bluuebunny/crossref_metadata_2025_split huggingface dataset:
Recognition, Specificity, Scanning Probe Microscopy and Biomaterials
Authors: Ratner Buddy D , Luginbühll Reto , Overney Rene , Garrison Michael , Boland Thomas 
Published: July 2020

Abstract
Although scanning probe microscopy (SPM) can generate images of surface topography, this class of techniques is exceptionally valuable in its ability to provide quantitative and chemically specific information about biomaterial surfaces with high spatial definition. Since engineered biomaterials are designed to deliver chemically defined information, often arrayed in specific geometries, tools that can characterize such materials are needed.
A few years ago, we demonstrated how the atomic force microscope (AFM) could precisely distinguish between each of the four nucleotide bases that comprise DNA, measure the nucleotide-nucleotide force of interaction and spatially localize that information on a surface (1). in particular, we found that the nucleotide bases could self-assemble on gold. The assembly process was imaged using scanning tunneling microscopy (STM) and this led to an understanding of the structure of the assembled film. The assembled film structure was further characterized using electron spectroscopy for chemical analysis (ESCA) and secondary ion mass spectrometry (SIMS).
Characterization of the Source/Drain Region in Mos Devices by Scanning Transmission Electron Microscopy
Authors: Topuria T , D. Browning N , Ma Z 
Published: July 2020

Abstract
The advancement of metal-oxide-semiconductor (MOS) technology towards sub- 100nm device dimensions presents several technical difficulties. Nanoscaling in MOS devices is specifically governed by difficulties in the formation of ultrashallow junctions for the source/drain regions with the requirement of low resistance and low leakage currents. The use of a silicide (forming Schottky contacts at the source and drain) instead of the conventional ion implanted Si for the contacts allows a reduction in the contact area to be made, due to lower serial resistance per unit area of the silicide. According to the specific contact resistance dependence on the Schottky barrier height (ΦSB) and active dopant concentration (ND),
Three-Dimensional STEM for Observing Nano-Structures
Authors: Tanaka Nobuo , Koguchi Masanari , Kakibayashi Hiroshi , Tsuneta Ruriko , Kase Kiwamu , Iwaki Masaya 
Published: July 2020

Abstract
Three-dimensional (3D) observation is one of the important trials of future TEM and STEM methods. in the field of biological science, 3D-observation has already become general because the biological materials are usually amorphous and computed tomography (CT) routines can be effectively used. The CT assumes that the image intensity is linearly proportional to the projection of material density. in a crystalline specimen, however, this linearity does not hold due to the dynamical diffraction effect depending on spepimen thickness and incident directions of electron beam. High-angle annular-darkfield STEM (HAADF-STEM) and EDX mapping images could meet this requirement of the linearity because their image intensity are little affected by the dynamical diffraction effect.
Our 3D-STEM is based on a 300 kV FE-TEM/STEM(Hitachi HF-3000) equipped with a specially designed eucentric specimen stage with double spherical fulcra, a newly developed dark/bright field STEM detectors, a 3D-sampling system and a 3D-imaging processor for 3D topography and tomography.
Characterization of Microlens Structures Fabricated in Cd1-xZnxTe and Cdte/Si IRFPA Substrate Materials
Authors: Boyd PR , Lee U , Little J , Morton D , Stoltz AJ , Benson JD , Martinka M , Dinan JH , Banish MR 
Published: July 2020

Abstract
The ternary II-VT alloy Hg1-xCdxTe has become the material of choice for many infrared detector applications. Current state of the art Hg1-xCdxTe infrared focal plane arrays (IRFPAs) are constructed as hybrid structures consisting of an epitaxial sensing layer of Hg1-xCdxTe on either a CdTe or Cd1-xZnxTe substrate, hybridized to a silicon readout circuit chip. For backside illuminated structures, like the typical infrared Hg1-xCdxTe detector array, multilayer antireflective coatings (AR) are required on the backside of the detector chip. The next generation of higher performance IRFPAs will be based on high densities of smaller detector pixels fabricated on large area monolithic heteroepitaxial substrate materials. Since the ultimate performance of photovoltaic diodes of this type is determined by the signal to noise ratio of the device, reducing the size of the pixels while lowering the undesirable noise currents in the devices also reduces the amount of signal generated by the diode.
Lipoblastoma and Lipoblastomatosis in Infancy and Childhood: Histopathologic, Ultrastructural and Cytogenetic Features
Authors: Barrish J , Dilley A , Brandt M , Patel D , Zhu S-H , Nichols R , Hicks J 
Published: July 2020

