A device for detecting an ionizing radiation comprising a sensor wherein the ionizing radiation causes the forming of charges, the sensor comprising a wafer of a semiconductor material, a first face of said plate being covered with one or more than one electrodes called cathodes, the other face being covered with several electrodes called anodes each connected to a correction electronic circuit capable of supplying a processing unit with a first signal (Hech) indicating that charges are being collected by the electrode connected to said correction electronic circuit; at least one electrode, called central electrode, being surrounded with at least two electrodes, called adjacent electrodes, the correction circuit connected to the central electrode, called central correction circuit, being capable of exchanging signals with each of the correction circuits connected to the adjacent electrodes, called adjacent correction circuits; characterized in that each central or adjacent correction circuit is capable of respectively sending to the adjacent or central correction circuit a second detection signal (M1 k, M k; H1 k, Hk) when charges are being respectively collected on the central electrode or an adjacent electrode; in that each central or adjacent correction circuit is capable of respectively sending to the adjacent or central correction circuit a request to participate in a detection overlap (Af k; Cc k) and respectively receiving from the adjacent or central correction circuit an availability indication (Pc k, A2 k); and in that each central correction circuit comprises an analysis and control device, capable of, when the central electrode has collected charges: (a) determining, within a time range, a possible detection overlap between the central electrode and at least one of the adjacent electrodes based on the detection signals; (b) in the case of a detection overlap, determining a first priority detection overlap with an adjacent correction circuit, called priority circuit, for which the second detection signals of the priority adjacent correction circuit and of the central correction circuit have the highest probability of corresponding to a same received photon; (c) transmitting to or receiving from the priority adjacent correction circuit a request to participate in a detection overlap and receiving from or transmitting to the priority adjacent correction circuit an availability indication; and (d) transmitting said first signal (Hech) to the processing unit except in the case where a detection overlap has been determined within said time range and where an availability indication has been sent to the priority adjacent correction circuit. (a) determining, within a time range, a possible detection overlap between the central electrode and at least one of the adjacent electrodes based on the detection signals; (b) in the case of a detection overlap, determining a first priority detection overlap with an adjacent correction circuit, called priority circuit, for which the second detection signals of the priority adjacent correction circuit and of the central correction circuit have the highest probability of corresponding to a same received photon; (c) transmitting to or receiving from the priority adjacent correction circuit a request to participate in a detection overlap and receiving from or transmitting to the priority adjacent correction circuit an availability indication; and (d) transmitting said first signal (Hech) to the processing unit except in the case where a detection overlap has been determined within said time range and where an availability indication has been sent to the priority adjacent correction circuit.