An optical coherence tomographic device comprising: a light source of wavelength sweeping type; a measurement optical system configured to irradiate a subject with light from the light source and to guide reflected light or scattered light from the subject; a reference optical system configured to guide the light from the light source so as to acquire reference light from the light from the light source; a light receiving element configured to receive interference light and to convert the interference light to an interference signal, the interference light being a combination of the reflected light or the scattered light and the reference light; a sample clock signal generator configured to generate a sample clock signal from the light from the light source at regular frequency intervals; a signal processor (66, 266a, 266b) configured to sample the interference signal outputted from the light receiving element based on a timing of the sample clock signal outputted from the sample clock signal generator; a processor (70, 270) configured to generate tomographic information of the subject from the sampled interference signal; and a delay circuit (68, 168, 268a, 268b) configured to delay, by a predetermined delay amount, at least one of the sample clock signal outputted from the sample clock signal generator to the signal processor (66, 266a, 266b) and the interference signal outputted from the light receiving element to the signal processor (66, 266a, 266b), wherein the signal processor (66, 266a, 266b) is configured to sample the interference light in a first wavelength region and a second wavelength region while the wavelength of the light emitted from the light source changes over one cycle, the second wavelength region being different from the first wavelength region, characterised in that the signal processor (66, 266a, 266b) is configured to acquire one piece of tomographic information by one sampling, the one piece of tomographic information being tomographic information on one scan line, the signal processor (66, 266a, 266b) is configured to acquire first one piece of tomographic information by sampling the interference signal in the first wavelength region, and to acquire second one piece of tomographic information by sampling the interference signal in the second wavelength region, and the delay circuit (68, 168, 268a, 268b) is configured such that a first delay amount is different from a second delay amount, the predetermined delay amount including the first delay amount which is a delay amount when the interference signal is sampled in the first wavelength region and the second delay amount which is a delay amount when the interference signal is sampled in the second wavelength region. a light source of wavelength sweeping type; a measurement optical system configured to irradiate a subject with light from the light source and to guide reflected light or scattered light from the subject; a reference optical system configured to guide the light from the light source so as to acquire reference light from the light from the light source; a light receiving element configured to receive interference light and to convert the interference light to an interference signal, the interference light being a combination of the reflected light or the scattered light and the reference light; a sample clock signal generator configured to generate a sample clock signal from the light from the light source at regular frequency intervals; a signal processor (66, 266a, 266b) configured to sample the interference signal outputted from the light receiving element based on a timing of the sample clock signal outputted from the sample clock signal generator; a processor (70, 270) configured to generate tomographic information of the subject from the sampled interference signal; and a delay circuit (68, 168, 268a, 268b) configured to delay, by a predetermined delay amount, at least one of the sample clock signal outputted from the sample clock signal generator to the signal processor (66, 266a, 266b) and the interference signal outputted from the light receiving element to the signal processor (66, 266a, 266b), wherein the signal processor (66, 266a, 266b) is configured to sample the interference light in a first wavelength region and a second wavelength region while the wavelength of the light emitted from the light source changes over one cycle, the second wavelength region being different from the first wavelength region, characterised in that the signal processor (66, 266a, 266b) is configured to acquire one piece of tomographic information by one sampling, the one piece of tomographic information being tomographic information on one scan line, the signal processor (66, 266a, 266b) is configured to acquire first one piece of tomographic information by sampling the interference signal in the first wavelength region, and to acquire second one piece of tomographic information by sampling the interference signal in the second wavelength region, and the delay circuit (68, 168, 268a, 268b) is configured such that a first delay amount is different from a second delay amount, the predetermined delay amount including the first delay amount which is a delay amount when the interference signal is sampled in the first wavelength region and the second delay amount which is a delay amount when the interference signal is sampled in the second wavelength region.