bluuebunny/crossref_metadata_2025_split huggingface dataset:
ECONOMIC RELATIONS AND THE SUBJECT OF THE CONSTITUTION
Authors: Власова Мария Алексеевна , Рузанов Илья Владиславович 
Published: October 2021

В статье исследуется проблема конституционного регулирования экономики. Отмечается неуклонное расширение предмета конституционного регулирования в аспекте экономических отношений. Конституция не просто задает общие стандарты регулирования и развития хозяйственной сферы, а воздействует на нормы других отраслей права так, что они приобретают конституционно-правовое содержание и должны истолковываться в свете конституционных ценностей. Это обстоятельство требует корректировки методологии правовой науки и пересмотра модели мышления российских юристов в направлении конституционализации.
The article analyzes the problem of regulating economic relations in constitutions. The expansion of constitutional regulation in the aspect of economic relations is proved. The Constitution does not only set common standards for regulation and development of the economic sphere any more, but affects the other fields of law. Therefore, they acquire constitutional and legal content and should be interpreted in the light of constitutional doctrines and constitutional values. This fact requires an adjustment of the methodology of legal science and a revision of methodology of Russian law in the direction of constitutionalization.
Peningkatan Hasil Belajar IPA melalui Model Pembelajaran Problem Based Learning dengan Media Flash Card
Authors: Ramadha Iis Eka , Zuhaida Anggun 
Published: October 2021

Penelitian ini bertujuan untuk mengetahui peningkatan hasil belajar IPA menggunakan model pembelajaran problem based learning dengan media flash card pada materi zat aditif dan adiktif siswa kelas VIII di SMP IT Assalam Bandungan tahun pelajaran 2020/2021. Jenis penelitian ini adalah Penelitian Tindakan Kelas (PTK) yang digunakan untuk memperbaiki proses pembelajaran di dalam kelas. Langkah-langkah PTK, yaitu sebagai berikut: perencanaan (planning), pelaksanaan (action), pengamatan (observing), dan refleksi (reflection) yang dilakukan dalam dua siklus. Subjek dari penelitian ini yaitu kelas VIII B yang berjumlah 24 siswa perempuan. Teknik pengumpulan data menggunakan tes dan observasi. Data yang terkumpul kemudian dianalisis. Peningkatan hasil belajar ini dapat diketahui melalui hasil evaluasi pembelajaran di akhir proses kegiatan pembelajaran. Pada siklus I diperoleh hasil belajar dengan nilai rata-rata kelas sebesar 67,70 dan ketuntasan klasikal sebesar 58%, 14 siswa dinyatakan tuntas dan 10 siswa dinyatakan tidak tuntas. Sedangkan pada siklus II diperoleh hasil belajar dengan nilai rata-rata kelas sebesar 79,58 dan ketuntasan klasikal sebesar 92%, 22 siswa dinyatakan tuntas dan 2 siswa dinyatakan tidak tuntas. sehingga dapat disimpulkan bahwa penggunaakan model pembelajaran problem based learning dengan media flash card dapat meningkatkan hasil belajar siswa.
DAS DIRETRIZES EDUCACIONAIS À REALIDADE DIDÁTICA: VARIANTES LINGUÍSTICAS NO LIVRO DIDÁTICO
Authors: Lazzaretti Jildonei , Oliveira Beatriz da Silva , Oliveira Rayani Andressa da Cruz , Karim Jocineide Macedo 
Published: October 2021

Este artigo desenvolve uma análise comparativa entre os Parâmetros Curriculares Nacionais de Língua Portuguesa do Ensino Médio e os livros didáticos no que se refere às variantes linguísticas. Apresentamos como resultados da pesquisa análises dos livros didáticos: (1) o livro Língua Portuguesa, linguagem e interação (FARACO, MOURA, MARUXO JR, 2010) e (2) o livro Português Projetos (FARACO e MOURA, 2005). Nas análises procuramos observar os referenciais em relação à adequação ou não dos livros didáticos em relação às orientações dos PCN´S de língua portuguesa.Para citar essa obra: LAZZARETTI, Jildonei, OLIVEIRA, Beatriz da Silva, OLIVEIRA, Rayani Andressa da Cruz, MACEDO-KARIM, Jocineide. Das diretrizes educacionais à realidade didática: variantes linguísticas no livro didático. Revista de Estudos Acadêmicos de Letras, vol. 07 n. 02, p. 109-118, Dezembro de 2014.
Una historia contemporánea de Palestina-Israel, o la necesidad de desmontar mitos aportando soluciones
Authors: Peña Peña Carlos 
Published: October 2021

