A bolometer circuit, comprising: a substrate; a focal plane array, FPA, of active bolometers arranged in rows and columns, the active bolometers being configured to receive external infrared radiation and substantially thermally isolated from the substrate, a first blind array of blind bolometers shielded from the external IR radiation and substantially thermally isolated from the substrate, the first blind array comprising rows corresponding to the rows of the FPA; a second blind array of blind bolometers shielded from the external IR radiation and substantially thermally isolated from the substrate; a third blind array of blind bolometers shielded from the external IR radiation, the third blind array comprising columns associated with the columns of the FPA, wherein the second blind array has a same number of columns as the first blind array and comprises columns associated with the columns of the first blind array, and wherein the second blind array has a same number of rows as the third blind array and comprises rows associated with the rows of the third blind array; a control circuit configured to select each row of the FPA and a corresponding row of the first blind array or the third blind array and the second blind array according to a timing signal to read out each row of the FPA and the first blind array or the third blind array and the second blind array in a row-by-row fashion, outputs from all rows of the FPA read out in the row-by-row fashion being combined to represent a frame of IR image captured by the FPA; and a logic device configured to: reduce noise in outputs from each row of the FPA based on a first statistical property of outputs from the corresponding row of the first blind array; reduce noise in outputs of the blind bolometers of the first blind array based on outputs of the blind bolometers of the second blind array; reduce noise in outputs of the blind bolometers of the third blind array based on the outputs of the blind bolometers of the second blind array; and reduce noise in outputs from each column of the FPA based on a second statistical property of outputs from the corresponding column of the third blind array. a substrate; a focal plane array, FPA, of active bolometers arranged in rows and columns, the active bolometers being configured to receive external infrared radiation and substantially thermally isolated from the substrate, a first blind array of blind bolometers shielded from the external IR radiation and substantially thermally isolated from the substrate, the first blind array comprising rows corresponding to the rows of the FPA; a second blind array of blind bolometers shielded from the external IR radiation and substantially thermally isolated from the substrate; a third blind array of blind bolometers shielded from the external IR radiation, the third blind array comprising columns associated with the columns of the FPA, wherein the second blind array has a same number of columns as the first blind array and comprises columns associated with the columns of the first blind array, and wherein the second blind array has a same number of rows as the third blind array and comprises rows associated with the rows of the third blind array; a control circuit configured to select each row of the FPA and a corresponding row of the first blind array or the third blind array and the second blind array according to a timing signal to read out each row of the FPA and the first blind array or the third blind array and the second blind array in a row-by-row fashion, outputs from all rows of the FPA read out in the row-by-row fashion being combined to represent a frame of IR image captured by the FPA; and a logic device configured to: reduce noise in outputs from each row of the FPA based on a first statistical property of outputs from the corresponding row of the first blind array; reduce noise in outputs of the blind bolometers of the first blind array based on outputs of the blind bolometers of the second blind array; reduce noise in outputs of the blind bolometers of the third blind array based on the outputs of the blind bolometers of the second blind array; and reduce noise in outputs from each column of the FPA based on a second statistical property of outputs from the corresponding column of the third blind array.