bluuebunny/crossref_metadata_2025_split huggingface dataset:
A Study of Plastic Flow and Residual Steress Distribution Caused by Rolling Contact
Authors: Nagashima Shin-ichi , Tanaka Niritaka , Ohtsubo Toshinori 
Published: March 2019

It is well knovm that a characteristic plastic flow occurs when two discs are rolled together at loads exceeding the yield point; even in the case of rolling contact without slip, a deformed layer shows marked plastic flow with respect to the direction opposite to the rolling direction. This phenomenon was first found by Crook and Welch. Later, Johnson and his co-workers explained why the forward flow occurs under pure normal stresses.The aim of the present study is to reproduce the various types of plastic flow under different testing conditions of rolling contact, such as nearly pure rolling contact, rolling contact by friction drive, and rolling-sliding contact. After a test of repeated rolling contact, the mode of plastic flow and the residual stress distribution at the surface of the specimen were observed. Further, the experimental data were compared with the result of analytical calculation by the method of Merwin and Johnson.
A New in Situ, Automatic, Strain-Measuring X-Ray Diffraction Apparatus with PSD
Authors: Castex Louis , Sprauel Jean-Michel , Barral Marc 
Published: March 2019

In order to increase the versatility of in-situ X-ray equipment for stress measurements, we decided to design and construct our own easily transportable apparatus. Similar equipments are already commercialized: (i) in Japan (RIGAKU STRAINFLEX, SHIMADZU); (ii) in West Germany (SIEMENS); (iii) in the USA (TEC). After the commercialization of PSD or PSSC, several prototypes were developed among which, the apparatus of Ruud, James, CETIM… Our own apparatus has been developed for two main reasons:
(i)For 1971, we have been working to ameliorate our own equipments effectively and frequently used for in situ measurements.(ii)We need a very precise and rapid apparatus amainable for the greatest number possible of applications.
Application of a Polarized X-Ray Spectrometer for Analysis of Ash from a Refuse-Fired Steam Generating Facility
Authors: Maddox William E. 
Published: March 2019

AbstractThe Refuse-Fired Steam Generating Facility (RFSGF) funded jointly by NASA, the U.S. Air Force, and the City of Hampton is presently in operation at the NASA/Langley Research Center in Hampton, Virginia. The facility b u m s approximately 200 tons/day of refuse and supplies approximately 170x103 tons/year of steam at 350 psig to the Langley Center. Concentrations of trace elements in the bottom ash and in the ash from the electrostatic precipitators were determined using the Murray State Polarized X-Ray Fluorescence Spectrometer (PXFS), The PXFS uses x-rays from a Phillips PW1140/96 x-ray generator in a double scattering process to make quantitative measurements on elements in pressed briquette samples. The double scattering process is used to produce polarized x-rays for excitation of the samples, Minimum detectable limits (MDL) of 1-3 ppm are achieved for elements with Z = 26 to 42. Lower Z elements have significantly higher MDL's; the lowest Z element detected, sulfur, has an MDL of 100 ppm. Elements with Z's higher than 42 have MDL's in the range of 4-10 ppm. Elements detected in the RFSGF ash were S, Cl, K, Ca, Ti, V, Mn, Fe, Cu, Zn, Br, Rb, Sr, Zr, Sn, Sb, and Pb. The concentrations ranged from a few ppm to several mg/g.
Spectra of X-Ray Tubes with Transmission Anodes for Fundamental Parameter Analysis
Authors: Ebel Horst , Ebel Maria F. , Pöhn Christian , Schoßmann Bernd 
Published: March 2019

AbstractThe approach for the description of the emission of white and characteristic x-rays from standard x-ray tubes is modified for an application to transmission anodes. This modification is based on the assumption of a negligible penetration depth of the electrons in comparison to the thickness of the anode. The results of our considerations are presented for Cu, Mo and W anodes with two different thicknesses. For comparison, the spectra of standard anodes which have been operated with identically high voltages and anode currents are given. A typical feature of transmission anodes is their spectral hardening of the energy distribution of emitted photons. A further interesting detail is the development of narrow band excitation anodes as can be seen from the results for Mo. With anode thicknesses of approximately 200 μm and a high voltage of 30 kv the spectral distribution is restricted to an energy ranging from 15 to 20 keV.
Angle Dependent XRF for the Analysis of Thin Al(x)Ga(1-x)As Layers on GaAs and Thin Zn Layers on Steel
Authors: Ebel Horst , Ebel Maria F. , Svagera Robert , Heller Martin , Kaitna Roland 
Published: March 2019

