With TestStand's parallel-test support, you can run batch or asynchronous parallel tests. The asynchronous mode also tests multiple DUTs in parallel, but individual tests can proceed independently. In asynchronous mode, for example, if one PCB under test fails, the associated instrumentation might switch to a diagnostic mode to help pinpoint particular bad components while instrumentation associated with other DUTs proceeds normally. TestStand includes synchronization tools that schedule and manage parallel tests operations to achieve optimum test-equipment use. Users can publish test data on a Web page by using TestStand's XML reporting feature.
Users accessing the page can then use XML tools to customize presentation of the data.
TestStand 2.0 provides for direct connection to instruments via IVI-compliant software drivers. IVI drivers support functions such as state-caching, simulation, and interchangeability. Users can mix and match code from their choices of programming languages under TestStand while using TestStand itself to control instrument configuration and simple measurements. TestStand 2.0 also includes an expanded API to facilitate users' development of custom ad-on tools and editors. Copyright 2001 Cahners Business Information , a division of Reed Elsevier .