bluuebunny/crossref_metadata_2025_split huggingface dataset:
Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS
Authors: Wight Scott , Gillen Greg , Herne Tonya 
Published: July 2020

Abstract
The scattering of primary beam electrons has several implications for energy dispersive X-ray analysis on the environmental scanning electron microscope (ESEM). One of the most basic problems is determining the spatial distribution and fraction of primary beam electrons scattered under typical high pressure analysis conditions A method for studying the scattering of the primary electron beam in the ESEM has been demonstrated. The method involves the use of self-assembled alkanethiol monolayers (SAM) which are sensitive to damage by primary beam electrons. After irradiation, the electron damaged molecules can be exchanged out of the monolayer by immersion in a second alkanethiol solution. The spatial distribution of this second marker compound can then be imaged directly by static secondary ion mass spectrometry (SSIMS). Alternatively, only a single fluorinated thiol is used and the decrease in fluorine secondary ion signal is used to map the electron damage.
The Low Voltage Scanning Electron Microscope
Authors: Joy David C 
Published: July 2020

Abstract
A majority of the scanning electron microscopes (SEMs) now in use are probably employed as low voltage SEMs (LVSEMs), that is to say they are operated to produce beams with energies below 5keV. This trend away from the more conventional mode of operation at 20 or 30keV has gathered momentum over the past decade and has been driven by both theoretical and practical considera-tions.
Firstly, the distance travelled by an electron falls rapidly (in fact as about E1.6 ) as the incident ener-gy E is reduced. Images generated by low energy electron beams therefore contain enhanced surface information compared to those images recorded at higher energies. Since surfaces are of great inter-est in both the life sciences and in materials science this has been a persuasive factor. Secondly, both the secondary and the backscattered electrons now come from essentially the same interaction volume, rather than from volumes which are widely different in size and shape.
Effect of Specimen Bias on the Contrast of High Resolution Low Voltage SEM Images in a Semi-In-Lens JSM-6320f Fe-SEM
Authors: J.Liu  
Published: July 2020

Abstract
Nanometer-resolution surface imaging by secondary electrons (SE) is now routinely obtainable in field-emission SEM or STEM microscopes. The resolution in SE images obtained in a modern field-emission (FE) SEM is still limited by the electron probe size although the localization of the SE generation processes sets the ultimate resolution limit that will be achievable in SE images. The combination of a FE gun with improved probe forming lenses and detection systems makes it possible to image nanometer-scale surface features at low voltages. Because of the reduced electron beam range and the new SE detection system, image contrast formation in low voltage FE-SEMs is quite different to that in conventional SEMs. In a FE-SEM, SEs are detected through the combination of a strong magnetic field of the lens and a weak electrostatic extraction field of the detector. The detection efficiency varies with the energy of the emitted SEs.
Image Reconstruction in Atomic Force Microscopy
Authors: Goh M Cynthia 
Published: July 2020

Abstract
The atomic force microscope has been an essential tool in the past few years for visualization of mesoscopic structures, and has been applied to numerous examples in biological systems. The finite size of the probe tip, however, means that the picture produced by the AFM inevitably includes the tip geometry convoluted with the desired image of the sample. If the tip is asymmetric and/or deformed, the resulting image may bear little resemblance to the original sample. Even in the case of a “good tip”, however, the effect on the image is non-negligible, causing broadening and obscuring of features. In this presentation, approaches developed in our laboratory with regards to problems in imaging mesoscopic samples will be discussed.
In samples where the primary tip-sample interaction is via excluded volume - that is, the tip and sample are mutually impenetrable and come into contact - we had been utilizing a numerical algorithm for removing the tip geometry from the AFM image.
Topography of Nacre/Prismatic Growth Edge in Red Abalone by AFM
Authors: Graham Thomas , Sarikaya Mehmet 
Published: July 2020

