A solid-state imaging apparatus comprising: a pixel circuit; and a negative feedback circuit, wherein the pixel circuit includes: a photodiode; a charge storage; a transfer transistor that transfers a signal charge generated by the photodiode to the charge storage; an amplification transistor that outputs a pixel signal corresponding to the signal charge in the charge storage; a first reset transistor that resets the charge storage; a first storage capacitive element (C1 C4); and a first transistor (GC1 TGC) that controls a connection between the charge storage and the first storage capacitive element (C1 C4), the negative feedback circuit negatively feeds back a feedback signal according to a reset output of the amplification transistor to the charge storage via the first reset transistor, and, wherein, a control signal input into the first reset transistor includes a sloped voltage waveform that gradually transitions from an on state to an off state, characterized in that, the solid-state imaging apparatus comprises a plurality of pixel circuits, and the solid-state imaging apparatus further comprises: a measurement unit configured to measure reset noise levels of pixel circuits located in a predetermined area among the plurality of pixel circuits; and a determination unit configured to determine an incline for the sloped voltage waveform that reduces variation in the reset noise levels, based on a measurement result of the measurement unit, the measurement unit is configured to measure the reset noise levels while varying the incline of the sloped voltage waveform, per row of the pixel circuits located in the predetermined area, and the determination unit is configured to determine an optimal incline for the sloped voltage waveform based on the variation per row of the pixel circuits located in the predetermined area. a pixel circuit; and a negative feedback circuit, wherein the pixel circuit includes: a photodiode; a charge storage; a transfer transistor that transfers a signal charge generated by the photodiode to the charge storage; an amplification transistor that outputs a pixel signal corresponding to the signal charge in the charge storage; a first reset transistor that resets the charge storage; a first storage capacitive element (C1 C4); and a first transistor (GC1 TGC) that controls a connection between the charge storage and the first storage capacitive element (C1 C4), a photodiode; a charge storage; a transfer transistor that transfers a signal charge generated by the photodiode to the charge storage; an amplification transistor that outputs a pixel signal corresponding to the signal charge in the charge storage; a first reset transistor that resets the charge storage; a first storage capacitive element (C1 C4); and a first transistor (GC1 TGC) that controls a connection between the charge storage and the first storage capacitive element (C1 C4), the negative feedback circuit negatively feeds back a feedback signal according to a reset output of the amplification transistor to the charge storage via the first reset transistor, and, wherein, a control signal input into the first reset transistor includes a sloped voltage waveform that gradually transitions from an on state to an off state, characterized in that, the solid-state imaging apparatus comprises a plurality of pixel circuits, and the solid-state imaging apparatus further comprises: a measurement unit configured to measure reset noise levels of pixel circuits located in a predetermined area among the plurality of pixel circuits; and a determination unit configured to determine an incline for the sloped voltage waveform that reduces variation in the reset noise levels, based on a measurement result of the measurement unit, a measurement unit configured to measure reset noise levels of pixel circuits located in a predetermined area among the plurality of pixel circuits; and a determination unit configured to determine an incline for the sloped voltage waveform that reduces variation in the reset noise levels, based on a measurement result of the measurement unit, the measurement unit is configured to measure the reset noise levels while varying the incline of the sloped voltage waveform, per row of the pixel circuits located in the predetermined area, and the determination unit is configured to determine an optimal incline for the sloped voltage waveform based on the variation per row of the pixel circuits located in the predetermined area.