bluuebunny/crossref_metadata_2025_split huggingface dataset:
A combined ISS and XPS investigation of passive film formation on Fe53Ni
Authors: Rossi A. , Calinski C. , Hoppe H.‐W. , Strehblow H.‐H. 
Published: May 2005

AbstractA surface analytical study of the Fe53Ni alloy passivation process in alkaline solution was carried out by ISS (ion scattering spectroscopy) and XPS (x‐ray photoelectron spectroscopy).The ISS depth profiles of the passive films formed in 1MNaOH show an iron‐enriched outer part of the film that is about three monolayers thick and stays on the surface independently of the polarization potential. This finding may be related to the outer hydroxide Fe/Ni film identified by XPS. The inner part of the quasi‐steady‐state passive film is nickel enriched and its thickness grows linearly with the potential. The results obtained by ISS satisfactorily agree with those obtained on the same samples by XPS, which demonstrates that ISS can be used profitably as a semiquantitative tool for the investigation of thin surface layers; in addition, it provides a higher depth resolution than XPS.
Influence of Cu, Ag, Ir and Pt on the work function and near‐surface electron density of Re mass spectrometer filaments
Authors: Baer D. R. , Hubbard C. W. , Gordon R. L. 
Published: May 2005

AbstractThe influence of metal overlayers on the properties of polycrystalline Re mass spectrometer filaments has been examined using contact potential difference (CPD) measurements of the work function, x‐ray photoelectron spectroscopy (XPS) measurements of overlayer binding energy (BE) and ultraviolet photoelectron spectroscopy (UPS) measurements of electron energy distribution curves (EDCs). Work function data for CuRe, AgRe and IrRe are compared to earlier results for AuRe, PdRe and PtRe as part of the effort to understand the influence of surface additions to the work functions of ionization sources. The changes in work function owing to the addition of a metal overlayer do not always follow predictions of bulk electron transfer, such as the Miedema electronegativity. However, the observed changes in work function are consistent with a simple initial‐state understanding of the XPS core‐level data involving charge flow toward and away from the surface. The XPS binding energy shifts are consistent with shifts observed in the valence bands for Cu and Ag on Re.
Estimation of the uncertainties associated with XPS peak intensity determination
Authors: Evans Stephen 
Published: May 2005

AbstractFormulae are presented for estimation of the statistical uncertainties (standard deviations) associated with the peak heights and integrated intensities (areas) required for elemental quantification in XPS in situations where peak overlap is not significant. The situation arising when curve‐resolution procedures are used to separate discrete XPS signals for quantification is discussed, and a simple, rapid, but approximate procedure to estimate standard deviations for both the parameters characterizing the fit and the overall component intensities is developed. Both minimum‐χ2 and unweighted least‐squares procedures are considered. Some difficulties in relation to background subtraction and the inevitable presence of systematic errors in most XPS curve‐fitting procedures are identified and discussed.
Modified procedure of quantitative analysis by AES
Authors: Mrozek P. , Lesiak B. , Jablonski A. 
Published: May 2005

AbstractMuch controversy in the literature is associated with the definitons of terms describing electron transport in solids, i.e. the inelastic mean free path, the attenuation length, the escape depth, etc. This may cause some confusion in determining the corresponding correcting factors for calculations of quantitative AES. There are indications that the proper parameter for the correcting procedure is the inelastic mean free path (IMFP). None the less, difficulties may be encountered in estimating the values of the IMFP for studied samples, particularly for binary or multicomponent systems.A novel procedure of quantitative analysis is proposed in which knowledge of the IMFP is no longer necessary. Actually, the correction procedure normally used requires the ratio of the IMFP for the sample and the standard. One can take advantage of the fact that the IMFP is related to the absolute elastic peak intensity. In that case, determination of the ratio of elastic peak intensities for the sample and the standard makes possible calculation of the ratio of the IMFP. Inasmuch as the measurements of the absolute elastic peak intensities offer considerable experimental difficulties, the determination of the ratio of intensities is relatively easy to perform. Thus, recording the ratio of elastic peak intensities, in addition to the ratio of Auger electron intensities, provides complete information for the correction procedure of quantitative analysis. Such a procedure has two important advantages: the ratio of the IMFP is determined for the studied samples instead of taking these values from the literature, and the actual concentration dependence of the IMFP is accounted for. The calibration plots facilitate recalculation of the ratio of elastic peak intensities to the ratio of the IMFP. Somewhat lengthy calculations are necessary to determine such a plot; however, they are made only once for a given alloy. Application of the proposed method of quantitative analysis is illustrated by using the AuPd alloys.
UPS and XPS study of the polymer/metal interface of poly(2‐methyl‐2‐propenenitrile) electropolymerized on an oxidized nickel surface cathode
Authors: Deniau G. , Viel P. , Lécayon G. , Delhalle J. 
Published: May 2005

