An apparatus for obtaining intensity maps from optical coherence tomography interferogram data, the apparatus comprising: a light source for generating a beam of light; a beam splitter for dividing the beam of light along a sample path and a reference path; a scanner located along the sample path, the scanner for directing the beam of light to a plurality of different locations in the X-Y plane; a detector for receiving light returned from each of the sample path and the reference path and generating a plurality of sets of outputs, each of the plurality of sets of outputs representing optical coherence tomography interferogram data and corresponding to light intensities received at different wavelengths of the light source when the beam of light is directed at a particular location in the X-Y plane, the light intensities including information about a light reflectance distribution within an object in a depth direction Z at the particular location in the X-Y plane; a memory storing computer program instructions; and a processor communicatively coupled to the memory, the processor configured to execute the computer program instructions, which, when executed on the processor, cause the processor to perform a method comprising: high-pass filtering a set of outputs generated from directing the beam of light at a particular location in the X-Y plane to generate a set of filtered outputs; and translating the set of filtered outputs into a single estimated intensity value in the depth direction Z for the particular location in the X-Y plane by calculating an inverse cumulative distribution function for a pre-selected probability to determine a corresponding value of the set of outputs, wherein the plurality of single estimated intensity values corresponding to the plurality of different locations in the X-Y plane are used for generating a two-dimensional image intensity map of the object. a light source for generating a beam of light; a beam splitter for dividing the beam of light along a sample path and a reference path; a scanner located along the sample path, the scanner for directing the beam of light to a plurality of different locations in the X-Y plane; a detector for receiving light returned from each of the sample path and the reference path and generating a plurality of sets of outputs, each of the plurality of sets of outputs representing optical coherence tomography interferogram data and corresponding to light intensities received at different wavelengths of the light source when the beam of light is directed at a particular location in the X-Y plane, the light intensities including information about a light reflectance distribution within an object in a depth direction Z at the particular location in the X-Y plane; a memory storing computer program instructions; and a processor communicatively coupled to the memory, the processor configured to execute the computer program instructions, which, when executed on the processor, cause the processor to perform a method comprising: high-pass filtering a set of outputs generated from directing the beam of light at a particular location in the X-Y plane to generate a set of filtered outputs; and translating the set of filtered outputs into a single estimated intensity value in the depth direction Z for the particular location in the X-Y plane by calculating an inverse cumulative distribution function for a pre-selected probability to determine a corresponding value of the set of outputs, wherein the plurality of single high-pass filtering a set of outputs generated from directing the beam of light at a particular location in the X-Y plane to generate a set of filtered outputs; and translating the set of filtered outputs into a single estimated intensity value in the depth direction Z for the particular location in the X-Y plane by calculating an inverse cumulative distribution function for a pre-selected probability to determine a corresponding value of the set of outputs, wherein the plurality of single estimated intensity values corresponding to the plurality of different locations in the X-Y plane are used for generating a two-dimensional image intensity map of the object.