A test specimen for X-ray inspection systems, a) comprising a preferably monolithic profile block formed from a first material (M A) and a preferably monolithic counter-block, the material (M B) of which differs in at least one property from the first material (M A), wherein the profile block and the counter-block extends in a longitudinal direction, a transverse direction extends at right angles thereto and a height direction extends perpendicularly to the two directions (X, Y), b) wherein the profile block has a number of areas with different thicknesses in the Z-direction (D A1, D A2,...) and wherein the counter-block has a number of areas with different thicknesses in the Z-direction (D B1, D B2,...), c) wherein the profile block and the counter-block can be arranged one above the other in a predeterminable test arrangement in the Z-direction in order to jointly form material pairs which can be radiated through in the Z-direction and are different from one another, d) in that the thicknesses of the profile block and of the counter-block are combined with one another in an X-Y matrix, in that in the X direction at least two, preferably all, different thicknesses of the profile block are combined with a thickness of the counter-block, while in the Y direction at least two, preferably all, different thicknesses of the counter-block are combined with a thickness of the profile block characterized in that e) the test arrangement forms segments of the same total thickness arranged along diagonals, each with different individual thicknesses (D A, D B), f) wherein along each diagonal all segments of a diagonal have a respective constant total thickness. a) comprising a preferably monolithic profile block formed from a first material (M A) and a preferably monolithic counter-block, the material (M B) of which differs in at least one property from the first material (M A), wherein the profile block and the counter-block extends in a longitudinal direction, a transverse direction extends at right angles thereto and a height direction extends perpendicularly to the two directions (X, Y), b) wherein the profile block has a number of areas with different thicknesses in the Z-direction (D A1, D A2,...) and wherein the counter-block has a number of areas with different thicknesses in the Z-direction (D B1, D B2,...), c) wherein the profile block and the counter-block can be arranged one above the other in a predeterminable test arrangement in the Z-direction in order to jointly form material pairs which can be radiated through in the Z-direction and are different from one another, d) in that the thicknesses of the profile block and of the counter-block are combined with one another in an X-Y matrix, in that in the X direction at least two, preferably all, different thicknesses of the profile block are combined with a thickness of the counter-block, while in the Y direction at least two, preferably all, different thicknesses of the counter-block are combined with a thickness of the profile block characterized in that e) the test arrangement forms segments of the same total thickness arranged along diagonals, each with different individual thicknesses (D A, D B), f) wherein along each diagonal all segments of a diagonal have a respective constant total thickness.