bluuebunny/crossref_metadata_2025_split huggingface dataset:
A multi‐analytical investigation on medieval pottery from Caltagirone (Sicily, Italy)
Authors: Casaletto M. P. , Chiozzini G. , De Caro T. , Ingo G. M. 
Published: March 2006

AbstractA multi‐analytical approach was used to investigate Medieval and post‐medieval (thirteenth‐seventeenth century) ceramic artefacts from archaeological excavations at Caltagirone (Sicily, Italy). The chemical, structural and micro‐morphological characterizations were carried out by the combined use of surface‐sensitive techniques, such as X‐ray photoelectron spectroscopy (XPS), and bulk analytical techniques, such as scanning electron microscopy/energy‐dispersive spectroscopy (SEM/EDS) and X‐ray diffraction (XRD). Fragments of basins, bowls, vases of great historical and archaeological interest as the first Sicilian evidences of such polychromatic decorations were sampled in different conservation conditions. In order to characterize the conservation state and determine the possible causes of alteration and/or degradation phenomena, for each sample both the ceramic body and the polychromatic glaze of the artefacts were studied. The presence on some artefacts of a lead glaze, which is typical of Islamic ceramics, suggested the use of manufacturing techniques directly derived from the Islamic domination in Sicily, even beyond the ninth century. Degradation phenomena such as the partial devitrification of the glaze, i.e. the slow structural reorganization towards stable crystalline phases, and the leaching by mineral dissolution in the soil, were determined by surface and bulk analysis results. Copyright © 2006 John Wiley & Sons, Ltd.
The anodic oxidation of silver in 1 M NaOH: electrochemistry, ex situ XPS and in situ X‐ray absorption spectroscopy
Authors: Lützenkirchen‐Hecht Dirk , Strehblow Hans‐Henning 
Published: March 2006

AbstractWe have investigated the electrochemical formation of oxide layers on silver in 1 M NaOH (pH 13.8) using a combination of electrochemical techniques, X‐ray photoelectron spectroscopy (XPS) and surface sensitive grazing incidence X‐ray absorption spectroscopy (XAS). While the XPS experiments were performed after the removal of the samples from the electrolyte and transfer into an ultra‐high vacuum (UHV) system under inert conditions, the XAS experiments were performed in situ and under full potential control. The application of these techniques leads to a detailed, consistent picture of the anodic oxide layer formation process on silver. All the applied techniques proved that the anodic oxidation starts at potentials lower than the corresponding Nernst potential. Extended X‐ray absorption fine structure (EXAFS) investigations suggest that the underpotential Ag+ oxide layer of some few nanometres thickness has a rather disordered structure. Time resolved XPS and EXAFS experiments have shown that the growth of these disordered layers is diffusion controlled, i.e. the thickness increases with the square root of the oxidation time. For moderately higher potentials, i.e. slightly above the Nernst equilibrium potential, the thickness of the silver(I) oxide layer increases rapidly with potential and the structure is very similar to that of crystalline Ag2O. Copyright © 2006 John Wiley & Sons, Ltd.
The peculiarities of electronic structure of Si nanocrystals formed in SiO2 and Al2O3 matrix with and without P doping
Authors: Kovalev Anatoly , Wainstein Dmitry , Tetelbaum David , Mikhailov Alexey 
Published: March 2006

AbstractThe system of the nanoinclusions of Si in the SiO2 and Al2O3 matrixes (SiO2:Si, Al2O3:Si) attracts great attention owing to its ability to the luminesce in the visible and near‐IR range of the spectrum. The influence of P‐ion alloying on the electronic structure of nanocomposites was investigated. The P‐ion doping and post‐annealing at T = 1000 °C (2 hours) result in the enhancement of the photoluminescence (PL) peak connected with the Si nanocrystals. The electronic structure was investigated by X‐ray photoelectron spectroscopy (XPS) and high‐resolution electron energy losses spectroscopy (HREELS) methods. Ion surface modification and annealing form the special nanostructure with Si nanocrystals in SiO2 and Al2O3 matrixes having high density of interfaces with special atomic structure and various degree of oxidation of Si atoms on the boundaries. HREELS investigations show that P‐ion doping increases the probability of interband transitions in SiO2:Si and Al2O3:Si composites. Copyright © 2006 John Wiley & Sons, Ltd.
Interfacial reactions between In–48Sn solder and electroless nickel/immersion gold substrate during reflow process
Authors: Koo Ja‐Myeong , Yoon Jeong‐Won , Jung Seung‐Boo 
Published: March 2006

