A multi-angle imager comprising - one or more entrance pupils configured to pass through light beams (Li) of an object to be imaged from multiple entry angles (αi) into the imager; - an imaging array (Mij) configured to o receive the light beams (Li) via the one or more entrance pupils according to distinct fields of view (Vi) of the object along each of the multiple entry angles (αi), and o to image subsections (Si) of the object according to the distinct fields of view (Vi) onto an imaging plane; - wherein the imaging array (Mij) comprises multiple imaging branches (M1j,M2j) configured to form respective optical paths for the light beams (L1,L2) through the imager for imaging the respective subsections (S1,S2) of the object; - wherein each imaging branch (Mij) comprises a distinct set of optical elements (M11,M12) configured to ∘ receive the respective light beam along the respective entry angle (α1) and ∘ redirect the respective light beam towards the imaging plane; - wherein the light beams (L1,L2) from each of the multiple imaging branches (M1j,M2j) are redirected to travel in a common direction (y) between the imaging array (Mij) and the imaging plane; wherein the multiple imaging branches (M1j,M2j) are configured to stack their respective light beams one above the other along a first direction (z) transverse to a plane (x,y) spanned by the multiple entry angles (αi); wherein the multiple imaging branches (M1j,M2j) are configured to project respective images of the respective subsections (S1,S2) onto a slit, wherein the images are extended along the first direction (z), corresponding to a length of the slit, to provide spatial information of the respective subsections (S1,S2) along said first direction (z), wherein a second direction (x), transverse to the first direction (z) and corresponding to a width of the slit, is used for subsequent spectral analysis of the images. - one or more entrance pupils configured to pass through light beams (Li) of an object to be imaged from multiple entry angles (αi) into the imager; - an imaging array (Mij) configured to o receive the light beams (Li) via the one or more entrance pupils according to distinct fields of view (Vi) of the object along each of the multiple entry angles (αi), and o to image subsections (Si) of the object according to the distinct fields of view (Vi) onto an imaging plane; o receive the light beams (Li) via the one or more entrance pupils according to distinct fields of view (Vi) of the object along each of the multiple entry angles (αi), and o to image subsections (Si) of the object according to the distinct fields of view (Vi) onto an imaging plane; - wherein the imaging array (Mij) comprises multiple imaging branches (M1j,M2j) configured to form respective optical paths for the light beams (L1,L2) through the imager for imaging the respective subsections (S1,S2) of the object; - wherein each imaging branch (Mij) comprises a distinct set of optical elements (M11,M12) configured to ∘ receive the respective light beam along the respective entry angle (α1) and ∘ redirect the respective light beam towards the imaging plane; ∘ receive the respective light beam along the respective entry angle (α1) and ∘ redirect the respective light beam towards the imaging plane; - wherein the light beams (L1,L2) from each of the multiple imaging branches (M1j,M2j) are redirected to travel in a common direction (y) between the imaging array (Mij) and the imaging plane; wherein the multiple imaging branches (M1j,M2j) are configured to stack their respective light beams one above the other along a first direction (z) transverse to a plane (x,y) spanned by the multiple entry angles (αi); wherein the multiple imaging branches (M1j,M2j) are configured to project respective images of the respective subsections (S1,S2) onto a slit, wherein the images are extended along the first direction (z), corresponding to a length of the slit, to provide spatial information of the respective subsections (S1,S2) along said first direction (z), wherein a second direction (x), transverse to the first direction (z) and corresponding to a width of the slit, is used for subsequent spectral analysis of the images. wherein the multiple imaging branches (M1j,M2j) are configured to stack their respective light beams one above the other along a first direction (z) transverse to a plane (x,y) spanned by the multiple entry angles (αi); wherein the multiple imaging branches (M1j,M2j) are configured to project respective images of the respective subsections (S1,S2) onto a slit, wherein the images are extended along the first direction (z), corresponding to a length of the slit, to provide spatial information of the respective subsections (S1,S2) along said first direction (z), wherein a second direction (x), transverse to the first direction (z) and corresponding to a width of the slit, is used for subsequent spectral analysis of the images.