Title: Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore /
Authors: IEEE International Workshop on Memory Technology, Design, and Testing; Rajsuman, Rochit.; Swee, Yong-Khim.; Lau, Lee-Yee.; IEEE Computer Society.; IEEE Computer Society.; IEEE Solid-State Circuits Council.
Date: 1996
Publisher: IEEE Computer Society Press,
Physical description: ix, 117 pages : illustrations ; 28 cm
Language: English
LC classification: T
Contents: Keynote Speech: Future Trends in Flash Memories / S. Grossman -- Recent Developments in DRAM Testing / B. F. Cockburn -- Built-in Self Testing for Detection of Coupling Faults in Semiconductor Memories / M. G. Karpovsky, D. Das and H. Vardhan -- A Built In Self Test Scheme for 256Meg SDRAM / F. Hii, T. Powell and D. Cline -- Proposed On-Chip Test Structure to Quantify Trap Densities within Flash Memories / V. Verma and A. Swaneck -- An Embedded Frame Buffer for Graphics Applications / P. Lazar, C. F. Yeo, D. Selinger, P.-J. Kim and R. Pinkham -- A Concurrent Placement and Routing Strategy for Improving the Quality of Application Specific Memory Designs / S. U. Hegde -- Flash Memory Quality and Reliability Issues / R. Verma -- A Low Power Current Sensing Scheme for CMOS SRAM / H. Wang and P. C. Liu -- Giga-Bit DRAM Trend / T. Furuyama -- Flash Memory Technology - A Review / K. Rajkanan -- RAMBIST Builder: A Methodology for Automatic Built-In Self-Test Design of Embedded RAMs / R. Rajsuman -- A Synthesizable RAM BIST Circuit for Applying an O(n Log[subscript 2] n) Test that Detects Scrambled Static Pattern-Sensitive Faults / B. F. Cockburn and D. P. Sarda -- Methods for Memory Test Time Reduction / W.-J. Wu, C. Y. Tang and M. Y. Lin -- Design and Analysis of a Synchronous DRAM Memory Module / G. Ley and D. Phipps -- Scanning Capacitance Microscopy Analysis of DRAM Trench Capacitors / K. L. Pey, Y. E. Strausser, A. N. Erickson, A. J. Leslie, M. T. F. Beh and T. T. Sheng -- Thermal Monitoring of Memories / V. Szekely, M. Rencz and B. Courtois -- Unexpected Charge Losses from the Floating Gates of EEPROM Memory Cells / R. Allinger, M. Kerber, H. J. Mattausch and H. Braun -- RAM Diagnostic Tests / V. N. Yarmolik, Y. V. Klimets, A. J. van de Goor and S. N. Demidenko -- A True Testprocessor-Per-Pin Algorithmic Pattern Generator / K.-D. Hilliges and J. Sundermann -- Design-for-Test Analysis of a Buffered SDRAM DIMM / S. Jandhyala and A. Ley.
Notes: "IEEE order plan catalog number 96TB100042"--T.p. verso. "IEEE Computer Society Press order number PR07466"--T.p. verso.
Subject headings (LCSH): Random access memory--Congresses.; Semiconductor storage devices--Testing--Congresses.