An observation method comprising: placing a specimen on a specimen supporting film of a specimen support; attaching the specimen support to a retainer; attaching the retainer to an optical microscope retainer holding base; attaching the optical microscope retainer holding base to a specimen stage of an optical microscope and observing the specimen under the optical microscope; attaching the retainer to a transmission electron microscope retainer holding base; and loading the transmission electron microscope retainer holding base into a transmission electron microscope and observing the specimen under the transmission electron microscope, wherein the transmission electron microscope includes a specimen holder provided with the transmission electron microscope retainer holding base, the specimen holder includes a first moving mechanism for moving the specimen, and the first moving mechanism moves the specimen by moving the transmission electron microscope retainer holding base, wherein the transmission electron microscope includes a second moving mechanism for moving the specimen, the second moving mechanism moves the specimen by moving the specimen holder, the first moving mechanism moves the specimen along a first axis, and the second moving mechanism moves the specimen along the first axis and a second axis that is orthogonal to the first axis, wherein the transmission electron microscope includes a control unit that controls the first moving mechanism and the second moving mechanism, and the control unit specifies position coordinates of the specimen under the transmission electron microscope based on an amount by which the first moving mechanism moves the specimen and an amount by which the second moving mechanism moves the specimen; and wherein the transmission electron microscope includes a storage unit that stores error correction information for correcting an error that occurs in the position coordinates of the specimen when the specimen is moved by the first moving mechanism, and the control unit obtains movement amount information indicating amounts by which the first moving mechanism and the second moving mechanism (520 move the specimen and specifies the position coordinates of the specimen by correcting the position coordinates of the specimen specified from the movement amount information based on the error correction information. placing a specimen on a specimen supporting film of a specimen support; attaching the specimen support to a retainer; attaching the retainer to an optical microscope retainer holding base; attaching the optical microscope retainer holding base to a specimen stage of an optical microscope and observing the specimen under the optical microscope; attaching the retainer to a transmission electron microscope retainer holding base; and loading the transmission electron microscope retainer holding base into a transmission electron microscope and observing the specimen under the transmission electron microscope, wherein the transmission electron microscope includes a specimen holder provided with the transmission electron microscope retainer holding base, the specimen holder includes a first moving mechanism for moving the specimen, and the first moving mechanism moves the specimen by moving the transmission electron microscope retainer holding base, wherein the transmission electron microscope includes a second moving mechanism for moving the specimen, the second moving mechanism moves the specimen by moving the specimen holder, the first moving mechanism moves the specimen along a first axis, and the second moving mechanism moves the specimen along the first axis and a second axis that is orthogonal to the first axis, wherein the transmission electron microscope includes a control unit that controls the first moving mechanism and the second moving mechanism, and the control unit specifies position coordinates of the specimen under the transmission electron microscope based on an amount by which the first moving mechanism moves the specimen and an amount by which the second moving mechanism moves the specimen; and wherein the transmission electron microscope includes a storage unit that stores error correction information for correcting an error that occurs in the position coordinates of the specimen when the specimen is moved by the first moving mechanism, and the control unit obtains movement amount information indicating amounts by which the first moving mechanism and the second moving mechanism (520 move the specimen and specifies the position coordinates of the specimen by correcting the position coordinates of the specimen specified from the movement amount information based on the error correction information.