bluuebunny/crossref_metadata_2025_split huggingface dataset:
Domain Structure of Epitaxial SrRuO3 Thin Films on (001) LaA1O3
Authors: Jiang J C , Pan XQ , Gan Q , Eom C B 
Published: July 2020

Abstract
Epitaxial thin film of SrRuO3 is very useful in device applications, due to its important electrical and magnetic properties. For example, (Pb,Zr)TiO3 ferroelectric capacitors with SrRuO3 thin film electrodes exhibit superior fatigue and leakage characteristics. Epitaxial SrRuO3 thin films grown on different substrates, such as on (001) SrTiO3 and (001) LaA1O3, have different magnetic properties, owing to the different microstructures in the film. Microstructures in epitaxial SrRuO3 thin films grown on (001) SrTiO3 have been studied in our previously work. In this paper, microstructure of epitaxial SrRu03 thin films grown on (001) LaA103 is reported.
SrRuO3 thin films on (001) LaA1O3 were deposited by 90° off-axis sputtering. For cross-section TEM studies the SrRuO3/LaA1O3 heterostructural samples were cut along the [100] direction of LaA103. The cut slides were glued face-to-face by joining the SrRu03 surfaces. Plan-view and cross-section TEM specimens were prepared by mechanical grinding, polishing and dimpling, followed by Ar-ion milling.
Electron Microscopy and Microanalysis of Metal Phases in Meteorites
Authors: Williams D B , Goldstein J I 
Published: July 2020

Abstract
Meteorites are remnants of the primordial material from which the solar system condensed. Most meteorites originated in the asteroid belt between Mars and Jupiter and fell to earth when their orbits were disturbed by collisions. Metal phases are present in all types of meteorites and are alloys of Fe and Ni containing S and P. The study of metal meteorites has yielded valuable information about the early thermal history of the solar system, since their heat treatment has been preserved in the microstructure and microchemistry of the meteorites and can be discerned by electron microscopy and microanalysis. A full understanding of the structure and chemistry of meteorites requires detailed knowledge of the Fe-Ni, Fe-Ni-S and Fe-Ni-P phase diagrams and determination of these diagrams has been carried out over more than three decades of electron-beam analysis by the authors.
Electron Microscopy in the Real Semiconductor Processing World
Authors: Anderson Ron 
Published: July 2020

Abstract
Introduction: The “real” semiconductor processing world consists of the universe of industrial and government semiconductor laboratories and manufacturing facilities plus a small number of university departments with heavy funding from industry—or a consortium of the above. We are bombarded with reports of how the drive toward faster, denser, lower power consuming and more reliable semiconductor products will accelerate with time. The smallest features of today's devices have already shrunk from view in visible light microscopes! Electron microscopy studies of semiconductor device materials, interconnects, insulators, and device packaging materials play a vital role in these extraordinarily “high tech” and financially important arenas.
Shifting semiconductor analytical paradigms: For the most part, the analytical paradigm has shifted: from visible light microscopy to SEM analysis, at low magnification and high accelerating voltage… to much more sophisticated SEM analysis, at high resolution and/or low accelerating voltages… to the many variations of TEM available today… and to new types of scanning probe microscopy.
Transmission Electron Microscopy Studies of Tin Oxide Thin Films Grown on the Sapphire Substrate
Authors: Fu L , Pan X 
Published: July 2020

Abstract
Tin dioxide (SnO2) with rutile type structure exhibits unique electronic and optical properties. In applications of this material as gas sensors, a film-type of SnO2 provides high ratio of surface area to volume and lead to high sensitivity and fast responses. It has been found that substrate material, deposition conditions, and annealing procedure may directly control the microstructure of thin films, hence control gas-sensing properties. In this paper, we present transmission electron microscopy (TEM) studies of the microstructure and crystal defects of tin oxide thin films on sapphire substrate with subsequent annealing at high temperatures.
Tin oxide thin films were deposited on the surface of sapphire by e-beam evaporation of high purity SnO2 (99.999%) at 350°C followed by annealing in air at 600°C - 700°C. Microstructures of the films were characterized by X-ray diffraction (XRD) and TEM techniques.
Microstructural Characterization of GaN on (0001) Sapphire
Authors: Mao Zhigang , Johnson Matthew T , Barry Carter C 
Published: July 2020

