An industrial X-ray workpiece measuring system, in particular an industrial X-ray tomography system, comprising an X-ray source disposed in an X-ray protection housing and having an X-ray focal spot, workpiece support means for holding a non-medical workpiece to be examined, the workpiece support means being disposed in the X-ray protection housing and preferably configured to perform a rotary motion, and X-ray detector means (10a, 10b, 10c) provided on and/or in the X-ray protection housing and configured to detect an X-ray of the X-ray source radiographing a workpiece held on the workpiece support means, downstream of which electronic evaluation means, in particular for defect evaluation of an X-ray image of the workpiece to be examined produced by the X-ray detector means, can be disposed, the X-ray detector means comprising scintillator means for converting incident X-rays into visible light on a light exit surface and optical detector means disposed optically downstream thereof and comprising a plurality of image pixels in a physical pixel density disposed adjacent to each other at regular intervals and forming a common sensor incidence surface, the image pixels detecting the visible light produced by the scintillator means for electronic evaluation at an effective pixel density, the optical detector means are configured in such a manner that the physical and/or the effective pixel density can be changed in a predetermined manner, in particular as a function of a specific dimension of the workpiece to be examined, during configuration, set-up, interchange and/or evaluation of the optical detector means, and/or a ratio of the light exit surface relative to the sensor incidence surface does not equal 1 and/or can be changed during configuration, set-up, interchange and/or evaluation of the optical detector means, characterized in that a first scintillator module realizing the scintillator means is configured to be interchangeable with a second scintillator module differing from the first scintillator module in a blur property relevant to X-ray conversion, and that the X-ray focal spot effective for an X-ray output from the X-ray source is dimensioned and configured in such a manner that the area of the X-ray focal spot is greater than or equal to a pixel surface size resulting from the inverse of the effective pixel density, the industrial X-ray workpiece measuring system being configured in such a manner that it can be transferred from a first operating mode with a first physical and/or effective pixel density to a second operating mode with a second physical and/or effective pixel density, which differs from the first one, by configuration, set-up, interchange and/or evaluation of the optical detector means, and the first scintillator module being assigned to the first operating mode and the second scintillator module being assigned to the second operating mode. workpiece support means for holding a non-medical workpiece to be examined, the workpiece support means being disposed in the X-ray protection housing and preferably configured to perform a rotary motion, and X-ray detector means (10a, 10b, 10c) provided on and/or in the X-ray protection housing and configured to detect an X-ray of the X-ray source radiographing a workpiece held on the workpiece support means, downstream of which electronic evaluation means, in particular for defect evaluation of an X-ray image of the workpiece to be examined produced by the X-ray detector means, can be disposed, the X-ray detector means comprising scintillator means for converting incident X-rays into visible light on a light exit surface and optical detector means disposed optically downstream thereof and comprising a plurality of image pixels in a physical pixel density disposed adjacent to each other at regular intervals and forming a common sensor incidence surface, the image pixels detecting the visible light produced by the scintillator means for electronic evaluation at an effective pixel density, the optical detector means are configured in such a manner that the physical and/or the effective pixel density can be changed in a predetermined manner, in particular as a function of a specific dimension of the workpiece to be examined, during configuration, set-up, interchange and/or evaluation of the optical detector means, and/or a ratio of the light exit surface relative to the sensor incidence surface does not equal 1 and/or can be changed during configuration, set-up, interchange and/or evaluation of the optical detector means, characterized in that a first scintillator module realizing the scintillator means is configured to be interchangeable with a second scintillator module differing from the first scintillator module in a blur property relevant to X-ray conversion, and that the X-ray focal spot effective for an X-ray output from the X-ray source is dimensioned and configured in such a manner that the area of the X-ray focal spot is greater than or equal to a pixel surface size resulting from the inverse of the effective pixel density, the industrial X-ray workpiece measuring system being configured in such a manner that it can be transferred from a first operating mode with a first physical and/or effective pixel density to a second operating mode with a second physical and/or effective pixel density, which differs from the first one, by configuration, set-up, interchange and/or evaluation of the optical detector means, and the first scintillator module being assigned to the first operating mode and the second scintillator module being assigned to the second operating mode.