A gyroscope comprising a proof mass (11, 21, 61, 91, 101) in a device plane defined by a lateral axis (191, 291, 691) and a transversal axis (192, 292, 692) which is orthogonal to the lateral axis, and the gyroscope further comprises a first structure which is coupled to the proof mass with a laterally flexible first coupling spring (151, 251, 451, 651, 951, 1051) from a first coupling direction, a second structure which is coupled to the proof mass with a laterally flexible second coupling spring (152, 252, 452, 652, 952, 1052) from a second coupling direction, a third structure which is coupled to the proof mass with a transversally flexible third coupling spring (153, 253, 453, 653, 953, 1053) from a third coupling direction, and a fourth structure which is coupled to the proof mass with a transversally flexible fourth coupling spring (154, 254, 454, 654, 954, 1054) from a fourth coupling direction, wherein the first and second coupling directions are substantially opposite to each other, the third and fourth coupling directions are substantially opposite to each other, and the first and second coupling directions are substantially perpendicular to the third and fourth coupling directions, wherein the first structure comprises two or more first lateral elongated beams (221, 621, 921) which extend from corresponding one or more anchor points in a first lateral direction, the second structure comprises two or more second lateral elongated beams (222, 622, 922) which extend from corresponding one or more anchor points in a second lateral direction, wherein the second lateral direction is opposite to the first, and the third structure comprises two or more first transversal elongated beams (223, 623, 923) which extend from corresponding one or more anchor points in a first transversal direction, and the fourth structure comprises two or more second transversal elongated beams (224, 624, 924) which extend from corresponding one or more anchor points in a second transversal direction, wherein the second transversal direction is opposite to the first, and the first and second structures further comprise one or more lateral piezoelectric transducers which have been deposited on the two or more first or second lateral elongated beams, and the third and fourth structures further comprise one or more transversal piezoelectric transducers which have been deposited on the two or more first or second transversal elongated beams, wherein said one or more lateral piezoelectric transducers are configured to bend the corresponding lateral elongated beams in the device plane and to measure the bending of the corresponding lateral elongated beams in the device plane and said one or more transversal piezoelectric transducers are configured to bend the corresponding transversal elongated beams in the device plane and to measure the bending of the corresponding transversal elongated beams in the device plane. and the gyroscope further comprises a first structure which is coupled to the proof mass with a laterally flexible first coupling spring (151, 251, 451, 651, 951, 1051) from a first coupling direction, a second structure which is coupled to the proof mass with a laterally flexible second coupling spring (152, 252, 452, 652, 952, 1052) from a second coupling direction, a third structure which is coupled to the proof mass with a transversally flexible third coupling spring (153, 253, 453, 653, 953, 1053) from a third coupling direction, and a fourth structure which is coupled to the proof mass with a transversally flexible fourth coupling spring (154, 254, 454, 654, 954, 1054) from a fourth coupling direction, wherein the first and second coupling directions are substantially opposite to each other, the third and fourth coupling directions are substantially opposite to each other, and the first and second coupling directions are substantially perpendicular to the third and fourth coupling directions, wherein the first structure comprises two or more first lateral elongated beams (221, 621, 921) which extend from corresponding one or more anchor points in a first lateral direction, the second structure comprises two or more second lateral elongated beams (222, 622, 922) which extend from corresponding one or more anchor points in a second lateral direction, wherein the second lateral direction is opposite to the first, and the third structure comprises two or more first transversal elongated beams (223, 623, 923) which extend from corresponding one or more anchor points in a first transversal direction, and the fourth structure comprises two or more second transversal elongated beams (224, 624, 924) which extend from corresponding one or more anchor points in a second transversal direction, wherein the second transversal direction is opposite to the first, and the first and second structures further comprise one or more lateral piezoelectric transducers which have been deposited on the two or more first or second lateral elongated beams, and the third and fourth structures further comprise one or more transversal piezoelectric transducers which have been deposited on the two or more first or second transversal elongated beams, wherein said one or more lateral piezoelectric transducers are configured to bend the corresponding lateral elongated beams in the device plane and to measure the bending of the corresponding lateral elongated beams in the device plane and said one or more transversal piezoelectric transducers are configured to bend the corresponding transversal elongated beams in the device plane and to measure the bending of the corresponding transversal elongated beams in the device plane.