bluuebunny/crossref_metadata_2025_split huggingface dataset:
TEM FIB Lift-Out of Mount Saint Helens Volcanic Ash
Authors: Drown-MacDonald JL , Prenitzer BI , Shofner TL , Giannuzzi LA 
Published: July 2020

Abstract
Focused Ion Beam (FIB) specimen preparation for both scanning and transmission electron microscopy (SEM and TEM respectively) has seen an increase in usage over the past few years. The advantage to the FIB is that site specific cross sections (or plan view sections) may be fabricated quickly and reproducibly from numerous types of materials using a finely focused beam of Ga+ ions [1,2]. It was demonstrated by Prenitzer et al. that TEM specimens may be acquired from individual Zn powder particles by employing the FIB LO specimen preparation technique [3]. In this paper, we use the FIB LO technique to prepare TEM specimens from Mount Saint Helens volcanic ash.
Volcanic ash from Mount Saint Helens was obtained at the Microscopy and Microanalysis 1998 meeting in Atlanta. TEM analysis of the ash was performed using the FIB lift out technique [1]. Ash powders were dusted onto an SEM sample stud that had been coated with silver paint.
SEM Specimen Preparation by Broad Ion Beam Etching For Enhanced Channeling and Orientation Imaging
Authors: Alani R , P. Field D , Ogura K 
Published: July 2020

Abstract
It is well known that the “channeling contrast” and EBSD pattern formation, which is the basis for “orientation imaging microscopy” (OIM), is highly sensitive to specimen surface quality in SEM studies. Typically, specimens for these studies are prepared by a combination of mechanical grinding then chemical etching or electropolishing. As an alternative to the chemical step(s) in this technique, we report a method based upon broad ion beam etching equipment [1]. This alternative method is more universal and reliable for enhanced channeling contrast and EBSD/OIM of metallic materials.
A variety of polycrystalline metallic specimens were etched in an instrument dedicated for etching and coating SEM specimens [1] and examined in the SEM for channeling contrast and OIM mapping. Fig. la is a SEM image of an annealed titanium sheet specimen in as-received condition showing a well-defined surface texture. It can be seen that channeling contrast is absent, presumably due to the existence of a surface layer formed during the manufacturing process.
A Method for Site Specific Characterization Using a Dedicated FIB System Combined With an Analyitical TEM
Authors: Kamino T , Yaguchi T , Matsumoto H , Kobayashi H , Koike H 
Published: July 2020

Abstract
A method for site specific characterization of the materials using a dedicated focused ion beam(FIB) system and an analytical transmission electron microscope (TEM) was developed. Needless to say, in TEM specimen preparation using FIB system, stability of a specimen is quite important. The specimen stage employed in the developed FIB system is the one designed for high resolution TEM, and the specimen drift rate of the stage is less than lnm/min. In addition, FIB-TEM compatible specimen holder which allows milling of a specimen with the FIB system and observation of the specimen with the TEM without re-loading was developed. To obtain thin specimen from the area to be characterized correctly, confirmation of the area before final milling is needed. However, observation of cross sectional view in a FIB system is recommended because it causes damage by Ga ion irradiation. To solve this problem, we used a STEM unit as a viewer of FIB milled specimen.
Image Analysis and Fourier Transform Infrared Light Microscopy and Transmission Electron Microscopy of Mercerized Cotton Yarns
Authors: Boylston Eileen K 
Published: July 2020

Abstract
Renewed interest in mercerization as a pre-treatment for textile finishing has led to research on the effects of temperature on this process. Mercerization, the swelling of cotton in caustic soda, causes changes in crystallinity from a Cellulose I structure to a Cellulose II structure, along with changes in fiber physical dimensions, increased dyeability, luster and tensile strength. These changes are differentiated by light microscopy, image analysis and FT-IR, and transmission electron microscopy. Cotton yarns were mercerized with an aqueous solution of 23% NaOH and 1% wetting agent. The yarns were treated for 1 hour at 0, 20, 60, 80, and 110° C, and washed in distilled water at the same temperature as the treatment bath. Rapid embeddment procedures have been developed for analyzing the effects of treatments on cotton fiber structure. Cotton fiber cross-sections were prepared for light microscopy/image analysis by encasing the fibers in a tube,1 embedding in mefhacrylate plastic (Fig. la), polymerizing for 30 minutes with UV, and sectioning.
Effect of Specimen Aspect Ratio on the Reconstruction of Atom Probe Tomography Data
Authors: Larson D J , Russell K F , Miller M K 
Published: July 2020

