DOI: 10.5281/zenodo.5597738
title: Nanobeam electron diffraction dataset from ion irradiated DIN 1.4970 austenitic stainless steel with G-phase precipitates collected on pixelated TVIPS detector

description: <strong>Summary</strong> This is a 4D scanning transmission electron microscopy (4D STEM) dataset collected in near-parallel beam mode (NBED) from a sample of ion irradiated austenitic (FCC) stainless steel of the DIN 1.4970 specification, collected on a high quality pixelated detector inside a transmission electron microscope (TEM). The dataset is represented by a 4D array, comprising a 2D grid of scan points, with each scan point mapping to an electron diffraction spot pattern. From this kind of dataset it is possible to derive local crystal orientations and strains. The dataset is in the .hspy format, the native hdf5 format of the HyperSpy library. The main features in this dataset are: a single crystal of the matrix is sampled, close to a 110 zone axis inside the matrix, irradiation induced G-phase precipitates of 10-20 nm in size can be found which contribute weakly to some of the diffraction patterns. From these patterns it is possible to derive the orientation relationship of the precipitates with respect to the matrix. irradiation also resulted in the formation of faulted frank loops, which also show up in some diffraction patterns. <strong>Material and sample preparation</strong> The sample was prepared from DIN 1.4970 steel (composition by weight: 15% Ni, 15% Cr, 1.8% Mn, 1.2% Mo, 0.5% Ti, 0.5% Si, 0.1% C, Fe Bal.) with the intended application of nuclear fuel cladding material. The material was originally in the shape of thin walled tubes and cold worked to 24% (measured by cross sectional area reduction). The material was aged for 2 hours at 800 °C. It was then irradiated to 40 dpa surface damage as calculated using the SRIM program and the Kinchin and Pease model with displacement energy of 40 eV, using 4.5 MeV Fe<sup>2+</sup> ions with a flux of arround 9x10<sup>11</sup> ions.s<sup>-1</sup>.cm<sup>-2</sup>. The irradiation was performed at 600 °C. Full details on the material, irradiation conditions, and context can be found in: Cautaerts, N., Delville, R., Stergar, E., Pakarinen, J., Verwerft, M., Yang, Y., Hofer, C., Schnitzer, R., Lamm, S., Felfer, P., & Schryvers, D. (2020). The role of Ti and TiC nanoprecipitates in radiation resistant austenitic steel : A nanoscale study. <em>Acta Materialia</em>, <em>197</em>, 184–197. https://doi.org/10.1016/j.actamat.2020.07.022 A TEM sample was prepared by regular focused ion beam (FIB) lift-out techniques in a Ga-ion FIB. Additional details on the dataset can be found in the paper and supplementary materials of Cautaerts, N., Rauch, E. F., Jeong, J., Dehm, G., & Liebscher, C. H. (2021). Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector. <em>Scripta Materialia</em>, <em>201</em>, 113930. https://doi.org/10.1016/j.scriptamat.2021.113930 <strong>Microscopy parameters and data collection</strong> NBED was performed in a JEM-2200FS TEM (JEOL) operating at 200 kV. The microscope was operated in nanobeam diffraction mode with the smallest spot size (Spot 5). The probe diameter was ~ 1 nm with a semi-convergence angle of ~0.5 mrad. Data was collected on a TemCam-XF416 pixelated CMOS detector (TVIPS). The camera length as indicated in the operating software was 80 cm, and collected images were 1024 by 1024 in size (hardware binning of 4). The dataset comprises 260x200 scan points and pixel depth is 2 bytes (unsigned 16 bit integers). <strong>Data processing</strong> The raw data was collected in the .tvips format. The original dataset was about 50 GB in size and can be shared upon request to the author. This dataset was converted to the .hspy format using the TVIPSconverter tool. In the conversion, the images were binned by an additional factor of 4 to a final size of 256x256. A median filter was also applied to the data to remove pixel noise. <strong>Data characteristics</strong> Scan shape: 260 x 200 pixels Image shape: 256 x 256 pixels Pixel dtype: uint16 Scan pixel size: about 1 nm, scan dimensions were never calibrated Image pixel size: 0.01261 Angstrom<sup>-1</sup> / pixel Note that scale factors are not stored in the dataset! The dataset can be read with HyperSpy using the load function (please see the HyperSpy documentation) and the pixel scale can be set through the axes manager. It is highly recommended to have a working installation of Pyxem as well to process the data. <strong>Additional notes</strong> Data was collected with the TVIPS scan generator which can be quite buggy. The scan lines show "jitters" due to the unstable snake-scan pattern, hysteresis and instability.