# Dynamic Weighted CNN-LSTM with Sliding Window Fusion for RFFE Final Test Yield Prediction
## 2 Materials and Methods
### Establishment of the Dataset  
The key test indicators in the mass production test of RFFE chip have a corresponding relationship with the integrated devices. In fact, RFFE chip test is essentially the test of various internal devices, and the setting of its mass production test projects often follows  
Figure 1: Overall architecture of yield prediction model. similar principles and logic. The following Table 1 analyzes the different test indexes corresponding to different RF devices. Open-circuit and short-circuit tests can ensure the connectivity integrity of the internal circuits within the chip. Leakage current testing can verify the chip's power consumption characteristics. These test items can be categorized as electrical performance metrics. Metrics such as the 1 dB compression point, gain, and vector error further assess the device's linearity, amplification capability, and signal transmission quality. Additionally, parameters like harmonics, adjacent channel leakage suppression ratio, and switching time effectively control signal purity, spectrum utilization efficiency, and channel switching stability. Noise figure, PAE, insertion loss, and isolation comprehensively ensure overall system performance in terms of noise characteristics, energy efficiency, signal transmission efficiency, and path separation. The complete signal test items for the RFFE chip encompass all frequency points and internal paths specified in the design. To optimize testing efficiency and reduce testing time, these test items can be organized into groups, with items sharing identical test conditions classified together. In these test items, PAE refers to Power Added Efficiency. It serves as a critical metric for assessing the performance of radio frequency power amplifiers, indicating the efficiency of converting DC power input into RF output power. Specifically, PAE is determined using the following Formula (1):  
\[PAE=\left(\frac{P_{out}-P_{in}}{P_{dc}}\right)\times 100\% \tag{1}\]  
where \(P_{out}\) and \(P_{in}\) represent the output and input power, respectively, and \(P_{dc}\) is the power consumption supplied by the DC power source, all of which are measured in dBm. This formulation ensures a precise evaluation of the amplifier's energy conversion efficiency, making PAE a fundamental parameter in RF engineering. Additionally, ACLR and EVM are influenced by the linearity of the PA (power amplifier), which, in turn, is affected by the power level and gain. Therefore, input and output power, gain, PAE, and power consumption can be grouped for testing. These test parameters reflect the linearity of the power amplifier (PA), which, in turn, influences key metrics such as ACLR and EVM [36]. Therefore, by analyzing the relationships among these test items, it can be concluded that within a test group defined by a specific frequency point (e.g., 824 MHz, 915 MHz, 1910 MHz) or modulation scheme (e.g., QPSK, 64 QAM, 256 QAM), the PAE test item either influences or is influenced by other test metrics within the same group. Due to the interac \begin{table}
\begin{tabular}{c c c c} \hline \hline
**Test Specification** & **Related Devices** & **Test Specification** & **Related Devices** \\ \hline Open short circuit test & The entire link & Harmonic wave & PA, Filter \\ \hline Leakage current & The whole chip & \
\begin{tabular}{c} Neighborhood leakage \\ suppression ratio \\ \end{tabular} &
\begin{tabular}{c} PA, Filter, and Duplex \\ device \\ \end{tabular} \\ \hline Input output power & PA, LNA & Noise factor & LNA \\ \hline
1 dB compression point & PA & Power additional efficiency & PA \\ \hline Gain & LNA, PA, Filter & Insertion loss &
\begin{tabular}{c} Filter, Switch, and Duplex \\ device \\ \end{tabular} \\ \hline EVM & PA, Filter & Insulation & Duplex, switch \\ \hline \hline \end{tabular}
\end{table} 
Table 1: RFFE test item analysis table. tions between PAE and other test items, we designate PAE as the characteristic test item among the test items, using it to represent the features of the other test metrics.