bluuebunny/crossref_metadata_2025_split huggingface dataset:
A high‐resolution add‐on in‐lens attachment for scanning electron microscopes
Authors: Khursheed A. , Karuppiah N. , Koh S. H. 
Published: June 2010

AbstractA compact add‐on objective lens for the scanning electron microscope (SEM) has been designed and tested. The lens is < 35 mm high and can be fitted on to the specimen stage as an easy‐to‐use attachment. Initial results show that it typically improves the spatial resolution of the SEM by a factor of three. The add‐on unit is based upon a permanent magnet immersion lens design. Apart from the extra attachment to the specimen stage, the SEM with the add‐on lens functions in the normal way. The in‐lens unit can comfortably accommodate specimen heights up to 10 mm. The new add‐on lens unit opens up the possibility of operating existing SEMs in the high‐resolution in‐lens mode. By using a deflector at the top of the add‐on lens unit, it can also operate as a quantitative multichannel voltage contrast spectrometer, capable of recording the energy spectrum of the emitted secondary electrons. Initial experiments confirm that a significant amount of voltage contrast can be obtained.
A comparison of surface roughness of pipes as measured by two profilometers and atomic force microscopy
Authors: Farshad Fred F. , Pesacreta Thomas C. , Garber James D. , Bikki S. R. 
Published: June 2010

AbstractThe objective of this study was to develop a reliable method for the measurement of pipe surface roughness. Roughness of coated pipe was measured with two linear surface profilers, a Dektak3ST® and a Hommel T 1000, and a Dimension 3000® atomic force microscope (AFM). Arithmetic roughness (Ra), root mean square roughness (Rq), and mean peak‐to‐valley height (RZD) were statistically analyzed. Each instrument yielded reliable results, but there were significant differences between the AFM and the other two instruments. The ability of RZD to ignore intermediate height data while focusing on extreme height data made it a useful parameter for detecting differences in height that would be the most likely to affect fluid flow in pipes.
The use of secondary ion mass spectrometry coupled with image analysis to identify and locate chemical elements in soil minerals: The example of phosphorus
Authors: Bertrand Isablle , Grignon Nicole , Hinsinger Philippe , Souche Gérard , Jaillard Benoǐt 
Published: June 2010

AbstractThe mobility andbioavailability of elements in soils and sediments largely depends on their distribution on the diverse inorganic and organic constituents. This work addresses the example of phosphorus (P) associated to goethite and calcite, that is, to the major minerals involved in the retention of P in soils and sediments in calcareous environments. Synthetic goethite (FeOOH) and calcite (CaCO3) were reacted with P prior to being analysed by dynamic secondary ion mass spectrometry (SIMS). Powdery samples were embedded in resin, cut in thin sections, and imaged with a Cameca IMS 4F ion microscope used in scanning mode with a primary ion beam of caesium that produced negatively charged secondary ions (−) (Cameca, Cedex, France). Carbon, O, P, and calcium (Ca) were directly imaged at m/z 12, 16, 31, and 40, respectively, while Fe was imaged via the polyatomic ion FeO− ion at m/z 72. The SIMS data were treated by image analysis procedures. The visual comparison of images and the scatterplot method showed that P strongly interacted with goethite, probably following an adsorption process, and was thus evenly distributed at its surface. Conversely, P was not evenly distributed at the surface of calcite which rather suggests a precipitation process, and the scatterplot method confirmed a poor relationship between P and Ca. For the goethite‐calcite mixture, visual examination suggested that P occurred as clusters which were largely associated with calcite, whereas a statistical analysis of the various images showed that the distribution of P was largely related to that of goethite particles. This work confirms the potential contribution of iron oxides in the retention of P in calcareous environments and shows that coupling image analysis to sensitive analytical techniques such as SIMS is a powerful approach for providing quantitative information on the location of elements at low bulk concentrations.
Experimental data and model simulations of beam spread in the environmental scanning electron microscope
Authors: Wight Scott A. 
Published: June 2010

AbstractThis work describes the comparison of experimental measurements of electron beam spread in the environmental scanning electron microscope with model predictions. Beam spreading is the result of primary electrons being scattered out of the focused beam by interaction with gas molecules in the low‐vacuum specimen chamber. The scattered electrons form a skirt of electrons around the central probe. The intensity of the skirt depends on gas pressure in the chamber, beam‐gas path length, beam energy, and gas composition. A model has been independently developed that, under a given set of conditions, predicts the radial intensity distribution of the scattered electrons. Experimental measurements of the intensity of the beam skirt were made under controlled conditions for comparison with model predictions of beam skirting. The model predicts the trends observed in the experimentally determined scattering intensities; however, there does appear to be a systematic deviation from the experimental measurements.
Single‐image signal‐to‐noise ratio estimation
Authors: Thong J. T. L. , Sim K. S. , Phang J. C. H. 
Published: June 2010

