A system for X-ray dark field, phase contrast and attenuation tomosynthesis image acquisition, the system comprising: - an X-ray source; - an interferometer arrangement; - an X-ray detector; - a control unit; and - an output unit; wherein, a first axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector; wherein, an examination region is located between the X-ray source and the X-ray, wherein the first axis extends through the examination region, and wherein the examination region is configured to enable location of an objection to be examined; wherein, the interferometer arrangement is located between the X-ray source and the X-ray detector, wherein the interferometer arrangement comprises a first grating and a second grating, and wherein a second axis is defined that is perpendicular to a plane that is defined with respect to a centre of the first grating and/or a centre of the second grating; wherein, the control unit is configured to control movement of the X-ray source and/or movement of the X-ray detector to provide a plurality of image acquisition states for which the X-ray source and X-ray detector are configured to operate to acquire image data, and wherein for each of the plurality of image acquisition states the first axis extends through the examination region at a different angle; wherein, the control unit is configured to control movement of the first grating or movement of the second grating in a lateral position direction perpendicular to the second axis, and wherein for each of the acquisition states the first grating or second grating is at a different lateral position of a plurality of lateral positions; and wherein, the output unit is configured to output one or more of: dark field image data, phase contrast image data, and attenuation image data. - an X-ray source; - an interferometer arrangement; - an X-ray detector; - a control unit; and - an output unit; wherein, a first axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector; wherein, an examination region is located between the X-ray source and the X-ray, wherein the first axis extends through the examination region, and wherein the examination region is configured to enable location of an objection to be examined; wherein, the interferometer arrangement is located between the X-ray source and the X-ray detector, wherein the interferometer arrangement comprises a first grating and a second grating, and wherein a second axis is defined that is perpendicular to a plane that is defined with respect to a centre of the first grating and/or a centre of the second grating; wherein, the control unit is configured to control movement of the X-ray source and/or movement of the X-ray detector to provide a plurality of image acquisition states for which the X-ray source and X-ray detector are configured to operate to acquire image data, and wherein for each of the plurality of image acquisition states the first axis extends through the examination region at a different angle; wherein, the control unit is configured to control movement of the first grating or movement of the second grating in a lateral position direction perpendicular to the second axis, and wherein for each of the acquisition states the first grating or second grating is at a different lateral position of a plurality of lateral positions; and wherein, the output unit is configured to output one or more of: dark field image data, phase contrast image data, and attenuation image data. wherein, a first axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector; wherein, an examination region is located between the X-ray source and the X-ray, wherein the first axis extends through the examination region, and wherein the examination region is configured to enable location of an objection to be examined; wherein, the interferometer arrangement is located between the X-ray source and the X-ray detector, wherein the interferometer arrangement comprises a first grating and a second grating, and wherein a second axis is defined that is perpendicular to a plane that is defined with respect to a centre of the first grating and/or a centre of the second grating; wherein, the control unit is configured to control movement of the X-ray source and/or movement of the X-ray detector to provide a plurality of image acquisition states for which the X-ray source and X-ray detector are configured to operate to acquire image data, and wherein for each of the plurality of image acquisition states the first axis extends through the examination region at a different angle; wherein, the control unit is configured to control movement of the first grating or movement of the second grating in a lateral position direction perpendicular to the second axis, and wherein for each of the acquisition states the first grating or second grating is at a different lateral position of a plurality of lateral positions; and wherein, the output unit is configured to output one or more of: dark field image data, phase contrast image data, and attenuation image data.