A power system comprising: a first power input configured to transmit a first voltage signal; a second power input configured to transmit a second voltage signal; a power output; a first ideal diode coupled to the first power input and the power output; a second ideal diode coupled to the second power input and the power output; a first switching circuit coupled to the first power input and the first ideal diode and configured to switch between a first switch open state that prevents the first voltage signal from being received at the first ideal diode and a first switch closed state based on a first switch input; a second switching circuit coupled to the second power input and the second ideal diode and configured to switch between a second switch open state that prevents the second voltage signal from being received at the second ideal diode and a second switch closed state based on a second switch input; and a test controller coupled to the first switching circuit, the second switching circuit and the power output and configured to determine an operating status of the power system based on the first switch input, the second switch input and the power output, wherein the first ideal diode includes a first diode MOSFET coupled to a first diode controller configured to control the first diode MOSFET, and the second ideal diode includes a second diode MOSFET coupled to a second diode controller configured to control the second diode MOSFET; wherein the first diode controller is configured to receive a first diode input and control the first diode MOSFET based on the first diode input, the second diode controller is configured to receive a second diode input and control the second diode MOSFET based on the second diode input and the test controller is further configured to determine the operating status of the power system based on at least one of the first diode input or the second diode input, wherein the first diode MOSFET is coupled to a first MOSFET input configured to control the first diode MOSFET, the second diode MOSFET is coupled to a second MOSFET input configured to control the second diode MOSFET, the first diode controller receives the first diode input from the test controller, the second controller receives the second diode input from the test controller, the test controller is coupled to the first MOSFET input, the test controller is coupled to the second MOSFET input, and the test controller is further configured to determine the operating status of the power system based on at least one of the first MOSFET input or the second MOSFET input. a first power input configured to transmit a first voltage signal; a second power input configured to transmit a second voltage signal; a power output; a first ideal diode coupled to the first power input and the power output; a second ideal diode coupled to the second power input and the power output; a first switching circuit coupled to the first power input and the first ideal diode and configured to switch between a first switch open state that prevents the first voltage signal from being received at the first ideal diode and a first switch closed state based on a first switch input; a second switching circuit coupled to the second power input and the second ideal diode and configured to switch between a second switch open state that prevents the second voltage signal from being received at the second ideal diode and a second switch closed state based on a second switch input; and a test controller coupled to the first switching circuit, the second switching circuit and the power output and configured to determine an operating status of the power system based on the first switch input, the second switch input and the power output, wherein the first ideal diode includes a first diode MOSFET coupled to a first diode controller configured to control the first diode MOSFET, and the second ideal diode includes a second diode MOSFET coupled to a second diode controller configured to control the second diode MOSFET; wherein the first diode controller is configured to receive a first diode input and control the first diode MOSFET based on the first diode input, the second diode controller is configured to receive a second diode input and control the second diode MOSFET based on the second diode input and the test controller is further configured to determine the operating status of the power system based on at least one of the first diode input or the second diode input, wherein the first diode MOSFET is coupled to a first MOSFET input configured to control the first diode MOSFET, the second diode MOSFET is coupled to a second MOSFET input configured to control the second diode MOSFET, the first diode controller receives the first diode input from the test controller, the second controller receives the second diode input from the test controller, the test controller is coupled to the first MOSFET input, the test controller is coupled to the second MOSFET input, and the test controller is further configured to determine the operating status of the power system based on at least one of the first MOSFET input or the second MOSFET input.