bluuebunny/crossref_metadata_2025_split huggingface dataset:
High Resolution Fesem Study of Au Particle Growth on TiO2
Authors: Cosandey F , Zhang L , Madey T E 
Published: July 2020

Abstract
Transition metals supported on oxides have important catalytic properties and are also used in chemical gas sensors for increasing sensitivity and selectivity. In order to understand growth and reactivity in the Au/TiO2 system, we have performed surface studies on a model system consisting of ultrathin, discontinuous Au films on TiO2 (110) single crystals. In this paper we are presenting results obtained by high resolution scanning electron microscopy (HRSEM) on the effects of substrate temperature and average Au thickness on particle size, density and coverage.
The TiO2 (110) single crystal surfaces used in this study were prepared in UHV using surface science tools followed by in-situ Au deposition for different substrate temperatures and for various film thicknesses. After deposition, the samples were transferred in air to the Field Emission Scanning Electron microscope (LEO 982 Gemini) for high resolution imaging.
Typical high resolution scanning electron microscopy (HRSEM) images of Au films deposited at 300 K are shown in Fig. 1 for two film thicknesses of 0.22 and 1.0 nm.
TEM Analysis of Defects in Simox Silicon-On-Insulator Material
Authors: Guss B , Seraphin S , Cordts BF 
Published: July 2020

Abstract
Silicon-on-Insulator is the leading technology for VLSI fast speed processors and low voltage applications. SIMOX (Separation by Implantation of Oxygen) is a subset of SOI with a high quality top silicon layer onto which VLSI circuitry is placed. SIMOX processing begins with a high energy, high current implantation of a large dose of O+ ions to penetrate the wafer’s surface to form the buried oxide and top silicon layers. This implantation creates numerous precipitates and a large damage region. Therefore a multi-step anneal is used to improve the quality of the top silicon layer by significantly reducing precipitate and dislocation densities, to create smooth interfaces, and to remove any ion residual damage. Using TEM, this study traces the defect formations through the various processing steps, with the objective to arrive at device quality.
The SIMOX wafers were implanted with an oxygen ion implant dose of 5xl017cm−2, and then subjected to multiple implantation and anneal steps, bringing the final oxygen ion dose to 1.5xl018cm−2[1].
Experiments on Foucault Imaging of Superconducting Fluxons
Authors: Yoshida T , Endo J , Harada K , Kasai H , Matsuda T , Beleggia M , Pozzi G , Tonomura A 
Published: July 2020

Abstract
The out-of-focus method has been successfully employed in the dynamical observation of superconducting fluxons. However, owing to the large defocus distance needed to image fluxons with enough contrast it turns out that their correlation with structural defects, better imaged at focus, is troublesome. Among the standard methods of Lorentz microscopy the Foucault technique is a good candidate for removing this drawback, since it generates phase contrast in the focused image by masking part of the transmitted beam by means of an aperture.
Therefore, simulations have been carried out both for one-dimensional fluxon models and more realistic two dimensional ones, with the result that enough contrast can be generated in the focused image in order to detect them. However, although these theoretical results suggest the feasibility of Foucault experiments, filling the gap between theory and practice is not an easy task, especially when considering the small angular deflections involved, of the order of 10−5 rad.
Simulation of the Spin Polarization Transfer of Electrons in a Solid
Authors: Kotera M , Tamura K 
Published: July 2020

Abstract
The electron spin polarization scanning electron microscopy (Spin-SEM) has been used to image the surface magnetic structures of magnetic materials in the order of nra scale. However, the sensitivity of the Spin-SEM so far used is very low. To improve the sensitivity, it is necessary to find the best condition for the electron detection system. The Mott polarimeter has commonly been used in the Spin-SEM. In the present study the performance of the Mott polarimeter is discussed. The geometrical configuration and the value of the post acceleration of secondary electrons to the detector have been experimentally determined or analized by a simple theoretical consideration. On the other hand, in the present study the condition to obtain the highest intensity and the highest signal contrast is seached by using an electron trajectory simulation in the Mott polarimeter. A series of electron scattering events and the electron energy loss in the target of the polarimeter is calculated, and not only the three dimensional scattering trajectory of electrons, but also the spin polarization transfer at every scattering event are traced in the target.
Beam-Broadening Effects in STEM/EDS Measurement of Radiation-Induced Segregation in High-Purity 304L Stainless Steel
Authors: Busby JT , Allen TR , Kenik EA , Zaluzec NJ , Was GS 
Published: July 2020

