An X-ray imaging system, comprising: a rotor configured to rotate about an object; an X-ray source mounted on the rotor and configured to project a beam of X-ray radiation; and an X-ray detector mounted on the rotor and positioned to receive the beam of X-ray radiation at a location, the X-ray detector including: (i) a monolithic substrate having a first side and a second side opposite the first side, (ii) a scintillation layer arranged upon the first side and including a first region and a second region, the first region having a first X-ray sensitivity and the second region having a second X-ray sensitivity different than the first X-ray sensitivity, and (iii) a photosensor array arranged upon the second side, wherein the X-ray source is configured to pivot relative to the rotor and the X-ray detector between a first position and a second position to adjust a location at which the X-ray detector receives the beam of X-ray radiation, when the X-ray source is pivoted to the first position, the location at which the X-ray detector receives the beam of radiation is adjusted such that the location is within the first region more than the second region, and when the X-ray source is pivoted to the second position, the location at which the X-ray detector receives the beam of radiation is adjusted such that the location is within the second region more than the first region. a rotor configured to rotate about an object; an X-ray source mounted on the rotor and configured to project a beam of X-ray radiation; and an X-ray detector mounted on the rotor and positioned to receive the beam of X-ray radiation at a location, the X-ray detector including: (i) a monolithic substrate having a first side and a second side opposite the first side, (ii) a scintillation layer arranged upon the first side and including a first region and a second region, the first region having a first X-ray sensitivity and the second region having a second X-ray sensitivity different than the first X-ray sensitivity, and (iii) a photosensor array arranged upon the second side, wherein the X-ray source is configured to pivot relative to the rotor and the X-ray detector between a first position and a second position to adjust a location at which the X-ray detector receives the beam of X-ray radiation, when the X-ray source is pivoted to the first position, the location at which the X-ray detector receives the beam of radiation is adjusted such that the location is within the first region more than the second region, and when the X-ray source is pivoted to the second position, the location at which the X-ray detector receives the beam of radiation is adjusted such that the location is within the second region more than the first region. (i) a monolithic substrate having a first side and a second side opposite the first side, (ii) a scintillation layer arranged upon the first side and including a first region and a second region, the first region having a first X-ray sensitivity and the second region having a second X-ray sensitivity different than the first X-ray sensitivity, and (iii) a photosensor array arranged upon the second side, wherein the X-ray source is configured to pivot relative to the rotor and the X-ray detector between a first position and a second position to adjust a location at which the X-ray detector receives the beam of X-ray radiation, when the X-ray source is pivoted to the first position, the location at which the X-ray detector receives the beam of radiation is adjusted such that the location is within the first region more than the second region, and when the X-ray source is pivoted to the second position, the location at which the X-ray detector receives the beam of radiation is adjusted such that the location is within the second region more than the first region. wherein the X-ray source is configured to pivot relative to the rotor and the X-ray detector between a first position and a second position to adjust a location at which the X-ray detector receives the beam of X-ray radiation, when the X-ray source is pivoted to the first position, the location at which the X-ray detector receives the beam of radiation is adjusted such that the location is within the first region more than the second region, and when the X-ray source is pivoted to the second position, the location at which the X-ray detector receives the beam of radiation is adjusted such that the location is within the second region more than the first region.