Metrology and Nanometrology at Agricultural/Food/Nutraceutical
Interface: An Updated Shot
Authors: Santini Antonello , Souto Eliana B. , Zielińska Aleksandra , Santos Beatriz , Silva Margarida , Fernandes Christophe , Silva A. R. , Durazzo Alessandra , Lucarini Massimo , Eder Piotr 
Published: May 2022

Abstract:
Nanometrology has been considered as a key to the future of nanotechnology since recently. It is particularly important for nanoparticle market development that is commonly applied in dif-ferent areas of science. The adoption of nanotechnologies in food and agrochemical industries represents a new frontier, with particular regard to plant defence against pathogen agents. Na-nometrology deals with a broad range of measurements, as well as chemical and structural characterization, electronic, thermal, and mechanical properties, fabrication and monitoring of nanodevices, and theoretical modelling of nanomaterials properties. Besides the scientific and technological values of a global standard offered by nanometrology, there are also several in-dustry-related values. In this paper, the most common the areas of science emphasized on the most frequently applied methods by the example of techniques/tools that have been described from a metrological standpoint at a nano size scale. Therefore, at the microscopic scale may be widely applied: optical techniques, for example, X-ray Photoelectron Spectroscopy (XPS), or op-tical transmission. Moreover, Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Spectroscopy (EDX) can be used for microscopic characterization, while Scanning Probe Micros-copy (SPM), consisting of Scanning-Tunnelling Microscopy (STM) and Atomic Force Microscopy (AFM), as well as Transmission-Electron Microscopy (TEM), can be employed at the nanoscopic scale. The review has also mentioned about Secondary Ion Mass Spectroscopy (SIMS) to analyze secondary ions using a mass spectrometer. In addition, Electron Energy Loss Spectroscopy (EELS) using high-energy electrons from sample penetration or Fourier Transform Infrared Spectroscopy (FTIR) to obtain the infrared spectrum of a sample were also presented. Particle size analysis can be analyzed by performing Small-/Wide-Angle X-ray Scattering (SAXS/WAXS) and Dynamic Light Scattering (DLS) techniques. A specific metrology approach is required for most nanoparticle-based products, that is, the way nanometrology is significant for production quality control and for toxicology studies. This review wants to give an updated shot on the metrological approaches and applications, with particular attention to nanometrology for dif-ferent areas of scientific research, i.e., food, agricultural, nutraceutical, biological and medical ones. The novelty character of this paper is to discuss the application of nanotechnologies under metrological principles and approach at the interface of different integrated, multipurpose and multidisciplinary application fields. The following topics are here explored: i) metrology: defi-nitions, principles, and main features; ii) calibration methods and techniques; iii) measurement methods and systems; iv) proficiency testing; v) nanometrology. Particularly, nanometrology was highlighted in the following directions: significance of the nanodimension, nanometrology in chemical research, nanometrology for the characterization of nanoparticles, nanometrology in biological and medical sciences, mechanical nanometrology, electrical nanometrology and applications of nanometrology in agriculture and food industry.