A probe card for a testing apparatus of electronic devices comprising at least one probe head housing a plurality of contact probes, each contact probe having at least one contact tip adapted to abut onto a contact pad of a device under test, as well as a main support and an intermediate support connected to said main support and adapted to realize a spatial transformation of distances between contact pads on its opposite sides as a space transformer, further comprising at least one connecting element adapted to link said space transformer and said main support, said connecting element having a rod-like body and being equipped with a first end portion, wherein said at least one connecting element includes at least one terminal section (30A1) adapted to be engaged in a corresponding housing realized in said space transformer, a further housing being realized in said main support to house said at least one connecting element without engagement, and with a second end portion adapted to abut onto an abutment element linked to said main support, wherein said abutment element is glued to said main support and is realized by metal having a stiffness and a planarity greater than a material of which said main support is made, and wherein said second end portion of said at least one connecting element has a maximum transverse dimension greater than a maximum transverse dimension of said body of said at least one connecting element and defines at least one undercut section (Sq) adapted to abut onto said abutment element, wherein the probe card further comprises: at least one frame equipped with at least one housing hole of said at least one connecting element and positioned between said main support and said space transformer; and at least one electrical connection interface positioned between said space transformer and said main support, in correspondence with said frame and adapted to realize a link between corresponding pluralities of pads realized on said space transformer and on said main support, in correspondence with their sides (F3, F4) facing one another in correspondence with said frame, wherein said first end portion of said at least one connecting element has an maximum transverse dimension lesser than a maximum transverse dimension of said body and realizes at least one additional undercut section (Sq') adapted to abut onto said frame. wherein said abutment element is glued to said main support and is realized by metal having a stiffness and a planarity greater than a material of which said main support is made, and wherein said second end portion of said at least one connecting element has a maximum transverse dimension greater than a maximum transverse dimension of said body of said at least one connecting element and defines at least one undercut section (Sq) adapted to abut onto said abutment element, wherein the probe card further comprises: at least one frame equipped with at least one housing hole of said at least one connecting element and positioned between said main support and said space transformer; and at least one electrical connection interface positioned between said space transformer and said main support, in correspondence with said frame and adapted to realize a link between corresponding pluralities of pads realized on said space transformer and on said main support, in correspondence with their sides (F3, F4) facing one another in correspondence with said frame, wherein said first end portion of said at least one connecting element has an maximum transverse dimension lesser than a maximum transverse dimension of said body and realizes at least one additional undercut section (Sq') adapted to abut onto said frame. at least one frame equipped with at least one housing hole of said at least one connecting element and positioned between said main support and said space transformer; and at least one electrical connection interface positioned between said space transformer and said main support, in correspondence with said frame and adapted to realize a link between corresponding pluralities of pads realized on said space transformer and on said main support, in correspondence with their sides (F3, F4) facing one another in correspondence with said frame, wherein said first end portion of said at least one connecting element has an maximum transverse dimension lesser than a maximum transverse dimension of said body and realizes at least one additional undercut section (Sq') adapted to abut onto said frame.