A surface texture measuring machine for measuring a surface texture of an object after adjusting an attitude of the object in parallel to or perpendicular to a predetermined measurement axis, comprising: a stage provided with a turntable on which the object is mounted, the turntable being adapted to rotate the object within a predetermined plane; a contact-type detector having a stylus that is adapted to be brought into contact with a surface of the object; an image probe adapted to capture an image of the surface of the object; a relative movement mechanism adapted to relatively move the turntable and the contact-type detector; and a controller adapted to control the relative movement mechanism and the turntable, the controller including: an image probe control unit adapted to capture the image of the object by the image probe; an inclination calculating unit adapted to calculate an inclination angle (θ) of the object relative to the measurement axis based on the image of the object captured by the image probe control unit; and an attitude adjusting unit adapted to rotate the turntable based on the inclination angle (θ) calculated by the inclination calculating unit and to adjust the attitude of the object in parallel to or perpendicular to the measurement axis; wherein the inclination calculating unit is adapted to calculate the inclination angle (θ) by calculating a generatrix of the object from an outer profile of the object based on the captured image of the object and calculating an inclination angle (θ) of the generatrix relative to the measurement axis as the inclination angle (θ) of the object relative to the measurement axis. a stage provided with a turntable on which the object is mounted, the turntable being adapted to rotate the object within a predetermined plane; a contact-type detector having a stylus that is adapted to be brought into contact with a surface of the object; an image probe adapted to capture an image of the surface of the object; a relative movement mechanism adapted to relatively move the turntable and the contact-type detector; and a controller adapted to control the relative movement mechanism and the turntable, the controller including: an image probe control unit adapted to capture the image of the object by the image probe; an inclination calculating unit adapted to calculate an inclination angle (θ) of the object relative to the measurement axis based on the image of the object captured by the image probe control unit; and an attitude adjusting unit adapted to rotate the turntable based on the inclination angle (θ) calculated by the inclination calculating unit and to adjust the attitude of the object in parallel to or perpendicular to the measurement axis; wherein the inclination calculating unit is adapted to calculate the inclination angle (θ) by calculating a generatrix of the object from an outer profile of the object based on the captured image of the object and calculating an inclination angle (θ) of the generatrix relative to the measurement axis as the inclination angle (θ) of the object relative to the measurement axis. an image probe control unit adapted to capture the image of the object by the image probe; an inclination calculating unit adapted to calculate an inclination angle (θ) of the object relative to the measurement axis based on the image of the object captured by the image probe control unit; and an attitude adjusting unit adapted to rotate the turntable based on the inclination angle (θ) calculated by the inclination calculating unit and to adjust the attitude of the object in parallel to or perpendicular to the measurement axis; wherein the inclination calculating unit is adapted to calculate the inclination angle (θ) by calculating a generatrix of the object from an outer profile of the object based on the captured image of the object and calculating an inclination angle (θ) of the generatrix relative to the measurement axis as the inclination angle (θ) of the object relative to the measurement axis.