Oscilloscope (100, 200, 300) for testing an electronic device under test (150, 250, 350), the oscilloscope (100, 200, 300) comprising: a test controller (101, 201, 301), which is configured to control the oscilloscope (100, 200, 300) to perform tests with the electronic device under test (150, 250, 350) based on respective user provided configuration parameters (102, 202, 302), and a memory device (103, 203, 303), which is coupled to the test controller (101, 201, 301), a display device (205, 305) that is configured to display a representation (208, 209) of stored parameter sets comprising the user provided configuration parameters, a tabbed interface that is displayed on the display device (205, 305), a user input device (210, 310) that is configured to receive a user selection (211, 311) of one of the displayed representations (208, 209), wherein the test controller (101, 201, 301) is configured - to automatically store for every test in the memory device (103, 203, 303) a parameter set comprising the user provided configuration parameters (102, 202, 302), - to load a respective parameter set based on the user selection (211, 311), - to store measurement results of a measurement together with the respective parameter set, - to dynamically generate the representation (208, 209) of the respective parameter set based on the measurement results, wherein every tab of the tabbed interface comprises one of the representations (208, 209) of the stored parameter sets, and when a tab is selected the test controller (101, 201, 301) is further configured to automatically load the respective parameter set and configure the oscilloscope (100, 200, 300) according to the loaded parameter set. a test controller (101, 201, 301), which is configured to control the oscilloscope (100, 200, 300) to perform tests with the electronic device under test (150, 250, 350) based on respective user provided configuration parameters (102, 202, 302), and a memory device (103, 203, 303), which is coupled to the test controller (101, 201, 301), a display device (205, 305) that is configured to display a representation (208, 209) of stored parameter sets comprising the user provided configuration parameters, a tabbed interface that is displayed on the display device (205, 305), a user input device (210, 310) that is configured to receive a user selection (211, 311) of one of the displayed representations (208, 209), wherein the test controller (101, 201, 301) is configured - to automatically store for every test in the memory device (103, 203, 303) a parameter set comprising the user provided configuration parameters (102, 202, 302), - to load a respective parameter set based on the user selection (211, 311), - to store measurement results of a measurement together with the respective parameter set, - to dynamically generate the representation (208, 209) of the respective parameter set based on the measurement results, - to automatically store for every test in the memory device (103, 203, 303) a parameter set comprising the user provided configuration parameters (102, 202, 302), - to load a respective parameter set based on the user selection (211, 311), - to store measurement results of a measurement together with the respective parameter set, - to dynamically generate the representation (208, 209) of the respective parameter set based on the measurement results, wherein every tab of the tabbed interface comprises one of the representations (208, 209) of the stored parameter sets, and when a tab is selected the test controller (101, 201, 301) is further configured to automatically load the respective parameter set and configure the oscilloscope (100, 200, 300) according to the loaded parameter set.