title: ÐÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ðµ Ð¾Ð¿ÑÐ¸ÑÐµÑÐºÐ¸Ñ ÑÐ²Ð¾Ð¹ÑÑÐ² ÑÐ»ÐµÐºÑÑÐ¾Ð»ÑÐ¼Ð¸Ð½ÐµÑÑÐµÐ½ÑÐ½ÑÑ ÑÐ¾Ð½ÐºÐ¾Ð¿Ð»ÐµÐ½Ð¾ÑÐ½ÑÑ ÑÑÑÑÐºÑÑÑ
title: Ð²ÑÐ¿ÑÑÐºÐ½Ð°Ñ ÐºÐ²Ð°Ð»Ð¸ÑÐ¸ÐºÐ°ÑÐ¸Ð¾Ð½Ð½Ð°Ñ ÑÐ°Ð±Ð¾ÑÐ° Ð±Ð°ÐºÐ°Ð»Ð°Ð²ÑÐ°
titleType: Subtitle
title: Investigation of the optical properties of electroluminescent thin-film structures
Creators: name: Ð§ÐµÐ±Ð¾ÑÐ½Ð¸ÐºÐ¾Ð², ÐÐ¸ÑÐ¸Ð»Ð»
Publisher: name: Ð¡Ð°Ð½ÐºÑ-ÐÐµÑÐµÑÐ±ÑÑÐ³ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ ÐÐµÑÑÐ° ÐÐµÐ»Ð¸ÐºÐ¾Ð³Ð¾
Year: 2022
Subjects: ÑÐ»ÐµÐºÑÑÐ¾Ð»ÑÐ¼Ð¸Ð½ÐµÑÑÐµÐ½ÑÐ½ÑÐµ ÑÐ¾Ð½ÐºÐ¾Ð¿Ð»ÐµÐ½Ð¾ÑÐ½ÑÐµ ÑÑÑÑÐºÑÑÑÑ
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ÑÐ¿ÐµÐºÑÑ Ð¸Ð·Ð»ÑÑÐµÐ½Ð¸Ñ
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Ð½ÐµÐ¾Ð´Ð½Ð¾ÑÐ¾Ð´Ð½Ð¾Ðµ ÑÑÐ¸ÑÐµÐ½Ð¸Ðµ
electroluminescent thin-film structures
lux-voltage characteristics
emission spectrum
luminescence center
inhomogeneous broadening

description: Ð¢ÐµÐ¼Ð° Ð²ÑÐ¿ÑÑÐºÐ½Ð¾Ð¹ ÐºÐ²Ð°Ð»Ð¸ÑÐ¸ÐºÐ°ÑÐ¸Ð¾Ð½Ð½Ð¾Ð¹ ÑÐ°Ð±Ð¾ÑÑ: Â«ÐÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ðµ Ð¾Ð¿ÑÐ¸ÑÐµÑÐºÐ¸Ñ ÑÐ²Ð¾Ð¹ÑÑÐ² ÑÐ»ÐµÐºÑÑÐ¾Ð»ÑÐ¼Ð¸Ð½ÐµÑÑÐµÐ½ÑÐ½ÑÑ ÑÐ¾Ð½ÐºÐ¾Ð¿Ð»ÐµÐ½Ð¾ÑÐ½ÑÑ ÑÑÑÑÐºÑÑÑÂ». ÐÐ°Ð½Ð½Ð°Ñ ÑÐ°Ð±Ð¾ÑÐ° Ð¿Ð¾ÑÐ²ÑÑÐµÐ½Ð° Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ñ Ð¾Ð¿ÑÐ¸ÑÐµÑÐºÐ¸Ñ ÑÐ²Ð¾Ð¹ÑÑÐ² ÑÐ»ÐµÐºÑÑÐ¾Ð»ÑÐ¼Ð¸Ð½ÐµÑÑÐµÐ½ÑÐ½ÑÑ ÑÐ¾Ð½ÐºÐ¾Ð¿Ð»ÐµÐ½Ð¾ÑÐ½ÑÑ ÑÑÑÑÐºÑÑÑ Ð½Ð° Ð¾ÑÐ½Ð¾Ð²ÐµÂ ZnS:Mn, Ð² ÑÐ°ÑÑÐ½Ð¾ÑÑÐ¸ Ð¸Ð·ÑÑÐµÐ½Ð¸Ðµ Ð»ÑÐºÑ-Ð²Ð¾Ð»ÑÑÐ½ÑÑ ÑÐ°ÑÐ°ÐºÑÐµÑÐ¸ÑÑÐ¸Ðº Ð¸ Ð¿Ð¾Ð»ÑÑÐµÐ½Ð¸Ðµ ÑÐ¿ÐµÐºÑÑÐ¾Ð² Ð¸Ð·Ð»ÑÑÐµÐ½Ð¸Ñ Ð¾Ð±ÑÐ°Ð·ÑÐ¾Ð². ÐÐ°Ð´Ð°ÑÐ¸, ÐºÐ¾ÑÐ¾ÑÑÐµ ÑÐµÑÐ°Ð»Ð¸ÑÑ Ð² ÑÐ¾Ð´Ðµ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ñ: ÐÐ·ÑÑÐµÐ½Ð¸Ðµ ÑÐ°Ð±Ð¾ÑÑ ÑÑÑÐ°Ð½Ð¾Ð²ÐºÐ¸ Ð¸ Ð¾ÑÐ²Ð¾ÐµÐ½Ð¸Ðµ ÑÐµÑÐ½Ð¸ÐºÐ¸ Ð¸Ð·Ð¼ÐµÑÐµÐ½Ð¸Ñ Ð»ÑÐºÑ-Ð²Ð¾Ð»ÑÑÐ½ÑÑ ÑÐ°ÑÐ°ÐºÑÐµÑÐ¸ÑÑÐ¸Ðº. ÐÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ðµ Ð¿Ð°ÑÐ°Ð¼ÐµÑÑÐ¾Ð² Ð¸Ð·Ð»ÑÑÐµÐ½Ð¸ÑÂ TFEL-ÑÑÑÑÐºÑÑÑÑ Ð½Ð° Ð¾ÑÐ½Ð¾Ð²ÐµÂ ZnS:Mn: Ð»ÑÐºÑ-Ð²Ð¾Ð»ÑÑÐ½ÑÑ ÑÐ°ÑÐ°ÐºÑÐµÑÐ¸ÑÑÐ¸ÐºÐ¸, ÑÐ¿ÐµÐºÑÑÐ¾Ð² Ð¸Ð·Ð»ÑÑÐµÐ½Ð¸Ñ. Ð ÑÐ¾Ð´Ðµ Ð´Ð°Ð½Ð½Ð¾Ð¹ ÑÐ°Ð±Ð¾ÑÑ Ð¿ÑÐ¾Ð²ÐµÐ´ÐµÐ½ ÐºÐ¾Ð¼Ð¿Ð»ÐµÐºÑ Ð¸Ð·Ð¼ÐµÑÐµÐ½Ð¸Ð¹ Ð¾Ð¿ÑÐ¸ÑÐµÑÐºÐ¸Ñ ÑÐ°ÑÐ°ÐºÑÐµÑÐ¸ÑÑÐ¸Ðº Ð¾Ð±ÑÐ°Ð·ÑÐ¾Ð². ÐÐ±ÑÐ°Ð±Ð¾ÑÐºÐ° Ð²ÑÐµÑ Ð´Ð°Ð½Ð½ÑÑ Ð¿ÑÐ¾Ð²Ð¾Ð´Ð¸Ð»Ð°ÑÑ Ð² Ð¿ÑÐ¾Ð³ÑÐ°Ð¼Ð¼ÐµÂ OriginProÂ 2018. ÐÐ½Ð°Ð»Ð¸Ð· ÑÐºÑÐ¿ÐµÑÐ¸Ð¼ÐµÐ½ÑÐ°Ð»ÑÐ½ÑÑ Ð³ÑÐ°ÑÐ¸ÐºÐ¾Ð² Ð¿Ð¾ÐºÐ°Ð·Ð°Ð» Ð¼Ð¾Ð½Ð¾ÑÐ¾Ð½Ð½ÑÐ¹ ÑÐ¾ÑÑ Ð¸Ð½ÑÐµÐ½ÑÐ¸Ð²Ð½Ð¾ÑÑÐ¸ Ð¸Ð·Ð»ÑÑÐµÐ½Ð¸Ñ Ð² Ð·Ð°Ð²Ð¸ÑÐ¸Ð¼Ð¾ÑÑÐ¸ Ð¾Ñ Ð²ÐµÐ»Ð¸ÑÐ¸Ð½Ñ Ð¿ÑÐ¸ÐºÐ»Ð°Ð´ÑÐ²Ð°ÐµÐ¼Ð¾Ð³Ð¾ Ð½Ð°Ð¿ÑÑÐ¶ÐµÐ½Ð¸Ñ, Ð²Ð»Ð¸ÑÐ½Ð¸Ðµ ÑÐµÐ½ÑÑÐ¾Ð² Ð»ÑÐ¼Ð¸Ð½ÐµÑÑÐµÐ½ÑÐ¸Ð¸ Ð½Ð° ÑÐ¿ÐµÐºÑÑ Ð¸Ð·Ð»ÑÑÐµÐ½Ð¸Ñ Ð¸ÑÑÐ»ÐµÐ´ÑÐµÐ¼Ð¾Ð³Ð¾ Ð¾Ð±ÑÐ°Ð·ÑÐ°. Ð ÑÐ²ÑÐ·Ð¸ Ñ Ð´Ð°Ð½Ð½ÑÐ¼Ð¸ ÑÐ°ÐºÑÐ°Ð¼Ð¸ Ð±ÑÐ»Ð¸ ÑÐ´ÐµÐ»Ð°Ð½Ñ Ð²ÑÐ²Ð¾Ð´ÑÂ Ð¾ ÑÐ¿ÐµÑÐ¸ÑÐ¸ÐºÐµ Ð¼Ð°ÑÐµÑÐ¸Ð°Ð»Ð° Ð¾Ð±ÑÐ°Ð·ÑÐ°,Â ÑÐ°ÑÐ°ÐºÑÐµÑÐ½ÑÑ Ð½Ð°Ð¿ÑÑÐ¶ÐµÐ½Ð¸ÑÑ Ð½Ð°ÑÐ°Ð»Ð° ÑÐ²ÐµÑÐµÐ½Ð¸Ñ Ð¸ÑÑÐ»ÐµÐ´ÑÐµÐ¼ÑÑ Ð¾Ð±ÑÐ°Ð·ÑÐ¾Ð² Ð¸ Ð¿Ð¾ÑÐ¾Ð³Ð¾Ð²ÑÑ Ð½Ð°Ð¿ÑÑÐ¶ÐµÐ½Ð¸ÑÑ Ð¿ÑÐ¾Ð±Ð¾Ñ.Â 
description: The subject of the graduate qualification work: "Investigation of the optical properties of electroluminescent thin-film structures". This work is devoted to the study of the optical properties of electroluminescent thin-film structures based on ZnS:Mn, in particular, the study of lux-volt characteristics and obtaining luminescence spectra of samples.Â The goals of the study:Studying the operation of the installation and mastering the technique of measuring lux-volt characteristics. Investigation of the radiative parameters of the TFEL structure based on ZnS:Mn: lux-volt characteristics, emission spectra. In the course of this work, a set of measurements of the optical characteristics of the samples was carried out. All data was processed in the OriginPro 2018 program.The analysis of experimental graphs showed a stable increase in the radiation intensity depending on the magnitude of the applied voltage, the influence of impurity centers on the radiation spectrum of the sample under study. In connection with these facts, conclusions were drawn about the specifics of the sample material, the characteristic stresses of the beginning of the glow of the studied samples and the threshold breakdown stresses.