An X-ray detector (20; 32) comprising: a first detector module having a first detection region arranged in a first detection plane; a second detector module having a second detection region arranged in a second detection plane, which is neighboring to the first detector module; and a first manipulation means configured to orient the first detection plane of the first detector module and the second detection plane of the second detector module to each other such that a first normal to surface of the first detection plane and a second surface to normal of the second detection plane intersect within a reference region. a further detector module having a further detection region arranged in a further detection plane, which is neighboring to the second detector module and which is arranged relative to the first and second detector modules (32a, 32b) such that the first, second and further detection planes (22, 24) are distributed with their respective centroids tangentially on a circular path at an adjustable radius; and a further manipulation means configured to orient the further detection plane of the further detector module relative to the first and second detection planes (22, 24) such that the first and second normals to surface (22b, 24b), together with a further normal to surface of the further detection plane, intersect within the reference region, characterized in that the first and second detector modules (32a, 32b) are connected relative to one another by a first spring and the second and the further detector module are connected relative to one another by a second spring, wherein a) the first and second springs (66a; 66b) have an equal spring stiffness and the manipulation means (72a; 72b) are configured to vary a distance (l 38a_38c) between the first and further detector modules (32a, 32i) and the springs are configured to orient the X-ray detector (20; 32) along the circular path when varying the distance (l 38a_38c), or wherein b) the manipulation means (72a, 72b) are configured to provide the first and/or further detector module with a torque (M b) or a force, and wherein the springs (66a, 66b) are configured to distribute the torque (M b) or the force evenly along all detector modules (32a to 32i) in order to orient the detector modules (32a to 32i) along the circular path. a first detector module having a first detection region arranged in a first detection plane; a second detector module having a second detection region arranged in a second detection plane, which is neighboring to the first detector module; and a first manipulation means configured to orient the first detection plane of the first detector module and the second detection plane of the second detector module to each other such that a first normal to surface of the first detection plane and a second surface to normal of the second detection plane intersect within a reference region. a further detector module having a further detection region arranged in a further detection plane, which is neighboring to the second detector module and which is arranged relative to the first and second detector modules (32a, 32b) such that the first, second and further detection planes (22, 24) are distributed with their respective centroids tangentially on a circular path at an adjustable radius; and a further manipulation means configured to orient the further detection plane of the further detector module relative to the first and second detection planes (22, 24) such that the first and second normals to surface (22b, 24b), together with a further normal to surface of the further detection plane, intersect within the reference region, a) the first and second springs (66a; 66b) have an equal spring stiffness and the manipulation means (72a; 72b) are configured to vary a distance (l 38a_38c) between the first and further detector modules (32a, 32i) and the springs are configured to orient the X-ray detector (20; 32) along the circular path when varying the distance (l 38a_38c), or wherein b) the manipulation means (72a, 72b) are configured to provide the first and/or further detector module with a torque (M b) or a force, and wherein the springs (66a, 66b) are configured to distribute the torque (M b) or the force evenly along all detector modules (32a to 32i) in order to orient the detector modules (32a to 32i) along the circular path.