A loaded board test fixture for testing a plurality of closely spaced test points on a loaded printed circuit board, comprising: an array of relatively widely spaced apart high spring force test probes extending through a probe plate and adapted for electrically connecting to an external electronic test analyzer; a translator fixture removably positioned over the high spring force test probes and adjacent the closely spaced test points on the circuit board; the translator fixture having a top plate for receipt of circuit board components so that an upper surface of the top plate is substantially adjacent to the test points on a loaded printed circuit board, the translator fixture further having a plurality of parallel plates (42, 44, 44a, 44b, 44c, 44d, 44e, 44f) below the top plate; and a plurality of translator pins supported in the translator fixture for alignment with the test probes at one end of the translator fixture and with the closely spaced test points at the opposite end of the translator fixture, the translator pins comprising solid pins having sufficient axial rigidity to effectively translate test forces applied by the test probes to the closely spaced test points, and wherein the test probes are in compliant contact with the translator pins for translating said test forces and electrical test signals between the closely spaced test points on the printed circuit board and connections to the external electronic test analyzer; wherein each of the top plate and the plurality of parallel plates of the translator fixture comprises corresponding guide holes for supporting the translator pins in the translator fixture, and wherein the guide holes are arranged in such a manner that tilt angles of the supported translator pins are minimal. an array of relatively widely spaced apart high spring force test probes extending through a probe plate and adapted for electrically connecting to an external electronic test analyzer; a translator fixture removably positioned over the high spring force test probes and adjacent the closely spaced test points on the circuit board; the translator fixture having a top plate for receipt of circuit board components so that an upper surface of the top plate is substantially adjacent to the test points on a loaded printed circuit board, the translator fixture further having a plurality of parallel plates (42, 44, 44a, 44b, 44c, 44d, 44e, 44f) below the top plate; and a plurality of translator pins supported in the translator fixture for alignment with the test probes at one end of the translator fixture and with the closely spaced test points at the opposite end of the translator fixture, the translator pins comprising solid pins having sufficient axial rigidity to effectively translate test forces applied by the test probes to the closely spaced test points, and wherein the test probes are in compliant contact with the translator pins for translating said test forces and electrical test signals between the closely spaced test points on the printed circuit board and connections to the external electronic test analyzer; wherein each of the top plate and the plurality of parallel plates of the translator fixture comprises corresponding guide holes for supporting the translator pins in the translator fixture, and wherein the guide holes are arranged in such a manner that tilt angles of the supported translator pins are minimal.