DOI: 10.57760/sciencedb.11722
title: Data map of the photocatalytic production of hydrogen peroxide by amino-modified nitrogen-sulfur-doped carbon dots
title: 氨基修饰的氮硫掺杂碳点光催化生产过氧化氢的数据图

description: X-ray diffraction (XRD, Apex II, Bruker X-ray diffractometer) patterns were operated to characteristic the crystal phase of samples in the range of 2θ =10-80°. The Fourier transform infrared (FT-IR) spectra were tested by a Nicolet 6700 spectrometer in the range of 4000-400 cm-1. And in-suit FT-IR spectra was tested by a Nicolet iS 10 with Drifts module. X-ray photoelectron spectroscopy (XPS) was measured by VG Multilab 2000 instrument with Al Kα source to identify the chemical states. The performed UV-Vis diffuse reflectance spectra (UV-Vis DRS) were record by Shimadzu UV-3100 spectrophotometer to detect the optical properties of the materials in the wavelength of 200 to 500 nm. The transient photocurrent density and Mott-Schottky (MS) plots were measured by Chenhua CHI 760E with three-electrode system. The photoluminescence (PL) spectra were monitored by Edinburgh FLS980 transient fluorescence spectrophotometer. Transmission electron microscope (TEM) and high-resolution TEM (HRTEM) were obtained by a FEI-TecnaiTM G2F30 with a field-emission gun operating at 200 kV. Electron spin resonance (ESR) was measured by a BRUKE A300. Femtosecond transient absorption (fs-TA) spectroscopy was performed by using a self-made system (FemPum-A) in Dalian Institute of Chemical Physics, Chinese Academy of Sciences. The size distribution was obtained by Nano Measurer 1.2.5 software, counting the 400 dots in image. Temperature programmed O2 desorption (TPD-O2) profile was measured by Quantachrome Autosorb-iQ-C chemisorption analyzer. Intermediates electron spin resonance (ESR) was measured by a BRUKE A300.The data were measured in Zhenjiang, Jiangsu province from March to July 2024. The occurrence of error may be related to climate, and the performance of carbon points is related to the pressure in the Teflon reactor during synthesis.
description: X-ray diffraction (XRD, Apex II, Bruker X-ray diffractometer) patterns were operated to characteristic the crystal phase of samples in the range of 2θ =10-80°. The Fourier transform infrared (FT-IR) spectra were tested by a Nicolet 6700 spectrometer in the range of 4000-400 cm-1. And in-suit FT-IR spectra was tested by a Nicolet iS 10 with Drifts module. X-ray photoelectron spectroscopy (XPS) was measured by VG Multilab 2000 instrument with Al Kα source to identify the chemical states. The performed UV-Vis diffuse reflectance spectra (UV-Vis DRS) were record by Shimadzu UV-3100 spectrophotometer to detect the optical properties of the materials in the wavelength of 200 to 500 nm. The transient photocurrent density and Mott-Schottky (MS) plots were measured by Chenhua CHI 760E with three-electrode system. The photoluminescence (PL) spectra were monitored by Edinburgh FLS980 transient fluorescence spectrophotometer. Transmission electron microscope (TEM) and high-resolution TEM (HRTEM) were obtained by a FEI-TecnaiTM G2F30 with a field-emission gun operating at 200 kV. Electron spin resonance (ESR) was measured by a BRUKE A300. Femtosecond transient absorption (fs-TA) spectroscopy was performed by using a self-made system (FemPum-A) in Dalian Institute of Chemical Physics, Chinese Academy of Sciences. The size distribution was obtained by Nano Measurer 1.2.5 software, counting the 400 dots in image. Temperature programmed O2 desorption (TPD-O2) profile was measured by Quantachrome Autosorb-iQ-C chemisorption analyzer. Intermediates electron spin resonance (ESR) was measured by a BRUKE A300.The data were measured in Zhenjiang, Jiangsu province from March to July 2024. The occurrence of error may be related to climate, and the performance of carbon points is related to the pressure in the Teflon reactor during synthesis.