bluuebunny/crossref_metadata_2025_split huggingface dataset:
On the X-Ray Diffraction Method of Measurement of Triaxial Stresses with Particular Reference to the Angle 2θo
Authors: Torbaty S. , Sprauel J.M. , Maeder G. , Markho P.H. 
Published: March 2019

AbstractCertain machining processes (e.g. turning, grinding, …) lead to a splitting up and an opening out of the curve of 2θ ϕ ψ = f (sin2ψ). In order to determine the complete stress tensor, it is necessary in this case to use the Dölle-Cohen method but this requires the knowledge of the diffraction angle 2θo for the unstressed material. Such a material, however, is extremely difficult to obtain in practice and the method usually employed uses annealed powder for this measurement. In our study, we show that it is nevertheless possible to determine the angle 2θo on a specimen for which the curve of 2θ ϕ ψ = f (sin2ψ)
does not open out. Applying the Dölle-Cohen method to turning of a medium carbon steel, we have been able to bring to the fore: (i) the presence of an opening out of the curve 2θ ϕ ψ = f (sin2ψ), for measurements made in the direction of lay, which is attributed to a shear stress σ23, and (ii) shear stress σ12 which causes a rotation of the stress distribution diagram σϕ = f(ϕ) in the plane of the specimen.
A Comparison of the XRF11 and EXACT Fundamental Parameters Programs when Using Filtered Direct and Secondary Target Excitation in EDXRF
Authors: Vane Ronald A. 
Published: March 2019

The XRF11 program by John Criss and the EXACT program are two commercially available fundamental parameters programs for energy dispersive x-ray fluorescence spectrometry (EDXRF). These programs are both based on the same underlying equations but use different approaches to the calculations. The EXACT program assumes monochromatic excitation, and the XEF11 program models polychromatic excitation sources. There are also great differences in how the two programs approach the iterations in the calculations and in how the data from standards are used in the two programs for calibration.To produce the monochromatic excitation neeiled by the EXACT program, secondary targets have been the preferred method. But it is also possible to approximate monochromatic excitation by using filtered direct excitation. The purpose of this study is to compare the data obtained from both secondary targets and direct filtered excitation as processed through both XRF11 and EXACT.
A Correction Method for Absorption in the Analysis of Aerosols by EDX Spectrometry
Authors: de Jesus A.S.M. , van der Bank D.J. , Wesolinski E.S. 
Published: March 2019

AbstractLow-energy x-rays can undergo considerable absorption in the sample material when EDX spectrometry is used in multi-element analysis of aerosol-loaded filters. An expression which corrects for the effects of absorption, based on counting aerosol filters and standards on both sides, is derived. The method is experimental verified by using the absorption of the 60 keV gamraa-ray of 241Am in aluminium and also by comparison with PIXE results for environmental filters.
Measurement of Composition and Thickness for Single Layer Coating with Energy Dispersive XRF Analysis
Authors: Shen Robert , Sandborg Alan 
Published: March 2019

Methods for rapid and accurate analysis of coating composition and thickness are of major importance for the semiconductor industry. Typical coating problems are Al, Au or Pt coatings on metal and Cr/Ni alloy or SiO2/P2O5 glass on Si wafers. Due to the nature of the coatings ana tne variety of elements, a software package, COAT95 has been developed to cover the following three possible situations:1. Single element coating for thickness only.2. Compound, elements A and B, coating on substrate element S, for composition and thickness.3. Compound, elements A and S, coating on substrate element S , for composition and thickness.The main goal of the COAT95 software is to have all possible models for the single layer coating problems of the semiconductor industry.
Experimental XRF Calculation Method with Correction for a Polydisperse Material Particle Size
Authors: Zagorodny V. V. , Karmanov V. I. 
Published: March 2019

