An interconnect (200, 1640) for coupling a superconducting system and a non-superconducting system, the interconnect (200, 1640) comprising: a first end configured for coupling to the superconducting system, wherein the interconnect (200, 1640) comprises two superconducting elements having a critical temperature; a second end configured for coupling to the non-superconducting system, such that during operation of the superconducting system and the non-superconducting system (200, 1640), a first portion of the interconnect near the first end being arranged to have a first temperature equal to or below the critical temperature of the superconducting elements, a second portion of the interconnect (200, 1640) near the second end being arranged to have a second temperature above the critical temperature of the superconducting elements, and characterized in that the interconnect (200, 1640) is further configured to use a short length of the second portion with respect to the first portion such that the temperature over the entire other part of the interconnect (200, 1640) is maintained at a temperature equal to or below the critical temperature of the superconducting elements and in that the interconnect comprises a first layer comprising one of the superconducting elements; a second layer comprising the other superconducting elements; and a third layer comprising a dielectric material formed between the first layer and the second layer. a first end configured for coupling to the superconducting system, wherein the interconnect (200, 1640) comprises two superconducting elements having a critical temperature; a second end configured for coupling to the non-superconducting system, such that during operation of the superconducting system and the non-superconducting system (200, 1640), a first portion of the interconnect near the first end being arranged to have a first temperature equal to or below the critical temperature of the superconducting elements, a second portion of the interconnect (200, 1640) near the second end being arranged to have a second temperature above the critical temperature of the superconducting elements, and characterized in that the interconnect (200, 1640) is further configured to use a short length of the second portion with respect to the first portion such that the temperature over the entire other part of the interconnect (200, 1640) is maintained at a temperature equal to or below the critical temperature of the superconducting elements and in that the interconnect comprises a first portion of the interconnect near the first end being arranged to have a first temperature equal to or below the critical temperature of the superconducting elements, a second portion of the interconnect (200, 1640) near the second end being arranged to have a second temperature above the critical temperature of the superconducting elements, and characterized in that the interconnect (200, 1640) is further configured to use a short length of the second portion with respect to the first portion such that the temperature over the entire other part of the interconnect (200, 1640) is maintained at a temperature equal to or below the critical temperature of the superconducting elements and in that the interconnect comprises a first layer comprising one of the superconducting elements; a second layer comprising the other superconducting elements; and a third layer comprising a dielectric material formed between the first layer and the second layer.