An air data probe comprising a passive power control circuit (100, 200) having: at least one low temperature coefficient of resistance component (106, 206) forming a first heating element and placed in a strut of the probe, wherein the at least one low temperature coefficient of resistance component has a low positive temperature resistance coefficient; at least one high temperature coefficient of resistance component (112, 212) forming a second heating element and placed in a tip of the probe and connected in series with the at least one low temperature coefficient of resistance component, wherein the at least one high temperature coefficient of resistance component has a high positive temperature resistance coefficient, and wherein the at least one high temperature coefficient of resistance component responds to temperature differently than the at least one low temperature coefficient of resistance component; and at least one shunt component connected in parallel with the at least one high temperature coefficient of resistance component; wherein, when the temperature of the at least one high temperature coefficient of resistance component is at or below a set temperature point, the at least one shunt component is configured to prevent the current flow through the at least one shunt component; and wherein, when the temperature of the at least one high temperature coefficient of resistance component exceeds the set temperature point, the at least one shunt component is configured to pass the current flow through the at least one high temperature coefficient of resistance component and the at least one shunt component at least one low temperature coefficient of resistance component (106, 206) forming a first heating element and placed in a strut of the probe, wherein the at least one low temperature coefficient of resistance component has a low positive temperature resistance coefficient; at least one high temperature coefficient of resistance component (112, 212) forming a second heating element and placed in a tip of the probe and connected in series with the at least one low temperature coefficient of resistance component, wherein the at least one high temperature coefficient of resistance component has a high positive temperature resistance coefficient, and wherein the at least one high temperature coefficient of resistance component responds to temperature differently than the at least one low temperature coefficient of resistance component; and at least one shunt component connected in parallel with the at least one high temperature coefficient of resistance component; wherein, when the temperature of the at least one high temperature coefficient of resistance component is at or below a set temperature point, the at least one shunt component is configured to prevent the current flow through the at least one shunt component; and wherein, when the temperature of the at least one high temperature coefficient of resistance component exceeds the set temperature point, the at least one shunt component is configured to pass the current flow through the at least one high temperature coefficient of resistance component and the at least one shunt component