Abstract
III-V nitrides grown on (0001) sapphire substrates often contain a very high density of defects; this high density is usually attributed to the poor lattice and thermal match between the nitride and the sapphire [1]. There is thus a need to understand the defect structures in these materials. In the present study, a microstructural characterization of MBE-grown GaN films on (0001) sapphire using various TEM techniques was performed to evaluate defect structures in this material. This paper will outline some of the different types of defects found in these films and suggest some possible mechanisms by which they were formed.
Focused Ion Beam (FIB) Milling Damage Formed During Tem Sample Preparation of Silicon
Authors: Susnitzky David W , Johnson Kevin D 
Published: July 2020

Abstract
The ongoing reduction of scale of semiconductor device structures places increasing demands on the sample preparation methods used for transmission electron microscopy (TEM). Much of the semiconductor industry's failure analysis and new process development effort requires specific transistor, metal or dielectric structures to be analyzed using TEM techniques. Focused ion beam (FIB) milling has emerged as a valuable technique for site-specific TEM sample preparation. FIB milling, typically with 25-50kV Ga+ ions, enables thin TEM samples to be prepared with submicron precision. However, Ga+ ion milling significantly modifies the surfaces of TEM samples by implantation and amorphization. Previous work using 90° milling angles has shown that Ga+ ion milling of Si produces a surface damage layer that is 280Å thick. This damage is problematical since the current generation of semiconductor devices requires TEM samples in the 500-1000Å thickness range.
Fluctuation Microscopy: A New Class of Microscopy Techniques for Probing Medium Range Order in Amorphous Materials
Authors: Gibson J M , Treacy M M J , Voyles P M 
Published: July 2020

Abstract
Amorphous materials are devoid of periodic long range order, but at the nearest-neighbor level they possess a high degree of short-range order. In amorphous tetrahedral semiconductors, such as Si and Ge, this short-range order arises because each atom attempts to satisfy four bonds arranged as a regular tetrahedron. It is the rotations about each bond, from the second-nearest-neighbor outwards, that result in the loss of long-range order. It is apparent from modeling of amorphous materials, that there is considerable flexibility as to how rapidly the medium-range-order diminishes. The continuous random network (CRN) is a hypothetical tetrahedral extended structure wherein the atoms possess full four-connected coordination, but have minimal medium-range order. However, real amorphous materials infrequently exhibit true CRN-like topologies. Traditionally, diffraction has been used to study short- and medium-range order in amorphous materials. Assuming kinematical scattering, and that every atom has a similar environment, a radial distribution function (RDF) can be extracted which is sensitive only to the averaged atom pair-correlations out to ∼1 nm.
Extended Electron Loss Fine Structure Analysis of Silicon-K Edges Using an Imaging Filter
Authors: Former J A , Buck E C , Strachan D M , Hess N J 
Published: July 2020

Abstract
The recent availability of Gatan's imaging filter (GIF) has improved detail in electron energy loss spectroscopy (EELS) owing to the greatly reduced channel-to-channel gain variation. In particular, extended electron loss fine structure (EXELFS) can be rapidly obtained with relatively low beam exposures to the sample. Previous studies using EXELFS (of which there are relatively few) have been limited to rather beam-insensitive samples and have required extensive effort to correct detector gain variation. [1,2] We will discuss here some of our ongoing work on use of EXELFS as a complement to other analytical microscopy techniques to study changes in materials caused by radiation damage (ion and alpha) and transmutation. Using an imaging filter as a spectrometer, we have obtained EXELFS from a rather beam-sensitive alkali aluminosilicate, pollucite (CsAlSi2O6).
Porous Spherical Particles of ZnS Nanocrystallites
Authors: Arnold M , Wang ZL , Scholz SM , Vacassy R , Stadelmann P 
Published: July 2020

