A method of manufacturing a transistor, the method comprising: providing a substrate and a region of electrically conductive material supported by the substrate; forming at least one layer (3, 31, 32) of resist material over said region to form a covering of resist material over said region; forming a depression in a surface of the covering of resist material, said depression extending over a first portion of said region, said first portion separating a second portion of the region from a third portion of the region; removing resist material located under said depression so as to form a window, through said covering, exposing said first portion of the electrically conductive region; removing said first portion to expose a portion of substrate separating the second portion from the third portion of the region; depositing semiconductive material at least inside the window to form a layer of semiconductive material connecting the second portion to the third portion; depositing dielectric material to form a layer of dielectric material over said layer of semiconductive material; depositing electrically conductive material to form a layer of electrically conductive material over said layer of dielectric material; and removing resist material at least from around said window so as to expose the second and third portions, whereby said second and third portions provide a source terminal and a drain terminal respectively and the layer of electrically conductive material provides a gate terminal to which a potential may be applied to control a conductivity of the layer of semiconductive material connecting the second and third portions, and characterised in that the method further comprises widening said window after said depositing of semiconductive material but before said depositing of dielectric material. providing a substrate and a region of electrically conductive material supported by the substrate; forming at least one layer (3, 31, 32) of resist material over said region to form a covering of resist material over said region; forming a depression in a surface of the covering of resist material, said depression extending over a first portion of said region, said first portion separating a second portion of the region from a third portion of the region; removing resist material located under said depression so as to form a window, through said covering, exposing said first portion of the electrically conductive region; removing said first portion to expose a portion of substrate separating the second portion from the third portion of the region; depositing semiconductive material at least inside the window to form a layer of semiconductive material connecting the second portion to the third portion; depositing dielectric material to form a layer of dielectric material over said layer of semiconductive material; depositing electrically conductive material to form a layer of electrically conductive material over said layer of dielectric material; and removing resist material at least from around said window so as to expose the second and third portions, whereby said second and third portions provide a source terminal and a drain terminal respectively and the layer of electrically conductive material provides a gate terminal to which a potential may be applied to control a conductivity of the layer of semiconductive material connecting the second and third portions, and characterised in that the method further comprises widening said window after said depositing of semiconductive material but before said depositing of dielectric material.