bluuebunny/crossref_metadata_2025_split huggingface dataset:
SMT Ceramic Capacitor Failure Mechanisms, Isolation Tools, Techniques and Analysis Methods
Authors: Carbone Ralph A. , Roche David J. 
Published: December 2020

Abstract
Surface Mount Technology (SMT) ceramic capacitors are widely used on virtually every type of electronic product. In computer systems, SMT capacitors populate the majority of electronic parts found on each Printed Circuit Assembly (PCA) within the product, primarily as bypass or coupling devices between power and ground. As such, the opportunity for failure is substantially higher than with other commonly used active or passive components. Additionally, the relatively small ceramic bodies are prone to mechanical damage. Their proportionately high numbers, sensitivity to mechanical stress and difficulty in isolating to a specific failing device on the PCA (since many of these parts are in parallel with many other identical capacitors) all combine to make the successful isolation and analysis of the root cause of failure particularly difficult for the failure analyst. Often, the cause of failure is misdiagnosed, or the evidence is compromised by the methods used to perform the analysis. This paper will discuss the common failure mechanisms associated with SMT ceramic capacitors, as well as some innovative non-destructive isolation tools and techniques, including C-Mode Scanning Acoustic Microscopy (C-SAM), Infrared thermography (IR) and Micro-Focus X-ray analysis. Several case studies will be cited which demonstrate each of the mechanisms and methods. Additionally, the processes used to properly analyze these defects will be examined.
Direct Measurements of Charge in Floating Gate Transistor Channels of Flash Memories Using Scanning Capacitance Microscopy
Authors: De Nardi Christophe , Desplats Romain , Perdu Philippe , Guérin Christophe , Gauffier Jean Luc , Amundsen Thomas B. 
Published: December 2020

Abstract
Failure Analysis has to deal with challenging questions about stored charges in floating gates in Non Volatile Memories (NVM) when reading does not give expected data. Access to this information will help to understand failure mechanisms. A method to measure on-site programmed charges in Flash EEPROM devices is presented. Scanning Capacitance Microscopy (SCM) is used to directly probe the carrier concentration on Floating Gate Transistor (FGT) channels. The methodology permits mapping channels and active regions from the die backside. Transistor charged values (ON/OFF) are measured and localized with a 15 nm resolution. Both preparation and probing methods are discussed. Applications are demonstrated on two different Flash technologies: a two-transistor cell (2T-cell) from Atmel and a one-transistor cell (1T-cell) from STMicroelectronics.
Energy Dispersive Spectrum (EDS) Study of Copper Grid Effect on Semiconductor Failure Analysis
Authors: Hu Jianqiang , Li Ming , Gao Qiang , Niou Chorng , Kary Chien W.T. 
Published: December 2020

Abstract
In this paper the artifacts of additional copper signal induced by the copper grid, one of the most widely used supporting grid for focus ion beam (FIB) prepared TEM sample, is studied. Its influence on both the spot and the line scan energy dispersive spectroscopy (EDS) analyses are described. It was determined that, during line scan analysis, the strength of the copper signal varied between heavy and light elements, which could lead to inconclusive results during the EDS analysis of Cu interconnect structures. Based on the study using nickel support grid, it is concluded that the additional copper signal is a result of electrons scattered by the sample striking the Cu grid.
DNA to Safeguard Electrical Components and Protect Against Counterfeiting and Diversion
Authors: Hayward James A. , Meraglia Janice 
Published: December 2020

Abstract
This abstract provides an introduction to the utility of botanical DNA taggants to provide supply chain security for electronic components and to protect against counterfeiting and diversion. A detailed treatment of the science behind Applied DNA Sciences' botanical DNA technology, its applications to semiconductors and microchips, and an overview of DNA analysis by PCR and CE analysis is provided. In addition, information on the evolution of electronic product counterfeiting and inadequate anti-counterfeiting measures is also provided.
Localization of Dead Open in a Solder Bump by Space Domain Reflectometry
Authors: Vallett David P. , Bader Daniel A. , Talanov Vladimir V. , Gaudestad Jan , Gagliolo Nicolas , Orozco Antonio 
Published: December 2020

