cometadata/datacite-titles-descriptions-related-identifiers huggingface dataset:
DOI: 10.6084/m9.figshare.1012803.v1
title: Transition probabilities of Re II spectral lines

description: <b>Table 1.</b> Transition probabilities of Re II spectral lines. The names adopted here for the levels are those of NIST; thus, sequential numbers are assigned instead of term designations for those levels that have no meaningful names. The experimental values obtained in this work are compared to those from [24] and to the theoretical values from [20]. <strong>Abstract</strong> Experimental transition probabilities for 37 spectral lines of Re II (15 measured for the first time) have been obtained from a plasma produced by ablation of a Zn–Re alloy with a Nd:YAG laser. The plasma evolved in air at atmospheric pressure, and measurements were performed for the following plasma parameters: an electron density of (1.27 ± 0.19) <b>×</b> 10<sup>17</sup> cm<sup>−3</sup> and an electron temperature of 11 200 ± 400 K. The relative intensities were placed on an absolute scale by the combining branching fractions with the measured lifetimes and by comparing well-known lines using the plasma temperature. Some plasma parameters, such as the temperature and the electron density, were also obtained to provide a local thermodynamic equilibrium environment and an optically thin plasma. Comparisons were made to previously obtained experimental and theoretical values wherever possible.
DOI: 10.6084/m9.figshare.1012800
title: Our measured Cu II Stark FWHM (<em>W<sub>m</sub></em>) obtained at 19 300 K electron temperature and at 2.1 <b>×</b>

description: <b>Table 1.</b> Our measured Cu II Stark FWHM (<em>W<sub>m</sub></em>) obtained at 19 300 K electron temperature and at 2.1 <b>×</b> 10<sup>23</sup> m<sup>−3</sup> electron density. Transitions and wavelengths (λ) were taken from [23] and [24]. The accuracy estimates are: 15% ≤ A ≤20% ≤ B ≤25% ≤ C ≤30%. <strong>Abstract</strong> In this work we present the Stark widths (<em>W</em>) of 22 neutral (Cu I) and 100 singly ionized (Cu II) copper spectral lines that have been measured at 18 400 K and 19 300 K electron temperatures and 6.3 <b>×</b> 10<sup> 22</sup> m<sup>−3</sup> and 2.1 <b>×</b> 10<sup> 23</sup> m<sup>−3</sup> electron densities, respectively. The experiment is conducted in the laser-induced plasma—the Nd:YAG laser, operating at 532 nm, was used to produce plasma from the copper sample in the residual air atmosphere at a pressure of 8 Pa. The electron temperature and density were estimated by the Boltzmann-plot method and from the Saha equation. The investigated Cu I lines belong to the 4s–4p', 4s<sup> 2</sup>–4p'' and 4p'–4d' transitions while Cu II spectral lines belong to the 4s–4p, 4p–5s, 4p–4d, 4p–4s<sup> 2</sup>, 4d–4f and 4d–v transitions. Comparison with existing experimental data was possible only in the case of 17 Cu II lines due to a lack of experimental and theoretical values. The rest of the data, Stark widths of 22 Cu I and 83 Cu II lines are published for the first time.
DOI: 10.6084/m9.figshare.1012802
title: Our measured Cu I Stark FWHM (<em>W<sub>m</sub></em>) obtained at 18 400 K electron temperature at 6.3 <b>×</b>

description: <b>Table 3.</b> Our measured Cu I Stark FWHM (<em>W<sub>m</sub></em>) obtained at 18 400 K electron temperature at 6.3 <b>×</b> 10<sup>22</sup> m<sup>−3</sup> electron density. Transitions and wavelengths are taken from [25]. The accuracy estimates are: 20% ≤ B ≤25% ≤ C ≤30%. <strong>Abstract</strong> In this work we present the Stark widths (<em>W</em>) of 22 neutral (Cu I) and 100 singly ionized (Cu II) copper spectral lines that have been measured at 18 400 K and 19 300 K electron temperatures and 6.3 <b>×</b> 10<sup> 22</sup> m<sup>−3</sup> and 2.1 <b>×</b> 10<sup> 23</sup> m<sup>−3</sup> electron densities, respectively. The experiment is conducted in the laser-induced plasma—the Nd:YAG laser, operating at 532 nm, was used to produce plasma from the copper sample in the residual air atmosphere at a pressure of 8 Pa. The electron temperature and density were estimated by the Boltzmann-plot method and from the Saha equation. The investigated Cu I lines belong to the 4s–4p', 4s<sup> 2</sup>–4p'' and 4p'–4d' transitions while Cu II spectral lines belong to the 4s–4p, 4p–5s, 4p–4d, 4p–4s<sup> 2</sup>, 4d–4f and 4d–v transitions. Comparison with existing experimental data was possible only in the case of 17 Cu II lines due to a lack of experimental and theoretical values. The rest of the data, Stark widths of 22 Cu I and 83 Cu II lines are published for the first time.
DOI: 10.6084/m9.figshare.1012816.v2
title: Image Phylogenr Forests Reconstruction