AbstractDepth profiling is performed by monochromatic primary excitation using variable incidence and take-off angles, A proper choice of the photon energy and the angular range of incident radiation allows depth profiling of layered structures without comparison to reference samples. The method has been verified for two different systems. Thin Al(x)Ga(1-x)As-layers on GaAs substrates are characterized by thickness D and atomic ratio x. For an excitation of AlKα-radiation by SiKα-radiation from a secondary target, the lower limit of measurement is layer thicknesses of 40 to 80 nm at x=0.6 to 0.4. Zn-coatings on steel have been investigated with CuKα radiation for selective excitation of FeKα-radiation from the substrate and with GeKα radiation for the excitation of ZnKα radiation from the layer. The scatter of the results required a measurement of the lateral homogeneity of the coating thickness. These experiments have been performed by step scanning in steps of 1 mm under fixed incidence and take-off geometry over an area of 30mm*30mm and excitation with unfiltered radiation from a Cu target diffraction tube with a beam cross section of less than 1 mm2. The obtained thickness distribution of ±20% has been confirmed by electron micrographs.
Combined Small-Angle Neutron and X-Ray Scattering Studies of Polymers
Authors: Wignall George D. 
Published: March 2019

Scattering technigues have been employed since the beginnings of polymer science to provide information on the spatial arrangements of macromolecules. The first measurements were made in the 1920s and were concerned primarily with the determination of crystal structures via the Bragg lawnλ = 2dsinθ.
X-Ray Examination of Type 310S Stainless Steel during its Oxidation in Air at 900°C*
Authors: Cavin O. Burl , Wolf J. S. 
Published: March 2019

AbstractType 310S stainless steel was exposed in air at 900°C and simultaneously examined periodically by X-ray diffraction in an attempt to determine the structural evolution of the compounds formed on its surface. The adherent oxide product was found to be a two-layered scale composed of an inner sesquioxide and an outer spinel layer. Both of these compounds exhibited systematic changes in their unit cell sizes as a function of increasing exposure time at constant temperature. The spinel showed an increase in its lattice parameter while the sesquioxide and stainless steel substrate both had decreases in their parameters proportional to the square root of exposure time. In each of the three phases, the rate of change was constant up to approximately four hours after which the parameters approached a limiting value. Evidence also exists for the presence of at least localized stresses in the scales.
PC-Based Management and Analysis of X-Ray Residual Stress Data
Authors: Courtney S. B. , Tricard M. J. , Hendricks R. W. 
Published: March 2019

AbstractThe authors have developed two independent software packages that store x-ray peak locations, integrated intensities and full-width half-maximum intensity data as a function of diffractometer tilt and orientation angle; this information is used to compute residual stress tensor values. Each program retrieves the fitted x-ray peak locations from a dBASE-compatible data set that is independent of both x-ray diffractometer and acquisition software. Machine-specific routines have been coded to transfer peak data and general diffraction setup information from several different x-ray acquisition platforms into this common format. The two database management programs provide stand-alone storage, retrieval, analysis and graphic output of data, and thus have become practical laboratory vehicles toward establishing a standard database format for storing x-ray strain measurements and the residual stress values calculated therefrom.
High Resolution Measurement of Surface Misorientation in Single Crystal Wafers
Authors: Fatemi M. 
Published: March 2019

AbstractA simple method for high-resolution measurement of surface misorientation in electronic materials is introduced. The technique combines laser optical alignment with double-crystal x-ray diffraction to yield a typical sensitivity of better than 1-2 arc sec. The technique can also be used to make corrections in spectrometric measurements in which commonly ignored rocking - curve errors may be significant.
Non-Destructive Chemical-State Analysis of Thin Films and Surface Layers (1-1000 nm) by Low-Energy Electron-Induced X-ray Spectroscopy (LEEIXS)
Authors: Gyani Angeli K. , McClusky Phillip , Urch David S. , Charbonnicr M. , Gaillard F. , Romand M. 
Published: March 2019

