A method for measuring a sample property by means of a photonic circuit, the method comprising - applying input light (Li) into the photonic circuit and measuring output light (Lo) out of the photonic circuit; - wherein the photonic circuit comprises at least two photonic sensors (11,12) configured to interferometrically modulate the output light (Lo) with respect to the input light (Li) according to a respective output signal (S 1,S 2); - wherein respective signal values (V 1,V 2) of the respective output signals (S 1,S 2) periodically recur as a function of a wavelength (λ i) of the input light (Li) according to a respective wavelength interval (Λ 1,Λ 2); - wherein a wavelength (λ a,λ b) at which the recurring signal values (V 1,V 2) occur, shifts according to a respective wavelength shift (Δλ 1,Δλ 2) as a function of change (ΔX) in the sample property to be measured by a corresponding change of effective refractive index for the light through at least a portion of the photonic sensors (11,12); - wherein a relative range of a respective photonic sensor (11,12) for the sample property is defined by a respective quotient (Λ 1 /Δλ 1, Λ 2 /Δλ 2) of the respective wavelength interval (Λ 1,Λ 2) over the respective wavelength shift (Δλ 1,Δλ 2) for a change (ΔX) in the sample property; - wherein the at least two photonic sensors (11,12) comprise a low range sensor providing a first output signal and a high range sensor providing a second output signal (S 2), wherein the high range sensor has a higher relative range for the sample property than the low range sensor; - wherein the sample property is calculated by combining the output signals (S 1,S 2) of the at least two photonic sensors (11,12), wherein the second output signal (S 2) of the high range sensor is used to distinguish between recurring signal values (V 1) in the first output signal (S 1) of the low range sensor characterized in that the photonic sensors (11,12) comprise a combination of a multi-path interferometer and a ring resonator, wherein the multi-path interferometer forms the high range sensor and the ring resonator forms the low range sensor. - applying input light (Li) into the photonic circuit and measuring output light (Lo) out of the photonic circuit; - wherein the photonic circuit comprises at least two photonic sensors (11,12) configured to interferometrically modulate the output light (Lo) with respect to the input light (Li) according to a respective output signal (S 1,S 2); - wherein respective signal values (V 1,V 2) of the respective output signals (S 1,S 2) periodically recur as a function of a wavelength (λ i) of the input light (Li) according to a respective wavelength interval (Λ 1,Λ 2); - wherein a wavelength (λ a,λ b) at which the recurring signal values (V 1,V 2) occur, shifts according to a respective wavelength shift (Δλ 1,Δλ 2) as a function of change (ΔX) in the sample property to be measured by a corresponding change of effective refractive index for the light through at least a portion of the photonic sensors (11,12); - wherein a relative range of a respective photonic sensor (11,12) for the sample property is defined by a respective quotient (Λ 1 /Δλ 1, Λ 2 /Δλ 2) of the respective wavelength interval (Λ 1,Λ 2) over the respective wavelength shift (Δλ 1,Δλ 2) for a change (ΔX) in the sample property; - wherein the at least two photonic sensors (11,12) comprise a low range sensor providing a first output signal and a high range sensor providing a second output signal (S 2), wherein the high range sensor has a higher relative range for the sample property than the low range sensor; - wherein the sample property is calculated by combining the output signals (S 1,S 2) of the at least two photonic sensors (11,12), wherein the second output signal (S 2) of the high range sensor is used to distinguish between recurring signal values (V 1) in the first output signal (S 1) of the low range sensor