In addition, we are investigating spatial light modulators, waveguide modulators, waveguides, lasers, and high-speed electronics. We have complete facilities for optoelectronic device design, fabrication, and testing. Microanalytical test facilities are available for semiconductor structure characterization, including secondary ion mass spectrometry, scanning electron microscopy, transmission electron microscopy, Rutherford backscattering, AEM, glow discharge mass spectroscopy, photoreflectance, photoluminescence, and Raman spectroscopy.
Facilities are also available for DC, RF, and optical testing of devices and circuits.
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