Thickness is cubed in the spring constant calculation, thus, actual values can vary substantially. Same as Model NP-020, but one wafer containing more than 500 tipless NanoProbes. Thickness is cubed in the spring constant calculation, thus, actual values can vary substantially. The oxide sharpening process is used to produce a tip with two end points, one which is 100nm higher than the other. 100nm in height.
Thickness is cubed in the spring constant calculation, thus actual values can vary substantially.
There are three different types of Olympus oxide-sharpened probes which are primarily differentiated by their cantilever thickness and cantilever shape. Contains 1 wafer of 500 Probes Contact Etched Silicon Probes Each contact etched silicon probe consists of an integrated single crystal silicon cantilever and tip. The tip has a smaller radius of curvature than the silicon nitride tips and steeper sidewalls, making it a good choice for applications requiring a higher aspect ratio tip. These probes can also be used with interferometer-based detection AFMs because of their long cantilever length. Please contact Sales Support for more details.