bluuebunny/crossref_metadata_2025_split huggingface dataset:
Crystallization and Amorphization of Sic-Ceramic PVD Coatings After Laser Treatment
Authors: Knotek O. , Löffler F. 
Published: March 2011

AbstractOver the last ten years, surface coating engineering has become a key technology throughout the world, especially due to the successes achieved in the optics and microelectronics sectors. First advances in the wear protection field were attained with coated carbides, indicating a substantial technical and economic potential in these areas.The development of wear protective coatings often reaches the limits of what is technically possible. For this reason, processes incorporating two different methods and combining the specific advantages of each are increasingly being developed for the deposition of certain coatings. In the study presented here, PVD (Physical Vapour Deposition) technology was combined with laser surface treatment technology to produce amorphous and crystalline SiC coating phases. The objectives of the study were to establish the respective advantages of crystalline and amorphous phases. The amorphous ceramic coating exhibits excellent corrosion resistance, whereas the crystalline phases generally attain higher adhesion and superior stability at high temperatures. There are therefore technical applications for both phases.
Processing of Ferroelectric Memories
Authors: Paz De Araujo Carlos A. , McMillan L. D. , Scott J. F. 
Published: March 2011

AbstractThis paper describes the classification of existing integration schemes for ferroelectric memories, including both nonvolatile and volatile devices, and the status of device development for CMOS (both SRAM and DRAM architecture), GaAs JFET structures, bipolar, and true ferroelectric FETs (in which the ferroelectric is deposited in the gate region to modify the source-to-drain current when the polarization is reversed). Emphasis in the paper is on electroding, film deposition, drying and baking, and annealing steps.
Structure and Characterization of Sputtered Thin Films Based on Lead Titanate.
Authors: Pignolet A. , Schmid P. E. , Wang L. , Lévy F. 
Published: March 2011

AbstractPure and doped lead-titanate (PT) and lead-zirconate-titanate (PZT) thin films have been deposited on platinum-coated silicon by rf-magnetron sputtering from pressed powder targets. The films have been deposited without substrate heating. The amorphous films were then annealed in an oxygen flow. The structure of the films is tetragonal or rhombohedral depending on composition. The electrical resistivity, dielectric permittivity, ferroelectric hysteresis and pyroelectric coefficient are reported.
The Effects of Lead-Compensation and Thermal Processing on the Characteristics of DC-Magnetron Sputtered Lead Zirconate Titanate Thin Films
Authors: Chikarmane Vinay , Sudhama Chandra , Kim Jiyoung , Lee Jack , Tasch A I 
Published: March 2011

AbstractThe feasibility of the fabrication of thin film capacitors of Lead Zirconate Titanate (PZT) by reactive DC-Magnetron sputtering, with large switched charge and low leakage current densities for ultra-large scale integration Dynamic Random Access Memory (ULSI DRAM) applications has been demonstrated. As-deposited films were found to be predominantly pyrochlore; therefore, a subsequent phase transformation-inducing thermal processing step was key to obtaining device quality films. The importance of the thermal budget in optimizing the device characteristics of PZT films is discussed. The importance of the role of Pb compensation in lowering the required thermal budget and significantly enhancing device characteristics is shown.
Metal-Ferroelectric-Semiconductor Characteristics of BaMgF4 Films on p-Silicon
Authors: Kalkur T. S. , Kulkarni J. R. , Kwor R. Y. , Levinson L. , Kammerdiner L. 
Published: March 2011

AbstractCapacitance-voltage characterstics of BaMgF4 film deposited in an ion-assisted deposition system shows hysteresis and the direction of hysteresis corresponds to ferroelectric polarization. Electrical characterization of the films shows that these films can be used to implement non-destructive read-out non-volatile ferroelectric memories. These films were found to dissolve in water and other aqueous solutions. In order to overcome this problem, a suitable capping layer like zirconium oxide and amorphous silicon was deposited on BMF films. The shift in threshold voltage did not change significantly due to the incorporation of the capping layer. The shift in threshold voltage was found to be temperature dependent and this might be due to ionic conduction in fluorides.
Direct Evidence of the Si Interstitialicy Injection and Fast diffusion effect in Si During Pulsed Laser Melt Process
Authors: Chang Yih , Chen J. , Talwar S. , Shu E. Y. , Sigmon Thomas. W. 
Published: March 2011

