bluuebunny/crossref_metadata_2025_split huggingface dataset:
Atomic Force Probe Kelvin Measurements of Large MOSFET Devices at Contact Level for Accurate Device Threshold Characteristics
Authors: Kane Terence , Tenney Michael P. , Erickson Andrew , Phan Sebastien 
Published: December 2020

Abstract
To reconstruct discrete device threshold characteristics at tungsten contact level with atomic force probe (AFP), specific care in making drive current measurements is essential. Kelvin probing as well as the proper placement of the AFP probes themselves is an absolute requirement for insuring precise measurements. For this paper, NFET and PFET test structures employing 3 micrometer gate widths are used to simulate a sense-amp device. The results obtained using normal pad-level probing on a conventional probe station with results from an AFP nanoprober with and without Kelvin sensing are compared. These measurements are also compared with the nominal or expected design rule values. Experimental results comparing AFP Kelvin measurements at contact level on the same MOSFET test structure versus measurement obtained conventionally at pad level underscores the importance and value of AFP Kelvin measurements.
Bevel Etching: A Low Cost Alternative to FIB
Authors: Seidl B. , Walter J. , Kirchberger M. 
Published: December 2020

Abstract
Microstructural diagnostic for electronic packaging development and failure analysis under industrial manufacturing conditions require fast but reliable preparation routines. The aim of the presented poster is to introduce a time and cost efficient preparation technique for FESEM (field emission scanning electron microscope) investigations with focus on typical issues in electronic packaging development and failure analysis. The new ion beam based technique acts as a low cost alternative to FIB, able to prepare much wider section areas, combined in a tool, which can also be used for standard ion beam polishing processes.
Fail Mechanisms Causing Single Bit Flash Data Gain in Flash Memory
Authors: Medikonduri Rajesh 
Published: December 2020

Abstract
Flash memory is one of the most mysterious and difficult structures in the semiconductor industry. Excessive data gain and data loss may cause errors in reading the flash memory. This paper discusses the data gain mechanism and the various failure mechanisms (i.e., CoSi at Mux, CoSi at bit, particle at Mux, resistive contact, erasing defect at failing bit, programming fail at bit, misaligned contact, passive voltage contrast (PVC) at multiple gates in Mux region, particle and missing via, poly residue defect etc.) causing single bit flash data gain. Presented in the paper are the definitions involved, Flash cell theory and physics involved, and the theory explaining why leakage in the 8:1 mux causes the single bit flash data gain. This is followed by a case study involving various failure mechanisms and a final conclusion. Knowing the fail mechanisms and correcting them promptly enhances the yield.
A Comprehensive Analysis Methodology for Gate Oxide Integrity Failure Using Combined FA Techniques
Authors: Younan Hua , Rao Nistala Ramesh , Shuting Chen , Lei Zhu , Ning Chia Chin , Jianming Zhang , Yanhua Huang , Ping Neo Soh 
Published: December 2020

Abstract
In this paper, a comprehensive analysis methodology for gate oxide integrity (GOI) failure using combined FA techniques is proposed. The current method integrates the failure analysis flow we previously reported with a new flow proposed in this paper. The method is applicable to a wide range of GOI failure cases and has been used in analyzing many product wafers with GOI failure. In particular, there is one wafer with GOI failure that results from known failed process machines. This wafer could be readily analyzed with this new method to identify the root causes. The newly proposed flow is based on our previous report on GOI failure analysis, but the detection limit of contamination elements was significantly improved. The enhancement of detection limit is mainly attributable to the utilization of Vapor Phase Decomposition and Inductively Coupled Plasma Mass Spectrometry (VPD ICP-MS). The ICP-MS technique is highly sensitive and capable of simultaneously measuring a large number of elements at very low concentration level in the range of ppb (part per billion) to ppt (part to trillion). This enhanced sensitivity enables effective investigation of contamination caused by specific machines. A case study of GOI failure investigated by the proposed new method will be discussed in detail. In the study, Al, Fe, Mo and Sn contamination from a suspected tool were detected by ICPMS, followed by confirmation by Secondary Ion Mass Spectrometry (SIMS) on the affected product wafers. Failurepart isolation investigations of the affected diffusion furnace revealed that the root cause of the failure is due to a defective gas flow valve.
Systematic Approach for the Gate Oxide Failure Caused by Arsenic Cross Contamination
Authors: Zhu Lei , Ng Huipeng , Huang Yanhua , Teo Hanwei , Ong Kenny , Chen Shuting , Chen Changqing , Ang Ghimboon , Hua Younan , Li Zheng 
Published: December 2020

