A method comprising: controlling a scanning electrochemical microscopy probe tip to perform an approach/retract measurement routine at each of plural locations on a surface of interest in succession; and translating the scanning electrochemical microscopy probe tip along the surface of interest between successive locations whilst the scanning electrochemical microscopy probe tip is not in intermittent contact with the surface of interest, wherein performing an approach/retract measurement routine comprises: oscillating the scanning electrochemical microscopy probe tip relative to the surface of interest; moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest; detecting damping of an amplitude of the oscillation of the scanning electrochemical microscopy probe tip resulting from the scanning electrochemical microscopy probe tip coming into contact with the surface of interest at the first location; using the detected damping to detect the surface of interest; retracting the scanning electrochemical microscopy probe tip away from the surface of interest to a position at which there is no intermittent contact between the scanning electrochemical microscopy probe tip and the surface of interest without first translating the scanning electrochemical microscopy probe tip along the surface of interest whilst the scanning electrochemical microscopy probe tip is in intermittent contact with the surface of interest; and measuring electrochemical signals produced at the oscillating scanning electrochemical microscopy probe tip whilst moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest and/or whilst retracting the scanning electrochemical microscopy probe tip away from the surface of interest. controlling a scanning electrochemical microscopy probe tip to perform an approach/retract measurement routine at each of plural locations on a surface of interest in succession; and translating the scanning electrochemical microscopy probe tip along the surface of interest between successive locations whilst the scanning electrochemical microscopy probe tip is not in intermittent contact with the surface of interest, wherein performing an approach/retract measurement routine comprises: oscillating the scanning electrochemical microscopy probe tip relative to the surface of interest; moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest; detecting damping of an amplitude of the oscillation of the scanning electrochemical microscopy probe tip resulting from the scanning electrochemical microscopy probe tip coming into contact with the surface of interest at the first location; using the detected damping to detect the surface of interest; retracting the scanning electrochemical microscopy probe tip away from the surface of interest to a position at which there is no intermittent contact between the scanning electrochemical microscopy probe tip and the surface of interest without first translating the scanning electrochemical microscopy probe tip along the surface of interest whilst the scanning electrochemical microscopy probe tip is in intermittent contact with the surface of interest; and measuring electrochemical signals produced at the oscillating scanning electrochemical microscopy probe tip whilst moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest and/or whilst retracting the scanning electrochemical microscopy probe tip away from the surface of interest. oscillating the scanning electrochemical microscopy probe tip relative to the surface of interest; moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest; detecting damping of an amplitude of the oscillation of the scanning electrochemical microscopy probe tip resulting from the scanning electrochemical microscopy probe tip coming into contact with the surface of interest at the first location; using the detected damping to detect the surface of interest; retracting the scanning electrochemical microscopy probe tip away from the surface of interest to a position at which there is no intermittent contact between the scanning electrochemical microscopy probe tip and the surface of interest without first translating the scanning electrochemical microscopy probe tip along the surface of interest whilst the scanning electrochemical microscopy probe tip is in intermittent contact with the surface of interest; and measuring electrochemical signals produced at the oscillating scanning electrochemical microscopy probe tip whilst moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest and/or whilst retracting the scanning electrochemical microscopy probe tip away from the surface of interest.