# A Trust-Influenced Smart Grid: A Survey and a Proposal
## 15 Future Work
\begin{table}
\begin{tabular}{l l} \hline \hline
**Notation** & **Meaning** \\ \hline \(m_{ij}\) & Message between \(d_{i}\) and \(d_{j}\) \\ \hline \(h_{ij}\) & History of communication between \(d_{i}\) and \(d_{j}\) \\ \hline \(D\) & A list of \(n\) devices \\ \hline \(R_{d_{i}}\) & List of devices functionally dependent on \(d_{i}\) \\ \hline \(An_{d_{i}}\) & List of devices that functionally influence \(d_{l}\) \\ \hline \(I_{d_{i}}\) & Intersection of \(R_{d_{i}}\) and \(An_{d_{j}}\) \\ \hline \(l\) & Criticality rank of devices \\ \hline \(\Xi\) & Substation \\ \hline \(M\) & A set of clients \\ \hline \(S\) & A set of servers \\ \hline \(N\) & A set of network devices \\ \hline \(Q\) & A set of queries \\ \hline \(R\) & A set of responses associated with \(Q\) \\ \hline \(\theta\) & type of query or response being either read or write \\ \hline \(Q^{\prime}\) & A malicious \(Q\) \\ \hline \(E_{i}\) & Exposure intensity \\ \hline \(E_{f}\) & Exposure frequency \\ \hline \(E_{s}\) & Similar exposure \\ \hline \(E^{T}\) & An exposure’s threshold \\ \hline \(\kappa_{E}\) & An alarm associated with a particular exposure factor of familiarity \\ \hline \(Z\) & A set of features associated with \(E_{i}\) \\ \hline \(Z_{R}\) & A reference set of features associated with \(E_{i}\) \\ \hline \(\xi_{\mu\tau}\) & Pre-time feature \\ \hline \(\xi_{\mu\tau}\) & Inter-query time feature \\ \hline \(\xi_{rr}\) & Inter-response time feature \\ \hline \(\xi_{\varphi\tau}\) & Query-response time feature \\ \hline \(\xi_{\mu\tau}\) & Transaction time feature \\ \hline \(\xi_{\mu\tau}\) & Timeout feature \\ \hline \(\xi_{\mu\tau}^{T}\) & Inter-query time threshold \\ \hline \(\xi_{rr}^{T}\) & Inter-response time threshold \\ \hline \(\xi_{\varphi\tau}^{T}\) & Query-response time threshold \\ \hline \(\xi_{\mu\tau}^{T}\) & Timeout threshold \\ \hline \(Y\) & Moore machine used to generate \(E_{s}\)-based features \\ \hline \(\rho\) & Finite set of states \\ \hline \(\rho_{\mu\mu}\) & Read discrete input state \\ \hline \(\rho_{rc}\) & Read coil state \\ \hline \(\rho_{mvc}\) & Write coil state \\ \hline \(\rho_{mvc}\) & Write multiple coils state \\ \hline \(\rho_{thr}\) & Read holding registers state \\ \hline \(\rho_{mvr}\) & Write single register state \\ \hline \(\rho_{mvr}\) & Write multiple registers state \\ \hline \(\rho_{mvr}\) & Read input registers state \\ \hline \(\rho_{u}\) & Unknown state \\ \hline \(fc_{i}\) & Modbus function code of \(q_{i}\) or \(r_{i}\) \\ \hline \hline \end{tabular}
\end{table} 
Table 1: Cont. \begin{table}
\begin{tabular}{l l} \hline \hline
**Notation** & **Meaning** \\ \hline \(a\) & Modbus address \\ \hline \(d_{a_{i}}\) & Modbus data value of \(a\) \\ \hline \(b_{a_{i}}\) & Modbus byte count of the value found at \(a\) \\ \hline \(l_{d}\) & Modbus length of data frame \\ \hline \(l_{f}\) & Length of entire Modbus packet \\ \hline \(l_{a_{i}}\) & Modbus coil/discrete input/input register/holding register quantity \\ \hline \(l_{h_{a_{i}}}\) & Modbus header length \\ \hline \(\sigma\) & A set of input alphabets of Y \\ \hline \(\delta\) & A transition function of Y \\ \hline \(\Psi\) & A set of features associated with \(E_{s}\) \\ \hline \(\Psi_{R}\) & A reference set of features associated with \(E_{s}\) \\ \hline \(\psi_{i}\) & State traversed feature \\ \hline \(\psi_{\gamma}\) & IP-MAC mismatch feature \\ \hline \(\psi_{p}\) & Port mismatch feature \\ \hline \(\psi_{ms}\) & Unknown state feature \\ \hline \(\psi_{ms}\) & Address match feature \\ \hline \(\psi_{ms}\) & Address size match feature \\ \hline \(\psi_{fc}\) & Function code match feature \\ \hline \(\psi_{mliv}\) & Discrete input reference match feature \\ \hline \(\psi_{mliq}\) & Discrete input quantity match feature \\ \hline \(\