An electron imaging apparatus that is configured for an electron transfer along an electron-optical axis from a sample emitting electrons to an energy analyzer apparatus and comprises a first lens group on a sample side and a second lens group on an analyzer side and a deflector device that is configured to deflect the electrons in an exit plane of the electron imaging apparatus in a deflection direction perpendicular to the electron-optical axis, wherein: - the first lens group provides a first reciprocal plane inside the first lens group and a first Gaussian plane between the first and the second lens group (10, 30) and is configured to generate a first momentum distribution image of a momentum distribution of electrons from the sample in the first reciprocal plane and to generate a first Gaussian image of the sample in the first Gaussian plane, - the second lens group provides a second reciprocal plane on the analyzer side of the second lens group and is configured to generate a second momentum distribution image of the momentum distribution of the electrons from the sample in the second reciprocal plane, characterized in that - the first lens group is configured to generate the first Gaussian image in a front focal plane of the second lens group with an extent perpendicular to the electron-optical axis of less than 1 mm, so that the second momentum distribution image generated by the second lens group is a parallel image, the partial beams of which run parallel to the electron-optical axis on passing through the second reciprocal plane or have a divergence smaller than 0.4°, and - the deflector device acts in the first Gaussian plane or in another Gaussian plane, so that the deflection of the electrons effects a parallel displacement of the partial beams, which form the parallel image in the second reciprocal plane, without changing the angle between the partial beams perpendicular to the optical axis. - the first lens group provides a first reciprocal plane inside the first lens group and a first Gaussian plane between the first and the second lens group (10, 30) and is configured to generate a first momentum distribution image of a momentum distribution of electrons from the sample in the first reciprocal plane and to generate a first Gaussian image of the sample in the first Gaussian plane, - the second lens group provides a second reciprocal plane on the analyzer side of the second lens group and is configured to generate a second momentum distribution image of the momentum distribution of the electrons from the sample in the second reciprocal plane, - the first lens group is configured to generate the first Gaussian image in a front focal plane of the second lens group with an extent perpendicular to the electron-optical axis of less than 1 mm, so that the second momentum distribution image generated by the second lens group is a parallel image, the partial beams of which run parallel to the electron-optical axis on passing through the second reciprocal plane or have a divergence smaller than 0.4°, and - the deflector device acts in the first Gaussian plane or in another Gaussian plane, so that the deflection of the electrons effects a parallel displacement of the partial beams, which form the parallel image in the second reciprocal plane, without changing the angle between the partial beams perpendicular to the optical axis.