description: This material contains the description and the links where to find the datasets used in the paper Image Phylogeny Forests Reconstruction, by F. de O. Costa, M. A. Oikawa, Z. Dias, S. Goldenstein, and A. Rocha, currently submitted and under review to the IEEE Transactions on Information Forensics and Security.
DOI: 10.6084/m9.figshare.1012818.v1
title: Posters

description: A collection of posters I presented throughout the years.
DOI: 10.6084/m9.figshare.1012801.v1
title: The Cu II measured Stark FWHM (<em>W<sub>m</sub></em>) obtained at 19 300 K electron temperature and normalized to an 1 <b>×</b>

description: <b>Table 2.</b> The Cu II measured Stark FWHM (<em>W<sub>m</sub></em>) obtained at 19 300 K electron temperature and normalized to an 1 <b>×</b> 10<sup>23</sup> m<sup>−3</sup> electron density. The <em>W<sub>S</sub></em> [12], <em>W<sub>F</sub></em> [10] and <em>W<sub>N</sub></em> [11] represent existing experimental data at 24 000, 10 000 and 20 000 K electron temperatures, respectively and are normalized to an 1 <b>×</b> 10<sup>23</sup> m<sup>−3</sup> electron density, also. Ratio <em>W<sub>m</sub></em>/<em>W<sub>s</sub></em> is given at 19 300 K. <strong>Abstract</strong> In this work we present the Stark widths (<em>W</em>) of 22 neutral (Cu I) and 100 singly ionized (Cu II) copper spectral lines that have been measured at 18 400 K and 19 300 K electron temperatures and 6.3 <b>×</b> 10<sup> 22</sup> m<sup>−3</sup> and 2.1 <b>×</b> 10<sup> 23</sup> m<sup>−3</sup> electron densities, respectively. The experiment is conducted in the laser-induced plasma—the Nd:YAG laser, operating at 532 nm, was used to produce plasma from the copper sample in the residual air atmosphere at a pressure of 8 Pa. The electron temperature and density were estimated by the Boltzmann-plot method and from the Saha equation. The investigated Cu I lines belong to the 4s–4p', 4s<sup> 2</sup>–4p'' and 4p'–4d' transitions while Cu II spectral lines belong to the 4s–4p, 4p–5s, 4p–4d, 4p–4s<sup> 2</sup>, 4d–4f and 4d–v transitions. Comparison with existing experimental data was possible only in the case of 17 Cu II lines due to a lack of experimental and theoretical values. The rest of the data, Stark widths of 22 Cu I and 83 Cu II lines are published for the first time.
DOI: 10.6084/m9.figshare.1012802.v1
title: Our measured Cu I Stark FWHM (<em>W<sub>m</sub></em>) obtained at 18 400 K electron temperature at 6.3 <b>×</b>