Abstract
Formation and growth mechanisms of biological hard tissues are relevant in biomimetics for obtaining lessons in the assembly of complex and ordered microstructures for engineering applications. Shells of mollusks offer examples of organic/inorganic hybrid structures with nanoscale order that produce functionally-gradient macroarchitectures. Here, the nacre/prismatic interface of red abalone (Haliotis rufescens) was topographically profiled with an atomic force microscope (Park Scientific PC) using contact mode in air to elucidate growth characteristics of the shell. The results give a quantitative (spatial and temporal) measure of how nacre (N) grows over the prismatic (P) section of the shell.
Nine regions, with a length of 350 µm parallel to the growing edge and a width of 120 µm, were scanned (e.g., Figs 1 & 2). Raster scanning from N to the P sections revealed that the rms roughness of the surface tends to increase from N to P region with the latter having topographical height variations of up to 5 µm at the growing edge.
Scanning Probe Microscopy: Internet Resource Development and Integration into Undergraduate Curriculum
Authors: Kline RJ , Leonard DN , Batchelor AD , Russell PE 
Published: July 2020

Abstract
The Internet has become a very valuable educational resource. It allows a person to be able to reach a very large, diverse audience across the world with ease. With NSF Combined Research-Curriculum Development (CRCD) funding, we have begun to use the Internet as an educational and technical resource for people wanting to learn about Scanning Probe Microscopy (SPM). We have set up a web page with informative information for people of all levels of SPM knowledge. We are actively combining SPM research and education into the materials science and engineering undergraduate curriculum. We also use the web page as a way to publish our findings to help other universities integrate SPM into their curriculums.
The URL is: http://spm.aif.ncsu.edu
The web page is divided into seven main components. Each component has a specific intended audience and purpose. We have designed some components for people who have never heard of SPM and others for people who run SPM labs.
Scanning Electron Microscopy And Electron Probe Microanalysis Of Extraterrestrial Materials
Authors: Goldstein J I 
Published: July 2020

Abstract
One of the first samples analyzed by Castaing in his electron probe microanalyzer (EPMA) some 50 years ago was an iron meteorite. The Widmanstatten pattern microstructure of iron meteorites can be observed at very low magnifications ( Fig. 1). These meteorites are ideal samples for microanalysis because of the Ni gradient which extends over 10 to 1000 microns in the parent taenite phase of these Fe-Ni samples (Fig. 3). The Ni gradient is the result of very slow cooling of the iron meteorite, in terms of millions of years, within a parent'asteroid.
The scanning electron microscope (SEM) has been used to characterize the microstructure of meteorites, as well as samples from the moon and mars. For example, the microstructure of the dark etching taenite areas (T in Fig. 1) of the Carleton iron meteorite is shown in Fig 2. In this example, precipitates are observed along original martensite laths which form during the cooling of the iron meteorite at low temperatures.
The Nc State Analytical Instrumentation Facility
Authors: Phillips JR , Griffis DP , Russell PE 
Published: July 2020

Abstract
The Analytical Instrumentation Facility (AIF) is a laboratory composed of scientists and engineers specializing in the development and application of advanced techniques for materials characterization (http://spm.aif.ncsu.edu/aif/index.html)http://www.nice.org.uk/page.aspx?o=43210. AIF facilities include an extensive collection of analytical instrumentation utilized in teaching, research, and in support of academic and industrial programs. General forms of analysis include: electron, ion, and photon microscopies, surface science and analysis, and scanned probe microscopies. An abbreviated listing of AIF capabilities follows: metallography/sample preparation, optical microscopy, X-ray Diffraction (XRD), X-ray Fluorescence (XRF), Secondary Ion Mass Spectroscopy (SIMS), Secondary Electron Microscopy (SEM), Scanned Probe Microscopy (SPM), Micro-Raman Spectroscopy, Focused Ion Beam Micro-machining (FIBM), Auger Electron Spectroscopy (AES), and X-Ray Photoelectron Spectroscopy (XPS or ESCA).
AIF is a resource utilized not only by those within NC State requiring analytical services, but also by a large number of North Carolina non-profit and industrial organizations as well as the Materials Community at large.
Olis: On-Line Image Simulation And Structure Characterization For The Materials Microcharacterization Collaboratory
Authors: O'Keefe Michael A , Taylor John R 
Published: July 2020

