bluuebunny/crossref_metadata_2025_split huggingface dataset:
Mapping the Mesoscale Interface Structure in Polycrystalline Materials
Authors: Wu C T , Adams B L , Bauer C L , Casasent D , Morawiec A , Ozdemir S , Talukder A 
Published: July 2020

Abstract
Using the new method known as Orientation Imaging Microscopy (OIM), characterization of mesoscale aspect of the internal structure of polycrystalline materials in the two-dimensional section plane has become routine. However, in some applications which primarily focus either on the characterization of interface types or on their connectivity, OIM is rather inefficient since only the scan points that lie adjacent to the interfaces are used to determine interface character. When the OIM grid spacing is dictated by the precision with which the interfacial in-plane inclination must be determined in the section plane, the efficiency with which conventional OIM can harvest interfacial data is rather poor.
In this paper a new approach and system of microscopy is described, called the Mesoscale Interface Mapping System (MIMS). MIMS overcomes the challenges associated with OIM by directing the beam to the vicinity of interfaces which have been identified by a microstructural contrast image.
Electron Backscatter Diffraction. Characterization of Polyphase Materials
Authors: Medevielle A , Hugon I , Dugne O 
Published: July 2020

Abstract
Electron diffraction was observed in 1928 by Kikuchi. In electron diffraction, diagrams characteristic of the crystal lattice and the phase orientation are formed. Consequently, Venable, then Dingley recently developed electronic diffraction coupled with scanning electron microscopy. Their approach enables micrometric scale examination of a specimen obtained by simple metallographical preparation (polished surface). Since the 1980’s, this technique has benefited from strong technological and computerized development which have led to the sale of the first systems under the name of Electron Backscatter Diffraction (EBSD). Niobium is used in the cast industry of uranium to refine it (getter function). The strong affinity of niobium for carbon leads indeed to the formation of small precipitates of niobium carbides. Whereas carbon cannot be detected by EDS because of its high absorption by the niobium (absorption coefficient μ=29000), hardness measurement indicates the presence of carbides (HV30 = 2000), but without further information on the nature of those carbides.
Low Voltage Microanalysis and Imaging: Opportunities and Limitations of High-Resolution Analysis in Fe-SEM Instruments
Authors: Liu Jingyue 
Published: July 2020

Abstract
The use of a high-brightness field-emission gun and a high-resolution lens system in modern SEM instruments allows us to perform high-resolution chemical analysis and atomic-number contrast imaging of bulk materials at low voltages. Low voltage microanalysis is especially useful for analyzing surface coatings or deposits, catalyst particles, small inclusions or precipitates, and biological samples. In this report, we present useful applications as well as limitations of low voltage microanalysis in studying surface-related problems.
In the study of film formation on metal coupons for inhibiting metal corrosion in drinking water supplies, highly porous films were found to form on fresh metal coupons after treatment with various corrosion inhibitors. Figure 1a shows a low voltage (1.5 kV) SE image of a copper test coupon that was exposed to flowing water for a period of two months. The SE image clearly shows the porosity of the surface film and the presence of different phases.
On the Microanalysis of Small Precipitates at Low Voltage with a FE-SEM
Authors: Gauvin Raynald , Hovington Pierre 
Published: July 2020

Abstract
The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate the microscope with incident electron energy, E0, below 5 keV, with probe diameter smaller than 2.5 nm. Furthermore, what gives FE-SEM outstanding resolution is the combination of new magnetic lenses with a virtual secondary electron (SE) detector. The new lenses are designed to reduce the spherical and chromatic aberration coefficients, giving a smaller probe size. Contrary to the conventional systems, the SE detector is located above the objective lens and it becomes a virtual or through-the-lens (TTL) detector. Therefore, the SE image is mostly made up of all SEs of type I, almost eliminating those of type II and III which are generated by the backscattered electrons inside the specimen as well as in the chamber. It has been shown recently that Nb(CN) precipitates in Fe, as small than 10 nm, can be imaged with a FE-SEM Hitachi S-4500 with the TTL detector.
High Spatial Resolution Low Energy Electron Beam X-ray Microanalysis
Authors: Barkshire IR , Karduck P , Rehbach W , Richter S 
Published: July 2020

Abstract
Conventionally, x-ray microanalysis on scanning electron microscopes (SEM) with energy dispersive spectrometers (EDS) has been performed with relatively high primary energies (&gt;10 kv). for most samples this results in reasonably good separation of the generated x-ray line series from different elements enabling unambiguous identification and therefore accurate qualitative analysis. Under these circumstances it is widely accepted that quantitative analysis of polished bulk samples is possible on a routine basis with relative errors around 1-5% and detection limits of the order of 0.1%.
However, in order to address the analysis requirements of new advanced materials with sub-micron features, there is growing interest in performing x-ray microanalysis at low beam energies(&lt;5kv). this is now a more realistic goal due to the routine availability of field emission sem's which can operate with much improved beam sizes at low beam energies with sufficient beam current to perform practical microanalysis, in conjunction with the improved low energy performance of current, commercially available EDS systems.
Low Voltage ED-X-ray Microanalysis of Bulk Organic Materials
Authors: Echlin Patrick 
Published: July 2020

