Method for a thermo voltage acquisition from a thermocouple element, comprising: a first measurement measuring the voltage at terminals of the thermocouple element for a first bias voltage (VBIAS), a second measurement measuring the voltage at terminals of the thermocouple element for a second bias voltage (VBIAS), a third measurement measuring the voltage at terminals of a probe resistor for the first bias voltage (VBIAS), and a fourth measurement measuring the voltage at terminals of the probe resistor for the second bias voltage (VBIAS), wherein during the first and second measurement (A1, B1) the bias voltage (VBIAS) is applied to one terminal of the thermocouple element to set the working point of the thermocouple element to two different levels, and wherein the probe resistor is connected in series between the bias voltage source and the terminal of the thermocouple element, and wherein during the third and fourth measurement (A2, B2) the bias voltage (VBIAS) is applied to the probe resistor, and further comprising the steps of: calculating a first difference between the first measurement and the second measurement by subtracting the second measurement from the first measurement, calculating a second difference between the third measurement and the fourth measurement by subtracting the fourth measurement from the third measurement, calculating a correction factor (CORR) by multiplying the first difference with the fraction of the third measurement to the second difference, and calculating the corrected thermo voltage of the thermocouple element by subtracting the correction factor (CORR) from the first measurement. a first measurement measuring the voltage at terminals of the thermocouple element for a first bias voltage (VBIAS), a second measurement measuring the voltage at terminals of the thermocouple element for a second bias voltage (VBIAS), a third measurement measuring the voltage at terminals of a probe resistor for the first bias voltage (VBIAS), and a fourth measurement measuring the voltage at terminals of the probe resistor for the second bias voltage (VBIAS), wherein during the first and second measurement (A1, B1) the bias voltage (VBIAS) is applied to one terminal of the thermocouple element to set the working point of the thermocouple element to two different levels, and wherein the probe resistor is connected in series between the bias voltage source and the terminal of the thermocouple element, and wherein during the third and fourth measurement (A2, B2) the bias voltage (VBIAS) is applied to the probe resistor, and further comprising the steps of: calculating a first difference between the first measurement and the second measurement by subtracting the second measurement from the first measurement, calculating a second difference between the third measurement and the fourth measurement by subtracting the fourth measurement from the third measurement, calculating a correction factor (CORR) by multiplying the first difference with the fraction of the third measurement to the second difference, and calculating the corrected thermo voltage of the thermocouple element by subtracting the correction factor (CORR) from the first measurement. calculating a first difference between the first measurement and the second measurement by subtracting the second measurement from the first measurement, calculating a second difference between the third measurement and the fourth measurement by subtracting the fourth measurement from the third measurement, calculating a correction factor (CORR) by multiplying the first difference with the fraction of the third measurement to the second difference, and calculating the corrected thermo voltage of the thermocouple element by subtracting the correction factor (CORR) from the first measurement.