A test contact pin array assembly for temporary contact with a test pad on a wafer level integrated circuit device under test comprising: a. at least one slideable upper contact pin, further having, a top extension portion for contacting the DUT, at least one lateral cross member flange (44a/b) and a contact surface; said upper contact pin being slideable between an out of test position and an in-test position; b. at least one lower contact pin having a foot and a contact surface; c. said upper and lower contact pins being held in contact by bias forces which maintain their respective contact surfaces (52,64) together but in a slideable coplanar relationship to each other; d. an elastomeric material of predetermined height when in an uncompressed state, said material surrounding the pins to create said bias forces; e. a rigid top pin guide plate located atop said elastomeric material, including a pair of spaced part parallel walls defining a guide channel for said flange, an upper wall between said parallel walls defining an up-stop surface for said upper contact pin and an aperture in said up-stop surface for receiving the top extension portion of said upper contact pin which protrudes beyond said guide plate to make contact with said DUT, said channel being sized to be large enough to receive said flange with minimum frictional contact to the parallel walls; said up-stop surface providing an upward stop limit for the upper contact pin by virtue of contact of said up-stop surface with the flange, f. said guide channel having a depth sufficient to contain and prevent said flange against twisting rotation between pin travel distance occurring from said out of test position and said in test position, so that said upper contact pin and lower contact pin contact surfaces are maximally in contact with each other throughout the pin travel distance. a. at least one slideable upper contact pin, further having, a top extension portion for contacting the DUT, at least one lateral cross member flange (44a/b) and a contact surface; said upper contact pin being slideable between an out of test position and an in-test position; b. at least one lower contact pin having a foot and a contact surface; c. said upper and lower contact pins being held in contact by bias forces which maintain their respective contact surfaces (52,64) together but in a slideable coplanar relationship to each other; d. an elastomeric material of predetermined height when in an uncompressed state, said material surrounding the pins to create said bias forces; e. a rigid top pin guide plate located atop said elastomeric material, including a pair of spaced part parallel walls defining a guide channel for said flange, an upper wall between said parallel walls defining an up-stop surface for said upper contact pin and an aperture in said up-stop surface for receiving the top extension portion of said upper contact pin which protrudes beyond said guide plate to make contact with said DUT, said channel being sized to be large enough to receive said flange with minimum frictional contact to the parallel walls; said up-stop surface providing an upward stop limit for the upper contact pin by virtue of contact of said up-stop surface with the flange, f. said guide channel having a depth sufficient to contain and prevent said flange against twisting rotation between pin travel distance occurring from said out of test position and said in test position, so that said upper contact pin and lower contact pin contact surfaces are maximally in contact with each other throughout the pin travel distance.