A method for determining surface data (16, 18) and/or measuring data of a surface (12, 14) having an optically effective first surface and/or an opposite optically effective second surface of an at least partially transparent object, the surfaces (12, 14) comprising a front surface of the object and/or a rear surface of the object and/or one or more interfaces in the object, characterized by - irradiating polarized light with an irradiation polarization of at least one illumination device onto an analysis area of the object to be examined, wherein the light is guided through a polarizer associated with or integrated in the illumination device for adjusting the irradiation polarization, - receiving light reflected at the first and/or second surface (12, 14) with an analysis polarization by means of at least one receiving device, wherein the light is passed through an analyzer associated with or integrated in the receiving device, which is used as a polarizer for analyzing the reflected light, - at least partially suppressing an undesired light intensity reflected from the first or second surface (12, 14) of the object received by the receiving device by adjusting the irradiation polarization of the polarizer and/or the analysis polarization of the analyzer, wherein the adjusting comprises selectively weakening the reflections of the first surface or the second surface of the object, - measuring an intensity distribution (22, 23) or a wavefront (24, 25) of the light received with the analysis polarization to determine the surface data (16, 18) and/or measurement data of the surface (12, 14) in the analysis region, and determining therefrom the surface data (16, 18) and/or measurement data of the surface (12, 14) to the first and/or second surface (12, 14), wherein the surface data (16, 18) and/or measurement data comprises elevation data and/or slope data and/or curvature data of the surface (12, 14), and wherein a predetermined contrast or a maximum contrast to be achieved between the light reflected at the first surface and the light reflected at the second surface is reached or a limit value for the intensity of the unwanted light is reached or undershot, in that the position of the analyzer is determined by calculation or the positions of the polarizer and/or analyzer are adjusted iteratively. - irradiating polarized light with an irradiation polarization of at least one illumination device onto an analysis area of the object to be examined, wherein the light is guided through a polarizer associated with or integrated in the illumination device for adjusting the irradiation polarization, - receiving light reflected at the first and/or second surface (12, 14) with an analysis polarization by means of at least one receiving device, wherein the light is passed through an analyzer associated with or integrated in the receiving device, which is used as a polarizer for analyzing the reflected light, - at least partially suppressing an undesired light intensity reflected from the first or second surface (12, 14) of the object received by the receiving device by adjusting the irradiation polarization of the polarizer and/or the analysis polarization of the analyzer, wherein the adjusting comprises selectively weakening the reflections of the first surface or the second surface of the object, - measuring an intensity distribution (22, 23) or a wavefront (24, 25) of the light received with the analysis polarization to determine the surface data (16, 18) and/or measurement data of the surface (12, 14) in the analysis region, and determining therefrom the surface data (16, 18) and/or measurement data of the surface (12, 14) to the first and/or second surface (12, 14), wherein the surface data (16, 18) and/or measurement data comprises elevation data and/or slope data and/or curvature data of the surface (12, 14), and wherein a predetermined contrast or a maximum contrast to be achieved between the light reflected at the first surface and the light reflected at the second surface is reached or a limit value for the intensity of the unwanted light is reached or undershot, in that the position of the analyzer is determined by calculation or the positions of the polarizer and/or analyzer are adjusted iteratively. wherein the surface data (16, 18) and/or measurement data comprises elevation data and/or slope data and/or curvature data of the surface (12, 14), and wherein a predetermined contrast or a maximum contrast to be achieved between the light reflected at the first surface and the light reflected at the second surface is reached or a limit value for the intensity of the unwanted light is reached or undershot, in that the position of the analyzer is determined by calculation or the positions of the polarizer and/or analyzer are adjusted iteratively.