bluuebunny/crossref_metadata_2025_split huggingface dataset:
Improvements to differential voltage contrast and light and electron scanning beam analysis of solar cells
Authors: Therrien J. , Mil'Shtein S. 
Published: June 2010

AbstractDifferential voltage contrast (DVC) in conjunction with light and electron beam scanning (LEBEAMS) technique were used for measuring the electric potential, field, and charge distribution in solar cells. The DVC is based on enhancement or retardation of secondary electron emission, generated by an electron beam, due to local changes in the potential of a semiconductor device. The information provided by this technique is invaluable to the development of any device. Solar cells have been studied by the DVC technique, both under electrical bias (DVC) and under illumination (DVC in conjunction with LEBEAMS); however, the conditions of the previous did not replicate the normal illumination conditions of a solar cell. The goal of this research was to redesign and expand the previous LEBEAMS experiments to produce accurate profiles of quasi Fermi energies on solar cells.
Characterization of biomolecule immobilization by scanning force microscopy using a wet‐masking technique
Authors: Fritzsche Wolfgang , Ermantraut Eugen , Köhler J. Michael 
Published: June 2010

AbstractThe assemblage of molecular layers was investigated using scanning force microscopy (SFM). A wet‐masking technique was used for the preparation of monolayer steps by partial masking of the substrate with an elastomeric mask during incubation in the modification buffers. The subsequent adsorption of biotin, streptavidin, and biotiny lated beads onto a gold substrate was investigated by SFM visualization of the created steps. The molecular layers were characterized based on measurements of step height and surface roughness. The simultaneous visualization of the surface before and after modification minimizes artifacts introduced by changes in tip shape or imaging parameters.
Correlating auger electron spectroscopy with scanning electron microscopy‐energy dispersive spectroscopy for the analysis of respirable particles
Authors: Stephens James W. , Harrison Joel C. , Wallace William E. 
Published: June 2010

AbstractA method has been developed to characterize large populations of individual respirable particles. With the use of custom data collection and data correlation computer software, the same set of particles can be analyzed in multiple instruments. The method is demonstrated by the analysis of a sample of hard‐metal particles. A series of particles are analyzed by Auger electron spectroscopy, and then the same particles are analyzed by scanning electron microscopy‐energy dispersive spectroscopy.
Investigation of foreign substances in food using scanning electron microscopy‐x‐ray microanalysis
Authors: Charbonneau James E. 
Published: June 2010

AbstractScanning electron microscopy (SEM) and x‐ray microanalysis (EDS) were used to conduct forensic investigations on metal and glass foreign objects. SEM‐EDS is an excellent method for identifying metal foreign objects in food, such as wire, dental fillings, bone, and metal packaging, based on their element composition. From a determination of the extent of corrosion of a metal foreign object using SEM‐EDS, it is sometimes possible to determine whether the material has been processed with the food product. Case histories of processed aluminum, unprocessed nickel‐coated steel, and corrosion resistant stainless steel foreign objects are discussed. A potential product‐tampering problem involving a hole defect in a paperboard package was resolved using SEM‐EDS. Blue fibers found in the hole were found to contain brass particles from a ball point pen rather than a syringe needle. SEM‐EDS has been used to determine the elemental composition of glass foreign objects and is able to distinguish between many types of glass including container, electrical, and bakeware. A case history is presented to show that although container glasses cannot, in general, be distiguished from one another using SEM‐ED S, they can be distinguished by trace element semiquantitative spectrograghic analysis. SEM‐EDS can be used to distinguish glass‐like foreign objects from glass. Case histories of struvite crystals found in salmon and cream of tartar crystals found in grape juice are discussed. Fourier transform infrared (FTIR) identified the cream of tartar crystal as calcium tartrate, and this complemented the calcium, carbon, and oxygen components of the compound found using SEM‐EDS.
Transformation reactions of partially gold‐coated bioactive Ca‐P glass granules investigated by analytical scanning electron microscopy
Authors: Valdrè Giovanni 
Published: June 2010

