A millimeter-wave inspection apparatus, wherein the millimeter-wave inspection apparatus comprises: optics devices (30, 50), configured to receive millimeter-wave energy radiated from an object to be inspected and focus the received millimeter-wave energy; a radiometer receiving device configured to receive the focused millimeter-wave energy and transform the millimeter-wave energy into electrical signal; and an imaging device configured to generate a temperature image of the object to be inspected in accordance with the electrical signal, wherein the optics devices (30, 50) include: a swing reflection device configured to receive and reflect the millimeter-wave energy from the object to be inspected; and a convex lens device configured to focus the millimeter-wave energy from the swing reflection device; characterized in that the optics devices further include a path-folding reflection plate device configured to fold the propagating path of the focused millimeter-wave energy, and further characterized in that the radiometer receiving device comprises: a linear array of radiometers; first and second positioning plates (82, 84), which fix the radiometers therebetween by a first fastener; and a support frame configured to condition the angle of the radiometers; wherein the support frame is provided with a sliding hole, and the radiometer receiving device further comprises a second fastener, wherein the second fastener passes though the sliding hole and connects the support frame to a curved plate of the first positioning plate, so that the second fastener can slide within the sliding hole so as to adjust the angle of the first positioning plate and thus to adjust the orientation of the radiometers with respect to the support frame. optics devices (30, 50), configured to receive millimeter-wave energy radiated from an object to be inspected and focus the received millimeter-wave energy; a radiometer receiving device configured to receive the focused millimeter-wave energy and transform the millimeter-wave energy into electrical signal; and an imaging device configured to generate a temperature image of the object to be inspected in accordance with the electrical signal, wherein the optics devices (30, 50) include: a swing reflection device configured to receive and reflect the millimeter-wave energy from the object to be inspected; and a convex lens device configured to focus the millimeter-wave energy from the swing reflection device; characterized in that the optics devices further include a path-folding reflection plate device configured to fold the propagating path of the focused millimeter-wave energy, and further characterized in that the radiometer receiving device comprises: a linear array of radiometers; first and second positioning plates (82, 84), which fix the radiometers therebetween by a first fastener; and a support frame configured to condition the angle of the radiometers; a linear array of radiometers; first and second positioning plates (82, 84), which fix the radiometers therebetween by a first fastener; and a support frame configured to condition the angle of the radiometers; wherein the support frame is provided with a sliding hole, and the radiometer receiving device further comprises a second fastener, wherein the second fastener passes though the sliding hole and connects the support frame to a curved plate of the first positioning plate, so that the second fastener can slide within the sliding hole so as to adjust the angle of the first positioning plate and thus to adjust the orientation of the radiometers with respect to the support frame.