description: <b>Table 3.</b> Our measured Cu I Stark FWHM (<em>W<sub>m</sub></em>) obtained at 18 400 K electron temperature at 6.3 <b>×</b> 10<sup>22</sup> m<sup>−3</sup> electron density. Transitions and wavelengths are taken from [25]. The accuracy estimates are: 20% ≤ B ≤25% ≤ C ≤30%. <strong>Abstract</strong> In this work we present the Stark widths (<em>W</em>) of 22 neutral (Cu I) and 100 singly ionized (Cu II) copper spectral lines that have been measured at 18 400 K and 19 300 K electron temperatures and 6.3 <b>×</b> 10<sup> 22</sup> m<sup>−3</sup> and 2.1 <b>×</b> 10<sup> 23</sup> m<sup>−3</sup> electron densities, respectively. The experiment is conducted in the laser-induced plasma—the Nd:YAG laser, operating at 532 nm, was used to produce plasma from the copper sample in the residual air atmosphere at a pressure of 8 Pa. The electron temperature and density were estimated by the Boltzmann-plot method and from the Saha equation. The investigated Cu I lines belong to the 4s–4p', 4s<sup> 2</sup>–4p'' and 4p'–4d' transitions while Cu II spectral lines belong to the 4s–4p, 4p–5s, 4p–4d, 4p–4s<sup> 2</sup>, 4d–4f and 4d–v transitions. Comparison with existing experimental data was possible only in the case of 17 Cu II lines due to a lack of experimental and theoretical values. The rest of the data, Stark widths of 22 Cu I and 83 Cu II lines are published for the first time.
DOI: 10.6084/m9.figshare.1012818.v2
title: Posters

description: A collection of posters I presented throughout the years.
DOI: 10.6084/m9.figshare.1012792
title: Calculated initial vacancy ratios (<em>I</em><sub>L</sub> = <em>I</em>_{{ m KL}^{1}}:<em>I</em>_{{ m KL}^{0}}), extrapolated x-ray intensity relative to the main line (<em>R</em><sub>L</sub> = <em>X</em>_{{ m KL}^{1}}:<em>X</em>_{{ m KL}^{0}}) and to the total intensity (<em>R</em><sub>T</sub> = <em>X</em>_{{ m KL}^{1}}:<em>X</em>_{{ m KL}^{0}+{ m KL}^{1}}), average differences in <em>X</em>_{{ m KL}^{1}} intensity between oxides and pure elements extracted from the literature (ΔR<sub>L</sub>), and the product effect on the total x-ray yield

description: <b>Table 1.</b> Calculated initial vacancy ratios (<em>I</em><sub>L</sub> = <em>I</em>_{{\rm KL}^{1}}:<em>I</em>_{{\rm KL}^{0}}), extrapolated x-ray intensity relative to the main line (<em>R</em><sub>L</sub> = <em>X</em>_{{\rm KL}^{1}}:<em>X</em>_{{\rm KL}^{0}}) and to the total intensity (<em>R</em><sub>T</sub> = <em>X</em>_{{\rm KL}^{1}}:<em>X</em>_{{\rm KL}^{0}+{\rm KL}^{1}}), average differences in <em>X</em>_{{\rm KL}^{1}} intensity between oxides and pure elements extracted from the literature (ΔR<sub>L</sub>), and the product effect on the total x-ray yield. Absolute uncertainties are listed in parentheses. <strong>Abstract</strong> Proton-induced x-ray emission (PIXE) was used to assess the accuracy of the National Institute of Standards and Technology XCOM and FFAST photo-ionization cross-section databases in the low energy region (1–2 keV) for light elements. Characteristic x-ray yields generated in thick samples of Mg, Al and Si in elemental and oxide form, were compared to fundamental parameters computations of the expected x-ray yields; the database for this computation included XCOM attenuation coefficients. The resultant PIXE instrumental efficiency constant was found to differ by 4–6% between each element and its oxide. This discrepancy was traced to use of the XCOM Hartree–Slater photo-electric cross-sections. Substitution of the FFAST Hartree–Slater cross-sections reduced the effect. This suggests that for 1–2 keV x-rays in light element absorbers, the FFAST predictions of the photo-electric cross-sections are more accurate than the XCOM values.
DOI: 10.6084/m9.figshare.1012794
title: Average <sub>a</sub>(<em>E</em><sub>X</sub>)-values of elements and oxides and percentage differences calculated using the XCOM and FFAST attenuation coefficients; uncertainties, seen in italics, apply to the rightmost decimal place of the data <strong>Abstract</strong> Proton-induced x-ray emission (PIXE) was used to assess the accuracy of the National Institute of Standards and Technology XCOM and FFAST photo-ionization cross-section databases in the low energy region (1–2 keV) for light elements