AbstractHigh temperature gradient induced fast diffusion effect during pulsed laser melt processes is reported for the first time in the Si semiconductor. We use both the oxidationinduced stacking faults and dislocation loops as markers to determine the degree of enhanced diffusion in the unmelted Si substrate by tracing their movement after laser melt. The crosssectional transmission electron microscope is employed to investigate the defect structures before and after laser melt. The expanded dislocation loops exhibit a significant diffusion and climb occurring during the nanosecond-scale processing duration. We also formulate and solve the governed diffusion equation, based on a high temperature gradient induced electric field, to simulate the dislocation movement. The agreement between the experimental and simulated results verifies that the fast diffusion effect indeed occurs in the Si semiconductor during the pulsed laser melt period.
Preparation and Application of Magnetic Films by Ferrite Plating in Aqueous Solution
Authors: Abe M. , Itoh T. , Tamaura Y. 
Published: March 2011

ABSTRACTFerrite plating invented by the authors facilitates formation of crystalline films of spinel, (Fe, M)3O4 (M=Fe, Ni, Co, Mn, Zn, etc.), in an aqueous solution below 100 °C. This opened the door to new ferrite-film devices which use, as substrate, such non-heat-resistant materials as plastics and GaAs ICs. In this paper we describe the principle and the experimental methods of ferrite plating and report magnetic and structural properties of the films. We also describe various applications of the ferrite plating films to microwave, electrochemical and bio-medical devices.
Imaging Magnetic Bit Patterns Using a Scanning Tunneling Microscope with a Flexible Tip
Authors: Moreland John , Rice Paul 
Published: March 2011

ABSTRACTTunneling stabilized magnetic force microscopy (TSMFM) is a variant of scanning tunneling microscopy (STM) where the usual rigid STM tip is replaced with a flexible magnetic tip. This method contrasts with other magnetic force microscopes based on optical or capacitive detection of cantilever deflection due to magnetic forces. Instead, the position of the flexible tunneling tip depends on both topography and magnetic forces acting on the end of the tip. The z-motion of the piezoelectric translator flexes the tip to balance the magnetic force so that the end of the tip remains a fixed tunneling distance from the sample surface. We present a review of some TSMFM images showing the recorded bit patterns on hard disk, floppy disk, and tape surfaces. The images were taken in air using STM tips made from free-standing Fe and Ni films about 1 μm thick. The image resolution of TSMFM is routinely submicrometer. We conclude that this simple modification of STM will be a valuable diagnostic tool in the magnetic recording industry.
Magnetic Properties of Fe/Ru and Fe/Ir Superlattices with Short Periodicity
Authors: Piecuch M. , Andrieu S. , Bobo J. F. , Maurer M. , Ravet M. F. , Dupuis V. , Ousset J. C. , Dieny B. 
Published: March 2011

ABSTRACTWe present new results on the magnetic properties of constrained, iron base, good quality, single-crystalline superlattices, Fe/Ru and Fe/Ir. It is shown that in the first case there are two magnetically dead layers at the interface while in the second case there is probably none. The magnetic moment of Fe is, in both superlattices, about 1.7μb. The magnetic anisotropy are opposite, in plane for Fe/Ru, perpendicular for Fe/Ir.
Thermal Evolution of Magnetic Properties and Crystal Structure in Compositionally Modulated Al/Ni Thin Films
Authors: Waknis A. , Haftek E. , Tan M. , Barnard J. A. , Tsang E. 
Published: March 2011

ABSTRACTPeriodic multilayer thin films of the form (xAl/yNi)n were grown by alternate deposition of pure Al and Ni using dc-magnetron sputtering. The thicknesses of the individual Al and Ni layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm while y was systematically varied from 2.4 to 154 nm. The films were tested in as-deposited and annealed states for magnetic properties using a vibrating sample magnetometer and for crystal structure by x-ray diffraction. In both the as-deposited and annealed samples the magnetization per unit volume of Ni declined as the Ni layer thickness decreased. This result can be interpreted in terms of a magnetically ‘dead’ layer at the Al/Ni interfaces. The width of the dead layer increased from 2.9 nm to 5.8 nm on annealing. Magnetic properties were correlated with crystal structure experiments by x-ray diffraction. As-deposited films yielded a Ni(111) texture. The Ni (111) peak decreased in intensity and broadened as the Ni thickness declined. Annealing produced evidence for the growth of the intermetallic NiAl3.
Periodic Length Dependence of Magnetic Properties in Fe/MnSb Multilayered Films
Authors: Nakagawa Shigeki , Tanaka Hiroki , Naoe Masahiko 
Published: March 2011

