A spectroscopic measurement device comprising: a fixed reflection unit; a movable reflection unit that has a reflection surface parallel to a reflection surface of the fixed reflection unit and is movable in a direction perpendicular to the reflection surface of the fixed reflection unit; an incident optical system that causes measurement light emitted from each of a plurality of measurement points inside of an object to be measured to enter the reflection surface of the fixed reflection unit and the reflection surface of the movable reflection unit; an imaging optical system that introduces fixed reflected measurement light reflected by the reflection surface of the fixed reflection unit and movable reflected measurement light reflected by the reflection surface of the movable reflection unit to the same point and forms interference light of the two reflected measurement lights; a light detection unit including a plurality of pixels for detecting an intensity of the interference light; and an arithmetic processing unit that obtains an interferogram of the measurement light from a detection signal of each pixel of the light detection unit when the movable reflection unit is moved, and obtains a spectrum of the measurement light based on the interferogram, characterized in that a dark filter is arranged on an optical path between the imaging optical system and the light detection unit and includes a plurality of regions having different transmittances, the dark filter being configured such that the fixed reflected measurement light and the movable reflected measurement light that form the interference light that enters each pixel of the light detection unit are transmitted through the same region, the dark filter being further configured that a plurality of interference lights, each having passed through a region of different transmittance, are incident on the light detection unit to be detected at the same time, and in that the arithmetic processing unit obtains an interferogram for each of the detected inteference lights at a transmittance corresponding to each of the plurality of regions. a fixed reflection unit; a movable reflection unit that has a reflection surface parallel to a reflection surface of the fixed reflection unit and is movable in a direction perpendicular to the reflection surface of the fixed reflection unit; an incident optical system that causes measurement light emitted from each of a plurality of measurement points inside of an object to be measured to enter the reflection surface of the fixed reflection unit and the reflection surface of the movable reflection unit; an imaging optical system that introduces fixed reflected measurement light reflected by the reflection surface of the fixed reflection unit and movable reflected measurement light reflected by the reflection surface of the movable reflection unit to the same point and forms interference light of the two reflected measurement lights; a light detection unit including a plurality of pixels for detecting an intensity of the interference light; and an arithmetic processing unit that obtains an interferogram of the measurement light from a detection signal of each pixel of the light detection unit when the movable reflection unit is moved, and obtains a spectrum of the measurement light based on the interferogram, characterized in that a dark filter is arranged on an optical path between the imaging optical system and the light detection unit and includes a plurality of regions having different transmittances, the dark filter being configured such that the fixed reflected measurement light and the movable reflected measurement light that form the interference light that enters each pixel of the light detection unit are transmitted through the same region, the dark filter being further configured that a plurality of interference lights, each having passed through a region of different transmittance, are incident on the light detection unit to be detected at the same time, and in that the arithmetic processing unit obtains an interferogram for each of the detected inteference lights at a transmittance corresponding to each of the plurality of regions.