## 3 Methods and Materials
The ASF HyP3 is a free service that was developed to process synthetic aperture radar (SAR) images, benefiting users by reducing image processing where distortions are eliminated, the amount of computing resources is minimized, some program complications and usage costs are eliminated and the user is helped to manage the complexity of SAR processing [45; 46]. The products generated under the ASF HyP3 have a spatial resolution of 40 m and are based on the Copernicus GLO-30 Digital Elevation Model (DEM), which has a native resolution of 1 arcsecond (about 30 m). For processing in the ASF HyP3 program, the Sentinel-1 image pair is selected in the direction of the ascending and descending orbital direction. This procedure is carried out independently and in parallel thanks to the benefits provided by the support of the ASF portal, in which the processing of the images is carried out by means of a work order that is uploaded to a cloud, of which a series of internal orders (11 steps) are executed, arranged in three phases (pre-processing, InSAR processing, post-processing) [45]. From this procedure, a total of 11 products are obtained, arranged by selection in the configuration of the processing characteristics that are executed in the work order. The products of the Coherence Map (correlation), Line-of-Sight Displacement Map (LOS) and Vertical Displacement Map are acquired for the present research. The coherence map expresses the overlap between the two images and represents the homogeneity generated by the correlation of pixels measured between the phase of two images in a window centered on that pixel; of this overlap, the values close to 1 will have the greatest consistency [1; 45; 46]. The Line-of-Sight Displacement Map (LOS) is a one-dimensional projection that describes the movement of the ground in meters along the display vector (line of sight) and is based on the conversion of the unwrapped differential phase, where positive values are observed as uplifts and negative values as subsidence [23; 45; 46; 47]. The vertical displacement map is a projection from the differential phase measurements, developed under the assumption that the displacement is completely in the vertical direction by means of a mathematical transformation of the LOS displacement, and its values are expressed in the same condition as LOS [45; 46; 48; 49]. The third step described in the methodological workflow (Figure 2) consists of a statistical analysis based on the differential interferometry performed on each pair of Sentinel-1 images. For this analysis, a certain number of zones or areas (ratio in pixels) are taken randomly that are the most concordant among all the images resulting from interferometry as Statistical Control Points (SCP). From these control points, a correlation is made with the images to establish a time series (multi-temporal), thus describing the behavior of the degrees of deformation present in the study region [5; 50; 51]. For this statistical analysis, the Sentinel-1 images arranged in the ASF port between the periods 2014 and 2021 are selected, where the pair of images for differential interferometry are taken at an interval of 3 months, thus generating 4 interferometry images per year. The construction of this analysis is carried out by means of a box-whisker diagram where the characteristics of time, dispersion and symmetry of the control points are described. The fourth step described in the methodological scheme comprises two phases. These phases involve the correlation and analysis of the tectonic environments (Bucaramanga Seismic Nest and the Bucaramanga Fault) and the surface displacement states in temporal terms. This analysis seeks to establish a deformation pattern of the rock massif based on the multi-temporal analysis and its correlation with regional tectonic elements. These deformation patterns, evaluated according to regional tectonic-structural aspects, can aid understanding of the dynamic behavior of surfaces as a function of the generation of instability planes as an inherent endogenous parameter.