A device for remote polarimetric characterization (100, 200) of a sample comprising: - a source of emission of at least one incident light wave at at least one first wavelength ( λ E); - a single-mode optical fiber in which the incident light wave is intended to be propagated; - a polarization state generator arranged on the proximal side of the optical fiber and making it possible to generate a given number of polarization states of the incident light wave, called probe states; - a reflector (40, 44) intended to be arranged on the distal side of the optical fiber; - a polarization state analyzer arranged on the proximal side of the optical fiber and allowing, for each probe state of the incident wave, the analysis of the polarization of the light wave obtained after propagation of the incident wave in the optical fiber, reflection on the distal side of the optical fiber and back propagation in the optical fiber; - processing means making it possible to determine: ∘ a Mueller matrix ( M F ( λ E)) associated with the optical fiber at the first wavelength from a first polarimetric characterization of the optical fiber, obtained by analysis for each probe state, of the polarization of at least one wave reflected on the distal side of the optical fiber by means of the reflector and propagated in the back direction in the optical fiber; ∘ a Mueller matrix ( M T) associated with said assembly at the first wavelength from a second polarimetric characterization of the assembly comprising the optical fiber and the sample, obtained by analysis for each probe state of the polarization, of a wave returned from the distal side of the fiber by the sample and propagated in the back direction in the optical fiber; ∘ the Mueller matrix ( M O) associated with the sample at the first wavelength from Mueller matrices associated respectively with the optical fiber and with the assembly comprising the optical fiber and the sample. - a source of emission of at least one incident light wave at at least one first wavelength ( λ E); - a single-mode optical fiber in which the incident light wave is intended to be propagated; - a polarization state generator arranged on the proximal side of the optical fiber and making it possible to generate a given number of polarization states of the incident light wave, called probe states; - a reflector (40, 44) intended to be arranged on the distal side of the optical fiber; - a polarization state analyzer arranged on the proximal side of the optical fiber and allowing, for each probe state of the incident wave, the analysis of the polarization of the light wave obtained after propagation of the incident wave in the optical fiber, reflection on the distal side of the optical fiber and back propagation in the optical fiber; - processing means making it possible to determine: ∘ a Mueller matrix ( M F ( λ E)) associated with the optical fiber at the first wavelength from a first polarimetric characterization of the optical fiber, obtained by analysis for each probe state, of the polarization of at least one wave reflected on the distal side of the optical fiber by means of the reflector and propagated in the back direction in the optical fiber; ∘ a Mueller matrix ( M T) associated with said assembly at the first wavelength from a second polarimetric characterization of the assembly comprising the optical fiber and the sample, obtained by analysis for each probe state of the polarization, of a wave returned from the distal side of the fiber by the sample and propagated in the back direction in the optical fiber; ∘ the Mueller matrix ( M O) associated with the sample at the first wavelength from Mueller matrices associated respectively with the optical fiber and with the assembly comprising the optical fiber and the sample. ∘ a Mueller matrix ( M F ( λ E)) associated with the optical fiber at the first wavelength from a first polarimetric characterization of the optical fiber, obtained by analysis for each probe state, of the polarization of at least one wave reflected on the distal side of the optical fiber by means of the reflector and propagated in the back direction in the optical fiber; ∘ a Mueller matrix ( M T) associated with said assembly at the first wavelength from a second polarimetric characterization of the assembly comprising the optical fiber and the sample, obtained by analysis for each probe state of the polarization, of a wave returned from the distal side of the fiber by the sample and propagated in the back direction in the optical fiber; ∘ the Mueller matrix ( M O) associated with the sample at the first wavelength from Mueller matrices associated respectively with the optical fiber and with the assembly comprising the optical fiber and the sample.