DOI: 10.20350/digitalcsic/15522
title: Scattering spheres boost afterglow: a Mie glass approach to go beyond the limits set by persistent phosphor composition [Dataset]

description: Persistent luminescence phosphor nanoparticles (PersLNPs) offer exciting opportunities for anticounterfeiting, data storage, imaging displays or AC-driven lighting applications owing to the possibility to process them as shapable thin coatings. However, despite unique delayed and long-lasting luminescence, the relatively low storage capacity of persistent phosphor nanoparticles combined to the difficulty to harvest photons from transparent thin layers drastically hinder the perceived afterglow. In order to enhance persistent luminescence (PersL) of thin coatings, herein we propose a novel approach based on resonant optical nanostructures. In particular, we demonstrate that the integration of TiO2 scattering spheres in films (with thickness comprised between 1 and 10 ??m) made of ZnGa2O4:Cr3+ PersLNPs enables a significant increase in afterglow intensity due to the combination of effective charging and enhanced outcoupling. As a result, we observe a ~ 3.5-fold enhancement of the PersL in 2 ??m-thick films stuffed with scattering centres using low-light illumination conditions. Furthermore, inclusion of scattering centres leads to an unprecedented acceleration of the PersL charging speed. Our results constitute the first example of photonic engineering applied to enhance the properties of PersL materials coatings.
description: - Figure1f_XRD.txt : 2 theta (??, column 1), normalized XRD reflection intensity of reference sample (column 2) and 5 V% sample (column 3). - Figure2b_NormLumEmission.txt : Wavelength (nm, column 1), normalized Lum intensity of reference sample (column 2) and 5 V% sample (column 3). - Figure2c_NormLumExcitation.txt : Wavelength (nm, column 1), normalized Lum excitation intensity of reference sample (column 2) and 5 V% sample (column 3). - Figure2d_NormPersLDecays.txt : Time (s, column 1), normalized PersL decay intensity of reference sample (column 2) and 5 V% sample (column 3). - Figure2e_NormPersLEmission.txt : Wavelength (nm, column 1), normalized PersL intensity of reference sample (column 2) and 5 V% sample (column 3). - Figure3a_AbsTransm.txt : Wavelength (nm, column 1), transmittance of reference sample (%, column 2), 5 V% sample (%, column 3), absorptance of reference sample (%, column 4), 5 V% sample (%, column 5). - Figure3b_MieEfficiency.txt : Wavelength (nm, column 1), calculated scattering efficiency of TiSi spheres in a medium with an effective refractive index of 1.4 (arb. units, column 2). - Figure3c_FDTD_Field420nmXZ_ref.txt : X (nm, column 1), Z (nm, row 1), electric field intensity in reference sample at 420 nm wavelength (column to to end). - Figure3d_FDTD_Field696nmXZ_ref.txt : X (nm, column 1), Z (nm, row 1), electric field intensity in reference sample at 696 nm wavelength (column to to end). - Figure3e_FDTD_Field420nmXZ_5V%.txt : X (nm, column 1), Z (nm, row 1), electric field intensity in 5 V% sample at 420 nm wavelength (column to to end). - Figure3f_FDTD_Field696nmXZ_5V%.txt : X (nm, column 1), Z (nm, row 1), electric field intensity in 5 V% sample at 696 nm wavelength (column to to end). - Figure3g_FDTD_Field420nmXY_5V%.txt : X (nm, column 1), Y (nm, row 1), electric field intensity in 5 V% sample at 420 nm wavelength (column to to end). - Figure3h_FDTD_Field696nmXY_5V%.txt : X (nm, column 1), Y (nm, row 1), electric field intensity in 5 V% sample at 696 nm wavelength (column to to end). - Figure4a_Lum-PersLEnhancement_Wavelength.txt : Sample (column 1), Lum enhancement with 420 nm wavelength excitation (column 2), Lum enhancement with 560 nm wavelength excitation (column 3), PersL enhancement with 420 nm wavelength excitation (column 4), PersL enhancement with 560 nm wavelength excitation (column 5). - Figure4b_ChargingKinetics.txt : Charging time (s, column 1), normalized integrated PersL intensity of reference sample (column 2), measured error of integrated PersL intensity of reference sample (column 3), normalized integrated PersL intensity of 5 V% sample (column 4), measured error of integrated PersL intensity of 5 V% sample (column 5). - Figure4c_PersLEnhancementChargingTime.txt : Charging time (s, column 1), PersL ehancement (column 2). - Figure5b_PersLCharging_wLED.txt : Charging time (min, column 1), normalized integrated PersL intensity of reference sample (column 2), normalized integrated PersL intensity of 5 V% sample (column 3). - Figure5e_PersLDecay_UV.txt : Time (min, column 1), normalized PersL intensity of reference sample (column 2), normalized PersL intensity of 5 V% sample (column 3).