Moved common tools for I/O device testing out to an include
Moved common logic for running I/O device acceptance tests out to a "tools" module

- Added support for additional tools accessible via test port - description output is tool index #0
Fixed issue with ASM data sections not being jumped over
Added support for "beforeEach" with I/O device acceptance tests
Rebuilt CMOS acceptance test binary
Added initial (failing) acceptance tests for PIT I/O device
Slight optimization to legacy operand decoder by using a lookup map rather than generating masks every time