Offering all the system and user benefits of Philips XL Series SEMs, the XL30 FEG SEM features a large chamber with many free ports. The chamber accepts a wide range of samples, the flexibility of port configuration enables specific user needs to be easily accomplished.
Operation is enhanced by the fact that all detectors are optimized at a single working distance.
User friendliness, too, is a special feature. High resolution from high to low kV combined with optimum analytical performance, makes the XL30 FEG scanning electron microscope the preferred choice for advanced materials such as ceramics and superconductors, as well as for ultra-structural examination of biological tissue. Gun configuration control fully automatic. Optimized for total voltage range including low voltage performance. Alignment Computer assisted alignment allows free change of spotsize and high voltage without the necessity of realigning the system.