bluuebunny/crossref_metadata_2025_split huggingface dataset:
A multi-institution longitudinal randomised control trial of speaking up: Implications for theory and practice
Authors: Violato Efrem , Stefura Jennifer , Patey Meredith , Witschen Brian 
Published: October 2024

Background Speaking up is an important yet challenging aspect of health professional communication. To overcome social-cognitive influences and improve speaking up, an intervention based on Kolb’s experiential learning cycle was developed, which integrated Virtual Simulation, curriculum, and practice speaking up. The present study investigated if integrating Virtual Simulation influenced Respiratory Therapy students’ ability to challenge a physician compared to a control condition at multiple time points during training. Methods A multi-institutional longitudinal randomized control trial was conducted. Students from two schools completed a Virtual Simulation or No Virtual Simulation before classroom instruction on speaking up and an in-person simulation requiring speaking up. After three-to-six months and post-clinical placement, students completed a second simulation requiring speaking up. The student’s ability to speak up and use CUS (Concerned, Uncomfortable, Safety Issue) was measured. Results No significant effects for the intervention were observed across time points, p>.05, with a small effect for using CUS, ϕ=.28. During the study, two unexpected findings emerged with theoretical and practical implications. The multi-institutional design created a natural experiment that allowed for the identification of instructor effects on speaking up and Bloom’s Two-Sigma problem. Observations were also made related to perceptual limitations that diminish the ability to speak up. Conclusions Single speaking-up interventions continue to appear to be ineffective. To substantially influence behaviour, consistent mentorship through a “champion” is likely necessary to train for and create a culture of speaking up. Training in situational awareness is also likely needed to counter human perceptual limitations in complex situations.
DETERMINATION OF FERTILITY OF FIRST CALVING COWS UNDER DIFFERENT HOUSING
Authors: Admin O. E. , Admina N. G. 
Published: October 2024

The best fertilization rate of firstborns was established at the farm “Kutuzivka” under free housing, it was 11% times higher than at the farm “Agroprogres”, and 7% higher than the farm “Dekabrystiv”. The influence of the "farm" factor – 1.0% was probable (p < 0.001). In our opinion, the higher percentage of fertile inseminations of firstborns is explained by the use of an automatic system for determining sexual desire at the farm "Kutuzivka".The season of the year was the most influential factor in the fertilization of the first-born cows among the factors of the external environment. The largest number of inseminations of first-borns at farm “Agroprogres” was in the summer (28%), and the lowest in the winter (23%). On the farm of the farm “Dekabrystiv”, a greater number of inseminations were also carried out in the summer (30%) months, and the smallest share of inseminations – in the winter (21%). The nature of this impact is explained not by the state of the environment, but by the housing technology and feeding animals.
During the first insemination after calving, a slightly lower percentage of fertilization of first-borns was observed in all studied farms. During the second insemination, it increased by 4% in the animals of the farm “Agroprogres”, by 7% in the farm “Decembrists”, by 3% in the farm "Kutuzivka". In the subsequent growth of the number of insemination of firstborns in the first two farms did not lead to probable changes in fertility. At the same time, the animals of the the farm "Kutuzivka", starting from the 5th insemination, were fertilized by 11–23% less than from the second insemination. The influence of this factor on the effectiveness of insemination of cows was improbable in the farm “Agroprogres” and amounted to 0.7%, in the farm “Dekabristov” and the farm "Kutuzivka" 0.8%. It was established that in all experimental farms, the number of artificial insemination after the first calving of cows is not the main factor that determines its fertility. The main factor related to the efficiency of insemination is the stage of lactation. Correlation coefficients of the lactation day with the number of artificial insemination in experimental farms ranged from +0.545 to +0.723 and with the daily productivity of first-borns equaled from +0.156 to +0.383. Low fertility in the first 90 days of lactation is primarily due to a high milk dominance, possibly a negative energy balance during this period of lactation.
DEPENDENCE OF MILK PRODUCTIVITY AND SIGNS OF LONGEVITY OF COWS OF THE HOLSTEIN AND UKRAINIAN BLACK-SPOTTED DAIRY BREED ON THE LENGTH OF THE SERVICE PERIOD
Authors: Pavlenko Yu. M. , Kompanets I. O. 
Published: October 2024

