Authors: Carolin B. Wahl | Alexandra Day | Vishu Gupta | Roberto R dos Reis | Wei‐keng Liao | Chad A. Mirkin | Alok Choudhary | Vinayak P. Dravid | Ankit Agrawal
Source: Microscopy and Microanalysis (article, 2023-07-22)
Field: Materials Science — Surfaces, Coatings and Films

Machine Learning Enabled Image Classification for Automated Data Acquisition in the Electron Microscope Journal Article Machine Learning Enabled Image Classification for Automated Data Acquisition in the Electron Microscope Get access Carolin B Wahl, Carolin B Wahl Department of Materials Science and Engineering, Northwestern University, Evanston, IL, United StatesInternational Institute for Nanotechnology, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Alexandra Day, Alexandra Day Department of Electrical and Computer Engineering, Northwestern University, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Vishu Gupta, Vishu Gupta Department of Electrical and Computer Engineering, Northwestern University, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Roberto R dos Reis, Roberto R dos Reis Department of Materials Science and Engineering, Northwestern University, Evanston, IL, United StatesThe NUANCE Center, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Wei-keng Liao, Wei-keng Liao Department of Electrical and Computer Engineering, Northwestern University, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Chad A Mirkin, Chad A Mirkin Department of Materials Science and Engineering, Northwestern University, Evanston, IL, United StatesInternational Institute for Nanotechnology, Northwestern University, Evanston, IL, United StatesDepartment of Chemistry, Northwestern University, Evanston, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Alok Choudhary, Alok Choudhary Department of Electrical and Computer Engineering, Northwestern University, IL, United States Search for other works by this author on: Oxford Academic Google Scholar Vinayak P Dravid, Vinayak P Dravid Department of Materials Science and Engineering, Northwestern University, Evanston, IL, United StatesInternational Institute for Nanotechnology, Northwestern University, Evanston, IL, United StatesThe NUANCE Center, Northwestern University, Evanston, IL, United States Corresponding authors: v-dravid@northwestern.edu, ankit-agrawal@northwestern.edu Search for other works by this author on: Oxford Academic Google Scholar Ankit Agrawal Ankit Agrawal Department of Electrical and Computer Engineering, Northwestern University, IL, United States Corresponding authors: v-dravid@northwestern.edu, ankit-agrawal@northwestern.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1909–1910, https://doi.org/10.1093/micmic/ozad067.986 Published: 22 July 2023 Library science ; Artificial intelligence ; Computer science Electron and X-Ray Spectroscopy Techniques ; Machine Learning in Materials Science ; Advanced Electron Microscopy Techniques and Applications