An optoelectronic solar cell test system for an in-line solar cell production plant, the solar cell test system comprising: - an exposure and measuring device for in-line measurement of solar cells, and - a control and evaluation unit coupled to the exposure and measuring device, the exposure and measuring device being configured and adapted to carry out one or more test measurements on a solar cell in order to generate test measurement data, the test measurements being selected from the group consisting of: - infrared image measurement of a solar cell energized in the reverse direction in order to determine local short circuits in the solar cell, - flash exposure with an exposure spectrum in order to measure at least one current-voltage characteristic curve of the solar cell, - a multiplicity of spectrally differentiated flash exposures in order to measure spectrally resolved current characteristic curves of the solar cell and/or in order to measure a quasi-external quantum efficiency of the solar cell, - electroluminescence measurement of the solar cell, particularly in order to determine microcracks in the solar cell material and/or in order to determine electrode structure interruptions and/or contact problems between electrode structures and the substrate and/or in order to determine electrically inactive regions and/or local short circuits, - measurement of the bright characteristic curve and measurement of the dark characteristic curve of the solar cell in order to calculate the series resistance of the solar cell, - resistance measurement of the electrode structures comprising electrode fingers in order to determine the quality of the metal electrode structures, characterized in that the control and evaluation unit is adapted and configured to carry out statistical analyses with test measurement data of the same test measurements, carried out by means of the exposure and measuring device on a plurality of solar cells produced in-line, and - to correlate the statistical analyses of the test measurement data of different test measurements with one another and/or - to correlate the statistical analyses of test measurement data (TMstat) with statistical analyses of production measurement data (PMstat) and/or - to correlate the statistical analyses of test measurement data (TMstat) and/or the statistical analyses of production measurement data (PMstat) with production input data, in order to generate correlation results and to derive at least one handling proposal and/or at least one handling instruction, which are assigned to at least one person group (PG1, PG2, PGn) involved in the in-line production of the solar cells, from the correlation results with the aid of derivation rules, the control and evaluation unit comprising a communication device which transmits the at least one handling proposal and/or the at least one handling instruction to the at least one assigned person group (PG1, PG2, PGn). - an exposure and measuring device for in-line measurement of solar cells, and - a control and evaluation unit coupled to the exposure and measuring device, the exposure and measuring device being configured and adapted to carry out one or more test measurements on a solar cell in order to generate test measurement data, the test measurements being selected from the group consisting of: the exposure and measuring device being configured and adapted to carry out one or more test measurements on a solar cell in order to generate test measurement data, the test measurements being selected from the group consisting of: - infrared image measurement of a solar cell energized in the reverse direction in order to determine local short circuits in the solar cell, - flash exposure with an exposure spectrum in order to measure at least one current-voltage characteristic curve of the solar cell, - a multiplicity of spectrally differentiated flash exposures in order to measure spectrally resolved current characteristic curves of the solar cell and/or in order to measure a quasi-external quantum efficiency of the solar cell, - electroluminescence measurement of the solar cell, particularly in order to determine microcracks in the solar cell material and/or in order to determine electrode structure interruptions and/or contact problems between electrode structures and the substrate and/or in order to determine electrically inactive regions and/or local short circuits, - measurement of the bright characteristic curve and measurement of the dark characteristic curve of the solar cell in order to calculate the series resistance of the solar cell, - resistance measurement of the electrode structures comprising electrode fingers in order to determine the quality of the metal electrode structures, characterized in that the control and evaluation unit is adapted and configured to carry out statistical analyses with test measurement data of the same test measurements, carried out by means of the exposure and measuring device on a plurality of solar cells produced in-line, and - to correlate the statistical analyses of the test measurement data of different test measurements with one another and/or - to correlate the statistical analyses of test measurement data (TMstat) with statistical analyses of production measurement data (PMstat) and/or - to correlate the statistical analyses of test measurement data (TMstat) and/or the statistical analyses of production measurement data (PMstat) with production input data,