Micromechanical device for measuring an acceleration, a pressure or the like in a measuring plane, comprising - a substrate, - a seismic mass arranged such that it can move on the substrate, wherein the seismic mass is formed such that it can rotate about an axis of rotation and the axis of rotation is arranged in the measuring plane; wherein, on opposite sides of the seismic mass in relation to the axis of rotation, in each case at least one ground electrode is arranged on the seismic mass and in each case at least one stationary electrode is arranged on the substrate; - wherein the respective at least one stationary electrode and the respective at least one ground electrode are formed in the measuring plane for measuring an acceleration, a pressure or the like in the measuring plane, and wherein the respective at least one stationary electrode and the respective at least one ground electrode are formed for measuring an acceleration, pressure or the like acting on the seismic mass perpendicular to the measuring plane, wherein the respective at least one stationary electrode comprises two, upper and lower first metallic first regions (3a, 4a; 3b, 4b) arranged perpendicularly one above the other and the respective at least one ground electrode comprises at least one second metallic region (6a, 6b), wherein the first regions (3a, 4a; 3b, 4b) and the second region (6a, 6b) interact to form a first and a second capacitance (C1, C2; C3, C4), wherein the respective at least one stationary electrode and the respective at least one ground electrode are arranged in such a way that in an initial position the first and second capacitances (C1, C2; C3, C4) are equal and wherein, in the event of a deflection of the respective at least one ground electrode in an upward direction, the first capacitance (C1; C3) increases and the second capacitance (C2; C4) decreases and wherein, in the event of a deflection of the respective at least one ground electrode in an opposite direction, the first capacitance (C1; C3) decreases and the second capacitance (C2; C4) increases; characterized in that the respectively upper first metallic regions (3a, 3b) of the respective at least one stationary electrode on one side of the seismic mass are interconnected with the respectively lower first metallic regions (4a, 4b) of the respective at least one stationary electrode on the other side of the seismic mass for measuring an acceleration, a pressure or the like. - a substrate, - a seismic mass arranged such that it can move on the substrate, wherein the seismic mass is formed such that it can rotate about an axis of rotation and the axis of rotation is arranged in the measuring plane; - wherein the respective at least one stationary electrode and the respective at least one ground electrode are formed in the measuring plane for measuring an acceleration, a pressure or the like in the measuring plane, and wherein the respective at least one stationary electrode and the respective at least one ground electrode are formed for measuring an acceleration, pressure or the like acting on the seismic mass perpendicular to the measuring plane, wherein the respective at least one stationary electrode comprises two, upper and lower first metallic first regions (3a, 4a; 3b, 4b) arranged perpendicularly one above the other and the respective at least one ground electrode comprises at least one second metallic region (6a, 6b), wherein the first regions (3a, 4a; 3b, 4b) and the second region (6a, 6b) interact to form a first and a second capacitance (C1, C2; C3, C4), wherein the respective at least one stationary electrode and the respective at least one ground electrode are arranged in such a way that in an initial position the first and second capacitances (C1, C2; C3, C4) are equal and wherein, in the event of a deflection of the respective at least one ground electrode in an upward direction, the first capacitance (C1; C3) increases and the second capacitance (C2; C4) decreases and wherein, in the event of a deflection of the respective at least one ground electrode in an opposite direction, the first capacitance (C1; C3) decreases and the second capacitance (C2; C4) increases;