Easy Axis Dispersion Head Wafer Testing Hysteresis Meas. Permanent Magnet Process Control Rock Magnetism Temp. Options HI-RES option provides up to 50 times improvement in measurement resolution through enhanced digital signal processing when used in reduced bandwidth applications. Enhanced measurement result accessible through front panel display or RS232 port only.
Actual resolution depends on probe selection, bandwidth and operating range.
Resolution improves with larger sensor area, reduced bandwidth and smaller range. User settable protocols. Parallel printer port. Supports PCL protocol. Calibration Channels individually calibrated at factory using ADE developed laser interferometry system.