An apparatus for at least one of detecting, inspecting and screening at least one of a counterfeit semiconductor, a counterfeited integrated circuit and a counterfeited device employing the counterfeit semiconductor and/or the counterfeit integrated circuit, said apparatus comprising: (a) a high precision input source configured to generate a high precision oscillatory input signal for driving at least one of a signal input and a clock input of a powered at least one of a semiconductor, an integrated circuit and a device employing the semiconductor and/or the integrated circuit, said high precision signal having a frequency thereof being consistent with input requirements of the at least one of the semiconductor, the integrated circuit and the device employing the semiconductor and/or the integrated circuit; (b) a radio frequency collection means positioned in a close proximity to the at least one of the semiconductor, the integrated circuit and the device employing the semiconductor and/or the integrated circuit, said RF collection means configured to receive emissions radiated by the at least one of the semiconductor, the integrated circuit and the device employing the semiconductor and/or the integrated circuit driven with said high precision signal; and (c) a processor coupled to said RF collection means, said processor processes a signature of said radiated emission and compares said radiated emission signature against at least one emission signature predetermined for said at least one of the semiconductor, the integrated circuit and the device employing the semiconductor and/or the integrated circuit, whereby a resulting match of said comparison defines at least one of a genuine semiconductor, a genuine integrated circuit and a genuine device employing the genuine semiconductor and/or the genuine integrated circuit, wherein characterized in that the said high precision input source is an atomic frequency oscillator. (a) a high precision input source configured to generate a high precision oscillatory input signal for driving at least one of a signal input and a clock input of a powered at least one of a semiconductor, an integrated circuit and a device employing the semiconductor and/or the integrated circuit, said high precision signal having a frequency thereof being consistent with input requirements of the at least one of the semiconductor, the integrated circuit and the device employing the semiconductor and/or the integrated circuit; (b) a radio frequency collection means positioned in a close proximity to the at least one of the semiconductor, the integrated circuit and the device employing the semiconductor and/or the integrated circuit, said RF collection means configured to receive emissions radiated by the at least one of the semiconductor, the integrated circuit and the device employing the semiconductor and/or the integrated circuit driven with said high precision signal; and (c) a processor coupled to said RF collection means, said processor processes a signature of said radiated emission and compares said radiated emission signature against at least one emission signature predetermined for said at least one of the semiconductor, the integrated circuit and the device employing the semiconductor and/or the integrated circuit, whereby a resulting match of said comparison defines at least one of a genuine semiconductor, a genuine integrated circuit and a genuine device employing the genuine semiconductor and/or the genuine integrated circuit, wherein