A cutting tool comprising a base material and a coating layer provided on the base material, the coating layer including a titanium carbonitride layer provided on the base material, an intermediate layer provided on the titanium carbonitride layer in contact therewith, and an alumina layer provided on the intermediate layer in contact therewith, the intermediate layer being made of only a carbonitroxide of titanium or a carbonitroxide of titanium and an inevitable impurity, the coating layer having a thickness of more than or equal to 7 μm and less than or equal to 30 μm, the titanium carbonitride layer having a thickness of more than or equal to 3 μm and less than or equal to 20 μm, the intermediate layer having a thickness of more than 1 μm and less than or equal to 3 μm, and the alumina layer having a thickness of more than or equal to 3 μm and less than or equal to 20 μm, the thicknesses being determined using a scanning transition electron microscope using the method described in the description, when P C1 atomic % represents an atomic ratio of the carbon in an interface between the intermediate layer and the alumina layer, and P C2 atomic % represents an atomic ratio of the carbon at a point A away from the interface by 1 μm on a side of the intermediate layer, a ratio P C1 /P C2 of the P C1 to the P C2 being more than or equal to 1.03, the position of the interface being determined by the method described in the description, wherein the atomic ratios of elements are calculated by measuring the spectrum on a cross section by Auger electron spectroscopy along a line in the stacking direction of layers and the interface, P B, between the intermediate layer and the alumina layer is defined from the results obtained from the Auger electron spectroscopy analysis of this line as a point where the atomic ratio of aluminum is 10 atomic%, the Auger electron spectroscopy being carried out using the method described in the description. the coating layer including a titanium carbonitride layer provided on the base material, an intermediate layer provided on the titanium carbonitride layer in contact therewith, and an alumina layer provided on the intermediate layer in contact therewith, the intermediate layer being made of only a carbonitroxide of titanium or a carbonitroxide of titanium and an inevitable impurity, the coating layer having a thickness of more than or equal to 7 μm and less than or equal to 30 μm, the titanium carbonitride layer having a thickness of more than or equal to 3 μm and less than or equal to 20 μm, the intermediate layer having a thickness of more than 1 μm and less than or equal to 3 μm, and the alumina layer having a thickness of more than or equal to 3 μm and less than or equal to 20 μm, the thicknesses being determined using a scanning transition electron microscope using the method described in the description, when P C1 atomic % represents an atomic ratio of the carbon in an interface between the intermediate layer and the alumina layer, and P C2 atomic % represents an atomic ratio of the carbon at a point A away from the interface by 1 μm on a side of the intermediate layer, a ratio P C1 /P C2 of the P C1 to the P C2 being more than or equal to 1.03, the position of the interface being determined by the method described in the description, wherein the atomic ratios of elements are calculated by measuring the spectrum on a cross section by Auger electron spectroscopy along a line in the stacking direction of layers and the interface, P B, between the intermediate layer and the alumina layer is defined from the results obtained from the Auger electron spectroscopy analysis of this line as a point where the atomic ratio of aluminum is 10 atomic%, the Auger electron spectroscopy being carried out using the method described in the description.