A thyristor valve test system based on cooperation of logic functions of software, wherein the test system comprises: a tested thyristor valve, a tester and a valve based electronics VBE, wherein the tested thyristor valve and the VBE are connected via optical fibers, the VBE being configured to transmit a firing pulse FP to the tested thyristor valve and to receive an indication pulse IP from the tested thyristor valve through the optical fibers; wherein the tested thyristor valve and the tester are connected via cables, the tester being configured to apply a test voltage to the tested thyristor valve and to detect the thyristor voltage and current through the cables; wherein there is no direct connection between the VBE and the tester; wherein the tested thyristor valve includes at least one thyristor level, the thyristor level at least includes a thyristor, a thyristor control unit TCU and an auxiliary circuit; wherein the TCU is configured to feed back an IP1 to the VBE when in normal operation, and to feed back an IP2 to the VBE when being protective fired; wherein the VBE is provided with a test mode correspondingly, and in the test mode is configured so as: a. To send a FP to the TCU every time the VBE receives N consecutive IP1; b. After receiving the IP2, the VBE is configured not to send FP to TCU when next time receiving N consecutive IP1; c. If the VBE does not receive any of the IPs within a certain time T, the VBE is configured to calculate the number of the IP1 and IP2 from zero; and wherein the tester is configured to apply different voltages in different stages according to the test requirements. a tested thyristor valve, a tester and a valve based electronics VBE, wherein the tested thyristor valve and the VBE are connected via optical fibers, the VBE being configured to transmit a firing pulse FP to the tested thyristor valve and to receive an indication pulse IP from the tested thyristor valve through the optical fibers; wherein the tested thyristor valve and the tester are connected via cables, the tester being configured to apply a test voltage to the tested thyristor valve and to detect the thyristor voltage and current through the cables; wherein there is no direct connection between the VBE and the tester; wherein the tested thyristor valve includes at least one thyristor level, the thyristor level at least includes a thyristor, a thyristor control unit TCU and an auxiliary circuit; wherein the TCU is configured to feed back an IP1 to the VBE when in normal operation, and to feed back an IP2 to the VBE when being protective fired; wherein the VBE is provided with a test mode correspondingly, and in the test mode is configured so as: a. To send a FP to the TCU every time the VBE receives N consecutive IP1; b. After receiving the IP2, the VBE is configured not to send FP to TCU when next time receiving N consecutive IP1; c. If the VBE does not receive any of the IPs within a certain time T, the VBE is configured to calculate the number of the IP1 and IP2 from zero; and a. To send a FP to the TCU every time the VBE receives N consecutive IP1; b. After receiving the IP2, the VBE is configured not to send FP to TCU when next time receiving N consecutive IP1; c. If the VBE does not receive any of the IPs within a certain time T, the VBE is configured to calculate the number of the IP1 and IP2 from zero; and wherein the tester is configured to apply different voltages in different stages according to the test requirements.