description: <b>Table 3.</b> Average <sub>a</sub>(<em>E</em><sub>X</sub>)-values of elements and oxides and percentage differences calculated using the XCOM and FFAST attenuation coefficients; uncertainties, seen in italics, apply to the rightmost decimal place of the data <strong>Abstract</strong> Proton-induced x-ray emission (PIXE) was used to assess the accuracy of the National Institute of Standards and Technology XCOM and FFAST photo-ionization cross-section databases in the low energy region (1–2 keV) for light elements. Characteristic x-ray yields generated in thick samples of Mg, Al and Si in elemental and oxide form, were compared to fundamental parameters computations of the expected x-ray yields; the database for this computation included XCOM attenuation coefficients. The resultant PIXE instrumental efficiency constant was found to differ by 4–6% between each element and its oxide. This discrepancy was traced to use of the XCOM Hartree–Slater photo-electric cross-sections. Substitution of the FFAST Hartree–Slater cross-sections reduced the effect. This suggests that for 1–2 keV x-rays in light element absorbers, the FFAST predictions of the photo-electric cross-sections are more accurate than the XCOM values.
DOI: 10.6084/m9.figshare.1012818.v3
title: Posters

description: A collection of posters I presented throughout the years.
DOI: 10.6084/m9.figshare.1012792.v1
title: Calculated initial vacancy ratios (<em>I</em><sub>L</sub> = <em>I</em>_{{ m KL}^{1}}:<em>I</em>_{{ m KL}^{0}}), extrapolated x-ray intensity relative to the main line (<em>R</em><sub>L</sub> = <em>X</em>_{{ m KL}^{1}}:<em>X</em>_{{ m KL}^{0}}) and to the total intensity (<em>R</em><sub>T</sub> = <em>X</em>_{{ m KL}^{1}}:<em>X</em>_{{ m KL}^{0}+{ m KL}^{1}}), average differences in <em>X</em>_{{ m KL}^{1}} intensity between oxides and pure elements extracted from the literature (ΔR<sub>L</sub>), and the product effect on the total x-ray yield

description: <b>Table 1.</b> Calculated initial vacancy ratios (<em>I</em><sub>L</sub> = <em>I</em>_{{\rm KL}^{1}}:<em>I</em>_{{\rm KL}^{0}}), extrapolated x-ray intensity relative to the main line (<em>R</em><sub>L</sub> = <em>X</em>_{{\rm KL}^{1}}:<em>X</em>_{{\rm KL}^{0}}) and to the total intensity (<em>R</em><sub>T</sub> = <em>X</em>_{{\rm KL}^{1}}:<em>X</em>_{{\rm KL}^{0}+{\rm KL}^{1}}), average differences in <em>X</em>_{{\rm KL}^{1}} intensity between oxides and pure elements extracted from the literature (ΔR<sub>L</sub>), and the product effect on the total x-ray yield. Absolute uncertainties are listed in parentheses. <strong>Abstract</strong> Proton-induced x-ray emission (PIXE) was used to assess the accuracy of the National Institute of Standards and Technology XCOM and FFAST photo-ionization cross-section databases in the low energy region (1–2 keV) for light elements. Characteristic x-ray yields generated in thick samples of Mg, Al and Si in elemental and oxide form, were compared to fundamental parameters computations of the expected x-ray yields; the database for this computation included XCOM attenuation coefficients. The resultant PIXE instrumental efficiency constant was found to differ by 4–6% between each element and its oxide. This discrepancy was traced to use of the XCOM Hartree–Slater photo-electric cross-sections. Substitution of the FFAST Hartree–Slater cross-sections reduced the effect. This suggests that for 1–2 keV x-rays in light element absorbers, the FFAST predictions of the photo-electric cross-sections are more accurate than the XCOM values.
DOI: 10.6084/m9.figshare.1012793
title: Target origins, purity levels and PIXE analyses of trace elements

