Computer-implemented method for generating a high-resolution Phase-Contrast X-ray image corrected for absorption gradient artefacts in a phase image or a dark field image on a Phase-Contrast X-ray imaging system, comprising the steps of: - acquiring a series of n ≥4 x-ray absorption images on an x-ray detector, acquiring said x-ray absorption images at n different positions ξ i =1→ n of a pre-sample mask in said Phase-Contrast X-ray imaging system, wherein ξ i = 1 → n = i. s p M, s p is the pixel size of said x-ray detector, and M is the magnification factor of the Phase-Contrast X-ray imaging system, said pre-sample mask having a pitch size p pm that corresponds to the selected pitch of the virtual analyzer grating p vg divided by the magnification M: p pm = p vg M, the pitch size of the virtual analyser grating p vg is determined by the pitch size of the detector S p, wherein: p vg = S p. n; n ≥ 4 - computing n uncorrected Phase-Contrast X-ray images for each of said n x-ray absorption images, wherein said Phase-Contrast X-ray image is a phase image or a dark field image, each uncorrected Phase-Contrast X-ray image being calculated from n different sets of the total number of pixels detected by said x-ray detector, said n sets being obtained by virtually overlaying a pixel matrix read out of the exposed detector by a virtual mask having on/off locations and by using pixels covered by 'on' locations of the virtual mask to populate a first set and shifting said virtual mask relative to the pixel matrix to obtain further sets; - calculating n corrected Phase-Contrast X-ray images wherein said Phase-Contrast X-ray image is a phase image or a dark field image, by correcting phase profile measurements from said phase image and correcting scatter profile measurements from said dark field image at each detector position of said n uncorrected Phase-Contrast X-ray images by normalizing said uncorrected profile measurements with at least 2 acquired profile measurements from directly neighbouring pre-sample mask positions and corresponding detector pixels, said profile measurements from directly neighbouring pre-sample mask positions obtainable from the corresponding neighbouring image from the series of n x-ray absorption images, - recombining said n corrected Phase-Contrast X-ray images into respectively a high-resolution phase image and a high-resolution dark field image, wherein each same pixel position values of said n corrected Phase-Contrast X-ray images are collated into n consecutive pixels of the respective recombined high-resolution phase image and dark field image. - acquiring a series of n ≥4 x-ray absorption images on an x-ray detector, acquiring said x-ray absorption images at n different positions ξ i =1→ n of a pre-sample mask in said Phase-Contrast X-ray imaging system, wherein ξ i = 1 → n = i. s p M, s p is the pixel size of said x-ray detector, and M is the magnification factor of the Phase-Contrast X-ray imaging system, said pre-sample mask having a pitch size p pm that corresponds to the selected pitch of the virtual analyzer grating p vg divided by the magnification M: p pm = p vg M, the pitch size of the virtual analyser grating p vg is determined by the pitch size of the detector S p, wherein: p vg = S p. n; n ≥ 4 - computing n uncorrected Phase-Contrast X-ray images for each of said n x-ray absorption images, wherein said Phase-Contrast X-ray image is a phase image or a dark field image, each uncorrected Phase-Contrast X-ray image being calculated from n different sets of the total number of pixels detected by said x-ray detector, said n sets being obtained by virtually overlaying a pixel matrix read out of the exposed detector by a virtual mask having on/off locations and by using pixels covered by 'on' locations of the virtual mask to populate a first set and shifting said virtual mask relative to the pixel matrix to obtain further sets; - calculating n corrected Phase-Contrast X-ray images wherein said Phase-Contrast X-ray image is a phase image or a dark field image, by correcting phase profile measurements from said phase image and correcting scatter profile measurements from said dark field image at each detector position of said n uncorrected Phase-Contrast X-ray images by normalizing said uncorrected profile measurements with at least 2 acquired profile measurements from directly neighbouring pre-sample mask positions and corresponding detector pixels, said profile measurements from directly neighbouring pre-sample mask positions obtainable from the corresponding neighbouring image from the series of n x-ray absorption images, - recombining said n corrected Phase-Contrast X-ray images into respectively a high-resolution phase image and a high-resolution dark field image, wherein each same pixel position values of said n corrected Phase-Contrast X-ray images are collated into n consecutive pixels of the respective recombined high-resolution phase image and dark field image.