A filter debugging method, comprising: step S1: inputting a current hole parameter and a current index value of a filter into a policy network which is pre-trained; step S2: determining, by the policy network, a target hole to be polished of the filter, according to the current hole parameter and the current index value of the filter; step S3: controlling a mechanical arm to polish the target hole of the filter; and step S4: determining whether the filter is qualified according to an index value of the polished filter; in a case that the filter is qualified, ending a process including the steps S1 to S4; in a case that the filter is unqualified, performing the steps S1 to S4 circularly until the filter is qualified; wherein the hole parameter of the filter comprises a hole depth and a hole diameter; the index value of the filter comprises at least one of a center frequency, a pass band width, a return loss, an insertion loss, a left side out-of-band rejection and a right side out-of-band rejection; characterized in that, the inputting the current hole parameter and the current index value of the filter into the policy network which is pre-trained comprises: performing a Multi-Layer Perceptron, MLP, processing on the current hole parameter of the filter to obtain a processed hole parameter; performing the MLP processing on the current index value of the filter to obtain a processed index value; inputting the processed hole parameter and the processed index value to the policy network which is pre-trained; the determining by the policy network the target hole to be polished of the filter according to the current hole parameter and the current index value of the filter comprises: determining, by the policy network, the target hole to be polished of the filter, according to the processed hole parameter and the processed index value. step S1: inputting a current hole parameter and a current index value of a filter into a policy network which is pre-trained; step S2: determining, by the policy network, a target hole to be polished of the filter, according to the current hole parameter and the current index value of the filter; step S3: controlling a mechanical arm to polish the target hole of the filter; and step S4: determining whether the filter is qualified according to an index value of the polished filter; in a case that the filter is qualified, ending a process including the steps S1 to S4; in a case that the filter is unqualified, performing the steps S1 to S4 circularly until the filter is qualified; wherein the hole parameter of the filter comprises a hole depth and a hole diameter; the index value of the filter comprises at least one of a center frequency, a pass band width, a return loss, an insertion loss, a left side out-of-band rejection and a right side out-of-band rejection; characterized in that, the inputting the current hole parameter and the current index value of the filter into the policy network which is pre-trained comprises: performing a Multi-Layer Perceptron, MLP, processing on the current hole parameter of the filter to obtain a processed hole parameter; performing the MLP processing on the current index value of the filter to obtain a processed index value; inputting the processed hole parameter and the processed index value to the policy network which is pre-trained; the determining by the policy network the target hole to be polished of the filter according to the current hole parameter and the current index value of the filter comprises: determining, by the policy network, the target hole to be polished of the filter, according to the processed hole parameter and the processed index value. performing a Multi-Layer Perceptron, MLP, processing on the current hole parameter of the filter to obtain a processed hole parameter; performing the MLP processing on the current index value of the filter to obtain a processed index value; inputting the processed hole parameter and the processed index value to the policy network which is pre-trained; the determining by the policy network the target hole to be polished of the filter according to the current hole parameter and the current index value of the filter comprises: determining, by the policy network, the target hole to be polished of the filter, according to the processed hole parameter and the processed index value.