A multi-angle spectral imaging measurement apparatus comprising: a linear or spot lighting device capable of emitting white or monochromatic illumination light perpendicularly onto a sample surface containing effect materials from two or more fixed angular directions; spectroscopic means for dispersing light reflected from the sample surface, the spectroscopic means being disposed above the sample surface; an imaging lens forming an image of reflected light dispersed by the spectroscopic means; a fixed two-dimensional image sensor capable of receiving the reflected light through the imaging lens to take an image of the sample surface; and a white reference surface provided around the entire sample surface; the multi-angle spectral imaging measurement apparatus acquiring spectral information on the sample surface by using changes in optical geometrical conditions in an illumination direction and an image taking direction for each pixel in a two-dimensional image taken with the two-dimensional image sensor; wherein, during calibration before measurement, an image of a reference standard white plate and the white reference surface is taken at the same time, a calibration coefficient for each pixel and each wavelength is measured, and exposure time for each of the wavelengths is determined; a two-dimensional image of the sample surface and the white reference surface provided around the entire sample surface is taken at each measurement wavelength by changing a pass wavelength of the spectroscopic means without changing the relative positions of the lighting device, the two-dimensional image sensor, the sample surface and the white reference surface, and spectral information on all of the pixels of the two-dimensional image at each measurement wavelength is acquired; a pixel position on the white reference surface is obtained by referring to a position on the sample surface to be measured for which correction is made, which is a position on the white reference surface that intersects with a line drawn from a position to be measured in parallel to the X axis and with a line drawn from the position in parallel to the Y axis as an extrapolation position for the X axis and the Y axis; and image taking exposure time for calibration and measurement is changed according to each of the measurement wavelengths to correct gain differences in a spectral property of the lighting device, a spectral property in the spectroscopic means, and a spectral property of the two-dimensional image sensor within the range of the measurement wavelengths. a linear or spot lighting device capable of emitting white or monochromatic illumination light perpendicularly onto a sample surface containing effect materials from two or more fixed angular directions; spectroscopic means for dispersing light reflected from the sample surface, the spectroscopic means being disposed above the sample surface; an imaging lens forming an image of reflected light dispersed by the spectroscopic means; a fixed two-dimensional image sensor capable of receiving the reflected light through the imaging lens to take an image of the sample surface; and a white reference surface provided around the entire sample surface; the multi-angle spectral imaging measurement apparatus acquiring spectral information on the sample surface by using changes in optical geometrical conditions in an illumination direction and an image taking direction for each pixel in a two-dimensional image taken with the two-dimensional image sensor; wherein, during calibration before measurement, an image of a reference standard white plate and the white reference surface is taken at the same time, a calibration coefficient for each pixel and each wavelength is measured, and exposure time for each of the wavelengths is determined; a two-dimensional image of the sample surface and the white reference surface provided around the entire sample surface is taken at each measurement wavelength by changing a pass wavelength of the spectroscopic means without changing the relative positions of the lighting device, the two-dimensional image sensor, the sample surface and the white reference surface, and spectral information on all of the pixels of the two-dimensional image at each measurement wavelength is acquired; a pixel position on the white reference surface is obtained by referring to a position on the sample surface to be measured for which correction is made, which is a position on the white reference surface that intersects with a line drawn from a position to be measured in parallel to the X axis and with a line drawn from the position in parallel to the Y axis as an extrapolation position for the X axis and the Y axis; and image taking exposure time for calibration and measurement is changed according to each of the measurement wavelengths to correct gain differences in a spectral property of the lighting device, a spectral property in the spectroscopic means, and a spectral property of the two-dimensional image sensor within the range of the measurement wavelengths.