bluuebunny/crossref_metadata_2025_split huggingface dataset:
USING ECOLOGICAL AND BIOGEOGRAPHICAL FEATURES TO PRODUCE A TYPOLOGY OF THE PLANT SPECIES USED IN BIOENGINEERING FOR RIVERBANK PROTECTION IN EUROPE
Authors: Evette A. , Balique C. , Lavaine C. , Rey F. , Prunier P. 
Published: August 2011

ABSTRACTRiver managers involved in riverbank protection need plant‐selection guidelines based on the biogeographical and ecological requirements of a wide variety of plant species. In this study, we propose a double typology of the woody plant species used in riverbank protection bioengineering in Europe based on ecological and biogeographical features.The statistical analyses of existing data highlight the important role played by waterlogging tolerance, soil moisture, soil productivity and light exposure in species classification, whereas acidity was less selective. Ninety‐five species were classified in 11 ecological groups according to the six ecological variables. Based on three biogeographical variables (altitude, continentality and geographic distribution), a second classification gave five biogeographical groups clustering species according to their geographic preferences.Independent biogeographical and ecological typologies allow river managers to be consistent with the regional altitudinal and climatic environment and to select species adapted to the local environmental conditions of the riverbank considered. This study is of particular interest because its methodology and results are applicable to slope protection in general as well as to potential changes resulting from climate change. Copyright © 2011 John Wiley & Sons, Ltd.
The use of subgrains as imaged in the SEM from bulk specimens in the study of localized plasticity
Authors: Davidson D. L. 
Published: August 2011

AbstractThe ability to image subgrains in the SEM by channeling contrast affords the opportunity to study localized plasticity and quantify parameters not previously measurable. This paper examines some of the ways in which subgrain information may be used in the study of fatigue and creep phenomena. Fatigue crack tip stress range and the work required to form a fatigue crack may be estimated. An example of the measurement of subgrain misorientation due to creep is also given.
Measurements of electron channeling pattern linewidths in silicon
Authors: Farrow R. C. , Joy D. C. 
Published: August 2011

AbstractUsing a new method for improving the signal‐to‐noise of electron channeling pattern (ECP) contrast, preliminary quantitative measurements of the linewidths of ECP lines in silicon have been performed. The signal‐to‐noise was improved by utilizing a boxcar integrating circuit whose gating logic was referenced to the SEM horizontal scan signal. The measurements were done on the (220) series of reflections from 18 and 25 keV incident electrons by monitoring the specimen current as the SEM was scanning in the line mode. The measured linewidths are consistent with those predicted by the two beam theory of ECP intensity when the affects of the incident beam divergence, α, are accounted for. The appearance of ECP lines from very high order reflections is an indication that the limit of the reciprocal lattice vector, g, of a line that can be resolved in an ECP is limited more by the sample than by α. The finite α appears only to broaden the linewidths of higher order lines. These studies are being pursued to explore the potential of this technique for the study of crystalline perfection.
Scanning electron microscopy of two‐dimensional magnetic stray fields
Authors: Rau E. I. , Spivak G. V. 
Published: August 2011

AbstractMethods used in metrology of two‐dimensional magnetic microfields and based on direct interaction of the electron beam of scanning electron microscope (SEM) with the studied fields are described. An analytical expression for calculating the value of the field is presented. The errors and applicability of the methods have been estimated. The concepts discussed are illustrated by the experimental results of the measurements of some types of statistical and dynamic stray fields.
Methods for quantitative analysis in secondary ion mass spectrometry
Authors: Newbury Dale E. 
Published: August 2011

