Method for adjusting a Scanning Transmission Electron Microscope (STEM), said STEM equipped with an objective lens and an aberration corrector for correcting aberrations of the objective lens, the corrector excited with an excitation, and the objective lens focused to a focal value F, wherein the method comprises the repeated steps of: a) record a through-focus series of high-resolution STEM images I 1..I n (2A-2E) of a crystalline or poly-crystalline part of a sample, the through-focus series covering a defocus range, b) transform said images (2A-2E) to representations R 1..R n (3A-3E) in reciprocal space, the representations showing a number of spots arranged in a pattern, each of the spots showing an intensity (step 106), c) determine for each of the representations R 1..R n the asymmetry in intensity distribution of at least part of the spots (302, 304), d) change the excitation of the corrector and the focal value F of the objective lens, combining knowledge of the aberration corrector with said asymmetry, e) optionally change the defocus range, and f) optionally record a high-resolution STEM image using the altered values of excitation and/or focus, transform said image to a representation in reciprocal space and determine the symmetry of said representation as well as the distance from the centre of the pattern at which spots can be observed, said distance giving an indication of the maximum transfer limit, said repetition of steps aborted when: • the representation in reciprocal space of the optionally recorded in-focus image shows a symmetry better than a predetermined value and shows a maximum transfer limit higher than a predetermined transfer limit, and/or • the changes in excitation of corrector and objective lens are below predetermined values, and/or • the number of repetitions exceeds a predetermined maximum number of repetitions a) record a through-focus series of high-resolution STEM images I 1..I n (2A-2E) of a crystalline or poly-crystalline part of a sample, the through-focus series covering a defocus range, b) transform said images (2A-2E) to representations R 1..R n (3A-3E) in reciprocal space, the representations showing a number of spots arranged in a pattern, each of the spots showing an intensity (step 106), c) determine for each of the representations R 1..R n the asymmetry in intensity distribution of at least part of the spots (302, 304), d) change the excitation of the corrector and the focal value F of the objective lens, combining knowledge of the aberration corrector with said asymmetry, e) optionally change the defocus range, and f) optionally record a high-resolution STEM image using the altered values of excitation and/or focus, transform said image to a representation in reciprocal space and determine the symmetry of said representation as well as the distance from the centre of the pattern at which spots can be observed, said distance giving an indication of the maximum transfer limit, • the representation in reciprocal space of the optionally recorded in-focus image shows a symmetry better than a predetermined value and shows a maximum transfer limit higher than a predetermined transfer limit, and/or • the changes in excitation of corrector and objective lens are below predetermined values, and/or • the number of repetitions exceeds a predetermined maximum number of repetitions