New systems verify and characterize a full range of memory, digital and mixed-signal IC prototypes.
Together these innovations help design test engineers bring new high-performance devices to market with greater reliability in less time. Orion also provides a fail capture memory of 64 Mb standard with up to 1 Gb as an option. Electra Mixed Signal Test Station New IMS engineering Test Stations provide solutions for high performance multimedia and datacom ICs. Electra resolves mixed-signal design problems by quickly verifying and characterizing first silicon samples. Electra accomplishes its analysis faster and more economically than bench top rack and stack approaches or ATE systems adapted for prototype testing.