A cutting tool comprising a substrate and a coating layer provided on the substrate, the coating layer including a multilayer structure layer composed of a first unit layer and a second unit layer, and a lone layer, the first unit layer and the second unit layer being alternately stacked, the multilayer structure layer and the lone layer being stacked such that more than one multilayer structure layer and more than one lone layer are alternately stacked, the first unit layer including cubic Al x Ti 1-x N crystal grains, the second unit layer including cubic Al y Ti 1-y N crystal grains, the lone layer including cubic Ti z Al 1-z N crystal grains, an atomic ratio x of Al in the Al x Ti 1-x N being 0.8 or more and 0.95 or less, an atomic ratio y of Al in the Al y Ti 1-y N being 0.7 or more and less than 0.8, an atomic ratio z of Ti in the Ti z Al 1-z N being 0.55 or more and 0.7 or less, the first unit layer having a thickness with an average value of 2.5 nm or more and 5 nm or less, the second unit layer having a thickness with an average value of 2.5 nm or more and 5 nm or less, the multilayer structure layer having a thickness with an average value of 40 nm or more and 95 nm or less, the lone layer having a thickness with an average value of 2.5 nm or more and 10 nm or less, one multilayer structure layer and one lone layer forming a repetitive unit having a thickness with an average value of 50 nm or more and 100 nm or less, a maximum value of 90 nm or more and 110 nm or less, and a minimum value of 40 nm or more and 60 nm or less; wherein: the thickness of each layer is measured with a scanning transmission electron microscope as described in the description; the crystal form of the Al x Ti 1-x N crystal grains of the first unit layer, the crystal form of the Al y Ti 1-y N crystal grains of the second unit layer and the crystal form of the Ti z Al 1-z N crystal grains of the lone layer are each identified using X-ray diffraction as described in the description; and the atomic ratio x of Al in the Al x Ti 1-x N, the atomic ratio y of Al in the Al y Ti 1-y N and the atomic ratio z of Ti in the Ti z Al 1-z N are each determined using an energy dispersive X-ray spectrometer accompanying a transmission electron microscope as described in the description. the coating layer including a multilayer structure layer composed of a first unit layer and a second unit layer, and a lone layer, the first unit layer and the second unit layer being alternately stacked, the multilayer structure layer and the lone layer being stacked such that more than one multilayer structure layer and more than one lone layer are alternately stacked, the first unit layer including cubic Al x Ti 1-x N crystal grains, the second unit layer including cubic Al y Ti 1-y N crystal grains, the lone layer including cubic Ti z Al 1-z N crystal grains, an atomic ratio x of Al in the Al x Ti 1-x N being 0.8 or more and 0.95 or less, an atomic ratio y of Al in the Al y Ti 1-y N being 0.7 or more and less than 0.8, an atomic ratio z of Ti in the Ti z Al 1-z N being 0.55 or more and 0.7 or less, the first unit layer having a thickness with an average value of 2.5 nm or more and 5 nm or less, the second unit layer having a thickness with an average value of 2.5 nm or more and 5 nm or less, the multilayer structure layer having a thickness with an average value of 40 nm or more and 95 nm or less, the lone layer having a thickness with an average value of 2.5 nm or more and 10 nm or less, one multilayer structure layer and one lone layer forming a repetitive unit having a thickness with an average value of 50 nm or more and 100 nm or less, a maximum value of 90 nm or more and 110 nm or less, and a minimum value of 40 nm or more and 60 nm or less; wherein: the thickness of each layer is measured with a scanning transmission electron microscope as described in the description; the crystal form of the Al x Ti 1-x N crystal grains of the first unit layer, the crystal form of the Al y Ti 1-y N crystal grains of the second unit layer and the crystal form of the Ti z Al 1-z N crystal grains of the lone layer are each identified using X-ray diffraction as described in the description; and the atomic ratio x of Al in the Al x Ti 1-x N, the atomic ratio y of Al in the Al y Ti 1-y N and the atomic ratio z of Ti in the Ti z Al 1-z N are each determined using an energy dispersive X-ray spectrometer accompanying a transmission electron microscope as described in the description. the thickness of each layer is measured with a scanning transmission electron microscope as described in the description; the crystal form of the Al x Ti 1-x N crystal grains of the first unit layer, the crystal form of the Al y Ti 1-y N crystal grains of the second unit layer and the crystal form of the Ti z Al 1-z N crystal grains of the lone layer are each identified using X-ray diffraction as described in the description; and the atomic ratio x of Al in the Al x Ti 1-x N, the atomic ratio y of Al in the Al y Ti 1-y N and the atomic ratio z of Ti in the Ti z Al 1-z N are each determined using an energy dispersive X-ray spectrometer accompanying a transmission electron microscope as described in the description.