An optical coherence analysis system, comprising: an interferometer splitter for splitting a source optical signal from a source between a sample arm and a reference arm; a first sample arm polarization beam splitter through which the source optical signal is transmitted after the interferometer splitter to a sample, the first sample arm polarization beam splitter directing a first polarization of the source optical signal returning from the sample to a first pair of the optical detectors (226, 232); a second sample arm polarization beam splitter through which the source optical signal is transmitted to the sample, the second sample arm polarization beam splitter directing a second polarization of the source optical signal returning from the sample to a second pair of the optical detectors (236, 238); a non-reciprocal sample polarization rotation system (228, 230) between the first sample arm polarization beam splitter and the second sample arm polarization beam splitter; a first reference arm beam splitter through which the source optical signal is transmitted in the reference arm, the first reference arm beam splitter directing the source optical signal reflected by a reflector in the reference arm to the first pair of the optical detectors (226, 232); a second reference arm beam splitter through which the source optical signal is transmitted in the reference arm, the second reference arm beam splitter directing the source optical signal reflected by the reflector in the reference arm to the second pair of the optical detectors (236, 238); a first detector interference splitter/combiner for generating interference signals detected by the first pair of detectors (226, 232) from the first polarization of the source optical signal returning from the sample and the source optical signal from the reference arm; a second detector interference splitter/combiner for generating interference signals detected by the second pair of detectors (236, 238) from the second polarization of the source optical signal returning from the sample and the source optical signal from the reference arm. an interferometer splitter for splitting a source optical signal from a source between a sample arm and a reference arm; a first sample arm polarization beam splitter through which the source optical signal is transmitted after the interferometer splitter to a sample, the first sample arm polarization beam splitter directing a first polarization of the source optical signal returning from the sample to a first pair of the optical detectors (226, 232); a second sample arm polarization beam splitter through which the source optical signal is transmitted to the sample, the second sample arm polarization beam splitter directing a second polarization of the source optical signal returning from the sample to a second pair of the optical detectors (236, 238); a non-reciprocal sample polarization rotation system (228, 230) between the first sample arm polarization beam splitter and the second sample arm polarization beam splitter; a first reference arm beam splitter through which the source optical signal is transmitted in the reference arm, the first reference arm beam splitter directing the source optical signal reflected by a reflector in the reference arm to the first pair of the optical detectors (226, 232); a second reference arm beam splitter through which the source optical signal is transmitted in the reference arm, the second reference arm beam splitter directing the source optical signal reflected by the reflector in the reference arm to the second pair of the optical detectors (236, 238); a first detector interference splitter/combiner for generating interference signals detected by the first pair of detectors (226, 232) from the first polarization of the source optical signal returning from the sample and the source optical signal from the reference arm; a second detector interference splitter/combiner for generating interference signals detected by the second pair of detectors (236, 238) from the second polarization of the source optical signal returning from the sample and the source optical signal from the reference arm.