Abstract
Space Domain Reflectometry (SDR) is a newly developed non-destructive failure analysis (FA) technique for localizing open defects in both packages and dies through mapping in space domain the magnetic field produced by a radio frequency (RF) current induced in the sample, herein the name Space Domain Reflectometry. The technique employs a scanning superconducting quantum interference device (SQUID) RF microscope operating over a frequency range from 60 to 200 MHz. In this paper we demonstrate that SDR is capable of locating defective micro bumps in a flip-chip device.
Advanced Physical Inspection Methods for Counterfeit IC Detection
Authors: Shahbazmohamadi Sina , Forte Domenic , Tehranipoor Mark 
Published: December 2020

Abstract
Possible methods for counterfeit electronic part detection can be classified into two main categories: physical inspection and electrical testing. The physical inspection techniques can potentially be extended to different integrated circuit (IC) types; however, there are some challenges. The major contribution of this paper is to tackle these issues by introducing and optimizing two novel three and four dimensional imaging techniques that can provide us with the necessary information on interior and exterior geometry along with the material composition for the parts under test: four-dimensional scanning electron microscopy and dual energy 3D x-ray microscopy. In this study, advanced image processing and image analysis tools are utilized to establish a more consistent and accurate image perception. Inconsistencies within the samples and their defects are also used as an alternative to having a golden IC. However, the final decision has further been validated using results from five known authentic samples.
Analyzing the Impact of X-Ray Tomography on the Reliability of Integrated Circuits
Authors: Dogan Halit , Alam Md Mahbub , Asadizanjani Navid , Shahbazmohamadi Sina , Forte Domenic , Tehranipoor Mark 
Published: December 2020

Abstract
X-ray tomography is a promising technique that can provide micron level, internal structure, and three dimensional (3D) information of an integrated circuit (IC) component without the need for serial sectioning or decapsulation. This is especially useful for counterfeit IC detection as demonstrated by recent work. Although the components remain physically intact during tomography, the effect of radiation on the electrical functionality is not yet fully investigated. In this paper we analyze the impact of X-ray tomography on the reliability of ICs with different fabrication technologies. We perform a 3D imaging using an advanced X-ray machine on Intel flash memories, Macronix flash memories, Xilinx Spartan 3 and Spartan 6 FPGAs. Electrical functionalities are then tested in a systematic procedure after each round of tomography to estimate the impact of X-ray on Flash erase time, read margin, and program operation, and the frequencies of ring oscillators in the FPGAs. A major finding is that erase times for flash memories of older technology are significantly degraded when exposed to tomography, eventually resulting in failure. However, the flash and Xilinx FPGAs of newer technologies seem less sensitive to tomography, as only minor degradations are observed. Further, we did not identify permanent failures for any chips in the time needed to perform tomography for counterfeit detection (approximately 2 hours).
Automated Detection of Fault Sensitive Locations for Reconfiguration Attacks on Programmable Logic
Authors: Lohrke Heiko , Scholz Philipp , Boit Christian , Tajik Shahin , Seifert Jean-Pierre 
Published: December 2020

Abstract
Programmable logics, such as complex programmable logic devices (CPLDs) and field programmable gate arrays (FPGAs), are widely used in security applications. In these applications cryptographic ciphers, physically unclonable functions (PUFs) and other security primitives are implemented on such platforms. These security primitives can be the target of fault injection attacks. One of the most powerful examples of fault injection techniques is laser fault injection (LFI), which can induce permanent or transient faults into the configuration memories of programmable logic. However, localization of fault sensitive locations on the chip requires reverse-engineering of the utilized building blocks, and therefore, is a tedious task. In this work, we propose an automated technique using readily available IC debug tools to map and profile the fault sensitive locations of programmable logic devices in a short period.
Nanoscale Capacitance and Capacitance-Voltage Curves for Advanced Characterization of Electrical Properties of Si and GaN Structures Using Scanning Microwave Impedance Microscopy
Authors: Friedman Stuart , Amster Oskar , Yang Yongliang , Stanke Fred 
Published: December 2020

