Method of determining spatially-resolved, material properties from a sample's complex reflectance or transmittance comprising the steps of: a. providing at least partially spatially-coherent radiation in the form of an incident beam; b. characterizing the incident beam; c. delivering the incident beam onto a sample (128, 228) to produce scattered radiation (130, 230), wherein the scatter data generated by said scattered radiation consist of holographic datasets, coherent diffraction imaging datasets or data obtained by interferometric scanning point microscopy measurements; d. varying (121, 122, 124-127) at least one independent parameter of the incident beam upon which the sample's complex reflectance or transmittance is dependent; e. collecting the scattered radiation (130, 230) at multiple values of the independent parameter (121, 122, 124-127, 132, 133) on a detector and generating said scatter data; f. generating at least one spatially resolved complex image (500, 510, 520, 530) of the sample corresponding to a spatially resolved complex reflectance or transmittance image of the sample based upon the beam characterization and the collected scatter data, at each of the multiple values of the independent parameter; g. calculating the complex reflectance or transmittance of the sample for each pixel or groups of pixels corresponding to the same spatial location in each complex image (500, 510, 520, 530) as a function of the independent parameter; and h. determining spatially-resolved, depth-dependent material properties of the sample from the spatially-resolved complex reflectance or transmittance; i. guessing at least one sample model in which respective spatially-resolved material properties are assigned at respective depths of the sample; j. estimating (900, 1000) a predicted complex reflectance or transmittance versus the independent parameter based on the sample model; k. comparing the predicted complex reflectance or transmittance versus the independent parameter to said calculated measurement of complex reflectance or transmittance versus the independent parameter; and l. refining the sample model until the predicted complex reflectance or transmittance versus the independent parameter substantially agrees with the measured complex reflectance or transmittance versus the independent parameter. a. providing at least partially spatially-coherent radiation in the form of an incident beam; b. characterizing the incident beam; c. delivering the incident beam onto a sample (128, 228) to produce scattered radiation (130, 230), wherein the scatter data generated by said scattered radiation consist of holographic datasets, coherent diffraction imaging datasets or data obtained by interferometric scanning point microscopy measurements; d. varying (121, 122, 124-127) at least one independent parameter of the incident beam upon which the sample's complex reflectance or transmittance is dependent; e. collecting the scattered radiation (130, 230) at multiple values of the independent parameter (121, 122, 124-127, 132, 133) on a detector and generating said scatter data; f. generating at least one spatially resolved complex image (500, 510, 520, 530) of the sample corresponding to a spatially resolved complex reflectance or transmittance image of the sample based upon the beam characterization and the collected scatter data, at each of the multiple values of the independent parameter; g. calculating the complex reflectance or transmittance of the sample for each pixel or groups of pixels corresponding to the same spatial location in each complex image (500, 510, 520, 530) as a function of the independent parameter; and h. determining spatially-resolved, depth-dependent material properties of the sample from the spatially-resolved complex reflectance or transmittance; i. guessing at least one sample model in which respective spatially-resolved material properties are assigned at respective depths of the sample; j. estimating (900, 1000) a predicted complex reflectance or transmittance versus the independent parameter based on the sample model; k. comparing the predicted complex reflectance or transmittance versus the independent parameter to said calculated measurement of complex reflectance or transmittance versus the independent parameter; and l. refining the sample model until the predicted complex reflectance or transmittance versus the independent parameter substantially agrees with the measured complex reflectance or transmittance versus the independent parameter.