An optical coherence tomography apparatus for irradiating a sample, comprising: a) an interferometer in a backscattering configuration forwarding an electromagnetic radiation; the interferometer comprising a sample arm receiving the electromagnetic radiation, the sample arm including an arrangement which is configured to separate at least two beamlets (1,2) from the electromagnetic radiation so as to irradiate the sample, and the arrangement is configured to delay a first beamlet of the at least two beamlets with respect to a second beamlet of the at least two beamlets, wherein the delay is a difference in an optical path length, and a reference arm providing a further electromagnetic radiation, wherein the interferometer receives the first beamlet, the second beam let and the further radiation, and forms a resultant signal based on the first and second beamlets and the further radiation; b) a processing arrangement configured for generating a first image based on the first beamlet, a second image based on the second beamlet, and a further image based on the first and second images, wherein the first and second images are different from one another, wherein the further image is generated based on an incoherent mathematical combination of the first and second images so as to reduce speckle, and wherein the arrangement has: □ a first configuration with a refractive index of at least 1.5, and propagates one of the at least two beamlets, or □ a second configuration which has silicon, and propagates one of the at least two beamlets. a) an interferometer in a backscattering configuration forwarding an electromagnetic radiation; the interferometer comprising a sample arm receiving the electromagnetic radiation, the sample arm including an arrangement which is configured to separate at least two beamlets (1,2) from the electromagnetic radiation so as to irradiate the sample, and the arrangement is configured to delay a first beamlet of the at least two beamlets with respect to a second beamlet of the at least two beamlets, wherein the delay is a difference in an optical path length, and a reference arm providing a further electromagnetic radiation, wherein the interferometer receives the first beamlet, the second beam let and the further radiation, and forms a resultant signal based on the first and second beamlets and the further radiation; a sample arm receiving the electromagnetic radiation, the sample arm including an arrangement which is configured to separate at least two beamlets (1,2) from the electromagnetic radiation so as to irradiate the sample, and the arrangement is configured to delay a first beamlet of the at least two beamlets with respect to a second beamlet of the at least two beamlets, wherein the delay is a difference in an optical path length, and a reference arm providing a further electromagnetic radiation, wherein the interferometer receives the first beamlet, the second beam let and the further radiation, and forms a resultant signal based on the first and second beamlets and the further radiation; b) a processing arrangement configured for generating a first image based on the first beamlet, a second image based on the second beamlet, and a further image based on the first and second images, wherein the first and second images are different from one another, wherein the further image is generated based on an incoherent mathematical combination of the first and second images so as to reduce speckle, and □ a first configuration with a refractive index of at least 1.5, and propagates one of the at least two beamlets, or □ a second configuration which has silicon, and propagates one of the at least two beamlets.