## 3 Results and Discussion  
### Structural Characterization  
SEM images reveal a homogeneous surface morphology in all powder films, characterized by particles of varying sizes (Figure 2). This agglomeration is caused by the high temperature during sample preparation, inevitable for nanostructure formation. Figure 2a,c depict the surface morphology of pure TP2 and TP4 films. It is evident that the morphology, crystalline size, and grain growth improve with increasing molecular weight of the surfactant. Co-catalytic modification with Ag\({}^{+}\) (10\({}^{-2}\) M) shows minimal alteration to the surface of the original TiO\({}_{2}\) films (TP2 and TP4) with a slight reduction in crystal size, consistent with the XRD analysis. The reduced particle size in Ag/TiO\({}_{2}\) films may be attributed to the effect of electron confinement, which prevents surface Plasmon resonance from interacting with light. [PERSON] et al. 's explanation of this phenomenon can be linked to electronic barrier sets for Ag with tiny sizes [29]. The slight reduction in crystal size is consistent with the XRD analysis. The BET analysis results (Table 1) validate the SEM observations. The BET surface area of Ag\({}^{+}\) (10\({}^{-2}\) M) co-catalytic modified powder films exceeds that of pure samples (Table 1). Notably, Ag, 10\({}^{-2}\)/TP4 powder films exhibit the largest surface area, suggesting potential for the highest photocatalytic activity, compared to pure TP2 and TP4 films, which are expected to have a lower efficiency. \begin{table}
\begin{tabular}{c c} \hline
**Powder Films** & **Surface Area, m\({}^{2}\)/g** \\ \hline TP2 & 11 \\ Ag, 10\({}^{-2}\)/TP2 & 38 \\ TP4 & 14 \\ Ag, 10\({}^{-2}\)/TP4 & 54 \\ \hline \end{tabular}
\end{table} 
Table 1: Specific surface area of films. Figure 2: SEM images of (**a**) TP2, (**b**) Ag/TP2, (**c**) TP4, and (**d**) Ag/TP4 films. Energy-dispersive X-ray spectroscopy was used to examine the co-catalytically modified TiO\({}_{2}\) films (TP2, TP4) with the highest (10\({}^{-2}\) M) silver content to determine the presence of Ti, O, and Ag (Figure 3). Peaks of varying intensities representing oxygen, silver, and titanium atoms are evident. The approximate weight percentage of Ag is around 5 wt%. The presence of Si is attributed to the glass substrates on which the nanostructured materials are deposited. The lack of impurity peaks in the EDS spectrum signifies the high purity of the produced powder films, indicating the successful production of high-purity Ag modified TiO\({}_{2}\) material photo-fixed under ultraviolet light. The crystal structure of the produced pure and silver (10\({}^{-2}\) M) modified film is determined using X-ray diffraction (Figure 4). The primary phase of the pure semiconductor films (TP2, TP4) is anatase, evidenced by intense diffraction peaks at 25.45, 38.35, 48.35, 53.91, 55.07, and 63.2\({}^{\circ}\), corresponding to (101), (004), (200), (105), (211), and (204), respectively, and matching the standard JCPDS card (96-500-0224). Both pure TiO\({}_{2}\) (TP2, TP4) films exhibit well-defined peaks, indicating a crystalline film free of impurities. The photo-fixation of silver does not alter the anatase structure in Ag/TP2 and Ag/TP4; however, at a concentration of 10\({}^{-2}\) M, additional peaks at 38.46, 45.86, and 64.72\({}^{\circ}\) emerge, corresponding to planes (111), (200), and (220) of the metallic form of Ag (JCPDS 96-901-3048). Similar patterns have been reported for TiO\({}_{2}\) co-catalytically modified with silver ions [30]. A modest reduction in the TP2 photocatalyst's diffraction peak at (101) is noted, suggesting a suppressed grain growth [31]. The average crystallite size of the samples, determined using the Debye Scherrer formula (Table 2), reveals smaller crystalline sizes in TP4 and Ag/TP4, compared to those in TP2 and Ag/TP2. This reduction correlated with an increase in non-ionic surfactant molecular weight.