A system (100; 200) for measuring electrical resistance, comprising: a resistive structure (101; 201) having: a first node (130A; 230A) at a first end of the resistive structure (101; 201); a second node (130B; 230B) at a second end of the resistive structure (101; 201); and a third node (130C; 230C) on the resistive structure (101; 201) between the first and second nodes (130A, 130B; 230A, 230B); a calibration current generation circuit (102; 202) having an output coupled to the third node (130C; 230C) of the resistive structure (101; 201), and configured to sequentially couple at least two different calibration currents (I CAL) of different magnitude or sign into the third node (130C; 230C) of the resistive structure (101; 201); a signal conditioning circuit (104; 204) comprising: a first input coupled to the first node (130A; 230A) of the resistive structure (101; 201); a second input coupled to the second node (130B; 230B) of the resistive structure (101; 201); a third input coupled to the third node (130C; 230C) of the resistive structure (101; 201); and an output (105; 205), wherein the signal conditioning circuit (104; 204) is configured to provide at its output (105; 205) a signal proportional to a difference between a voltage at the third node (130C; 230C) and a weighted average of the voltages (Vavg) at the first and second nodes (130A, 130B; 230A, 230B) of the resistive structure (101; 201); and a signal processing circuit (106; 206) coupled to the output (105; 205) of the signal conditioning circuit (104; 204), wherein the signal processing circuit (106; 206) is configured to calculate the resistance of the resistive structure (101; 201) from a difference between a first output voltage of the signal conditioning circuit (104; 204) when the calibration current (I CAL) is set to a first value, and a second output voltage of the signal conditioning circuit (104; 204) when the calibration current (I CAL) is set to a second value, the difference being proportional to a product of the resistance Rx of the resistive structure (101; 201) and the calibration current (I CAL). a resistive structure (101; 201) having: a first node (130A; 230A) at a first end of the resistive structure (101; 201); a second node (130B; 230B) at a second end of the resistive structure (101; 201); and a third node (130C; 230C) on the resistive structure (101; 201) between the first and second nodes (130A, 130B; 230A, 230B); a first node (130A; 230A) at a first end of the resistive structure (101; 201); a second node (130B; 230B) at a second end of the resistive structure (101; 201); and a third node (130C; 230C) on the resistive structure (101; 201) between the first and second nodes (130A, 130B; 230A, 230B); a calibration current generation circuit (102; 202) having an output coupled to the third node (130C; 230C) of the resistive structure (101; 201), and configured to sequentially couple at least two different calibration currents (I CAL) of different magnitude or sign into the third node (130C; 230C) of the resistive structure (101; 201); a signal conditioning circuit (104; 204) comprising: a first input coupled to the first node (130A; 230A) of the resistive structure (101; 201); a second input coupled to the second node (130B; 230B) of the resistive structure (101; 201); a third input coupled to the third node (130C; 230C) of the resistive structure (101; 201); and an output (105; 205), a first input coupled to the first node (130A; 230A) of the resistive structure (101; 201); a second input coupled to the second node (130B; 230B) of the resistive structure (101; 201); a third input coupled to the third node (130C; 230C) of the resistive structure (101; 201); and an output (105; 205), wherein the signal conditioning circuit (104; 204) is configured to provide at its output (105; 205) a signal proportional to a difference between a voltage at the third node (130C; 230C) and a weighted average of the voltages (Vavg) at the first and second nodes (130A, 130B; 230A, 230B) of the resistive structure (101; 201); and a signal processing circuit (106; 206) coupled to the output (105; 205) of the signal conditioning circuit (104; 204), wherein the signal processing circuit (106; 206) is configured to calculate the resistance of the resistive structure (101; 201) from a difference between a first output voltage of the signal conditioning circuit (104; 204) when the calibration current (I CAL) is set to a first value, and a second output voltage of the signal conditioning circuit (104; 204) when the calibration current (I CAL) is set to a second value, the difference being proportional to a product of the resistance Rx of the resistive structure (101; 201) and the calibration current (I CAL).