Impact research of the duration of service period on the longevity traits of Holstein and Ukrainian Black-and-White dairy cows was conducted in the herd of private enterprise "Burynske" in Sumy district. It has been established that the milk yield of cows for 305 days and full lactation according to the assessment data of the first, third and best lactations and, in general, for the entire life, grew under the condition of increasing the duration of service period to the level of 140 days, regardless of breed. A further increase in the duration of service period for 141 days led to a decline in the above-mentioned traits. The highest lifetime milk yield was obtained from a group of cows with a service period length of 121–140 days, which amounted to 31955 ± 606.7 kg in Holsteins, and 30188 ± 624.4 kg for Ukrainian Black-and-White dairy breed. Against the background of increase in the duration of service period, rising rates of lifetime, productive use and the number of used lactations was observed in cows of experimental breeds. However, the yield per day of life and productive use decreased in groups of Holstein breed with a service period of ˃ 80–161 < days, from 14.6 to 10.3 kg and from 24.7 to 14.6 kg, respectively. In the groups of cows of the Ukrainian Black-and-White dairy breed with the duration of service period ˃ 80–161 < days, corresponding reduction in milk yield per day of life and productive use amounted to 13.1–9.5 and 21.9–13.2 kg. A direct, medium-level, reliable relationship between the service period length and the traits of lifetime, productive use, milk yield and milk fat during life was revealed, which was within the range of r = 0.193–0.311 in Holstein cows and Ukrainian Black-and-White dairy r = 0.145–0.251. An inverse and highly reliable relationship was found between the duration of service period and the milk yield per day of life and productive use in Holstein cows (r = -0.268 and -0.383) and Ukrainian Black-and-White dairy breed (r = -0.255 and -0.325). The strength of influence the duration of service period of cows on their lifespan, productive use and number of used lactations was 22.4–27.5% for Holstein breed, and 21.4–24.3% for Ukrainian Black-and-White dairy breed. Traits of lifetime milk productivity of Holstein cows depended on the duration of service period by 12.2–31.3% and of Ukrainian Black-and-White dairy cows by 13.4–28.9%.
ANALYSIS OF THE DAIRY PRODUCTIVITY OF MARES NOVOOLEKSANDRIVSKA DRAFT BREED TAKING INTO ACCOUNT THE TYPE OF HIGHER NERVOUS ACTIVITY
Authors: Taradayko A. P. , Dzhus P. P. 
Published: October 2024

The results of the analysis of the quantitative indices of milk yield of the mares of the Novo-Alexander weight-carrying breed and the determination of their type of higher nervous activity are given. The research was carried out using the motor-forage technique and monthly control milkings for two adjacent days. On the basis of the obtained data, the highest indicators of breeding in the herd were established in June. Record-breaking mares (Rizba, Fibr-ra) were identified according to the individual level of productivity, whose milk yield was more than 2000 liters per lactation, with an average value of1, 331 liters. Mares with a strong balanced mobile type of higher nervous activity prevailed in number and were characterized by significantly higher milk yield (p ˂ 0.05) compared to mares with a strong balanced inert and strong unbalanced type of higher nervous activity.
ACADEMICIAN V. P. BURKAT (1939–2009) – FOUNDER OF MODERN THEORY AND METHODOLOGY OF BREEDING, ORGANIZER OF RESEARCH WORK IN ANIMAL HUSBANDRY IN UKRAINE (to the 85th anniversary of the birthday)
Authors: Kovtun S. I. , Borodai I. S. , Shcherbak O. V. 
Published: October 2024

