Measurement system for a combined energy dispersive spectroscopy, EDS, and transmission Kikuchi diffraction, TKD, measurement, comprising: a sample holder for positioning a sample in an electron microscope, EM,, the sample holder having a main body with a tapered portion that is terminating in a tip portion configured to receive the sample such that the sample is disposed on a contact plane; and an aperture extension having an attachment portion comprising a U-shaped metal bar and being mechanically engaged with the main body outside of the tapered portion and the tip portion in that side legs of the U-shaped metal bar are closely fitted to side walls of the main body and an inner leg of the U-shaped metal bar is closely fitted to a top surface of the main body, wherein the attachment portion is configured to fix the aperture extension to the sample holder; an aperture portion extending laterally over the tip portion in a plane that is plane-parallel to the contact plane and overlapping the tip portion, wherein an extension of the aperture portion parallel to the contact plane is larger than an extension of the tip portion parallel to the contact plane; and an aperture opening disposed on the aperture portion, having an extension parallel to the contact plane that is larger than the extension of the sample parallel to the contact plane and overlapping the sample. a sample holder for positioning a sample in an electron microscope, EM,, the sample holder having a main body with a tapered portion that is terminating in a tip portion configured to receive the sample such that the sample is disposed on a contact plane; and an aperture extension having an attachment portion comprising a U-shaped metal bar and being mechanically engaged with the main body outside of the tapered portion and the tip portion in that side legs of the U-shaped metal bar are closely fitted to side walls of the main body and an inner leg of the U-shaped metal bar is closely fitted to a top surface of the main body, wherein the attachment portion is configured to fix the aperture extension to the sample holder; an aperture portion extending laterally over the tip portion in a plane that is plane-parallel to the contact plane and overlapping the tip portion, wherein an extension of the aperture portion parallel to the contact plane is larger than an extension of the tip portion parallel to the contact plane; and an aperture opening disposed on the aperture portion, having an extension parallel to the contact plane that is larger than the extension of the sample parallel to the contact plane and overlapping the sample. an attachment portion comprising a U-shaped metal bar and being mechanically engaged with the main body outside of the tapered portion and the tip portion in that side legs of the U-shaped metal bar are closely fitted to side walls of the main body and an inner leg of the U-shaped metal bar is closely fitted to a top surface of the main body, wherein the attachment portion is configured to fix the aperture extension to the sample holder; an aperture portion extending laterally over the tip portion in a plane that is plane-parallel to the contact plane and overlapping the tip portion, wherein an extension of the aperture portion parallel to the contact plane is larger than an extension of the tip portion parallel to the contact plane; and an aperture opening disposed on the aperture portion, having an extension parallel to the contact plane that is larger than the extension of the sample parallel to the contact plane and overlapping the sample.