AbstractIn the present work, we have clarified the detail of the surface transformation reactions of bioactive calcium‐phosphate (Ca‐P) glass granules induced by in vivo implantation in rabbit dorsal muscle sites. To this aim we have compared the behaviour, during the same implantation, between the as‐prepared and gold‐coated only‐on‐one‐side glass granules. The deposited gold layer enabled us to determine very precisely the initial position of the surface of the glass before the transformation took place. In addition, since the gold layer acts as a diffusion barrier, it allowed the study of the direction and the mechanism of crystal growth which occurred at the glass surface. Lapped and polished cross‐sections of the samples were examined by backscattered electron (BSE) imaging and quantitative (with standards) x‐ray energy dispersive spectroscopy (EDS) in a scanning electron microscope (SEM). The observations showed the presence of an interlayered structure. Quantitative EDS microanalysis performed by profiling the electron beam across the samples indicated the presence of hydrated calcium phosphate in the external layer, an inhomogeneous silica‐rich gel‐type layer in the middle layer, and an unaffected original Ca‐P glass in the centre. From the comparison with those granules gold‐coated on one side, we deduced that the hydrated calcium phosphate layer grew towards the interior of the granules at the expense of the starting glass. A simple model, based on the balance of the concentrations of the elements which have diffused in the different layers, is proposed to explain the contribution of the elements constituting the original glass to the formation of the different layers. This result agrees with the experimental data obtained from image analysis and the microstructural behaviour of this type of glass is discussed.
How the down step edges influence formation of the 7×7 structure
Authors: Hata Kenji , Okawa Shuichi , Miyake Koji , Shigekawa Hidemi 
Published: June 2010

AbstractA surface that has wide terraces was fabricated by utilizing the step bunching phenomenon to study the effect of the down step edges on the formation of the 7×7 reconstruction. The surface with wide terraces was quenched through the 1×1–7×7 phase transition, freezing the formation process of the 7×7 reconstruction. On this surface, it became possible to investigate the influence of the down step edges on the formation of the 7×7 reconstruction because the influence of the upper step edge, which is located at the other side of the terrace, did not reach to the down step edge. A considerable decrease in the existence probability of the 7×7 reconstruction was observed near the down step edges. This decrease cannot explained by electromigration and steps advancement caused by the difference in adatom density between the 7×7 and disordered structure. Instead, we propose that the decrease in existence probability at down step edges is well explained by a simple topographic model assuming corner holes as the growth nuclei of the 7×7 domains.
An automated image alignment system for the scanning electron microscope
Authors: Rosolen G. C. , King W. D. 
Published: June 2010

AbstractWe have developed an automated image alignment system for the scanning electron microscope (SEM). This system enables specific locations on a sample to be located and automatically aligned with submicron accuracy. The system comprises a sample stage motorization and control unit together with dedicated imaging electronics and image processing software. The standard SEM sample stage is motorized in the X and Y axes with stepping motors which are fitted with rotary optical encoders. The imaging electronics are interfaced to beam deflection electronics of the SEM and provide the image data for the image processing software. The system initially moves the motorized sample stage to the area of interest and acquires an image. This image is compared with a reference image to determine the required adjustments to the stage position or beam deflection. This procedure is repeated until the area imaged by the SEM matches the reference image. A hierarchical image correlation technique is used to achieve submicron alignment accuracy in a few seconds. The ability to control the SEM beam deflection enables the images to be aligned with an accuracy far exceeding the positioning ability of the SEM stage. The alignment system may be used on a variety of samples without the need for registration or alignment marks since the features in the SEM image are used for alignment. This system has been used for the automatic inspection of devices on semiconductor wafers, and has also enabled the SEM to be used for direct write self‐aligned electron beam lithography.
Staining tissue with methacrylate casts for light microscopy
Authors: Sekosan Marin , Schraufnagel Dean E. 
Published: June 2010

AbstractScanning electron microscopy (SEM) of methyl methacrylate casts and light microscopy (LM) of tissue are well‐established methods for studying the microcirculation. The two are complimentary, but methacrylate is transparent and thus its presence is often not appreciated by LM. Histologic stains applied to methyl methacrylate in tissue sections would better identify by LM and allow the relationships with the SEM view of cast vasculature. We sought to test different stains on cast tissue to find one that would accent the cast. Surgically removed and autopsied human lungs were cast with methacry late and processed by routine light microscopic methods. They were stained with the hematoxylin and eosin, Masson trichome, elastic‐van Gieson, Grocottmethenamine silver, Brown‐Brennan, and Ziehl‐Neelsen methods. The Ziehl‐Neelsen procedure stained the methacry late best, giving it a red color. This procedure also worked well without heating. We conclude that (1) cast methacry late lung can be processed for routine LM with excellent results; (2) methacry late stains well with the Ziehl‐Neelsen technique; (3) the acid‐fast stained cast lung shows capillaries and cells in both normal and diseased lung better than the routine hematoxylin and eosin stain; (4) this technique can be used to assess filling and correlate findings on the same tissue with the two different microscopic methods.
Confocal laser scanning microscopy of chondrocytes in vitro: Cytoskeletal changes after quinolone treatment
Authors: Walter I. , Egerbacher M. , Wolfesberger B. , Seiberl G. 
Published: June 2010

