Au Options LED Die, Sample Tested, with rejects not inked or removed, whole wafer on 200mm X 175mm tape. The luminous intensity is determined by sample testing LED with a beam candela integrating fixture. The dominant wavelength is determined by testing header mounted bare LED die with a spectral radiometer. A 2nm tolerance applies due to measuring variations 3. Sample electrical testing is performed with die on header.
Maximum ratings are package dependent.
Ratings were determined using a T-1 style package for the electrical drive characterization data cited. Ratings for other package types will differ. The forward current is not limited by the die but by the effect of the package on the device junction temperature. All die products conform to the listed specifications when packaged and operated within the maximum limits shown above. Typical values are provided for information only but are within the range of expected values of acceptable sample sizes.