A computer-implemented method comprising: under control of one or more processing devices, receiving, from a particle analyzer, measurements for a first portion of particles associated with an experiment as a first raw data set; applying a non-parametric transformation to the first raw data set from the particle analyzer to generate a first transformed data set; generating a second transformed data set with a greater amount of data than the first transformed data set from the first transformed data set; generating a parametric model, comprising a machine learning model, using the second transformed data set to receive, as an input, the first raw data set and generate, as an output, the first transformed data set; and configuring the particle analyzer to: convert a measurement for a particle included in a second portion of the particles associated with the experiment based at least in part on the parametric model; and classify the particle based at least in part on the converted measurement and a sorting criterion; and sort the particle based at least in part on results of the particle classification, wherein sorting the particle comprises: identifying a target vessel for the particle based at least in part on the converted measurement corresponding to a sort criterion associated with the target vessel, and adjusting an operational state for an analytical means included in the particle analyzer, wherein the analytical means comprises sorting electronics communicatively coupled to a deflection plate (252, 254), and wherein adjusting the operational state comprises application of a charge via the deflector plate (252, 254) to direct the particle into a target vessel (272, 274, 276, 278). under control of one or more processing devices, receiving, from a particle analyzer, measurements for a first portion of particles associated with an experiment as a first raw data set; applying a non-parametric transformation to the first raw data set from the particle analyzer to generate a first transformed data set; generating a second transformed data set with a greater amount of data than the first transformed data set from the first transformed data set; generating a parametric model, comprising a machine learning model, using the second transformed data set to receive, as an input, the first raw data set and generate, as an output, the first transformed data set; and configuring the particle analyzer to: convert a measurement for a particle included in a second portion of the particles associated with the experiment based at least in part on the parametric model; and classify the particle based at least in part on the converted measurement and a sorting criterion; and sort the particle based at least in part on results of the particle classification, wherein sorting the particle comprises: identifying a target vessel for the particle based at least in part on the converted measurement corresponding to a sort criterion associated with the target vessel, and adjusting an operational state for an analytical means included in the particle analyzer, wherein the analytical means comprises sorting electronics communicatively coupled to a deflection plate (252, 254), and wherein adjusting the operational state comprises application of a charge via the deflector plate (252, 254) to direct the particle into a target vessel (272, 274, 276, 278). convert a measurement for a particle included in a second portion of the particles associated with the experiment based at least in part on the parametric model; and classify the particle based at least in part on the converted measurement and a sorting criterion; and sort the particle based at least in part on results of the particle classification, wherein sorting the particle comprises: identifying a target vessel for the particle based at least in part on the converted measurement corresponding to a sort criterion associated with the target vessel, and adjusting an operational state for an analytical means included in the particle analyzer, identifying a target vessel for the particle based at least in part on the converted measurement corresponding to a sort criterion associated with the target vessel, and adjusting an operational state for an analytical means included in the particle analyzer, wherein the analytical means comprises sorting electronics communicatively coupled to a deflection plate (252, 254), and wherein adjusting the operational state comprises application of a charge via the deflector plate (252, 254) to direct the particle into a target vessel (272, 274, 276, 278).