Abstract
ZnS particles consisting of nanocrystallites have potential applications as light emitters for displays. The possibility of encapsulating chemicals into porous particles and the temperature-controlled release of them could also be of interest in chemical engineering. The objective of this study is to determine the size distribution, shape and morphology of ZnS particles synthesized under different conditions, since they strongly influence the optical and electric properties.
The ZnS powders were prepared by precipitation from homogeneous aqueous solutions, following a procedure described elsewhere1-3 The initial solution consists of a zincsalt precursor dissolved in ultrapure water under acidic pH conditions. Adding Thioacetamide (TAA: CH3C(S)NH2) to this acidic solution at elevated temperature leads to the precipitation of ZnS nanocrystals. Four different types of zincsalt precursors were used to study their influence on the precipitation process and the final powder morphology: acetate (CH3COO), chloride (Cl-), trifluoromethanesulfonate (tFMS: CF3SO3 -) and dimethyldithiocarbamate (dMdTC: S4N2C6H12 -). The dried powder were subjected to 350°C and 700°C heat treatments, respectively.
Transmission Electron Microscopy Studies of Pd Encapsulation by Ceria-Zirconia Oxides
Authors: Jiang J C , Pan X Q , Graham G W , McCabe R W , Schwank J 
Published: July 2020

Abstract
High-temperature catalysts containing Pd supported on high-surface area ceria-zirconia are optimum materials for fuel economy when automotive engines operate under high speed or load conditions. A prerequisite for developing such thermally stable catalysts is to gain a good understanding of the thermal deactivation modes contributing to the aging and degradation of catalysts in harsh thermal environments. It was discovered by X-ray diffraction that upon hightemperature aging, Pd may sinter into large (about 10 nm diameter) particles and become encapsulated in the ceria-zirconia. To confirm this conclusion, a prototype high-temperature catalyst containing Pd supported on high-surface area ceria-zirconia, aged at temperature above 1100 °C is studied by transmission electron microscopy (TEM).
The ceria-zirconia supported Pd (0.25 wt%) catalyst was aged at 1105 °C and calcined at 700 °C for 2 h. For TEM sample preparations, first of all, a large-size aggregate with diameter about 1 mm was selected and sandwiched between by two pieces of silicon crystal.
Ordered Assembling of Size and Shape Selected Nanocrystals
Authors: Wang ZL 
Published: July 2020

Abstract
Nanoparticles and the physical and chemical functional specificity and selectivity they possess, suggest them as ideal building blocks for two- and three-dimensional cluster self-assembled superlattice structures, in which the particles behave as well-defined molecular matter and they are arranged with long-range translation and even orientation order [1]. Self-assembled arrays involve self-organization into monolayers, thin films, and superlattices of size-selected nanoclusters encapsulated in protective compact organic coating. The macroscopic properties of the nanocrystal superlattice (NCS) are determined not only by the properties of each individual particle but by the coupling/interaction between nanocrystals interconnected and isolated by a monolayer of thin organic molecules.
Periodic packing of nanocrystals is different from the 3-D packing of atoms. First, to an excellent approximation atoms are spherical, while nanoparticles can be faceted polyhedra, thus, the 3-D packing of particles can be critically affected by their shapes and sizes.
Self-Assembled and Micro-Patterned Mesoscopic Thin Films
Authors: Yao N , Trau M , Nakagawa N , A. Aksay I 
Published: July 2020

Abstract
Recently we have reported that the silica mesoscopic thin films can be formed at water/solid interface at room temperature. These self-assembled thin films are comprised of hexagonally packed nanotubules ((∼ 5 nm in diameter), with a percolating one-dimensional channel network that extends from one side of the film to the other. The solid substrate can affect strongly the overall alignment of assembly of surfactant micelle array. These films hold much promise for applications such as their use as orientated nanowires, sensor/actuator arrays and optoelectronic devices. Here, we report further electron microscopy studies of free standing thin film formed at air/water interface and patterned silica mesoscopic thin film formed with the guidance of micro-molding and electric field.
We employ tetraethoxy silane (TEOS), dissolved in acidic solution, as a silicate source and cetyltrimethyl ammonium chloride (CTAC) as the templating surfactant. Typical molar ratios are 1 TEOS : 1.2 CTAC : 9.2 HC1 : 1000 H2O.
Effects of Cation Promoters in Selective Catalyzation of N-Butane
Authors: Gai Pratibha L , Kourtakis Kostantinos 
Published: July 2020

