ARCHIVES HISTORIQUES
DELACOMMISSION
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DOCUMENTS "COM"
COM(78)766
Vol.1978/0277

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COMMISSION OFTHEEUROPEAN COMMUNITIES
COM(78)766 final .
Brussels ,22January 1979 .
PROPOSAL FORACOUNCIL DIRECTIVE AMENDING
COUNCIL DIRECTIVE 71/316/EECOF26JULY 1971 ONTHEAPPROXIMATION
OFTHELAWS OFTHEMEMBER STATES RELATING TOCOMMON PROVISIONS FOR
BOTH MEASURING INSTRUMENTS ANDMETHODS OFMETROLOGICAL CONTROL
(Submitted bytheCommission totheCouncil )
COM(78 )766final .'~Z\
•X '-»/
..-.V j
,V' y/
n.■ ;i \C-Î-^

EXPLANATORY MEMORANDUM
Introduction
Themeasuringinstrumentsindustryisinfullevolutionbecauseofthe
development ofelectronics .
AtpresentwithintheCommunity,themarketintheseinstruments ,isexpan­
dingabout107.peryear.In1976thismarketrepresented morethan400
millionUnitsofAccount.Withreferencetothefieldofweighingmachines/
whoseturnoveristotheorderof250millionUnitsofAccountintheEEC,
electronic machinesrepresenteachyearagrowingpercentageoftheturn­
over,percentage whichisatpresentbetween30%andAO%.Whenonethinks
*
oftheintroduction ofelectronics .intothefieldofmetersforliquids
(petrolpumps!)onecanimaginetheenormousonarketwhichisopentoelec­
tronicsinthefieldofmeasuringinstruments .Andyetthesituationis
stillblockedfromthepointof.viewofintraCommunitytradebecauseof
divergingnationallaws,inparticularinFranceandinGermany.Forsome
♦
timenowtheCommunity hasturneditsattentiontotheelimination oftech­
nicalbarriersinthemetrological field.Since1971morethan25directives
adoptedfortheelimination oftechnicalbarriers,relatetothissector.
Howevertheinstruments whichhavebeenaffectedtothisdatehavealways
beenmechanicalorelectromechanical instruments whichrepresented the
majorpartofthemarket,thiswillnolongerbethecaseinthefuture.
InordertofacilitatetheCommunityindustryinitsnaturalevolution
towardselectronics,inthefaceofitsthirdcountrycompetitors,itwas
necessarytoallowitalsotobenefitfromtheadvantagesofaunified
internalmarketinthisfield.

-2-
II.Contentsoftheproposal _
ThisDirectiveamendingCouncilDirective 71/316/EECisadoptedpursuant
toArticle100oftheTreatyestablishing theEuropeanEconomicCommunity.
TheCouncilDirective71/316/EECof26July1971ontheapproximation of
thelawsoftheMemberStatesrelatingtocommonprovisionsforboth
1measuringinstruments andmethodsofmetrological controlwasadopted
withaviewtoharmonizing thelaws,regulations andadministrative provisions
'whichwereinforceatthetimeofeachoftheMemberStatesandwhich
wereintendedtolaydowntheprocedures andmethodsofmetrological
controlontheirrespectiveterritories .
TheadvantageofthatDirectivewastherefore ,toestablishappropriate
EECpatternapprovalandinitialverification procedures andEECmethods
ofmetrological controlrecognized byalltheMemberStateswhich,
combinedwiththerequirements oftheseparatedirectives,allowfree
movementoftheinstruments inquestion.Theinstruments coveredbythe
Communitystudiesweremechanicalorelectromechanical .
SincetheadoptionofthisCouncilDirective 71/316/EEC,considerable
changeshaveoccurredinthetechnologyofthesemeasuringinstruments .
WhenDirective 71/316/EECwasdrawnup,measuringinstruments weremostly
ofthemechanical andelectromechanical types.Nowadaysthesituation
iscompletelydifferent:thedevelopment,standardization andincreasingly
widespread useofelectronic deviceshavecompletely revolutionized
measuringtechniques.
Notallmeasuringinstruments areaffectedbythisinnovation,butmany
arefittedwithorassociatedwithelectronic devices.Bywayofexample,
mentionmaybemadeofweighinginstruments ingeneral,taximeters and
tcertainmeterswhosereadoutsystemsmakeuseofthesedevices.Others,
suchasdevicesformeasuringliquidsotherthanwater(e.g.petrolpumps
,usedinservicestations)«lsorelyonthismoderntechnique.' > ■

