A film construction, comprising: a plurality of microlayers configured to selectively transmit and reflect light as a function of angle and polarization over an extended wavelength region including visible wavelengths, the microlayers defining a pass axis for normally incident visible light of a first polarization and a block axis for normally incident visible light of a second polarization, wherein the microlayers having a pass axis reflectivity at oblique angles that is greater than a pass axis reflectivity for normally incident visible light; and an optically thick low index layer having a refractive index averaged over visible wavelengths in a range from 1.1 to 1.3 laminated in contact with the microlayers; and a first and second optically thick layer (1312, 1318) arranged such that the optically thick low index layer and the plurality of microlayers are both disposed between the first and second optically thick layers (1312, 1318); wherein the first and second optically thick layers (1312, 1318) have higher refractive indices than that of the optically thick low index layer, wherein the plurality of microlayers has a pass axis, a block axis, and a normal axis, and wherein the plurality of microlayers has an average internal reflectivity over visible wavelengths, as a function of propagation angle θ, of: RPpass(θ) for p-polarized light incident in a pass plane containing the pass axis and the normal axis; RSblock(θ) for s-polarized light incident in the pass plane; RPblock(θ) for p-polarized light incident in a block plane containing the block axis and the normal axis; and RSpass(θ) for s-polarized light incident in the block plane; wherein Rblock(θ) is an average of RSblock(θ) and RPblock(θ), and Rpass(θ) is an average of RSpass(θ) and RPpass(θ); wherein the plurality of microlayers has an average internal transmission over visible wavelengths, as a function of the propagation angle θ, of: TPpass(θ) for p-polarized light incident in the pass plane; TSblock(θ) for s-polarized light incident in the pass plane; TPblock(θ) for p-polarized light incident in the block plane; and TSpass(θ) for s-polarized light incident in the block plane; wherein Tblock(θ) is an average of TSblock(θ) and TPblock(θ), and Tpass(θ) is an average of TSpass(θ) and TPpass(θ), wherein Tblock is less than 10%, and wherein Tpass is in a range from 55% to 75%, and wherein the propagation angle θ is an angle θ air measured in air, and wherein Tpass(θ air = 60°) < 0.85 ∗ Tpass, or wherein the propagation angle θ is an angle θ low index measured in the optically thick low index layer, and wherein Tpass(θ low index = 90°) < 0.6 ∗ Tpass. a plurality of microlayers configured to selectively transmit and reflect light as a function of angle and polarization over an extended wavelength region including visible wavelengths, the microlayers defining a pass axis for normally incident visible light of a first polarization and a block axis for normally incident visible light of a second polarization, wherein the microlayers having a pass axis reflectivity at oblique angles that is greater than a pass axis reflectivity for normally incident visible light; and an optically thick low index layer having a refractive index averaged over visible wavelengths in a range from 1.1 to 1.3 laminated in contact with the microlayers; and a first and second optically thick layer (1312, 1318) arranged such that the optically thick low index layer and the plurality of microlayers are both disposed between the first and second optically thick layers (1312, 1318); wherein the first and second optically thick layers (1312, 1318) have higher refractive indices than that of the optically thick low index layer, wherein the plurality of microlayers has a pass axis, a block axis, and a normal axis, and wherein the plurality of microlayers has an average internal reflectivity over visible wavelengths, as a function of propagation angle θ, of: RPpass(θ) for p-polarized light incident in a pass plane containing the pass axis and the normal axis; RSblock(θ) for s-polarized light incident in the pass plane; RPblock(θ) for p-polarized light incident in a block plane containing the block axis and the normal axis; and RSpass(θ) for s-polarized light incident in the block plane; wherein Rblock(θ) is an average of RSblock(θ) and RPblock(θ), and Rpass(θ) is an average of RSpass(θ) and RPpass(θ); wherein the plurality of microlayers has an average internal transmission over visible wavelengths, as a function of the propagation angle θ, of: TPpass(θ) for p-polarized light incident in the pass plane; TSblock(θ) for s-polarized light incident in the pass plane; TPblock(θ) for p-polarized light incident in the block plane; and TSpass(θ) for s-polarized light incident in the block plane; wherein Tblock(θ) is an average of TSblock(θ) and TPblock(θ), and Tpass(θ) is an average of TSpass(θ) and TPpass(θ), wherein Tblock is less than 10%, and wherein Tpass is in a range from 55% to 75%, and wherein the propagation angle θ is an angle θ air measured in air, and wherein Tpass(θ air = 60°) < 0.85 ∗ Tpass, or wherein the propagation angle θ is an angle θ low index measured in the optically thick low index layer, and wherein Tpass(θ low index = 90°) < 0.6 ∗ Tpass.