## 2 High-Speed Interface Overview and Related Works
They evaluated and tested high speed interfaces without the use of high-speed ATE instruments or design for-test (DfT) functionalities using a new jitter injection method and an FPGA-based bit error rate tester (BERT); this approach also solves conventional ATE instrument constraints. They intended to employ ATE high-speed instruments or do external loopback testing without ATE, depending upon on the applications. They used electronic test equipment BERT for post-silicon validation acceleration and focused on functional testing and high-speed serial interfaces. [PERSON] and [PERSON] [34] concentrated on testing that looked for manufacturing circuit-level flaws that may affect system performance. They discussed the distinctions andprovided a summary of twenty years of defect-based testing experience with high-speed I/O interfaces. These findings indicated that defect-based testing approaches based on DfT circuits may cover the same erroneous behaviors as specification-based testing. They also examined and recommended solutions to bridge potential gaps that infrequently used high-speed I/O defect-based test techniques. They ensured that the performance of high-speed I/O interfaces necessitated rigorous production testing, either using defect-based or specification-based methods. [PERSON] and [PERSON] [35] presented a review of industry practices of the approaches based on DFT to testing high-speed IO interfaces, as well as a comparison of these approaches to specification-based testing. They discussed DfT, which assesses device performance in five areas: transmitter with functional speed, transmitter implied jitter production, receiver with functional speed, receiver minimum detectable level, and receiver jitter tolerance. [PERSON] and [PERSON] [36] proposed a BERT method to describe the quality of communication interfaces. They introduced a BER tester core and a unique additive white Gaussian noise (AWGN) generating core for BERT in field-programmable gate arrays (FPGAs). In terms of cost, volume, and energy, combining a BERT with an AWGN in FPGAs is orders of magnitude more efficient than existing similar-speed stand-alone systems and has a large speed advantage over software simulations. The whole BERT method can be used to test and evaluate the performance of a variety of communication devices, including spread spectrum, user-defined modulation, native clock/data recovery interfaces, and error-correcting codes. They validated their proposed solution via two case studies: one evaluating an AWGN baseband transmission system and the other testing a high-speed serial interface. They used electronic test equipment BERT and focused on the functional correctness of high-speed serial interface transceivers. [PERSON] and [PERSON] [37] proposed creating a DMA controller and a high-speed synchronous serial interface test harness. This suggested that the test harness may be used to stimulate the device under various test capabilities, as well as for behavioral analysis. They created test drivers that can be used for testing by incorporating appropriate observability characteristics. To evaluate the success of this test harness, the experimental results are supplied with appropriate functional test coverage. [PERSON] [38] presented case studies of external loopback, which is one of the most often used DfT approaches for high-speed serial interface testing. They briefly discussed the various types of loopbacks that are accessible in the industry, along with their applications. Following that, the importance of external loopback interactions in the high-speed serial interface test method was discussed. The external loopback circuitry on the device-under-test (DUT) card was then explained, followed by test techniques for enabling high-speed serial interface buffer level testing that was implemented on transceiver-based FPGA products. They also provided a review of silicon experiences, as well as recommendations for future developments.