Method of SPIM microscopy using a microscope, consisting of - an illumination device comprising an illumination light source (L1, L2) and an illumination beam path for illuminating a sample with a light sheet, - a detection device for detecting light radiated from the sample using an objective, - the light sheet being substantially planar in the focus of the objective or in a defined plane in the vicinity of the focus of the imaging objective and the objective having an optical axis intersecting the plane of the light sheet at an angle that is different from zero, preferably perpendicularly, - the sample being displaced through the light sheet in the direction of the optical axis of the objective for the purpose of detecting different sample planes and an illumination of the sample being implemented at at least a first and a second illumination angle and a plurality of sample planes being detected at each illumination angle and being stored as at least first and second image stacks (ST1, ST2) containing sample structures, characterized in that A. there is a manual alignment of the image stacks (ST1, ST2) in relation to one another by virtue of the coordinate systems of all image stacks (ST1, ST2) being aligned into the coordinate system of the first image stack, B. the at least first and second image stacks (ST1, ST2) are overlaid to form an overlaid image stack (ST1+ST2), C. there is a projection of the overlaid image stack (ST1+ST2) into a two-dimensional representation, D. sample structures detected from different illumination angles and contained in the two-dimensional representation are corrected in terms of their pose in relation to one another, E. a coordinate transformation is ascertained from the coordinates of the pose correction of the sample structures, F. the coordinate transformation is applied to the overlaid image stack (ST1+ST2) for alignment purposes. - an illumination device comprising an illumination light source (L1, L2) and an illumination beam path for illuminating a sample with a light sheet, - a detection device for detecting light radiated from the sample using an objective, - the light sheet being substantially planar in the focus of the objective or in a defined plane in the vicinity of the focus of the imaging objective and the objective having an optical axis intersecting the plane of the light sheet at an angle that is different from zero, preferably perpendicularly, - the sample being displaced through the light sheet in the direction of the optical axis of the objective for the purpose of detecting different sample planes and an illumination of the sample being implemented at at least a first and a second illumination angle and a plurality of sample planes being detected at each illumination angle and being stored as at least first and second image stacks (ST1, ST2) containing sample structures, A. there is a manual alignment of the image stacks (ST1, ST2) in relation to one another by virtue of the coordinate systems of all image stacks (ST1, ST2) being aligned into the coordinate system of the first image stack, B. the at least first and second image stacks (ST1, ST2) are overlaid to form an overlaid image stack (ST1+ST2), C. there is a projection of the overlaid image stack (ST1+ST2) into a two-dimensional representation, D. sample structures detected from different illumination angles and contained in the two-dimensional representation are corrected in terms of their pose in relation to one another, E. a coordinate transformation is ascertained from the coordinates of the pose correction of the sample structures, F. the coordinate transformation is applied to the overlaid image stack (ST1+ST2) for alignment purposes.