Optical device for detecting a surface profile of an object surface of an object by means of interferometric distance measurement, comprising a beam splitter for splitting a light beam of a light source into a first partial beam and a second partial beam, wherein the light beam consists of one or several monochromatic light components; a beam splitter for splitting each partial beam (410, 420) of the light source into a reference beam (470, 480) and a measuring beam (430, 440); a mirror for reflecting the two reference beams (470, 480), which is designed to generate a phase difference between the reflected beams (490, 500); a detector unit for detecting evaluation beams (520, 510); and a signal evaluation unit for evaluating the detected evaluation beams (520, 510) and determining the surface profile; wherein each measuring beam (430, 440) is directed for reflection onto a measuring area on the object surface and, after reflection, is directed to the beam splitter as an object beam (450, 460); each reference beam (470, 480) is reflected at the mirror and directed to the beam splitter as a mirror beam (490, 500); the object beam (450, 460) and the mirror beam (490, 500) each interfere after impinging on the beam splitter and are each fed as an evaluation beam (520, 510) to a detector unit for evaluation; the signal evaluation unit is designed to determine the intensities of the two evaluation beams (520, 510); and the signal evaluation unit is designed to use the intensities of the two evaluation beams (520, 510) to determine a height profile of the surface, for which height profile the influence of the degree of reflection of the surface on the measured intensities is computationally compensated, and in order to thereby determine a correct profile for object surfaces with non-100% reflection and for object surfaces with different reflection coefficients within an area to be measured, characterized in that the signal evaluation unit is further designed to generate a monochromatic inspection image for each wavelength from the determined reflection coefficients of the object surface and to calculate the reflection coefficients on the basis of the previously determined height profile and the measured signal intensity of at least one of the beams (510 and 520) so that merely one measurement of the intensities of the two evaluation beams (520, 510) is sufficient for determining the height profile of the measuring area observed and for eliminating the influence of the degree of reflection. a beam splitter for splitting each partial beam (410, 420) of the light source into a reference beam (470, 480) and a measuring beam (430, 440); a mirror for reflecting the two reference beams (470, 480), which is designed to generate a phase difference between the reflected beams (490, 500); a detector unit for detecting evaluation beams (520, 510); and a signal evaluation unit for evaluating the detected evaluation beams (520, 510) and determining the surface profile; wherein each measuring beam (430, 440) is directed for reflection onto a measuring area on the object surface and, after reflection, is directed to the beam splitter as an object beam (450, 460); each reference beam (470, 480) is reflected at the mirror and directed to the beam splitter as a mirror beam (490, 500); the object beam (450, 460) and the mirror beam (490, 500) each interfere after impinging on the beam splitter and are each fed as an evaluation beam (520, 510) to a detector unit for evaluation; the signal evaluation unit is designed to determine the intensities of the two evaluation beams (520, 510); and the signal evaluation unit is designed to use the intensities of the two evaluation beams (520, 510) to determine a height profile of the surface, for which height profile the influence of the degree of reflection of the surface on the measured intensities is computationally compensated, and in order to thereby determine a correct profile for object surfaces with non-100% reflection and for object surfaces with different reflection coefficients within an area to be measured, characterized in that the signal evaluation unit is further designed to generate a monochromatic inspection image for each wavelength from the determined reflection coefficients of the object surface and to calculate the reflection coefficients on the basis of the previously determined height profile and the measured signal intensity of at least one of the beams (510 and 520) so that merely one measurement of the intensities of the two evaluation beams (520, 510) is sufficient for determining the height profile of the measuring area observed and for eliminating the influence of the degree of reflection.