DOI: 10.5061/dryad.zcrjdfnr9
title: Kikuchi pattern dataset from wrought and as-built additively manufactured superalloys

description: This dataset provides high-resolution Kikuchi diffraction patterns and
 associated orientation mapping data collected from both wrought and
 as-built additively manufactured (AM) Inconel 718 superalloys. The dataset
 includes raw electron backscatter diffraction (EBSD) patterns stored as
 .tif images and organized through .up2 metadata files, along with
 processed orientation data in .ang format. These measurements were
 acquired using a high-sensitivity EBSD detector over large scan areas,
 enabling detailed spatial resolution of microstructural features such as
 grain orientations, subgrain boundaries, and processing-induced texture.
 The dataset supports a range of applications, including machine learning
 for pattern recognition and the development of robust indexing algorithms.
 By including both wrought and AM material states, this dataset offers
 valuable insight into the influence of manufacturing route on
 crystallographic texture and cellular dislocation structure in Inconel
 718, a critical alloy for high-temperature structural applications.
description: Materials and
 Sample Preparation: Three different nickel-based
 superalloys were used in this study: a wrought recrystallized Inconel 718
 (30 minutes at 1050°C followed by 8 hours at 720°C) with chemical
 composition of (wt.%) Ni – 0.56% Al – 17.31% Fe – 0.14% Co – 17.97% Cr –
 5.4% Nb + Ta – 1.00% Ti – 0.023% C – 0.0062% N; a 3D-printed Inconel 718
 by DED (as-built) and a dynamically recrystallized Waspalloy
 (heat-treated) characterized by a necklace microstructure. The 3D-printed
 material was produced using a Formalloy L2 Directed Energy Deposition
 (DED) unit utilizing a 650 W Nuburu 450 nm blue laser capable of achieving
 a 400 μm laser spot size. Argon was used as the shielding and carrier gas,
 and the specimen remained in its as-built condition. The chemical
 composition is in wt.%: Ni – 0.45% Al – 18.77% Fe – 0.07% Co – 18.88% Cr –
 5.08% Nb – 0.96% Ti – 0.036% C – 0.02% Cu - 0.04% Mn - 0.08% Si - 3.04%
 Mo. All samples were machined by EDM as flat dogbone samples of gauge
 section 1 × 3 mm<sup>2</sup>. All samples were mechanically
 polished using abrasive papers, followed by diamond suspension down to 3
 μm, and were finished using a 50 nm colloidal silica suspension.
 Electron
 BackScatter Diffraction: EBSD measurements were
 performed on a Thermo Fisher Scios 2 Dual Beam FIB-SEM with an EDAX
 OIM-Hikari detector at an accelerating voltage of 20 kV, current of 6.4
 nA, an exposure time of 8.5 ms per diffraction pattern, 12 mm of working
 distance, and a 70° tilt. In total, 3 maps of 1000 × 900 μm were collected
 with a 1 μm step size, and 4 additional maps were collected at 0.1 μm step
 size. These EBSD maps were saved to .ang files and processed using the
 MTEX toolbox1. For each of these maps, SEM signal, confidence index (CI),
 and image quality (IQ) are provided as .tif files. The orientation maps
 are transformed using the inverse pole figure MTEX coloring [2] (given as
 IPF_mtex.jpg) and provided for the X (horizontal), Y (vertical), and Z
 (normal) directions. Additionally, all Kikuchi patterns were saved with no
 binning to 16-bit images under the .up2 format. Based on the diffraction
 patterns, sharpness maps, indicating the diffuseness of Kikuchi bands [3],
 have been constructed using EMSPHINX software [4] and are provided as .tif
 files. The details on the pattern center are provided in the .ang
 file. Kikuchi
 Patterns preprocessing: The Kikuchi patterns were
 originally acquired using 1 × 1 binning at a resolution of 480 × 480
 pixels. For the purpose of data processing, two versions are provided with
 the initial 1 × 1 binning and with a 4 × 4 binning (resulting in a reduced
 resolution of 120 × 120 pixels). Additional .up2 files, referred to as
 "preprocessed", are provided in which the background was
 subtracted and pattern gray values have been rescaled to fill the complete
 16-bit range (between 0 and 65535). Due to the large size of the raw,
 unbinned data, they are not hosted on Dryad but can be made available upon
 request to the authors. Files
 Provided: The nomenclature of the provided files is
 described below, and a detailed explanation is available in the
 accompanying ReadMe.txt file, formatted according to DRYAD
 recommendations. The labels 718RX, AM718, and Waspalloy correspond to the
 wrought recrystallized Inconel 718, the as-built additively manufactured
 Inconel 718 (produced by DED), and a partially recrystallized Waspalloy,
 respectively. The term 1um refers to maps collected with a spatial
 resolution of 1 um, while 0.1um_1 and 0.1um_2 denote two separate maps
