A three-dimensional shape measuring apparatus comprising: a single projector device that is adapted to project a first light pattern whose luminance changes at a first cycle and a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on a measured object; an image capture device that is adapted to acquire an image of the measured object on which the first light pattern and an image of the measured object on which the second light pattern is projected; and an image processing device that is adapted to process the image acquired by the image capture device, wherein the image processing device includes a relative phase value calculation unit that, based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculates a relative phase value on each part of the measured object corresponding to each of the pixels, an absolute phase value calculation unit that, based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculates an absolute phase value on each the part of the measured object corresponding to each of the pixels, and a three-dimensional coordinate calculation unit that, based on the absolute phase value, calculates three-dimensional coordinates at each the part of the measured object corresponding to each of the pixels, wherein the first light pattern is a sinusoidal pattern and the second light pattern is a luminance slope pattern whose luminance changes linearly, and wherein the image capture device is adapted to acquire at least three images captured with different phases of the first light pattern projected on the measured object. a single projector device that is adapted to project a first light pattern whose luminance changes at a first cycle and a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on a measured object; an image capture device that is adapted to acquire an image of the measured object on which the first light pattern and an image of the measured object on which the second light pattern is projected; and an image processing device that is adapted to process the image acquired by the image capture device, wherein the image processing device includes a relative phase value calculation unit that, based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculates a relative phase value on each part of the measured object corresponding to each of the pixels, an absolute phase value calculation unit that, based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculates an absolute phase value on each the part of the measured object corresponding to each of the pixels, and a three-dimensional coordinate calculation unit that, based on the absolute phase value, calculates three-dimensional coordinates at each the part of the measured object corresponding to each of the pixels, a relative phase value calculation unit that, based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculates a relative phase value on each part of the measured object corresponding to each of the pixels, an absolute phase value calculation unit that, based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculates an absolute phase value on each the part of the measured object corresponding to each of the pixels, and a three-dimensional coordinate calculation unit that, based on the absolute phase value, calculates three-dimensional coordinates at each the part of the measured object corresponding to each of the pixels, wherein the first light pattern is a sinusoidal pattern and the second light pattern is a luminance slope pattern whose luminance changes linearly, and wherein the image capture device is adapted to acquire at least three images captured with different phases of the first light pattern projected on the measured object.