AbstractThe penetration depth of 1-12 keV electrons in most materials is less than one micron and the characteristic soft x-rays that are produced can be used to identify the elements present in the surface. Varying the energy of the incident electron beam enables the depth of analysis to be controlled.Soft x-rays often exhibit large 'chemical effects' (changes in peak profile and peak position) which can he correlated with chemical changes. A study of such effects for each element present in the sample surface, as a function of electron-beam energy, can in some cases, permit changes in the chemical state (valency - coordination number-spin state etc.) to be determined as a function of depth.Such analyses can be carried out either in a conventional x-ray spectrometer in which the x-ray tube has been replaced by a gas-discharge source, or in a spectrometer in which the sample is bombarded with electrons from a normal electron gun. In this paper these techniques are outlined and some applications reviewed:- the analysis of oxide layers on aluminium and steel, the analysis of aluminium-nitride layers produced by MOCVD on gallium arsenide, the analysis of silica fiims (with added boron and phosphorus oxides) on silicon and the analysis of zinc-oxide films on glass.
Strain and Particle Size of Palladium Metal Powders by Time-of-Flight Neutron Diffraction
Authors: Lawson A. C. , Conant J. W. , Talcott C. L. , David M. A. , Vaninetti J. , Goldstone J. A. , Williams A. , Roof R. B. , Von Dreele R. B. , Hitterman R. L. , Richardson J. W. , Faber J. 
Published: March 2019

AbstractWe have determined the strain and particle size for several samples of palladium powder by time-of-flight nrutron powder diffraction on two different diffractometers and by x-ray powder diffraction. The results are compared and found to be in fair agreement. The time-of-flight method gives good enough precision to reveal deficiencies in the simple models used for strain and particle size line broadening.
TXRF Spectrometer for Trace Element Detection
Authors: Hegedüs F. , Winkler P. , Wobrauschek P. , Streli Christina 
Published: March 2019

A method to measure low level iodine concentrations by means of a Total Reflectance X-Ray Spectrometer (TXRF) was presented at the 1986 and 1988 Denver X-Ray Conferences (Ref. 1 and 2.). The optimum set-up of the spectrometer for this purpose was obtained by using a Cu-anode tube. The collimated beam was two times totally reflected: first on the mirror and then on the synsil sample substrate. By these means the undesired high energy bremsstrahlung was almost eliminated. This operational mode is very convenient for iodine measurement by L-lines. The detection limit of iodine was as low as 100 pg.For simultaneous measurement of several elements (I2<Z<83) it was necessary to change the set-up of the spectrometer.
Concepts of Influence Coefficients in XRF Analysis and Calibration
Authors: Rousseau Richard M. 
Published: March 2019

AbstractA new computer program, named CiROU, has been written to determine the chemical composition of homogeneous samples analyzed by X-ray fluorescence spectrometry (XRF). It uses the furdamental algorithm to convert measured intensities into concentrations anc to correct for matrix effects and runs on any IBM-PC/XT/AT, PS/2 or compatible corrputer.The program is very easy to use mainly because it is a step-by-step guide to the routine process of analyzing specimens by XRF and because a user friendly interface makes up a main menu bar containing six major options, which provide several other options inside a pull-down window system.The program is applicable to specimens of any composition with the utmost accuracy that can be obtained from the fundamental-parameters method. It’s unique calibration procedure still adds to the accuracy by eliminating the bias between theory and reality.The program is a complete “off-line” program allowing to perform all the steps of an XRF analysis: calculation of theoretical influence coefficients, calibration, reading of measured intensities, calculation of net intensities and concentrations of unknowns, print-out of analytical reports and data transmission to or from an external computer.
Quantitative Analysis of Arsenic Element in a Trace of Water Using Total Reflection X-ray Fluorescence Spectrometry
Authors: Ninomiya T. , Nomura S. , Taniguchi K. , Ikeda S. 
Published: March 2019

