bluuebunny/crossref_metadata_2025_split huggingface dataset:
High intensity excitation sources for X‐ray energy spectroscopy
Authors: Porter D. E. 
Published: May 2005

AbstractThe use of secondary targets with commercially available high power X‐ray spectroscopy tubes has been investigated as a means of providing an excitation source for X‐ray energy spectroscopy. A comparison has been made between the secondary target mode of excitation and the use of the tube directly. Results from this comparison show the superiority of the secondary target technique. Examples of analysis using the secondary target excitation are given to illustrate the high data rates and low background this technique has to offer.
A new approach to the study and control of interelement effects in the X‐ray fluorescence analysis of metal alloys and other multi‐component systems
Authors: Tertian R. 
Published: May 2005

AbstractAccurate fluorescent intensities of a number of binary and ternary alloys have been calculated by relying on the classical expressions of primary and secondary fluorescence and assuming standard spectral intensity distributions for the primary radiation. It could then be shown that under polychromatic excitation the enhancement effect on the one hand, and on the other hand, the absorption effect with the complications (drift of equivalent wavelength) related to polychromatic radiation, became very much alike on practical terms, apart from generally opposed signs. Both effects could then be dealt with in a homogeneous way and a simple method was derived using (K − 1) coefficients ‐ see definition in the text ‐ which are fixed from a careful study of binary compositions.Moreover, making provision for fluorescence ‘crossed effects’, the principle of a general and accurate procedure was then established to the end of computerized non‐destructive analysis. The name of ‘generalized iteration method’ is proposed for this procedure.
The evaluation of the use of a scanning electron microscope combined with an energy dispersive X‐ray analyser for quantitative analysis
Authors: Blum F. , Brandt M. P. 
Published: May 2005

AbstractThis paper describes an evaluation of the use of a scanning electron microscope to perform a rapid total analysis under secondary electron image conditions using a commercial energy dispersive X‐ray analyser. Problems encountered with overlapping intensity peaks and interference by the solid state Si (Li) detector are discussed. Elements heavier than sodium are detectable in metallic and geological samples and the total analysis of oxides requires only pure elements as standards.
Ein Beitrag zur Optimierung der Röntgen‐Spektralanalyse durch Verwendung spezifischer Zählrohrgase
Authors: Loch G. 
Published: May 2005

AbstractBei manchen Analysenproblemen in der RFA reichen das Auflösungsvermogen des Kristalls und die Impulshöhendiskriminierung nicht aus, um den Einfluss von Storlinien zu unterdrücken. In vielen dieser Fälle kann durch Verwendung spezifischer Zählrohrgase eine erhebliche Verbesserung des Signal‐Untergrund‐Verhältnisses erreicht werden.
Computerized correction for element inter‐action in X‐ray fluorescence analysis with special reference to copper, chromium and arsenic in solutions and preserved wood
Authors: Reistad T. , Pettersson B. 
Published: May 2005

AbstractThe Boliden X‐ray computer system is an ‘on‐line’ combination of an X‐ray spectrometer and a computer. With the X‐ray computer system a rapid and accurate determination of copper, chromium and arsenic in solutions and preserved wood has been accomplished. A functional model for interelement corrections has been tested within the actual concentration range 0 to 2%. The 2σ values for the determination of copper, chromium and arsenic have been calculated to ±1%rel. for solutions. The corresponding 2s̀ value for treated wood is ±2.5% rel. of which at least 1.5% is due to the sample preparation error.
A critical survey of mixing, dilution and addition methods and addition methods and possible extensions of the theory. Part I
Authors: Gwozdz R. 
Published: May 2005

