This image was obtained from Philips Research . To see a cross-section of typical embedded lines in an IC device, select this link . For more information about AFM, SPM, and CMP, please go to the Digital Images pages and be sure and visit the DI NanoTheater . If you wish to return to PAGE I of Materials Characterization, click here . The materials engineer is often involved in a function called failure analysis .
Materials characterization is an important component of any failure analysis.
For further information about this most interesting aspect of materials engineering, please visit the Failure Analysis web pages at this site. Analysis Return to the Materials Engineering Home Page at San Jose State University Please send any comments to Patrick P. Pizzo, Professor Emeritus of Materials Engineering Created by Dr. Pizzo on October 18, 1997.