An eddy-current flaw detector comprising: a profilometer configured to acquire surface shape data of an object to be inspected; an inspection probe; a trace data calculator being configured to calculate each coordinate of the flaw detection points on which the inspection probe including a contact plane is moved and positioned to perform an eddy-current testing, the flaw detection points being predetermined on a surface of the object based on flaw detection conditions to be inputted and the surface shape data acquired by the profilometer, and to calculate each of first normal vectors at each of the flaw detection points; the trace data calculator being configured to calculate a second normal vector being perpendicular to the contact plane of the inspection probe, said second vector passing through a center point of the contact plane, the trace data calculator being further configured to calculate the position and orientation of the inspection probe with respect to each flaw detection point under the conditions where (i) the inspection probe is arranged to be in contact with the object surface, and (ii) the second normal vector of the contact plane of the inspection probe oriented toward a side of the object surface at the time of scanning matches the first normal vector calculated by the trace data calculator; a gap evaluation calculator storing the surface shape data and contact shape data of the inspection probe configured to acquire, using the surface shape data and the contact shape data of the inspection probe, an evaluation result by evaluating a gap between the object surface and the inspection probe for each of the flaw detection points; a flaw detection data collector configured to acquire flaw detection data of the object to be inspected for each of the flaw detection points from the inspection probe; and a flaw detection data analyzer configured to evaluate presence/absence of a flaw in the object surface based on the flaw detection data of the object to be inspected and the evaluation result, acquired for each of the flaw detection points. a profilometer configured to acquire surface shape data of an object to be inspected; an inspection probe; a trace data calculator being configured to calculate each coordinate of the flaw detection points on which the inspection probe including a contact plane is moved and positioned to perform an eddy-current testing, the flaw detection points being predetermined on a surface of the object based on flaw detection conditions to be inputted and the surface shape data acquired by the profilometer, and to calculate each of first normal vectors at each of the flaw detection points; the trace data calculator being configured to calculate a second normal vector being perpendicular to the contact plane of the inspection probe, said second vector passing through a center point of the contact plane, the trace data calculator being further configured to calculate the position and orientation of the inspection probe with respect to each flaw detection point under the conditions where (i) the inspection probe is arranged to be in contact with the object surface, and (ii) the second normal vector of the contact plane of the inspection probe oriented toward a side of the object surface at the time of scanning matches the first normal vector calculated by the trace data calculator; a gap evaluation calculator storing the surface shape data and contact shape data of the inspection probe configured to acquire, using the surface shape data and the contact shape data of the inspection probe, an evaluation result by evaluating a gap between the object surface and the inspection probe for each of the flaw detection points; a flaw detection data collector configured to acquire flaw detection data of the object to be inspected for each of the flaw detection points from the inspection probe; and a flaw detection data analyzer configured to evaluate presence/absence of a flaw in the object surface based on the flaw detection data of the object to be inspected and the evaluation result, acquired for each of the flaw detection points.