An analysis system comprising a test and measurement tool comprising a test and measurement circuit configured to electrically connect with a device under test and to generate measurement data representative of at least one parameter of the device under test at high voltage; an imaging tool attached to the test and measurement tool , the imaging tool comprising a sensor array and a receiving end having a lens configured to receive electromagnetic radiation from a target scene and to direct the received electromagnetic radiation to the sensor array to generate image data representative of the target scene; a housing enclosing the test and measurement tool and the imaging tool , the housing comprising an insulating coating surrounding at least a portion of the imaging tool , the insulating coating having an opening proximate the imaging tool such that electromagnetic radiation can enter the opening and reach the imaging tool ; a processor in communication with the test and measurement circuit of the test and measurement tool and the imaging tool and configured to receive and process measurement data and image data; and at least one electrical isolation mechanism comprising a window covering the opening in the insulating coating proximate the imaging tool , the window being positioned at least a first distance from the receiving end of the imaging tool ; the first distance being associated with the electrical characteristics of the window and a voltage rating of the test and measurement circuit so that a user operating the analysis system is electrically isolated from the test and measurement circuit through the imaging tool at least to the voltage rating of the test and measurement circuit via the window and the at least first distance between the window and the receiving end of the imaging tool . a test and measurement tool comprising a test and measurement circuit configured to electrically connect with a device under test and to generate measurement data representative of at least one parameter of the device under test at high voltage; an imaging tool attached to the test and measurement tool , the imaging tool comprising a sensor array and a receiving end having a lens configured to receive electromagnetic radiation from a target scene and to direct the received electromagnetic radiation to the sensor array to generate image data representative of the target scene; a housing enclosing the test and measurement tool and the imaging tool , the housing comprising an insulating coating surrounding at least a portion of the imaging tool , the insulating coating having an opening proximate the imaging tool such that electromagnetic radiation can enter the opening and reach the imaging tool ; a processor in communication with the test and measurement circuit of the test and measurement tool and the imaging tool and configured to receive and process measurement data and image data; and at least one electrical isolation mechanism comprising a window covering the opening in the insulating coating proximate the imaging tool , the window being positioned at least a first distance from the receiving end of the imaging tool ; the first distance being associated with the electrical characteristics of the window and a voltage rating of the test and measurement circuit so that a user operating the analysis system is electrically isolated from the test and measurement circuit through the imaging tool at least to the voltage rating of the test and measurement circuit via the window and the at least first distance between the window and the receiving end of the imaging tool . <EOS>