A methodology for characterization modeling and mitigation of single event transient effects in CMOS standard combinational cells With the downscaling of CMOS technologies the radiation induced Single Event Transient (SET) effects in combinational logic have become a critical reliability issue for modern integrated circuits (ICs) intended for operation under harsh radiation conditions. The SET pulses generated in combinational logic may propagate through the circuit and eventually result in soft errors. It has thus become an imperative to address the SET effects in the early phases of the radiation hard IC design. In general the soft error mitigation solutions should accommodate both static and dynamic measures to ensure the optimal utilization of available resources. An efficient soft error aware design should address synergistically three main aspects: (i) characterization and modeling of soft errors (ii) multi level soft error mitigation and (iii) online soft error monitoring. Although significant results have been achieved the effectiveness of SET characterization methods accuracy of predictive SET models and efficiency of SET mitigation measures are ...