-3-
Becauseoftheuseofelectronic devicesinmeasuring instruments ,certain
MemberStateshavelaiddowntechnical requirements concerning these
devicesandtheserequirements have"createdbarriers totrade .inthese
measuring instruments .
Conscious ofthistechnical development andoftheproblemsthuscreated,-
theCommission beganafewyearsagotostudythevariousaspectsofthis
question incollaboration withthecompetent nationaldepartments ineach
oftheMemberStatesandwiththemanufacturers andusersofthese
instruments ,associated inorganizations belongingtctheLiaisonGroupfor
theEuropeanIndustries (ORGALIME).TheseincludetheCommittee of
Electrical andElectronic Measuring Instrument Industri.es oftheEEC(CIMEC),
theEuropean Committee ofWeighingInstrument Manufacturers (CECIP)and
theEuropean^Committee ofManufacturers ofEquipmentfortheMetering ancf
Distribution ofHydrocarbons (CECOD);theEuropean Committee forElectro­
technicalStandardization (CENELEC)andtheInternational Electrotecnni caI
Commission (IEC)havealsobeenkeptinformedand,especially CENELEC,
associated withthestudies..
Anumberofdifficulties wereencountered inpreparingtheproposalfora
directiveamendingCouncilDirective 71/316/EEC..Theseweredueprincipally
totheconflicting interestsoftheindustrialsectorsconcerned,but
alsotodifferences intheprinciples adoptedbytheMemberStatesto
allowthesemeasuringinstruments equippedwithelectronic deviceson
theirnationalterritories .
Thepreparatory discussions showed'thattwoequallyprevalentschoolsof
thoughtintheMemberStateswereacceptable asregardsthedesignof
thesedevices.Oneadvocatedtheincorporation ofanumberofchecksalong
theelectronicchair,inordertodetectandindicatesignificant defects,
theotherthattheaimshouldbetoproduce ^electronicdeviceswitha
satisfactory standardofqualityandreliability .

-4-
After numerous stadias andtalks with theprotagonists ofthese two
school scfthc.icjht ,tiieCommission has rin.a_l.ized thegeneral requirements
forboth systems which should thus provide reciprocally accepted
metrolog icalsecurity ,With a'fewexceptions ,themanufacturer remains
free tochoose between these twomethods according ^tocircumstances .The
newproposal foramending theDirective adds anAnnex IIItotheoriginal
text andmakes certain amendments toAnnexes IandIItotheoldDirective .
This hastwoadvantages :formechanical andelectrical appliances ,the
Directive retains itsintrinsic value with regard toEECcontrol (EEC
pattern approval andEECinitial verification )while atthesame time it
isbrought uptodate bytheaddition ofrequirements specific tothese
instruments fitted with electronic devices .
Allofthese newrequirements ,with which thenational experts have
expressed alarge degree ofagreement ,thus allow provision tobemade in
thevertical directives forrequirements peculiar toEECpattern approval
and tothe tests tobecarried out onthem .
This proposal foradirective ,supplemented byseparate directives ,will
make possible thefree movement ofthese newmeasuring instruments within
theCommunity .
CONSULTATION OFTHE EUROPEAN PARLIAMENT AND THE ECONOMIC AND SOCIAL COMMITTEE
Pursuant toArticle 100 ,paragraph 2,theopinion ofthese twobodies is
necessary ,since implementation oftherequirements laid down inthe
proposal for adirective involves theamendment oflegislation insome of
the Member States .
Asfarastheprocedure isconcerned ,theproposed amendments arenecessary
toadapt Directive 71/316EEC totechnical innovations asexplained above .
Itwould therefore seem appropriate touse thespecial procedure laid down
inArticles 17to19ofthe Directive .
However ,since itconsiders theinnovations tobeoffundamental importance ,
theCommission hasdecided tosubmit totheCouncil aproposal foran
amendment under Article 100 .This will enable the Council todiscuss the
problems indepth tolaydown theprinciples fortheadaptation of
particular directives according towhat isknown astheprocedure for
adapting totechnical progress .

PROPOSAL FOR ACOUNCIL DIRECTIVE AMENDING DIRECTIVE 71/316/EEC
OF26JULY .1971 ONTHE .APPROXIMATION OFTHELAWS OFTHEMEMBER STATES
RELATING TOCOMMON PROVISIONS FOR BOTH MEASURING INSTRUMENTS AND METHODS
OFMETROLOGICAL CONTROL
(submitted bythe Commission tothe Council )
*
À
THE COUNCIL OFTHE EUROPEAN COMMUNITIES ,.
Having regard totheTreaty establishing theEuropean Economic Community ,
and inparticular Article 100thereof ,
Having regard totheproposal from theCommission ,
Having regard totheOpinion oftheEuropean Parliament ,
Having regard totheOpinion oftheEconomic andSocial Committee ,
Whereas Council Directive 71/316/EECof26July 1971 isintended to
achieve thefree movement ofthese instruments within theCommunity by
harmonizing thediffering national laws relating tometrological controls
andbyestablishing forthis purpose appropriate EECpatterm approval and
initial verification procedures aswell asEECmethods ofmetrological
control ; " '
Whereas ,since theadoption ofthat Directive ,progress intechnology and
engineering hasledtothedevelopment ofmethods of -construction based
onelectronics which aretoday regularly used inthedesign ,elaboration
andmanufacture ofmeasuring instruments ;
1OJNoL202 6.9.1971 p.l

-5-
Whereasthistechnical progress couldnotbetakenintoaccount
atthetimeDirective 71/316/EECwasadopted;whereassincethen
MemberStateshaveembodied intheirnational lawsrequirements allowing
national approval tobegrantedtomeasuring instruments fittedwith
electronic devices;
Whereasitisconsequently advisable ,inordertoextendthescopeofthe
above-mentioned CouncilDirective tomeasuring instruments equipped with
electronic devices andtoharmonize thenational lawsadoptedtothisend,
toamendandsupplement thetextoftheEuropean requirements atpresent
inforce.
HASADOPTED ..THISDIRECTIVE :

