A method for non-contact measuring the surface of an object, the method comprising the steps of: - projecting light onto a target area of an object surface in which there is a reference point (X 1) in at least a first axis (x) of the object surface such that said reference point (X 1) is closest to the best in focus position; - acquiring one image of a field of view area after reflection of the projected light by the object surface comprising said reference point (X 1); - determining the position (Z 1) of the object in a second axis (z); - projecting light onto the object surface on successive target areas in which there are respective reference points (X 2, X 3... X n) of the object surface in said first axis (x); - acquiring a number of images of the respective field of view areas after reflection of the projected light by the object surface comprising said reference points (X 2, X 3... X n) by simultaneously varying the position of the object along the second axis (z) in order to maintain the reference points (X 2, X 3... X n) as close as possible to the best in focus position; and - determining the positions (Z 2, Z 3... Z n) for each corresponding positions of the object in which said images of the field of view areas comprising the reference points (X 2, X 3... X n) have been acquired, - said step of projecting light onto a target area of an object surface is carried out by projecting a pattern of light (m) with a light distribution along at least said first axis (x); characterized in that the method further comprises the steps of: - determining the position of the best in focus point along the first axis (x) for each of the acquired images; - calculating a corresponding correction differential (Δ 1, Δ 2...Δ n) as a distance along first axis (x) between said best in focus points and the reference points (X 1, X 2.. X n); and - obtaining a representation of the object surface, said representation involving at least parameters relating to the reference points (X 1, X 2,.. X n) in the first axis (x) with said correction differential (Δ 1, Δ 2,...Δ n) and the position (Z 1, Z 2,... Z n) of the object in the second axis (z). - projecting light onto a target area of an object surface in which there is a reference point (X 1) in at least a first axis (x) of the object surface such that said reference point (X 1) is closest to the best in focus position; - acquiring one image of a field of view area after reflection of the projected light by the object surface comprising said reference point (X 1); - determining the position (Z 1) of the object in a second axis (z); - projecting light onto the object surface on successive target areas in which there are respective reference points (X 2, X 3... X n) of the object surface in said first axis (x); - acquiring a number of images of the respective field of view areas after reflection of the projected light by the object surface comprising said reference points (X 2, X 3... X n) by simultaneously varying the position of the object along the second axis (z) in order to maintain the reference points (X 2, X 3... X n) as close as possible to the best in focus position; and - determining the positions (Z 2, Z 3... Z n) for each corresponding positions of the object in which said images of the field of view areas comprising the reference points (X 2, X 3... X n) have been acquired, - said step of projecting light onto a target area of an object surface is carried out by projecting a pattern of light (m) with a light distribution along at least said first axis (x); characterized in that the method further comprises the steps of: - determining the position of the best in focus point along the first axis (x) for each of the acquired images; - calculating a corresponding correction differential (Δ 1, Δ 2...Δ n) as a distance along first axis (x) between said best in focus points and the reference points (X 1, X 2.. X n); and - obtaining a representation of the object surface, said representation involving at least parameters relating to the reference points (X 1, X 2,.. X n) in the first axis (x) with said correction differential (Δ 1, Δ 2,...Δ n) and the position (Z 1, Z 2,... Z n) of the object in the second axis (z).