AbstractA method for estimating the signal‐to‐noise ratio from a single image is presented in this paper. The autocorrelation‐based technique requires that image details be correlated over distances of a few pixels, while the noise is assumed to be uncorrelated from pixel to pixel. The latter is shown to be a good approximation in the case of scanning electron microscope (SEM) images provided that the video signal is not band limited. The noise component is derived from the difference between the image autocorrelation at zero offset and an estimate of the corresponding noise‐free autocorrelation. Nonlinear effects introduced by intensity saturation and their implications on the image signal‐to‐noise ratio are also discussed.
Direct wet surface imaging of an anaerobic biofilm by environmental scanning electron microscopy: Application to landfill clay liner barriers
Authors: Darkin M. G. , Gilpin C. , Williams J. B. , Sangha C. M. 
Published: June 2010

AbstractTo contain domestic waste and its associated pollution within a landfill, engineered mineral (clay) barriers are used and are designed to have a permeability of 1×10−9 m/s (Westlake 1995). The rate of permeability of various porous media has shown to be influenced by the clogging of flow paths (media pores) due to biofilm formation (Charckalis and Marshall 1990, Cunningham et al. 1991). The term biofilm is given to describe the colonies of surface adherent microorganisms (Donlan et al. 1994). In this study, permeability experiments were built and modified to act as microcosms to investigate the influence of biofilm formation on the permeability of clay barriers. Traditional scanning electron microscopy methods disrupt or destroy the biofilm and previous anaerobic studies have involved building closed cells (such as miniature continuous culture chambers) that utilise light microscopes (Robin Jones et al. 1997). This paper examines the application of the environmental scanning electron microscope (ESEM) to the direct examination of the clay interface and biofilm formation in situ within the microcosm.
Strategies for optimum use of superposition diffractogram in scanning electron microscopy
Authors: Oho Eisaku , Toyomura Kenji 
Published: June 2010

AbstractCharacteristics of the superposition diffractogram used for precisely estimating scanning electron microscopy (SEM) resolution are investigated. It is shown that the choice of pixel density to satisfy the sampling theorem, the direction of scanning, the choice of image shift direction, the properties of the specimen, the effect of external disturbances such as vibration and stray magnetic fields, and the effect of the window function required in the Fourier transform, are all factors which must be considered in order to make the superposition diffractogram a practical technique. An additional important improvement required to exploit fully the ability of the superposition diffractogram, which potentially is very high, is a special scanning mode which employs a digital scan generator, and digital image processing technology with autocorrelation functions.
Three‐dimensional visualization and physiologic evaluation of bile canaliculi in the rat liver slice by confocal laser scanning microscopy
Authors: Yoneyama Keiichiro 
Published: June 2010

AbstractWe evaluated the morphology and physiologic function of the bile canaliculi (BC) in the rat liver slice (RLS) by confocal laser scanning microscopy (CLSM). Lucifer yellow (LY) dye was injected into the RLS, and the distribution of LY was serially evaluated. After the injection of LY, hepatocytes were initially visualized, followed by visualization of the BC. There was no significant difference in the distribution of LY between zones 1 and 3 in the hepatic lobule. In zone 1, the reticular distribution of the BC was observed, whereas the part of BC was linearly visualized in zone 3 along the course of sinusoids. When changes in the bile canalicular fluorescence (BCF) were serially evaluated, the BCF was decreased to the minimal level (88% of the value obtained immediately after the LY injection) 10 min after the LY injection, and it tended to increase thereafter. The intralobular hepatocyte fluorescence (ILHF) was decreased to 58.9% of the initial value during the first 40 min. However, the ILHF was transiently increased 30 min after the LY injection, suggesting the possibility of reabsorption of LY by hepatocytes. Three‐dimensional (3‐D) reconstruction images of the BC facilitated the evaluation of the stereoscopic structure of BC. Confocal laser scanning microscopy facilitated the evaluation of structures and physiologic function of the BC.
Imaging of specimens at optimized low and very low energies in scanning electron microscopes
Authors: Müllerová Ilona 
Published: June 2010

AbstractThe modern trend towards low electron energies in scanning electron microscopy (SEM), characterised by lowering the acceleration voltages in low‐voltage SEM (LVSEM) or by utilising a retarding‐field optical element in low‐energy SEM (LESEM), makes the energy range where new contrasts appear accessible. This range is further extended by a scanning low‐energy electron microscope (SLEEM) fitted with a cathode lens that achieves nearly constant spatial resolution throughout the energy scale. This enables one to optimise freely the electron beam energy according to the given task. At low energies, there exist classes of image contrast that make particular specimen data visible most effectively or even exclusively within certain energy intervals or at certain energy values. Some contrasts are well understood and can presently be utilised for practical surface examinations, but others have not yet been reliably explained and therefore supplementary experiments are needed.
Reduction of charging effects using vector scanning in the scanning electron microscope
Authors: Thong J. T. L. , Lee K. W. , Wong W. K. 
Published: June 2010