Abstract
Adipose tumors during the first decade of life are infrequent, composing about 6% of all soft tissue neoplasms in children. Lipoblastomas are rare benign tumors occurring in infancy and early childhood and arising from embryonic white fat. The tumors may infiltrate tissue locally and may be of considerable size, but lack the ability to metastasize. The tumor may be an isolated well-encapsulated mass (lipoblastoma, Figure) or lack encapsulation and be locally infiltrative (lipoblastomatosis). Although a benign tumor, lipoblastomas tend to recur, and may resemble myxoid liposarcoma, a malignant tumor.
We report 26 cases of lipoblastoma/lipoblastomatosis over a 15 year period at Texas Children's Hospital. There was a slight female predilection (1.2 F:1.0 M). The most common symptom was a painless mass of increasing size. The trunk (48%), extremities (33%), head and neck (15%), and lung (4%) were the tumor sites.
Oxidative Stress in Galactose Induced Diabetic Retinopathy in Inducible Nitric Oxide Synthase Knockout Mice
Authors: Ann Ellis E , Grant Maria B 
Published: July 2020

Abstract
Oxidative stress and inducible nitric oxide synthase (iNOS) have been implicated in endothelial cell dysfunction in diabetic retinopathy by formation of peroxynitrite, a cytotoxic product of superoxide and high levels of nitric oxide. Spontaneous diabetic models do not allow for separating the oxidative stress as a result of hyperglycemia from that of the nitric oxide system. in addition chemicals such as streptozotocin which can induce diabetes in animal models cause oxidative stress and induce iNOS before the onset of hyperglycemia. Galactose has been used to induce non-insulin dependent diabetes in mice and rats while gene knockout mice provide a means to study the role of specific NOS components. This study used cytochemical localization of hydrogen peroxide produced by NADH oxidase, a marker for superoxide production, and immunocytochemical localization of nitrotyrosine, a marker for nitric oxide formed radical peroxynitrite, to investigate the role of oxidative stress and the nitric oxide system in galactose induced diabetic retinopathy in iNOS knockout (iNOS%) mice.
Morphologic Assessment of Plasma Membrane Blebbing Provides a Sensitive, Early Indicator of Low Dose Lidocaine Neurotoxicity
Authors: Johnson ME , Dadarkar P 
Published: July 2020

Abstract
Background: Lidocaine is a local anesthetic that is frequently used for spinal anesthesia. in clinical and animal studies, lidocaine is associated with an increased risk of spinal neurotoxicity following spinal anesthesia. The mechanism of lidocaine neurotoxicity has not been fully elucidated, but it does not involve blockade of sodium channels, the mechanism by which lidocaine causes local anesthesia. Previous in vitro studies assessing cytoplasmic calcium, nerve conduction and action potential generation, and cell death, have demonstrated overt neurotoxicity at higher concentrations of lidocaine (≥ 2% [74 mM] of the hydrochloride formulation), but equivocal results at lower concentrations. Clinically available preparations of lidocaine for spinal anesthesia contain 5% or 2.5% lidocaine hydrochloride. in most cases, lidocaine mixes rapidly with cerebrospinal fluid after injection for spinal anesthesia, so that lower concentrations are more clinically relevant. We have therefore evaluated morphologic assessment of plasma membrane blebbing as a more sensitive assay of neuronal injury by lidocaine.
“Casino V2.0 : An Advance Simulation Tool for Scanning Electron Microscope Users”
Authors: Drouin D , Couture AR , Gauvin R 
Published: July 2020

