An interferometric measurement system for use with an optical waveguide, comprising: a memory configured to store a reference data set for multiple points along a reference segment of the optical waveguide; interferometric detection circuitry configured to detect and store a measurement data set for multiple points along a measurement segment of the optical waveguide during a measurement operation, wherein a spectral range of the reference data set is greater than a spectral range of the measurement data set; and processing circuitry configured to: shift the reference data set and the measurement data set in a positive direction in a spectral domain to induce a first phase slope in a temporal domain; compare phases of the positively-shifted reference data set and the positively-shifted measurement data set to provide a phase of a positively-shifted reference and measurement data set pair having the first phase slope; shift the reference data set and the measurement data set in a negative direction in a spectral domain to induce a second phase slope in a temporal domain, the first and second slopes having opposite signs; compare phases of the negatively-shifted reference data set and the negatively-shifted measurement data set to provide a phase of a negatively-shifted reference and measurement data set pair having the second phase slope; compare a phase of the positively-shifted reference and measurement data set pair to a phase of the negatively-shifted reference and measurement data set pair, and determine a temporal delay between the reference data set and the measurement data set based on a crossing point of the phases; determine an alignment of the reference data set and the measurement data set at the multiple points along the measurement segment based on the temporal delay; and determine a measurement parameter associated with the optical waveguide based on the alignment of the reference data set and the measurement data set. a memory configured to store a reference data set for multiple points along a reference segment of the optical waveguide; interferometric detection circuitry configured to detect and store a measurement data set for multiple points along a measurement segment of the optical waveguide during a measurement operation, wherein a spectral range of the reference data set is greater than a spectral range of the measurement data set; and processing circuitry configured to: shift the reference data set and the measurement data set in a positive direction in a spectral domain to induce a first phase slope in a temporal domain; compare phases of the positively-shifted reference data set and the positively-shifted measurement data set to provide a phase of a positively-shifted reference and measurement data set pair having the first phase slope; shift the reference data set and the measurement data set in a negative direction in a spectral domain to induce a second phase slope in a temporal domain, the first and second slopes having opposite signs; compare phases of the negatively-shifted reference data set and the negatively-shifted measurement data set to provide a phase of a negatively-shifted reference and measurement data set pair having the second phase slope; compare a phase of the positively-shifted reference and measurement data set pair to a phase of the negatively-shifted reference and measurement data set pair, and determine a temporal delay between the reference data set and the measurement data set based on a crossing point of the phases; determine an alignment of the reference data set and the measurement data set at the multiple points along the measurement segment based on the temporal delay; and determine a measurement parameter associated with the optical waveguide based on the alignment of the reference data set and the measurement data set. shift the reference data set and the measurement data set in a positive direction in a spectral domain to induce a first phase slope in a temporal domain; compare phases of the positively-shifted reference data set and the positively-shifted measurement data set to provide a phase of a positively-shifted reference and measurement data set pair having the first phase slope; shift the reference data set and the measurement data set in a negative direction in a spectral domain to induce a second phase slope in a temporal domain, the first and second slopes having opposite signs; compare phases of the negatively-shifted reference data set and the negatively-shifted measurement data set to provide a phase of a negatively-shifted reference and measurement data set pair having the second phase slope; compare a phase of the positively-shifted reference and measurement data set pair to a phase of the negatively-shifted reference and measurement data set pair, and determine a temporal delay between the reference data set and the measurement data set based on a crossing point of the phases; determine an alignment of the reference data set and the measurement data set at the multiple points along the measurement segment based on the temporal delay; and determine a measurement parameter associated with the optical waveguide based on the alignment of the reference data set and the measurement data set.