A cutting tool comprising a base material and a coating layer provided on the base material, the coating layer including a titanium carbonitride layer provided on the base material, an intermediate layer provided on the titanium carbonitride layer in contact therewith, and an alumina layer provided on the intermediate layer in contact therewith, the coating layer having a thickness of more than or equal to 7 μm and less than or equal to 30 μm, the titanium carbonitride layer having a thickness of more than or equal to 3 μm and less than or equal to 20 μm, the intermediate layer having a thickness of more than 1 μm and less than or equal to 3 μm, and the alumina layer having a thickness of more than or equal to 3 μm and less than or equal to 20 μm, the intermediate layer consisting of a compound made of titanium, carbon, oxygen, and nitrogen and optionally inevitable impurity, when P O1 atomic % represents an atomic ratio of the oxygen derived from the intermediate layer in an interface, P B, between the intermediate layer and the alumina layer, and P O2 atomic % represents an atomic ratio of the oxygen derived from the intermediate layer at a point A away from the interface, P B, by 1 μm on a side of the intermediate layer, a ratio P O1 /P O2 of the P O1 to the P O2 being more than or equal to 1.03, wherein: P O1 and P O2 refer to the atomic ratios based on the total of titanium, carbon, oxygen and nitrogen in the compound made of titanium, carbon, oxygen, and nitrogen and optionally inevitable impurity, the atomic ratios of elements are calculated by measuring the spectrum on a cross section by Auger electron spectroscopy along a line in the stacking direction of layers, the atomic ratios of oxygen are determined based on both oxygen derived from the intermediate layer and oxygen derived from the alumina layer, the two types of oxygen being distinguished by performing waveform separation processing of the spectrum using standard spectra, and the interface, P B, between the intermediate layer and the alumina layer is defined from the results obtained from the Auger electron spectroscopy analysis of this line as a point where the atomic ratio of aluminum is 10 atomic%, the Auger electron spectroscopy being carried out using the method described in the description. the coating layer including a titanium carbonitride layer provided on the base material, an intermediate layer provided on the titanium carbonitride layer in contact therewith, and an alumina layer provided on the intermediate layer in contact therewith, the coating layer having a thickness of more than or equal to 7 μm and less than or equal to 30 μm, the titanium carbonitride layer having a thickness of more than or equal to 3 μm and less than or equal to 20 μm, the intermediate layer having a thickness of more than 1 μm and less than or equal to 3 μm, and the alumina layer having a thickness of more than or equal to 3 μm and less than or equal to 20 μm, the intermediate layer consisting of a compound made of titanium, carbon, oxygen, and nitrogen and optionally inevitable impurity, when P O1 atomic % represents an atomic ratio of the oxygen derived from the intermediate layer in an interface, P B, between the intermediate layer and the alumina layer, and P O2 atomic % represents an atomic ratio of the oxygen derived from the intermediate layer at a point A away from the interface, P B, by 1 μm on a side of the intermediate layer, a ratio P O1 /P O2 of the P O1 to the P O2 being more than or equal to 1.03, P O1 and P O2 refer to the atomic ratios based on the total of titanium, carbon, oxygen and nitrogen in the compound made of titanium, carbon, oxygen, and nitrogen and optionally inevitable impurity, the atomic ratios of elements are calculated by measuring the spectrum on a cross section by Auger electron spectroscopy along a line in the stacking direction of layers, the atomic ratios of oxygen are determined based on both oxygen derived from the intermediate layer and oxygen derived from the alumina layer, the two types of oxygen being distinguished by performing waveform separation processing of the spectrum using standard spectra, and the interface, P B, between the intermediate layer and the alumina layer is defined from the results obtained from the Auger electron spectroscopy analysis of this line as a point where the atomic ratio of aluminum is 10 atomic%, the Auger electron spectroscopy being carried out using the method described in the description.