AbstractWe describe a vector scanning system to reduce charging effects during scanning electron microscope (SEM) imaging. The vector scan technique exploits the intrinsic charge decay mechanism of the specimen to improve imaging conditions. We compare SEM images obtained by conventional raster scanning versus vector scanning to demonstrate that vector scanning successfully reduces specimen‐charging artifacts.
Interaction of maize zein with wheat gluten in composite dough and bread as determined by confocal laser scanning microscopy
Authors: Bugusu Betty A. , Hamaker Bruce R. , Rajwa Bartlomiej 
Published: June 2010

AbstractProtein body‐free maize zein, when mixed at 35°C (above its glass transition temperature range), significantly (p < 0.01) improved the rheological and leavening properties of sorghum‐wheat composite flour dough, resulting in improved loaf volume. Confocal laser scanning microscopy was used to observe the structure of zein fibrils and the interaction between zein and gluten proteins in the composite dough and bread systems. Autofluorescence and immunolocalization techniques were used to locate gluten and zein, respectively. Optical sections were collected every 0.4 μm through the samples and digitally processed to produce reconstructed three‐dimensional images. Results showed that zein fibrils form an outer layer that intermittently coats the gluten networks, thereby strengthening them. This type of microstructure is able to withstand the pressure exerted by gas cell expansion during yeast fermentation to increase loaf volume.
Development of preparation methods for and insights obtained from atomic force microscopy of fluid spaces in cortical bone
Authors: Knapp Helmut F. , Stemmer Andreas , Reilly Gwendolen C. , Niederer Peter , Tate Melissa L. Knothe 
Published: June 2010

AbstractSeveral preparation methods were developed to investigate the dimensions and surface structure of fluid spaces within cortical bone, using atomic force microscopy (AFM). Of special interest was the morphology of the lacunocanalicular system, which serves as a conduit between osteocytes encased in bone tissue, the intramedullary cavity, blood vessels running through the bone, and the periosteal surface of bone. Fracture and the removal of either the mineral or the organic component is a method by which each component can be investigated at a very high resolution in situ. Although fractured bone was too rough to image details of the lacunocanalicular system, post‐treatment with ethylene diamine tetraacetic acid (EDTA) or pa‐pain allowed for investigation of the collagen matrix or the mineral crystals of bone, respectively. Cut and polished bone was smooth enough for identifying the lacunae of bone using AFM, but unambiguous differentiation between the canaliculi and cracks in the bone surface was not possible. However, when the lacunocanalicular system was filled with polymethylmethacrylate (PMMA), it was possible to image casts of the lacunocanalicular system by selectively etching away the surrounding bone matrix. Using this method, we identified individual canaliculi and measured their dimensions. Furthermore, by carefully etching away the bone matrix in successive etches, it was shown that the wall structure of the canaliculus is dominated by collagen fibrils. These observations have important implications for fluid flow in bone.
Line profile reconstruction from simultaneously recorded secondary and backscattered electron signals
Authors: Li Xiaoyuan , Uchikawa Yoshiki , Kodama Tetsuji , Mori Yuki 
Published: June 2010

AbstractWe propose a reconstruction method of surface morphology using a combination of secondary and back‐scattered electron signals from the scanning electron microscope (SEM). Compared with multiple‐detector methods, the proposed system requires only conventional secondary and backscattered electron detectors for a line profile reconstruction in one direction. This method is an application of genetic algorithms to the measurement of surface morphology in SEM. We use the chi‐square distribution of the reconstruction error as the objective function within a scheme to minimize the number of vertices in the reconstructed surface profile. (The reconstruction error is the relative difference between the calculated and experimental data.) To evaluate the efficacy of our method, a surface profile is successfully reconstructed from a pair of line scans across the center of a latex particle.
The method for the reconstruction of complex images of specimens using backscattered electrons
Authors: Kaczmarek Danuta , Domaradzki Jaroslaw 
Published: June 2010

