DOI: 10.5878/jxpa-0k68
title: Dataset: Alkali Ion diffusion and structure of chemically strengthened TiO2 doped soda-lime silicate glass
title: Dataset: Alkali jon diffusion och struktur för kemiskt härdade TiO2 dopade soda kalk silikatglas

description: Diffusion kinetics and structural properties of chemically strengthened titania-doped soda-lime silicate glasses were studied by depth-resolved X-ray photoelectron spectroscopy, Raman spectroscopy and spectrophotometry.

Chemical strengthening (CS) is frequently used to strengthen thin glasses. CS of glass is based on ion exchange of larger ions from a molten salt into glass. Both the ion and counter ion are conventionally monovalent alkali ions. 

Diffusion kinetics and structural properties of chemically strengthened titania-doped (TiO2) soda-lime silicate (SLS) glasses were studied by depth-resolved X-ray photoelectron spectroscopy, Raman spectroscopy and spectrophotometry. The glasses were ion exchanged, whereby Na+ in the glass was replaced by K+ in a molten salt bath, at four different treatment temperatures between 350 and 500 °C.

The following samples were prepared and analyzed by X-ray Photoelectron Spectroscopy (XPS): (1) SLS, (2) 4.7% TiO2, and (3) 9.9% TiO2. The ion exchange procedure was performed for 5 h at four different temperatures below Tg (350, 400, 450 and 500 °C). Before XPS measurements, the samples were wet-etched using hydrofluoric (HF) acid to produce samples with six different etching depths.

The Raman scattered light was detected in the backscattering configuration employing linear polarization and 2400 lines/mm grating, and a 100x objective lens. Depth profile spectra were collected at six different depths of 0, 10, 20, 30, 40, and 50 µm for each glass sample, employing 12 scans with a 10 s exposure time for each scan.

Spectrophotometric measurements were conducted before and after K+/Na+ ion-exchange treatmeatment for 5 h at 500 °C, collected between 300 and 2500 nm.

File List:
XPS:
XPS_4.7%TiO2_350degrees_acq1.txt
XPS_4.7%TiO2_350degrees_acq2.txt
XPS_4.7%TiO2_400degrees_acq1.txt
XPS_4.7%TiO2_400degrees_acq2.txt
XPS_4.7%TiO2_450degrees_acq1.txt
XPS_4.7%TiO2_450degrees_acq2.txt
XPS_4.7%TiO2_500degrees_acq1.txt
XPS_4.7%TiO2_500degrees_acq2.txt
XPS_4.7%TiO2_500degrees_acq3.txt
XPS_4.7%TiO2_500degrees_acq4.txt
XPS_9.9%TiO2_350degrees_acq1.txt
XPS_9.9%TiO2_350degrees_acq2.txt
XPS_9.9%TiO2_400degrees_acq1.txt
XPS_9.9%TiO2_450degrees_acq1.txt
XPS_9.9%TiO2_450degrees_acq2.txt
XPS_9.9%TiO2_450degrees_acq3.txt
XPS_9.9%TiO2_500degrees_acq1.txt
XPS_9.9%TiO2_500degrees_acq2.txt
XPS_9.9%TiO2_500degrees_acq3.txt

Variable 1: KE_Ti 2p 8, Description: Kinetic Energy, Unit: eV
Variable 2: BE_Ti 2p 8, Description: Binding Energy, Unit: eV
Variable 3: CPS_Ti 2p 8, Description: Ti XPS specta, Unit: Counts per s
Variable 4: Ti 2p_1_Ti_2p 8, Description: Ti4+ 2p3/2 deconvolution, Unit: Counts per s
Variable 5: Ti 2p_2_Ti 2p 8, Description: Ti4+ 2p1/2 deconvolution, Unit: Counts per s
Variable 6: Ti 2p_3_Ti 2p 8, Description: Ti3+ 2p1/2 deconvolution, Unit: Counts per s
Variable 7: Ti 2p_4_Ti 2p 8, Description: Ti3+ 2p3/2 deconvolution, Unit: Counts per s
Variable 8: Background_Ti 2p 8, Description: Background spectra, Unit: Counts per s
Variable 9: Envelope_Ti 2p 8, Description: Sum of the deconvolutions and background, Unit: Counts per s
Variable 10: Normalised_Residual_Ti 2p 8, Description: Normalised residual spectra, Unit: Counts per s
Variable 11: Residual_Ti 2p 8, Description: Residual spectra, Unit: Counts per s

Raman spectroscopy:
Raman_SLS_untreated_depth1.txt
Raman_SLS_500deg_depth6.txt
Raman_SLS_500deg_depth5.txt
Raman_SLS_500deg_depth4.txt
Raman_SLS_500deg_depth3.txt
Raman_SLS_500deg_depth2.txt
Raman_SLS_500deg_depth1.txt
Raman_SLS_450deg_depth1.txt
Raman_SLS_400deg_depth1.txt
Raman_SLS_350deg_depth1.txt
Raman_4.7%TiO2_untreated_depth1.txt
Raman_4.7%TiO2_500deg_depth6.txt
Raman_4.7%TiO2_500deg_depth5.txt
Raman_4.7%TiO2_500deg_depth4.txt
Raman_4.7%TiO2_500deg_depth3.txt
Raman_4.7%TiO2_500deg_depth2.txt
Raman_4.7%TiO2_500deg_depth1.txt
Raman_4.7%TiO2_450deg_depth1.txt
Raman_4.7%TiO2_400deg_depth1.txt
Raman_4.7%TiO2_350deg_depth1.txt
Raman_9.9%TiO2_untreated_depth1.txt
Raman_9.9%TiO2_500deg _depth6.txt
Raman_9.9%TiO2_500deg _depth5.txt
Raman_9.9%TiO2_500deg _depth4.txt
Raman_9.9%TiO2_500deg _depth3.txt
Raman_9.9%TiO2_500deg _depth2.txt
Raman_9.9%TiO2_500deg _depth1.txt
Raman_9.9%TiO2_450deg _depth1.txt
Raman_9.9%TiO2_400deg _depth1.txt
Raman_9.9%TiO2_350deg _depth1.txt

Variable 1: #Wave, Description: Wavelength, Unit: cm-1
Variable 2: #Intensity, Description: Raman intensity, Unit: Counts per s

Spectrophotometry:
SLS_AbsorptionCoefficient_untreated.txt
SLS_ AbsorptionCoefficient_treated.txt
4.7%TiO2_AbsorptionCoefficient_untreated.txt
4.7%TiO2_AAbsorptionCoefficient_treated.txt
9.9%TiO2_AbsorptionCoefficient_untreated.txt
9.9%TiO2_AbsorptionCoefficient_treated.txt

Variable 1: Description: Wavelength, Unit: nm
Variable 2: Description: Absorption coefficient, Unit: cm-1
description: Diffussionskinetik och strukturella egenskaper för kemiskt härdade titanoxid dopade soda kalk silikat glas studerades med djupupplöst fotoelektronspektroskopi, Ramanspektroskopi och spektrofotometri.

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