A measurement system (10, 80) comprising: a set of N electrical contacts (18, 88) comprising a set of drive electrical contacts comprising a force electrical contact, a return electrical contact; and a measurement electrical contact; wherein each electrical contact is configured to be electrically coupled to a tested material (16, 86); a return node; a voltage source (34, 104); a fixed resistor; and a control module (28, 98); wherein, when the electrical contacts are electrically coupled to the tested material, a circuit path is created between the voltage source and the return node comprising in series the force electrical contact, the fixed resistor, the tested material, and the return electrical contact; and wherein the control module is configured to: cause the voltage source to apply a voltage signal to the force electrical contact; cause a voltage drop across the fixed resistor to be measured; cause a measured voltage to be measured using the measurement electrical contact, wherein the measured voltage is measured relative to a reference voltage; determine a measured equivalent impedance of the tested material associated with the measurement electrical contact based on the voltage drop across the fixed resistor and the measured voltage; and determine whether the tested material includes a crack or other defect based on the measured equivalent impedance and a second equivalent impedance selected from the group consisting of a second measured equivalent impedance and a control equivalent impedance, wherein the measurement system further comprises a set of N fixed resistors, the set of N fixed resistors comprising the fixed resistor, and a respective resistor of the set of N resistors being electrically connected in series with each respective electrical contact of the set of N electrical contacts, wherein the measurement system further comprises a programmable switch array (26, 96), wherein each electrical contact of the set of N electrical contacts is connected to at least one respective electrical contact input of the programmable switch array, and wherein the control module is configured to control the programmable switch array, and wherein: the programmable switch array comprises at least N electrical contact input ports, at least N resistor input ports, at least 4 ∗ N switches, and at least 2 ∗ N inputs; and for each respective electrical contact: the respective electrical contact is electrically connected to an electrical contact input port; and the respective electrical contact is electrically connected via a respective resistor from the set of N resistors to a resistor input port. a set of N electrical contacts (18, 88) comprising a set of drive electrical contacts comprising a force electrical contact, a return electrical contact; and a measurement electrical contact; wherein each electrical contact is configured to be electrically coupled to a tested material (16, 86); a set of drive electrical contacts comprising a force electrical contact, a return electrical contact; and a force electrical contact, a return electrical contact; and a measurement electrical contact; a return node; a voltage source (34, 104); a fixed resistor; and a control module (28, 98); cause the voltage source to apply a voltage signal to the force electrical contact; cause a voltage drop across the fixed resistor to be measured; cause a measured voltage to be measured using the measurement electrical contact, wherein the measured voltage is measured relative to a reference voltage; determine a measured equivalent impedance of the tested material associated with the measurement electrical contact based on the voltage drop across the fixed resistor and the measured voltage; and determine whether the tested material includes a crack or other defect based on the measured equivalent impedance and a second equivalent impedance selected from the group consisting of a second measured equivalent impedance and a control equivalent impedance, wherein the measurement system further comprises a set of N fixed resistors, the set of N fixed resistors comprising the fixed resistor, and a respective resistor of the set of N resistors being electrically connected in series with each respective electrical contact of the set of N electrical contacts, the programmable switch array comprises at least N electrical contact input ports, at least N resistor input ports, at least 4 ∗ N switches, and at least 2 ∗ N inputs; and for each respective electrical contact: the respective electrical contact is electrically connected to an electrical contact input port; and the respective electrical contact is electrically connected via a respective resistor from the set of N resistors to a resistor input port. the respective electrical contact is electrically connected to an electrical contact input port; and the respective electrical contact is electrically connected via a respective resistor from the set of N resistors to a resistor input port.