An optical characteristics measuring device, comprising: an illumination device capable of illuminating a measured site of a measurement object with illumination light of which an illumination angle is changed to a plurality of illumination angles; an imaging element configured to receive reflected light from the measured site of each beam of the illumination light having the illumination angle changed and converts the reflected light into an image; and an analysis unit configured to set, as an analysis area, a specific area at a position in the image where a specular reflection component reflected by a surface of the measured site is not received with respect to any beam of the illumination light having the illumination angle changed in a light receiving area in the imaging element, and analyze an optical characteristic of the measured site on the basis of a light reception result in the analysis area when the measured site is irradiated with each beam of the illumination light, wherein the illumination device is a single illumination display device configured to change the illumination angle into the plurality of illumination angles by moving a display position of a specific illumination pattern, and a moving direction of the illumination pattern is a direction parallel and/or perpendicular to a plane formed by a normal of the measured site, a normal of the illumination display device, and a normal of the imaging element; wherein the imaging element is a two-dimensional imaging element in which an entire light receiving area is larger than a light receiving portion of the specular reflection component reflected by the surface of the measured site by one beam of illumination light; and wherein the analysis unit is configured to set the analysis area at a position shifted in a direction perpendicular to a first direction, the first direction being the direction in which the position of the light receiving portion of the imaging element for the specular reflection component reflected by the surface of the measured site sequentially moves in response to the change in the illumination angle of the illumination light. an illumination device capable of illuminating a measured site of a measurement object with illumination light of which an illumination angle is changed to a plurality of illumination angles; an imaging element configured to receive reflected light from the measured site of each beam of the illumination light having the illumination angle changed and converts the reflected light into an image; and an analysis unit configured to set, as an analysis area, a specific area at a position in the image where a specular reflection component reflected by a surface of the measured site is not received with respect to any beam of the illumination light having the illumination angle changed in a light receiving area in the imaging element, and analyze an optical characteristic of the measured site on the basis of a light reception result in the analysis area when the measured site is irradiated with each beam of the illumination light, wherein the illumination device is a single illumination display device configured to change the illumination angle into the plurality of illumination angles by moving a display position of a specific illumination pattern, and a moving direction of the illumination pattern is a direction parallel and/or perpendicular to a plane formed by a normal of the measured site, a normal of the illumination display device, and a normal of the imaging element; wherein the imaging element is a two-dimensional imaging element in which an entire light receiving area is larger than a light receiving portion of the specular reflection component reflected by the surface of the measured site by one beam of illumination light; and wherein the analysis unit is configured to set the analysis area at a position shifted in a direction perpendicular to a first direction, the first direction being the direction in which the position of the light receiving portion of the imaging element for the specular reflection component reflected by the surface of the measured site sequentially moves in response to the change in the illumination angle of the illumination light.