An electrophotographic photosensitive member comprising: a cylindrical support, a conductive layer formed on the cylindrical support, and a photosensitive layer formed on the conductive layer, wherein, the conductive layer comprises: a metal oxide particle coated with tin oxide doped with niobium or tantalum, and a binder material, Ia and Ib satisfy relations (i) and (ii): Ia ≤ 6, 000 10 ≤ Ib where, in the relation (i), Ia [μA] is an absolute value of the largest amount of a current flowing through the conductive layer when a test which continuously applies a voltage having only a DC voltage of -1.0 kV to the conductive layer is performed, and, in the relation (ii), Ib [μA] is an absolute value of an amount of a current flowing through the conductive layer when a decrease rate per minute of the current flowing through the conductive layer reaches 1% or less for the first time, and Ia and Ib are measured according to the description and the conductive layer before the test is performed has a volume resistivity - as measured according to the description - of not less than 1.0 × 10 8 Ω·cm and not more than 5.0 × 10 12 Ω·cm, wherein the metal oxide particle coated with tin oxide doped with niobium or tantalum is selected from the group consisting of: titanium oxide particle coated with tin oxide doped with niobium, titanium oxide particle coated with tin oxide doped with tantalum, tin oxide particle coated with tin oxide doped with niobium, tin oxide particle coated with tin oxide doped with tantalum, zinc oxide particle coated with tin oxide doped with niobium, and zinc oxide particle coated with tin oxide doped with tantalum. a cylindrical support, a conductive layer formed on the cylindrical support, and a photosensitive layer formed on the conductive layer, wherein, the conductive layer comprises: a metal oxide particle coated with tin oxide doped with niobium or tantalum, and a binder material, a metal oxide particle coated with tin oxide doped with niobium or tantalum, and a binder material, Ia and Ib satisfy relations (i) and (ii): Ia ≤ 6, 000 10 ≤ Ib where, in the relation (i), Ia [μA] is an absolute value of the largest amount of a current flowing through the conductive layer when a test which continuously applies a voltage having only a DC voltage of -1.0 kV to the conductive layer is performed, and, in the relation (ii), Ib [μA] is an absolute value of an amount of a current flowing through the conductive layer when a decrease rate per minute of the current flowing through the conductive layer reaches 1% or less for the first time, and Ia and Ib are measured according to the description and the conductive layer before the test is performed has a volume resistivity - as measured according to the description - of not less than 1.0 × 10 8 Ω·cm and not more than 5.0 × 10 12 Ω·cm, wherein the metal oxide particle coated with tin oxide doped with niobium or tantalum is selected from the group consisting of: titanium oxide particle coated with tin oxide doped with niobium, titanium oxide particle coated with tin oxide doped with tantalum, tin oxide particle coated with tin oxide doped with niobium, tin oxide particle coated with tin oxide doped with tantalum, zinc oxide particle coated with tin oxide doped with niobium, and zinc oxide particle coated with tin oxide doped with tantalum. titanium oxide particle coated with tin oxide doped with niobium, titanium oxide particle coated with tin oxide doped with tantalum, tin oxide particle coated with tin oxide doped with niobium, tin oxide particle coated with tin oxide doped with tantalum, zinc oxide particle coated with tin oxide doped with niobium, and zinc oxide particle coated with tin oxide doped with tantalum.