蛍光X線
Analytical X-ray techniques such as X-ray crystallography, small-angle X-ray scattering, wide-angle X-ray scattering, X-ray fluorescence, X-ray spectroscopy and X-ray photoelectron spectroscopy all benefit from high X-ray flux densities on the samples being investigated. This is achieved by focusing the divergent beam from the X-ray source onto the sample using one out of a range of focusing optical components. This is also useful for scanning probe techniques such as scanning transmission X-ray microscopy and scanning X-ray fluorescence imaging.