Added 'peripherals test' cases filter to run only declared in private_settings' MUTs tests.
Merge pull request #189 from bcostm/master

[NUCLEO_xxx] Update STM32CubeF4 driver V1.0.0 + update license
add D0-D13 and A0-A5 for Arch V1.1 and Arch Pro
KL46Z and K20D5M targets addition

	- sharing KL25Z implementation (same USB peripheral)
Merge pull request #191 from 0xc0170/dev_usb_kl46z_k20d5m

KL46Z and K20D5M targets addition to USBDevice
Merge pull request #190 from xiongyihui/master

add D0-D13 and A0-A5 for Arch V1.1 and Arch Pro
Update README.md
Removed hardcoded test scenario. Now test scenario should be imported from external JSON file.
Fixed minor pylint warnings and comments
to export lpc11u24 to gcc arm
Merge remote-tracking branch 'upstream/master'
Merge pull request #192 from xiongyihui/master

to export lpc11u24 to gcc arm
JSON test specification file code refactored
Added external support for MUTS definiitons. Now each instance of singletest.py can obtain its own MUTS collection(s): (mcu, port, disk, peripherals)
Merge branch 'master' of https://github.com/mbedmicro/mbed
FIxed few minor pylint warnings and suggestions
pylint minor issues fixes
Added floating point time notification
Fixed writable for LPC1768

Bit 6 (0x40) is true if the peripheral is completely empty.
Bit 5 (0x20) is true if the transmit hold register is empty, which is
sufficient for it to be writable.

The TxIrq uses the same requirement, so now it works together and
BufferedSerial doesn't go haywire on LPC1768
Fixed KL25Z/KL46Z RTC-IN pin function

It used to set it to alternate function 2, which is I2C, and still works
fine in all my tests. Not intended though, and might be giving others
issues. 1 is the RTC_CLKIN