An instrument including a probe that interacts with a sample having a surface, wherein the probe includes a base, a cantilever extending outwardly from said base, and a tip disposed on said cantilever generally opposite said base, the instrument including: an integrated linear probe actuator producing relative motion between the sample and the probe in a general direction substantially perpendicular to the sample surface to load and unload the probe relative to the sample, wherein the linear probe actuator operates to deflect cantilever and tip a distance that is proportional to the voltage applied to the linear probe actuator, wherein the probe actuator is located either at least partially on said cantilever of the probe or on the base of the probe and the cantilever of the probe; a controller that generates an actuator drive signal; a scanner to provide relative motion between the sample and probe in response to the interaction between the probe and the sample; and characterized in that said linear probe actuator has an operable bandwidth of at least about 5 kHz, wherein the scanner is able to position the probe with respect to the sample in at least the direction substantially perpendicular to the sample surface prior to performing a force curve measurement on the sample which is a measurement of the magnitude of the force as a function of relative tip-sample position in the axis substantially perpendicular to the sample surface, by operating a feedback loop, while the linear probe actuator is utilized in data acquisition after the scanner has positioned the probe to perform the force curve measurement on sample, wherein a probe response to actuation of the integrated linear probe actuator is indicative of a mechanical property of the sample. an integrated linear probe actuator producing relative motion between the sample and the probe in a general direction substantially perpendicular to the sample surface to load and unload the probe relative to the sample, wherein the linear probe actuator operates to deflect cantilever and tip a distance that is proportional to the voltage applied to the linear probe actuator, wherein the probe actuator is located either at least partially on said cantilever of the probe or on the base of the probe and the cantilever of the probe; a controller that generates an actuator drive signal; a scanner to provide relative motion between the sample and probe in response to the interaction between the probe and the sample; and characterized in that said linear probe actuator has an operable bandwidth of at least about 5 kHz, wherein the scanner is able to position the probe with respect to the sample in at least the direction substantially perpendicular to the sample surface prior to performing a force curve measurement on the sample which is a measurement of the magnitude of the force as a function of relative tip-sample position in the axis substantially perpendicular to the sample surface, by operating a feedback loop, while the linear probe actuator is utilized in data acquisition after the scanner has positioned the probe to perform the force curve measurement on sample, wherein a probe response to actuation of the integrated linear probe actuator is indicative of a mechanical property of the sample.