This presentation will be followed by a panel discussion which focuses on several of the most visible implications for metrology in the move to 300-mm production. New technologies force a review of the way metrology is integrated into the patterning processes in microlithography. Manufacturing technologies such as CMP have brought about a revolution in the application and integration of metrology into the manufacturing process. The panel will be made up from industry experts from equipment suppliers, semiconductor manufacturers, and experts from the standards community. As an industry service, SPIE's Career Center displays a resume file of qualified scientists, engineers, and technicians interested in employment.
Space is provided for posting descriptions of job opportunities and for informal discussion.
Tabletop space provides your company an excellent opportunity to obtain resumes directly from job applicant. Preregistration is required and payment must be received no later than January 8, 2001. Authors of poster papers will be on hand during these sessions to answer questions and provide in-depth discussion concerning their papers. Attendees are requested to wear their conference registration badges to the poster sessions. D. Other supplies can be obtained from the Speakers' Audio Visual Desk.