A method of normalizing a fluorescence analyzer configured to illuminate a sample and obtain resultant fluorescence intensity measurements from the sample, the method comprising the steps of: measuring, using a spectrometer configured to receive an output illumination signal from the fluorescence analyzer, an excitation spectrum of the output illumination signal output from the fluorescence analyzer to obtain a data set of relative excitation irradiance as a function of wavelength for each incremental wavelength in a first wavelength range; determining at least one wavelength characteristic function of the excitation spectrum of the fluorescence analyzer based upon the obtained data set of relative excitation irradiance as a function of wavelength for each incremental wavelength in the first wavelength range, wherein the at least one wavelength characteristic function of the excitation spectrum includes a first term proportional to a fractional area under a first portion of the excitation spectrum and a second term proportional to a fractional area under a second, different, portion of the excitation spectrum; measuring an emission sensitivity spectrum obtained by the fluorescence analyzer in response to input of an input illumination signal into the fluorescence analyzer using a monochromator to obtain a data set of relative irradiance sensitivity as a function of wavelength for each incremental wavelength in a second wavelength range, wherein the monochromator receives broadband illumination and is scanned through the second wavelength range to provide the input illumination; determining at least one wavelength characteristic function of the emission sensitivity spectrum of the fluorescence analyzer based upon the obtained data set of relative irradiance sensitivity as a function of wavelength for each incremental wavelength in the second wavelength range, wherein the at least one wavelength characteristic function of the emission sensitivity spectrum includes a first term proportional to a fractional area under a first portion of the emission sensitivity spectrum and a second term proportional to a fractional area under a second, different, portion of the emission sensitivity spectrum; and determining a normalization factor based at least upon the at least one wavelength characteristic function of the excitation spectrum and the at least one wavelength characteristic function of the emission sensitivity spectrum, wherein, the normalization factor is used to normalize an analyzer response value of the fluorescence analyzer. measuring, using a spectrometer configured to receive an output illumination signal from the fluorescence analyzer, an excitation spectrum of the output illumination signal output from the fluorescence analyzer to obtain a data set of relative excitation irradiance as a function of wavelength for each incremental wavelength in a first wavelength range; determining at least one wavelength characteristic function of the excitation spectrum of the fluorescence analyzer based upon the obtained data set of relative excitation irradiance as a function of wavelength for each incremental wavelength in the first wavelength range, wherein the at least one wavelength characteristic function of the excitation spectrum includes a first term proportional to a fractional area under a first portion of the excitation spectrum and a second term proportional to a fractional area under a second, different, portion of the excitation spectrum; measuring an emission sensitivity spectrum obtained by the fluorescence analyzer in response to input of an input illumination signal into the fluorescence analyzer using a monochromator to obtain a data set of relative irradiance sensitivity as a function of wavelength for each incremental wavelength in a second wavelength range, wherein the monochromator receives broadband illumination and is scanned through the second wavelength range to provide the input illumination; determining at least one wavelength characteristic function of the emission sensitivity spectrum of the fluorescence analyzer based upon the obtained data set of relative irradiance sensitivity as a function of wavelength for each incremental wavelength in the second wavelength range, wherein the at least one wavelength characteristic function of the emission sensitivity spectrum includes a first term proportional to a fractional area under a first portion of the emission sensitivity spectrum and a second term proportional to a fractional area under a second, different, portion of the emission sensitivity spectrum; and determining a normalization factor based at least upon the at least one wavelength characteristic function of the excitation spectrum and the at least one wavelength characteristic function of the emission sensitivity spectrum, wherein, the normalization factor is used to normalize an analyzer response value of the fluorescence analyzer.