The Scanning Probe Microscope from Digital Instruments makes available high resolution surface imaging through a variety of modes - contact AFM, intermittent mode AFM, scanning tunnelling microscopy, lateral force microscopy and magnetic or electrostatic force microscopy. Maximum scan area is 100mm x 100mm with an inspection area of approximately 100mm 2 disc. Samples may be in air or under liquid.
Some image analysis is also possible.
Web version of an original document. Dr Ken Short.