A method for monitoring a wiring system, the method comprising: measuring a number of responses to signals transmitted in a portion of the wiring system to form a measured signature, comprising: sending a number of test signals through a number of paths in the portion of the wiring system; and detecting a number of reflected pulses generated by the portion of the wiring system in response to the number of test signals; retrieving design data for the portion of the wiring system; identifying a number of expected responses for the signals in the portion of the wiring system using the design data to form a computed signature, comprising: generating a number of expected impedance values for the portion of the wiring system using the design data; performing a simulation of the number of test signals using the number of expected impedance values to identify the number of expected responses for the computed signature; and comparing the measured signature with the computed signature, wherein the step of comparing the measured signature with the computed signature further comprises: plotting the computed signature and the measured signature on a graph; identifying a number of areas on the graph where a difference between the computed signature and the measured signature exceeds a specified threshold to form a number of identified areas; and displaying the graph with the computed signature, the measured signature, and the number of identified areas on a display device. measuring a number of responses to signals transmitted in a portion of the wiring system to form a measured signature, comprising: sending a number of test signals through a number of paths in the portion of the wiring system; and detecting a number of reflected pulses generated by the portion of the wiring system in response to the number of test signals; sending a number of test signals through a number of paths in the portion of the wiring system; and detecting a number of reflected pulses generated by the portion of the wiring system in response to the number of test signals; retrieving design data for the portion of the wiring system; identifying a number of expected responses for the signals in the portion of the wiring system using the design data to form a computed signature, comprising: generating a number of expected impedance values for the portion of the wiring system using the design data; performing a simulation of the number of test signals using the number of expected impedance values to identify the number of expected responses for the computed signature; and generating a number of expected impedance values for the portion of the wiring system using the design data; performing a simulation of the number of test signals using the number of expected impedance values to identify the number of expected responses for the computed signature; and comparing the measured signature with the computed signature, wherein the step of comparing the measured signature with the computed signature further comprises: plotting the computed signature and the measured signature on a graph; identifying a number of areas on the graph where a difference between the computed signature and the measured signature exceeds a specified threshold to form a number of identified areas; and displaying the graph with the computed signature, the measured signature, and the number of identified areas on a display device. plotting the computed signature and the measured signature on a graph; identifying a number of areas on the graph where a difference between the computed signature and the measured signature exceeds a specified threshold to form a number of identified areas; and displaying the graph with the computed signature, the measured signature, and the number of identified areas on a display device.