title: ÐÐ°Ð»Ð¾Ð³Ð°Ð±Ð°ÑÐ¸ÑÐ½ÑÐ¹ ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐ¹ Ð¼Ð¸ÐºÑÐ¾ÑÐºÐ¾Ð¿ Ð²ÑÑÐ¾ÐºÐ¾Ð³Ð¾ ÑÐ°Ð·ÑÐµÑÐµÐ½Ð¸Ñ Ñ Ð¿ÐµÑÐµÐ¼ÐµÐ½Ð½ÑÐ¼ ÑÐ¾ÐºÑÑÐ½ÑÐ¼ ÑÐ°ÑÑÑÐ¾ÑÐ½Ð¸ÐµÐ¼
title: Ð²ÑÐ¿ÑÑÐºÐ½Ð°Ñ ÐºÐ²Ð°Ð»Ð¸ÑÐ¸ÐºÐ°ÑÐ¸Ð¾Ð½Ð½Ð°Ñ ÑÐ°Ð±Ð¾ÑÐ° Ð¼Ð°Ð³Ð¸ÑÑÑÐ°
titleType: Subtitle
title: Small high-resolution electronic microscope with variable focal length
Creators: name: ÐÑÐ¾Ð²Ð¾Ð´Ð¸Ð½, ÐÐ°Ð½Ð¸Ð¸Ð»
Publisher: name: Ð¡Ð°Ð½ÐºÑ-ÐÐµÑÐµÑÐ±ÑÑÐ³ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ ÐÐµÑÑÐ° ÐÐµÐ»Ð¸ÐºÐ¾Ð³Ð¾
Year: 2023
Subjects: Ð­Ð»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐµ Ð¼Ð¸ÐºÑÐ¾ÑÐºÐ¾Ð¿Ñ
ÑÐ¾ÐºÑÑÐ½Ð¾Ðµ ÑÐ°ÑÑÑÐ¾ÑÐ½Ð¸Ðµ
ÐºÑÐ°ÑÐ½Ð¾ÑÑÑ ÑÐ²ÐµÐ»Ð¸ÑÐµÐ½Ð¸Ñ
ÑÐ¸ÑÐ»Ð¾Ð²Ð°Ñ Ð°Ð¿Ð¿ÐµÑÑÑÑÐ°
ÑÐ°Ð·ÑÐµÑÐ°ÑÑÐ°Ñ ÑÐ¿Ð¾ÑÐ¾Ð±Ð½Ð¾ÑÑÑ
Ð°Ð±Ð±ÐµÑÐ°ÑÐ¸Ð¸
ÑÐ¾ÑÐ¾Ð¿ÑÐ¸ÐµÐ¼Ð½Ð¾Ðµ ÑÑÑÑÐ¾Ð¹ÑÑÐ²Ð¾
focal length
magnification
numerical aperture
resolving power
aberrations
photodetector

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description: The object of study is a small-sized electron microscope. The aim of this work is to develop a small-sized collapsible electron microscope for studying various objects with a resolution of 100 nm and an image contrast of at least 0.96. As a result of the analysis of the designs of industrial electron and optical microscopes for the study of various objects, surfaces and media with a resolution of up to 100 nm or less, a number of shortcomings were identified. These shortcomings do not allow the structures of these microscopes to be quickly moved, for example, across the territory of a scientific center to solve various problems. In addition, when changing the object of study, a long adjustment and calibration of the microscope is required, which creates a number of additional problems under conditions of lack of time or large volumes of studies. A universal design of a small-sized collapsible electron microscope with an autonomous power source was proposed and developed. The calculation of the optical part of the microscope was performed to select the optimal distances for placing the photodetector from the optical part for solving various problems. A technique for compensating for paralax, prism and diffraction aberrations, and numerous reflections of a light beam on optical elements is proposed. Studies of various objects have been carried out. Results have been obtained that confirm the adequacy of our design solutions and developments.