bluuebunny/crossref_metadata_2025_split huggingface dataset:
Poly Undercut Induced Device Asymmetric Failure
Authors: Wang Wen Hui , Lin Mei Chuang , Huang Shiuan Wen 
Published: December 2020

Abstract
Device asymmetric current is a common soft failure type in real nano-probing cases. Generally speaking, it is not easy to find out the root cause. LDD shadowing, Poly depletion are well known failure mechanisms causing asymmetric current due to an equivalent high resistance at defect location. Based on the defect serious condition, even some hard defect like channel AA pitting will show the similar I-V feature with previous 2 soft fail cases. This paper will introduce another type of asymmetric current feature – poly bottom undercut which I-V curve still keeps ideal linear and saturation area, but the asymmetric current difference is obvious.
Pulse Laser Ablation Techniques for IC Package Substrate Modifications and Validation
Authors: Mulholland Matthew M. , Helmy Ahmed A. , Dao Anthony V. 
Published: December 2020

Abstract
Post silicon validation techniques specifically Focused Ion Beam (FIB) circuit editing and Failure Analysis (FA) require sample preparation on Integrated Circuits (IC). Although these preparation techniques are typically done globally across the encapsulated and silicon packaging materials, in some scenarios with tight mechanical or thermal boundary conditions, only a local approach can be attempted for the analysis. This local approach to access the underlying features, such as circuits, solder bumps, and electrical traces can be divided into two modification approaches. The back side approach is typically done for die level analysis by de-processing through encapsulated mold compound and silicon gaining access to the silicon transistor level. On the other hand, the front side approach is typically used for package level analysis by de-processing the ball grid array (BGA) and package substrate layers. Both of these local de-processing approaches can be done by using the conventional Laser Chemical Etching (LCE) platforms. The focus of this paper will be to investigate a front side modification approach to provide substrate material removal solutions. Process details and techniques will be discussed to gain access to metal signals for further failure analysis and debug. A pulse laser will be used at various processing stages to de-process IC package substrate materials.
Locating Gate Oxide Failures Using KOH
Authors: Sarnecki Lori L. 
Published: December 2020

Abstract
This paper presents two new methods using potassium hydroxide (KOH) as a wet etch technique to successfully stop on gate oxide and find the submicron gate oxide failures that correspond to failure response sites. Applications of this new technique to submicron gate oxide failures on both planar and deep trench MOSFET devices are reported in this paper.
Analysis Approach on Copper Solderable Front Side Discoloration Issue
Authors: Sing Lim Saw , Ping Lim Siew 
Published: December 2020

Abstract
This paper outlines the physical analysis approach to investigate droplet-like copper discoloration defects. These defects are proven to be caused by differences in copper oxidation based on quantification results of the CuO and Cu2O chemical states using X-ray photoelectron spectroscopy (XPS) analysis.
Enhanced Static Fault Localization Methodology on Resistive Open Defects Using Photon Emission Microscopy and Layout Defect Prediction
Authors: Quah A.C.T. , Nagalingam D. , Ang G.B. , Chen C.Q. , Ma H.H. , Susanto E. , Moon S. , Neo S.P. , Lam J.C. , Mai Z.H. 
Published: December 2020

Abstract
In this paper, the effects of an open defect resulting in floating gate on combinational logic gate structures are studied. From this study, a novel method is derived to predict and narrow down the potential open defect location from a long failure path that is driving multiple branches of input nodes, into a much smaller segment without EBAC analysis. This method is applied with great success to localize open defects on actual low yield cases from advanced technology nodes with significant reduction in FA cycle time.
A Database for Counterfeit Electronics and Automatic Defect Detection Based on Image Processing and Machine Learning
Authors: Asadizanjani Navid , Gattigowda Sachin , Tehranipoor Mark , Forte Domenic , Dunn Nathan 
Published: December 2020