Abstract
The role of cation promoters on the microstructure and stability of complex vanadyl pyrophosphate ((VO)2P2O7 or VPO) catalysts in the selective oxidation of n-butane to maleic anhydride (MA) is of major technological importance. Although several studies have been cited in the literature on the specific activity and MA selectivity of promoted VPO, no direct evidence for the formation of solid solutions with VPO has been reported. A better fundamental understanding of the location and the complex role of promoters in the catalyst-adsorbate interactions is therefore required. We have synthesized novel promoted catalyst powders with several cations including iron and antimony, as well as with ceria. We have probed their nanostructures in n-butane directly (in-situ) at the atomic level using environmental-HREM (EHREM) and their composition by high spatial resolution depth profiling using EDX (and STEM probe size) on the nanometer (nm) scale.
Selected Reflection Imaging of Nanostructured Materials
Authors: Liu Yi , Sellmyer David J 
Published: July 2020

Abstract
Nanostructured materials are finding increasing applications. In characterizing the nanostructured materials, we have developed a technique using a conventional TEM to characterize the nanostructure. The technique is named selected reflection imaging and could be used for measuring the grain size, measuring the volume fraction of a second phase in a dual phase material, measuring the texture and identifying the crystal structure in multiphase materials.
The technique is evolved from dark field imaging which is known to generate strong contrast. In conventional materials with a grain size larger than 1 μm, selected area diffraction pattern is from a single crystal. Dark field image could be formed by allowing one of the diffracted beam to go through the objective aperture. In nanostructured materials, however, the diffraction pattern becomes a ring pattern. Ordinary dark field image could be formed by allowing one of the spot in the ring to go through the aperture. However, only a limited number of grains are differentiated from the rest.
Core Level Shifts and Grain Boundary Cohesion
Authors: Muller D A 
Published: July 2020

Abstract
The role of core level shifts at metallic interfaces has often been ignored in electron energy loss spectroscopy (EELS) even though very small changes in bond length can lead to large core level shifts. However, the popular interpretation of core level shifts as measures of charge transfer is highly problematic. For instance, in binary alloys systems, the core level shifts can be the same sign for both atomic constituents[l]. The simple interpretation would require that both atomic species had lost or gained charge. Further, the signs of the core level shifts can be opposite to those expected from electronegativity arguments[2]. A core level shift (CLS) is still possible, even when no charge transfer occurs. As illustrated in Fig. 1, if the valence band width is increased, the position of the center of the valence band with respect to the Fermi energy will change (as the number of electrons remains unchanged).
Grain Boundary Dislocations and Stacking Defects in the 9R Phase at an Incoherent Twin Boundary in Copper
Authors: Medlin DL , Campbell GH , Barry Carter C 
Published: July 2020

Abstract
Experiment and modeling show that there is a general mode of grain boundary dissociation, common in low stacking fault energy FCC metals, that can be well understood in terms of the emission of arrays of stacking faults from the grain boundary plane. Most extensively studied of such dissociated interfaces are the Σ=3 incoherent twin boundaries. Numerous observations now exist of grain boundary dissociation at such interfaces showing a layer that is well described as a narrow, several nanometer wide slab of 9R stacked material. The 9R stacking sequence is equivalent to a close-packed stacking of FCC ﹛111﹜ planes with an intrinsic stacking fault inserted every three planes (i.e., a stacking sequence of ABC/BCA/CBA …). The width of the 9R layer is sensitive to the local stress state. Figure 1 shows results of an atomistic calculation simulating the effect of an applied shear strain parallel to the boundary.
Investigating Ca Segregated to a Grain Boundaries in MgO Using Multiple Scattering Analysis of Electron Energy Loss Spectra
Authors: Buban J P , Zaborac J , Moltaji H , Duscher G , Browning N D 
Published: July 2020

Abstract
Although grain boundaries typically account for only a small fraction of a material, they can have far reaching effects on the overall bulk scale properties. These effects are usually simply linked to the boundary having a different atomic arrangement to the bulk. A necessary first step in understanding the structure-property relationships is therefore a detailed determination of the boundary structure.
One means of obtaining detailed information on the structure of grain boundaries is through correlated Z-contrast imaging and electron energy loss spectroscopy (EELS). The Z-contrast image generates a map of the grain boundary which can be used to position the probe in defined locations for spectroscopy. In the case of oxides, a structural model of the metal atom positions can be determined directly from the image. Furthermore, using a simple bond-valence sum minimization routine, the oxygen atoms can be placed so that the structure contains atoms that have valences consistent with their expected formal valence state.
Profiling Pvp/Ps Homopolymer Interfaces Using Core-Loss Electron Energy-Loss Spectroscopy
Authors: Siangchaew K , Prayoonthong P , Libera M 
Published: July 2020

