A non-contact coordinate measurement machine, comprising: an optical assembly comprising a structured light projector, at least one optical sensor (4509, 4511), and a controller, wherein: the structured light projector comprises: a light source; and a code drum comprising a plurality of hybrid cyclic binary code, HCBC, patterns, the plurality of HCBC patterns including a plurality of weighted numbering system multiple period patterns and a plurality of unweighted numbering system common period patterns, the plurality of weighted numbering system multiple period patterns comprising Gray code patterns; and an optical imaging projector lens; the controller is configured to cause the light source to project incident light onto the code drum as the code drum rotates about an axis; the code drum and optical imaging projector lens are configured to produce structured light from the incident light thereon, the structured light to be incident on a surface of an object being measured, whereby each of said plurality of HCBC patterns are configured such that said structured light comprises a sequence of binary bar patterns; the at least one optical sensor (4509, 4511) is to measure reflected structured light from the surface of the object being measured and to produce a plurality of measurement signals, the plurality of measurement signals being related to positional coordinates of at least one point on the surface of the object being measured. an optical assembly comprising a structured light projector, at least one optical sensor (4509, 4511), and a controller, wherein: the structured light projector comprises: a light source; and a code drum comprising a plurality of hybrid cyclic binary code, HCBC, patterns, a light source; and a code drum comprising a plurality of hybrid cyclic binary code, HCBC, patterns, the plurality of HCBC patterns including a plurality of weighted numbering system multiple period patterns and a plurality of unweighted numbering system common period patterns, the plurality of weighted numbering system multiple period patterns comprising Gray code patterns; and an optical imaging projector lens; the controller is configured to cause the light source to project incident light onto the code drum as the code drum rotates about an axis; the code drum and optical imaging projector lens are configured to produce structured light from the incident light thereon, the structured light to be incident on a surface of an object being measured, whereby each of said plurality of HCBC patterns are configured such that said structured light comprises a sequence of binary bar patterns; the at least one optical sensor (4509, 4511) is to measure reflected structured light from the surface of the object being measured and to produce a plurality of measurement signals, the plurality of measurement signals being related to positional coordinates of at least one point on the surface of the object being measured. an optical imaging projector lens; the controller is configured to cause the light source to project incident light onto the code drum as the code drum rotates about an axis; the code drum and optical imaging projector lens are configured to produce structured light from the incident light thereon, the structured light to be incident on a surface of an object being measured, whereby each of said plurality of HCBC patterns are configured such that said structured light comprises a sequence of binary bar patterns;