A measurement apparatus, comprising: a magnetic resonance member arranged in a measurement target AC physical field, and in which a quantum operation can be performed in a specific quantum system; a coil that is configured to apply a magnetic field of a microwave to the magnetic resonance member; a high frequency power supply that is configured to cause the coil to conduct a current of the microwave; an irradiating device that is configured to irradiate the magnetic resonance member with light in a DC physical field measurement sequence; a detecting device that is configured to detect from the magnetic resonance member a physical phenomenon corresponding to the measurement target AC physical field in the DC physical field measurement sequence; a measurement control unit that is configured to perform the DC physical field measurement sequence a predetermined plural times, and in each of the plural times of the DC physical field measurement sequence, (a) to control the high frequency power supply and the irradiating device, and (b) to determine a detection value of the physical phenomenon detected by the detecting device; and a calculation unit that is configured to calculate a measurement result for a specific time span of the measurement target AC physical field on the basis of the detection values corresponding to the plural times of the DC physical field measurement sequence, wherein the calculation unit is configured to perform the DC physical field measurement sequence the predetermined plural times every period of the measurement target AC physical field, and to calculate averages of the measurement results for the specific time span that are obtained over plural periods of the measurement target AC physical field, and to thereby decrease noise in the measurement result for the specific time span; and the number of the measurement results for the specific time span is same as the number of plural periods. a magnetic resonance member arranged in a measurement target AC physical field, and in which a quantum operation can be performed in a specific quantum system; a coil that is configured to apply a magnetic field of a microwave to the magnetic resonance member; a high frequency power supply that is configured to cause the coil to conduct a current of the microwave; an irradiating device that is configured to irradiate the magnetic resonance member with light in a DC physical field measurement sequence; a detecting device that is configured to detect from the magnetic resonance member a physical phenomenon corresponding to the measurement target AC physical field in the DC physical field measurement sequence; a measurement control unit that is configured to perform the DC physical field measurement sequence a predetermined plural times, and in each of the plural times of the DC physical field measurement sequence, (a) to control the high frequency power supply and the irradiating device, and (b) to determine a detection value of the physical phenomenon detected by the detecting device; and a calculation unit that is configured to calculate a measurement result for a specific time span of the measurement target AC physical field on the basis of the detection values corresponding to the plural times of the DC physical field measurement sequence, wherein the calculation unit is configured to perform the DC physical field measurement sequence the predetermined plural times every period of the measurement target AC physical field, and to calculate averages of the measurement results for the specific time span that are obtained over plural periods of the measurement target AC physical field, and to thereby decrease noise in the measurement result for the specific time span; and the number of the measurement results for the specific time span is same as the number of plural periods.