bluuebunny/crossref_metadata_2025_split huggingface dataset:
A routine correction for electron beam intensity variation during quantitative EDS microanalysis using continuum radiation
Authors: Griffin B. J. , Nockolds C. E. 
Published: August 2011

AbstractA detailed investigation of the relationship between the mean atomic number and the intensity of high energy continuum radiation has verified earlier studies in defining a linear relationship. Corrections for matrix effects on the continuum intensity are found to be unnecessary within the precision limits of the data. Incorporation of this relationship into a quantitative energy‐dispersive spectrometer (EDS) microanalysis program allows internal correction for electron beam intensity variations between standard and unknown specimen analysis. It therefore allows quantitative analysis without normalisation on systems lacking any form of electron beam current measurement. Within limits, the need for reproducibility of electron beam intensity and counting time is eliminated.
Diagnostics of heterogeneous chemical reactions by cathodoluminescence
Authors: Melikhov I. V. , Saparin G. V. , Bozhevolnov V. E. , Obyden S. K. , Kuleshova O. V. 
Published: August 2011

AbstractA scheme is developed for establishing the mechanism of heterogeneous chemical reactions by scanning electron microscopy (SEM) using cathodoluminescent markers (or flares CLF). Diagnostic formulas are found for the distribution function of product crystals with respect to their states under different reaction conditions. The diagnostic scheme is checked for the reaction of F‐apatite with phosphoric acid.
Calculation of depth distribution functions in films using an electron scattering model
Authors: August Hans‐Jürgen 
Published: August 2011

AbstractAn electron scattering model which has proved reliable in predicting both characteristic and continuous radiation depth distributions in bulk samples is further developed to cope with the quantification of depth distribution curves in thin films. The validity of the extended model is checked by comprehensive comparisons of calculated emitted x‐ray intensities with experimental data. The deviations obtained are generally small, the root‐mean‐square error being ∼5%. The results of calculations quantifying the effect of the substrate material on the shape of the depth distribution function in the film are also presented. The curves obtained are discussed in light of known theories and of fundamental physical considerations. The new model generates curves which correspond at least qualitatively with what is to be expected from basic principles and with the results of recent Monte Carlo simulations.
Cryopump vibration isolation system for an SEM
Authors: Postek M. T. , Keery W. J. 
Published: August 2011

AbstractA standard commercially available cryopump system has been installed on a scanning electron microscope (SEM) using specially optimized vacuum vibration isolation bellows. This installation was successful in reducing the cryopump‐induced vibration to a level that did not degrade the standard performance or resolution of the SEM in the pump‐on mode and, in the pump‐off (or coasting) mode, eliminated all measurable instrument‐induced vibration (i.e., from the vacuum system). This article outlines the manner in which this performance has been accomplished and presents the results of an experiment demonstrating the reduction of specimen contamination provided by this type of vacuum system.
Nonoptical method of spectral cathode luminescence analysis
Authors: Kasparov K. N. , Zaretskii N. I. 
Published: August 2011

AbstractA new method for measuring a monochromatic wavelength of cathodoluminescence using a scanning electron microscope is described. By eliminating losses of the optical system and ensuring a large relative aperture, it is possible to measure the wavelengths of luminous surface spots and compositions of spot sizes up to 2 μm; spectral resolution is about 3 nm.
Techniques for obtaining and observing complementary images with a low‐temperature field emission SEM and subsequent comparison of the identical cells in freeze‐etch replicas viewed with a TEM
Authors: Wergin William P. , Erbe Eric F. 
Published: August 2011

