An X-ray backscattering safety inspection system, comprising: a) a backscattering inspection subsystem, configured to inspect an object to be inspected by emitting X-ray beams towards the object to be inspected and inspecting scattering signals; and b) a control subsystem configured to adjust a distance between the backscattering inspection subsystem and locations on a side of the object to be inspected where are irradiated by the X-ray beams in real time according to a size of the object to be inspected; characterized in that said backscattering inspection subsystem includes: c) an X-ray source (1, 101) which includes a plurality of target spots each controllable individually to emit X-rays and the X-ray source is configured to emit X-rays in sequence or simultaneously by the plurality of target spots; d) each target spot of the X-ray source being provided with a respective collimator configured to be respectively passed through by the respective X-ray emitted by a respective target spot and each to output N pencil-shaped X-ray beams, and the N pencil-shaped X-ray beams are irradiated onto N locations of the object to be inspected; and e) N detectors configured to respectively receive scattering signals from the corresponding N locations of the object to be inspected, in which N is a positive integer that is greater than 1, f) wherein N scans on the object to be inspected are performed by irradiating the N pencil-shaped X-ray beams from the respective collimators onto the object to be inspected during a scan period, thereby results of the N scans are integrated so as to obtain an enhanced inspection signal or increased inspection speed. a) a backscattering inspection subsystem, configured to inspect an object to be inspected by emitting X-ray beams towards the object to be inspected and inspecting scattering signals; and b) a control subsystem configured to adjust a distance between the backscattering inspection subsystem and locations on a side of the object to be inspected where are irradiated by the X-ray beams in real time according to a size of the object to be inspected; characterized in that said backscattering inspection subsystem includes: c) an X-ray source (1, 101) which includes a plurality of target spots each controllable individually to emit X-rays and the X-ray source is configured to emit X-rays in sequence or simultaneously by the plurality of target spots; d) each target spot of the X-ray source being provided with a respective collimator configured to be respectively passed through by the respective X-ray emitted by a respective target spot and each to output N pencil-shaped X-ray beams, and the N pencil-shaped X-ray beams are irradiated onto N locations of the object to be inspected; and e) N detectors configured to respectively receive scattering signals from the corresponding N locations of the object to be inspected, in which N is a positive integer that is greater than 1, f) wherein N scans on the object to be inspected are performed by irradiating the N pencil-shaped X-ray beams from the respective collimators onto the object to be inspected during a scan period, thereby results of the N scans are integrated so as to obtain an enhanced inspection signal or increased inspection speed. c) an X-ray source (1, 101) which includes a plurality of target spots each controllable individually to emit X-rays and the X-ray source is configured to emit X-rays in sequence or simultaneously by the plurality of target spots; d) each target spot of the X-ray source being provided with a respective collimator configured to be respectively passed through by the respective X-ray emitted by a respective target spot and each to output N pencil-shaped X-ray beams, and the N pencil-shaped X-ray beams are irradiated onto N locations of the object to be inspected; and e) N detectors configured to respectively receive scattering signals from the corresponding N locations of the object to be inspected, in which N is a positive integer that is greater than 1, f) wherein N scans on the object to be inspected are performed by irradiating the N pencil-shaped X-ray beams from the respective collimators onto the object to be inspected during a scan period, thereby results of the N scans are integrated so as to obtain an enhanced inspection signal or increased inspection speed.