A power consumption control method for an electronic device, performed by an electronic device with a hidden function key, characterized in that the method comprises: obtaining a current state of the electronic device, wherein the current state comprises: a shutdown state, a standby state, and a use state; determining a target integration time of an ADC sampling circuit in the electronic device based on the current state; and adjusting an integration time of the ADC sampling circuit to the target integration time, and adjusting a power-on time of the hidden function key based on the adjusted integration time to control actual power consumption of the electronic device, wherein the integration time is positively correlated with the power-on time; wherein the determining a target integration time of an ADC sampling circuit in the electronic device based on the current state comprises: if the current state is the use state, determining a first integration time as the target integration time of the ADC sampling circuit in the electronic device; if the current state is the standby state, determining a second integration time as the target integration time of the ADC sampling circuit in the electronic device; and if the current state is the shutdown state, determining a third integration time as the target integration time of the ADC sampling circuit in the electronic device, wherein the first integration time is greater than the second integration time, and the second integration time is greater than the third integration time. obtaining a current state of the electronic device, wherein the current state comprises: a shutdown state, a standby state, and a use state; determining a target integration time of an ADC sampling circuit in the electronic device based on the current state; and adjusting an integration time of the ADC sampling circuit to the target integration time, and adjusting a power-on time of the hidden function key based on the adjusted integration time to control actual power consumption of the electronic device, wherein the integration time is positively correlated with the power-on time; wherein the determining a target integration time of an ADC sampling circuit in the electronic device based on the current state comprises: if the current state is the use state, determining a first integration time as the target integration time of the ADC sampling circuit in the electronic device; if the current state is the standby state, determining a second integration time as the target integration time of the ADC sampling circuit in the electronic device; and if the current state is the shutdown state, determining a third integration time as the target integration time of the ADC sampling circuit in the electronic device, wherein the first integration time is greater than the second integration time, and the second integration time is greater than the third integration time. if the current state is the use state, determining a first integration time as the target integration time of the ADC sampling circuit in the electronic device; if the current state is the standby state, determining a second integration time as the target integration time of the ADC sampling circuit in the electronic device; and if the current state is the shutdown state, determining a third integration time as the target integration time of the ADC sampling circuit in the electronic device, wherein the first integration time is greater than the second integration time, and the second integration time is greater than the third integration time.