A sample analyzing system, comprising: a plasma ionization source configured to ionize a sample(s) under ambient pressure; characterised in that the system further comprises: an ion mobility spectrometer configured to operate under ambient pressure, wherein the ion mobility spectrometer comprises an inlet, an ionization region, a ion separation region, and a detector, arranged such that the ionization region is downstream of the inlet, the ion separation region is downstream of the ionization region, and the detector is downstream of the ion separation region; and a sample transport assembly configured to transport the sample through the inlet of the ion mobility spectrometer and to the ionization region, wherein the sample transport assembly is in physical communication with the plasma ionization source; wherein ionization of the sample occurs in-situ within the ionization region of the ion mobility spectrometer; and wherein the ion mobility spectrometer is operable such that the electric field at the inlet of the ion mobility spectrometer is greater than an electric field produced by the plasma ionization source when both the ion mobility spectrometer and the plasma ionization source are activated. a plasma ionization source configured to ionize a sample(s) under ambient pressure; characterised in that the system further comprises: an ion mobility spectrometer configured to operate under ambient pressure, wherein the ion mobility spectrometer comprises an inlet, an ionization region, a ion separation region, and a detector, arranged such that the ionization region is downstream of the inlet, the ion separation region is downstream of the ionization region, and the detector is downstream of the ion separation region; and a sample transport assembly configured to transport the sample through the inlet of the ion mobility spectrometer and to the ionization region, wherein the sample transport assembly is in physical communication with the plasma ionization source; wherein ionization of the sample occurs in-situ within the ionization region of the ion mobility spectrometer; and wherein the ion mobility spectrometer is operable such that the electric field at the inlet of the ion mobility spectrometer is greater than an electric field produced by the plasma ionization source when both the ion mobility spectrometer and the plasma ionization source are activated. an ion mobility spectrometer configured to operate under ambient pressure, wherein the ion mobility spectrometer comprises an inlet, an ionization region, a ion separation region, and a detector, arranged such that the ionization region is downstream of the inlet, the ion separation region is downstream of the ionization region, and the detector is downstream of the ion separation region; and a sample transport assembly configured to transport the sample through the inlet of the ion mobility spectrometer and to the ionization region, wherein the sample transport assembly is in physical communication with the plasma ionization source; wherein ionization of the sample occurs in-situ within the ionization region of the ion mobility spectrometer; and wherein the ion mobility spectrometer is operable such that the electric field at the inlet of the ion mobility spectrometer is greater than an electric field produced by the plasma ionization source when both the ion mobility spectrometer and the plasma ionization source are activated.