Abstract
This paper described a gate oxide failure case which affected the electrical parameters such as Vt and Idsat of both HV N&P MOS. A systematic problem solving approach combined with several FA techniques was applied to find the root-cause to be arsenic outgas cross-contamination.
Dynamic Impact Package Characterization
Authors: Klein Jake E. , Madsen Ronald R. 
Published: December 2020

Abstract
In semiconductor packaging, cracked die can result from any mechanical contact with the package during the manufacturing operation including final customer assembly. Depending on the extent of the damage to the device, even a subtle crack on the silicon die can diminish the operability, reliability or specifications of a semiconductor component. Historically, customer returns for cracked die have resulted in intense customer dissatisfaction and high penalties for semiconductor suppliers affecting both the automotive and commercial sectors. Over the years, attempts to model the effects of package impact have been unsuccessful due to the extreme complexity of internal package structures and die geometry. For example, “Probe Drop” studies have generated die cracks, but the technique does not accurately simulate the dynamic forces encountered in semiconductor manufacturing nor does it provide a measure of impact force. Other techniques such as Ball-on-Ring (BOR) and 3-Point-Bend testing are used for silicon strength evaluations. Additionally, a major misconception in the industry is that package damage is a good indicator of internal die damage. With the advent of a proper impacting device and use of a commercial load cell and high speed data converter, the concept of dynamic impact package characterization has conclusively proven to be a reliable technique to accurately measure the actual dynamic impact forces imposed to a packaged semiconductor device during manufacturing and customer assembly. The resulting characterization allows for better understanding of the package susceptibility towards failure as devices shrink in size or when assembly materials or techniques change.
3D Magnetic Field Imaging for Non-Destructive Fault Isolation
Authors: Orozco A. , Gaudestad J. , Gagliolo N.E. , Rowlett C. , Wong E. , Jeffers A. , Cheng B. , Wellstood F.C. , Cawthorne A.B. , Infante F. 
Published: December 2020

Abstract
While transistor gate lengths may continue to shrink for some time, the semiconductor industry faces increasing difficulties to satisfy Moore’s Law. One solution to satisfying Moore’s Law in the future is to stack transistors in a 3-dimensional (3D) formation. In addition, the need for expanding functionality, real-estate management and faster connections has pushed the industry to develop complex 3D package technology which includes System-in-Package (SiP), wafer-level packaging, through-silicon-vias (TSV), stacked-die and flex packages. These stacks of microchips, metal layers and transistors have caused major challenges for existing Fault Isolation (FI) techniques. We describe in this paper innovations in Magnetic Field Imaging for FI which have the potential to allow 3D characterization of currents for non-destructive fault isolation at every chip level in a 3D stack.
Sample Preparation for High Numerical Aperture Solid Immersion Lens Laser Imaging
Authors: Wei M.S. , Chong H.B. , Lim S.H. , Richardson C. 
Published: December 2020

Abstract
High resolution laser imaging, using high numerical aperture (NA) solid immersion lens (SIL) for backside fault isolation imposes stringent sample preparation requirements; as a result of the short focal length of SIL, a die must be thinned to a targeted thickness with less than a ±5 μm silicon thickness variation across the entire die. Flip chip packaged dice suffer from warpage due to various package sizes and substrate thicknesses. Such broad spectrums of part geometries pose a great challenge to meet such silicon planarity requirements. As relaxation of the packaged silicon during polishing causes the warpage profile to change dynamically and unpredictably throughout the thinning process, it has become an added challenge to meet the stringent sample preparation requirements. To overcome the stochastic nature of this problem, a two-step polishing recipe consisting of computer numerical control (CNC) mechanical milling and polishing processes has been developed to achieve sufficient silicon thickness uniformity to enable SIL imaging across an entire silicon chip as large as approximately 20 mm x 15 mm.
A Combination Continuous Wave and Pulse Laser Assisted Chemical Etching Processes through Encapsulated IC Packaging
Authors: Mulholland Matthew M. , Silverman Scott 
Published: December 2020

