bluuebunny/crossref_metadata_2025_split huggingface dataset:
Spatial Resolution in the Atom Probe Field Ion Microscope
Authors: Miller M K 
Published: July 2020

Abstract
The atom probe field ion microscope can resolve and identify individual atoms. This ability is demonstrated in a pair of field ion micrographs of an Ni3Al specimen, Fig. 1, in which the individual atoms on the close packed (111) plane are clearly resolved. Comparison of these two micrographs reveals that an individual atom was field evaporated between the micrographs. Due to the hemispherical nature of the specimen, the ability to resolve this two dimensional atomic arrangement is only possible on low index plane facets. The spatial resolution in field ion images is determined by a number of factors including specimen temperature, material, microstructural features, specimen geometry, and crystallographic location.
The spatial resolution of the data obtained in atom probe and 3 dimensional atom probe compositional analyses can be evaluated with the use of field evaporation or field desorption images. The field evaporation images are formed from the surface atoms with the use of a single atom sensitive detector whereas the field ion image is formed from the projection of a continuous supply of ionized image gas atoms.
Biological Applications of Environmental Scanning Electron Microscopy
Authors: C. J. Gilpin 
Published: July 2020

Abstract
Over recent years there has been relatively little experimental data produced by environmental scanning electron microscopy on biological applications. The author’s laboratory is situated in a multi-user facility based in a School of Biological Sciences and has examined a wide variety of samples over a 5 year period. The purpose of this paper is to present a number of biological applications, one in detail, in an attempt to illustrate the potential and pitfalls of the instrumentation.
A study has been made of the elastic bands used in dental orthodontics as a method of moving teeth. It is common clinical practice to replace the elastic bands at 24 hour intervals as it is known that the bands lose their elasticity and thus effectiveness during this period. The present study has examined the structure of such bands at time intervals after stretching to clinically used extension on a former and immersing the bands in water.
An SEM on a Chip
Authors: Bailey GW , Dimlich RVW , Alexander KB , McCarthy JJ , Pretlow TP , Crewe DA , Feinerman AD 
Published: July 2020

Abstract
A silicon microfabrication technique has been applied toward the development of a Miniature Scanning Electron Microscope (MSEM). The fabrication technology is not only precise but is inexpensive compared to conventional methods of electron microscope construction and is easily extended to the construction of arrays of MSEMs for applications in high throughput e-beam lithography and wafer inspection.
An electrostatic electron lens consists of a series of planar electrodes with central apertures that are precisely aligned to and electrically isolated from one another. This structure is fabricated using silicon as the electrode material and Pyrex optical fibers as the insulators. The electrodes are fabricated on four inch (100) orientation silicon wafers that are patterned on both sides and anisotropically etched to form four orthogonal v-grooves and an open diaphragm with a circular aperture in the center. The apertures are formed by reactive ion etching. The wafers are then diced to create approximately 100 7 mm by 9 mm electrodes.
Surface Sensitivity and Resolution in LVSEM Imaging and Microanalysis
Authors: Boyes Ed 
Published: July 2020

Abstract
The surface sensitivity of both imaging and EDX chemical microanalysis of materials, micro-fabrications and nanostructures can be greatly enhanced by using low beam energies in the SEM (LVSEM). This has become more apparent with the advent of instruments which are relatively uncompromised in performance (&lt;5nm) at a range of low voltages around 1kV, and especially ones with higher resolution (≤2.5nm) and full digital imaging to make a wide range of conditions more readily accessible (1). They yield images of natural surfaces retaining their inherent chemical and electronic image contrasts and with probe sizes comparable to those which we are familar with at high voltages, but where many samples require to be coated with metal. The traditional SEM resolution test samples for evaluating SEM imaging are far from a typical bulk SEM sample. The small heavy metal particles on a carbon support behave more like the STEM situation since the backscattering of electrons from the support, and hence the generation of type 2 secondary electrons, is very limited.
Sampling Depth Controlled by Accelerating Voltage in a Low Voltage SEM
Authors: Yao N , Harrison C , H. Adamson D , Park M , Chaikin P , Register R A 
Published: July 2020

