All of the probes listed may also be used in deflection-based microscopes. Probes for probes that can be used for MFM and EFM applications with interferometer-based detection AFMs. Due to their longer cantilever lengths, the Contact Etched Silicon Probes described in the previous section may also be used for contact mode imaging with interferometer-based detection AFMs.
Thickness is cubed in the spring constant calculation, thus, actual values can vary substantially.
Contains 1 wafer of more than 500 standard NanoProbes Laser Diode Interferometer TappingMode Probes TappingMode probes for use with interferometer-based detection AFMs can be purchased as Etched or Focused Ion Beam Machined silicon probes. The probe style listed here consists of an integrated single crystal silicon cantilever and tip, and is most commonly used for TappingMode applications.