Magnifications from 7 - 500,000X with resolutions down to 60 angstroms depending on sample characteristics. Elemental characterization possible with energy dispersive attachments. XL-20 Electronic image manipulation and storage. Back scatter detector. Elemental analysis system.
Energy dispersive x-ray analysis capability.
Wide range of sample sizes from microns to inches. JEOL JSM-6300F Secondary and backscattered electron detectors. Oxford Instruments EDS detector and analysis system. Ultra-thin window detector for elements as low as beryllium. PC based control system provides microscope control, stage movement automation, and digital imaging acquisition, analysis, and archiving.