A detector for determining a position of at least one object, the detector comprising: - at least one projector for illuminating the object with at least two illumination patterns, wherein the projector comprises at least one tunable laser source and at least one diffractive optical element, wherein the projector is configured to generate the at least two illumination patterns each comprising a plurality of illumination features by controlling at least one property of the tunable laser source, wherein the projector comprises at least one control unit, wherein the control unit is configured for controlling the at least one property of the tunable laser source, wherein the projector is operable in at least two emission modes, wherein the control unit is configured to adjust the emission mode by applying an electrical signal to the tunable laser source, wherein in a first emission mode the tunable laser source has a first emission wavelength λ 1 and in a second emission mode the tunable laser source has a second emission wavelength λ 2 different from the first emission wavelength λ 1, wherein the projector is configured to project the two illumination patterns to at least partly differing locations, wherein the control unit is configured to adjust the emission wavelength in steps or continuously thereby adjusting the location of the illumination patterns; - at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein each optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object to the detector, wherein the sensor element is configured to determine at least one reflection image; - at least one evaluation device, wherein the evaluation device is configured to select at least one reflection feature of the reflection image, wherein the evaluation device is configured for determining at least one longitudinal coordinate z of the selected reflection feature of the reflection image by evaluating a combined signal Q from the sensor signals, wherein the evaluation device is configured for deriving the combined signal Q by Q z O = ∫∫ A 1 E x y z O dxdy ∫∫ A 2 E x y z O dxdy wherein x and y are transversal coordinates, A1 and A2 are different areas of at least one beam profile of the reflection light beam at a position of the sensor element, and E(x,y,z o) denotes the beam profile given at the object distance z o, wherein each of the sensor signals comprises at least one information of at least one area of the beam profile of the reflection light beam. - at least one projector for illuminating the object with at least two illumination patterns, wherein the projector comprises at least one tunable laser source and at least one diffractive optical element, wherein the projector is configured to generate the at least two illumination patterns each comprising a plurality of illumination features by controlling at least one property of the tunable laser source, wherein the projector comprises at least one control unit, wherein the control unit is configured for controlling the at least one property of the tunable laser source, wherein the projector is operable in at least two emission modes, wherein the control unit is configured to adjust the emission mode by applying an electrical signal to the tunable laser source, wherein in a first emission mode the tunable laser source has a first emission wavelength λ 1 and in a second emission mode the tunable laser source has a second emission wavelength λ 2 different from the first emission wavelength λ 1, wherein the projector is configured to project the two illumination patterns to at least partly differing locations, wherein the control unit is configured to adjust the emission wavelength in steps or continuously thereby adjusting the location of the illumination patterns; - at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein each optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object to the detector, wherein the sensor element is configured to determine at least one reflection image; - at least one evaluation device, wherein the evaluation device is configured to select at least one reflection feature of the reflection image, wherein the evaluation device is configured for determining at least one longitudinal coordinate z of the selected reflection feature of the reflection image by evaluating a combined signal Q from the sensor signals, wherein the evaluation device is configured for deriving the combined signal Q by Q z O = ∫∫ A 1 E x y z O dxdy ∫∫ A 2 E x y z O dxdy wherein x and y are transversal coordinates, A1 and A2 are different areas of at least one beam profile of the reflection light beam at a position of the sensor element, and E(x,y,z o) denotes the beam profile given at the object distance z o, wherein each of the sensor signals comprises at least one information of at least one area of the beam profile of the reflection light beam.