A method for inspecting a component, the method comprising: inducing, by an inductive coil, an electrical current flow into the component; capturing, by an infrared camera, thermographic data of the component, wherein the thermographic data comprises at least a first set of frames corresponding to a first area of the component at a first time interval and a second set of frames corresponding to a second area of the component at a second time interval different from the first time interval; determining, by a processing unit, a first reference point in the thermographic data of the first set of frames based on and corresponding to a drop in temperature at a portion of the component, wherein the first reference point indicates that the portion of the component is blocked by the inductive coil from the IR camera; determining, by the processing unit, a second reference point in the thermographic data of the second set of frames based on and corresponding to a drop in temperature at another portion of the component, wherein the second reference point indicates that the another portion of the component is blocked by the inductive coil from the IR camera; selecting, by the processing unit, a first sub-set of frames from the first set of frames, wherein the first sub-set of frames is selected within a first process period before the first reference point; selecting, by the processing unit, a second sub-set of frames from the second set of frames, wherein the second sub-set of frames is selected within a second process period before the second reference point; constructing, by the processing unit, a thermal image based on at least the first sub-set of frames and the second sub-set of frames corresponding to the component, wherein said step comprises combining the first sub-set of frames and the second sub-set of frames to construct at least in part the thermal image of the component; and determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component. inducing, by an inductive coil, an electrical current flow into the component; capturing, by an infrared camera, thermographic data of the component, wherein the thermographic data comprises at least a first set of frames corresponding to a first area of the component at a first time interval and a second set of frames corresponding to a second area of the component at a second time interval different from the first time interval; determining, by a processing unit, a first reference point in the thermographic data of the first set of frames based on and corresponding to a drop in temperature at a portion of the component, wherein the first reference point indicates that the portion of the component is blocked by the inductive coil from the IR camera; determining, by the processing unit, a second reference point in the thermographic data of the second set of frames based on and corresponding to a drop in temperature at another portion of the component, wherein the second reference point indicates that the another portion of the component is blocked by the inductive coil from the IR camera; selecting, by the processing unit, a first sub-set of frames from the first set of frames, wherein the first sub-set of frames is selected within a first process period before the first reference point; selecting, by the processing unit, a second sub-set of frames from the second set of frames, wherein the second sub-set of frames is selected within a second process period before the second reference point; constructing, by the processing unit, a thermal image based on at least the first sub-set of frames and the second sub-set of frames corresponding to the component, wherein said step comprises combining the first sub-set of frames and the second sub-set of frames to construct at least in part the thermal image of the component; and determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.