An operation guide system for X-ray analysis, the operation guide system comprising a computer comprising: measurement information acquisition means configured to acquire information on a sample, and information on each of a plurality of X-ray measurement optical system parts configured to conduct X-ray analysis on the sample; sample magnification acquisition means configured to acquire a magnification by which the sample is to be magnified for display; incident X-ray shape deformation means configured to determine a distorted shape of an incident X-ray obtained when the sample is measured through use of the plurality of X-ray measurement optical system parts; scattered X-ray shape deformation means configured to determine a distorted shape of a scattered X-ray obtained when the sample is measured through use of the plurality of X-ray measurement optical system parts; X-ray measurement optical system modeling means configured to model a deformed shape of the sample, which is obtained by magnifying a shape of the sample based on the magnification, the distorted shape of the incident X-ray, and the distorted shape of the scattered X-ray; an X-ray measurement optical system rendering portion configured to generate a two-dimensional digital image from a state described as numerical data related to the deformed shape of the sample, the distorted shape of the incident X-ray and the distorted shape of the scattered X-ray, which are modeled by the X-ray measurement optical system modeling means; and a display instruction portion configured to give an instruction to display the two-dimensional digital image generated by the X-ray measurement optical system rendering portion as a display image, wherein the distorted shape of the incident X-ray is a shape obtained by magnifying a shape of an incident X-ray, which irradiates the sample, based on the magnification in a plane perpendicular to an incident optical axis direction of the incident X-ray, wherein the incident X-ray shape deformation means is configured to maintain the shape of the incident X-ray in the incident optical axis direction of the incident X-ray, wherein the distorted shape of the scattered X-ray is a shape obtained by magnifying a shape of a scattered X-ray, which is generated from the sample to be detected, based on the magnification in a plane perpendicular to a scattered optical axis direction of the scattered X-ray, and wherein the scattered X-ray shape deformation means is configured to maintain the shape of the scattered X-ray in the scattered optical axis direction of the scattered X-ray. measurement information acquisition means configured to acquire information on a sample, and information on each of a plurality of X-ray measurement optical system parts configured to conduct X-ray analysis on the sample; sample magnification acquisition means configured to acquire a magnification by which the sample is to be magnified for display; incident X-ray shape deformation means configured to determine a distorted shape of an incident X-ray obtained when the sample is measured through use of the plurality of X-ray measurement optical system parts; scattered X-ray shape deformation means configured to determine a distorted shape of a scattered X-ray obtained when the sample is measured through use of the plurality of X-ray measurement optical system parts; X-ray measurement optical system modeling means configured to model a deformed shape of the sample, which is obtained by magnifying a shape of the sample based on the magnification, the distorted shape of the incident X-ray, and the distorted shape of the scattered X-ray; an X-ray measurement optical system rendering portion configured to generate a two-dimensional digital image from a state described as numerical data related to the deformed shape of the sample, the distorted shape of the incident X-ray and the distorted shape of the scattered X-ray, which are modeled by the X-ray measurement optical system modeling means; and a display instruction portion configured to give an instruction to display the two-dimensional digital image generated by the X-ray measurement optical system rendering portion as a display image, wherein the distorted shape of the incident X-ray is a shape obtained by magnifying a shape of an incident X-ray, which irradiates the sample, based on the magnification in a plane perpendicular to an incident optical axis direction of the incident X-ray, wherein the incident X-ray shape deformation means is configured to maintain the shape of the incident X-ray in the incident optical axis direction of the incident X-ray, wherein the distorted shape of the scattered X-ray is a shape obtained by magnifying a shape of a scattered X-ray, which is generated from the sample to be detected, based on the magnification in a plane perpendicular to a scattered optical axis direction of the scattered X-ray, and wherein the scattered X-ray shape deformation means is configured to maintain the shape of the scattered X-ray in the scattered optical axis direction of the scattered X-ray.