Computer implemented method for estimating degradation of a wire-bonded power semi-conductor module comprising: a) obtaining an indicator of degradation (Degr est_t-1) of said module at a first instant (t-1); b) estimating an estimated indicator of degradation (Degr est_t) of said module at a second instant (t) by applying a temporal degradation model to said indicator of degradation (Degr est_t-1) at said first instant (t-1), wherein the temperature of the module is a parameter of said temporal degradation model to estimate said indicator of degradation (Degr est_t) of said module at a second instant (t) in function of said indicator of degradation (Degr est_t-1) at said first instant (t-1); c) obtaining a set of on-line measure (X on_meas_t), said set including at least one of an on-state measured voltage (V on_meas_t), an on-state measured current (I on_meas_t) and an on-line measured temperature (T on_meas_t) of said module and each being measured at said second instant (t) within plus or minus 100 microseconds; then, d1) converting said set of on-line measure (X on_meas_t) into a deducted indicator of degradation (Degr meas_t) at said second instant (t) by applying an electrical equivalence model, and e1) computing a deviation between said estimated indicator of degradation (Degr est_t) and said deducted indicator of degradation (Degr meas_t); or d2) converting said estimated indicator of degradation (Degr est_t) at said second instant (t) into a set of on-line estimation (X on_est_t), said set including at least one of an on-state estimated voltage (V on_est_t), an on-state estimated current (I on_est_t) and an on-line estimated temperature (T on_est_t) of said module and each being estimated for said second instant (t) by applying an electrical equivalence model, and e2) computing a deviation between said set of on-line measure (X on _ meas_t) and said set of on-line estimation (X on_est_t); and f) correcting said estimated indicator of degradation (Degr est_t) at said second instant (t) into a corrected estimated indicator of degradation (Degr corr_t) at said second instant (t) in function of the computed deviation. a) obtaining an indicator of degradation (Degr est_t-1) of said module at a first instant (t-1); b) estimating an estimated indicator of degradation (Degr est_t) of said module at a second instant (t) by applying a temporal degradation model to said indicator of degradation (Degr est_t-1) at said first instant (t-1), wherein the temperature of the module is a parameter of said temporal degradation model to estimate said indicator of degradation (Degr est_t) of said module at a second instant (t) in function of said indicator of degradation (Degr est_t-1) at said first instant (t-1); c) obtaining a set of on-line measure (X on_meas_t), said set including at least one of an on-state measured voltage (V on_meas_t), an on-state measured current (I on_meas_t) and an on-line measured temperature (T on_meas_t) of said module and each being measured at said second instant (t) within plus or minus 100 microseconds; d1) converting said set of on-line measure (X on_meas_t) into a deducted indicator of degradation (Degr meas_t) at said second instant (t) by applying an electrical equivalence model, and e1) computing a deviation between said estimated indicator of degradation (Degr est_t) and said deducted indicator of degradation (Degr meas_t); or d2) converting said estimated indicator of degradation (Degr est_t) at said second instant (t) into a set of on-line estimation (X on_est_t), said set including at least one of an on-state estimated voltage (V on_est_t), an on-state estimated current (I on_est_t) and an on-line estimated temperature (T on_est_t) of said module and each being estimated for said second instant (t) by applying an electrical equivalence model, and e2) computing a deviation between said set of on-line measure (X on _ meas_t) and said set of on-line estimation (X on_est_t); and f) correcting said estimated indicator of degradation (Degr est_t) at said second instant (t) into a corrected estimated indicator of degradation (Degr corr_t) at said second instant (t) in function of the computed deviation.