AbstractA new experimental calculation method for polydisperse (i.e. heterogeneous) multicomponent material analysis has been developed using the dependence of element fluorescence intensity on the particle size and its distribution in the specimen. It is shown that correction of the influence of matrix particle size is possible using this experimental calculation method. For its application, the information on particle size distribution for each of the components is sufficient. Sample preparation includes only the pelleting of specimens under standard conditions. The efficiency of the method proposed is demonstrated by the analysis of the multicomponent mixtures of welding materials.
The Use of Bragg Reflection on Single Crystals for the Production of Polarized Excitation Radiation in the EDXRF
Authors: Beckhoff Burkhard , Kanngießer Birgit , Scheer Jens , Swoboda Walter 
Published: March 2019

AbstractA monochromatic and linear polarized X-ray beam obtained by a Bragg reflection of a characteristic tube line under 90° on single crystals can be used as a EDXRF excitation source in a triaxial beam geometry in order to profit by the polarization effects reducing the scattering background in the fluorescence spectrum, A systematic selection procedure for 55 single crystals suitable for Bragg reflection was established. The selection procedure takes the following conditions and criteria into account. First of all the existence of appropriate lattice planes hkl fulfilling the Bragg reflection condition and having low Miller indices as well as a Bragg angle close to 45° ensures a high degree of polarization. Furthermore the integrated reflectivity Rifor these lattice planes should be as high as possible. For the validity of the formula for Riof an ideal mosaic crystal, the effects of primary and secondary extinction as well as of true absorption have to be considered. The critical limits of these parameters are calculated. The results of this systematic crystal selection procedure for the characteristic Kα lines of Cr, Cu, Mo and Ag tubes are presented.
L X-Ray Line Shape of Copper(II) Compounds and their Covalency
Authors: Kawai Jun , Nakajima Katsumi , Maeda Kuniko , Gohshi Yohichi 
Published: March 2019

AbstractProfile changes of copper Lα (L3-V) and Lβ (L2-V) X-ray fluorescence spectra are interpreted. It is shown that the intensity of the high energy shoulder of the Cu L X-ray spectra has a relation to the intensity of the so-called ‘shake-up’ satellite in 2p X-ray photoelectron spectra; the high energy shoulder of the divalent copper La is weak for covalent compounds and strong for ionic compounds. It is also shown that the Lβ/Lα intensity ratio changes with the change of copper concentration of the analyte as well as the change of chemical state of the analyte.
Comparison of Elemental Sensitivities Induced by Radioisotope and Secondary Target Excitation for Simultaneous Multielement X-Ray Analysis
Authors: LaBrecque J. J. 
Published: March 2019

SummaryThe major advantage of secondary-target X-ray fluorescence analysis is the enchancement of sensitivity and detection limit of an element or small group of elements with similiar atomic numbers by selecting a target material which produces X-rays slightly higher than the absorption edges of the analysis of interest. Secondary target excitation systems are, however, being employed for simultaneous determinations of a large range of elements. Thus, it was decided to compare the application of a simple secondary target X-ray fluorescence system with excitation from a Cd-109 annular radioisotope source.A simple secondary target X-ray fluorescence system was constructed and optimized which operates at less than 800 kilowatts. The “relative” elemental sensitivities of this system. and a radioisotope system with a Cd-109 annular source were compared by the analysis of the 1-2-3-multi-spectral standard from Chemplex which contains 1.23% of 53 elements. The characteristic X-rays were collected with the same Si(Li) detector and analyzed with the same Apple lie microprocessor with a Nucleus ADC/interface card. Finally, the secondary target system described herein with a molybdenum X-ray tube and zirconium or cadmium target produced similiar elemental sensitivities as a Cd-109 annular source of about 7.5 mCi and 5.0 mCi intensity respectively.
Provenance of Kanjera Fossils by X-Ray Fluorescence and Ion Microprobe Analyses
Authors: Kinyua A. M. , Plummer T. , Shimizu N. , Melson W. , Potts R. 
Published: March 2019

