Phase microscope comprising a light path comprising at least a sample area, a lighting device for lighting said sample area and an imaging device for capturing a phase image of said sample, said phase image being a 2D matrix of pixels, wherein it further comprises a device for phase microscopy comprising: • a spatial light modulator, and: • a connecting means adapted to fix the spatial light modulator onto said phase microscope so that the spatial light modulator is positioned in the light path in a conjugated plane of the sample area and • a command of the spatial light modulator connected to the imaging device and characterized in that said command is adapted to: ∘ command a step b) of measuring the phase shift of a plurality of pixels of the phase image, wherein the phase image is generated by an optical field written as the sum of a plane reference wave (E R) and a scattered wave (E S): E = | E | e iψ ( x,y) = | E R | + | E S ( x,y)| e iφ ( x,y), where: ψ(x,y) is the phase of the optical field E, |E R | is the field amplitude of the plane reference wave E R, φ(x,y) is the phase of the scattered wave E S, |E S | is the field amplitude of the scattered wave E S, which yields to an intensity of the phase image I ( x,y) = | E S ( x,y)| 2 + | E R | 2 + 2| E S ( x, y)|| E R | cos ( φ ( x,y) - α), where: - α is chosen to be equal to ±π/2, ∘ command a step c) of controlling the spatial light modulator so that it subtracts the measured phase-shift from the light ray associated with the pixel, ∘ command a repetition of the steps a) to c), recursively, and until ψ ( x,y) - ψ meas ( x,y) « 1 wherein it further comprises a device for phase microscopy comprising: • a spatial light modulator, and: • a connecting means adapted to fix the spatial light modulator onto said phase microscope so that the spatial light modulator is positioned in the light path in a conjugated plane of the sample area and • a command of the spatial light modulator connected to the imaging device and characterized in that said command is adapted to: ∘ command a step b) of measuring the phase shift of a plurality of pixels of the phase image, wherein the phase image is generated by an optical field written as the sum of a plane reference wave (E R) and a scattered wave (E S): E = | E | e iψ ( x,y) = | E R | + | E S ( x,y)| e iφ ( x,y), where: ψ(x,y) is the phase of the optical field E, |E R | is the field amplitude of the plane reference wave E R, φ(x,y) is the phase of the scattered wave E S, |E S | is the field amplitude of the scattered wave E S, which yields to an intensity of the phase image I ( x,y) = | E S ( x,y)| 2 + | E R | 2 + 2| E S ( x, y)|| E R | cos ( φ ( x,y) - α), where: - α is chosen to be equal to ±π/2, ∘ command a step c) of controlling the spatial light modulator so that it subtracts the measured phase-shift from the light ray associated with the pixel, ∘ command a repetition of the steps a) to c), recursively, and until ψ ( x,y) - ψ meas ( x,y) « 1 • a spatial light modulator, and: • a connecting means adapted to fix the spatial light modulator onto said phase microscope so that the spatial light modulator is positioned in the light path in a conjugated plane of the sample area and • a command of the spatial light modulator connected to the imaging device and characterized in that said command is adapted to: ∘ command a step b) of measuring the phase shift of a plurality of pixels of the phase image, wherein the phase image is generated by an optical field written as the sum of a plane reference wave (E R) and a scattered wave (E S): E = | E | e iψ ( x,y) = | E R | + | E S ( x,y)| e iφ ( x,y), where: ψ(x,y) is the phase of the optical field E, |E R | is the field amplitude of the plane reference wave E R, φ(x,y) is the phase of the scattered wave E S, |E S | is the field amplitude of the scattered wave E S, which yields to an intensity of the phase image I ( x,y) = | E S ( x,y)| 2 + | E R | 2 + 2| E S ( x, y)|| E R | cos ( φ ( x,y) - α), where: - α is chosen to be equal to ±π/2, ∘ command a step c) of controlling the spatial light modulator so that it subtracts the measured phase-shift from the light ray associated with the pixel, ∘ command a repetition of the steps a) to c), recursively, and until ψ ( x,y) - ψ meas ( x,y) « 1 ∘ command a step b) of measuring the phase shift of a plurality of pixels of the phase image, wherein the phase image is generated by an optical field written as the sum of a plane reference wave (E R) and a scattered wave (E S): E = | E | e iψ ( x,y) = | E R | + | E S ( x,y)| e iφ ( x,y), where: ψ(x,y) is the phase of the optical field E, |E R | is the field amplitude of the plane reference wave E R, φ(x,y) is the phase of the scattered wave E S, |E S | is the field amplitude of the scattered wave E S, which yields to an intensity of the phase image I ( x,y) = | E S ( x,y)| 2 + | E R | 2 + 2| E S ( x, y)|| E R | cos ( φ ( x,y) - α), where: - α is chosen to be equal to ±π/2, ψ(x,y) is the phase of the optical field E, |E R | is the field amplitude of the plane reference wave E R, φ(x,y) is the phase of the scattered wave E S, |E S | is the field amplitude of the scattered wave E S, which yields to an intensity of the phase image I ( x,y) = | E S ( x,y)| 2 + | E R | 2 + 2| E S ( x, y)|| E R | cos ( φ ( x,y) - α), where: - α is chosen to be equal to ±π/2, - α is chosen to be equal to ±π/2, ∘ command a step c) of controlling the spatial light modulator so that it subtracts the measured phase-shift from the light ray associated with the pixel, ∘ command a repetition of the steps a) to c), recursively, and until ψ ( x,y) - ψ meas ( x,y) « 1