## 3 Methods  
The wavelength dispersion X-ray fluorescence spectroscopy (WDXRF) involved the utilization of a Rigaku ZSX Primus II spectrometer. The instrument is equipped with an X-ray tube featuring a Rh anode and 4.0 kW power, and a front Be window (30 \(\upmu\)m thickness). Employing an EZ scan in conjunction with the Rigaku SQX fundamental parameters software (ZSX version) facilitated spectra recording and data processing, ensuring precise and comprehensive results from the spectroscopic examination. X-ray diffraction (XRD) analysis was carried out utilizing a Rigaku Ultima IV model diffractometer with the following characteristics: Cu K\(\alpha\) radiation (\(\lambda\) = 1.5406 A), generator radiation acceleration voltage of 40 kV, and the emission current of 200 mA. Diffractograms were captured in parallel beam geometry within a 20 range of 5\({}^{\circ}\) to 100\({}^{\circ}\) at a scanning rate of 4\({}^{\circ}\)/min. Additionally, optical microscopy (OM) imaging was conducted using a Novex Microscope BBS trinocular microscope at various magnifications, equipped with a digital video camera for real-time data acquisition through ZenPro software and subsequent analysis with ImageJ 1.50. Stereomicroscopy was performed using a Stereo trinocular stereomicroscope from EUROMEX Microscopen B.V., model 1903, providing magnification options within the range of 7\(\times\)-45\(\times\). Environmental scanning electron microscopy (ESEM-FEI Quanta 200, Eindhoven, The Netherlands) has been used for morphology evaluation of the samples. The working parameters were high vacuum, an LFD detector, and magnification between 50\(\times\)-100,000\(\times\). For preparing the samples for SEM investigations, a small piece of each sample has been taken and covered with a 5 nm layer of Au (through sputter coating), by using a Q150R-ES  
Figure 2: Vessel before restoration. system (Quorum Technologies Ltd., West Sussex, UK). This coating of thin films of Au is used to minimize the charging effects during SEM imaging, and to make them conductive before observation. FTIR spectroscopy utilizing a Perkin Elmer GX spectrometer (manufacturer Perkin Elmer, Waltham, MA, USA) (attenuated total reflection mode--ATR) was carried out, with resolution of 4 cm\({}^{-1}\) and accumulation of 32 spectra, and measurements within the range of 4000-400 cm\({}^{-1}\) for analysis. Raman spectroscopy was conducted with a Rigaku portable analyzer (Rigaku, The Woodlands, TX, USA) with 785 and 1064 nm stabilized laser to ensure high sensitivity. The measurements were carried out at a resolution of 4 cm\({}^{-1}\) using a laser power of 252 mW. For data processing, the Opus 7.0 software from Bruker Optics GmbH has been used. The textural properties of the investigated samples were determined using the Brunauer-Emmett-Teller (BET) method, where nitrogen adsorption/desorption isotherms were recorded at 77 K over a relative pressure range of 0.005-1.0 using a NOVA2200e gas absorption analyzer from Quantachrome Instruments in Boynton Beach, FL, USA. For data processing, the NovaWin version 11.03 software has been used. Before the adsorption measurements, the samples underwent a 4 h degassing process at 180 \({}^{\circ}\)C under vacuum. The BjH model was applied to evaluate the pore size distribution and pore volume information. For this technique, some sources of errors could be identified and taken into account: adsorption and desorption of nitrogen on the material's surface, which can vary, leading to errors around 1-5% for specific surface areas; instrument calibration error, which could add a variation of 1-2%; an impure gas, which can lead to inaccurate results, with a 1-3% variation; controlled temperatures, typically at the boiling point of liquid nitrogen (77 K), which can introduce additional errors of approx. 1-2%; and BET modeling error, taking into account that not all the models are suitable for all materials, especially those with very small pores (micropores) or very large pores (macroropes).