A touchscreen device with projected capacitive detection comprising a matrix touchpad that comprises a plurality of conducting rows and of conducting columns, said pad being connected to electronic control means generating, for each conducting row and each conducting column, emission voltages (V IN) and being connected to electronic means for receiving and analysing reception voltages (V OUT) coming from each conducting row and each conducting column, said electronic control means being adapted to generate, for each conducting row and each conducting column, a first periodic emission voltage emitted at a first frequency (F MIN), denoted working frequency, and a second periodic emission voltage emitted at a second frequency (F MAX), denoted discrimination frequency, different from said first frequency, so that: when pressed, the low value of the working frequency causes very low variations in the reception voltages at this working frequency and the high value of the discrimination frequency causes significant variations in the reception voltages as a function of the position of the press on the row or on the column at this discrimination frequency; said electronic reception and analysis means being arranged to determine, for each row and for each column: - the value of a first reception voltage at the working frequency and the value of a second reception voltage at the discrimination frequency; - whether, as a function of predetermined values, the values of the two reception voltages represent two simultaneous presses on the touchpad and the location of these two presses on the two rows and two columns concerned, characterised in that, in the event of two simultaneous presses, with the first press being located at a first intersection of a first row and a first column and the second press being located at a second intersection of a second row and a second column, locating the two presses is carried out by means of: - first analysis means allowing the minima or "dips" of the reception voltages to be identified for the first frequency and the minima or "dips" of the reception voltages to be identified for the second frequency corresponding to the voltage variations of the two presses; - second analysis means for computing, around each row or each column corresponding to one of said minima, the barycentre of the voltage "dip" for a determined number of rows or columns located either side of this row or this column; - third analysis means for determining, on the basis of the knowledge of the barycentres, the first row and the first column corresponding to the first press and the second row and the second column corresponding to the second press. when pressed, the low value of the working frequency causes very low variations in the reception voltages at this working frequency and the high value of the discrimination frequency causes significant variations in the reception voltages as a function of the position of the press on the row or on the column at this discrimination frequency; said electronic reception and analysis means being arranged to determine, for each row and for each column: - the value of a first reception voltage at the working frequency and the value of a second reception voltage at the discrimination frequency; - whether, as a function of predetermined values, the values of the two reception voltages represent two simultaneous presses on the touchpad and the location of these two presses on the two rows and two columns concerned, - the value of a first reception voltage at the working frequency and the value of a second reception voltage at the discrimination frequency; - whether, as a function of predetermined values, the values of the two reception voltages represent two simultaneous presses on the touchpad and the location of these two presses on the two rows and two columns concerned, characterised in that, in the event of two simultaneous presses, with the first press being located at a first intersection of a first row and a first column and the second press being located at a second intersection of a second row and a second column, locating the two presses is carried out by means of: - first analysis means allowing the minima or "dips" of the reception voltages to be identified for the first frequency and the minima or "dips" of the reception voltages to be identified for the second frequency corresponding to the voltage variations of the two presses; - second analysis means for computing, around each row or each column corresponding to one of said minima, the barycentre of the voltage "dip" for a determined number of rows or columns located either side of this row or this column; - third analysis means for determining, on the basis of the knowledge of the barycentres, the first row and the first column corresponding to the first press and the second row and the second column corresponding to the second press. - first analysis means allowing the minima or "dips" of the reception voltages to be identified for the first frequency and the minima or "dips" of the reception voltages to be identified for the second frequency corresponding to the voltage variations of the two presses; - second analysis means for computing, around each row or each column corresponding to one of said minima, the barycentre of the voltage "dip" for a determined number of rows or columns located either side of this row or this column; - third analysis means for determining, on the basis of the knowledge of the barycentres, the first row and the first column corresponding to the first press and the second row and the second column corresponding to the second press.