A method of controlling a supply voltage of a voltage regulator for a sector of an integrated circuit. the method comprising: sending a command from a processor in the integrated circuit to a sector manager to configure a regulator control circuit to a testing mode; translating the command by the sector manager to generate a first plurality of bits; loading the first plurality of bits into registers so as to set the regulator control circuit to the testing mode, the registers comprising a voltage trimming register that receives a first set of bits of the first plurality of bits to maintain a voltage level of a supply voltage of the sector of the integrated circuit and a test control register that receives a second set of bits of the first plurality of bits to enable or disable the testing mode of the regulator control circuit, and wherein the voltage trimming register and the test control register are arranged in a serial chain; and sending, by the regulator control circuit, the supply voltage output of the voltage regulator to a voltage analog-to-digital converter, converting the supply voltage to a digital reading by the voltage analog-to-digital converter; providing the digital reading from the voltage analog-to-digital converter to the processor; processing the digital reading by the processor so as to generate a decision instruction; and sending the decision instruction from the processor to the sector manager, translating the decision instruction to a second plurality of bits by the sector manager; loading the second plurality of bits into the registers; adjusting the voltage level of the supply voltage of the voltage regulator based on a first set of the second plurality of bits received at the voltage trimming register; and resetting the regulator control circuit to a normal operating mode based on a second set of the second plurality of bits received at the test control register. sending a command from a processor in the integrated circuit to a sector manager to configure a regulator control circuit to a testing mode; translating the command by the sector manager to generate a first plurality of bits; loading the first plurality of bits into registers so as to set the regulator control circuit to the testing mode, the registers comprising a voltage trimming register that receives a first set of bits of the first plurality of bits to maintain a voltage level of a supply voltage of the sector of the integrated circuit and a test control register that receives a second set of bits of the first plurality of bits to enable or disable the testing mode of the regulator control circuit, and wherein the voltage trimming register and the test control register are arranged in a serial chain; and sending, by the regulator control circuit, the supply voltage output of the voltage regulator to a voltage analog-to-digital converter, converting the supply voltage to a digital reading by the voltage analog-to-digital converter; providing the digital reading from the voltage analog-to-digital converter to the processor; processing the digital reading by the processor so as to generate a decision instruction; and sending the decision instruction from the processor to the sector manager, translating the decision instruction to a second plurality of bits by the sector manager; loading the second plurality of bits into the registers; adjusting the voltage level of the supply voltage of the voltage regulator based on a first set of the second plurality of bits received at the voltage trimming register; and resetting the regulator control circuit to a normal operating mode based on a second set of the second plurality of bits received at the test control register.