Abstract
Radiation-induced segregation (RIS) is the spatial redistribution of elements at defect sinks such as grain boundaries and free surfaces during irradiation. This phenomenon has been studied in a wide variety of alloys and has been linked to irradiation-assisted stress corrosion cracking (IASCC) of nuclear reactor core components. Therefore, accurate determination of the grain boundary composition is important in understanding its effects on environmental cracking. Radiation-induced segregation profiles are routinely measured by scanning-transmission electron microscopy using energy-dispersive X-ray spectroscopy (STEM-EDS) and Auger electron spectroscopy (AES). Because of the narrow width of the segregation profile (typically less than 10 nm full width at half-maximum), the accuracy of grain boundary concentration measurements using STEM/EDS depends on the characteristics of the analyzing instrument, specifically, the excited volume in which x-rays are generated. This excited volume is determined by both electron beam diameter and the primary electron beam energy. Increasing the primary beam energy in STEM/EDS produces greater measured grain boundary segregation, as the reduced electron beam broadening a smaller excited volume.
Dynamic Observation of Vortex Interaction with Pinning Centers Using Electron Waves
Authors: Tonomura Akira 
Published: July 2020

Abstract
Tiny magnetic vortices hold the key in practical applications of superconductors, since the dynamic behaviors of vortices at pinning centers determine the critical current. These vortices have become observable directly and dynamically by using a “coherent” field-emission electron beam: The magnetic lines of force of vortices can be quantitatively observed as contour fringes in an electron-holographic interference micrograph. The change in the vortex radius could actually be measured when the temperature of a superconducting thin film changed. Vortices were also dynamically observed in a Lorentz micrograph. Both vortices and defects in the thin film can be observed simultaneously with this method, though the defects image is blurred.
This paper reports the dynamic observation of vortices at defects when the applied magnetic field changes. A superconducting Nb thin film, set on a low-temperature stage, is tilted 45° to an incident beam of 300kV electrons (see Fig. 1), and an external magnetic field is applied in the horizontal direction. When an electron beam passes through the vortices, their magnetic fields deflect the electron beam. Therefore, when observed in the lower plane, a vortex can be viewed as a pair of black and white spots.
High-Resolution Observation of Si100-xVx Amorphous Alloys by HAADF-STEM
Authors: Tanaka N , Penny cook SJ , Fujiwara T , Fukunaga T , Mizutani U 
Published: July 2020

Abstract
A combination of Si and transition metal element like V, Ni and Au can form an amorphous phase over a wide composition range. Extensive studies have been reported in relation to a change in the electron transport properties across the metal-insulator transition. It has been reported that the metal-insulator transition in the amorphous Si100−xVx alloys accompanies a substantial change in both the electronic structure and atomic structure around x=18, as revealed by the photoemission spectroscopy and neutron diffraction experiments[1]. It is of great interest to examine the structural change associated with the metal-insulator transition at an atomic level by utilizing the HRTEM[2]. However, the correspondence between the image contrast and projection of atomic structures in amorphous materials is usually indirect due to the well-known phenomena of phase contrast in HRTEM. High-angle detection annular dark field scanning transmission electron microscopy (HAADF-STEM) as illustrated in Fig.1 is a solution of the problem without contrast reversal due to the lens-defocus and thickness-variation of samples.
Electron Diffraction Analysis and Determination of Se Phase Formed by Reduction of Oxoselenium Anions by Iron (II) Hydroxide
Authors: Dufner D C , Zingaro R A , Murphy A P , Moody C D 
Published: July 2020

Abstract
Since the early 1980s, Se toxicity in wildlife has created a great deal of interest and concern. Reservoirs, marshes, and wetlands in which excessive amounts of Se have been found are considered to be the source of their toxicity problems. Thus, an effective and inexpensive treatment of Se-contaminated waters which significantly lowers the concentration of this element is needed. One such method for removing selenites and selenates from water utilizes iron (II) hydroxide as a reducing agent. In this work, the reduction products are analyzed in the transmission electron microscope (TEM) using electron diffraction and energy-dispersive spectroscopy (EDS) to determine the presence of Se.
A “standard” aqueous solution was prepared by the addition of KOH to distilled water to pH 8.8. Sufficient quantities of Na2SeO3 or Na2SeO4 were weighed and dissolved in the “standard” solution to yield SeO3 -2 or SeO4 -2 ions. A weighed quantity of Fe(NH4)2(SO4)2 was then added to the SeO3 -2 or SeO4 -2 “standard” solution to form a precipitate of iron hydroxide.
Cross-Section TEM Study On Kr+ Irradiation-Induced Amorphization in Quartz
Authors: Gong WL , Wang LM , Ewing RC 
Published: July 2020