description: <b>Table 2.</b> Target origins, purity levels and PIXE analyses of trace elements. <strong>Abstract</strong> Proton-induced x-ray emission (PIXE) was used to assess the accuracy of the National Institute of Standards and Technology XCOM and FFAST photo-ionization cross-section databases in the low energy region (1–2 keV) for light elements. Characteristic x-ray yields generated in thick samples of Mg, Al and Si in elemental and oxide form, were compared to fundamental parameters computations of the expected x-ray yields; the database for this computation included XCOM attenuation coefficients. The resultant PIXE instrumental efficiency constant was found to differ by 4–6% between each element and its oxide. This discrepancy was traced to use of the XCOM Hartree–Slater photo-electric cross-sections. Substitution of the FFAST Hartree–Slater cross-sections reduced the effect. This suggests that for 1–2 keV x-rays in light element absorbers, the FFAST predictions of the photo-electric cross-sections are more accurate than the XCOM values.
DOI: 10.6084/m9.figshare.1012794.v1
title: Average <sub>a</sub>(<em>E</em><sub>X</sub>)-values of elements and oxides and percentage differences calculated using the XCOM and FFAST attenuation coefficients; uncertainties, seen in italics, apply to the rightmost decimal place of the data <strong>Abstract</strong> Proton-induced x-ray emission (PIXE) was used to assess the accuracy of the National Institute of Standards and Technology XCOM and FFAST photo-ionization cross-section databases in the low energy region (1–2 keV) for light elements

description: <b>Table 3.</b> Average <sub>a</sub>(<em>E</em><sub>X</sub>)-values of elements and oxides and percentage differences calculated using the XCOM and FFAST attenuation coefficients; uncertainties, seen in italics, apply to the rightmost decimal place of the data <strong>Abstract</strong> Proton-induced x-ray emission (PIXE) was used to assess the accuracy of the National Institute of Standards and Technology XCOM and FFAST photo-ionization cross-section databases in the low energy region (1–2 keV) for light elements. Characteristic x-ray yields generated in thick samples of Mg, Al and Si in elemental and oxide form, were compared to fundamental parameters computations of the expected x-ray yields; the database for this computation included XCOM attenuation coefficients. The resultant PIXE instrumental efficiency constant was found to differ by 4–6% between each element and its oxide. This discrepancy was traced to use of the XCOM Hartree–Slater photo-electric cross-sections. Substitution of the FFAST Hartree–Slater cross-sections reduced the effect. This suggests that for 1–2 keV x-rays in light element absorbers, the FFAST predictions of the photo-electric cross-sections are more accurate than the XCOM values.
DOI: 10.6084/m9.figshare.1012793.v1
title: Target origins, purity levels and PIXE analyses of trace elements

description: <b>Table 2.</b> Target origins, purity levels and PIXE analyses of trace elements. <strong>Abstract</strong> Proton-induced x-ray emission (PIXE) was used to assess the accuracy of the National Institute of Standards and Technology XCOM and FFAST photo-ionization cross-section databases in the low energy region (1–2 keV) for light elements. Characteristic x-ray yields generated in thick samples of Mg, Al and Si in elemental and oxide form, were compared to fundamental parameters computations of the expected x-ray yields; the database for this computation included XCOM attenuation coefficients. The resultant PIXE instrumental efficiency constant was found to differ by 4–6% between each element and its oxide. This discrepancy was traced to use of the XCOM Hartree–Slater photo-electric cross-sections. Substitution of the FFAST Hartree–Slater cross-sections reduced the effect. This suggests that for 1–2 keV x-rays in light element absorbers, the FFAST predictions of the photo-electric cross-sections are more accurate than the XCOM values.
DOI: 10.6084/m9.figshare.1012818.v4
title: Posters

description: A collection of posters I presented throughout the years.
DOI: 10.6084/m9.figshare.1012818.v5
title: Posters

description: A collection of posters I presented throughout the years.
DOI: 10.6084/m9.figshare.1012818.v6
title: Posters

description: Poster on Children's pronoun comprehension in Dutch, presented at RASCAL 2009.
DOI: 10.6084/m9.figshare.1012818.v7
title: Posters

description: Poster on Children's pronoun comprehension in Dutch, presented at RASCAL 2009.
DOI: 10.6084/m9.figshare.1012818.v8
title: Posters

description: A collection of scientific posters with Christina Bergmann as first author.
DOI: 10.6084/m9.figshare.1012757
title: Elastic collision loss rate coefficients, <em>k</em><sub>loss</sub>, and charge transfer rate coefficients <em>k</em><sub>20</sub> + <em>k</em><sub>21</sub> obtained in this work and the corresponding <em>k</em><sub>20</sub> + <em>k</em><sub>21</sub> values measured by Tosh and Johnsen