AbstractThe use of quinolone antibiotics would be significant for chronically diseased children (e.g., cysticfibrosis) as a prophylactic long‐term treatment. However, quinolones were shown to cause cartilage damage in experimental animals when administered during certain developmental stages. In the present study, the effect of quinolones on chondrocytes was studied in a cell culture model in order to avoid animal experiments, to investigate the influence of single factors, and to open up the possibility to test human tissue. Chondrocytes were obtained from hipjoint cartilage of 3 to 4‐weeks‐old rats and cultured in control medium or quinolone‐supplemented medium. It was shown that quinolones heavily disturbed adhesion of chondrocytes to the culture dish, accompanied by changes in cell shape and cytoskeletal morphology. Reduction of filamentous actin (stress fibers) and disintegration of vimentin fibers was demonstrated by immunofluorescence and evaluated by con‐focal laser scanning microscopy. In contrast, distribution and amount of the adhesion molecule integrin α did not change. Results of the present study indicate that quinolones disturb the adherence mechanism of chondrocytes and lead to cytoskeleton changes.
Errors in quantitative backscattered electron analysis of bone standardized by energy‐dispersive x‐ray spectrometry
Authors: Vajda Eric. G. , Skedros John. G. , Bloebaum Roy. D. 
Published: June 2010

AbstractBackscattered electron (BSE) imaging has proven to be a useful method for analyzing the mineral distribution in microscopic regions of bone. However, an accepted method of standardization has not been developed, limiting the utility of BSE imaging for truly quantitative analysis. Previous work has suggested that BSE images can be standardized by energy‐dispersive x‐ray spectrometry (EDX). Unfortunately, EDX‐standardized BSE images tend to underestimate the mineral content of bone when compared with traditional ash measurements. The goal of this study is to investigate the nature of the deficit between EDX‐standardized BSE images and ash measurements. A series of analytical standards, ashed bone specimens, and unembedded bone specimens were investigated to determine the source of the deficit previously reported. The primary source of error was found to be inaccurate ZAF corrections to account for the organic phase of the bone matrix. Conductive coatings, methyl‐methacrylate embedding media, and minor elemental constituents in bone mineral introduced negligible errors. It is suggested that the errors would remain constant and an empirical correction could be used to account for the deficit. However, extensive preliminary testing of the analysis equipment is essential.
NSOM the fourth dimension: Integrating nanometric spatial and femtosecond time resolution
Authors: Lewis Aaron , Ben‐Ami Udi , Kuck Nily , Fish Galina , Diamant Dora , Lubovsky Lev , Lieberman Klony , Katz Sharon , Saar Amir , Roth Michael 
Published: June 2010

AbstractPhotonic devices are becoming the cornerstone of next generation systems for computing and information processing. This paper reports on the first steps in the development of methods to understand these devices with nanometric (10−7 cm) spatial and femtosecond (10−15 s) time resolution. The basis of this achievement is the dramatic developments that have occurred in the past few years in a new area of optics called near‐field optics. Near‐field optics is a form of lensless optics with a resolution that is subwavelength and which is independent of the wavelength of the light being employed. We report in this paper the transmission of pulses with tens of femtosecond duration through subwavelength, near‐field optical elements. We also report on a femtosecond near‐field optical light source with cross‐correlating capabilities and on the growth of GaAs in the tip of micropipettes for use as an ultra‐fast electro‐optical switch which can cross‐correlate optical, electrical, and electro‐optical effects. These developments are especially relevant in the investigation of photonic devices since such devices can alter their characteristics as a function of size in the mesoscopic regime from just below lens‐based optical resolutions to dimensions that approach atomic scales of ∼1 nm (10−7 cm). In view of the fact that these devices and the processes that govern them also exhibit ultrafast speeds, the combination of state of the art femtosecond laser spectroscopy with the unique features of near‐field optics is a critical step in advancing our next generation understandings of such materials and structures so that their full potential in information processing can be achieved.
Effects of the introduction of the discrete energy loss process into Monte Carlo simulation of electron scattering
Authors: Murata Kenji , Yasuda Masaaki , Kawata Hiroaki 
Published: June 2010

AbstractFirst, the single scattering model is briefly described. Next, the hybrid model is explained, which takes into consideration a part of the discrete energy loss processes. The Vriens or the Gryzinski cross section is used for core electron ionizations, and the Moller cross section for free electron excitations. The model is applied to the calculations of the energy distribution of transmitted electrons through a thin film and the depth distribution of generated x‐rays. From comparisons among the calculated results with and without energy straggling and experimental data, it is found that the Gryzinski cross section shows the best result.
Monte Carlo modeling of secondary x‐ray fluorescence across phase boundaries in electron probe microanalysis
Authors: Myklebust Robert L. , Newbury Dale E. 
Published: June 2010