AbstractMechanisms of formation and structure of the interface between an oxidized nickel surface and poly(2‐methyl‐2‐propenenitrile) obtained by electropolymerization under cathodic polarization are studied by UPS and XPS spectroscopies. The results suggest that a direct interaction takes place between the monomer molecules and surface metallic sites freed by reduction of the metal oxides. The interface between the metal and the resulting polymer is characterized by the existence of chemical bonds of the carbon–nickel type.
Background removal in x‐ray photoelectron spectroscopy
Authors: Tokutaka Heizo , Ishihara Naganori , Nishimori Katsumi , Kishida Satoru , Isomoto Kazuhiro 
Published: May 2005

AbstractBackground removal from x‐ray photoelectron spectra (XPS) was evaluated using the Shirley method and the Tougaard method. The effect of background removal over a range of kinetic energy was evaluated, and the Tougaard method was found to be effective over a wide energy range. In this paper we report a modification of the Tougaard method that is shown to provide satisfactory background removal from a wide range of XPS data.
Studies of surface composition, structure and oxygen adsorption of Ni3Al(110) by Li+ and He+ ion scattering
Authors: Shen Y. G. , O'Connor D. J. , MacDonald R. J. 
Published: May 2005

AbstractThe surface composition, structure and initial stages of oxygen adsorption of Ni3Al(110) have been investigated by ISS. The surface composition of the Ni3Al(110) surface was determined by Li+ and He+ ion scattering using selected scattering geometries. These results consistently show a surface composition of 50% Ni‐50% Al in the outermost layer with some small percentage of Ni enhancement (perhaps 1–2%), while the second layer is basically Ni. The surface structure has been probed by measuring the intensity of Li+ ion scattering as a function of incident angle along the [001], [112], [111], [332] and [110] azimuthal directions. The interpretation of experimental data is based on the calibrated shadow cone and chain model simulations. The results show that there is no displacement of first‐layer Al relative to first‐layer Ni, but there is a contraction in the first‐to‐second layer spacing of 0.11 ± 0.08 Å. The adsorption of oxygen at low exposure (∼8L) and pressures in the range 2 × 10−8−1 × 10−6 mbar at a temperature of 700°C shows the disappearance of the Ni ISS signal, and the results suggest the formation of a monolayer of an AlOx overlayer. Using a model similar to that previously studied for the formation of AlOx islands on the Ni3Al(001) surface, this oxide overlayer has been shown to be AlOx islands with no influence on remaining areas on the crystal. The mechanism for apparent interchange of the Al atoms to the surface to replace the Ni atoms is also discussed.
Characterization of hydroxylated oxide film on iron surfaces and its acid–base properties using XPS
Authors: Kurbatov G. , Darque‐Ceretti E. , Aucouturier M. 
Published: May 2005

AbstractX‐ray photoelectron spectroscopy was used to characterize the hydroxylated oxide film on iron surfaces. The composition of the films and its transformations for eighteen specimens prepared by ex situ techniques and simulating various conditions of hydroxylated oxide layer formation were examined. A model of hydroxylated oxide multilayer film formation on iron was proposed. Quantitative analysis procedures of its composition and hydroxyl group population determination were given.Anion and cation exchange experiments at the specimen surfaces in solutions at different values of pH followed by x‐ray photoelectron analysis of the surface compositions were employed for the estimation of acid–base properties.
Effects of electrochemical and plasma treatments on carbon fibre surfaces
Authors: Jones Carol 
Published: May 2005

