An apparatus comprising: a. a capacitance-type sensor (110, 210) for measuring a parameter; b. a measurement circuit (120,220) comprising: i) at least two calibration capacitors (238,240), one of the calibration capacitors has a known and fixed capacitance that is closer to a lower end of the capacitance-type sensor's measurable range of capacitance, another one of the calibration capacitors has a known and fixed capacitance that is closer to a higher end of the capacitance-type sensor's measurable range of capacitance; ii) a switch for selectively connecting a measuring signal to one of the capacitance-type sensor and respective ones of the calibration capacitors; c. a microprocessor that is connected to the measurement circuit to send commands thereto and to receive data therefrom, wherein the microprocessor is programmed to: i) command the position of the switch; ii) determine, for each of the respective calibration capacitors, an error between measured data that is collected by the measurement circuit when it is connected to respective ones of the calibration capacitors, and predefined data associated with the known capacitance; iii) extrapolate between measured data and predefined data to calculate a correction value for the measurement circuit when it is connected to the capacitance-type sensor; and iv) determine a corrected data measurement by applying the correction value to said measured data that is collected by the measurement circuit when it is connected to the capacitance-type sensor. a. a capacitance-type sensor (110, 210) for measuring a parameter; b. a measurement circuit (120,220) comprising: i) at least two calibration capacitors (238,240), one of the calibration capacitors has a known and fixed capacitance that is closer to a lower end of the capacitance-type sensor's measurable range of capacitance, another one of the calibration capacitors has a known and fixed capacitance that is closer to a higher end of the capacitance-type sensor's measurable range of capacitance; ii) a switch for selectively connecting a measuring signal to one of the capacitance-type sensor and respective ones of the calibration capacitors; i) at least two calibration capacitors (238,240), one of the calibration capacitors has a known and fixed capacitance that is closer to a lower end of the capacitance-type sensor's measurable range of capacitance, another one of the calibration capacitors has a known and fixed capacitance that is closer to a higher end of the capacitance-type sensor's measurable range of capacitance; ii) a switch for selectively connecting a measuring signal to one of the capacitance-type sensor and respective ones of the calibration capacitors; c. a microprocessor that is connected to the measurement circuit to send commands thereto and to receive data therefrom, wherein the microprocessor is programmed to: i) command the position of the switch; ii) determine, for each of the respective calibration capacitors, an error between measured data that is collected by the measurement circuit when it is connected to respective ones of the calibration capacitors, and predefined data associated with the known capacitance; iii) extrapolate between measured data and predefined data to calculate a correction value for the measurement circuit when it is connected to the capacitance-type sensor; and iv) determine a corrected data measurement by applying the correction value to said measured data that is collected by the measurement circuit when it is connected to the capacitance-type sensor. i) command the position of the switch; ii) determine, for each of the respective calibration capacitors, an error between measured data that is collected by the measurement circuit when it is connected to respective ones of the calibration capacitors, and predefined data associated with the known capacitance; iii) extrapolate between measured data and predefined data to calculate a correction value for the measurement circuit when it is connected to the capacitance-type sensor; and iv) determine a corrected data measurement by applying the correction value to said measured data that is collected by the measurement circuit when it is connected to the capacitance-type sensor.