A measurement system configured to determine at least one apparatus parameter related to a working procedure of an apparatus involving movements, the system comprises a processing unit and at least one measurement unit configured to be arranged at said apparatus and to measure movements related to the working procedure, said at least one measurement unit comprises at least one sensor member configured to measure at least accelerations, and to generate at least one sensor signal in dependence thereto, and to apply said signal(s) to said processing unit , wherein said at least one measurement unit is configured to be arranged at said apparatus such that the at least one measurement unit , during a measurement procedure, is repetitively moved in a loop , displaying a loop trajectory, in both forward and backward directions along the loop trajectory , and to perform measurements of at least accelerations during said measurement procedure, wherein said processing unit is configured to determine said at least one apparatus parameter of working procedure movements which are indicated in said measured at least accelerations, and only based upon said measured at least accelerations, and wherein said processing unit is configured to calculate a measure of said at least one apparatus parameter only based upon one or many parameters of said accelerations, wherein said processing unit is configured to determine said at least one apparatus parameter of working procedure movements based upon motion components in loop movements, and wherein said processing unit is configured to perform said calculation by applying a predetermined fit technique adapted to the type of loop and modelling of the effect of errors on the measured acceleration to connect the fit to actual apparatus parameter, and if the loop is circular a sine-wave-fit technique is applied to determine a frequency, and/or amplitude and/or phase difference indicative of apparatus parameter. wherein said at least one measurement unit is configured to be arranged at said apparatus such that the at least one measurement unit , during a measurement procedure, is repetitively moved in a loop , displaying a loop trajectory, in both forward and backward directions along the loop trajectory , and to perform measurements of at least accelerations during said measurement procedure, wherein said processing unit is configured to determine said at least one apparatus parameter of working procedure movements which are indicated in said measured at least accelerations, and only based upon said measured at least accelerations, and wherein said processing unit is configured to calculate a measure of said at least one apparatus parameter only based upon one or many parameters of said accelerations, wherein said processing unit is configured to determine said at least one apparatus parameter of working procedure movements based upon motion components in loop movements, and wherein said processing unit is configured to perform said calculation by applying a predetermined fit technique adapted to the type of loop and modelling of the effect of errors on the measured acceleration to connect the fit to actual apparatus parameter, and if the loop is circular a sine-wave-fit technique is applied to determine a frequency, and/or amplitude and/or phase difference indicative of apparatus parameter. <EOS>