A sensor assembly comprising: a capacitive probe; a resistive element, wherein a capacitance of the capacitive probe and a resistance of the resistive element are indicative of characteristics of an environment; an electronic circuit configured to convert the capacitance and the resistance into optical data, wherein the electronic circuit comprises: a sensor interface circuit configured to provide timing signals indicative of the capacitance and the resistance, wherein the sensor interface circuit comprises: an operational amplifier a first signal path configured to excite the capacitive probe and a reference resistance (R REF); wherein an output of the reference resistor (R REF) is connected to an inverting input of the operational amplifier, and the capacitive probe is connected between the output of resistor (R REF) and the output of the operational amplifier; and a second signal path configured to excite the resistive element and a reference capacitance (C REF); wherein an output of the resistive element is connected to the inverting input of the operational amplifier, and the reference capacitance (C REF) is connected between the output of the resistive element and the output of the operational amplifier; wherein the sensor interface circuit is configured to select between the first signal path and the second signal path; and a controller configured to control the sensor interface circuit to select between the first signal path and the second signal path, and to convert the timing signals into the optical data; and an optical interface configured to provide the optical data to an optical link. a capacitive probe; a resistive element, wherein a capacitance of the capacitive probe and a resistance of the resistive element are indicative of characteristics of an environment; a sensor interface circuit configured to provide timing signals indicative of the capacitance and the resistance, wherein the sensor interface circuit comprises: an operational amplifier a first signal path configured to excite the capacitive probe and a reference resistance (R REF); wherein an output of the reference resistor (R REF) is connected to an inverting input of the operational amplifier, and the capacitive probe is connected between the output of resistor (R REF) and the output of the operational amplifier; and a second signal path configured to excite the resistive element and a reference capacitance (C REF); wherein an output of the resistive element is connected to the inverting input of the operational amplifier, and the reference capacitance (C REF) is connected between the output of the resistive element and the output of the operational amplifier; wherein the sensor interface circuit is configured to select between the first signal path and the second signal path; and an operational amplifier a first signal path configured to excite the capacitive probe and a reference resistance (R REF); wherein an output of the reference resistor (R REF) is connected to an inverting input of the operational amplifier, and the capacitive probe is connected between the output of resistor (R REF) and the output of the operational amplifier; and a second signal path configured to excite the resistive element and a reference capacitance (C REF); wherein an output of the resistive element is connected to the inverting input of the operational amplifier, and the reference capacitance (C REF) is connected between the output of the resistive element and the output of the operational amplifier; wherein the sensor interface circuit is configured to select between the first signal path and the second signal path; and a controller configured to control the sensor interface circuit to select between the first signal path and the second signal path, and to convert the timing signals into the optical data; and an optical interface configured to provide the optical data to an optical link.