bluuebunny/crossref_metadata_2025_split huggingface dataset:
Factor analysis of AES sputter depth profiles of B, C and N sequentially implanted in silicon
Authors: Morant C. , Prieto P. , Hernández M. J. , Cervera M. , Elizalde E. , Sanz J. M. 
Published: August 2004

AbstractIn this work, a crystalline silicon wafer was sequentially implanted with N+, C+ and $\hbox{BF}_{2}^{+}$ ions of 25, 21 and 77 keV and doses up to 5 × 1017, 1 × 1018 and 5 × 1017 cm−2, respectively. The energies and doses of the respective ions were chosen according to standard simulations to obtain an implanted layer with the appropriate BC2N composition. After that, the sample was annealed at 1200°C for 3 h.The sample has been characterized by Auger electron spectroscopy (AES) depth profiling in order to get a quantitative analysis of the components in the sample. Factor analysis has been used to deconvolute the different chemical states of Si, B, C and N, and to identify different compounds. The analysis of the as‐implanted sample indicates the formation of a quaternary compound with an estimated average composition of SiB0.3C0.6N0.1 in a broad region close to the surface, as well as a ternary compound with an estimated average composition of SiB0.1N0.05 at the interface with the silicon substrate. The major effect induced by the thermal treatment is observed at the interface which shows an out‐diffusion of boron from the interface. Copyright © 2004 John Wiley & Sons, Ltd.
Surface characterization of tungsten and tungsten carbide–cobalt probe materials for a fine‐pitch four‐point probe by variable excitation XPS using synchrotron radiation
Authors: Matsubayashi N. , Singh B. P. , Imamura M. , Tanaka T. , Sato Y. , Ogiwara T. , Suzuki M. , Kiyota S. 
Published: August 2004

AbstractIn the course of the development of a new fine‐pitch four‐point probe, surface oxide layers of the probe material were characterized by a non‐destructive depth profiling analysis with a variable excitation XPS using synchrotron radiation. The high surface sensitivity of this technique has allowed us to measure the ultra‐thin thickness of the oxide layer on the probe material without damage. The XPS of W 4f of the tungsten metal was measured in the excitation x‐ray energy range 100–1200 eV at the Photon Factory (BL‐13C), Tsukuba, Japan and analysed by the simulation of attenuation in the layer models using the values of inelastic mean free path (IMFP) and effective attenuation length (EAL) calculated by the National Institute of Standards and Technology (NIST) database programs 71 and 82, respectively. The values of practical EAL at 1 nm depth were smaller than the IMFP by 20–40% and resulted in a smaller thickness of the surface oxide layer than for that of IMFP by about 20%. The result showed that the thickness of the surface oxide layer of the tungsten metal was 1.0 nm ‘as received’ and 0.5 nm after polish. The XPS of W 4f of the superfine grain (grain size < 0.5 µm) tungsten carbide–cobalt wires with 0.45 mm diameter, which is a probe size of conventional four‐point probes, were measured and the results indicated that the thickness of the surface oxide layer of the tungsten carbide–cobalt was 0.4 nm ‘as received’, and the thickness of the oxide layer was increased to 0.5 nm after polish. The XPS of W 4f of the tungsten carbide–cobalt wire with 0.05 mm diameter of an actual probe for a new fine‐pitch four‐point probe system was also measured and the results indicated that the thickness of the surface oxide layer was 0.6 nm. The XPS of W 4f also indicated the existence of an intermediate thin layer of WO2 between W and WO3. Copyright © 2004 John Wiley & Sons, Ltd.
Depth‐resolved analysis of traffic soot sampled in the vicinity of a German motorway
Authors: Goschnick J. , Natzeck C. , Sommer M. 
Published: August 2004

AbstractParticulate air pollution is caused to a high extent by soot particles arising from traffic. The formation of soot particles and their interaction with the atmosphere usually results in an inhomogeneous depth distribution of its chemical inventory. Because the potential reactivity of the compounds strongly depends on their distance from the surface, the chemical composition at or near the surface is important. Therefore, airborne particles were sampled for depth‐resolved analysis near a busy German motorway. The particles' sizes were classified with a multi‐stage impactor and deposited on indium foil for analysis with plasma‐based secondary neutral mass spectrometry (Plasma‐SNMS), dynamic secondary ion mass spectrometry (SIMS) as well as XPS. At a distance of 2 m from the motorway, the fine particles smaller than 100 nm mainly consisted of carbon and organic hydrogen similar to virgin diesel soot particles produced by a test diesel engine. With increasing particle size, nitrogen, sulfur and oxygen occurred additionally in substantial amounts with a sulfur–oxygen ratio of 1:4. These elements were found in the surface region not deeper than 30 nm predominantly as ammonium sulfate. A minor fraction of the nitrogen was found to be part of nitro‐organic compounds in the surface. Further away from the motorway no virgin soot particles were found. All soot particles (except for minor soil dust contributions) were found covered by the same surface layer as the motorway‐near particles. Copyright © 2004 John Wiley & Sons, Ltd.
Monitoring the environmental degradation of paint dosimeters used to assess risk for fine art paintings on display by XPS
Authors: West R. H. , Odlyha M. , Pratt K. , Roberts A. , Hutton S. 
Published: August 2004

