A surface plasmon resonance fluorescence analysis device configured to measure fluorescence emitted as a result of a fluorescent substance contained in a specimen being excited by an electric field based on surface plasmon resonance, the surface plasmon resonance fluorescence analysis device is characterized by comprising: a prism unit having a prism in which a metal film is formed on a prescribed surface thereof; a light source configured to emit a light beam (α) onto the prism from a surface different from the prescribed surface so as to be reflected by the metal film; a light measuring unit configured to measure an intensity of light generated in the metal film on an opposite side from the prism as a result of the light beam (α) being reflected by the metal film; and a control unit configured to adjust a direction in which the light beam (α) is emitted from the light source based on the intensity of light measured by the light measuring unit, wherein the light measuring unit is configured to measure an intensity of plasmon scattered light generated in the metal film, wherein the light measuring unit has: a light receiving unit configured to receive light generated in the metal film; a first optical filter configured to emit incident light after attenuating that light; a position switching unit configured to switch a position of the first optical filter between an intermediate position that is located between the metal film and the light receiving unit, and a standby position that is farther away from the metal film and the light receiving unit than the intermediate position; and a second optical filter configured to block out light of a prescribed wavelength, and the position switching unit is configured to respectively switch the positions of the first optical filter and the second optical filter so that the second optical filter is at the standby position when the first optical filter is at the intermediate position so as to measure said intensity of plasmon scattered light, or so that the second optical filter is at the intermediate position when the first optical filter is at the standby position so as to measure the intensity of said fluorescence. a prism unit having a prism in which a metal film is formed on a prescribed surface thereof; a light source configured to emit a light beam (α) onto the prism from a surface different from the prescribed surface so as to be reflected by the metal film; a light measuring unit configured to measure an intensity of light generated in the metal film on an opposite side from the prism as a result of the light beam (α) being reflected by the metal film; and a control unit configured to adjust a direction in which the light beam (α) is emitted from the light source based on the intensity of light measured by the light measuring unit, wherein the light measuring unit is configured to measure an intensity of plasmon scattered light generated in the metal film, wherein the light measuring unit has: a light receiving unit configured to receive light generated in the metal film; a first optical filter configured to emit incident light after attenuating that light; a position switching unit configured to switch a position of the first optical filter between an intermediate position that is located between the metal film and the light receiving unit, and a standby position that is farther away from the metal film and the light receiving unit than the intermediate position; and a light receiving unit configured to receive light generated in the metal film; a first optical filter configured to emit incident light after attenuating that light; a position switching unit configured to switch a position of the first optical filter between an intermediate position that is located between the metal film and the light receiving unit, and a standby position that is farther away from the metal film and the light receiving unit than the intermediate position; and a second optical filter configured to block out light of a prescribed wavelength, and the position switching unit is configured to respectively switch the positions of the first optical filter and the second optical filter so that the second optical filter is at the standby position when the first optical filter is at the intermediate position so as to measure said intensity of plasmon scattered light, or so that the second optical filter is at the intermediate position when the first optical filter is at the standby position so as to measure the intensity of said fluorescence.