bluuebunny/crossref_metadata_2025_split huggingface dataset:
Analysis of a B4C/Mo/Si multilayer interferential mirror by SIMS: influence of the sputtering ion
Authors: Maury H. , Holliger P. , Farès B. , Gautier J. , Roulliay M. , Bridou F. , Delmotte F. , Ravet M.‐F. , André J.‐M. , Jonnard P. 
Published: March 2006

AbstractWe present the analysis of a B4C/Mo/Si multilayer interferential mirror (MIM) by secondary ion mass spectrometry (SIMS). The sample is prepared by magnetron cathodic sputtering and consists of a succession of 20 B4C (4.0 nm)/Mo (2.2 nm)/Si (12.0 nm) tri‐layers deposited on a silicon substrate. Two types of ions have been used for bombardment: Cs+ at an impact energy of 2 keV and O2+ at 0.5 keV. An artefact is clearly observed on the BCs+ profile which presents two maxima and a pronounced minimum at the maximum of the C profile, while the B profile obtained upon oxygen sputtering has its maximum in coincidence with that of the C profile. It is clearly seen under Cs and O sputtering that the B4‐on‐Mo and Si‐on‐B4C interfaces are more abrupt than the Mo‐on‐Si interfaces, evidencing the role of the boron carbide layer as a diffusion barrier. It is also observed that the B4C layers are inhomogeneous, some boron being present in excess with respect to C at the B4C‐on‐Mo and Si‐on‐B4C interfaces. These results evidence the importance of the interaction between the primary ions and some elements (boron in our case) present in the samples. Copyright © 2006 John Wiley & Sons, Ltd.
High‐energy X‐ray photoelectron spectroscopy with new monochromatised Cu Kα1 X‐rays; characteristics, capabilities and limitations
Authors: Moslemzadeh N. , Beamson G. , Haines S. R. , Tsakiropoulos P. , Watts J. F. , Weightman P. 
Published: March 2006

AbstractHigh‐energy X‐ray photoelectron spectroscopy is a valuable technique for the study of the electronic and chemical states of materials. Here we present the specification, capabilities and restrictions of a recently built Cu Kα1 X‐ray source (hν = 8047.8 eV) and discuss a range of potential applications. Preliminary results from a study of Ti metal and TiO2 powder are presented with emphasis on the Ti 1s intrinsic plasmon loss and the Auger‐parameter shift. Comparison with data obtained from conventional soft X‐ray photoelectron spectroscopy (hν = 1486.6 eV) demonstrates the advantage of the Cu Kα1 source. Copyright © 2006 John Wiley & Sons, Ltd.
Detection of DNA hybridization by a field‐effect transistor with covalently attached catcher molecules
Authors: Han Y. , Offenhäusser A. , Ingebrandt S. 
Published: March 2006

AbstractElectronic DNA sensors based on field‐effect transistor (FET) arrays operating in liquid environments offer an alternative method for the detection of biomolecular binding events without the requirement to label the analyte molecules. In order to obtain reproducible signals from such sensors, the attachment of the probe molecules to the gate area of the transistor chips requires a well‐controlled supramolecular architecture. The FET chips used in this work are non‐metallized, 8‐channel transistor devices with micrometer dimensions of the gate structures, which are encapsulated to be dipped into an analyte solution. Two identical chips were functionalized with DNA catcher molecules of different sequences and read out in a differential measurement approach. In this article, we describe the details of the surface modification and covalent attachment of the catcher DNA. The surface modification was characterized by XPS, Fourier transform infrared spectroscopy (FT‐IR), fluorescence microscopy and imaging ellipsometry. Electrical FET recordings of the immobilization and hybridization of DNA molecules are presented. Copyright © 2006 John Wiley & Sons, Ltd.
Curing and electrical conductivity of conductive glues for die attach in microelectronics
Authors: Scandurra A. , Cavallaro A. , Pignataro S. , Tiziani R. , Gobbato L. , Cognetti C. 
Published: March 2006

AbstractThe curing process of silver‐filled glues can be traditionally monitored through thermomechanical measurements such as differential scanning calorimetry (DSC). This technique is useful for the control of the polymerization and other chemical reactions mainly involving the organic moiety of the glue. However, it is not useful to ascertain whether good electrical conduction paths are established between all the conductive filler particles as expected at the end of the curing process. In this paper, we propose a method for the control of the surface electrical conductivity of a commercial silver‐filled glue, based on the charging‐up phenomena occurring in ESCA spectroscopy. Copyright © 2006 John Wiley & Sons, Ltd.
Monte Carlo simulation study of electron interaction with solids and surfaces
Authors: Ding Z. J. , Salma K. , Li H. M. , Zhang Z. M. , Tokesi K. , Varga D. , Toth J. , Goto K. , Shimizu R. 
Published: March 2006

