Optical position-measuring device for detecting the relative position of a scanning unit and a material measure with a measuring graduation, in which the scanning unit and the material measure are movable against one another along at least one measuring direction (x) and - the scanning unit comprises a light source, a first annular scanning graduation, a reflector element, a beam-splitting element and a detection unit, and - a beam emitted by the light source strikes the measuring graduation, where a splitting into at least two partial beams takes place, - the partial beams propagating in the direction of the scanning unit strike the reflector element via the first scanning graduation, - the partial beams experience a reflection by the reflector element in the direction of the measuring graduation, and pass the first scanning graduation on the way to the measuring graduation, and - after renewed exposure of the measuring graduation, the partial beams propagating in the direction of the scanning unit come to overlap and, via the beam splitter element, experience a deflection in the direction of the detection unit where a plurality of position-dependent, phase-shifted scanning signals are detectable, characterized - in that the first scanning graduation (24; 124; 224; 324; 424; 524.1, 524.2; 624) is designed in such a way - that thereby the partial beams incident on it from the measuring graduation (11; 111; 211; 311; 411; 511; 611) are focused onto the reflector element (25; 125; 225; 325; 425; 525.1, 525.2; 625a, 625b), and - in that thereby there is a recollimation of the partial beams which propagate in the direction of the measuring graduation (11; 111; 211; 311; 411; 511; 611) after reflection at the reflector element (25; 125; 225; 325; 425; 525.1, 525.2; 625a, 625b). - the scanning unit comprises a light source, a first annular scanning graduation, a reflector element, a beam-splitting element and a detection unit, and - a beam emitted by the light source strikes the measuring graduation, where a splitting into at least two partial beams takes place, - the partial beams propagating in the direction of the scanning unit strike the reflector element via the first scanning graduation, - the partial beams experience a reflection by the reflector element in the direction of the measuring graduation, and pass the first scanning graduation on the way to the measuring graduation, and - after renewed exposure of the measuring graduation, the partial beams propagating in the direction of the scanning unit come to overlap and, via the beam splitter element, experience a deflection in the direction of the detection unit where a plurality of position-dependent, phase-shifted scanning signals are detectable, characterized - in that the first scanning graduation (24; 124; 224; 324; 424; 524.1, 524.2; 624) is designed in such a way - that thereby the partial beams incident on it from the measuring graduation (11; 111; 211; 311; 411; 511; 611) are focused onto the reflector element (25; 125; 225; 325; 425; 525.1, 525.2; 625a, 625b), and - in that thereby there is a recollimation of the partial beams which propagate in the direction of the measuring graduation (11; 111; 211; 311; 411; 511; 611) after reflection at the reflector element (25; 125; 225; 325; 425; 525.1, 525.2; 625a, 625b).