A cutting tool comprising a substrate and a coating provided on the substrate, the coating comprising: a first alumina layer provided on the substrate, a titanium compound layer provided directly on the first alumina layer, and a second alumina layer provided directly on the titanium compound layer, wherein a portion adjacent to the titanium compound layer in the first alumina layer serves as an interface region, a portion that is not the interface region in the first alumina layer serves as a non-interface region, a content of nitrogen in the interface region is 0.2 at% or more and 10.5 at% or less, and a content of nitrogen in the non-interface region is 0 at% or more and 0.15 at% or less; and the titanium compound layer comprises a layer of titanium carbonitride adjacent to the first alumina layer; wherein the content of nitrogen in the interface region and the content of nitrogen in the non-interface region are atomic ratios to the total of aluminum, oxygen, and nitrogen in the first alumina layer, determined by performing line analysis on a cross-sectioned sample parallel to the direction of the normal to the surface of the substrate by Auger electron spectroscopy; and wherein the interface region of the first alumina layer is a region sandwiched between an interface with the titanium compound layer and a virtual plane parallel to the interface that passes through a point 0.5 μm away from the interface in a thickness direction. the coating comprising: a first alumina layer provided on the substrate, a titanium compound layer provided directly on the first alumina layer, and a second alumina layer provided directly on the titanium compound layer, a first alumina layer provided on the substrate, a titanium compound layer provided directly on the first alumina layer, and a second alumina layer provided directly on the titanium compound layer, wherein a portion adjacent to the titanium compound layer in the first alumina layer serves as an interface region, a portion that is not the interface region in the first alumina layer serves as a non-interface region, a content of nitrogen in the interface region is 0.2 at% or more and 10.5 at% or less, and a content of nitrogen in the non-interface region is 0 at% or more and 0.15 at% or less; and the titanium compound layer comprises a layer of titanium carbonitride adjacent to the first alumina layer; wherein the content of nitrogen in the interface region and the content of nitrogen in the non-interface region are atomic ratios to the total of aluminum, oxygen, and nitrogen in the first alumina layer, determined by performing line analysis on a cross-sectioned sample parallel to the direction of the normal to the surface of the substrate by Auger electron spectroscopy; and wherein the interface region of the first alumina layer is a region sandwiched between an interface with the titanium compound layer and a virtual plane parallel to the interface that passes through a point 0.5 μm away from the interface in a thickness direction. wherein the content of nitrogen in the interface region and the content of nitrogen in the non-interface region are atomic ratios to the total of aluminum, oxygen, and nitrogen in the first alumina layer, determined by performing line analysis on a cross-sectioned sample parallel to the direction of the normal to the surface of the substrate by Auger electron spectroscopy; and wherein the interface region of the first alumina layer is a region sandwiched between an interface with the titanium compound layer and a virtual plane parallel to the interface that passes through a point 0.5 μm away from the interface in a thickness direction.