A method for objective chromatic perimetry analysis using a pupillometer, a processor, and at least one camera, wherein: the pupillometer comprises a testing compartment provided in the form of a hemispheric bowl; an inner surface of the bowl comprises a plurality of openings forming a plurality of visual field testing points; the hemispheric bowl associated with a plurality of chromatic beam emitters arranged about the visual field such that they are disposed over the plurality of visual field testing points; the chromatic beam emitters generate a plurality of chromatic stimuli about the visual field testing points; the chromatic stimuli comprise a first chromatic beam stimulus and a second chromatic beam stimulus; the inner surface further comprises a fixation point opposite a subject's line of sight; the at least one camera records the pupil contraction in response to the first and second chromatic beam stimuli; the processor controls the chromatic beam emitters, the stimulus parameters and the visual field points including wavelength, duration, delay, and intensity of the chromatic beam emitters; the processor processes data associated with and generated by the first and second chromatic beam stimuli and the camera; and the method comprises measuring a pupillary light reflex in response to chromatic beam stimuli presented at the plurality of visual field testing points, and defining a ratios of the PLR measurements at each of the plurality of visual field testing points, wherein the ratios at each testing point represents a PLR measurement at the second chromatic beam stimulus relative to a PLR measurement at the first chromatic beam stimulus, and wherein (i) the first chromatic beam stimulus employs a shorter-wavelength chromatic beam, relative to the second chromatic beam stimulus, (ii) the second chromatic beam stimulus employs a longer-wavelength chromatic beam, relative to the first chromatic beam stimulus, and (iii) the wavelengths of the first chromatic beam stimulus is selected from the range of 480±19 nm and the second chromatic beam stimulus is selected from the range of 640±10 nm. the pupillometer comprises a testing compartment provided in the form of a hemispheric bowl; an inner surface of the bowl comprises a plurality of openings forming a plurality of visual field testing points; the hemispheric bowl associated with a plurality of chromatic beam emitters arranged about the visual field such that they are disposed over the plurality of visual field testing points; the chromatic beam emitters generate a plurality of chromatic stimuli about the visual field testing points; the chromatic stimuli comprise a first chromatic beam stimulus and a second chromatic beam stimulus; the inner surface further comprises a fixation point opposite a subject's line of sight; the at least one camera records the pupil contraction in response to the first and second chromatic beam stimuli; the processor controls the chromatic beam emitters, the stimulus parameters and the visual field points including wavelength, duration, delay, and intensity of the chromatic beam emitters; the processor processes data associated with and generated by the first and second chromatic beam stimuli and the camera; and the method comprises measuring a pupillary light reflex in response to chromatic beam stimuli presented at the plurality of visual field testing points, and defining a ratios of the PLR measurements at each of the plurality of visual field testing points, wherein the ratios at each testing point represents a PLR measurement at the second chromatic beam stimulus relative to a PLR measurement at the first chromatic beam stimulus, and wherein (i) the first chromatic beam stimulus employs a shorter-wavelength chromatic beam, relative to the second chromatic beam stimulus, (ii) the second chromatic beam stimulus employs a longer-wavelength chromatic beam, relative to the first chromatic beam stimulus, and (iii) the wavelengths of the first chromatic beam stimulus is selected from the range of 480±19 nm and the second chromatic beam stimulus is selected from the range of 640±10 nm.