Abstract
Despite the physical and technological significance of polymer interfaces (1), they have not been extensively studied using techniques based on electron scattering. Spontak et al. (2) used digital analysis of bright-field images to study Os-stained polystyrene-polydiene block copolymer interfaces, but work in this area has been lacking largely because of difficulties with staining or uncertainties in the distribution of stain at the nanometer length scales relevant to interfaces. Studies of polymer interfaces are now largely done by neutron scattering (3) This research explores the application of spatially-resolved electron energyloss spectroscopy to measure compositional widths of polymer-polymer interfaces. These first studies focus on blends of poly(2-vinyl pyridine) (PVP) dispersed in poly(styrene) (PS) to establish the various electron-optical, electron-scattering, and specimen-dependent limitations (4) to resolving such an interfacial width. The uncompatibilized PS/PVP interface should be relatively sharp.
Blends of PS (M.W. 190,000) and PVP ( M.W. 200,000) were made using a 5wt% solution of polymer in THF with a PS/PVP ratio of 7/3. The solution was cast into methanol. The resulting solid precipitate was removed and annealed under vacuum at 120°C for 36 hours.
Quantitative Thickness Mapping of Dewetting Polymer Bilayers
Authors: Winesett D A , Ade H , Smith A P , Rafailovich M , Sokolov S , Slep D 
Published: July 2020

Abstract
The study of wetting and dewetting in thin polymer films has many implications for technological applications of polymer films, including dielectric films to control conductivity and colloidal paint systems. We have started to use a novel approach, Near Edge X-ray Absorption Fine Structure (NEXAFS) microscopy, to characterize dewetting in thin polymer films. We have investigated a polystyrene/brominated polystyrene (PS/PBrS) bilayer model system with the Scanning Transmission X-ray Microscope (STXM) at the National Synchrotron Light Source. Our method offers quantitative thickness mapping of all constituent components in these thin polymer films.
NEXAFS imaging of polymers has advantages over other forms of microscopy primarily because of its low damage, good chemical sensitivity, and the possibility for quantitative analysis. Figure 1 shows four micrographs of one PS/PBrS bilayer annealed for one week at 170 C.
Microscopical Procedures for Investigating Natural Textile Fibers
Authors: Boylston E K 
Published: July 2020

Abstract
Microscopical procedures for the evaluation of cotton textiles are important to the textile industry in evaluating mixed fiber blends, dyes and chemical finishes on fabrics. A new procedure for embedding cellulosic textiles has been developed for FT-IR microscopy whereby fibers are embedded in polystyrene. This polymer does not absorb in the same regions of the infrared spectrum as cellulose or traditional acrylate and epoxy resins that contain chemical groups in common with cellulose. Additionally, use of cross-sections mounted on a KBr disk (Fig. 1) has the advantage of better resolution (Fig. 2B) than grinding and pressing fibers in a KBr disk (Fig. 2A).
A new process for the evaluation of yarns has been developed. Approximately 2000 fibers before spinning, 50 yarn segments after spinning, or yarns removed from fabric after processing, can be encased in a tube, embedded in methacrylate plastic, quickly UV polymerized, and sectioned.
Uncoated Lvsem and Imaging Tof-Sims of Unfixed, Plunge Frozen, Freeze Dried, Fungal and Plant Material
Authors: Basgall E J , Winograd N 
Published: July 2020

Abstract
A Cryosorption Freeze Drying (CFD) system was evaluated for its effectiveness in preparing delicate biological materials for both low voltage-field emission scanning electron microscopy (LVFESEM) and imaging liquid metal (Ga) ion beam, static time-of-flight, secondary ion mass spectrometry (TOF-SIMS). The primary goals of these studies were to investigate the retention of both structural and chemical integrity using fresh cryoprepared biological material which had not been exposed to any chemical fixation and which would not be coated by any conductive material in order to obtain information from the native surfaces. Duplicate chemically fixed samples were processed for comparison. LV-FESEM (2-2.5kV) was used to assess the quality of the structural preservation of the freezing and freeze drying (FD) protocols. Imaging static TOF-SIMS was used to investigate the surface chemical compositions of the biological samples.