The purpose of the article is to reconstruct the major life milestones and creative path of the recognized scientist in the field of animal husbandry, Doctor of Agricultural Sciences, Professor, Academician of UAAS V. P. Burkat. Research methods are general scientific (analysis, synthesis, classification), special historical (problematic-chronological, comparative-historical), biographical and source studies. The contribution of the scientist to the development of theoretical and methodological principles of breeding, selection, and biotechnology of reproduction of farm animals is substantiated. The important role of V. P. Burkat in the organization of domestic research work in animal husbandry, in particular, in the formation of the Institute of Animal Breeding and Genetics named after M.V. Zubets NAAS was proven. The scientific heritage of the scientist is systematized, the priority of his research on the formation of a systematic concept of the breed, linear breeding, development of genetic and biotechnological bases of selection in animal husbandry, the actualization of the problem of conservation and rational use of the farm animals, etc. is substantiated. The contribution of V. P. Burkat to the formation of the modern theory and methodology of breeding in dairy and beef cattle breeding, the breeding of specialized breeds and types of cattle is revealed. It is shown that among his scientist's methodological developments, the most significant is the method of creating the Ukrainian Red-and-White Dairy breed, which is the basis for the development of other specialized domestic breeds of dairy and beef production directions. The program of activities and achievements of established by V.P. Burkat of the scientific school "Breeding and Biotechnology in Animal Husbandry" is summarized. The scholar's scientific search for the popularization and representation of the history of agricultural science in Ukraine is highlighted.
SRAM Single Bit Cell Soft Failure and Nanoprobing Methods
Authors: Song Zhigang , Tenney Michael , Fischer Larry , Albert Dave 
Published: October 2024

Abstract
SRAM is often chosen to be the process qualification vehicle during technology development or yield learning vehicle during product manufacturing, and consequently failure analysis of SRAM is the main feedback for process improvement and yield learning. The most common SRAM failure is single bit cell failure. Although its location can be precisely localized by functional test and the defect causing the failure is within the failing bit cell, its failure analysis becomes more and more challenging in advanced technology nodes. As semiconductor technology continuously scales down, SRAM bit cell size and power supply voltage decrease, resulting in increased transistor strength variation and mismatch. SRAM single bit cell soft failures have become more and more common. For such a failure, its defect is usually subtle or even there is not physical defect at most cases. The soft failure is just due to transistor parameter variation. To evaluate the single bit cell soft failure and identify its root cause, electrical nano-probing is an indispensable measure. In this paper, we will first describe the operation of a 6-Transistor (6-T) SRAM single bit cell and three different types of single bit cell soft failures, then discuss the two electrical nano-probing methods for the SRAM single bit cell soft failure.
Application of Advanced Dynamic Photon Emission Microscopy with Programmable Tester for Functional Failure Analysis of DRAM Devices
Authors: Kwon Hagyeong , Kim Chae Soo , Lee Sunah , Park Jihoon , Son Jihoon , Baek Jeonghoon , Yew Seungchul , Lee Dong In , Lee Byeongheon 
Published: October 2024

Abstract
In DRAM devices, many failures only appeared in a specific operating state on chips during functional tests. Dynamic photon emission microscopy (D-PEM) is a useful technique in failure analysis for emitted photons when the device under test (DUT) is electrically exercised. Therefore, D-PEM analysis combined with specific external triggers in functional test can activate the chip, and thereby expand the range of detectable defects and increase the chances of finding a specific failure mode. In this study, we will discuss various cases of external triggers applied from the tester. This method can be used to detect emission which did not show up in conventional test condition in PEM method for localizing active fails in DRAM. Then, after localizing the site of failure, more detailed physical visualization by Focused Ion Beam (FIB) cross section image, Transmission Electron Microscope (TEM), and Energy Dispersive X-ray microscopy (EDX) revealed main causes of failure. We believe that our method could be a future solution for increasingly difficult and diverse failures modes in the DRAM industry.
Utilizing PFIB for Preparing TEM Lamellae Tailored to High Aspect Ratio 3D NAND Structures
Authors: Chen Yu-Chih , Wu Zhao-Ling , Chiou Bo-Hao , Lin Chun-Hung , Hsu Hsin-Cheng , Yeh Chin-Chih , Lian Nan-Tzu , Yang Ta-Hone , Chen Kuang-Chao 
Published: October 2024

Abstract
The TEM sample preparation by Plasma focused ion beam (PFIB) for a 3D NAND sample with high aspect ratio (HAR) was investigated. Through the PFIB window delayering method, a nearly curtain-free and uniform thickness of TEM lamella could be obtained, addressing the issue of curtaining effectively. Moreover, the pre-treatment step for preparing the chunk of the region of interesting (ROI) out from wafer can be performed by PFIB automated procedures, which could promote the sample preparation efficiency. Through the PFIB window delayering method, TEM analysis of large-area HAR 3D NAND nanostructures becomes achievable.
Narrowing the Launch and Capture Pulses for Detection of Marginal Defects
Authors: Merassi A.A. 
Published: October 2024

