A method for inspecting a load in a container, comprising: receiving a digitized image from an inspection system of a type of inspection system, wherein the type of inspection system is characterized by an energy and a dose of the inspection radiation, wherein the digitized image was generated by the inspection system by transmission of inspection radiation from an inspection radiation source of the inspection system to an inspection radiation detector of the inspection system, through the container, and wherein the digitized image is divided into a plurality of successive patches, each patch of the plurality of patches being a division of the image; and classifying one or more patches of the plurality of successive patches, J wherein the classifying comprises: extracting one or more texture descriptors (V, P) of a patch, wherein the one or more texture descriptors (V, P) are configured to describe a texture in the patch, the texture being a repetition of texels having identical macroscopic visual properties, and wherein the texture descriptor is extracted from values of pixels of the patch and/or from spatial mutual relationships between the pixels of the patch corresponding to the structure of the patch, and classifying the patch, by comparing the one or more extracted texture descriptors (V, P) of the patch to one or more reference texture descriptors (Vr, Wr, Pr) corresponding to one or more classes of reference items, wherein the one or more reference texture descriptors (Vr, Wr, Pr) of each class of reference items has been extracted from one or more reference images of the one or more reference items on a type of inspection system corresponding to the inspection system generating the digitized image, wherein the one or more reference texture descriptors (Vr, Wr, Pr) corresponding to one or more classes of reference items are stored in a reference database, and wherein the reference database comprises one or more reference texture descriptors (Vr, Wr, Pr) for each type of inspection system, comprising said same type of inspection system and a different type of inspection system. wherein the digitized image was generated by the inspection system by transmission of inspection radiation from an inspection radiation source of the inspection system to an inspection radiation detector of the inspection system, through the container, and wherein the digitized image is divided into a plurality of successive patches, each patch of the plurality of patches being a division of the image; and classifying one or more patches of the plurality of successive patches, J extracting one or more texture descriptors (V, P) of a patch, wherein the one or more texture descriptors (V, P) are configured to describe a texture in the patch, the texture being a repetition of texels having identical macroscopic visual properties, and wherein the texture descriptor is extracted from values of pixels of the patch and/or from spatial mutual relationships between the pixels of the patch corresponding to the structure of the patch, and classifying the patch, by comparing the one or more extracted texture descriptors (V, P) of the patch to one or more reference texture descriptors (Vr, Wr, Pr) corresponding to one or more classes of reference items, wherein the one or more reference texture descriptors (Vr, Wr, Pr) of each class of reference items has been extracted from one or more reference images of the one or more reference items on a type of inspection system corresponding to the inspection system generating the digitized image, wherein the one or more reference texture descriptors (Vr, Wr, Pr) corresponding to one or more classes of reference items are stored in a reference database, and wherein the reference database comprises one or more reference texture descriptors (Vr, Wr, Pr) for each type of inspection system, comprising said same type of inspection system and a different type of inspection system.