Light scattering measurements can be made on the same surfaces. As plastic deformation occurs, dislocation motion generates slip bands that emerge on the surface. As a consequence, the surface roughens. Models of deformation have been used to simulate this roughening. Students are asked to compare the AFM and light scattering data with these simulations.
Students gain experience using a scanning near-field optical microscope.
This microscope has been modified to allow optical imaging with a solid immersion lens. The properties of total internal reflection microscopy are reviewed. Students are familiarized with optical data storage techniques such as Faraday rotation and use the modified AFM for imaging ferroelectric domains with surface specific second harmonic generation. Copyright 1996 Washington State University.