AbstractSecondary fluorescence induced by photoelectric absorption of x‐rays generated by an electron beam can occur when the characteristic x‐ray energy of material “A” exceeds the critical excitation energy of material “B.” An expression is developed to calculate secondary fluorescence across a planar boundary from a discrete source placed at any (X, Y, Z) coordinates relative to the boundary. The expression can be incorporated into a Monte Carlo electron trajectory simulation which calculates the discrete distribution of primary x‐ray generation.
Use of Monte Carlo modeling for interpreting scanning electron microscope linewidth measurements
Authors: Lowney Jeremiah R. 
Published: June 2010

AbstractA scanning electron microscope (SEM) can be used to measure the dimensions of the microlithographic features of integrated circuits. However, without a good model of the electron‐beam/specimen interaction, accurate edge location cannot be obtained. A Monte Carlo code has been developed to model the interaction of an electron beam with one or two lines lithographically produced on a multilayer substrate. The purpose of the code is to enable one to extract the edge position of a line from SEM measurements. It is based on prior codes developed at the National Institute of Standards and Technology, but with a new formulation for the atomic scattering cross sections and the inclusion of a method to simulate edge roughness or rounding. The code is currently able to model the transmitted and backscattered electrons, and the results from the code have been applied to the analysis of electron transmission through gold lines on a thin silicon substrate, such as is used in an x‐ray lithographic mask. Significant reductions in backscattering occur because of the proximity of a neighboring line.
Application of scanning electron microscopy for pollution particle source determination in residential dust and soil
Authors: Brown R. S. , Millette J. R. , Mount M. D. 
Published: June 2010

AbstractMany tons of electric furnace flue dust accumulated in an industrial area in Tifton, Georgia. Vehicles transporting the flue dust, classified as K061 hazardous waste because it contained lead and cadmium, initially dumped the material in a warehouse. Once the warehouse was full, the flue dust was dumped in uncovered piles. Run‐off from the piles and wind‐driven particles had the opportunity to contaminate nearby industries, residential buildings, and neighborhood soils over a period of many years. Scanning electron microscopy‐energy dispersive x‐ray spectrometry (SEM‐EDS) was used to compare the morphology and chemical composition of fly ash dust from the suspect pile with samples collected from the surrounding buildings and soil. Adhesive samplers were used to collect dust that had accumulated in buildings surrounding the fly ash dump site. Suspect dust particles were analyzed by SEM‐EDS and compared with known dust particles from the fly ash pile. Soil samples were dried, sieved, and the “fines” analyzed by SEM‐EDS for comparison with samples from the fly ash pile. Fly ash particles similar in morphology and chemical composition to the fly ash in the suspect pile were identified in most of the buildings sampled surrounding the fly ash dump site and in all of the soil samples analyzed surrounding the dumpsite. This case study illustrates the usefulness of applying morphology and chemistry information acquired by SEM‐EDS for pollution particle source determination.
Compositional imaging of polymers using a field emission scanning electron microscope with a microchannel plate backscattered electron detector
Authors: Brostin Joel 
Published: June 2010

AbstractThe incorporation of a microchannel plate backscattered electron (BSE) detector into the field emission scanning electron microscope allows compositional imaging of polymers and other organic phases to be performed without chemical modification. Small atomic number differences, such as the presence or lack of oxygen, provide ample contrast when specimens are imaged without coating at accelerating voltages close to EII (Goldstein et al. 1984). Conventional electron stains provide superb contrast for purely hydrocarbon systems that have no intrinsic contrast.
Atomic force microscopy for ultrafiltration membrane imaging
Authors: Centoni S. A. , Vanasupa L. S. , Tong P. S. 
Published: June 2010

AbstractAtomic force microscopy (AFM) can reveal nanometer‐scale structure of samples without the sample preparation techniques that involve dehydration. This is particularly important for hydrophilic organic materials. An asymmetric polysulfone ultrafiltration membrane (molecular weight cutoff rated at 10 kg/mol) was imaged by AFM. Sample mounting methods tried include cyanoacrylate, double‐sided tape, and paraffin. Wax and tape bonding did not lead to usable images. Cyanoacrylate bonding resulted in images that appear to show 2.8° 109 pores/m2 approximately 3 nm in diameter, creating a porosity of 2%. This is consistent with estimates of molecular sizes for 10 kg/mol proteins, but not with the results of other AFM studies of similar membranes. The discrepancies can be explained largely by differences in sample preparation techniques.
World wide web‐controlled scanning electron microscope
Authors: Chand G. , Breton B. C. , Caldwell N. H. M. , Holburn D. M. 
Published: June 2010

AbstractThis paper1 presents a system for remote control of a scanning electron microscope (SEM) over the Internet using the World Wide Web (WWW). The evolution of the SEM to its current incarnation as a PC‐SEM is noted, and the World Wide Web is briefly described. The implementation of the authors' system is detailed in terms of configuration and manner of interaction. The potential commercial applications of the research are described. Related work in microscopy and networking fields is considered. A discussion of the advantages of the described system and expected future directions for research and development concludes the paper.