AbstractThis paper summarizes the chemical changes induced on carbon fibre surfaces (examined by X‐ray photoelectron spectroscopy, XPS) by a variety of electrochemical treatment in aqueous electrolytes together with the improvements in fibre/resin bonding in the corresponding composite materials. It was found that there was no correlation between the amount of chemical functionality introduced onto the fibre surface and the fibre/resin bond strength, i.e. chemical bonding does not play a major role in fibre resin adhesion. This does not rule out the possibility of chemical bonding between the fibre and resin—it simply implies that it is not the governing factor. It is suggested that the immediate surface concentration of chemical groups is too low to make a significant contribution.To tailor interfacial properties it would be desirable to promote chemical bonding between fibre and matrix. The use of a specially designed plasma treatment cell has led to an increase in the surface concentration of chemical groups (COH, hydroxyl) that have the potential to react chemically with the resin. By exploiting grazing angle data taken from XPS analysis, it is shown that changes in the chemical nature of the fibres only occurs in the outermost layers, whereas the electrochemical reaction proceeds well into the fibre sublayers. Selective introduction of nitrogen‐containing functionality (such as amines, NH2) has been achieved. The reactivity towards a particular plasma is shown to be largely dependent on the structure of the fibre surface. The number of C/N groups produced on higher modulus fibres was undesirably low. Their concentration was increased by biasing the fibres to a negative potential (10–30 V) during plasma exposure.
Contamination of surfaces: Origin, detection and effect on adhesion
Authors: Davis Guy D. 
Published: May 2005

AbstractSurface contamination is one of the most insidious factors affecting adhesive bond performance and, hence, reliability of bonded structures. Sources of contamination are widespread and include primary materials, secondary materials, equipment, human operators, adjacent processes and the atmosphere. A successful approach to solving contamination problems involves the identification of the contamination and its source, establishment of the level of contamination that degrades the given bond, development of a plan to correct the problem and prevent contamination from occurring again, and subsequent verification of adequate substrate cleanlines prior to bonding. This generic approach is discussed and examples are cited to illustrate its use.
Polymer–metal interface formation and film growth on plasma and ion‐treated polymer surfaces
Authors: Nowak S. , Collaud M. , Dietler G. , Schmutz P. , Schlapbach L. 
Published: May 2005

AbstractA study of polymer‐metal interface formation after plasma treatment and low‐energy ion bombardment is presented. In situ surface analysis by XPS lead to well‐defined surface compositions. Different types of bonding of an evaporated metal overlayer with the polymer surface compositions. Different types of bonding of an evaporated metal overlayer with the polymer surface are observed. Depending on the surface treatment, an island growht mode of the metal with different degrees of coverage is observed. Measurement with an atomic force microscope show that the surface treatment also leads to increased surface forces.
The effect of energy‐dependent detector efficiency in electron spectroscopic methods: XPS, AES and DCEMS
Authors: Kajcsos Zs. , Meisel W. , Griesbach P. , Gütlich P. 
Published: May 2005

AbstractSystematic studies were performed to investigate the distorting effect of the electron energy dependence of the channeltron detector efficiency on the shape of data distributions in electron spectroscopy. In agreement with earlier results for electron energies up to 3 keV, it was found that a virtually energy‐independent shape of the electron distribution might be achieved even in a very broad range of electgron energies (up to 15 keV) by appropriate selection of the operational high voltage of a channeltron. However, the efficieny of channeltrons was also found to depend on count rates, indicating one of the principal difficulties in comparing distribution recorded under different experimental conditions.
Interlaboratory comparison of the depth resolution in sputter depth profiling of Ni/Cr multilayers with and without sample rotation using AES, XPS, and SIMS
Authors: Hofmann S. , Zalar A. , Cirlin E.‐H. , Vajo J. J. , Mathieu H. J. , Panjan P. 
Published: May 2005

