An eddy-current flaw detection method for performing eddy-current flaw detection of a conductive pipe by using: magnetic element groups of which magnetic elements (11 to 18, 21 to 28), which either excite or detect a magnetic field, are evenly spaced in each of first and second rows that are formed, in the circumferential direction, around the surface of a column shaped casing, a magnetic element group (31 to 38) being located in a third row around the surface of the casing in the circumferential direction adjacent to the magnetic element group (21 to 28) of the second row, the column shaped casing being formed such that it can be inserted into the conductive pipe, with the first row being located at a position that differs from each of the second and third rows in which the magnetic elements detecting the magnetic field are placed by 1/2 the even spacing of the evenly spaced magnetic elements in the circumferential direction; and first, second and third switching circuits (51, 52, 53) for selecting each magnetic element (11 to 18, 21 to 28, 31 to 38) in the respective first, second and third rows of the magnetic element groups, characterized by comprising: a step of causing the first switching circuit to select in turn each magnetic element (11 to 18) in the first row during corresponding time slots in order to excite a magnetic field; a step of causing the second switching circuit to select, during corresponding time slots, magnetic elements (21 to 28) of the second row two at a time in a sequential manner, each two selected magnetic elements of the second row being located at positions that differ from the magnetic element (11 to 18) that excited the magnetic field by 3/2 the even spacing of the evenly spaced magnetic elements in the circumferential direction in order to detect the excited magnetic field; and a step of causing the third switching circuit to select, during corresponding time slots, magnetic elements (31 to 38) of the third row two at a time in a sequential manner, each two selected magnetic elements of the third row being located at positions that differ from the magnetic element (11 to 18) that excited the magnetic field by 1/2 the even spacing of the evenly spaced magnetic elements in the circumferential direction in order to detect the excited magnetic field. a step of causing the first switching circuit to select in turn each magnetic element (11 to 18) in the first row during corresponding time slots in order to excite a magnetic field; a step of causing the second switching circuit to select, during corresponding time slots, magnetic elements (21 to 28) of the second row two at a time in a sequential manner, each two selected magnetic elements of the second row being located at positions that differ from the magnetic element (11 to 18) that excited the magnetic field by 3/2 the even spacing of the evenly spaced magnetic elements in the circumferential direction in order to detect the excited magnetic field; and a step of causing the third switching circuit to select, during corresponding time slots, magnetic elements (31 to 38) of the third row two at a time in a sequential manner, each two selected magnetic elements of the third row being located at positions that differ from the magnetic element (11 to 18) that excited the magnetic field by 1/2 the even spacing of the evenly spaced magnetic elements in the circumferential direction in order to detect the excited magnetic field.