Apparatus for detecting a 3D structure of an object , comprising: - at least three laser emitters , each of which generates laser radiation at a wavelength, wherein the wavelengths of the emitted laser radiation differ from one another, - optical devices , at least one of which is a beam splitter that splits the laser radiation of the laser emitters into a reference radiation and an illumination radiation , wherein the illumination radiation strikes the object to be measured, is reflected from the object as object radiation and interferes with the reference radiation , - a detector , which records the interference patterns formed due to the interference of the reference radiation and the object radiation , and - an analysis unit for analyzing the recorded interference patterns which is connected to the detector , - wherein at least two of the laser emitters emit laser radiation in the invisible range, and - wherein the analysis unit is configured to detect the object in three dimensions based on the interference patterns of the invisible laser radiation , characterized in that - at least one of the laser emitters is a color laser that emits colored laser radiation ; and - the analysis unit is further configured to deduce the color of the object on the basis of the intensity of the colored object radiation reflected from the object ; - the laser emitters are arranged in two emitter arrays ; - the laser emitters that emit invisible laser radiation are part of a first emitter array and the at least one color laser is part of a second emitter array ; and - the at least one color laser is arranged in a position in the second emitter array , which is conjugated with an unoccupied position for a laser emitter or with a non-emitting laser emitter in the first emitter array . - at least three laser emitters , each of which generates laser radiation at a wavelength, wherein the wavelengths of the emitted laser radiation differ from one another, - optical devices , at least one of which is a beam splitter that splits the laser radiation of the laser emitters into a reference radiation and an illumination radiation , wherein the illumination radiation strikes the object to be measured, is reflected from the object as object radiation and interferes with the reference radiation , - a detector , which records the interference patterns formed due to the interference of the reference radiation and the object radiation , and - an analysis unit for analyzing the recorded interference patterns which is connected to the detector , - wherein at least two of the laser emitters emit laser radiation in the invisible range, and - wherein the analysis unit is configured to detect the object in three dimensions based on the interference patterns of the invisible laser radiation , characterized in that - at least one of the laser emitters is a color laser that emits colored laser radiation ; and - the analysis unit is further configured to deduce the color of the object on the basis of the intensity of the colored object radiation reflected from the object ; - the laser emitters are arranged in two emitter arrays ; - the laser emitters that emit invisible laser radiation are part of a first emitter array and the at least one color laser is part of a second emitter array ; and - the at least one color laser is arranged in a position in the second emitter array , which is conjugated with an unoccupied position for a laser emitter or with a non-emitting laser emitter in the first emitter array . <EOS>