A system, comprising: a measurement instrument including a first connector and a control module electrically connected to the first connector; a temperature probe including a shaft, a tip, and a second connector, the shaft having a first end and a second end, the second connector being coupled to the first end, the tip being coupled to the second end and configured to measure a change in voltage generated by a junction of wires within the tip when toy inserting the temperature probe into a sample, and the second connector being received by the first connector when the temperature probe is attached to the measurement instrument; and a storage module housed within the second connector and configured to store one or more parameters of the temperature probe, the one or more parameters including a response time of the temperature probe and an offset value associated with the temperature probe, the offset value being determined based on a difference between an observed temperature measurement generated using the temperature probe and an expected temperature measurement; the control module being configured to: receive the one or more parameters, including the response time of the temperature probe and the offset value associated with the temperature probe, from the storage module housed within the second connector; prompt a user to select a sample type of the sample; determine a thermal conductivity of the sample based on the selected sample type; determine a stable time of the sample based on the response time of the temperature probe and the thermal conductivity of the sample; determine a temperature measurement of the sample based on the change in voltage in response to a time period greater than or equal to the stable time having elapsed after insertion of the temperature probe into the sample; and determine an adjusted temperature measurement based on the temperature measurement and the offset value. a measurement instrument including a first connector and a control module electrically connected to the first connector; a temperature probe including a shaft, a tip, and a second connector, the shaft having a first end and a second end, the second connector being coupled to the first end, the tip being coupled to the second end and configured to measure a change in voltage generated by a junction of wires within the tip when toy inserting the temperature probe into a sample, and the second connector being received by the first connector when the temperature probe is attached to the measurement instrument; and a storage module housed within the second connector and configured to store one or more parameters of the temperature probe, the one or more parameters including a response time of the temperature probe and an offset value associated with the temperature probe, the offset value being determined based on a difference between an observed temperature measurement generated using the temperature probe and an expected temperature measurement; the control module being configured to: receive the one or more parameters, including the response time of the temperature probe and the offset value associated with the temperature probe, from the storage module housed within the second connector; prompt a user to select a sample type of the sample; determine a thermal conductivity of the sample based on the selected sample type; determine a stable time of the sample based on the response time of the temperature probe and the thermal conductivity of the sample; determine a temperature measurement of the sample based on the change in voltage in response to a time period greater than or equal to the stable time having elapsed after insertion of the temperature probe into the sample; and determine an adjusted temperature measurement based on the temperature measurement and the offset value. receive the one or more parameters, including the response time of the temperature probe and the offset value associated with the temperature probe, from the storage module housed within the second connector; prompt a user to select a sample type of the sample; determine a thermal conductivity of the sample based on the selected sample type; determine a stable time of the sample based on the response time of the temperature probe and the thermal conductivity of the sample; determine a temperature measurement of the sample based on the change in voltage in response to a time period greater than or equal to the stable time having elapsed after insertion of the temperature probe into the sample; and determine an adjusted temperature measurement based on the temperature measurement and the offset value.