An apparatus comprising: a micro-electromechanical system,MEMS, gyroscope sensor including a first sensing capacitor and a second sensing capacitor; and an integrated circuit, IC, including: a switch circuit configured to electrically decouple the first sensing capacitor from a first input of the IC and electrically couple the second sensing capacitor to a second input of the IC, and to electrically decouple the second sensing capacitor of the MEMS gyroscope sensor from the second input of the IC and electrically couple the first sensing capacitor of the MEMS gyroscope sensor to the first input of the IC; and a capacitance test circuit configured to test change in capacitance of the second sensing capacitor of the MEMS gyroscope sensor during application of a first electrical signal to the first sensing capacitor when the first sensing capacitor is electrically decoupled from the IC and the second capacitor is electrically coupled to the IC, and to test change in capacitance of the first sensing capacitor of the MEMS gyroscope sensor during application of a second electrical signal to the second sensing capacitor when the second sensing capacitor is electrically decoupled from the IC and the first capacitor is electrically coupled to the IC. a micro-electromechanical system,MEMS, gyroscope sensor including a first sensing capacitor and a second sensing capacitor; and an integrated circuit, IC, including: a switch circuit configured to electrically decouple the first sensing capacitor from a first input of the IC and electrically couple the second sensing capacitor to a second input of the IC, and to electrically decouple the second sensing capacitor of the MEMS gyroscope sensor from the second input of the IC and electrically couple the first sensing capacitor of the MEMS gyroscope sensor to the first input of the IC; and a capacitance test circuit configured to test change in capacitance of the second sensing capacitor of the MEMS gyroscope sensor during application of a first electrical signal to the first sensing capacitor when the first sensing capacitor is electrically decoupled from the IC and the second capacitor is electrically coupled to the IC, and to test change in capacitance of the first sensing capacitor of the MEMS gyroscope sensor during application of a second electrical signal to the second sensing capacitor when the second sensing capacitor is electrically decoupled from the IC and the first capacitor is electrically coupled to the IC. a switch circuit configured to electrically decouple the first sensing capacitor from a first input of the IC and electrically couple the second sensing capacitor to a second input of the IC, and to electrically decouple the second sensing capacitor of the MEMS gyroscope sensor from the second input of the IC and electrically couple the first sensing capacitor of the MEMS gyroscope sensor to the first input of the IC; and a capacitance test circuit configured to test change in capacitance of the second sensing capacitor of the MEMS gyroscope sensor during application of a first electrical signal to the first sensing capacitor when the first sensing capacitor is electrically decoupled from the IC and the second capacitor is electrically coupled to the IC, and to test change in capacitance of the first sensing capacitor of the MEMS gyroscope sensor during application of a second electrical signal to the second sensing capacitor when the second sensing capacitor is electrically decoupled from the IC and the first capacitor is electrically coupled to the IC.