A system for measuring a propagation delay (to) of a device under test, the system comprising: a first measurement unit, wherein the first measurement unit comprises: a first frequency generator configured to produce a first periodic signal with a first frequency; a first transmitter port; a first receiver port; and a first comparator; a second measurement unit, wherein the second measurement unit comprises: a second frequency generator configured to produce a second periodic signal with a second frequency; a second transmitter port; a second receiver port; and a second comparator; wherein, the first transmitter port of the first measurement unit is configured to transmit the first periodic signal from the first frequency generator to the DUT, wherein the first periodic signal is further transmitted to the second receiver port of the second measurement unit as a first delayed periodic signal; the second transmitter port of the second measurement unit is configured to transmit the second periodic signal from the second frequency generator to the DUT, wherein the second periodic signal is further transmitted to the first receiver port of the first measurement unit as a second delayed periodic signal; the first comparator of the first measurement unit is configured to calculate a first comparison phase output (Ø 12) by comparing a phase of the first periodic signal and the second delayed periodic signal; and the second comparator of the second measurement unit is configured to calculate a second comparison phase output (Ø 21) by comparing a phase of the second periodic signal and the first delayed periodic signal, wherein the propagation delay (t 0) is calculated by combining the first comparison phase output (Ø 12) and the second comparison phase output (Ø 21). a first measurement unit, wherein the first measurement unit comprises: a first frequency generator configured to produce a first periodic signal with a first frequency; a first transmitter port; a first receiver port; and a first comparator; a first frequency generator configured to produce a first periodic signal with a first frequency; a first transmitter port; a first receiver port; and a first comparator; a second measurement unit, wherein the second measurement unit comprises: a second frequency generator configured to produce a second periodic signal with a second frequency; a second transmitter port; a second receiver port; and a second comparator; wherein, a second frequency generator configured to produce a second periodic signal with a second frequency; a second transmitter port; a second receiver port; and a second comparator; wherein, the first transmitter port of the first measurement unit is configured to transmit the first periodic signal from the first frequency generator to the DUT, wherein the first periodic signal is further transmitted to the second receiver port of the second measurement unit as a first delayed periodic signal; the second transmitter port of the second measurement unit is configured to transmit the second periodic signal from the second frequency generator to the DUT, wherein the second periodic signal is further transmitted to the first receiver port of the first measurement unit as a second delayed periodic signal; the first comparator of the first measurement unit is configured to calculate a first comparison phase output (Ø 12) by comparing a phase of the first periodic signal and the second delayed periodic signal; and the second comparator of the second measurement unit is configured to calculate a second comparison phase output (Ø 21) by comparing a phase of the second periodic signal and the first delayed periodic signal, wherein the propagation delay (t 0) is calculated by combining the first comparison phase output (Ø 12) and the second comparison phase output (Ø 21).