Back to List Quality Assurance At Celeritek, quality and reliability are designed into our products, based on results from continuous reliability and quality assurance testing. Some of the ways we test our products include the following. The MTBF over temperature is determined by high temperature and DC-biased accelerated life tests at several temperatures. The durability of devices is established by applying high RF power to the device inputs. Purchased materials are qualified by vendors based on applicable Celeritek quality standards.
Incoming inspection is performed via certification of compliance.
Additional quality and screening tests are performed on each individual wafer for high-reliability products designed for space and military applications. All systems used in the design and manufacture of Celeritek semiconductor products are checked and calibrated regularly.