The test device w159c1 is an unreflexed ccd typical of the ACIS devices.
Irradiation is done at room temperature with all inputs shorted.
At least two days are allowed after irradiation for any short term activation to subside, then subsequent testing is done under normal calibration conditions. Even at the lowest doses an oxide charging effect is seen. Superimposed on the glow are a number of hot-pixels. This particular ccd has some problems with repeated temperature cycles, perhaps because of the flexprint. The output noise has been increasing with time but this has nothing to do with radiation damage.