An information processing apparatus comprising: an accepting portion configured to accept a captured image of a structure, as a first image; a detecting portion configured to automatically detect, as defect data, a plurality of respective defect areas of the said structure in the captured image, a display controlling portion configured to display the first image on a display unit, and to display a second image (111, 112) in which the defect data is visualized on the display unit, the second image (111, 112) being superposed on the first image, a selecting portion configured to select, as object defect data, at least one piece of the defect data based on a browsing state of a user or a user instruction, wherein selecting based on a browsing state of a user refers to selecting defect data which the user is browsing, a determining portion configured to determine an offset position for at least the object defect data indicated by the second image (111, 112) with respect to a corresponding defect area in the first image, and a calculating portion configured to calculate an evaluation value related to a relationship between the plurality of defect areas included in the first image and the defect data indicated by the second image (111, 112), wherein the displaying unit is configured to display the first image and the second image (111, 112) on the display unit, in a first display mode of shifting and displaying the second image (111, 112) based on the offset position determined by the determining portion to facilitate a browsing of the first image of an area where the object defect data indicated by the second image (111, 112) is superposed, and in a second display mode of displaying the plurality of defect areas included in the first image and the defect data indicated by the second image (111, 112) such that they are coincident, wherein the displaying unit is configured to switch between the first display mode and the second display mode based on a user instruction, wherein the evaluation value is calculated based on at least one of a value related to an overlap between a plurality of defect areas included in the first image and the defect data indicated by the second image (111, 112), and a value related to an overlap between an edge of the first image and the defect data indicated by the second image (111, 112), and wherein the determining portion is configured to determine the offset position based on the evaluation value calculated by the calculating portion. an accepting portion configured to accept a captured image of a structure, as a first image; a detecting portion configured to automatically detect, as defect data, a plurality of respective defect areas of the said structure in the captured image, a display controlling portion configured to display the first image on a display unit, and to display a second image (111, 112) in which the defect data is visualized on the display unit, the second image (111, 112) being superposed on the first image, a selecting portion configured to select, as object defect data, at least one piece of the defect data based on a browsing state of a user or a user instruction, wherein selecting based on a browsing state of a user refers to selecting defect data which the user is browsing, a determining portion configured to determine an offset position for at least the object defect data indicated by the second image (111, 112) with respect to a corresponding defect area in the first image, and a calculating portion configured to calculate an evaluation value related to a relationship between the plurality of defect areas included in the first image and the defect data indicated by the second image (111, 112), wherein the displaying unit is configured to display the first image and the second image (111, 112) on the display unit, in a first display mode of shifting and displaying the second image (111, 112) based on the offset position determined by the determining portion to facilitate a browsing of the first image of an area where the object defect data indicated by the second image (111, 112) is superposed, and in a second display mode of displaying the plurality of defect areas included in the first image and the defect data indicated by the second image (111, 112) such that they are coincident, wherein the displaying unit is configured to switch between the first display mode and the second display mode based on a user instruction, wherein the evaluation value is calculated based on at least one of a value related to an overlap between a plurality of defect areas included in the first image and the defect data indicated by the second image (111, 112), and a value related to an overlap between an edge of the first image and the defect data indicated by the second image (111, 112), and wherein the determining portion is configured to determine the offset position based on the evaluation value calculated by the calculating portion.