bluuebunny/crossref_metadata_2025_split huggingface dataset:
Suicide, other externally caused injuries and cardiovascular death following a cancer diagnosis: study protocol for a nationwide population-based study in Japan (J-SUPPORT 1902)
Authors: Harashima Saki , Fujimori Maiko , Akechi Tatsuo , Matsuda Tomohiro , Saika Kumiko , Hasegawa Takaaki , Inoue Keisuke , Yoshiuchi Kazuhiro , Miyashiro Isao , Uchitomi Yosuke , Matsuoka Yutaka J 
Published: July 2019

IntroductionA growing body of literature has demonstrated that cancer patients have a higher risk of suicide and cardiovascular mortality compared with the general population, especially immediately after a cancer diagnosis. Using data from the National Cancer Registry in Japan launched in January 2016, we will conduct the first nationwide population-based study in Japan to compare incidence of death by suicide, other externally caused injuries (ECIs) and cardiovascular disease following a cancer diagnosis with that of the general population in Japan. We will also aim to identify the patient subgroups and time periods associated with particularly high risk.Methods and analysisOur study subjects will consist of cancer cases diagnosed between 1 January 2016 and 31 December 2016 in Japan and they will be observed until 31 December 2018. We will calculate standardised mortality ratios (SMRs) and excess absolute risks (EARs) for suicide, other ECIs and cardiovascular death compared with the general population in Japan, after adjustment for sex, age and prefecture. SMRs and EARs will be calculated separately in relation to a number of factors: sex; age at diagnosis; time since cancer diagnosis; prefecture of residence at diagnosis; primary tumour site; behaviour code of tumour; extension of tumour; whether definitive surgery of the primary site was performed; and presence/absence of multiple primary tumours.Ethics and disseminationThe study protocol was approved by the institutional review board and ethics committee of the National Cancer Center Japan and Nagoya City University Graduate School of Medical Sciences. The findings will be disseminated through peer-reviewed publications and conference presentations.Trial registration numberUMIN000035118; Pre-results.
Study of Y1Ba2Cu3O7−δ+CuO Nanocomposite as a Resistive Current Limiter
Authors: Ushakov A. V. , Karpov I. V. , Demin V. G. , Shaihadinov A. A. , Demchenko A. I. , Bachurina E. P. , Fedorov L. Yu. , Goncharova E. A. 
Published: July 2019

The influence of CuO nanoscale inclusions as the second component of the composites on the transport properties of superconducting polycrystals YBa2Cu3O7 was studied. Samples of YBa2Cu3O[Formula: see text] with different content of CuO nanoparticles were synthesized. The analysis of magnetic properties was carried out within the framework of the extended critical state model. It was found that the addition of 20[Formula: see text]wt.% CuO nanoparticles leads to an increase in the critical current density at [Formula: see text][Formula: see text]K. A further increase to 30[Formula: see text]wt.% reduces the critical current density. The results of the experimental studies of a switching superconducting fault current limiter in AC voltage networks based on high-temperature superconductors (HTSC) of the 2nd generation are given in this work. The testing equipment contains a series-connected HTSC module and a high-speed current switch with a break time of 9[Formula: see text]ms. The high efficiency of the samples made from the YBa2Cu3O[Formula: see text] + CuO nanocomposite material as an active element of a resistive current limiter is shown.
Dynamic Characterization in Advanced Manufacturing
Authors: Snyder Robert L. , Chen Bin-Jiang 
Published: July 2019

Abstract
The coming era of reduced defense funding will dramatically alter the way in which advanced materials develop. In the absence of large funding researchers must concentrate on reducing the time that the R&amp;D of a new materia) consumes. One way in which speed may be achieved is via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&amp;D to manufacturing by avoiding the problems associated with scale-up. Example high-temperature dynamic characterization procedures have been applied to the problem of trying to improve the current carrying capacity of the YBa
2
Cu
3
O
7-8 ceramic superconductor by melt-texturing. These procedures have led to a technique for the preparation of specimens with J
c on the order of 10,000 A/cm2.
Diffraction Space Mapping of Heteroepitaxial Layers
Authors: Halliwell Mary 
Published: July 2019

