A cutting tool including a rake face, a flank face, and a cutting edge portion connecting the rake face and the flank face together, the cutting tool comprising a substrate and an AlTiN layer provided on the substrate, the AlTiN layer having a thickness of 2.5 μm or more and 20 μm or less, the AlTiN layer including cubic Al x Ti 1-x N crystal grains, an atomic ratio x of Al in the Al x Ti 1-x N being 0.7 or more and 0.95 or less, the atomic ratio x being measured by the method described in the description, the AlTiN layer including a central portion, the central portion being a region sandwiched between an imaginary plane D and an imaginary plane E, the imaginary plane D being an imaginary plane which passes through a point 1 μm away in a direction of thickness from a first interface located on a side of the substrate and is parallel to the first interface, the imaginary plane E being an imaginary plane which passes through a point 1 μm away from a second interface opposite to the side of the substrate in the direction of thickness and is parallel to the second interface, the first interface being parallel to the second interface, when a cross section of the AlTiN layer obtained when cut along a plane including a normal to the second interface at the rake face and a normal to the second interface at the flank face is subjected to an electron backscattering diffraction image analysis using a field emission scanning microscope to determine a crystal orientation of each of the Al x Ti 1-x N crystal grains, the crystal orientation being determined by the method described in the description, and a color map is created based thereon, in the color map, the central portion at the rake face being occupied in area at a ratio of 80% or more by Al x Ti 1-x N crystal grains having a plane with a normal thereto having a direction within ± 15° with respect to a direction of the normal to the second interface at the rake face, the central portion at the flank face being occupied in area at a ratio of 80% or more by Al x Ti 1-x N crystal grains having the plane with a normal thereto having a direction within ± 15° with respect to a direction of the normal to the second interface at the flank face, the central portion at the cutting edge portion being occupied in area at a ratio of 80% or more by Al x Ti 1-x N crystal grains having the plane with a normal thereto having a direction within ± 15° with respect to a direction of a normal to the cutting edge portion, the direction of the normal to the cutting edge portion being a direction of a normal to an imaginary plane C including a boundary line on the substrate between the rake face and the cutting edge portion and a boundary line on the substrate between the flank face and the cutting edge portion. the cutting tool comprising a substrate and an AlTiN layer provided on the substrate, the AlTiN layer having a thickness of 2.5 μm or more and 20 μm or less, the AlTiN layer including cubic Al x Ti 1-x N crystal grains, an atomic ratio x of Al in the Al x Ti 1-x N being 0.7 or more and 0.95 or less, the atomic ratio x being measured by the method described in the description, the AlTiN layer including a central portion, the central portion being a region sandwiched between an imaginary plane D and an imaginary plane E, the imaginary plane D being an imaginary plane which passes through a point 1 μm away in a direction of thickness from a first interface located on a side of the substrate and is parallel to the first interface, the imaginary plane E being an imaginary plane which passes through a point 1 μm away from a second interface opposite to the side of the substrate in the direction of thickness and is parallel to the second interface, the first interface being parallel to the second interface, when a cross section of the AlTiN layer obtained when cut along a plane including a normal to the second interface at the rake face and a normal to the second interface at the flank face is subjected to an electron backscattering diffraction image analysis using a field emission scanning microscope to determine a crystal orientation of each of the Al x Ti 1-x N crystal grains, the crystal orientation being determined by the method described in the description, and a color map is created based thereon, in the color map, the central portion at the rake face being occupied in area at a ratio of 80% or more by Al x Ti 1-x N crystal grains having a plane with a normal thereto having a direction within ± 15° with respect to a direction of the normal to the second interface at the rake face, the central portion at the flank face being occupied in area at a ratio of 80% or more by Al x Ti 1-x N crystal grains having the plane with a normal thereto having a direction within ± 15° with respect to a direction of the normal to the second interface at the flank face, the central portion at the cutting edge portion being occupied in area at a ratio of 80% or more by Al x Ti 1-x N crystal grains having the plane with a normal thereto having a direction within ± 15° with respect to a direction of a normal to the cutting edge portion, the direction of the normal to the cutting edge portion being a direction of a normal to an imaginary plane C including a boundary line on the substrate between the rake face and the cutting edge portion and a boundary line on the substrate between the flank face and the cutting edge portion.