A method comprising: (a) generating electrical charge in a first photodiode of an imaging pixel at a rate of generation, which rate of generation depends on a first irradiance, which first irradiance is irradiance of light that has passed through a first optical filter and that is incident on the first photodiode; (b) depleting, at a rate of depletion, a first portion of the electric charge, in such a way that (i) the rate of depletion depends, at least in part, on a second irradiance, which second irradiance is irradiance of light that has passed through a second optical filter and that is incident on a second circuit element of the imaging pixel, wherein the second circuit element is a photoresistor (ii) the depleting is from the first photodiode or from a third circuit element in which the electrical charge has been stored, (iii) the depleting is from a floating diffusion that stores charge generated by the first photodiode; and (c) reading out a remaining portion of the electrical charge, which remaining portion remains after the first portion is depleted; wherein light incident on the imaging pixel comprises active light and ambient light, irradiance of ambient light that has passed through the first optical filter and is incident on the first photodiode differs by less than 25% from irradiance of ambient light that has passed through the second optical filter and is incident on the second circuit element, irradiance of active light that has passed through the second optical filter and is incident on the second circuit element (i) is less than 25% of irradiance of active light that has passed through the first optical filter and is incident on the first photodiode, (ii) controls electrical resistance of the second circuit element and (iii) thus controls amperage of an electrical current that flows through the second circuit element and depletes charge from the first photodiode, and the depleting reduces or eliminates an effect that the ambient light would otherwise have on a measurement taken by the imaging pixel. (a) generating electrical charge in a first photodiode of an imaging pixel at a rate of generation, which rate of generation depends on a first irradiance, which first irradiance is irradiance of light that has passed through a first optical filter and that is incident on the first photodiode; (b) depleting, at a rate of depletion, a first portion of the electric charge, in such a way that (i) the rate of depletion depends, at least in part, on a second irradiance, which second irradiance is irradiance of light that has passed through a second optical filter and that is incident on a second circuit element of the imaging pixel, wherein the second circuit element is a photoresistor (ii) the depleting is from the first photodiode or from a third circuit element in which the electrical charge has been stored, (iii) the depleting is from a floating diffusion that stores charge generated by the first photodiode; and (i) the rate of depletion depends, at least in part, on a second irradiance, which second irradiance is irradiance of light that has passed through a second optical filter and that is incident on a second circuit element of the imaging pixel, wherein the second circuit element is a photoresistor (ii) the depleting is from the first photodiode or from a third circuit element in which the electrical charge has been stored, (iii) the depleting is from a floating diffusion that stores charge generated by the first photodiode; and (c) reading out a remaining portion of the electrical charge, which remaining portion remains after the first portion is depleted; light incident on the imaging pixel comprises active light and ambient light, irradiance of ambient light that has passed through the first optical filter and is incident on the first photodiode differs by less than 25% from irradiance of ambient light that has passed through the second optical filter and is incident on the second circuit element, irradiance of active light that has passed through the second optical filter and is incident on the second circuit element (i) is less than 25% of irradiance of active light that has passed through the first optical filter and is incident on the first photodiode, (ii) controls electrical resistance of the second circuit element and (iii) thus controls amperage of an electrical current that flows through the second circuit element and depletes charge from the first photodiode, and the depleting reduces or eliminates an effect that the ambient light would otherwise have on a measurement taken by the imaging pixel.