EEV CCD 44-82, 2Kx4K, 15um pixels. No correction to the QE data has been attempted. Strange diamond pattern. Uniformity is nice.
Sensitivity is approximately proportional to thickness.
Vignetting at corners is caused by the test-stand. From counting fringes, a thickness difference of 2.1um peak-to peak is estimated. The files below contains two graphs each. The upper one is gain vs. ADU, measured from noise statistics. This method has proven to have poor precision.