Method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis, comprising: - generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment; - executing a sample measurement process comprising the following steps: ∘ determining a distribution of X rays scattered from said sample by means of an area detector arranged downstream of said sample environment; and ∘ determining an intensity (I t) of a beam of X rays transmitted through said sample by means of said detector; - executing a sample data treatment process comprising the following step: ∘ determining an absolute scattered X-ray distribution by applying to said scattered X-ray distribution a conversion into absolute intensities which depends on said transmitted intensity; and - executing a data analysis process comprising the following step: ∘ determining at least one structural characteristic of said sample on the basis of said absolute scattered X-ray distribution; characterized in that - acquisition of said scattered and said transmitted X-rays is divided into a plurality of acquisition periods, wherein each acquisition period (T acq) is shorter than or equal to a previously determined maximum acquisition time (T max) in such a way that said detector operates in a linear range; - said detector measures individual detector image frames containing signals of said scattered and said transmitted X-rays, wherein each individual detector image frame is measured during one among said plurality of acquisition periods; - said individual detector image frames are added up to a total detector image frame in a computer connected to said detector; and - said determination of said at least one structural characteristic of said sample is realized based on an absolute scattered X-ray distribution obtained on the basis of said total detector image frame. - generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment; - executing a sample measurement process comprising the following steps: ∘ determining a distribution of X rays scattered from said sample by means of an area detector arranged downstream of said sample environment; and ∘ determining an intensity (I t) of a beam of X rays transmitted through said sample by means of said detector; ∘ determining a distribution of X rays scattered from said sample by means of an area detector arranged downstream of said sample environment; and ∘ determining an intensity (I t) of a beam of X rays transmitted through said sample by means of said detector; - executing a sample data treatment process comprising the following step: ∘ determining an absolute scattered X-ray distribution by applying to said scattered X-ray distribution a conversion into absolute intensities which depends on said transmitted intensity; and - executing a data analysis process comprising the following step: ∘ determining at least one structural characteristic of said sample on the basis of said absolute scattered X-ray distribution; - acquisition of said scattered and said transmitted X-rays is divided into a plurality of acquisition periods, wherein each acquisition period (T acq) is shorter than or equal to a previously determined maximum acquisition time (T max) in such a way that said detector operates in a linear range; - said detector measures individual detector image frames containing signals of said scattered and said transmitted X-rays, wherein each individual detector image frame is measured during one among said plurality of acquisition periods; - said individual detector image frames are added up to a total detector image frame in a computer connected to said detector; and - said determination of said at least one structural characteristic of said sample is realized based on an absolute scattered X-ray distribution obtained on the basis of said total detector image frame.