A system for use in inspecting a coating on a substrate, the system comprising: a sample comprising a substrate having a coating deposited thereon; a platform configured to receive the sample; a light source configured to direct a plurality of electromagnetic pulses towards a scanning location on the coating, wherein the light source is oriented to direct each of the plurality of electromagnetic pulses at a different respective oblique angle relative to the scanning location, on a surface of the coating; a light detector configured to receive electromagnetic pulses reflected from the sample, wherein a first portion of each electromagnetic pulse is reflected from the surface of the coating at an interface between the coating and an ambient environment, and wherein a second portion of each electromagnetic pulse is reflected from a surface of the substrate at an interface between the coating and the substrate; and an actuator coupled to at least one of the platform and the light source, wherein the actuator is configured to move the platform and the light source relative to each other such that the plurality of electromagnetic pulses are directed towards the scanning location from different respective rotational angles relative to a reference axis in a plane of the surface of the coating; the system further comprising a computing device in communication with the light detector, wherein the computing device is configured to: determine a time delay between reception of the first portion and the second portion of each reflected electromagnetic pulse at the light detector, thereby defining a plurality of time delays for the respective plurality of electromagnetic pulses; and analyze whether the time delays for the different respective electromagnetic pulses are different to one another or are substantially equal to one another, to determine a microstructure of the coating. a sample comprising a substrate having a coating deposited thereon; a platform configured to receive the sample; a light source configured to direct a plurality of electromagnetic pulses towards a scanning location on the coating, wherein the light source is oriented to direct each of the plurality of electromagnetic pulses at a different respective oblique angle relative to the scanning location, on a surface of the coating; a light detector configured to receive electromagnetic pulses reflected from the sample, wherein a first portion of each electromagnetic pulse is reflected from the surface of the coating at an interface between the coating and an ambient environment, and wherein a second portion of each electromagnetic pulse is reflected from a surface of the substrate at an interface between the coating and the substrate; and an actuator coupled to at least one of the platform and the light source, wherein the actuator is configured to move the platform and the light source relative to each other such that the plurality of electromagnetic pulses are directed towards the scanning location from different respective rotational angles relative to a reference axis in a plane of the surface of the coating; the system further comprising a computing device in communication with the light detector, wherein the computing device is configured to: determine a time delay between reception of the first portion and the second portion of each reflected electromagnetic pulse at the light detector, thereby defining a plurality of time delays for the respective plurality of electromagnetic pulses; and analyze whether the time delays for the different respective electromagnetic pulses are different to one another or are substantially equal to one another, to determine a microstructure of the coating. determine a time delay between reception of the first portion and the second portion of each reflected electromagnetic pulse at the light detector, thereby defining a plurality of time delays for the respective plurality of electromagnetic pulses; and analyze whether the time delays for the different respective electromagnetic pulses are different to one another or are substantially equal to one another, to determine a microstructure of the coating.