Articiel
Articles 2(2 )and (5),5(3).and (4),7(1 )and (4),8(1 )and (2),9first
"paragraph ,15(2 )andCl7)of Directive 71/316/EECarereplaced bythe
following texts respectively :
Article 2(2 )
Insofarastheir control equipment permits ,Member States shall ,atthj
request ofthemanufacturer orofhisauthorized representative ,grant
EECpattern approval forevery pattern ofinstrument andallancillary
equipment which satisfies themeasurement characteristics and the ~
technical design andfunctioning requirements laid down bythis Directive
where appropriate ,andbytheseparate directive relating tothecategory
ofinstrument inquestion . *
Article 2(5 ) ,
Member States shall grant EECpattern approval inaccordance with the
provisions ofthis Directive andoftheseparate directives .
Article 5(3 ) .
When newtechniques which arenotprovided for inthis Directive orina
separate directive areemployed ,limited EECpattern approval mayalso be
granted after prior "consultation with theother Member States .This
limited approval maybesubject totherestrictions mentioned in
paragraph 2andtospecial conditions connected with thetechnique used .
This limited approval can,however ;begranted only :
~iftheseparate directive fortherelevant category ofinstruments has
already entered into force ;
ifthemaximum permissible' errors specified intheseparate directives
are not exceeded .

-7-
Such Limited approval shall bevalid fornotmore than twoyears .Itmay
beextended for afurther period ofthree years .
Article 5(4 )
IftheMember State which granted limited EECpattern approval asreferred
toinparagraph 3considers that anewtechnique hasproved satisfactory ,
itshall apply fortheadjustment totechnical progress oftheAnnexes
tothis Directive ,where appropriate ,andoftheAnnexes totherelevant
separate directive ,inaccordance with theprovisions ofArticles 18and
■19. . '
Article 7(1 )
TheMember State which hasgranted EECpattern approval maywithdraw it:
(a)ifinstruments forwhich this approval wasgranted donotconform to
'theapproved pattern and/ortotheprovisions ofthis Directive ,where
appropriate ,andoftherelevant separate directive ;
(b)ifthemetrological requirements specified inthecertificate of
approval ortheprovisions ofArticle 5(2 )and (3)arenot met .
Article 7(4 )
AMember State which discovers acase coming within theterms ofpara­
graph 2maysuspend theplacing onthemarket andputting into service of
the instruments concerned . *
Itshall immediately inform theother Member States andtheCommission ,
stating thereasons onwhich itsdecision isbased .
'Thesame procedure shall apply inthecases mentioned inparagraph 1/
with respect toinstruments which have been exempted from EECInitial
verification ,ifthemanufacturer ,after duewarning ,does notbring the
instruments into line with theapproved pattern and/orwith theprovisions
ofthis Directive ,where appropriate ,andoftherelevant separate directive

-8-
Article8(1)
"i
TheEECinitialverification constitutes theinspectionofanewor
reconditioned instrumenttoconfirmthatitconformstotheapproved
patternand/ortotheprovisionsofthis'Directive,whereappropriate,
andoftherelevantseparatedirective;itiscertifiedbytheEEC
initialverification mark.
Article8(2) '
Iftheyhavetherequisiteequipment,MemberStatesshallcarryoutEEC
initialverification ofinstruments submitted ashavingthemeasurement
characteristics andsatisfyingthetechnical .construction andfunctioning
requirements laiddownbythisDirective,whereappropriate andbythe
separatedirectiveonthiscategoryofinstruments .
Article9,firstparagraph
WhenaninstrumentissubmittedforEECinitialverification ,theMember
Statecarryingouttheexamination shalldetermine :
(a)whethertheinstrument belongstoacategoryexemptfromEECpattern
approval,and,ifso,whetheritsatisfiesthetechnicalconstruction
andfunctioning requirements laiddownbythisDirective,where
appropriate,andbytheseparatedirective onthiscategoryof
instruments ;
(b)whethertheinstrument hasreceivedanEEC-patternapprovaland,if
so,whetheritconformstotheapproved ,patternandtotheprovisions
ofthisDirective,whereappropriate,aswellastothoseofthe
relevantseparatedirective.
Article15(2)
Notwithstanding theprovisionsofArticle1(1),aninstrumentinservice
whichbearsEECsignsormarksbutdoesnotsatisfytherequirements ofthis
Directiveand/oroftherelevantseparatedirective,inparticularwith
regardtomaximumpermissible errors,maybebannedfromserviceinthesame
wayasaninstrumentbearingnationalmarks.

-9-
Article 17
Theamendments necessary tokeep :
-the Annexes tothis Directive
-theAnnexes totheseparate directives dealing with thedifferent
categories ofinstruments ,thelegal units ofmeasurement andEEC
methods ofmetrological control ,
inline with technical progress shall bemade inaccordance with the
procedure laid down inArticle 19.
Article II
Thefollowing texts areadded toitems 1.3and2.1ofAnnex 1to
Directive 71/316/EEC :
1.3.4 .
Inaddition ,inthe case ofaninstrument equipped with electronic
devi ces :
-alist ofitselectronic components with their essential charac­
teristics ,
-adescription oftheelectronic devices with drawings anddiagrams
explaining their construction andoperation .
2.1.3 .
Where appropriate ,adetailed study ofthe electronic devices consis­
ting principally ofanexamination oftheir design ,proving tests
ofdesign and/oroperation and anendurance test asprovided for in
item 8ofAnnex III .
Article III
Item 1ofAnnex IItoDirective 71/316/EEC -isreplaced bythefollowing
text :
1.General points
1.1 -TheEECinitial verification maybecarried out inoneormore
stages (usually two )-

