[2/6] ARM Neon Intrinsic Tablegen Test Generator.

This patch causes OpInst records to be silently identified with their Non-Op
inst counterparts so that the same test generation infrastructure can be used to
generate tests.

Reviewed by Bob Wilson.

git-svn-id: https://llvm.org/svn/llvm-project/cfe/trunk@179628 91177308-0d34-0410-b5e6-96231b3b80d8