An apparatus for managing an imaging workflow of an X-ray imaging system for an upcoming imaging sequence, comprising: - an input unit; - a processing unit; and - an output unit; wherein the input unit is configured to receive data including (i) a current temperature profile of an X-ray anode inside a tube housing of the X-ray imaging system, (ii) information about a heat capability and a cooling rate of the X-ray anode, (iii) information about a heat capability and a cooling rate of the tube housing, (iv) information about a current operation condition of the X-ray imaging system, and (v) information about a planned operation condition of the X-ray imaging system for the upcoming imaging sequence, wherein the planned operation condition comprises a sequence of planned scans, each planned scan being associated with a respective set of planned scan parameters; wherein the processing unit is configured to: - determine, based on the received data, an estimated temperature profile of the X-ray anode under the planned operation condition for the upcoming imaging sequence, - compare the estimated temperature profile of the X-ray anode with a maximum allowable hardware temperature of the X-ray anode, and - in response to the determination that the estimated temperature profile is greater than or equal to the maximum allowable hardware temperature of the X-ray anode, modify the planned operation condition such that the estimated temperature profile of the X-ray anode under the modified planned operation condition is less than the maximum allowable hardware temperature of the X-ray anode, wherein the modified planned operation condition comprises a change of the sequence of planned scans and/or a change of the set of planned scan parameters for one or more planned scans; and wherein the output unit is configured to provide the modified planned operation condition for the upcoming imaging sequence. - an input unit; - a processing unit; and - an output unit; wherein the input unit is configured to receive data including (i) a current temperature profile of an X-ray anode inside a tube housing of the X-ray imaging system, (ii) information about a heat capability and a cooling rate of the X-ray anode, (iii) information about a heat capability and a cooling rate of the tube housing, (iv) information about a current operation condition of the X-ray imaging system, and (v) information about a planned operation condition of the X-ray imaging system for the upcoming imaging sequence, wherein the planned operation condition comprises a sequence of planned scans, each planned scan being associated with a respective set of planned scan parameters; wherein the processing unit is configured to: - determine, based on the received data, an estimated temperature profile of the X-ray anode under the planned operation condition for the upcoming imaging sequence, - compare the estimated temperature profile of the X-ray anode with a maximum allowable hardware temperature of the X-ray anode, and - in response to the determination that the estimated temperature profile is greater than or equal to the maximum allowable hardware temperature of the X-ray anode, modify the planned operation condition such that the estimated temperature profile of the X-ray anode under the modified planned operation condition is less than the maximum allowable hardware temperature of the X-ray anode, wherein the modified planned operation condition comprises a change of the sequence of planned scans and/or a change of the set of planned scan parameters for one or more planned scans; and - determine, based on the received data, an estimated temperature profile of the X-ray anode under the planned operation condition for the upcoming imaging sequence, - compare the estimated temperature profile of the X-ray anode with a maximum allowable hardware temperature of the X-ray anode, and - in response to the determination that the estimated temperature profile is greater than or equal to the maximum allowable hardware temperature of the X-ray anode, modify the planned operation condition such that the estimated temperature profile of the X-ray anode under the modified planned operation condition is less than the maximum allowable hardware temperature of the X-ray anode, wherein the modified planned operation condition comprises a change of the sequence of planned scans and/or a change of the set of planned scan parameters for one or more planned scans; and wherein the output unit is configured to provide the modified planned operation condition for the upcoming imaging sequence.