A device (1, 10, 110, 210) for characterizing a sample including: - a measuring instrument (2, 20, 120, 220) adapted to determine a physical characteristic of said sample at one point of said sample, and - a positioning system (3, 30, 230) adapted to position said measuring instrument (2, 20, 120, 220) in relation to said sample to be characterized, at one localized measurement point of said sample, said positioning system (3, 30, 230) comprising: - a localization target made integral with said sample and defining a referential system linked to said sample, said localization target being engraved on or in the sample through mechanical or photolithographic techniques, or said localization target being printed on the sample by inking or serigraphy or said localization target comprising a flexible or rigid support added on the sample to make said support integral with said sample to be characterized, - image acquisition and analysis means including: - means for illuminating said localization target, - an optical imaging system, integral with said measuring instrument (2, 20, 120, 220), adapted to acquire an image of at least one portion of said localization target, and - image analysis means adapted to analyse the image of said portion of the localization target to determine the position and orientation of said optical imaging system in relation to said localization target, - calibration means (34, 34A) adapted to determine the relative position of said measuring instrument (2, 20, 120, 220) in relation to said optical imaging system, and - means for processing the results of the image analysis and of the calibration, adapted to determine the absolute position of said localized measurement point in said referential system linked to said sample, said measuring instrument (2, 20, 120, 220) being positioned for the measurement at said localized measurement point and said physical characteristic of said sample being determined by said measuring instrument (2, 20, 120, 220) at said localized measurement point. - a measuring instrument (2, 20, 120, 220) adapted to determine a physical characteristic of said sample at one point of said sample, and - a positioning system (3, 30, 230) adapted to position said measuring instrument (2, 20, 120, 220) in relation to said sample to be characterized, at one localized measurement point of said sample, - a localization target made integral with said sample and defining a referential system linked to said sample, said localization target being engraved on or in the sample through mechanical or photolithographic techniques, or said localization target being printed on the sample by inking or serigraphy or said localization target comprising a flexible or rigid support added on the sample to make said support integral with said sample to be characterized, - image acquisition and analysis means including: - means for illuminating said localization target, - an optical imaging system, integral with said measuring instrument (2, 20, 120, 220), adapted to acquire an image of at least one portion of said localization target, and - image analysis means adapted to analyse the image of said portion of the localization target to determine the position and orientation of said optical imaging system in relation to said localization target, - means for illuminating said localization target, - an optical imaging system, integral with said measuring instrument (2, 20, 120, 220), adapted to acquire an image of at least one portion of said localization target, and - image analysis means adapted to analyse the image of said portion of the localization target to determine the position and orientation of said optical imaging system in relation to said localization target, - calibration means (34, 34A) adapted to determine the relative position of said measuring instrument (2, 20, 120, 220) in relation to said optical imaging system, and - means for processing the results of the image analysis and of the calibration, adapted to determine the absolute position of said localized measurement point in said referential system linked to said sample, said measuring instrument (2, 20, 120, 220) being positioned for the measurement at said localized measurement point and said physical characteristic of said sample being determined by said measuring instrument (2, 20, 120, 220) at said localized measurement point.