AbstractThe backscattered electron signal (BSE) is widely used for investigation of specimen surfaces in a scanning electron microscope (SEM). The development of multiple detector systems for BSE signal detection and the methods of digital processing of these signals have allowed for reconstruction of the third dimension on the basis of the two‐dimensional (2‐D) SEM image. A technique for simultaneous mapping of material composition (COMPO mode) and reconstruction of surface topography (TOPO mode) has also been proposed. This method is based on the measurements of BSE currents sensed by four semiconductor detectors versus the inclination angle of surface. To improve the separation of topographic and material contrasts in SEM, a correction of the TOPO and COMPO modes (resulting from a theoretical description of the system: electron beam, specimen, and detector) was applied. The proposed method can be used for a correct reconstruction of the surface image when the surface slope is <60°. The measuring limit of the slope was closely connected with the detector setup. Next, the digital simulation of the colors was performed (after application of the method of linearization of BSE characteristic versus atomic number). This procedure to increase the SEM resolution for the BSE signal by use of digital image processing allows for a better distinction between the two elements with high atomic numbers.
Energy distribution of electron backscattering from crystals and relation to electron backscattering patterns and electron channeling patterns
Authors: Berger Dirk , Niedrig Heinz 
Published: June 2010

AbstractThis paper reports on the influence of the channeling effect on the energy distribution of electrons backscattered from crystals with different atomic numbers Z. These results can be used for the optimization of the contrast of electron backscattering and electron channeling patterns.Energy and angular resolved electron scattering distributions are obtained using a 4‐axial experimental setup with a moveable high‐resolution spherical spectrometer. Special care is taken to suppress undesired reflections of electrons inside the spectrometer. This experimental setup allows the direct observation of the excitation of different Bloch waves (anomalous absorption and transmission) within the crystal for different electron incidence angles and the observation of angular distributions of elastically scattered electrons. Results are presented for Si and Au monocrystals, showing that the influence of the channeling effect is more distinct for low atomic numbers.
Conditions for imaging emulsions in the environmental scanning electron microscope
Authors: Mathews R. G. , Donald A. M. 
Published: June 2010

AbstractEnvironmental scanning electron microscopy (ESEM) is a technique capable of imaging volatile and/or insulating samples in their natural state, without prior specimen preparation. It is thus a powerful potential tool for the study of the structure and dynamics of emulsions and other complex liquid systems, at a resolution greater than that obtainable by conventional optical microscopy. We present images of a variety of liquid systems containing micronscale and smaller features. The morphology of these systems may be clearly discerned. The contrast observed between the liquid phases was consistent with the model proposed by Stokes et al. (1998). The limits of resolution were determined by sample motion and by beam damage effects; under optimum conditions, resolution of a few tens of nanometers was obtained. This compares favourably with conventional and confocal optical microscopy. In some samples, thin films (solid or liquid) could be observed at the liquid/gas interface. Some of these films were so thin that they did not completely obscure the underlying structure of the bulk sample.
Automatic Integrated Circuit Die Positioning in the Scanning Electron Microscope
Authors: Tan H. W. , Phang J. C. H. , Thong J. T. L. 
Published: June 2010

AbstractIn scanning electron microscope (SEM)‐based integrated circuit (IC) failure analysis, there is often a need for manual location of a prespecified failure site in several ICs. Such a procedure is both tedious and time consuming. This paper presents a new vision‐based die positioning system that can automatically locate a specified failure site without the need for a high‐accuracy specimen stage. Depending on the appearance of the desired failure site, the system applies either image registration or feature tracking to locate the site. Experiments performed on a variety of IC samples show that the system is able to locate the failure site accurately, even in the presence of unfavorable conditions such as IC sample rotation and repetitive IC patterns.
Automated analysis of submicron particles by computer‐controlled scanning electron microscopy
Authors: Poelt P. , Schmied M. , Obernberger I. , Brunner T. , Dahl J. 
Published: June 2010

AbstractAutomated analysis of submicron particles by computer‐controlled scanning electron microscopy is generally possible. The minimum diameter of the detectable particles is dependent on the mean atomic number of the particles and the operating parameters of the scanning microscope. The main limitation with regard to particle size is set by the quality of the particle detection system, which generally is the backscatter electron detector. The accuracy of the results of the x‐ray analyses is very often strongly affected by specimen damage, omnipresent especially for environmental particles even at low electron energies and probe currents. With the exception for light elements, the detection limit is approximately 1 wt%. Device‐related limitations to automated analysis may be specimen drift and an unreliable autofocus function.
Guiding Self‐Assembly with the Tip of an Atomic Force Microscope
Authors: Mesquida Patrick , Stemmer Andreas 
Published: June 2010

AbstractWe report the guided self‐assembly of nanoparticles to geometrically well‐defined charge patterns written on a dielectric surface with the conductive tip of an atomic force microscope (AFM). Charges are deposited in 30‐90‐nm thick fluorocarbon layers by applying voltage pulses to the conductive AFM tip. The samples are being developed by dipping them into an organic suspension of silica nanoparticles. Coulomb forces draw the nanoparticles to the charge patterns. With this simple process, we achieve a resolution of about 800 nm.