Lower scores are better. Higher scores are better. Full description . Full description . Measures aberrant noise introduced by the internal circuitry, as well as flaws in and contamination of the optical system.
Lower scores are better.
Full description . Tests for uniform evels across a scanned target. Lower scores are better. Full description . ZDNet and ZDNet logo are registered trademarks of ZD Inc. Content originally published in Ziff Davis Media publications is the copyrighted property of Ziff Davis Media.