AbstractMethods for quantitative analysis in secondary ion mass spectrometry must be capable of correcting for strong matrix effects on emitted secondary ion intensities as well as strong instrumental effects on measured secondary ion intensities. Both empirical methods, based on sensitivity factors and working curves, and theoretical models for secondary ion emission, are available. Absolute sensitivity factors are not satisfactory because of the lack of compensation for matrix effects. Working curves are capable of yielding analysis with 5% relative accuracy but offer poor flexibility in dealing with unknowns which differ strongly from the standards. Relative sensitivity factors offer both flexibility in the analysis of unknowns and an error distribution in which 80% of the analyses fall within a factor of 2 of the unknown and 99% within a factor of 5. Numerous physical models for secondary ion emission are available but are generally limited in application due to uncertainties in the required physical data. The local thermal equilibrium (LTE) model is broadly applicable with partial constraint on the composition of the unknown. The LTE error distribution places about 50% of the analyses within a factor of 2 and 80% within a factor of 5. Large errors, exceeding a factor of 10, are observed for heavy elements, possibly due to uncorrected instrument effects.Future development of analytical methods may combine the relative sensitivity factor method (which minimizes the influence of instrument artifacts) with the theoretical description of secondary ion emission (to calculate matrix effects).
Morphological polarity in oral epithelial cells revealed by boric acid partial dissociation
Authors: Newcomb G. M. 
Published: August 2011

AbstractLayers of epithelium were stripped with adhesive tape from the surface of rat palatal mucosa after that tissue had been fixed in OsO4, treated in 0.2 M boric acid and critical point or freeze dried. Cell layers stripped off evenly with very few intracellular fractures. The oral surface of cells in the stratum corneum was characterized by small pits and raised cell boundaries. By contrast the deep aspect of these cells displayed microvilli and linear grooves which exactly matched the pits and raised boundaries on the opposing cell beneath. Partial dissociation with boric acid after OsO4 fixation greatly assists the demonstration of complementary cell surfaces deep in the epithelium.
A method for preparing colored scanning electron micrographs using SE and BSE images
Authors: Tanaka K. 
Published: August 2011

AbstractBiological specimens impregnated with heavy metal are observed in an SEM equipped with a sensitive BSE detector. The SE image and the BSE image are successively recorded under the same conditions. Both pictures are displayed coincidentally on a screen, using two projectors of the same type, but with different color filters. The resulting color picture is photographed with color film. Specific regions of the specimen which were impregnated with heavy metal are clearly demonstrated.
An atmospheric scanning electron microscope (ASEM)
Authors: Danilatos G. D. 
Published: August 2011

AbstractA new detection configuration for the Scanning Electron Microscope (SEM) has been devised, which allows the imaging of the surfaces of a specimen in the open room, i.e., at atmospheric pressure. Such a device gives rise to a new microscope: the Atmospheric Scanning Electron Microscope (ASEM). In this configuration, a backscattered electron detector is placed between the pressure limiting aperture and the electron column. The electron beam passes through the final aperture, reaches the sample in the open room and the backscattered electrons passing through the same final aperture reach the detector. This principle has been tested and the result reported.
A double detector system for BSE and SE imaging
Authors: Autrata R. 
Published: August 2011

AbstractThe double detector system described here is a simple device suitable for any SEM. It permits efficient imaging of specimen surfaces in either the secondary electron (SE) or backscattered electron (BSE) mode. The BSE detector is an annular single‐crystal scintillator made of yttrium aluminium garnet (YAG) and the SE detector has a scintillator of the same material. Both detectors have their own light guides which are connected to a single photomultiplier. The choice of signal is made with a mechanical diaphragm mounted on a flange between the light guide and the photomultiplier. The SE detector may be replaced by a second BSE detector to allow the detection of “low” take‐off angle BSEs to provide information which differs from that given by the annular BSE detector which operates to detect BSEs with a “high” take‐off angle. In this way it is possible to image either material or topographic contrast with high resolution and to take advantage of the choice of detected electrons.
Quantitation of shrinkage during preparation for scanning electron microscopy: Human lung
Authors: Bastacky J. , Hayes T. L. , Gelinas R. P. 
Published: August 2011

AbstractHuman lung tissue is found to shrink considerably with preparation for SEM. Fifty‐one blocks of glutar‐aldehyde‐fixed and inflated lung, approximately 2.5 cm × 2.5 cm × 1 cm, shrank a mean of 19% (± 4.0% SD) linear dimension through post fixation, dehydration and critical point drying. Shrinkage with fixation was not measured. Blocks of lung were observed to shrink equally in length (L) and width (W), L = 19.4% ± 2.7 SD, W = 19.0% ± 4.0 SD. Final shrinkage was the same whether samples were dehydrated in acetone or ethanol, although with acetone more of the shrinkage occurred during the dehydration process and less occurred during critical point drying.
Scanning deep level transient spectroscopy (SDLTS)
Authors: Breitenstein O. , Heydenreich J. 
Published: August 2011

