A system comprising: a signal conditioning circuit comprising: a first signal path comprising a first multiplexer (402-1, 402-2, 402-3, 402-4) and a first filter (404-1, 404-2, 404-3, 404-4), wherein the first multiplexer is connected to the first filter, and wherein the first signal path is configured to receive a first secondary signal from a first sensor and a built in test, BIT, signal; a second signal path comprising a second multiplexer (406-1, 406-2) and a second filter, wherein the second multiplexer is connected to the second filter, and wherein the second signal path is configured to receive a second secondary signal from the first sensor and the BIT signal; a third multiplexer; wherein the first signal path and the second signal path are connected to the third multiplexer; and a first analog to digital converter (408-1, 408-2), ADC, connected to an output of the third multiplexer; and a controller connected to an output of the first ADC, wherein the controller is configured to: determine a position measurement for the first sensor based on the first secondary signal, the second secondary signal, and the BIT signal; wherein determining the position measurement for the first sensor based on the first secondary signal, the second secondary signal, and the built in test signal comprises calculating the position, whereby: Position = E1/BIT 1 _ E1 − E2/BIT 1_E2 / E1/BIT 1_E1 + E2/BIT 1_E2, wherein E1 comprises the first secondary signal, wherein E2 comprises the second secondary signal, wherein BIT1_E1 comprises the built in test signal traversing the first signal path, and wherein BIT1_E2 comprises the built in test signal traversing the second signal path. a signal conditioning circuit comprising: a first signal path comprising a first multiplexer (402-1, 402-2, 402-3, 402-4) and a first filter (404-1, 404-2, 404-3, 404-4), wherein the first multiplexer is connected to the first filter, and wherein the first signal path is configured to receive a first secondary signal from a first sensor and a built in test, BIT, signal; a second signal path comprising a second multiplexer (406-1, 406-2) and a second filter, wherein the second multiplexer is connected to the second filter, and wherein the second signal path is configured to receive a second secondary signal from the first sensor and the BIT signal; a third multiplexer; wherein the first signal path and the second signal path are connected to the third multiplexer; and a first analog to digital converter (408-1, 408-2), ADC, connected to an output of the third multiplexer; and a controller connected to an output of the first ADC, wherein the controller is configured to: determine a position measurement for the first sensor based on the first secondary signal, the second secondary signal, and the BIT signal; a first signal path comprising a first multiplexer (402-1, 402-2, 402-3, 402-4) and a first filter (404-1, 404-2, 404-3, 404-4), wherein the first multiplexer is connected to the first filter, and wherein the first signal path is configured to receive a first secondary signal from a first sensor and a built in test, BIT, signal; a second signal path comprising a second multiplexer (406-1, 406-2) and a second filter, wherein the second multiplexer is connected to the second filter, and wherein the second signal path is configured to receive a second secondary signal from the first sensor and the BIT signal; a third multiplexer; wherein the first signal path and the second signal path are connected to the third multiplexer; and a first analog to digital converter (408-1, 408-2), ADC, connected to an output of the third multiplexer; and a controller connected to an output of the first ADC, wherein the controller is configured to: determine a position measurement for the first sensor based on the first secondary signal, the second secondary signal, and the BIT signal; wherein determining the position measurement for the first sensor based on the first secondary signal, the second secondary signal, and the built in test signal comprises calculating the position, whereby: Position = E1/BIT 1 _ E1 − E2/BIT 1_E2 / E1/BIT 1_E1 + E2/BIT 1_E2, wherein E1 comprises the first secondary signal, wherein E2 comprises the second secondary signal, wherein BIT1_E1 comprises the built in test signal traversing the first signal path, and wherein BIT1_E2 comprises the built in test signal traversing the second signal path.