A system (10a, 10b) for determining a material property at an interface (12a, 12b) between a first layer (14a, 14b) and a second layer (16a, 16b) of a sample (18a, 18b), wherein the interface is generally an area of adhesion between the first layer (14a, 14b) and the second layer (16a, 16b), the system comprising: a transmitter (22a, 22b) configured to output electromagnetic radiation (36a, 36b) to the sample (18a, 18b); a receiver (24a, 24b) configured to receive electromagnetic radiation (38a, 38b) that was reflected by the sample (18a, 18b); a data acquisition device (40a, 40b) configured to digitize the electromagnetic radiation reflected by the sample (18a, 18b) to yield waveform data, wherein the waveform data represents the radiation reflected by the sample (18a, 18b), the waveform data having a first magnitude, a second magnitude and a third magnitude; wherein the first magnitude represents a reflected portion of the electromagnetic radiation provided to a top surface interface of the first layer (14a, 14b), the second magnitude represents a reflected portion of the electromagnetic radiation provided to the interface (12a, 12b) between the first (14a, 14b) and second (16a, 16b) layers, and the third magnitude represents a reflected portion of the electromagnetic radiation provided to a bottom surface interface of the second layer (16a, 16b), wherein the electromagnetic radiation is terahertz radiation, characterized in that the data acquisition device is configured (40a, 40b) to determine the material property between the first layer (14a, 14b) and the second layer (16a, 16b) of the sample (18a, 18b) by analyzing the second magnitude and/or third magnitude, wherein the material property is an adhesion between the first layer and the second layer, wherein the data acquisition device (40a, 40b) is further configured to determine the adhesion between the first layer (14a, 14b) and the second layer (16a, 16b) of the sample (18a, 18b) by analyzing the waveform data to determine if a fourth magnitude is present in a time between the third magnitude and the second magnitude, wherein the fourth magnitude being present indicates that the first layer (14a, 14b) and the second layer (16a, 16b) are either fully separated or have reduced adhesion, wherein the fourth magnitude represents a reflected portion of the electromagnetic radiation provided to a top surface interface of the second layer (16a, 16b) and wherein the data acquisition device (40a, 40b) is further configured to determine that there is reduced adhesion between the first layer (14a, 14b) and the second layer (16a, 16b) when a fourth magnitude is located between the third magnitude and the second magnitude in time. a transmitter (22a, 22b) configured to output electromagnetic radiation (36a, 36b) to the sample (18a, 18b); a receiver (24a, 24b) configured to receive electromagnetic radiation (38a, 38b) that was reflected by the sample (18a, 18b); a data acquisition device (40a, 40b) configured to digitize the electromagnetic radiation reflected by the sample (18a, 18b) to yield waveform data, wherein the waveform data represents the radiation reflected by the sample (18a, 18b), the waveform data having a first magnitude, a second magnitude and a third magnitude; wherein the first magnitude represents a reflected portion of the electromagnetic radiation provided to a top surface interface of the first layer (14a, 14b), the second magnitude represents a reflected portion of the electromagnetic radiation provided to the interface (12a, 12b) between the first (14a, 14b) and second (16a, 16b) layers, and the third magnitude represents a reflected portion of the electromagnetic radiation provided to a bottom surface interface of the second layer (16a, 16b), wherein the electromagnetic radiation is terahertz radiation,