A coated cutting tool comprising a substrate and a coating layer formed on a surface of the substrate, wherein the coating layer comprising at least one α-type aluminum oxide layer and a titanium carbonitride layer between the substrate and the α-type aluminum oxide layer, wherein the coating layer comprises, between the titanium carbonitride layer and the α-type aluminum oxide layer, an intermediate layer comprising a compound of at least one kind selected from the group consisting of a Ti carboxide, a Ti oxynitride and a Ti carboxynitride, wherein: in the α-type aluminum oxide layer, a texture coefficient TC (0,0,12) of a (0,0,12) plane represented by formula below is from 4.0 or more to 8.4 or less; a residual stress value in a (1,1,6) plane of the α-type aluminum oxide layer is from -800 MPa or higher to 100 MPa or lower; a residual stress value in a (4,0,10) plane of the α-type aluminum oxide layer is from 0 MPa or higher to 300 MPa or lower; and the coating layer satisfies a condition represented by formula below. 0 ≤ S 1 − S 2 ≤ 400 wherein in formula, S1 denotes a residual stress value in MPa in a (4,0,10) plane of the α-type aluminum oxide layer, and S2 denotes a residual stress value in MPa in a (4,2,2) of the titanium carbonitride layer, wherein the residual stress value of the α-type aluminum oxide layer is measured by measuring residual stresses via a sin 2 φ method at three points included in the coating layer and obtaining the arithmetic mean of the residual stresses at such three points, and wherein the residual stress value of the titanium carbonitride layer is measured by a sin 2 φ method using an X-ray stress measuring apparatus; TC 0,0 12 = I 0,0 12 I 0 0,0 12 1 9 ∑ I h k l I 0 h k l − 1 and wherein in formula, I (h,k,l) denotes a peak intensity for an (h,k,l) plane in X-ray diffraction of the α-type aluminum oxide layer, I 0 (h,k,l) denotes a standard diffraction intensity for an (h,k,l) plane which is indicated on a JCPDS Card No. 10-0173 for α-type aluminum oxide, and (h,k,l) refers to nine crystal planes of (0,1,2), (1,0,4), (1,1,0), (1,1,3), (1,1,6), (0,1,8), (2,1,4), (3,0,0) and (0,0,12). in the α-type aluminum oxide layer, a texture coefficient TC (0,0,12) of a (0,0,12) plane represented by formula below is from 4.0 or more to 8.4 or less; a residual stress value in a (1,1,6) plane of the α-type aluminum oxide layer is from -800 MPa or higher to 100 MPa or lower; a residual stress value in a (4,0,10) plane of the α-type aluminum oxide layer is from 0 MPa or higher to 300 MPa or lower; and the coating layer satisfies a condition represented by formula below. 0 ≤ S 1 − S 2 ≤ 400 wherein in formula, S1 denotes a residual stress value in MPa in a (4,0,10) plane of the α-type aluminum oxide layer, and S2 denotes a residual stress value in MPa in a (4,2,2) of the titanium carbonitride layer, wherein the residual stress value of the α-type aluminum oxide layer is measured by measuring residual stresses via a sin 2 φ method at three points included in the coating layer and obtaining the arithmetic mean of the residual stresses at such three points, and wherein the residual stress value of the titanium carbonitride layer is measured by a sin 2 φ method using an X-ray stress measuring apparatus; TC 0,0 12 = I 0,0 12 I 0 0,0 12 1 9 ∑ I h k l I 0 h k l − 1 and wherein in formula, I (h,k,l) denotes a peak intensity for an (h,k,l) plane in X-ray diffraction of the α-type aluminum oxide layer, I 0 (h,k,l) denotes a standard diffraction intensity for an (h,k,l) plane which is indicated on a JCPDS Card No. 10-0173 for α-type aluminum oxide, and (h,k,l) refers to nine crystal planes of (0,1,2), (1,0,4), (1,1,0), (1,1,3), (1,1,6), (0,1,8), (2,1,4), (3,0,0) and (0,0,12).