Method for controlling the thickness of extruded film, comprising the following method features: - measuring the thickness profile of straight extruded film by means of a thickness measuring probe, which is moved substantially transversely (x) to the transporting direction (z) of the extruded film along the surface thereof and records for each measuring cycle a thickness profile of the film, at least over parts of the extent of the film transversely (x) to the transporting direction (z) thereof, - transmitting the measured values to a control unit (14, 15, 17), - storing the measured values on which the thickness profiles are based in a memory unit, - providing statistical values of the film thickness by a computer device, the computer device thereby taking into account measured values or information derived from measured values from a specific number of measuring cycles, - determining the deviations in the statistical values of the film thickness from a target value, - generating control commands to means for influencing the film thickness, characterized in that, during a predetermined time period at the beginning of the extrusion process, when providing the statistical values, the computer device takes into account the more recent measured value or values with a great weighting than the older measured values, which were recorded at an earlier point in time than the more recent measured values, than during normal operation, in that • the measured values or information derived from measured values from a smaller number of measuring cycles is/are taken into account than during normal operation and/or • at least one older measured value is provided with a smaller weighting factor than during normal operation and/or • at least one more recent measured value is provided with a greater weighting factor than during normal operation. - measuring the thickness profile of straight extruded film by means of a thickness measuring probe, which is moved substantially transversely (x) to the transporting direction (z) of the extruded film along the surface thereof and records for each measuring cycle a thickness profile of the film, at least over parts of the extent of the film transversely (x) to the transporting direction (z) thereof, - transmitting the measured values to a control unit (14, 15, 17), - storing the measured values on which the thickness profiles are based in a memory unit, - providing statistical values of the film thickness by a computer device, the computer device thereby taking into account measured values or information derived from measured values from a specific number of measuring cycles, - determining the deviations in the statistical values of the film thickness from a target value, - generating control commands to means for influencing the film thickness, • the measured values or information derived from measured values from a smaller number of measuring cycles is/are taken into account than during normal operation and/or • at least one older measured value is provided with a smaller weighting factor than during normal operation and/or • at least one more recent measured value is provided with a greater weighting factor than during normal operation.