ET-400: Changed the code so that the ApplicationDiagnosticSettings are only read once instead of over and over again.  Added dummy test mode to the diagnostics area so the user could see what the graph looks like with dummy data coming in instead of talking to the firmware for data.
ET-404: Exposed the NotchFilterFrequency in the TesterViewModel so it could be changed from the UI.  Added a ToggleButton and ComboBox in order to be able to turn notch filters on or off and to select a filter value.  Also changed the default notch filter value from 50 to 60.  50 was used in the original ElectroTek application for some reason.
Database overhaul sans Montage seeding
ET-241: Implemented the StudyType and Montage on the EEGGraph side, populated the montages and updated the EEGGraph when the montage changes.  Cannot run a test currently because I never receive a TestConfigComplete.  Will work on ET-422 and get TestConfigComplete working there.