A capacitance detection method, N first offsetting processes and M second offsetting processes constituting a detection period during detection, wherein N, M≥1, the method comprising: performing charging, base capacitance offsetting, and charge transferring successively on a capacitor to be detected (Cx) in an i-th first offsetting process of the first offsetting processes, to generate a first output voltage, wherein i≤N; performing discharging, base capacitance offsetting, and charge transferring on the capacitor to be detected (Cx) successively in a j-th second offsetting process of the second offsetting processes, to generate a second output voltage, wherein j≤M; and determining a capacitance variation of the capacitor to be detected (Cx) before and after the capacitor to be detected (Cx) is affected by an external electric field based on the first output voltages corresponding to the N first offsetting processes and the second output voltages corresponding to the M second offsetting processes in the detection period; wherein: performing the base capacitance offsetting on the capacitor to be detected (Cx) in the i-th first offsetting process comprises: performing a plurality of times of first offsetting operations on the capacitor to be detected (Cx) until charges corresponding the base capacitance of the capacitor to be detected (Cx) are offset in the i-th first offsetting process, each of the plurality of times of first offsetting operations comprising: charging an offset capacitor (Cc) to a first voltage of a voltage source Vcc minus a voltage source Vss; and performing the base capacitance offsetting on the capacitor to be detected (Cx) in the j-th second offsetting process comprises: performing a plurality of times of second offsetting operations on the capacitor to be detected (Cx) until the charges corresponding the base capacitance of the capacitor to be detected (Cx) are offset in the j-th second offsetting process, each of the plurality of times of second offsetting operations comprising: charging the offset capacitor (Cc) to a second voltage of the voltage source Vss minus the voltage source Vcc. performing charging, base capacitance offsetting, and charge transferring successively on a capacitor to be detected (Cx) in an i-th first offsetting process of the first offsetting processes, to generate a first output voltage, wherein i≤N; performing discharging, base capacitance offsetting, and charge transferring on the capacitor to be detected (Cx) successively in a j-th second offsetting process of the second offsetting processes, to generate a second output voltage, wherein j≤M; and determining a capacitance variation of the capacitor to be detected (Cx) before and after the capacitor to be detected (Cx) is affected by an external electric field based on the first output voltages corresponding to the N first offsetting processes and the second output voltages corresponding to the M second offsetting processes in the detection period; wherein: performing the base capacitance offsetting on the capacitor to be detected (Cx) in the i-th first offsetting process comprises: performing a plurality of times of first offsetting operations on the capacitor to be detected (Cx) until charges corresponding the base capacitance of the capacitor to be detected (Cx) are offset in the i-th first offsetting process, each of the plurality of times of first offsetting operations comprising: charging an offset capacitor (Cc) to a first voltage of a voltage source Vcc minus a voltage source Vss; and performing the base capacitance offsetting on the capacitor to be detected (Cx) in the j-th second offsetting process comprises: performing a plurality of times of second offsetting operations on the capacitor to be detected (Cx) until the charges corresponding the base capacitance of the capacitor to be detected (Cx) are offset in the j-th second offsetting process, each of the plurality of times of second offsetting operations comprising: charging the offset capacitor (Cc) to a second voltage of the voltage source Vss minus the voltage source Vcc. performing the base capacitance offsetting on the capacitor to be detected (Cx) in the i-th first offsetting process comprises: performing a plurality of times of first offsetting operations on the capacitor to be detected (Cx) until charges corresponding the base capacitance of the capacitor to be detected (Cx) are offset in the i-th first offsetting process, each of the plurality of times of first offsetting operations comprising: charging an offset capacitor (Cc) to a first voltage of a voltage source Vcc minus a voltage source Vss; and performing the base capacitance offsetting on the capacitor to be detected (Cx) in the j-th second offsetting process comprises: performing a plurality of times of second offsetting operations on the capacitor to be detected (Cx) until the charges corresponding the base capacitance of the capacitor to be detected (Cx) are offset in the j-th second offsetting process, each of the plurality of times of second offsetting operations comprising: charging the offset capacitor (Cc) to a second voltage of the voltage source Vss minus the voltage source Vcc.