A fault detection system, comprising: - a sensor; - a processing unit; and - an output unit; wherein the sensor is configured to acquire temperature data at a sensor location of a device, wherein the temperature data comprises first temperature data and second temperature data acquired a first time period after the first temperature data; wherein the processing unit is configured to determine a temperature magnitude comprising utilization of the first temperature data and/or the second temperature data; wherein the processing unit is configured to determine a rate of change of temperature comprising utilization of the first temperature data and the second temperature data and the first time period; wherein the processing unit is configured to predict a temperature at a location of the device comprising utilization of the temperature magnitude, the rate of change of temperature, and a correlation, wherein the correlation is a correlation of a plurality of temperature magnitudes and a plurality of rate of change of temperatures at the sensor location with a plurality of hotspot temperatures at the location; wherein the processing unit is configured to determine if the device has a fault comprising utilization of the predicted temperature; and wherein the output unit is configured to output an indication that the device has a fault when it is determined that the device has a fault. - a sensor; - a processing unit; and - an output unit; wherein the sensor is configured to acquire temperature data at a sensor location of a device, wherein the temperature data comprises first temperature data and second temperature data acquired a first time period after the first temperature data; wherein the processing unit is configured to determine a temperature magnitude comprising utilization of the first temperature data and/or the second temperature data; wherein the processing unit is configured to determine a rate of change of temperature comprising utilization of the first temperature data and the second temperature data and the first time period; wherein the processing unit is configured to predict a temperature at a location of the device comprising utilization of the temperature magnitude, the rate of change of temperature, and a correlation, wherein the correlation is a correlation of a plurality of temperature magnitudes and a plurality of rate of change of temperatures at the sensor location with a plurality of hotspot temperatures at the location; wherein the processing unit is configured to determine if the device has a fault comprising utilization of the predicted temperature; and wherein the output unit is configured to output an indication that the device has a fault when it is determined that the device has a fault. wherein the sensor is configured to acquire temperature data at a sensor location of a device, wherein the temperature data comprises first temperature data and second temperature data acquired a first time period after the first temperature data; wherein the processing unit is configured to determine a temperature magnitude comprising utilization of the first temperature data and/or the second temperature data; wherein the processing unit is configured to determine a rate of change of temperature comprising utilization of the first temperature data and the second temperature data and the first time period; wherein the processing unit is configured to predict a temperature at a location of the device comprising utilization of the temperature magnitude, the rate of change of temperature, and a correlation, wherein the correlation is a correlation of a plurality of temperature magnitudes and a plurality of rate of change of temperatures at the sensor location with a plurality of hotspot temperatures at the location; wherein the processing unit is configured to determine if the device has a fault comprising utilization of the predicted temperature; and wherein the output unit is configured to output an indication that the device has a fault when it is determined that the device has a fault.