A device for analyzing the structure of a material for the nondestructive inspection of sheet metal, tubes, track rails, comprising: - a probe comprising a plurality of probe elements for the emission of a wave at a wavelength, into the material, with an emission delay law corresponding to a deviation according to a direction and a focusing of this wave, and the reception, in parallel on the various probe elements, of signals originating from the refraction of this wave by the material, - a plurality of emitters, each emitter exciting a single probe element, - a plurality of detection channels, each detection channel being connected to a probe element, so as to collect the refraction signals and transmit them to data processing means, - a plurality of delay circuits, each delay circuit applying a delay, to each detection channel, according to a predetermined reception delay law corresponding to the deviation of the wave emitted, and wherein: • each probe element emits the wave with at least one other emission delay law corresponding to the emission of the wave according to at least one other deviation, simultaneously, and that • the delay circuits apply delays to each detection channel according to at least one other predetermined reception delay law corresponding to the reception of the wave emitted according to the other deviation, characterized in that the delay circuits comprise first delay cells and second delay cells in series and two summation circuits (20, 22) for summing the signals transmitted, after application of the delays respectively by the first and second delay cells, and that: - the first delay cells have a first resolution, - the first summation circuits adding the signals from the first delay cells of a group of several consecutive probe elements, - the second delay cells have a second resolution, lower than said first resolution, and delay the signals from the first summator, - the second summation circuits comprise a plurality of cascaded second summators, each second summator adding the signals from a second delay cell and from a previous other second summator, so as the second summator provides a signal corresponding to a deviation. - a probe comprising a plurality of probe elements for the emission of a wave at a wavelength, into the material, with an emission delay law corresponding to a deviation according to a direction and a focusing of this wave, and the reception, in parallel on the various probe elements, of signals originating from the refraction of this wave by the material, - a plurality of emitters, each emitter exciting a single probe element, - a plurality of detection channels, each detection channel being connected to a probe element, so as to collect the refraction signals and transmit them to data processing means, - a plurality of delay circuits, each delay circuit applying a delay, to each detection channel, according to a predetermined reception delay law corresponding to the deviation of the wave emitted, and wherein: • each probe element emits the wave with at least one other emission delay law corresponding to the emission of the wave according to at least one other deviation, simultaneously, and that • the delay circuits apply delays to each detection channel according to at least one other predetermined reception delay law corresponding to the reception of the wave emitted according to the other deviation, characterized in that the delay circuits comprise first delay cells and second delay cells in series and two summation circuits (20, 22) for summing the signals transmitted, after application of the delays respectively by the first and second delay cells, and that: • each probe element emits the wave with at least one other emission delay law corresponding to the emission of the wave according to at least one other deviation, simultaneously, and that • the delay circuits apply delays to each detection channel according to at least one other predetermined reception delay law corresponding to the reception of the wave emitted according to the other deviation, - the first delay cells have a first resolution, - the first summation circuits adding the signals from the first delay cells of a group of several consecutive probe elements, - the second delay cells have a second resolution, lower than said first resolution, and delay the signals from the first summator, - the second summation circuits comprise a plurality of cascaded second summators, each second summator adding the signals from a second delay cell and from a previous other second summator, so as the second summator provides a signal corresponding to a deviation.