A method, executed by a calculator, for processing a raw image, characterized by raw measurements S_(i,j) collected by bolometers Pix_(i,j) of a detector arranged in a matrix-like fashion according to n rows (L i) and m columns (C j), the bolometers Pix_(i,j) comprising exposed bolometers (Pix_exp_(i,j)), and masked bolometers (Pix_mask_(i,j)), veiled during the acquisition of the raw measurements, the method comprising: a) calculating masked terms S_mask_norm_(i,j), associated with the masked bolometers (Pix_mask_(i,j)), the calculating consisting in subtracting a given column (C j) from the raw measurement S_(i,j) of each masked bolometer (Pix_mask_(i,j)), the mean value of the raw measurements S_(i,j) of the masked bolometers of said column; b) correlating between the masked terms S_mask_norm_(i,j) and calibrated components S_mask_cal_(i,j) of the masked bolometers (Pix_mask_(i,j)), determined according to the relationship: S _ mask _ cal _ i j = S _ mask _ ref _ i j − 1 n ∑ k = 1 n S _ mask _ ref _ k j the terms S_mask_ref_(i,j) being reference measurements of the masked bolometers (Pix_mask_(i,j)) obtained at a reference temperature (Tr) and by masking the detector with a mask also maintained at the reference temperature (Tr), the correlation step comprising a linear regression so that each masked term S_mask_norm_(i,j) and the calibrated components S_mask cal_(i,j) comply with the following relationship: S _ mask _ norm _ i j = β. S _ mask _ cal _ i j + D offset where β and D offset are the terms determined during the linear regression; c) a step of correcting the raw image which comprises the calculation of corrected measurements S_Cor_(i,j) of a corrected image for each bolometer (Pix_(i,j) on the basis of the result of the correlation step b), this correction step comprising the calculation of the corrected measurements S_Cor_(i,j) for each bolometer (Pix_(i,j)) according to the following relationship: S _ Cor _ i j = S _ i j − β. S _ cal _ i j − D offset where, for a given bolometer (Pix_(i,j)), S_cal_(i,j) is a calibrated component determined according to the relationship: S _ cal _ i j = S _ ref _ i j − 1 n ∑ k = 1 n S _ ref _ k j the terms S_ref (i,j) being reference measurements of the bolometers (Pix_(i,j)) at a reference temperature (Tr) and by masking the detector with a mask also maintained at the reference temperature (Tr). a) calculating masked terms S_mask_norm_(i,j), associated with the masked bolometers (Pix_mask_(i,j)), the calculating consisting in subtracting a given column (C j) from the raw measurement S_(i,j) of each masked bolometer (Pix_mask_(i,j)), the mean value of the raw measurements S_(i,j) of the masked bolometers of said column; b) correlating between the masked terms S_mask_norm_(i,j) and calibrated components S_mask_cal_(i,j) of the masked bolometers (Pix_mask_(i,j)), determined according to the relationship: S _ mask _ cal _ i j = S _ mask _ ref _ i j − 1 n ∑ k = 1 n S _ mask _ ref _ k j the terms S_mask_ref_(i,j) being reference measurements of the masked bolometers (Pix_mask_(i,j)) obtained at a reference temperature (Tr) and by masking the detector with a mask also maintained at the reference temperature (Tr), the correlation step comprising a linear regression so that each masked term S_mask_norm_(i,j) and the calibrated components S_mask cal_(i,j) comply with the following relationship: S _ mask _ norm _ i j = β. S _ mask _ cal _ i j + D offset where β and D offset are the terms determined during the linear regression; c) a step of correcting the raw image which comprises the calculation of corrected measurements S_Cor_(i,j) of a corrected image for each bolometer (Pix_(i,j) on the basis of the result of the correlation step b), this correction step comprising the calculation of the corrected measurements S_Cor_(i,j) for each bolometer (Pix_(i,j)) according to the following relationship: S _ Cor _ i j = S _ i j − β. S _ cal _ i j − D offset where, for a given bolometer (Pix_(i,j)), S_cal_(i,j) is a calibrated component determined according to the relationship: S _ cal _ i j = S _ ref _ i j − 1 n ∑ k = 1 n S _ ref _ k j the terms S_ref (i,j) being reference measurements of the bolometers (Pix_(i,j)) at a reference temperature (Tr) and by masking the detector with a mask also maintained at the reference temperature (Tr).