Title: Acute stress resistance, DR and Lifespan in a multi-parent recombinant inbred line panel.
Authors: Stastna, Jana, Snoek, L Basten, Volkers, Rita, Riksen, Joost, Vujakovic, Alex, Schulenburg, Hinrich, Kammenga, Jan, Harvey, Simon
Journal: International Worm Meeting
Published: 2015
Affiliations: Canterbury Christ Church University, Canterbury, KENT, UK, Wageningen University, Wageningen, The Netherlands, University of Kiel, Kiel, Germany