AbstractIn this study, the interfacial reactions of In–48Sn solder balls on an electroless Ni/immersion Au (ENIG) ball grid array (BGA) substrate during reflow at 170 °C for up to 1800 s were investigated using SEM, transmission electron microscope (TEM) and energy dispersive X‐ray spectroscope (EDS) analyses. During the initial 10 s of the reflow process, AuIn2 cubes and a continuous Ni3(Sn,In)4 intermetallic compound (IMC) layer were formed at the interface between the solder and the substrate. The thickness of the Ni3(Sn,In)4 layer was found to increase from approximately 140 nm to 1 µm, as the reflow time increased from 10 to 1800 s, respectively. The transformation of Ni to form the Ni3(Sn,In)4 IMC led to the formation of a P‐rich Ni (hereafter Ni3P) layer between the Ni3(Sn,In)4 IMC and the ENIG substrate, whose thickness increased with increasing the reflow time. Copyright © 2006 John Wiley & Sons, Ltd.
Growth of polymer brushes by atom transfer radical polymerization on glassy carbon modified by electro‐grafted initiators based on aryl diazonium salts
Authors: Matrab T. , Chehimi M. M. , Pinson J. , Slomkowski S. , Basinska T. 
Published: March 2006

AbstractPoly(methyl methacrylate), polystyrene, and polyglycidol brushes (PMMA, PS and PGL, respectively) were grown on glassy carbon (GC) plates that were modified by the electrochemical reduction of the diazonium salt BF4−, +N2C6H4CH(CH3)Br. The grafted C6H4CH(CH3)Br species were effective in surface‐initiating atom transfer radical polymerization (SI‐ATRP) of the vinyl monomers. The structure of the polymer brushes was characterized by XPS. Static contact angles of water drops on PS, PGL and PMMA brushes were 89.5 ± 2.0, 75.1 ± 7.0 and 83.5 ± 1.4°, respectively. The polymer brushes were further evaluated as adsorbents of human serum albumin (HSA). Protein adsorption decreased in the order PS > PGL ∼ PMMA. This highlights the resistance of PGL to protein adsorption. Copyright © 2006 John Wiley & Sons, Ltd.
Excitations of bulk and surface plasmons in solids and nanostructures
Authors: Gervasoni Juana L. 
Published: March 2006

AbstractIn this work, recent studies on the interaction of charged particles with bulk and surface plasmons in systems ranging from macroscopic to nanoscopic scales are summarized. The differences and similarities that arise when the size of the system is modified are analyzed. In particular, the strong interference effects in the excitation of plasmons that arise from the interaction of particles with nanoscale systems are discussed. Copyright © 2006 John Wiley & Sons, Ltd.
Hydrogen plasma immersion ion implantation of ultra‐high molecular weight polyethylene
Authors: Tóth A. , Mohai M. , Ujvári T. , Bertóti I. 
Published: March 2006

AbstractUltra‐high molecular weight polyethylene (UHMWPE) was treated by hydrogen plasma immersion ion implantation (PIII). Accelerating voltages (U) between 15 and 30 kV, fluences (F) between 1 × 1017 and 3 × 1017 cm−2 with fluence rates (FR) between 3 × 1013 and 7 × 1013 cm−2 s−1 were applied. The surface chemical characterisation was performed by XPS. Nanomechanical properties like hardness (H), reduced modulus (E) and slope of scratch (S) of the untreated and modified surfaces were characterised by nanoindentation and nanoscratch measurements.The results demonstrate that hydrogen PIII‐treatment can significantly and favourably modify the nanomechanical properties of UHMWPE. The dependence of these properties on the main process parameters has been determined. Copyright © 2006 John Wiley & Sons, Ltd.
XPS MultiQuant: a step towards expert systems
Authors: Mohai M. 
Published: March 2006

AbstractA thorough evaluation of photoelectron spectra is impossible without involvement of data systems. It is advantageous if the different programmes are easily able to communicate with each other. This connectivity may also serve as a base for future expert systems. The well‐known VAMAS file format provides the first necessary step, converting the spectra into forms portable between various platforms.In this paper, a new file format, the XPS Reduced Data Exchange File, is proposed, which defines an ‘interface’ between programs to transfer the derived XPS data.XPS MultiQuant, which can be used routinely together with various spectrum processing packages to improve the flexibility and precision of quantitative calculations, is a typical target application requiring transfer of reduced experimental data (e.g., selected elements, line position, intensity data, etc.). The latest version of XPS MultiQuant already implements the XPS Reduced Data Exchange Files proposed here, to transfer necessary data between programs. Copyright © 2006 John Wiley & Sons, Ltd.
Temperature dependence of band alignments in ultrathin Hf–Al–O and Al2O3 films on p‐Si (100)
Authors: Jin H. , Oh S. K. , Kang H. J. , Lee Y. S. , Cho M. H. 
Published: March 2006

