A method for compensating drift of sensitivity of a MEMS gyroscope, the method comprising: - feeding into a sense part of a sensor element of the MEMS gyroscope a force feedback signal comprising a test signal, wherein the test signal comprises at least one test frequency; - obtaining an angular rate signal from the sense part of the sensor element; - demodulating the angular rate signal with an in-phase carrier signal for producing a raw rate signal, wherein the angular rate signal comprises a test signal component comprising the at least one test frequency, and wherein the at least one test frequency deviates from a nominal frequency of the MEMS gyroscope; - obtaining a DC test signal by processing the angular rate signal, wherein said processing the angular rate signal comprises: - if the test signal component comprises an amplitude modulated test signal comprising at least two test frequencies, performing steps of: a) demodulating the angular rate signal using a quadrature-phase carrier signal, and b) multiplying the demodulated angular rate signal with a test carrier signal for obtaining the DC test signal; or - if the test signal component includes a single test frequency, performing step: b) multiplying the angular rate signal with a test carrier signal for obtaining the DC test signal, or - obtaining the DC test signal by further processing the raw rate signal, wherein said further processing the raw rate signal comprises: - multiplying the raw rate signal with a test carrier signal for obtaining the DC test signal; - low pass filtering the DC test signal for obtaining a raw test signal, said low-pass filtering removing spurious signal components with higher frequencies from the DC test signal; - zeroing offset of the raw test signal by comparing each sample of the raw test signal to a test signal normalization value for producing an offset zeroed test signal representing a deviation of the sample of the raw test signal from the test signal normalization value, wherein the test signal normalization value refers to a value of the test signal at a known condition; - determining a sensitivity compensation multiplier on basis of the offset zeroed test signal and a predefined gain coefficient; and - multiplying the raw rate signal with the sensitivity compensation multiplier for providing a sensitivity compensated rate signal. - feeding into a sense part of a sensor element of the MEMS gyroscope a force feedback signal comprising a test signal, wherein the test signal comprises at least one test frequency; - obtaining an angular rate signal from the sense part of the sensor element; - demodulating the angular rate signal with an in-phase carrier signal for producing a raw rate signal, wherein the angular rate signal comprises a test signal component comprising the at least one test frequency, and wherein the at least one test frequency deviates from a nominal frequency of the MEMS gyroscope; - obtaining a DC test signal by processing the angular rate signal, wherein said processing the angular rate signal comprises: - if the test signal component comprises an amplitude modulated test signal comprising at least two test frequencies, performing steps of: a) demodulating the angular rate signal using a quadrature-phase carrier signal, and b) multiplying the demodulated angular rate signal with a test carrier signal for obtaining the DC test signal; or - if the test signal component includes a single test frequency, performing step: b) multiplying the angular rate signal with a test carrier signal for obtaining the DC test signal, or - if the test signal component comprises an amplitude modulated test signal comprising at least two test frequencies, performing steps of: a) demodulating the angular rate signal using a quadrature-phase carrier signal, and b) multiplying the demodulated angular rate signal with a test carrier signal for obtaining the DC test signal; or a) demodulating the angular rate signal using a quadrature-phase carrier signal, and b) multiplying the demodulated angular rate signal with a test carrier signal for obtaining the DC test signal; or - if the test signal component includes a single test frequency, performing step: b) multiplying the angular rate signal with a test carrier signal for obtaining the DC test signal, or - obtaining the DC test signal by further processing the raw rate signal, wherein said further processing the raw rate signal comprises: - multiplying the raw rate signal with a test carrier signal for obtaining the DC test signal; - multiplying the raw rate signal with a test carrier signal for obtaining the DC test signal; - low pass filtering the DC test signal for obtaining a raw test signal, said low-pass filtering removing spurious signal components with higher frequencies from the DC test signal; - zeroing offset of the raw test signal by comparing each sample of the raw test signal to a test signal normalization value for producing an offset zeroed test signal representing a deviation of the sample of the raw test signal from the test signal normalization value, wherein the test signal normalization value refers to a value of the test signal at a known condition; - determining a sensitivity compensation multiplier on basis of the offset zeroed test signal and a predefined gain coefficient; and - multiplying the raw rate signal with the sensitivity compensation multiplier for providing a sensitivity compensated rate signal.