Abstract
Customer-reported device failures that cannot be replicated during incoming retests present a significant challenge in semiconductor testing. These discrepancies often arise because customer applications subject devices to more extensive and prolonged stress conditions than standard final testing procedures allow. This paper presents a novel method for detecting subtle marginalities in main logic failures by modifying launch and capture pulses in transition delay patterns. Our approach enhances failure detection capabilities in failure analysis environments, particularly for marginal failures that initially pass automated test equipment (ATE) retesting despite customer-reported issues. We demonstrate the effectiveness of this technique through a case study where we successfully reproduced a customer-observed failure by adjusting the timing parameters. This method bridges the gap between standard test conditions and real-world application environments, enabling more accurate fault detection and validation.
Pluck-and-Probe Method for EBIRCH Isolation of Wordline Defects in 3D Replacement Gate NAND
Authors: Rich Chandler , Harlow Wayne , Muñoz Becky , Sandoval Regino , Crow William , Jensen Erik , Davis J. Temo , Hamid H M Ashfiqul 
Published: October 2024

Abstract
Wordline defects in 3D Replacement Gate NAND (RG NAND) are a major issue holding back part functionality and yield. Shorted wordline locations isolated by EBIRCH enable precise lamella preparation for STEM/TEM, increasing the defect visual rate for physical failure analysis. Due to deprocessing limitations, such as specialized tool requirements, part-specific die preparation knowledge, and the location of the defect in the die, makes preparing samples for successful EBIRCH isolation difficult and time-consuming. A novel sample preparation method for SEM-based nanoprobing has been developed to solve these issues, enabling EBIRCH/EBAC for isolating wordline defect locations with minimal advanced deprocessing and which can be similarly applied to any RG NAND node.
Cross-Sectional Passive Voltage Contrast Technique on FinFET Metal-Gate Breakdown Defect Isolation and Visualization for TEM Analysis
Authors: Ting S.L. , Tan P.K. , Ng P.T. , Chen C.Q. 
Published: October 2024

Abstract
Failure analysis for gate oxide breakdown is increasingly challenging as technology advances to smaller technology nodes. Previously, the cross-sectional passive voltage contrast (XPVC) technique has been successfully utilized in mature technology nodes to isolate gate oxide breakdown locations in complex polysilicon gate structures of planar transistors. However, as semiconductor technology advances, more intricate transistor structures such as FinFET are employed to improve device performance. This paper focuses on the application of the XPVC technique to metal gate structures and examines the challenges associated with its implementation in advanced technology nodes. We demonstrate the applicability of this method in 14nm FinFET devices in simulated gate oxide breakdown experiments showcasing successful sample preparation for subsequent Transmission Electron Microscopy (TEM) analysis.
X-Ray Nanotomography Enabling Submicron Resolution Failure Analysis for Advanced Packaging
Authors: Dreier Till , Nilsson Daniel , Hållstedt Julius , Wittborn Jesper 
Published: October 2024

Abstract
Advanced packaging of electronic components is increasing complexity of single packages containing up to hundreds of individual components in a 3-dimensional arrangement. X-ray nano-tomography enables to resolve these complex structures in 3D with sub-micron resolution for failure analysis. Here we present a study using a cutout from an embedded multi-die interconnect bridge (EMIB) scanned with a custom nano-CT system utilizing a state-of-the-art nano focus X-ray source. For comparison, a scan using a commercial electronics imaging system was performed as well. We demonstrate that micron and sub-micron sized defects can be identified enabling failure analysis on the sub-micron level.
Enhanced TEM Specimen Preparation for STEM-EBIC Analysis Using a Ga FIB system Followed by Post-FIB Ar Ion Beam Milling
Authors: Bonifacio C.S. , Li R. , Ray M.L. , Fischione P.E. , Hubbard William 
Published: October 2024

