A resistance mapping device, comprising: a first chip (110, 210, 310, 510) including a first surface, a second surface positioned at a side opposite to the first surface, a plurality of first electrodes (112, 212, 312) provided at the first surface, and a plurality of first through-electrodes (113, 213, 313) electrically connected to the plurality of first electrodes (112, 212, 312), the plurality of first through-electrodes (113, 213, 313) extending in a direction from the first surface toward the second surface; a second chip (120, 220, 320,520) including a third surface facing the first surface, a fourth surface positioned at a side opposite to the third surface, and a plurality of second electrodes (122, 222, 322) provided at the third surface, the plurality of second electrodes (122, 222, 322) corresponding to the plurality of first electrodes (112, 212, 312); and a measurement part (160, 560) electrically connected to the plurality of first electrodes (112, 212, 312) and the plurality of second electrodes (122, 222, 322), the measurement part (160, 560) being configured to measure a resistance of a portion of a measurement object in a state in which the measurement object is disposed between the first chip (110, 210, 310, 510) and the second chip (120, 220, 320,520), the portion of the measurement object being between the first electrode (112, 212, 312) and the second electrode (122, 222, 322) that correspond to each other among the plurality of first electrodes (112, 212, 312) and the plurality of second electrodes (122, 222, 322), and acquire mapping data in which measured values of the resistances are associated with positions of the measurement object corresponding to the plurality of first electrodes (112, 212, 312). a first chip (110, 210, 310, 510) including a first surface, a second surface positioned at a side opposite to the first surface, a plurality of first electrodes (112, 212, 312) provided at the first surface, and a plurality of first through-electrodes (113, 213, 313) electrically connected to the plurality of first electrodes (112, 212, 312), the plurality of first through-electrodes (113, 213, 313) extending in a direction from the first surface toward the second surface; a first surface, a second surface positioned at a side opposite to the first surface, a plurality of first electrodes (112, 212, 312) provided at the first surface, and a plurality of first through-electrodes (113, 213, 313) electrically connected to the plurality of first electrodes (112, 212, 312), the plurality of first through-electrodes (113, 213, 313) extending in a direction from the first surface toward the second surface; a second chip (120, 220, 320,520) including a third surface facing the first surface, a fourth surface positioned at a side opposite to the third surface, and a plurality of second electrodes (122, 222, 322) provided at the third surface, the plurality of second electrodes (122, 222, 322) corresponding to the plurality of first electrodes (112, 212, 312); and a third surface facing the first surface, a fourth surface positioned at a side opposite to the third surface, and a plurality of second electrodes (122, 222, 322) provided at the third surface, the plurality of second electrodes (122, 222, 322) corresponding to the plurality of first electrodes (112, 212, 312); and a measurement part (160, 560) electrically connected to the plurality of first electrodes (112, 212, 312) and the plurality of second electrodes (122, 222, 322), the measurement part (160, 560) being configured to measure a resistance of a portion of a measurement object in a state in which the measurement object is disposed between the first chip (110, 210, 310, 510) and the second chip (120, 220, 320,520), the portion of the measurement object being between the first electrode (112, 212, 312) and the second electrode (122, 222, 322) that correspond to each other among the plurality of first electrodes (112, 212, 312) and the plurality of second electrodes (122, 222, 322), and acquire mapping data in which measured values of the resistances are associated with positions of the measurement object corresponding to the plurality of first electrodes (112, 212, 312). measure a resistance of a portion of a measurement object in a state in which the measurement object is disposed between the first chip (110, 210, 310, 510) and the second chip (120, 220, 320,520), the portion of the measurement object being between the first electrode (112, 212, 312) and the second electrode (122, 222, 322) that correspond to each other among the plurality of first electrodes (112, 212, 312) and the plurality of second electrodes (122, 222, 322), and acquire mapping data in which measured values of the resistances are associated with positions of the measurement object corresponding to the plurality of first electrodes (112, 212, 312).