This alone can save hundreds of thousands of dollars in last-minute tooling changes. Early detection can not be achieved with only the far-field test. No one would be able or willing to take early prototypes to the EMC laboratory for routine diagnostics. On the other hand, ScanEM near-field probes are affordable, and can and should be as common for an electronics engineer as a multimeter or an oscilloscope. Inc. Products are covered by patents or are patent pending.
All specifications are subject to change without notice.