A device for detecting a defect on a surface, the detection device comprising: - an optical device having an optical axis, the optical device being able to acquire an image of the surface along a given optical direction, - a lighting device comprising a plurality of light sources, the light sources being arranged in a hemisphere, each light source having an off state and an on state, each light source having a lighting direction (E, E'), - an electronic calculation device, the electronic calculation device being able to control the optical device and the lighting device so that the optical device acquires a plurality of images of the surface, different light sources or different combinations of light sources being switched on for each image, the hemisphere having a diameter D smaller than or equal to 50 mm (millimeters), the lighting device comprising a first number of light sources, the first number being comprised between 32 and 128, each light source having a different lighting direction (E, E'), for each acquired image, a single light source or a defined combination of sources being illuminated, the single light source or combination being different for each acquired image, the light sources having respective light intensities identical to one another, the electronic calculating device being configured to calculate, for each point of the surface, from acquired images, a plurality of parameters, the parameters including coefficients of an equation characterizing the response of said point of the surface as a function of the lighting direction and an observation direction, then to deduce from the calculated parameters whether the surface has a defect at said point. - an optical device having an optical axis, the optical device being able to acquire an image of the surface along a given optical direction, - a lighting device comprising a plurality of light sources, the light sources being arranged in a hemisphere, each light source having an off state and an on state, each light source having a lighting direction (E, E'), - an electronic calculation device, the electronic calculation device being able to control the optical device and the lighting device so that the optical device acquires a plurality of images of the surface, different light sources or different combinations of light sources being switched on for each image, the hemisphere having a diameter D smaller than or equal to 50 mm (millimeters), the lighting device comprising a first number of light sources, the first number being comprised between 32 and 128, each light source having a different lighting direction (E, E'), for each acquired image, a single light source or a defined combination of sources being illuminated, the single light source or combination being different for each acquired image, the light sources having respective light intensities identical to one another, the electronic calculating device being configured to calculate, for each point of the surface, from acquired images, a plurality of parameters, the parameters including coefficients of an equation characterizing the response of said point of the surface as a function of the lighting direction and an observation direction, then to deduce from the calculated parameters whether the surface has a defect at said point. the electronic calculation device being able to control the optical device and the lighting device so that the optical device acquires a plurality of images of the surface, different light sources or different combinations of light sources being switched on for each image, the hemisphere having a diameter D smaller than or equal to 50 mm (millimeters), the lighting device comprising a first number of light sources, the first number being comprised between 32 and 128, each light source having a different lighting direction (E, E'), for each acquired image, a single light source or a defined combination of sources being illuminated, the single light source or combination being different for each acquired image, the light sources having respective light intensities identical to one another, the electronic calculating device being configured to calculate, for each point of the surface, from acquired images, a plurality of parameters, the parameters including coefficients of an equation characterizing the response of said point of the surface as a function of the lighting direction and an observation direction, then to deduce from the calculated parameters whether the surface has a defect at said point.