AbstractThe commonly used equation relating the intensity of characteristic X‐radiation to the concentration of the element to be determined contains three unknowns. By chanfing the concentration of this element in two additionally prepared samples further data are obained permitting the derivation of two more equations. Solution of these three equations by algebraic or graphical methods yields the concentration of the elemen. Formulae have been derived desribing ten experimental variants of this principle. Three of these formulae are similar to those described by sherman and Tertian. The other two describe the semi‐emipirical methods of addition, and mixing‐dilution developed by Jones.The experimental data for eleven elements involving ten kα lines, two Kβ lines and one Lα line were obtained using two X‐ray units. The samples were investigated in the form cf liquid, powder pellet, glass disc and powdered glass disc. Only the three most general formulae have used in the calculations. Results show absolute percentage deviations within 1 to 3%.
The on‐stream analysis of hematite ore fractions using radioisotopes
Authors: Reed D. J. , Dalton J. L. , Gillieson A. H. 
Published: May 2005

AbstractHematite ore fractions in the form of circulating slurries of various solids content were analyzed for iron and silicon, their principal metallic constituents, to determine the relationships and factors significant to such analyses. Radioisotopes were used to excite the characteristic radiations which were measured nondispersively. Counts were also taken for the exciting radiations.The measured intensities for Fe Kα and Si Kα were corrected by backscatter and absorption factors derived by the comparison of counts from the slurries to those from water. Regression lines were used to convert all counts to a 40% solid basis.The iron content of the ore fractions was determined with a standard error of less than 2%. The determination of silicon was not satisfactory at low concentrations because all components of the slurries absorb Si Kα strongly.
Determination of overall system efficiency of an energy dispersive X‐ray fluorescence spectrometer using a bremsstrahlung exciting source
Authors: Cothern C. R. , Manuel H. L. , Millette R. J. 
Published: May 2005

AbstractFour independent techniques for quantitatively calibrating an energy dispersive X‐ray fluorescence system are compared. These include commercially available powder standards, vacuum deposited standards, laboratory developed powder standards and a semi‐theoretical method. A technique is presented for using the latter method in the case where the exciting radiation is bremsstrahlung. These methods are discussed and their resulting efficiency values compared. The most complete, most reliable and easiest method is the semi‐theoretical method. Single compound powders of standard chemicals can be used one at a time for periodic checks of the system.
An X‐ray fluorescence method for analysis of lead zirconate‐titanate compositions
Authors: Murata Michihiro 
Published: May 2005

AbstractAn X‐ray fluorescence method for the determinatios of lead, titanium, zirconium and strontium oxides in lead zirconate‐titanate has been developed. The method is a simple empirical correction procedure and requires only one standard containing all the elements analyzed. Moreover, the method does not require prior determination of correction factors obtained by a complex calculation, a multiple regression procedure, or from use of a considerable number of well analyzed standards.
A method for predicting X‐ray fluorescence anomalies in multiphase metal alloys
Authors: Kemper M. A. 
Published: May 2005

AbstractThe problem presented by a multiphase metal system is studied, where one element is able to migrate from one phase of the alloy to another due to different states of heat treatment. The experimental work was performed on the simple Al + Si system; the results demonstrate that in extreme cases relative analytical errors of 400% may be accumulated if the ‘metallurgical history’ of sample and standard is neglected. The Claisse‐Samson particle size formulae for powder samples are applied to the grain size of the phases present in the allows with good agriment, and may be used to predict whether analytical problems are to be expected.
On obtaining consistent solutions of the equations for quantitative analysis by X‐ray fluorescence spectrometry
Authors: Boniforti R. , Buffoni G. , Colella C. , Riccardi R. 
Published: May 2005

AbstractMany of the equation systems proposed for calculating elemental composition by X‐ray fluoresence spectrometry are overdetermined. In the present work an attempt has been made to overcome this difficulty by reducing the problem outlined to an eigenvalue one.
Eine Methode Zur eichprobenfreien quantitativen Röntgenfluoreszenzanalyse
Authors: Drabseh Salih 
Published: May 2005

AbstractEs wird eine Methods zur eichprobenfreien Rötgenfluoreszenzanalyse beschrieben. Der Vergleich mit Reinelementstandards kann dabci entfallen, da das Zählratenverhältnis von je zwei Reinelementen als Gerätefunktion definiert wird. Durch Verwendung der Zählratenverhältnisse jeweils zweier Elemente der unbekannten Probe wird zusammen mit der Methode des variablen Beobachtungswinkels die quantitaive Zusammensetzung erhalten.
Préparation Automatisée de Perles pour l'Analyse par la Fluorescence de Rayons X
Authors: Wittmann A. , Chmeleff J. , Herrmann H. 
Published: May 2005

