Apparatus (10; 30; 40; 70 1; 70 2) for capturing at least partially reflective surfaces, comprising: a detection area arrangement; a means for illumination configured to emit an illumination pattern towards the at least partially reflective surface so as to project, through reflection via the at least partially reflective surface, a first reflection pattern (22 1) and a second reflection pattern (22 2) onto the detection area arrangement; and a capturing unit configured to capture the first reflection pattern (22 1) and the second reflection pattern (22 2) from the detection area arrangement; wherein the apparatus is configured to generate the first reflection pattern (22 1) during a first time interval and the second reflection pattern (22 2) during a second time interval at the detection area arrangement, wherein the first time interval and the second time interval are temporally disjoint; wherein the apparatus is configured to illuminate a surface point of the at least partially reflective surface of an object to be measured at a first point in time (t 1) with a first illumination pattern (16 1) so as to obtain the first reflection pattern (22 1); and to illuminate the surface point at a second point in time (t 2), different from the first point in time, with a second illumination pattern (16 2) so as to obtain the second reflection pattern (22 2); wherein the first reflection pattern (22 1) is obtained by using a first relative position between a first illumination source (14 1) for generating the first reflection pattern (22 1) on the one hand and the detection area arrangement on the other hand, and wherein the second reflection pattern (22 2) is obtained by using a second relative position between a second illumination source (14 2) for generating the second reflection pattern (22 2) on the one hand and the detection area arrangement on the other hand. a detection area arrangement; a means for illumination configured to emit an illumination pattern towards the at least partially reflective surface so as to project, through reflection via the at least partially reflective surface, a first reflection pattern (22 1) and a second reflection pattern (22 2) onto the detection area arrangement; and a capturing unit configured to capture the first reflection pattern (22 1) and the second reflection pattern (22 2) from the detection area arrangement; wherein the apparatus is configured to generate the first reflection pattern (22 1) during a first time interval and the second reflection pattern (22 2) during a second time interval at the detection area arrangement, wherein the first time interval and the second time interval are temporally disjoint; wherein the apparatus is configured to illuminate a surface point of the at least partially reflective surface of an object to be measured at a first point in time (t 1) with a first illumination pattern (16 1) so as to obtain the first reflection pattern (22 1); and to illuminate the surface point at a second point in time (t 2), different from the first point in time, with a second illumination pattern (16 2) so as to obtain the second reflection pattern (22 2); wherein the first reflection pattern (22 1) is obtained by using a first relative position between a first illumination source (14 1) for generating the first reflection pattern (22 1) on the one hand and the detection area arrangement on the other hand, and wherein the second reflection pattern (22 2) is obtained by using a second relative position between a second illumination source (14 2) for generating the second reflection pattern (22 2) on the one hand and the detection area arrangement on the other hand.