Power Spectral Density Analysis Bearing Analysis and numerous others. Unlike other systems, all these capabilities are included standard with your NanoScope E purchase, so there is no need to buy extra software options. AFM, LFM and STM Imaging for Clean, Clear Results Use contact AFM to examine surface topography or LFM to highlight frictional differences on the sample surface. STM and electrochemistry also let you examine the atomic world and investigate changes induced by changing electrical potentials. Our experience and technological leadership ensure that your images are singular in their clarity and resolution and your measurements are of the highest accuracy and validity.
True productivity means high throughput and superior data quality.
And true productivity is what you get with every NanoScope system. In addition, the NanoScope E also provides the flexibility to accept your own supplemental input signals. Over twenty user-adjustable parameters make interfacing your own SPM design easy and convenient. When you're ready to upgrade, we'll simply add additional hardware functionality and you'll be up and running fast with the most advanced capabilities anywhere. Digital Instruments has pioneered technologies that will expand your horizons and take your work to a new level.