Abstract
The topic of this paper is to present a new Windows™ environment version of the CASINO Monte Carlo program. The goal of this program is to assist scanning electron microscope users in their routine analysis and also in more advanced topic such as electron beam lithography for example. Based on a single scattering algorithm, this software is specially designed for low beam interaction in a bulk and thin foil. This program uses tabulated Mott elastic cross-sections, which benefit of both fast calculation and accurate interaction at low beam energy. At the moment CASINO can either be used to generate X-rays or backscattered electron signals. The program used simple two-dimension geometry to represent real sample. in this version, vertical and horizontal planes can be generated to allow cross-section representation or multi-layers analysis. Then beam can be scanned across different regions to produce X-ray linescan or bascattered electron profiles.
Many new convenient features have been added to the version 2.0 of CASINO. The new interface lets the users to consult the results as the simulation is still in progress.
The Single Platform Concept for the Operation of Analytical Equipment
Authors: Rowlands N , Bagnall. K 
Published: July 2020

Abstract
The movement towards a single platform concept for the operation of multi-functional analytical instruments has progressed over the past 10 years largely due to the availability of powerful computer technology combined with the need of ease of use to increase productivity. Other factors include the need to share data obtained from these increasingly complex instruments, and to transport these data in an easily managed format and the possibility of storing large amounts of data generated from projects.
Initial efforts in this field were generated by the need for computer control of complex instrumentation such as TEMs, EPMAs and dual beam instruments. Microprocessors enabled easy alignment, storage of stage parameters and digital image acquisition. with the boom in the semiconductor industry it was necessary to design tools that could be operated by individuals who did not possess the same amount of knowledge as the scientists and technologists of the previous generation. Early attempts at integration of techniques on a single platform were restricted, largely due to limitations in the capacity of the computers employed in controlling these tasks. Indeed, in some cases this actually increased the complexity of some instruments due to a profusion of microprocessors controlling the various analytical components of the larger analytical machines.
Chromatic Aberration Correction of a Low-Voltage SEM using a Wien Filter: Adjusting the Correction Strength
Authors: Steffen T , Tiemeijer PC , Krijn MPCM , Mentink SAM 
Published: July 2020

Abstract
The resolution of state-of-the-art low-voltage scanning electron microscopes (LV SEM), which is currently limited by the chromatic and spherical aberrations of the objective lens, can be improved by incorporating an aberration correcting device. At present four different concepts are discussed in literature: Zach and Haider demonstrated that a quadrupole/octupole corrector can correct both chromatic and spherical aberration. Rose proposed a Wien filter for chromatic aberration correction, which has relaxed stability requirements. Recently, we reported a simplified version of this corrector and showed that a spherical aberration corrector can be integrated in a Wien filter. Henstra and co-workers suggested a purely electrostatic corrector that can correct both chromatic and spherical aberration.
For all these concepts problems may arise when the lens-to-sample (working) distance for an aligned corrector is to be changed. in general, the corrector settings depend on the ratio Cc/f2, where Cc and f denote the coefficient of the chromatic aberration and the focal length of the objective lens, respectively. When the working distance is changed, this ratio is no longer perfectly matched to the corrector settings. The tedious realignments and readjustments, which then seem necessary, can be avoided by using a doublet objective lens as illustrated schematically in Figure 1.
In-Situ Ion Milling in the Transmission Electron Microscope (TEM) Outlook to a New Preparation Technique
Authors: Gnauck Peter , Burkhardt Claus , Plies Erich , Nisch Wilfried 
Published: July 2020

Abstract
Recent developments in transmission electron microscopy put high demands on specimen preparation. in general the imaging quality is not limited by the performance of the microscope but by the quality of the specimen. in order to achieve a spatial resolution of 0.1 nm in HRTEM undamaged samples with a thickness below 10 nm are required. in energy filtering analytical electron microscopy (EFTEM), a constant specimen thickness over large areas and very low contamination is needed.
Conventional ion-milling techniques for TEM specimen preparation are essentially blind. Thus, it is left to chance whether the specimen detail of interest is suitable for TEM-imaging (many specimen areas are too thick). Another problem is the reaction of the specimen with the atmosphere during the transfer from the preparation stage to the microscope, which makes it very difficult to obtain the clean specimen surfaces that are needed in analytical EFTEM. Especially in high-resolution electron microscopy and electron holography the formation of amorphous oxidation and contamination layers on otherwise crystalline materials may seriously reduce the quality of high resolution images of the crystal structure.
The Future of Automation: A Microscopist’s Wish List
Authors: Crozier P A 
Published: July 2020

