A measurement system (100, 400) for temporal signal measurement of a device under test, the measurement system (100, 400) comprising: a reference clock synthesizer configured to generate a master reference clock signal; an optical transmitter unit connected to the reference clock synthesizer and configured to connect to a first end of the device under test; a measurement control system connected to the optical transmitter unit, the measurement control system configured to control the optical transmitter unit to generate a test signal pattern based on a first reference clock signal derived from the master reference clock signal, and to generate an optical signal for passing through the device under test based on the test signal pattern; and an optical receiver unit connected to the reference clock synthesizer and configured to connect to a second end of the device under test, the optical receiver unit configured to detect the optical signal that passes through the device under test and further configured to generate a digital signal based on the optical signal detected and a second reference clock signal derived from the master reference clock signal; wherein the measurement control system is connected to the optical receiver unit; wherein the measurement control system is further configured to provide an output signal comprising measurement results based on the digital signal; wherein the optical receiver unit comprises an optical detector module configured to detect the optical signal that passes through the device under test and configured to generate a response signal, which is an electrical signal, based on the optical signal received. a reference clock synthesizer configured to generate a master reference clock signal; an optical transmitter unit connected to the reference clock synthesizer and configured to connect to a first end of the device under test; a measurement control system connected to the optical transmitter unit, the measurement control system configured to control the optical transmitter unit to generate a test signal pattern based on a first reference clock signal derived from the master reference clock signal, and to generate an optical signal for passing through the device under test based on the test signal pattern; and an optical receiver unit connected to the reference clock synthesizer and configured to connect to a second end of the device under test, the optical receiver unit configured to detect the optical signal that passes through the device under test and further configured to generate a digital signal based on the optical signal detected and a second reference clock signal derived from the master reference clock signal; wherein the measurement control system is connected to the optical receiver unit; wherein the measurement control system is further configured to provide an output signal comprising measurement results based on the digital signal; wherein the optical receiver unit comprises an optical detector module configured to detect the optical signal that passes through the device under test and configured to generate a response signal, which is an electrical signal, based on the optical signal received.