An inspection apparatus for inspecting an annular cavity formed in the structure of an aircraft, the apparatus comprising: a rotating scanner device having a grip portion arranged so that it may be manually gripped or held by an operator; and a probe apparatus comprising: a first end configured to connect to a rotating scanner device; and, a second end comprising: two or more eddy current elements; a positioning mechanism configured to position the two or more eddy current elements against cavity walls of the annular cavity of the structure to be inspected with the probe apparatus, when the probe apparatus is positioned within the annular cavity; an aligning mechanism coupled to the positioning mechanism, the aligning mechanism configured to align the two or more eddy current elements in a perpendicular position with respect to the cavity walls of the annular cavity, when the probe apparatus is positioned within the annular cavity; and, wherein the probe apparatus further comprises: three or more foot portions, each foot portion coupled to the positioning mechanism and each foot portion coupled to the aligning mechanism, and wherein electromagnetic coil elements of the two or more eddy current elements are coupled to at least one of the three or more foot portions, wherein the positioning mechanism comprises: three or more positioning arm elements configured to expand and contract about a fulcrum member of the probe apparatus and the alignment mechanism comprises three or more pivot joint mechanisms each configured to rotate one of the three or more foot portions. a rotating scanner device having a grip portion arranged so that it may be manually gripped or held by an operator; and a probe apparatus comprising: a first end configured to connect to a rotating scanner device; and, a second end comprising: two or more eddy current elements; a positioning mechanism configured to position the two or more eddy current elements against cavity walls of the annular cavity of the structure to be inspected with the probe apparatus, when the probe apparatus is positioned within the annular cavity; an aligning mechanism coupled to the positioning mechanism, the aligning mechanism configured to align the two or more eddy current elements in a perpendicular position with respect to the cavity walls of the annular cavity, when the probe apparatus is positioned within the annular cavity; and, wherein the probe apparatus further comprises: three or more foot portions, each foot portion coupled to the positioning mechanism and each foot portion coupled to the aligning mechanism, and wherein electromagnetic coil elements of the two or more eddy current elements are coupled to at least one of the three or more foot portions, wherein the positioning mechanism comprises: a first end configured to connect to a rotating scanner device; and, a second end comprising: two or more eddy current elements; a positioning mechanism configured to position the two or more eddy current elements against cavity walls of the annular cavity of the structure to be inspected with the probe apparatus, when the probe apparatus is positioned within the annular cavity; an aligning mechanism coupled to the positioning mechanism, the aligning mechanism configured to align the two or more eddy current elements in a perpendicular position with respect to the cavity walls of the annular cavity, when the probe apparatus is positioned within the annular cavity; and, two or more eddy current elements; a positioning mechanism configured to position the two or more eddy current elements against cavity walls of the annular cavity of the structure to be inspected with the probe apparatus, when the probe apparatus is positioned within the annular cavity; an aligning mechanism coupled to the positioning mechanism, the aligning mechanism configured to align the two or more eddy current elements in a perpendicular position with respect to the cavity walls of the annular cavity, when the probe apparatus is positioned within the annular cavity; and, wherein the probe apparatus further comprises: three or more foot portions, each foot portion coupled to the positioning mechanism and each foot portion coupled to the aligning mechanism, and wherein electromagnetic coil elements of the two or more eddy current elements are coupled to at least one of the three or more foot portions, wherein the positioning mechanism comprises: three or more positioning arm elements configured to expand and contract about a fulcrum member of the probe apparatus and the alignment mechanism comprises three or more pivot joint mechanisms each configured to rotate one of the three or more foot portions.