title: Ð ÐµÐ½ÑÐ³ÐµÐ½Ð¾ÑÐ»ÑÐ¾ÑÐµÑÑÐµÐ½ÑÐ½ÑÐ¹ Ð°Ð½Ð°Ð»Ð¸Ð· ÑÐ²ÐµÐ»Ð¸ÑÐ½ÑÑ Ð¸Ð·Ð´ÐµÐ»Ð¸Ð¹
title: Ð²ÑÐ¿ÑÑÐºÐ½Ð°Ñ ÐºÐ²Ð°Ð»Ð¸ÑÐ¸ÐºÐ°ÑÐ¸Ð¾Ð½Ð½Ð°Ñ ÑÐ°Ð±Ð¾ÑÐ° Ð±Ð°ÐºÐ°Ð»Ð°Ð²ÑÐ°
titleType: Subtitle
title: X-ray fluorescence of jewelry
Creators: name: ÐÐ¾ÑÐµÐ»ÐºÐ¸Ð½Ð°, Ð¢Ð°ÑÑÑÐ½Ð°
Publisher: name: Ð¡Ð°Ð½ÐºÑ-ÐÐµÑÐµÑÐ±ÑÑÐ³ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ ÐÐµÑÑÐ° ÐÐµÐ»Ð¸ÐºÐ¾Ð³Ð¾
Year: 2024
Subjects: Ð¿Ð¾Ð»ÑÐ¿ÑÐ¾Ð²Ð¾Ð´Ð½Ð¸ÐºÐ¾Ð²ÑÐµ Ð´ÐµÑÐµÐºÑÐ¾ÑÑ
ÑÐµÐ½ÑÐ³ÐµÐ½Ð¾Ð²ÑÐºÐ¾Ðµ Ð¸Ð·Ð»ÑÑÐµÐ½Ð¸Ðµ
ÑÐµÐ½ÑÐ³ÐµÐ½Ð¾ÑÐ»ÑÐ¾ÑÐµÑÑÐµÐ½ÑÐ½Ð°Ñ ÑÐ¿ÐµÐºÑÑÐ¾ÑÐºÐ¾Ð¿Ð¸Ñ
ÑÐ½ÐµÑÐ³Ð¾Ð´Ð¸ÑÐ¿ÐµÑÑÐ¸Ð¾Ð½Ð½Ð°Ñ ÑÐµÐ½ÑÐ³ÐµÐ½Ð¾ÑÐ»ÑÐ¾ÑÐµÑÑÐµÐ½ÑÐ½Ð°Ñ ÑÐ¿ÐµÐºÑÑÐ¾ÑÐºÐ¾Ð¿Ð¸Ñ
ÐºÑÐµÐ¼Ð½Ð¸ÐµÐ²ÑÐ¹ Ð´ÐµÑÐµÐºÑÐ¾Ñ ÐÐÐ¢ÐÐ
ÑÐµÐ½ÑÐ³ÐµÐ½Ð¾Ð²ÑÐºÐ°Ñ ÑÑÑÐ±ÐºÐ° ÐÐ¡1
Ð¼ÐµÑÐ¾Ð´ Ð½Ð°Ð¸Ð¼ÐµÐ½ÑÑÐ¸Ñ ÐºÐ²Ð°Ð´ÑÐ°ÑÐ¾Ð² Ñ Ð¿Ð¾Ð¼Ð¾ÑÑÑ Ð¿ÑÐ¾Ð³ÑÐ°Ð¼Ð¼Ñ ÑÐ¸Ð¼ÑÐ»ÑÑÐ¸Ð¸ Ð¼ÐµÑÐ¾Ð´Ð¾Ð¼ ÐÐ¾Ð½ÑÐµ-ÐÐ°ÑÐ»Ð¾
semiconductor detectors
X-ray radiation
X-ray fluorescence spectroscopy
energy dispersive X-ray fluorescence spectroscopy
KETEK silicon detector
BS1 X-ray tube
least squares method using a Monte Carlo simulation program

description: ÐÐ°Ð½Ð½Ð°Ñ ÑÐ°Ð±Ð¾ÑÐ° Ð¿Ð¾ÑÐ²ÑÑÐµÐ½Ð° ÑÐµÐ°Ð»Ð¸Ð·Ð°ÑÐ¸Ð¸ Ð¼ÐµÑÐ¾Ð´Ð° ÑÐµÐ½ÑÐ³ÐµÐ½Ð¾ÑÐ»ÑÐ¾ÑÐµÑÑÐµÐ½ÑÐ½Ð¾Ð³Ð¾ Ð°Ð½Ð°Ð»Ð¸Ð·Ð° Ð±ÐµÐ· Ð¸ÑÐ¿Ð¾Ð»ÑÐ·Ð¾Ð²Ð°Ð½Ð¸Ñ ÑÑÐ°Ð»Ð¾Ð½Ð¾Ð². Ð¡ Ð¿Ð¾Ð¼Ð¾ÑÑÑ ÑÑÐ¾Ð³Ð¾ Ð¼ÐµÑÐ¾Ð´Ð° Ð²Ð¾Ð·Ð¼Ð¾Ð¶Ð½Ð¾ Ð¿ÑÐµÐ´ÑÐºÐ°Ð·ÑÐ²Ð°ÑÑ ÐºÐ°ÑÐµÑÑÐ²ÐµÐ½Ð½ÑÐ¹ Ð¸ ÐºÐ¾Ð»Ð¸ÑÐµÑÑÐ²ÐµÐ½Ð½ÑÐ¹ ÑÐ¾ÑÑÐ°Ð² Ð¾Ð±ÑÐ°Ð·ÑÐ°, Ð¸Ð¼ÐµÑ ÑÐ¾Ð»ÑÐºÐ¾ ÐµÐ³Ð¾ ÑÐºÑÐ¿ÐµÑÐ¸Ð¼ÐµÐ½ÑÐ°Ð»ÑÐ½ÑÐ¹ ÑÐ¿ÐµÐºÑÑ Ð¸Ð·Ð»ÑÑÐµÐ½Ð¸Ñ. Ð ÐµÐ½ÑÐ³ÐµÐ½ÑÐ»ÑÐ¾ÑÐµÑÑÐµÐ½ÑÐ½ÑÐ¹ Ð°Ð½Ð°Ð»Ð¸Ð· Ð² Ð½Ð°ÑÐµÐ¹ ÑÐ°Ð±Ð¾ÑÐµ Ð¾ÑÑÑÐµÑÑÐ²Ð»ÑÐµÑÑÑ ÑÐ½ÐµÑÐ³Ð¾Ð´Ð¸ÑÐ¿ÐµÑÑÐ¸Ð¾Ð½Ð½ÑÐ¼ Ð¼ÐµÑÐ¾Ð´Ð¾Ð¼, ÐºÐ¾ÑÐ¾ÑÑÐ¹ Ð¾Ð±ÐµÑÐ¿ÐµÑÐ¸Ð²Ð°ÐµÑ ÑÐ¾ÑÐ¾ÑÐµÐµ ÑÐ½ÐµÑÐ³ÐµÑÐ¸ÑÐµÑÐºÐ¾Ðµ ÑÐ°Ð·ÑÐµÑÐµÐ½Ð¸Ðµ Ð·Ð° Ð±Ð¾Ð»ÐµÐµ ÐºÐ¾ÑÐ¾ÑÐºÐ¸Ð¹ Ð¿ÑÐ¾Ð¼ÐµÐ¶ÑÑÐ¾Ðº Ð²ÑÐµÐ¼ÐµÐ½Ð¸ Ð¿Ð¾ ÑÑÐ°Ð²Ð½ÐµÐ½Ð¸Ñ Ñ Ð²Ð¾Ð»Ð½Ð¾Ð´Ð¸ÑÐ¿ÐµÑÑÐ¸Ð¾Ð½Ð½ÑÐ¼ Ð¼ÐµÑÐ¾Ð´Ð¾Ð¼. ÐÐ»Ð°Ð³Ð¾Ð´Ð°ÑÑ Ð¸ÑÐ¿Ð¾Ð»ÑÐ·Ð¾Ð²Ð°Ð½Ð¸Ñ ÑÐ½ÐµÑÐ³Ð¾Ð´Ð¸ÑÐ¿ÐµÑÑÐ¸Ð¾Ð½Ð½Ð¾Ð³Ð¾ Ð¼ÐµÑÐ¾Ð´Ð°, Ð¼Ñ ÑÐ¼Ð¾Ð³Ð»Ð¸ Ð¿Ð¾Ð»ÑÑÐ¸ÑÑ ÑÐ¾ÑÐ½ÑÐµ Ð´Ð°Ð½Ð½ÑÐµ Ð¾ ÑÐ¾Ð´ÐµÑÐ¶Ð°Ð½Ð¸Ð¸ ÑÐ°Ð·Ð»Ð¸ÑÐ½ÑÑ ÑÐ»ÐµÐ¼ÐµÐ½ÑÐ¾Ð² Ð² Ð¾Ð±ÑÐ°Ð·ÑÐµ Ð±ÐµÐ· Ð½ÐµÐ¾Ð±ÑÐ¾Ð´Ð¸Ð¼Ð¾ÑÑÐ¸ Ð¿ÑÐ¸Ð¼ÐµÐ½ÐµÐ½Ð¸Ñ ÑÑÐ°Ð»Ð¾Ð½Ð° Ð´Ð»Ñ ÐºÐ°Ð»Ð¸Ð±ÑÐ¾Ð²ÐºÐ¸ Ð¿ÑÐ¸Ð±Ð¾ÑÐ°. Ð­ÑÐ¾ Ð·Ð½Ð°ÑÐ¸ÑÐµÐ»ÑÐ½Ð¾ ÑÐ¿ÑÐ¾ÑÐ°ÐµÑ Ð¿ÑÐ¾ÑÐµÑÑ Ð°Ð½Ð°Ð»Ð¸Ð·Ð° Ð¸ ÑÐ¾ÐºÑÐ°ÑÐ°ÐµÑ Ð²ÑÐµÐ¼Ñ, Ð·Ð°ÑÑÐ°ÑÐ¸Ð²Ð°ÐµÐ¼Ð¾Ðµ Ð½Ð° Ð¿Ð¾Ð´Ð³Ð¾ÑÐ¾Ð²ÐºÑ Ð¸ Ð¿ÑÐ¾Ð²ÐµÐ´ÐµÐ½Ð¸Ðµ ÑÐºÑÐ¿ÐµÑÐ¸Ð¼ÐµÐ½ÑÐ°. Ð ÐµÐ½ÑÐ³ÐµÐ½Ð¾ÑÐ»ÑÐ¾ÑÐµÑÑÐµÐ½ÑÐ½ÑÐ¹ Ð°Ð½Ð°Ð»Ð¸Ð· Ð±ÐµÐ· Ð¿ÑÐ¸Ð¼ÐµÐ½ÐµÐ½Ð¸Ñ ÑÑÐ°Ð»Ð¾Ð½Ð¾Ð² ÑÐ¿Ð¾ÑÐ¾Ð±ÐµÐ½ ÑÑÑÐµÑÑÐ²ÐµÐ½Ð½Ð¾ ÑÐ´ÐµÑÐµÐ²Ð¸ÑÑ Ð¿ÑÐ¾Ð²ÐµÐ´ÐµÐ½Ð¸Ðµ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ñ Ð¾Ð±ÑÐ°Ð·ÑÐ¾Ð². Ð ÐµÐ½ÑÐ³ÐµÐ½Ð¾ÑÐ»ÑÐ¾ÑÐµÑÑÐµÐ½ÑÐ½ÑÐ¹ Ð°Ð½Ð°Ð»Ð¸Ð· Ð±ÐµÐ· Ð¸Ð·Ð³Ð¾ÑÐ¾Ð²Ð»ÐµÐ½Ð¸Ñ Ð¾Ð±ÑÐ°Ð·ÑÐ¾Ð² Ð¼Ð¾Ð¶ÐµÑÂ  Ð¸ÑÐ¿Ð¾Ð»ÑÐ·Ð¾Ð²Ð°ÑÑÑÑ Ð´Ð»Ñ ÑÐ»ÐµÐ¼ÐµÐ½ÑÐ½Ð¾Ð³Ð¾ Ð¸ ÑÐ¸Ð¼Ð¸ÑÐµÑÐºÐ¾Ð³Ð¾ Ð°Ð½Ð°Ð»Ð¸Ð·Ð° , Ð¾ÑÐ¾Ð±ÐµÐ½Ð½Ð¾ Ð¿ÑÐ¸ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ð¸ Ð¼ÐµÑÐ°Ð»Ð»Ð¾Ð² , ÑÑÐµÐºÐ»Ð° , ÐºÐµÑÐ°Ð¼Ð¸ÐºÐ¸ Ð¸ ÑÑÑÐ¾Ð¸ÑÐµÐ»ÑÐ½ÑÑ Ð¼Ð°ÑÐµÑÐ¸Ð°Ð»Ð¾Ð², Ð° ÑÐ°ÐºÐ¶Ðµ Ð´Ð»Ñ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ð¹ Ð² Ð¾Ð±Ð»Ð°ÑÑÐ¸ Ð³ÐµÐ¾ÑÐ¸Ð¼Ð¸Ð¸ , ÑÑÐ´ÐµÐ±Ð½Ð¾Ð¹ Ð¼ÐµÐ´Ð¸ÑÐ¸Ð½Ñ , Ð°ÑÑÐµÐ¾Ð»Ð¾Ð³Ð¸Ð¸ Ð¸ Ð¿ÑÐµÐ´Ð¼ÐµÑÐ¾Ð² Ð¸ÑÐºÑÑÑÑÐ²Ð° , ÑÐ°ÐºÐ¸Ñ ÐºÐ°Ðº ÐºÐ°ÑÑÐ¸Ð½Ñ.
description: The given work is devoted to the implementation of the X-ray fluorescence analysis method without the use of standards. Using this method, it is possible to predict the qualitative and quantitative composition of a sample, having only its experimental radiation spectrum. X-ray fluorescence analysis in our work is carried out using the energy dispersive method, which provides good energy resolution in a shorter period of time compared to the wavelength dispersive method. Thanks to the use of the energy dispersion method, we were able to obtain accurate data on the content of various elements in the sample without the need to use a reference for calibration of the device. This greatly simplifies the analysis process and reduces the time spent on preparing and conducting the experiment. X-ray fluorescence analysis without the use of standards can significantly reduce the cost of conducting a sample study. X-ray fluorescence analysis without sample fabrication can be widely used for elemental and chemical analysis, especially in the study of metals, glass, ceramics and building materials, as well as for research in geochemistry, forensic medicine, archaeology and art objects such as paintings.