A pulse width modulated controller system for a semiconductor switch, the system comprising: a microcontroller coupled with a memory; a switch controller coupled with the microcontroller; and a calibration unit, the calibration unit comprising: at least two comparators (52, 54), one or more passive electrical components (R1-R5), and an encoder logic all operatively coupled together and coupled with the microcontroller and with the switch controller; wherein the microcontroller is configured to send a calibration trigger signal to the encoder logic of the calibration unit, and, in response, the calibration unit is configured to: using a first one of the at least two comparators, generate a first comparator output for a switching-on operation of the semiconductor switch; using a second one of the at least two comparators, generate a second comparator output for a switching-off operation of the semiconductor switch; generate a status signal using the encoder logic using one of the first comparator output, the second comparator output, and both the first comparator output and the second comparator output; and send the status signal to the microcontroller; wherein the one or more comparators (52, 54) and the one or more passive electrical components (R1- R5) are electrically coupled with a supply voltage to the semiconductor switch and with an output voltage from the semiconductor switch; wherein the memory coupled to the microcontroller comprises a digitally stored model comprising one or more control parameters for generating a control signal for the semiconductor switch; and wherein the microcontroller is configured to receive one or more operating condition parameters determined by measurements, said parameters being one or more of an actual temperature in an environment of the system, an actual supply voltage provided by an electrical supply system, an actual load current provided by the electrical supply system, a load-related variable, and, using one or more of said operating condition parameters and the digitally stored model, to generate control parameters for generating the control signal for the semiconductor switch. a microcontroller coupled with a memory; a switch controller coupled with the microcontroller; and a calibration unit, the calibration unit comprising: at least two comparators (52, 54), one or more passive electrical components (R1-R5), and an encoder logic all operatively coupled together and coupled with the microcontroller and with the switch controller; wherein the microcontroller is configured to send a calibration trigger signal to the encoder logic of the calibration unit, and, in response, the calibration unit is configured to: using a first one of the at least two comparators, generate a first comparator output for a switching-on operation of the semiconductor switch; using a second one of the at least two comparators, generate a second comparator output for a switching-off operation of the semiconductor switch; generate a status signal using the encoder logic using one of the first comparator output, the second comparator output, and both the first comparator output and the second comparator output; and send the status signal to the microcontroller; using a first one of the at least two comparators, generate a first comparator output for a switching-on operation of the semiconductor switch; using a second one of the at least two comparators, generate a second comparator output for a switching-off operation of the semiconductor switch; generate a status signal using the encoder logic using one of the first comparator output, the second comparator output, and both the first comparator output and the second comparator output; and send the status signal to the microcontroller; wherein the one or more comparators (52, 54) and the one or more passive electrical components (R1- R5) are electrically coupled with a supply voltage to the semiconductor switch and with an output voltage from the semiconductor switch; wherein the memory coupled to the microcontroller comprises a digitally stored model comprising one or more control parameters for generating a control signal for the semiconductor switch; and wherein the microcontroller is configured to receive one or more operating condition parameters determined by measurements, said parameters being one or more of an actual temperature in an environment of the system, an actual supply voltage provided by an electrical supply system, an actual load current provided by the electrical supply system, a load-related variable, and, using one or more of said operating condition parameters and the digitally stored model, to generate control parameters for generating the control signal for the semiconductor switch.