AbstractAnnealing temperature dependence of band alignments in Hf–Al–O and Al2O3 thin films, grown on p‐Si(100) by atomic layer deposition (ALD), has been studied by utilizing XPS and reflection electron energy loss spectroscopy (REELS). Band gaps and valence band offsets were estimated from the onset of REELS and valence band spectra of XPS, respectively. Hf–Al–O thin film is found to have asymmetric barrier heights for electrons and holes and reveals an increasing trend in the conduction band offsets after annealing treatment, while Al2O3 film shows a nearly symmetric band offsets. Copyright © 2006 John Wiley & Sons, Ltd.
Investigation of the (sub)surface of commercially pure rolled aluminium alloys by means of total reflectance, r.f. GDOES, SEM/EDX and FIB/TEM analysis
Authors: Buytaert G. , Terryn H. , Van Gils S. , Kernig B. , Grzemba B. , Mertens M. 
Published: March 2006

AbstractRolling is known to alter surface properties of aluminium alloys and to introduce disturbed subsurface layers. These layers are characterised by a refined grain structure, rolled‐in oxide particles, a fine distribution of intermetallic particles and various voids and cracks.In previous studies, mostly higher alloyed materials have been investigated. Here, the subsurface of a commercially pure rolled aluminium alloy (99.5% Al) is characterised. Hot and cold rolled sheets, with and without additional annealing are investigated.Measuring total reflectance (TR) of progressively etched samples is used as an optical depth profiling method to derive the thickness of disturbed layers. The in‐depth behaviour of alloying, trace and impurity elements in the subsurface regions is studied with quantitative radio frequency glow discharge optical emission spectrometry (r.f. GDOES). The bottom of glow discharge optical emission spectrometry (GDOES) craters at various depths is investigated with SEM/EDX. Focused ion beam (FIB) thinning is employed to prepare site‐specific cross‐sectional TEM specimens. Analytical TEM is used to investigate the thickness, microstructure and composition of the disturbed subsurface.It can be concluded that rolled commercially pure aluminium exhibits disturbed subsurface layers, consisting of a mixture of Al2O3 and metallic aluminium particles, with cracks and voids. These layers are introduced during hot rolling, and reduced in thickness and redistributed over the surface during subsequent cold rolling. Copyright © 2006 John Wiley & Sons, Ltd.
Application of surface ionization to determine rate constant and activation energy of dissociation reactions of nitrogen base polyatomic molecules on W oxides
Authors: Rakhmanov G. , Rasulev U. Kh. , Saidumarov I. 
Published: March 2006

AbstractAdsorption and surface ionization of procaine, imipramine, amitriptyline and tetraethylammonium chloride on oxidized tungsten surface have been studied by the methods of voltage modulation and flux modulation under identical experimental conditions with the high‐vacuum mass‐spectrometric set up having a ‘black’ chamber with the walls cooled with liquid nitrogen. Rate constants and activation energies of dissociation reaction of initially adsorbed molecules by (C–C)β bonds with formation of radicals to be ionized have been defined. Also, rate constants and activation energy of desorption of these radicals as ions (CH3)2N+CH2 and (C2H5)2N+CH2 have been determined. Copyright © 2006 John Wiley & Sons, Ltd.
TOF‐SIMS depth profiling study of corrosion propagation in coated hollow spheres
Authors: Oriňáková Renáta , Oriňák Andrej , Arlinghaus Heinrich F. , Hellweg Sebastian , Kupková Miriam , Strečková Magdaléna 
Published: March 2006

AbstractMetallic foams and cellular materials prepared by sintering hollow metallic particles belong to the relatively new group of materials with extremely low density and extraordinary combination of mechanical, electrical, thermal and acoustic properties. Electrochemical deposition of metallic coatings on the surface of hollow spherical particles facilitates the required modification of the surface corresponding to high mechanical quality.Copper hollow spheres were obtained from porous iron powder particles by a cementation process. The suitable matrix for the preparation of relatively light but mechanically strong porous materials was obtained by electrochemically plating hollow copper microparticles by a Ni layer. The propagation of corrosion throughout the coated copper particles was examined.In this study, time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) depth profiling was used to investigate the distribution of the coating components and corrosion products across the surface and on the subsurface layer of coated hollow particles. Fe hollow particles were examined as a reference system.Our observations indicate that the corrosion results in metallic (Fe, Ni, Cu) oxidic, hydroxidic and chloridic species in the corroded substrate. Significant content of iron as well nickel and copper was registered on the outer surface layer after the corrosion test. Copyright © 2006 John Wiley & Sons, Ltd.
Influence of Cr on initial thermal oxidation and its kinetics on Si (001) surfaces
Authors: Shimizu H. , Sato T. 
Published: March 2006

