Optical system for parameter characterization of an element of body fluid or tissue comprising an optical device comprising a spectrometer having lower resolution than a reference spectrometer, said system comprising: a light source for emitting light onto the element; and said optical device spectrometer for recording the spectrum of light from the element, said light from the element being of transmittance, reflectance or Raman scattering of the emitted light by said element; the optical system further comprising a data processing module configured to: convert the recorded spectrum by a conversion matrix into a standardized spectrum, wherein said conversion matrix has been obtained by calibrating the optical system spectrum response against a spectrum reference previously measured by the reference spectrometer; pre-process the converted spectrum; correlate, for parameter quantification, the converted pre-processed spectrum with pre-obtained spectral bands for each parameter previously measured by the reference spectrometer; said recorded spectrum being contained within uv-vis-nir wavelengths; wherein the spectral bands for each parameter were pre-obtained by: obtaining sample spectra with the reference spectrometer for known parameter values; pre-processing the obtained sample spectra; correlating the pre-processed spectra with the known parameter values in order to obtain the spectral bands for each parameter; characterised in that the data processing module is further configured to subject the obtained spectra, prior to spectrum pre-processing, to a super-resolution process to obtain higher spectral full width at half maximum, FWHM, than that of the optical limit of the optical device spectrometer, said process comprising: calculating an interpolation model of the higher pixel resolution of the reference spectrometer by local regression, and interpolating the obtained spectra; performing deconvolution of the interpolated spectra by the apodization function of the optical device to resolve convolved information below optical resolution. a light source for emitting light onto the element; and said optical device spectrometer for recording the spectrum of light from the element, said light from the element being of transmittance, reflectance or Raman scattering of the emitted light by said element; the optical system further comprising a data processing module configured to: convert the recorded spectrum by a conversion matrix into a standardized spectrum, wherein said conversion matrix has been obtained by calibrating the optical system spectrum response against a spectrum reference previously measured by the reference spectrometer; pre-process the converted spectrum; correlate, for parameter quantification, the converted pre-processed spectrum with pre-obtained spectral bands for each parameter previously measured by the reference spectrometer; convert the recorded spectrum by a conversion matrix into a standardized spectrum, wherein said conversion matrix has been obtained by calibrating the optical system spectrum response against a spectrum reference previously measured by the reference spectrometer; pre-process the converted spectrum; correlate, for parameter quantification, the converted pre-processed spectrum with pre-obtained spectral bands for each parameter previously measured by the reference spectrometer; said recorded spectrum being contained within uv-vis-nir wavelengths; wherein the spectral bands for each parameter were pre-obtained by: obtaining sample spectra with the reference spectrometer for known parameter values; pre-processing the obtained sample spectra; correlating the pre-processed spectra with the known parameter values in order to obtain the spectral bands for each parameter; characterised in that the data processing module is further configured to subject the obtained spectra, prior to spectrum pre-processing, to a super-resolution process to obtain higher spectral full width at half maximum, FWHM, than that of the optical limit of the optical device spectrometer, said process comprising: calculating an interpolation model of the higher pixel resolution of the reference spectrometer by local regression, and interpolating the obtained spectra; performing deconvolution of the interpolated spectra by the apodization function of the optical device to resolve convolved information below optical resolution. obtaining sample spectra with the reference spectrometer for known parameter values; pre-processing the obtained sample spectra; correlating the pre-processed spectra with the known parameter values in order to obtain the spectral bands for each parameter; characterised in that the data processing module is further configured to subject the obtained spectra, prior to spectrum pre-processing, to a super-resolution process to obtain higher spectral full width at half maximum, FWHM, than that of the optical limit of the optical device spectrometer, said process comprising: calculating an interpolation model of the higher pixel resolution of the reference spectrometer by local regression, and interpolating the obtained spectra; performing deconvolution of the interpolated spectra by the apodization function of the optical device to resolve convolved information below optical resolution. calculating an interpolation model of the higher pixel resolution of the reference spectrometer by local regression, and interpolating the obtained spectra; performing deconvolution of the interpolated spectra by the apodization function of the optical device to resolve convolved information below optical resolution.