AbstractDescription d'un appareil automatique de préparation des échantillons pour l'analyse par fluorescence de rayons X, La technique est basée sur la mise en soluation solide de l'échantillon en uve de l'obtention d'une perle directement analysable.L'appreil est composé de deux fours HF, I'un pourla fusion, I'autre pour la coulée Les récipients de fusion et de coulée sont en alliage platine+ or+ rhodium. La seéquence automatique de préparation dure huit minutes.Une application á I'anlyse de minerais de fer reches par miscen solution dens le tétraborate de sodium illustre les reproductibilités de préparation que I'on peut atteindre avec ce matériel (écart type de reproductibiliteé égal á 0,15% de Fe au niveau de 60%).
X‐ray spectrometry of Al + Ni powder compacts and alloy thin films
Authors: Duz̆ević D. , Gaćes̆a T. 
Published: May 2005

AbstractThis paper reports on expeeriments to determine the composition of thin aluminium + nickel films. The techniques used were similar to those described by both Rhodin and Weyl but for reasons of simplification of the calculations involved, the effective wavelength concept was employed. Fluorescence measurements were also made on aluminium + nickel powder compacts of known composition. The comparison of measured intensities from powder compacts and thin films revealed a strong particle size intensity dependence.
A time saving approach to peak spectra analysis
Authors: Grote R. , Cothern C. R. 
Published: May 2005

AbstractIn X‐ray fluorescence, as well as other quantitative methods for determining trace metal concentrations, computer methods for extracting characteristic peaks from background are very important. Cases where background is large and nonlinear, or there are overlapping peaks, present difficulties in the development of simple computer programs which give an accurate analysis of the peak. The method of analysis that will be described here was developed to meet these demands. The basic concept is simple, and good accuracy and reproducibility are achieved in samples with large nonlinear background, as well as overlapping peaks. The analysis is essentially independent of background.
Experiences with automated X‐ray fluorescence spectrometry in the analysis of refractory metals
Authors: Ortner H. M. , Lassner E. , Hertroys P. 
Published: May 2005

AbstractThis paper reflects three years' experience on the part of two of the authors with the Philips PW 1220/C X‐ray fluorescence spectrometer in combination with the Philips software packages ‘X‐ray 21’ and ‘X‐ray 10’ for the analysis of molybdenum, tungsten and their alloys.Of the ten analysis programs developed, three are discussed in detail. They embrace the determination of main constituents in the region of 100 per cent as well as the determination of traces in the ppm range after trace‐matrix separation. For trace analysis the standard software had to be modified in order to measure several blanks and standards and to overcome other shortcomings in the original program. The arithmetical means of blanks and standards are used for the calculation of linear calibration functions. This new, more versatile X‐ray 10 software package extends the applicability of the standard X‐ray 10 system to trace analysis. It also proved advantageous for the analysis of minor constituents in aqueous solutions.
Analysis of powdered materials by X‐ray fluorescence spectrometry. Evaluation and correction of the interferences
Authors: Frigieri P. , Trucco R. , Caretta E. 
Published: May 2005

AbstractA method is described for the direct quantitative analysis by X‐ray fluorescence spectrometry of some elements in powdered materials collected on inert filters. In order to gain a view of the general applicability of the method, the effects of the interferences due to the nature of the analytical samples were studied and verified, and a possible means of overcoming them is proposed. The principal factors that effect the interference phenomena were found to be variation of the X‐ray path into the sample due to different deposit thickness, different X‐ray beam penetration owing to sample density, and absorption and enhancement of the characteristic radiation by the combining elements. The aim of this work is to propose a method which eliminates the drawbacks due to the matrix absorption effects, whatever their origin. A better understanding of the phenomena, the mathematical treatment of the basic principles and the use of experimental artifices, allowed us to achieve optimized conditions for analysis, suitable for general routine applications.
Indium antimonide as an X‐ray monochromator
Authors: Gohshi Y. , Hirao O. , Murata M. , Tanoue T. , Tsuruoka M. 
Published: May 2005