description: <b>Table 1.</b> Elastic collision loss rate coefficients, <em>k</em><sub>loss</sub>, and charge transfer rate coefficients <em>k</em><sub>20</sub> + <em>k</em><sub>21</sub> obtained in this work and the corresponding <em>k</em><sub>20</sub> + <em>k</em><sub>21</sub> values measured by Tosh and Johnsen. <strong>Abstract</strong> We report our measured values for the sum of single and double charge transfer rate coefficients between <sup>3</sup>He<sup>2 +</sup> and H<sub>2</sub>, CH<sub>4</sub>, N<sub>2</sub> and CO. Our values are 2.4 ± 0.2 <b>×</b> 10<sup>−9</sup> cm<sup>3</sup> s<sup>−1</sup> for H<sub>2</sub>, 6.3 ± 0.9 <b>×</b> 10<sup>−9</sup> cm<sup>3</sup> s<sup>−1</sup> for CH<sub>4</sub>, 4.0 ± 0.3 <b>×</b> 10<sup>−9</sup> cm<sup>3</sup> s<sup>−1</sup> for N<sub>2</sub> and 4.7 ± 0.4 <b>×</b> 10<sup>−9</sup> cm<sup>3</sup> s<sup>−1</sup> for CO. The values are obtained at equivalent temperatures of 1200–2400 K.
DOI: 10.6084/m9.figshare.1012757.v1
title: Elastic collision loss rate coefficients, <em>k</em><sub>loss</sub>, and charge transfer rate coefficients <em>k</em><sub>20</sub> + <em>k</em><sub>21</sub> obtained in this work and the corresponding <em>k</em><sub>20</sub> + <em>k</em><sub>21</sub> values measured by Tosh and Johnsen

description: <b>Table 1.</b> Elastic collision loss rate coefficients, <em>k</em><sub>loss</sub>, and charge transfer rate coefficients <em>k</em><sub>20</sub> + <em>k</em><sub>21</sub> obtained in this work and the corresponding <em>k</em><sub>20</sub> + <em>k</em><sub>21</sub> values measured by Tosh and Johnsen. <strong>Abstract</strong> We report our measured values for the sum of single and double charge transfer rate coefficients between <sup>3</sup>He<sup>2 +</sup> and H<sub>2</sub>, CH<sub>4</sub>, N<sub>2</sub> and CO. Our values are 2.4 ± 0.2 <b>×</b> 10<sup>−9</sup> cm<sup>3</sup> s<sup>−1</sup> for H<sub>2</sub>, 6.3 ± 0.9 <b>×</b> 10<sup>−9</sup> cm<sup>3</sup> s<sup>−1</sup> for CH<sub>4</sub>, 4.0 ± 0.3 <b>×</b> 10<sup>−9</sup> cm<sup>3</sup> s<sup>−1</sup> for N<sub>2</sub> and 4.7 ± 0.4 <b>×</b> 10<sup>−9</sup> cm<sup>3</sup> s<sup>−1</sup> for CO. The values are obtained at equivalent temperatures of 1200–2400 K.
DOI: 10.6084/m9.figshare.1012748
title: The molecular orbital energies and total energy of N<sub>2</sub>

description: <b>Table 2.</b> The molecular orbital energies and total energy of N<sub>2</sub>. <strong>Abstract</strong> We have determined the multiply differential cross sections (MDCS) of the vertical photo-double ionization of diatomic nitrogen with coincidence detection of the ejected electrons, for fixed and random orientations of the internuclear axis, using the correlated product of two two-centre continuum Coulomb functions for the description of the two ejected electrons, which satisfies the exact asymptotic conditions. To verify our procedure, we have applied it to the photo-double ionization of diatomic hydrogen for which many experimental and theoretical results are available. Our results on diatomic hydrogen show the influence of the initial state correlation. In the case of diatomic nitrogen only, the photo-double ionization of the 3σ<sub><em>g</em></sub> orbital is considered resulting in the <sup>1</sup>Σ<sub><em>g</em></sub> state of the residual N_2^{2+} dication. The case of the nearby <sup>3</sup>Π<sub><em>u</em></sub> final state having an open shell configuration will be considered in a future paper. Our results confirm the symmetry properties of the MDCS and give the optimal ejection angles. A comparison is also made with results obtained by the Gaussian parametrization method.