Bias, Dark, and Flat Field exposures are taken in each gain setting in order to measure read noise, dark current, Charge Transfer Efficiency, and gain.
All exposures are internals.
Compare bias, dark, and flat-field frames for all available binning and gain settings to ground calibration data from IDT archive. Check behavior of serial overscan region of images and compare with ground calibration data from IDT archive. Measure read-out noise, mean dark current, gain and Charge Transfer Efficiency. Evaluate dark current within the SAA to decide whether CCD is usable during SAA passages.