A method of generating surface geometry information of an object within an imaged region using an imaging system comprising a camera and a source of structured light comprising a source of a plurality of rays of light, the method comprising: obtaining first image data comprising a plurality of pixels, the first image data comprising phased wrapped image data representing the object and first structured light incident on the object, the first structured light comprising a periodic sinusoidal pattern comprising a plurality of pattern elements and having a first spatial frequency projected from said source of structured light; obtaining second image data comprising a plurality of pixels, the second image data comprising phase unwrapped image data representing the object and second structured light incident on the object comprising a periodic sinusoidal pattern comprising a plurality of pattern elements and having a second spatial frequency projected from said source of structured light; wherein said second image data is generated based upon a phase unwrapping using third image data comprising phase wrapped image data representing the object and third structured light incident on the object comprising a periodic sinusoidal pattern comprising a plurality of pattern elements and having a third spatial frequency projected from said source of structured light; processing the first image data to determine a relationship between each of the plurality of image pixels of the first image data and a pattern element of said pattern of the first structured light projected from said source of structured light, wherein the processing comprises unwrapping the phase of the first image data using the second image data; and generating the surface geometry information of said object based upon the determined relationship and position data indicating relative spatial positions of said camera and said source of structured light; wherein the first structured light, the second structured light and the third structured light are incident on the object at three or more phase offsets; wherein the spatial frequency of the first structured light is greater than the spatial frequency of the second structured light and the spatial frequency of the second structured light is greater than the spatial frequency of the third structured light; and wherein the third spatial frequency is less than 1/d, wherein d is a size of the field of projection in the plane of interest corresponding to the area to be imaged in which the plurality of pattern elements are projected. obtaining first image data comprising a plurality of pixels, the first image data comprising phased wrapped image data representing the object and first structured light incident on the object, the first structured light comprising a periodic sinusoidal pattern comprising a plurality of pattern elements and having a first spatial frequency projected from said source of structured light; obtaining second image data comprising a plurality of pixels, the second image data comprising phase unwrapped image data representing the object and second structured light incident on the object comprising a periodic sinusoidal pattern comprising a plurality of pattern elements and having a second spatial frequency projected from said source of structured light; wherein said second image data is generated based upon a phase unwrapping using third image data comprising phase wrapped image data representing the object and third structured light incident on the object comprising a periodic sinusoidal pattern comprising a plurality of pattern elements and having a third spatial frequency projected from said source of structured light; processing the first image data to determine a relationship between each of the plurality of image pixels of the first image data and a pattern element of said pattern of the first structured light projected from said source of structured light, wherein the processing comprises unwrapping the phase of the first image data using the second image data; and generating the surface geometry information of said object based upon the determined relationship and position data indicating relative spatial positions of said camera and said source of structured light; wherein the first structured light, the second structured light and the third structured light are incident on the object at three or more phase offsets; wherein the spatial frequency of the first structured light is greater than the spatial frequency of the second structured light and the spatial frequency of the second structured light is greater than the spatial frequency of the third structured light; and wherein the third spatial frequency is less than 1/d, wherein d is a size of the field of projection in the plane of interest corresponding to the area to be imaged in which the plurality of pattern elements are projected.