A method for detecting topographical and spatially resolved, spectral properties of a surface to be examined, comprising: - generating an illumination pattern of a first measuring light with a plurality of wavelengths; - imaging the illumination pattern of the first measuring light onto the surface to be examined by means of a chromatic objective such that the illumination pattern for different wavelengths of the plurality of wavelengths of the first measuring light is imaged sharply at different distances from the chromatic objective; - imaging the first measuring light emitted from the surface to be examined by means of the chromatic objective onto a confocal mask having a transmission pattern corresponding to the illumination pattern; - spectrally splitting the first measuring light transmitted through the confocal mask; - spatially resolved detection of a 2-dimensional intensity distribution of the spectrally split first measuring light by means of a detector; - determining the topographical properties of the surface to be examined on the basis of the intensity distribution of the first measuring light detected by means of the detector, characterized by: - homogeneously illuminating the surface to be examined by means of a second measuring light with a plurality of wavelengths; - imaging the second measuring light emitted from the surface to be examined by means of the chromatic objective onto the confocal mask; - spectrally splitting the second measuring light transmitted through the confocal mask; - spatially resolved detection of a 2-dimensional intensity distribution of the spectrally split second measuring light by means of the detector; and - determining the spatially resolved, spectral properties of the surface to be examined on the basis of the intensity distribution of the second measuring light detected by means of the detector. - generating an illumination pattern of a first measuring light with a plurality of wavelengths; - imaging the illumination pattern of the first measuring light onto the surface to be examined by means of a chromatic objective such that the illumination pattern for different wavelengths of the plurality of wavelengths of the first measuring light is imaged sharply at different distances from the chromatic objective; - imaging the first measuring light emitted from the surface to be examined by means of the chromatic objective onto a confocal mask having a transmission pattern corresponding to the illumination pattern; - spectrally splitting the first measuring light transmitted through the confocal mask; - spatially resolved detection of a 2-dimensional intensity distribution of the spectrally split first measuring light by means of a detector; - determining the topographical properties of the surface to be examined on the basis of the intensity distribution of the first measuring light detected by means of the detector, characterized by: - homogeneously illuminating the surface to be examined by means of a second measuring light with a plurality of wavelengths; - imaging the second measuring light emitted from the surface to be examined by means of the chromatic objective onto the confocal mask; - spectrally splitting the second measuring light transmitted through the confocal mask; - spatially resolved detection of a 2-dimensional intensity distribution of the spectrally split second measuring light by means of the detector; and - determining the spatially resolved, spectral properties of the surface to be examined on the basis of the intensity distribution of the second measuring light detected by means of the detector. - homogeneously illuminating the surface to be examined by means of a second measuring light with a plurality of wavelengths; - imaging the second measuring light emitted from the surface to be examined by means of the chromatic objective onto the confocal mask; - spectrally splitting the second measuring light transmitted through the confocal mask; - spatially resolved detection of a 2-dimensional intensity distribution of the spectrally split second measuring light by means of the detector; and - determining the spatially resolved, spectral properties of the surface to be examined on the basis of the intensity distribution of the second measuring light detected by means of the detector.