A specimen analysis apparatus for analyzing a component contained in a specimen, comprising: a specimen suction section for sucking a specimen from a specimen vessel placed on a specimen vessel placing section; a sample preparation section (2u, 2b) for preparing a measurement sample by mixing the specimen sucked by the specimen suction section with a reagent (18u, 18b); a measurement section for measuring a component in the measurement sample; a first controller for controlling the specimen suction section, the sample preparation section (2u, 2b) and the measurement section to implement processing of a first specimen, the processing comprising suction of a specimen, preparation of a measurement sample and measurement of a component in the measurement sample; wherein the first controller controls the specimen suction section, the sample preparation section and the measurement section to initiate processing of a second specimen different from the first specimen during the implementation of the processing of the first specimen; the specimen analysis apparatus further comprising: a second controller for judging whether a measurement result of the first specimen exceeds a threshold; and wherein the first controller controls the specimen suction section, the sample preparation section and the measurement section to implement reprocessing of the second specimen when the second controller judges that the measurement result of the first specimen exceeds the threshold. a specimen suction section for sucking a specimen from a specimen vessel placed on a specimen vessel placing section; a sample preparation section (2u, 2b) for preparing a measurement sample by mixing the specimen sucked by the specimen suction section with a reagent (18u, 18b); a measurement section for measuring a component in the measurement sample; a first controller for controlling the specimen suction section, the sample preparation section (2u, 2b) and the measurement section to implement processing of a first specimen, the processing comprising suction of a specimen, preparation of a measurement sample and measurement of a component in the measurement sample; wherein the first controller controls the specimen suction section, the sample preparation section and the measurement section to initiate processing of a second specimen different from the first specimen during the implementation of the processing of the first specimen; the specimen analysis apparatus further comprising: a second controller for judging whether a measurement result of the first specimen exceeds a threshold; and wherein the first controller controls the specimen suction section, the sample preparation section and the measurement section to implement reprocessing of the second specimen when the second controller judges that the measurement result of the first specimen exceeds the threshold. a second controller for judging whether a measurement result of the first specimen exceeds a threshold; and wherein the first controller controls the specimen suction section, the sample preparation section and the measurement section to implement reprocessing of the second specimen when the second controller judges that the measurement result of the first specimen exceeds the threshold.