 acquired at 0.1 um resolution. The file labeled sharpness contains
 sharpness maps, as defined in [3], and computed using the EMSPHINX
 software [4]. Files labeled CI, IQ, and SEM represent the Confidence
 Index, Image Quality, and associated SEM maps obtained using MTEX1 and are
 provided as .tif files. Similarly, IPF_X, IPF_Y, and IPF_Z refer to
 inverse pole figure maps along the X (horizontal), Y (vertical), and Z
 (normal) directions and are provided as .jpg files. The file IPF_mtex
 gives the associated inverse pole figure MTEX coloring [1, 2]. 480x480 and
 120x120 indicate the diffraction pattern resolutions, with the initial
 binning and with the 4 x 4 binning operation, respectively. All the images
 are stored as .up2 files. Files denoted as 120×120_preprocessed include
 the corresponding preprocessed patterns at the 120 x 120 resolution. The
 preprocessing procedure is detailed in the section "Kikuchi Patterns
 preprocessing." File
 format: The .up2 file is a proprietary data format
 used by EDAX/TSL systems to store Kikuchi pattern images and associated
 metadata from electron backscatter diffraction (EBSD) experiments. Each
 .up2 file contains high-resolution diffraction patterns acquired at each
 scan point, typically stored in a compressed or indexed form for efficient
 access. These files are commonly used when raw Kikuchi patterns are
 required for post-processing, including pattern remapping, machine
 learning applications, or simulation-based indexing. In addition to image
 data, .up2 files also include key acquisition parameters such as beam
 voltage, working distance, detector settings, image resolution, and stage
 coordinates, enabling full traceability of each pattern to its spatial
 location in the sample. The .ang file is a widely used text-based format
 for storing processed electron backscatter diffraction (EBSD) data.
 Generated by EDAX/TSL OIM software, it contains orientation mapping
 results after successful indexing of Kikuchi patterns. Each row in an .ang
 file corresponds to a single scan point and includes key information such
 as spatial coordinates (X, Y), Euler angles (Phi1, PHI, Phi2) defining
 crystallographic orientation, image quality (IQ), confidence index (CI),
 phase ID, and other optional metrics (e.g., grain ID or local
 misorientation). The file begins with a header that describes metadata,
 including step size, scan grid type (square or hexagonal), phase
 information, and scanning parameters. .ang files are commonly used for
 downstream analyses such as grain reconstruction, texture analysis, and
 misorientation mapping, and are often imported into visualization tools
 like MTEX toolbox1 or Dream.3D for further processing. The .tif (Tagged
 Image File Format) is a high-fidelity raster image format widely used in
 scientific imaging due to its ability to store uncompressed or losslessly
 compressed image data. In the context of EBSD datasets, .tif files
 typically store individual Kikuchi diffraction patterns collected during a
 scan. When used within a .up2 dataset, each pattern is saved as a separate
 .tif file, preserving the original grayscale intensity distribution
 necessary for accurate post-processing tasks such as reindexing, pattern
 matching, or machine learning-based classification. These images often
 have high bit-depth (e.g., 12-bit or 16-bit grayscale) to retain subtle
 contrast variations in the diffraction bands, which are critical for
 crystallographic orientation determination. The file naming and
 organization are indexed and referenced by the accompanying .up2 metadata
 file to maintain spatial correlation with the scan grid. The .jpg (or
 .jpeg), standing for Joint Photographic Experts Group, file format is a
 commonly used compressed image format designed to store photographic and
 continuous-tone images efficiently. .jpg uses lossy compression, meaning
 some image detail is discarded to significantly reduce file size. This
 makes it suitable for visual display and documentation purposes, but less
 ideal for quantitative image analysis, where preserving original pixel
 intensity values is critical. References:
 Bachmann, F., Hielscher, R. & Schaeben, H.
 Texture analysis with mtex–free and open source software toolbox.
 <em>Solid state phenomena</em> 160, 63–68 (2010).
 Nolze, G. & Hielscher, R. Orientations–perfectly
 colored. <em>Appl. Crystallogr.</em> 49, 1786–1802
 (2016). Wang, F. et al. Dislocation cells in
 additively manufactured metallic alloys characterized by electron
 backscatter diffraction pattern sharpness. <em>Mater.
 Charact.</em> 197, 112673 (2023). EMsoft-org.
 EMSphInx: Spherical indexing software for diffraction patterns. Public
 beta release; GPL-2.0 license. 
