A system for identifying a non-switching semiconductor switch, wherein the system has: a first semiconductor switch, which is controllable by means of a first control signal, and a first semiconductor structural element (34b; 34c), which is configured and arranged to prevent a current flow through the first semiconductor structural element (34b; 34c) at least in one direction; a second semiconductor switch, which is controllable by means of a second control signal, and is connected in parallel with the first semiconductor switch, and a second semiconductor structural element (36b; 36c), which is configured and arranged to prevent a current flow through the second semiconductor structural element (36b; 36c) at least in one direction; a first resistor, wherein one end of the first resistor is connected between the first semiconductor switch and the first semiconductor structural element (34b; 34c) and another end of the first resistor is connected to a reference potential, for example to ground; a second resistor, wherein one end of the second resistor is connected between the second semiconductor switch and the second semiconductor structural element (36b; 36c) and another end of the second resistor is connected to the reference potential, for example to ground; and a determination unit, which is configured to identify, based on a profile of a first voltage drop across the first resistor, whether the first semiconductor switch does not switch, and which is configured to identify, based on a profile of a second voltage drop across the second resistor, whether the second semiconductor switch does not switch, characterised in that the determination unit has: a first comparison component, for example a first comparator, which is configured to determine a first comparison profile by comparing the profile of the first voltage with a profile of a reference voltage that drops across a reference resistor; and a second comparison component, for example a second comparator, which is configured to determine a second comparison profile by comparing the profile of the second voltage with the profile of the reference voltage that drops across the reference resistor. a first semiconductor switch, which is controllable by means of a first control signal, and a first semiconductor structural element (34b; 34c), which is configured and arranged to prevent a current flow through the first semiconductor structural element (34b; 34c) at least in one direction; a second semiconductor switch, which is controllable by means of a second control signal, and is connected in parallel with the first semiconductor switch, and a second semiconductor structural element (36b; 36c), which is configured and arranged to prevent a current flow through the second semiconductor structural element (36b; 36c) at least in one direction; a first resistor, wherein one end of the first resistor is connected between the first semiconductor switch and the first semiconductor structural element (34b; 34c) and another end of the first resistor is connected to a reference potential, for example to ground; a second resistor, wherein one end of the second resistor is connected between the second semiconductor switch and the second semiconductor structural element (36b; 36c) and another end of the second resistor is connected to the reference potential, for example to ground; and a determination unit, which is configured to identify, based on a profile of a first voltage drop across the first resistor, whether the first semiconductor switch does not switch, and which is configured to identify, based on a profile of a second voltage drop across the second resistor, whether the second semiconductor switch does not switch, characterised in that the determination unit has: a first comparison component, for example a first comparator, which is configured to determine a first comparison profile by comparing the profile of the first voltage with a profile of a reference voltage that drops across a reference resistor; and a second comparison component, for example a second comparator, which is configured to determine a second comparison profile by comparing the profile of the second voltage with the profile of the reference voltage that drops across the reference resistor. a first comparison component, for example a first comparator, which is configured to determine a first comparison profile by comparing the profile of the first voltage with a profile of a reference voltage that drops across a reference resistor; and a second comparison component, for example a second comparator, which is configured to determine a second comparison profile by comparing the profile of the second voltage with the profile of the reference voltage that drops across the reference resistor.