Note that there are total 7 sequential elements in the two blocks. When you use it in AL, you must use .gn format for the design and specify the destination library. Now we have to use it in command line version. The -lib switch gives information about where the ATPG lib is available. The h4c.atpglib just describes all of the H4C cells that the design may use.
Scan design uses either full or partial scan techniques, depending on design criteria.
The idea is to control and observe the values in all the design's storage elements so you can make the sequential circuit's test generation and fault simulation tasks as simple as those of a combinational circuit. They are shown in the following figures. Each scan style provides different benefits. LSSD is most effective on latch-based designs. If you don't specify a scan type, the default Mux-DFF is used.