A current sense system including a current transformer having a primary coil and a secondary coil, wherein the secondary coil has a first and second terminal; a burden resistor connected between the first terminal of the secondary coil and ground; a monitor circuit configured to measure current in the primary coil by monitoring voltage across the burden resistor; and a built-in test, BIT, circuit connected to the second terminal of the secondary coil, wherein the BIT circuit comprises: an operational amplifier circuit having an output connected to the second terminal of the secondary coil; and a first controller configured to control a state of the operational amplifier circuit, wherein the first controller is configured to provide a first output and a second output to control the state of the operational amplifier circuit; wherein the first and second outputs are logic low values during normal system operation to operate in a first state in which the output of the operational amplifier is a virtual ground and to create an alternating, AC, voltage across the burden resistor, wherein the first output is a logic high value and the second output is a logic low value to operate in a second state in which the output of the operational amplifier is a positive direct current, DC, voltage, and wherein the first output is a logic low value and the second output is a logic high value to operate in a third state in which the output of the operational amplifier is a negative direct current, DC, voltage; and wherein the monitor circuit comprises: a rectifier configured to convert the alternating current, AC, voltage to direct current, DC, voltage; and an analog-to-digital converter configured to convert the DC voltage provided by the rectifier to a digital output, wherein the analog-to-digital converter provides a digital output to a controller representative of the voltage provided by the rectifier to determine that the BIT test was performed successfully. the BIT circuit comprises: an operational amplifier circuit having an output connected to the second terminal of the secondary coil; and a first controller configured to control a state of the operational amplifier circuit, wherein the first controller is configured to provide a first output and a second output to control the state of the operational amplifier circuit; an operational amplifier circuit having an output connected to the second terminal of the secondary coil; and a first controller configured to control a state of the operational amplifier circuit, wherein the first controller is configured to provide a first output and a second output to control the state of the operational amplifier circuit; wherein the first and second outputs are logic low values during normal system operation to operate in a first state in which the output of the operational amplifier is a virtual ground and to create an alternating, AC, voltage across the burden resistor, wherein the first output is a logic high value and the second output is a logic low value to operate in a second state in which the output of the operational amplifier is a positive direct current, DC, voltage, and wherein the first output is a logic low value and the second output is a logic high value to operate in a third state in which the output of the operational amplifier is a negative direct current, DC, voltage; and wherein the monitor circuit comprises: a rectifier configured to convert the alternating current, AC, voltage to direct current, DC, voltage; and an analog-to-digital converter configured to convert the DC voltage provided by the rectifier to a digital output, wherein the analog-to-digital converter provides a digital output to a controller representative of the voltage provided by the rectifier to determine that the BIT test was performed successfully. a rectifier configured to convert the alternating current, AC, voltage to direct current, DC, voltage; and an analog-to-digital converter configured to convert the DC voltage provided by the rectifier to a digital output, wherein the analog-to-digital converter provides a digital output to a controller representative of the voltage provided by the rectifier to determine that the BIT test was performed successfully.