AbstractDegradation mechanisms due to the effect of environmental pollutants on ingredients used in cultural objects such as fine art paint media have been investigated by surface analysis and other methods. Painters have used proteinaceous materials such as egg tempera and resinous additives, for example triterpenoid mastic, for many centuries. These paint components degrade by different mechanisms under the influence of atmospheric pollutants such as nitrogen dioxide. In this study, thin layers of egg tempera and mastic resin layers on quartz crystal microbalances (QCM) have been exposed to nitrogen dioxide at up to 100 ppm for 6 h. Surface characterization before and after exposure has been undertaken by monochromatized Al Kα XPS.Before exposure, egg tempera possesses a surface rich in proteins and phosphatidyl dicholine which forms part of its lipid structure. Unexposed mastic resin coating is chemically less complex than the egg coating. Exposure of egg tempera to nitrogen dioxide causes a reduction in the surface concentration of phosphatidyl dicholine and an increase in fatty acid components at the surface. Exposure of mastic resin to nitrogen dioxide increases carbonyl/hydroxyl surface concentrations. Shifts in the QCM resonance frequencies are correlated with the hydrocarbon content of the coating for a fixed exposure to nitrogen dioxide. Copyright © 2004 John Wiley & Sons, Ltd.
Microchemical investigation of archaeological copper‐based artefacts used for currency in ancient Italy before the coinage
Authors: Ingo G. M. , Angelini E. , De Caro T. , Bultrini G. , Mezzi A. 
Published: August 2004

AbstractBy means of the combined use of XPS and scanning electron microscopy + energy dispersive spectrometry (SEM + EDS), the microchemical structure of long‐term corrosion products grown on Aes Rude, i.e. archaeological unworked lumps of Cu‐based materials, has been carried out. In ancient Italy, these materials have been used as currency, as a medium of exchange and as a form of saving, from the sixth to the third centuries BC before the use of the struck metallic coins. The results of the microchemical investigation disclose their apparently unusable nature for any functional applications or possible use, being constituted of highly ferruginous leaded copper, and demonstrate that Aes Rude were a primitive form of currency as suggested by archaeologists. Furthermore, XPS and SEM + EDS results give evidence on the corroded external region of the presence of Cu (II) hydrates mixed with hydrated iron oxide and aluminium–silicon phases coming from the soil that have been incorporated into the patina. This information is useful to identify the material nature of these archaeological artefacts and to select tailored conservation strategies finalized to ensure long life to these relevant ancient materials. Copyright © 2004 John Wiley & Sons, Ltd.
Combined use of XPS and SEM + EDS for the study of surface microchemical structure of archaeological bronze Roman mirrors
Authors: Ingo G. M. , Angelini E. , De Caro T. , Bultrini G. , Mezzi A. 
Published: August 2004

AbstractBy means of the combined use of XPS and scanning electron microscopy + energy dispersive spectrometry (SEM + EDS) the study of the surface microchemical structure of two archaeological Roman mirrors is carried out in order to obtain useful information to identify the ancient production technology, the degradation state and, further, for understanding the origin of their high chemical stability and appearance. Indeed, one of the selected archaeological bronze mirrors is characterized by a reflecting surface and the other one by a black and uncorroded surface. The results show that via XPS and SEM + EDS, it is possible to obtain detailed elemental composition depth profiles and microstructural information for the outermost layers of these ancient bronze works of art. The results provide good insight into the nature of the external layers showing the presence of different copper–tin phases and lead selective corrosion and depletion phenomena leading to the formation of complex microchemical structures and, further, show the presence of different chemical states of tin as a function of the mirror appearance. Finally, the results indicate that the combined use of XPS and SEM + EDS has significant potential in tailoring the restoration and conservation methodologies of these high‐tin bronze archaeological artefacts. Copyright © 2004 John Wiley & Sons, Ltd.
XPS study of the atmospheric corrosion of copper alloys of archaeological interest
Authors: Hayez V. , Franquet A. , Hubin A. , Terryn H. 
Published: August 2004

