A method for use at a storage device, the storage device including a controller and a plurality of memory devices (108A, 108B, 108C), the method for testing power characteristics of the plurality of memory devices (108A, 108B, 108C), the method comprising: receiving a command at the controller to initiate a plurality of power tests included in a test matrix, each power test defining a command pattern of memory commands, executing a test program embedded in the controller in response to receiving the command; the test program configured to search the test matrix to identify a pattern of memory commands that causes higher current draw relative to other command patterns in the test matrix; the test program accessing the power tests, wherein accessing the power tests comprises accessing the test matrix from within controller storage; the test program testing the power characteristics of one or more memory devices (108A, 108B, 108C), wherein the testing comprises for each of the plurality of power tests, issuing the command pattern defined for the power test to the one or more memory devices (108A, 108B, 108C); a monitoring device monitoring the power characteristics of the one or more memory devices (108A, 108B, 108C) and sending feedback to an input, the controller receiving the feedback from the monitoring device at the input; and maintaining command patterns and corresponding feedback for subsequent use and analysis, based on the feedback for the issued command patterns, identifying, among the issued command patterns, a command pattern that causes the greatest total current draw from the one or more memory devices (108A, 108B, 108C), and receiving a specific pattern command at the controller to issue the identified command pattern, issuing, in particular repeatedly at specified intervals, the identified command pattern to one or more memory devices, and monitoring the power characteristics as the identified command pattern is issued to the one or more memory devices, in particular monitoring it over time as the identified command pattern is repeatedly issued to the one or more memory devices. receiving a command at the controller to initiate a plurality of power tests included in a test matrix, each power test defining a command pattern of memory commands, executing a test program embedded in the controller in response to receiving the command; the test program configured to search the test matrix to identify a pattern of memory commands that causes higher current draw relative to other command patterns in the test matrix; the test program accessing the power tests, wherein accessing the power tests comprises accessing the test matrix from within controller storage; the test program testing the power characteristics of one or more memory devices (108A, 108B, 108C), wherein the testing comprises for each of the plurality of power tests, issuing the command pattern defined for the power test to the one or more memory devices (108A, 108B, 108C); a monitoring device monitoring the power characteristics of the one or more memory devices (108A, 108B, 108C) and sending feedback to an input, the controller receiving the feedback from the monitoring device at the input; and maintaining command patterns and corresponding feedback for subsequent use and analysis, based on the feedback for the issued command patterns, identifying, among the issued command patterns, a command pattern that causes the greatest total current draw from the one or more memory devices (108A, 108B, 108C), and receiving a specific pattern command at the controller to issue the identified command pattern, issuing, in particular repeatedly at specified intervals, the identified command pattern to one or more memory devices, and monitoring the power characteristics as the identified command pattern is issued to the one or more memory devices, in particular monitoring it over time as the identified command pattern is repeatedly issued to the one or more memory devices.