A test device for a data collecting chip (DUT 0, DUT 1, DUT N), wherein the data collecting chip comprises a plurality of data sampling points, and the test device comprises: a data collecting module, the data collecting module being connected to the data collecting chip, and configured to receive multiple frames of sampling data collected by the data collecting chip; a storing module, the storing module being configured to store the multiple frames of sampling data; a processing module, the processing module being configured to calculate noise of the plurality of data sampling points according to the multiple frames of sampling data to obtain a noise test result; a data transceiving module, the data transceiving module being configured to upload the noise test result to an upper computer; and a control module, the control module being configured to control the data collecting module, the storing module, the processing module and the data transceiving module, wherein each frame sampling data in the multiple frames of sampling data comprises sampling values of the plurality of data sampling points, and the processing module comprises: a calculating unit module, the calculating unit module being connected to the control module, and configured to calculate a variance of a plurality of sampling values for each data sampling point in the multiple frames of sampling data and a bulge value of the plurality of sampling values for each data sampling point in the multiple frames of sampling data; a noise determining module, the noise determining module being connected to the calculating unit module, and configured to determine whether the variance corresponding to each data sampling point is less than a predetermined variance and whether the bulge value corresponding to the each data sampling point is less than a predetermined bulge value to determine whether a noise test of the each data sampling point passes, and then obtain the noise test result. a data collecting module, the data collecting module being connected to the data collecting chip, and configured to receive multiple frames of sampling data collected by the data collecting chip; a storing module, the storing module being configured to store the multiple frames of sampling data; a processing module, the processing module being configured to calculate noise of the plurality of data sampling points according to the multiple frames of sampling data to obtain a noise test result; a data transceiving module, the data transceiving module being configured to upload the noise test result to an upper computer; and a control module, the control module being configured to control the data collecting module, the storing module, the processing module and the data transceiving module, wherein each frame sampling data in the multiple frames of sampling data comprises sampling values of the plurality of data sampling points, and the processing module comprises: a calculating unit module, the calculating unit module being connected to the control module, and configured to calculate a variance of a plurality of sampling values for each data sampling point in the multiple frames of sampling data and a bulge value of the plurality of sampling values for each data sampling point in the multiple frames of sampling data; a noise determining module, the noise determining module being connected to the calculating unit module, and configured to determine whether the variance corresponding to each data sampling point is less than a predetermined variance and whether the bulge value corresponding to the each data sampling point is less than a predetermined bulge value to determine whether a noise test of the each data sampling point passes, and then obtain the noise test result. a calculating unit module, the calculating unit module being connected to the control module, and configured to calculate a variance of a plurality of sampling values for each data sampling point in the multiple frames of sampling data and a bulge value of the plurality of sampling values for each data sampling point in the multiple frames of sampling data; a noise determining module, the noise determining module being connected to the calculating unit module, and configured to determine whether the variance corresponding to each data sampling point is less than a predetermined variance and whether the bulge value corresponding to the each data sampling point is less than a predetermined bulge value to determine whether a noise test of the each data sampling point passes, and then obtain the noise test result.