An additive manufacturing device comprising: a beam irradiation unit configured to irradiate a conductive powder disposed in a layered shape with an electron beam to thereby melt the conductive powder of a first layer; a nondestructive inspection unit configured to detect a flaw in a surface layer of an additively manufactured article formed of the hardened conductive powder; a powder applying mechanism configured to supply of a second layer and leveling the second layer, wherein the powder applying mechanism is configured to laminate the conductive powder of the second layer on the additively manufactured article and level the second layer; and a controller including an energy control unit (33, 34) configured to control energy of the electron beam, and a computation unit configured to calculate a depth of the flaw, wherein the energy control unit (33, 34) is configured to increase energy of an electron beam when a repairing region set in accordance with results of flaw detection by the nondestructive inspection unit is irradiated with the electron beam to thereby repair the region, wherein the conductive powder is one of a metal powder and carbon fiber reinforced plastics, wherein the nondestructive inspection unit is a probe, the computation unit is configured to calculate the depth of the flaw based on a signal detected by the probe, wherein the probe is attached to the powder applying mechanism, wherein a bottom surface of the probe is disposed above a lower end of the powder applying mechanism, wherein a gap is formed between the bottom surface of the probe and an outer surface of a laminate of the conductive powder, wherein the probe extends in a first direction intersecting a second direction, which is a scanning direction of the probe, wherein the probe includes a plurality of rows of inspection coils disposed side by side in the first direction and the second direction, wherein the beam irradiation unit is provided with an electron gun configured to perform irradiation of an electron ray serving as the electron beam, an acceleration power source configured to supply an acceleration voltage to the electron gun, and a coil portion configured to form a magnetic field in a region in front of an irradiation port of the electron gun, wherein the energy control unit includes an acceleration voltage control unit configured to control the acceleration voltage, and a coil control unit configured to control the coil portion, wherein the acceleration voltage control unit is configured to further increase the acceleration voltage in accordance with the depth of the detected flaw. a beam irradiation unit configured to irradiate a conductive powder disposed in a layered shape with an electron beam to thereby melt the conductive powder of a first layer; a nondestructive inspection unit configured to detect a flaw in a surface layer of an additively manufactured article formed of the hardened conductive powder; a powder applying mechanism configured to supply of a second layer and leveling the second layer, wherein the powder applying mechanism is configured to laminate the conductive powder of the second layer on the additively manufactured article and level the second layer; and a controller including an energy control unit (33, 34) configured to control energy of the electron beam, and a computation unit configured to calculate a depth of the flaw, wherein the energy control unit (33, 34) is configured to increase energy of an electron beam when a repairing region set in accordance with results of flaw detection by the nondestructive inspection unit is irradiated with the electron beam to thereby repair the region, wherein the conductive powder is one of a metal powder and carbon fiber reinforced plastics, wherein the nondestructive inspection unit is a probe, the computation unit is configured to calculate the depth of the flaw based on a signal detected by the probe, wherein the probe is attached to the powder applying mechanism, wherein a bottom surface of the probe is disposed above a lower end of the powder applying mechanism, wherein a gap is formed between the bottom surface of the probe and an outer surface of a laminate of the conductive powder, wherein the probe extends in a first direction intersecting a second direction, which is a scanning direction of the probe, wherein the probe includes a plurality of rows of inspection coils disposed side by side in the first direction and the second direction, wherein the beam irradiation unit is provided with an electron gun configured to perform irradiation of an electron ray serving as the electron beam, an acceleration power source configured to supply an acceleration voltage to the electron gun, and a coil portion configured to form a magnetic field in a region in front of an irradiation port of the electron gun, an electron gun configured to perform irradiation of an electron ray serving as the electron beam, an acceleration power source configured to supply an acceleration voltage to the electron gun, and a coil portion configured to form a magnetic field in a region in front of an irradiation port of the electron gun, wherein the energy control unit includes an acceleration voltage control unit configured to control the acceleration voltage, and a coil control unit configured to control the coil portion, an acceleration voltage control unit configured to control the acceleration voltage, and a coil control unit configured to control the coil portion, wherein the acceleration voltage control unit is configured to further increase the acceleration voltage in accordance with the depth of the detected flaw.