An analyzer and an analysis kit, the analysis kit including a chip provided with a capillary through which a sample flows, and a cartridge superimposed on the chip in a vertical direction and provided with a liquid reservoir, the analyzer comprising: a guide-in section configured to receive the analysis kit containing the sample; a placement section configured to support the analysis kit in the guide-in section in the vertical direction; a pusher configured to push the analysis kit supported on the placement section from one side face of the analysis kit, the one side face being disposed on one horizontal direction side of the analysis kit as defined with respect to the vertical direction; a contact (140A, 140B) that opposes an other side face of the analysis kit on an opposite side in the horizontal direction to the one side face of the analysis kit supported on the placement section, and is configured to contact the other side face of the analysis kit being pushed by the pusher so as to position the analysis kit in the horizontal direction; and a measurer configured to measure a component present in the sample in the analysis kit received by the guide-in section, wherein the contact (140A, 140B) includes a first protrusion and a second protrusion, wherein the chip comprises a first notch and a second notch, both formed on the other side face of the analysis kit, wherein the first notch includes two oblique faces (72A, 72B) that are oblique with respect to a direction in which the analysis kit is received by the guide-in section, and the second notch has a substantially trapezoidal profile or rectangular profile in plan view, wherein the first protrusion is configured to fit into the first notch and the second protrusion is configured to fit into the second notch, wherein the first protrusion is configured to contact either of the oblique faces (72A, 72B) when the pusher pushes the analysis kit, and to contact both oblique faces when the analysis kit is positioned in the horizontal direction in which the analysis kit is pushed by the pusher and the direction in which the analysis kit is received by the guide-in section, wherein the second protrusion is configured to contact the back face of the second notch, and wherein the first and second protrusions (140A, 140B) are pins on the guide-in section, the pins configured to project from the placement section on which the analysis kit is supported. a guide-in section configured to receive the analysis kit containing the sample; a placement section configured to support the analysis kit in the guide-in section in the vertical direction; a pusher configured to push the analysis kit supported on the placement section from one side face of the analysis kit, the one side face being disposed on one horizontal direction side of the analysis kit as defined with respect to the vertical direction; a contact (140A, 140B) that opposes an other side face of the analysis kit on an opposite side in the horizontal direction to the one side face of the analysis kit supported on the placement section, and is configured to contact the other side face of the analysis kit being pushed by the pusher so as to position the analysis kit in the horizontal direction; and a measurer configured to measure a component present in the sample in the analysis kit received by the guide-in section, wherein the contact (140A, 140B) includes a first protrusion and a second protrusion, wherein the chip comprises a first notch and a second notch, both formed on the other side face of the analysis kit, wherein the first notch includes two oblique faces (72A, 72B) that are oblique with respect to a direction in which the analysis kit is received by the guide-in section, and the second notch has a substantially trapezoidal profile or rectangular profile in plan view, wherein the first protrusion is configured to fit into the first notch and the second protrusion is configured to fit into the second notch, wherein the first protrusion is configured to contact either of the oblique faces (72A, 72B) when the pusher pushes the analysis kit, and to contact both oblique faces when the analysis kit is positioned in the horizontal direction in which the analysis kit is pushed by the pusher and the direction in which the analysis kit is received by the guide-in section, wherein the second protrusion is configured to contact the back face of the second notch, and wherein the first and second protrusions (140A, 140B) are pins on the guide-in section, the pins configured to project from the placement section on which the analysis kit is supported.