A device (20, 30) for three-dimensional in depth imaging by full-field interferential microscopy of a volumic and scattering sample comprising: - an emission source with low temporal coherence, wherein the emission source has a variable spectral bandwidth, - an imaging interferometer (200, 300) of variable magnification, comprising ∘ a reference arm comprising a reference mirror (205, 305), ∘ an object arm for receiving the sample, ∘ means for varying the relative path difference between the object and reference arms, ∘ a multichannel acquisition device and an optical conjugation device with variable magnification for optically conjugating the sample and said multichannel device, wherein the imaging interferometer allows for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of light emitted by the emission source on said reference mirror and an object wave obtained by backscattering of light emitted by the emission source by a slice of the sample at a given depth into the sample, the at least two interferometric images having a phase difference obtained by varying the relative path difference between the object and reference arms, - a processing unit for processing said interferometric images making it possible to obtain a tomographic image of said slice of the sample, - means for axially displacing the interferometer relative to the sample allowing for the acquisition of tomographic images for slices at different depths into the sample, - means for varying the magnification of the conjugation device of the imaging interferometer allowing for the acquisition of interferometric images of a slice of the sample for different magnification values, and - means for varying the spectral bandwidth of the emission source allowing for the acquisition of interferometric images of slices of the sample of different thicknesses. - an emission source with low temporal coherence, wherein the emission source has a variable spectral bandwidth, - an imaging interferometer (200, 300) of variable magnification, comprising ∘ a reference arm comprising a reference mirror (205, 305), ∘ an object arm for receiving the sample, ∘ means for varying the relative path difference between the object and reference arms, ∘ a multichannel acquisition device and an optical conjugation device with variable magnification for optically conjugating the sample and said multichannel device, wherein the imaging interferometer allows for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of light emitted by the emission source on said reference mirror and an object wave obtained by backscattering of light emitted by the emission source by a slice of the sample at a given depth into the sample, the at least two interferometric images having a phase difference obtained by varying the relative path difference between the object and reference arms, ∘ a reference arm comprising a reference mirror (205, 305), ∘ an object arm for receiving the sample, ∘ means for varying the relative path difference between the object and reference arms, ∘ a multichannel acquisition device and an optical conjugation device with variable magnification for optically conjugating the sample and said multichannel device, wherein the imaging interferometer allows for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of light emitted by the emission source on said reference mirror and an object wave obtained by backscattering of light emitted by the emission source by a slice of the sample at a given depth into the sample, the at least two interferometric images having a phase difference obtained by varying the relative path difference between the object and reference arms, - a processing unit for processing said interferometric images making it possible to obtain a tomographic image of said slice of the sample, - means for axially displacing the interferometer relative to the sample allowing for the acquisition of tomographic images for slices at different depths into the sample, - means for varying the magnification of the conjugation device of the imaging interferometer allowing for the acquisition of interferometric images of a slice of the sample for different magnification values, and - means for varying the spectral bandwidth of the emission source allowing for the acquisition of interferometric images of slices of the sample of different thicknesses.