An electronic level comprising: a wide-angle lens system having a two-dimensional imaging element configured to form thereon a picture image including images respectively of a plurality of level staffs assigned with identifiable code patterns allowing measurement of height levels, wherein the level staffs are formed by enlarging a single level staff having a code pattern, and dividing the enlarged single level staff to divide the enlarged code pattern into a plurality of code patterns, so that the level staffs are assigned with the code patterns which indicate a height level different from an actual height level; an extraction part configured to extract the images of the plurality of level staffs from the picture image; a height-level measurement value calculation part configured to obtain a height-level measurement value indicated by a portion of the code pattern in each of the images of the plurality of level staffs extracted by the extraction part, the portion of the code pattern located at a collimation optical axis of the wide-angle lens system; and a collimation height calculation part configured to obtain actual collimation heights of the respective level staffs by obtaining offset values used to obtain the actual collimation heights of the level staffs respectively from the height-level measurement values obtained by the height-level measurement value calculation part, by identifying each of the level staffs from the height-level measurement value, and by subtracting the offset values respectively from the height-level measurement values obtained by the height-level measurement value calculation part. a wide-angle lens system having a two-dimensional imaging element configured to form thereon a picture image including images respectively of a plurality of level staffs assigned with identifiable code patterns allowing measurement of height levels, wherein the level staffs are formed by enlarging a single level staff having a code pattern, and dividing the enlarged single level staff to divide the enlarged code pattern into a plurality of code patterns, so that the level staffs are assigned with the code patterns which indicate a height level different from an actual height level; an extraction part configured to extract the images of the plurality of level staffs from the picture image; a height-level measurement value calculation part configured to obtain a height-level measurement value indicated by a portion of the code pattern in each of the images of the plurality of level staffs extracted by the extraction part, the portion of the code pattern located at a collimation optical axis of the wide-angle lens system; and a collimation height calculation part configured to obtain actual collimation heights of the respective level staffs by obtaining offset values used to obtain the actual collimation heights of the level staffs respectively from the height-level measurement values obtained by the height-level measurement value calculation part, by identifying each of the level staffs from the height-level measurement value, and by subtracting the offset values respectively from the height-level measurement values obtained by the height-level measurement value calculation part.