It has the capability to make measurements in a user s environment, reducing the issue of correlating test to the end application. At the core of this technology is modulated vector-corrected stimulus and measure. This capability allows you to make measurements with just one instrument that once required the use of network analyzers, spectrum analyzers, vector signal analyzers, and power meters. In addition to the obvious cost savings, throughput and accuracy are enhanced. Fourier proved why all of this is possible.
Every signal is a composite of an infinite sum of sinusoids.
Consequently, the use of modulated signals necessary for testing 3G devices offers the capability to gather more information from the same data set. The amount of information gathered is a function of the stimulus applied and the information bandwidth of the measurement receiver. S-parameters traditionally have been used by RF engineers to describe the device performance and offer the most direct way of correlating performance to the models used to design them. For the device vendor, they also provide the best feedback to design, product, and modeling engineers on how the ongoing process variations are affecting performance and yield. Unfortunately, traditional sinusoidal narrowband network analyzers do a poor job of predicting modulated behavior of S-parameters.