A conductive film (10, 11) that is provided on a display unit of a display device, the conductive film comprising: a transparent substrate; and a conductive section that is formed on at least one surface of the transparent substrate and is formed of a plurality of thin metal lines, wherein the conductive section has a wiring pattern which is formed in a mesh shape by the plurality of thin metal lines and in which a plurality of opening portions is arranged, and wherein regarding the wiring pattern, normalized spectrum intensities of an entire image of the wiring pattern, obtained by performing two-dimensional Fourier transform on transmittance image data of the entire image, are calculated, wherein each normalized spectrum intensity is a standard value which is normalized by an image size and an average value of the spectrum intensities, the normalized spectrum intensities, which are equal to or greater than a specified value, are extracted, wherein the specified value is -4.0 as a value which is 10,000 times a logarithmic value of a value of the normalized spectrum intensity, intensity differences, wherein each intensity difference is obtained by multiplying 10,000 times a common logarithm of a difference between a maximum value and a minimum value of the normalized spectrum intensity for an angular direction, are calculated by oscillating the angular direction by a specific angle step, wherein the specific angle step is 1 degree, and in a case where a histogram of intensity differences is calculated, one or more clusters of bars which indicate frequencies at an average value or more of the intensity difference are isolated from another cluster of bars which indicate frequencies at a lower value than the average value of intensity differences, wherein a range of the intensity difference forming a horizontal axis of the histogram is from -4.0 to 0, and a step width of the range is 0.1, and in a case where a sample standard deviation indicating an angular direction variation of single direction variations of the normalized spectrum intensities is calculated as a quantitative value of the wiring pattern, the quantitative value is in a specific numerical value range, wherein the specific numerical value range is from -5.29 to -5.05. a transparent substrate; and a conductive section that is formed on at least one surface of the transparent substrate and is formed of a plurality of thin metal lines, wherein the conductive section has a wiring pattern which is formed in a mesh shape by the plurality of thin metal lines and in which a plurality of opening portions is arranged, and wherein regarding the wiring pattern, normalized spectrum intensities of an entire image of the wiring pattern, obtained by performing two-dimensional Fourier transform on transmittance image data of the entire image, are calculated, wherein each normalized spectrum intensity is a standard value which is normalized by an image size and an average value of the spectrum intensities, the normalized spectrum intensities, which are equal to or greater than a specified value, are extracted, wherein the specified value is -4.0 as a value which is 10,000 times a logarithmic value of a value of the normalized spectrum intensity, intensity differences, wherein each intensity difference is obtained by multiplying 10,000 times a common logarithm of a difference between a maximum value and a minimum value of the normalized spectrum intensity for an angular direction, are calculated by oscillating the angular direction by a specific angle step, wherein the specific angle step is 1 degree, and in a case where a histogram of intensity differences is calculated, one or more clusters of bars which indicate frequencies at an average value or more of the intensity difference are isolated from another cluster of bars which indicate frequencies at a lower value than the average value of intensity differences, wherein a range of the intensity difference forming a horizontal axis of the histogram is from -4.0 to 0, and a step width of the range is 0.1, and in a case where a sample standard deviation indicating an angular direction variation of single direction variations of the normalized spectrum intensities is calculated as a quantitative value of the wiring pattern, the quantitative value is in a specific numerical value range, wherein the specific numerical value range is from -5.29 to -5.05.