10
1.2.Subject totheprovisions oftheseparate directives :
1.2.1 .TheEECinitial verification shall becarried out inone stage
oninstruments which constitute awhole onleaving the'factory ,
that istosayinstruments which ,theoretically ,canbe
•transferred totheir place ofinstallation without first having
tobedismantled .
1-.2.2 ..TheEECinitial verification shall becarried out intwoor
more stages forinstruments whose correct functioning depends
ontheconditions inwhich they are installed orused .
1.2.3 .The first stage oftheverification procedure must ensure ,in
particular ,that the instrument conforms totheapproved pattern
and/ortotheprovisions ofthis Directive ,where appropriate ,
andoftherelevant separate directive ,or,inthecase of
instruments exempt from pattern approval ,that they conform to
therelevant provisions .
laExamination forEEC initial verification
ForEECinitial verification ,instruments equipped with electronic
devices shall ,inaddition tomeeting therequirement ^stipulated in
Article 9,undergo theexaminations setout initem 9ofAnnex III in
order toensure that the'electroni cdevices conform tothose incorporated
intheapproved pattern .
Article -IV
TheAnnex tothis Directive ,isadded toDirective 71/316/EEC .
Article V
(a)Member States shall adopt andpublish by31December 1981thelaws ,
regulations andadministrative provisions which areneeded inorder to
comply with this Directive andwhich shall enter into force on
1April 1982 ,andshall inform theCommission thereof .

-11-
(b)OncethisDirective hasbeennotified,theMemberStatesshallalso
ensurethattheCOP.missionisinformed,insufficient timeforitto
submititscomments,ofanydraftlaw,regulation oradministrative
provisionwhichtheyproposetoadoptinthefieldcoveredbythis
Directive.
ArticleVI
ThisDirectiveisaddressedtotheMemberStates.
DoneatBrussels

A_N_N_E_X
ANNEXIII
REQUIREMENTS RELATING TOELECTRONIC DEVICESINCORPORATED INOR
ASSOCIATED WITHMEASURING INSTRUMENTS
Chapter ■I
SiDêC|l_EQlQ |!
ThisAnnexspecifiesthegeneralmetrologicalandtechnicalcharac­teristics whichmustbeexhibited byelectronic devicesincorporated
inorassociated withmeasuring instruments ortheirancillary
equipment,togetherwiththerelevantexaminations andtests.
Theseparatedirectivesrelatingtothedifferentcategories of
measuringinstruments supplement andclarifythegeneralrequirements .
Aim -' ;
Theobjecttobeattainedistoensurethattheelectronic deviceswill
functioncontinuously andwillinnocaseintroducesignificant errors
intothemeasurement results.
\
BÊlioi£iQQs_aQçj_t!Ç03iQglQgy ;
ThefolLowingtermswhicharedefinedinthisAnnexmaybeusedinthe
separatedirectives inwhichtheyshallhavethesamemeaning.
3.1.Electronic devices
,3.1.1.Electroni c_deviçe
'. ForthepurposesofthisAnnexanelectronic deviceisa
partofameasuring instrument orancillary equipment
containing atleastoneelectronic component andperforming
aspecificfunction intheinstrument .
3-1.2.Electronic devjçew|Íll_íiiii-.£!2ê£lSÍD2_£âEã21il£ ^
Anelectronic deviceshallbeconsidered tohavefull
checkingcapability ifeverysub-assembly oftheelectronic
devicehavinganessential functionin.themeasuring is
checked .
3.1.3.§i£Ctron2C_de\ /2ce_WT_tl}_no_or_only_garti al_checking _cagabij-jty
Electronic deviceswithoutthefullchecking eapability•as
specified initem3.1.2.
3.2.Primary andauxiliary indications -
3.2.1.Primary_indi cations
Anyoutputdataconsidered asauthentic^forthepurposeofleg
metrology . „-

-13-
Theprimaryindication mayincludenotonlytheindication
ofthemeasuredquantity,indisplay,printedorrecorded
form,butalsoafunctionofthatquantity.
Theseparatedirective mayspecifywhichoftheindications
ofameasuringinstrument aretoberegardedasprimary
indication .
3.2.2.AuxiIiar^_indications
Anyoutputdatanotregardedasprimaryindications .
3.3.Repeatable andnon-repeatable measurement
3.3.1.Repeatable measurement
Measurement inwhichthedetermination ofthemeasuredquantity
cannormallyberepeated.
3.3.2.Non-regeatable measurement
Measurement inwhichonlyonedetermination ofthemeasured
quantityispossible.
3.-4.Typesofelectronic devices
Deviceinwhichallthesignalsarecontinuousfunctionsof
thequantitybeingprocessed.
I_dey2ce
Deviceinwhichallthesignalsarediscontinuous functions
ofthequantitybeingprocessed.
Μ2ϊ§^_^ενι ΰθ
Indivisibledevicemakinguseofboththeprecedingtypesof
signals.
.5.Typesof-function
3.5.1.Statiç_function_(garallel )
Functioninwhichtheoutputdatadependonlyonthe
instantaneous valueoftheinputdata.
3.5.2.Klnetic_function _(serial)
Functioninwhichtheoutputdatadependnotonlyonthe
currentinstantaneous valuesoftheinputdatabutalsoon
thepreviousinstantaneous valuesoftheinputdata.3.4.1.
3.4.2.
3.4.3.

