A method for displaying measurement results from X-ray diffraction measurement, which is a measurement in which a sample is irradiated with X-rays outputted from an X-ray generation device and the X-rays diffracted by the sample are detected by an X-ray detector, wherein the method comprises: forming, by an analysis unit, a one-dimensional diffraction profile by displaying on a display device, on the basis of output data from the X-ray detector, a 2θ-I profile within a coordinate system in which one orthogonal coordinate axis shows 2θ angle values and another orthogonal coordinate axis shows X-ray intensity values; forming, by the analysis unit, a two-dimensional diffraction pattern by displaying on the display device X-ray intensity data which are present in the circumferential direction of a plurality of Debye rings formed at each 2θ angle by X-rays diffracted by the sample, within a coordinate system for a two-dimensional pattern in which one orthogonal coordinate axis shows 2θ angle values and another orthogonal coordinate axis shows angle values (β°) in the circumferential direction of Debye rings; displaying X-ray intensity data which are present in the circumferential direction of Debye rings linearly in the coordinate system for the two-dimensional pattern; and displaying on the display device the two-dimensional diffraction pattern and the one-dimensional diffraction profile so as to be aligned such that the 2θ angle values of both coincide with each other; wherein the X-ray diffraction measurement has a step for performing a crystal phase candidate search in consideration of uniformity in the circumferential direction of the Debye rings (d1-d5), and wherein the method further comprises: a step for determining, by a detection unit of the analysis unit, β-I data, which is data about "the X-ray intensity" versus "the angle in the circumferential direction of the Debye rings" at peaks in the 2θ-I profile; a step for classifying, by a clustering unit of the analysis unit, the diffraction patterns that correspond to the Debye rings (d1-d5) into clusters on the basis of the β-I data; and a step for performing a crystal phase candidate search within the same clusters, wherein a search unit of the analysis unit searches a database of a storage unit for a crystal phase showing peak positions and peak intensity ratios that conform with a set comprising the position and the intensity ratio of peaks in the diffraction patterns that were sorted into the same cluster, and extracts a crystal phase candidate. forming, by an analysis unit, a one-dimensional diffraction profile by displaying on a display device, on the basis of output data from the X-ray detector, a 2θ-I profile within a coordinate system in which one orthogonal coordinate axis shows 2θ angle values and another orthogonal coordinate axis shows X-ray intensity values; forming, by the analysis unit, a two-dimensional diffraction pattern by displaying on the display device X-ray intensity data which are present in the circumferential direction of a plurality of Debye rings formed at each 2θ angle by X-rays diffracted by the sample, within a coordinate system for a two-dimensional pattern in which one orthogonal coordinate axis shows 2θ angle values and another orthogonal coordinate axis shows angle values (β°) in the circumferential direction of Debye rings; displaying X-ray intensity data which are present in the circumferential direction of Debye rings linearly in the coordinate system for the two-dimensional pattern; and displaying on the display device the two-dimensional diffraction pattern and the one-dimensional diffraction profile so as to be aligned such that the 2θ angle values of both coincide with each other; wherein the X-ray diffraction measurement has a step for performing a crystal phase candidate search in consideration of uniformity in the circumferential direction of the Debye rings (d1-d5), and wherein the method further comprises: a step for determining, by a detection unit of the analysis unit, β-I data, which is data about "the X-ray intensity" versus "the angle in the circumferential direction of the Debye rings" at peaks in the 2θ-I profile; a step for classifying, by a clustering unit of the analysis unit, the diffraction patterns that correspond to the Debye rings (d1-d5) into clusters on the basis of the β-I data; and a step for performing a crystal phase candidate search within the same clusters, wherein a search unit of the analysis unit searches a database of a storage unit for a crystal phase showing peak positions and peak intensity ratios that conform with a set comprising the position and the intensity ratio of peaks in the diffraction patterns that were sorted into the same cluster, and extracts a crystal phase candidate. a step for determining, by a detection unit of the analysis unit, β-I data, which is data about "the X-ray intensity" versus "the angle in the circumferential direction of the Debye rings" at peaks in the 2θ-I profile; a step for classifying, by a clustering unit of the analysis unit, the diffraction patterns that correspond to the Debye rings (d1-d5) into clusters on the basis of the β-I data; and a step for performing a crystal phase candidate search within the same clusters, wherein a search unit of the analysis unit searches a database of a storage unit for a crystal phase showing peak positions and peak intensity ratios that conform with a set comprising the position and the intensity ratio of peaks in the diffraction patterns that were sorted into the same cluster, and extracts a crystal phase candidate.