A method, comprising: scanning a sample over a period of time using a wavelength stepped electro-magnetic radiation source, the period of time including a first time period and a second time period, a sample portion of the electro-magnetic radiation source being directed to the sample in a sample arm of an optical interferometric system, and a reference portion of the electro-magnetic radiation source being directed to a reference arm of the optical interferometric system; applying, using a phase modulator, a phase shift comprising a first phase shift and a second phase shift to at least one of the reference portion or the sample portion of the electro-magnetic radiation source, the first phase shift being applied during the first time period and the second phase shift being applied during the second time period, the second phase shift having a difference of 90 degrees from the first phase shift; acquiring in-phase data based on a first interference between first backscattered electro-magnetic radiation during the first time period and the at least one of the reference portion or the sample portion subjected to the first phase shift; acquiring in-phase data comprising acquiring an in-phase frame associated with the first phase shift; acquiring quadrature data based on a second interference between second backscattered electro-magnetic radiation during the second time period and the at least one of the reference portion or the sample portion subjected to the second phase shift; acquiring quadrature data comprising acquiring a quadrature frame associated with the second phase shift; characterized in that the method further comprises: generating a phase difference frame based on a difference of phases between the in-phase frame and the quadrature frame; determining a correction factor based on the phase difference frame; applying the correction factor to the in-phase frame and the quadrature frame; and determining a complex interference frame based on the corrected in-phase frame and the corrected quadrature frame. scanning a sample over a period of time using a wavelength stepped electro-magnetic radiation source, the period of time including a first time period and a second time period, a sample portion of the electro-magnetic radiation source being directed to the sample in a sample arm of an optical interferometric system, and a reference portion of the electro-magnetic radiation source being directed to a reference arm of the optical interferometric system; the period of time including a first time period and a second time period, a sample portion of the electro-magnetic radiation source being directed to the sample in a sample arm of an optical interferometric system, and a reference portion of the electro-magnetic radiation source being directed to a reference arm of the optical interferometric system; applying, using a phase modulator, a phase shift comprising a first phase shift and a second phase shift to at least one of the reference portion or the sample portion of the electro-magnetic radiation source, the first phase shift being applied during the first time period and the second phase shift being applied during the second time period, the second phase shift having a difference of 90 degrees from the first phase shift; the first phase shift being applied during the first time period and the second phase shift being applied during the second time period, the second phase shift having a difference of 90 degrees from the first phase shift; acquiring in-phase data based on a first interference between first backscattered electro-magnetic radiation during the first time period and the at least one of the reference portion or the sample portion subjected to the first phase shift; acquiring in-phase data comprising acquiring an in-phase frame associated with the first phase shift; acquiring quadrature data based on a second interference between second backscattered electro-magnetic radiation during the second time period and the at least one of the reference portion or the sample portion subjected to the second phase shift; acquiring quadrature data comprising acquiring a quadrature frame associated with the second phase shift; characterized in that the method further comprises: generating a phase difference frame based on a difference of phases between the in-phase frame and the quadrature frame; determining a correction factor based on the phase difference frame; applying the correction factor to the in-phase frame and the quadrature frame; and generating a phase difference frame based on a difference of phases between the in-phase frame and the quadrature frame; determining a correction factor based on the phase difference frame; applying the correction factor to the in-phase frame and the quadrature frame; and determining a complex interference frame based on the corrected in-phase frame and the corrected quadrature frame.