# Partial Discharge Inception and Breakdown Voltage Analysis in PCB-Based Electrode Structures
## 5 Conclusions  
This study presented a detailed analysis of the PD characteristics and breakdown patterns of power electronic modules, using five different electrode samples fabricated from PCB materials and epoxy resin insulation. The results demonstrated significant variations in the PDIV and breakdown patterns across different electrode configurations, revealing the influence of design geometry and insulation spacing on dielectric stability. Notably, the TE sample exhibited strong dielectric properties, with a PDIV of 6.13 kV, RPDIV of 8.04 kV, and a breakdown voltage of 14.9 kV, showing high insulation resilience. The RE sample showed a PDIV of 7 kV, RPDIV of 8.5 kV, and breakdown voltage of 13.3 kV, suggesting heightened vulnerability at sharp edges. The FE samples exhibited distinct behaviors based on the insulation gap distance. The FE_0.5 mm sample exhibited surface discharges without internal breakdown, whereas the FE_0.3 mm sample experienced early carbonization, leading to a breakdown at 18 kV with a higher average breakdown voltage of 15.3 kV. These findings validate the targeted dielectric stress points in the design, providing valuable insights into how the electrode geometry  
Figure 18: FE_0.3 mm sample breakdown test results. and insulation gaps influence the PD onset and breakdown resilience, particularly for high-stress AC applications. From a technical perspective, the proposed study highlights the importance of electrode design in optimizing PCB performance for high-voltage systems. The use of varied electrode configurations and controlled insulation gaps can significantly improve the reliability of power electronic systems by mitigating PD risks. Furthermore, the results emphasize the importance of precise design parameters in enhancing the durability of PCBs, reducing the likelihood of insulation failure, and extending the lifespan of power electronic modules. The economic benefits of this study lie in the potential for improved design strategies that can reduce failure rates in high-voltage systems, leading to lower maintenance costs, a higher operational efficiency, and longer lifespans for critical power electronic infrastructures. Future research should explore a broader range of frequencies, alternative PCB materials, and additional electrode configurations to better understand the impact of design variations on PD behavior. Incorporating advanced diagnostic techniques, such as machine-learning algorithms, can further enhance the real-time prediction and modeling of PD behavior. Currently, this study does not include simulations or theoretical modeling to predict the electric field strength around sharp corners of the electrodes. However, this aspect could be explored in future work, particularly in the context of defect recognition or detailed electric field analysis, to provide a deeper understanding of the influence of electrode geometry on discharge characteristics. These efforts will contribute to the development of optimized design strategies and diagnostic frameworks, ultimately improving the reliability and performance of high-voltage power electronic systems. Conceptualization, T.-C.T. and C.-K.C. ; Methodology, T.-C.T. and C.-K.C. ; Software, T.-C.T., S.-Y.A.B. and C.-K.C. ; Validation, S.-Y.A.B. and C.-K.C. ; Formal analysis  
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, S.-Y.A.B., B.K.B. and C.-K.C. ; Investigation, T.-C.T., S.-Y.A.B., B.K.B. and C.-K.C. ; Resources, C.-K.C. ; Data curation, S.-Y.A.B. and C.-K.C. ; Writing--original draft, B.K.B. and C.-K.C. ; Writing--review & editing, B.K.B. ; Visualization, B.K.B. and C.-K.C. ; Supervision, C.-K. and C.-K.C. ; Project administration, C.-C.-K. and C.-K.C. ; Funding acquisition, C.-C.K. and C.-K.C. All authors have read and agreed to the published version of the manuscript. This research received no external funding. Not applicable. The original contributions presented in this study are included in the article. Further inquiries can be directed to the corresponding author. The authors declare no conflicts of interest.