Abstract
An earlier investigation had shown that it is possible to perform quantitative energy dispersive x-ray microanalysis at primary beam voltages as low as 5kV on bulk biological material maintained in either the fully frozen hydrated or the dried state. This present study extends the earlier work and provides data which shows that the same type of analysis can be achieved at voltages as low as 3kV on organic samples composed primarily of hydrogen, carbon and oxygen which contain varying amounts of bromine, sulphur and chlorine. Such materials are equally beam sensitive as fully frozen hydrated biological samples and range in density from 1.1 to 2.2kg.m3. The samples fall into three main classes. 1. Chlorinated and/or sulphonated organic polymers. 2. A brominated organic sample. 3. Three experimental brominated plastics kindly supplied by Ms. B.S.Chuah, Melville Laboratory for Polymer Synthesis, Cambridge University. The remaining samples were purchased from Aldrich Chemicals at the highest purity available. The atomic weight percent and density was calculated for each of the eight specimens using the Electron Flight Simulation™ software programme.
LVEDS For Advanced Materials and Semiconductor Technologies
Authors: Boyes E D 
Published: July 2020

Abstract
The need to analyze bulk samples containing features with submicron dimensions has driven revaluation of the processes controlling the interaction of electron beams with inorganic, polymer and semiconductor materials, and to development of LVEDS analysis at lower beam energies of E0 &lt;5kV (1,2).
It has previously been shown (1,2) that the physics is much as expected with the vertical penetration range (R) along the beam direction in many cases predicted quite accurately for beam energy E0 by the simple Bethe (e.g. in 3) power law with R = F(E0)5/3. These same factors are effective to varying degrees in all three dimensions. The strong dependence of the range on energy has practical importance for the identification of sub-micron particles, including to help to determine the root cause of a defect Fig. 1 is an example of the sequential analysis of the exact same sub-micron particle, with the very real potential for a processing disaster, on the surface of a silicon wafer. When this feature is analyzed with a 3kV electron beam we learn it is alumina (A12O3). The analysis comes only from the target particle and the data have a simple relationship to the chemistry and the sensitivity for the light element (O) is excellent, providing simple and direct qualitative identification of the oxide compound.
NETSEM Collaborator - an Application in Telemicroscopy
Authors: Breton BC , Chand G , Howard PJ , Caldwell NHM , Holburn DM 
Published: July 2020

Abstract
Telemicroscopy, sometimes called remote microscopy, is an expanding set of microscopy techniques, made possible by the advent of ubiquitous and pervasive Internet technologies such as the World Wide Web. Recently, telemicroscopy has moved from laboratory prototypes to commercially available software. This paper discusses a real-world application of telemicroscopy in terms of a microscopy consultancy service offered by ERA Technology Ltd. in Leatherhead, UK.
Many organisations require microscopical services on an occasional basis. These needs are not however, sufficiently frequent as to justify the purchase and upkeep of an SEM or the recruitment and retention of a trained instrument operator Such organisations employ consultancy firms to perform the required analyses. In many such consultancies, a sample is sent to the microscopist with appropriate instructions. Once the investigation is complete, the consultant returns sample, micrographs and other results. The SEM service run by ERA has always offered its customers the opportunity for personal participation in any investigation, by attendance at SEM sessions at the Leatherhead laboratory.
A Miniature Low Voltage SEM with High Resolution
Authors: Krans JM , van Rooy TL 
Published: July 2020

Abstract
Miniaturization of electron optical systems has gained much interest over the last decade [1,2]. In a scanning electron microscope, downscaling of the column dimensions is expected to allow for high resolution imaging at low electron beam voltage. Main advantages of low voltage imaging are lower penetration depth, increased secondary electron yield, less specimen charging and better topographic contrast [3].
We have developed a miniature scanning electron microscope (SEM) with high resolution at low beam energies. The outer dimensions of the miniaturized SEM column are 25 mm diameter and 95 mm length, including conventional field emitter electron source module. The column prototype is shown in Fig. 1. The size reduction has been achieved by the exclusive implementation of electrostatic column components. Electron optical simulations indicate that the retarding objective lens of the miniature SEM allows for a probe resolution of 3 nm at 1 keV beam energy. The secondary electrons are collected at an internal scintillator detector.
Thermophile Endospores have Responsive Exosporium for Attachment
Authors: Panessa-Warren B , Tortora George T , Warren J , Sabatini R 
Published: July 2020

