Title: Stress induced plasticity of the C. elegans electrical synapse network.
Authors: Bhattacharya, Abhishek, Lee, Daehan, Lee, Junho, Hobert, Oliver
Journal: International Worm Meeting
Published: 2015
Affiliations: Dept. Biochemistry, Columbia Univ, NY, Howard Hughes Medical Institute, Dept. Biophysics & Chemical Biology, Seoul National University, Korea