Abstract
Radiation damage in quartz has been of interest to the semiconductor industry, optical fiber industry, and nuclear industry. Cross-section transmission electron microscopy (TEM) is a powerful tool for investigating the irradiation effects since it provides a direct measurement of the ion and the damage distributions, and can also provide detailed microstructural information such as the presence of amorphous regions and the size, density and chemical nature of defect aggregates. The results reported below are from a systematic cross-section TEM study on 1.5 MeV Kr+ ion irradiated quartz.
3-mm discs of quartz (along 010 face) were prepared with 100 μm in thickness. One side for each discs was well polished using a 0.05 μm diamond paste. The well-polished side was irradiated at room temperature with 1.5 MeV Kr ions in the HVEM-Tandem Facility at Argonne National Laboratory. Following irradiation, cross-section TEM specimens were prepared using the so-called T-tool technique, a modified tripot technique
Growth of ZrO2 Corrosion Film on Zr-2.5%Nb Pressure Tube Alloy
Authors: Lin Y P 
Published: July 2020

Abstract
The microstructure of Zr-2.5wt%Nb pressure tubes used in CANDU reactors consists α-Zr grains with a [110] texture in the radial direction and surrounded by a thin layer of metastable β-Zr. Information on oxide formed on β-regions have been reported. For the predominantly monoclinic ZrO2 (a=0.514, b=0.521, c=0.531nm, β=99.2°) formed α-Zr, two types of grain morphology and texture have been observed. In some areas of the oxide, columnar grains with a fibre texture exhibit no specific orientation relationship with the metal; such regions are not the subject here. Results presented here address a textured growth mode which is sensitive to the metal orientation.
Plan-view foils of oxide on the pressure tube radial-normal surface formed by a treatment of 24 hours in steam were prepared by ion-beam thinning and examined in a JEOL 2010 TEM. Selected area diffraction (SAD) and convergent beam diffraction (CBD) patterns showed that oxide growth mode was dominated by a [001] growth and consisted of a combination of orientation related [001] growth and mixed [001]/[100] growth.
A Study of An Yttria-Doped Zirconia Coating With Electron Microprobe Wavelength Dispersive Compositional Mapping
Authors: Marinenko Ryna B , Bright David S , Steel Eric B 
Published: July 2020

Abstract
Yttria-doped zirconia plasma-sprayed thermal barrier coatings (TBC’s) have been used successfully to improve the performance and extend the life of industrial equipment such as jet engines. For this reason, there is considerable interest in understanding and improving the plasma spray process and resulting TBC’s. A collaborative research program exists between Sandia National Laboratories and the National Institute of Science and Technology (NIST) to study the materials and processes used in preparing the coatings as well as the relationship between the physical properties of the coating and its microstructure.
The purpose of this work was to determine the elemental compositions on a micrometer scale of an yttria-doped zirconia coating. The cubic and tetragonal crystal forms of the yttria-doped zirconia have the most favorable thermal expansion coefficient, therefore providing the most effective thermal barrier. The Y concentration in these crystal phases is known to be 6-7 wt%, while the less desirable monoclinic phase, having a less favorable thermal expansion coefficient, contains less that 3 wt% Y.
Soft X-Ray Spectroscopy of Amino Acids and Peptides
Authors: Osanna A , Boese J , Jacobsen C , Kirz J 
Published: July 2020

