A microscopic total reflection measuring apparatus, comprising: a Cassegrain system having a Cassegrain primary mirror and a Cassegrain secondary mirror, a hemispherical prism having a convex hemispherical surface and a bottom surface opposite to the convex hemispherical surface, which is arranged below the Cassegrain secondary mirror, wherein the Cassegrain system is configured such that an incident light beam is reflected successively by the secondary mirror and the primary mirror so as to be condensed through the hemispherical prism on a measurement object, wherein the incident light beam includes a visible light beam for visual observation and a measurement light beam for acquisition of analysis information, wherein the hemispherical prism is arranged such that the convex hemispherical surface of the hemispherical prism faces the Cassegrain primary mirror, such that the central axis of the convex surface of the hemispherical prism coincides with the central axis of the Cassegrain mirror, and such that the center point of the convex surface of the hemispherical prism coincides with the position at which the light beam is converged by the Cassegrain mirror, the microscopic total reflection measuring apparatus being characterized in further comprising a first filter for removing visible light, and a second filter for removing infrared light; the first filter is formed on the total reflection area of the hemispherical prism, that is, the area of the convex hemispherical surface in which the angle of the incident beam incident on the prism bottom surface becomes the critical angle θc or more; and the second filter is formed on an area of the convex hemispherical surface in which the angle of the incident light beam incident on the prism bottom surface becomes less than the critical angle θc. a Cassegrain system having a Cassegrain primary mirror and a Cassegrain secondary mirror, a hemispherical prism having a convex hemispherical surface and a bottom surface opposite to the convex hemispherical surface, which is arranged below the Cassegrain secondary mirror, wherein the Cassegrain system is configured such that an incident light beam is reflected successively by the secondary mirror and the primary mirror so as to be condensed through the hemispherical prism on a measurement object, wherein the incident light beam includes a visible light beam for visual observation and a measurement light beam for acquisition of analysis information, wherein the hemispherical prism is arranged such that the convex hemispherical surface of the hemispherical prism faces the Cassegrain primary mirror, such that the central axis of the convex surface of the hemispherical prism coincides with the central axis of the Cassegrain mirror, and such that the center point of the convex surface of the hemispherical prism coincides with the position at which the light beam is converged by the Cassegrain mirror, the microscopic total reflection measuring apparatus being characterized in further comprising a first filter for removing visible light, and a second filter for removing infrared light; the first filter is formed on the total reflection area of the hemispherical prism, that is, the area of the convex hemispherical surface in which the angle of the incident beam incident on the prism bottom surface becomes the critical angle θc or more; and the second filter is formed on an area of the convex hemispherical surface in which the angle of the incident light beam incident on the prism bottom surface becomes less than the critical angle θc.