Abstract
A fundamental new pathway to a basic understanding of nanostructured composite thin films has been recently afforded by advances in both high brightness field emission electron source and electron optics in the SEM. The key advantages of controlling the incident electron beam at low energies (&lt; 5 keV) for surface imaging has been largely focused on goals such as the reduction of sample charging and minimization of macroscopic radiation damage. In this paper, we present a new opportunity to obtain sampling depth information by controlling the incident electron beam energy. One of the major factors which determines the contrast seen in SEM images is the interaction of the incident electron beam with the solid. As a result of this interaction, the secondary electron yield is proportional to the stopping power of the electron as described by the Bethe penetration depth,where dE/dl is the stopping power of incident electron with energy Einc and Emin is some suitable lower energy limit for the interaction.
Quantitative Analysis and Interpretation of Atomic Force Microscopy (AFM) Phase Imaging
Authors: Leonard DN , Batchelor AD , Russell PE 
Published: July 2020

Abstract
Gaps in the understanding and interpretation of data collected in various SPM modes are a direct result of the rapidly advancing scanning probe microscopy (SPM) technology. This systematic study is coupling classical metallurgical samples with a new surface variation mapping technique in an effort to further the quantitative comprehension of atomic force microscopy (AFM) phase imaging.
Phase imaging is a technique that has exhibited the ability to provide the microscopist with qualitative information of a material’s microstructure on the nanometer scale. Regions of a microstructure that exhibit incongruous mechanical properties like: friction, elastic modulus, composition, and viscoelasticity are displayed, in the resulting image, as regions of differing contrast. An example of this type of phase contrast is clearly seen in FIG. 1. A quantification of the phase shift will give new insight into the cause of the contrast mechanism, and reason for contrast reversal.
Recent Advances In Magnetic Force Microscopy: Imaging In The Presence Of External Fields
Authors: Gomez Romel D 
Published: July 2020

Abstract
In the last decade since its development, magnetic force microscopy[l] has emerged as a workhorse in imaging magnetic structures at the sub-micron length scales. It possesses the desirable attributes of robustness, straightforward implementation and a fairly well characterized image contrast formation. In recent years, we have successfully implemented MFM in the presence of a highly controlled external magnetic field.[2] Using this technique, it is possible to follow the sample’s magnetic evolution at various points along it’s magnetization curve. Further, by using standard software implementation, the images can be presented as an animation of the micromagnetic process. We applied this technique to study a variety of slow varying dynamics of magnetic systems, including the dc erasure of thin film recording media[3], the mechanisms of moment rotation and reversal, and the domain wall motion nanostructured magnetic elements[4,5].
In this talk, I will review the rudiments of the technique and show the “dynamics” of the magnetization of cobalt and Permalloy alloys interacting with external fields.
Phase Contrast Of Magnetic Cobalt Spheres
Authors: Graef M De , Nuhfer NT , McCartney MR 
Published: July 2020

Abstract
The recent increased interest in Lorentz Microscopy methods is due to two important factors: (1) the advent of digital detection systems (CCD cameras) and advanced computer controlled transmission electron microscopes, and (2) the continually decreasing length scale of magnetic recording media and related magnetic materials. Along with the increased experimental resolution and detection sensitivity one should ask the question: how small a magnetic moment can one detect with conventional Lorentz or electron holography techniques? And, perhaps more importantly, which technique should one use to obtain the best spatial resolution? To address these questions we identified a simple model system :the uniformly magnetized sphere.
The phase of the electron wave after passing through a region with a non-zero magnetic vector potential and an internal electrostatic potential Vscan be computed from the Aharonov-Bohm trajectory integral. For a spherical particle with a uniform magnetization and a constant mean inner potential (see geometry in Fig. la), this phase shift can be analytically computed.
Magnetic Force Microscopy Of Shape Memory Alloys: Identifying Two Magnetic Patterns
Authors: Neves BRA , Andrade MS 
Published: July 2020