Abstract
Soft x-rays provide a high signal-to-background ratio and an energy resolution of 0.1 - 0.5 eV for quantitative microanalysis of thin organic specimens. For specimens with non-uniform thickness, it it necessary to take spatially resolved spectra for quantitative analysis. In the Stony Brook scanning transmission x-ray microscope, spectra can be acquired from ∼ 0.2 micron spots, and images at selected energies can be acquired at &lt; 55 nm Rayleigh resolution. This spectromicroscopy capability has been used for biological applications including the mapping of protein and DNA so as to rule out certain models of chromosome packing in sperm, the mapping of calcium in bone and tendon tissue, and for polymer science applications.
We have investigated x-ray absorption near edge structure (XANES) of amino acids and peptides at the carbon K-edge. We find strong evidence that spectra of small proteins can be predicted from amino acid spectra
Multivariate Statistical Analysis of Spectrum Lines From Si3N4 Grain Boundaries
Authors: Rice P M , Alexander K B , Anderson I M 
Published: July 2020

Abstract
It is well known that the high-temperature properties of polycrystalline Si3N4 ceramics are strongly influenced by the nanometer-scale glassy phase at the grain boundaries. We have recently analyzed the variation of the near-edge fine structure (ELNES) of the Si-L2,3 edges using a combination of TEM spectrum-line acquisition with an imaging filter and multivariate statistical analysis.
The glassy phase at the Si3N4 grain boundaries is easily damaged by the the fine probes usually used in scanning transmission electron microscopy to acquire ELNES data. Thus an alternative method using a Gatan imaging filter (GIF), called TEM spectrum-line analysis, was used. In this mode, energy-loss spectra are dispersed along one axis of the CCD detector, while the orthogonal axis displays the spatial variation across the interface. In this mode, a slotted washer is used as the GIF entrance aperture, with its minor axis parallel to the energy-dispersion direction of the spectrometer.
The Role of Gallium Sulfide in Srs:Ce Grain Growth
Authors: Evans N D , Naman A , Rice P M , Jones K S , Holloway P H 
Published: July 2020

Abstract
Whereas efficient red (ZnS:Mn) and green (ZnS:Tb) phosphors are available for full-color flat-panel display technology, efficient blue phosphors are still under development. SrS:Ce is being investigated as a suitable material. As part of a larger study, annealed SrS:Ce films produced from sputter targets incorporating Ga2S3 were found to be five times brighter than films produced from targets containing no Ga2S3. Consequently, the significance of added gallium sulfide to the morphology of SrS:Ce films during annealing is being investigated.
Following deposition, plan view specimens of films were prepared for transmission electron microscopy by mechanical grinding, dimpling, and Ar+ milling. Films were examined in a Philips CM 12, and a JEOL 200CX. Additionally, EDS line scans were obtained in the scanning-transmission mode of a Philips CM200FEG, integrated with an EMiSPEC Vision acquisition system. The EDS line scans were defined as a series of 40 points along a line, spaced approximately 3.6 nm apart.
Electron Energy-Loss and Energy Dispersive X-Ray Spectros-Copy Studies of Diffusion Bonded Cu-Al2O3 Interfaces
Authors: Hashimoto R , Menon E S K , Saunders M , Fox A G 
Published: July 2020

Abstract
The metal-ceramic interface between copper and alumina has been studied by TEM, Electron Energy-Loss Spectroscopy (EELS), and Energy Dispersive X-ray spectroscopy (EDX). of partic-ular interest is the potential role of silicon which is the major impurity in commercial alumina. This investigation focuses on the presence and distribution of silicon within the bulk alumina and at the diffusion bonded CU-AI2O3 interface using a Topcon 002B TEM equipped with an EDAX EDX detector and a Gatan Imaging Filter. The interface was created under vacuum by diffusion bonding of 100/xm copper foils (99.999% purity) pressed between polished alumina substrates (∼99.5% purity) for several hours at ∼90% of the melting temperature of the metal.
An initial investigation of the bulk AI2O3 indicated that the majority of the Si occurred at the triple points. A typical example is shown in Fig. la. EDX spectra acquired with a 6nm probe from the center of the junction (Fig. lbi) and at the grain boundary indicate that the Si wets the grain boundary to a limited extent.
The Study of Ti-Mcm-41 by Transmission Electron Microscopy
Authors: Blanford CF , Aronson BJ , McKernan S , Stein A , Carter CB 
Published: July 2020