AbstractXRF and Ion mfcroprobe analyses of fossils of known and uncertain provenance from the Lower-Middle Pleistocene locality of Kanjera. Kenya, are reported. The goal of this study was to develop a nondestructive technique of provenancixig fossils, which could be applied to the Kanjera sample. The fossils of known provenance were collected in the excavations of the 1987 Smithsonian Expedition. Three fossils of uncertain provenance, two specimens of Theropithecus oswaldi and a hominid fossil, were analyzed as test cases.Both qualitative and quantitative XRF analyses of Kanjera fossils were carried out. In the qualitative analysis, the elemental peak areas from each fossil's XRF spectrum were calculated and normalized to the peak area of the incoherently scattered radiation. Results of the analysis showed that fossils from the Lower-Middle Pleistocene Kanjera Beds, for the most part, had higher levels of yttrium (Y) and zirconium (Zr) than those of the younger Apoko (Ap) Bed. black cotton soil (BCS) and modem bones (MD). The relative concentrations of uranium (U) v strontium (Sri and thorium (Th) were diagnostic of the Kanjera Bed of origin. These findings were confirmed by quantitative XRF and ion microprobe analyses of a subsample of Kanjera fossils. The T. oswaldi and hominid fossils had trace element concentrations suggestive of K2 and BCS provenances, respectively. These findings provide a framework for the qualitative XRF provenancing of other surface collected fossils from the locality.
Two Easily-Overlooked Sources of Error in XRF Intensity Measurements
Authors: DeGroot Peter B. 
Published: March 2019

AbstractFundamental parameters methods of calculating elemental concentrations from x-ray fluorescence (XRF) data put stringent demands on the accuracy of XRF intensity measurement. Two significant but rather unobvious sources of intensity error are inaccurate deadtime correction in energy-dispersive x-ray fluorescence (EDX) systems and errors caused by certain combinations of sample thickness and geometry. A method of evaluating the accuracy of an EDX system's deadtime compensation is given. In our system, a nearly constant error was found over a wide range of average x-ray photon energy. Accurate deadtime correction was obtained by adding a mathematical correction to the partial compensation by the built-in system electronics. Problems related to sample thickness and geometry can result when the effective x-ray path length is longer than the geometrically possible path length (high energy analyte radiation and light element matrix). In such samples, a known sample thickness less than the geometry-limited thickness must be used for accurate intensities. A method for determining when this is necessary has been devised. A useful empirical correction for absorption by Mylar windows is also given.
Trace Analytical Capabilities of Total-Reflection X-ray Fluorescence Analysis
Authors: Michaelis W. , Knoth J. , Prange A. , Schwenke H. 
Published: March 2019

AbstractThe principle to utilize total reflection of the primary X-rays in fluorescence analysis is known since a lot of years. Nevertheless, analytical chemistry did not profit from the inherent advantages of the method for a long time. The main reason for this failure was the lack of instruments which were easy to use in practice. A few years ago, however, the development of a proper mechanical design and of adapted sample preparation techniques led to commercially available spectrometers which throughout fulfill the demands for routine applications. Since then the utilization of Total-Reflection X-Ray Fluorescence Analysis (TXRF) has increased rapidly. The scope of work is meanwhile widespread over environmental research and monitoring, mineralogy, mineral exploration, oceanography, biology, medicine and biochemistry. Accordingly, numerous matrices have been handled.
Excitation and Detection of High Energy Characteristic X-rays (20-90 KeV) Using a Novel Radiometric Technique*
Authors: LaBrecque J. J. , Rosales P. A. 
Published: March 2019

Recently, we have developed a new radioisotope excited technique for x-ray fluorescence which employs “direct” beta particle excitation to produce characteristic x-rays for elemental analysis. We have also studied this technique with various other isotopes with different decay modes. But in all these previous works, we have only studied the x-ray energy region below the Bak lines (≤ 35 KeV), because of the poor efficiency of the Si(Li) semiconductor at higher energies.In this work we have employed a planar Ge detector, which has about a 100% efficiency in the range of about 20 to 100 KeV. We have also compared this detector with a HgI2 detector, even though its resolution and efficiency is far less than the planar Ge detector.
Reflection Intensity Dependence on Surface and Wavelength from LiF and EDDT Analyzer Crystals
Authors: Toh K. , Ui T. , Asada E. 
Published: March 2019

