A measurement system for characterizing a device under test, comprising a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module, wherein the device under test is established as an RF-to-digital device comprising an analog input, or wherein the device under test is established as a digital-to-RF device comprising a digital input, wherein the signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test, wherein, in the case of generating the analog stimulus signal by means of the signal source, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test is configured to generate a digital output signal based on the analog stimulus signal received, wherein the digital output signal is forwarded to the analysis module, wherein, in the case of generating the digital instruction signal by means of the signal source, the device under test is configured to generate an analog output signal based on the digital instruction signal received, wherein the directional element is configured to forward the analog output signal generated to the analysis module, and wherein the analysis module is configured to determine at least one characteristic parameter of the device under test based on the analog output signal of the device under test or the digital output signal of the device under test, wherein the device under test has a transmitting mode, in which the device under test receives the digital instruction signal and generates the analog output signal, characterized in that the signal source is configured to generate an analog test signal if the device under test is in the transmitting mode, wherein the directional element is configured to forward the analog test signal to the analog input of the device under test, and wherein the directional element is configured to forward a reflected portion of the analog test signal reflected at the analog input to the analysis module, such that the reflected portion of the analog test signal and the analog output signal generated by the device under test are forwarded to the analysis module. wherein the device under test is established as an RF-to-digital device comprising an analog input, or wherein the device under test is established as a digital-to-RF device comprising a digital input, wherein the signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test, wherein, in the case of generating the analog stimulus signal by means of the signal source, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test is configured to generate a digital output signal based on the analog stimulus signal received, wherein the digital output signal is forwarded to the analysis module, wherein, in the case of generating the digital instruction signal by means of the signal source, the device under test is configured to generate an analog output signal based on the digital instruction signal received, wherein the directional element is configured to forward the analog output signal generated to the analysis module, and wherein the analysis module is configured to determine at least one characteristic parameter of the device under test based on the analog output signal of the device under test or the digital output signal of the device under test, wherein the device under test has a transmitting mode, in which the device under test receives the digital instruction signal and generates the analog output signal, characterized in that the signal source is configured to generate an analog test signal if the device under test is in the transmitting mode, wherein the directional element is configured to forward the analog test signal to the analog input of the device under test, and wherein the directional element is configured to forward a reflected portion of the analog test signal reflected at the analog input to the analysis module, such that the reflected portion of the analog test signal and the analog output signal generated by the device under test are forwarded to the analysis module.