A pulsed tone passive intermodulation, PIM, test system comprising: a DC power source configured to provide power to said pulsed tone PIM test system; a pulse generator electrically coupled to a first transmitter and a second transmitter, said pulse generator and said first transmitter configured for generating a first stimulus signal, said pulse generator and said second transmitter configured for generating a second stimulus signal; a first bandpass filter electrically coupled to said first transmitter configured to attenuate spectral components associated with said first pulsed stimulus signal; a second bandpass filter electrically coupled to said second transmitter configured to attenuate spectral components associated with said second pulsed stimulus signal; a processor having a memory; a combiner electrically coupled to said first and second bandpass filter (35, 40), said combiner configured to combine said first and second stimulus signals into a combined stimulus signal; a directional coupler having a main line with an input electrically coupled to said combiner and an output configured to be electrically coupled to a device under test, said main line being configured to deliver said combined stimulus signal propagating in a forward direction to said device under test and receive a signal propagating in a reflected direction from said device under test; said direction coupler being further comprised of a reflected channel output; said directional coupler being further configured to sample said signal propagating in the reflected direction on said main line; said reflected channel output being configured to provide said sample signal propagating in the reflected direction to a notch filter; said notch filter is electrically coupled to said reflected channel output and configured to attenuate said first and second stimulus signals from said sample signal propagating in the reflected direction; a low noise gain stage electrically coupled to said notch filter, said low noise gain stage configured to amplify said sample signal propagating in the reflected direction; and a receiving and analyzing circuitry electrically coupled to said low noise gain stage configured to receive and identify at least one PIM product generated by a PIM source in said device under test, characterized in that the first stimulus signal, the second stimulus signal and the combined stimulus signal are pulsed signals, and in that the pulsed tone PIM system comprises a first pulsed power amplifier and a second pulsed power amplifier, which are configured for the generation of pulse type waveforms and pulsed by the pulse generator, wherein the first pulsed power amplifier generates the first pulsed stimulus signal, which is routed to the first bandpass filter, and the second pulsed power amplifier generates the second pulsed stimulus signal, which is routed to second bandpass filter, and wherein the pulse generator is configured to activate first pulsed power amplifier and second pulsed power amplifier for a predetermined length of time, thereby generating a first pulsed signal and second pulsed signal having pulse width equivalent to the predetermined length of time. a DC power source configured to provide power to said pulsed tone PIM test system; a pulse generator electrically coupled to a first transmitter and a second transmitter, said pulse generator and said first transmitter configured for generating a first stimulus signal, said pulse generator and said second transmitter configured for generating a second stimulus signal; a first bandpass filter electrically coupled to said first transmitter configured to attenuate spectral components associated with said first pulsed stimulus signal; a second bandpass filter electrically coupled to said second transmitter configured to attenuate spectral components associated with said second pulsed stimulus signal; a processor having a memory; a combiner electrically coupled to said first and second bandpass filter (35, 40), said combiner configured to combine said first and second stimulus signals into a combined stimulus signal; a directional coupler having a main line with an input electrically coupled to said combiner and an output configured to be electrically coupled to a device under test, said main line being configured to deliver said combined stimulus signal propagating in a forward direction to said device under test and receive a signal propagating in a reflected direction from said device under test; said direction coupler being further comprised of a reflected channel output; said directional coupler being further configured to sample said signal propagating in the reflected direction on said main line; said reflected channel output being configured to provide said sample signal propagating in the reflected direction to a notch filter; said notch filter is electrically coupled to said reflected channel output and configured to attenuate said first and second stimulus signals from said sample signal propagating in the reflected direction; a low noise gain stage electrically coupled to said notch filter, said low noise gain stage configured to amplify said sample signal propagating in the reflected direction; and a receiving and analyzing circuitry electrically coupled to said low noise gain stage configured to receive and identify at least one PIM product generated by a PIM source in said device under test,