In addition to trace element capabilities, this machine can provide high resolution depth profiles with a depth resolution of better than 10 nm. Computer controlled data acquisition is provided by the Charles Evans v4.3 software package. In addition to our Cameca SIMS instrument, we possess a Dektak IIA stylus profilometer which provides nanometer-scale data on surface roughness and pit depth. In 1992 the current collaboration between SNL and the University of New Mexico's Institute of Meteoritics was initiated, and in June 1992 the machine was moved from the grounds of the national laboratory to the Advanced Materials Lab on the university's south campus. Beyond these two core foci, analytical services are provided to the broader scientific and engineering community on a time-permits basis.
Assistance is also available with the reduction and interpretation of the collected data.
Given advanced notification,we will work with customers to identify and characterize suitable standard materials and will work to develop new analytical packages. Samples may either be sent to our laboratory with adequate documentation for analysis or customers may elect to be present at the time of analysis so as to assist with identifying the sample locations. For those users new to the SIMS technique, we recommend they be present when their initial analyses are conducted so as to better understand the strengths of this technique. REEs, minor, and trace elements in plagioclase. Li, Be, B in silicate minerals and glasses.