An exception handling test apparatus for a system including a device driver, a device manager, and an application, the apparatus comprising: a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, wherein the defect model includes defects related to connection between the application and a device, and wherein the modified device driver generates a defect in the operation of the system by modifying data in a communication process between the application and the device according to a modification rule; a hooking module configured to hook the device driver to the modified device driver by changing information of a start address of the device driver into start address of an operation of the modified device driver; a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, the test information including current call-stack information, device driver information, and process information; and an analysis module configured to analyze the test information collected by the scanning module, wherein if the test information indicates that a defect has occurred, the application performs exception handling according to the generated defect, and wherein if the exception handling has not performed properly, the analysis module analyzes the test information as at least one of entire system down, some process down, an abnormal termination of some processes, an abnormal operation of some processes, an abnormal return and no error code, and a normal return and incorrect error code return. a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, wherein the defect model includes defects related to connection between the application and a device, and wherein the modified device driver generates a defect in the operation of the system by modifying data in a communication process between the application and the device according to a modification rule; a hooking module configured to hook the device driver to the modified device driver by changing information of a start address of the device driver into start address of an operation of the modified device driver; a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, the test information including current call-stack information, device driver information, and process information; and an analysis module configured to analyze the test information collected by the scanning module, wherein if the test information indicates that a defect has occurred, the application performs exception handling according to the generated defect, and wherein if the exception handling has not performed properly, the analysis module analyzes the test information as at least one of entire system down, some process down, an abnormal termination of some processes, an abnormal operation of some processes, an abnormal return and no error code, and a normal return and incorrect error code return.