AbstractXPS analysis of different forms of copper sulfate, including antlerite, brochantite, posnjakite, chalcanthite and anhydrous copper sulfate, as well as pure copper and its oxides cuprite and tenorite, was carried out. These products most often occur when dealing with atmospheric corrosion of copper and bronze in sulfur‐bearing environments. These compounds were minerals, commercial products, or grown on pure copper by artificial weathering. Spectral features such as peak energy and line shape for Cu 2p, Cu LMM, O 1s and S 2p bands were examined. Comparison of the measurements obtained proves the efficiency of XPS in differentiating the various compounds. Copyright © 2004 John Wiley & Sons, Ltd.
Low‐energy and low‐dose electron irradiation of potassium–lime–silicate glass investigated by XPS. Part II. Chemical bonding
Authors: Zemek J. , Gedeon O. 
Published: August 2004

AbstractXPS has been used to study changes in chemical bonding occurring in a surface region of potassium–lime–silicate glass. The surface was prepared by fracturing in ultrahigh vacuum and step‐by‐step irradiated with low‐energy and low‐dose electron beam. The modified near‐surface region thickness is in this case comparable with the mean sampling depth of XPS. Therefore, possible changes due to electron irradiation could be recorded with high sensitivity. The irradiation resulted in potassium accumulation at the glass surface. As a consequence, changes in surface charging, binding energy shift, peak width (FWHM), and peak area ratios of non‐bridging oxygen (NBO) and bridging oxygen (BO) contributions to the O 1s lines with electron dose were observed. Copyright © 2004 John Wiley & Sons, Ltd.
Use of Auger imaging for three‐dimensional visualization of interface morphology at isoconcentration
Authors: Lahaye M. , Bernard D. , Arvieu C. 
Published: August 2004

AbstractDepth or line profiles on polished sections only provide partial and local information about the chemical distribution at the interface between two solids. Germination and growth, which happen during the reaction phase, can only be explored by a three‐dimensional in‐situ visualization. The most powerful means presently at our disposal are: (i) for non‐destructive analysis, synchrotron microtomography, with a maximum lateral resolution of 0.29 µm (ESRF, European Synchrotron Radiation Facility, Grenoble, France), and, (ii) for destructive analysis, SIMS image reconstruction (resolution 0.2 µm), with a difficult quantitative interpretation.The object of this paper is to demonstrate that a 3D analysis of a series of AES images is possible at an unrivalled spatial resolution (lateral and depth) and coupled with chemical analysis.The interaction between titanium and carbon at moderate temperatures is considered here to illustrate the method. The sample is elaborated from a polished substrate of carbon on which a thin layer of titanium is deposited by PVD. Thereafter the sample has been thermally treated under secondary vacuum.The data set comprises 50 images (squares of side 7 µm) separated by 20 nm, yielding to an analysis volume corresponding to a parallelepiped of 7 × 7 × 1 µm3. On a sample maintained at 450 °C for 30 min, the formation of TiC islands on a thickness of about 100 nm has been observed. Copyright © 2004 John Wiley & Sons, Ltd.
Analysis of labelled gas movements at metal/oxide interfaces by secondary ion mass spectrometry
Authors: Horita Teruhisa , Yamaji Katsuhiko , Kato Tohru , Sakai Natsuko , Yokokawa Harumi 
Published: August 2004

AbstractSIMS imaging analysis was applied to visualize the distribution of active parts for decomposition of CH4 and/or adsorption and reaction with reformed gases (H2, CO, CO2, O2 and C) around metal/oxide interfaces. To analyse the metal/oxide interfaces in a sub‐µm level, mesh‐shape metals were applied on the oxide substrates. The catalytic activity was compared between two samples in the mixture of CH4, 18O2, and D2O: nickel (Ni) on Y2O3‐stabilized ZrO2 (YSZ) and Ni on Sm2O3‐doped CeO2 (SDC). Stable isotope label annealing was conducted at 1073 K for 300 s, and the quenched samples were analysed by SIMS. The SIMS images and line analyses clearly showed the difference of catalytic activity for CH4 decomposition between Ni/YSZ and Ni/SDC samples: a significant carbon deposition was observed at the Ni‐mesh of Ni/YSZ, whereas homogeneous distribution of C was observed on the Ni/SDC surface. The 16O/18O exchange was distinct at the Ni/SDC samples, whereas that reaction was low at the Ni/YSZ sample. Copyright © 2004 John Wiley & Sons, Ltd.
Specular and off‐specular x‐ray reflectivity study of ion irradiated Co/Pt multilayers
Authors: Schug C. , Grimm H. , Berger R. , Dietzel A. , Wormington M. 
Published: August 2004

