A method of programming a voltage regulation circuit within an integrated circuit, the method comprising: determining which bandgap reference circuit of at least two bandgap reference circuits in the voltage regulation circuit to program based on a current operational temperature of the integrated circuit, wherein one bandgap reference circuit is selected if the current operational temperature is below a threshold temperature, and another bandgap reference circuit is selected if the current operational temperature is above the threshold temperature; performing a boundary scan to measure an actual voltage magnitude generated by the voltage regulation circuit, the actual voltage magnitude dependent on a voltage magnitude selected from the bandgap reference circuits; in response to the actual voltage magnitude being outside an acceptable error magnitude as compared to a target voltage magnitude for the current operational temperature, iterating, until the actual voltage magnitude is within the acceptable error magnitude as compared to a target voltage magnitude, including: reprogramming a configuration bit setting of the integrated circuit to change the voltage magnitude generated by the selected bandgap reference circuit; and performing a boundary scan to measure the actual voltage magnitude generated by the voltage regulation circuit; and programming an eFuse with the configuration bit setting that caused the actual voltage magnitude to be within the acceptable error magnitude as compared to the target voltage magnitude, the programming of the eFuse permanently programming the selected bandgap reference circuit for causing the actual voltage magnitude to be within the acceptable error magnitude. determining which bandgap reference circuit of at least two bandgap reference circuits in the voltage regulation circuit to program based on a current operational temperature of the integrated circuit, wherein one bandgap reference circuit is selected if the current operational temperature is below a threshold temperature, and another bandgap reference circuit is selected if the current operational temperature is above the threshold temperature; performing a boundary scan to measure an actual voltage magnitude generated by the voltage regulation circuit, the actual voltage magnitude dependent on a voltage magnitude selected from the bandgap reference circuits; in response to the actual voltage magnitude being outside an acceptable error magnitude as compared to a target voltage magnitude for the current operational temperature, iterating, until the actual voltage magnitude is within the acceptable error magnitude as compared to a target voltage magnitude, including: reprogramming a configuration bit setting of the integrated circuit to change the voltage magnitude generated by the selected bandgap reference circuit; and performing a boundary scan to measure the actual voltage magnitude generated by the voltage regulation circuit; and reprogramming a configuration bit setting of the integrated circuit to change the voltage magnitude generated by the selected bandgap reference circuit; and performing a boundary scan to measure the actual voltage magnitude generated by the voltage regulation circuit; and programming an eFuse with the configuration bit setting that caused the actual voltage magnitude to be within the acceptable error magnitude as compared to the target voltage magnitude, the programming of the eFuse permanently programming the selected bandgap reference circuit for causing the actual voltage magnitude to be within the acceptable error magnitude.