A method for developing a projected lifetime profile for a component of a process control device, the method comprising: receiving, at a profiler, an indication of at least one operating parameter of the component that affects aging of the component, over time, during operation of the process control device in a process installation; receiving, at the profiler, in-service operating conditions the component is expected to experience during operation of the process control device in the process installation; developing, in the profiler, at least one accelerated aging test protocol, based on the in-service operating conditions the component is expected to experience, where the at least one accelerated aging test protocol is designed to simulate operation of the component to failure under the in-service operating conditions; receiving, from an accelerated test system, accelerated age testing data developed by performing the at least one accelerated aging test protocol on an instance of the component; developing, in the profiler, a projected lifetime profile for the component based on the accelerated age testing data; characterized by receiving, at an operational data module, during operation of the component in the process installation, sensed data including at least: data reflecting the operability of the component when in use in the process installation; or data reflecting conditions experienced by the component during operation of the process control device when in use in the process installation; and determining, at a lifetime analyzer, a projected remaining lifetime of the component, based on the projected lifetime profile for the component and the sensed data. receiving, at a profiler, an indication of at least one operating parameter of the component that affects aging of the component, over time, during operation of the process control device in a process installation; receiving, at the profiler, in-service operating conditions the component is expected to experience during operation of the process control device in the process installation; developing, in the profiler, at least one accelerated aging test protocol, based on the in-service operating conditions the component is expected to experience, where the at least one accelerated aging test protocol is designed to simulate operation of the component to failure under the in-service operating conditions; receiving, from an accelerated test system, accelerated age testing data developed by performing the at least one accelerated aging test protocol on an instance of the component; developing, in the profiler, a projected lifetime profile for the component based on the accelerated age testing data; characterized by receiving, at an operational data module, during operation of the component in the process installation, sensed data including at least: data reflecting the operability of the component when in use in the process installation; or data reflecting conditions experienced by the component during operation of the process control device when in use in the process installation; data reflecting the operability of the component when in use in the process installation; or data reflecting conditions experienced by the component during operation of the process control device when in use in the process installation; and determining, at a lifetime analyzer, a projected remaining lifetime of the component, based on the projected lifetime profile for the component and the sensed data.