## 2 High-Speed Interface Overview and Related Works  
Data transmission and reception between PEs and their peripherals are accomplished via communication interfaces [13]. With rising data-rate requirements and ramping up integration density posing new design difficulties at the chip, circuit, and system levels [14], and the resulting gap due to high data rates in the bandwidth of the PEs and peripherals has become a key barrier for the entire system performance [15]. The need for greater bandwidth interfaces in computing systems has resulted in the increased use of high-speed communication interfaces [16]. High-speed interfaces are key components of any electrical design and have become a cornerstone for communication [17]. High-speed serial interface devices are becoming widely used in communications, ranging from embedded to high-performance systems, as well as from on-chip and massive haul [18]. Due to the need for high-speed data processing, the data transmission speed of these interfaces has been steadily increasing [19; 20]. Although, in the past, the parallel approach was the most commonly used for high-speed communication, this is no longer the case. The decreased cost of integrated circuits, along with growing consumer demands for faster and longer distances, has led to the serialization of parallel connections [21]. A high-speed synchronous serial interface is a high-speed communication interface. It is a low-latency, full-duplex protocol designed for die-level interconnection between a baseband chipset and an application processor. It was developed by the MIPI alliance in 2003 and has been deployed by a number of vendors since then. It is the predecessor of mobile phone inter-chip interconnects and can still be found on many modern SoCs [22]. Some interfaces rely on clock forwarding, often known as source synchronous timing. The testing difficulties connected with this technology are substantial [23]. The debugging, and testing of these types of interfaces is becoming highly difficult as design complexity rises and the time budget tightens [24]; it and has also been a critical issue due to additional test times, signal integrity problems, and the use of costly instrumentation [25; 26; 27]. As the requirements for higher data transfer rates grow [28], it is much more critical to test and validate these interfaces during development [29]. However, testing such interfaces usually requires the use of specialized test equipment and software, or it needs to be outsourced to external providers. These systems often provide interface compliance testing and are expensive and are normally unnecessary during prototype development [30]. Typically, these external providers only provide full interface compliance testing. This method is time-consuming and is frequently unneeded for embedded systems that do not require interfacing for general-purpose hardware [31]. Both academics and industry are continuously striving to develop new ways to debug and test these interfaces due to the constantly increasing data rates and to design the complexity of embedded systems. Our proposed framework tests these interfaces in a multiprocessor-based embedded system. [PERSON] and [PERSON] [32] also discussed the use of automated test equipment (ATE) and external measuring devices to characterize and test high-speed I/O digital interfaces. The difficulties that the test engineers face with high-speed devices were also addressed. They provided hardware-testing solution ATEs and focused on production testing based on functional/specification testing. [PERSON] and [PERSON] [33] proposed a subtle approach for validating, testing, and debugging high-speed serial interfaces. They utilized an approach that can also self-calibrate and diagnose. Some of the existing ATE restrictions also addressed with the external loopback method.