Abstract
The considerable improvements in computational power and the increased sophistication of programming techniques now make it possible to automate many aspects of electron microscopy [1]. Automation offers several important advantages over manual operation. Automation of microscope operation permits novice microscopists to obtain data relatively easily thus increasing instrument utilization. The experienced microscopist should be able to acquire data more rapidly and with greater ease compared to manual operation, resulting in increased efficiency. Alignment of energyfilters and proposed Cs correctors are difficult and time consuming even for experienced microscopist and stable alignment algorithms are critical for practical use. Automation is essential for extensive statistical sampling of microstructures and can permit experiments to be performed that were previously impractical. For example, spectrum imaging involves acquisition of thousands of spectra from a predefined area. The acquisition and processing of such large volumes of data cannot be accomplished without the aid of automation. The future prospects for automation are exciting, although it is important to carefully consider the relationship between the computer controlled microscope and the operator. Here I give a personal perspective on approaches to automation which increase the power and efficiency of modern transmission electron microscopes.
The degree of automation is an important consideration that is related to the complexity of the analysis strategy. Some analysis situations call for repetitive sampling of a well-defined quantity such as layer thickness or particle size. These simple repetitive operations are ideal candidates for total automation. For many applications of automation it is necessary not only to acquire the data but also to process the data and extract the quantity of interest.
High Resolution Backscatter Electron (BSE) Imaging using the Autrata Modified YAG BSE Detector: Comparison of an In-lens Hitachi S-900 FESEM with the Below-the-Lens Hitachi S-4700 FESEM
Authors: Erlandsen Stanley L , Chen Ya , Frethem Chris 
Published: July 2020

Abstract
To obtain high resolution backscatter electron (BSE) images in field emission SEM (FESEM), one must consider selection of accelerating voltage, beam current, working distance between the specimen and the backscatter detector (in-lens or below-the-lens position for the specimen), the type of BSE detector, and the type of metal used to coat the specimen to improve conductivity and signal collection [1]. A new generation of below-the-lens FESEM have been tested for BSE imaging on biological samples, but no information exists on whether or not high resolution imaging is possible. Here we report the comparison of detection of a colloidal gold standard (6, 12, 18 nm) by high resolution BSE imaging using Autrata-modified YAG detectors in an in-lens FESEM and in a below-the-lens FESEM.
Standards were prepared by mixing colloidal gold particles of 6 nm, 12 nm, and 18 nm. The gold particles were attached via poly-l-lysine to glass chips and coated with &lt;1 nm Pt by ion beam sputtering.
The Application of Ab Initio Direct Methods with Electron Diffraction for Solving Zeolite Structures
Authors: Sinkler Wharton 
Published: July 2020

Abstract
Recently a number of reports have been made in which direct methods (DM) were used to solve bulk inorganic crystal structures with electron diffraction (ED) data, either ab initio or in a combined approach using phase information from images. This paper reports ab initio application of DM to experimental ED data from the zeolite mordenite. Data from mordenite [001] were taken using a JEOL 3010 TEM at 300 kV. For collecting data, a small condenser and spot size were used to obtain a defocused probe 50 nm in size positioned over the edge of a thin area. Patterns were recorded with a CCD camera. Fig. 1 compares experiment with modeled kinematical data based on a published structure. Phase determination by DM was performed with the minimum relative entropy approach. As a test, ab initio DM was performed on modeled kinematical data.The result, shown in Fig. 2, is not distinguishable from a picture of the projected potential.
Real-time EELS spectra classification using Principal Components Analysis (PCA) and Artificial Neural Networks (ANN)
Authors: Åstrand P-G , Csillag S 
Published: July 2020

Abstract
Recent developments in detector technology [1] for EELS and Energy Filtered TEM has made possible to obtain large number of spectra and energy filtered images during very short exposure times. This in turn opens the exciting possibility of studying time dependent processes in the electron microscope, during exposure to the electron beam as well as the study of different radiation sensitive samples which are being degraded during lengthily data recording. This kind of data recording generates a large amount of data and manual data analysis should be avoided in order to be able to fully benefit from the improved sensitivity and increased speed of these new detectors. Thus a fast, real-time data analysis system is highly desirable.
A system for real-time data analysis (spectra classification) of data generated from such a detector has been simulated in a program based on the object oriented C++ framework ROOT [2][3].
Analysis of The Electronic Structure of Threading Dislocations in GaN Using Multiple Scattering Simulations
Authors: Arslan I , Browning N D 
Published: July 2020

