A method for increasing the measurement accuracy in a particle measurement device characterized in that it comprises: - measuring light emitted by a first fluorescent particle (110, 202, 206, 302, 602, 702) and light emitted by a second fluorescent particle (110, 204, 208, 304, 704), where the measured light from the second fluorescent particle (110, 204, 208, 304, 704) at least partially overlaps the measured light from the first fluorescent particle (110, 202, 206, 302, 602, 702) in an overlap region; - determining a contribution of light from the first fluorescent particle (110, 202, 206, 302, 602, 702) in the overlap region, wherein determining the contribution of light from the first fluorescent particle (110, 202, 206, 302, 602, 702) includes calculating the expected distribution of the light based on known parameters and measured parameters; - determining a contribution of light from the second fluorescent particle (110, 204, 208, 304, 704) in the overlap region, wherein determining the contribution of light from the second fluorescent particle (110, 204, 208, 304, 704) includes calculating the expected distribution of the light based on the known parameters and measured parameters - subtracting the contribution of light from the second fluorescent particle (110, 204, 208, 304, 704) from the contribution of light from the first fluorescent particle (110, 202, 206, 302, 602, 702); and - determining the intensity of light emitted by the first fluorescent particle (110, 202, 206, 302, 602, 702) wherein the peak of the first or second fluorescent particle and the slope of the respective particle are used to approximate the expected distribution of the respective particle or wherein the expected distribution of light of the first or second fluorescent particle is calculated based on the peak intensity of the respective particle and the known size of the respective particle. - measuring light emitted by a first fluorescent particle (110, 202, 206, 302, 602, 702) and light emitted by a second fluorescent particle (110, 204, 208, 304, 704), where the measured light from the second fluorescent particle (110, 204, 208, 304, 704) at least partially overlaps the measured light from the first fluorescent particle (110, 202, 206, 302, 602, 702) in an overlap region; - determining a contribution of light from the first fluorescent particle (110, 202, 206, 302, 602, 702) in the overlap region, wherein determining the contribution of light from the first fluorescent particle (110, 202, 206, 302, 602, 702) includes calculating the expected distribution of the light based on known parameters and measured parameters; - determining a contribution of light from the second fluorescent particle (110, 204, 208, 304, 704) in the overlap region, wherein determining the contribution of light from the second fluorescent particle (110, 204, 208, 304, 704) includes calculating the expected distribution of the light based on the known parameters and measured parameters - subtracting the contribution of light from the second fluorescent particle (110, 204, 208, 304, 704) from the contribution of light from the first fluorescent particle (110, 202, 206, 302, 602, 702); and - determining the intensity of light emitted by the first fluorescent particle (110, 202, 206, 302, 602, 702)