Microscope comprising an illumination objective which is embodied to generate a light sheet and which has a first optical axis, the light sheet being or being able to be at least partly generated in a sample plane, and a detection objective which is embodied to detect light coming from the sample plane and which has a second optical axis, wherein the illumination objective and the detection objective are aligned with respect to one another and with respect to the sample plane in such a way that the first optical axis and the second optical axis intersect in the sample plane and include a substantially right angle therebetween, and the first optical axis and the second optical axis each include an angle that differs from zero with a reference axis that is directed orthogonal to the sample plane, an overview illumination apparatus which is embodied for wide field illumination of the sample plane and which has an illumination optical unit with a third optical axis is present, and the detection objective is embodied to detect both light from the light sheet and light from the illumination optical unit, characterized in that the third optical axis of the illumination optical unit is directed substantially along the reference axis and at an angle not equal to zero in relation to the second optical axis such that an oblique overview illumination is generated, and a control unit is present and embodied to control the illumination objective, the detection objective and/or the illumination optical unit in such a way that, by means of the detection objective, light from the overview illumination apparatus is captured and an overview image is created and, in a further step, light from the light sheet is captured by means of the detection objective. an illumination objective which is embodied to generate a light sheet and which has a first optical axis, the light sheet being or being able to be at least partly generated in a sample plane, and a detection objective which is embodied to detect light coming from the sample plane and which has a second optical axis, wherein the illumination objective and the detection objective are aligned with respect to one another and with respect to the sample plane in such a way that the first optical axis and the second optical axis intersect in the sample plane and include a substantially right angle therebetween, and the first optical axis and the second optical axis each include an angle that differs from zero with a reference axis that is directed orthogonal to the sample plane, the illumination objective and the detection objective are aligned with respect to one another and with respect to the sample plane in such a way that the first optical axis and the second optical axis intersect in the sample plane and include a substantially right angle therebetween, and the first optical axis and the second optical axis each include an angle that differs from zero with a reference axis that is directed orthogonal to the sample plane, an overview illumination apparatus which is embodied for wide field illumination of the sample plane and which has an illumination optical unit with a third optical axis is present, and the detection objective is embodied to detect both light from the light sheet and light from the illumination optical unit, characterized in that the third optical axis of the illumination optical unit is directed substantially along the reference axis and at an angle not equal to zero in relation to the second optical axis such that an oblique overview illumination is generated, and a control unit is present and embodied to control the illumination objective, the detection objective and/or the illumination optical unit in such a way that, by means of the detection objective, light from the overview illumination apparatus is captured and an overview image is created and, in a further step, light from the light sheet is captured by means of the detection objective.