A charged particle radiation apparatus, comprising: a sample holder including a sample stage to hold a sample; an electron gun to generate an electron beam to be applied to the sample; a detector to detect an electron beam passing through the sample; a processor to perform operation processing of a transmission image that the detector acquires; and a display to display an operation result by the processor, wherein the sample holder includes a rotation mechanism having a rotation axis perpendicular to an irradiation direction of the electron beam, and a shielding mechanism (8, 9) capable of forming an airtight chamber around the sample stage, characterised in that the rotation mechanism is capable of rotating the sample stage around the rotation axis 180 degrees, the shielding mechanism (8, 9) includes a cylindrical covering unit (9, 10) to cover and surround a forward end part of a supporting rod at the sample holder, wherein either the covering unit is configured to slidingly move to connect with the supporting rod via an O-ring, or the shielding mechanism includes a mechanism to slide the supporting rod to connect with the covering unit via the O-ring, so that the shielding mechanism forms the airtight chamber, the sample holder includes gas piping capable of emitting gas in the airtight chamber formed by the shielding mechanism (8, 9), or an optical fiber capable of irradiating light to the sample, and the processor is adapted to cause the display to display a comparison result between first three-dimensional information and second three-dimensional information, the first three-dimensional information being obtained by rotating the sample stage by a predetermined angle before gas emission through the gas piping or light irradiation via the optical fiber to the sample, and the second three-dimensional information being obtained by rotating the sample stage by a predetermined angle after gas emission through the gas piping or light irradiation via the optical fiber to the sample. a sample holder including a sample stage to hold a sample; an electron gun to generate an electron beam to be applied to the sample; a detector to detect an electron beam passing through the sample; a processor to perform operation processing of a transmission image that the detector acquires; and a display to display an operation result by the processor, wherein the sample holder includes a rotation mechanism having a rotation axis perpendicular to an irradiation direction of the electron beam, and a shielding mechanism (8, 9) capable of forming an airtight chamber around the sample stage, characterised in that the rotation mechanism is capable of rotating the sample stage around the rotation axis 180 degrees, the shielding mechanism (8, 9) includes a cylindrical covering unit (9, 10) to cover and surround a forward end part of a supporting rod at the sample holder, wherein either the covering unit is configured to slidingly move to connect with the supporting rod via an O-ring, or the shielding mechanism includes a mechanism to slide the supporting rod to connect with the covering unit via the O-ring, so that the shielding mechanism forms the airtight chamber, the sample holder includes gas piping capable of emitting gas in the airtight chamber formed by the shielding mechanism (8, 9), or an optical fiber capable of irradiating light to the sample, and the processor is adapted to cause the display to display a comparison result between first three-dimensional information and second three-dimensional information, the first three-dimensional information being obtained by rotating the sample stage by a predetermined angle before gas emission through the gas piping or light irradiation via the optical fiber to the sample, and the second three-dimensional information being obtained by rotating the sample stage by a predetermined angle after gas emission through the gas piping or light irradiation via the optical fiber to the sample.