Abstract
Electrical characterization is a critical step in the failure analysis workflow, a sequence that often ends in high-resolution imaging in the transmission electron microscope (TEM). Scanning TEM electron beam-induced current (STEM EBIC) is a technique that effectively combines these methods by performing electrical characterization at each imaging pixel, with the electron beam acting as a local current source. This work highlights the specimen preparation technique using the Ga FIB system followed by post-FIB Ar ion milling for STEM EBIC analysis. We present STEM EBIC as a technique to evaluate the surface quality of the specimens and to characterize the electronic properties of advanced devices at high resolution. With STEM EBIC, inactive and active finFET structures were clearly distinguished and improvements in sample quality from post-FIB Ar ion milling were evident.
Exploring the Effectiveness of Combining Electron-Beam Probing and Optical Techniques in a 16 nm Technology Device
Authors: Saavedra Antonio , Amini Elham , Jatzkowski Jörg , Kiyan Tuba , Renkes Lars , Boit Christian , Altmann Frank , Brand Sebastian , Seifert Jean-Pierre 
Published: October 2024

Abstract
This work demonstrates the capability of E-beam probing, combined with optical techniques, to effectively monitor the activity of the IC structures and extract the signals from a 16nm technology device through the silicon backside. We conducted optical probing to localize the area of interest on the device, where we aimed the E-beam probing to gather the signal. Once the target was located, a trench down to the STI level was opened on the device. This enables the use of E-beam probing, which has a much higher resolution than the optical methods.
Automating Submicron IR Measurements for Failure Analysis
Authors: Anderson Jay , Lo Michael K.F. , Dillon Eoghan P. , Kansiz Mustafa 
Published: October 2024

Abstract
Fast analysis of small organic contamination at the surface represents a major set of common microelectronics and semiconductor issues. Infrared (IR) microspectroscopy the workhorse for organic contamination is often limited to ~50µm and larger. Many labs move these samples from IR to Raman micro spectroscopy which should achieve higher spatial resolution down to 1µm using high NA objectives but routinely fails to achieve the chemical specificity of these organic contaminants. We will discuss a new IR method that provides organic contamination identification &lt;1µm resolution. We provide this analysis via an automated routine, where optical images including brightfield, cross-polarized or fluorescence images can be used to automatically identify the contamination, provide its approximate shape and size, and identify its X&Y location on the sample, for measurement. The measured spectra is searched to provide a match against stored library spectra to identify the contamination.
Unlocking Insights into 3D Transistor Defects: The Power of Supplementing TEM with Elemental Electron Tomography
Authors: Zhang Yu , Davidson Kevin , Lu Po-Cheng , Baumann Frieder , Mitchell Travis 
Published: October 2024

Abstract
This study investigates the application of 3D electron tomography to enhance transmission electron microscopy (TEM)-based failure analysis of 3D FinFET transistors. Traditional TEM analysis is challenged by projection effects due to the thickness of the sample, complicating accurate defect characterization in miniaturized semiconductor structures. The defects seen by conventional (2D projection) TEM imaging are unclear and difficult to interpret. Leveraging scanning transmission electron microscopy (STEM) and energy dispersive X-ray spectroscopy (EDS) tomography techniques, the study presents detailed examinations of two semiconductor samples exhibiting high leakage currents. Results reveal etched-out epitaxial regions subsequently filled with gate materials, critical for understanding device failure. By digitally reconstructing TEM lamellae in three dimensions, this approach overcomes projection artifacts and precisely localizes defects. The findings underscore the efficacy of 3D electron tomography in semiconductor failure analysis, offering insights crucial for improving device reliability and manufacturing processes in advanced semiconductor technologies.
Short Stories—Isolating Shorts in Circuit Boards
Authors: Fasolino Stephen , Cardle Will , Wheeler Jason 
Published: October 2024

Abstract
The intent of this paper is to present several case studies that highlight different analytical methods used to isolate short circuits within Circuit Card Assemblies (CCAs). When working with CCAs, each investigation may present its own unique challenges that can be solved utilizing a diverse toolset. This toolset does not just include test equipment but rather a catalog of methodologies and processes, which is learned through experience while leveraging how others have approached similar problems.