A system for microscopic analysis of a sample, comprising: - a microscopic analysis path comprising: - a microscope objective of given nominal numerical aperture in a given field of view; - an illumination path configured to illuminate the sample through the microscope objective according to a first illumination pattern and in a first spectral band; - a detection path comprising said microscope objective, said detection path being configured to detect in said field of view, and according to a detection pattern, a light beam emitted by the sample in response to said illumination of the sample, and to generate a detection signal; - a processing unit configured to generate information on microscopic analysis of the sample from said detection signal; - a sighting path comprising: - said microscope objective; - a full-field illumination device configured to illuminate the sample in a second spectral band; - a two-dimensional detector; - one or more imaging elements forming, with said microscope objective, a full-field imaging device configured to optically conjugate a given effective field of the sample encompassing said field of view with a detection area of the two-dimensional detector, and to form a sighting image in surface reflection of said effective field; - a beam splitter element arranged upstream of the microscope obj ective in order to separate the analysis path and the sighting path; - a display module configured to show said sighting image and, on said sighting image, an image element indicating the position of said detection pattern. - a microscopic analysis path comprising: - a microscope objective of given nominal numerical aperture in a given field of view; - an illumination path configured to illuminate the sample through the microscope objective according to a first illumination pattern and in a first spectral band; - a detection path comprising said microscope objective, said detection path being configured to detect in said field of view, and according to a detection pattern, a light beam emitted by the sample in response to said illumination of the sample, and to generate a detection signal; - a processing unit configured to generate information on microscopic analysis of the sample from said detection signal; - a microscope objective of given nominal numerical aperture in a given field of view; - an illumination path configured to illuminate the sample through the microscope objective according to a first illumination pattern and in a first spectral band; - a detection path comprising said microscope objective, said detection path being configured to detect in said field of view, and according to a detection pattern, a light beam emitted by the sample in response to said illumination of the sample, and to generate a detection signal; - a processing unit configured to generate information on microscopic analysis of the sample from said detection signal; - a sighting path comprising: - said microscope objective; - a full-field illumination device configured to illuminate the sample in a second spectral band; - a two-dimensional detector; - one or more imaging elements forming, with said microscope objective, a full-field imaging device configured to optically conjugate a given effective field of the sample encompassing said field of view with a detection area of the two-dimensional detector, and to form a sighting image in surface reflection of said effective field; - said microscope objective; - a full-field illumination device configured to illuminate the sample in a second spectral band; - a two-dimensional detector; - one or more imaging elements forming, with said microscope objective, a full-field imaging device configured to optically conjugate a given effective field of the sample encompassing said field of view with a detection area of the two-dimensional detector, and to form a sighting image in surface reflection of said effective field; - a beam splitter element arranged upstream of the microscope obj ective in order to separate the analysis path and the sighting path; - a display module configured to show said sighting image and, on said sighting image, an image element indicating the position of said detection pattern.