Computer-implemented method for determining material interfaces of an object from at least one measurement on the object, a rasterized representation of the object being produced by means of the measurement, the rasterized representation having a plurality of measurement points, a measurement point having at least one piece of image information which indicates a value of a measurement variable for the object at the position of the measurement point, the method comprising the following steps: • determining a parameterization of the rasterized representation of the object, the parameterization assigning at least one parameter to each of the measurement points of a subset of the measurement points of the representation, • applying at least one parameter-dependent edge-detection operator to the measurement points of the rasterized representation, an edge-detection operator being designed to determine the location of at least one material interface in the rasterized representation, and in the determination of the location of a material interface from the image information of a measurement point, the edge-detection operator taking into consideration at least the image information of a subset of the measurement points adjacent to the measurement point in the rasterized representation, at least one of the parameters of a measurement point defining an analysis direction within the rasterized representation, wherein, when applied to a measurement point, the edge-detection operators are designed to determine at least one material interface along the analysis direction defined by means of the parameter of the measurement point, an analysis direction being defined in each case for a subset of the measurement points by means of at least two of the parameters of a measurement point of the subset, at least one edge-detection operator being applied to the measurement point for each analysis direction, which edge-detection operator determines the location of at least one material interface along the particular analysis direction, the parameterization being determined from the image information of at least a subset of the measurement points. a rasterized representation of the object being produced by means of the measurement, the rasterized representation having a plurality of measurement points, a measurement point having at least one piece of image information which indicates a value of a measurement variable for the object at the position of the measurement point, the method comprising the following steps: • determining a parameterization of the rasterized representation of the object, the parameterization assigning at least one parameter to each of the measurement points of a subset of the measurement points of the representation, • applying at least one parameter-dependent edge-detection operator to the measurement points of the rasterized representation, an edge-detection operator being designed to determine the location of at least one material interface in the rasterized representation, and • determining a parameterization of the rasterized representation of the object, the parameterization assigning at least one parameter to each of the measurement points of a subset of the measurement points of the representation, • applying at least one parameter-dependent edge-detection operator to the measurement points of the rasterized representation, an edge-detection operator being designed to determine the location of at least one material interface in the rasterized representation, and in the determination of the location of a material interface from the image information of a measurement point, the edge-detection operator taking into consideration at least the image information of a subset of the measurement points adjacent to the measurement point in the rasterized representation, at least one of the parameters of a measurement point defining an analysis direction within the rasterized representation, wherein, when applied to a measurement point, the edge-detection operators are designed to determine at least one material interface along the analysis direction defined by means of the parameter of the measurement point, an analysis direction being defined in each case for a subset of the measurement points by means of at least two of the parameters of a measurement point of the subset, at least one edge-detection operator being applied to the measurement point for each analysis direction, which edge-detection operator determines the location of at least one material interface along the particular analysis direction, the parameterization being determined from the image information of at least a subset of the measurement points.