title: Ð¥Ð°ÑÐ°ÐºÑÐµÑÐ¸Ð·Ð°ÑÐ¸Ñ Ð¾Ð±Ð»ÑÑÐµÐ½Ð½ÑÑ Ð¸ Ð½ÐµÐ¾Ð±Ð»ÑÑÐµÐ½Ð½ÑÑ Ð»Ð°Ð²Ð¸Ð½Ð½ÑÑ Ð´ÐµÑÐµÐºÑÐ¾ÑÐ¾Ð² Ñ Ð½Ð¸Ð·ÐºÐ¸Ð¼ ÐºÐ¾ÑÑÑÐ¸ÑÐ¸ÐµÐ½ÑÐ¾Ð¼ ÑÑÐ¸Ð»ÐµÐ½Ð¸Ñ
title: Ð²ÑÐ¿ÑÑÐºÐ½Ð°Ñ ÐºÐ²Ð°Ð»Ð¸ÑÐ¸ÐºÐ°ÑÐ¸Ð¾Ð½Ð½Ð°Ñ ÑÐ°Ð±Ð¾ÑÐ° Ð¼Ð°Ð³Ð¸ÑÑÑÐ°
titleType: Subtitle
title: Characterization of irradiated and non-irradiated low gain avalanche detectors (LGAD's)
Creators: name: ÐÑÐ¸Ð°Ñ ÐÑÐ½ÑÐ¾Ð·, Ð¥ÑÐ°Ð½
Publisher: name: Ð¡Ð°Ð½ÐºÑ-ÐÐµÑÐµÑÐ±ÑÑÐ³ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ ÐÐµÑÑÐ° ÐÐµÐ»Ð¸ÐºÐ¾Ð³Ð¾
Year: 2021
Subjects: ÐÐµÑÐµÐºÑÐ¾ÑÑ
ÐÑÐ¶Ð¸Ð³
Ð Ð°Ð´Ð¸Ð°ÑÐ¸Ð¾Ð½Ð½Ð°Ñ Ñ Ð¸Ð¼Ð¸Ñ
Ð»Ð°Ð²Ð¸Ð½Ð½ÑÐµ Ð´ÐµÑÐµÐºÑÐ¾ÑÑ
Ð°Ð´ÑÐ¾Ð½Ð½Ð¾Ðµ Ð¾Ð±Ð»ÑÑÐµÐ½Ð¸Ðµ
Ð²Ð¾Ð»ÑÑ-ÑÐ°ÑÐ°Ð´Ð½ÑÐµ Ñ Ð°ÑÐ°ÐºÑÐµÑÐ¸ÑÑÐ¸ÐºÐ¸
Ð¼ÐµÑÐ¾Ð´ Ð¿ÐµÑÐµÑ Ð¾Ð´Ð½ÑÑ ÑÐ¾ÐºÐ¾Ð²
ÑÐ°Ð´Ð¸Ð°ÑÐ¸Ð¾Ð½Ð½Ð°Ñ ÑÑÐ¾Ð¹ÐºÐ¾ÑÑÑ
ÐÐ¾Ð¼Ð¿Ð°ÐºÑÐ½ÑÐ¹ ÐÑÐ¾Ð½Ð½ÑÐ¹ Ð¡Ð¾Ð»ÐµÐ½Ð¾Ð¸Ð´
Ð¾ÑÐ¶Ð¸Ð³
avalanche detectors
hadron irradiation
capacitance-voltage characteristics
transient current technique
radiation hardness
Compact Muon Solenoid
annealing

description: Ð¦ÐµÐ»Ñ ÑÑÐ¾Ð¹ ÑÐ°Ð±Ð¾ÑÑ Ð·Ð°ÐºÐ»ÑÑÐ°ÐµÑÑÑ Ð² ÑÐ¾Ð¼, ÑÑÐ¾Ð±Ñ Ð¾ÑÐ°ÑÐ°ÐºÑÐµÑÐ¸Ð·Ð¾Ð²Ð°ÑÑ ÑÐ°Ð´Ð¸Ð°ÑÐ¸Ð¾Ð½Ð½ÑÑ ÑÑÐ¾Ð¹ÐºÐ¾ÑÑÑ Ð¿Ð¾ÑÐ»ÐµÐ´Ð½ÐµÐ¹ Ð¿Ð°ÑÑÐ¸Ð¸ Ð´ÐµÑÐµÐºÑÐ¾ÑÐ¾Ð², Ð¿ÑÐ¾Ð¸Ð·Ð²ÐµÐ´ÐµÐ½Ð½ÑÑ Â«FondazioneBrunoKesslerÂ» (FBK):UFSD3.2 Ð¸ HamamatsuphotonicsK.K. (HPK): HPK-P2, ÑÑÐ°Ð²Ð½Ð¸Ð² Ð¸Ñ Ð²Ð¾Ð»ÑÑ-ÑÐ°ÑÐ°Ð´Ð½ÑÐµ ÑÐ°ÑÐ°ÐºÑÐµÑÐ¸ÑÑÐ¸ÐºÐ¸ Ð´Ð¾ Ð¸ Ð¿Ð¾ÑÐ»Ðµ Ð°Ð´ÑÐ¾Ð½Ð½Ð¾Ð³Ð¾ Ð¾Ð±Ð»ÑÑÐµÐ½Ð¸Ñ Ð¿ÑÐ¸ ÑÐ°Ð·Ð½ÑÑ ÑÐ»ÑÐµÐ½ÑÐ°Ñ. Ð¢ÐµÑÑÑ ÑÑÑÐ¾Ð¹ÑÐ¸Ð²Ð¾ÑÑÐ¸ Ð¿Ð¾ÐºÐ°Ð·Ð°Ð»Ð¸ Ð¿ÑÐ¸Ð±Ð»Ð¸Ð·Ð¸ÑÐµÐ»ÑÐ½ÑÐµ Ð·Ð½Ð°ÑÐµÐ½Ð¸Ñ ÑÐ°Ð´Ð¸Ð°ÑÐ¸Ð¾Ð½Ð½Ð¾Ð¹ ÑÑÐ¾Ð¹ÐºÐ¾ÑÑÐ¸ Ðº Ð°Ð´ÑÐ¾Ð½Ð½Ð¾Ð¼Ñ Ð¾Ð±Ð»ÑÑÐµÐ½Ð¸Ñ. ÐÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ñ Ð¾ÑÐ¶Ð¸Ð³Ð° Ð¿ÑÐ¾Ð´ÐµÐ¼Ð¾Ð½ÑÑÑÐ¸ÑÐ¾Ð²Ð°Ð»Ð¸ Ð¿Ð¾Ð»Ð¾Ð¶Ð¸ÑÐµÐ»ÑÐ½ÑÐµ ÑÑÑÐµÐºÑÑ ÑÑÐ¾Ð³Ð¾ Ð¿ÑÐ¾ÑÐµÑÑÐ° Ð½Ð° Ð´ÐµÑÐµÐºÑÑ, Ð²ÑÐ·Ð²Ð°Ð½Ð½ÑÐµ ÑÐ°Ð´Ð¸Ð°ÑÐ¸ÐµÐ¹. ÐÐµÑÐ¾Ð´ Ð¿ÐµÑÐµÑÐ¾Ð´Ð½ÑÑ ÑÐ¾ÐºÐ¾Ð² Ð±ÑÐ» Ð¸ÑÐ¿Ð¾Ð»ÑÐ·Ð¾Ð²Ð°Ð½, ÑÑÐ¾Ð±Ñ Ð¾Ð¿ÑÐµÐ´ÐµÐ»Ð¸ÑÑ ÑÑÐ½ÐºÑÐ¸Ð¾Ð½Ð°Ð»ÑÐ½Ð¾ÑÑÑ Ð´ÐµÑÐµÐºÑÐ¾ÑÐ¾Ð² Ð¿Ð¾ÑÐ»Ðµ Ð¾Ð±Ð»ÑÑÐµÐ½Ð¸Ñ, Ð° ÑÐ°ÐºÐ¶Ðµ, ÑÑÐ¾Ð±Ñ Ð¾Ð¿ÑÐµÐ´ÐµÐ»Ð¸ÑÑ Ð¼ÐµÐ¶Ð´ÐµÑÐµÐºÑÐ¾ÑÐ½ÑÐµ ÑÐ°ÑÑÑÐ¾ÑÐ½Ð¸Ñ Ð² Ð¾Ð±ÑÐ°Ð·ÑÐ°Ñ Ð¸ Ð²ÑÑÐ¸ÑÐ»Ð¸ÑÑ ÐºÐ¾ÑÑÑÐ¸ÑÐ¸ÐµÐ½Ñ Ð·Ð°Ð¿Ð¾Ð»Ð½ÐµÐ½Ð¸Ñ. ÐÐµÐºÐ¾ÑÐ¾ÑÑÐµ Ð¸Ð· Ð¿Ð¾Ð»ÑÑÐµÐ½Ð½ÑÑ ÑÐµÐ·ÑÐ»ÑÑÐ°ÑÐ¾Ð² Ð±ÑÐ»Ð¸ ÑÑÐ°Ð²Ð½ÐµÐ½Ñ Ñ Ð¸Ð·Ð¼ÐµÑÐµÐ½Ð¸ÑÐ¼Ð¸ Ð¿ÑÐµÐ´ÑÐ´ÑÑÐ¸Ñ Ð¿Ð°ÑÑÐ¸Ð¹ Ð´ÐµÑÐµÐºÑÐ¾ÑÐ¾Ð² HPK Ð¸ FBK, Ñ ÑÐµÐ»ÑÑ Ð¾ÑÐµÐ½Ð¸Ð²Ð°Ð½Ð¸Ñ ÑÐ»ÑÑÑÐµÐ½Ð¸Ñ Ð½Ð¾Ð²Ð¾Ð³Ð¾ Ð¿Ð¾ÐºÐ¾Ð»ÐµÐ½Ð¸Ñ Ð´ÐµÑÐµÐºÑÐ¾ÑÐ¾Ð². ÐÑÐµ Ð¸Ð·Ð¼ÐµÑÐµÐ½Ð¸Ñ Ð¸ ÑÐ²ÑÐ·Ð°Ð½Ð½ÑÐµ Ñ Ð½Ð¸Ð¼Ð¸ Ð´ÐµÐ¹ÑÑÐ²Ð¸Ñ Ð±ÑÐ»Ð¸ Ð¿ÑÐ¾Ð²ÐµÐ´ÐµÐ½Ñ Ð² ÐÐµÑÐµÐºÑÐ¾ÑÐ½Ð¾Ð¹ ÐÐ°Ð±Ð¾ÑÐ°ÑÐ¾ÑÐ¸Ð¸ Ð¤Ð¸Ð·Ð¸ÑÐµÑÐºÐ¾Ð³Ð¾ ÐÐ½ÑÑÐ¸ÑÑÑÐ° Ð¥ÐµÐ»ÑÑÐ¸Ð½ÐºÐ¸, Ð² ÐºÐ°ÑÐµÑÑÐ²Ðµ ÑÐ»ÐµÐ½Ð° Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°ÑÐµÐ»ÑÑÐºÐ¾Ð¹ Ð³ÑÑÐ¿Ð¿Ñ Ð¾Ð±Ð½Ð¾Ð²Ð»ÐµÐ½Ð¸Ñ ÐÐ¾Ð¼Ð¿Ð°ÐºÑÐ½Ð¾Ð³Ð¾ ÐÑÐ¾Ð½Ð½Ð¾Ð³Ð¾ Ð¡Ð¾Ð»ÐµÐ½Ð¾Ð¸Ð´Ð°.
description: The objective of this work was to characterize the radiation hardness of the Fondazione Bruno Kessler (FBK) Ultra-Fast Silicon Detectors (UFSD) UFSD3.2 and the Hamamatsu photonics K.K. (HPK-P2) batches by comparing their capacitance-voltage characteristics before and after hadron irradiation at different fluence values. Stability tests gave an estimate of the hadron radiation hardness and the annealing studies showed the effect of beneficial annealing on the radiation damage. Transient current technique (TCT) was utilized to determine the operability of the sensors after the irradiation, and it was also used for determining the interpad distances and fill factor. Some of the results were compared with measurements from the previous HPK sensor batch and with previous measurements from FBK UFSD3.1 batch, with the objective of getting an estimate of the detectors enhanced performance. All measurements and related activities were carried out at the Helsinki Institute of Physics (HIP) Detector Laboratory as a member of the Compact Muon Solenoid (CMS) upgrade research group.