It has been recognized that more nearly perfect crystal surfaces have a low intensity of X-ray reflection as a result of extinction effects. Therefore, it has been common practice to abrade analyzer crystals used in X-ray fluorescence analysis so that they approximate so-called mosaic crystals.While investigating the intensity of reflection from various ADP crystals about 10 years ago, one of the authors (A) and his colleague discovered that wavelength dependence of the intensity of reflection widely varied among crystals. in other words, crystals that had a high reflection intensity for short wavelengths displayed a low reflection intensity for long wavelengths, and crystals effective for long wavelengths were not effective for short wavelengths. Also, they discovered that this phenomenon was related to the perfect quality of the crystal surfaces. As-grown crystals were more effective for longer wavelengths than commercially available crystals into which a certain amount of imperfection presumably had been introduced.
A Fast, Versatile X-ray Fluorescence Method for Measuring Tin in Impregnated Wood
Authors: Drabæk Iver , Christensen Leif Højslet 
Published: March 2019

AbstractThe present paper describes an energy-dispersive x-ray fluorescence method for measuring tin in bis(tri-n-butyl)tin-oxide impregnated wood. The proposed method is of the backscatter/fundamental parameter type. Its versatility, precision, and accuracy is demonstrated by analyses of eleven samples of sapwood of Baltic Redwood. The results obtained are compared with those from neutron activation analysis.
Grazing Incidence X-ray Fluorescence Analysis with Monochromatic Radiation
Authors: Schuster Manfred 
Published: March 2019

AbstractX-ray fluorescence excited by a monochromatic collimated Mo-Kα beam at grazing incidence is measured as a function of the angle of incidence. Monochromatic excitation guarantees a well-defined penetration depth and enables a simple analytical description of the fluorescence intensity. This method is applied to a system of thin Cu and Ti metallization layers on a Si wafer and to As dopant concentration profiles in Si wafers.Thereby, the effect of annealing can be analyzed non-destructively.
Impurity Analysis on Si Wafer Using Monochro-Trex
Authors: Nishihagi Kazuo , Yamashita Noboru , Fujino Kobukatsu , Taniguchi Kazuo , Ikeda Shigero 
Published: March 2019

Recently, semiconductors have been integrated and densified to much higher levels. Under this circumstance, control of surface impurity on the Si substrate has become more important. We have attempted to increase analytical sensitivity of the transition metals, which have the greatest influence on productivity.For the last few years, x-ray fluorescence analysis, using total reflection as a non-destructive and speedy method, has been applied for surface impurity analysis of Si wafers. However, this method is insufficiently sensitive (to the level required for surface impurity analysis) and the lower detection limit is still 1011 to 1012 atoms/cm2 order because the continuous x-ray excitation causes lots of scattering which makes the background higher.
Advances in Boron Measurement with Wavelength Dispersive XRF
Authors: Adamson B. W. , Juchli K. , Matula G. 
Published: March 2019

Over recent years, the availability of man made “crystals“ (Layered Synthetic Microstructures or Multilayers) has led to a significant extension of the capabilities of WD XRF for the lighter elements. In particular, the elements from Atomic Number 5 (Boron) to Atomic Number 12 (Magnesium) have benefitted.This paper will cover the lower end of this range and show how selection of multilayers is made. It will then consider the optimization of collimation to suit The performance characteristics of the multilayer device. One of many new applications opened up by these advances will be covered in detail (analysis of Boron in BPSG coatings on Silicon Wafers). Finally, a word of warning will be issued to those seeking to apply this newfound performance in routine XRF environments.
Requirement Analysis and Preliminary Design for Energy Dispersive X-ray Fluorescence Analysis Software
Authors: Liu Zhaogui 
Published: March 2019