AbstractScanning Deep Level Transient Spectroscopy (SDLTS) is a current SEM technique for the detection of the local distribution of deep level centres in semiconductors. It is based on the application of the widely used Deep Level Transient Spectroscopy (DLTS), which enables capacitance changes (or current changes) to be measured in a space charge structure after an excitation pulse as a function of the temperature. This makes it possible to detect the energy levels and the concentration of electronic states in the band gap. By means of scanning DLTS–i.e. the excitation of the levels by an electron probe–deep level states can be investigated with a spatial resolution of a few microns. Scanning the pulsed electron beam (at a temperature selected according to an interesting energy level) yields an SDLTS image. Based on the general principle of the measurement and on the necessary instrumentation the practice of the SDLTS signal generation analysis is presented and experimental examples are discussed.
Electron optical property of a charged foil, observed with a transmitted electron detector device in an SEM
Authors: Wurster R. 
Published: August 2011

AbstractExperimental evidence is presented for the electron optical behaviour of a charged foil area, using the transmitted electron detection device of the scanning electron microscope JSM 50 A (JEOL). The primary electron beam scanning a thin pioloform foil on the one hand produces a charged foil region which on the other hand acts as an electron lens to the primary and scattered electrons.Scanning electron microscopical investigations of air particulates in the submicron size range can be eased by using a transmitted electron detection device both of the bright and dark field operation mode. The image contrast thus may be improved by orders of magnitude, also allowing on line operation of an image analysis system. Using a special preparation technique, depositing the particles on a thin supporting foil which is also used for LAMMA analysis – Wieser et al. 1980, the x‐ray spectra of single particles provided by an energy dispersive x‐ray spectrometer may be quantitatively interpreted on the basis of the peak‐to‐background method (Statham and Pawley 1978, Small et al. 1979).Figure 1 shows a schematic of the transmission detector device of the JSM 50 A when operated in the dark field mode. Geometrical dimensions and apertures also are given in Fig. 1. The dark field diaphragm (DFD) on the optical axis of the microscope blocks all electrons (primary electrons and scattered electrons) within an angle of about 10−2 rad from contributing to the video signal. As long as magnifications above about 350 × are used the primary electron beam hits the DFD thus yielding a transmission scanning electron micrograph in dark field mode. Below this limit or above the corresponding maximal scanning angle (about 7 × 10−3 rad) of the primary electron beam the rim of the DFD becomes visible in the displayed image as shown in Fig. 2a. At the same magnification Figure 2b shows the sharpened contours of the DFD as obtained by focussing the primary electron beam to the plane of the DFD by lowering the objective lens excitation. By means of the thin bar attached to the DFD (left hand upper corner of Fig. 2b) the DFD may be centered to the optical axis or exchanged to the bright field aperture.Looking to the circular center of Fig. 2a, we recognize the black grid bars and a few black particles whereas the supporting foil looks bright. No video signal can be obtained, because both the grid bars, and to a lesser extent the particles, are not transparent to the primary electrons of 15 keV energy. On the other hand all electrons scattered by the thin foil to an angle of more than 10−2 rad are seen by the scintillator and hence accumulate a measurable video signal: This is also favoured by the large solid angle outside the DFD, which is about 30 times the solid angle of the DFD itself.
A BSE scintillation detector in the (S)TEM
Authors: Autrata R. , Walther P. , Kriz S. , Müller M. 
Published: August 2011

