A computer-implemented method for electromagnetic, EM, modelling and simulation of an EM structure, the EM structure being an electronic packaging structure, to ensure electromagnetic compatibility and to reduce electromagnetic interference of the EM structure, the method comprising: obtaining Eigen vectors of a first EM structure from solution of Maxwell's equations for the first EM structure, wherein Maxwell's equations for the first EM structure (102, 502) are solved during EM modelling and simulation of the first EM structure; characterized in that, the method comprises: when a mesh structure (M1, M3) of the first EM structure (102, 502) is different from that (M2, M4) of a second EM structure (104, 504), interpolating the Eigen vectors of the first EM structure (102, 502) to a second EM structure (104, 504), wherein the second EM structure (104, 504) is a design variant of the first EM structure (102, 502); selecting Eigen vectors of the first EM structure (102, 502) that are to be augmented in Krylov subspace of the second EM structure (104, 504), wherein each Eigen vector has a corresponding Eigen value, wherein each Eigen value has one of a small, medium, and large magnitude, and wherein selecting Eigen vectors comprises selecting an Eigen vector in response to an Eigen value corresponding to the Eigen vector having a small magnitude or a medium magnitude, wherein the Eigen value having medium magnitude corresponds to predetermined number of the smallest interior Eigen values, the Eigen value having small magnitude corresponds to predetermined number of the smallest terminal Eigen values, the Eigen value having large magnitude corresponds to predetermined number of the largest of terminal Eigen values; augmenting the Krylov subspace of the second EM structure (104, 504) with the selected Eigen vectors to form an augmented space; and solving Maxwell's equations for the second EM structure (104, 504) using the augmented space to perform EM modelling and simulation of the second EM structure, wherein solving of the Maxwell's equations is used to ascertain electromagnetic compatibility of the second EM structure. obtaining Eigen vectors of a first EM structure from solution of Maxwell's equations for the first EM structure, wherein Maxwell's equations for the first EM structure (102, 502) are solved during EM modelling and simulation of the first EM structure; characterized in that, the method comprises: when a mesh structure (M1, M3) of the first EM structure (102, 502) is different from that (M2, M4) of a second EM structure (104, 504), interpolating the Eigen vectors of the first EM structure (102, 502) to a second EM structure (104, 504), wherein the second EM structure (104, 504) is a design variant of the first EM structure (102, 502); selecting Eigen vectors of the first EM structure (102, 502) that are to be augmented in Krylov subspace of the second EM structure (104, 504), wherein each Eigen vector has a corresponding Eigen value, wherein each Eigen value has one of a small, medium, and large magnitude, and wherein selecting Eigen vectors comprises selecting an Eigen vector in response to an Eigen value corresponding to the Eigen vector having a small magnitude or a medium magnitude, wherein the Eigen value having medium magnitude corresponds to predetermined number of the smallest interior Eigen values, the Eigen value having small magnitude corresponds to predetermined number of the smallest terminal Eigen values, the Eigen value having large magnitude corresponds to predetermined number of the largest of terminal Eigen values; augmenting the Krylov subspace of the second EM structure (104, 504) with the selected Eigen vectors to form an augmented space; and solving Maxwell's equations for the second EM structure (104, 504) using the augmented space to perform EM modelling and simulation of the second EM structure, wherein solving of the Maxwell's equations is used to ascertain electromagnetic compatibility of the second EM structure. when a mesh structure (M1, M3) of the first EM structure (102, 502) is different from that (M2, M4) of a second EM structure (104, 504), interpolating the Eigen vectors of the first EM structure (102, 502) to a second EM structure (104, 504), wherein the second EM structure (104, 504) is a design variant of the first EM structure (102, 502); selecting Eigen vectors of the first EM structure (102, 502) that are to be augmented in Krylov subspace of the second EM structure (104, 504), wherein each Eigen vector has a corresponding Eigen value, wherein each Eigen value has one of a small, medium, and large magnitude, and wherein selecting Eigen vectors comprises selecting an Eigen vector in response to an Eigen value corresponding to the Eigen vector having a small magnitude or a medium magnitude, wherein the Eigen value having medium magnitude corresponds to predetermined number of the smallest interior Eigen values, the Eigen value having small magnitude corresponds to predetermined number of the smallest terminal Eigen values, the Eigen value having large magnitude corresponds to predetermined number of the largest of terminal Eigen values; augmenting the Krylov subspace of the second EM structure (104, 504) with the selected Eigen vectors to form an augmented space; and solving Maxwell's equations for the second EM structure (104, 504) using the augmented space to perform EM modelling and simulation of the second EM structure, wherein solving of the Maxwell's equations is used to ascertain electromagnetic compatibility of the second EM structure.