An evaporation equipment, comprising: a support, which is arranged for loading a substrate to be coated by an evaporation process, wherein a loading surface of the support includes a plurality of zones (201,202,203), and each of the plurality of zones corresponds to a region to be coated of the substrate; and a zone temperature controlling device, which includes at least two temperature controlling parts and at least one temperature controlling device, wherein each of the plurality of zones (201,202,203) is arranged with a temperature controlling part, and the temperature controlling device is configured to control temperatures provided by the temperature controlling parts, so as to control corresponding deposition rates of film coating on the regions to be coated; characterized in that the evaporation equipment comprises: a film thickness measuring device, which is connected with the temperature controlling device(s), and is configured to measure a thickness of film coating within each of the regions to be coated of the substrate after the evaporation process and provide the measured thickness of film coating within each of the regions to be coated of the substrate to the temperature controlling device(s); wherein the temperature controlling device(s) is(are) further configured to determine whether or not the measured thickness of film coating within each of the regions to be coated of the substrate meets a predetermined thickness, maintain the temperature provided by the temperature controlling parts for the region(s) to be coated and coat a next substrate by an evaporation process at the current temperature provided by the temperature controlling parts where the measured thickness of film coating meets the predetermined thickness; and adjust the temperature provided by the temperature controlling parts for the region(s) to be coated and coat a next substrate by an evaporation process at the adjusted temperature provided by the temperature controlling parts where the measured thickness of film coating does not meet the predetermined thickness. a support, which is arranged for loading a substrate to be coated by an evaporation process, wherein a loading surface of the support includes a plurality of zones (201,202,203), and each of the plurality of zones corresponds to a region to be coated of the substrate; and a zone temperature controlling device, which includes at least two temperature controlling parts and at least one temperature controlling device, wherein each of the plurality of zones (201,202,203) is arranged with a temperature controlling part, and the temperature controlling device is configured to control temperatures provided by the temperature controlling parts, so as to control corresponding deposition rates of film coating on the regions to be coated; characterized in that the evaporation equipment comprises: a film thickness measuring device, which is connected with the temperature controlling device(s), and is configured to measure a thickness of film coating within each of the regions to be coated of the substrate after the evaporation process and provide the measured thickness of film coating within each of the regions to be coated of the substrate to the temperature controlling device(s); wherein the temperature controlling device(s) is(are) further configured to determine whether or not the measured thickness of film coating within each of the regions to be coated of the substrate meets a predetermined thickness, maintain the temperature provided by the temperature controlling parts for the region(s) to be coated and coat a next substrate by an evaporation process at the current temperature provided by the temperature controlling parts where the measured thickness of film coating meets the predetermined thickness; and adjust the temperature provided by the temperature controlling parts for the region(s) to be coated and coat a next substrate by an evaporation process at the adjusted temperature provided by the temperature controlling parts where the measured thickness of film coating does not meet the predetermined thickness. a film thickness measuring device, which is connected with the temperature controlling device(s), and is configured to measure a thickness of film coating within each of the regions to be coated of the substrate after the evaporation process and provide the measured thickness of film coating within each of the regions to be coated of the substrate to the temperature controlling device(s); wherein the temperature controlling device(s) is(are) further configured to determine whether or not the measured thickness of film coating within each of the regions to be coated of the substrate meets a predetermined thickness, maintain the temperature provided by the temperature controlling parts for the region(s) to be coated and coat a next substrate by an evaporation process at the current temperature provided by the temperature controlling parts where the measured thickness of film coating meets the predetermined thickness; and adjust the temperature provided by the temperature controlling parts for the region(s) to be coated and coat a next substrate by an evaporation process at the adjusted temperature provided by the temperature controlling parts where the measured thickness of film coating does not meet the predetermined thickness.