A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of cuvettes, the cuvettes comprising first and second cuvettes; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting a rack holding specimen containers each containing a specimen; an operation mode selecting means for selecting one of a first operation mode for supplying the specimen of a first amount, which is a necessary amount for analyzing the specimen, from the specimen container to the first cuvette, and a second operation mode for supplying the specimen of a second amount greater than the first amount from the specimen container to a third cuvette and for supplying the specimen of the first amount from the third cuvette to the second cuvette; a first supplying device for supplying the specimen of the second amount; a second supplying device for supplying the specimen of the first amount; and a supply controlling means for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selecting means, wherein the transporting device is configured to transport the rack such that the specimen container is positioned at a first aspirating position when the first operation mode has been selected and is configured to transport the rack such that the specimen container is positioned at a second aspirating position different from the first aspirating position when the second operation mode has been selected, and wherein the second supplying device is configured to aspirate the specimen of the first amount from the specimen container positioned at the first aspirating position when the first operation mode has been selected, and wherein the first supplying device is configured to aspirate the specimen of the second amount from the specimen container positioned at the second aspirating position when the second operation mode has been selected; and wherein the second amount is greater than the first amount for examining the specimen a plurality of times. a detector for detecting component information regarding a component in a specimen contained in each of cuvettes, the cuvettes comprising first and second cuvettes; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting a rack holding specimen containers each containing a specimen; an operation mode selecting means for selecting one of a first operation mode for supplying the specimen of a first amount, which is a necessary amount for analyzing the specimen, from the specimen container to the first cuvette, and a second operation mode for supplying the specimen of a second amount greater than the first amount from the specimen container to a third cuvette and for supplying the specimen of the first amount from the third cuvette to the second cuvette; a first supplying device for supplying the specimen of the second amount; a second supplying device for supplying the specimen of the first amount; and a supply controlling means for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selecting means, wherein the transporting device is configured to transport the rack such that the specimen container is positioned at a first aspirating position when the first operation mode has been selected and is configured to transport the rack such that the specimen container is positioned at a second aspirating position different from the first aspirating position when the second operation mode has been selected, and wherein the second supplying device is configured to aspirate the specimen of the first amount from the specimen container positioned at the first aspirating position when the first operation mode has been selected, and wherein the first supplying device is configured to aspirate the specimen of the second amount from the specimen container positioned at the second aspirating position when the second operation mode has been selected; and wherein the second amount is greater than the first amount for examining the specimen a plurality of times.