Abstract
Counterfeiting is an increasing concern for businesses and governments as greater numbers of counterfeit integrated circuits (IC) infiltrate the global market. There is an ongoing effort in experimental and national labs inside the United States to detect and prevent such counterfeits in the most efficient time period. However, there is still a missing piece to automatically detect and properly keep record of detected counterfeit ICs. Here, we introduce a web application database that allows users to share previous examples of counterfeits through an online database and to obtain statistics regarding the prevalence of known defects. We also investigate automated techniques based on image processing and machine learning to detect different physical defects and to determine whether or not an IC is counterfeit.
Impact of Carbon on Threshold Voltage Shift in MOSFET Studied by 3D Atom Probe Tomography
Authors: Kim Ju-Heon , Ok Euna , Sim Hyunmi , Na Dongkeun , Song Ho Seok , kim Dae Hyun , Cho Yong-Beom , Won Seok-Jun , Park Tae-Soo 
Published: December 2020

Abstract
In this paper, impact of carbon on threshold voltage in MOSFET-based device is studied by 3D-atom probe tomography (APT). Carbon is one of most difficult contaminants incorporated from fab-environment to be detected by typical analytical techniques such as TEM-EDS or SIMS. Here, we successfully demonstrated the detection of carbon segregated at gate oxide/Si substrate interface using 3D-APT with single-atom sensitivity and sub-nanometer spatial resolution. It was found that the carbon contaminants have significant effect on the threshold voltage shift (ΔVth), in which ΔVth increases slightly with increasing carbon concentration. The deterioration of device performance is explained by means of which the positively ionized carbons at the interface acting as additional positive charges affecting the inversion to n-channel.
Transmission Electron Microscopy Nano Beam Diffraction Sensitivity Study in Focused Ion Beam Prepared Semiconductor Test Structures
Authors: Demarest James 
Published: December 2020

Abstract
In this paper, a sample was made on an advanced technology node finFET test structure and analyzed in a 200kV TEM equipped with a 4k camera and commercially available strain analysis software using a sub 5nm parallel probe. It was observed that doubling the step size of the data acquisition from 5nm per step to 2.5nm per step with a 4k image resolution changed the sensitivity of the data by about 4%. However, increasing the number of pixels of each diffraction pattern from 2k to 4k and removing the focused ion beam prepared sample surface damage both showed greater than 10% improvements in nano beam electron diffraction (NBD) sensitivity greater than 10%. As a result, it is possible to obtain greater sensitivity of the NBD technique by employing these changes in response to the evolving characterization needs.
Practical Dynamic Laser Stimulation Techniques for Complex Analog and Mixed Signal IC Failure Analysis
Authors: Javier Jeffrey , Hurdle Taylor , Fernandez Sammie , Van Vliet Kari 
Published: December 2020

Abstract
The increasing electrical design and physical complexity of semiconductor devices, especially in the analog and mixed signal (AMS) applications, directly influences the development and evolution of fault isolation techniques. One of these techniques is Dynamic Laser Stimulation (DLS) which is widely used in the industry for effective identification of subtle failure mechanisms and soft defects especially for AC signal-related failures [1, 2]. However, for analysis of some complex AMS IC failure modes, the tool’s standard setup may not always be compatible with the biasing requirements of the device. For example, the setup would typically require expensive and intricate test systems (i.e. Automatic test equipment (ATE), SCAN tester, etc.) to be interfaced with the DLS tool for the analysis to be feasible and successful [3, 4]. This paper presents simple and practical techniques to implement DLS without the need for an expensive test support system. These techniques were applied in three different FA cases involving AMS ICs with complex and temperature-dependent failure modes. The results of subsequent analysis indicated success in isolating the exact defect sites.
Challenges in Failure Analysis of 3D Bonded Wafers
Authors: Pichumani Pradip Sairam , Atanasova Tanya , Baumann Frieder , Hatzistergos Michael , Mody Jay , Molis Steven , Pozder Scott , Madan Anita 
Published: December 2020

Abstract
This paper discusses the Failure Analysis methodology used to characterize 3D bonded wafers during the different stages of optimization of the bonding process. A combination of different state-of-the-art techniques were employed to characterize the 3D patterned and unpatterned bonded wafers. These include Confocal Scanning Acoustic Microscopy (CSAM) to determine the existence of voids, Atomic Force Microscopy (AFM) to determine the roughness of the films on the wafers, and the Double Cantilever Beam Test to determine the interfacial strength. Focused Ion Beam (FIB) was used to determine the alignment offset in the patterns. The interface was characterized by Auger Spectroscopy and the precession electron nanobeam diffraction analysis to understand the Cu grain boundary formation.
Correlation of Thermal Rise Time to Sample Depth in Multi-Die Stacked Devices
Authors: Shi M. , Street A.G. , Dai Y.F. 
Published: December 2020

