A current probe comprising: a current sensing circuit; inputs (94, 96) for coupling to a device under test to receive a current signal therefrom; and outputs (114, 120) coupled to the current sensing circuit, wherein the current sensing circuit has a transformer with a magnetic core and a primary winding wrapped around said magnetic core, the primary winding having opposing ends coupled to said outputs, characterized in that the current probe further comprises: a switching circuit electrically coupled to the inputs (94, 96) of the current probe and to the outputs (114, 120) coupled to the current sensing circuit; and a switch control circuit coupled to the switching circuit and structured to cause the switching circuit to selectively couple and decouple the current probe inputs (94, 96) from the current sensing circuit while the current probe remains in place and such that a current signal can continuously flow in the device under test; wherein the switching circuit comprises first and second switches coupled to one of the current probe inputs of the current probe with each of the first and second switches having a common terminal (106, 108) coupled to the one current probe input, a first terminal (110, 112) coupled to the current sensing circuit through one of the outputs and a second terminal (116, 118) coupled to the other current probe input such that the first and second switches couple the current signal to the current sensing circuit when the common switch terminals of the first and second switches are coupled to the first terminals of the first and second switches, and first and second switches couple the current signal between the current probe inputs when the common switch terminals of the first and second switches are coupled to the second terminals of the first and second switches. a current sensing circuit; inputs (94, 96) for coupling to a device under test to receive a current signal therefrom; and outputs (114, 120) coupled to the current sensing circuit, wherein the current sensing circuit has a transformer with a magnetic core and a primary winding wrapped around said magnetic core, the primary winding having opposing ends coupled to said outputs, characterized in that the current probe further comprises: a switching circuit electrically coupled to the inputs (94, 96) of the current probe and to the outputs (114, 120) coupled to the current sensing circuit; and a switch control circuit coupled to the switching circuit and structured to cause the switching circuit to selectively couple and decouple the current probe inputs (94, 96) from the current sensing circuit while the current probe remains in place and such that a current signal can continuously flow in the device under test; wherein the switching circuit comprises first and second switches coupled to one of the current probe inputs of the current probe with each of the first and second switches having a common terminal (106, 108) coupled to the one current probe input, a first terminal (110, 112) coupled to the current sensing circuit through one of the outputs and a second terminal (116, 118) coupled to the other current probe input such that the first and second switches couple the current signal to the current sensing circuit when the common switch terminals of the first and second switches are coupled to the first terminals of the first and second switches, and first and second switches couple the current signal between the current probe inputs when the common switch terminals of the first and second switches are coupled to the second terminals of the first and second switches. a switching circuit electrically coupled to the inputs (94, 96) of the current probe and to the outputs (114, 120) coupled to the current sensing circuit; and a switch control circuit coupled to the switching circuit and structured to cause the switching circuit to selectively couple and decouple the current probe inputs (94, 96) from the current sensing circuit while the current probe remains in place and such that a current signal can continuously flow in the device under test; wherein the switching circuit comprises first and second switches coupled to one of the current probe inputs of the current probe with each of the first and second switches having a common terminal (106, 108) coupled to the one current probe input, a first terminal (110, 112) coupled to the current sensing circuit through one of the outputs and a second terminal (116, 118) coupled to the other current probe input such that the first and second switches couple the current signal to the current sensing circuit when the common switch terminals of the first and second switches are coupled to the first terminals of the first and second switches, and first and second switches couple the current signal between the current probe inputs when the common switch terminals of the first and second switches are coupled to the second terminals of the first and second switches.