An image inspection apparatus for inspecting an image recorded on a recording medium, comprising: an image pickup part that acquires an inspection image by capturing a recorded image; a first accumulation part that obtains a reference accumulated value distribution by accumulating values of pixels in a reference image that are arranged in a predetermined image recording direction, said reference accumulated value distribution being a distribution of accumulated values in a direction that is perpendicular to said image recording direction, and said reference image being generated in accordance with data used in image recording; a second accumulation part that obtains an inspection accumulated value distribution by accumulating values of pixels in said inspection image that are arranged in said image recording direction, said inspection accumulated value distribution being a distribution of accumulated values in the direction perpendicular to said image recording direction; a sensitivity correction part that performs sensitivity correction processing on at least one of said inspection accumulated value distribution and said reference accumulated value distribution; and a comparison part that compares said inspection accumulated value distribution (62, 62a) and said reference accumulated value distribution after said sensitivity correction processing, and characterized in that said sensitivity correction part performs, on at least one of said inspection accumulated value distribution and said reference accumulated value distribution, sensitivity correction in which any local peaks in said inspection accumulated value distribution are removed based on surrounding accumulated values, and then, based on a difference between said inspection accumulated value distribution and said reference accumulated value distribution or a ratio between said inspection accumulated value distribution and said reference accumulated value distribution, the accumulated value at each position in said inspection accumulated value distribution is corrected so as to relatively approach a plurality of accumulated values other than said local peaks in said inspection accumulated value distribution to a plurality of corresponding accumulated values in said reference accumulated value distribution. an image pickup part that acquires an inspection image by capturing a recorded image; a first accumulation part that obtains a reference accumulated value distribution by accumulating values of pixels in a reference image that are arranged in a predetermined image recording direction, said reference accumulated value distribution being a distribution of accumulated values in a direction that is perpendicular to said image recording direction, and said reference image being generated in accordance with data used in image recording; a second accumulation part that obtains an inspection accumulated value distribution by accumulating values of pixels in said inspection image that are arranged in said image recording direction, said inspection accumulated value distribution being a distribution of accumulated values in the direction perpendicular to said image recording direction; a sensitivity correction part that performs sensitivity correction processing on at least one of said inspection accumulated value distribution and said reference accumulated value distribution; and a comparison part that compares said inspection accumulated value distribution (62, 62a) and said reference accumulated value distribution after said sensitivity correction processing, and characterized in that said sensitivity correction part performs, on at least one of said inspection accumulated value distribution and said reference accumulated value distribution, sensitivity correction in which any local peaks in said inspection accumulated value distribution are removed based on surrounding accumulated values, and then, based on a difference between said inspection accumulated value distribution and said reference accumulated value distribution or a ratio between said inspection accumulated value distribution and said reference accumulated value distribution, the accumulated value at each position in said inspection accumulated value distribution is corrected so as to relatively approach a plurality of accumulated values other than said local peaks in said inspection accumulated value distribution to a plurality of corresponding accumulated values in said reference accumulated value distribution.