## 2 Materials and Methods
### Materials
#### 2.4.3 Embedded Software Defects via Content Analysis  
Using the content analysis procedures (as shown in Table 3), the researchers and collaborators (as shown in Table 6) classified defects in Table 7 and used the reliability table in Table 4 to derive matching classifications. This process was repeated several times to extract the 12 embedded software defects shown in Table 8. The categorization index, a ratio of the agreed value located on the diagonal line of Figure 2, was used to confirm the reliability of the agreed-upon classifications. The classification index was evaluated at about 96%, with 64 of the 66 defects agreed upon by the researchers and experts, qualifying it as \"excellent.\" \begin{table}
\begin{tabular}{c c c c} \hline \hline  & \multicolumn{3}{c}{**Embedded Software Expert**} \\ \cline{2-4}
**Experts** & **Field of Embedded Software** & **Number of Years of Embedded** & **Experts Class or** \\  & **Development** & **Software Experience** & **Certification** \\ \hline Experts 1 & Mobile, Internet of thing & 20 years & IT Auditor \\ Experts 2 & Internet Cable TV, IoT, Device driver & 10 years & Professional engineer \\ Experts 3 & Mobile, industrial device control & 8 years & Top engineer \\ Experts 4 & Industrial control & 8.5 years & Professional engineer \\ \hline \hline \end{tabular}
\end{table} 
Table 6: Four embedded software experts involved in terms standardization. \begin{table}
\begin{tabular}{c c c c} \hline \hline
**Code** & **Embedded Software Defects** & **Code** & **Embedded Software Defects** \\ \hline
1-1 & Data access & 4-1 & Wrong interrupts \\
1-2 & Shared memory & 4-2 & Incorrect subroutine called \\
1-3 & Data violation & 4-3 & Nonexistent subroutine call \\
1-4 & Data boundary error & 4-4 & Wrong parameter \\
1-5 & Type mismatch & 4-5 & Inter-task communication \\
1-6 & Save storage data & 4-6 & Internal interface \\
1-7 & Flash memory & 4-7 & Module interface \\
1-8 & Memory initialization & 4-8 & Incorrect API usage \\
1-9 & Memory management & 4-9 & Wrong protocol \\
1-10 & Memory access & 4-10 & Software architecture \\
1-11 & Resource leaks & 4-11 & Exception handling \\
1-12 & Memory free error & 4-12 & None sensor logic \\
1-13 & Memory overflow error & 5-1 & Missing computation \\
1-14 & Memory violation error & 5-2 & Incorrect operand and operator \\
2-1 & Wrong H/W interface & 5-3 & Incorrect parenthesis \\
2-2 & I/O devices & 5-4 & Round and truncate \\
2-3 & User interfaces & 5-5 & Sign convention \\
2-4 & External interface & 5-6 & Divide by zero \\
2-5 & Send and receive packets error & 5-7 & Arithmetic overflow and underflow \\
2-6 & Networking & 6-1 & Wrong logic \\
2-7 & Input value error & 6-2 & Non-reentrant function \\
2-8 & Output signal & 6-3 & Wrong objects \\
2-9 & Data I/O process & 6-4 & Wrong relationship \\
2-10 & Incorrect sensor data & 6-5 & Incorrect return \\
3-1 & Optimization & 6-6 & Logic error \\
3-2 & Time out & 7-1 & Infinite loops \\
3-3 & Time fault causes data loss & 7-2 & If and case statements \\
3-4 & Complete with delay & 7-3 & Check variables \\
3-5 & Time delay & 7-4 & Serialization \\
3-6 & Feedback control error & 7-5 & Deadlock \\
3-7 & Set time and read & 7-6 & Concurrent processing \\
3-8 & Time management & 7-7 & Task management \\  & & 7-8 & Recursion \\ \hline \hline \end{tabular}
\end{table} 
Table 7: Standardized embedded software defect terms.