A confocal microscopy method for creating an image of a cross section of interest (π) of a sample, said method comprising the steps of: - selecting a group of illumination planes (β j), at least two (β -,β +) of said illumination planes arranged at opposite sides of said section of interest (π), said illumination planes located at respective distances (δj) from said section of interest (π) shorter than a predetermined maximum distance, - for each illumination plane (β j) of said group of illumination planes, steps of: - illuminating said sample with at least one light beam concentrated on a spot of each illumination plane (β j); - scanning said sample with said at least one light beam on each illumination plane, according to directions (u,v) parallel to each illumination plane (β j), sequentially bringing said light beam to a plurality of positions on each illumination plane (β j); - for each position (u,v,w j) of said respective beam on each illumination plane (β j), collecting light emitted by said sample in a region comprising said spot of each illumination plane (β j), in response to said at least one light beam; - for each position (u,v,w j) of said respective beam, creating a provisional (56',56",56"') image that is associated to said illumination plane (β j) at a light detector, said provisional image described by a light intensity distribution function on said spot; wherein said maximum distance is the same order of magnitude as the wavelength of said light beams; - computing a final image as a combination of said provisional images (56',56",56"') to obtain a higher axial resolution. - selecting a group of illumination planes (β j), at least two (β -,β +) of said illumination planes arranged at opposite sides of said section of interest (π), said illumination planes located at respective distances (δj) from said section of interest (π) shorter than a predetermined maximum distance, - for each illumination plane (β j) of said group of illumination planes, steps of: - illuminating said sample with at least one light beam concentrated on a spot of each illumination plane (β j); - scanning said sample with said at least one light beam on each illumination plane, according to directions (u,v) parallel to each illumination plane (β j), sequentially bringing said light beam to a plurality of positions on each illumination plane (β j); - for each position (u,v,w j) of said respective beam on each illumination plane (β j), collecting light emitted by said sample in a region comprising said spot of each illumination plane (β j), in response to said at least one light beam; - for each position (u,v,w j) of said respective beam, creating a provisional (56',56",56"') image that is associated to said illumination plane (β j) at a light detector, said provisional image described by a light intensity distribution function on said spot; wherein said maximum distance is the same order of magnitude as the wavelength of said light beams; - illuminating said sample with at least one light beam concentrated on a spot of each illumination plane (β j); - scanning said sample with said at least one light beam on each illumination plane, according to directions (u,v) parallel to each illumination plane (β j), sequentially bringing said light beam to a plurality of positions on each illumination plane (β j); - for each position (u,v,w j) of said respective beam on each illumination plane (β j), collecting light emitted by said sample in a region comprising said spot of each illumination plane (β j), in response to said at least one light beam; - for each position (u,v,w j) of said respective beam, creating a provisional (56',56",56"') image that is associated to said illumination plane (β j) at a light detector, said provisional image described by a light intensity distribution function on said spot; - computing a final image as a combination of said provisional images (56',56",56"') to obtain a higher axial resolution.