Graphed and tabulated results are analysed for trends. This modelling analysis is then compared to actual lab results for refracted angle determination.
Good correlation is seen.
He received a B.Sc. from MIT in 1966, M.Phil. and Ph.D. from Yale in 1972 and 1974 respectively. He was a postdoctoral fellow at the Smithsonian Institution in 1975. Hotchkiss is responsible for the scientific and technical development of transducers at Panametrics. Ed Ginzel is an independent consultant with the Materials Research Institute. Materials Research Institute provides training and consulting to the NDT industry.