A shape measurement device (1, 1a, 201) configured to measure a shape of an object to be measured, the device comprising: a probe including: a projection optical system configured to project, onto a surface of the object to be measured, a line-shaped pattern, or a spot pattern while scanning in at least a linear scanning range; and an image capturing device configured to detect an image of the pattern projected onto the object to be measured; a movement mechanism (2, 7) configured to rotate the object to be measured and the probe relative to each other so that the object to be measured rotates relative to the probe around a rotation axis (Ax) and moves at least one of the probe and the object to be measured relatively in a direction that intersects with a rotation direction of the relative rotation; a measurement region setting unit configured to set a measurement region of the object to be measured; and an actual measurement region setting unit configured to set an actual measurement region including two positions of an actual measurement start position and an actual measurement end position based on the measurement region set by the measurement region setting unit, characterized in that the actual measurement region setting unit sets the actual measurement region such that one of the two positions which is closer to the rotation axis (Ax) is positioned closer to the rotation axis (Ax) than the measurement region, or the actual measurement region setting unit sets the actual measurement region such that another of the two positions which is positioned further from the rotation axis (Ax) is positioned further from the rotation axis (Ax) than the measurement region. a probe including: a projection optical system configured to project, onto a surface of the object to be measured, a line-shaped pattern, or a spot pattern while scanning in at least a linear scanning range; and an image capturing device configured to detect an image of the pattern projected onto the object to be measured; a projection optical system configured to project, onto a surface of the object to be measured, a line-shaped pattern, or a spot pattern while scanning in at least a linear scanning range; and an image capturing device configured to detect an image of the pattern projected onto the object to be measured; a movement mechanism (2, 7) configured to rotate the object to be measured and the probe relative to each other so that the object to be measured rotates relative to the probe around a rotation axis (Ax) and moves at least one of the probe and the object to be measured relatively in a direction that intersects with a rotation direction of the relative rotation; a measurement region setting unit configured to set a measurement region of the object to be measured; and an actual measurement region setting unit configured to set an actual measurement region including two positions of an actual measurement start position and an actual measurement end position based on the measurement region set by the measurement region setting unit, characterized in that the actual measurement region setting unit sets the actual measurement region such that one of the two positions which is closer to the rotation axis (Ax) is positioned closer to the rotation axis (Ax) than the measurement region, or the actual measurement region setting unit sets the actual measurement region such that another of the two positions which is positioned further from the rotation axis (Ax) is positioned further from the rotation axis (Ax) than the measurement region.