A surface-coated cutting tool comprising a substrate and a coating formed on a surface of the substrate, the coating including one or two or more layers, at least one of the layers being an Al-rich layer including hard particles, wherein the hard particles occupy 50% by volume or more and 95% by volume or less of the Al-rich layer, the % by volume determined using the method described in the description, and wherein the hard particles have a particle diameter of 10 nm or more and 1000 nm or less, the particle diameter being determined using the method described in the description, the hard particles having a sodium chloride type crystal structure, and including a first unit phase in a form of a plurality of lumps and a second unit phase interposed between the lumps of the first unit phase, the first unit phase being composed of a nitride or carbonitride of Al x Ti 1-x, the first unit phase having an atomic ratio x of Al of 0.7 or more and 0.96 or less, the atomic ratio being determined using the method described in the description, a size of the first unit phase is 2 nm or more and 15 nm or less in the <100> orientation, the size of the first unit phase being determined using the TEM image method described in the description, the second unit phase being composed of a nitride or carbonitride of Al y Ti 1-y, the second unit phase having an atomic ratio y of Al exceeding 0.5 and less than 0.7, the atomic ratio being determined using the method described in the description, the Al-rich layer exhibiting a maximum peak in the plane when the Al-rich layer is analyzed through X-ray diffraction in a direction normal to a surface of the coating, the X-ray diffraction being carried out using the method described in the description, the Al-rich layer has a thickness of 1 μm or more and 20 μm or less, the thickness being determined using the method described in the description, the hard particle internally having a structure in which the second unit phase in the form of a thin line surrounds the first unit phase in the form of a plurality of lumps, and the number of lumps of the first unit phase surrounded by the second unit phase in the <100> orientation is 10 or more and 1000 or less, the number of lumps being determined using the method using TEM images of three different fields of view to determine an average value as described in the description. the coating including one or two or more layers, at least one of the layers being an Al-rich layer including hard particles, wherein the hard particles occupy 50% by volume or more and 95% by volume or less of the Al-rich layer, the % by volume determined using the method described in the description, and wherein the hard particles have a particle diameter of 10 nm or more and 1000 nm or less, the particle diameter being determined using the method described in the description, the hard particles having a sodium chloride type crystal structure, and including a first unit phase in a form of a plurality of lumps and a second unit phase interposed between the lumps of the first unit phase, the first unit phase being composed of a nitride or carbonitride of Al x Ti 1-x, the first unit phase having an atomic ratio x of Al of 0.7 or more and 0.96 or less, the atomic ratio being determined using the method described in the description, a size of the first unit phase is 2 nm or more and 15 nm or less in the <100> orientation, the size of the first unit phase being determined using the TEM image method described in the description, the second unit phase being composed of a nitride or carbonitride of Al y Ti 1-y, the second unit phase having an atomic ratio y of Al exceeding 0.5 and less than 0.7, the atomic ratio being determined using the method described in the description, the Al-rich layer exhibiting a maximum peak in the plane when the Al-rich layer is analyzed through X-ray diffraction in a direction normal to a surface of the coating, the X-ray diffraction being carried out using the method described in the description, the Al-rich layer has a thickness of 1 μm or more and 20 μm or less, the thickness being determined using the method described in the description, the hard particle internally having a structure in which the second unit phase in the form of a thin line surrounds the first unit phase in the form of a plurality of lumps, and the number of lumps of the first unit phase surrounded by the second unit phase in the <100> orientation is 10 or more and 1000 or less, the number of lumps being determined using the method using TEM images of three different fields of view to determine an average value as described in the description.