Abstract
The field ion microscope is a point projection microscope, with the magnification inversely proportional to the radius of curvature (R) of the needle-shaped tip which comprises the specimen. The electric field at the specimen apex, which determines the trajectories of field evaporated ions, is given by F=V/(kR), where V is the specimen voltage and k is a geometric field reduction factor which increases with the specimen taper angle, θ. In the reconstruction of atom probe tomography (APT) data, the magnification, and thus the lateral extent of the analyzed region, is determined primarily by the specimen radius and taper angle. Asymmetric specimens may often be fabricated, even from materials which lend themselves to straightforward preparation. In addition, in certain materials, specimens with high aspect ratios may result from crystallographic preferential electropolishing. For accurate data reconstruction, it is important to know not only the specimen radius, but also, ideally, the degree of anisotropy (aspect ratio taper angle in orthogonal directions) of the specimen.
Electron Holography of Magnetic Memory Cells
Authors: Frost BG , Voelkl E , Kowalewski M 
Published: July 2020

Abstract
The phase shift of an electron wave compared with a reference wave amounts to [1]

where e is the electron charge (e &gt; 0), h is Planck's constant, A is the magnetic vector potential, B is the magnetic induction and Фm is the magnetic flux through an area F bordered by the trajectories of the two waves. The absolute value of the vector F perpendicular to this area is given by F. As a simple example we qualitatively sketch the phase shifts by a uniformly magnetized sphere. The cross section of this sphere and the magnetic field lines are shown in Fig. 1. The electron wave travels perpendicular to the paper plane. On one side of the sphere the object wave through point 1 is compared with the reference wave through point 2 and on the opposite side the wave through point 3 is compared with the one through point 4.
Applications of Scanned Probe Microscopy in the Integrated Circuit Fabrication Industry
Authors: Richards J F , Kline RJ 
Published: July 2020

Abstract
Scanning Probe Microscopy (SPM), in particular Atomic Force Microscopy (AFM), has become well establish member of the IC metrology tool arsenal which few IC manufacturers are without. Although Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) remain the “workhorse” metrology techniques, SPM (standard AFM, as well as Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM), Scanning Kelvin probe, Nanoindentaion and others) are being increasingly called upon to help solve IC production problems and to aid in research and development for next generation devices.
Topographical metrology with standard AFM is by far the most common application of SPM in the semiconductor industry. It is typically used to gain surface roughness and grain size information about thin films that can be used as feedback to modify deposition conditions until the desired film properties are obtained.
Nanometer-Scale Dimensional Metrology With the Nist Calibrated Atomic Force Microscope
Authors: Dixson R , Köning R , Tsai V W , Fu J , Vorburger T V 
Published: July 2020

Abstract
Atomic force microscopes (AFMs), which generate three dimensional images with nanometer level resolution, are increasingly being used as tools for sub-micrometer dimensional metrology in a wide range of applications. Measurements commonly performed with AFMs are feature spacing (pitch), feature height (or depth), feature width (critical dimension), and surface roughness. To perform accurate measurements, the scales of an AFM must be calibrated regularly. Presently available standards for this purpose are calibrated using stylus instruments and optical techniques. The effectiveness of this approach, however, is limited by the differences in the working ranges of the various techniques and by questions of methods divergence. Such divergence may occur between measurements made by instruments using different techniques to measure the same feature. A reflected light microscope and an AFM, for example, may have differing sensitivity to the cross-sectional profile of measured lines. For sufficiently steep lines, an AFM tip will only contact the features near the tops.
Self-Assembled Monolayers: Assembling, Disassembling and Reassembling Studies Using Afm
Authors: Neves BRA , Salmon M E , Leonard DN , Russell PE , Troughton EB 
Published: July 2020

