Method of spatially measuring a nano-scale structure in a sample, comprising the steps of: - marking the structure at different locations with fluorescent markers (8, 9) which are selected from fluorescent markers (8, 9) that differ in their excitation spectrum and/or their emission spectrum, - exciting the fluorescent markers (8, 9) with excitation light having an intensity distribution for emission of fluorescence light at the respective position of a local minimum of an intensity distribution of fluorescence inhibition light, wherein the local minimum is arranged at different positions in a close-up range in the sample, whose dimensions are not larger than the diffraction limit at the wavelength of the excitation light and the wavelength of the fluorescence light, - registering the fluorescence light emitted out of the sample for the different positions (20, 21, 22, 23) of the minimum, and - determining positions of the fluorescent markers (8, 9) in the sample from the intensities of the fluorescence light registered for the different positions (20, 21, 22, 23) of the minimum, characterized by - registering the fluorescence light emitted out of the sample separately for the individual fluorescent markers (8, 9) and for the different positions (20, 21, 22, 23) of the minimum, wherein the fluorescence light registered is assigned both to a certain fluorescent marker (8, 9) and to a certain position (20, 21, 22, 23) of the minimum in the sample; - determining positions of the individual fluorescent markers (8, 9) in the sample from the intensities of the fluorescence light registered for the respective fluorescent marker (8, 9) for the different positions (20, 21, 22, 23) of the minimum. - marking the structure at different locations with fluorescent markers (8, 9) which are selected from fluorescent markers (8, 9) that differ in their excitation spectrum and/or their emission spectrum, - exciting the fluorescent markers (8, 9) with excitation light having an intensity distribution for emission of fluorescence light at the respective position of a local minimum of an intensity distribution of fluorescence inhibition light, wherein the local minimum is arranged at different positions in a close-up range in the sample, whose dimensions are not larger than the diffraction limit at the wavelength of the excitation light and the wavelength of the fluorescence light, - registering the fluorescence light emitted out of the sample for the different positions (20, 21, 22, 23) of the minimum, and - determining positions of the fluorescent markers (8, 9) in the sample from the intensities of the fluorescence light registered for the different positions (20, 21, 22, 23) of the minimum, characterized by - registering the fluorescence light emitted out of the sample separately for the individual fluorescent markers (8, 9) and for the different positions (20, 21, 22, 23) of the minimum, wherein the fluorescence light registered is assigned both to a certain fluorescent marker (8, 9) and to a certain position (20, 21, 22, 23) of the minimum in the sample; - determining positions of the individual fluorescent markers (8, 9) in the sample from the intensities of the fluorescence light registered for the respective fluorescent marker (8, 9) for the different positions (20, 21, 22, 23) of the minimum.