Abstract
The acceptance angle of the detector of a double axis diffractometer is designed such that all of the diffracted beam is recorded for a rocking curve. When this acceptance angle is reduced, as in the triple axis diffractometer, two dimensional diffraction data can be recorded. In the resulting diffraction space maps each diffraction feature has a shape and a position from which the unit cell dimensions of a heteroepitaxial layer can be derived as well as information about relative tilts, curvature, lattice parameter variations and defect densities. Applications of diffraction space mapping using high and low resolution optics are discussed
Interfaces and Strain in InGaAsP/InP Heterostructures Assessed with Dynamical Simulations of High-Resolution X-ray Diffraction Curves
Authors: Vandenberg J. M. 
Published: July 2019

Abstract
The interfacial structure of a lattice-matched InGaAs/InP/(100)InP superlattice with a long period of ∼630Å has been studied by fully dynamical simulations of high-resolution x-ray diffraction curves. This structure exhibits a very symmetrical x-ray pattern enveloping a large number of closely spaced satellite intensities with pronounced maxima and minima. It appears in the dynamical analysis that the position and shape of these maxima and minima is extremely sensitive to the number N of molecular layers and atomic spacing d of the InGaAs and InP layer and in particular the presence of strained interfacial layers. The structural model of strained inrerfaces was also applied to an epitaxial lattice-matched 700Å InP/400Å InGaAsP/(100)InP heterostructure.
High Resolution X-ray Diffractometry and Topography of Float-Zone GaAs Crystals Grown in Microgravity
Authors: Loxley N. , Moore C. D. , Safa M. , Tanner B. K. , Clark G. F. , Herrmann F. M. , Mueller G. 
Published: July 2019

Abstract
High resolution Bragg-case X-ray double and triple axis diffractometry and Laue-case white beam synchrotron X-ray topography experiments have been performed on undoped [001] oriented float-zone GaAs crystals have been grown under microgravity conditions in space on the D2 mission. Near the seed, excellent anomalous transmission was achieved and a clear cellular structure of dislocations observed. The double and triple axis rocking curves were comparable with those from semi-insulating terrestrial material. Following a heater failure, the molten zone height dropped and reciprocal space maps revealed a long ridge of scatter transverse to the diffraction vector direction. This corresponds to the presence of a distribution of sub-grains containing little internal strain. Continued growth resulted in twin formation.
Reciprocal Space Mapping of Epitaxial Materials Using Position-Sensitive X-ray Detection
Authors: Lee S. R. , Doyle B. L. , Drummond T. J. , Medernach J. W. , Schneider P. 
Published: July 2019

Abstract
Reciprocal space mapping can be efficiently carried out using a position-sensitive x-ray detector (PSD) coupled to a traditional double-axis diffractometer. The PSD offers parallel measurement of the total scattering angle of all diffracted x-rays during a single rocking-curve scan. As a result, a two-dimensional reciprocal space map can be made in a very short time similar to that of a one-dimensional rocking-curve scan. Fast, efficient reciprocal space mapping offers numerous routine advantages to the x-ray diffraction analyst. Some of these advantages arc the explicit differentiation of lattice strain from crystal orientation effects in strain-relaxed heteroepitaxial layers; the nondestructive characterization of the size, shape and orientation of nanocrystalline domains in ordered-alloy epilayers; and the ability to measure the average size and shape of voids in porous epilayers. Here, the PSD-based diffractometer is described, and specific examples clearly illustrating the advantages of complete reciprocal space analysis are presented.
Homogeneous Strain Relaxation and Mosaic Spread in InGaAs/GaAs Heterostructures Using Triple Axis Diffractometry
Authors: Goorsky M. S. , Matney K. M. , Chu G. , Goldman R. S. , Kavanagh K. L. 
Published: July 2019

Abstract
We investigated strain relaxation in (001) InGaAs/GaAs structures using both double and triple axis high resolution x-ray diffraction techniques. We determined diat broadening which is observed in double axis scans stews pnmanly from mosaic spread and not from lattice constant variations in the layer, demonstrating that relaxation is uniform along the growth direction. These observations held for layers with both low and high indium content and extents of relaxation. Triple axis measurements showed that the peak broadening was due exclusively to mosaic spread for the low indium content samples and also confirmed earlier double axis measurements that a crystallographic tilt of the epitaxial layer was attributed to substrate miscut. The ability to distinguish the source of peak broadening and crystallographic tilts makes triple axis diffraction a powerful characterization technique for the study of mismatched epitaxial layers.
Fluorine Implantation and Residual Stresses in Polysilicon Films
Authors: Lowry Lyan , Zschack Paul , De Angelis Robert 
Published: July 2019

