A system (200, 300) that is configured to detect both opaque defects and transparent defects in transparent containers (104, 105, 106), the system comprising: (paragraph) an emitter that is configured to direct a color gradient through a sidewall of a transparent container (104, 105, 106), wherein the emitter is a backlight (310, 312, 314, 316), wherein color of light passing through the sidewall of the transparent container (104, 105, 106) varies across the sidewall of the transparent container (104, 105, 106) while intensity of the light is approximately uniform across the sidewall of the transparent container, the emitter comprising: a first light emitter (202, 204, 206) that is configured to emit light of a first color through a first region (210, 212, 214) of the sidewall; a second light emitter (202, 204, 206) that is configured to emit light of a second color through a second region (210, 212, 214) of the sidewall; and a third light emitter (202, 204, 206) that is configured to emit light of a third color through a third region (210, 212, 214) of the sidewall; a camera that is configured to capture an image (400, 500, 606) of the sidewall of the transparent container (104, 105, 106) while the color gradient is directed through the sidewall of the transparent container (104, 105, 106); and a computing system that is in communication with the camera, the computing system is configured to receive the image (400, 500, 606) and analyze the image (400, 500, 606) for both opaque defects and transparent defects that may exist in the sidewall of the transparent container (104, 105, 106), where the computing system is able to analyze the image (400, 500, 606) for opaque defects due to the intensity of the light being approximately uniform across the sidewall of the transparent container (104, 105, 106), and further where the computing system is able to analyze the image (400, 500, 606) for transparent defects due to different colors of light being directed through different locations of the sidewall of the transparent container (104, 105, 106), and output an indication that the transparent container (104, 105, 106) includes the defect (402, 404, 502) based upon the image (400, 500, 606) of the sidewall of the container (104, 105, 106). an emitter that is configured to direct a color gradient through a sidewall of a transparent container (104, 105, 106), wherein the emitter is a backlight (310, 312, 314, 316), wherein color of light passing through the sidewall of the transparent container (104, 105, 106) varies across the sidewall of the transparent container (104, 105, 106) while intensity of the light is approximately uniform across the sidewall of the transparent container, the emitter comprising: a first light emitter (202, 204, 206) that is configured to emit light of a first color through a first region (210, 212, 214) of the sidewall; a second light emitter (202, 204, 206) that is configured to emit light of a second color through a second region (210, 212, 214) of the sidewall; and a third light emitter (202, 204, 206) that is configured to emit light of a third color through a third region (210, 212, 214) of the sidewall; a first light emitter (202, 204, 206) that is configured to emit light of a first color through a first region (210, 212, 214) of the sidewall; a second light emitter (202, 204, 206) that is configured to emit light of a second color through a second region (210, 212, 214) of the sidewall; and a third light emitter (202, 204, 206) that is configured to emit light of a third color through a third region (210, 212, 214) of the sidewall; a camera that is configured to capture an image (400, 500, 606) of the sidewall of the transparent container (104, 105, 106) while the color gradient is directed through the sidewall of the transparent container (104, 105, 106); and a computing system that is in communication with the camera, the computing system is configured to receive the image (400, 500, 606) and analyze the image (400, 500, 606) for both opaque defects and transparent defects that may exist in the sidewall of the transparent container (104, 105, 106), where the computing system is able to analyze the image (400, 500, 606) for opaque defects due to the intensity of the light being approximately uniform across the sidewall of the transparent container (104, 105, 106), and further where the computing system is able to analyze the image (400, 500, 606) for transparent defects due to different colors of light being directed through different locations of the sidewall of the transparent container (104, 105, 106), and output an indication that the transparent container (104, 105, 106) includes the defect (402, 404, 502) based upon the image (400, 500, 606) of the sidewall of the container (104, 105, 106).