Smart embedded control system for a field device of an automation system comprising: a diagnostic application interface to a backend server for transferring data with signal analytics information, complex event pattern information and diagnostic information; a physical process interface to a signal data source for transferring signal data; a signal evaluation component for comparing the received signal analytics information with the received signal data in order to identify at least a first and a second event (E1, E2), wherein an event is a data set that classifies a status of a process or an event is a classification of a data set and the signal analytics information contains framework conditions that have to apply so that the received signal data is classified as out-of-normal; a complex event processing component configured for applying the received complex event pattern information at least to the first and second identified event (E1, E2) in order to identify at least a first classified event (E1'), wherein the received complex event pattern information comprises a plurality of patterns over streams of events, wherein the plurality of patterns is arranged to distinguish between different situations or contexts, in which an event or stream of event occurs; a diagnostic reasoning component configured for deriving causal dependencies between at least the first classified event (E1') and at least a further classified event (E2'), wherein the further classified event can be either another classified event generated by the complex event processing component or can be comprised in the diagnostic information or can be stored at a database on the smart embedded control system, based on the received diagnostic information in order to identify a root cause for at least the first classified event (E1'), and/or predict an impact of at least the first classified event (E1'), wherein the received diagnostic information includes asset and event context information and an underlying event model, wherein the underlying event model is a hierarchy that models dependencies between classified events. a diagnostic application interface to a backend server for transferring data with signal analytics information, complex event pattern information and diagnostic information; a physical process interface to a signal data source for transferring signal data; a signal evaluation component for comparing the received signal analytics information with the received signal data in order to identify at least a first and a second event (E1, E2), wherein an event is a data set that classifies a status of a process or an event is a classification of a data set and the signal analytics information contains framework conditions that have to apply so that the received signal data is classified as out-of-normal; a complex event processing component configured for applying the received complex event pattern information at least to the first and second identified event (E1, E2) in order to identify at least a first classified event (E1'), wherein the received complex event pattern information comprises a plurality of patterns over streams of events, wherein the plurality of patterns is arranged to distinguish between different situations or contexts, in which an event or stream of event occurs; a diagnostic reasoning component configured for deriving causal dependencies between at least the first classified event (E1') and at least a further classified event (E2'), wherein the further classified event can be either another classified event generated by the complex event processing component or can be comprised in the diagnostic information or can be stored at a database on the smart embedded control system, based on the received diagnostic information in order to identify a root cause for at least the first classified event (E1'), and/or predict an impact of at least the first classified event (E1'), wherein the received diagnostic information includes asset and event context information and an underlying event model, wherein the underlying event model is a hierarchy that models dependencies between classified events.