Records contain assignee data, publication information, International Patent Classification codes, as well as the title and abstract in English.
Abstracts are available for all applications originating in Japan.
This database is available in STN Easy . There are no fields that allow left truncation in this file. Either STN format or Derwent format may be used. The Japanese Patent Classification was in use for publications before 1979 only. Super Search Fields Enter a super search code to execute a search in one or more fields that may contain the desired information.