-14-
3.6 .Faults
3.6.1 .faults
Forthepurpose ofthis Annex /afault isamalfunction of
the electronic device due toafailure ofcomponents or
their connections ,ortoexternal disturbances .
3.6.2 .£aults_accordi^g_to_duration
3.6.2.1 .Jransi entfaults _
Faults theduration oiwhich maybeless than that
ofthe shortest measuring operation involved .
3.6.2.2 .Permanent faults _
Faults which are not transient .
3.6.3 .faylts_accord2ng_to_thei r_seriousness
3.6.3^1 .Insignificant faults _
Faults causing noerrors orcausing errors inthe
measurement results which are smaller than the
.value laid down intheseparate directive relating
tothe instrument concerned .
3.6.3.2 .Significant faults _
Faults notcovered byitem 3.6.3.1 .
3.7 .Types ofchecking
3.7.1 .Permanent_automati c^checking (P)
Checking permitting thecorrect operation ofelectronic
devices tobeverified during ameasurement either continuously
ordiscontinuously andpreventing theinclusion oferroneous
information ,without theintervention ofanoperator .
3.7.2 .lnterrr )2ttent _automati cchecking (I)
Checking permitting cyclic verification ofthecorrect
operation ofelectronic devices without theintervention of
anoperator .
3.7.3 .Non2automatic_checking (N) ,
Checking topermit verification ofthecorrect operation of
electronic devices andrequiring theintervention ofan
operator .
3.8.Hetrologi calsecurity
Themetrological security ofameasuring instrument equipped with
electronic devices istheability ofthese devices tocomply with
themetrological andtechnical requirements towhich they aresubject .

15
ChapterII
Requirements concerningelectronic devices
4.Q£Decai_ceguiçe||Dt |
4.1.Metrological security
Measuringinstruments andancillaryequipmentfittedwithelectronic
devicesshallhavethemetrological securityrequiredfortheuse
towhichtheyaretobeput.
Thissecuritymaybeachievedbyoneofthefollowingmethods:
-bymeansofasuitabledesignandtypeofconstruction whichwill-
resultinelectronic deviceswhichcorrespondtotherequisite
standardofqualityandforwhichanadequateworkinglifecanbe
predictedbymeansoftests,
-byproviding,foreachsub-assembly ofanelectronic devicewith
anessentialfunctioninthemeasurement,checkingfacilities
whichdetectandindicatesignificant defects,
-byacombination ofthesemethods.
Thechoiceofoneofthesemethodsislefttothemanufacturer,
unlessaseparate ,directivespecifiesotherwise'.
4.2.Emergencypowersupply
Ifanemergencypowersupplyisrequiredbyaseparatedirective,
switchingovertotheemergencypowersupplyshallnotcausefaults
intheelectronic devices.
5.Be9yÍrg!!DÍ!_£2D£!ÇDÍD9_fÍ!!írgDÍ!_dê¥Í£p_wi!h_íy !i_£heçkÍD3_£iQabilit2
Thedesignofdeviceswithfullcheckingcapabilityshallbesuchthat
thefunctioningofthedeviceisverifiedandthatfunctionalfaults
aredetectedautomatically orbyanoperatorandindicated.
5.1.Faultdetection
Faultsaredetectedbymeansofcheckingfacilitiesasspecifiedin
item3.7.Thetypeofchecking(P,I-,N)dependsonthetypesof
electronicdevicesinwhichthesecheckingfacilitiesare
incorporated . -
'4
Automaticcheckingfacilitiesarerequiredinthefollowing/instances,unlessaseparatedirectivespecifiesotherwise:
-digitalkineticfunction(digital/serial)devicesshallbe
equippedwithapermanentautomaticcheckingsystemCP).

-16-
However/iftheaforementioned checking systemisfittedtoonly
onepartofthedigitalkineticfunction device,butenables
transient faultsinthewholeofthisdevicetobedetected,the
otherpartsneedonlybefittedwithanintermittent automatic
checking system(I).
-digitalstaticfunction (digital/parallel )devicesshallbe
equipped withapermanent automatic checking system (P)oran
intermittent automatic checking system (I).
Thefrequency oftheintermittent automatic checksshallbelaid
downbytheseparatedirective .
Non-automatic checks-(N )shallbeusedonlywhereprovidedforby
theseparatedirectives .
However,certainfaultsneednotbedetected :
-faultsarisingfromtwoormoresimultaneous failuresresulting
fromindependent causes, .,
-faultswhichmakeitimpossible toperformanymeasurement ,
-faultsinvolving measuring errorssoseriousthattheyarebound
\tobenoticedbyallthoseinterested intheresultofthe
measurement ,-
-faultswhicharespecified intheseparatedirectives .
5.2.Indication ofafault
Whenafaulthasbeendetected,actionspecified intheseparate
directive (settingoffanaudibleorvisiblealarm,stoppingthe
measuring operation,switchingofftheindicating device,etc.)shallbetakenautomatical ly.
Thisactionshallbetakenwhen:*
-anyfaultisdetectedindigitaldevices,
~anyfaultresulting inameasurement errorexceedingthevaluelaiddownbytheseparatedirectiveisdetectedinanalogueormixeddevices.
5.3.Manualtestdevices
Ifameasuringinstrumentisfittedwithelectronic devicesequipped
withcheckingfacilities,oneormoremanualtestdevicesincorporatedintheinstrumentshallallowtheexistence andoperatingconditionofthecheckingfacilitytobeverified.
ii9yiÇiiiQli =£QD£§ÇDÍDg_|i|£ÍÇQDÍ£_d|VÍ£ ||=yÍ£hout_çhgçl <ing.çaoabiiityor-
-====il===--------in9_Ç§B§bi lity --- =--
Thedesignandconstruction ofelectronic deviceswithoutcheckingcapabilityorwithpartialcheckingcapabilityshallbesuchastogive
themaqualitystandardenablingthemtofunctionsufficientlycontinuously
ndaccuratelyunderthenominaloperatingconditionsofthemeasuringIssoJiatT^theyaPeincorporated orwith"hichtheyare

-17-
Furthermore ,theseelectronic devicesshallbeprotected against
external disturbances towhichtheymaybeexposed andwhicharelikely
tocausesignificant faults.
Testsshallbecarriedouttoassessthequalityoftheseelectronic
devices .

