## 4 Discussion
Indeed, the analysis shows that, if the relative by-frame dispersion is the same, the intensity adjustment decreases with the reduction in the intensity itself. Thus, the adjustment results in a more significant increase in the intensity of the central pixels of the image rather than the intensity of the pixels on the spectral line wings. This will decrease the half-width of the line. The line width at the base remains the same because, for the image forming edge pixels with low intensity, compared to \(I_{max}\), the adjustment for the effect considered is negligibly small. Figure 3: Intensity ratio dependency in a single CCD pixel \(b_{nm}=\frac{\overline{J}_{n}}{\overline{I}_{nm}}\) on parameter \(a_{nm}=\frac{I_{nm}}{\overline{I}_{nm}}\) at various relative dispersions of the actual intensity. Figure 5: Intensity ratio dependency in a single CCD pixel \(b_{nm}=\frac{\int_{a}}{I_{nm}}\) on parameter \(\alpha_{nm}=\frac{I_{nm}}{I_{nm}}\) at various relative dispersions of the measured intensity. Figure 6: Intensity ratio dependency in a single CCD pixel \(b_{nm}=\frac{\int_{a}}{I_{nm}}\) on the relative dispersion of the measured intensity \(\Sigma_{nm}\) with the various parameters. Figure 8: The dependency of the relative dispersion of the actual intensity in a single CCD pixel \(\Sigma_{n}\) on the dispersion of the measured intensity \(\Sigma_{nm}\) at the various parameter values \(\alpha_{nm}\). Figure 7: The dependency of the relative dispersion of the actual intensity in a single CCD pixel \(\Sigma_{n}\) on parameter \(\alpha_{nm}\) at various dispersions of the measured intensity \(\Sigma_{nm}\). We assumed previously that the measured spectral line width in pixels at the base is equal to \(L\). We now number these pixels from right to left from 1 to \(L\). Moreover, we assume, for simplicity, that the center of the spectral line coincides with the center of one of the pixels, i.e., number \(L\) is odd. Based on the line width at the base, we understand that this number of pixels, when the intensity is measured in the first and the last (number \(L\)) pixels, is \(10^{-3}\) of the intensity in the center. This assumption is supported for modern emission spectrometers used for the analysis of, for example, metals and alloys, and the lines with the measured intensity in the central pixel of the order of value \(I_{max}\). As we noted previously, when developing an analytical technique for calculating analytical line intensities with spectrometer software where CCDs are used as radiation receivers in the recording system, it is necessary to indicate the pixels whose intensities should be summed. Figure 9 shows, as an example, a view of the corresponding window of the SPAS-02 emission spectrometer software ([[http://activespectr.com/en/products/emission-spectrometers/optical-emission-spectrometer-oes-spas-02-metal-analysis](http://activespectr.com/en/products/emission-spectrometers/optical-emission-spectrometer-oes-spas-02-metal-analysis)]([http://activespectr.com/en/products/emission-spectrometers/optical-emission-spectrometer-oes-spas-02-metal-analysis](http://activespectr.com/en/products/emission-spectrometers/optical-emission-spectrometer-oes-spas-02-metal-analysis)) (accessed on 27 February 2022)) designed to analyze metals and alloys (pixels inside the yellow shading on the line **Ni** 351.505 nm). As can be seen, the summed pixels occupy almost the entire line width for low **Ni** concentrations (of a weak line), whereas, for high concentrations, they occupy only the central pixels, as the width of the line image increases with its intensity. Thus, the in-equation \(L>K\) is usually satisfied. If the intensity constituting pixels symmetrical to the center of the line is chosen, number \(K\) will also be odd.