A system for providing a signal proportional to the absolute temperature of a semiconductor junction, comprising: an analog preprocessing stage configured and arranged so as to process an analog signal from the semiconductor junction so as to produce an analog preprocessed signal including a resistance error term; a temperature to voltage converter stage for converting the analog preprocessed signal to a voltage proportional to absolute temperature representing the absolute temperature of the semiconductor junction, the analog preprocessing stage including a resistance error extraction circuit configured and arranged so as to generate a resistance error term signal representative of the resistance error term, and an extraction circuit for extracting the resistance error term from the preprocessed signal so as to produce an analog resistance error free signal representative of the semiconductor junction temperature; and three current sources for sequentially applying three excitation currents of different values I 1, I 2 and I 3, through the semiconductor junction so as to develop successive measured sensor signals in response to each of the excitation currents, characterized in that the system further comprises: a variable offset buffer configured and arranged so as to generate a buffered signal from the semiconductor junction with a variable offset; and a signal integration circuit arrangement coupled to the output of the variable offset buffer and configured so as to generate an integrated signal as a function of integrated differential measurements of the buffered signal, wherein the variable offset is a function of the measurement current cycle and the resistive error term so that the integrated signal represents the resistive error compensated temperature of the semiconductor junction. an analog preprocessing stage configured and arranged so as to process an analog signal from the semiconductor junction so as to produce an analog preprocessed signal including a resistance error term; a temperature to voltage converter stage for converting the analog preprocessed signal to a voltage proportional to absolute temperature representing the absolute temperature of the semiconductor junction, the analog preprocessing stage including a resistance error extraction circuit configured and arranged so as to generate a resistance error term signal representative of the resistance error term, and an extraction circuit for extracting the resistance error term from the preprocessed signal so as to produce an analog resistance error free signal representative of the semiconductor junction temperature; and three current sources for sequentially applying three excitation currents of different values I 1, I 2 and I 3, through the semiconductor junction so as to develop successive measured sensor signals in response to each of the excitation currents, characterized in that the system further comprises: a variable offset buffer configured and arranged so as to generate a buffered signal from the semiconductor junction with a variable offset; and a signal integration circuit arrangement coupled to the output of the variable offset buffer and configured so as to generate an integrated signal as a function of integrated differential measurements of the buffered signal, wherein the variable offset is a function of the measurement current cycle and the resistive error term so that the integrated signal represents the resistive error compensated temperature of the semiconductor junction. a variable offset buffer configured and arranged so as to generate a buffered signal from the semiconductor junction with a variable offset; and a signal integration circuit arrangement coupled to the output of the variable offset buffer and configured so as to generate an integrated signal as a function of integrated differential measurements of the buffered signal, wherein the variable offset is a function of the measurement current cycle and the resistive error term so that the integrated signal represents the resistive error compensated temperature of the semiconductor junction.