-18
ChapterIII
Examinations andtestsofelectronic devicesforEECpattern
approval andEECinitial -verification
7.ForEECpatternapproval andEECinitialverification ofmeasuring
instruments equipped withelectronic devices,thesedevicesshallundergo
theexaminations and/orthetestsspecified inthischapter.
8.ÊXâQîiQatlSD-1QC_ÊÊ£_E||£êÇQ =iBBÇ2yiI
8.1.Examination andtestingofelectronic deviceswithfullchecking
capabiIity
8.1.1.Examination_of_the_design
Theexamination ofthedesigndrawingsisintendedtoverify
thatelectronic devicesandtheirchecking systemsmeetthe
requirements ofitems4and5ofthisAnnex.
Thisexamination shallinclude :
(a)anassessment oftheconstructional features and
components usedtoensurethattheminimumrequired
qualityisattained,
(b)consideration ofanyfunctional faultscausedby
externalinfluences orbyfailures duetothecomponents
ortheirconnections toensurethatinallinstances the
.devicesmeettherequirements ofitem5,
(c)verification oftheexistence andthecorrectfunctioning
ofoneormoremanualtestdevices.
8.1.2.Examinati_on_of_correct_funct2on2n2_§Qd_oge rationaItests-
Electronic devicesincorporated inthemeasuring instrument
shallbeexaminedtoensurethatth.eyhavebeenconstructed
withcareandthattheconnections andjointshavebeen
correctly made.
Ifanemergency powersupplyisrequired,acheckshallbe
madethattherequirements ofitem4.2.havebeenmet.
Operational testsshallthenbecarriedoutontheelectronic
devicesincorporated inthe-fullyoperational measuring -instrument .

-19-
(a)Response_to influencefactors
Whentheinstrumentissubjectedtotheinfluence
factors .specifiedinitem11.1.ofthisAnnex,the
electronicdevicesshallcontinuetofunctioncorrectly
withoutgivingrisetoerrorsintheinstrumentinexcess
ofthosepermittedundertheconditionsspecifiedbythe
relevantseparatedirective.
-(b)Response_to disturbances _
Theinstrumentshallbesubjectedtotheexternal
disturbances specifiedinitem11.2.ofthisAnnexand
supplemented,whereappropriate,bytheseparate
directive,andalsotosimulatedcomponentandconnection
failures.
Throughouttheseteststheelectronicdeviceshall
continuetooperatenormallyor.elseshalldetectand
indicateanysignificantfaultsinaccordancewiththe
requirements ofitem5.
8.1.3.Description of_the_gattern
Operationofthebuilt-inmanualtestdeviceordevicesshall
showtheexistence andthecorrectfunctioning ofthe
checkingsystem.
Anendurancetestshallthenbecarriedout.Itshall
"consistinsubmitting oneormoreinstruments toatest
-programmeforaspecifiedlengthoftimeorforaspecified
numberofoperatingcycles.
Thelengthofthetestsandtheprocedureforcarryingthem
\outshallbespecifiedintherelevantseparatedirective.
Oncompletionofthesetests,theconditionorthecorrect
functioning ofthecheckingsystemshallbeverifiedusing
the.testdeviceor.devicesandanassessment shallbemade
ofwhetherthebehaviouroftheelectronic devicesduring
thesetestscanbeconsideredsatisfactory fortheuseto
whichthesedevicesaretobeput.
8.2.Examination andtestingofelectronic deviceswithoutchecking
capability ,orwithpartialchecking ,capability .
8.2.1.§xami^at2on_of_the_desijn_and_des22Q_i£St2n2
Thisstudyofthedesignofelectronic devicesisintended
toverifythatthedevicesmeettherequirements ofitems4,
6and10ofthisAnnex.

