A contact inspection device configured to perform contact inspection of a test object, the contact inspection device further comprising: plural probes each having a first end to be brought into contact with the test object; a probe substrate including contact portions in contact with respective second ends of the probes; a probe head through which the plural probes extend and which is detachably attached to the probe substrate; the probe head comprising an upper probe head, a lower probe head, and an intermediate retaining member, characterized in that the contact inspection device further comprises plural positioning members (36, 38) which are provided on a surface of the upper probe head facing the probe substrate and through which the plural probes extend, each of the probes having a rotation restricted portion provided on the side of the second end, each of the plural positioning members (36, 38) having rotation restricting portions adapted to engage the rotation restricted portions, wherein, when the plural positioning members (36, 38) are moved relative to each other, in a state where the probe head is removed from the probe substrate, the rotation restricting portions align the probes and switch the probes from a rotation unrestricted state to a rotation restricted state, and wherein the plural positioning members (36, 38) include a first positioning member and a second positioning member, wherein the rotation restricting portions of the first positioning member and the second positioning member have a rectangular shape, wherein the rotation restricted portions have a rectangular shape, and wherein when the first positioning member and the second positioning member are moved relative to each other along a diagonal of the rectangular shape, the rotation restricting portions restrict rotation of the rotation restricted portions. plural probes each having a first end to be brought into contact with the test object; a probe substrate including contact portions in contact with respective second ends of the probes; a probe head through which the plural probes extend and which is detachably attached to the probe substrate; the probe head comprising an upper probe head, a lower probe head, and an intermediate retaining member, characterized in that the contact inspection device further comprises plural positioning members (36, 38) which are provided on a surface of the upper probe head facing the probe substrate and through which the plural probes extend, each of the probes having a rotation restricted portion provided on the side of the second end, each of the plural positioning members (36, 38) having rotation restricting portions adapted to engage the rotation restricted portions, wherein, when the plural positioning members (36, 38) are moved relative to each other, in a state where the probe head is removed from the probe substrate, the rotation restricting portions align the probes and switch the probes from a rotation unrestricted state to a rotation restricted state, and wherein the plural positioning members (36, 38) include a first positioning member and a second positioning member, wherein the rotation restricting portions of the first positioning member and the second positioning member have a rectangular shape, wherein the rotation restricted portions have a rectangular shape, and wherein when the first positioning member and the second positioning member are moved relative to each other along a diagonal of the rectangular shape, the rotation restricting portions restrict rotation of the rotation restricted portions.