A method of testing aircraft systems comprising a first aircraft system and a second aircraft system, the method comprising: obtaining, at a device (102, 610), a first test matrix (133, 225) for testing the first aircraft system and a second test matrix (173, 225) for testing the second aircraft system, wherein the first test matrix (133, 225) describes a first operational test (123, 223), and the second test matrix (173, 225) describes a second operational test (163, 223); during the first operational test (123, 223), obtaining, at the device (102, 610), sensor data that comprises first sensor data (175, 253) in a range (145, 245) specified by the first test matrix (133, 225) and second sensor data (153, 253) that is not specified by the first test matrix (133, 225); evaluating, at the device (102, 610), the first operational test (123, 223) by processing the first sensor data (175, 253) using a first analytic model (103, 213) of the first aircraft system, wherein the first analytic model (103, 213) is configured to generate first predicted sensor data (141, 241) based on the first sensor data (175, 253); generating, at the device (102, 610), the first predicted sensor data (141, 241) based on the evaluation of the first operational test (123, 223); evaluating, at the device (102, 610), the second operational test (163, 223) by processing the second sensor data (153, 253) using a second analytic model (113, 213) of the second aircraft system, wherein the second analytic model (113, 213) is configured to generate second predicted sensor data (181, 241) based on the second sensor data (153, 253); generating, at the device (102, 610), the second predicted sensor data (181, 241) based on the evaluation of the second operational test (163, 223); generating, at the device (102, 610), a first error measure (143, 243) by comparing a first subset of the sensor data (147, 257) with the first predicted sensor data (141, 241); generating, at the device (102, 610), a second error measure (183, 243) by comparing a second subset of the sensor data (157, 257) with the second predicted sensor data (181, 241); determining, at the device (102, 610), based at least in part on a range (195, 245) of the second sensor data (153, 253), a test coverage metric (197, 247) of the second test matrix (173, 225), wherein the test coverage metric (197, 247) indicates how much of the second test matrix (173, 225) has been covered; and providing, by the device (102, 610), an output (149, 199, 251) to a display device (120, 670), the output (149, 199, 251) indicating the first error measure (143, 243), the second error measure (183, 243), and the test coverage metric (197, 247). obtaining, at a device (102, 610), a first test matrix (133, 225) for testing the first aircraft system and a second test matrix (173, 225) for testing the second aircraft system, wherein the first test matrix (133, 225) describes a first operational test (123, 223), and the second test matrix (173, 225) describes a second operational test (163, 223); during the first operational test (123, 223), obtaining, at the device (102, 610), sensor data that comprises first sensor data (175, 253) in a range (145, 245) specified by the first test matrix (133, 225) and second sensor data (153, 253) that is not specified by the first test matrix (133, 225); evaluating, at the device (102, 610), the first operational test (123, 223) by processing the first sensor data (175, 253) using a first analytic model (103, 213) of the first aircraft system, wherein the first analytic model (103, 213) is configured to generate first predicted sensor data (141, 241) based on the first sensor data (175, 253); generating, at the device (102, 610), the first predicted sensor data (141, 241) based on the evaluation of the first operational test (123, 223); evaluating, at the device (102, 610), the second operational test (163, 223) by processing the second sensor data (153, 253) using a second analytic model (113, 213) of the second aircraft system, wherein the second analytic model (113, 213) is configured to generate second predicted sensor data (181, 241) based on the second sensor data (153, 253); generating, at the device (102, 610), the second predicted sensor data (181, 241) based on the evaluation of the second operational test (163, 223); generating, at the device (102, 610), a first error measure (143, 243) by comparing a first subset of the sensor data (147, 257) with the first predicted sensor data (141, 241); generating, at the device (102, 610), a second error measure (183, 243) by comparing a second subset of the sensor data (157, 257) with the second predicted sensor data (181, 241); determining, at the device (102, 610), based at least in part on a range (195, 245) of the second sensor data (153, 253), a test coverage metric (197, 247) of the second test matrix (173, 225), wherein the test coverage metric (197, 247) indicates how much of the second test matrix (173, 225) has been covered; and providing, by the device (102, 610), an output (149, 199, 251) to a display device (120, 670), the output (149, 199, 251) indicating the first error measure (143, 243), the second error measure (183, 243), and the test coverage metric (197, 247).