A polymeric piezoelectric film, comprising a helical chiral polymer having a weight average molecular weight of from 50,000 to 1,000,000 and optical activity, wherein, in the film: a crystallinity given by a DSC method is from 20% to 80%; a standardized molecular orientation MORc is from 3.5 to 15.0 when a reference thickness measured by a microwave transmission-type molecular orientation meter is 50 μm; and wherein MORc is determined by the following formula MORc = tc / t × MOR − 1 + 1 wherein tc: reference thickness to which the thickness should be corrected; t: thickness of polymeric piezoelectric film; characterized in that, when a direction parallel to a phase difference streak is a direction X, a direction perpendicular to the direction X and parallel to a main plane of a film is a direction Y, and the phase difference streak is evaluated by an evaluation method A, per a length of 1,000 mm in the direction Y, a number of phase difference streaks with an evaluation value of 60 or more is 0, and a sum of evaluation values of phase difference streaks with an evaluation value of 20 or more is 1000 or less, the evaluation method A comprising: (a) with respect to the direction Y, acquiring in-plane phase difference data by measurement with a birefringence evaluation system of a film at intervals of 0.143 mm to obtain an in-plane phase difference profile, the in-plane phase difference data of the film being the product of the birefringence and the thickness; (b) performing fast Fourier transformation on the obtained in-plane phase difference profile, removing low frequency components using 0.273/mm as a cutoff frequency, and then performing inverse Fourier transformation; (c) calculating slopes of two adjacent points with respect to the in-plane phase difference profile after inverse Fourier transformation and converting the slopes into a slope profile; and (d) taking a height from a bottom point of a valley of the obtained slope profile to an apex of a mountain adjacent to the valley as an evaluation value of a phase difference streak. a crystallinity given by a DSC method is from 20% to 80%; a standardized molecular orientation MORc is from 3.5 to 15.0 when a reference thickness measured by a microwave transmission-type molecular orientation meter is 50 μm; and wherein MORc is determined by the following formula MORc = tc / t × MOR − 1 + 1 wherein tc: reference thickness to which the thickness should be corrected; t: thickness of polymeric piezoelectric film; characterized in that, when a direction parallel to a phase difference streak is a direction X, a direction perpendicular to the direction X and parallel to a main plane of a film is a direction Y, and the phase difference streak is evaluated by an evaluation method A, per a length of 1,000 mm in the direction Y, a number of phase difference streaks with an evaluation value of 60 or more is 0, and a sum of evaluation values of phase difference streaks with an evaluation value of 20 or more is 1000 or less, the evaluation method A comprising: (a) with respect to the direction Y, acquiring in-plane phase difference data by measurement with a birefringence evaluation system of a film at intervals of 0.143 mm to obtain an in-plane phase difference profile, the in-plane phase difference data of the film being the product of the birefringence and the thickness; (b) performing fast Fourier transformation on the obtained in-plane phase difference profile, removing low frequency components using 0.273/mm as a cutoff frequency, and then performing inverse Fourier transformation; (c) calculating slopes of two adjacent points with respect to the in-plane phase difference profile after inverse Fourier transformation and converting the slopes into a slope profile; and (d) taking a height from a bottom point of a valley of the obtained slope profile to an apex of a mountain adjacent to the valley as an evaluation value of a phase difference streak. (a) with respect to the direction Y, acquiring in-plane phase difference data by measurement with a birefringence evaluation system of a film at intervals of 0.143 mm to obtain an in-plane phase difference profile, the in-plane phase difference data of the film being the product of the birefringence and the thickness; (b) performing fast Fourier transformation on the obtained in-plane phase difference profile, removing low frequency components using 0.273/mm as a cutoff frequency, and then performing inverse Fourier transformation; (c) calculating slopes of two adjacent points with respect to the in-plane phase difference profile after inverse Fourier transformation and converting the slopes into a slope profile; and (d) taking a height from a bottom point of a valley of the obtained slope profile to an apex of a mountain adjacent to the valley as an evaluation value of a phase difference streak.