A measurement device (100, 150, 180) for the determination of one or more properties of a measured object by means of an optical radiation, wherein the measurement device comprises: - at least one optical radiation source for emitting optical radiation to the measured object, and - at least one detector for receiving the radiation reflected from the measured object and for generating an electric signal proportional to its intensity, wherein the measurement device in addition comprises - an emitted optical radiation processing unit, which is adjusted to split optical radiation emitted by the optical source to separate wavelengths (103, 104a, 104b, 104c) and to direct said separate wavelengths to the measured object in a direction that differs from the normal of the surface being measured so that at least the shortest and the longest wavelengths (104a, 104b, 104c) of said wavelengths are focused on different sides (109a, 109b) of the measured object's surface and to different heights (109a, 109b) in the direction of the normal of the surface being measured, - a reflected optical radiation processing unit, which is adjusted to receive an optical radiation reflected from the measured object at least in the direction of a specular reflection, which differs from the normal of the surface being measured, and to direct received optical radiation to said detector, wherein the measurement device (100, 150, 180) is adjusted to analyze an electric signal produced by the detector and proportional to the intensity of the radiation focused thereto, characterised in that the measurement device is further adjusted to determine at least a characteristic describing measured object's surface gloss, such as gloss degree, based on the intensity of that wavelength, the focus point of which was located (104a, 104b, 104c) on the measured surface, and thus, reflected from that point to the detector as a strongest wavelength in the specular geometry. - at least one optical radiation source for emitting optical radiation to the measured object, and - at least one detector for receiving the radiation reflected from the measured object and for generating an electric signal proportional to its intensity, wherein the measurement device in addition comprises - an emitted optical radiation processing unit, which is adjusted to split optical radiation emitted by the optical source to separate wavelengths (103, 104a, 104b, 104c) and to direct said separate wavelengths to the measured object in a direction that differs from the normal of the surface being measured so that at least the shortest and the longest wavelengths (104a, 104b, 104c) of said wavelengths are focused on different sides (109a, 109b) of the measured object's surface and to different heights (109a, 109b) in the direction of the normal of the surface being measured, - a reflected optical radiation processing unit, which is adjusted to receive an optical radiation reflected from the measured object at least in the direction of a specular reflection, which differs from the normal of the surface being measured, and to direct received optical radiation to said detector, wherein the measurement device (100, 150, 180) is adjusted to analyze an electric signal produced by the detector and proportional to the intensity of the radiation focused thereto, characterised in that the measurement device is further adjusted to determine at least a characteristic describing measured object's surface gloss, such as gloss degree, based on the intensity of that wavelength, the focus point of which was located (104a, 104b, 104c) on the measured surface, and thus, reflected from that point to the detector as a strongest wavelength in the specular geometry.