A temperature distribution sensor comprising: a laser source to emit a laser beam that is tunable to a first wavelength and to a second wavelength for injection into a device under test; a first wavelength optical receiver to convert a return signal corresponding to the first wavelength with respect to Rayleigh backscatter or Raman backscatter Anti-Stokes; a second wavelength optical receiver to convert the return signal corresponding to the second wavelength with respect to Rayleigh backscatter or Raman backscatter Stokes, wherein an incident signal associated with the first wavelength generates a Rayleigh backscatter signal corresponding to the first wavelength and a Raman backscatter Stokes signal corresponding to the second wavelength, and an incident signal associated with the second wavelength generates a Rayleigh backscatter signal corresponding to the second wavelength and a Raman backscatter Anti-Stokes signal corresponding to the first wavelength; a processor; and a memory storing machine readable instructions that when executed by the processor cause the processor to: determine bending loss associated with the DUT by utilizing the Rayleigh backscatter signal corresponding to the first wavelength and the Rayleigh backscatter signal corresponding to the second wavelength; determine temperature distribution associated with the DUT by utilizing the Raman backscatter Anti-Stokes signal corresponding to the first wavelength and the Raman backscatter Stokes signal corresponding to the second wavelength; characterised by identify, by combining measurements associated with the Rayleigh backscatter signal and the Raman backscatter Anti-Stokes signal analyzed at the first wavelength, and the Rayleigh backscatter signal and the Raman backscatter Stokes signal analyzed at the second wavelength, a false temperature offset related to the determined bending loss associated with the DUT; and compensate the false temperature offset in the determined temperature distribution. a laser source to emit a laser beam that is tunable to a first wavelength and to a second wavelength for injection into a device under test; a first wavelength optical receiver to convert a return signal corresponding to the first wavelength with respect to Rayleigh backscatter or Raman backscatter Anti-Stokes; a second wavelength optical receiver to convert the return signal corresponding to the second wavelength with respect to Rayleigh backscatter or Raman backscatter Stokes, wherein an incident signal associated with the first wavelength generates a Rayleigh backscatter signal corresponding to the first wavelength and a Raman backscatter Stokes signal corresponding to the second wavelength, and an incident signal associated with the second wavelength generates a Rayleigh backscatter signal corresponding to the second wavelength and a Raman backscatter Anti-Stokes signal corresponding to the first wavelength; a processor; and a memory storing machine readable instructions that when executed by the processor cause the processor to: determine bending loss associated with the DUT by utilizing the Rayleigh backscatter signal corresponding to the first wavelength and the Rayleigh backscatter signal corresponding to the second wavelength; determine temperature distribution associated with the DUT by utilizing the Raman backscatter Anti-Stokes signal corresponding to the first wavelength and the Raman backscatter Stokes signal corresponding to the second wavelength; characterised by identify, by combining measurements associated with the Rayleigh backscatter signal and the Raman backscatter Anti-Stokes signal analyzed at the first wavelength, and the Rayleigh backscatter signal and the Raman backscatter Stokes signal analyzed at the second wavelength, a false temperature offset related to the determined bending loss associated with the DUT; and compensate the false temperature offset in the determined temperature distribution. determine bending loss associated with the DUT by utilizing the Rayleigh backscatter signal corresponding to the first wavelength and the Rayleigh backscatter signal corresponding to the second wavelength; determine temperature distribution associated with the DUT by utilizing the Raman backscatter Anti-Stokes signal corresponding to the first wavelength and the Raman backscatter Stokes signal corresponding to the second wavelength; characterised by identify, by combining measurements associated with the Rayleigh backscatter signal and the Raman backscatter Anti-Stokes signal analyzed at the first wavelength, and the Rayleigh backscatter signal and the Raman backscatter Stokes signal analyzed at the second wavelength, a false temperature offset related to the determined bending loss associated with the DUT; and compensate the false temperature offset in the determined temperature distribution.