A specimen analyzer that measures an amount of a specimen included in a sample, the specimen analyzer comprising: a measurement unit configured to measure the sample and output a measurement signal indicating an amount of the specimen; and a control unit configured to calculate an amount of the specimen using the measurement signal, wherein: when a first specimen is measured, the measurement unit is configured to measure a first sample including the first specimen and a first internal reference material; when a second specimen is measured, the measurement unit is configured to measure a second sample including the second specimen and a second internal reference material; and the control unit is configured to calculate an amount of the second specimen included in the second sample using an amount of the first internal reference material measured when the first sample has been measured and an amount of the second internal reference material measured when the second sample has been measured subsequently to the first sample, characterized in that: the control unit is configured to calculate a first carry-over amount of the first specimen carried from the first sample to the second sample using the amount of the first internal reference material measured when the first sample has been measured and the amount of the second internal reference material measured when the second sample has been measured subsequently to the first sample; and the control unit is configured to calculate an amount of the second specimen included in the second sample using the first carry-over amount. a measurement unit configured to measure the sample and output a measurement signal indicating an amount of the specimen; and a control unit configured to calculate an amount of the specimen using the measurement signal, wherein: when a first specimen is measured, the measurement unit is configured to measure a first sample including the first specimen and a first internal reference material; when a second specimen is measured, the measurement unit is configured to measure a second sample including the second specimen and a second internal reference material; and the control unit is configured to calculate an amount of the second specimen included in the second sample using an amount of the first internal reference material measured when the first sample has been measured and an amount of the second internal reference material measured when the second sample has been measured subsequently to the first sample, characterized in that: the control unit is configured to calculate a first carry-over amount of the first specimen carried from the first sample to the second sample using the amount of the first internal reference material measured when the first sample has been measured and the amount of the second internal reference material measured when the second sample has been measured subsequently to the first sample; and the control unit is configured to calculate an amount of the second specimen included in the second sample using the first carry-over amount. the control unit is configured to calculate a first carry-over amount of the first specimen carried from the first sample to the second sample using the amount of the first internal reference material measured when the first sample has been measured and the amount of the second internal reference material measured when the second sample has been measured subsequently to the first sample; and the control unit is configured to calculate an amount of the second specimen included in the second sample using the first carry-over amount.