The cornerstone of Test Week, the IEEE s International Test Conference features formal paper and panel sessions, case studies, commercial exhibits and presentations, lecture series, tutorials, and workshops. This year s theme, Tackling Test Trade-Offs, examines the decisions that affect the design and test costs. Other topics include BIST or embedded ATE, design verification, IC test embedded-core test, MEMS testing, and production test automation. Cosponsored by the Computer Society s Test Technology Technical Council and the IEEE s Philadelphia Section, this year s ITC will take place at the Baltimore Convention Center in Maryland. The conference includes panel sessions, tutorials, and workshops that showcase latest developments in computer-aided design.
Vendors can display new products and useful technologies.
Online registration will be available at the end of August. Separate fees apply for single-day attendance or for tutorials. For more than a decade, the SC conference has been the place where industry and academia meet to discuss developments in high-performance computing, networking, communications, scientific computing, and related areas. Using advanced Access Grid collaboration technology, this year s conference will provide the opportunity for more interaction among experts and make good on its Beyond Boundaries theme through links from the conference center to constellation sites around the world. In addition, at SC 2001 high school math and science teachers will have the opportunity to begin a training program in the latest computer technologies.