## 2 Platform Architecture
### Particle Waveform Data Software Preprocessing Module  
The main function of this module is to process all kinds of particle waveform data obtained from in-orbit or ground accelerators, including data normalization, random sampling, random cropping, noise addition, and frequency domain transformation, in order to improve the robustness and generalization of the model and divide processed data into training, validation, and test data. The training data are mainly used to complete the training of the weights and biases of the entire network's structure, validation data are used to determine whether the hyperparameters of the model are reasonable, and test data are mainly used to complete the final particle identification and inference and simultaneously measure the accuracy performance of the model's inference. In order to construct a software preprocessing module for particle waveform data, it is necessary to have a deep understanding of the characteristics of particle waveform data and construct a corresponding training dataset based on this characteristic. Semiconductor detectors are the most commonly used means for charged particle detection. Due to the internal electric field, the electric field strength inside the detector gradually increases from the backend to the frontend, and when charged particles are incident from the backend, the plasma erosion time on the trajectory of heavier ions is longer due to their short range, higher energy loss rate, and low electric field strength. In charge carrier transport, electron mobility is faster, and hole mobility is slower. Since the incidence is from the rear end of the detector, the average distance traveled during hole migration increases, which leads to an increase in the charge carrier's transport time. When the incident energy is certain, variations in the number of nuclear charges and mass numbers of the particles can lead to differences in charge collection times. Heavier particles produce current pulses with a longer duration, lower amplitude, longer charge rise time, and greater time to a zero value, such that different particles deposited in the sensor will produce certain waveform differences [10; 11; 12; 13; 14]. For the neutral component, take neutron gamma as an example. The organic scintillator is irradiated by neutrons or \(\gamma\)-rays to produce recoil protons and secondary electrons and luminescence, and the intensity of the light is quickly enhanced up to the maximum. On the contrary, the attenuation is relatively slow, and the attenuation is approximate relative to the exponential decay. Its luminous decay time contains two fast and slow components. When neutron or \(\gamma\)-ray irradiation occurs in the same scintillator, the formation of ionization densities in the scintillator is different, resulting in the different luminous decay times of the fast and slow components of the intensity ratio. The share of the fast component in proton-excited fluorescence generated by the interaction of neutrons with the scintillator is lower than the share of electron-excited fluorescence generated by the interaction of \(\gamma\)-rays with the scintillator, while the share of the slow component is higher than that of \(\gamma\)-rays. It is this factor that causes the difference in the decay time of the fluorescence generated by the interaction of neutrons and \(\gamma\)-rays with the scintillator, which in turn leads to a difference in the shape of the generated pulse [15; 16; 17]. The waveforms of a charged particle are shown in Figure 2a, where i represents the current generated by the charged particles in the semiconductor sensor, q represents the amount of charge generated by the charged particles in the semiconductor sensor, and U represents the voltage output by the charged particles in the semiconductor sensor and the subsequent front-end preamplifier circuit. The waveforms of a neutral particle are shown in Figure 2b, where i represents the current generated by neutrons and gamma rays in the scintillator sensor.