For Diagnostic Probing RTI designs and manufactures a full line of DUT fixtures for diagnostic probing and testing of LSI devices. These low-profile units are designed for use under diagnostic probe and wafer probe stations. Both heated and non-heated units are available for most packages from 3 to 625 pins. PCB technology is used for all interconnect.
Many units use multilayer PCB technology with ground planes.
Height varies dependent on socket type Rugged construction using a solid anodized aluminum base plate Also available in custom versions with controlled impedance and programming matrix for power supplies and ground Socket savers are included with most units to allow for easy socket replacement DUT sockets can be modified to allow for diagnostic probing of the die. Interface boards are available to interface to most any cable assembly required. Height varies dependent on socket type Rugged construction using a solid anodized aluminum base plate Available in both heated and non-heated versions Socket savers are included with most units to allow for easy socket replacement DUT sockets can be modified to allow for diagnostic probing of the die. Interface boards are available to interface to most any cable assembly required. The 256 Series 256 Pogo Pin Fixture and DUT cards Standard DUT cards are available for many package types from 64 through 256 pins including PQFP, QFP, VQFP, TQFP, BGA, PGA and many other devices.