Multi-aperture imaging device (10; 40; 140; 150; 160; 170; 180; 200; 220; 250), comprising: an image sensor; a single-line array of juxtaposed optical channels (16a-b), wherein each optical channel (16a-b) includes optics (17a-d) for projecting a partial area (106a-d) of an object area on an image sensor area (13a-d) of the image sensor, wherein the single-line array comprises a carrier through which the optical channels (16a-b) pass; beam-deflecting means for deflecting an optical path (22a-d) of the optical channels (16a-b); and actuator means for generating a relative movement between the image sensor, the single-line array and the beam-deflecting means, wherein the actuator means is arranged such that the same is arranged at least partly between two planes (26a, 26b) that are spanned by sides of a cuboid, wherein the sides of the cuboid are oriented parallel to one another as well as to a line extension direction of the single-line array and part of the optical path (22a-d) of the optical channels (16a-b) between the image sensor and the beam-deflecting means and its volume is at a minimum and still includes the image sensor, the single-line array and the beam-deflecting means; wherein the multi-aperture imaging device comprises a thickness direction that is arranged normal to the two planes (26a, 26b), wherein the actuator means comprises a dimension parallel to the thickness direction and a portion of at most 10% of the dimension projects beyond the two planes (26a, 26b), starting from an area between the two planes (26a, 26b); wherein the actuator means includes a piezoelectric actuator that is coupled to the image sensor or the array; wherein said image sensor or the beam-deflecting means is arranged between the piezoelectric actuator of the actuator means and the single-line array, wherein the piezoelectric actuator is configured to change a distance between the image sensor and the single-line array and to bend along a beam direction parallel to an optical path (22a-d) through the optical channels (16a-b) when actuated; and wherein the piezoelectric actuator is connected to the image sensor or the array via a mechanical deflection means (78; 84), wherein the mechanical deflection means (78; 84) is arranged between the planes (26a-b); wherein the mechanical deflection means (78; 84) or the single-line array or the image sensor is supported via a support which is configured to limit degrees of freedom of movement of the single-line array or the image sensor caused by a deflection of the actuator to a direction parallel or antiparallel to the beam direction; wherein the piezoelectric actuator is configured as piezoelectric bending converter. an image sensor; a single-line array of juxtaposed optical channels (16a-b), wherein each optical channel (16a-b) includes optics (17a-d) for projecting a partial area (106a-d) of an object area on an image sensor area (13a-d) of the image sensor, wherein the single-line array comprises a carrier through which the optical channels (16a-b) pass; beam-deflecting means for deflecting an optical path (22a-d) of the optical channels (16a-b); and actuator means for generating a relative movement between the image sensor, the single-line array and the beam-deflecting means, wherein the actuator means is arranged such that the same is arranged at least partly between two planes (26a, 26b) that are spanned by sides of a cuboid, wherein the sides of the cuboid are oriented parallel to one another as well as to a line extension direction of the single-line array and part of the optical path (22a-d) of the optical channels (16a-b) between the image sensor and the beam-deflecting means and its volume is at a minimum and still includes the image sensor, the single-line array and the beam-deflecting means; wherein the multi-aperture imaging device comprises a thickness direction that is arranged normal to the two planes (26a, 26b), wherein the actuator means comprises a dimension parallel to the thickness direction and a portion of at most 10% of the dimension projects beyond the two planes (26a, 26b), starting from an area between the two planes (26a, 26b); wherein the actuator means includes a piezoelectric actuator that is coupled to the image sensor or the array; wherein said image sensor or the beam-deflecting means is arranged between the piezoelectric actuator of the actuator means and the single-line array, wherein the piezoelectric actuator is configured to change a distance between the image sensor and the single-line array and to bend along a beam direction parallel to an optical path (22a-d) through the optical channels (16a-b) when actuated; and wherein the piezoelectric actuator is connected to the image sensor or the array via a mechanical deflection means (78; 84), wherein the mechanical deflection means (78; 84) is arranged between the planes (26a-b); wherein the mechanical deflection means (78; 84) or the single-line array or the image sensor is supported via a support which is configured to limit degrees of freedom of movement of the single-line array or the image sensor caused by a deflection of the actuator to a direction parallel or antiparallel to the beam direction; wherein the piezoelectric actuator is configured as piezoelectric bending converter.