A solid-state imaging element comprising: a limiting circuit that is configured to limit an electric signal generated by photoelectric conversion by a predetermined limit value and to output the electric signal limited as an output signal; a differentiating circuit that is configured to obtain an amount of change of the output signal; and a comparison circuit that is configured to perform comparison between the amount of change and a predetermined threshold value to output a result of the comparison as a result of detection of an address event, wherein the predetermined limit value is a lower limit value of a current, the limiting circuit includes: a photoelectric conversion element that is configured to generate a photocurrent as the electric signal by the photoelectric conversion for incident light; an offset current source that is configured to generate an offset current indicating the lower limit value, and to supply the offset current as a conversion target current in a case where the photocurrent is less than the offset current; and a current-to-voltage conversion unit (322, 324, 325) that is configured to perform current-to-voltage conversion on the conversion target current and to output the conversion target current converted as the output signal to the differentiating circuit, wherein the output signal is a logarithmic value of the conversion target current, and wherein the offset current source is a transistor connected in parallel with the photoelectric conversion element between the current-to-voltage conversion unit (322, 324, 325) and a predetermined reference potential. a limiting circuit that is configured to limit an electric signal generated by photoelectric conversion by a predetermined limit value and to output the electric signal limited as an output signal; a differentiating circuit that is configured to obtain an amount of change of the output signal; and a comparison circuit that is configured to perform comparison between the amount of change and a predetermined threshold value to output a result of the comparison as a result of detection of an address event, the predetermined limit value is a lower limit value of a current, the limiting circuit includes: a photoelectric conversion element that is configured to generate a photocurrent as the electric signal by the photoelectric conversion for incident light; an offset current source that is configured to generate an offset current indicating the lower limit value, and to supply the offset current as a conversion target current in a case where the photocurrent is less than the offset current; and a current-to-voltage conversion unit (322, 324, 325) that is configured to perform current-to-voltage conversion on the conversion target current and to output the conversion target current converted as the output signal to the differentiating circuit, wherein the output signal is a logarithmic value of the conversion target current, and wherein the offset current source is a transistor connected in parallel with the photoelectric conversion element between the current-to-voltage conversion unit (322, 324, 325) and a predetermined reference potential. a photoelectric conversion element that is configured to generate a photocurrent as the electric signal by the photoelectric conversion for incident light; an offset current source that is configured to generate an offset current indicating the lower limit value, and to supply the offset current as a conversion target current in a case where the photocurrent is less than the offset current; and a current-to-voltage conversion unit (322, 324, 325) that is configured to perform current-to-voltage conversion on the conversion target current and to output the conversion target current converted as the output signal to the differentiating circuit, wherein the output signal is a logarithmic value of the conversion target current, and wherein the offset current source is a transistor connected in parallel with the photoelectric conversion element between the current-to-voltage conversion unit (322, 324, 325) and a predetermined reference potential.