Simple Testing Can Prevent Most Critical Failures

Ding Yuan, Yu Luo, Xin Zhuang, Guilherme Renna Rodrigues, Xu Zhao, Yongle Zhang,
Pranay U. Jain, and Michael Stumm

Simple Testing Can Prevent Most Critical Failures: An Analysis of Production
Failures in Distributed Data-Intensive Systems
Merge pull request #10 from lorin/osdi14-paper-yuan

Simple Testing Can Prevent Most Critical Failures