A method of testing a transistor component, the method comprising the step of, (a) capturing a first image of the transistor component which is to be positioned into a nest for testing; (b) identifying from the first image the locations of the source and gate of the transistor component; (c) holding the transistor component using a component handling head on a rotatable turret, (d) using an alignment device to move the transistor component into a position on the component handling head such that the component handling head can deliver the component into a position on the nest wherein all of a plurality of electrical contacts on the base-plate of the nest will make electrical contact with the drain of the transistor component, and a portion of the plurality of electrical contacts on the cover-plate of the nest will make electrical contact with the gate of the transistor component and the remaining electrical contacts on the cover-plate of the nest will make electrical contact with the source of the transistor component, when the cover-plate is moved to close the nest; (e) delivering the transistor component to the nest so that all of said plurality of electrical contacts on the base-plate of the nest make electrical contact with the drain of the transistor component; (f) moving the nest cover-plate to overlay the base-plate to close the nest and a portion of the plurality of electrical contacts on the cover-plate of the nest will make electrical contact with the gate of the transistor component and the remaining electrical contacts on the cover-plate of the nest will make electrical contact with the source of the transistor component; (g) performing testing of the transistor component; (h) capturing a second image of the nest when the nest is closed, the second image providing a side view of the cover-plate, base-plate, and transistor component; and (i) using the second image to determine if all of said plurality of electrical contacts on the base-plate of the nest overlay the drain of the transistor component, and to determine if said remaining electrical contacts on the cover-plate of the nest overlay the source of the transistor component. (a) capturing a first image of the transistor component which is to be positioned into a nest for testing; (b) identifying from the first image the locations of the source and gate of the transistor component; (c) holding the transistor component using a component handling head on a rotatable turret, (d) using an alignment device to move the transistor component into a position on the component handling head such that the component handling head can deliver the component into a position on the nest wherein all of a plurality of electrical contacts on the base-plate of the nest will make electrical contact with the drain of the transistor component, and a portion of the plurality of electrical contacts on the cover-plate of the nest will make electrical contact with the gate of the transistor component and the remaining electrical contacts on the cover-plate of the nest will make electrical contact with the source of the transistor component, when the cover-plate is moved to close the nest; (e) delivering the transistor component to the nest so that all of said plurality of electrical contacts on the base-plate of the nest make electrical contact with the drain of the transistor component; (f) moving the nest cover-plate to overlay the base-plate to close the nest and a portion of the plurality of electrical contacts on the cover-plate of the nest will make electrical contact with the gate of the transistor component and the remaining electrical contacts on the cover-plate of the nest will make electrical contact with the source of the transistor component; (g) performing testing of the transistor component; (h) capturing a second image of the nest when the nest is closed, the second image providing a side view of the cover-plate, base-plate, and transistor component; and (i) using the second image to determine if all of said plurality of electrical contacts on the base-plate of the nest overlay the drain of the transistor component, and to determine if said remaining electrical contacts on the cover-plate of the nest overlay the source of the transistor component.