The size of the LFSR, the primitive feedback polynomial and the length of the generated test sequence are a priori known. The method uses a deterministic test cube compression technique and produces a one-seed LFSR test sequence of a predefined test length that achieves high fault coverage. Compared with existing methods, the proposed technique is able to deal with combinational circuits of great size and with a lot of primary inputs.
Experimental results demonstrate the effectiveness of our method.
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