Abstract
The promise of advanced technological applications in optical and electronic devices has led to a significant recent research effort in the structure-property relationships of defects in GaN. in particular, the major scientific issues arise from the high density of threading dislocations induced during thin film growth by film-substrate lattice mismatch. There is still debate as to the exact effect of these dislocations on the overall properties; they may or may not be electrically active and are thought to decrease the lifetime of devices. As such, a fundamental understanding of the electronic properties of these defects will facilitate the development of new and improved devices.
The analysis of the electronic structure of dislocations in GaN is performed here by a combination of atomic resolution electron energy loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) and multiple scattering (MS) simulations. Experimentally, a Z-contrast image of the dislocation core is obtained first1 and used to position the probe for EELS.
Effect of Shape on Solid-Liquid Phase Changes of Xe Precipitates in An Al Matrix
Authors: Mitsuishi K , Allen CW , Birtcher R C , Dahmen U 
Published: July 2020

Abstract
It is well known that rare-gas Xe atoms embedded in a crystalline Al matrix form precipitates having cuboctahedral shapes bounded by ﹛100﹜ and ﹛111﹜ surfaces1. Below a certain critical size, Xe precipitates are observed to be solid, even at room temperature. This is a result of the Laplace pressure, which is inversely proportional to the radius of the precipitate. Donnelly et al. reported that the critical size of Xe solidification was expected at 4nm in radius at room temperature.
Using high-resolution transmission electron microscopy, it is possible to observe these particles directly. It has been demonstrated that under off-Bragg conditions, the Al lattice fringes are minimized whereas the Xe lattice fringes are maximized. From such observations, it was confirmed experimentally that the average critical size of Xe precipitates is around 4 to 5nm in radius. However, much larger Xe precipitates are sometime observed to remain solid.
Pulse-Arc System for Investigation of Initial Fullerene Deposition
Authors: Murooka Y , Maede Y , Ozaki M , Hibino M 
Published: July 2020

Abstract
Since the discovery of fullerenes and carbon nanotubes, the deposits on arc electrodes produced at high gas pressure have been investigated intensely. Despite of the enthusiasm, little work was reported about the initial deposition processes. In principle, such processes could be followed by reducing the amount of products, i.e. a short discharge with a small current. In practice, however, this was prevented by two practical obstacles, arc instability and possible byproducts originated from reactions with remaining impurities in the vacuum chamber. In the present study, we reported a new kind of compact preparation system which allowed stable arc with a small current and a clean environment.
Figure 1 shows a schematic diagram of the system. For higher arc stability, the system had a small cylindrical shape which would reduce the effect of convection. Both electrodes were aligned on the axis inside the cylinder and their gap was adjustable by a micrometer.
Towards Property Nanomeasurments By In-Situ TEM
Authors: Wang ZL , Gao RP , Bai ZG , Dai ZR , Poncharal P , de Heer WA 
Published: July 2020

Abstract
Characterizing the physical properties of individual nanostructures is rather challenging because of the difficulty in manipulating the objects of sizes from nanometer to micrometer. Most of the nanomeasurements have been carried using STM and AFM. In this presentation, we demonstrate that transmission electron microscopy can be a powerful tool for quantitative measurements the mechanical, electrical and thermodynamic properties of a single nanostructure, such as a carbon nanotube or a nanoparticle.
Using a customer-built specimen holder, in-situ measurements on the mechanical properties of carbon nanotubes has been carried out using the resonance phenomenon induced by an externally applied alternating voltage [1]. If an oscillating voltage is applied on the nanotube with tunable frequency, resonance can be induced (Fig. 1). The bending modulus is calculated from the resonance frequency. The bending modulus is as high as 1.2 TPa (as strong as diamond) for nanotubes with diameters smaller than 8 nm, and it drops to as low as 0.2 TPa for those with diameters larger than 30 nm.