Abstract
Recently studies examining the colonization of Clostridial pathogens on agar and human tissue culture cells, demonstrated that (C. sporogenes ATCC 3584, C. difficile ATCC 43594 [patient isolate], C. difficile ATCC 9689 [non-clinical], C. clostridioforme [patient isolate]) bacterial spores (endospores) of the genus Clostridia have an outer membrane that becomes responsive at activation and exhibits extensions of the exosporial membrane that facilitate and maintain spore attachment to a nutritive substrate during germination and initial outgrowth of the newly developed bacterial cell. Therefore this attachment phenomenon plays an important role in insuring bacterial colonization of a surface and the initial stages of the infective process. To see if other non-clinical members of this genus also have this ability to attach to a substrate or food-source during spore germination, and how this attachment process in environmental thermophiles compares to the clinical paradigm (in relation to time sequence, exosporial membrane structure, type of attachment structures, composition of the membrane etc.), sediment samples were collected in sterile transport containers at 4 geothermal sites at Yellowstone National Park in Wyoming.
Removal of Contamination Deposits from Defects on Thin Film Magnetic Disks by Oxidative Cleaning Inside the SEM
Authors: Myers Sharon , Vane Ronald 
Published: July 2020

Abstract
Scanning Electron Microscopy (SEM) of thin film magnetic disk defects is challenging due to lubricant on the disk surface. The lubricant aids disk durability but interacts with the electron beam to form a contaminantation layer over the area of interest. A new cleaning technology allows the removal of the surface contamination while the specimen is in the SEM.
Plasma dry ashing of SEM samples to remove surface hydrocarbons is a well-known technique for specimen preparation. A number of commercial external plasma cleaning units are on the market for sample preparation outside the microscope. Zaluzec developed a technique for plasma cleaning the specimen and stage together prior to insertion into the analytical region of the electron microscope. But similar plasma cleaning within the SEM chamber must be avoided due to ion bombardment damage to the SEM and the deleterious effect of argon plasmas on ion pumps. XEI Scientific has developed a new device that creates neutral oxygen radicals from air. This technique oxidizes surface hydrocarbons into volatile gases that are easily carried away to the roughing and diffusion pumps.
In-Situ HREM Observation of Reduction of PdO to Pd Metal
Authors: Crozier Peter A , Datye Abhaya K 
Published: July 2020

Abstract
A detailed understanding of phase transformation mechanisms in small particles is critical for the design of small metal particle catalysts and nanophase materials. For palladium supported on silica, it is known that under certain conditions, reduction of PdO can lead to the formation of small Pd metal particles containing central faceted voids[l]. In-situ microscopy studies show that the voids form when PdO is reduced at temperatures between 200 and 400°C but collapse when the temperature reaches about 550°C [2]. Here we present in-situ high resolution microscopy showing the details of the void formation process.
Model Pd/SiO2, catalysts were prepared by dispersing Pd metal over silica microspheres using techniques described elsewheretl]. The Pd/SiO2, catalyst were fully oxidize°C for 2 hours. The catalyst was crushed and dispersed over Mo grids and plasma cleaned to remove any residual carbonaceous material. A Philips CM 200 with a slow scan CCD camera and video recording system was used to recording HREM images during in situ reduction at 200°C.
Design of a Photoelectron Microscope for Integrated Circuits and Other Areas of Surface Science
Authors: Rempfer G F , Griffith O H 
Published: July 2020

Abstract
In photoelectron microscopy (PEM; also known as PEEM) ultraviolet light is used to liberate electrons from the surface of a specimen through the photoelectric effect. The emitted electrons (photoelectrons) have low kinetic energies (∼1 eV) and are accelerated by an electric field between the specimen and an anode, before being imaged by a lens system. The lens system forms the image of the specimen in parallel mode, as in TEM, rather than in scanning mode, as in SEM. Image contrast arises from differences in work function and from electric or magnetic fields over the specimen surface. Micro-fields associated with surface topography are also a source of contrast. Because of the low emission energies of the electrons PEM is a highly surface-specific technique and also is relatively non-destructive.
Several versions of the photoelectron microscope have been designed and constructed jointly by the University of Oregon (U0) and Portland State University (PSU), and the instrument has evolved to an advanced state of development.
Digital Holographic Microscopy
Authors: Zhang Tong , Yamaguchi Ichirou , Morgan Hywel 
Published: July 2020