Abstract
In 1992, researchers at Mobil Research and Development created a new class of porous silicates, most notably MCM-41. This material features a hexagonal arrangement of pores and surface areas in excess of 1000 m2 g-1. Typically, MCM-41 exhibits pore diameters around 2.5 nm and a d-spacing around 4.0 nm, but slight variations in the synthesis of MCM-41 can produce a range of pore sizes from 2 to 10 nm. Zeolites, in comparison, have pore openings smaller than 1.3 nm and surface areas of a few hundred square meters per gram.
Recently, Aronson et al. have been studying the grafting of TiO2 to MCM-41. TiO2 is a versatile photocatalyst in many selective organic oxidations and other reactions, including the degradation of environmental toxins. by dispersing TiO2 on the internal surface of a mesoporous support one can increase the active surface area significantly and introduce some size-selectivity.
Resolution Issues in Scanned Probe Microscopy
Authors: Russell P E 
Published: July 2020

Abstract
Scanned Probe Microscopy first received widespread recognition in the form of scanning tunneling microscopy (STM) images clearly showing atomic resolution of the Si 111 surface in the characteristic 7×7 surface reconstruction. For this sample, STM imaging under carefully controlled ultrahigh vacuum conditions reveals the clear image of each atom position within the surface unit cell with excellent contrast and clearly atomic resolution. Over the past few years, versions of scanning force microscopy (commonly referred to as atomic force microscopy or AFM) have become much more widespread than STM. A very common, and very difficult question, is: What is the resolution of AFM? The simple answer is that SPM in general, and STM and AFM in particular, routinely obtain sub-angstrom resolution—in the z axis, or the sample height direction. This high resolution capability is easily demonstrated by scanning a cleaved crystal of known lattice spacing and observing single and multiple atomic steps.
Studies of Supported Metal Catalysts Using Low Voltage Biased Secondary Electron Imaging in a JSM-6320f Fe-SEM
Authors: Liu J , Ornberg R L , Ebner J R 
Published: July 2020

Abstract
Many industrial catalysts have a complex geometric structure to enable reacting gases or fluids to reach as much of the active surface of the catalyst as possible. The catalyzing surface frequently consists of a complex chemical mixture of different phases produced by an evolved chemical process. The active components are often very small particles dispersed on high-surface-area supports. The catalytic properties of this type of catalyst depend on the structure, composition, and morphology of the active species as well as the supports. TEM/STEM and associated techniques have been used extensively to characterize the structure and composition of supported catalysts. Surface morphology of supported catalysts is generally examined by secondary electron imaging, especially at low incident beam energies. It is, however, frequently found that small metal particles are not usually seen in SE images because of the complication of support topography
Surface Morphology of Mechanically Strained Silicate Glass Films on Alumina Substrates
Authors: Zagrebelny AV , Carter CB 
Published: July 2020

Abstract
It has been long recognized that the understanding of mechanical properties of thin films on substrates requires an understanding of the stresses in the film structures as well as a knowledge of mechanisms by which thin films deform. It has also been shown that these stresses may compromise the performance of integrated circuits, magnetic media, etc. The presence of residual and thermal stresses between the matrix and intergranular films in structural multiphase ceramics is the most common mechanism of failure that often causes deformation and fracture
In this paper, the effect of residual stress on mechanical properties of silicate-glass films on single-crystal α-Al2O3 substrates has been studied with AFM with the emphasis on the changes in surface morphology associated with the film strain and relaxation. The deformation of thin layers of glass on crystalline materials has also been examined using newly developed experimental methods for nanomechanical testing.
Monte Carlo Simulation Of X-Ray Spectra In Absolute Units In The Energy Regime Between 1 And 50 Kev
Authors: Schiebl C O , Ambrose V , Wernisch J 
Published: July 2020

Abstract
SeSAME, a Monte Carlo simulation program which can handle totally arbitrarily shaped twodimensional geometries, has been extended for the modeling of whole x-ray spectra in absolute units. The so called single scattering model has been used for the simulations presented here. Elastic scattering processes are modeled using a partial wave approach according to a relativistic expression derived by Mott. For the calculation of the electron energy loss the stopping power formula from Joy and Luo has been applied.
Two different double differential cross sections for continuous x-ray production have been implemented into SeSAME. The first one is an analytical model derived by Kirkpatrick and Wiedmann and is based on a non-relativistic theory developed by Sommerfield and Elwert. The second one uses tabulated values for the shape function for atomic-field Bremsstrahlung and scaled Bremsstrahlung cross sections differential only in photon energy according to Kissel at al.