Optical position measurement device for capturing the position of two objects that are arranged to be movable relative to one another along a measurement direction (x), comprising - a measurement scale that is connected to one of the two objects and has, extending along the measurement direction (x), a measurement graduation with a specific measurement graduation periodicity (TP M), and - a scanning unit connected to the other object, comprising - at least one light source, - at least one scanning plate with at least two scan graduations (24.1, 24.2), which are arranged adjacent to one another on one side of the scanning plate perpendicularly to the measurement direction (x) and each have a specific scan graduation periodicity (TP A), which differs from the measurement graduation periodicity (TP M), and - at least two direction-selective deflection elements (25.1, 25.2), which are assigned to the at least two scan graduations (24.1, 24.2) and effect deflection of the beams passing through the various scan graduations (24.1, 24.2) in the direction of a partial region on the measurement graduation, with the partial region being jointly impinged upon, and - at least two detector arrangements (26.1, 26.2), which are arranged adjacent to one another in the direction of a perpendicular (y) to the measurement direction (x) and on which the beams that are incident from the same impinged-upon partial region on the measurement graduation are incident in each case in the form of a periodic Vernier stripe pattern with a stripe pattern periodicity and wherein the detector arrangements (26.1, 26.2) each comprise a plurality of light-sensitive detector elements (26.1a, 26.1b, 26.1c, 26.1d, 26.2a, 26.2b, 26.2c, 26.2d) which are arranged periodically along the measurement direction (x), with the result that the Vernier stripe patterns are converted via the detector arrangements (26.1, 26.2) into electrical output signals that are processed further to two or more phase-shifted scanning signals. - a measurement scale that is connected to one of the two objects and has, extending along the measurement direction (x), a measurement graduation with a specific measurement graduation periodicity (TP M), and - a scanning unit connected to the other object, comprising - at least one light source, - at least one scanning plate with at least two scan graduations (24.1, 24.2), which are arranged adjacent to one another on one side of the scanning plate perpendicularly to the measurement direction (x) and each have a specific scan graduation periodicity (TP A), which differs from the measurement graduation periodicity (TP M), and - at least two direction-selective deflection elements (25.1, 25.2), which are assigned to the at least two scan graduations (24.1, 24.2) and effect deflection of the beams passing through the various scan graduations (24.1, 24.2) in the direction of a partial region on the measurement graduation, with the partial region being jointly impinged upon, and - at least two detector arrangements (26.1, 26.2), which are arranged adjacent to one another in the direction of a perpendicular (y) to the measurement direction (x) and on which the beams that are incident from the same impinged-upon partial region on the measurement graduation are incident in each case in the form of a periodic Vernier stripe pattern with a stripe pattern periodicity and wherein the detector arrangements (26.1, 26.2) each comprise a plurality of light-sensitive detector elements (26.1a, 26.1b, 26.1c, 26.1d, 26.2a, 26.2b, 26.2c, 26.2d) which are arranged periodically along the measurement direction (x), with the result that the Vernier stripe patterns are converted via the detector arrangements (26.1, 26.2) into electrical output signals that are processed further to two or more phase-shifted scanning signals. - at least one light source, - at least one scanning plate with at least two scan graduations (24.1, 24.2), which are arranged adjacent to one another on one side of the scanning plate perpendicularly to the measurement direction (x) and each have a specific scan graduation periodicity (TP A), which differs from the measurement graduation periodicity (TP M), and - at least two direction-selective deflection elements (25.1, 25.2), which are assigned to the at least two scan graduations (24.1, 24.2) and effect deflection of the beams passing through the various scan graduations (24.1, 24.2) in the direction of a partial region on the measurement graduation, with the partial region being jointly impinged upon, and - at least two detector arrangements (26.1, 26.2), which are arranged adjacent to one another in the direction of a perpendicular (y) to the measurement direction (x) and on which the beams that are incident from the same impinged-upon partial region on the measurement graduation are incident in each case in the form of a periodic Vernier stripe pattern with a stripe pattern periodicity and wherein the detector arrangements (26.1, 26.2) each comprise a plurality of light-sensitive detector elements (26.1a, 26.1b, 26.1c, 26.1d, 26.2a, 26.2b, 26.2c, 26.2d) which are arranged periodically along the measurement direction (x), with the result that the Vernier stripe patterns are converted via the detector arrangements (26.1, 26.2) into electrical output signals that are processed further to two or more phase-shifted scanning signals.