An automatic thin section sample preparation device that prepares a thin section by thinly cutting an embedding block which includes an embedded biological sample and is held by a cassette to which ID data is attached in advance and that fixes the thin section on a substrate to prepare a thin section sample including the thin section and the substrate, the device comprising: a reading portion configured to read the ID data; a first imaging portion configured to image a surface image of the embedding block; a sample preparation mechanism configured to prepare the thin section by thinly cutting the embedding block and fix the thin section on the substrate to prepare the thin section sample including the thin section and the substrate; a recording portion); and a control portion which is configured to control an operation of the sample preparation mechanism, and to which the ID data read by the reading portion, and the surface image imaged by the first imaging portion are input, wherein the control portion includes a determination portion, and a storage portion, characterized in that the automatic thin section sample preparation device comprises a second imaging portion configured to image a thin section image of the thin section of the thin section sample, and in that the thin section image imaged by the second imaging portion is also input to the control portion, and in that the determination portion is configured to determine whether or not the thin section is prepared from the embedding block by collating the surface image and the thin section image, and in that the storage portion is configured to store the individual data, wherein the individual data consists of the determination result in association with the ID data, and wherein the recording portion is configured to record said individual data on the substrate of the thin section sample. a reading portion configured to read the ID data; a first imaging portion configured to image a surface image of the embedding block; a sample preparation mechanism configured to prepare the thin section by thinly cutting the embedding block and fix the thin section on the substrate to prepare the thin section sample including the thin section and the substrate; a recording portion); and a control portion which is configured to control an operation of the sample preparation mechanism, and to which the ID data read by the reading portion, and the surface image imaged by the first imaging portion are input, wherein the control portion includes a determination portion, and a storage portion, characterized in that the automatic thin section sample preparation device comprises a second imaging portion configured to image a thin section image of the thin section of the thin section sample, and in that the thin section image imaged by the second imaging portion is also input to the control portion, and in that the determination portion is configured to determine whether or not the thin section is prepared from the embedding block by collating the surface image and the thin section image, and in that the storage portion is configured to store the individual data, wherein the individual data consists of the determination result in association with the ID data, and wherein the recording portion is configured to record said individual data on the substrate of the thin section sample.