A condition monitoring apparatus adapted to monitor a condition of an object, the condition monitoring apparatus comprising: a peak detector adapted to detect a peak from a frequency spectrum obtained by frequency analysis of waveform data measured by a sensor provided in the object; a map generator adapted to generate at least one abnormality map for the frequency spectrum, the at least one abnormality map including as abnormal components, a frequency of one peak of interest selected from among detected peaks and a frequency of a peak that appears together with the peak of interest when the peak of interest is assumed as a peak originating from abnormality of the object; an abnormal peak extractor adapted to select one map of interest from among the at least one abnormality map and adapted to extract as an abnormal peak from the detected peaks, a peak of which frequency difference from any of the abnormal components included in the map of interest is equal to or smaller than a prescribed value; and a first criterion value calculator adapted to calculate based on a spectral density of the abnormal peak, a first criterion value representing occurrence of abnormality corresponding to the map of interest, the condition monitoring apparatus being characterized in comprising a database and an abnormal part estimator adapted to extract abnormal part information as identification information from the database, the database being adapted to store, for each part of the object, the abnormal part information in which part information for identifying the part, a frequency originating from abnormality of the part, and a second threshold value are brought in correspondence with one another, the identification information being adapted to represent the frequency of which difference from the peak of interest corresponding to the map of interest is equal to or smaller than a second prescribed value and being adapted to represent the second threshold value smaller than the first criterion value corresponding to the map of interest, the abnormal part estimator being adapted to generate first estimation result information indicating that abnormality has occurred in a part identified by the part information in the identification information. a peak detector adapted to detect a peak from a frequency spectrum obtained by frequency analysis of waveform data measured by a sensor provided in the object; a map generator adapted to generate at least one abnormality map for the frequency spectrum, the at least one abnormality map including as abnormal components, a frequency of one peak of interest selected from among detected peaks and a frequency of a peak that appears together with the peak of interest when the peak of interest is assumed as a peak originating from abnormality of the object; an abnormal peak extractor adapted to select one map of interest from among the at least one abnormality map and adapted to extract as an abnormal peak from the detected peaks, a peak of which frequency difference from any of the abnormal components included in the map of interest is equal to or smaller than a prescribed value; and a first criterion value calculator adapted to calculate based on a spectral density of the abnormal peak, a first criterion value representing occurrence of abnormality corresponding to the map of interest, the condition monitoring apparatus being characterized in comprising a database and an abnormal part estimator adapted to extract abnormal part information as identification information from the database, the database being adapted to store, for each part of the object, the abnormal part information in which part information for identifying the part, a frequency originating from abnormality of the part, and a second threshold value are brought in correspondence with one another, the identification information being adapted to represent the frequency of which difference from the peak of interest corresponding to the map of interest is equal to or smaller than a second prescribed value and being adapted to represent the second threshold value smaller than the first criterion value corresponding to the map of interest, the abnormal part estimator being adapted to generate first estimation result information indicating that abnormality has occurred in a part identified by the part information in the identification information.