Method for evaluating an anesthesia or intensive-care EEG by means of a computer, which executes the followings steps: - establishing parameters from the time and/or frequency domain from measured EEG curves of an EEG established by a measuring unit for an EEG channel by a multi-electrode arrangement, - inserting the established parameters in multi-variate classification functions and performing automatically a classification of stages of the anesthesia or intensive-care EEG, - performing a first analysis step of the measured EEG curves, wherein the curve profiles are analyzed in respect of scattering-in signal components, wherein scattering-in signal components are those that influence the over-all curve profile but are atypical for anesthesia or intensive-care EEG, wherein such atypical signal components which are analyzed are of the bulk of bio-signals of non-anesthesia or non-intensive-care EEG characteristic curves and artifacts, wherein bio-signals of non-anesthesia or non-intensive-care EEG characteristic curves comprise epilepsy-typical curve patterns in the form of seizure potentials, - performing a second analysis step, which is performed if such scattering-in signal components are detected, wherein an artifact analysis is performed for verifying, if the scattering-in signal components could be bio-signals or artifacts, - wherein in the artifact analysis by means of signals which are established by artifact sensors, which are embodied as deformation sensors of the EEG electrodes, the existence of artifacts is verified, if shape modifications are established by means of the deformation sensors, and the existence of bio-signals of non-anesthesia or non-intensive-care EEG characteristic curves is verified, if shape modifications are not established by the deformation sensors, - displaying the stage of the anesthesia or intensive-care EEG, if no scattering-in signal components are detected, - not displaying the stage of the anesthesia or intensive-care EEG, if artifacts are detected. - establishing parameters from the time and/or frequency domain from measured EEG curves of an EEG established by a measuring unit for an EEG channel by a multi-electrode arrangement, - inserting the established parameters in multi-variate classification functions and performing automatically a classification of stages of the anesthesia or intensive-care EEG, - performing a first analysis step of the measured EEG curves, wherein the curve profiles are analyzed in respect of scattering-in signal components, wherein scattering-in signal components are those that influence the over-all curve profile but are atypical for anesthesia or intensive-care EEG, wherein such atypical signal components which are analyzed are of the bulk of bio-signals of non-anesthesia or non-intensive-care EEG characteristic curves and artifacts, wherein bio-signals of non-anesthesia or non-intensive-care EEG characteristic curves comprise epilepsy-typical curve patterns in the form of seizure potentials, - performing a second analysis step, which is performed if such scattering-in signal components are detected, wherein an artifact analysis is performed for verifying, if the scattering-in signal components could be bio-signals or artifacts, - wherein in the artifact analysis by means of signals which are established by artifact sensors, which are embodied as deformation sensors of the EEG electrodes, the existence of artifacts is verified, if shape modifications are established by means of the deformation sensors, and the existence of bio-signals of non-anesthesia or non-intensive-care EEG characteristic curves is verified, if shape modifications are not established by the deformation sensors, - displaying the stage of the anesthesia or intensive-care EEG, if no scattering-in signal components are detected, - not displaying the stage of the anesthesia or intensive-care EEG, if artifacts are detected.