Barton, Daniel L. BS and MSEE - Lehigh University, 1988. High resolution thermal imaging techniques and failure analysis of compound semiconductor devices. Development, improvement and application of non-destructive IC failure analysis tools, with emphasis on electron beam, optical and magnetic imaging techniques. Gutierrez, Teresa B. BSEE - University of New Mexico, 1999. Microelectronic Failure Analysis and MDL Process Development Support.
Work experience includes reliability modeling and device characterization.
Additional interests in condensed matter simulations, including process and device simulation. MSEE - University of New Mexico, 1990. Primary job responsibilities are performing failure analysis and developing an expert system for failure analysis. Iben, Gordon I. Org. MS in Educational Math, Sul Ross State University, 1982.