AbstractInitial evidence shows that low‐temperature (LT) field emission scanning electron microscopy (FESEM) provides high‐resolution complementary images of frozen, fractured biological tissues and that the coating or replicas from the tissues can be recovered and viewed in the TEM to compare the identical cellular structures. To observe frozen specimens, a Hitachi S‐4000 FESEM was equipped with an Oxford CT 1500 Cryotrans System. The standard Oxford specimen carrier was modified to accommodate a Denton complementary freeze‐etch cap that would hold up to 6 hinged 24K gold specimen holders. This combination allowed observation of complementary images of sputter‐coated, freeze‐etched biological specimens at magnifications up to X30,000. Resolution of sputter‐coated images was also compared with that from evaporative coatings. Use of high‐vacuum evaporation of Pt/C in conjunction with LT‐FESEM provided useful resolutio up to X100,000. In addition, after these specimens were observed in the LT‐ FESEM, their coating, which consisted of a freeze‐etch replica, could be recovered from the frozen tissues and subsequently observed in the TEM at even higher resolutions. Consequently, complementary images of frozen, fractured, fully hydrated cells could be observed in the LT‐FESEM and then compared to the complementary images of the identical cells that were present in the replicas, which were recovered from the frozen specimens, and subsequently observed in the TEM. Being able to evaluate, compare, and contrast data from these two different EM imaging techniques as well as from complementary surfaces, not only provides additional information about the ultrastructure of a specimen, but also helps to assess the resolution of coating films, the presence of contaminants and the three‐dimensional distortion in replicas.
Ion microscopy imaging of various pyrimidic nucleotides and analogs in the nuclei of cultured tumor cells
Authors: Berry J. P. , Lespinats G. , Escaig F. 
Published: August 2011

AbstractNew applications for ion microscopy are presented. This method has been used primarily to detect mineral elements (K+, Na+, AL+). It also can be used to detect organic molecules containing halogen atoms and radioactive isotopes. 14C‐nucleotides and halogenated pyrimidic nucleotides and analogs were employed in this study. The various images obtained were correlated with the mechanism of action of these compounds, thus opening new lines of research.
Surface topography and intracellular organization of human cells in suspension as revealed by scanning electron microscopy
Authors: Malecki Marek , Ris Hans 
Published: August 2011

AbstractThis report presents a new procedure to study the ultrastructure of human cells in suspension by means of scanning electron microscopy. Living cells were maintained in suspension within cell culture flasks located on a rotating tilting table within an incubator. These cells were injected into warm glutaraldehyde/formaldehyde fixative. After washing in buffer, fixed cells were attached to propylamine‐derived glass carriers. However, saturating free aldehyde groups of fixed cells and blocking amine groups of the derived glass carriers prevented cells from attachment to these carriers. Thus, we postulated that bonds between the fixed cell‐free aldehyde groups and the carrier amine groups were responsible for cell‐to‐carrier attachment. Fixed cells attached to the carriers were subsequently dehydrated, dried, and coated for surface topography studies. For studies of internal cell organization, these attached cells were immersed in agar or gelatin as extracellular embedments and infused with sucrose or polyvinyl‐pyrrolidone as cryoprotectants. Cells then were frozen and fractured. Fractured cells were either thawed, dehydrated, critical point dried, and ion beam sputter‐coated, or freeze‐substituted, dried, and planar magnetron sputter‐coated. Finally, cell preparations were observed in the scanning electron microscope. Due to high cell attachment yield, both approaches samples observed in the electron microscope were representative of the entire cell population.
Scanning microscopies of indented MgO crystals
Authors: Nazarova T. A. , Nazarov M. V. , Rau E. I. , Saparin G. V. 
Published: August 2011

AbstractThe combination of scanning electron microscopy (SEM) and scanning optical microscopy (SOM), including a computer‐controlled signal detection system, is promising in the study of a variety of materials, especially such alkaline‐earth oxides with a rock salt structure, such as MgO. Among the SEM modes of this technique used to investigate deformed zones in indented MgO single crystals are: secondary electrons (SE), cathodoluminescence (CL) (total, pointal, color), electron beam‐induced current (EBIC), electron beam‐induced voltage (EBIV), as well as both polarized and transmitted light modes in SOM. The present experiments were designed to clarify the correlation between the optical, luminescent, electrical, and plastic properties of deformed MgO. An attempt has been made to explain the results in terms of dislocations created during deformation.
Chemical preparation of dielectrics for studying their microtopography by the SEM
Authors: Dorozhkin S. V. , Nikolaev A. L. , Melikhov I. V. , Saparin G. V. , Bliadze V. G. 
Published: August 2011

