An apparatus (700, 1100) for analyzing a component of an object, the apparatus comprising: (i) an image sensor (100, 200, 300, 710,1110) comprising (a) optical modules (711, 1111), wherein each of the optical modules (711, 1111) comprises: a light source configured to emit a source light; a first detector configured to detect a first light that is scattered or reflected from the object on which the emitted source light is incident; and a second detector configured to detect a second light that is emitted by the light source but is not incident on the object; and (b) a substrate on which the optical modules are disposed one by one at each node of the substrate to form a network structure, wherein the light source is disposed on a first surface of the substrate, and the first detector and the second detector are disposed on a second surface of the substrate, wherein the second surface of the substrate is an opposite surface to the first surface of the substrate; and (ii) a processor configured to: calculate a scattering coefficient and an absorption coefficient, based on the detected first light and the detected second light; generate separately a scattering image and a first absorption image, based on the calculated scattering coefficient and the calculated absorption coefficient; and analyze the component of the object, based on the calculated scattering coefficient and the calculated absorption coefficient. (i) an image sensor (100, 200, 300, 710,1110) comprising (a) optical modules (711, 1111), wherein each of the optical modules (711, 1111) comprises: a light source configured to emit a source light; a first detector configured to detect a first light that is scattered or reflected from the object on which the emitted source light is incident; and a second detector configured to detect a second light that is emitted by the light source but is not incident on the object; and (b) a substrate on which the optical modules are disposed one by one at each node of the substrate to form a network structure, wherein the light source is disposed on a first surface of the substrate, and the first detector and the second detector are disposed on a second surface of the substrate, wherein the second surface of the substrate is an opposite surface to the first surface of the substrate; and (a) optical modules (711, 1111), wherein each of the optical modules (711, 1111) comprises: a light source configured to emit a source light; a first detector configured to detect a first light that is scattered or reflected from the object on which the emitted source light is incident; and a second detector configured to detect a second light that is emitted by the light source but is not incident on the object; and a light source configured to emit a source light; a first detector configured to detect a first light that is scattered or reflected from the object on which the emitted source light is incident; and a second detector configured to detect a second light that is emitted by the light source but is not incident on the object; and (b) a substrate on which the optical modules are disposed one by one at each node of the substrate to form a network structure, wherein the light source is disposed on a first surface of the substrate, and the first detector and the second detector are disposed on a second surface of the substrate, wherein the second surface of the substrate is an opposite surface to the first surface of the substrate; and (ii) a processor configured to: calculate a scattering coefficient and an absorption coefficient, based on the detected first light and the detected second light; generate separately a scattering image and a first absorption image, based on the calculated scattering coefficient and the calculated absorption coefficient; and analyze the component of the object, based on the calculated scattering coefficient and the calculated absorption coefficient. calculate a scattering coefficient and an absorption coefficient, based on the detected first light and the detected second light; generate separately a scattering image and a first absorption image, based on the calculated scattering coefficient and the calculated absorption coefficient; and analyze the component of the object, based on the calculated scattering coefficient and the calculated absorption coefficient.