Updates to LPC4330_M4 drivers
Remove log file
Update LPC4330_M4 README
Added simple print to table in -S switch command
Added TIMEOUT as one of the rest results. Fixed test result structure in result summary (not all results were added)
Restored assert on gpio_object.h. Added export template for GCC ARM Embedded (TOOLCHAIN_GCC_ARM)
Merge pull request #400 from micromint/master

[LPC4330] Updated LPC4330_M4 port
Added new feature: Now user can change default global name of project (test) binary to other name or by default use name chosen by the suite which is test folder name
Added SD card and EEPROM test pins for new Freescale K20D50M platform
Removed prints in verbose mode regarding skipped print. Still this prints can be shown using --verbose-skipped switch
Removed compilation warning about unused variable in i2c test
Added MMA8451Q accelerometer test port for K20D50M platform
Fix erroneous boolean expression conversions

In fb90157c9ad7f54c4012354d63bb8bebe259abb1, asserts were introduced
changing the error checking style in large portions of the code base
from `if(error_condition) fail();` to `assert(!error_condition);`. In
doing so, not all boolean conditions were negated properly. This commit
restores the original semantics of the error checks as they were before
fb90157, (unless an error check has been changed upstream, in which
case it is ignored).

The practical effects of this commit is that it should restore proper
I2C and SPI functionality on the LPC15XX and nRF51822, respectively.
Merge pull request #1 from sigvef/master

Fix erroneous boolean expression conversions
Merge remote-tracking branch 'upstream/master'
Merge pull request #401 from NordicSemiconductor/master

[HAL] Fix for asserts LPC15xx, NRF51822