AbstractA procedure for the chemical preparation of dielectrics to make their surfaces conductive is proposed. Its simplicity and rapidity, as well as the possibility of using it to study etching kinetics of specimen surface morphology are noteworthy. The procedure is demonstrated by the interaction of F‐apatite with acids. The procedural steps include careful attention to the washing of the specimen following its interaction with an acid and to its drying thereafter. The composition of the washing solution and the washing time must be carefully controlled. Positive results are obtained for the interaction between F‐apatite and phosphoric, hydrochloric, nitric acids and between glass and hydrofluoric acid. Acetone was employed as the washing solution and in all cases sharp images of the specimen surface were obtained in the SEM. The subsequent washing of the specimen in water restored the dielectric properties of its surface. By sequentially etching, drying, and observing the specimen in the SEM, a series of images was obtained of an area of the surface as it was being etched. This series of images permitted determination of the growth rate of etched pits.
Confocal surface profiling utilizing chromatic aberration
Authors: Browne M. A. , Akinyemi O. , Boyde A. 
Published: August 2011

AbstractA new method for surface profiling in the confocal microscope utilizing chromatic aberration is presented. An expression for the integrated spectral intensity in the new profilometer is derived and chromatic aberration in the confocal microscope is explained. Estimates of the minimum resolvable depth and the maximum depth that can be profiled are given utilizing a ratiometric signal detection scheme. Examples of ratio images illustrating the new surface profiling technique are presented, showing the scheme to be both simple to implement and effective.
SIMS analyses of rare earth elements in natural minerals and glasses: An investigation of structural matrix effects on ion yields
Authors: Bottazzi Piero , Ottolini Luisa , Vannucci Riccardo 
Published: August 2011

AbstractAn investigation of the influence of matrix structure upon secondary ion signals for rare earth elements (REEs) in various silicates (amphiboles, clinopyroxenes, garnets, and plagioclases) was carried out by means of conventional energy filtering technique (CEF). Such matrices were analysed both as natural crystals and fused glasses. Of the selected REEs for the different minerals, only La showed an intensity relatively higher than Si in glassy amphiboles and augites. The hypothesis proposed of an ionization behaviour of La that differs with respect to other REEs in silicates has not been confirmed in plagioclases. All other relative REE ion yields from crystals and glasses agreed within the statistics of measurement for all investigated matrices. Moreover, any difference between crystal and glass REE ionization appeared not to be attributable to varying charging conditions during analysis under O− primary beam bombardment. Laboratory contamination during glass preparation and/or the presence of residual light REE‐enriched micron‐scale accessory phases (e.g., apatite) could be responsible for the higher La/Si signal in augite and amphibole glasses. Results obtained show that the efficiency of REE ionization compared with that of Si. generally is not affected by the sample structure as far as high energy secondary ions are concerned; therefore, glasses obtained by fusing silicate minerals are suitable for analytical work and can be employed to calibrate REE ion signals for quantitative purposes.
DNA and RNA polymerase/DNA complex imaged by scanning force microscopy: Influence of molecular‐scale friction
Authors: Zenhausern F. , Adrian M. , Heggeler‐Bordier B. Ten , Eng L. M. , Descouts P. 
Published: August 2011

AbstractReproducible images of DNA and the interaction of RNA polymerase with supercoiled DNA on mica have been obtained by scanning force microscopy (SFM) in air. This technique allowed visualization of the assembly of distinct nucleoprotein complexes at specific sites which initiate DNA replication. Transmission electron microscopic controls were performed on the carbon‐coated replica of the same specimens previously scanned by scanning force microscope. Image contrast formation has been investigated and lateral friction forces have been qualitatively characterized with SFM on DNA‐covered samples.
Analysis of electron range versus energy relationship of insulators in low‐voltage scanning electron microscopy
Authors: Ishibashi Y. , Kodama T. , Oiwa H. , Uchikawa Y. 
Published: August 2011

