A non-contact measurement apparatus, comprising: a probe for mounting on a coordinate positioning apparatus, comprising an imaging device for capturing an image of an object to be measured; and an image analyser configured to: a) analyse at least one first image of an object obtained by the probe's imaging device from a first perspective and at least one second image of the object obtained by the probe's same imaging device from a second perspective so as to identify in each of the at least first and second images of the object at least one photogrammetric target feature on the object to be measured, determine the two-dimensional coordinates of the at least one photogrammetric target feature on the object within each image, and then, based on the knowledge of the relative location and orientation of the imaging device which took the images, determine the three-dimensional coordinates of the at least one common photogrammetric target feature, and b) obtain topographical data regarding the form of a surface of the object via triangulation and/or phase analysis of a structured light pattern projected on the object and as imaged in at least one image obtained by the probe's same imaging device, the structured light pattern being distorted due to height variation of the surface of the object. a probe for mounting on a coordinate positioning apparatus, comprising an imaging device for capturing an image of an object to be measured; and an image analyser configured to: a) analyse at least one first image of an object obtained by the probe's imaging device from a first perspective and at least one second image of the object obtained by the probe's same imaging device from a second perspective so as to identify in each of the at least first and second images of the object at least one photogrammetric target feature on the object to be measured, determine the two-dimensional coordinates of the at least one photogrammetric target feature on the object within each image, and then, based on the knowledge of the relative location and orientation of the imaging device which took the images, determine the three-dimensional coordinates of the at least one common photogrammetric target feature, and b) obtain topographical data regarding the form of a surface of the object via triangulation and/or phase analysis of a structured light pattern projected on the object and as imaged in at least one image obtained by the probe's same imaging device, the structured light pattern being distorted due to height variation of the surface of the object. a) analyse at least one first image of an object obtained by the probe's imaging device from a first perspective and at least one second image of the object obtained by the probe's same imaging device from a second perspective so as to identify in each of the at least first and second images of the object at least one photogrammetric target feature on the object to be measured, determine the two-dimensional coordinates of the at least one photogrammetric target feature on the object within each image, and then, based on the knowledge of the relative location and orientation of the imaging device which took the images, determine the three-dimensional coordinates of the at least one common photogrammetric target feature, and b) obtain topographical data regarding the form of a surface of the object via triangulation and/or phase analysis of a structured light pattern projected on the object and as imaged in at least one image obtained by the probe's same imaging device, the structured light pattern being distorted due to height variation of the surface of the object.