A method for testing at least one energy micro-storage device comprising a anode made of metallic lithium formed by electrodeposition of Li + ions on a metal inert to lithium ions, an electrolyte and a cathode, characterized in that said method comprises a sequence of testing steps during the manufacture of said anode, said sequence containing: - a step of measuring (Ph-a) the initial voltage of said device in open-circuit mode in order to obtain, at a time t0, the value of the initial voltage of said energy micro-storage device; - if said initial voltage is non-zero, a first charging step (Ph-b) comprising: o applying a current Ib for a time tb in order to charge a first portion of said device for a minimum charging time so as to form a first lithium layer thickness at the anode; o measuring the voltage Vb across the terminals of said device; determining the internal resistance Rb; - if the voltage Vb is located within an interval Vb min -Vb max defined on the basis of the architecture of the component and if the resistance Rb is located within an interval Rb min -Rb max defined on the basis of the architecture of the component, a stabilization step (Ph-c) comprising: o continuing to apply at least one current Ic for a time tc in order to charge a second portion of said device for a second charging time tc so as to form a second lithium layer thickness at the anode; o measuring the voltage Vc across the terminals of said device; - if the voltage Vc is located within an interval Vc min -Vc max defined on the basis of the architecture of the component, a retention step (Ph-d) comprising: o applying a zero current for a time td; o measuring the voltage V across the terminals of the device over time; o determining the parameter Vd, where Vd = ΔV/Δt; o if Vd is located within an interval Vd min -Vd max defined on the basis of the architecture of the component, said device is tested as being valid. - a step of measuring (Ph-a) the initial voltage of said device in open-circuit mode in order to obtain, at a time t0, the value of the initial voltage of said energy micro-storage device; - if said initial voltage is non-zero, a first charging step (Ph-b) comprising: o applying a current Ib for a time tb in order to charge a first portion of said device for a minimum charging time so as to form a first lithium layer thickness at the anode; o measuring the voltage Vb across the terminals of said device; determining the internal resistance Rb; o applying a current Ib for a time tb in order to charge a first portion of said device for a minimum charging time so as to form a first lithium layer thickness at the anode; o measuring the voltage Vb across the terminals of said device; - if the voltage Vb is located within an interval Vb min -Vb max defined on the basis of the architecture of the component and if the resistance Rb is located within an interval Rb min -Rb max defined on the basis of the architecture of the component, a stabilization step (Ph-c) comprising: o continuing to apply at least one current Ic for a time tc in order to charge a second portion of said device for a second charging time tc so as to form a second lithium layer thickness at the anode; o measuring the voltage Vc across the terminals of said device; o continuing to apply at least one current Ic for a time tc in order to charge a second portion of said device for a second charging time tc so as to form a second lithium layer thickness at the anode; o measuring the voltage Vc across the terminals of said device; - if the voltage Vc is located within an interval Vc min -Vc max defined on the basis of the architecture of the component, a retention step (Ph-d) comprising: o applying a zero current for a time td; o measuring the voltage V across the terminals of the device over time; o determining the parameter Vd, where Vd = ΔV/Δt; o if Vd is located within an interval Vd min -Vd max defined on the basis of the architecture of the component, said device is tested as being valid. o applying a zero current for a time td; o measuring the voltage V across the terminals of the device over time; o determining the parameter Vd, where Vd = ΔV/Δt; o if Vd is located within an interval Vd min -Vd max defined on the basis of the architecture of the component, said device is tested as being valid.