Abstract
X-ray diffraction techniques were utilized to study the film stress effects in silicon wafers subjected to several processing conditions. The wafer processing matrix consisted of three thicknesses of polysilicon deposited on (100) silicon with a 25 nm layer of Si02. The polysilicon was doped with phosphorous and arsenic after which the samples were implanted with fluorine at 30 KeV at a dose of 6 × 1015 cm2. A synchrotron radiation source at Brookhaven National Laboratory on beamline X-14 was employed to determine the residual stresses in the polysilicon film by a powder diffraction technique ordinarily used on poly crystal line material X-ray rocking curve experiments were employed to determine the stress in the film from measurements of the curvature of the substrate. These two stress measurements allow the estimation of the stress gradient in the intermediate amorphous oxide layer. Correlations are made between the stress gradients, the fluorine distribution in the wafer and the electrical characteristics of the structures.
Determination of Composition and Phase Depth-Profiles in Multilayer and Gradient Solid Solution Photovoltaic Films Using Grazing Incidence X-ray Diffraction
Authors: Ballard B. L. , Zhu X. , Predecki P. K. , Albin D. , Gabor A. , Turtle J. , Noufi R. 
Published: July 2019

Abstract
A method for using grazing incidence x-ray diffraction (GIXD) for profiling composition changes with depth of photovoltaic quality thin films is presented. The average thickness of the first layer in a multi-layer film of CuIn2Se3.5/CuInSe2/Mo and the variation in solid solution composition of a Cu(In1-xGax)Se2 (CIGS) film with depth are solved using this method. The phase volume fraction and the phase composition profiles are developed from peak intensity and d-spacing measurements respectively at a series of fixed incident angles corresponding to a set of increasing 1/e penetration depths, τ. Inverse Laplace and numerical methods are applied to the τ profiles converting them to true depth profiles. Vegard's law is applied to the d-spacing vs z-profile to obtain x in the formula Cu(In1-xGax)Se2. The results show that an ∼1 μm thick layer of CuIn2Se3.5 is present on the surface of the multi-layer film and that the CIGS film consists of a Ga rich surface layer ∼2000 Å thick followed by a gradual decrease in Ga content with increasing depth. This gradient appears to be desirable for producing photovoltaic quality CIGS films.
Computational (ω, φ) X-ray Diffractometry for Single Crystal Analysis
Authors: Dragoi Danut 
Published: July 2019

Abstract
(ω, φ) X-ray Diffraetometry is a method of XRD based on two independent variables, ω–the rotation of the sample around an axis contained in the plane of the sample and normal to the incident beam, and-the rotation of the sample in its own plane. Each crystallographic plane has an φ peak position, i.e. diffracted intensity is a maximum at a particular ω position for a given φ position. The incident X-ray beam is considered to be parallel, (a divergence of 0.1 degrees or less is accepted), very narrow (the width of the beam is not critical, a width of 0.1 mm or less is accepted), and monochromatic. The position of the detector is not a necessary variable in this system. Its open X-ray sensitive area collects the photons from the diffracting planes at different positions on that sensitive area. Using the method, the diffraction angles 2θ of different crystallographic planes can be determined without the need for knowing the position of the detector, which is a large area detector, free of slits between the sample and the area sensitive to the X-ray photons. Consequently the detector can be placed in a favorable position such as close to the sample.
The method can be applied to any crystal symmetry. If the symmetry of the crystal is known then a theoretical ω(φ) curve can be generated and compared with the experimental data. The difference between these two curves can be easily computed and attributed to the crystallographic lattice distortions of the sample.
Line Profile Analyses of Rhodium Metal Obtained by Decomposition of Rhodium Carbonyl
Authors: Chandra Dhanesh , Mandalia Himanshu , Garner Michael L. , Blakely Mary Kay , Lau K. H. 
Published: July 2019

