An adhesion strength detection system comprising: a die assembly including a lower die, a fixture fitted to the lower die, and a sample including a test ring and filled at least at one end of the ring with a cured polymer disk, the test ring resting on the lower die, the cured polymer disk unobstructed by the lower die; and a piston insertable into the fixture, wherein the sample may be fitted between the lower die and the fixture, such that the piston may come to rest on the cured polymer disk of the sample and be moved to apply a force to the cured polymer disk in an attempt to delaminate the cured polymer disk from the test ring; and a tensile testing machine structured to accept the die assembly, the tensile testing machine storing a force application program suitable for the sample, wherein the force application program when executed causes the piston to be moved against the cured polymer disk of the sample, the tensile testing machine further configured to measure a resistive force applied by the sample while the piston is moved at least until delamination of the cured polymer disk from the test ring within the sample occurs. a die assembly including a lower die, a fixture fitted to the lower die, and a sample including a test ring and filled at least at one end of the ring with a cured polymer disk, the test ring resting on the lower die, the cured polymer disk unobstructed by the lower die; and a piston insertable into the fixture, wherein the sample may be fitted between the lower die and the fixture, such that the piston may come to rest on the cured polymer disk of the sample and be moved to apply a force to the cured polymer disk in an attempt to delaminate the cured polymer disk from the test ring; and a tensile testing machine structured to accept the die assembly, the tensile testing machine storing a force application program suitable for the sample, wherein the force application program when executed causes the piston to be moved against the cured polymer disk of the sample, the tensile testing machine further configured to measure a resistive force applied by the sample while the piston is moved at least until delamination of the cured polymer disk from the test ring within the sample occurs. a lower die, a fixture fitted to the lower die, and a sample including a test ring and filled at least at one end of the ring with a cured polymer disk, the test ring resting on the lower die, the cured polymer disk unobstructed by the lower die; and a piston insertable into the fixture, wherein the sample may be fitted between the lower die and the fixture, such that the piston may come to rest on the cured polymer disk of the sample and be moved to apply a force to the cured polymer disk in an attempt to delaminate the cured polymer disk from the test ring; and a tensile testing machine structured to accept the die assembly, the tensile testing machine storing a force application program suitable for the sample, wherein the force application program when executed causes the piston to be moved against the cured polymer disk of the sample, the tensile testing machine further configured to measure a resistive force applied by the sample while the piston is moved at least until delamination of the cured polymer disk from the test ring within the sample occurs.