AbstractCo/Pt thin film superlattices with strong perpendicular anisotropy and out‐of‐plane coercivities of 5–11 kOe were irradiated with Xe+ ions to tailor their magnetic properties. Specular and off‐specular x‐ray reflectivity (XRR) studies were performed to correlate the irradiation‐induced coercivity reduction with changes of the interfacial properties. Off‐specular XRR turned out to be particularly sensitive to the Co/Pt superlattice period. By applying the distorted wave Born approximation to simulate the diffusely scattered intensity, we were able to quantify the vertical roughness correlation throughout the superlattice stack. Study of a Co/Pt multilayer exposed to different Xe+ ion doses suggests that progressive ion bombardment causes a gradual loss of conformality between the different interfaces and a change of the interface morphology, whereas initial vertical RMS roughness values are not affected. Copyright © 2004 John Wiley & Sons, Ltd.
AES, XPS and EDS analyses of an iron‐based magnetic powder and an SMC material
Authors: Mandrino Dj. , Godec M. , Škraba P. , Šuštaršič B. , Jenko M. 
Published: August 2004

AbstractA soft magnetic composite material was prepared from a commercial, iron‐based, soft magnetic powder. Its morphology and composition were examined using SEM, EDS and AES. The flat surface of the sample was found to be of a homogeneous composition, corresponding to the basic soft magnetic powder, whereas phosphorous and zinc were found in the subsurface layers of the sample. These were accessed and probed through the pores in the sample surface. AES and XPS analyses was also performed on non‐compressed soft magnetic powder particles, yielding phosphorous compounds. Copyright © 2004 John Wiley & Sons, Ltd.
The development of a Fe74Si11B14Ni1 soft magnetic powder used for SMC materials
Authors: Godec M. , Remškar M. , Mandrino Dj. , Šuštaršič B. , Jenko M. 
Published: August 2004

AbstractSoft magnetic composites (SMCs) are produced by compressing together soft magnetic powders and a binding insulator material. In some applications these composites are able to replace electrical steel sheets or ferrites. Here we report on the development of an SMC produced from Fe74Si11B14Ni1 alloy powder and a binding epoxy insulator. The Fe74Si11B14Ni1 powder was prepared by water atomization. The surfaces and the microstructures of the amorphous and nanocrystalline powders were investigated by x‐ray photoelectron spectroscopy (XPS), x‐ray diffraction (XRD), scanning electron microscopy (SEM) and high‐resolution transmission electron microscopy (HRTEM). It was found that most of the water‐atomized Fe74Si11B14Ni1 alloy powder particles that were smaller than 40 µm had an amorphous structure with small, isolated nanocrystalline grains. During annealing a completely nanocrystalline structure was obtained. Copyright © 2004 John Wiley & Sons, Ltd.
Interface effects for very thin Al films deposited onto Cu, Si and SiO2 substrates
Authors: Leinen D. 
Published: August 2004

AbstractAl has been deposited by PVD in UHV onto Cu, Si and SiO2 substrates. The film surfaces have been analysed quasi in‐situ by XPS for increasing Al film thickness. At very low coverages, Al shows shifts in binding energy of Al 2p and the modified Auger parameter. These shifts are produced as an effect of the interaction with the substrate and depend on the amount of Al coverage and the type of substrate. They decrease with increasing conductivity of the substrate (SiO2, Si and Cu) and with increasing Al coverage. For thicker Al films the modified Auger parameter tends to its bulk value. Auger parameter shifts are discussed in terms of chemical state plots and the relaxation energy of the photoholes. Copyright © 2004 John Wiley & Sons, Ltd.
Study of structural relaxation in alloys of metallic glasses
Authors: Habibi S. , Soudmand M. 
Published: August 2004

AbstractStructural relaxation in the Fe78Si9B11C2 amorphous alloy has been studied by using length change and microhardness measurements. It is observed that, owing to thermal annealing at low temperatures, the density of the amorphous phase and also its microhardness increases before the start of crystallization. Hence the amorphous meta‐stable phase can be transformed to a more stable amorphous phase, and also its properties can be improved due to thermal annealing at low temperatures. Copyright © 2004 John Wiley & Sons, Ltd.
Bulk‐to‐surface segregation measurements of Sb in Cu(111)(0.08 at.%)Sb and Cu(110)(0.08 at.%)Sb single crystals
Authors: Terblans J. J. , van Wyk G. N. 
Published: August 2004