AbstractIn order to provide a consistent judgment on the capabilities and limitations of the sample rotation approach to depth profiling, a round robin (interlaboratory comparison) was organized between four laboratories on identical samples using AES, XPS and SIMS. The sample consisted of an Ni/Cr multilayer with a total of 16 alternating Ni and Cr layers with a singly layer thickness of 30 nm. Sputter profiling was performed with a rastered beam of 3 keV Ar+ ions at an incidence angle of 45° to the surface normal, with and without sample rotation. Test runs were additionally performed with BCR standard samples of 30 nm thick Ta2O5 layers on Ta. For sample rotation, depth profiles of the Ni/Cr multilayer by AES and SIMS show a marked improvement in depth resolution of about a factor of two for lower sputter depth (30 nm) and four to five for greater sputter depth (450 nm). The depth resolution deteriorates with depth for stationary samples, but is found to be independent of depth when using sample rotation. For XPS, the depth resolution improvement for sample rotation is less pronounced. Agreement between the different laboratories and techniques is excellent and clearly demonstrates the capabilities of sample rotation in depth profiling studies.
Refinement of magnesium and aluminium Kα x‐ray source functions
Authors: Klauber C. 
Published: May 2005

AbstractThe magnesium and aluminium Kα x‐ray line structures, for application to x‐ray photoelectron spectroscopy peak analysis, have been re‐examined for the Kα1, Kα2, Kα′, Kα3, Kα3′, Kα4, Kα5 and Kα6 components. Commonly employed literature source functions are compared with each other and to the refined functions in this work. In terms of both useful removal of x‐ray satellite structure and general x‐ray broadening effects, a detailed description of the complete minor satellite structure is less important than an accurate representation of the main lines and the six most intense satellites, including the generally ignored Kα3′. Some of the inaccuracies have arisen from the inappropriate adoption of x‐ray emission data without the removal of spectrometer broadening. Other errors in determining the source functions come from the excessive smoothing employed in the noise reduction necessary for deconvoluted spectra. This obliterates localized oscillations, which can actually be removed by fine‐tuning component parameters without resorting to increased smoothing or filtering. It is demonstrated that reductions in spectral component width of up to 50% are possible.
Elastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function
Authors: Cumpson Peter J. 
Published: May 2005

AbstractWe present improvements to the Monte Carlo methods used to calculate emission depth distribution functions (DDFs), emission function decay lengths (EFDLs) and attenuation lengths in quantitative XPS and AES. These reduce the time required to reach any desired level of accuracy by a factor of ∼500, so that even a personal computer can produce accurate results in 2 or 3 min. These rapid results are due to the new technique of averaging over an ensemble of possible inelastic events for each feasible set of elastic scatterings in the Monte Carlo simulation, closely related to methods that have been used successfuly in nuclear physics for many years. No new approximations are required. The results are compared with exact analytical solutions for simple special cases; agreement is excellent.
Ion scattering and electron spectroscopic study of the surface coverage of V/Al2O3 catalysts
Authors: Eberhardt Mary A. , Houalla Marwan , Hercules David M. 
Published: May 2005

AbstractIon scattering spectroscopy (ISS) and x‐ray photoelectron spectroscopy (XPS, ESCA) were used to study the dispersion of the vanadium phase and the coverage of Al2O3 by vanadium. A series of V/Al2O3 catalysts was prepared by equilibrium adsorption with vanadium loadings varying from 1.9 to 6.7 wt.% V. By monitoring the ISS Al/O intensity ratio the surface coverage of the catalysts was determined. The surface coverage increases from 15 to 33% with increasing the loading from 1.9 to 3.5 wt.% V. The results are consistent with a model of a uniform monolayer vanadium phase. For higher vanadium loadings the surface coverage appears to level off, suggesting the formation of a multilayer vanadium phase.
Formalism and parameters for quantitative surface analysis by Auger electron spectroscopy and x‐ray photoelectron spectroscopy
Authors: Jablonski A. , Powell C. J. 
Published: May 2005

