A depth sensing system, characterized in that it comprises: a spatially modulated light projection device to project light toward a surface, wherein the light is reflected from the surface toward a sensor; the sensor having a first sensor pixel (810A1) and a plurality of second sensor pixels (810B1-4) including a second sensor pixel (810B1) to receive the light reflected from the surface; a filter to allow transmission of a first known numerical proportion of light intensity across all wavelengths of a total visible light and a second known numerical proportion of light intensity across all wavelengths of a total infrared light to the first sensor pixel (810A1) and a third known numerical proportion of light intensity across all wavelengths of the total visible light and a fourth known numerical proportion of light intensity across all wavelengths of the total infrared light to the second sensor pixel (810B1), wherein the first known numerical proportion (pV_A), the second known numerical proportion (pl_A), the third known numerical proportion (pV_B) and the fourth known numerical proportion (pl_B) are different from one another, wherein the first sensor pixel (810A1) is adjacent to each of the plurality of second sensor pixels (810B1-4), wherein the first known numerical proportion (pV_A) of the total visible light and the second known numerical proportion (pl_A) of the total infrared light result in a first sensed value (SV_A) at the first sensor pixel (810A1), wherein the third known numerical proportion (pV_B) of the total visible light and the fourth known numerical proportion (pl_B) of the total infrared light result in a second sensed value (SV_B) at the second sensor pixel (810B1); and a processor (406, 604) to analyze the first and second sensed values (SV_A, SV_B) to determine a depth of the surface by: calculating an infrared intensity for the first sensor pixel (810A1) using the first and second sensed values (SV_A, SV_B) and the assumption that the same amount of visible light and infrared light is received by the first sensor pixel (810A1) as by some of the ality of second sensor pixels (810B1-4), and triangulating the first sensor pixel (810A1), the spatially modulated light projection device, and the surface using the infrared intensity to determine the depth of the surface, wherein the filter is disposed between the sensor and the surface. a spatially modulated light projection device to project light toward a surface, wherein the light is reflected from the surface toward a sensor; the sensor having a first sensor pixel (810A1) and a plurality of second sensor pixels (810B1-4) including a second sensor pixel (810B1) to receive the light reflected from the surface; a filter to allow transmission of a first known numerical proportion of light intensity across all wavelengths of a total visible light and a second known numerical proportion of light intensity across all wavelengths of a total infrared light to the first sensor pixel (810A1) and a third known numerical proportion of light intensity across all wavelengths of the total visible light and a fourth known numerical proportion of light intensity across all wavelengths of the total infrared light to the second sensor pixel (810B1), wherein the first known numerical proportion (pV_A), the second known numerical proportion (pl_A), the third known numerical proportion (pV_B) and the fourth known numerical proportion (pl_B) are different from one another, wherein the first sensor pixel (810A1) is adjacent to each of the plurality of second sensor pixels (810B1-4), wherein the first known numerical proportion (pV_A) of the total visible light and the second known numerical proportion (pl_A) of the total infrared light result in a first sensed value (SV_A) at the first sensor pixel (810A1), wherein the third known numerical proportion (pV_B) of the total visible light and the fourth known numerical proportion (pl_B) of the total infrared light result in a second sensed value (SV_B) at the second sensor pixel (810B1); and a processor (406, 604) to analyze the first and second sensed values (SV_A, SV_B) to determine a depth of the surface by: calculating an infrared intensity for the first sensor pixel (810A1) using the first and second sensed values (SV_A, SV_B) and the assumption that the same amount of visible light and infrared light is received by the first sensor pixel (810A1) as by some of the ality of second sensor pixels (810B1-4), and triangulating the first sensor pixel (810A1), the spatially modulated light projection device, and the surface using the infrared intensity to determine the depth of the surface, calculating an infrared intensity for the first sensor pixel (810A1) using the first and second sensed values (SV_A, SV_B) and the assumption that the same amount of visible light and infrared light is received by the first sensor pixel (810A1) as by some of the ality of second sensor pixels (810B1-4), and triangulating the first sensor pixel (810A1), the spatially modulated light projection device, and the surface using the infrared intensity to determine the depth of the surface, wherein the filter is disposed between the sensor and the surface.