Our System Our instrument used for dynamic SIMS analyses is a Cameca IMS-3f secondary ion mass spectrometer that has undergone significant electrical and computer interface upgrades in response to today's range of applications. Often the first step in SIMS analysis is to obtain general chemical composition, that can be the basis for further SIMS analyses. Depth Profiles - The sputtering process removes material from the surface, constantly exposing new, previously buried layers to analysis by the ion beam. Sputter rates can be adjusted to analyze depths ranging from nanometres to many microns. Images can be overlayed to illustrate the spatial relationship between two or three elements at a time.
Sensitivity can be as low as ppm.
3D images can be volume-rendered and shown as a movie of the cylinder in motion . This creates a highly visual aid in understanding elemental distributions throughout the analyzed volume. These images were collected to determine the thickness and the distribution of the tin coating on a tinplated steel sample, which is widely used for storing food and non-food products. SIMS imaging can also be used to determine the distribution of molecular species, such as iron oxides, and the iron-tin alloy layers present between the tin coating and the steel substrate. Features of SIMS Quantification normally requires reference standards because secondary ion yields are substrate dependent.