Abstract
The use of Atomic Force Microscopy (AFM) electrical measurement modes is a critical tool for the study of semiconductor devices and process development. A relatively new electrical mode, scanning microwave impedance microscopy (sMIM), measures a material’s change in permittivity and conductivity at the scale of an AFM probe tip [1]. sMIM provides the real and imaginary impedance (Re(Z) and Im(Z)) of the probe-sample interface. By measuring the reflected microwave signal as a sample of interest is imaged with an AFM, we can in parallel capture the variations in permittivity and conductivity and, for doped semiconductors, variations in the depletion-layer geometry. An existing technique for characterizing doped semiconductors, scanning capacitance microscopy, modulates the tip-sample bias and detects the tip-sample capacitance with a lock-in amplifier. A previous study compares sMIM to SCM and highlights the additional capabilities of sMIM [2], including examples of nano-scale capacitance-voltage curves. In this paper we focus on the detailed mechanisms and capabilities of the nano-scale C-V curves and the ability to extract semiconductor properties from them. This study includes analytical and finite element modeling of tip bias dependent depletion-layer geometry and impedance. These are compared to experimental results on reference samples for both doped Si and GaN doped staircases to validate the systematic response of the sMIM-C (capacitive) channel to the doping concentration.
Low Energy Ar Ion Milling of FIB TEM Specimens from 14 nm and Future FinFET Technologies
Authors: Bonifacio C.S. , Nowakowski P. , Campin M.J. , Ray M.L. , Fischione P.E. 
Published: December 2020

Abstract
Transmission electron microscopy (TEM) specimens are typically prepared using the focused ion beam (FIB) due to its site specificity, and fast and accurate thinning capabilities. However, TEM and high-resolution TEM (HRTEM) analysis may be limited due to the resulting FIB-induced artifacts. This work identifies FIB artifacts and presents the use of argon ion milling for the removal of FIB-induced damage for reproducible TEM specimen preparation of current and future fin field effect transistor (FinFET) technologies. Subsequently, high-quality and electron-transparent TEM specimens of less than 20 nm are obtained.
Comparison of lower limb muscle activity during the dynamic balance test between baseball pitchers and healthy young adults
Authors: Jeon Jeongwoo , Lee Jiyeon , Hong Jiheon , Yu Jaeho , Kim Jinseop , Lee Dongyeop 
Published: December 2020

BACKGROUND: Dynamic balance is an essential factor for efficient pitching by baseball pitchers. OBJECTIVE: To compare distances reached and lower-extremity muscle activity during the star excursion balance test (SEBT) in baseball pitchers and healthy young adults. METHODS: Nineteen baseball pitchers (BPG) and 20 healthy adults (HAG) were recruited. Surface EMG was used to measure the activity of vastus medialis (VM), vastus lateralis (VL), tibialis anterior, and lateral gastrocnemius. RESULTS: The BPG exhibited greater dynamic balance than in the HAG ([Formula: see text] 0.05) in the posteromedial (PM) and posterolateral (PL) directions. For the PM and PL directions, significantly greater muscle activity of VM and VL was found in the BPG than in the HAG ([Formula: see text] 0.05). CONCLUSION: SEBT performance is characterized by high-level VM and VL muscle activities. Neuromuscular control of knee extensors, such as the VM and VL of pitchers, might affect the dynamic balance measured by the SEBT.
PENERAPAN DIRECT MARKETING PADA UKM JAJANAN TRADISIONAL
Authors: Atmojo Cahyo Tri 
Published: December 2020

Penelitian ini bertujuan untuk mengetahui Penerapan Direct Marketing Pada UKM Jajanan Tradisional Di Desa Bulang Kecamatan Prambon Kabupaten Sidoarjo. Penelitian ini menggunakan metode deskriptif kualitatif strategi fenomenologi. Pengumpulan data dalam penelitian ini menggunakan sumber data primer observasi dan wawancara serta sumber data sekunder melalui dokumentasi. Teknik analisis data menggunakan triangulasi data. Hasil yang diperoleh yakni penerapan direct marketing pada UKM jajanan tradisional sudah sangat baik, dan sudah menggunakan strategi bauran promosi yang salah satunya yakni direct marketing yakni dengan menggunakan media internet.
A Comparison of Frequency Domain Electro-Magnetometry, Electrical Resistivity Tomography and Borehole Temperatures to Assess the Presence of Ice in a Rock Glacier
Authors: Boaga Jacopo , Phillips Marcia , Noetzli Jeannette , Haberkorn Anna , Kenner Robert , Bast Alexander 
Published: December 2020