Various kinds of compounds containing arsenic have been used in the world as rat poisons, agricultural chemicals and so on. In the field of semiconductor materials, AsH3 is used as a doping gas on silieon-wafer substrates and GaAs is now also investigated as a wafer substrate instead of Si wafer.As for quantitative analysis of arsenic, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic-emission spectrometry (ICP-AES) have often been used. In these methods, usually, oomplioated pretreatments such as preconcentration and separation have been needed in order to obtain reproducible values for arsenic.
Thickness Measurement of Epitaxical Thin Films by X-ray Diffraction Method
Authors: Chaudhuri J. , Shah S. , Harbison J.P. 
Published: March 2019

AbstractA method was described for determining the thickness of epitaxical thin films common to electronic materials. The equations were developed based on the kinematical theory of X-ray diffraction and effects of both primary and secondary extinctions were considered. As an example of the applications of this method, thickness measurement of AlGaAs thin films on GaAs was demonstrated. These films were grown by molecular beam epitaxy. The integrated reflected intensities from the film and the substrate were obtained by the X-ray double crystal diffractometer. An excellent agreement was obtained between the results from X-ray measurements and RHEED oscillation data.
Standard Deviations in X-Ray Stress and Elastic Constants Due to Counting Statistics
Authors: Kurita Masanori 
Published: March 2019

AbstractX-ray diffraction can be used to nondestructively measure residual stress of polycrystalline materials. In x-ray stress measurement, it is important to determine a stress constant experimentally in order to measure the stress accurately. However, every value measured by x-ray diffraction has statistical errors arising from counting statistics. The equations for calculating the standard deviations of the stress constant and elastic constants measured by x-rays are derived analytically in order to ascertain the reproducibility of the measured values. These standard deviations represent the size of the variability caused by counting statistics, and can be calculated from a single set of measurements by using these equations. These equations can apply Lu any meuhud for x-ray stress ifiesuremenL. The variances of the x-ray stress and elastic constants are expressed in terms of the linear combinations of the variances of the peak position. The confidence limits of these constants of a quenched and tempered steel specimen were determined by the Gaussian curve method. The 95% confidence limits of the stress constant were -314 ± 25 MFa/deg.
Advantages of the Vector Method to Study the Texture of Well Textured Thin Layers
Authors: Vadon Albert , Heizmann Jean-Julien 
Published: March 2019

Depositing a thin layer of noble matter on a less noble material is a standard means of improving the qualities of the material. The characterization of the deposit is essential to understand tile physical phenomena involved and to improve the final product. Two physical parameters of the layer deposited are of great consequence on the behavior of the material as a whole:
-the crystallographic and morphological textures related or not related to those of the substratum-the internal stresses.
Chemical Constraints in Quantitative X-ray Powder Diffraction for Mineral Analysis of the Sand/Silt Fractions of Sedimentary Rocks
Authors: Smith D. K. , Johnson G. G. , Kelton M. J. , Andersen C. A. 
Published: March 2019

AbstractQuantitative X-ray powder diffraction using the complete digitized diffraction pattern has proved to be an effective approach to improving the accuracy of the analysis of complex mineral mixtures, provided representative reference patterns and accurate Reference Intensity Ratio (RIR) factors arc available for each component phase. However, chemical and structural variability of common rock-forming minerals may complicate the pattern fitting approach. A method has been developed which utilizes X-ray fluorescence chemistry of an unknown and realistic compositional ranges for component phases as constraints on the quantitative XRD analysis without significant compromise of the pattern fit. This unique approach no only yields accurate weight fractions, but also provides indications of the specific compositions of each phase present in the mixture.
Use of the Crystal Data File on CD-ROM
Authors: Holomany Mark , Jenkins Ron 
Published: March 2019

AbstractWe have recently described the use of the Compact Disk Read Only Memory disk for the storage of data in the Powder Diffraction File (PDF). This work has now been extended to include the NBS (1987) Crystal Data File (CDF). The CDF contains 115,753 entries of which 59,613 are Inorganic materials and 56,140 organic. The data base can be accessed either by means of bit maps built on chemistry and subfile restrictions, or by means of a Boolean search system allowing combinations of search parameters including: chemistry; space group; cell volume; density and unit cell data.
Mechanically-Induced Phase Transformations in Plutonium Alloys
Authors: Wallace P. L. , Wien W. L. , Goehner R. P. 
Published: March 2019

