A method for collecting a vapor condensate sample, comprising: (a) obtaining a device for analyzing a VC sample comprising a collection plate and a cover plate, wherein: i. the plates are movable relative to each other, having an open configuration and a closed configuration; ii. one or both plates are flexible and collect a vapor condensate sample that contains or is suspected of containing an analyte; iii. each of the plates has, on its respective surface, a sample contact area for contacting the VC sample; iv. one or both of the plates comprise spacers that are fixed with a respective plate, wherein the spacers have a predetermined substantially uniform height and a predetermined inter-spacer distance and wherein at least one of the spacers is inside the sample contact area; (b) depositing the vapor condensate sample onto one or both pates of the device; and (c) placing the plates in a closed configuration within 120 seconds after the end of step (b); and wherein, in the open configuration, the two plates are completely or partially separated and the spacing between the plates is not regulated by the spacers; and wherein, in the closed configuration, at least a part of the VC sample is between the two plates and in contact with the two plates, having a highly uniform thickness that is regulated by the spacers and the two sample surfaces of the plates and is equal to or less than 100 μm. (a) obtaining a device for analyzing a VC sample comprising a collection plate and a cover plate, wherein: i. the plates are movable relative to each other, having an open configuration and a closed configuration; ii. one or both plates are flexible and collect a vapor condensate sample that contains or is suspected of containing an analyte; iii. each of the plates has, on its respective surface, a sample contact area for contacting the VC sample; iv. one or both of the plates comprise spacers that are fixed with a respective plate, wherein the spacers have a predetermined substantially uniform height and a predetermined inter-spacer distance and wherein at least one of the spacers is inside the sample contact area; i. the plates are movable relative to each other, having an open configuration and a closed configuration; ii. one or both plates are flexible and collect a vapor condensate sample that contains or is suspected of containing an analyte; iii. each of the plates has, on its respective surface, a sample contact area for contacting the VC sample; iv. one or both of the plates comprise spacers that are fixed with a respective plate, wherein the spacers have a predetermined substantially uniform height and a predetermined inter-spacer distance and wherein at least one of the spacers is inside the sample contact area; (b) depositing the vapor condensate sample onto one or both pates of the device; and (c) placing the plates in a closed configuration within 120 seconds after the end of step (b); and wherein, in the open configuration, the two plates are completely or partially separated and the spacing between the plates is not regulated by the spacers; and wherein, in the closed configuration, at least a part of the VC sample is between the two plates and in contact with the two plates, having a highly uniform thickness that is regulated by the spacers and the two sample surfaces of the plates and is equal to or less than 100 μm.