Austria This workshop will focus on the need for surface analysis and will include the definition and application of surface analysis, sampling depth and lateral resolution for surface analysis, and comparison of X-ray methods with associated techniques. Selected examples application will be discussed. MD A tutorial workshop that examines in detail the basic principles underlying computational methods in XRF analysis. The topic is addressed from the point of view of someone who is relatively new to this technique. The first half covers common mathematical expressions presently in use by analysts while the second half deals with methods, i.e., how these expressions are used in practice.
Ample time is allocated for questions and discussion.
Handouts will be available to attendees. There will be a discussion of the minimum specimen preparation equipment required, a discussion and sketch of a lab layout, plus a brief outline of some of the analysis procedures. Speakers' discussions will, in some cases, also include photos of good and bad specimens. Recommendations will be made on paperwork useful to follow a sample from receipt in the lab to the report of the analysis. All Rights Reserved.