Abstract
Metal carbonyls are important for chemical vapor deposition (CVD) of metals and alloys and formation of high surface area metallic particles which have potential applications as catalysts. Rhodium carbonyl [Rh6(CO)16] produces high surface area metallic particles whose structure has been reported as monoclinic (I2/a) with lattice dimensions, a=17.00(±0.03)Å, b=9.78(±0.02)Å, c=17.53(±0.03)Å and β=121°45' ± 30' at room temperature. Generally, metal carbonyl crystals dissociate under vacuum as carbonyl gas and decompose to metallic crystals and carbon monoxide at higher temperatures. However, the behavior of rhodium carbonyl crystals is different; they decompose directly to metallic rhodium without the formation of rhodium carbonyl gas in vacuum. Several residual fine grains of rhodium metal are found after the decomposition in vacuum at relatively low temperatures. The metallic samples of rhodium were obtained from vapor pressure experiments using torsion Knudsen-effusion apparatus. X-ray diffraction analyses performed on these grains showed severely broadened Bragg reflections indicative of small particle size and/or lattice microstrain. In this study, a comparison of lattice strains and domain sizes obtained by integral breadth and Fourier methods has been made. In addition a comparison of the lattice strains and domain sizes has been made between the Cauchy, Gaussian, Cauchy-Gaussian and Aqua integral breadth methods.
X-ray Fractography on Fatigue Fractured Surface of Austenitic Stainless Steel
Authors: Yajima Zenjiro , Tokuyama Hideki , Kibayashi Yasuo , Hirose Yukio 
Published: July 2019

X-ray diffraction observation of the material internal structure beneath fracture surfaces provide fracture analysis with useful information to investigate the conditions and mechanisms of fracture. X-ray fractography is a generic name given to this technique.In the present study, X-ray fractography was applied to fatigue fracture surfaces of austenitic stainless steel (AISI 304) which consisted of solution treatment. The fatigue tests were carried out on compact tension (CT) specimens. The plastic strain on the fracture surface was estimated from measuring the line broadening of X-ray diffraction profiles. The line broadening of X-ray diffraction profiles was measured on and beneath fatigue fracture surfaces. The depth of the plastic zone left on fracture surfaces was evaluated from the line broadening. The results are discussed on the basis of fracture mechanics.
Crystallinity and Unit Cell Variations in Linear High-Density Polyethylene
Authors: Schwartz Kenneth B. , Cheng Jinlong , Reddy Vijay N. , Fone Matilda , Fisher Howard P. 
Published: July 2019

Abstract
The degree of crystallinity and unit cell parameters have been determined using WAXS on a number of compression molded high-density polyethylene (HDPE) plaques processed at widely varying conditions of crystallization and annealing times and temperatures. Changes in unit cell parameters with variations in processing conditions can be explained in terms of increases in lamellar thickness of polyethylene crystals with increasing thermal treatments. Concomitant increases in the degree of crystallinity of these samples can also be explained in terms of lamellar thickening and other changes in polyethylene morphology. Crystallinity determinations using XRD data are also compared with values determined by differential scanning calorimetry (DSC) and solid-state 13C nuclear magnetic resonance (NMR). Comparisons of crystallinity values obtained by these three different techniques can reveal details of the morphology of HDPE including the presence of an interfacial zone in addition to the crystalline and amorphous components of the system.
Generation of Crystallographic Packing Candidates with Fixed Helical Symmetry and Axial Advance: Application to Pi-2 Polyimide
Authors: Waller J. M. , Eby R. K. 
Published: July 2019

Abstract
A normal coordinate approach was used to generate ciystallographic packing candidates of a multitorsional polyimide synthesized from 3,3′,4,4′-benzophenonetetracarboxylic acid (BTDA) and 2,2-dimethyl-l,3-(4-aminophenoxy)propane (DMDA) (PI-2). Candidates were obtained under conditions of fixed axial advance of 24.6 Å per monomer, and imposed 2/1 helical or 1/0 transiational symmetry, consistent with the observed WAXD meridional layer line spacing [1]. The ability of comb in atori ally generated torsional states to adopt the desired geometry was examined. Necessary corrections to die conformational parameter equations originally derived by Kusanagi, et al. [2|, have been made. The procedure described allowed crystallographic conformations satisfying explicit geometric and MM3 intramolecular energy criteria to be generated for a linear multitorsional polyimide prior to the application of crystallographic screening or refinement procedures.
Appllied Crystallography in the Scanning Electron Microscope Using a CCD Detector*
Authors: Goehner R.R. , Michael J.R. 
Published: July 2019

