A system for performing a self-test for a gyroscope (12, 100), the system comprising: one or more drive masses located in a device plane; one or more drive electrodes (111a, 111b) adjacent to the one or more drive masses; a drive circuit, wherein the drive circuit is configured to cause the one or more drive electrodes (111a, 111b) to drive the one or more drive masses in a first direction to oscillate at a drive frequency; one or more sense masses located in the device plane, wherein the one or more sense masses are coupled to the one or more drive masses to oscillate at the drive frequency in response to a rotation about an axis perpendicular to the device plane; one or more sense electrodes adjacent to the one or more sense masses, wherein a voltage between the one or more sense electrodes and the one or more sense masses changes based on the oscillation of the one or more sense masses; one or more auxiliary electrodes (132a - 132d) adjacent to the one or more sense masses, wherein the one or more auxiliary electrodes (132a - 132d) drive, by imparting test signals having a first test frequency and a second test frequency, the one or more sense masses in a second direction perpendicular to the first direction at the first test frequency and the second test frequency, wherein the first test frequency is distinct from the drive frequency, wherein the second test frequency is distinct from the drive frequency and the first test frequency, and wherein the one more sense electrodes sense a first test response signal at the first test frequency and a second test response signal at the second test frequency; and processing circuitry configured to identify a gyroscope failure based on at least one of the first test response signal and the second test response signal, wherein the gyroscope failure is identified based on a first gain change for the first test response signal, a second gain change for the second test response signal, and a ratio of the first gain change and the second gain change, and the first gain change is determined based on a difference between a magnitude of the first test response signal and a first baseline magnitude, and the second gain change being determined based on a difference between a magnitude of the second test response signal and a second baseline magnitude. one or more drive masses located in a device plane; one or more drive electrodes (111a, 111b) adjacent to the one or more drive masses; a drive circuit, wherein the drive circuit is configured to cause the one or more drive electrodes (111a, 111b) to drive the one or more drive masses in a first direction to oscillate at a drive frequency; one or more sense masses located in the device plane, wherein the one or more sense masses are coupled to the one or more drive masses to oscillate at the drive frequency in response to a rotation about an axis perpendicular to the device plane; one or more sense electrodes adjacent to the one or more sense masses, wherein a voltage between the one or more sense electrodes and the one or more sense masses changes based on the oscillation of the one or more sense masses; one or more auxiliary electrodes (132a - 132d) adjacent to the one or more sense masses, wherein the one or more auxiliary electrodes (132a - 132d) drive, by imparting test signals having a first test frequency and a second test frequency, the one or more sense masses in a second direction perpendicular to the first direction at the first test frequency and the second test frequency, wherein the first test frequency is distinct from the drive frequency, wherein the second test frequency is distinct from the drive frequency and the first test frequency, and wherein the one more sense electrodes sense a first test response signal at the first test frequency and a second test response signal at the second test frequency; and processing circuitry configured to identify a gyroscope failure based on at least one of the first test response signal and the second test response signal, wherein the gyroscope failure is identified based on a first gain change for the first test response signal, a second gain change for the second test response signal, and a ratio of the first gain change and the second gain change, and the first gain change is determined based on a difference between a magnitude of the first test response signal and a first baseline magnitude, and the second gain change being determined based on a difference between a magnitude of the second test response signal and a second baseline magnitude.