A system comprising: a broadband source; an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference pattern, the electromagnetic radiation being derived from the broadband source, wherein the interferometer includes a scanning stage to adjust the relative optical path length between the test and reference electromagnetic radiation when they form the optical interference pattern, and wherein the scanning stage is configured to vary the optical path length over a range larger than a coherence length for the broadband source; a multi-element detector; one or more optics configured to image the interference pattern onto the detector so that different elements of the detector correspond to different illumination angles of the test surface by the test electromagnetic radiation; and an electronic processor coupled to the detector, wherein the electronic processor is configured to: frequency transform an interference signal measured by each element; analyze the frequency transformed interference signal in the frequency domain to extract phase and magnitude information for the various spectral components of the broadband source; and analyze information based on the frequency transform to determine angularly resolved information about a test object having the test surface. a broadband source; an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference pattern, the electromagnetic radiation being derived from the broadband source, wherein the interferometer includes a scanning stage to adjust the relative optical path length between the test and reference electromagnetic radiation when they form the optical interference pattern, and wherein the scanning stage is configured to vary the optical path length over a range larger than a coherence length for the broadband source; a multi-element detector; one or more optics configured to image the interference pattern onto the detector so that different elements of the detector correspond to different illumination angles of the test surface by the test electromagnetic radiation; and an electronic processor coupled to the detector, wherein the electronic processor is configured to: frequency transform an interference signal measured by each element; analyze the frequency transformed interference signal in the frequency domain to extract phase and magnitude information for the various spectral components of the broadband source; and analyze information based on the frequency transform to determine angularly resolved information about a test object having the test surface. frequency transform an interference signal measured by each element; analyze the frequency transformed interference signal in the frequency domain to extract phase and magnitude information for the various spectral components of the broadband source; and analyze information based on the frequency transform to determine angularly resolved information about a test object having the test surface.