Test system (100, 200, 300, 400) for testing a device under test (180, 280, 380, 480) comprising an antenna array with multiple antennas and capable of controlling a radiation pattern of the antenna array, the test system comprising: a) a test antenna system (101, 201, 301, 401) adapted to emit outgoing test signals (102, 202, 302, 402) to the device under test and to receive incoming test signals (103, 203, 303, 403) from the device under test, b) a control unit (104, 204, 304, 404) adapted to control the device under test to set a first radiation pattern (105, 205, 305, 405) with a theoretical main lobe pointing to the test antenna system or to set a second radiation pattern (106, 206, 306, 406) with a main lobe comprising an angle larger than 0° with the main lobe of the first radiation pattern, c) a test processing unit (108, 208, 308, 408) adapted to evaluate the device under test based on signal levels of incoming test signals (103, 203, 303, 404) received by the test antenna system from the device under test and/or based on signal levels of outgoing test signals (102, 202, 302, 402) as received by the device under test; d) wherein the test processing unit comprises an incoming signal evaluation unit adapted to verify if a received first incoming test signal with the first radiation pattern set comprises a signal level within a first predefined incoming signal level range and if a received second incoming test signal with the second radiation pattern set comprises a signal level within a second predefined incoming signal level range; and/or e1) wherein the test processing unit comprises an outgoing signal evaluation unit adapted to evaluate if a received first outgoing test signal comprises a signal level within a first predefined outgoing signal level range and if a received second outgoing test signal comprises a signal level within a second predefined outgoing signal level range, and e2) wherein the outgoing signal evaluation unit is adapted to perform the evaluation based on a signal information received from the device under test regarding the signal levels of the emitted first outgoing test signal as received by the device under test with the first radiation pattern set and the emitted second outgoing test signal as received by the device under test with the second radiation pattern set; wherein f) the second radiation pattern comprises a theoretical null between the main lobe and a side lobe pointing to the test antenna system (101, 201, 301, 401); and g) wherein the test processing unit (108, 208, 308, 408) further comprises an outgoing signal processor coupled to the test antenna system and adapted to generate and emit the first outgoing test signal emitted to the device under test with the first radiation pattern set and for generating and emitting the second outgoing test signal emitted to the device under test with the second radiation pattern set. a) a test antenna system (101, 201, 301, 401) adapted to emit outgoing test signals (102, 202, 302, 402) to the device under test and to receive incoming test signals (103, 203, 303, 403) from the device under test, b) a control unit (104, 204, 304, 404) adapted to control the device under test to set a first radiation pattern (105, 205, 305, 405) with a theoretical main lobe pointing to the test antenna system or to set a second radiation pattern (106, 206, 306, 406) with a main lobe comprising an angle larger than 0° with the main lobe of the first radiation pattern, c) a test processing unit (108, 208, 308, 408) adapted to evaluate the device under test based on signal levels of incoming test signals (103, 203, 303, 404) received by the test antenna system from the device under test and/or based on signal levels of outgoing test signals (102, 202, 302, 402) as received by the device under test; d) wherein the test processing unit comprises an incoming signal evaluation unit adapted to verify if a received first incoming test signal with the first radiation pattern set comprises a signal level within a first predefined incoming signal level range and if a received second incoming test signal with the second radiation pattern set comprises a signal level within a second predefined incoming signal level range; and/or e1) wherein the test processing unit comprises an outgoing signal evaluation unit adapted to evaluate if a received first outgoing test signal comprises a signal level within a first predefined outgoing signal level range and if a received second outgoing test signal comprises a signal level within a second predefined outgoing signal level range, and e2) wherein the outgoing signal evaluation unit is adapted to perform the evaluation based on a signal information received from the device under test regarding the signal levels of the emitted first outgoing test signal as received by the device under test with the first radiation pattern set and the emitted second outgoing test signal as received by the device under test with the second radiation pattern set; wherein f) the second radiation pattern comprises a theoretical null between the main lobe and a side lobe pointing to the test antenna system (101, 201, 301, 401); and g) wherein the test processing unit (108, 208, 308, 408) further comprises an outgoing signal processor coupled to the test antenna system and adapted to generate and emit the first outgoing test signal emitted to the device under test with the first radiation pattern set and for generating and emitting the second outgoing test signal emitted to the device under test with the second radiation pattern set.