A method for producing fine silver particles, the method comprising the steps of: preparing water as a solvent, an aliphatic amine having a carbon number of not less than 6 serving as an organic protective material, a reducing agent, and a silver compound; and adding the aliphatic amine, the reducing agent and the silver compound to the water to carry out a reduction treatment of the silver compound at a temperature of 10 to 50 °C by stirring a mixed solution of the aliphatic amine, the reducing agent, the silver compound and the water while blowing an inert gas into the mixed solution, to form fine silver particles having an average primary particle diameter of from 10 nm to 500 nm, wherein the aliphatic amine serving as the organic protective material is added so that the molar ratio thereof to silver of the silver compound is in the range of from 0.05 to 0.6, wherein the reducing agent is added so that the molar ratio thereof to silver of the silver compound is in the range of from 1 to 6, wherein the silver compound is added so that the concentration of silver ions in the mixed solution is in the range of from 0.03 mol/L to 0.2 mol/L, wherein said aliphatic amine is at least one selected from the group consisting of octylamine, hexylamine and oleylamine, and wherein the average primary particle diameter of the fine silver particles is calculated by an image analysis software with respect to optionally selected 100 or more of fine silver particles on a scanning electron micrograph or transmission electron micrograph obtained by observing the fine silver particles by means of a scanning electron microscope or a transmission electron microscope at a predetermined magnification which is a magnification of 180,000 by the transmission electron micrograph when the particle diameter is not greater than 20 nm, a magnification of 80,000 by the scanning electron micrograph when the particle diameter is greater than 20 nm and not greater than 30 nm, a magnification of 50,000 by the scanning electron micrograph when the particle diameter is greater than 30 nm and not greater than 100 nm, a magnification of 30,000 by the scanning electron micrograph when the particle diameter is greater than 100 nm and not greater than 300 nm, and a magnification of 10,000 when the particle diameter is greater than 300 nm. preparing water as a solvent, an aliphatic amine having a carbon number of not less than 6 serving as an organic protective material, a reducing agent, and a silver compound; and adding the aliphatic amine, the reducing agent and the silver compound to the water to carry out a reduction treatment of the silver compound at a temperature of 10 to 50 °C by stirring a mixed solution of the aliphatic amine, the reducing agent, the silver compound and the water while blowing an inert gas into the mixed solution, to form fine silver particles having an average primary particle diameter of from 10 nm to 500 nm, wherein the aliphatic amine serving as the organic protective material is added so that the molar ratio thereof to silver of the silver compound is in the range of from 0.05 to 0.6, wherein the reducing agent is added so that the molar ratio thereof to silver of the silver compound is in the range of from 1 to 6, wherein the silver compound is added so that the concentration of silver ions in the mixed solution is in the range of from 0.03 mol/L to 0.2 mol/L, wherein said aliphatic amine is at least one selected from the group consisting of octylamine, hexylamine and oleylamine, and wherein the average primary particle diameter of the fine silver particles is calculated by an image analysis software with respect to optionally selected 100 or more of fine silver particles on a scanning electron micrograph or transmission electron micrograph obtained by observing the fine silver particles by means of a scanning electron microscope or a transmission electron microscope at a predetermined magnification which is a magnification of 180,000 by the transmission electron micrograph when the particle diameter is not greater than 20 nm, a magnification of 80,000 by the scanning electron micrograph when the particle diameter is greater than 20 nm and not greater than 30 nm, a magnification of 50,000 by the scanning electron micrograph when the particle diameter is greater than 30 nm and not greater than 100 nm, a magnification of 30,000 by the scanning electron micrograph when the particle diameter is greater than 100 nm and not greater than 300 nm, and a magnification of 10,000 when the particle diameter is greater than 300 nm.