A device for scanning range measurement to an object, comprising a light source configured to generate an optical output signal having a varying frequency, a plurality of optical processing units (PU1 to PU4) that are connected optically in parallel to the light source, wherein each processing unit (PU1 to PU4) comprises: an optical distribution matrix (M1 to M4) comprising a plurality of optical switches (S11, S21, S22, S31 to S34) and configured to distribute the optical output signal, which is supplied to the respective processing unit (PU1 to PU4), selectively to different optical waveguides (W11 to W44), a plurality of free space couplers (FSC11 to FSC46), wherein there is a one-to-one correspondence between the optical waveguides (W11 to W44) and the free space couplers such that each free space coupler is connected to an associated optical waveguide, and wherein each free space coupler is configured to outcouple the optical output signal guided in the associated optical waveguides (W11 to W44) into the free space, and to couple an optical output signal, which was reflected on the object, into the associated optical waveguide as an optical measurement signal, a detector (D1 to D4; D11 to D14) configured to detect a superposition of the optical measurement signal with the optical output signal generated by the light source and supplied via a local oscillator light path, and wherein the device further comprises a deflection optical unit configured to deflect the output signals outcoupled from the free space couplers (FSC11 to FSC46) so that they are emitted in different directions, and an evaluation unit configured to determine the range to the object from the superposition detected by the detectors (D1 to D4; D11 to D14), characterized in that each processing unit (PU1 to PU4) further comprises a photonically integrated polarization sensitive light splitter (PS1 to PS4; PS11 to PS14) directing the optical measurement signal guided in the associated optical waveguide (W11 to W44) to the detector (D1 to D4; D11 to D14). a plurality of optical processing units (PU1 to PU4) that are connected optically in parallel to the light source, wherein each processing unit (PU1 to PU4) comprises: an optical distribution matrix (M1 to M4) comprising a plurality of optical switches (S11, S21, S22, S31 to S34) and configured to distribute the optical output signal, which is supplied to the respective processing unit (PU1 to PU4), selectively to different optical waveguides (W11 to W44), a plurality of free space couplers (FSC11 to FSC46), wherein there is a one-to-one correspondence between the optical waveguides (W11 to W44) and the free space couplers such that each free space coupler is connected to an associated optical waveguide, and wherein each free space coupler is configured to outcouple the optical output signal guided in the associated optical waveguides (W11 to W44) into the free space, and to couple an optical output signal, which was reflected on the object, into the associated optical waveguide as an optical measurement signal, a detector (D1 to D4; D11 to D14) configured to detect a superposition of the optical measurement signal with the optical output signal generated by the light source and supplied via a local oscillator light path, an optical distribution matrix (M1 to M4) comprising a plurality of optical switches (S11, S21, S22, S31 to S34) and configured to distribute the optical output signal, which is supplied to the respective processing unit (PU1 to PU4), selectively to different optical waveguides (W11 to W44), a plurality of free space couplers (FSC11 to FSC46), wherein there is a one-to-one correspondence between the optical waveguides (W11 to W44) and the free space couplers such that each free space coupler is connected to an associated optical waveguide, and wherein each free space coupler is configured to outcouple the optical output signal guided in the associated optical waveguides (W11 to W44) into the free space, and to couple an optical output signal, which was reflected on the object, into the associated optical waveguide as an optical measurement signal, outcouple the optical output signal guided in the associated optical waveguides (W11 to W44) into the free space, and to couple an optical output signal, which was reflected on the object, into the associated optical waveguide as an optical measurement signal, a detector (D1 to D4; D11 to D14) configured to detect a superposition of the optical measurement signal with the optical output signal generated by the light source and supplied via a local oscillator light path, and wherein the device further comprises a deflection optical unit configured to deflect the output signals outcoupled from the free space couplers (FSC11 to FSC46) so that they are emitted in different directions, and an evaluation unit configured to determine the range to the object from the superposition detected by the detectors (D1 to D4; D11 to D14),