A power system comprising: a power transistor that is configurable in an ON condition or an OFF condition corresponding to a signal at a gate of the power transistor; a desaturation sense circuit coupled to a terminal of the power transistor and including a blanking capacitor configured to be charged to a voltage corresponding to a desaturation condition of the power transistor; a gate driver including: a driver circuit configured to generate the signal at the gate of the power transistor according to an input signal at an input terminal of the gate driver; and a desaturation fault detection circuit that is configured to receive the voltage of the blanking capacitor and to generate a fault signal when the voltage of the blanking capacitor exceeds a threshold; and a control module configured to perform a test of the power system and comprises: means for transmitting a test signal to a test terminal of the gate driver to configure the power transistor in the OFF condition and means for configuring the desaturation fault detection circuit to receive the voltage of the blanking capacitor, wherein the desaturation fault detection circuit comprises means for charging the blanking capacitor during the test, wherein the test is a first test, the test signal is a first test signal, and the fault signal is a first fault signal; wherein the control module is further configured to perform a second test of the power system after the first test is passed and further comprises: means for transmitting a second test signal to the input terminal of the gate driver to configure the power transistor in the ON condition and means for configuring the desaturation fault detection circuit to receive the voltage of the blanking capacitor, wherein the blanking capacitor is charged by the power transistor in the ON condition. a power transistor that is configurable in an ON condition or an OFF condition corresponding to a signal at a gate of the power transistor; a desaturation sense circuit coupled to a terminal of the power transistor and including a blanking capacitor configured to be charged to a voltage corresponding to a desaturation condition of the power transistor; a gate driver including: a driver circuit configured to generate the signal at the gate of the power transistor according to an input signal at an input terminal of the gate driver; and a desaturation fault detection circuit that is configured to receive the voltage of the blanking capacitor and to generate a fault signal when the voltage of the blanking capacitor exceeds a threshold; and a driver circuit configured to generate the signal at the gate of the power transistor according to an input signal at an input terminal of the gate driver; and a desaturation fault detection circuit that is configured to receive the voltage of the blanking capacitor and to generate a fault signal when the voltage of the blanking capacitor exceeds a threshold; and a control module configured to perform a test of the power system and comprises: means for transmitting a test signal to a test terminal of the gate driver to configure the power transistor in the OFF condition and means for configuring the desaturation fault detection circuit to receive the voltage of the blanking capacitor, means for transmitting a test signal to a test terminal of the gate driver to configure the power transistor in the OFF condition and means for configuring the desaturation fault detection circuit to receive the voltage of the blanking capacitor, wherein the desaturation fault detection circuit comprises means for charging the blanking capacitor during the test, wherein the test is a first test, the test signal is a first test signal, and the fault signal is a first fault signal; wherein the control module is further configured to perform a second test of the power system after the first test is passed and further comprises: means for transmitting a second test signal to the input terminal of the gate driver to configure the power transistor in the ON condition and means for configuring the desaturation fault detection circuit to receive the voltage of the blanking capacitor, wherein the blanking capacitor is charged by the power transistor in the ON condition. means for transmitting a second test signal to the input terminal of the gate driver to configure the power transistor in the ON condition and means for configuring the desaturation fault detection circuit to receive the voltage of the blanking capacitor, wherein the blanking capacitor is charged by the power transistor in the ON condition.