Abstract
The development of a new charge coupled device (CCD)-based detector for the scanning electron microscope (SEM) has allowed high quality backscattered electron Kikuchi patterns (BEKP) suitable for crystallographic analysis to be collected. These BEKPs can be used for crystallographic texture, phase and microstress analysis. This CCD detector system, can also be equipped with a special filter for removing backscattered electrons, which allows us to image low intensity, highly divergent x-ray diffraction (Kossel) patterns. The Kossel patterns are utilized for the accurate measurement of d-spacings suitable foe residual stress and lattice parameter measurements.
3-D Graphing of XRF Matrix Correction Equations
Authors: Klimasara Anthony J. 
Published: July 2019

Abstract
The Lachance-Traill, and Lucas-Tooth-Price matrix correction equations/functions for XRF determined concentrations can be graphically interpreted with the help of three dimensional graphics. Statistically derived Lachance-Traill and Lucas-Tooth-Price matrix correction equations can be represented as follows:

1

where:
Ci -elemental concentration of element “i”
Ij -X-Ray intensity representing element “i”
Ai0 -regression intercept for element “i”
Ai -regression coefficient
Zj -correction term defined below

2

Ai0, Aj , and Zi together represent the results of a multi-dimensional contribution.
li, Ci, and Zi can be represented in three dimensional Cartesian space by X, Y and Z. These three variables are connected by a matrix correction equation that can be graphed as the function Y = F(X, Z), which represents a plane in three dimensional space. It can be seen that each chemical element will deliver a different set of coefficients in the equation of a plane that is called here a calibration plane. The commonly known and used two dimensional calibration plot is a “shadow” of the three dimensional real calibration points. These real (not shadow) points reside on a regression calibration plane in this three dimensional space. Lachance-Traill and Lucas-Tooth-Price matrix correction equations introduce the additional dimension(s) to the two dimensional flat image of uncorrected data. Illustrative examples generated by three dimensional graphics will be presented.
Digital Spectrum Processing of the Characteristic K-Lines of the Lanthanides
Authors: Smolniakov V. I. , Koltoun I. A. 
Published: July 2019

Abstract
For the decomposition of complex multiplets, which consist of the fluorescent K-series of the lanthanides in the energy range from 30 keV to 60 keV, the procedure of digital filtering of the spectrum data was elaborated using the libraries of real-shape lines. This elaboration was applied to the software for energy-dispersive x-ray fluorescent spectrometers based on Si(Li) and HP Ge planar detectors.
Taking into account the fact that the real shape of line is changed under different count rate, the procedure of spectrum processing has the following principle peculiarities:

- three levels of library of real-shape lines, i.e. the level of high content of fluorescent elements, middle and low contents;

- the regulation of parameters of digital filters;

- use of the nonlinear least squares technique;

Also the estimation of quality of this investigation is given.
Distortion of the Peak Shape Due to the Discrete Sampling of X-Ray Spectra
Authors: Stoev Krassimir N. , DIouhy Joseph E. 
Published: July 2019

Abstract
Accurate and precise evaluation of the peak parameters of the recorded X-ray spectra requires the use of the correct peak shape. Usually, it is assumed that the shape of the X-ray peaks is a Voigt function, i.e., convolution of a Lorentzian distribution function of the emitted X-ray lines with a Gaussian response of the spectrometer, with additional terms for description of the tailing. This assumption is not exactly correct, because it employs a probability density function for description of a discrete signal, while, actually, the measurable parameter is the probability, i.e., the integral of the probability density function over the channel width. In trie present work, the distortion in the peak shape caused by the discrete sampling of the X-ray spectrum is studied and the significance of the introduced errors is evaluated. An improved fitting procedure for evaluation of the peak parameters is proposed.