Authors: Carolin B. Wahl | Jie Chen | Hengrui Zhang | Wei Liu | Shengtong Zhang | Jiezhong Wu | Chad A. Mirkin | Vinayak P. Dravid | Daniel W. Apley | Wei Chen
Source: Microscopy and Microanalysis (article, 2023-07-22)
Field: Materials Science — Materials Chemistry

Automated Crystal System Identification from Four-dimensional Scanning Transmission Electron Microscopy Data Using Brain-inspired Artificial Intelligence Journal Article Automated Crystal System Identification from Four-dimensional Scanning Transmission Electron Microscopy Data Using Brain-inspired Artificial Intelligence Get access Carolin B Wahl, Carolin B Wahl Department of Materials Science and Engineering, Northwestern University, Evanston, IL, United StatesInternational Institute for Nanotechnology, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Jie Chen, Jie Chen Department of Mechanical Engineering, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Hengrui Zhang, Hengrui Zhang Department of Mechanical Engineering, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Wei Liu, Wei Liu Department of Industrial Engineering and Management Sciences, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Shengtong Zhang, Shengtong Zhang Department of Industrial Engineering and Management Sciences, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Jiezhong Wu, Jiezhong Wu Department of Industrial Engineering and Management Sciences, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Chad A Mirkin, Chad A Mirkin Department of Materials Science and Engineering, Northwestern University, Evanston, IL, United StatesInternational Institute for Nanotechnology, Northwestern University, Evanston, IL, United StatesDepartment of Chemistry, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Vinayak P Dravid, Vinayak P Dravid Department of Materials Science and Engineering, Northwestern University, Evanston, IL, United StatesInternational Institute for Nanotechnology, Northwestern University, Evanston, IL, United StatesThe NUANCE Center, Northwestern University, Evanston, IL, United States Corresponding authors: v-dravid@northwestern.edu, apley@northwestern.edu, weichen@northwestern.edu Search for other works by this author on: Oxford Academic Google Scholar Daniel W Apley, Daniel W Apley Department of Industrial Engineering and Management Sciences, Northwestern University, Evanston, IL, United States Corresponding authors: v-dravid@northwestern.edu, apley@northwestern.edu, weichen@northwestern.edu Search for other works by this author on: Oxford Academic Google Scholar Wei Chen Wei Chen Department of Mechanical Engineering, Northwestern University, Evanston, IL, United States Corresponding authors: v-dravid@northwestern.edu, apley@northwestern.edu, weichen@northwestern.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1883–1884, https://doi.org/10.1093/micmic/ozad067.972 Published: 22 July 2023 Identification (biology) ; Transmission electron microscopy ; Materials science ; Electron tomography ; Scanning transmission electron microscopy ; Artificial intelligence ; Pattern recognition (psychology) ; Nanotechnology ; Computer science ; Biology Machine Learning in Materials Science ; Electrochemical Analysis and Applications ; Advanced Electron Microscopy Techniques and Applications