A computer-implemented method for use in inspecting a composite structure, said method comprising: defining at least one irregularity (270, 450) parameter, wherein defining the at least one irregularity (270, 450) parameter further comprises defining the at least one irregularity (270, 450) parameter including at least one of an irregularity thickness (290, 480), an irregularity width (300, 490), an irregularity length, an irregularity location, and an irregularity shape; defining at least one composite structure parameter; generating at least one model based on the at least one irregularity (270, 450) parameter, wherein the model is a graphical representation of the at least one irregularity (270, 450) parameter; conducting a first simulated inspection to provide a first waveform data set associated with the at least one irregularity (270, 450) parameter, wherein the first simulated inspection is conducted using a first evaluation setting for use in inspecting the composite structure, wherein the first evaluation setting is associated with a stimulating mechanism for stimulation of the composite structure; producing a first image based on the first waveform data set; determining whether a quality of the first image satisfies a predetermined threshold; and wherein, if the quality of the first image satisfies the predetermined threshold, the method further comprises: identifying the first evaluation setting as a desired evaluation setting for use in inspecting the composite structure; or if the quality of the first image does not satisfy the predetermined threshold, the method further comprises: conducting a second simulated inspection to provide a second waveform data set associated with the at least one irregularity (270, 450) parameter, wherein the second simulated inspection is conducted using a second evaluation setting that is different from the first evaluation setting, wherein the quality of the first image does not satisfy the predetermined threshold; producing a second image based on the second waveform data set; determining that a quality of the second image satisfies a predetermined threshold; and identifying the second evaluation setting as a desired evaluation setting for use in inspecting the composite structure. defining at least one irregularity (270, 450) parameter, wherein defining the at least one irregularity (270, 450) parameter further comprises defining the at least one irregularity (270, 450) parameter including at least one of an irregularity thickness (290, 480), an irregularity width (300, 490), an irregularity length, an irregularity location, and an irregularity shape; defining at least one composite structure parameter; generating at least one model based on the at least one irregularity (270, 450) parameter, wherein the model is a graphical representation of the at least one irregularity (270, 450) parameter; conducting a first simulated inspection to provide a first waveform data set associated with the at least one irregularity (270, 450) parameter, wherein the first simulated inspection is conducted using a first evaluation setting for use in inspecting the composite structure, wherein the first evaluation setting is associated with a stimulating mechanism for stimulation of the composite structure; producing a first image based on the first waveform data set; determining whether a quality of the first image satisfies a predetermined threshold; and wherein, if the quality of the first image satisfies the predetermined threshold, the method further comprises: identifying the first evaluation setting as a desired evaluation setting for use in inspecting the composite structure; or if the quality of the first image does not satisfy the predetermined threshold, the method further comprises: identifying the first evaluation setting as a desired evaluation setting for use in inspecting the composite structure; or if the quality of the first image does not satisfy the predetermined threshold, the method further comprises: conducting a second simulated inspection to provide a second waveform data set associated with the at least one irregularity (270, 450) parameter, wherein the second simulated inspection is conducted using a second evaluation setting that is different from the first evaluation setting, wherein the quality of the first image does not satisfy the predetermined threshold; producing a second image based on the second waveform data set; determining that a quality of the second image satisfies a predetermined threshold; and identifying the second evaluation setting as a desired evaluation setting for use in inspecting the composite structure.