ABSTRACTThe relationship between crystallographic and magnetic characteristics of multilayered films composed of Fe and MnSb layers were investigated in detail. The thicknesses of Fe and MnSb layers dFe and dMnSb were changed in the range of 50 ˜ 100 and 3˜ 100 Å, respectively. Although only the (110) oriented α-Fe crystallites appeared in the films with dMnSb as small as about 5 Å, both of X-ray diffraction peaks of Fe and MnSb crystallites were not detectable in one with dMnSb of about 15 Å. The growth of both Fe and MnSb crystallites seemed to be strongly prevented in the films with dMnSb in this range. On the contrary, the peaks corresponding to (110)Fe and (110)MnSb appeared in X-ray diffraction diagram for the film with dMnSb above 25 Å. The films with d of 10 Å and dFe of 20 Å exhibite the saturation magnetization 4πMs of 15 kG and the coercivity Hc of 0.2 Oe. Such a low Hc was two order lower than those of both Fe single layer film and MnSb one. This seems to be attributed to the fine granulation of Fe and MnSb crystallites.
Magnetic Properties of Nanocrystalline Fe-Based Soft Magnetic Alloys
Authors: Yoshizawa Yoshihito , Yamauchi Kiyotaka 
Published: March 2011

ABSTRACTMagnetic properties of nanocrystalline alloys produced by crystallization of Fe-Cu-Nb-Si-B amorphous alloys have been investigated. The best result is obtained at the annealing conditions where the main phase is bcc and it is very important to suppress the formation of Fe-B compounds with large magnetocrystalline anisotropy. Homogeneous and ultrafine grain structure has an important effect to improve the magnetic properties. Conclusively, soft magnetic properties of nanocrystalline alloys are related to various factors such as formed phases, ratio of amorphous phase, intrinsic magnetocrystalline anisotropy and magnetic interaction from grain boundary phase.
The Magnetic Anisotropy of Co-Base Amorphous Alloys
Authors: Zhang Wu-Xin , Li Xi-Ming , Chen Nan-Ping 
Published: March 2011

ABSTRACT4 Co–base amorphous alloys prepared by rapid quenchling are stress–annealed under different temperature (Ta) balow its crytalline temperature Tcry, after pre–annealing. The effect of magnetic anisotropy with Ta shows the mechanism of stress–induced anisotropy is changed from single ionic modal to pair model as Ta inereases. The effect of Mn content may exaggerate the model changing.
Effect of Cu and Al Substitutions on the Microstructure of R-Fe-B Magnets
Authors: Zhang Y. J. , Withanawasam L. , Hadjipanayis G. C. , Kim A. 
Published: March 2011

ABSTRACTThe coercivity of melt-spun Pr-Fe-B ribbons was found to increase with the addition of Cu and Al. The change in size and shape of grains with Cu and Al substitution were investigated by transmission eletron microscopy (TEM) and the grain boundary structure was further examined with high resolution electron microscopy (HREM). For small substitutions only “disturbed lattice” regions were observed at most of the grain boundaries. Secondary phases rich in the added elements were observed mostly at tripple grain boundaries and sometimes at grain boundaries in samples with larger amounts of substitution. The grain size in the substituted samples does not decrease much with further substitution. However, the shape of grains changes from polyhexagons to facets. The enhancement in coercivity can be explained by the grain size reduction and the modification of microstructure at the grain boundary regions.
In Situ Tem Study of Amorphous to Crystalline Transformation in R-Fe-B Ribbons
Authors: Zhang Y. J. , Wang Y. Z. , Hadjipanayis G. C. 
Published: March 2011

ABSTRACTThe amorphous-crystalline transformation in R-Fe-B ribbons was studied in situ in a transmission electron microscope (TEM) and with X-ray diffraction. Metastable phases of α-Fe(R) and Fe3B were found to form during crystallization before the final R2Fe14B phase is formed. The Fe3B phase is believed to be important for the formation of the 2:14:1 phase because its “local unit structure” is one of the basic building blocks in the 2:14:1 unit cell.
Chromium Underlayer Effects in Longitudinal Magnetic Recording
Authors: Doerner M. F. , Wang P.-W. , Mirzarnaani S. M. , Parker D. S. 
Published: March 2011

