A sequential X-ray fluorescence spectrometer configured to irradiate a sample (1, 14, 24) placed at a measurement position with primary X-rays and to determine a content of a component in the sample (1, 14, 24) on the basis of a measured intensity of fluorescent X-rays generated, wherein a sample transfer time represents, in a case of continuous measurement of a plurality of samples (1, 14, 24), a time required for replacement of one sample (1, 14, 24) at the measurement position and, in a case of measurement of only one sample (1, 14, 24), a time required for introduction of that sample (1, 14, 24) to the measurement position from outside of the sequential X-ray fluorescence spectrometer and removal of that sample (1, 14, 24) from the measurement position to the outside of the sequential X-ray fluorescence spectrometer, a total measurement condition change time represents a total time required for changing a measurement condition so as to correspond to each measurement line, which represents fluorescent X-rays having an intensity to be measured, for a sample (1, 14, 24) placed at the measurement position, a total counting time represents a sum of counting times of respective measurement lines for a sample (1, 14, 24) placed at the measurement position, a total non-counting time represents a sum of the sample transfer time and the total measurement condition change time, a total analysis time represents a sum of the total counting time and the total non-counting time, the sequential X-ray fluorescence spectrometer comprises a total analysis time display unit configured to output the total analysis time to a display module, the total analysis time display unit is configured: to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity of each measurement line corresponding to the component, to calculate the total counting time by subtracting the total non-counting time from a specified total analysis time and to calculate counting times of respective components by using the total counting time and respective preset counting time ratios, to calculate, for each component, an analytical precision which is obtained with the calculated counting time by using the standard value and the measured intensity, and to output the specified total analysis time and the calculated analytical precisions of the respective components to the display module. wherein a sample transfer time represents, in a case of continuous measurement of a plurality of samples (1, 14, 24), a time required for replacement of one sample (1, 14, 24) at the measurement position and, in a case of measurement of only one sample (1, 14, 24), a time required for introduction of that sample (1, 14, 24) to the measurement position from outside of the sequential X-ray fluorescence spectrometer and removal of that sample (1, 14, 24) from the measurement position to the outside of the sequential X-ray fluorescence spectrometer, a total measurement condition change time represents a total time required for changing a measurement condition so as to correspond to each measurement line, which represents fluorescent X-rays having an intensity to be measured, for a sample (1, 14, 24) placed at the measurement position, a total counting time represents a sum of counting times of respective measurement lines for a sample (1, 14, 24) placed at the measurement position, a total non-counting time represents a sum of the sample transfer time and the total measurement condition change time, a total analysis time represents a sum of the total counting time and the total non-counting time, the sequential X-ray fluorescence spectrometer comprises a total analysis time display unit configured to output the total analysis time to a display module, the total analysis time display unit is configured: to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity of each measurement line corresponding to the component, to calculate the total counting time by subtracting the total non-counting time from a specified total analysis time and to calculate counting times of respective components by using the total counting time and respective preset counting time ratios, to calculate, for each component, an analytical precision which is obtained with the calculated counting time by using the standard value and the measured intensity, and to output the specified total analysis time and the calculated analytical precisions of the respective components to the display module. to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity of each measurement line corresponding to the component, to calculate the total counting time by subtracting the total non-counting time from a specified total analysis time and to calculate counting times of respective components by using the total counting time and respective preset counting time ratios, to calculate, for each component, an analytical precision which is obtained with the calculated counting time by using the standard value and the measured intensity, and to output the specified total analysis time and the calculated analytical precisions of the respective components to the display module.