El artículo destaca la necesidad de hacer llegar a un público no necesariamente especialista, obras como esta que, a pesar de tener un enfoque académico y muy riguroso, están al alcance de cualquier lector interesado en el tema.
Se hace hincapié en algunos aspectos de la obra que resultant destacables por su originalidad o diferencia con respecto a otras obras sobre el tema de Palestina que hay en el mercado literario español.
Subjetividades hidropolíticas y megaminería en Mendoza (Argentina)
Authors: Liceaga Gabriel , Ivars Jorge Daniel , Parise Schneider Nicolás 
Published: October 2021

En diciembre de 2019, en la provincia de Mendoza (Argentina), se modificó la ley provincial N°7722, que regula a la minería metalífera. Pocos días después, tras una notable movilización social y política desatada en toda la provincia, el cuerpo original de aquella ley fue restituido. Partiendo de estos acontecimientos, en este artículo se propone y desarrolla el concepto de “subjetividades hidropolíticas”, como clave capaz de explicar las raíces profundas de aquella movilización en la cultura provincial. En cuanto a la metodología utilizada se recurre no sólo al análisis cualitativo de un importante corpus de información secundaria (artículos de periódicos, posteos en redes sociales, censos, entre otros) sino también a la experiencia de los autores, articulando así una narración (Benjamin, Larrosa).
Retomando algunos elementos de la obra de Félix Guattari -particularmente, el concepto de “agenciamiento colectivo de enunciación”- se analizan algunas de las sensibilidades y deseos involucrados en el conflicto minero en Mendoza. Se argumenta que, al interior de este conflicto opera una cierta subjetividad hidropolítica, que actúa como zona de tránsitos y articulaciones entre fragmentos subjetivos y procesos de singularización. Teniendo en cuenta y desarrollando algunos postulados de la literatura especializada, se postula que el Estado Provincial ha sido clave en la construcción de aquella forma de subjetividad.
A partir del análisis del conflicto minero en la provincia y, particularmente, de la movilización de diciembre, se proponen algunas claves teóricas útiles en el estudio de la conflictividad ambiental contemporánea, y particularmente, de la cuestión minera en la provincia.
Cooperation from Outside: Security Regionalism in Central Asia and Its Limits
Authors: Mayer Sebastian 
Published: October 2021

Abstract
The degree of institutionalized cooperation on security among three or more of the five Central Asian states remains moderate. Currently, regional security is nurtured in part via frameworks provided by external state and nonstate partners. A rational institutionalist perspective has been invoked, suggesting demand for regional security cooperation. This view also insinuates that it would be reasonable for these five states, because of their limited resources, to rely largely on external cooperation partners instead of being self-organized. This article discusses additional causal factors possibly responsible for the low degree of regionalism. Given varying foreign policy preferences and Kazakhstan’s consistent backing of far-reaching security regionalism, the argument that autocracies generally refrain from deep security cooperation cannot be sustained, nor does the sea change in Uzbekistan’s foreign policy in 2016, which could serve to nurture security regionalism in the future, align well with this argument.
Analysis of Time-Resolved Thermal Responses in Lock-In Thermography by Independent Component Analysis (ICA) for a 3D Spatial Separation of Weak Thermal Sources and Defects
Authors: Kögel Michael , Brand Sebastian , Große Christian , Altmann Frank , Jacobs Kristof J. P. , De Wolf Ingrid 
Published: October 2021

Abstract
Lock-In Thermography is an established nondestructive method for analyzing failures in microelectronic devices. In recent years, a major improvement made it possible to acquire time-resolved temperature responses of weak thermal spots, greatly enhancing defect localization in 3D stacked architectures. One limitation, however, is in the method used to determine defect depth, which is based on the numerical estimation of the delay between excitation and thermal response inferred from the value of the lock-in phase. In structures where the region between the origin of the defect and sample surface is partially or fully transparent to infrared signals, interference between radiated and conducted signal components largely falsifies the phase value on which the classical depth estimation relies. In the present study, blind source separation based on independent component analysis was successfully used to separate interfering signal components arising from direct thermal radiation and conduction, resulting in a precise estimation of the defect depth.
Failure Analysis Challenges of Phase Change Memory Test Structures with Two Case Studies
Authors: Demarest J. , Arnold N. , Brew K. , Chan V. , Cote A. , Gordon T. , Iwatake M. , Lian G. , Li J. , OK I. , McDermott S. , Saraf I. , Saulnier N. , Tierney L. , Varghese A. 
Published: October 2021

Abstract
There are several variants of artificial intelligence (AI) hardware structures that are under study by the semiconductor industry for potential use in complementary metal–oxide–semiconductor (CMOS) designs. This paper discusses some of the failure analysis challenges that have appeared in discrete test structures and test arrays developed as part of an exploratory phase-change memory (PCM) program at IBM's Albany AI Hardware Research Center.
SRAM Bitcell Defect Identification Methodology Using Electrical Failure Analysis Data
Authors: Kim Hyungtae , Kim Geonho , Li Yunrong , Jeong Jinyong , Kim Youngdae 
Published: October 2021

Abstract
Static random access memory (SRAM) can occupy up to 90% of the die surface in a microprocessor and is often laid out with even more aggressive design rules than logic circuitry, which makes it more prone to manufacturing defects and more sensitive to process variations. As a result, SRAM is often chosen to be the process qualification vehicle during technology development and the yield learning vehicle during product manufacturing. Consequently, fast and accurate analysis of SRAM failure is critical to success on many levels. In this paper, we present a defect identification method that combines design for test (DFT) features, direct bitcell access (DBA), and nondestructive fault isolation techniques. With examples and case studies, it is shown how the approach makes use of electrical failure analysis data to greatly reduce the cycle time of root cause identification in the early stages of new technology development.
Vector Magnetic Current Imaging of an 8 nm Process Node Chip and 3D Current Distributions Using the Quantum Diamond Microscope
Authors: Oliver Sean M. , Martynowych Dmitro J. , Turner Matthew J. , Hopper David A. , Walsworth Ronald L. , Levine Edlyn V. 
Published: October 2021

Abstract
The adoption of 3D packaging technology necessitates the development of new approaches to failure electronic device analysis. To that end, our team is developing a tool called the quantum diamond microscope (QDM) that leverages an ensemble of nitrogen vacancy (NV) centers in diamond, achieving vector magnetic imaging with a wide field-of-view and high spatial resolution under ambient conditions. Here, we present the QDM measurement of 2D current distributions in an 8-nm flip chip IC and 3D current distributions in a multi-layer PCB. Magnetic field emanations from the C4 bumps in the flip chip dominate the QDM measurements, but these prove to be useful for image registration and can be subtracted to resolve adjacent current traces in the die at the micron scale. Vias in 3D ICs display only Bx and By magnetic fields due to their vertical orientation and are difficult to detect with magnetometers that only measure the Bz component (orthogonal to the IC surface). Using the multi-layer PCB, we show that the QDM’s ability to simultaneously measure Bx, By, and Bz is advantageous for resolving magnetic fields from vias as current passes between layers. We also show how spacing between conducting layers is determined by magnetic field images and how it agrees with the design specifications of the PCB. In our initial efforts to provide further z-depth information for current sources in complex 3D circuits, we show how magnetic field images of individual layers can be subtracted from the magnetic field image of the total structure. This allows for isolation of signal layers and can be used to map embedded current paths via solution of the 2D magnetic inverse. In addition, the paper also discusses the use of neural networks to identify 2D current distributions and its potential for analyzing 3D structures.
Photon Emission Microscopy of HfO2 ReRAM Cells
Authors: Stellari Franco , Wu Ernest Y. , Ando Takashi , Frank Martin M. , Song Peilin 
Published: October 2021

