An information processing apparatus comprising: an accepting unit that accepts pattern information, which is information indicating a pattern figure that is a figure that is to be drawn by an electron beam writer, and actually observed contour information, which is information acquired using an image obtained by capturing an image of a figure drawn according to the pattern figure by the electron beam writer, and indicating an actually observed contour that is a contour of the captured figure and which is information having coordinates of an n number of actually observed contour points forming the actually observed contour; a transforming information acquiring unit that calculates, using the pattern information and the actually observed contour information, i) transforming information, which is a transforming vector α for correcting coordinates of the n number of actually observed contour points that are points on the actually observed contour respectively into an n number of corrected contour points that are points obtained by correcting the n number of actually observed points, where n is an integer of three or more, and ii) a threshold T, the acquired pair of transforming information and threshold minimizing a value calculated from a formula; a corrected contour point acquiring unit that acquires the n number of corrected contour points respectively corresponding to the n number of actually observed contour points, using the actually observed contour information and the acquired transforming information, and acquires corrected contour point information, which is information indicating the acquired n number of corrected contour points; and an output unit that outputs the corrected contour point information, wherein the formula is expressed as ∑ i = 1 n I M x i M α − T 2 where x M i is coordinates of an i-th actually observed contour point, i being an integer of 1, 2,..., n, M is a function for calculating coordinates of a corrected contour point using the coordinates of the actually observed contour point and the transforming vector α, and I (x) is a function for calculating the intensity of the electron beams on a point x when electron beams are incident on the entire irradiation region, for drawing, in the pattern figure indicated by the pattern information, wherein the coordinates of said point x are the coordinates of a corrected contour point M (x M i,α) and wherein a given point spread function indicates the intensity distribution at a given point in the irradiation region. an accepting unit that accepts pattern information, which is information indicating a pattern figure that is a figure that is to be drawn by an electron beam writer, and actually observed contour information, which is information acquired using an image obtained by capturing an image of a figure drawn according to the pattern figure by the electron beam writer, and indicating an actually observed contour that is a contour of the captured figure and which is information having coordinates of an n number of actually observed contour points forming the actually observed contour; a transforming information acquiring unit that calculates, using the pattern information and the actually observed contour information, i) transforming information, which is a transforming vector α for correcting coordinates of the n number of actually observed contour points that are points on the actually observed contour respectively into an n number of corrected contour points that are points obtained by correcting the n number of actually observed points, where n is an integer of three or more, and ii) a threshold T, the acquired pair of transforming information and threshold minimizing a value calculated from a formula; a corrected contour point acquiring unit that acquires the n number of corrected contour points respectively corresponding to the n number of actually observed contour points, using the actually observed contour information and the acquired transforming information, and acquires corrected contour point information, which is information indicating the acquired n number of corrected contour points; and an output unit that outputs the corrected contour point information, wherein the formula is expressed as ∑ i = 1 n I M x i M α − T 2 where x M i is coordinates of an i-th actually observed contour point, i being an integer of 1, 2,..., n, M is a function for calculating coordinates of a corrected contour point using the coordinates of the actually observed contour point and the transforming vector α, and I (x) is a function for calculating the intensity of the electron beams on a point x when electron beams are incident on the entire irradiation region, for drawing, in the pattern figure indicated by the pattern information, wherein the coordinates of said point x are the coordinates of a corrected contour point M (x M i,α) and wherein a given point spread function indicates the intensity distribution at a given point in the irradiation region.