AbstractA single crystal of indium antimonide (zinc blende type InSb) was evaluated as an X‐ray monochromator. The long 2d spacing of 7.481 Å makes it possible to diffract Si K α in an ordinary X‐ray emission spectrometer. The indium antimonide data were compared with crystals of EDDT, Ge and LiF. Indium antimonide shows seven times higher Si Kα intensity than EDDT. It also has very low second order reflection. A low coefficient of thermal expansion (4.9 × 10−6 °C−1), together with its very stable chemical nature will facilitate high precision measurement ranging from 14Si to 46Pd(Kα), 38Sr to 92U(Lα) and 74W to 92U(Mα).
Nickel‐59 excitation source for X‐ray fluorescence analysis of carbon and low alloy steels
Authors: Gehrke R. J. , Helmer R. G. 
Published: May 2005

AbstractThe use of Nickel‐59 as an excitation source for the X‐ray fluorescence analysis of carbon and low alloy steels has been investigated. Nickel‐59 has a half life of 80 000 y and is essentially a pure source of cobalt K X‐rays. It is ideal as an X‐ray source for field systems because the encapsulated source is small, rugged and requires no external power or maintenance. The prototype system require ∼2½ minutes to obtain a manganese analysis, and 15 minutes to determine vanadium, chromium and manganese concentrations. These times could be shortened about a factor of 40 with a more intense excitation source and a larger area detector. The feasibility of portable field systems is discussed.
Zinc trace analysis in InSb by proton‐induced X‐rays
Authors: Pabst W. , Schmid K. 
Published: May 2005

AbstractThe zinc concentration in an epitaxial layer of InSb was measured by proton excited X‐rays. For the determination of zinc concentration, the X‐ray yield was compared to that from known zinc concentrations. As layer thickness, stopping power and X‐ray absorption must be taken into account, a general mathematical evaluation was developed. In an appendix, the derived equations are shown to allow a layer thickness determination. The calculated values agree quite well with the experimental results.
On obtaining consistent solutions of the equations for quantitative analysis by X‐ray fluorescence spectrometry. A program for use when the power method fails
Authors: Boniforti R. , Buffoni G. , Riccardi R. 
Published: May 2005

AbstractFor the case where the power method fails to give a non‐negative eigenvector for system (1) a program has been set up to calculate all the eigenvalues and eigenvectors of system (1).
Energy dispersion quantitative X‐ray microanalysis on a scanning electron microscope
Authors: Servant Jean‐Michel , Meny Lucienne , Champigny Michel 
Published: May 2005

AbstractIn this work quantitative measurements performed by EDX on SEM, abd by WDX on EPMA are compared. The commerical SEM has been improved by the addition of a beam regulation and an anticontamination device. The spectra are detected by a Si(Li) detector (FWHM = 180 eV) and digitalized by an analog‐to ‐digital converter. The spectra obtained are treated by an on‐line minicomputer PDF 11/05 included in a NS 880 system. A teminal byilt‐in magnetic tape cassette functions as a storage device for the computer. The dialogue between the system and the operator and programmation are possible through a keyboard and a visualization screen. The programs used include: spectrun smoothing, background subtaction selected area totalizing and spectrum stripping. The count rate is maintained at the order of 3000 counts per second to avoid pulse pile up and dead time losses. The experimental intensities are then corrected through a ZAF method by the profgram C ø R on an IBM 360. Binary alloys TiA1, FeA1, ZrNi, NbA1 and TiZr have been studied by K and L lines at different values of the excitation voltage. Alloys MgA1, FeMn and TiVCr Presenting overlapping peaks, and a glass, have also been analysed. The errors, advantages and limits of the method are discussed: in a homgeneous bulk material the minimum detectable limit calculated by C(DL)A = 3I CA/IA is of the order of 0.03 wt % with WDX and 0.2 Wt % with EDX for 100 seconds counting time. It could be improved by increasing the counting time and by using better electronics. The precision of the result is comparable to that obtained by WDX. With EDX on SEM the rapid and simultaneous quentitative micro analysis of all the elements of 11 < Z ≤ 92 can be performed with good precision. This method is very interesting for thin targets and dispersion of precipitates.
Intercomparison of trace element determinations in simulated and real air particulate samples
Authors: Camp David C. , VanLehn Allan L. , Rhodes John R. , Pradzynski Andrej H. 
Published: May 2005

