Method for the simultaneous determination of at least two, in particular three or four parameters, of at least one paper layer impregnated with at least one resin layer in an impregnation plant Whereby the impregnation plant comprises: - at least one NIR multimeter head for recording at least one NIR spectrum of the impregnated paper layer in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, in particular preferably between 900 nm and 1700 nm and especially advantageously between 1450 nm and 1550 nm; and - at least one control system comprising at least one computer-aided evaluation unit and a database, - wherein the at least one NIR multimeter head is connected in each case to the one control system with evaluation unit and database for processing and storing the determined NIR data, wherein in the evaluation unit desired parameters of the paper layer impregnated with the at least one resin layer are simultaneously determined by an automated comparison of the single NIR spectrum recorded for the paper layer impregnated with the resin layer with the calibration model created for the respective parameters, - whereby the parameter data determined in this way is stored in the database, where the calibration model is determined from reference samples as follows: - Recording of at least one NIR spectrum of several reference samples, each with different values of the desired parameters, using at least one NIR multimeter head in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, particularly preferably between 900 nm and 1700 nm, and especially advantageously between 1450 nm and 1550 nm; - Determination of the desired parameters of the measured reference samples by non-spectroscopic methods; - Assignment of the determined parameters to the respective recorded NIR spectra of the measured reference samples. Whereby the impregnation plant comprises: - at least one NIR multimeter head for recording at least one NIR spectrum of the impregnated paper layer in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, in particular preferably between 900 nm and 1700 nm and especially advantageously between 1450 nm and 1550 nm; and - at least one control system comprising at least one computer-aided evaluation unit and a database, - wherein the at least one NIR multimeter head is connected in each case to the one control system with evaluation unit and database for processing and storing the determined NIR data, - at least one NIR multimeter head for recording at least one NIR spectrum of the impregnated paper layer in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, in particular preferably between 900 nm and 1700 nm and especially advantageously between 1450 nm and 1550 nm; and - at least one control system comprising at least one computer-aided evaluation unit and a database, - wherein the at least one NIR multimeter head is connected in each case to the one control system with evaluation unit and database for processing and storing the determined NIR data, wherein in the evaluation unit desired parameters of the paper layer impregnated with the at least one resin layer are simultaneously determined by an automated comparison of the single NIR spectrum recorded for the paper layer impregnated with the resin layer with the calibration model created for the respective parameters, - whereby the parameter data determined in this way is stored in the database, - whereby the parameter data determined in this way is stored in the database, - Recording of at least one NIR spectrum of several reference samples, each with different values of the desired parameters, using at least one NIR multimeter head in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, particularly preferably between 900 nm and 1700 nm, and especially advantageously between 1450 nm and 1550 nm; - Determination of the desired parameters of the measured reference samples by non-spectroscopic methods; - Assignment of the determined parameters to the respective recorded NIR spectra of the measured reference samples.