Apparatus for testing of polishing materials and polished surface conditions of composite materials comprising: A) a surface abrading apparatus for imparting a roughness to the surface of a specimen comprising: a base; a rotating platen with an abrasive material surface on said platen; a specimen support mounted on said base, said support including a moveable bracket generally transverse to the platen, and a specimen holder supported by the bracket, said bracket further including a holder drive for rotatably driving the specimen in the specimen holder, whereby said specimen is moveable into contact with said abrasive material surface: B) a polishing device testing apparatus for applying a polishing device to the specimen comprising: a stand; a platen on said stand having at least one degree movement along a first axis; a sample containment device mounted on the platen; a drive mechanism mounted on the platen to drive the containment device in a direction generally normal to the first axis; a support for a polishing device including an alignment mechanism for orienting the polishing device against a sample in the containment device; and a programmable control system for controlling the movement of the platen and the containment device; and C) a surface roughness measurement apparatus for measuring the roughness of the surface comprising: a base; a profilometer mounted on a stand on said base, said stand adjustable in an XY plane and Z axis elevation, said profilometer including a stylus sensor for engaging the specimen surface and measuring the roughness upon movement in an XY plane. A) a surface abrading apparatus for imparting a roughness to the surface of a specimen comprising: a base; a rotating platen with an abrasive material surface on said platen; a specimen support mounted on said base, said support including a moveable bracket generally transverse to the platen, and a specimen holder supported by the bracket, said bracket further including a holder drive for rotatably driving the specimen in the specimen holder, whereby said specimen is moveable into contact with said abrasive material surface: a base; a rotating platen with an abrasive material surface on said platen; a specimen support mounted on said base, said support including a moveable bracket generally transverse to the platen, and a specimen holder supported by the bracket, said bracket further including a holder drive for rotatably driving the specimen in the specimen holder, whereby said specimen is moveable into contact with said abrasive material surface: B) a polishing device testing apparatus for applying a polishing device to the specimen comprising: a stand; a platen on said stand having at least one degree movement along a first axis; a sample containment device mounted on the platen; a drive mechanism mounted on the platen to drive the containment device in a direction generally normal to the first axis; a support for a polishing device including an alignment mechanism for orienting the polishing device against a sample in the containment device; and a programmable control system for controlling the movement of the platen and the containment device; and a stand; a platen on said stand having at least one degree movement along a first axis; a sample containment device mounted on the platen; a drive mechanism mounted on the platen to drive the containment device in a direction generally normal to the first axis; a support for a polishing device including an alignment mechanism for orienting the polishing device against a sample in the containment device; and a programmable control system for controlling the movement of the platen and the containment device; and C) a surface roughness measurement apparatus for measuring the roughness of the surface comprising: a base; a profilometer mounted on a stand on said base, said stand adjustable in an XY plane and Z axis elevation, said profilometer including a stylus sensor for engaging the specimen surface and measuring the roughness upon movement in an XY plane. a base; a profilometer mounted on a stand on said base, said stand adjustable in an XY plane and Z axis elevation, said profilometer including a stylus sensor for engaging the specimen surface and measuring the roughness upon movement in an XY plane.