The CCL performs both static and dynamic photosensitivity characterization of a wide variety of materials including semiconductors and fiber-optics. The lab is equipped with a helium-neon laser, which provides a usable output of approximately 0.7 watts at a wavelength of 632.8 nanometers. Various implements, such as beam expanders and spatial filters, are available to adjust the nominal beam width of 0.6 millimeters.
Computer monitoring is available for long term studies of parametric changes.