A method for obtaining a sub-resolution image of a specimen using a microscope, the method comprising: projecting an illumination pattern of illumination light onto the specimen, thereby illuminating the specimen; detecting at least a portion of fluorescent light emitted from the specimen and/or detecting at least a portion of illumination light reflected from the specimen, thereby capturing a series of images of the specimen at a plurality of different relative positions of the specimen with respect to the illumination pattern projected onto the specimen, wherein between the capturing of at least two images of the series the relative position of the specimen with respect to the illumination pattern projected onto the specimen is stochastically shifted; processing the captured images to extract a sub-resolution image of the specimen, wherein the processing of the captured images comprises: applying an analytic deconvolution of each of a second and subsequent images of the series by a first image of the series to obtain a corresponding deconvolved image; determining the position of a maximum of the analytic deconvolution of each of the deconvolved images; determining the stochastic shift of the relative position of the specimen with respect to the illumination pattern projected onto the specimen for each of the second and subsequent images of the series from the determined position of the maximum of the analytic deconvolution; a-posteriori shifting of each image of the series to reverse the determined shift of the relative position of the specimen with respect to the projected illumination pattern, thereby obtaining a corresponding shifted image; and processing the shifted images to extract the sub-resolution image of the specimen. projecting an illumination pattern of illumination light onto the specimen, thereby illuminating the specimen; detecting at least a portion of fluorescent light emitted from the specimen and/or detecting at least a portion of illumination light reflected from the specimen, thereby capturing a series of images of the specimen at a plurality of different relative positions of the specimen with respect to the illumination pattern projected onto the specimen, wherein between the capturing of at least two images of the series the relative position of the specimen with respect to the illumination pattern projected onto the specimen is stochastically shifted; processing the captured images to extract a sub-resolution image of the specimen, wherein the processing of the captured images comprises: applying an analytic deconvolution of each of a second and subsequent images of the series by a first image of the series to obtain a corresponding deconvolved image; determining the position of a maximum of the analytic deconvolution of each of the deconvolved images; determining the stochastic shift of the relative position of the specimen with respect to the illumination pattern projected onto the specimen for each of the second and subsequent images of the series from the determined position of the maximum of the analytic deconvolution; a-posteriori shifting of each image of the series to reverse the determined shift of the relative position of the specimen with respect to the projected illumination pattern, thereby obtaining a corresponding shifted image; and processing the shifted images to extract the sub-resolution image of the specimen. applying an analytic deconvolution of each of a second and subsequent images of the series by a first image of the series to obtain a corresponding deconvolved image; determining the position of a maximum of the analytic deconvolution of each of the deconvolved images; determining the stochastic shift of the relative position of the specimen with respect to the illumination pattern projected onto the specimen for each of the second and subsequent images of the series from the determined position of the maximum of the analytic deconvolution; a-posteriori shifting of each image of the series to reverse the determined shift of the relative position of the specimen with respect to the projected illumination pattern, thereby obtaining a corresponding shifted image; and processing the shifted images to extract the sub-resolution image of the specimen.