Method of calibrating an ionising radiation detection device, the device comprising a detector comprising a semiconducting detection material extending between two electrodes (E, E', E", 12, 13, 13x), at least one electrode being capable of generating a signal S with amplitude A during an interaction of ionising radiation in said detection material, an electronic processing device (22,23 x) adapted to form said signal S from charge carriers collected by an electrode during an interaction and to derive amplitude A therefrom; an electronic positioning circuit adapted to determine the value (k,k i) of at least one position parameter for an interaction in the detection material, from the signal of at least one electrode, said calibrating method comprising the following steps: a) irradiation of the detector using a known reference source (Sref) so as to generate interactions in the detector material, b) selection of a plurality of correction factors (j), and determination of reference spectra (Sp refj), each reference spectrum being associated with a correction factor (j), each reference spectrum representing a distribution of the amplitude of the signal generated when the detector is irradiated by said reference source (Sref), the amplitude of the detected signal being weighted by said correction factor (j), c) detection of a plurality of interactions in the detector during said irradiation and, for each interaction, measurement of at least one amplitude A of an electronic signal S generated by an electrode E and determination of the value k of at least one position parameter of the interaction as a function of said amplitude A. d) for a plurality of values k of said position parameter, determination of a calibration function F k such that ▪ each calibration function F k is associated with one of said values k of said position parameter ▪ each calibration function F k is defined on a plurality of correction factors j, ▪ each term F k (j) of said calibration function represents a probability associated with said correction factor j when the position parameter is equal to the value k, ▪ each term F k (j) being updated, at each interaction for which the position parameter is equal to the value k with which said calibration function F k is associated, combining the amplitude A measured during this interaction with each reference spectrum Sp ref j, e) determination of a correction factor j k associated with each value k of the position parameter by j k = arg max j F k j. a) irradiation of the detector using a known reference source (Sref) so as to generate interactions in the detector material, b) selection of a plurality of correction factors (j), and determination of reference spectra (Sp refj), each reference spectrum being associated with a correction factor (j), each reference spectrum representing a distribution of the amplitude of the signal generated when the detector is irradiated by said reference source (Sref), the amplitude of the detected signal being weighted by said correction factor (j), c) detection of a plurality of interactions in the detector during said irradiation and, for each interaction, measurement of at least one amplitude A of an electronic signal S generated by an electrode E and determination of the value k of at least one position parameter of the interaction as a function of said amplitude A. d) for a plurality of values k of said position parameter, determination of a calibration function F k such that ▪ each calibration function F k is associated with one of said values k of said position parameter ▪ each calibration function F k is defined on a plurality of correction factors j, ▪ each term F k (j) of said calibration function represents a probability associated with said correction factor j when the position parameter is equal to the value k, ▪ each term F k (j) being updated, at each interaction for which the position parameter is equal to the value k with which said calibration function F k is associated, combining the amplitude A measured during this interaction with each reference spectrum Sp ref j, ▪ each calibration function F k is associated with one of said values k of said position parameter ▪ each calibration function F k is defined on a plurality of correction factors j, ▪ each term F k (j) of said calibration function represents a probability associated with said correction factor j when the position parameter is equal to the value k, ▪ each term F k (j) being updated, at each interaction for which the position parameter is equal to the value k with which said calibration function F k is associated, combining the amplitude A measured during this interaction with each reference spectrum Sp ref j, e) determination of a correction factor j k associated with each value k of the position parameter by j k = arg max j F k j.