A system for identifying an extracted ion chromatogram peak of a compound of interest using a plurality of standard samples, comprising: a separation device for separating a compound of interest over time from each sample of a plurality of standard samples, wherein each sample of the plurality of standard samples includes a different known quantity of the compound of interest; an ion source device for ionizing and transforming the separated compound of interest for each sample of the plurality of standard samples into an ion beam; a mass spectrometer for receiving the ion beam for each sample of the plurality of standard samples and for mass analyzing the ion beam for at least one ion of the compound of interest, producing a plurality of intensity measurements at a plurality of different acquisition times for the at least one ion of the compound of interest for each sample of the plurality of standard samples; a processor in communication with the mass spectrometer for receiving the plurality of intensity measurements of the at least one ion of the compound of interest for each sample of the plurality of standard samples from the mass spectrometer, calculating an XIC for the at least one ion of the compound of interest for each sample of the plurality of standard samples from the plurality of intensity measurements, producing an XIC for each sample of the plurality of standard samples, finding one or more XIC peaks in each XIC of each sample of the plurality of standard samples, and identifying an XIC peak of the one or more XIC peaks in each XIC of each sample of the plurality of standard samples as an actual peak of the compound of interest, if a ratio of the intensity of the XIC peak in the each sample and the intensity of another XIC peak in another sample matches a ratio of the known quantity of the compound of interest in the each sample and the known quantity of the compound of interest in the another sample. a separation device for separating a compound of interest over time from each sample of a plurality of standard samples, wherein each sample of the plurality of standard samples includes a different known quantity of the compound of interest; an ion source device for ionizing and transforming the separated compound of interest for each sample of the plurality of standard samples into an ion beam; a mass spectrometer for receiving the ion beam for each sample of the plurality of standard samples and for mass analyzing the ion beam for at least one ion of the compound of interest, producing a plurality of intensity measurements at a plurality of different acquisition times for the at least one ion of the compound of interest for each sample of the plurality of standard samples; a processor in communication with the mass spectrometer for receiving the plurality of intensity measurements of the at least one ion of the compound of interest for each sample of the plurality of standard samples from the mass spectrometer, calculating an XIC for the at least one ion of the compound of interest for each sample of the plurality of standard samples from the plurality of intensity measurements, producing an XIC for each sample of the plurality of standard samples, finding one or more XIC peaks in each XIC of each sample of the plurality of standard samples, and identifying an XIC peak of the one or more XIC peaks in each XIC of each sample of the plurality of standard samples as an actual peak of the compound of interest, if a ratio of the intensity of the XIC peak in the each sample and the intensity of another XIC peak in another sample matches a ratio of the known quantity of the compound of interest in the each sample and the known quantity of the compound of interest in the another sample. receiving the plurality of intensity measurements of the at least one ion of the compound of interest for each sample of the plurality of standard samples from the mass spectrometer, calculating an XIC for the at least one ion of the compound of interest for each sample of the plurality of standard samples from the plurality of intensity measurements, producing an XIC for each sample of the plurality of standard samples, finding one or more XIC peaks in each XIC of each sample of the plurality of standard samples, and identifying an XIC peak of the one or more XIC peaks in each XIC of each sample of the plurality of standard samples as an actual peak of the compound of interest, if a ratio of the intensity of the XIC peak in the each sample and the intensity of another XIC peak in another sample matches a ratio of the known quantity of the compound of interest in the each sample and the known quantity of the compound of interest in the another sample.