AbstractThe influence of Cr and the growth kinetics in the first stages of the thermal oxidation of Si (001) from 600 to 900 °C in a dry oxygen ambient were investigated using ellipsometry and X‐ray photoelectron spectroscopy (XPS). On oxidation at 810 °C, the oxide growth of samples contaminated with Cr (‘Cr’) was initially enhanced during the first 120 min, the growth curves of the ‘Cr’ and samples rinsed in RCA (‘RCA’) ‘crossed over’, with the commencement of growth retardation. During the initial oxidation, Cr acted as a catalyst to assist the Si–O reaction on the surface of Si, thereby enhancing the oxide growth. As the oxidation advanced, Cr atoms were found to be mainly concentrated close to the surface of the SiO2. Thus, a Cr‐rich SiO2 layer acts as a diffusion barrier for oxygen species, resulting in growth retardation. Regarding the oxidation kinetics, a discontinuity in the thermal oxidation rate was observed at 760 °C. Below 760 °C, the activation energy for the ‘RCA’ samples was determined to be 0.27 eV, indicating the oxidation of the second atomic layers of Si. For the ‘Cr’ samples (0.05 eV), the Cr atom lowers the energy barrier to breaking the bonds of the first Si–Si layer by the catalytic role. Above 760 °C, the activation energy obtained for the ‘RCA’ samples was found to be 1.58 eV, which corresponds to the bulk diffusion mechanism. For the ‘Cr’ samples, the activation energy was measured as 0.46 eV, which is close to the second atomic layer. Copyright © 2006 John Wiley & Sons, Ltd.
The influence of an OTS self‐assembled monolayer on the wear‐resistant properties of polysilicon based MEMS
Authors: Baker M. A. , Li J. 
Published: March 2006

AbstractPolysilicon MEMS structures are coated with self‐assembled monolayers (SAMs) to reduce stiction and improve wear resistance. This study reports on an octadecyltrichlorosilane (OTS) coated low‐pressure chemical vapour deposited (LPCVD) polysilicon based MEMS test structure fabricated at Sandia National Laboratories, USA. The surface morphology and OTS layer have been studied by SEM, XPS and AFM. Nanowear properties were investigated using a diamond‐tipped cantilever AFM. The presence of OTS is confirmed by XPS and AFM measurements and the polysilicon/OTS interface is found to be vulnerable to hydrolysis when stored under laboratory conditions. A comparison is made between the wear resistance of the OTS‐coated and uncoated surfaces of the MEMS polysilicon components and silicon nitride substrate. Nanowear results were also obtained for CVD polysilicon and silicon nitride layers and a silicon wafer. The presence of the OTS layer was found to enhance the wear properties of the MEMS polysilicon and silicon nitride layers, with an increase in the wear resistance of up to two times for the MEMS polysilicon and up to three times for the MEMS silicon nitride. Copyright © 2006 John Wiley & Sons, Ltd.
Mechanism of delamination of a polyamide coating modified with an aminosilane
Authors: Guichenuy Marianne , Watts John F. , Abel Marie‐Laure , Audenaert Marc 
Published: March 2006

AbstractPrevious articles have reported the progress made in enhancing the durability of a polyamide powder coating through the incorporation of an aminosilane. This work has been extended, and this paper is concerned mainly with the use of high mass resolution ToF‐SIMS to refine the understanding of the role of the aminosilane in enhancing adhesion.After delamination of the coatings in a salt‐spray cabinet, the presence of silane is easily detected on both sides of the failed interface. The silane has cross‐linked; fragments attributed to this polymerisation are observed on the delaminated coatings and the exposed steel.At nominal mass 100, a peak assigned to FeOSi+ fragment is readily observed and can be attributed to the formation of a covalent bond between iron and silane and the presence of an iron silicon oxide. The silicon Auger parameter obtained on the steel surface is consistent with this hypothesis. Copyright © 2006 John Wiley & Sons, Ltd.
Work‐function imaging of oriented copper grains by photoemission
Authors: Renault O. , Brochier R. , Roule A. , Haumesser P.‐H. , Krömker B. , Funnemann D. 
Published: March 2006

