Optoelectronic measuring device having scanning functionality, in particular a laser scanner, laser tracker, laser profiler, or total station, having • a pulsed radiation source, in particular a pulsed laser source, for generating a measuring beam from light pulses (2, 2", L, L1-L4, La-Lc) at a light pulse emission rate, • an optical unit for emitting the light pulses (2, 2`, L, L1-L4, La-Lc) into free space onto a target object (100, 100'), • a beam deflector for varying the emission direction of the light pulses (2, 2`, L, L1-L4, La-Lc) about at least one axis (a1, a2), in particular two axes perpendicular to one another, in such a way that scanning sampling of the target object is executable, wherein a scanning grid is formed from scanning points (P, P`, P1', P2', P1-P7), • at least one position or angle sensor for measuring the emission direction, • an optoelectronic detector for detecting light pulses (2, 2`, L, L1-L4, La-Lc) reflected from the target object (100, 100'), • a control and analysis unit designed for measuring a distance value (Z, Z', M1-M3) from a respective scanning point (P, P', P1', P2 `, P1-P7) of the target object (100, 100') according to the time-of-flight principle, wherein a number n>=1 of detected light pulses (2, 2`, L, L1-L4, La-Lc) is used for the measurement, whereby the control and analysis unit is designed for automatically setting the number (n) of the light pulses (2, 2`, L, L1-L4, La-Lc) used for the measurement in dependence on at least one target-object-related measured value (Z, Z', M1-M3, I ges) determined by the measuring device in real time, characterized in that the number (n) is adapted in real time, flexibly and automatically to presently existing measuring conditions on the basis of the target-object-related measured value (Z, Z', M1-M3, I ges). • a pulsed radiation source, in particular a pulsed laser source, for generating a measuring beam from light pulses (2, 2", L, L1-L4, La-Lc) at a light pulse emission rate, • an optical unit for emitting the light pulses (2, 2`, L, L1-L4, La-Lc) into free space onto a target object (100, 100'), • a beam deflector for varying the emission direction of the light pulses (2, 2`, L, L1-L4, La-Lc) about at least one axis (a1, a2), in particular two axes perpendicular to one another, in such a way that scanning sampling of the target object is executable, wherein a scanning grid is formed from scanning points (P, P`, P1', P2', P1-P7), • at least one position or angle sensor for measuring the emission direction, • an optoelectronic detector for detecting light pulses (2, 2`, L, L1-L4, La-Lc) reflected from the target object (100, 100'), • a control and analysis unit designed for measuring a distance value (Z, Z', M1-M3) from a respective scanning point (P, P', P1', P2 `, P1-P7) of the target object (100, 100') according to the time-of-flight principle, wherein a number n>=1 of detected light pulses (2, 2`, L, L1-L4, La-Lc) is used for the measurement, whereby the control and analysis unit is designed for automatically setting the number (n) of the light pulses (2, 2`, L, L1-L4, La-Lc) used for the measurement in dependence on at least one target-object-related measured value (Z, Z', M1-M3, I ges) determined by the measuring device in real time, characterized in that the number (n) is adapted in real time, flexibly and automatically to presently existing measuring conditions on the basis of the target-object-related measured value (Z, Z', M1-M3, I ges).