A coated cutting tool comprising a substrate comprising a cubic boron nitride sintered body and a coating layer formed on the substrate, wherein the coating layer comprises a Ti carbonitride layer comprising a composition represented by a following formula (i), Ti(C x N 1-x) (i) in the formula, x represents an atomic ratio of the C element to a total of the C element and the N element at a position where a thickness is 50% from the substrate side in the Ti carbonitride layer, and satisfies 0.1 < x < 0.5, wherein the atomic ratio x of the C element is gradually increased toward the surface opposite to the substrate in the composition of the Ti carbonitride layer; an average thickness of the Ti carbonitride layer is 0.5 μm or more and 5.0 μm or less; in the Ti carbonitride layer, an atomic ratio R75 of the C element to a total of the C element and the N element at a position where a thickness is 75% from the substrate side is higher than an atomic ratio R25 of the C element to a total of the C element and the N element at a position where a thickness is 25% from the substrate side; in the Ti carbonitride layer, a difference, R75-R25, between the atomic ratio R75 of the C element to a total of the C element and the N element at a position where a thickness is 75% from the substrate side and the atomic ratio R25 of the C element to a total of the C element and the N element at a position where a thickness is 25% from the substrate side is 0.1 or more and 0.3 or less; in the Ti carbonitride layer, a texture coefficient TC of a plane represented by a following formula is 1.0 or more and 2.0 or less, wherein the texture coefficient TC of the plane is calculated according to the description; and in X-ray diffraction measurement of the Ti carbonitride layer, an absolute value of a difference between a maximum value and a minimum value of 2θ represented by a following formula is 0.1° or less on the plane when the measurement is performed at each of ψ angles of 0°, 30°, 50° and 70°. in the formula, l(hkl) represents a peak intensity of an (hkl) plane in X-ray diffraction of the Ti carbonitride layer, I 0 (hkl) represents a standard diffraction intensity of the (hkl) plane in an ICDD card number 00-042-1488, and (hkl) indicates six crystal planes of,,,,,; Absolute value of the difference between the maximum value and the minimum value of 2 θ = 2 θ max − 2 θ min in the formula, 2θmax represents a maximum value among peak positions 2θ of a crystal plane when the ψ angle is 0°, 30°, 50°, and 70°, and 2θmin represents a minimum value among peak positions 2θ of the crystal plane when the ψ angle is 0°, 30°, 50°, and 70°. the coating layer comprises a Ti carbonitride layer comprising a composition represented by a following formula (i), Ti(C x N 1-x) (i) in the formula, x represents an atomic ratio of the C element to a total of the C element and the N element at a position where a thickness is 50% from the substrate side in the Ti carbonitride layer, and satisfies 0.1 < x < 0.5, wherein the atomic ratio x of the C element is gradually increased toward the surface opposite to the substrate in the composition of the Ti carbonitride layer; an average thickness of the Ti carbonitride layer is 0.5 μm or more and 5.0 μm or less; in the Ti carbonitride layer, an atomic ratio R75 of the C element to a total of the C element and the N element at a position where a thickness is 75% from the substrate side is higher than an atomic ratio R25 of the C element to a total of the C element and the N element at a position where a thickness is 25% from the substrate side; in the Ti carbonitride layer, a difference, R75-R25, between the atomic ratio R75 of the C element to a total of the C element and the N element at a position where a thickness is 75% from the substrate side and the atomic ratio R25 of the C element to a total of the C element and the N element at a position where a thickness is 25% from the substrate side is 0.1 or more and 0.3 or less; in the Ti carbonitride layer, a texture coefficient TC of a plane represented by a following formula is 1.0 or more and 2.0 or less, wherein the texture coefficient TC of the plane is calculated according to the description; and in X-ray diffraction measurement of the Ti carbonitride layer, an absolute value of a difference between a maximum value and a minimum value of 2θ represented by a following formula is 0.1° or less on the plane when the measurement is performed at each of ψ angles of 0°, 30°, 50° and 70°. in the formula, l(hkl) represents a peak intensity of an (hkl) plane in X-ray diffraction of the Ti carbonitride layer, I 0 (hkl) represents a standard diffraction intensity of the (hkl) plane in an ICDD card number 00-042-1488, and (hkl) indicates six crystal planes of,,,,,; Absolute value of the difference between the maximum value and the minimum value of 2 θ = 2 θ max − 2 θ min in the formula, 2θmax represents a maximum value among peak positions 2θ of a crystal plane when the ψ angle is 0°, 30°, 50°, and 70°, and 2θmin represents a minimum value among peak positions 2θ of the crystal plane when the ψ angle is 0°, 30°, 50°, and 70°.