AbstractA brief overview is given on several aspects of applications of the Monte Carlo (MC) simulation method to surface‐related electron spectroscopy and microscopy. For the MC modeling of electron interaction with solids, the electron inelastic scattering cross section is calculated by the use of bulk dielectric function with optical constants in a dielectric functional approach. This has enabled the systematic reproductions of the experimental energy distributions of backscattered electrons for a number of elemental materials. An improved calculation of backscattering factor for quantitative AES analysis has been performed on the basis of a new definition and by making use of the up‐to‐date relevant cross sections. The physical reason is given for the backscattering factor that can be less than unity for very low primary energies close to the ionization energy and/or for large incident angles. For the MC modeling of electron interaction with surfaces, the inelastic scattering of electrons moving in a surface region is treated in a self‐energy formalism. The model has enabled the evaluation of the surface excitation effect through the calculation of position‐dependent electron IMFP. A simulation of REELS spectra for Ag is compared with an experiment; a reasonable agreement found on the surface plasmon peak intensity normalized with elastic peak intensity thus verifies this modeling of electron interaction with surfaces. Finally, the MC simulation code has been extended to deal with complex sample geometries. By using basic building blocks to construct a complex geometry and the ray‐tracing technique for correction of electron flight‐step‐length sampling, the structured and/or inhomogeneous sample can be modeled with reasonable flexibility. Copyright © 2006 John Wiley & Sons, Ltd.
XPS and RBS characterizations of electrosynthesized polypyrrole films doped with a heteropolyanion, SiMo12O404−
Authors: Debiemme‐Chouvy Catherine , Bernard Marie‐Claude , Cachet Hubert , Deslouis Claude 
Published: March 2006

AbstractIn this paper, the electrosynthesis of polypyrrole (PPy) films doped with a Keggin‐type heteropolyanion, SiMo12O404−, is reported. The in situ electrochemical growth of the hybrid film was conducted using an electrochemical quartz crystal microbalance (EQCM) that allowed us to evaluate the doping level of the polymers, which were synthesized in galvanostatic mode. By combining EQCM with chemical analyses, such as X‐ray photoelectron spectroscopy and Rutherford backscattering spectroscopy, it was evidenced that the doping level of the polymer depends on the current imposed during the PPy film synthesis. Copyright © 2006 John Wiley & Sons, Ltd.
PECVD coatings: analysis of the interface with the metallic substrate
Authors: Angelini E. , Grassini S. , Rosalbino F. , Fracassi F. , Laera S. , Palumbo F. 
Published: March 2006

AbstractPlasma enhanced chemical vapor deposition (PECVD) from silicon‐containing organic compounds, such as SiOx coatings, appears to be an attractive treatment technique for the surface modification of metals in order to increase their corrosion resistance. This study deals with the characterization of SiNx thin films, in comparison with SiOx coatings, deposited on steels and aluminum alloys in a capacitively coupled (CC) parallel‐plate reactor and in an inductively coupled (IC) reactor. The nitride‐like coatings have been deposited in plasma fed with bis(dimethylamino)dimethylsilane (BIS) and Ar on as‐received substrates and after a plasma treatment performed in oxygen or hydrogen plasmas. SiOx coatings have been deposited starting from tetraethoxysilane (TEOS) in a mixture of Ar and O2. The substitution of oxygen by nitrogen can lead to higher tribological and mechanical properties, maintaining the insulating nature of the film. Surface and chemical characterization of the coatings have been carried out by means of X‐ray photoelectron spectroscopy (XPS) and Fourier transformed infrared spectroscopy (FTIR). The protective effectiveness of PECVD coatings has been assessed by electrochemical impedance spectroscopy (EIS) and may be related to their barrier effect against the diffusion of water and gaseous aggressive agents from the environment toward the metal surface. Plasma pretreatments play an important role in determining the barrier properties of the film by reducing its defectiveness and enhancing its adhesion to the substrate. Copyright © 2006 John Wiley & Sons, Ltd.
Straggling of fast electrons
Authors: Chaoui Zine‐El‐Abidine , Bichsel Hans 
Published: March 2006