 Acknowledgments: M.C., H.W., K.V., and J.C.S.
 are grateful for financial support from the Defense Advanced Research
 Projects Agency (DARPA - HR001124C0394). C.B., D.A., and J.C.S.
 acknowledge the NSF (award #2338346) for financial support. This work was
 carried out in the Materials Research Laboratory Central Research
 Facilities, University of Illinois. Carpenter Technology is acknowledged
 for providing the 718 and Waspalloy material. Tresa Pollock, McLean
 Echlin, and James Lamb are acknowledged for their support on the EBSD
 sharpness calculations.
description: # Kikuchi pattern dataset from wrought and as-built additively
 manufactured superalloys Dataset DOI:
 [10.5061/dryad.zcrjdfnr9](10.5061/dryad.zcrjdfnr9) ## Description of the
 data and file structure #### Files Provided: See the Methods section for a
 description of file naming patterns and meaning. #### Folder architecture:
 718RX: * 1um * 718RX_1um.ang * 718RX_1um_sharpness.tif * 718RX_1um_CI.tif
 * 718RX_1um_IQ.tif * 718RX_1um_SEM.tif * IPF_mtex.jpg *
 718RX_1um_IPF_X.jpg * 718RX_1um_IPF_Y.jpg * 718RX_1um_IPF_Z.jpg *
 718RX_1um_480x480.up2 * 718RX_1um_120x120.up2 *
 718RX_1um_120x120_preprocessed.up2 * 0.1um_1 * 718RX_0.1um_1.ang *
 718RX_0.1um_1_sharpness.tif * 718RX_0.1um_1_CI.tif * 718RX_0.1um_1_IQ.tif
 * 718RX_0.1um_1_SEM.tif * IPF_mtex.jpg * 718RX_0.1um_1_IPF_X.jpg *
 718RX_0.1um_1_IPF_Y.jpg * 718RX_0.1um_1_IPF_Z.jpg *
 718RX_0.1um_1_480x480.up2 * 718RX_0.1um_1_120x120.up2 *
 718RX_0.1um_1_120x120_preprocessed.up2 * 0.1um_2 * 718RX_0.1um_2.ang *
 718RX_0.1um_2_sharpness.tif * 718RX_0.1um_2_CI.tif * 718RX_0.1um_2_IQ.tif
 * 718RX_0.1um_2_SEM.tif * IPF_mtex.jpg * 718RX_0.1um_2_IPF_X.jpg *
 718RX_0.1um_2_IPF_Y.jpg * 718RX_0.1um_2_IPF_Z.jpg *
 718RX_0.1um_2_480x480.up2 * 718RX_0.1um_2_120x120.up2 *
 718RX_0.1um_2_120x120_preprocessed.up2 AM718: * 1um * AM718_1um.ang *
 AM718_1um_sharpness.tif * AM718_1um_CI.tif * AM718_1um_IQ.tif *
 AM718_1um_SEM.tif * IPF_mtex.jpg * AM718_1um_IPF_X.jpg *
 AM718_1um_IPF_Y.jpg * AM718_1um_IPF_Z.jpg * AM718_1um_480x480.up2 *
 AM718_1um_120x120.up2 * AM718_1um_120x120_preprocessed.up2 * 0.1um_1 *
 AM718_0.1um_1.ang * AM718_0.1um_1_sharpness.tif * AM718_0.1um_1_CI.tif *
 AM718_0.1um_1_IQ.tif * AM718_0.1um_1_SEM.tif * IPF_mtex.jpg *
 AM718_0.1um_1_IPF_X.jpg * AM718_0.1um_1_IPF_Y.jpg *
 AM718_0.1um_1_IPF_Z.jpg * AM718_0.1um_1_480x480.up2 *
 AM718_0.1um_1_120x120.up2 * AM718_0.1um_1_120x120_preprocessed.up2 *
 0.1um_2 * AM718_0.1um_2.ang * AM718_0.1um_2_sharpness.tif *
 AM718_0.1um_2_CI.tif * AM718_0.1um_2_IQ.tif * AM718_0.1um_2_SEM.tif *
 IPF_mtex.jpg * AM718_0.1um_2_IPF_X.jpg * AM718_0.1um_2_IPF_Y.jpg *
 AM718_0.1um_2_IPF_Z.jpg * AM718_0.1um_2_480x480.up2 *
 AM718_0.1um_2_120x120.up2 * AM718_0.1um_2_120x120_preprocessed.up2
 Waspalloy: * 1um * Waspalloy_1um.ang * Waspalloy_1um_sharpness.tif *
 Waspalloy_1um_CI.tif * Waspalloy_1um_IQ.tif * Waspalloy_1um_SEM.tif *
 IPF_mtex.jpg * Waspalloy_1um_IPF_X.jpg * Waspalloy_1um_IPF_Y.jpg *
 Waspalloy_1um_IPF_Z.jpg * Waspalloy_1um_480x480.up2 *
 Waspalloy_1um_120x120.up2 * Waspalloy_1um_120x120_preprocessed.up2 ##
 Code/software See Methods for recommendations on how to open files.