A sensor integrated circuit comprising: a substrate comprising a first cavity forming a first diaphragm that can be deformed by a pressure differential across the first diaphragm and a second cavity forming a second diaphragm that can be deformed by a pressure differential across the second diaphragm; a first processing channel responsive to a first analog signal to generate a first processed signal, wherein the first analog signal is provided by a first sensing element positioned adjacent to the first diaphragm and configured to detect the pressure differential across the first diaphragm by detecting deformation of the first diaphragm; a second processing channel responsive to a second analog signal to generate a second processed signal, wherein the second analog signal is provided by a second sensing element positioned adjacent to the second diaphragm and configured to detect the pressure differential across the second diaphragm by detecting deformation of the second diaphragm; and a checker circuit responsive to the first processed signal and the second processed signal and configured to detect a fault in the sensor integrated circuit and generate a fault signal indicative of the fault when the first processed signal and the second processed signal differ from each other by more than a predetermined amount, wherein the checker circuit comprises a first sample circuit (206; 256) configured to sample the first processed signal and generate a first sampled signal, a second sample circuit (208; 258) configured to process the second processed signal and generate a second sampled signal, and a window comparator (220; 270) responsive to the first sampled signal and the second sampled signal and configured to generate the fault signal, wherein the first sensing element comprises a first pressure sensing element formed by the first cavity, and the second sensing element comprises a second pressure sensing element formed by the second cavity, wherein each of the first and second pressure sensing elements comprises a magnetic field sensing element (543, 545; 521, 527) and one of a back-bias magnet, permanent magnet or coil (521, 527), and wherein the first and second pressure sensing elements are arranged such that a strength of a magnetic field detected by the magnetic field sensing element of the first pressure sensing element changes according to a deformation of the first diaphragm and a strength of a magnetic field detected by the magnetic field sensing element of the second pressure sensing element changes according to a deformation of the second diaphragm. a substrate comprising a first cavity forming a first diaphragm that can be deformed by a pressure differential across the first diaphragm and a second cavity forming a second diaphragm that can be deformed by a pressure differential across the second diaphragm; a first processing channel responsive to a first analog signal to generate a first processed signal, wherein the first analog signal is provided by a first sensing element positioned adjacent to the first diaphragm and configured to detect the pressure differential across the first diaphragm by detecting deformation of the first diaphragm; a second processing channel responsive to a second analog signal to generate a second processed signal, wherein the second analog signal is provided by a second sensing element positioned adjacent to the second diaphragm and configured to detect the pressure differential across the second diaphragm by detecting deformation of the second diaphragm; and a checker circuit responsive to the first processed signal and the second processed signal and configured to detect a fault in the sensor integrated circuit and generate a fault signal indicative of the fault when the first processed signal and the second processed signal differ from each other by more than a predetermined amount, wherein the checker circuit comprises a first sample circuit (206; 256) configured to sample the first processed signal and generate a first sampled signal, a second sample circuit (208; 258) configured to process the second processed signal and generate a second sampled signal, and a window comparator (220; 270) responsive to the first sampled signal and the second sampled signal and configured to generate the fault signal, wherein the first sensing element comprises a first pressure sensing element formed by the first cavity, and the second sensing element comprises a second pressure sensing element formed by the second cavity, wherein each of the first and second pressure sensing elements comprises a magnetic field sensing element (543, 545; 521, 527) and one of a back-bias magnet, permanent magnet or coil (521, 527), and wherein the first and second pressure sensing elements are arranged such that a strength of a magnetic field detected by the magnetic field sensing element of the first pressure sensing element changes according to a deformation of the first diaphragm and a strength of a magnetic field detected by the magnetic field sensing element of the second pressure sensing element changes according to a deformation of the second diaphragm.