## 5 Conclusions
Inst. Mech. Eng. Part O J. Risk Reliab._**2020**, _234_, 764-778. [CrossRef]
* (15) [PERSON]; [PERSON] Multi-stress accelerated life evaluation method considering generalized coupling. _J. Syst. Eng. Electron._**2023**, _45_, 3350-3361. * (16) [PERSON]; [PERSON] A review of accelerated test models. _IMS_**2006**, _21_, 552-577. [CrossRef]
* (17) [PERSON]; [PERSON] Reliability analysis of ball screw based on double-stress accelerated life testing. _J. Beijing Univ. Chem. Technol._**2022**, _48_, 703-709. * (18) [PERSON]; [PERSON] Reliability estimation of thin film platinum resistance MEMS thermal mass flowmeter by step-stress accelerated life testing. _Microelectron. Reliab._**2023**, _147_, 115026. [CrossRef]
* (19) [PERSON]; [PERSON] Inference in simple step-stress accelerated life tests for Type-II censoring Lomax data. _JSTA_**2021**, _20_, 364-379. [CrossRef]
* (20) [PERSON]; [PERSON] Accelerated Life Tests under Pareto-IV Lifetime Distribution: Real Data Application and Simulation Study. _Mathematics_**2020**, \(8\), 1786. [CrossRef]
* (21) [PERSON]; [PERSON]; [PERSON] Review on accelerated life testing plan to develop predictive reliability models for electronic components based on design-of-experiments. _Qual. Reliab._**2023**, _39_, 2594-2607. [CrossRef]
* (22) [PERSON]; [PERSON] Design an optimal accelerated-stress reliability acceptance test plan based on acceleration factor. _IEEE Trans. Reliab._**2018**, _67_, 1008-1018. [CrossRef]
* (23) [PERSON]; [PERSON] Inference on Constant Stress Accelerated Life Tests Under Exponentiated Exponential Distribution. _EJAS_**2023**, _16_, 234-256. * (24) [PERSON]; [PERSON] Sequential Bayesian Design for Accelerated Life Tests. _Technometrics_**2018**, _60_, 472-483. [CrossRef]
* (25) [PERSON]; [PERSON] Optimal test plan of step stress partially accelerated life testing for alpha power inverse Weibull distribution under adaptive progressive hybrid censored data and different loss functions. _Mathematics_**2022**, _10_, 4652. [CrossRef]
* (26) [PERSON]; [PERSON] Lifetime predictions of LED-based light bars by accelerated degradation test. _Microelectron. Reliab._**2012**, _52_, 1332-1336. [CrossRef]
* (27) [PERSON]; [PERSON] [PERSON]; [PERSON] Analysis of dc current accelerated life tests of GaN LEDs using a weibull-based statistical model. _IEEE Trans. Device Mater. Reliab._**2005**, \(5\), 688-693. [CrossRef]
* (28) [PERSON]; [PERSON]; [PERSON] Analysis on failure modes and mechanisms of LED. In Proceedings of the 8 th International Conference on Reliability, Maintainability and Safety, Chengdu, China, 20-24 July 2009; pp. 1237-1241. * (29) [PERSON] [PERSON]; [PERSON]; [PERSON] [PERSON]; [PERSON] [PERSON]; [PERSON] [PERSON]; [PERSON] [PERSON]; [PERSON] [PERSON]; [PERSON] [PERSON]; [PERSON] [PERSON]; [PERSON] [PERSON] Failuremodes and mechanisms of DC-aged GaN LEDs. _Phys. Status Solidi A_**2002**, _194_, 389-392. [CrossRef]
* (30) [PERSON]; [PERSON]; [PERSON] Reliability issues in AlGaN based deep ultraviolet light emitting diodes. In Proceedings of the IEEE 47 th Annual International Reliability Physics Symposium, Montreal, QC, Canada, 26-30 April 2009; pp. 89-93. * (31) [PERSON]; [PERSON] [PERSON]; [PERSON]; [PERSON]; [PERSON]; [PERSON]; [PERSON] High power and high reliability GaN/ InGaN flip-chip light-emitting diodes. _Chin. Phys._**2007**, _16_, 1135-1139. * (32)_IES TM-28-14_; Projecting Long-Term Luminous Flux Maintenance of LED Lamps and Luminaires. IES-USA: New York, NY, USA, 2014. * (33) [PERSON], [PERSON]; [PERSON]; [PERSON] [PERSON] Acceleration factor analysis of aging test on gallium nitride (GaN)-based high power light-emitting diode (LED). In Proceedings of the Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), Orlando, FL, USA, 27-30 May 2014; pp. 178-181. **Disclaimer/Publisher's Note:** The statements, opinions and data contained in all publications are solely those of the individual author(s) and contributor(s) and not of MDPI and/or the editor(s).