AbstractA single crystal YAG: Ce3+ annular scintillator axially placed in a movable light guide forms the essential part of a new BSE detector. Comparison of properties of this detector with those of a semiconductor detector is made. The bandwidth, signal‐to‐noise ratio, capacitance effects, and relative efficiency are parameters which favour the scintillation detector. Its disadvantage is that it must be equipped with a photomultiplier and a light guide. The position of the scintillator above the specimen permits efficient detection at a large collection angle of BSE. For normal beam incidence, the signal homogeneity from any area of the scintillator ensures that images are obtained without shadow effects due to signal loss in the scintillator or due to detector geometry. The same probe current as for other detection modes can be used. Resolution of details is as high as for an SE image.
Direct observation of fracture in brittle materials in the SEM using a double torsion testing technique
Authors: Tait R. B. , Garrett G. G. 
Published: August 2011

AbstractThis paper describes an in‐situ testing technique for obtaining greater understanding of fracture mechanisms in brittle materials through direct observation of controlled fracture. The technique utilises constant stress intensity double torsion (DT) specimens loaded inside the specimen chamber of a conventional scanning electron microscope. With this method the control of discrete crack advance is extremely good, comparable with the limit of resolution. Evidence of the DT in‐situ method's fine control capability is illustrated by fracture observations in mortar, cement paste and tungsten carbide‐cobalt.
X‐ray image acquisition using an IBM‐PC
Authors: Lewis R. A. , Schick J. A. 
Published: August 2011

AbstractThe present interest among microscopists in digital image acquisition and analysis is surveyed and a trend towards using smaller computers identified. X‐ray images in particular are discussed. A simple arrangement for linking a Scanning Electron Microscope (SEM) based Energy Dispersive Spectroscopy (EDS) unit to an IBM Personal Computer (IBM‐PC) is described in detail. While readily available technical information is omitted, complete circuit diagrams and software flowcharts are given to facilitate reproduction of the system. Annotated listings of the programs used are available from the authors. Examples concerned with topographic effects in x‐ray maps illustrate the use of the system.
A three axis stereocomparator for scanning electron microscopic photogrammetry ‐ RS3
Authors: Howell P. G. T. , Boyde A. , Ross H. F. 
Published: August 2011

AbstractDespite the topographic appearance of the image derived from the scanning electron microscope operated in the secondary electron emission mode it is impossible to make linear measurements from single two dimensional micrographs and relate these accurately to distances in the third dimension.This paper describes a stereometer specifically designed for the examination and measurement of stereopair scanning electron micrographs. The new instrument uses rotary encoders attached to the movement of the photo‐carriage to register the coordinates of image features in both members of a stereoscopic. These raw data are passed to a microcomputer programmed for the reduction and conversion to real three dimensional values according to the geometry of the projection in scanning electron microscope image. This allows large quantities of data to be collated without the errors and tedium involved in manual collection.The need for rapid data acquisition arose during a study on characterisation of resorption of bone by osteoclasts, where the collection and correlation of large quantities of data were required to permit a statistical interpretation to be made.
Elastic peak electron spectroscopy
Authors: Gergely G. 
Published: August 2011

AbstractElastic peak electron spectroscopy (EPES) determines the elastic peak intensity N (Ep) in absolute units (percentage). The experimental curve N (Ep) is affected by the type of electron spectrometer used (CMA, RFA, etc.) and represents the probability Pe (E, Z) of elastic electron reflection detected by the angular window of the spectrometer.Pe (E, Z) = NAσeff (E, Z) Δ is the product of the inelastic mean free path Δ, the density NA of atoms and the effective elastic scattering cross‐section σeff (E, Z). Elementary processes of elastic scattering are treated with a simplified model based on a single scattering process. A more refined analysis will be to use the Monte‐Carlo approach. σeff is given by the differential elastic scattering cross‐section determined by the atomic number Z, the energy Ep, and the input and scattering angles. Results of σeff (E, Z) are presented based on tabulated differential cross‐section data published in the literature. Angular effects are discussed. A number of EPES applications are described for AES, plasmon‐, ionization‐, and low energy loss spectroscopies and SEM. EPES has been successful in the experimental determination of the inelastic mean free path Δ for a number of elements and compounds.
Efficient Detection of Secondary Electrons in Low‐Voltage Scanning Electron Microscopy
Authors: Zach J. , Rose H. 
Published: August 2011

