Method for obtaining an image (I R, I' R) of a sample with the aid of an imaging system comprising at least one light source, a sample support which is configured to receive the sample, and a photodetector array, the sample support being arranged between each light source and the photodetector array, the method comprising the following steps: - a) emission, from different emission positions (P 1, P 2,..., P N) relative to the sample support, of a light beam for illuminating the sample in an illumination direction with the aid of a light source, the different emission positions (P 1, P 2,..., P N) being offset relative to one another in a direction perpendicular to the illumination direction, wherein the emission positions (P 1, P 2) are offset in (a) pair(s), and the two positions (P 1, P 2) of each respective pair are offset relative to an axis which passes substantially through the middle of the sample and is parallel to the illumination direction, - b) acquisition of multiple successive images (I 1, I 2,..., I N) of the sample with the aid of the photodetector array, each image (I 1, I 2,..., I N) being formed by a ray transmitted by the illuminated sample and having at least one elementary diffraction pattern, each elementary diffraction pattern corresponding to waves diffracted on illumination of the sample, each acquired image (I 1, I 2,..., I N) corresponding to a respective emission position (P 1, P 2,..., P N) of the light beam relative to said sample support, - c) calculation of a resulting image (I R, I' R) of the sample from the different acquired images (I 1, I 2,..., I N), characterised in that step c) comprises: - detection of a zone of an acquired image (I 1) that comprises a light artefact, the light artefact having an intensity greater than a predefined threshold, and - replacement, in the resulting image (I R, I' R), of said detected zone that comprises the light artefact by a corresponding zone of a different acquired image (I 2), said corresponding zone not having a light artefact. - a) emission, from different emission positions (P 1, P 2,..., P N) relative to the sample support, of a light beam for illuminating the sample in an illumination direction with the aid of a light source, the different emission positions (P 1, P 2,..., P N) being offset relative to one another in a direction perpendicular to the illumination direction, wherein the emission positions (P 1, P 2) are offset in (a) pair(s), and the two positions (P 1, P 2) of each respective pair are offset relative to an axis which passes substantially through the middle of the sample and is parallel to the illumination direction, - b) acquisition of multiple successive images (I 1, I 2,..., I N) of the sample with the aid of the photodetector array, each image (I 1, I 2,..., I N) being formed by a ray transmitted by the illuminated sample and having at least one elementary diffraction pattern, each elementary diffraction pattern corresponding to waves diffracted on illumination of the sample, each acquired image (I 1, I 2,..., I N) corresponding to a respective emission position (P 1, P 2,..., P N) of the light beam relative to said sample support, - c) calculation of a resulting image (I R, I' R) of the sample from the different acquired images (I 1, I 2,..., I N), - detection of a zone of an acquired image (I 1) that comprises a light artefact, the light artefact having an intensity greater than a predefined threshold, and - replacement, in the resulting image (I R, I' R), of said detected zone that comprises the light artefact by a corresponding zone of a different acquired image (I 2), said corresponding zone not having a light artefact.