There is special access for detector manufacturers to protect confidential data. The Omnis application has Navigation menus on each window which allow you to find, e.g., Test records related to an Item record without typing in the serial number by hand. Dragging an Item serial number into the Tests window enters a new test for that item. You can also insert an item into a list of Shipment Items or into a list of Asssembly components using 'drag and drop'. Version 5.30 integrated Pixel and SCT data.
Users see only data for their own subsystem.
Real SCT silicon detector and ABCD front end chip test data are being entered using all three interfaces. The Shipment mechanism works with both Web and Omnis interfaces. Some assembly definitions for barrel and forward module protoytpes are completed, except for hybrids. Experts to define Item Descriptions, Assembly Descriptions, Test Descriptions for production modules and hybrids. Define tests for modules and hybrids.