An optical characteristic measurement device comprising: a) a division optical system including a first polarizing plate and a second polarizing plate, the division optical system arranged to direct a light emitted from an object to be measured, on which a linearly polarized light is incident, to the first polarizing plate and the second polarizing plate; b) an analyzer arranged to allow a synthetic light in a predetermined polarization direction to be transmitted therethrough, the synthetic light being made of a first polarization component transmitted through the first polarizing plate and a second polarization component transmitted through the second polarizing plate; c) an imaging optical system arranged to direct the synthetic light transmitted through the analyzer to a single point so as to thereby form an interference image; d) a detection unit configured to detect a light intensity of the interference image; e) a phase difference changer (13, 31) configured to change a difference in optical path length between the first polarization component and the second polarization component that respectively travel from the first polarizing plate and the second polarizing plate to the analyzer, to thereby change a phase difference between the first polarization component and the second polarization component; and f) a processing unit configured to Fourier-transform data of a change in light intensity detected by the detection unit along with the change in phase difference, to thereby acquire an amplitude per wavelength and a birefringent phase difference per wavelength of the light emitted from the object to be measured. a) a division optical system including a first polarizing plate and a second polarizing plate, the division optical system arranged to direct a light emitted from an object to be measured, on which a linearly polarized light is incident, to the first polarizing plate and the second polarizing plate; b) an analyzer arranged to allow a synthetic light in a predetermined polarization direction to be transmitted therethrough, the synthetic light being made of a first polarization component transmitted through the first polarizing plate and a second polarization component transmitted through the second polarizing plate; c) an imaging optical system arranged to direct the synthetic light transmitted through the analyzer to a single point so as to thereby form an interference image; d) a detection unit configured to detect a light intensity of the interference image; e) a phase difference changer (13, 31) configured to change a difference in optical path length between the first polarization component and the second polarization component that respectively travel from the first polarizing plate and the second polarizing plate to the analyzer, to thereby change a phase difference between the first polarization component and the second polarization component; and f) a processing unit configured to Fourier-transform data of a change in light intensity detected by the detection unit along with the change in phase difference, to thereby acquire an amplitude per wavelength and a birefringent phase difference per wavelength of the light emitted from the object to be measured.