A method for depositing tailored thin films of a UV-curable fluid on a substrate, the method comprising: precisely locating a metrology tool with respect to a fixed bridge, wherein said fixed bridge is supporting an inkjet and a superstrate chuck, wherein a superstrate is affixed to said superstrate chuck, wherein said superstrate possesses optimal flexibility, and wherein a stiffness of said superstrate is: high enough to allow urging of liquid organic material drops to merge laterally rather than trapping individual drops as islands with the superstrate wrapped around them, and low enough that strain energy stored in the superstrate due to its deformation does not significantly impact a thin film fluid redistribution prior to curing or crosslinking of a monomer; wherein said substrate is affixed to a chuck on a movable stage; moving said substrate to precisely locate it with respect to said metrology tool; precisely locating said inkjet with respect to said bridge; measuring a substrate topography on said metrology tool using said precise location of said metrology tool and said precise location of said substrate; mapping said measured substrate topography in a metrology tool coordinate system to an inkjet coordinate system; identifying a film thickness to deposit on said substrate; obtaining optimal inkjet drop locations, volumes and process time based on said mapping of said measured substrate topography in said metrology tool coordinate system to said inkjet coordinate system and said identified film thickness; dispensing drops of said UV-curable fluid from said inkjet with said optimal volumes at said optimal locations on said substrate; closing a gap between said superstrate and said substrate; allowing said drops to form a contiguous film captured between said substrate and said superstrate; allowing said contiguous film to evolve over said process time; curing said film to solidify it into a solid film; separating said superstrate from said solid film; leaving said solid film substantially on said substrate; using an alignment measurement system, wherein the location and orientation of the substrate affixed to said chuck on said movable stage can be known with a precision of <50 um with respect to the metrology coordinate system and the inkjet coordinate system; and locating said substrate affixed to said chuck on said movable stage using said alignment measurement system, wherein the introduction of errors in the film thickness arising from misalignment between the actual substrate topography and the topography that results from said solid film deposited on said substrate is minimized. precisely locating a metrology tool with respect to a fixed bridge, wherein said fixed bridge is supporting an inkjet and a superstrate chuck, wherein a superstrate is affixed to said superstrate chuck, wherein said superstrate possesses optimal flexibility, and wherein a stiffness of said superstrate is: high enough to allow urging of liquid organic material drops to merge laterally rather than trapping individual drops as islands with the superstrate wrapped around them, and low enough that strain energy stored in the superstrate due to its deformation does not significantly impact a thin film fluid redistribution prior to curing or crosslinking of a monomer; wherein said substrate is affixed to a chuck on a movable stage; moving said substrate to precisely locate it with respect to said metrology tool; precisely locating said inkjet with respect to said bridge; measuring a substrate topography on said metrology tool using said precise location of said metrology tool and said precise location of said substrate; mapping said measured substrate topography in a metrology tool coordinate system to an inkjet coordinate system; identifying a film thickness to deposit on said substrate; obtaining optimal inkjet drop locations, volumes and process time based on said mapping of said measured substrate topography in said metrology tool coordinate system to said inkjet coordinate system and said identified film thickness; dispensing drops of said UV-curable fluid from said inkjet with said optimal volumes at said optimal locations on said substrate; closing a gap between said superstrate and said substrate; allowing said drops to form a contiguous film captured between said substrate and said superstrate; allowing said contiguous film to evolve over said process time; curing said film to solidify it into a solid film; separating said superstrate from said solid film; leaving said solid film substantially on said substrate; using an alignment measurement system, wherein the location and orientation of the substrate affixed to said chuck on said movable stage can be known with a precision of <50 um with respect to the metrology coordinate system and the inkjet coordinate system; and locating said substrate affixed to said chuck on said movable stage using said alignment measurement system, wherein the introduction of errors in the film thickness arising from misalignment between the actual substrate topography and the topography that results from said solid film deposited on said substrate is minimized.