AbstractThe energy losses of fast electrons vary because of the stochastic nature of the interactions. In order to describe these processes and calculate the spectra of the total energy loss (straggling spectra), Monte Carlo simulations of fast electrons traversing a thin silicon absorber have been used. The distribution functions needed are described by the electronic energy losses in single collision calculated by Bichsel. Comparison between straggling spectra calculated on the basis of the single collision spectrum and that from its first moment (very often ‘stopping power’ in the literature), shows that the latter, the so‐called ‘Continuous Slowing Down Approximation (CSDA),’ is a poor approximation in its description of the individual energy deposition. Copyright © 2006 John Wiley & Sons, Ltd.
Electron irradiated sodium–potassium–aluminium silicate glass surfaces investigated by XPS
Authors: Lesiak B. , Zemek J. , Gedeon O. , Jóźwik A. 
Published: March 2006

AbstractAlkali‐aluminium silicate glasses are interesting due to their potential industrial applications. The most commonly applied methods for surface characterisation employ electron beam techniques operating with the electron beam affecting the atoms of solids and modifying glass surfaces.In the present work, the effect of the electron beam on the surface of sodium–potassium–aluminium silicate glass is investigated. The atomic composition, structural changes and chemical state of atoms are studied by qualitative and quantitative photoelectron spectroscopy (XPS) and the line shape analysis using the pattern recognition (PR) method called the fuzzy k‐nearest neighbour (fkNN) rule. These methods proved to be applicable for complex glasses. Copyright © 2006 John Wiley & Sons, Ltd.
Characterization of F+‐irradiated graphite surfaces using photon‐stimulated desorption spectroscopy
Authors: Sekiguchi Tetsuhiro , Baba Yuji , Shimoyama Iwao , Nath Krishna G. 
Published: March 2006

AbstractWe investigated nature of the orientation in the topmost layers of F+‐irradiated graphite using polarization‐dependent near‐edge X‐ray absorption fine structure (NEXAFS) spectroscopy, incorporating partial electron‐yield (PEY) detection and photon‐stimulated ion desorption (PSID) techniques. The fluorine K‐edge NEXAFS spectra conducted in PEY mode showed no significant dependence on polarization angles. In contrast, NEXAFS spectra recorded in F+ ion yield mode showed enhanced yields at a feature of ∼689.4 eV, assigned as a σ*(CF) state relevant to CF sites: furthermore, the yields depended on polarization angles. The F+ ion yields at the feature are larger in normal incidence than in grazing incidence, suggesting that the CF bonds prefer a relatively downward tilt at the topmost layer, while being randomly directed at deeper regions. We conclude that the difference in the orientation structures between the surface and the bulk is reflected in the NEXAFS spectra recorded in the two different detection modes. It was also found that H+‐ and F2+‐PSID NEXAFS spectra are helpful in understanding the desorption mechanisms, and thus in analysing NEXAFS data. Copyright © 2006 John Wiley & Sons, Ltd.
XPS and SIMS study of aluminium native oxide modifications induced by Q‐switched Nd:YAG laser treatment
Authors: Barnier V. , Heintz O. , Roberts D. E. , Oltra R. , Costil S. 
Published: March 2006

AbstractDuring laser cleaning of aluminium in ambient atmosphere, modifications of the metal surface can be induced by transient thermal effects. This work aims to characterize the modification of the aluminium oxide layer on pure aluminium for a wide range of power per area using a Q‐switched Nd:YAG (1064 nm) laser with two pulse durations, 10 and 180 ns. Experiments were carried out with single laser shots in ambient air at fluences (e.g. energy per area) below the ablation regime.For 10‐ns pulses with fluences between 0.7 and 1.7 J/cm2, X‐ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS) revealed thermal oxidation with an increase of the oxide‐layer thickness for 0.7–1.3 J/cm2. Above a threshold at about 1.3 J/cm2 the oxide thickness decreased. The Mixing Roughness Model was used for the SIMS depth profile.For 180‐ns pulses with fluences between 2.1 and 4.3 J/cm2, and therefore much lower power per area than with the 10 ns pulses, XPS showed a variation of surface composition with a different behaviour for 2.1–2.9 J/cm2 compared to 3.1–4.3 J/cm2. However, no significant changes of the average thickness of the oxide layer were found. Copyright © 2006 John Wiley & Sons, Ltd.
Shell layers of Ostrea edulis as an environmental indicator of TBT pollution: the contribution of surface techniques
Authors: Medaković Davorin , Traverso Pierluigi , Bottino Carlo , Popović Stanko 
Published: March 2006

