update Guide to describe adding a collection via a package
ARM JIT: fix test for VFP

Having `__VFP_FP__` defined does not mean that VFP instructions are
available; it just means that floating-point is native-endian.

According to

 https://wiki.debian.org/ArmEabiPort

the absence of `__SOFTFP__` combined with the precense of `__VFP_FP__`
can mean VFP, though.
Fix boolean/pattern confusion for term generation..
use hyphens in the example define-judgment-forms for STLC
add test case for 56a313caa

Also bring gen-tests.rkt downn below 102 columns wide
another fix to the 102 column guide

This should make it disappear properly when
the file's width goes down below the column guide

fix a bug in 27603faf, I believe
Preprocess nt patterns in pattern unification.

Specifically, correctly handle cases where an nt
production has named patterns.
Fix TR internal error

The following expression would trigger an arity error:
  (subst-all
   (make-simple-substitution (list 'a 'z) (list (-val 3) (-val 5)))
   (make-ListDots (make-F 'z) 'a))
Remove inaccurate comment
Fix some ref typos
Add a notation subsection for structs
Add a reference to pkg docs from notation section
futures: fix rest-arg list creation

Also, make rest-arg list creation safe for futures (and slightly
faster in general).

Closes PR 13832
Remove registry box from optimizer tests.
Make optimizer tests work without writing out files.
Share typed-racket instantiation across different runs of the optimizer.
Make optimizer tests worker better with failures.
Change tc-exprs to tc-body.
Make parse-type-tests work even if the typecheck-tests are not run.
Added #%expression to inst to order it correctly with ann.