Statisticians and engineers familiar with robust parameter design. It discusses current developments and refinements to this approach.
Examples illustrate the methodologies.
The course first outlines the basic idea of the combined array and then illustrates how one can generate separate models for the process mean and the process variance. It outlines appropriate methods for jointly optimizing the two. Next, the course outlines in detail the dual response approach. It illustrates how one can reduce the overall design size if a first-order model for the process variance is appropriate. Practical examples illustrate all of these methods.