A method for determining a calibration parameter for an in vivo glucose sensor including: providing a lot of in vivo glucose sensors, each in vivo glucose sensor comprising: a substrate; a conductive layer (804, 804a, 804b) disposed over at least a portion of the substrate: a dielectric layer disposed over the conductive layer and having a void therein: at least one active sensing layer disposed within the void, wherein the area of the active sensing layer in contact with the conductive layer has a sensor-to-sensor coefficient of variation of less than approximately 5% within the sensor lot; and at least one membrane disposed over the sensing layer, wherein the membrane has a defined thickness with a sensor-to-sensor coefficient of variation of less than approximately 5% within the sensor lot; testing a glucose response of a sample of the lot of in vivo glucose sensors to determine a calibration parameter of the lot; determining the membrane thickness and the surface area of the active sensing layer of each of the sampled sensors of the lot and based thereon a mean membrane thickness for the sampled sensors of the lot and a mean surface area of the active sensing layer for the sampled sensors; non-destructively determining a physical characteristic of the in vivo glucose sensor, the physical characteristic comprising at least one of: a thickness of the at least one membrane of the in vivo glucose sensor; and a surface area of an active sensing layer of the in vivo glucose sensor; and assigning a sensor specific calibration parameter for the in vivo glucose sensor by adjusting the calibration parameter of the lot based upon a comparison of the determined physical characteristic of the in vivo glucose sensor with the respective determined mean for the sampled sensors of the lot. providing a lot of in vivo glucose sensors, each in vivo glucose sensor comprising: a substrate; a conductive layer (804, 804a, 804b) disposed over at least a portion of the substrate: a dielectric layer disposed over the conductive layer and having a void therein: at least one active sensing layer disposed within the void, wherein the area of the active sensing layer in contact with the conductive layer has a sensor-to-sensor coefficient of variation of less than approximately 5% within the sensor lot; and at least one membrane disposed over the sensing layer, wherein the membrane has a defined thickness with a sensor-to-sensor coefficient of variation of less than approximately 5% within the sensor lot; a substrate; a conductive layer (804, 804a, 804b) disposed over at least a portion of the substrate: a dielectric layer disposed over the conductive layer and having a void therein: at least one active sensing layer disposed within the void, wherein the area of the active sensing layer in contact with the conductive layer has a sensor-to-sensor coefficient of variation of less than approximately 5% within the sensor lot; and at least one membrane disposed over the sensing layer, wherein the membrane has a defined thickness with a sensor-to-sensor coefficient of variation of less than approximately 5% within the sensor lot; testing a glucose response of a sample of the lot of in vivo glucose sensors to determine a calibration parameter of the lot; determining the membrane thickness and the surface area of the active sensing layer of each of the sampled sensors of the lot and based thereon a mean membrane thickness for the sampled sensors of the lot and a mean surface area of the active sensing layer for the sampled sensors; non-destructively determining a physical characteristic of the in vivo glucose sensor, the physical characteristic comprising at least one of: a thickness of the at least one membrane of the in vivo glucose sensor; and a surface area of an active sensing layer of the in vivo glucose sensor; and assigning a sensor specific calibration parameter for the in vivo glucose sensor by adjusting the calibration parameter of the lot based upon a comparison of the determined physical characteristic of the in vivo glucose sensor with the respective determined mean for the sampled sensors of the lot.