Title: Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. /
Authors: Thompson, C. V.; Lloyd, J. R.
Publisher: Materials Research Society,
Year: 1992
Subjects: Microelectronics Reliability Congresses.; Microelectronics Materials Testing Congresses.; Electrodiffusion Congresses.; Microstructure Congresses.