Abstract
In this work, we report on the observation of two coexisting patterns in Magnetic Force Microscopy (MFM) images of shape memory alloys. The MFM signal of both patterns presents similar behavior with tip-surface separation. An investigation on the origin of these patterns presents strong evidence that both are of magnetic nature only and, furthermore, can be assigned as bulk and surface-related, respectively.
Shape memory alloys are a class of materials that exhibit martensitic transformation [1]. The shape memory effect, which may be defined as the property of recovering its original shape during a thermal cycle after a material has been apparently deformed in a permanent way, is found in several materials, including the Fe-Mn-Cr-Ni-Si alloy, studied in this work [1]. A standard metalographic process was employed to reveal ferritic-phase islands surrounded by the austenitic-phase matrix, which constitute the structure of this alloy. The images were acquired with a MultiMode microscope from Digital Instruments.
Magnetic Field Calibration Of The Jeol 3000 Feg Electron Microscope: Application To Studies Of Hard Magnets
Authors: Volkov VV , Crew DC , Zhu Y , Lewis LH 
Published: July 2020

Abstract
For quantitative magnetic image analysis it is important that the value of the magnetic field applied to the sample is known. Calibration of the magnetic field inside an electron microscope is not a simple procedure, however, because it requires the use of a special sample holder which contains a Hall probe sensor. We report here on a simple and effective procedure for calibration of the magnetic field at the sample position of the JEOL 3000 FEG transmission electron microscope (equipped with ultra-high resolution pole pieces URP-32F, point resolution of 1.6 Å and tilt angle ±30°) without the use of a special sample holder. The technique is based upon the fact that the magnetic flux present in a magnetized material in a field-free environment, known as the remanence Br, is a sensitive function of the largest applied magnetic field. The inverse of this principle — that the value of an applied field may be determined from measurements of the remanence, — was used to quantify the magnitude of the field present at the sample position.
Infrared Microscopy As A Failure Analysis Tool In The Thermal Inkjet Cartridge Industry
Authors: Tungol Mary Widmark 
Published: July 2020

Abstract
Four major components comprise an inkjet cartridge (Fig.lA): (1) the pen body which contains the ink and positions the cartridge in the printer; (2) an ink delivery system which supplies ink at the correct backpressure and flow rate; (3) a flex circuit which provides the electrical interconnect to the printer; and (4) the printhead which generates and directs the drops. Because of its complexity and small critical dimensions, the printhead poses the greatest analytical challenge for many failure analysis problems. Each printhead may contain as many as 300 firing chambers (Fig. IB). Each chamber consists of a resistor surrounded by a polymer-based barrier material which forms a cavity into which ink flows from the ink delivery system. The chamber is capped by a metal or polymer orifice-containing plate. Printing occurs when the resistor is heated to form an ink vapor bubble which subsequently ejects a droplet of ink though the orifice onto the paper.
In Situ Identification Of Automotive Paint Organic Pigments Using Infrared Microspectroscopy And Spectral Subtractions
Authors: Suzuki Edward M 
Published: July 2020

Abstract
A forensic examination of automobile paint may involve either a comparative analysis of two paint samples or an attempt to identify a recovered paint chip to determine the make, model, and year of the vehicle from which it originated. Along with microscopy, the main tool which most U.S. forensic laboratories use for such analyses is infrared spectroscopy. Paint binders are normally identified by this means together with some inorganic pigments. Until recently, however, there were no published reports describing the identification of organic pigments in the cured paint samples normally analyzed in the forensic laboratory. The main reasons for this stem from the difficulties in isolating these pigments from the inert paint matrices and the insolubilities of the pigments. Using infrared microspectroscopy and spectral subtractions, several organic pigments used in automotive finishes have now been identified in situ based on spectra of intact paint samples.
Infrared spectra were obtained of U.S. automobile original (OEM) finiśhes from the Reference Collection of Automotive Paints.
Characterization By Scanning Electron Microscopy (Sem) And Energy Dispersive X-Ray Spectroscopy (Eds) Of Solid Solution Single Crystals Grown On Earth And In Microgravity
Authors: Cochrane J C , Carpenter P K , Gillies D C 
Published: July 2020