AbstractThe rapid progress of x-ray fluorescence analysis spectrometers has been closely associated with advances in computers. Due to the power of computers, it is possible to acquire the data automatically and interpret complex information accurately and quickly, so as to provide both qualitative and quantitative analyses. It is now about thirty years that computers have been applied to X-Ray Fluorescence Analysis (XRFA). Few workers have discussed the style of the various approaches, although many different software packages have been used for XRFA. Requirement analysis has been performed for Energy Dispersive (ED) XRFA, and preliminary designs are given for three types of structures: i. Sequence structure, ii. Tree structure, and iii. Net structure.
X-ray Fluorescence and Fire-Assay Collection: Useful Partners in the Determination of the Platinum-Group Elements
Authors: Eddy Basil T , Stuckenberg Belinda L , Pansi Gemot 
Published: March 2019

AbstractThis paper describes the determination of the individual platinum-group elements by X-ray fluorescence after nickel-sulphide fire-assay collection. The platinum-group sulphide residue obtained after the dissolution of the nickel is dissolved in acid, and reduced to the metal by use of sodium borohydride. The finely divided metals are then filtered onto a millipore filter, and measured by X-ray fluorescence spectroscopy. The procedure makes use of gold as an internal standard. Factors affecting the accuracy and precision are investigated.
The Substructure of Austenite and Martensite Through a Carburized Surface
Authors: Makinaon J. D. , Weins W. N. , De Angelis R. J. 
Published: March 2019

AbstractThe complex relationships among composition, roartensite start and finish temperatures, morphology of the martensite, residual stress distribution, and quenching conditions produce significant microstructural changes through a carburized case. Variations in the amount of retained austenite, the diffracting-particle size, and hardness were measured every 50μm in depth through a one percent carbon case on AISI-SAE 4320 steel. Measurement were made to a total depth of 2 mm. The percent retained austenite decreases from a maximum of 26% near the surface to a few percent in the bulk. It is shown that the x-ray diffracting-particle size of the martenaite phase is a structure parameter that changes when the martensite morphology goes from plate to lath type. The austenite phase diffracting-particle size is controlled hy the deformatioxis induced by the martensite formation.
X-ray Characterization of Thin Diamond Films Deposited by Hot-Filament Chemical Vapor Deposition
Authors: Hamilton Richard F. , Garg Diwakar , Wood Keith A. , Hoover David S. 
Published: March 2019

AbstractSynthesizing thin diamond films by chemical vapor deposition (CVD) is the most recent and technologically important development in the thin-film field. Thin diamond films are useful in many applications because of their unique physical, chemical, optical, and electronic properties.To assess thin diamond films’ suitability for support membranes in X-ray lithography, X-ray diffraction was used to characterize the crystal structure and orientation of these films deposited on silicon wafers by hot-filament assisted CVD. X-ray transmission properties of free-standing thin diamond films prepared by selectively etching silicon substrates were characterized by X-ray fluorescence in short and long wavelength regions.This paper discusses conventional and grazing incidence diffraction techniques used to study the crystal structure of thin diamond films and compares the results with film morphology. It also describes X-ray transmission properties of these films in terms of Beer's Law, the mass absorption coefficient, and the wavelength of attenuated radiation. Finally, it reveals the long wavelength regions for optimum X-ray lithography operations using polycrystalline diamond (PCD) film.
Diffrac-at Search: Search/Match Using Full Traces as Input
Authors: Nusinovici Julian , Winter Marcus J. 
Published: March 2019

AbstractThe advantages of using the full trace as input for search/match rather than the traditional list of d/I values are emphasized. These advantages stem from the availability and the logical employment of the whole information of the diffractogram.The two key features which enable successful identification of minor phases are discussed: (1) the reliable discrimination between background and weak lines and (2) by regarding the actual full widths of major lines as regions where weak lines can, potentially, he obscured.The user friendliness of the. package will be presented: the graphical user interface, the high level of interactivity, and the speed of the search/match - now less than 8 seconds for searching the current whole ICDD database of 61,993 reference patterns when using an i486/66-based PC.