A test system for testing a lead wire assembly, wherein the lead wire assembly comprises a plurality of connectors connected by lead wires, and wherein the test system comprises: at least one adapter having a data memory, a first connector configured to be coupled to one of the connectors of the lead wire assembly, a second connector and a bundle of lead wires connecting contacts of the first connector with contacts of the second connector, and wherein terminals of the data memory are connected with contacts of the second connector; a test device comprising: a terminal assembly on which a plurality of contacts is mounted, the contacts of the second connector being connectable to a selectable group of adjacent contacts of the terminal assembly; wherein the contacts of the terminal assembly are arranged next to each other such that the second connector is engageable with the terminal assembly in a plurality of different positions; a measuring device with at least two terminals (16, 17) for measuring at least one electrical characteristic; a memory readout device having at least two terminals (54, 55) for reading out the data memory of the adapter; and a switching matrix for selectively connecting the terminals (16, 17) of the measuring device and the terminals (54, 55) of the memory readout device on the one hand, to the contacts of the terminal assembly, on the other hand; characterized in that the test device is adapted to successively connect the terminals of the memory readout device to different combinations of contacts of the terminal assembly by actuating the switching matrix and to make a respective memory readout attempt by the memory readout device and to identify a position of the plurality of positions for the second connector depending thereon, to which positions the adapter is connected to the terminal assembly via the second connector. at least one adapter having a data memory, a first connector configured to be coupled to one of the connectors of the lead wire assembly, a second connector and a bundle of lead wires connecting contacts of the first connector with contacts of the second connector, and wherein terminals of the data memory are connected with contacts of the second connector; a test device comprising: a terminal assembly on which a plurality of contacts is mounted, the contacts of the second connector being connectable to a selectable group of adjacent contacts of the terminal assembly; wherein the contacts of the terminal assembly are arranged next to each other such that the second connector is engageable with the terminal assembly in a plurality of different positions; a measuring device with at least two terminals (16, 17) for measuring at least one electrical characteristic; a memory readout device having at least two terminals (54, 55) for reading out the data memory of the adapter; and a switching matrix for selectively connecting the terminals (16, 17) of the measuring device and the terminals (54, 55) of the memory readout device on the one hand, to the contacts of the terminal assembly, on the other hand; a terminal assembly on which a plurality of contacts is mounted, the contacts of the second connector being connectable to a selectable group of adjacent contacts of the terminal assembly; wherein the contacts of the terminal assembly are arranged next to each other such that the second connector is engageable with the terminal assembly in a plurality of different positions; a measuring device with at least two terminals (16, 17) for measuring at least one electrical characteristic; a memory readout device having at least two terminals (54, 55) for reading out the data memory of the adapter; and a switching matrix for selectively connecting the terminals (16, 17) of the measuring device and the terminals (54, 55) of the memory readout device on the one hand, to the contacts of the terminal assembly, on the other hand; characterized in that the test device is adapted to successively connect the terminals of the memory readout device to different combinations of contacts of the terminal assembly by actuating the switching matrix and to make a respective memory readout attempt by the memory readout device and to identify a position of the plurality of positions for the second connector depending thereon, to which positions the adapter is connected to the terminal assembly via the second connector.