cometadata/datacite-titles-descriptions-related-identifiers huggingface dataset:
DOI: 10.5281/zenodo.7966166
title: Physico-chemical characterization of sterilized Ce0.25Zr0.75O2 nanoparticles by XPS / HAXPES / SEM

description: Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. Ce<sub>0.25</sub>Zr<sub>0.75</sub>O<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000402, ERM00000444, ERM00000423). The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA. Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started. Equipment: SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer. For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position. Data: For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files. Naming of data: SEM: <em>sample_treatment (n)</em>, with n a consecutive number. XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave. The authors thank Sigrid Benemann, who performed the SEM measurements.
DOI: 10.5281/zenodo.7966165
title: Physico-chemical characterization of sterilized Ce0.25Zr0.75O2 nanoparticles by XPS / HAXPES / SEM

description: Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. Ce<sub>0.25</sub>Zr<sub>0.75</sub>O<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000402, ERM00000444, ERM00000423). The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA. Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started. Equipment: SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer. For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position. Data: For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files. Naming of data: SEM: <em>sample_treatment (n)</em>, with n a consecutive number. XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave. The authors thank Sigrid Benemann, who performed the SEM measurements.
DOI: 10.24400/527896/a01-2020.003
title: OHC/EEI from space
title: climate indicators: Ocean heat content and Earth energy imbalance

description: The OHC-EEI product results from the space geodetic approach. It contains 2D grids of ocean heat content variations. It also provides the temporal time series of global heat content change from which the Earth energy imbalance time series is derived. Variance-covariance matrices are also delivered and characterise the uncertainties of errors on all global mean time series. See the technical documentation available on the landing page for details.
DOI: 10.5281/zenodo.7993851
title: Monthly area series of 1632 reservoirs in the Yangtze River Basin from 1984 to 2020

description: The four compressed files contain the monthly area series of 1632 reservoirs in the upper, middle and upper, middle and lower, and lower reaches of the Yangtze River Basin, respectively, from April 1984 to December 2020. This dataset comprehensively includes 1632 reservoirs with an area greater than 1km2 (a total area of 9712 km2) in Yangtze River Basin based on the shapefiles provided by China Reservoirs Dataset. Combined the most complete reservoir database and advanced water enhance algorithm, the reconstructed monthly area time series can provide a data basis for the evaluation of future reservoir ecological benefits.
DOI: 10.5281/zenodo.7993772
title: Monthly area series of 1632 reservoirs in the Yangtze River Basin from 1984 to 2020

description: The four compressed files contain the monthly area series of 1632 reservoirs in the upper, middle and upper, middle and lower, and lower reaches of the Yangtze River Basin, respectively, from April 1984 to December 2020. This dataset comprehensively includes 1632 reservoirs with an area greater than 1km2 (a total area of 9712 km2) in Yangtze River Basin based on the shapefiles provided by China Reservoirs Dataset. Combined the most complete reservoir database and advanced water enhance algorithm, the reconstructed monthly area time series can provide a data basis for the evaluation of future reservoir ecological benefits.
DOI: 10.5281/zenodo.7965603
title: Physico-chemical characterization of sterilized Ce0.1Zr0.9O2 nanoparticles by XPS / HAXPES / SEM

description: Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. Ce<sub>0.1</sub>Zr<sub>0.9</sub>O<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000403, ERM00000445, ERM00000424). The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA. Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started. Equipment: SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer. For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position. Data: For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files. Naming of data: SEM: <em>sample_treatment (n)</em>, with n a consecutive number. XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave. The authors thank Sigrid Benemann, who performed the SEM measurements.
DOI: 10.5281/zenodo.7965602
title: Physico-chemical characterization of sterilized Ce0.1Zr0.9O2 nanoparticles by XPS / HAXPES / SEM

description: Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. Ce<sub>0.1</sub>Zr<sub>0.9</sub>O<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000403, ERM00000445, ERM00000424). The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA. Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started. Equipment: SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer. For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position. Data: For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files. Naming of data: SEM: <em>sample_treatment (n)</em>, with n a consecutive number. XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave. The authors thank Sigrid Benemann, who performed the SEM measurements.
DOI: 10.17037/data.00003429
title: Clinical codelist - Chronic kidney disease - gold

description: Read codes for Chronic kidney disease (CKD).
DOI: 10.5281/zenodo.7965537
title: Physico-chemical characterization of sterilized ZrO2 nanoparticles by XPS / HAXPES / SEM

