A mass spectrometry, MS, apparatus for chemical analysis, the apparatus comprising: a mass spectrometer; an ionization source coupled to the mass spectrometer; a flow injection system, (FIS, coupled to the ionization source, wherein the ionization source is configured to provide an ionized gas flow of an analyte towards an entrance of the mass spectrometer, wherein the ionization source is further configured to provide a second gas flow (22; 23; 24) of a second gas; wherein the apparatus is configured to: measure a mass spectrometer, MS, signal of the analyte; characterized in that the apparatus is furthermore configured to: analyze a dependency of the MS signal of the analyte versus a parameter of the second gas flow or a state of the second gas flow, wherein analyzing the dependency of the MS signal of the analyte includes comparing the dependency of the MS signal of the analyte with a reference dependency; determine a condition of the apparatus based on the analyzed dependency, wherein determining the condition of the apparatus includes one of: (i) classifying the condition of the apparatus as being normal without a malfunction or abnormal having the malfunction, and/or determining that the apparatus is in an error condition; (ii) quantifying the condition of the apparatus or classifying the condition of the apparatus into a plurality of categories; and (iii) predicting a point in time when the apparatus will be in an error state. a mass spectrometer; an ionization source coupled to the mass spectrometer; a flow injection system, (FIS, coupled to the ionization source, wherein the ionization source is configured to provide an ionized gas flow of an analyte towards an entrance of the mass spectrometer, wherein the ionization source is further configured to provide a second gas flow (22; 23; 24) of a second gas; wherein the apparatus is configured to: measure a mass spectrometer, MS, signal of the analyte; characterized in that the apparatus is furthermore configured to: analyze a dependency of the MS signal of the analyte versus a parameter of the second gas flow or a state of the second gas flow, wherein analyzing the dependency of the MS signal of the analyte includes comparing the dependency of the MS signal of the analyte with a reference dependency; determine a condition of the apparatus based on the analyzed dependency, wherein determining the condition of the apparatus includes one of: (i) classifying the condition of the apparatus as being normal without a malfunction or abnormal having the malfunction, and/or determining that the apparatus is in an error condition; (ii) quantifying the condition of the apparatus or classifying the condition of the apparatus into a plurality of categories; and (iii) predicting a point in time when the apparatus will be in an error state. measure a mass spectrometer, MS, signal of the analyte; characterized in that the apparatus is furthermore configured to: analyze a dependency of the MS signal of the analyte versus a parameter of the second gas flow or a state of the second gas flow, wherein analyzing the dependency of the MS signal of the analyte includes comparing the dependency of the MS signal of the analyte with a reference dependency; determine a condition of the apparatus based on the analyzed dependency, wherein determining the condition of the apparatus includes one of: (i) classifying the condition of the apparatus as being normal without a malfunction or abnormal having the malfunction, and/or determining that the apparatus is in an error condition; (ii) quantifying the condition of the apparatus or classifying the condition of the apparatus into a plurality of categories; and (iii) predicting a point in time when the apparatus will be in an error state. (i) classifying the condition of the apparatus as being normal without a malfunction or abnormal having the malfunction, and/or determining that the apparatus is in an error condition; (ii) quantifying the condition of the apparatus or classifying the condition of the apparatus into a plurality of categories; and (iii) predicting a point in time when the apparatus will be in an error state.