The Center for Advanced Thin Film Technology announces the availability of a Postdoctoral Research Associate position with a specialty in Optical Metrology. This position requires a Ph.D. in Physics, materials science, optics or related field. This position requires a dynamic individual who enjoys working on the cutting edge of new technology within an entrepreneurial environment. This position will be an appointment of the Research Foundation of the State University of New York.
Salary is contingent on experience and qualifications.
Appointments are awarded for a period of one year, renewable upon mutual agreement, contingent upon satisfactory performance and availability of funds.