AbstractUsing Auger electron spectroscopy and the linear temperature ramping technique, the bulk‐to‐surface segregation kinetics of Cu(111)(0.08 at.%)Sb and Cu(110)(0.08 at.%)Sb were measured. From these kinetic measurements the pre‐exponential factor (D0) and the activation energy (Q) were determined and it was clear that the activation energy (Q(111)) for the Cu(111) crystal was 18% higher than the activation energy (Q(110)) for the Cu(110) crystal. These differences in the activation energies are explained in terms of the vacancy formation energy and its dependency on the surface energy. Copyright © 2004 John Wiley & Sons, Ltd.
Solute segregation at grain boundaries of a partially ordered Fe3Al base alloy
Authors: Lejček Pavel , Hofmann Siegfried 
Published: August 2004

AbstractThe equilibrium chemical composition of grain boundaries in a polycrystalline FeAlCr ordered alloy was studied using AES at intergranular fracture surfaces. It was found that the grain boundaries are slightly enriched in aluminium and chromium. The temperature dependence of grain boundary segregation was correlated according to a recently proposed model of grain boundary segregation in ordered alloys that provides the values of enthalpy and entropy of grain boundary segregation of aluminium (ΔHAl0 = −11.5 ± 0.5 kJ/mol, ΔSAl0 = −7.5 ± 0.5 J/mol.K) and chromium (ΔHCr0 = −8 ± 2 kJ/mol, ΔSCr0 = −4 ± 2 J/mol.K) in α‐iron. These values are in agreement with predictions of grain boundary segregation parameters. Copyright © 2004 John Wiley & Sons, Ltd.
The characterization of various chromium carbide compounds in X20CrMoV121 steel
Authors: Skobir Danijela A. , Jenko Monika , Mandrino Djordje 
Published: August 2004

AbstractThe X20CrMoV121 steels, intended for high‐temperature components in power plants, show during thermal and creep exposure in the range of 650 to 800 °C a pronounced change in microstructure. This means that during use in this temperature range virtually all carbon is bound to carbide precipitates.The large particles that at first appear on subgrain boundaries are mainly cementite (Fe3C). When the chromium concentration in cementite rises above the solubility limit, the carbide of type M23C6 is formed with chromium, iron and molybdenum in the cation position M.A systematic investigation of the effect of the annealing temperature in the range from 650 to 800 °C, and for a time of up to 1344 hours, on the evolution of the microstructure and the phase composition of carbide precipitates was performed by SEM and AES. Copyright © 2004 John Wiley & Sons, Ltd.
TEM investigation on top Si layer and buried oxide layer in silicon wafer implanted with low dose at low energy
Authors: Jaroenworaluck A. , Sarmphim P. , Muensit S. , Stevens R. 
Published: August 2004

AbstractMicrostructures of as‐received Si wafers prepared by Separation by Implanted Oxygen (SIMOX) techniques have been investigated by means of high‐resolution transmission electron microscopy (TEM) with interest mainly in the top Si layer and the buried oxide (BOX) layer which were developed in the production process. Cross‐sectional TEM and HRTEM micrographs clearly reveal the existence of thermally produced oxide layers over the Si top interfaces in both the protectively capped and uncapped Si wafers implanted with different doses of oxygen ions at low fixed energy level, and before the annealing process. The thickness of the top Si layer and the BOX layer have been measured and it is apparent that the thickness of these layers relates to the thermally grown oxide layer covering the top Si layer. The TEM analysis allows an understanding and explanation to be made of the different deposition and growth processes of the thermal oxide layers that cover the top Si layers. Copyright © 2004 John Wiley & Sons, Ltd.
Characterization of Er:LiNbO3 and APE:Er:LiNbO3 by RBS–channeling and XRD techniques
Authors: Mackova A. , Groetzschel R. , Eichhorn F. , Nekvindova P. , Špirkova J. 
Published: August 2004

AbstractThe samples of erbium‐doped lithium niobate (Er:LiNbO3) were prepared by the standard Czochralski method and treated by the annealed proton exchange (APE) procedure to create a planar waveguide for further optical application. The positions of Er atoms in the crystal lattice of pristine and APE treated Er:LiNbO3 samples were studied by the Rutherford backscattering spectrometry (RBS)–channeling method. The Er3 + ion positions in the pristine and the APE treated Er:LiNbO3 samples are compared. X‐ray diffraction (XRD) was used to determine the damage to the crystal structure caused by the APE treatment. It was found that the APE treatment leads to significant crystal structure damage and to shifts of the Er3 + ions from their positions in the pristine crystal. Copyright © 2004 John Wiley & Sons, Ltd.