20-
8.2*1.1.Examination of_the_design
Theexamination includes:
(a)Anappraisalofthecharacteristics ofthe
components,designandconstruction ofthe
electronicdevicetodetermineitsreliability
andsuitability foruseinthemeasuring
instrument,
(b)consideration ofanyfunctionalfaultscaused
byfailuresduetocomponentsorconnections to
ensurethatthesefaultsarenotsignificant,
or,iftheyaresignificant,thattheirfrequency
islowenoughtoensurecompliancewiththe
required .levelofreliability,
(c)studyofthemeasurestakenbythemanufacturer
toprotecttheelectronic devicefromthe
-externalinfluencesspecifiedinitem11.2.
8.2.1.2.Design_proying_tests _
Thedesignprovingtestsprovidedforinitem10
ofthisAnnexshallbecarriedoutoneachnon­
operational electronic device.
Thecorrectfunctioning oftheelectronic devices
shallbeverifiedbeforeandafterthesetests.
8.2.2.Examination_of_correct_functionin2_ar]d_ogerationaJ ;_tests
Electronic devicesincorporated inthemeasuringinstrument
shallbeexaminedtoensurethattheyhavebeenconstructed
withcareandthattheconnections andjointshavebeen
correctly made.
Ifanemergency powersupplyisrequired acheckshallbe
madethattherequirements ofitem4.2.havebeenmet.The
operational testsprovidedforinitems11.1.and11.2.of
thisAnnexshallthenbecarriedoutontheelectronic
devicesincorporated inthefullyoperational measuring
instrument .Whentheinstrumentis.subjectedtothistest
programmetheelectronic devicesshallcontinuetofunction
correctly sothattheinstrumentretainstherequired
metrologicalqualities.
■ *
8.2.3.Description ofthepattern
Thepatternischaracterized bythelistofcomponents used,-
themanufacturing methodsandanobjectivequalitycriterion.
Thequalityisassessedbycarryingoutanendurancetest
whichconsistsinsubmitting oneormoreinstruments toa
testprogrammeforaspecifiedlengthoftimeorfora
specifiednumberofoperatingcycles.-
* ,. •*
-■■ '' - r
ν ,

Thelength ofandprocedure foreach test shall bespecified
intherelevant separate directive .
Electronic devices shall continue tofunction correctly
throughout theendurance test .
8.3 .Performance ofthetests
Theoperational tests provided forinitems 8.1.2 .and8.2.2 .may,
depending oncircumstances andinanycase incompliance with the
relevant separate directives ,becombined with theendurance tests
specified initems 8.1.3 .and8.2.3 .
Allthese tests shall result inahomogeneous programme ,suited to
theinstrument concerned andapplied uniformly bythecompetent
services ofthe Member States .
Furthermore ,when provided forbytheseparate directives ,these
tests shall becarried outonsub-assemblies ,fitted with electronic
devices ,which ,canbemade operational .
E^amioation_fgr_£|£_ÍDÍÍÍ|4 =^iCÍÍÍ£i|iQQ
9.1 .Electronic devices with full checking capability
The built-in manual test device ordevices shall beoperated on
all the instruments submitted for initial verification inorder to
show that thechecking systems arepresent andarefunctioning
properly .
Forevery ninstrument submitted tothemetrological service for .
EECinitial verification ,one instrument shall betaken for
performance ofthetests provided for initem 8.1.3 .or,depending
oncircumstances ,thetest programme drawn uppursuant toitem 8.3.'
Thenumber nandthe .consequences ofunsati sfactory results in
these tests shall bespecified inthe -separate directive .
9.2 .Electronic devices with noorwith partial checking capability
Forevery minstrument submitted forEEC initial verification ,one
shall betaken forthepurpose of:.
;
-verifying that themain components used inthemanufacture ofthe
electronic devices are inanequivalent condition andare at
least equal inquality tothose contained inthe list ofcomponent
included intheEECpattern approval file ,

-22-
-submitting theinstrument tothetests provided for in
item 8.2.3 .ortothe test programme drawn uppursuant to
item 8.3 .
Thenumber mandtheconsequences ofunsatisfactory results inthe
abovementioned operations shall bespecified intheseparate
directive .

-23-
Chapter IV
Tests tobecarried out onelectronic devices
Be|igQ_DÇQViDg_îë|t |
Thedesign proving tests areintended toensure thequality and
durability ofelectronic devices with noorwith partial checking
capability .
These tests ,towhich each ofthese electronic devices must be
subjected ,shall becarried outwhen theexamination forEECpattern
approval ismade . .
Theoperations carried outduring this examination shall consist of:
-verifying thecorrect functioning oftheinstrument ,
-carrying outthetests listed inthefollowing items ,
-refitting theelectronic devices inthe instrument and,
-rechecking thecorrect functioning oftheinstrument byverifying
inparticular that themaximum permissible errors arestill adhered
to.
10.1 .Damp heat cycling test
Theelectronic device shall beplaced inachamber whose temper­
ature shall bestabilized at25j+3°C andrelative humidity atnot
less than 95% .
Start the cycle byincreasing thetemperature to40°C in
'3h 30min.;therelative humidity (R.H. )shall notbeless
than 95%except during the last 15minutes when itshall not be
less than 90% .
Keep temperature at40+_2°Cuntil 12h 30min .from start of
cycle ;R.H. 93+_3%.
Reduce temperature to25+_3°Cin3h+_30min.;R.H. notless
than 95%except during thefirst 15minutes when itshall not be
less than 90%.Keep temperature at25+_3°Cwith R.H. notless
than 95%until the24-hour cycle iscompleted .
Six24-hour cycles shall becompleted .
§
10.2 .Thermal shock test
Theelectronic device shall beplaced inachamber at5+3°Cfo
3h;itshall beremoved from thecold chamber andsubjected to
the -ambient temperature fornot less than 2minutes ormore than
3minutes .