Alpine permafrost is currently warming, leading to changes such as active layer deepening and talik formation. Frequency domain electro-magnetometry (FDEM) measurements were tested as a simple and efficient method to investigate ground characteristics along two transects on the ice-rich Schafberg rock glacier in the Eastern Swiss Alps. The results were compared with electrical resistivity tomography (ERT) and ground temperature data acquired simultaneously in boreholes. FDEM provides information on the electrical properties of the ground, allowing to investigate ground-ice distribution. Our device allowed measurements to a depth of around 7 m. In ice-rich permafrost, FDEM can provide an approximation of the active layer thickness, and ice-free zones within the permafrost such as intra-permafrost taliks can be identified. This rapidly applicable geophysical method can be used to monitor ground ice distribution easily and efficiently, making it an ideal complement to borehole temperature data, which only provide point information and are costly to install and maintain. At the Schafberg site the three methods FDEM, electrical resistivity tomography and borehole temperature measurements provided similar results, with regard to active layer thickness and the presence of unfrozen zones within the ice-rich permafrost.
Evidence That Baseline Levels of Low-Density Lipoproteins Cholesterol Affect the Clinical Response of Graves’ Ophthalmopathy to Parenteral Corticosteroids
Authors: Naselli Adriano , Moretti Diletta , Regalbuto Concetto , Arpi Maria Luisa , Lo Giudice Fabrizio , Frasca Francesco , Belfiore Antonino , Le Moli Rosario 
Published: December 2020

BackgroundHigh dose intravenous glucocorticoid (ivGC) therapy is the first line treatment in moderate to severe Graves’ ophthalmopathy (GO) and is associated with a clinical response rate ranging from 50% to 80%. Recently, a positive correlation between total cholesterol and low-density lipoproteins cholesterol (LDLc) with GO presentation and activity has been described.ObjectiveWe aimed at evaluating whether, in patients with moderate to severe active GO treated with ivGC therapy, cholesterol, and LDLc could represent valuable predictive factors of medium-term GO outcome.MethodsThis single center retrospective study was conducted in a consecutive series of 87 patients undergone ivGC therapy because affected by moderate to severe active GO. Clinical outcome of GO was evaluated at week 6 (W6) and 12 (W12) in respect to baseline conditions (week 0) by the seven points CAS according to EUGOGO recommendations. Univariate analysis and binary logistic regression were performed for the outcome variable W12CAS.ResultsIn patients with active GO, an early positive clinical response to ivGC therapy (as evaluated by CAS at 6W) was a strong determinant (OR=13) of the clinical outcome at week 12. Moreover, high levels of LDLc at baseline were positively associated with a reduction in the likelihood of being classified as improved at 12W. Patients with LDLc &gt;193.6 mg/dl were very likely to respond negatively to ivGC therapy independently from the response at 6W. Based on these results, we propose a predictive decision-making model to be tested in future prospective studies.DiscussionWe found that, in patients with active GO, both an early clinical response to ivGC therapy and baseline LDLc levels are significant determinants of GO outcome (W12CAS). These data support the need of a cholesterol-lowering treatment before addressing these patients to ivGC therapy.
Fatal Rhinofacial Mycosis Due to Aspergillus nomiae: Case Report and Review of Published Literature
Authors: Zhou Ya Bin , Li Dong Ming , Houbraken Jos , Sun Ting Ting , de Hoog G. Sybren 
Published: December 2020

BackgroundA 73-year-old female suffering from acute myeloid leukemia presented with progressive rhinofacial mycosis. Suspecting it to be mucormycosis, the antifungal amphotericin B (AMB) was administered empirically, but the patient did not respond as planned. The fungus was then isolated from the biopsied tissue and morphologically identified as a species of Aspergillus. Necrosis progressed and she died of cerebral hemorrhage. Since Aspergillus flavus is susceptible to AMB, and several other Aspergillus species can be misidentified as A. flavus, the observed resistance necessitated a re-examination of the fungal isolate.MethodsThe fungal strain was re-isolated and re-examined morphologically. Additionally, genomic DNA was extracted from the fungus and sequences were obtained from three genomic regions [the rDNA internal transcribed spacer (ITS) region, and portions of the β-tubulin and calmodulin genes] to more accurately identify this Aspergillus strain. Its antifungal susceptibility was assessed using multiple compounds and our findings were compared with literature data.ResultsThe fungal culture again yielded an Aspergillus isolate morphologically identical to A. flavus. Molecular analyses, however, revealed the strain to be A. nomiae, a close relative of A. flavus in section Flavi, and it exhibited resistance to AMB. Reviewing the literature, only five other cases of A. nomiae infection in humans have been reported worldwide.Conclusion and Clinical ImportanceThe rhinofacial mycosis of the patient was actually due to A. nomiae. The initial misidentification of the fungus, coupled with its resistance to AMB, could be the reason treatment did not help the patient. We postulate that clinical A. nomiae infections may be underreported and that accurate and speedy pathogen identification is important so that an effective antifungal regimen can be administered.
Case Report: 18F-MK6240 Tau Positron Emission Tomography Pattern Resembling Chronic Traumatic Encephalopathy in a Retired Australian Rules Football Player
Authors: Krishnadas Natasha , Doré Vincent , Lamb Fiona , Groot Colin , McCrory Paul , Guzman Rodney , Mulligan Rachel , Huang Kun , O'Donnell Meaghan , Ponsford Jennie , Hopwood Malcolm , Villemagne Victor L. , Rowe Christopher C. 
Published: December 2020