description: Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. ZrO<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000404, ERM00000446, ERM00000425). The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA. Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started. Equipment: SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer. For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position. Data: For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files. Naming of data: SEM: <em>sample_treatment (n)</em>, with n a consecutive number. XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave. The authors thank Sigrid Benemann, who performed the SEM measurements.
DOI: 10.5281/zenodo.7965536
title: Physico-chemical characterization of sterilized ZrO2 nanoparticles by XPS / HAXPES / SEM

description: Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. ZrO<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000404, ERM00000446, ERM00000425). The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA. Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started. Equipment: SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer. For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position. Data: For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files. Naming of data: SEM: <em>sample_treatment (n)</em>, with n a consecutive number. XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave. The authors thank Sigrid Benemann, who performed the SEM measurements.
DOI: 10.5517/ccdc.csd.cc2bb0mb
title: CCDC 2154581: Experimental Crystal Structure Determination

description: Related Article: Alassane Saïdou Diallo, Ibrahima Elhadji Thiam, Mbossé Gueye-Ndiaye, Moussa Dieng, James Orton, Simon Coles, Mohamed Gaye|2022|Acta Crystallogr.,Sect.E:Cryst.Commun.|78|349|doi:10.1107/S2056989022002225
description: An entry from the Cambridge Structural Database, the world’s repository for small molecule crystal structures. The entry contains experimental data from a crystal diffraction study. The deposited dataset for this entry is freely available from the CCDC and typically includes 3D coordinates, cell parameters, space group, experimental conditions and quality measures.
DOI: 10.5281/zenodo.7941248
title: Physico-chemical characterization of sterilized Co3O4 nanoparticles by XPS / HAXPES / SEM

description: Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. Co<sub>3</sub>O<sub>4</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000405, ERM00000447, ERM00000426). The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA. Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started. Equipment: SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer. For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position. Data: For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files. Naming of data: SEM: <em>sample_treatment (n)</em>, with n a consecutive number. XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave. The authors thank Sigrid Benemann, who performed the SEM measurements.
DOI: 10.5281/zenodo.7941247
title: Physico-chemical characterization of sterilized Co3O4 nanoparticles by XPS / HAXPES / SEM

description: Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. Co<sub>3</sub>O<sub>4</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000405, ERM00000447, ERM00000426). The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA. Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started. Equipment: SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer. For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position. Data: For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files. Naming of data: SEM: <em>sample_treatment (n)</em>, with n a consecutive number. XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave. The authors thank Sigrid Benemann, who performed the SEM measurements.
DOI: 10.17037/data.00003428
title: Clinical codelist - Chronic kidney disease - aurum

description: Read, SNOME and EMIS codes for Chronic kidney disease (CKD).
DOI: 10.5258/soton/d2650
title: Dataset supporting the University of Southampton Doctoral Thesis: Hard Carbon Composites with Metal Oxides and Metal Nitrides for Sodium-ion Batteries.

description: Dataset supporting the University of Southampton Doctoral Thesis "Hard Carbon Composites with Metal Oxides and Metal Nitrides for Sodium-ion Batteries" by Bowen Liu. This dataset contains: The original data associated with each figure in the thesis.
DOI: 10.15468/dl.mmjpez
title: Occurrence Download

description: A dataset containing 98653 species occurrences available in GBIF matching the query:
{
 "TaxonKey" : [
 "is Myocastor coypus (Molina, 1782)"
 ]
}

 The dataset includes 98653 records from 1084 constituent datasets; see https://api.gbif.org/v1/occurrence/download/0187846-220831081235567/datasets/export for details.
 
Data from some individual datasets included in this download may be licensed under less restrictive terms.
DOI: 10.15468/dl.j0gch5
title: Occurrence Download

description: A dataset containing 1194 species occurrences available in GBIF matching the query:
{
 "TaxonKey" : [
 "is Callistemon viminalis (Sol. ex Gaertn.) G.Don"
 ]
}

 The dataset includes 1194 records from 73 constituent datasets; see https://api.gbif.org/v1/occurrence/download/0004486-160623103540712/datasets/export for details.
 
Data from some individual datasets included in this download may be licensed under less restrictive terms.
DOI: 10.15468/dl.w4h5bu
title: Occurrence Download

description: A dataset containing 2194 species occurrences available in GBIF matching the query:
{
 "and" : [
 "Country is one of (China, Chinese Taipei)",
 "TaxonKey is Pistacia chinensis Bunge"
 ]
}

 The dataset includes 2194 records from 53 constituent datasets; see https://api.gbif.org/v1/occurrence/download/0136865-230224095556074/datasets/export for details.
 
Data from some individual datasets included in this download may be licensed under less restrictive terms.