Abstract
The II-VI semiconductor mercury cadmium telluride, composed of 80 mole percent HgTe and 20 mole percent CdTe, has been grown on Earth and aboard two NASA Space Shuttle flights in order to study the solidification of a solid solution semiconductor having a wide separation between liquidus and solidus. Segregation during solidification, high volatility of mercury, and strain fields associated with large temperature gradients make the growth of homogeneous, high-quality, bulk crystals extremely difficult. The traditional growth methods yield crystals with axial and radial compositional variations and secondary precipitates of tellurium, probably caused by gravityinduced, thermosolutally-driven flows just ahead of the growth interface. The purpose of growing these crystals in microgravity is to reduce gravity-induced convection. This should be advantageous for minimizing the density of crystal defects while also minimizing compositional variation transverse to the crystal growth direction.
The ground based experiments consisted of growing crystals in several different configurations of heat pipe furnaces and NASA’s Advanced Automated Directional Solidification Furnace (AADSF).
Effect Of The Substrate Surface Termination On The Structure Of The Bi4Ti3O12 / SrTiO3 Interface
Authors: Jiang J C , Tian W , Theis C D , Schlom D G , Pan X Q 
Published: July 2020

Abstract
Bismuth titanate (Bi4Ti3O12) belongs to a family of layered perovskites (Aurivillius phases) that are important for nonvolatile ferroelectric memory applications. Recently epitaxial (001) Bi4Ti3O12 thin films have been grown on (001) SrTiO3 by reactive molecular beam epitaxy (MBE) in an adsorptioncontrolled growth regime. Bi4Ti3O12 has a monoclinic layered perovskite structure at room temperature which consists of alternating Bi2O2 and Bi4Ti3O10 perovskite layers (see the upper part of Fig. 1(b)). Due to the significant difference in crystal structure between film and substrate, the surface termination of the SrTiO3 substrate and the way in which growth is initiated might be expected to have a significant influence on the interfacial structure. In this work, we present high-resolution transmission electron microscope (HRTEM) studies of the Bi4Ti3O12 / SrTiO3 interfacial structure for Bi4Ti3O12 films grown on SrTiO3 substrates terminated with either the TiO2- or SrO-layers.
Bi4Ti3O12 thin films were grown on SrO- or TiO2-layer terminated homoepitaxial SrTiO3 buffer layers grown on SrTiO3 (001) substrates by reactive MBE.
Atomic Scale Characterization Of Interfaces And Defects In Non-Stoichiometricmulticomponent Oxides
Authors: Stemmer S , Streiffer S K , Sane A , Mazanec T J , Browning N D 
Published: July 2020

Abstract
The ability to obtain chemical information with (near) atomic resolution has recently become possible by a combined approach of Z-contrast imaging with electron energy-loss spectroscopy (EELS) in scanning transmission electron microscopes. This method is particularly interesting for the characterization of structure-property relationships in novel multicomponent oxides, which possess added functionality due to their high nonstoichiometry.
In this paper we demonstrate the capabilities of this method in analyzing the microstructural mechanisms of accommodation of non-stoichiometry, using two example systems: (Ba,Sr)TiO3thin films for DRAM applications, grown by MOCVD with different amounts of excess titanium, and an oxygen-deficient perovskite ceramic, SrCoOx. The experiments were performed in a JEOL JEM 201 OF field emission transmission electron microscope, operating at 200 kV, equipped with an annular dark-field detector, scanning unit and a post-column imaging filter (Gatan GIF 200). This microscope has been demonstrated to achieve probe sizes of under 1.5 Å.
A Stem Study Of A Germanium Island-Silicon Interface
Authors: Vanfleet RR , Basile DP , Kamins TI , Silcox J , Stanley Williams R 
Published: July 2020

