An apparatus for testing performance of a battery cell, comprising: a measuring unit electrically connected to the battery cell and configured to measure an open circuit voltage of the battery cell with a change in state of charge of the battery cell; a memory unit configured to store a plurality of profile data indicating a change in OCV of a positive electrode or a negative electrode of each of a plurality of reference cells, a plurality of upper limits corresponding to an amount of lithium ions stored in the positive electrode or the negative electrode of each of the plurality of reference cells at an upper limit of a predetermined SOC range, a plurality of lower limits corresponding to an amount of lithium ions stored in the positive electrode or the negative electrode of each of the plurality of reference cells at a lower limit of the predetermined SOC range, and a process deviation value occurred in a manufacturing process of the battery cell; and a control unit electrically connected to the measuring unit and the memory unit, wherein the control unit is configured to: generate a plurality of reference profile data indicating a change in OCV of the plurality of reference cells in the predetermined SOC range based on the plurality of profile data, the plurality of upper limits and the plurality of lower limits, generate measured profile data indicating a change in OCV of the battery cell in the predetermined SOC range, and determine at least one of a capacity of the battery cell, an estimated profile data indicating a change in OCV of the battery cell in the predetermined SOC range and a resistance of the battery cell based on the plurality of reference profile data, the measured profile data and the process deviation value. a measuring unit electrically connected to the battery cell and configured to measure an open circuit voltage of the battery cell with a change in state of charge of the battery cell; a memory unit configured to store a plurality of profile data indicating a change in OCV of a positive electrode or a negative electrode of each of a plurality of reference cells, a plurality of upper limits corresponding to an amount of lithium ions stored in the positive electrode or the negative electrode of each of the plurality of reference cells at an upper limit of a predetermined SOC range, a plurality of lower limits corresponding to an amount of lithium ions stored in the positive electrode or the negative electrode of each of the plurality of reference cells at a lower limit of the predetermined SOC range, and a process deviation value occurred in a manufacturing process of the battery cell; and a control unit electrically connected to the measuring unit and the memory unit, wherein the control unit is configured to: generate a plurality of reference profile data indicating a change in OCV of the plurality of reference cells in the predetermined SOC range based on the plurality of profile data, the plurality of upper limits and the plurality of lower limits, generate measured profile data indicating a change in OCV of the battery cell in the predetermined SOC range, and determine at least one of a capacity of the battery cell, an estimated profile data indicating a change in OCV of the battery cell in the predetermined SOC range and a resistance of the battery cell based on the plurality of reference profile data, the measured profile data and the process deviation value. generate a plurality of reference profile data indicating a change in OCV of the plurality of reference cells in the predetermined SOC range based on the plurality of profile data, the plurality of upper limits and the plurality of lower limits, generate measured profile data indicating a change in OCV of the battery cell in the predetermined SOC range, and determine at least one of a capacity of the battery cell, an estimated profile data indicating a change in OCV of the battery cell in the predetermined SOC range and a resistance of the battery cell based on the plurality of reference profile data, the measured profile data and the process deviation value.