ABSTRACTFor media used in longitudinal recording, an epitaxial relationship is observed between the Cr and Co-alloy layers, and generally a strong Cr <100> texture is desirable for c-axis in-plane orientation of the Co alloy. In this study, Cr underlayer thickness, temperature and Cr deposition pressure were varied while keeping the magnetic layer (CoPtCr) deposition process constant. Films were deposited on circumferentially textured NiP, polished NiP and chemically elched NiP substrates as well as Si wafers in order to study the effects of surface finish on the crystallographic orientation of the Cr underlayer. The uniformity of the magnetic properties and in-plane anisotropy (orientation ratio) of the disks were measured using Kerr magnetrometry. The in-plane anisotropy was found to be related to the Cr deposition conditions and the surface texture of the NiP. Signal to noise ratio results and a possible mechanism for the origin of the in-plane anisotropy are discussed.
Conversion Electron Mossbauer Spectroscopy of Epitaxial Iron Oxide Films
Authors: Takano M. , Fujii T. , Bando Y. , Isozumi Y. , Katano R. , Okuda T. 
Published: March 2011

ABSTRACTEpitaxially grown iron oxide films have been studied microscopically by conversion electron M~ssbauer spectroscopy. Specially designed proportional counters cover a temperature range between 1.75K and 1100K. A 5Å-thick layer containing 57Fe was grown at an arbitrary depth of a 56 Fe3O4 film, even- at the topmost or at the interface with a substrate crystal, to find local properties nondestructively. Temperature dependence of the hyperfine parameters of Bi 3 Fe5O12 films were analyzed to find structural and magnetic effects of Bi3+ in comparison with usual garnets. The Morin transition of α-Fe2O3 was found to strongly depend upon the orientation of films and post-annealing.
Magnetic Properties and Microstructure of Co-Pt-B-O Alloy Films
Authors: Hayashi K. , Iwasaki Y. , Okabe A. , Yamamoto T. , Hayakawa M. , Aso K. 
Published: March 2011

ABSTRACTCo-Pt-B-O alloy films show the magnetic properties of saturation magnetic induction 4TπMs = 12 kG, perpendicular coercivity Hc(⊥) = 5 kOe, and perpendicular anisotropy field Hk(⊥) = 23 kOe. These characteristics are easily controlled by changing the film composition. The perpendicular magnetic anisotropy field and the coercivity of the Co-Pt-B-O alloy films have close correlation with the film microstructure. To clarify this relation, the individual effects of oxygen and boron in the Co-Pt binary alloy film were investigated. The addition of boron makes the average grain size smaller, whereas the column diameter remains unchanged. The addition of oxygen to the Co-Pt binary alloy reduces the column diameter to about 5–10 nm, whereas the columns are densely packed without any gaps. The sole addition of oxygen or boron neither increases the perpendicular anisotropy nor the coercivity. The high perpendicular anisotropy and the large coercivity are derived from the fine columnar structure of 5–10 nm in diameter coupled with the inter-columnar gaps of about 1 nm and are obtained by the co-additions of oxygen and boron.
Microstructure of Electroless-Plated CoNiReP/NiMoP Double-Layered Media for Perpendicular Magnetic Recording
Authors: Osaka T. , Homma T. , Noda K. , Asai H. 
Published: March 2011

ABSTRACTThe microstructure of the electroless-plated CoNiReP/NiMoP doublelayered media was examined with various methods and the origin of the inplane anisotropy initial regions of the CoNiReP recording layers was discussed. It was confirmed that the initial region consists of randomly oriented fcc phase with Ni-rich composition, showing the granular condition, while the perpendicular anisotropy region at the top consists of <002> perpendicularly oriented hcp phase, showing the columnar structure. It is considered that the formation of the initial region is due to a preferential deposition of Ni onto the underlayers, and that the thickness of the initial region changes due to a change in the condition of the underlayers, especially that of deposition activity and/or morphology at their surfaces.
Magnetic Properties of Co/Pt Multilayers on MgO (100) Substrates
Authors: Krishnan R. , Lassri H. , Porte M. , Tessier M. , Flevaris N. K. 
Published: March 2011

