Analog and mixed-signal test (1998)

List of Figure. List of Tables. Preface. Contributors. 1. Introduction. Motivation. History. Current Research. Influence of Digital Test. Analog Test Issues. Test Paradigms. Organization. Conclusion. 2. Defect-Oriented Testing. Introduction. Previous Work. Estimation Method. Topological Method. Taxonomical Method. Defect-Based Realistic Fault Dictionary. Implementation. A Case Study. Fault Matrix Generation. Stimuli Matrix. Simulation Results. Silicon Results. Observations and Analysis. IFA-based Fault Grading and DFT for Analog Circuits. A/D Converter Testing. Description of the Experiment. Fault Simulation Issues. Fault Simulation Results. Analysis. DFT Measures. High-Level Analog Fault Models. Discussion: Strengths and Weaknesses of IFA-Based Tests. 3. Fault Simulation. Introduction. Why Analog Fault Simulation? Analog Fault Models and What-if Analysis. Focus and Organization. Fault Simulation of Linear Analog Circuits. Householder's Formula. Discrete Z-domain Mapping. Fault Bands and Band Faults. Interval-Mathematics Approach. Summary. C Fault Simulation of Nonlinear Analog Circuits. The Complementary Pivot Method. Fault Simulation via One-Step Relaxation. Simulation by Fault Ordering. Handling Statistical Variations. Summary. Fault Co-Simulation with Multiple Levels of Abstraction. Mixed-Signal Simulators. Incorporating Behavioral Models in Fault Simulation. Fault Macromodeling and Induced Behavioral Fault Modeling. Statistical Behavioral Modeling. Remarks on Hardware Description Languages. Concluding Remarks. 4. Automatic Test Generation Algorithms. Introduction. Fundamental Issues in Analog ATPG. Structural Test Versus Functional Test. Path Sensitization. Measurement Impact on Test Generation. Simulation Impact on Test Generation. Test Generation Algorithms and Results. Functional Test Generation Algorithms. Structural Test Generation Algorithms. ATPG Based on Automatic Test Selection Algorithms. DFT-based Analog ATPG Algorithms. Conclusions. 5. Design for Test. Preliminaries. Analog Characteristics. Common Characteristics. Generic Test Techniques. Increased Controllability/Observability. A/D Boundary Control. System-Specific Test Techniques. Analog Scan. Boundary Scan. Macro-Based DFT. Operational Amplifiers. Data Converters. Filters. Quality Analysis. Preliminaries. Analysis. Analysis. Conclusion. 6. Spectrum-Based Built-in Self-Test. Introduction. Some Early BIST Schemes. On-Chip Signal Generation. Digital Frequency Synthesis. Delta-Sigma Oscillators. Fixed-Length Periodic Bit Stream. Parameter Analysis. Fast Fourier Transform. Sinewave Correlation. Bandpass Filters. Application: MADBIST. Baseband MADBIST. Baseband MADBIST Experiments. MADBIST for Transceiver Circuits. Conclusions and Future Directions. 7. Implementing the 1149.4 Standard Mixed-Signal Test Bus. Overview of 1149.1 and 1149.4186. Test Functions Needed to Implement 1149.4189. Test Capabilities That This Standard Facilitates. Resistance, Capacitance, and Inductance Measurement. Measuring DC Parameters of Inputs and Outputs. Differential Measurements. Bandwidth. Delay Measurement. Potential Benefits of Using This Standard. Costs of Implementing This Standard on an IC. Practical Circuits Compliant with the Standard (Draft 18). Achieving Measurement Accuracy. DC Measurement Errors. AC Measurement Errors. Noise. Lessons from Test ICs. IMP (International Microelectronics Products) IC. Matsushita IC. Conclusions. 8. Test Techniques for CMOS Switched-Current Circuits. Introduction. Current Copiers: Basic Building Blocks of SI Circuits. Structure and Operation. Testing Current Copiers. Testing of Switched-Current Algorithmic A/D Converters. Structure and Operation. Concurrent Error Detection (CED). Test Generation. BIST Design. Scan Structures: Design for Testability. Conclusion. Index.