-24-
Theelectronic deviceshallbeplacedinahotchamberat40_+2°C
for3h;itshallberemovedfromthehotchamberandsubjected
totheambienttemperature fornotlessthan2minutesormore
than3minutes .
Fivecyclesshallbecompleted .
10.3.Mechanical shocktest
Equipment ofamassoflessthan50kgshallbeallowedtofall
freelyfromaheightof25mmontoasteelplatenotlessthan
8mmthick,fixedtoaconcrete basenotlessthan50cmthick.
Theheightofthedropshallbemeasured fromthepointofthe
equipment nearesttothesteelplatepriortodropping .-
Theunit,supported inarigidframe-byitsnormalsupportpoints,
shallbedroppedsixtimesoneachofthreemutually perpendicular
faces.
Equipment ofover50kgshallbedropped ontoasteelplatenot
lessthan8mmthick,fixedtoaconcrete basenotlessthan
50cmthick.Whenthetestisperformed,oneedgeofthe
equipment shallremainincontactwiththisplateanditscentre
ofgravityshallfallthrough 12mm.Eachbaseedgeshallbe­
takeninturn,andthetestshallbecarriedoutsixtimes.
10.4.Vibration test
Thevibrations shallbeappliedsuccessively alongthreeaxes
perpendicular toeachotherandselected sothattheweaknesses
haveeverychanceofbeingrevealed .
I
Thetestshallcoverthefrequency rangefrom10to150Hzwith
slightsinusoidal excitation andasweepratenotgreaterthan
1octave/min.upanddown.
Oneofthefollowing peaklevelsofacceleration shallbe
selected,depending ontheenvironmental conditions ofuse,unless
otherwise specified intheseparatedirectives :
25m/sforanormalenvironment
„,2,10m/sforanindustrial enviro'nment
Thistestshalllastfortwohours.
10.5.Additional tests -
Theadditional testsrequiredforameasuring instrument designed
foraspecialpurposeshallbespecified intheseparatedirectives .
QgeEitigoiI_tes£
Alltheelectronic devicesincorporated inameasuring instrument shall
besubjectedtooperational testsunderoneormoreofthetestconditions
specifiedinthissection,unlessotherwisespecified intheseparate *directive.Thetestsshallbecarriedout,atthetimeoftheexamination
forEECpatternapproval,onfullyoperational instruments .

25"
11.1 .Influence factors
.When the instrument issubjected totheeffect ofthe influence
factors ,theelectronic devices must continue tofunction
correctly without giving rise toerrors inthe instrument in
excess ofthemaximum errors provided for under these conditions
bytherelevant separate directive .
11.1.1 .Temperature
These tests shall beperformed atasufficient number of
stable temperatures tocover thetemperature ranges
specified bytheseparate directive .
The ambient temperature isconsidered stable ifthe
following twoconditions are satisfied :
~thedifference between theextreme temperatures recorded
during atest does notexceed 5°C;
-the temperature variation does notexceed 1°C in
five minutes . . .
11.1.2 .Relatiye_humidity
These tests shall beperformed atleast atthe twoends
oftherange specified below :
-from 20%to80% iftheelectronic device isincorporated
inapart oftheinstrument intended forindoor use,or,
-from 5%to95%iftheelectronic device isincorporated
inapart oftheinstrument intended foroutdoor use .
11.1.3 . at2on_in_the_gower_sugg ly
These tests shall beperformed atthenominal voltage and
frequency andatthelimits ofvariation specified bythe
separate directive .
11.1.4 .Other_inf_luence _factors
Other tests bringing into play influence factors such as
vibration ,harmonic distortions inthepower supply ,etc.,
shall belaid down intheseparate directives relating to
measuring instruments forwhich thefactors shall be
specified .
11.2 .External disturbances
Unless otherwise specified inaseparate directive ,thefollowing
tests shall becarried out ;

-26-
11.2.1 .Power sugply
11.2.1.1..Interruptions or_reduct ions
100% voltage reduction forapproximately
10milliseconds .
50%voltage reduction forapproximately
20milliseconds .
20%voltage reduction forapproximately
50miIliseconds .
The time interval between two consecutive tests
must beatleast 10seconds .
11.2.1.2 .Mains -Borne interference . ' v ■
Randomly phased transient overvoltages ofeither
polarity shall beapplied tothesystem .
These transients shall besupplied incommon -
mode andseries-mode from animpedance of5Owfi .-
Theamplitude ,risetime ,duration andrepetition
rate shall beasspecified inthefollowing
table :'
Amplitude Riseti me Half-amplitude Repetition
duration rate
500 ν 2ns 100 ns 10Hz n
1500 V 25ns 1LIS 412 Hz
300 V Burst ofpuises lasting forabout «12Hz
1msofabout 1.MHz •
5%
ofthe nominal sine wave superimposed onthemains 30kHz -150 kHz
value
1–1 V––sine wave superimposed onthemains 150 kHz -400 MHz
11.2.2 .External_interf erences
11.2.2.1 .Mains-borne interférence
Mains-borne interference over power lines is
specified initem 11.2.1.2 .
11.2.2.2 .Radiated interference
-Induction field
Induction field of60A/mand50Hzobtained
forexample byacable carrying 10Amps ata
distance ofabout 2.5 cm.

-27-
-Electromagnetic radiation
Fieldstrength of10V/matfrequencies of
100kHz-500MHz
Fieldstrength of1V/matfrequencies of
500MHz-1000MHz.
11.2.2.3.Electrostatic discharge '
Electrostatic discharge of6kVwithenergyof
2mJonearthedchassiswithaminimumof
... 10sbetweenindividual discharges .
11.2.3.Otherexternal disturbances
Othertestsinvolving disturbances suchaspowersupply
failure,interference bythelowvoltagenetwork,etc.,
shallbespecified intheseparatedirectives relatingto
measuring instruments likelytobeaffected bythesedisturbances .