Title: Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes /
Authors: Sher, Alvin H.; U.S. Atomic Energy Commission
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Year: 1975
Subjects: Germanium diodes Defects.; Silicon diodes Defects.; Infrared technology