A stimulus and response controller contained within a magnetic electrical test apparatus for evaluating, and characterizing at least one magnetic tunnel junction device under test MTJ DUT, the stimulus and response controller comprising: a communication interface connected to a tester controller for receiving tester configuration instructions and test stimulus instructions from the tester controller and transmitting response results to the tester controller; a configurable function circuit selectively configured for performing analytical and evaluation operations of the response data prior to transmission to the tester controller; a test function configurator in communication through the communication interface with the tester controller for receiving the test configuration instructions and configured for decoding the test configuration instructions and transferring the decoded test configuration to the configurable function circuit for constituting the configurable function circuit to a function detailed in the test configuration instructions; a stimulus memory configured for receiving test commands and instruction data from the communication interface and configured for retaining test commands and instruction data; a stimulus waveform generator in communication with the stimulus memory for extracting the test commands and instruction data from the stimulus memory and is configured for decoding the test commands and instruction data to form a stimulus signal that is applied to a first terminal of the at least one MTJ OUT; a response waveform receiver in communication with the at least one MTJ OUT for capturing the at least one response signal (312a-312n) from the at least one MTJ OUT; and a response memory in communication with the response waveform receiver for receiving the at least one response signal (312a-312n) for retention, the response memory in communication with the stimulus waveform generator for receiving the stimulus signal and timing trace signals for retention with the response signal (312a-312n) and in communication with the configurable function circuit for selectively transferring the stimulus signal, the response signal (312a-312n) and timing traces signals to the configurable function circuit for performing the evaluation and characterization operations and for receiving result data from the configurable function circuit, and the response memory in communication with the tester controller through the communication interface for transferring the result data to the tester controller. a communication interface connected to a tester controller for receiving tester configuration instructions and test stimulus instructions from the tester controller and transmitting response results to the tester controller; a configurable function circuit selectively configured for performing analytical and evaluation operations of the response data prior to transmission to the tester controller; a test function configurator in communication through the communication interface with the tester controller for receiving the test configuration instructions and configured for decoding the test configuration instructions and transferring the decoded test configuration to the configurable function circuit for constituting the configurable function circuit to a function detailed in the test configuration instructions; a stimulus memory configured for receiving test commands and instruction data from the communication interface and configured for retaining test commands and instruction data; a stimulus waveform generator in communication with the stimulus memory for extracting the test commands and instruction data from the stimulus memory and is configured for decoding the test commands and instruction data to form a stimulus signal that is applied to a first terminal of the at least one MTJ OUT; a response waveform receiver in communication with the at least one MTJ OUT for capturing the at least one response signal (312a-312n) from the at least one MTJ OUT; and a response memory in communication with the response waveform receiver for receiving the at least one response signal (312a-312n) for retention, the response memory in communication with the stimulus waveform generator for receiving the stimulus signal and timing trace signals for retention with the response signal (312a-312n) and in communication with the configurable function circuit for selectively transferring the stimulus signal, the response signal (312a-312n) and timing traces signals to the configurable function circuit for performing the evaluation and characterization operations and for receiving result data from the configurable function circuit, and the response memory in communication with the tester controller through the communication interface for transferring the result data to the tester controller.