Abstract
In this paper, we discuss the use of spontaneous photon emission microscopy (PEM) for observing filaments formed in HfO2 resistive random access memory (ReRAM) cells. The setup employs a CCD and an InGaAs camera, revealing photon emissions in both forward (set) and reverse (reset) bias conditions. Photon emission intensity is modeled using an electric-field equation and inter-filament distance and density are determined assuming a uniform spatial distribution. The paper also discusses the use of high frame rate and prolonged photon emission measurements to assess lifetime and reliability and explains how single filament fluctuations and multiple filaments in a single cell were observed for the first time.
Plasma Etching Pre-treatment for a TEM Lamella Preparation of 3D NAND with High Aspect Ratio
Authors: Chen Yu-Chih , Li Bing-Chang , Hsu Pei-Ling , Lin Tsung-Yi , Chen I-An , Lin Chun-Hung , Hsu Hsin-Cheng , Yeh Chin-Chih , Lian Nan-Tzu , Yang Ta-Hone , Chen Kuang-Chao 
Published: October 2021

Abstract
This paper evaluates the use of plasma etching for preparing TEM specimens to analyze high aspect ratio 3D NAND integrated circuits. By controlling plasma etching parameters, a relatively high material removal rate could be obtained. Moreover, through the control of etch time, the top region of the test specimens could be completely removed down through the expected number of layers, making it possible to resolve details throughout the entire sample, particularly in the middle region of the 3D NAND, using TEM cross-section analysis.
Plasma FIB Delayering and Nanoprobing with EBIRCH for Localizing Metal Shorts in DRAM
Authors: Kim Euiseok , Lee Jaeyun , Lee Jihyun 
Published: October 2021

Abstract
This paper explains how to localize metal-to-metal short failures in DRAM using mechanical grinding, plasma FIB delayering, and electron beam induced resistance change (EBIRCH) analysis. Experiments show that the slope created during grinding is compensated by PFIB delayering, producing a high-quality planar surface in the target layer and site. Target layers can thus be prepared at any location (site-free), likewise, defective areas can be delayered to any depth without damage (layer-free). After delayering, exposed surfaces are generally flat enough to allow an electron beam to evenly penetrate the device for precise EBIRCH analysis. With the use of more advanced device preparation methods, EBIRCH analysis has a higher chance of successfully localizing metal line/via shorts even in large regions that include the aluminum layer.
Submicron Noncontact Simultaneous Infrared and Raman Spectroscopy for Challenging Failure Analysis
Authors: Lo Michael K. F. , Anderson Jay , Dillon Eoghan P. , Kansiz Mustafa , Marcott Curtis A. 
Published: October 2021

Abstract
This paper discusses the use of optical photothermal infrared (O-PTIR) spectroscopy combined with Raman analysis. The new technique overcomes many of the limitations of conventional FTIR and Raman spectroscopy when used alone. It is based on an infrared-visible pump-probe system that incorporates a wavelength-tunable IR laser that emits a pulsed beam that is combined colinearly with the output of a 532-nm green laser. As the paper explains, infrared radiation is partially absorbed by the test target when the wavelength of the laser resonates with the vibrational mode of the material. This excitation process causes the area under the infrared spot to heat up, in turn, causing local expansion along with changes in the refractive indices. These photothermal effects cycle on and off in synch with the pulsed IR beam and the amplitudes of the on-off states are captured by the co-located visible beam and plotted as a function of wavelength over the tunable range of the IR laser. The diffraction limited spot size of the visible beam is approximately 416 nm, corresponding to a spatial resolution of about 1 μm, which is 30 times more precise than conventional FTIR. In addition, by measuring photothermal effects in localized regions, it is possible to identify chemicals in quantities of matter as small as 0.4 pg. By comparison, the sensitivity of transmission mode FTIR is significantly less at around 100 pg.
Resolution of Customer Return Non-Volatile Memory Data Retention Bit Failures through Bit Map Verification and Bit Cell Characterization by Nanoprobe Analysis
Authors: Mulder Randal 
Published: October 2021

Abstract
This paper explains how nanoprobe analysis was used to determine the cause of data retention failures in nonvolatile memory (NVM) bitcells. The challenge with such memory cells is that they consist of two transistors with a single control gate in series with a programmable floating gate connected by a shared source/drain active area. With such a layout, there is no way to isolate the control gate from the floating gate, meaning that characterization must be performed simultaneously on both transistors. Having to characterize two transistors connected in series increases the number of potential electrical signature effects not by a factor of two, but rather the power of two, which makes interpreting the results much more difficult. As discussed in the paper, however, the authors used an atomic force probe to verify the bit map of the faulty device and then analyze the failing bit to confirm the programming error and reveal the possible failure mechanism. The failure mechanism was determined based on its electrical signature and a physical analysis of the bitcell location.
Pulsing Test for Defect of Resistive Word Line in DRAM Main Cell using WGFMU (Waveform Generator Fast Measurement Unit)
Authors: Lee JaeYun , Kim EuiSeok , Lim JunYeal , Oh SeokHoon , Park YoungHa 
Published: October 2021

