Introduction to Scanning Transmission Electron Microscopy (Microscopy Handbooks)
by Robert J. Keyse, Anthony J. Garratt-Reed, Peter J. Goodhew, Gordon W. Lorimer
Category: SCIENCE

Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanlysis on thin sections of material. The technique is used in many modern transmission electron microscopes, and an increasing number of specialized instruments dedicated to STEM are being developed. This book provides an up-to-date introduction to the principles and major applications of STEM.