Optical and atomic force microscopy measurement integrated system, comprising: - an atomic force microscope having a first probe apt to interact with a sample to be analyzed, - first movement means apt to determine a relative movement of said first probe with respect to the sample to be analyzed, - an optical tweezer apt to emit an optical beam having focus on a portion of the sample to be analyzed, - a second probe apt to be associated with said sample to be analyzed, wherein: - said optical beam of the optical tweezer is designed for holding said second probe in said focus, and wherein said measurement system comprises: - first measuring means apt to generate a first measurement signal representative of the variations of relative position of said first probe with respect to said sample, - second movement means apt to determine a relative movement of said focus with respect to said sample so as to determine a relative movement of said second probe with respect to said sample, said first and second movement means are able to move respectively the first and second probe independently with respect to the sample and place the first and second probe in contact in different positions on the surface of the sample, - second measurement means apt to generate a second measurement signal representative of the variations of relative position of said second probe with respect to said sample, - processing means apt to receive as an input said first measurement signal and said second measurement signal to generate an output signal representative of said sample, - control means (25, 27) are provided apt to generate a trigger voltage signal to cause a mechanical stress to one of said first and second probes (7,8), said processing means processing said trigger signal and at least one of said first and second measurement signals to generate said output signal. - an atomic force microscope having a first probe apt to interact with a sample to be analyzed, - first movement means apt to determine a relative movement of said first probe with respect to the sample to be analyzed, - an optical tweezer apt to emit an optical beam having focus on a portion of the sample to be analyzed, - a second probe apt to be associated with said sample to be analyzed, wherein: - said optical beam of the optical tweezer is designed for holding said second probe in said focus, - said optical beam of the optical tweezer is designed for holding said second probe in said focus, - first measuring means apt to generate a first measurement signal representative of the variations of relative position of said first probe with respect to said sample, - second movement means apt to determine a relative movement of said focus with respect to said sample so as to determine a relative movement of said second probe with respect to said sample, said first and second movement means are able to move respectively the first and second probe independently with respect to the sample and place the first and second probe in contact in different positions on the surface of the sample, - second measurement means apt to generate a second measurement signal representative of the variations of relative position of said second probe with respect to said sample, - processing means apt to receive as an input said first measurement signal and said second measurement signal to generate an output signal representative of said sample, - control means (25, 27) are provided apt to generate a trigger voltage signal to cause a mechanical stress to one of said first and second probes (7,8), said processing means processing said trigger signal and at least one of said first and second measurement signals to generate said output signal.