A mixed mode vector network analyzer system to measure S- parameters and DC parameters of a differential device under test, wherein the mixed mode vector network analyzer system comprises: a differential transmitter that is configured to provide differential excitation signals to the differential DUT, wherein the differential transmitter comprises: a first transmitter port that is configured to couple to a first DUT port of the differential DUT through a first reflectometer, wherein the first transmitter port is configured to provide in-phase excitation signals to the first DUT port, wherein a ground node of the first reflectometer is connected to a circuit ground point via a first coupling capacitor; and a second transmitter port that is configured to couple to a second DUT port of the differential DUT through a second reflectometer, wherein the second transmitter port is configured to provide 180° out-phase excitation signals to the second DUT port, wherein a ground node of the second reflectometer is connected to the circuit ground point via a second coupling capacitor; a first receiver that is coupled to a measurement port of the first reflectometer, wherein the first reflectometer is configured to provide an output signal, on the first receiver, corresponding to a received signal from the first DUT port of the differential DUT; a second receiver that is coupled to a measurement port of the second reflectometer, wherein the second reflectometer is configured to provide an output signal, on the second receiver, corresponding to a received signal from the second DUT port of the differential DUT, wherein the first reflectometer and the second reflectometer are resistive reflectometers, wherein the output signals on the first receiver and the second receiver are configured to be measured concurrently and synchronously; a first DC measurement circuit connected to the ground node of the first reflectometer; and a second DC measurement circuit connected to the ground node of the second reflectometer; wherein the first receiver and the second receiver is configured to measure S parameters of the differential DUT, wherein the first DC measurement circuit and the second DC measurement circuit is configured to measure DC parameters of the differential DUT. a first transmitter port that is configured to couple to a first DUT port of the differential DUT through a first reflectometer, wherein the first transmitter port is configured to provide in-phase excitation signals to the first DUT port, wherein a ground node of the first reflectometer is connected to a circuit ground point via a first coupling capacitor; and a second transmitter port that is configured to couple to a second DUT port of the differential DUT through a second reflectometer, wherein the second transmitter port is configured to provide 180° out-phase excitation signals to the second DUT port, wherein a ground node of the second reflectometer is connected to the circuit ground point via a second coupling capacitor; a first receiver that is coupled to a measurement port of the first reflectometer, wherein the first reflectometer is configured to provide an output signal, on the first receiver, corresponding to a received signal from the first DUT port of the differential DUT; a second receiver that is coupled to a measurement port of the second reflectometer, wherein the second reflectometer is configured to provide an output signal, on the second receiver, corresponding to a received signal from the second DUT port of the differential DUT, wherein the first reflectometer and the second reflectometer are resistive reflectometers, wherein the output signals on the first receiver and the second receiver are configured to be measured concurrently and synchronously; a first DC measurement circuit connected to the ground node of the first reflectometer; and a second DC measurement circuit connected to the ground node of the second reflectometer; wherein the first receiver and the second receiver is configured to measure S parameters of the differential DUT, wherein the first DC measurement circuit and the second DC measurement circuit is configured to measure DC parameters of the differential DUT.