An interconnect system comprising: a flex circuit assembly including: a connecting portion configured to electrically and physically connect with a circuit board of a device under test, DUT, and a flex circuit having a contact portion with a plurality of connection points electrically coupled with the connecting portion; and a connector assembly configured to electrically couple the flex circuit assembly with a test instrument, the connector assembly including: a test instrument connector configured to connect the connector assembly to the test instrument, and a zero insertion force, ZIF, connecter coupled with the test instrument connector via one or more connecting members, the ZIF connector including: a connector housing defining an opening and an interior space configured to receive the contact portion of the flex circuit; a plurality of springs made by the LIGA process positioned within the interior space and configured to apply pressure to the contact portion of the flex circuit while in a closed position in which each of the plurality of springs made by the LIGA process establishes and maintains an electrical connection with one of the plurality of connection points on the flex circuit; and a locking component configured to move to an open position in which the locking component does not apply pressure to the flex circuit responsive to a user pressing the locking component, wherein the locking component is further configured to move back to the closed position responsive to the user releasing the locking component. a flex circuit assembly including: a connecting portion configured to electrically and physically connect with a circuit board of a device under test, DUT, and a flex circuit having a contact portion with a plurality of connection points electrically coupled with the connecting portion; and a connecting portion configured to electrically and physically connect with a circuit board of a device under test, DUT, and a flex circuit having a contact portion with a plurality of connection points electrically coupled with the connecting portion; and a connector assembly configured to electrically couple the flex circuit assembly with a test instrument, the connector assembly including: a test instrument connector configured to connect the connector assembly to the test instrument, and a zero insertion force, ZIF, connecter coupled with the test instrument connector via one or more connecting members, the ZIF connector including: a connector housing defining an opening and an interior space configured to receive the contact portion of the flex circuit; a plurality of springs made by the LIGA process positioned within the interior space and configured to apply pressure to the contact portion of the flex circuit while in a closed position in which each of the plurality of springs made by the LIGA process establishes and maintains an electrical connection with one of the plurality of connection points on the flex circuit; and a locking component configured to move to an open position in which the locking component does not apply pressure to the flex circuit responsive to a user pressing the locking component, wherein the locking component is further configured to move back to the closed position responsive to the user releasing the locking component. a test instrument connector configured to connect the connector assembly to the test instrument, and a zero insertion force, ZIF, connecter coupled with the test instrument connector via one or more connecting members, the ZIF connector including: a connector housing defining an opening and an interior space configured to receive the contact portion of the flex circuit; a plurality of springs made by the LIGA process positioned within the interior space and configured to apply pressure to the contact portion of the flex circuit while in a closed position in which each of the plurality of springs made by the LIGA process establishes and maintains an electrical connection with one of the plurality of connection points on the flex circuit; and a locking component configured to move to an open position in which the locking component does not apply pressure to the flex circuit responsive to a user pressing the locking component, wherein the locking component is further configured to move back to the closed position responsive to the user releasing the locking component. a connector housing defining an opening and an interior space configured to receive the contact portion of the flex circuit; a plurality of springs made by the LIGA process positioned within the interior space and configured to apply pressure to the contact portion of the flex circuit while in a closed position in which each of the plurality of springs made by the LIGA process establishes and maintains an electrical connection with one of the plurality of connection points on the flex circuit; and a locking component configured to move to an open position in which the locking component does not apply pressure to the flex circuit responsive to a user pressing the locking component, wherein the locking component is further configured to move back to the closed position responsive to the user releasing the locking component.