A calibration model that is developed in the laboratory should be applicable without modifications on an instrument in a production plant. This goal is achieved after wavelength selection based on simulated annealing. Major in Analytical Chemistry from September 1995 until December 1996. Development of techniques to support qualitative and quantitative XRF-methods. This research is carried out in collaboration with Philips Physics Laboratory at Eindhoven in the Netherlands.
Main purpose is the analysis of thin multi layers using XRF-spectroscopy.
A genetic algorithm is used to propose a sample composition. The genetic algorithm modifies the sample composition until the theoretical spectrum matches the experimental spectrum as good as possible. When the minimized error between the spectra is below an offset value, it is assumed that the correct multi layer composition has been found. Dow Chemical N.V., Terneuzen, the Netherlands, Chemical Lab. Local copy of this poster.