A system comprising: • a substrate; • a resistive touch sensor arranged across the substrate and comprising an array of sense electrode and drive electrode pairs; • a force-sensing layer arranged over the resistive touch sensor opposite the substrate and comprising a force-sensitive material exhibiting variations in local bulk resistance responsive to local variations in applied force; • a first shield electrode coupled to the force-sensing layer and extending across a first region of the force-sensing layer; and • a controller coupled to the substrate and configured to: ∘ during a first resistance scan cycle in a first sampling period: ▪ drive the first shield electrode to a virtual reference potential; and ▪ read resistance values across sense electrode and drive electrode pairs in the resistive touch sensor; and ∘ during a first processing cycle succeeding the first resistance scan cycle within the first sampling period: ▪ release the first shield electrode from the virtual reference potential; ▪ transform resistance values read from sense electrode and drive electrode pairs in the force-sensing layer into a force touch image, the force touch image representing locations and force magnitudes of objects applied over the force-sensing layer; ▪ read a capacitance value from the first shield electrode; and ∘ interpret proximity of a mass to the force-sensing layer during the first sampling period based on the capacitance value. • a substrate; • a resistive touch sensor arranged across the substrate and comprising an array of sense electrode and drive electrode pairs; • a force-sensing layer arranged over the resistive touch sensor opposite the substrate and comprising a force-sensitive material exhibiting variations in local bulk resistance responsive to local variations in applied force; • a first shield electrode coupled to the force-sensing layer and extending across a first region of the force-sensing layer; and • a controller coupled to the substrate and configured to: ∘ during a first resistance scan cycle in a first sampling period: ▪ drive the first shield electrode to a virtual reference potential; and ▪ read resistance values across sense electrode and drive electrode pairs in the resistive touch sensor; and ∘ during a first processing cycle succeeding the first resistance scan cycle within the first sampling period: ▪ release the first shield electrode from the virtual reference potential; ▪ transform resistance values read from sense electrode and drive electrode pairs in the force-sensing layer into a force touch image, the force touch image representing locations and force magnitudes of objects applied over the force-sensing layer; ▪ read a capacitance value from the first shield electrode; and ∘ interpret proximity of a mass to the force-sensing layer during the first sampling period based on the capacitance value. ∘ during a first resistance scan cycle in a first sampling period: ▪ drive the first shield electrode to a virtual reference potential; and ▪ read resistance values across sense electrode and drive electrode pairs in the resistive touch sensor; and ▪ drive the first shield electrode to a virtual reference potential; and ▪ read resistance values across sense electrode and drive electrode pairs in the resistive touch sensor; and ∘ during a first processing cycle succeeding the first resistance scan cycle within the first sampling period: ▪ release the first shield electrode from the virtual reference potential; ▪ transform resistance values read from sense electrode and drive electrode pairs in the force-sensing layer into a force touch image, the force touch image representing locations and force magnitudes of objects applied over the force-sensing layer; ▪ read a capacitance value from the first shield electrode; and ▪ release the first shield electrode from the virtual reference potential; ▪ transform resistance values read from sense electrode and drive electrode pairs in the force-sensing layer into a force touch image, the force touch image representing locations and force magnitudes of objects applied over the force-sensing layer; ▪ read a capacitance value from the first shield electrode; and ∘ interpret proximity of a mass to the force-sensing layer during the first sampling period based on the capacitance value.