AbstractX‐ray powder diffraction (XRD) was used to study the mineral composition of the shells and shell layers of the European flat oyster Ostrea edulis (Linnaeus) collected at two localities in the East Adriatic Sea of the coast of Croatia. The variations of the shell element chemistry between two different shell layers were determined by X‐ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM) with an energy dispersive X‐Ray (EDX) microprobe. XRD showed that the dominant component of the outer prismatic foliated shell layers was calcite with traces of aragonite and halite. The newly formed chambers of the inner nacreous shell layers were mainly built of magnesium calcite. Chemical element analysis given by XPS and SEM confirmed that besides carbonates other minor elements could be incorporated in the oyster shells. Silicon was present from 0.1 to almost 1.5 atomic percentage (at.%) in the outer shell layers, whereas its amount was lower and difficult to quantify in the inner shell layers. On the contrary, tin was detected only in the chambers of the newly formed inner nacreous layers, in a concentration that could be estimated, according to both XPS and SEM, to be of the order of 0.1–0.2 at.%. In the chambers of the oyster shells, tin is environmentally induced. A possible formation mechanism and specific ecological factors that could influence the precipitation of tin in the different shell layers of Copyright © 2006 John Wiley & Sons, Ltd.
Surface characterization of the Gram‐positive bacteria Bacillus subtilis‐an XPS study
Authors: Leone Laura , Loring John , Sjöberg Staffan , Persson Per , Shchukarev Andrei 
Published: March 2006

AbstractInteractions at the bacteria‐solid interface in aquatic environments are of crucial importance in biofilm formation processes. The characterization of microbial surfaces properties is therefore a very important step for the understanding of these interactions. In this study, XPS spectra of Bacillus subtilis wet pastes centrifuged from suspensions over a span of pH values were recorded using a fast‐freezing procedure. The chemical composition of the bacterial surface was elucidated and the presence of surface sites containing carboxylate, phosphate and amine functional groups was established. It was possible to distinguish between charged and uncharged amine sites on the surface and follow their deprotonation reactions as a function of pH. It is suggested that increased metabolic activity around the physiological pH results in the excretion of proteins and/or peptides which are possibly related to the production of extracellular polymeric substances (EPS). Copyright © 2006 John Wiley & Sons, Ltd.
Interdiffusion in microstructurally different Si/Al multilayered structures
Authors: Wang J. Y. , He D. , Zalar A. , Mittemeijer E. J. 
Published: March 2006

AbstractTwo types of a‐Si/c‐Al multilayers were prepared by magnetron sputter deposition under different sputtering conditions. X‐ray diffraction (XRD) and transmission electron microscopy (TEM) techniques were used to analyse the microstructures of the as‐deposited multilayers. The multilayers showed different degrees of interface roughness. The c‐Al sublayers of the multilayers exhibited different levels of macrostress and microstrain and were of different grain size (corresponding to the sublayer thickness). Interdiffusion coefficients were determined by Auger electron spectroscopic (AES) depth profiling. The results indicated that the initial stage of diffusion annealing involved diffusion of Si along grain boundaries in the Al sublayer. The data obtained for the interdiffusion coefficient were insensitive to the present differences in microstructure between the multilayeres investigated. Crystallization of Si took place if appreciable diffusion of Si along the Al grain boundaries had occurred. Copyright © 2006 John Wiley & Sons, Ltd.
Applications of scanning thermal microscopy in the analysis of the geometry of patterned structures
Authors: Klapetek Petr , Ohlídal Ivan , Buršík Jiří 
Published: March 2006

AbstractIn this article, the results of the scanning thermal microscopy (SThM) analysis of artificial structures such as microchip surfaces and solar cell contacts are presented. It is shown that in the absence of surface roughness the SThM can be used to obtain reliable material contrast images. However, roughness and other topographical features can influence the thermal data in a strong way. It is illustrated that this effect can be partially removed by using the neural network approach for modelling the thermal signal using the topography data. The illustration of this approach is presented in the analysis of the geometry of the examples selected in this article. Copyright © 2006 John Wiley & Sons, Ltd.
Nanoprocessing and evaluation of carbon and boron nitride nanoperiod multilayer films by lateral force modulation method
Authors: Miyake Shojiro , Hashizume Tsuyoshi , Wakatsuki Yukihiko 
Published: March 2006

