A method of increasing the dynamic range of at least one pixel in a pixel array, the method comprising the steps of: a) determining, for each pixel in the pixel array, a set of reference values ( V t (i)) from a pixel saturation electrical value ( V sat) in accordance with: V t i = V sat * 1 2 i − 1 where V t (i) is an i th sub-threshold voltage within the pixel saturation electrical value ( V sat) range; b) determining a predetermined integration time ( T 1) in accordance with: T int i = T max * 1 2 n − i where T int (i) is a sub-interval integration time with i = 1, 2,..., n, n is the number of sub-integration intervals, T max is the maximum integration time of a frame, the predetermined integration time ( T 1) being equal to T int and corresponding to the shortest integration time for a pixel in the pixel array; c) taking a first capture for the pixel array using the predetermined integration time ( T 1); d) determining, for each pixel, an electrical pixel output value ( V c1) after the predetermined integration time ( T 1); e) comparing, for each pixel, the determined pixel output electrical value ( V c1) with the set of reference values ( V t (i)) in order to predict an optimum integration time for that pixel; f) selecting, for each pixel, the optimum integration time to be one of: said shortest integration time ( T 1) when said determined pixel output electrical value ( V c1) is above the reference value V t; said maximum integration time ( T max) when said determined pixel output electrical value ( V c1) is lower than the lowest reference value V t ( n) ( V tmax); and an integration time T int ( i) between said shortest and said maximum integration times when said determined pixel output electrical value ( V c1) is between the reference values V t ( i) and V t ( i + 1); g) estimating an offset amount for each pixel having a determined pixel output electrical value ( V c1) which is close to one of said reference values ( V t (i)) and causes at step f) to select a longer integration time for that pixel; and lowering, for said each pixel, the reference value ( V t (i)) by the estimated offset amount for that pixel and using the lowered reference value at step f) in order to determine the optimum integration time for that pixel; and h) taking a second capture for the pixel array, the second capture for each pixel being at its optimum integration time. a) determining, for each pixel in the pixel array, a set of reference values ( V t (i)) from a pixel saturation electrical value ( V sat) in accordance with: V t i = V sat * 1 2 i − 1 where V t (i) is an i th sub-threshold voltage within the pixel saturation electrical value ( V sat) range; b) determining a predetermined integration time ( T 1) in accordance with: T int i = T max * 1 2 n − i where T int (i) is a sub-interval integration time with i = 1, 2,..., n, n is the number of sub-integration intervals, T max is the maximum integration time of a frame, the predetermined integration time ( T 1) being equal to T int and corresponding to the shortest integration time for a pixel in the pixel array; c) taking a first capture for the pixel array using the predetermined integration time ( T 1); d) determining, for each pixel, an electrical pixel output value ( V c1) after the predetermined integration time ( T 1); e) comparing, for each pixel, the determined pixel output electrical value ( V c1) with the set of reference values ( V t (i)) in order to predict an optimum integration time for that pixel; f) selecting, for each pixel, the optimum integration time to be one of: said shortest integration time ( T 1) when said determined pixel output electrical value ( V c1) is above the reference value V t; said maximum integration time ( T max) when said determined pixel output electrical value ( V c1) is lower than the lowest reference value V t ( n) ( V tmax); and an integration time T int ( i) between said shortest and said maximum integration times when said determined pixel output electrical value ( V c1) is between the reference values V t ( i) and V t ( i + 1); g) estimating an offset amount for each pixel having a determined pixel output electrical value ( V c1) which is close to one of said reference values ( V t (i)) and causes at step f) to select a longer integration time for that pixel; and lowering, for said each pixel, the reference value ( V t (i)) by the estimated offset amount for that pixel and using the lowered reference value at step f) in order to determine the optimum integration time for that pixel; and h) taking a second capture for the pixel array, the second capture for each pixel being at its optimum integration time.