An incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample, comprising: - a source for emitting an incident wave having a given spectral band, - an interference device comprising a reference arm and an object arm, to provide optical interference between a reference wave obtained by reflection of the incident wave on a reflective surface of the reference arm and an object wave obtained by the backscattering of the incident wave by a slice of the sample at a given depth of said sample, when said sample is placed in an object focal plane of a microscope objective placed in the object arm, - a two-dimensional acquisition device for multichannel acquisition of at least a first interference signal and at least a second interference signal resulting from the optical interference of said reference and object waves, the at least two interference signals having a phase difference produced by varying the relative path length difference between the two arms of the interference device, said two-dimensional acquisition device being placed in a plane optically conjugated with said object focal plane of said microscope objective of the object arm, - a processing unit for calculating an image of the slice of the sample based on said first and second interference signals, wherein - the interference device additionally comprises an optical phase modification element for modifying the phase of the wavefront of one of said reference or object waves, and - the microscopy device comprises a control unit for the optical phase modification element, linked to the processing unit, the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit, said statistical parameter comprising at least one of the mean value, the standard deviation and the contrast. - a source for emitting an incident wave having a given spectral band, - an interference device comprising a reference arm and an object arm, to provide optical interference between a reference wave obtained by reflection of the incident wave on a reflective surface of the reference arm and an object wave obtained by the backscattering of the incident wave by a slice of the sample at a given depth of said sample, when said sample is placed in an object focal plane of a microscope objective placed in the object arm, - a two-dimensional acquisition device for multichannel acquisition of at least a first interference signal and at least a second interference signal resulting from the optical interference of said reference and object waves, the at least two interference signals having a phase difference produced by varying the relative path length difference between the two arms of the interference device, said two-dimensional acquisition device being placed in a plane optically conjugated with said object focal plane of said microscope objective of the object arm, - a processing unit for calculating an image of the slice of the sample based on said first and second interference signals, wherein - the interference device additionally comprises an optical phase modification element for modifying the phase of the wavefront of one of said reference or object waves, and - the microscopy device comprises a control unit for the optical phase modification element, linked to the processing unit, the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit, said statistical parameter comprising at least one of the mean value, the standard deviation and the contrast.