Dual Axis Beam Sampling using BeamScan Revolutionizing slit measurements, Photon introduced the first commercial dual axis slit scanner, allowing BeamScan to measure orthogonal beam positions to the micron level. The second slit is at 90 degrees to the first slit and 45 degrees to the drum motion, and measures the wide profile of the elliptic spot. This simple invention allows sampling two orthogonal cross-sectional irradiance profiles with one mechanical motion. BeamScan Systems BeamScan is available as a meter with a beam size display or as an analyzer with greater analysis and display of profile data. The meter versions are preferred when a quick beam width answer is required such as an on-line adjustment of an optic in the factory or field.
Analyzers measure beam position, Gaussian fit, ellipticity, optionally relative power and more.
The Beam Analysis System offers greater detailed measures such as Gaussian fits, M2 measurement Wizard, laser beam position to a few microns, relative beam power, parameter measurements over time, ellipticity, and more. Data can be gathered or transferred through Active X Automation to another program. Measures divergence as small as 0.02 mrad. Available for either visible or near IR sources. Measures fiber geometry such as core diameter.