AbstractA theoretical analysis is made concerning the question of whether or not an insulator's surface is observable without the unstable disturbance due to negative charge‐up in the secondary electron mode of a low‐voltage scanning electron microscope. Introducing a simple modification into the elementary theory of secondary electron emission from solid materials, the threshold condition as to observability is formulated as a function of the energy Ep and the incident angle ϕp of the primary beam. It is shown that for insulators the material's constant n, which appears in the standard formula of the electron range (R) versus energy (Ep) relationship R Φ E, can be determined through experimental investigations into observability of the surface. Careful consideration is also given to the effectiveness of the present theoretical analysis.
Light transport in single‐crystal scintillation detectors in SEM
Authors: Schauer P. , Autrata R. 
Published: August 2011

AbstractA Monte Carlo simulation method was developed to determine the efficiency of photon transport through a modified rotationally symmetric Everhart‐Thornley detector. The method makes use of the random generation of photon emission from a luminescent centre and describes the trajectory of photons and the efficiency of their transport toward the photocathode of the photomultiplier tube. The model includes photon generation in a point source, mirror reflection by a metal‐coated surface, Fresnel reflection by a metal‐uncoated surface, Fresnel passage through the boundary of different materials, diffusion reflection, and passage through a matted surface and optical absorption in material. For the simulation, an IBM‐PC‐compatible program was written and applied to detection systems with disc, conical, and hemispherical YAG:Ce single‐crystal scintillators with cylindrical or tapered light guides or without any light guide. The model was verified by measuring the efficiency of detection systems excited by the primary electron beam in the line‐scan SEM mode.
Automatic contrast adjustment for detail recognition in SEM images using on‐line digital image processing
Authors: Oho Eisaku 
Published: August 2011

AbstractA new digital filter method has been developed for enhancement of detail recognition in SEM images of high signal‐to‐noise ratio using an on‐line digital image processing system. The filter allows an automated improvement of the presentation of SEM image information and utilizes a median filter of very large mask size and histogram equalization. Since the method can be performed without input of any processing parameters, the user simply pushes a button for obtaining the processing result similar to conventional photo recording. The method utilizes digital signal processors for establishing high speed, hence, the processing results can be immediately assessed. When Applied to a variety of field‐emission SEM images, there were no problems with inconvenient artifact encountered.
Determination of fixed electron‐beam‐induced positive oxide charge
Authors: Bernstein G. H. , Polchlopek S. W. , Kamath R. , Porod W. 
Published: August 2011

AbstractContrary to previous beliefs, electron‐beam‐induced positive charges in insulators persist where created for at least several weeks without discernible movement. Formerly, coating with a thin metal overlay was thought to allow the charge to leak away. Coating with a conductor is shown to shield electric fields from affecting the imaging probe, but to remove no charge from the specimen. A new technique is introduced for the evaluation of the properties of electron‐beam‐induced positive charges in metal‐oxide‐semiconductor (MOS) capacitors. MOS structures were subjected to partial area exposure in a scanning electron microscope. These exposures resulted in the creation of areas of localized positive charge within the oxide, which was observed as steps in the capacitance‐voltage data. A systematic study was performed. It related the exposed area to the step height and the amount of induced charge to the voltage shift of the step. A model describing the observed phenomenon is presented, followed by a comparison of theoretical and experimental results. The progress of the charge over time was studied by performing capacitance‐voltage analysis 30 min after electron beam exposure and up to 4 weeks later.
Electron‐specimen interactions in low‐voltage scanning electron microscopy
Authors: Böngeler R. , Golla U. , Kässens M. , Reimer L. , Schindler B. , Senkel R. , Spranck M. 
Published: August 2011

