An apparatus for providing time-interleaved analog-to-digital conversion with redundancy, comprising: a plurality of analog-to-digital converter blocks coupled to one another to form a time-interleaved ADC, each ADC block including a plurality of ADC slices, wherein a count of the plurality of ADC blocks is M; and a clock circuit configured to provide a plurality of clock signals, wherein: a portion N of M ADC blocks are configured to be active, in a normal mode of operation, N and M are integer numbers, N is smaller than M, a remaining portion of the M ADC blocks are redundant ADC blocks, and one or more of the redundant ADC blocks are configured to be selectively active, in a healing mode of operation, and be swapped for one or more failed ADC blocks using the plurality of clock signals, characterized in that: in the healing mode of operation, at least one of the failed ADC blocks is configured to be healed, wherein the at least one of the failed ADC blocks is configured to be healed by using electronic redundancy, wherein, in the normal mode of operation, each ADC slice runs at a sampling rate that is the same as the frequency of a clock signal associated with that ADC slice, in the healing mode of operation, the ADC slice is configured to run at a sampling rate that is twice the frequency of the clock signal associated with that ADC slice, and at least one of the ADC slices of the at least one of the failed ADC blocks that is configured to be healed by using electronic redundancy is configured to generate two digital output signals, and the at least one of the failed ADC blocks is configured to use one of the two digital output signals as an output signal of a defective ADC slice. a plurality of analog-to-digital converter blocks coupled to one another to form a time-interleaved ADC, each ADC block including a plurality of ADC slices, wherein a count of the plurality of ADC blocks is M; and a clock circuit configured to provide a plurality of clock signals, wherein: a portion N of M ADC blocks are configured to be active, in a normal mode of operation, N and M are integer numbers, N is smaller than M, a portion N of M ADC blocks are configured to be active, in a normal mode of operation, N and M are integer numbers, N is smaller than M, a remaining portion of the M ADC blocks are redundant ADC blocks, and one or more of the redundant ADC blocks are configured to be selectively active, in a healing mode of operation, and be swapped for one or more failed ADC blocks using the plurality of clock signals, characterized in that: in the healing mode of operation, at least one of the failed ADC blocks is configured to be healed, wherein the at least one of the failed ADC blocks is configured to be healed by using electronic redundancy, wherein, in the normal mode of operation, each ADC slice runs at a sampling rate that is the same as the frequency of a clock signal associated with that ADC slice, in the healing mode of operation, the ADC slice is configured to run at a sampling rate that is twice the frequency of the clock signal associated with that ADC slice, and at least one of the ADC slices of the at least one of the failed ADC blocks that is configured to be healed by using electronic redundancy is configured to generate two digital output signals, and the at least one of the failed ADC blocks is configured to use one of the two digital output signals as an output signal of a defective ADC slice. in the healing mode of operation, at least one of the failed ADC blocks is configured to be healed, wherein the at least one of the failed ADC blocks is configured to be healed by using electronic redundancy, wherein, in the normal mode of operation, each ADC slice runs at a sampling rate that is the same as the frequency of a clock signal associated with that ADC slice, in the healing mode of operation, the ADC slice is configured to run at a sampling rate that is twice the frequency of the clock signal associated with that ADC slice, and at least one of the ADC slices of the at least one of the failed ADC blocks that is configured to be healed by using electronic redundancy is configured to generate two digital output signals, and the at least one of the failed ADC blocks is configured to use one of the two digital output signals as an output signal of a defective ADC slice.