DOI: 10.5281/zenodo.10458023
title: Data from: Three dimensional classification of dislocations from single projections

description: About

This repository contains the experimental data for the article:

T. Niermann, L. Niermann, M. LehmannThree dimensional classification of dislocations from single projectionsNature Communications 15 (2023) 1356DOI: https://doi.org/10.1038/s41467-024-45642-z

If you use this data, please include a citation to the above article.

For further questions, please contact Tore Niermann (tore.niermann <at> tu-berlin.de)

Contents

raw_data_dislocation_A.hdf5

The file contains a dataset "data" representing the 4D-STEM measurementsof dislocation A in (0002) systematic row conditions.

Dimension #0: Scan y-axis (scale: 0.78125 nm/px)Dimension #1: Scan x-axis (scale: 0.78125 nm/px)Dimension #2: Diffraction y-axis (scale: 0.074677 nm^(-1)/px)Dimension #3: Diffraction x-axis (scale: 0.074677 nm^(-1)/px)

Please note, the diffraction coordinate system is mirrored and rotatedwith respect to the scan coordinate system.

Further experimental details:      Microscope: JEOL ARM300F2      Acceleration_voltage (kV): 300.0      Spot Size: 4C      Alpha Selector: ALPHA1      Indicated Magnification: 1000000.0      Indicated Camera Length (cm): 30.0      Dwell time (ms): 1.3      

raw_data_dislocation_B.hdf5

The file contains a dataset "data" representing the 4D-STEM measurementsof dislocation A in (2 -1 -1 0) systematic row conditions.

Dimension #0: Scan y-axis (scale: 0.78125 nm/px)Dimension #1: Scan x-axis (scale: 0.78125 nm/px)Dimension #2: Diffraction y-axis (scale: 0.074677 nm^(-1)/px)Dimension #3: Diffraction x-axis (scale: 0.074677 nm^(-1)/px)

Please note, the diffraction coordinate system is mirrored and rotatedwith respect to the scan coordinate system.

Further experimental details:      Microscope: JEOL ARM300F2      Acceleration_voltage (kV): 300.0      Spot Size: 4C      Alpha Selector: ALPHA1      Indicated Magnification: 1000000.0      Indicated Camera Length (cm): 30.0      Dwell time (ms): 1.3      Detector: Quantum Detector MerlinEM

raw_data_aluminum.hdf5

The file contains a dataset "data" representing the 4D-STEM measurementsof the deformed aluminum measurements of Supplementary Note 1in (200) systematic row conditions.

Dimension #0: Scan y-axis (scale: 0.78125 nm/px)Dimension #1: Scan x-axis (scale: 0.78125 nm/px)Dimension #2: Diffraction y-axis (scale: 0.074677 nm^(-1)/px)Dimension #3: Diffraction x-axis (scale: 0.074677 nm^(-1)/px)

Please note, the diffraction coordinate system is mirrored and rotatedwith respect to the scan coordinate system.

Further experimental details:      Microscope: JEOL ARM300F2      Acceleration_voltage (kV): 300.0      Spot Size: 7C      Alpha Selector: ALPHA1      Indicated Magnification: 1000000.0      Indicated Camera Length (cm): 30.0      Dwell time (ms): 50.0      Detector: Quantum Detector MerlinEM

figS3_hologram.hdf5 - Supplementary figure 3

The amplitude and phase of the reconstructed hologram are provided within the datasets "amplitude" and "phase". 

Dimension #0: y-axis (scale: 2.998 nm/px)Dimension #1: x-axis (scale: 2.998 nm/px)

figS5_overview.tif - Supplementary figure 5

Large area overview over GaN specimen. Original data file.

Dimension #0: y-axis (scale: 0.78125 nm/px)Dimension #1: x-axis (scale: 0.78125 nm/px)