An inspection device for a mounter configured to pick up a component supplied from a component supply device and mounts the component on a circuit board, the inspection device comprising: a holding table configured to hold a component; a measurement section provided with a pair of measuring elements configured to move towards and away from each other so as to grip and release the component, and configured to measure electrical characteristics of a component using the pair of measuring elements; a relative movement device configured to relatively move the pair of measuring elements and the holding table; a sorting and collecting device configured to separate and collect the component released from the pair of measurement elements by relatively moving the pair of measuring elements and the holding table by control of the relative movement device based on measurement results of the electrical characteristics of the component as measured by the measurement section, wherein the inspection device, further comprises a main body including a first through-hole and a second through-hole formed with an interval between them along a direction of the relative movement of the pair of measuring elements and the holding table by the relative movement device, wherein the pair of measuring elements includes a fixed element that is fixed to the main body, and a movable element capable of moving away from and towards the fixed element with each of the fixed element and the movable element including an opposing surface (34f,36f) capable of gripping the component, and wherein the sorting and collecting device includes a relative position changing section configured to, by controlling the relative movement device based on the measurement results, switch to and from a first state in which the holding table is positioned above the second through-hole and the opposing surface of the movable element is positioned on the first through-hole side with respect to the holding table, such that the space between the pair of opposing surfaces (34f,36f) connects to the first through hole, and a second state in which the holding table is positioned above the first through-hole and the opposing surface of the movable element is positioned on the second through -hole side with respect to the holding table, and the inspection device includes an air supply device configured to supply air through a passage portion on the fixed element side, the passage portion having an opening facing the opposing surface of the movable element, towards the opposing surface of the movable element when the pair of measuring elements are separated from each other. a holding table configured to hold a component; a measurement section provided with a pair of measuring elements configured to move towards and away from each other so as to grip and release the component, and configured to measure electrical characteristics of a component using the pair of measuring elements; a relative movement device configured to relatively move the pair of measuring elements and the holding table; a sorting and collecting device configured to separate and collect the component released from the pair of measurement elements by relatively moving the pair of measuring elements and the holding table by control of the relative movement device based on measurement results of the electrical characteristics of the component as measured by the measurement section, wherein the inspection device, further comprises a main body including a first through-hole and a second through-hole formed with an interval between them along a direction of the relative movement of the pair of measuring elements and the holding table by the relative movement device, wherein the pair of measuring elements includes a fixed element that is fixed to the main body, and a movable element capable of moving away from and towards the fixed element with each of the fixed element and the movable element including an opposing surface (34f,36f) capable of gripping the component, and wherein the sorting and collecting device includes a relative position changing section configured to, by controlling the relative movement device based on the measurement results, switch to and from a first state in which the holding table is positioned above the second through-hole and the opposing surface of the movable element is positioned on the first through-hole side with respect to the holding table, such that the space between the pair of opposing surfaces (34f,36f) connects to the first through hole, and a second state in which the holding table is positioned above the first through-hole and the opposing surface of the movable element is positioned on the second through -hole side with respect to the holding table, and the inspection device includes an air supply device configured to supply air through a passage portion on the fixed element side, the passage portion having an opening facing the opposing surface of the movable element, towards the opposing surface of the movable element when the pair of measuring elements are separated from each other.