## 2 Method  
### Measurement System Description  
The schematic diagram of the strain measurement system is shown in Figure 1. The resistive strain gauge used in the test has a substrate material of polyimide with dimensions of 6.4 mm \(\times\) 3.5 mm. The resistance of the strain gauge is 120 \(\Omega\) with a sensitivity factor of 1.8. The resistive strain gauge is connected to the Wheatstone bridge as a variable resistor of the quarter bridge. In the experiment, considering the distance of the test piece to be tested from the instrument, a three-wire connection method is chosen to offset the thermal-effect output problem of the long wire.  
Before the signal acquisition process starts, the relevant parameters of the acquisition system, including the sampling frequency, transmission rate, and communication interface type, are set through the software running on the upper computer. After the configuration is completed, the system starts to collect data. When the test specimen is deformed by force, the resistance value of the resistance strain gauges pasted on its surface will change accordingly. This small resistance change is converted by the Wheatstone bridge into an electrical signal, which is then amplified and filtered by the conditioning circuit. The final processed signal is converted to a digital signal by an analog-to-digital converter (ADC).  
To ensure that the data are not lost during processing or transmission in the case of high sampling rates and long-time acquisition operations, the system utilizes two DDR3 SDRAMs as high-speed, high-capacity storage to cache the acquired data. After frame encoding, the collected data is initially cached into DDR3. Then, these data are retrieved from the cache and transmitted to the software on the supervisory computer through the Ethernet interface module. The system program resides in QSPI Flash. Upon device activation, it automatically retrieves the program and configuration bitstream from this non-volatile storage, loading them into the processor and FPGA for initialization. The setting of circuit parameters of the measuring system is shown in Table 1.  
By combining the acquisition system and the proposed algorithm, the accurate acquisition of strain data can be achieved. The data are transmitted from the hardware system to the host computer, where they undergo drift correction through a Transformer model that has been previously trained.  
\begin{table}
\begin{tabular}{c c} \hline \hline
**Electronic Components** & **Device Parameters** \\ \hline Resistors in the Wheatstone & 120 \(\Omega\) \\ Bridge & AD8230 (Analog Devices, Inc., Wilmington, MA, USA) \\ Filter & MAX7480 (Maxim Integrated Products, Inc., San Jose, CA, USA) \\ ADC & AD7667, 16 bits, IMSPS (Analog Devices, Inc., Wilmington, MA, USA) \\ System on Chip & XC7Z020 LLG400 (Xilinx, Inc., San Jose, CA, USA) \\ DDR3 & MT41K28M1 GfJ-125 (Micro Technology, Inc., Boise, ID, USA) \\ Ethernet & RT1281E (ElRelek Semiconductor Corp., Hsinchu, China) \\ QSPI Flash & W25Q256 FV (Winnonl Electronics Corporation, Taichung, China) \\ \hline \hline \end{tabular}
\end{table}
Table 1: Measurement System Circuit Parameters.  
Figure 1: The schematic diagram of the strain measurement system.