Gaia-ESO Survey: The analysis of high-resolution UVES spectra of FGK-type stars
Creators: name: Smiljanic, R.
name: Korn, A. J.
name: Bergemann, M.
name: Frasca, A.
name: Magrini, L.
name: Masseron, T.
name: Pancino, E.
name: Ruchti, G.
name: Roman, I. San
name: Sbordone, L.
name: Sousa, S. G.
name: Tabernero, H.
name: Tautvaisiene, G.
name: Valentini, M.
name: Weber, M.
name: Worley, C. C.
name: Adibekyan, V. Zh.
name: Prieto, C. Allende
name: Barisevicius, G.
name: Biazzo, K.
name: Blanco-Cuaresma, S.
name: Bonifacio, P.
name: Bragaglia, A.
name: Caffau, E.
name: Cantat-Gaudin, T.
name: Chorniy, Y.
name: de Laverny, P.
name: Delgado-Mena, E.
name: Donati, P.
name: Duffau, S.
name: Franciosini, E.
name: Friel, E.
name: Geisler, D.
name: Hernandez, J. I. Gonzalez
name: Gruyters, P.
name: Guiglion, G.
name: Hansen, C. J.
name: Heiter, U.
name: Hill, V.
name: Jacobson, H. R.
name: Jofre, P.
name: Jonsson, H.
name: Lanzafame, A. C.
name: Lardo, C.
name: Ludwig, H. G.
name: Maiorca, E.
name: Mikolaitis, S.
name: Montes, D.
name: Morel, T.
name: Mucciarelli, A.
name: Munoz, C.
name: Nordlander, T.
name: Pasquini, L.
name: Puzeras, E.
name: Recio-Blanco, A.
name: Ryde, N.
name: Sacco, G.
name: Santos, N. C.
name: Serenelli, A. M.
name: Sordo, R.
name: Soubiran, C.
name: Spina, L.
name: Steffen, M.
name: Vallenari, A.
name: Van Eck, S.
name: Villanova, S.
name: Gilmore, G.
name: Randich, S.
name: Asplund, M.
name: Binney, J.
name: Drew, J.
name: Feltzing, S.
name: Ferguson, A.
name: Jeffries, R.
name: Micela, G.
name: Negueruela, I.
name: Prusti, T.
name: Rix, H-W.
name: Alfaro, E.
name: Babusiaux, C.
name: Bensby, T.
name: Blomme, R.
name: Flaccomio, E.
name: Francois, P.
name: Irwin, M.
name: Koposov, S.
name: Walton, N.
name: Bayo, A.
name: Carraro, G.
name: Costado, M. T.
name: Damiani, F.
name: Edvardsson, B.
name: Hourihane, A.
name: Jackson, R.
name: Lewis, J.
name: Lind, K.
name: Marconi, G.
name: Martayan, C.
name: Monaco, L.
name: Morbidelli, L.
name: Prisinzano, L.
name: Zaggia, S.
Publisher: name: arXiv
Year: 2014
Subjects: subject: Solar and Stellar Astrophysics (astro-ph.SR)
subject: FOS: Physical sciences
subject: FOS: Physical sciences

description: The Gaia-ESO Survey is obtaining high-quality spectroscopic data for about 10^5 stars using FLAMES at the VLT. UVES high-resolution spectra are being collected for about 5000 FGK-type stars. These UVES spectra are analyzed in parallel by several state-of-the-art methodologies. Our aim is to present how these analyses were implemented, to discuss their results, and to describe how a final recommended parameter scale is defined. We also discuss the precision (method-to-method dispersion) and accuracy (biases with respect to the reference values) of the final parameters. These results are part of the Gaia-ESO 2nd internal release and will be part of its 1st public release of advanced data products. The final parameter scale is tied to the one defined by the Gaia benchmark stars, a set of stars with fundamental atmospheric parameters. A set of open and globular clusters is used to evaluate the physical soundness of the results. Each methodology is judged against the benchmark stars to define weights in three different regions of the parameter space. The final recommended results are the weighted-medians of those from the individual methods. The recommended results successfully reproduce the benchmark stars atmospheric parameters and the expected Teff-log g relation of the calibrating clusters. Atmospheric parameters and abundances have been determined for 1301 FGK-type stars observed with UVES. The median of the method-to-method dispersion of the atmospheric parameters is 55 K for Teff, 0.13 dex for log g, and 0.07 dex for [Fe/H]. Systematic biases are estimated to be between 50-100 K for Teff, 0.10-0.25 dex for log g, and 0.05-0.10 dex for [Fe/H]. Abundances for 24 elements were derived: C, N, O, Na, Mg, Al, Si, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Y, Zr, Mo, Ba, Nd, and Eu. The typical method-to-method dispersion of the abundances varies between 0.10 and 0.20 dex.
description: 39 pages, A&amp;A accepted