Abstract
Dynamic Digital Modulation, an adaptation of Lock-In Thermography, has been shown to be a useful technique to establish the relative Z-depth of thermal sources in integrated circuits. In order to determine the specific depth of a thermal source it is necessary to correlate known depths to measured thermal rise time. In this work, multi-die stacked memory devices are used as calibration sources to correlate a thermal source at individual die to the measured thermal rise time.
Creative Approach Using Lock-in Thermography in Fault Localization of ASIC Devices
Authors: Sabate Andrew , Estores Rommel 
Published: December 2020

Abstract
The advent of lock-in thermal imaging application on semiconductor failure analysis added capability to localize failures through thermal activity (emission) of the die. When coupled with creative electrical set-up and material preparations, lock-in thermography (LIT) [1, 2] application gives more possibility in exploring the failure of the device using low power settings. This gives higher probability of preserving the defect which leads to a more conclusive root cause determination.
Novel Approach of Improving Secondary Electron Detector in FIB System
Authors: Wang Steve , McGinn Jim , Tvarozek Peter , Weiss Amir 
Published: December 2020

Abstract
Secondary electron detector (SED) plays a vital role in a focused ion beam (FIB) system. A successful circuit edit requires a good effective detector. Novel approach is presented in this paper to improve the performance of such a detector, making circuit altering for the most advanced integrated circuit (IC) possible.
Plan View Specimen Preparation Via Vacuum Assisted Ex Situ Lift Out
Authors: Lowery Lisa Marie , Lu Ping , Kotula Paul G. , Michael Joseph R. , Giannuzzi Lucille A. 
Published: December 2020

Abstract
Vacuum assisted ex situ lift out may be used for fast, easy, and reproducible plan view specimen preparation. Manipulation of samples via beveled hollow glass probes whose plane of interest is parallel to slotted grids allow for conventional FIB milling for S/TEM analysis.
Nanopyramid: An Optical Scrambler Against Backside Probing Attacks
Authors: Shen Haoting , Asadizanjani Navid , Tehranipoor Mark , Forte Domenic 
Published: December 2020

Abstract
Optical probing from the backside of an integrated circuit (IC) is a powerful failure analysis technique but raises serious security concerns when in the hands of attackers. For instance, attacks using laser voltage probing (LVP) allow direct reading of sensitive information being stored and/or processed in the IC. Although a few sensor-based countermeasures against backside optical probing attacks have been proposed, the overheads (fabrication cost and/or area) are considerable. In this paper, we introduce nanopyramid structures that mitigate optical probing attacks by scrambling the measurements reflected by a laser pulse. Nanopyramid structure is applied to selected areas inside an IC that requires protection against optical probing attacks. The fabrication of nanopyramids is CMOS compatible and well established for photovoltaic applications. We design the nanopyramid structure in ICs, develop the LVP attacking model, and perform optical simulations to analyze the impact of nanopyramids on LVP. According to the simulation results, the nanopyramid can disturb the optical measurements enough to make LVP attacks practically infeasible. In addition, our nanopyramid countermeasure has no area overheads and works in a passive mode without consuming any energy.
Uniform Mechanical Deprocessing of Stacked Memory Modules
Authors: Liechty Gary , Richardson Chris 
Published: December 2020

Abstract
With the introduction of CNC-based milling systems, it became possible to more uniformly deconstruct silicon devices for through-silicon electrical fault isolation techniques that feature either a convex or concave geometry or by thermally relaxing the device. This paper presents a novel methodology for uniform mechanical deprocessing of stacked memory modules using a CNC milling system. The PCB (FR4) substrate has been identified as the primary mechanism influencing both the profile of the device and relaxation that occurs during device deconstruction. Examples showing this effect are provided on both pre- and post-processed devices where a difference in symmetry can be observed. Utilizing this new strategy, it is possible to restore a more symmetrical profile that is easier to process with a CNC milling machine.
Variable Angle TEM Grid Holder for Advanced TEM Lamellae Preparation
Authors: Hrnčíř Tomáš , Šikula Marek , Doleže Pavel , Savoia Claudio A. G. 
Published: December 2020

