A sparse optical system comprising: an optical element including a plurality of optical segments arranged in a sparse aperture configuration; an optical source module configured to generate a first beam of light having a first set of characteristics and a second beam of light having a second set of characteristics; a plurality of collimating modules, the collimating modules configured to direct the first beam of light and the second beam of light towards the plurality of optical segments; an optical demultiplexer coupled between the optical source module and each collimating module of the plurality of collimating modules, wherein the optical demultiplexer is configured to generate a plurality of respective beams of the first beam of light and a plurality of respective beams of the second beam of light, wherein each collimating module of the plurality of collimating modules is configured to direct a respective beam of the first beam of light and a respective beam of the second beam of light towards a unique pair of two adjacent segments; a detector configured to: receive a reflection of the respective beams of the first beam of light simultaneously from each unique pair of two adjacent optical segments; and receive a reflection of the respective beams of the second beam of light simultaneously from each unique pair of two adjacent optical segments; and a processor coupled to the detector and the optical source module, the processor being configured to: instruct the optical source module to generate the first beam of light; determine a first measurement of an alignment of each unique pair of two adjacent segments based on interference patterns of the reflection of the first beam; adjust a position of at least one segment of each unique pair of two adjacent segments based on the first measurement; instruct the optical source module to generate the second beam of light; and determine a second measurement of the alignment of each unique pair of two segments based on interference patterns of the reflection of the second beam; wherein the first measurement is a coarse measurement and the second measurement is a fine measurement. an optical element including a plurality of optical segments arranged in a sparse aperture configuration; an optical source module configured to generate a first beam of light having a first set of characteristics and a second beam of light having a second set of characteristics; a plurality of collimating modules, the collimating modules configured to direct the first beam of light and the second beam of light towards the plurality of optical segments; an optical demultiplexer coupled between the optical source module and each collimating module of the plurality of collimating modules, wherein the optical demultiplexer is configured to generate a plurality of respective beams of the first beam of light and a plurality of respective beams of the second beam of light, wherein each collimating module of the plurality of collimating modules is configured to direct a respective beam of the first beam of light and a respective beam of the second beam of light towards a unique pair of two adjacent segments; a detector configured to: receive a reflection of the respective beams of the first beam of light simultaneously from each unique pair of two adjacent optical segments; and receive a reflection of the respective beams of the second beam of light simultaneously from each unique pair of two adjacent optical segments; and receive a reflection of the respective beams of the first beam of light simultaneously from each unique pair of two adjacent optical segments; and receive a reflection of the respective beams of the second beam of light simultaneously from each unique pair of two adjacent optical segments; and a processor coupled to the detector and the optical source module, the processor being configured to: instruct the optical source module to generate the first beam of light; determine a first measurement of an alignment of each unique pair of two adjacent segments based on interference patterns of the reflection of the first beam; adjust a position of at least one segment of each unique pair of two adjacent segments based on the first measurement; instruct the optical source module to generate the second beam of light; and determine a second measurement of the alignment of each unique pair of two segments based on interference patterns of the reflection of the second beam; instruct the optical source module to generate the first beam of light; determine a first measurement of an alignment of each unique pair of two adjacent segments based on interference patterns of the reflection of the first beam; adjust a position of at least one segment of each unique pair of two adjacent segments based on the first measurement; instruct the optical source module to generate the second beam of light; and determine a second measurement of the alignment of each unique pair of two segments based on interference patterns of the reflection of the second beam; wherein the first measurement is a coarse measurement and the second measurement is a fine measurement.