ABSTRACTWe have prepared Co/Pt multilayers by evaporation in UHV on MgO (100) substrates kept at various temperatures. Most of the samples were grown on a Pt buffer layer. Magnetic and magneto-optical properties have been studied. The surface anisotropy Ks for MgO substrates is 0.35 erg.cm−2 which is smaller than 0.6 erg.cm−2 obtained for glass substrates. The effect of the growth conditions on Ks is observed only for t(Co)<10 Å where the crossover to Keff>O occurs. Deposition at higher temperature leads to an increase in the coercivity. The magnetization and the anisotropy is practically temperature independent in the range 5 to 295 K. However the coercivity increases sharply below 100K.
Recent Developments in the use of the Tripod Polisher for TEM Specimen Preparation
Authors: Benedict John , Anderson Ron , Klepeis Stanley J. 
Published: March 2011

AbstractCross sections of material specimens for TEM analysis must be produced in the shortest time possible, contain few, if any, artifacts and have a large area available for analysis. The analyst must also be able to prepare these cross sections from specified areas of complex, heterogeneous structures on a routine, reproducible basis to meet the growing needs of the semiconductor industry for TEM analysis. The specimen preparation spatial resolution required for preparing precision cross sections is substantially less than one micron. Cross sections meeting these requirements can be prepared by mounting a specimen to the Tripod Polisher and mechanically polishing on one side of the specimen, using a sequence of progressively finer grit diamond lapping films, until the area of interest is reached. This polished surface is then very briefly polished on a cloth wheel with colloidal silica to attain the final polish on that side. The specimen is then flipped over on the Tripod Polisher and polished from the other side, using same sequence of diamond lapping films to reach the predefined area of interest. The Tripod Polisher is set at a slight angle, to produce a tapered, wedge-shaped specimen, which has the area of interest at the thinnest edge of the taper. The specimen is polished with the diamond lapping films and the colloidal silica until it is 1000 Angstroms or less in thickness. The specimen is removed from the polisher and mounted on a 2 × 1mm slotted grid with M-Bond 610 epoxy. After the epoxy is cured the specimen can be taken directly to the microscope for analysis. The need for ion milling has been eliminated or reduced to a few minutes in most of our work because of the thinness of the final specimen. The total specimen preparation time is between 2.5 and 4 hours, depending on the specimen and the size of the specified area. The area available for analysis ranges from 0.5mm up to the full size of the mounting grid opening. The wedge shape of the specimen provides the mechanical stability needed for a long thin specimen.
Preparation of Planview TEM Samples of Yba2Cu307−x Films Grown on BaF2(001)
Authors: Li Yang , Jinlong Zhang , Chenggao Fan , Yuheng Zhang 
Published: March 2011

AbstractA method for the preparation of planview transmission electron microscope (TEM) specimens of expitaxial Yba2Cu3O7−x (YBCO) thin films deposited on BaF2 by a dc modified planar magnetron sputtering technique is reported. The films are granular with their grains size ranging from a few hundred to a few thousand nanometers. The epitactic nature of the film growth is shown by analyses of moiré fringe patterns and by selected area diffraction methods. It is demonstrated that the YBCO thin film obtained is highly c-axis oriented, with misorientation corresponding to rotations of 9.2° and 90° about the c-axis. Additionally, the film's a or b axes form a 45° angle with that of the substrate.
Minimization of Non-Uniform Ion-Thinning Effects in Thin Film Transverse Specimens for Transmission Electron Microscopy
Authors: Shaapur F. , Watson K. A. 
Published: March 2011

AbstractA computer-controlled, specimen rotation attachment was developed and installed on a commercial ion-milling system for TEM specimen preparation. This rotation method produced relatively large thin areas on a variety of thin film transverse specimens with a difference in the ion-milling rates between the film and the substrate. The results were generally comparable to those obtained by a newly developed low-angle ion-thinning procedure and the overall processing time was considerably shortened.
Advanced Preparation of Hard Materials for Cross-Sectional Tem Analysis
Authors: Ostreicher Kim , Sung Changmo 
Published: March 2011

AbstractThe preparation of cross-sectional specimens for materials such as tungsten carbide containing ceramic coatings presents some unique problems. Pieces joined by the use of epoxies often separate at this interface during subsequent preparation steps as a result of the vibration and physical strain placed on the sample during the initial mechanical grinding and subsequent thinning process. These problems have been overcome through the use of a preparation process which essentially encapsulates the sample within the confines of an epoxy filled quartz tube. This preparation process has allowed for the cross-sectional analysis of Al2O3/TiC coatings on WC substrates and has revealed two distinct grain morphologies within the TiC coating.