Abstract
Multipurpose sample holder for advanced Transmission Electron Microscopy (TEM) sample preparation which reduces cost of the tool and most importantly simplifies the workflow is introduced. Following the current demand for user-friendly interface, semi-automated approach is aimed to be build up. Abilities to prepare advanced TEM lamellae in various geometries without rotary nanomanipulator and using various end-point detection signals are perceived as biggest advantages of this design.
Penerapan Model Pembelajaran Problem Based Learning untuk Meningkatkan Motivasi dan Hasil Belajar Biologi Siswa
Authors: Setiyadi Muhammad Wahyu 
Published: December 2020

Abstract: this research aims to improve motivation and student learning outcomes in applying Problem Based Learning model. This research is a classroom action research conducted in twi cycle.the subjects of the research was the X-Mia 2 MAN 1 Bima in the academic year of 2018/2019. The research data obtained through observation and test. The result showed an increased by 7,95%, from 73,73 inthe first cycle and 81,78 in the second cycle. Learning outcomes classiical completeness increaseby 64,29% of classical completeness 17,86% in the first cycle and 82,29% in the second cycle. This result indicate problem based learning model can improve motivation and studen learning outcomes. Abstrak: penelitian ini bertujuan ituk meningkatkan motivasi dan hasil belajar biologi siswa dengan menggunakan model pembelajaran Problem Based Learning. Penelitian ini merupakan penelitian tindakan kelas (PTK) yang dilaksanakan dalam dua siklus. Subyek penelitian dalam penelitian ini adalah siswa kelas X-Mia 2 MAN 1 Bima tahun ajaran 2018/2019 data diperoleh melaui observasi dan tes. Hasil penelitian ini terjadi pengkatan motivasi belajar yaitu sebesar 7,95% dari 73,83% pada siklus I menjadi 81,78% pada siklus II. Hasil belajar ketuntasan klasikal meningkat sebesar 64,29% dimana pada siklus i ketintasan klasikan hanya sebesar 17,86% sedangkan pada siklus 2 terjadi peningkatan yaitu 82,29%. Hasil ini menunjukkan bahwa model pembelajatan problem based learning dapat meningkatkan motivasi dan hasil belajar biologi siswa
Influence of submaximal isometric contractions of the hamstrings on electromyography activity and force while functioning as hip extensors
Authors: Oh Dasom , Lim Wootaek 
Published: December 2020

BACKGROUND: Although the medial and lateral hamstrings are clearly distinct anatomically and have different functions in the transverse plane, they are often considered as one muscle during rehabilitation. OBJECTIVE: The purpose of the study was to compare the electromyographic (EMG) activity between the prone position and the supine position during maximal isometric contraction and to additionally confirm the effect of submaximal isometric contractions on EMG activity of medial and lateral hamstrings, and force. METHODS: In the prone position, EMG activities of the long head of biceps femoris (BFLH) and semitendinosus (ST) were measured during the maximal isometric contraction. In the supine position, hip extension force with EMG activity were measured during the maximal and the submaximal isometric contractions. RESULTS: EMG activity in the prone position was significantly decreased in the supine position. In the supine position, there was a significant difference between the BFLH and ST during the maximal isometric contraction, but not during the submaximal isometric contractions. CONCLUSIONS: The dependence on the hamstrings could be relatively lower during hip extensions. When the medial and lateral hamstrings are considered separately, the lateral hamstrings may show a more active response, with increased muscle length, in clinical practice.
LEGALIZAÇÃO DE DROGAS
Authors: Almeida Galvão Cauê 
Published: December 2020

