A shape measuring device for measuring a measuring object having a columnar or cylindrical shape, comprising: a rotational moving unit configured to rotate the measuring object relative to a first measurement unit and a second measurement unit; the first measurement unit configured to perform roundness measurement of the rotating measuring object; and the second measurement unit configured to perform surface roughness measurement of the measuring object, wherein the first measurement unit and the second measurement unit are opposed to each other centering on a center axis of the rotation of the measuring object, to detect an occurrence of a disturbance signal caused by a disturbance, the shape measuring device further being configured such that the roundness measurement by the first measurement unit and the surface roughness measurement by the second measurement unit are simultaneously performed, the first measurement unit is configured to perform the roundness measurement in a state where the first measurement unit is in contact with the measuring object through a first stylus while being relatively rotated in the circumferential direction of the measuring object, based on detection signals acquired by detecting displacement of the first stylus, the second measurement unit is configured to perform the surface roughness measurement at a position opposite to a contact position between the first stylus and the measuring object in the circumferential direction, in a state where the second measurement unit is in contact with the measuring object through a second stylus while being relatively rotated in the circumferential direction of the measuring object, based on detection signals acquired by detecting displacement of the second stylus, and characterized in that the shape measuring device further comprises: processing means configured to eliminate a disturbance signal (V1, V2) caused by a disturbance from the detection signals of the first measurement unit and the detection signals of the second measurement unit, based on comparison between the detection signals of the first measurement unit and the detection signals of the second measurement unit, and undulation component elimination means configured to eliminate undulation component from the measurement result of the second measurement unit. a rotational moving unit configured to rotate the measuring object relative to a first measurement unit and a second measurement unit; the first measurement unit configured to perform roundness measurement of the rotating measuring object; and the second measurement unit configured to perform surface roughness measurement of the measuring object, wherein the first measurement unit and the second measurement unit are opposed to each other centering on a center axis of the rotation of the measuring object, to detect an occurrence of a disturbance signal caused by a disturbance, the shape measuring device further being configured such that the roundness measurement by the first measurement unit and the surface roughness measurement by the second measurement unit are simultaneously performed, the first measurement unit is configured to perform the roundness measurement in a state where the first measurement unit is in contact with the measuring object through a first stylus while being relatively rotated in the circumferential direction of the measuring object, based on detection signals acquired by detecting displacement of the first stylus, the second measurement unit is configured to perform the surface roughness measurement at a position opposite to a contact position between the first stylus and the measuring object in the circumferential direction, in a state where the second measurement unit is in contact with the measuring object through a second stylus while being relatively rotated in the circumferential direction of the measuring object, based on detection signals acquired by detecting displacement of the second stylus, and characterized in that the shape measuring device further comprises: processing means configured to eliminate a disturbance signal (V1, V2) caused by a disturbance from the detection signals of the first measurement unit and the detection signals of the second measurement unit, based on comparison between the detection signals of the first measurement unit and the detection signals of the second measurement unit, and undulation component elimination means configured to eliminate undulation component from the measurement result of the second measurement unit. processing means configured to eliminate a disturbance signal (V1, V2) caused by a disturbance from the detection signals of the first measurement unit and the detection signals of the second measurement unit, based on comparison between the detection signals of the first measurement unit and the detection signals of the second measurement unit, and undulation component elimination means configured to eliminate undulation component from the measurement result of the second measurement unit.