A spectral characteristics measurement device (10, 50) comprising: a) a first light source; b) a fixed reflection unit and a movable reflection unit; c) an incident optical system that causes measurement light emitted from an object to be measured to enter the fixed reflection unit and the movable reflection unit; d) an imaging optical system that forms interference light of light reflected by the fixed reflection unit and light reflected by the movable reflection unit; e) a measurement light detection unit that detects an intensity of the interference light of measurement light formed by the imaging optical system; and f) a processing unit that acquires an interferogram of measurement light based on a change in the intensity of the interference light of measurement light obtained by moving the movable reflection unit; characterized in that the spectral characteristics measurement device (10, 50) further comprises g) reference light incident means for causing reference light of a narrow wavelength band included in a wavelength band of the measurement light to enter the fixed reflection unit and the movable reflection unit; h) a reference light detection unit that detects an intensity of interference light of the reference light formed by the imaging optical system; and i) an arithmetic processing unit that corrects the interferogram of measurement light based on an amplitude of a change in the intensity of the interference light of reference light detected by the reference light detection unit by moving the movable reflection unit and based on a phase difference between narrow wavelength band measurement light having the same wavelength as the reference light in the measurement light and the reference light, and that acquires a spectrum of the measurement light based on the corrected interferogram of measurement light. a) a first light source; b) a fixed reflection unit and a movable reflection unit; c) an incident optical system that causes measurement light emitted from an object to be measured to enter the fixed reflection unit and the movable reflection unit; d) an imaging optical system that forms interference light of light reflected by the fixed reflection unit and light reflected by the movable reflection unit; e) a measurement light detection unit that detects an intensity of the interference light of measurement light formed by the imaging optical system; and f) a processing unit that acquires an interferogram of measurement light based on a change in the intensity of the interference light of measurement light obtained by moving the movable reflection unit; g) reference light incident means for causing reference light of a narrow wavelength band included in a wavelength band of the measurement light to enter the fixed reflection unit and the movable reflection unit; h) a reference light detection unit that detects an intensity of interference light of the reference light formed by the imaging optical system; and i) an arithmetic processing unit that corrects the interferogram of measurement light based on an amplitude of a change in the intensity of the interference light of reference light detected by the reference light detection unit by moving the movable reflection unit and based on a phase difference between narrow wavelength band measurement light having the same wavelength as the reference light in the measurement light and the reference light, and that acquires a spectrum of the measurement light based on the corrected interferogram of measurement light.