Title: Ultraviolet and X-ray detection, spectroscopy, and polarimetry III : 19-20 July 1999, Denver, Colorado /
Authors: Fineschi, Silvano.; Woodgate, Bruce.; Kimble, Randy A.; Kimble, Randy A.; Society of Photo-optical Instrumentation Engineers.
Publisher: SPIE,
Year: 1999
Subjects: Polarimetry Congresses.; X-ray astronomy Instruments Congresses; Ultraviolet astronomy Instruments Congresses.; Ultraviolet detectors Congresses.