AbstractIt has been realized during the last 5 years that quantitative surface analyses by Auger electron spectroscopy (AES) and x‐ray photoelectron spectroscopy (XPS) can be greatly complicated by the effects of elastic electron scattering. These effects had previously been largely ignored. We review here the effects of elastic scattering in the formalism of quantitative surface analysis by AES and XPS and discuss the various definitions of terms (inelastic mean free path, attenuation length and escape depth) that have been used to describe inelastic scattering and the surface sensitivities of various electron spectroscopies. We show how a realistic theoretical model of electron transport that includes elastic electron scattering can be related, for some analytical situations, to the common simple formalism of AES and XPS in which elastic scattering is neglected. We consider specifically measurements of overlayer thickness, determination of surface composition for a homogeneous surface region and estimation of the average depth of analysis and we indicate which parameter describing inelastic scattering can be utilized in the simple formalism for these applications. Information is given on sources of data for the inelastic mean free path and the attenuation length. Finally, we point out that the definitions of some terms are undergoing revision as a result of recent scientific developments and to avoid inconsistencies with established usage in other fields.
Fundamental parameters in quantitative depth profiling and bulk analysis with glow discharge spectrometry
Authors: Payling Richard , Jones D. G. 
Published: May 2005

AbstractBy re‐examining the roles played by the fundamental parameters in glow discharge spectrometry (GDS), a simpler approach to quantitative GDS is obtained. A new method is presented for separating the effects of the lamp parameters on emission yield, by varying the matrix. It is shown in the normal working ranges that emission yield depends on lamp pressure only and not on lamp voltage and current as previously thought. The theory is applied to depth profiles from three very different commercial metallic‐coated steels and good agreement is obtained with SEM–energy‐dispersive spectroscopy (EDS) line scans of the coatings. The implications of using constant pressure for bulk analysis are also described. The ability of GDS to measure sputtering rates simultaneously with concentration is explored and good agreement is obtained for zinc–iron alloys with calculated sputtering rates based on surface concentrations.
Imaging microanalysis of ceramic materials with a scanning ion microprobe
Authors: Soni K. K. , Chabala J. M. , Mogilevsky R. , Levi‐Setti R. , Zhang K. , Wolbach W. S. , Bryan S. R. 
Published: May 2005

AbstractThis article discusses the application of a scanning ion microprobe coupled with secondary ion mass spectrometry (SIMS) in the microanalytical characterization of ceramic materials. The high spatial resolution afforded by the microprobe mode, in conjunction with the analytical sensitivity of SIMS, make this technique ideally suited to explore the microchemistry of ceramics, which have complex microstructures and contain several trace and light elements. Two case studies of interface analysis are presented: YBa2Cu3O7‐x superconductors and sintered silicon carbide. Sodium and chlorine impurities were found to segregate to the grain boundaries of melt‐grown YBa2Cu3O7‐x, accompanied by oxygen deficiency. In SiC sintered with Al2O3, Al was present along the grain boundaries in elemental from and at triple‐grain junctions as Al oxide second phases.
In situ ToF‐SIMS/XPS investigation of nitrogen plasma‐modified polystyrene surfaces
Authors: Petrat F. M. , Wolany D. , Schwede B. C. , Wiedmann L. , Benninghoven A. 
Published: May 2005

AbstractPlasma modification of polymer surfaces is a well‐established technique for many technological applications. The control of the surface composition after plasma treatment requires in situ characterization by adequate surface analytical techniques. As an example, we investigated polystyrene modified by a microwave (2.45 GHz) nitrogen plasma by using an on‐line combination of time‐of‐flight secondary ion mass spectrometry and monochromatized photoelectron spectroscopy.Plasma treatment without subsequent air contact leads to the incorporation of nitrogen, the formation of amine, imine and nitrile bonds as evidenced by the C 1s and N 1s photoelectron lines, and the appearance of predominant CxNy clusters in the negative secondary ion spectra. These changes seem to be stable against organic solvents. A particular feature is the formation of a graphite‐like C 1s state after prolonged plasma treatment. The polystyrene surface after plasma treatment is very reactive, particularly the graphite‐like carbon state. Exposure to the atmosphere leads to the disappearance of this state, to considerable uptake of oxygen and to the formation of carbon‐nitrogen‐oxygen bonds, as evidenced by the CNO− secondary ion cluster and the amide binding state in the C 1s line.