A multimodal optical sectioning microscope (200, 400, 600) for full-field imaging of a volumic and scattering sample comprising: - a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system (201, 401, 601) and a full-field imaging interferometer, wherein the full-field imaging interferometer comprises: o a beamsplitter (202, 302, 402, 602) for defining a reference arm with a reference mirror and an object arm for receiving the sample and comprising a microscope objective (203, 403, 603), o a detection sub system (208, 408, 608) and ∘ an optical conjugation device (203, 207) for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises said microscope objective (203, 403, 603), - a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope, wherein said structured illumination microscope comprises: ∘ an illumination sub system (220, 401, 623), ∘ an imaging channel comprising said microscope objective (203, 403, 603) of said full-field imaging interferometer and means (220, 421, 422, 621, 622) for generating at the focal plane of said microscope objective a variable spatial pattern illumination, ∘ optical coupling means (213, 214, 202, 402, 632, 602) for optically coupling said imaging channel with the object arm of the full-field imaging interferometer, wherein said coupling means comprise said beamsplitter (202, 302, 402, 602) and ∘ a detection sub system, optically conjugated with said focal plane of the microscope objective. - a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system (201, 401, 601) and a full-field imaging interferometer, wherein the full-field imaging interferometer comprises: o a beamsplitter (202, 302, 402, 602) for defining a reference arm with a reference mirror and an object arm for receiving the sample and comprising a microscope objective (203, 403, 603), o a detection sub system (208, 408, 608) and ∘ an optical conjugation device (203, 207) for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises said microscope objective (203, 403, 603), o a beamsplitter (202, 302, 402, 602) for defining a reference arm with a reference mirror and an object arm for receiving the sample and comprising a microscope objective (203, 403, 603), o a detection sub system (208, 408, 608) and ∘ an optical conjugation device (203, 207) for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises said microscope objective (203, 403, 603), - a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope, wherein said structured illumination microscope comprises: ∘ an illumination sub system (220, 401, 623), ∘ an imaging channel comprising said microscope objective (203, 403, 603) of said full-field imaging interferometer and means (220, 421, 422, 621, 622) for generating at the focal plane of said microscope objective a variable spatial pattern illumination, ∘ optical coupling means (213, 214, 202, 402, 632, 602) for optically coupling said imaging channel with the object arm of the full-field imaging interferometer, wherein said coupling means comprise said beamsplitter (202, 302, 402, 602) and ∘ a detection sub system, optically conjugated with said focal plane of the microscope objective. ∘ an illumination sub system (220, 401, 623), ∘ an imaging channel comprising said microscope objective (203, 403, 603) of said full-field imaging interferometer and means (220, 421, 422, 621, 622) for generating at the focal plane of said microscope objective a variable spatial pattern illumination, ∘ optical coupling means (213, 214, 202, 402, 632, 602) for optically coupling said imaging channel with the object arm of the full-field imaging interferometer, wherein said coupling means comprise said beamsplitter (202, 302, 402, 602) and ∘ a detection sub system, optically conjugated with said focal plane of the microscope objective.