A circuit, comprising: an inertial measurement unit configured to be oscillated via a driving signal (D +, D -, Dsq) produced by driving circuitry (14A, 14B, 16, 18, 20A, 20B, 22, 24, 26, 28, 30, 32), and a lock-in amplifier receiving a sensing signal (S +, S -, Ssq) from the inertial measurement unit as well as a reference demodulation signal which is a function of the driving signal (D +, D -, Dsq), wherein the lock-in amplifier is configured to produce an inertial measurement signal (Vout) based on the sensing signal (S+, S -, Ssq) from the inertial measurement unit and the reference demodulation signal, wherein the reference demodulation signal is affected by a variable phase error, characterized by further comprising: phase meter circuitry configured to receive the driving signal (D +, D -, Dsq) and the sensing signal (S+, S -, Ssq) and produce, as a function of the phase difference ( ΔΦds) between the driving signal (D +, D -, Dsq) and the sensing signal (S +, S -, S sq), a phase correction signal for the reference demodulation signal of the lock-in amplifier, and a correction node configured to apply the phase correction signal to the reference demodulation signal of the lock-in amplifier wherein, in response to the phase correction signal being applied to the reference demodulation signal of the lock-in amplifier said phase error is maintained in the vicinity of a reference value ( Φer0). an inertial measurement unit configured to be oscillated via a driving signal (D +, D -, Dsq) produced by driving circuitry (14A, 14B, 16, 18, 20A, 20B, 22, 24, 26, 28, 30, 32), and a lock-in amplifier receiving a sensing signal (S +, S -, Ssq) from the inertial measurement unit as well as a reference demodulation signal which is a function of the driving signal (D +, D -, Dsq), wherein the lock-in amplifier is configured to produce an inertial measurement signal (Vout) based on the sensing signal (S+, S -, Ssq) from the inertial measurement unit and the reference demodulation signal, wherein the reference demodulation signal is affected by a variable phase error, characterized by further comprising: phase meter circuitry configured to receive the driving signal (D +, D -, Dsq) and the sensing signal (S+, S -, Ssq) and produce, as a function of the phase difference ( ΔΦds) between the driving signal (D +, D -, Dsq) and the sensing signal (S +, S -, S sq), a phase correction signal for the reference demodulation signal of the lock-in amplifier, and a correction node configured to apply the phase correction signal to the reference demodulation signal of the lock-in amplifier wherein, in response to the phase correction signal being applied to the reference demodulation signal of the lock-in amplifier said phase error is maintained in the vicinity of a reference value ( Φer0). phase meter circuitry configured to receive the driving signal (D +, D -, Dsq) and the sensing signal (S+, S -, Ssq) and produce, as a function of the phase difference ( ΔΦds) between the driving signal (D +, D -, Dsq) and the sensing signal (S +, S -, S sq), a phase correction signal for the reference demodulation signal of the lock-in amplifier, and a correction node configured to apply the phase correction signal to the reference demodulation signal of the lock-in amplifier wherein, in response to the phase correction signal being applied to the reference demodulation signal of the lock-in amplifier said phase error is maintained in the vicinity of a reference value ( Φer0).