AbstractCarbon and boron nitride nanoperiod (C/BN)n multilayer films were deposited by bias radio frequency (RF) sputtering. It was proposed that using the lateral modulation friction force microscopy technique (LM‐FFM), a nanoprocessing removal by mechanical action was performed on the nanoperiod (C/BN)n multilayered films with electroconductive diamond tips. It was found that the amplitude and phase of the tip cantilever torsion due to friction force between the tip and the sample surface varied with an increase in loading force when the film was processed with vibration. Since the amplitude variation obtained after this processing was correlated with the frictional force of each layer, the result that the amplitude varied with an increase in the processing depth indicated the nanostructure of this multilayer film. This suggested that the LM‐FFM method could perform nanoprocessing and microstructure analysis. As a result, the structure of the 2‐nm‐period multilayer film was experimentally confirmed to consist of the C‐layer, the interface, and the BN layer by this method. Copyright © 2006 John Wiley & Sons, Ltd.
Growth of TiO2 nanocrystals in the presence of alkylpyridinium salts: the interplay between hydrophobic and hydrophilic interactions
Authors: Ardizzone S. , Bianchi C. L. , Cappelletti G. 
Published: March 2006

AbstractTiO2 nanoparticles were prepared by combining a sol–gel precipitation with growth steps performed in the presence of cationic surfactants, dodecylpyridinium chlorides (DPC), and cetylpyridinium chlorides (CPC). Solutions at concentrations pertaining to the existence of either surfactant monomers or aggregates (micelles) were employed. XPS analyses were performed both on the surfactant salts and on the aged, dried precursors to study the surfactant films adsorbed onto the oxide. The crystal structures of the calcined samples and the phase composition were examined by X‐ray diffraction. The role played by the presence of the surfactant in affecting the physicochemical properties of the powders is discussed. Copyright © 2006 John Wiley & Sons, Ltd.
Investigation of passive films grown on biocompatible Ti‐50Zr and Ti‐13Zr‐13Nb alloys by XPS
Authors: Oliveira N. T. C. , Biaggio S. R. , Nascente P. A. P. , Rocha‐Filho R. C. , Bocchi N. 
Published: March 2006

AbstractIn this work, XPS investigations on the composition of anodic films electrochemically grown on heat‐treated Ti‐50Zr (at.%) and Ti‐13Zr‐13Nb (wt.%) alloys in 0.15 mol dm−3 Na2SO4 at room temperature are reported. The XPS analyses on anodic films of different thicknesses revealed for both alloys a gradual enrichment of the oxide film in Ti as the film thickness was increased. For the thickest oxide films, this Ti enrichment in the oxide was about 8% for the Ti‐13Nb‐13Zr alloy and about 9% for the Ti‐50Zr alloy, when compared with the nominal values for both alloys determined by inductively coupled plasma‐atomic emission spectroscopy (ICP‐AES). Copyright © 2006 John Wiley & Sons, Ltd.
ToF‐SIMS analysis of organic impurities in UPW
Authors: Kobayashi Junji , Owari Masanori 
Published: March 2006

AbstractWe have investigated adsorption of organic impurities in ultrapure water (UPW) on hydrophilic silicon wafer surface. The primary and tertiary amine molecules used as model compounds of organic impurities were adsorbed on the clean wafer surface during soaking in UPW. It was found that adsorbed quantities of relatively large tertiary amines among water‐soluble amines, such as (C3H7)3N and (C4H9)3N, were higher at relatively short soak time (two h in this experiment) than at longer one (24 h). Time‐of‐flight secondary‐ion mass spectrometry (ToF‐SIMS) is a very powerful tool for identification of trace organic contamination on wafer surface after UPW rinse from the studies of adsorption of the molecules present in UPW. Copyright © 2006 John Wiley & Sons, Ltd.
Angle‐resolved XPS: a critical evaluation for various applications
Authors: Oswald S. , Zier M. , Reiche R. , Wetzig K. 
Published: March 2006

AbstractAngle‐resolved X‐ray photoelectron spectroscopy (ARXPS) is widely accepted as a useful tool for nondestructive in‐depth analysis of near surface regions. In the present paper, it is shown for a variety of applications which kind of qualitative and quantitative information can be derived from ARXPS measurements in conjunction with appropriate mathematical modeling. The method is limited mainly by problems arising from contamination, roughness or preparation‐induced damage. Furthermore, especially for more complex surface structures, it must be considered that the information content of ARXPS is strongly limited and the calculations have to be supported by other knowledge. Copyright © 2006 John Wiley & Sons, Ltd.