AbstractIn this article, we show that mechanically-induced phase transformations can be readily achieved in two Pu-alloy systems. We have observed mechanically-induced phase transformations in both Ti-stabilized β-Pu and Ga-stabilized δ-Pu, In both of these alloys, the parent phase has been largely transformed to α-Pu, and the cause of these transformations was mechanical strain introduced by the metallographic sample preparation. For the Ga alloys, x-ray diffraction (XRD) patterns were taken at about 1.5-μm steps down to the undisturbed material in order to develop depth profiles of the surface damage. The total depth of the disturbed material in these alloys is estimated to be about 7.6μm, but this depth was not measured for the Ti alloys. The proportions of α-Pu and δ-Pu in the Ga alloys have been estimated using (a) a new quantitative phase analysis program (SPECQUAN) that uses multiple peaks of each phase in order to minimize the effects of preferred orientation and (b) an older manual technique (i.e., hand calculations). The results from these techniques are compared. SPECQUAN was developed to use the Specplot data file structure directly, thus reducing our data processing. The program is written in Fortran 77 and employs an external intensity ratio quantification procedure to obtain its results. XRD calibration has been done independently by means of accurate density measurements on a reference Ga alloy.
Comparison of Experimental Techniques to Improve Peak to Background Ratios in X-ray Powder Diffractometry
Authors: Istone William K. , Russ John C. , Stewart William D. 
Published: March 2019

AbstractHigh peak to background ratios are especially important in powder diffractometry when attempting to identify minor phases in a sample or improving the limit of detection in quantitative determinations. Instrumental techniques to improve peak to background generally involve the employment of monochromatic or partially monochromatic radiation through the use of filters, crystal monochrometers, or pulse height discriminators.In this study, a digital pulse height discriminator, configured as a card in a personal computer (Apple IIe) with appropriate software, is used in conjunction with a scintillation detector to improve peak to background ratios. The software allows the pulse height distribution to be scanned and the optimum pulse height window to be set for a given set of sample and instrumental conditions. Results obtained by this technique are directly compared with results obtained using a pyrolytic graphite monochrometer and beta filters. Examples cited include qualitative phase identification in both fluorescent and non-fluorescent samples and semi-micro quantitative analysis (determination of airborne silica).
Required Corrections for Analysis of Industrial Samples with Medical CT Scanners
Authors: Engler P. , Hunt P. K. , Armstrong E. E. , Friedman W. D. 
Published: March 2019

As a technique for non-destructive materials analysis, computed tomography (CT) has been especially useful for studying the dependence of the structure of ceramics on manufacturing processes. CT also has been used for characterizing the lithology of reservoir cores while they are still contained in preservation material or a core barrel.The parameter measured by CT is the X-ray attenuation coefficient, which is a function of both material density and material composition.
X-Ray Fluorescence Analysis (XRP) in Europe
Authors: Ebel H. 
Published: March 2019

The European contributions to X-ray fluorescence analysis (XRF) have shown remarkable fluctuations with regard to time and can be divided into three groups, each of them covering about thirty years.At the beginning there was the discovery of X-rays by Röntgen in 1895. He received the first Nobel Prize in physics (1901). Barkla (Nobel Prize in physics 1917) gave a description of the interaction of X–rays with matter–scattering (1904) and polarization (1906), absorption (1909) and fluorescence (1911). In 1912 the crucial experiment of Friedrich, Knipping and von Laue brought the confirmation on the nature of X–rays as part of the spectrum of electromagnetic waves (Nobel Prize in physics 1914).
X-Ray Microfluorescence of Geologic Materials
Authors: Boehme Dale R. 
Published: March 2019

AbstractElemental analyses of geologic materials were obtained using X-ray microfluorescence combined with simultaneous elemental digital mapping. The analytical results corroborate the information obtained by electron and optical microscopy methods. Zoned garnet and ore deposit specimens were analyzed and compared to information obtained from other analytical methods. The penetrating nature of the X-ray beam using this method provides elemental information from beneath the sample surface. The combination of this depth information with the surface information supplied by electron microscopy provides a more complete analysis of the sample than is possible with each technique alone. Minimal or no sample preparation along with the ability to examine materials in air enhances the microfluorescence and digital mapping analysis technique.