Abstract
In this paper, we describe the difference between oscilloscope pulsing tests and waveform generator fast measurement unit (WGFMU) tests in analyzing high-resistance defects in DRAM main cells. Nanoprobe systems have various constraints in terms of pulsing whether it involves an oscilloscope or pulse generator. There are certain types of devices, such as DRAM cells, for which these systems are ineffective because saturation currents are too small. In this paper, we address this constraint and propose a new way to conduct pulsing tests using the WGFMU's arbitrary linear waveform generator in combination with an electro-optical nanoprobe.
Chip Recombination Method in Planar Deprocessing – A Solution for Failure Analysis on Chip Edge Defects
Authors: Cheong Kah Chin , Pragay Gabriel , Wudjud Wiwy , Lainez Rafael 
Published: October 2021

Abstract
Planar deprocessing is a vital failure analysis technique for semiconductor devices. The basic concept is to expose an area of interest (AOI) by removing unnecessary material while maintaining planarity and surface evenness. Finger deprocessing is a widely used material removal technique, particularly for fin field-effect transistors (FinFETs). Here, success depends on certain factors, one of which is the location of the AOI. If the AOI is near the edge of the chip, finger deprocessing can be very difficult because material removal rates are much higher there than at the center of the chip. Plasma focused ion beam (PFIB) planar deprocessing is the preferred solution in such cases, but many labs cannot afford a PFIB system. To address this challenge, a sample preparation method has been developed that uses dummy chips to effectively eliminate edges. With dummy chips placed edge-to-edge with test chips, planar deprocessing can be achieved using conventional finger deprocessing techniques. This paper describes the newly developed method, step by step, and presents two examples demonstrating its use.
Creative Approaches for Thermal Hot Spot Identification on Analog IC
Authors: Khoo Chun Haur , Lau Zhi Jie 
Published: October 2021

Abstract
Thermal hotspot (THS) fault isolation is an effective technique for detecting heat-generating failure modes, especially those involving excessive current or resistance. The normal approach for modulation mode THS analysis is to connect a power supply to the leakage pin of the device under test through the modulation switch on the instrument. There are instances, however, where this may not work. This paper discusses two such cases: one in which the output terminal of the modulation switch is connected to the failing device through a series resistor in order to limit current, and one where a voltage divider is used to connect the unit under test to the modulation switch in order to create ramping sequences that mimic IQ current spikes for THS analysis.
Quantitative Evaluation of Bonded Silicon Wafer by Scanning Acoustic Tomography
Authors: Kikukawa Koutaro , Sugaya Natsuki , Ohno Shigeru , Tomita Yoshihiro 
Published: October 2021

Abstract
This paper assesses the capabilities of scanning acoustic tomography (SAT) for the analysis of bonded silicon wafers. In order to quantitatively evaluate detectability and resolution, the authors acquired images from samples prepared with artificial voids. The samples consisted of two wafers, a cap wafer and a base wafer with dry-etched pits on a silicon-oxide layer. Cap wafers of different thicknesses were used along with transducers of appropriate focal length. The paper describes the experimental setup and test procedures in detail as well as the results.
Charged Particle Systems: Fundamentals and Opportunities
Authors: Principe Edward 
Published: October 2021

Abstract
This presentation covers ion beam analytical tools, their capabilities, and uses. It provides an overview of ion sources, examines emerging trends in surface analysis, and assesses the potential of ultrafast lasers for panoscopic patterning, athermal ablation, and elemental analysis. It compares and contrasts liquid metal, gas field, and plasma sources and presents examples highlighting the capabilities of FIB-SIMS and FIB-SEM Auger/XPS surface analysis techniques. It also introduces computationally guided microspectroscopy (CGM) and assesses its potential impact on multi-variant analysis, point spread deconvolution, and compressed sensing.