Surface and Thin Film Analysis. Surfaces and thin films, including the construction and use of ultra-high vacuum apparatus. Various microscopy and elemental analysis techniques are investigated, including XRD, SEM, STM, AFM, LEED, Auger spectroscopy, XPS, EPMA and others. Offered spring semester. The instrumentation and methods used for spectrometric measurements throughout the spectrum from gamma-radiation to radio frequencies.
Attention is given to the uses, applications, and limitations of all methods studied.
Offered spring semester. Advanced Analytical Chemistry. Offered fall semester of even-numbered years. Special Topics in Analytical Chemistry. Repeatable for maximum 15 hours credit.