Introduction: It remains unclear if tau imaging may assist diagnosis of chronic traumatic encephalopathy (CTE). Flortaucipir PET has shown superior frontal with medial temporal tau binding consistent with the provisional neuropathological criteria for mid-stage CTE in group-level analyses of retired symptomatic NFL players and in one individual with pathologically confirmed CTE. 18F-MK6240 is a new PET ligand that has high affinity for tau. We present the case of a 63-year-old cognitively impaired, former Australian rules football player with distinct superior frontal and medial temporal 18F-MK6240 binding and show it to be significantly different to the pattern seen in prodromal Alzheimer's disease (AD).Findings: The participant was recruited for a study of amyloid-β and tau several decades after traumatic brain injury. He had multiple concussions during his football career but no cognitive complaints at retirement. A thalamic stroke in his mid 50s left stable mild cognitive deficits but family members reported further short-term memory, behavioral, and personality decline preceding the study. Imaging showed extensive small vessel disease on MRI, a moderate burden of amyloid-β plaques, and 18F-MK6240 binding in bilateral superior frontal and medial temporal cortices. Voxel-wise analysis demonstrated that the frontally predominant pattern of the participant was significantly different to the posterior temporo-parietal predominant pattern of prodromal AD.Conclusion: Although lacking neuropathological examination to distinguish CTE from a variant of AD, the clear demonstration of a CTE-like tau pattern in a single at-risk individual suggests further research on the potential of 18F-MK6240 PET for identifying CTE is warranted.
Transcriptome Analysis of Ovarian and Uterine Clear Cell Malignancies
Authors: Alldredge Jill , Randall Leslie , De Robles Gabriela , Agrawal Anshu , Mercola Dan , Liu Marisa , Randhawa Pavneet , Edwards Robert , McClelland Michael , Rahmatpanah Farah 
Published: December 2020

PurposeOvarian and uterine clear cell carcinomas (CCCs) are rare but associated with poor prognosis. This study explored RNA transcription patterns characteristic of these tumors.Experimental DesignRNA sequencing (RNA-seq) of 11 ovarian CCCs and five uterine CCCs was performed and compared to publicly available data from high grade serous ovarian cancers (HGSOCs). Ingenuity Pathway Analyses were performed. CIBERSORT analyses estimated relative fractions of 22 immune cell types in each RNA-seq sample. Sequencing data was correlated with PD-L1 immunohistochemical expression.ResultsRNA-seq revealed 1,613 downregulated and 1,212 upregulated genes (corrected p &lt; 0.05, |FC |≥10) in ovarian CCC versus HGSOC. Two subgroups were identified in the ovarian CCC, characterized by ethnicity and expression differences in ARID1A. There were 3,252 differentially expressed genes between PD-L1+/− ovarian CCCs, revealing immune response, cell death, and DNA repair networks, negatively correlated with PD-L1 expression, whereas cellular proliferation networks positively correlated with expression. In clear cell ovarian versus clear cell uterine cancer, 1,607 genes were significantly upregulated, and 109 genes were significantly downregulated (corrected p &lt; 0.05, |FC|≥10). Comparative pathway analysis of late and early stage ovarian CCCs revealed unique metabolic and PTEN pathways, whereas uterine CCCs had unique Wnt/Ca+, estrogen receptor, and CCR5 signaling. CIBERSORT analysis revealed that activated mast cells and regulatory T cell populations were relatively enriched in uterine CCCs. The PD-L1+ ovarian CCCs had enriched resting NK cells and memory B cell populations, while PD-L1− had enriched CD8 T-cells, monocytes, eosinophils, and activated dendritic cells.ConclusionsUnique transcriptional expression profiles distinguish clear cell uterine and ovarian cancers from each other and from other more common histologic subtypes. These insights may aid in devising novel therapeutics.