AbstractWe measured the work function of micrograins at the surface of a polycrystalline copper sample using NanoESCA, a photoelectron microscope equipped with two analysers in series. This allowed us to obtain accurate spectroscopic information with energy‐filtered images showing lateral resolutions of 40 nm. Reconstructed microspectra directly show variations in the local work function of grains having different crystalline orientation. Copyright © 2006 John Wiley & Sons, Ltd.
Application of angle‐resolved XPS for characterisation of SiC/Ni2Si thin film systems
Authors: Pérez‐García S. A. , Nyborg L. 
Published: March 2006

AbstractUltrathin nickel silicide layers (3 nm) on SiC, heat‐treated at 800 and 950 °C, were analysed by means of angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) in order to characterise the systems. The core level spectra of Si, C and Ni were correlated with the modelling of the arrangement of the surface layers. The model derived from this suggests that the silicide formed covers the SiC only in part (less than about half) and that the graphite forms a thin (<1 nm) layer on top of the whole surface. The model agrees fairly well with the relative amount of phases expected from the mass balance of the reaction between the initial Ni layer (1.2 nm) and the SiC substrate. Electronic structure was also investigated from the valence band spectra. Copyright © 2006 John Wiley & Sons, Ltd.
Measuring the energy of the graphite π + σ plasmon peak
Authors: Filippi M. , Calliari L. 
Published: March 2006

AbstractWe examine the graphite plasmon loss structure in reflection electron energy loss spectroscopy (REELS) and XPS with respect to the issue of measuring the energy, Ep, of the π + σ plasmon peak. The two spectra differ in shape because they are based on different physical processes. In fact, a static core hole—leading to intrinsic (in addition to extrinsic) losses—exists only for XPS. We show that no single energy can be measured on the two spectra for the π + σ peak. Possible procedures to deal with the matter are considered. Copyright © 2006 John Wiley & Sons, Ltd.
X‐ray photoelectron spectroscopic study of the surface chemistry of soda‐lime glass in vacuum
Authors: So L. , Ng N. , Bilek M. , Pigram P. J. , Brack N. 
Published: March 2006

AbstractThe surface chemistry of heat‐treated soda‐lime glass surfaces in vacuum was studied with X‐ray photoelectron spectroscopy (XPS). It was shown to vary greatly, in terms of carbon content, with different preparation environments before analysis. Specially designed miniature evacuated glass panels were used and a lever device was incorporated into the XPS system for in situ sample breakage. A considerable amount of carbon was found on glass surfaces exposed to air before XPS. Less carbon was found on surfaces exposed to an argon environment, and an even smaller amount of carbon could be detected when samples were broken in situ. The atomic percentage of carbon‐related compounds is found to increase with increasing air exposure time. This study shows that when analysing carbon and its related compounds on the inner glass surfaces of any evacuated device, it is important to break the sample in situ to minimise carbon contamination. Copyright © 2006 John Wiley & Sons, Ltd.
Surface basicity of ceria‐supported lanthana. Influence of the calcination temperature
Authors: Bernal S. , Blanco G. , El Amarti A. , Cifredo G. , Fitian L. , Galtayries A. , Martín J. , Pintado J. M. 
Published: March 2006

AbstractThe surface basicity of pure ceria is strongly enhanced by the presence of the supported La2O3, the effect being very much influenced by the calcination temperature. X‐ray diffraction (XRD), Raman spectroscopy, and La 3d5/2 XPS data for the different samples show a progressive incorporation of La3+ into the ceria lattice as the calcination temperature is increased. This structural change is considered to be responsible for the modifications that occurred in the basicity of the lanthana‐modified ceria samples as revealed by temperature‐programmed desorption‐mass spectrometry (TPD‐MS) of pre‐adsorbed CO2. Copyright © 2006 John Wiley & Sons, Ltd.
Deposition of ultrathin organic films on various carbon surfaces using vacuum vapor deposition
Authors: Choi Junho , Kato Takahisa , Nakao Setsuo , Ikeyama Masami , Kawaguchi Masahiro 
Published: March 2006

AbstractIn this report, we describe the bonding characteristics of a model lubricant, perfluoro‐1‐decanol (P1D), having a hydroxyl end group, toward N and Si incorporated amorphous carbon surfaces. The P1D is deposited on the carbon surfaces using vacuum vapor deposition, and the P1D bonding toward the carbon surfaces is compared to that deposited by immersion, a traditional deposition method. The P1D molecules are strongly bonded to the carbon surfaces by the vacuum vapor deposition, whereas the bondings are minimal in the case of immersion. The N and Si incorporation enhances the bonding of P1D toward the carbon surfaces. This is due to the change in the surface structure of the hydrogen‐terminated carbon surfaces by N and Si incorporation into the carbon network, which increases the adsorption sites on the carbon surfaces. Copyright © 2006 John Wiley & Sons, Ltd.