Abstract
Growth of germanium or silicon-germanium on silicon 100 surfaces produces pyramid shaped islands after several monolayers of coverage. With further deposition, these islands will continue to grow until they reach a critical volume where a transition to a dome shape occurs. The critical surface coverage for island formation and the critical volume for the pyramid to dome transition depend upon the silicon to germanium ratio or degree of mismatch between the deposited material and the silicon substrate. Strain plays a dominant role in the shape transitions. Annealing studies have shown that the pyramid to dome transition.is reversible and is likely due to strain reduction related to interdiffusion. Annealing results in island growth, a decrease in the number of islands, and interdiffusion of the silicon and germanium. The interdiffusion relieves the strain and shifts the critical volume to a value exceeding the current volume of the dome shaped island thereby driving the transition back to pyramidal shape.
Microstructure Of Tin Ohmic Contacts On N-Gan
Authors: Liu R-J , R. W.Carpenter  , Kim M J 
Published: July 2020

Abstract
GaN is a direct, wide band -gap semiconductor (Eg =3.4 eV) which has a potential application in electronic and optical devices including UV-emitting lasers and bright p-n junction GaN light emitting diodes. In order to attain optimum device performance, it is necessary to develop lowresistance, thermally stable and uniform ohmic contacts.
In this study, the TiN/GaN contact synthesis and examination of contact performance were conducted at North Carolina State University. Si-doped n-GaN films were grown on 6H-SiC substrates via MOVPE with an A1N buffer layer. The TiN films were deposited in an ion-beam assisted, UHV electron-beam evaporation system. TiN growth was performed at a substrate temperature of 350 °C and a nitrogen pressure of about 2×10-4 torr. The deposition rate was 1- 1.5 nm/min. The TiN contacts deposited on (0001) n-GaN were ohmic with high resistivity in the as-deposited condition, but the resistivity decreased sharply in response to annealing. The TiN/GaN interface was examined by transmission electron microscopy to provide correlations between changes in microstructure and electrical behavior.
In Situ Uhv-Tem Oxidation And Reduction Of Metals
Authors: Yang J C , Yeadon M , Kolasa B , Gibson J M 
Published: July 2020

Abstract
In this proceedings, we present a review of our experimental results of our investigations of the mechanisms of the initial stages of copper oxidation. We examined the initial stages of Cu(001) oxidation and reduction by in situ ultra-high vacuum (UHV) transmission, electron microscopy (TEM). We observed surface reconstruction and nucleation and growth of copper oxide islands. We have examined the oxidation processes from oxygen partial pressures of 10-5 torr to atmospheric pressures and temperatures from 25°C to 600°C, in order to gain fundamental insights into this important gas-metal reaction.
Fundamental knowledge of gas-metal reactions, in particular oxidation, is important for a wide variety of materials science fields, such as dry corrosion, catalysis, as well as some thin film growth, such as ferroelectrics. However, there is a wide gap between information provided by surface science methods and that provided by bulk oxidation studies. The former have mostly examined the adsorption of up to ˜1ML of oxygen on the metal surface.
Quantification Of Segregation Levels Using Xeds In The Stem
Authors: Keast V J , Williams D B 
Published: July 2020

Abstract
The quantification of grain boundary segregation levels, as measured with X-ray energy dispersive spectroscopy (XEDS) in a scanning transmission electron microscope (STEM), is dependent on the size and shape of the interaction volume. The segregation level T (in atoms/nm2) is related to the intensities of the characteristic peaks in the X-ray spectrum, Is and Im, by

where ρ is the density of the matrix in atoms/nm3, Am and As are the atomic masses of the matrix and segregant respectively and ksm is the usual k-factor. The geometric factor, V/A, is the ratio of the volume of interaction to the area of the grain boundary inside in the interaction volume. Different models have been used to describe the interaction volume and these are illustrated in Fig. 1 and the appropriate expression for V/A is given in each case. In the simplest case, beam broadening is neglected and the interaction volume can be described as a cylinder with diameter equal to the probe size, d.