An optoelectronic system for measuring physical parameters comprising: an optical sensor with a transducer tip, the optical sensor comprising: a first Fabry-Perot interferometer located in the transducer tip and arranged to receive a first portion of a combined light wherein the first Fabry-Perot interferometer is exposed to temperature and a second physical parameter; and a second Fabry-Perot interferometer located in the transducer tip and arranged to receive a second portion of the combined light wherein the second Fabry-Perot interferometer is exposed to temperature and not exposed to the second physical parameter; an interrogator in optical communication with the optical sensor, the interrogator comprising: a first narrow band light source with a first peak frequency; a second narrow band light source with a second peak frequency different from the first peak frequency; a coupler arranged to couple the first narrow band light source with the second narrow band light source into the combined light; a first splitter arranged to split the combined light into the first portion and the second portion; a first Fizeau interferometer arranged to receive light reflected from a first cavity of the first Fabry-Perot interferometer through an optical path comprising a lens or a mirror to a first optical detector; a second Fizeau interferometer arranged to receive light reflected from a second cavity of the second Fabry-Perot interferometer through an optical path comprising a lens or a mirror to a second optical detector; and a processor arranged to analyze the data received by the first optical detector and second optical detector and calculate a value for temperature and the second physical parameter. an optical sensor with a transducer tip, the optical sensor comprising: a first Fabry-Perot interferometer located in the transducer tip and arranged to receive a first portion of a combined light wherein the first Fabry-Perot interferometer is exposed to temperature and a second physical parameter; and a second Fabry-Perot interferometer located in the transducer tip and arranged to receive a second portion of the combined light wherein the second Fabry-Perot interferometer is exposed to temperature and not exposed to the second physical parameter; a first Fabry-Perot interferometer located in the transducer tip and arranged to receive a first portion of a combined light wherein the first Fabry-Perot interferometer is exposed to temperature and a second physical parameter; and a second Fabry-Perot interferometer located in the transducer tip and arranged to receive a second portion of the combined light wherein the second Fabry-Perot interferometer is exposed to temperature and not exposed to the second physical parameter; an interrogator in optical communication with the optical sensor, the interrogator comprising: a first narrow band light source with a first peak frequency; a second narrow band light source with a second peak frequency different from the first peak frequency; a coupler arranged to couple the first narrow band light source with the second narrow band light source into the combined light; a first splitter arranged to split the combined light into the first portion and the second portion; a first Fizeau interferometer arranged to receive light reflected from a first cavity a first narrow band light source with a first peak frequency; a second narrow band light source with a second peak frequency different from the first peak frequency; a coupler arranged to couple the first narrow band light source with the second narrow band light source into the combined light; a first splitter arranged to split the combined light into the first portion and the second portion; a first Fizeau interferometer arranged to receive light reflected from a first cavity of the first Fabry-Perot interferometer through an optical path comprising a lens or a mirror to a first optical detector; a second Fizeau interferometer arranged to receive light reflected from a second cavity of the second Fabry-Perot interferometer through an optical path comprising a lens or a mirror to a second optical detector; and a processor arranged to analyze the data received by the first optical detector and second optical detector and calculate a value for temperature and the second physical parameter. a second Fizeau interferometer arranged to receive light reflected from a second cavity of the second Fabry-Perot interferometer through an optical path comprising a lens or a mirror to a second optical detector; and a processor arranged to analyze the data received by the first optical detector and second optical detector and calculate a value for temperature and the second physical parameter.