AbstractResults are presented of an intercomparison study involving twenty‐two investigators who collectively used six different analytical techniques. Synthetic dried solution and particulate deposits were prepared and, together with natural aerosol samples, were used for the study. Analytical techniques utilized by the participants were wavelength dispersive X‐ray spectometry, two different energy dispersive X‐ray techniques, atomic absorption spectrometry, emmision spectroscopy and neutron activation analysis. Results showed that energy dispersive X‐ray spectrometry, is a reliabnle technique for the multi‐element analysis of particulate matter collected on filter media. It reported the most elemental determinations per man‐hour invested and provided satisfactory accuracy for the quantitative determination of elements pottassium (Z = 19) and above, with somewhat larger errors for elements down to aluminium (Z = 13). The study demonstrated the need for a better understanding and practical application of particle size corrections for lighter elements. The non X‐ray techniques were neither well represented nor strongly supported by the study.
Theoretical correction of inter‐element effects: System iron + nickel + chromium
Authors: Budesinsky Bret W. 
Published: May 2005

AbstractThe theoretical relationship between relative intensity and concentration is used for the estimation of influence coefficients for the Rasberry‐Heinrich, Claisse‐Quintin and Lachance‐Traill method. Those coefficients are used to evaluate Rasberry‐Heinrich, Beattie‐Brissey and Shiraiva‐Fujino measurements in the system of iron + nickel + chromium. An improved program, printing the average error of calculation per element had containing safeguards to avoid the divergence of iteration, is used for computation. The Rasberry‐Heinrich method gives the best results. Theoretical reasons are given in explanation.
A design to minimize exposure to scattered X‐ray radiation
Authors: Shepard R. L. 
Published: May 2005

AbstractA design is described which conforms to OSHA recommendations for good radiation protection procedures. This design can be used on most units where X‐ray optics are exposed to the atmosphere. It proves sufficient and should make most nonvacuum X‐ray units comply with today's recommended dosage levels. A survey of our instrument gave results well below the maximum permissible level of 2.5 milliröntgen per hour for scattered radiation at a distance five centimeters from the housing surface. The detected scattered radiation was in the range of 0.03 milliröntgen per hour, which is within the limits of normal background radiation.
X‐ray spectroscopic study of some cobalt chalcogenides
Authors: Kondawar V. K. , Mande C. 
Published: May 2005

AbstractThe position, shape and the extended fine structure of the cobalt K absorption discontinuity have been studied in the pure metal and in its four chalcogenides, CoO, CoS, CoSe and CoTe, using a forty centimetre diameter bent crystal X‐ray spectrograph. It has been found that the discontinuity shifts towards the high energy side in the chalcogenides and that the chemical shift ΔE depends upon the effective ionic charge on the absorbing atom. The fine structure within the main discontinuity is discussed on the basis of band structure and molecular orbital diagram, while the extended fine structure is interpreted on Lytle's theory. The results obtained throw light on the chemical bonding prevalent in these compounds.
A method of producing mounted thin windows for X‐ray spectrometer flow counters
Authors: Borley G. D. , Bullen G. , Hara K. O' 
Published: May 2005

AbstractThin windows for X‐ray spectrometer flow counters can be produced by stretching unorientated polypropylene film. A piece of the stretched film is clamped into a holder and pressed onto a copper ring made from thin copper sheeting. The mounted window is then suspended in a high vacuum coating unit and flashed with aluminium to a thickness of approximately 20 nm.