Abstract
Post silicon validation techniques specifically Focused Ion Beam (FIB) circuit editing and Failure Analysis (FA) require backside sample preparation on Integrated Circuits (IC). Although these preparation techniques are typically done globally across the encapsulated and silicon packaging materials, in some scenarios with tight boundary conditions, only a local approach can be attempted for the analysis. This local approach to access the underlying features, such as circuits, solder bumps, and electrical traces will typically use conventional Laser Chemical Etching (LCE) platforms. The focus of this analysis will be to investigate and conjoin previously published techniques to this local preparation by using a combination of laser sources. A Continuous Wave (CW) and Pulse laser will be used at various processing stages to de-process IC packaging materials silicon and mold compound encapsulation.
Fault Isolation and TEM Study in State-of-Art Thin-Film Transistors
Authors: Zhou Yongkai , Lee Shik Lin , Fu Chao , Hua Younan , Li Xiaomin 
Published: December 2020

Abstract
In this work, we discussed the fault isolation method for the Thin-Film Transistor (TFT). Many defects in the TFT can be directly observed by optical microscope; however, some defects are not visible in either optical microscope or SEM making the fault isolation effort very challenging. We demonstrated that OBIRCH can be used to find defect locations in TFT failures for leakage and shorts. The TFT is so fragile that the laser power and biasing voltage have to be very carefully controlled to avoid damaging the TFT. After identifying the defect location by OBIRCH hot spot detection, the defect was successfully captured with TEM analysis.
Nanoprobing Applications with Capacitance-Voltage and Pulsed Current-Voltage Measurements for Device Failure Analysis
Authors: Lai LiLung , Li Nan , Zhang Qi , Bao Tim , Newton Robert 
Published: December 2020

Abstract
Owing to the advancing progress of electrical measurements using SEM (Scanning Electron Microscope) or AFM (Atomic Force Microscope) based nanoprober systems on nanoscale devices in the modern semiconductor laboratory, we already have the capability to apply DC sweep for quasi-static I-V (Current-Voltage), high speed pulsing waveform for the dynamic I-V, and AC imposed for C-V (Capacitance-Voltage) analysis to the MOS devices. The available frequency is up to 100MHz at the current techniques. The specification of pulsed falling/rising time is around 10-1ns and the measurable capacitance can be available down to 50aF, for the nano-dimension down to 14nm. The mechanisms of dynamic applications are somewhat deeper than quasi-static current-voltage analysis. Regarding the operation, it is complicated for pulsing function but much easy for C-V. The effective FA (Failure Analysis) applications include the detection of resistive gate and analysis for abnormal channel doping issue.
FIB Enhancement of Mechanically Polished Cross-sections
Authors: Holdford Becky 
Published: December 2020

Abstract
On mechanically polished cross-sections, getting a surface adequate for high-resolution imaging is sometimes beyond the analyst’s ability, due to material smearing, chipping, polishing media chemical attack, etc.. A method has been developed to enable the focused ion beam (FIB) to re-face the section block and achieve a surface that can be imaged at high resolution in the scanning electron microscope (SEM).
ANALISA SENYAWA BIOAKTIF ANTIOKSIDAN DAN ZAT GIZI TERHADAP BUAH TERUNG POKAK (Solanum torvum) SEBAGAI BAHAN PANGAN FUNGSIONAL
Authors: Helilusiatiningsih Nunuk , Soenyoto Edy Soenyoto 
Published: December 2020

