An apparatus for providing analog drive transistor control signals to the gate electrodes of drive transistors in a plurality of electroluminescent subpixels in an EL panel, including a first voltage supply, a second voltage supply, and the plurality of EL subpixels in the EL panel; each EL subpixel including an EL emitter and a drive transistor with a first supply electrode electrically connected to the first voltage supply and a second supply electrode electrically connected to a first electrode of the EL emitter; and each EL emitter having a second electrode electrically connected to the second voltage supply, the apparatus further comprising: a) a measuring circuit configured to measure a respective current passing through the first and the second voltage supplies (211, 206) at a predetermined measurement gate voltage to provide a status signal for each subpixel representing a characteristic of the drive transistor and EL emitter in that EL subpixel, wherein the respective currents produced at a first EL subpixel and second EL subpixel differ by a current difference so that an offset and a gain are usable for the subsequent compensation rather than fully stored I-V curves (501, 502) for each subpixel and wherein each status signal comprises the gain and the offset; b) means for providing a linear code value for each subpixel; c) a compensator configured to change the linear code values in response to the corresponding status signals to compensate for the differences between the characteristics of the drive transistors in the plurality of EL subpixels, and for differences between the characteristics of the EL emitters in the plurality of EL subpixels; and d) a linear source driver configured to produce the analog drive transistor control signals in response to the changed linear code values so as to drive the gate electrodes of the drive transistors, characterized in that the measuring circuit includes: i) a current to voltage converter configured to produce a voltage signal; and ii) a correlated double-sampling unit responsive to the voltage signal configured to provide the status signal to the compensator. a) a measuring circuit configured to measure a respective current passing through the first and the second voltage supplies (211, 206) at a predetermined measurement gate voltage to provide a status signal for each subpixel representing a characteristic of the drive transistor and EL emitter in that EL subpixel, wherein the respective currents produced at a first EL subpixel and second EL subpixel differ by a current difference so that an offset and a gain are usable for the subsequent compensation rather than fully stored I-V curves (501, 502) for each subpixel and wherein each status signal comprises the gain and the offset; b) means for providing a linear code value for each subpixel; c) a compensator configured to change the linear code values in response to the corresponding status signals to compensate for the differences between the characteristics of the drive transistors in the plurality of EL subpixels, and for differences between the characteristics of the EL emitters in the plurality of EL subpixels; and d) a linear source driver configured to produce the analog drive transistor control signals in response to the changed linear code values so as to drive the gate electrodes of the drive transistors, characterized in that the measuring circuit includes: i) a current to voltage converter configured to produce a voltage signal; and ii) a correlated double-sampling unit responsive to the voltage signal configured to provide the status signal to the compensator. i) a current to voltage converter configured to produce a voltage signal; and ii) a correlated double-sampling unit responsive to the voltage signal configured to provide the status signal to the compensator.