# A Survey of Analog-to-Digital Converters for Operation under Radiation Environments
## Inventory
### Selected ADCs for Analysis  
To increase the number of samples under analysis, few exceptions were made for both requirements described in Section 3.1:  
* TID requirement was relaxed for a few ADCs with characterization data for transients and upsets (AD7712, MAX145, ADS1258, LTC1419, AD7984, ADS5483 and ADS5444-SP). * Three TID compliant ADCs for which no SEE data could be found in the literature were exempt from the latch-up requirement (AD570S, AD9254S and TS8388B). Finally, fifty four ADCs were selected for the analysis; their collected data are presented in Table 1. For a better understanding of the table, the following explanations shall be considered:  
* The table's header is divided into four lines: 'Group' (uppermost line), 'Sub-group' (second uppermost line), 'Field' (second lowermost line) and 'Units' (lowermost line). * Each of the 22 fields described in Section 3.2 is represented in one column of the table. * The 22 fields are classified in tree different groups: 'Performance', 'Hi-Rel', and 'Additional Information'. * Fields conceptually related and/or sharing the same units in the 'Performance' and 'Hi-Rel' groups are gathered in the same sub-group. * Collected data are presented in the table's body, below the table's header. Empty boxes therein (fulfilled with symbol \"-\") are non-available data due to lack of information in the literature. * The leftmost column of the table's body collects the names of the selected radenv-ADCs. Particularly, COTS are marked with a double asterisk (**) after their name. * The 'FOM' sub-group within the 'Performance' group is composed by the FOMs described in Section 2.3. Columns 'W', 'TID(L)', 'TID(H)', 'SET' and 'SEU' of this sub-group collect respectively for the selected radenv-ADCs their FOM\({}_{W}\), their FOM\({}_{TID}\) for TID measured at low and/or high dose rates, and their FOM\({}_{SET}\) for transients and/or upsets characterization. * In the 'ENOB' column, inferred data using Equation (5) are marked with a single asterisk (*). Additionally, in the 'FOM' sub-group columns, data calculated using an inferred ENOB are also marked with a single asterisk (*). * In the 'Hi-Rel' group, TID, LET\({}_{th}\) and \(\sigma_{sat}\) measurements are gathered respectively in the 'TID', 'LET\({}_{th}\)' and '\(\sigma_{sat}\)' sub-groups. TID measurements are discerned in two columns ('LDR' or 'HDR') depending on the dose rate as defined in Section 2.2.1. On the other hand, LET\({}_{th}\) and \(\sigma_{sat}\) measurements are segregated in different columns depending on the nature of the SEE ('SEL', 'SET', or 'SEU' columns for latch-up, transients or upsets respectively). As explained in the first paragraph of Section 2.2.2, SEL measurements only consider the LET\({}_{th}\). * Acronyms used in the 'SEE test' column are listed in Table 2.
* The 'Tech.' column collects manufacturing process details extracted from the literature. This information could be: the process type (bipolar, complementary-bipolar, CMOS, linear compatible CMOS, bipolar-CMOS, etc. ), the process name (B7 HF200, BiCom3, BiCom3X, BiCMOS9, C021.A, CMOS9, CMOS9X, XFCB, XH035, etc. ), or the CMOS node (350 nm, 250 nm, 180 nm, 130 nm, 32 nm, etc.). Additional technological explanations are provided in Section 4.4. * Acronyms used for the different ADC architectures in the 'Arc.' column are listed in the first sentence of Section 4.5.