Solanum torvum has potential as a functional food ingredient because it contains bioactive antioxidant compounds which are quite high and are proven as herbal medicines in China and are a popular food in Florida, Alabama, West India, Malaysia, Thailand, Mexico, Central America, South America, Brazil. The study aims to analyze the components of bioactive antioxidant compounds and nutrients in qualitative and quantitative methods and functional groups in fresh Solanum torvum. The research method used phytochemical screening, quantitative tests, chemical identification with LCMS, FTIR, AAS. The results of phytochemical screening studies, the Solanum torvum contains few alkaloids, while it contains a great number of saponins, steroids, glycosides. The quantitative test showed that the fruit contains 36.31 mg /g phenol, 0.62 mg/g tannin content, 2.76 mg/g flavonoid content and antioxidant activity (% DPPH inhibition) of 84.55%, 82.77% water content, 1.63% ash content, 2.73% fat content, 9.78% protein, 3.69% carbohydrates, 3.77% vitamin C, 0.97% phosphorus, 0.13% potassium, Ca 36.64 ppm, Mg 79.1 ppm, Fe 2.34 ppm. Chemical tests with LCMS contain 13 types of components namely (1) chlorogenic acid, (2) 4-O-caffeoylquinic, (3) 3-O-caffeoylquinic, (4) 4-O-caffeoylquinic, (5) 3-O-feruloylquinic acid, (6) 5-O-feruloylquinic acid, (7) 3-O-dicaffeoylquinic acid, (8) 4-O-dicaffeoylquinic acid, (9) 3-5-O-dicaffeoylquinic acid, (10) 3-O -feruloylquinic acid, (11) 5-O-feruloquinic acid, (12) putative dicaffeoylquiniacid, (13) putativedicaffeoylquinic acid. The functional groups of Solanum torvum have seven types namely phenol (OH), Alkane (C-H), Alkene (C = C), aromatic ring, Nitro (NO2), Amine and Amide (C-N), Alcohol (C-O). Thus, fresh Solanum torvum contains potential antioxidant compounds and nutrients that function for health and functional food.
GPs’ use of gut feelings when assessing cancer risk: a qualitative study in UK primary care
Authors: Smith Claire Friedemann , Kristensen Benedikte Møller , Andersen Rikke Sand , Hobbs FD Richard , Ziebland Sue , Nicholson Brian D 
Published: December 2020

BackgroundThe use of gut feelings to guide clinical decision making in primary care has been frequently described but is not considered a legitimate reason for cancer referral.AimTo explore the role that gut feeling plays in clinical decision making in primary care.Design and settingQualitative interview study with 19 GPs in Oxfordshire, UK.MethodGPs who had referred patients to a cancer pathway based on a gut feeling as a referral criterion were invited to participate. Interviews were conducted between November 2019 and January 2020, and transcripts were analysed using the one sheet of paper method.ResultsGut feeling was seen as an essential part of decision making that facilitated appropriate and timely care. GPs distanced their gut feelings from descriptions that could be seen as unscientific, describing successful use as reliant on experience and clinical knowledge. This was especially true for patients who fell within a ‘grey area’ where clinical guidelines did not match the GP’s assessment of cancer risk, either because the guidance inadequately represented or did not include the patient’s presentation. GPs sought to legitimise their gut feelings by gathering objective clinical evidence, careful examination of referral procedures, and consultation with colleagues.ConclusionGPs described their gut feelings as important to decision making in primary care and a necessary addition to clinical guidance. The steps taken to legitimise their gut feelings matched that expected in good clinical practice.
Impact of changes to national guidelines on hypertension-related workload: an interrupted time series analysis in English primary care
Authors: Lay-Flurrie Sarah L , Sheppard James P , Stevens Richard J , Mallen Christian , Heneghan Carl , Hobbs FD Richard , Williams Bryan , Mant Jonathan , McManus Richard J 
Published: December 2020