Abstract
We applied phase-shifting digital holography to microscopy in this paper. At first lensless microscopy is proposed, in which no optical adjustment is necessary. Then, the method is applied to relax the limitation of focal depth in traditional optical microscopy. A theory for image formation and experimental verification using a few specimens are described.
keywords: microscopy, digital holography, phase shifting
Due to the finite focal depth of an imaging lens, a limitation to normal optical microscopy-is that, only the 2-dimensional (2-D) information of an object can be obtained at one time. Besides, it is not convenient for quantitative analysis the observed image. Optical sectioning microscopy (OSM) and scanning confocal microscopy (SCM) which use opto-electronic detection have been proposed for quantitative analysis of a 3-D object. However, the former requires critical mechanical adjustment, while the latter uses timeconsuming mechanical 3-D scanning. Holographic microscopy can solve these problems because it can record 3-D information at one time. But, the chemical processing of holograms and the mechanical focusing at the reconstructed images cause more or less trouble. A 3-D imaging technique without use of photographic recording called optical scanning holography has recently been reported. However, there are also some trouble owing to the twin-image noise.
Digital Stereo Display and Projection Systems
Authors: Case Gary N , Mackenzie John M 
Published: July 2020

Abstract
For many years, we have been viewing stereo images created from a wide variety of microscopic sources. These images need to be easily viewed, shared and presented for stereo imagery to become more mainstream. We have been working for several years now to create affordable high resolution stereo display systems using the modern digital computers’ display capabilities. In the last couple of years, two methods have come into widespread use in our laboratory. One using shuttered goggles and the other using an active polarizing screen in front of the monitor. Both are synchronized with the display at refresh rates that allow for flicker free viewing. We use standard video display cards and shuttered glasses that cost under $300 (complete).
Unfortunately, the software and video cards turn over at such a fast rate that we have found our hardware “orphaned” several times.
Image Analysis: Converting from Manual to Automated Metrology
Authors: Cooper S , Saul E , Hunt J A 
Published: July 2020

Abstract
Many of the repetitive measurements required in the analysis of images in the semiconductor field can be replaced by partially or fully automated measurements. Automated measurements provide a number of benefits, including speed, repeatability, and removal of operator bias. The question of accuracy and precision in metrology applications is important to understand.
Recently we implemented a tool for automated analysis of resist bar images that was designed for use in acceptance testing-of lithographic stepper machines. The steppers are required to meet a defined set of criteria over the entire area of the wafer and through the focus range of the lens. Prior to the development of this package, the measurements were all done with a ruler and protractor on film.
The software identifies the boundary lines of the resist bar by locating a series of points along each edge and then fitting a line to those points. Edge identification is complicated by coating artifacts and by the variety in the images being analyzed. After identifying edge points along the base, side, and top of the resist bar, the software automatically generates information about the width, height, side wall angles, and various other measurements of the resist bar and stores the data in spread sheet format.
Imaging Cells in Liquid with a Near-Field Scanning Optical Microscope - Problems and Solutions
Authors: Gheber Levi A , Edidin Michael 
Published: July 2020

Abstract
Near Field Scanning Optical Microscopy (NSOM) is the newest member of the Scanning Probe Microscopy (SPM) family, which includes Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). Like its predecessors, it uses a sharp tip and a very precise positioning system to scan the surface of samples. The important difference is that the NSOM tip is made of an optical fiber, with a sub-wavelength size aperture at its end, which is brought to near-field proximity to the sample. In the near-field regime, the resolution is only limited by the size of the light source (the aperture), and not by the wavelength of light, thus allowing NSOM to obtain images with subwavelength resolution. Applying NSOM to biological samples is very appealing, since biological research has developed a wide variety of fluorescent dyes which can be directed with high specificity to objects of interest. Moreover, biological research relies to a large extent on conventional fluorescence microscopy, which is diffraction limited. Application of NSOM to biological problems requires the ability to image rough and soft samples in liquid, a task that presents many challenges.
We have developed a NSOM which is capable of imaging cells in liquid with a resolution of ∼150 nm. This has enabled us to image the organization of fluorescently labeled proteins on the membrane of cells in liquid, and demonstrate for the first time that the proteins are clustered.
Production and Analysis of High Resolution Polymer Replicas of Fibrillar Collagen
Authors: Sims P , Todd B , Eppell S , Li T , Park K , Albrecht R 
Published: July 2020

Abstract
Adherent cells generally construct the immediate substrate upon which they reside. This may occur via synthesis and secretion of new materials and/or by rearrangement and modification of existing substrate. The response of adherent cell types to an existing substrate can be influenced by a number of factors which include both the chemical and physical nature of the substrate. Cell adhesion, proliferation, differentiation and death can all be substrate dependent. Much effort has been directed toward chemical modification of substrates to regulate one or more of the parameters noted above. A significant, but somewhat smaller, degree of attention has been paid to the effects of the topography and microtopography on the cell response to substrate materials. Studies to date strongly suggest the topography is a significant factor in cell-substrate interactions. As noted above, it is most probable that both the chemistry and the structure of a substrate simultaneously influence the cellular response. However we wished to determine, particularly for artificial substrates, the role which microtopography can play in cell-substrate interactions.