AbstractMeasurements of the electron range R, and the backscattering coefficient η and the secondary electron yield δ at normal and tilted incidence for different elements show characteristic differences for electron energies in the range of 0.5 to 5 keV, compared with energies larger than 5 keV. The backscattering coefficient does not increase monotonically with increasing atomic number; for example, the secondary electron yield shows a lesser increase with increasing tilt angle. This can be confirmed in back‐scattered electron (BSE) and secondary electron (SE) micrographs of test specimens.The results are in rather good agreement with Monte Carlo simulations using elastic Mott cross‐sections and a continuous‐slowing‐down model with a Rao Sahib‐Wittry approach for the stopping power at low electron energies. Therefore, this method can be used to calculate quantities of BSE and SE emission, which need a larger experimental effort. Calculations of the angular distribution of BSEs show an increasing intensity with increasing atomic number at high takeoff angles than expected from a cosine law that describes the angular characteristics at high electron energies. When simulating the energy distribution of BSEs, the continuous‐slowing‐down model should be substituted by using an electron energy‐loss spectrum (EELS) that considers plasmon losses and inner‐shell ionizations individually (single‐scattering‐function model). The EELS can be approached via the theory for aluminium or from EELS spectra recorded in a transmission electron microscope for other elements.Measurements of electron range Rα En of 1 to 10 keV electrons are obtained from transmission experiments with thin films of known mass thickness. In agreement with other authors the exponent n is lower than at higher electron energies.
Plastic lenticular three‐dimensional prints
Authors: Wergin William P. , Erbe Eric F. , Pooley Christopher D. 
Published: August 2011

AbstractMethods and explanations are presented for obtaining a series of four scanning electron micrographs (SEMs) containing parallax information that can be incorporated into a single three‐dimensional (3‐D) plastic lenticular print. The explanation includes a brief discussion of tilt angles for optimum stereopsis and tilt compensation to correct for foreshortening. In addition, instructions are given on how the four prints must be arranged and rephotographed so that Nishika 3‐D, a commercial company, can produce the final plastic lenticular prints. These 3‐D prints, which can be black and white or color, do not require glasses or any additional aids to perceive stereopsis. They are believed to be an effective and economical format for displaying 3‐D data at scientific poster sessions. Furthermore, the format and procedure used to produce the prints are not limited to data obtained from the SEM but can be used to create 3‐D prints from micrographs or other data that originate with high and intermediate voltage transmission electron microscopy, confocal microscopy, scanned probe microscopies, magnetic resonance imaging, and molecular models.
An attachment to SEM for 3‐D surface topography measurements of uniform materials
Authors: Kazmiruk V. V. , Stepanov I. S. 
Published: August 2011

AbstractThe paper reports on a SEM‐based system for quantitative three‐dimensional (3‐D) surface topography measurements. In comparison with commercial line‐width measuring systems, this metrology instrument is designed to measure quantitatively both critical dimensions in horizontal plane and features height while allowing for full cross section reconstruction from backscattered electrons (BSE) signal. The philosophy behind this technique has been described previously, (Aristov et al. 1988, 1991). Now the system is operational at our Institute, and its characteristics just as design criteria, and some examples of application are presented.
The influence of oxide surface layers on bulk electron probe microanalysis of oxygen—application to Ti‐Si‐O compounds
Authors: Goldstein J. I. , Choi S. K. , Van Loo F. J. J. , Heijligers H. J. M. , Bastin G. F. , Sloof W. G. 
Published: August 2011

AbstractThis paper discusses a generalized method to measure with the electron probe microanalyzer (EPMA) the oxygen in a material containing a surface oxide layer. The continuum background is the most difficult to measure, particularly for materials in which oxygen‐free samples cannot be produced. The method depends on the preparation of either oxygen‐free samples or well characterized oxygen‐containing samples. Specific application of the method to the Ti‐Si‐O system is discussed. In addition, measurements of oxide surface‐layer thickness of 3.6–8.0 nm on Ti and Ti‐Si compounds were obtained using EPMA and a scanning Auger microprobe (SAM). The nature of the oxide surface layers was shown using x‐ray photoelectron spectroscopy (XPS).
Detectability: A new criterion for evaluation of the confocal microscope
Authors: Gan X. S. , Sheppard C. J. R. 
Published: August 2011

AbstractWe introduce a new criterion to explore the performance, with respect to signal‐noise ratio for fluorescent imaging, in the confocal microscope. This criterion, which we term detectability, has three forms: transverse, axial, and three‐dimensional. It describes the ease with which a small object can be detected in transverse images, axial images, and three‐dimensional images.