VLSI Test Symposium is pleased to present six tutorials on topics of current interest to symposium attendees. Three are held on Sunday, April 26th, and three on Thursday, April 30th. This tutorial discusses various distinctive test issues posed by technology migration. Technological scaling makes it possible to realize systems on a chip. Such complex devices with multi-million transistors offer significant benefits in market place but pose many test problems.
Defects influence various building blocks in different manner.
Sensitive embedded analog and DRAM blocks must be designed in a predominantly digital process and must share a common substrate. Diverse circuit types makes it difficult to have a single well defined test solution. A number of challenges are emerging. Secondly, IC design, manufacturing and test have been treated as separate disciplines. For economic and quality reasons these disciplines need to have greater synergy.