Major pieces of equipment with auxiliary apparatus are operated as central research facilities and are available to all qualified research personnel. Extensive automation and Frame Store capabilities exist. A JEOL JSM-35 is available with facilities for secondary and back back scattered electron imaging as well as absorbed current imaging. With a high brightness LaB6 gun, a resolution capability of 5nm or better can be attained making possible excellent quality high magnification images. Capability for electron channeling patterns is also available for the collection of crystallographic data.
Facilities exist for sterio imaging, dual magnification or dual display of different image signals.
Mixing of signals is also possible. 20 degrees of tilt, making imaging of the atomic structures of most metallic and ceramic materials routine. The microscope is equipped with an image intensifier TV system and antivibration structure to help in achieving atomic resolution, and a Macintosh Quadra 950 and Gatan Image Processing System for image acquisition and processing. A Philips EM 400T with STEM facility provides high resolution capability for electron microscopy and diffraction of thin film or particulate samples. Qualitative and fully quantitative x-ray analysis by computer can be carried out for all elements above fluorine in the Periodic Table.