Abstract
Self-assembled monolayers (SAM) and multilayers of organic materials have been intensely studied in the past years, due to their numerous potential applications as, for example, lubricants, corrosioninhibitors and/or adhesion-promoters [1,2]. In this talk, we will present results of several studies carried out using Atomic Force Microscopy to investigate octadecylphosphonic acid (OPA) SAM deposited on mica. We have assessed various mechanisms of assembling, disassembling and reassembling the SAM on mica. The SAM deposition method employed in this work was drip coating using an OPA solution. We have used two different solvents, which exhibit very different OPA solubility, in this work: ethanol and trihydrofuran (THF). Regarding the assembling studies, we will show the formation of groups of OPA double-layers as the initial deposition stage (deposition time &lt; 2 seconds) when using ethanol-based solutions. We will also show that annealing such samples at 60°C produces, favorably, OPA quadruple-layers, as shown in figures la and lb, respectively.
Identification of Halogen Atoms in Scanning Tunneling Microscopy Images of Substituted Phenyloctadecyl Ethers
Authors: Musselman I H , Lee H S , Iyengar S 
Published: July 2020

Abstract
Numerous scanning tunneling microscopy (STM) studies of organic adsorbates at the gas/solid and liquid/solid interfaces have been reported. Although early STM experiments of these systems were concerned primarily with visualizing molecules at the atomic level, the focus has shifted to extracting chemical information from STM images, including the identity of atoms or functional groups within an adsorbed molecule. However, STM image interpretation continues to be an immense challenge and one currently debated issue of critical importance is the mechanism(s) by which image contrast reveals atomic and molecular structure. Recently, a combination of electronic and geometric factors was proposed. The electronic factor addresses the coupling between the energy levels of the adsorbate and the Fermi level of the surface whereas the geometric factor is related to the spatial overlap between the STM tip and the functional group.
A study in our laboratory of a homologous series of para-halogenated phenyloctadecyl ethers (XPOEs, where X = H, Cl, Br, I) adsorbed on highly oriented pyrolytic graphite (HOPG) has contributed significantly to the understanding of the image contrast mechanism for molecular adsorbates and of the chemical specificity of STM.
Scanning Probe Microscope Studies of Nanoscale Corrosive Wear of Single Crystal Surfaces
Authors: Thomas Dickinson J 
Published: July 2020

Abstract
In a number of situations and applications, the tribological wear of ceramic and minerallike surfaces is often greatly enhanced in the presence of a corrosive fluid. Examples are the wear of surfaces associated with joints (biomaterials) subject to and the extremely active application to high density circuit production which requires chemical mechanical polishing (CMP). The physics and chemistry of these enhanced wear rates are needed to reduce wear and to improve and extend CMP to new applications. In both situations, surfaces experience simultaneous tribological loading and corrosive chemical exposure, which together produce high wear rates and altered topography. In CMP, the goal is to efficiently achieve very flat surfaces. As feature sizes diminish further, it is conceivable that atomically flat surfaces will be necessary. In almost all tribological situations, it is the interaction of asperities, often micron and sub-micron in dimensions, that control the wear processes due to the high stresses associated with these small structures.
Development of a Combined Scanning Ion-Conductance and Nearfield Optical Microscope to Image Living Cells
Authors: Raval M , Klenerman D , Rayment T , Korchev Y , Lab M 
Published: July 2020

Abstract
It is important to be able to image biological samples in a manner that is non-invasive and allows the sample to retain its functionality during imaging.
A member of the SPM (scanning probe microscopy) family, SNOM (scanning near-field optical microscopy), has emerged as a technique that allows optical and topographic imaging of biological samples whilst satisfying the above stated criteria. The basic operating principle of SNOM is as follows. Light is coupled down a fibre-optic probe with an output aperture of sub-wavelength dimensions. The probe is then scanned over the sample surface from a distance that is approximately equal to the size of its aperture. By this apparently simple arrangement, the diffraction limit posed by conventional optical microscopy is overcome and simultaneous generation of optical and topographic images of sub-wavelength resolution is made possible. Spatial resolution values of lOOnm in air and 60nm in liquid[1,2] are achievable with SNOM.
Atomic Force Microscopy of Industrial Polymers
Authors: Galuska Alan A 
Published: July 2020

