A cutting tool comprising: a substrate including a rake face; and a coating film that coats the rake face, wherein the coating film includes an α-Al 2 O 3 layer disposed on the substrate, the α-Al 2 O 3 layer includes crystal grains of α-Al 2 O 3, an area ratio of crystal grains oriented in among the crystal grains is more than or equal to 50% and less than or equal to 90% in the α-Al 2 O 3 layer at the rake face, wherein the area ratio is measured by the method described in the description, and in a residual stress measurement performed in accordance with a 2θ-sin 2 ψ method using X rays, as described in the description, a film residual stress A A determined based on a crystal plane interval of a plane of the α-Al 2 O 3 layer with a scanning angle range from 89.9° to 91.4° at the rake face is more than or equal to - 1000 MPa and less than 0 MPa, and a film residual stress B A determined based on a crystal plane interval of a plane of the α-Al 2 O 3 layer with a scanning angle range from 37.0° to 38.4° at the rake face is more than or equal to - 1000 MPa and less than 0 MPa, and a relational expression of |A A |≤|B A | is satisfied, and wherein the α-Al 2 O 3 layer has a thickness of more than or equal to 1 μm and less than or equal to 20 μm, and in a residual stress measurement performed in accordance with a constant penetration depth method using X rays at a region r1 interposed between a virtual plane D1 and a virtual plane D2, the virtual plane D1 being located at a distance d 10 from a surface of the α-Al 2 O 3 layer opposite to the substrate toward the substrate side, the distance d 10 being 10% of the thickness of the α-Al 2 O 3 layer, the virtual plane D2 being located at a distance d 40 from the surface of the α-Al 2 O 3 layer opposite to the substrate toward the substrate side, the distance d 40 being 40% of the thickness of the α-Al 2 O 3 layer, as described in the description, a residual stress A determined based on the crystal plane interval of the plane of the α-Al 2 O 3 layer at the rake face is more than or equal to - 800 MPa and less than or equal to 600 MPa, and a residual stress B determined based on the crystal plane interval of the plane of the α-Al 2 O 3 layer at the rake face is more than or equal to - 1300 MPa and less than or equal to 400 MPa, and a relational expression of A>B is satisfied. a substrate including a rake face; and a coating film that coats the rake face, wherein the coating film includes an α-Al 2 O 3 layer disposed on the substrate, the α-Al 2 O 3 layer includes crystal grains of α-Al 2 O 3, an area ratio of crystal grains oriented in among the crystal grains is more than or equal to 50% and less than or equal to 90% in the α-Al 2 O 3 layer at the rake face, wherein the area ratio is measured by the method described in the description, and in a residual stress measurement performed in accordance with a 2θ-sin 2 ψ method using X rays, as described in the description, a film residual stress A A determined based on a crystal plane interval of a plane of the α-Al 2 O 3 layer with a scanning angle range from 89.9° to 91.4° at the rake face is more than or equal to - 1000 MPa and less than 0 MPa, and a film residual stress B A determined based on a crystal plane interval of a plane of the α-Al 2 O 3 layer with a scanning angle range from 37.0° to 38.4° at the rake face is more than or equal to - 1000 MPa and less than 0 MPa, and a relational expression of |A A |≤|B A | is satisfied, and wherein a film residual stress A A determined based on a crystal plane interval of a plane of the α-Al 2 O 3 layer with a scanning angle range from 89.9° to 91.4° at the rake face is more than or equal to - 1000 MPa and less than 0 MPa, and a film residual stress B A determined based on a crystal plane interval of a plane of the α-Al 2 O 3 layer with a scanning angle range from 37.0° to 38.4° at the rake face is more than or equal to - 1000 MPa and less than 0 MPa, and a relational expression of |A A |≤|B A | is satisfied, and wherein the α-Al 2 O 3 layer has a thickness of more than or equal to 1 μm and less than or equal to 20 μm, and in a residual stress measurement performed in accordance with a constant penetration depth method using X rays at a region r1 interposed between a virtual plane D1 and a virtual plane D2, the virtual plane D1 being located at a distance d 10 from a surface of the α-Al 2 O 3 layer opposite to the substrate toward the substrate side, the distance d 10 being 10% of the thickness of the α-Al 2 O 3 layer, the virtual plane D2 being located at a distance d 40 from the surface of the α-Al 2 O 3 layer opposite to the substrate toward the substrate side, the distance d 40 being 40% of the thickness of the α-Al 2 O 3 layer, as described in the description, a residual stress A determined based on the crystal plane interval of the plane of the α-Al 2 O 3 layer at the rake face is more than or equal to - 800 MPa and less than or equal to 600 MPa, and a residual stress B determined based on the crystal plane interval of the plane of the α-Al 2 O 3 layer at the rake face is more than or equal to - 1300 MPa and less than or equal to 400 MPa, and a relational expression of A>B is satisfied. a residual stress A determined based on the crystal plane interval of the plane of the α-Al 2 O 3 layer at the rake face is more than or equal to - 800 MPa and less than or equal to 600 MPa, and a residual stress B determined based on the crystal plane interval of the plane of the α-Al 2 O 3 layer at the rake face is more than or equal to - 1300 MPa and less than or equal to 400 MPa, and a relational expression of A>B is satisfied.