AbstractA new detection method is proposed allowing an efficient extraction of the secondary electrons without affecting the scanning spot of the primary beam. The suggested detector arrangements can be regarded as generalized Wien filters whose electric and magnetic fields do not affect the primary electrons with average beam energy, yet strongly influence the paths of the secondary electrons. The new detectors are especially useful in low‐voltage scanning electron microscopy.
Development of a scanning electron microscope with a two detector system
Authors: Drzazga W. , Grządziel I. , Kubera Cz. , Mokrauz I. , Słowko W. , Szymański H. 
Published: August 2011

AbstractThe authors consider the design feature of a prototype scanning electron microscope which they have constructed. The article serves as basic revision of the function of all the components in an SEM system, as well as illustrating the authors' choice of alternatives. A distinctive aspect of the present instrument is that the idea of incorporating two detector systems for SE was present from the beginning of the planning stages. The applicability of this system is illustrated by compositional (A + B) and topographic (A − B) SE images.
Digital image acquisition in scanning electron microscopy
Authors: Le Floch H. , Franceschi J.‐L. , Gouraud T. , Launay P. 
Published: August 2011

AbstractDigital image acquisition is of great interest in SEM, as can be proven by the number of ways in which images can be improved by processing with this technique (Desai and Reimer 1985, Hawkes 1981).In the case of the system described here, this interest is enlarged by the facility of storage and retrieval of images. In addition, a digital image becomes the only quantitative result when the “MEBIS” (Microscope Electronique à Balayage In Situ)is used as an automatic control tool whithin an industrial production line (Franceschi and Le Floch 1985).This paper describes a system for acquisition, storage and processing of the images given by “MEBIS”, or other SEM if the scanning system includes a remote command. Software for preliminary processing for local representation is presented.The main advantages of this system are its ease of use and its compactness; it is developed around the familiar and low‐cost Apple IIe microcomputer, presented in a portable version including a 5 video screen and a single disk drive in a ruggedized housing.
Rapid determination of the electron‐beam diameter
Authors: Hamerlik R. 
Published: August 2011

AbstractIn the present paper a method for the rapid determination of the electron‐beam diameter is described. The diameter is determined by means of the ratio of minimum and maximum signal in observing strip lines of known width, including the case that the width of strip lines is equal to the gap between them. The applicability of this method of measurement is limited only by the minimal dimensions of the strip lines achieved technologically. It is a suitable method first of all for the measurement of high intensity beams in VLSI circuit testing.
LASEM — a novel combined device for laser modification in SEM
Authors: Wetzig K. , Edelmann J. , Fischer W. , Mueller H. 
Published: August 2011

AbstractAn intense localized heat source inside a microscope could be useful in the improvement of electron microscopic in‐situ investigations. For this reason a JEOL scanning electron microscope was combined with a pulsed Nd‐glass laser which allowed power densities up to about 109 W/cm2 on the specimen under Q‐switch conditions. The mechanical and electrical adaptations necessary for the SEM‐to‐laser coupling, as well as some tests of the method involving the new equipment are discussed in detail in this paper. Various applications to materials are reviewed, including melting processes, thermal cracking and surface hardening of tungsten carbide alloys and other hard materials.
Segregation studies in low‐alloy steels by energy‐dispersive x‐ray spectrometry
Authors: Butler S. A. 
Published: August 2011

AbstractAn automated energy‐dispersive spectrometer/scanning electron microscope (EDS/SEM) system has been applied to the study of segregation in low‐alloy steels in which the base concentrations of the alloying elements are ⩽ 1.5 wt%. The distribution of elements within segregation bands is measured at several hundred points arranged on rectangular grids. By using suitable calibration standards, an accuracy for an individual analysis of about ± 0.05 wt% (one standard deviation) is obtained. By using statistical analysis of whole sets of data, the effects of large relative errors in individual values are minimized, and useful results are obtained even for concentrations much less than 1.0 wt%. It is shown that the maximum‐segregation ratio is unreliable as a measure of the severity of segregation, and is of limited use as an indicator of the likely effects on steel properties.