DOI: 10.5281/zenodo.7319352
title: Synchrotron X-ray Diffraction Results - Measuring Bulk Crystallographic Texture from Differently-Orientated Ti-6Al-4V Samples

description: A dataset of crystallographic texture results for both α (hexagonal close packed, hcp) and β (body-centred cubic, bcc) phases, measured from six differently orientated Ti-6Al-4V (Ti-64) samples, using two different analysis techniques of synchrotron X-ray diffraction (SXRD) data. The texture results are produced from two refinement methods for fitting intensities from SXRD pattern images; an established Rietveld refinement method using the software package MAUD (Materials Analysis Using Diffraction) and a new Fourier-based peak fitting method from the Continuous-Peak-Fit Python package. The texture results were also compared with electron backscatter diffraction (EBSD) measurements from a single sample orientation. The SXRD and EBSD textures were analysed using MTEX to enable a direct comparison of the pole figures, orientation distribution functions (ODFs) and numerical values for the texture indices. The SXRD texture is calculated from each of the six different sample orientations, a combination of the six sample orientations, and in a batch processing method for calculating spatially-resolved texture variation from 387 individual X-Y stage-scan SXRD measurements across one of the samples. The texture variation measured using stage-scan SXRD is directly compared with EBSD, by splitting up the EBSD map into an equivalent grid matrix using an automated script in MTEX. <strong>Material </strong> The Ti-64 material used in this study was pre-rolled to 87.5% reduction at 915ºC and then air-cooled to develop a characteristic texture. The run numbers from the experiment reference six different sample orientations, according to their alignment with the original rolling directions (RD – rolling direction, TD – transverse direction, ND – normal direction), and alignment with the horizontal (X) and vertical (Y) axes of the synchrotron detector. <strong>MAUD / MTEX Analysis</strong> The α and β phase texture for each of the six different sample orientations was calculated using MAUD, included in this analysis dataset, which produced ODFs in the form of text files. The texture files were analysed in MTEX using scripts from the MAUD-batch-analysis package, for plotting of the pole figures and ODF slices, along with calculation of pole figure maxima, ODF maxima and texture indices. The same procedure was used to analyse texture from all six orientations together; using MTEX to fit a single ODF text file. And a series of ODF text files were analysed to calculate texture variation from an X-Y stage scan of Sample 1 (103845). Two different ODF resolutions of 5º and 15º were initially used to fit the texture in MAUD, with the same ODF resolution applied to analyse the data in MTEX. However, an ODF resolution of 15° was found to reproduce the most reasonable texture strength intensity values, with the closest match to the EBSD results. <strong>Continuous-Peak-Fit / MTEX Analysis </strong> The lattice plane intensities for 21 α and 4 β phase peaks were extracted from the Continuous-Peak-Fit analysis, included in this analysis dataset, and saved as text files in the form of pole figures. The lattice intensity text files were analysed in MTEX using scripts from the continuous-peak-fit-analysis package, to plot pole figures and ODF slices, and to calculate pole figure maxima, ODF maxima and texture indices. The same procedure was used to analyse texture from all six orientations together, along with combinations of different sample orientations, by fitting combined lattice intensity text files in MTEX. And a series of lattice intensity text files were analysed to calculate texture variation from the X-Y stage scan of Sample 1 (103845). Lattice plane intensity distributions which had been normalised to a Ti-64 powder sample measurement were also analysed, to see if this had any effect on the texture intensities. Nevertheless, the powder-corrected texture was found to exactly match the raw intensity measurements. Three different ODF resolutions of 5º, 10º and 15º were initially used to fit the texture in MTEX. However, a kernel half-width of 10° was found to produce optimal data fitting, for highly accurate texture strength intensity values. <strong>EBSD / MTEX Analysis </strong> The indexed α-phase EBSD measurements were recorded over an area of around 100 mm<sup>2</sup>, with an equivalent sized map of β-phase orientations reconstructed from the data. Both the α and the β phase maps were analysed using the MTEX-texture-block-analysis package, which was used to split up the map into 387 individual square sections, with equivalent dimensions to the SXRD stage-scan measurement grid. For each of the 387 sections, MTEX was used to plot pole figures and ODF slices, and to calculate pole figure maxima, ODF maxima and texture indices. <strong>Texture Variation Comparison</strong> The texture values calculated from the SXRD stage scan measurements, with the two analysis methods, were used for a direct comparison with the texture variation recorded using EBSD. This analysis was recorded in the texture-strength-comparison package. The results show differences in texture variation across the piece depending on the method used to analyse the SXRD data. The Continuous-Peak-Fit analysis method shows the closest match with EBSD, producing clear texture intensity spikes for the different α and β lattice plane pole figure intensities, ODF maxima and texture indices, at the centre of the piece. The results were also used to develop SXRD maps showing the distribution of texture intensities across the sample. <strong>Metadata </strong> An accompanying YAML text file contains associated processing metadata for the SXRD and EBSD analyses, recording information about the different packages used to process the data, along with details about the different files contained within this results dataset.