A sensor array having a lattice topology, comprising: a plurality of interconnects (52, 54) comprising an electrically-conductive layer sandwiched between two dielectric layers, the plurality of interconnects (52, 54) defining: a plurality of first-axis interconnects; a plurality of second-axis interconnects; and a plurality of interconnect junctions; a plurality of sensor nodes, each disposed on an associated interconnect junction defining an associated first-axis line and second-axis line; a plurality of sensors, each disposed on an associated sensor node; a primary first-axis interconnect interface, electrically connected to the plurality of first-axis interconnects; and a primary second-axis interconnect interface, electrically connected to the plurality of second-axis interconnects, characterized in that the plurality of interconnects further defines: a secondary first-axis interconnect interface, electrically connected to the plurality of first-axis interconnects; and a secondary second-axis interconnect interface, electrically connected to the plurality of second-axis interconnects, wherein each of the plurality of sensor nodes comprises: a first electrode (64, 102, 142), electrically connected to an associated first-axis line; a second electrode (68, 102', 142'), electrically connected to an associated second-axis line; and a bypass bridge (72, 108, 148), electrically isolating the associated second-axis line from the associated first-axis line, wherein the primary first-axis interconnect interface and the secondary first-axis interconnect interface are configured to enable one or more of the plurality of first-axis interconnects, and the primary second-axis interconnect interface and the secondary second-axis interconnect interface are configured to enable one or more of the plurality of second-axis interconnects, thereby interrogating the sensor nodes associated with the one or more enabled first-axis interconnects and the one or more enabled second-axis interconnects, wherein the sensor array is configured such that two of the plurality of sensors are interrogated at the same time by simultaneously: enabling one of the plurality of first-axis interconnects by the primary first-axis interconnect interface; enabling one of the plurality of second-axis interconnects by the primary second-axis interconnect interface; enabling another of the plurality of first-axis interconnects by the secondary first-axis interconnect interface; and enabling another of the plurality of second-axis interconnects by the secondary second-axis interconnect interface. a plurality of first-axis interconnects; a plurality of second-axis interconnects; and a plurality of interconnect junctions; a plurality of sensor nodes, each disposed on an associated interconnect junction defining an associated first-axis line and second-axis line; a plurality of sensors, each disposed on an associated sensor node; a primary first-axis interconnect interface, electrically connected to the plurality of first-axis interconnects; and a primary second-axis interconnect interface, electrically connected to the plurality of second-axis interconnects, a secondary first-axis interconnect interface, electrically connected to the plurality of first-axis interconnects; and a secondary second-axis interconnect interface, electrically connected to the plurality of second-axis interconnects, wherein each of the plurality of sensor nodes comprises: a first electrode (64, 102, 142), electrically connected to an associated first-axis line; a second electrode (68, 102', 142'), electrically connected to an associated second-axis line; and a bypass bridge (72, 108, 148), electrically isolating the associated second-axis line from the associated first-axis line, a first electrode (64, 102, 142), electrically connected to an associated first-axis line; a second electrode (68, 102', 142'), electrically connected to an associated second-axis line; and a bypass bridge (72, 108, 148), electrically isolating the associated second-axis line from the associated first-axis line, wherein the primary first-axis interconnect interface and the secondary first-axis interconnect interface are configured to enable one or more of the plurality of first-axis interconnects, and the primary second-axis interconnect interface and the secondary second-axis interconnect interface are configured to enable one or more of the plurality of second-axis interconnects, thereby interrogating the sensor nodes associated with the one or more enabled first-axis interconnects and the one or more enabled second-axis interconnects, wherein the sensor array is configured such that two of the plurality of sensors are interrogated at the same time by simultaneously: enabling one of the plurality of first-axis interconnects by the primary first-axis interconnect interface; enabling one of the plurality of second-axis interconnects by the primary second-axis interconnect interface; enabling another of the plurality of first-axis interconnects by the secondary first-axis interconnect interface; and enabling another of the plurality of second-axis interconnects by the secondary second-axis interconnect interface. enabling one of the plurality of first-axis interconnects by the primary first-axis interconnect interface; enabling one of the plurality of second-axis interconnects by the primary second-axis interconnect interface; enabling another of the plurality of first-axis interconnects by the secondary first-axis interconnect interface; and enabling another of the plurality of second-axis interconnects by the secondary second-axis interconnect interface.