Abstract
The performance of many industrial polymers is determined by the microscopic morphology of the polymers. For example, surface morphology can influence properties such as adhesion, friction, sealing, blocking, printability, wettability, and haze. Furthermore, bulk morphology often controls mechanical properties such as toughness. strength, wear, and tear resistance. In order to optimize polymer performance, quick reliable methods of determining surface and bulk morphology are essential.
In the past, electron microscopy (in particular TEM) has been the primary method for determining polymer morphology. However, the usefulness of electron microscopy has been limited by the destructive nature of the electron beam, the naturally poor contrast between polymer types, and the difficulty in preparing (staining, etching, cryogenic ultramicrotoming, etc.) high quality specimens.
Recently, the tapping phase-shift mode of atomic force microscopy (TPSAFM) has provided the polymer scientist with a simple, quick, flexible and quantitative method for determining polymer surface and bulk morphology.
Nanomechanical Property Determination of Organic Matrix in Mollusc Shell Nacre: A Biocomposite
Authors: Sopp Jeffrey M , Sarikaya Mehmet 
Published: July 2020

Abstract
Mechanical properties were determined from the organic matrix of a mollusc hard tissue using a nanomechanical testing instrument attached to an atomic force microscope (AFM). Shells of molluscs are two-tier functionally-gradient ceramic/polymer biocomposites used by organisms as impact resistant materials. The inner section of the red abalone (Haliotis refuscens)shell, nacre (mother-ofpearl), has a brick and mortar microarchitecture with pseudo-hexagonal-shaped bricks made of aragonitic (orthorhombic) CaCO3 platelets (0.25 μn thick, and 5 μm edge length) surrounded by a thin (10-25 nm thick) proteinaceous organic matrix (Fig. 1). This higly ordered biocomposite has submicron-layered structure that result in excellent bulk mechanical properties, not achieved by manmade composites with similar phase compositions and, therefore, offers biomimetic lessons for novel materials design. In this model biomimetic composite, mechanical properties of its constituents need to be evaluated in addition to the details of the microstructure. We previously determined nanomechanical properties (hardness and modulus) of individual (twinned, single crystalline) aragonitic platelets.
Morphology and Film Properties of Composite Carboxylated Latexes
Authors: Shaffer O L , Sandor M W , El-Aasser M S 
Published: July 2020

Abstract
In industrial applications, such as paints or adhesives, composite latex particles are very common. Most of the properties which are obtained from composite latexes and their films cannot be achieved by physical blending of different polymer components. Therefore it becomes crucial to examine the morphology of composite latexes formed by a multiple-stage polymerization process. The latexes for this study have been examined by transmission electron microscopy (TEM) and atomic force microscopy (AFM). Various staining methods were used such as ruthenium tetroxide (RuO4), cesium hydroxide (CsOH), and uranyl acetate (UAc) as a negative stain.
The poly(n-butyl acrylate/ poly(methylmethacrylate) (PBA/PMMA) composite latex particles consist of a soft core phase and a hard second phase with varying amounts of acrylic acid in the core, the shell and in both core and shell. The latexes were examined before and after cleaning by a centrifugation technique with 100,000 molecular weight filters.
Polymer Characterization Using Confocal Scanning Laser Microscopy: A Review
Authors: Atkinson Matthew R 
Published: July 2020

Abstract
Confocal microscopy was developed in 1957 by Minski, who was awarded a patent for this work in 1961. Since that time many advances have been in new designs and implementations. There are two basic classes of confocal microscope: the Nipkow-disk-based confocal microscope which allow real-time direct viewing of the sample, and the confocal scanning laser microscopes (CSLM). The CSLM will be focussed on in this presentation.
The CSLM scans a focussed beam over, across or through the sample, collecting the reflected, scattered or emitted light. This light is directed towards an optical spatial filter, which passes light returning from the on-axis focus position, and rejects light that is returning from anywhere else. By detecting the light passing through the spatial filter synchronously with the moving beam and/or sample, an image that has only in-focus information is acquired. Typically a set of images is acquired as the sample is moved through focus: from this “image stack” both an extended-focus image and topographic information can be obtained.
FTIR Imaging of Multiphase Polymer Systems
Authors: Wall BG , Koenig JL , Bhargava R , Snively CM 
Published: July 2020

