An analysis device, comprising: a light-receiving unit configured to 1) receive scattered light, transmitted light, fluorescence, or electromagnetic waves as optical signals from an observed object passing through a light irradiation region irradiated with the light from a light source wherein the light-receiving unit includes one or a few pixel detection elements to receive the optical signals from the observed object and 2) convert the received lights or electromagnetic waves into temporal electrical signals wherein spatial information of the observed object which is compressed into a one-dimensional temporal waveform is included in the temporal electrical signals, characterized in that the analysis device further comprises: an analysis unit configured to 1) optimize a classification algorithm using machine learning and 2) analyze the temporal electrical signal related to the optical signals from the observed objects converted from the received lights or electromagnetic waves by the light-receiving unit to analyze the observed objects for the recognition of the class to which the observed object belongs based on the one-dimensional temporal waveform using the classification algorithm, wherein the analysis unit is configured to analyze the observed object for the recognition of the class to which the observed object belongs without image reconstruction of the observed object. a light-receiving unit configured to 1) receive scattered light, transmitted light, fluorescence, or electromagnetic waves as optical signals from an observed object passing through a light irradiation region irradiated with the light from a light source wherein the light-receiving unit includes one or a few pixel detection elements to receive the optical signals from the observed object and 2) convert the received lights or electromagnetic waves into temporal electrical signals wherein spatial information of the observed object which is compressed into a one-dimensional temporal waveform is included in the temporal electrical signals, characterized in that the analysis device further comprises: an analysis unit configured to 1) optimize a classification algorithm using machine learning and 2) analyze the temporal electrical signal related to the optical signals from the observed objects converted from the received lights or electromagnetic waves by the light-receiving unit to analyze the observed objects for the recognition of the class to which the observed object belongs based on the one-dimensional temporal waveform using the classification algorithm, wherein the analysis unit is configured to analyze the observed object for the recognition of the class to which the observed object belongs without image reconstruction of the observed object. an analysis unit configured to 1) optimize a classification algorithm using machine learning and 2) analyze the temporal electrical signal related to the optical signals from the observed objects converted from the received lights or electromagnetic waves by the light-receiving unit to analyze the observed objects for the recognition of the class to which the observed object belongs based on the one-dimensional temporal waveform using the classification algorithm, wherein the analysis unit is configured to analyze the observed object for the recognition of the class to which the observed object belongs without image reconstruction of the observed object.