BackgroundIn 2011, National Institute for Health and Care Excellence (NICE) guidelines recommended the routine use of out-of-office blood pressure (BP) monitoring for the diagnosis of hypertension. These changes were predicted to reduce unnecessary treatment costs and workload associated with misdiagnosis.AimTo assess the impact of guideline change on rates of hypertension-related consultation in general practice.Design and settingA retrospective open cohort study in adults registered with English general practices contributing to the Clinical Practice Research Datalink between 1 April 2006 and 31 March 2017.MethodThe primary outcome was the rate of face-to-face, telephone, and home visit consultations related to hypertension with a GP or nurse. Age- and sex-standardised rates were analysed using interrupted time-series analysis.ResultsIn 3 937 191 adults (median follow-up 4.2 years) there were 12 253 836 hypertension-related consultations. The rate of hypertension-related consultation was 71.0 per 100 person–years (95% confidence interval [CI] = 67.8 to 74.2) in April 2006, which remained flat before 2011. The introduction of the NICE hypertension guideline in 2011 was associated with a change in yearly trend (change in trend −3.60 per 100 person–years, 95% CI = −5.12 to −2.09). The rate of consultation subsequently decreased to 59.2 per 100 person–years (95% CI = 56.5 to 61.8) in March 2017. These changes occurred around the time of diagnosis, and persisted when accounting for wider trends in all consultations.ConclusionHypertension-related workload has declined in the last decade, in association with guideline changes. This is due to changes in workload at the time of diagnosis, rather than reductions in misdiagnosis.
La ciudad y el origen de la civilización en los Andes. Sobre el imperativo y los límites de la comparación en la prehistoria.
Authors: Makowski Krzysztof 
Published: December 2020

Abstract/short description by Editorial Team:
This article discusses the presence of urbanism in the Andean region. The author revisits numerous models of development of complex societies that have been proposed and are still in use. Much of them relates to the concepts of city and urbanism and such manifestations of complex society are often regarded as a universal and important element of societal evolution. Makowski's article stresses that Mediterranean urbanism includes a number of very characteristic ideas that do not find any equivalent in the Andean region. He suggests that Andean settlements may not be comparable to Old World cities.
Performance of a Triangular Rubber Tracked Tractor in Paddy Fields
Authors: Ahmad Mohd Taufik , Khadzir Mohd Khusairy , Omar Mohd Fakhrul Zaman 
Published: December 2020

Tracked tractors have been commonly used on paddy fields to overcome soft soil problem. However, triangular-shaped rubber-tracked tractors with high clearance has not been properly tested. The objective of the research was to evaluate the performance of a triangular, rubber-tracked tractor used in paddy fields. This tractor was tested in typical paddy field conditions at MARDI Seberang Perai. The prime mover was attached with a rotary tiller. The performance tests include measuring the soil bearing capacity before and after machine disturbance, machine work rate per hectare and the effective field capacity. The fuel consumption was also recorded. Results showed that the tracked tractor obtained an effective field capacity of 0.576 hr/ha with average fuel consumption of 20 liters/ha. The lightweight tractor also contributed in producing less ground effects, combined with the use of low ground contact pressure tracks, that caused minimal soil disturbance that would affect the soil hardpan layer. The tractor had enough power to move in typical paddy field condition, with no soft soil problems. The tractor was able to turn 360 degrees within a small area, which made it suitable for working in paddy fields. This prime mover has potential to be used in paddy fields.
A new marine mite of the genus Litarachna Walter, 1925 from Guadeloupe, Caribbean Sea (Acari, Hydrachnidia, Pontarachnidae)
Authors: Pešić Vladimir , Chatterjee Tapas , Schizas Nikolaos V. 
Published: December 2020

In this paper a new marine mite (Litarachna guadeloupensis sp. nov.) is described from Guadeloupe, Caribbean Sea.
Four Reasons: The Garden and Its Double: Case Study
Authors: Marín-Clavijo Jesús , Angulo-Delgado Ana I. 
Published: December 2020

Analysis of an experimental educational methodology aimed at professional development in the field of visual arts. For this, it is based on the experimental and expository proposal consisting of the use of site-specific sculpture as a creative and methodological strategy for the exploration of the line of own research of students of plastic arts degree and pre-doctoral postgraduates. The selection of the students/artists was made based on the creative research lines they develop, examples of works that start from considering the sculptural as intrinsically related to the environment, and more specifically with the natural environment from a phenomenological and structural point of view in terms of artistic experience; and also, from a point of view of sculptural linguistic research based on the Kraussian foundations of the expanded sculptural field that formally arise from a Piaget´s group.
On the other hand, the exhibition proposal is intended as a framework for deepening production and artistic diffusion oriented to immersion in a professional experience in which all aspects of the creative process can be addressed, from the mere idea to dissemination through from different means of artistic work, so that the training obtained by the artists/students is holistic in terms of the professional field of visual arts.