Abstract
Fourier Transform Infrared (FTIR) Microspectroscopy is a powerful method to examine and characterize domains down to areas of 10х10 μm2. Spatial concentration maps of chemical species were obtained using apertures to sequentially examine areas on a grid and obtain a map by plotting average spectral absorbance data obtained from each of the areas. New Focal Plane Array (FPA) detectors, composed of a large number (in our case, 64х64) of small detectors arranged in a grid pattern, allow simultaneous collection of infrared radiation at many points from a large spatial region (500х500 μm2 in our case). This allows for a rapid acquisition of chemically specific images from a given area and the examination of several real-time processes. This technique has found a wide variety of applications in multi-phase polymers including polymer laminates, phase separated polymer composites, semi-crystalline polymers and blends, and solvent diffusion into polymers have been the main areas of interest in non-biological IR studies using FPA detection. We present some of the recent work in our group on various multi-phase polymer systems using FPA based infrared spectroscopy.
In Vitro Studies of Microtubule Structures Using the Mac Mode AFM
Authors: Zhu J , Hartman J , Case R , Rice S , Vale R 
Published: July 2020

Abstract
Microtubules are long, hollow, stiff polymers that extend throughout the cytoplasm. They are involved in such diverse functions as governing the location of membrane-bounded organelles and chromosome separation during mitosis. The basic structural unit is tubulin, which is a heterodimer consisting of two closely related and tightly linked globular polypeptides called α and β-tubulin. Alternating α and β tubulin subunits form protofilaments, 13 of which bundle around a central core to form microtubule. The detailed structures of cytoplasmic microtubules have been studied extensively using various electron microscopic techniques. As microtubules are dynamic structures in constant transitions between growing and shrinking phases, it would be extremely interesting to investigate the structural organization of the subunit tubulin molecules in a buffer close to physiological conditions. With its high resolution and ability to image in fluid, atomic force microscope (AFM) makes it possible to study the biological structures in a native environment.
Probing Biomaterials with the Atomic Force Microscope
Authors: Hansma Helen G , Chen Christine , Golan Roxana , Pietrasanta Lia , Sorenson Cody , Auerbach Ilene , Holden Patricia 
Published: July 2020

Abstract
Recent AFM research in our laboratory has covered such diverse biomaterials as laminin and other macromolecules from basement membranes (Fig. 1) (1), DNA condensed for gene therapy (Fig. 2) (2), DNA-protein complexes in the yeast kinetochore (Fig. 3) (3), and biofilms of the bacterium Pseudomonas putida (Fig. 4) (4).
Laminin is a major protein of basement membranes. When analyzed by AFM in air, it shows a variety of conformations of its cruciform structure (Fig. 1A). Time-lapse images of a single laminin molecule in aqueous solution show the flexibility of the laminin arms as they move and bend (Fig. 1B)(1).
AFM analysis of DNA condensed for receptor-mediated gene therapy poses a puzzle (Fig. 2)(2). Polylysine condenses DNA poorly (Fig. 2A), while AsOR-polylysine condenses DNA into compact toroids and short rods (Fig. 2B). AsOR (asialoorosomucoid) is a 38-kDa glycoprotein with a net negative charge of 5 carboxylic acid groups per molecule. The puzzle is why this negative glycoprotein, covalently attached to polylysine, can enhance the condensation of DNA so much over the condensation caused by the polycation, polylysine, alone.
Gel-Immobilized Microarrays for the Study of Nucleic Acids and Proteins
Authors: Zlatanova Jordanka , Mirzabekov Andrei 
Published: July 2020

Abstract
Recently, a quantum leap has been achieved in the analysis of DNA and proteins through the advent of the biochip technology. This technology is a product of a broad interdisciplinary approach combining biochemical analysis, semiconductor manufacturing and computer software. Biochips can be defined as miniaturized ordered arrays of macro molecules or pieces thereof that are immobilized in a precise spatial manner on support media and can be used in highly automated, large-scale and high-throughput fashion to analyze biological material. The biochip can be used in a wide variety of areas related to basic research and can find versatile applications in almost all areas of human activities connected to biotechnology, medicine, agriculture, and environment monitoring and bioremediation.
The power of the technology has already been demonstrated in areas like gene sequencing and proofreading, detection of single-nucleotide mutation and polymorphism, identification of genes, identification of viruses and microorganisms, gene expression analysis, analysis of sequencespecific ligands and proteins, and others.