An inspection apparatus for inspecting an appearance of an object having a satin-finished area on its surface, comprising: a first lighting part (41 to 43) for irradiating a predetermined object area on a surface of an object with light from only one direction; a second lighting part (41 to 43) for irradiating said object area with light from a plurality of directions; an image pickup part (30 to 33) for picking up an image of said object area; a defect candidate detection part for detecting an area of a defect candidate in said object area as a first defect candidate area by comparing a first picked-up image acquired in said image pickup part by light irradiation from said first lighting part, with a first reference image corresponding to said first picked-up image, and detecting an area of a defect candidate in said object area as a second defect candidate area by comparing a second picked-up image acquired in said image pickup part by light irradiation from said second lighting part, with a second reference image corresponding to said second picked-up image; a defect specifying part for specifying an overlapping area in said first defect candidate area and said second defect candidate area as a defect area in said object area; and a control part, wherein said second lighting part has a plurality of light source parts (41 to 43) for irradiating said object area with light from a plurality of directions, respectively, and characterized in that one of said plurality of light source parts is said first lighting part, said control part sequentially uses each of said plurality of light source parts as said first lighting part, to cause said image pickup part to acquire a plurality of first picked-up images, said defect candidate detection part compares said plurality of first picked-up images with a plurality of first reference images corresponding to said plurality of first picked-up images, respectively, to generate a plurality of first defect candidate images each representing a first defect candidate area, and said defect specifying part specifies an overlapping area in said first defect candidate area represented by each first defect candidate image and said second defect candidate area, as a defect area in said object area. a first lighting part (41 to 43) for irradiating a predetermined object area on a surface of an object with light from only one direction; a second lighting part (41 to 43) for irradiating said object area with light from a plurality of directions; an image pickup part (30 to 33) for picking up an image of said object area; a defect candidate detection part for detecting an area of a defect candidate in said object area as a first defect candidate area by comparing a first picked-up image acquired in said image pickup part by light irradiation from said first lighting part, with a first reference image corresponding to said first picked-up image, and detecting an area of a defect candidate in said object area as a second defect candidate area by comparing a second picked-up image acquired in said image pickup part by light irradiation from said second lighting part, with a second reference image corresponding to said second picked-up image; a defect specifying part for specifying an overlapping area in said first defect candidate area and said second defect candidate area as a defect area in said object area; and a control part, wherein said second lighting part has a plurality of light source parts (41 to 43) for irradiating said object area with light from a plurality of directions, respectively, and characterized in that one of said plurality of light source parts is said first lighting part, said control part sequentially uses each of said plurality of light source parts as said first lighting part, to cause said image pickup part to acquire a plurality of first picked-up images, said defect candidate detection part compares said plurality of first picked-up images with a plurality of first reference images corresponding to said plurality of first picked-up images, respectively, to generate a plurality of first defect candidate images each representing a first defect candidate area, and said defect specifying part specifies an overlapping area in said first defect candidate area represented by each first defect candidate image and said second defect candidate area, as a defect area in said object area.