A method for calibrating optical components in a photonic integrated circuit, PIC (210, 410, 620), the method comprising: activating one or more active optical components in the PIC of an optical-electrical circuit structure, the optical-electrical circuit structure comprising the PIC and one or more electrical circuits external to the PIC, the one or more electrical circuits including a processor circuit (415, 505) configured to generate a temperature control signal that adjusts an electrically controlled pressured air source that is configured to direct a high pressure airflow towards the PIC; wherein the one or more active optical components are activated at least in part by supplying electrical current to the one or more active optical components, the one or more active optical components optionally including one or more of: a light source, an optical amplifier, an electro-absorption modulator, EAM, a phase-based coupler, a photodetector; measuring an initial temperature value of the PIC using an integrated temperature sensor (408, 571) that is integrated in the optical-electrical circuit structure, the integrated temperature sensor being positioned proximate to the active optical components such that the integrated temperature sensor receives heat generated by the active optical components in the PIC, the initial temperature value indicating that the PIC is at an initial temperature after activation of the one or more active optical components in the PIC, the initial temperature corresponding to a preconfigured calibration temperature utilized to calibrate the PIC; receiving calibration adjustments to the one or more active optical components of the PIC while the initial temperature value measured by the integrated temperature sensor indicates the PIC is at the initial temperature; receiving, by the processor circuit, varying temperature values measured by the integrated temperature sensor; wherein the processor circuit is electrically connected to the PIC to receive temperature values from the integrated temperature sensor; and in response to the varying temperature values, adjusting, using the processor circuit, the temperature control signal to cause the electrically controlled pressured air source to vary a strength of the high pressure airflow directed towards the PIC such that a temperature of the PIC is adjusted to the initial temperature due to the high pressure airflow passing over the PIC while the one or more active optical components are calibrated. activating one or more active optical components in the PIC of an optical-electrical circuit structure, the optical-electrical circuit structure comprising the PIC and one or more electrical circuits external to the PIC, the one or more electrical circuits including a processor circuit (415, 505) configured to generate a temperature control signal that adjusts an electrically controlled pressured air source that is configured to direct a high pressure airflow towards the PIC; wherein the one or more active optical components are activated at least in part by supplying electrical current to the one or more active optical components, the one or more active optical components optionally including one or more of: a light source, an optical amplifier, an electro-absorption modulator, EAM, a phase-based coupler, a photodetector; measuring an initial temperature value of the PIC using an integrated temperature sensor (408, 571) that is integrated in the optical-electrical circuit structure, the integrated temperature sensor being positioned proximate to the active optical components such that the integrated temperature sensor receives heat generated by the active optical components in the PIC, the initial temperature value indicating that the PIC is at an initial temperature after activation of the one or more active optical components in the PIC, the initial temperature corresponding to a preconfigured calibration temperature utilized to calibrate the PIC; receiving calibration adjustments to the one or more active optical components of the PIC while the initial temperature value measured by the integrated temperature sensor indicates the PIC is at the initial temperature; receiving, by the processor circuit, varying temperature values measured by the integrated temperature sensor; wherein the processor circuit is electrically connected to the PIC to receive temperature values from the integrated temperature sensor; and in response to the varying temperature values, adjusting, using the processor circuit, the temperature control signal to cause the electrically controlled pressured air source to vary a strength of the high pressure airflow directed towards the PIC such that a temperature of the PIC is adjusted to the initial temperature due to the high pressure airflow passing over the PIC while the one or more active optical components are calibrated.