Title: Methods of surface analysis : techniques and applications /
Authors: Walls, J. M.
Publisher: Cambridge University Press,
Year: 1989
Subjects: Surfaces (Technology) Analysis; Surface Properties; Spectrum Analysis; Mass Spectrometry
Contents: Methods of surface analysis / J.M. Walls -- Ion erosion in surface analysis / R. Smith and J.M. Walls -- Electron and ion energy analysis / M.P. Seah -- Auger electron spectroscopy / H.E. Bishop -- X-ray photoelectron spectroscopy / A.B. Christie -- Static secondary ion mass spectroscopy / J.C. Vickerman -- Dynamic secondary ion mass spectrometry / D.E. Sykes -- Ion scattering spectroscopy / D.G. Armour -- Rutherford back-scattering spectrometry / W.A. Grant.