A single-crystal X-ray structure analysis system that performs a structure analysis of a material, the system comprising: a soaking apparatus, a single-crystal X-ray structure analysis apparatus, the single-crystal X-ray structure analysis apparatus comprising: an X-ray source adapted to generate X-rays; a sample holder adapted to hold a sample, the sample holder comprising a porous complex crystal configured to soak the sample in a plurality of fine pores formed therein; a goniometer configured to move rotationally, the sample holder being attached to the goniometer; an X-ray irradiation section configured to irradiate the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; an X-ray detection measurement section adapted to detect and measure X-rays diffracted or scattered by the sample; and a structure analysis section configured to perform a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section, wherein the soaking apparatus is configured to soak the sample in the porous complex crystal of the sample holder, wherein the soaking apparatus comprises a control section configured such that the sample supplied can be selectively introduced into and soaked in the porous complex crystal of the sample holder, wherein the sample is soaked in the porous complex crystal of the sample holder by adjusting a pressure of a flow passage with the control section. a soaking apparatus, a single-crystal X-ray structure analysis apparatus, the single-crystal X-ray structure analysis apparatus comprising: an X-ray source adapted to generate X-rays; a sample holder adapted to hold a sample, the sample holder comprising a porous complex crystal configured to soak the sample in a plurality of fine pores formed therein; a goniometer configured to move rotationally, the sample holder being attached to the goniometer; an X-ray irradiation section configured to irradiate the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; an X-ray detection measurement section adapted to detect and measure X-rays diffracted or scattered by the sample; and a structure analysis section configured to perform a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section, wherein the soaking apparatus is configured to soak the sample in the porous complex crystal of the sample holder, wherein the soaking apparatus comprises a control section configured such that the sample supplied can be selectively introduced into and soaked in the porous complex crystal of the sample holder, wherein the sample is soaked in the porous complex crystal of the sample holder by adjusting a pressure of a flow passage with the control section. an X-ray source adapted to generate X-rays; a sample holder adapted to hold a sample, the sample holder comprising a porous complex crystal configured to soak the sample in a plurality of fine pores formed therein; a goniometer configured to move rotationally, the sample holder being attached to the goniometer; an X-ray irradiation section configured to irradiate the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; an X-ray detection measurement section adapted to detect and measure X-rays diffracted or scattered by the sample; and a structure analysis section configured to perform a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section, wherein the soaking apparatus is configured to soak the sample in the porous complex crystal of the sample holder, wherein the soaking apparatus comprises a control section configured such that the sample supplied can be selectively introduced into and soaked in the porous complex crystal of the sample holder, wherein the sample is soaked in the porous complex crystal of the sample holder by adjusting a pressure of a flow passage with the control section.