Esse artigo propõe um debate sobre os direitos humanos ao compreender o processo de legalização e regulamentação das drogas como uma atitude socialmente responsável dentro de uma necessidade histórico-estrutural de remodelar os processos de entendimento sobre as relações com as drogas, vinculadas diretamente à pobreza, à negritude e à violência. Objetiva ampliar o crescente debate sobre questões antiproibicionistas e compreender o processo de descriminalização dos sujeitos via política antiproibicionista. Trata-se de um excerto de estudo descritivo e qualitativo, com abordagem analítica, à luz da Análise Crítica do Discurso (ACD) direcionada ao proibicionismo de drogas na América Latina. Urge, nessa perspectiva, além de legalizar e regulamentar as drogas consideradas ilegais, que se constitua uma campanha massiva de educação de direitos humanos em diversas esferas sobre as drogas, bem como mudanças na formação educacional dos agentes policiais, estimulando abordagens equalitárias de pessoas, independente do status social, etnia ou condição de moradia. Observou-se que a política antidrogas não tem a droga como seu principal interesse de combate, e sim as populações pobres e não-brancas. Deste modo, a luta contra o preconceito social e racial são essenciais no processo de reconstrução e recodificação da nossa história, nossas culturas e nossas cosmovisões.
Zoocentrismo didático: Análise quantitativa de gravuras em livros didáticos brasileiros de Biologia do Ensino Médio
Authors: De Azevedo Hugo José Coelho Corrêa , De Melo Eric Vinaud , Sá Natália de Paula , Ferreira Cristiane Pereira , De Meirelles Rosane Moreira Silva 
Published: December 2020

O zoocentrismo se tornou uma forte corrente filosófica e ideológica nos séculos XX e XXI, denotando questões acerca do bem-estar animal e políticas sobre os mesmos. Contudo, o zoocentrismo didático se caracteriza por uma predileção e massificação das representações animais no ensino, negligenciando as demais formas de vida e seus componentes abióticos. Sendo os dados, até o momento, inferidos por pesquisas estadunidenses, esta pesquisa objetivou realizar um levantamento quantitativo das imagens com representações animais em todas as coleções dos livros aprovados pelo Programa Nacional do Livro Didático no triênio de 2018-2020 para o ensino médio regular. Os dados coletados apresentaram um espectro percentual entre 44% e 59% de figuração animal nas coleções utilizadas neste estudo, sugerind demasia acerca destas representações. Além disso, 7 das 10 coleções mostraram uma taxa acima de 50%, sugerindo uma tendência zoocêntrica nos livros didáticos brasileiros. Conclui-se assim, que o Ensino em Biociências brasileiro no que tange aos livros didáticos para o Ensino Médio, estão inseridos em uma possível tendência e contexto zoocêntrico dado o alto percentual de figuração animal presente, podendo ser nocivo para a construção de uma visão holística e crítica acerca da biodiversidade nacional dos demais seres vivos e compreensão dos mesmos enquanto pertencentes à biosfera.
Isolation and molecular identification of Lumpy Skin Disease (LSD) virus from infected cattle in Bangladesh
Authors: Giasuddin M , Yousuf MA , Hasan M , Rahman MH , Hassan MZ , Ali MZ 
Published: December 2020

Lumpy Skin Disease (LSD) is a new disease of cattle in Bangladesh. It is endemic in Africa but through the last few years disease beings to spread to other countries of the world. The disease was widely spreaded in the many other countries in Asia and some parts of Europe. In Bangladesh, the disease was first time detected in April 2019, in southern part and then continued to spread all over the country.The disease caused enormous economic losses causing cutaneous and internal lesions, affecting milk production, hide quality and in some cases death of infected animal. LSD suspected samples were collected from different areas of the country during the period from July 2019 to January 2020. In this study, a total of 36 clinically suspected LSD samples of skin crustnodules, pus and ocular discharge were collected. Samples were examined by the published PCR protocol for LSD virus, GPV and SPV. Around 78% samples were found positive for LSD virus in PCR test. LSD virus was also identified from pus and ocular discharge of infected cattle. The virus can grow in the lamb testicular cell and clinically the disease is characterized by distinctive nodular lesions mostly on the skin of the affected animals.The results indicated that the LSD virus is circulating in the outbreak are as and is an emerging transboundary cattle disease in Bangladesh.
Bang. J. Livs. Res. Vol. 26 (1&2), 2019: P. 15-20