A method for automatically examining an instrument probe coupled with a mechanical testing instrument configured to performing mechanical testing at micron scale or less, the method comprising: determining if an instrument probe use threshold is achieved, the instrument probe is coupled with a transducer, and the transducer is configured to move the instrument probe, measure an instrument probe indentation depth and measure force applied to the instrument probe through the transducer, and determining if the instrument probe use threshold is achieved includes: counting a number of transducer operations, and determining if the number of transducer operations is greater than a transducer operation count threshold, and measuring one or more of the instrument probe indentation depth, force applied to the instrument probe through the transducer or a sample mechanical parameter, and determining the instrument probe use threshold is met if one or more of the instrument probe indentation depth, force applied to the instrument or the sample mechanical parameter is outside of one or more of a specified indentation depth threshold range, a specified force threshold range or a specified sample mechanical parameter threshold range of the sample; and conducting a probe check operation once the instrument probe use threshold is achieved, the probe check operation includes: aligning the instrument probe with a diagnostic sample, indenting the instrument probe into the diagnostic sample, measuring one or more of the indentation depth, indentation force or a sample mechanical parameter with the transducer, and determining the instrument probe requires one of calibration or replacement if one or more of the measured indentation depth, the measured indentation force or the sample mechanical parameter are outside of an indentation threshold range, an indentation force threshold range or a sample mechanical parameter threshold range of the diagnostic sample, respectively. determining if an instrument probe use threshold is achieved, the instrument probe is coupled with a transducer, and the transducer is configured to move the instrument probe, measure an instrument probe indentation depth and measure force applied to the instrument probe through the transducer, and determining if the instrument probe use threshold is achieved includes: counting a number of transducer operations, and determining if the number of transducer operations is greater than a transducer operation count threshold, and measuring one or more of the instrument probe indentation depth, force applied to the instrument probe through the transducer or a sample mechanical parameter, and determining the instrument probe use threshold is met if one or more of the instrument probe indentation depth, force applied to the instrument or the sample mechanical parameter is outside of one or more of a specified indentation depth threshold range, a specified force threshold range or a specified sample mechanical parameter threshold range of the sample; and counting a number of transducer operations, and determining if the number of transducer operations is greater than a transducer operation count threshold, and measuring one or more of the instrument probe indentation depth, force applied to the instrument probe through the transducer or a sample mechanical parameter, and determining the instrument probe use threshold is met if one or more of the instrument probe indentation depth, force applied to the instrument or the sample mechanical parameter is outside of one or more of a specified indentation depth threshold range, a specified force threshold range or a specified sample mechanical parameter threshold range of the sample; and conducting a probe check operation once the instrument probe use threshold is achieved, the probe check operation includes: aligning the instrument probe with a diagnostic sample, indenting the instrument probe into the diagnostic sample, measuring one or more of the indentation depth, indentation force or a sample mechanical parameter with the transducer, and determining the instrument probe requires one of calibration or replacement if one or more of the measured indentation depth, the measured indentation force or the sample mechanical parameter are outside of an indentation threshold range, an indentation force threshold range or a sample mechanical parameter threshold range of the diagnostic sample, respectively. aligning the instrument probe with a diagnostic sample, indenting the instrument probe into the diagnostic sample, measuring one or more of the indentation depth, indentation force or a sample mechanical parameter with the transducer, and determining the instrument probe requires one of calibration or replacement if one or more of the measured indentation depth, the measured indentation force or the sample mechanical parameter are outside of an indentation threshold range, an indentation force threshold range or a sample mechanical parameter threshold range of the diagnostic sample, respectively.