But, in a huge system, we may expect a few processors to fail in each round.
Dynamic faults make diagnosis substantially more difficult.
In our dynamic fault model all processors are initially good, at most t fail per round, and s may be repaired per round. The work above is joint with Will Hurwood. We will also sketch joint work with Bin Fu on diagnosing intermittent faults. Light refreshments and casual conversation will begin 15 minutes prior to the talk.