Sensor arrangement, comprising - a pressure sensor that is realized as capacitive pressure sensor, - a capacitance-to-digital converter coupled to the pressure sensor and implemented as a delta-sigma analog-to-digital converter, - a reference voltage generator having a control input for receiving a control signal and an output for providing a reference voltage (VREF), wherein the output of the reference voltage generator is connected to an input of the capacitance-to-digital converter, - a digital circuit coupled to the capacitance-to-digital converter and configured to generate the control signal, and - a memory connected to the digital circuit, wherein - the digital circuit is configured to control the reference voltage generator by the control signal in a test phase of operation such that the reference voltage generator consecutively generates at least two different values of the reference voltage (VREF), wherein the at least two different values of the reference voltage (VREF) have the same sign, - the capacitance-to-digital converter is configured to generate at least two values of a digital signal depending on a capacitance value CA of the pressure sensor in the test phase of operation, and - the digital circuit is configured to generate a parameter A0 and/or a parameter C0 depending on the at least two values of the digital signal and the values of the reference voltage (VREF) in the test phase of operation using the following equation: C = C0 + A0 ⋅ VREF 2, wherein C is the capacitance value CA of the pressure sensor and VREF is the value of the reference voltage, or wherein - the digital circuit is configured to control the reference voltage generator by the control signal in a test phase of operation such that the reference voltage generator consecutively generates at least three different values of the reference voltage (VREF), wherein the at least three different values of the reference voltage (VREF) have the same sign, - the capacitance-to-digital converter is configured to generate at least three values of a digital signal depending on a capacitance value CA of the pressure sensor in the test phase of operation, and - the digital circuit is configured to generate a parameter A0 and/or a parameter B0 and/or a parameter C0 depending on the at least three values of the digital signal and the values of the reference voltage (VREF) in the test phase of operation using one of the following equations: C = C0 + B 0 ⋅ VREF + A0 ⋅ VREF 2, or C = C0 + A0 ⋅ VREF 2, wherein C is the capacitance value CA of the pressure sensor and VREF is the value of the reference voltage. - a pressure sensor that is realized as capacitive pressure sensor, - a capacitance-to-digital converter coupled to the pressure sensor and implemented as a delta-sigma analog-to-digital converter, - a reference voltage generator having a control input for receiving a control signal and an output for providing a reference voltage (VREF), wherein the output of the reference voltage generator is connected to an input of the capacitance-to-digital converter, - a digital circuit coupled to the capacitance-to-digital converter and configured to generate the control signal, and - a memory connected to the digital circuit, wherein - the digital circuit is configured to control the reference voltage generator by the control signal in a test phase of operation such that the reference voltage generator consecutively generates at least two different values of the reference voltage (VREF), wherein the at least two different values of the reference voltage (VREF) have the same sign, - the capacitance-to-digital converter is configured to generate at least two values of a digital signal depending on a capacitance value CA of the pressure sensor in the test phase of operation, and - the digital circuit is configured to generate a parameter A0 and/or a parameter C0 depending on the at least two values of the digital signal and the values of the reference voltage (VREF) in the test phase of operation using the following equation: C = C0 + A0 ⋅ VREF 2, - the digital circuit is configured to control the reference voltage generator by the control signal in a test phase of operation such that the reference voltage generator consecutively generates at least three different values of the reference voltage (VREF), wherein the at least three different values of the reference voltage (VREF) have the same sign, - the capacitance-to-digital converter is configured to generate at least three values of a digital signal depending on a capacitance value CA of the pressure sensor in the test phase of operation, and - the digital circuit is configured to generate a parameter A0 and/or a parameter B0 and/or a parameter C0 depending on the at least three values of the digital signal and the values of the reference voltage (VREF) in the test phase of operation using one of the following equations: C = C0 + B 0 ⋅ VREF + A0 ⋅ VREF 2, or C = C0 + A0 ⋅ VREF 2,