Inc. Electron Flight Simulator TM Analysis Simulation and Modeling Software for Windows Model particles or inclusions. Drag the particle into any position on the sample.
Particle can be any size and chemistry.
Select round or square particles. Specify chemistry and thickness of each layer. Chemistry and thickness are displayed for each layer, along with chemistry of the substrate and particle. The x-ray line being modeled is also shown. Horizontal and vertical scale bars show depth and lateral spread of the interaction volume.