Abstract
The Materials Microcharacterization Collaboratory (MMC), a pilot project of the DOE2000 program, links DOE-sponsored electron microscope user facilities at ANL, LBNL, ORNL and UIUC with that at NIST to form one collaboratory. The MMC brings the microcharacterization and microanalysis tools available in these national centers to geographically-dispersed researchers working in industries,universities, and government laboratories. It enables remote users to share on-line the instrumentation, knowledge and expertise available at the individual facilities making up the collaboratory.
On-line services available to users of the MMC may be classified as instrument, computational, and exchange services (fig. 1). LBNL's contribution to the MMC's instrumentation includes a Kratos EM-1500 HVEM (for remote in-situ high-voltage microscopy) and a Philips CM300 HREM (remote highresolution capability). DeepView is an exchange service that provides a common graphical userinterface (GUI) for control of MMC instruments over the wide area network (both the client and server sides of DeepView are available for download).
Switching Behaviour of Sub-Micron Magnetic Elements Studied By Tem
Authors: Chapman J N , Kirk K J , Herrmann M , McVitie S , Scheinfein M R 
Published: July 2020

Abstract
Magnetic elements in the micron and sub-micron size range are important for application as discrete bits in high density storage systems and as the active part of ultra-small magnetic sensors of the kind required in read heads. Patterning techniques based around electron beam lithography are used to fabricate elements with different sizes and shapes and TEM allows the magnetisation distributions they support to be investigated. Figure 1 shows a regular domain structure in a rectangular element of length 1μm. Of particular importance is the ability to observe directly how the elements respond to an applied field and thereby to gain information on magnetisation processes. When the fields required are in excess of a few 100 Oe, it is most convenient to use the vertical field of the objective lens. Field components in the specimen plane are then generated by tilting. For this technique to be effective it must be possible to choose an objective field strength appropriate to the elements under study and to have separate non-immersion lenses (Lorentz lenses) as the primary imaging or probeforming components.
Quantitative Electron Holography Of Magnetic Materials
Authors: McCartney M R 
Published: July 2020

Abstract
Off-axis electron holography is a powerful method for providing quantitative micromagnetic structure to nanometer-scale resolution. One of the main challenges in determining magnetic induction from reconstructed phase images is the separation of phase shifts due to electrostatic and thickness effects from magnetostatic effects. We have used in-situ magnetization reversal to remove electrostatic and thickness effects which would otherwise prevent quantification of the induction. The Philips CM200-FEG microscope which was used for the holography described here is equipped with a powerful mini-lens below the specimen enabling 2nm spatial resolution (∼5nm phase resolution) and only a small residual field at the sample. In addition, the objective lens field versus current has been calibrated so that external vertical fields over a wide range of values may be applied to the sample. Tilting the sample in the presence of the vertical field has the effect of ‘applying an inplane component. This combination of high spatial resolution, quantitative analysis and in situ capabilities allows for the study of individual defects and provides experimental input for comparison with simulations.
Raman Microscopy As A New Failure Analysis Tool In The Thermal Inkjet Cartridge Industry
Authors: Hammond Loma 
Published: July 2020

Abstract
In order to remain competitive in the rapidly growing inkjet printer industry, higher and higher demands are being made on print speed and print/image quality. As a result, the critical dimensions of thermal inkjet cartridge printheads are being constantly reduced in order to yield smaller ink droplets at higher frequencies. In order to enhance our laboratory’s ability to acquire vibrational spectral data from the increasingly small sample sizes encountered in failure analysis problems, a Raman microscope was recently added to our infrared microscopy laboratory.
The addition of a Raman microscope has increased our analysis capabilities in several ways. While infrared microscopy is diffraction limited at 10 μm, Raman microscopy can be used to study spot sizes as small as 1 μm in diameter. This has greatly expanded the range of particles which can be identified in our work. The Raman spectrum acquired of an adhesive particle in a printhead bore is shown in Fig.1.
Structure And Composition Of Grain Boundaries In SrTiO3
Authors: Kienzle O , Ernst F , Rühle Manfred 
Published: July 2020

Abstract
The electrical properties of SrTiO3 (strontium titanate) ceramics are strongly influenced or even dictated by grain boundary segregation of charged point defects, such as dopant atoms, impurities, vacancies, or self-interstitials. The atomistic structure of the grain boundaries, their energy, and the segregation of point defects mutually depend on each other. Grain boundary segregation of charged point defects induces the formation of space charge layers in the adjoining crystals. In order to investigate the relation between grain boundary structure and composition, grain boundaries in Fedoped SrTiO3 bicrystals and in SrTiO3 ceramics were studied by HRTEM and by AEM with subnanometer resolution.
Quantitative HRTEM served to investigate the atomistic structure of Σ=3, (111) grain boundaries in Fe-doped SrTiO3 bicrystals with a doping level of Fe/Ti= 0.04at% (Fig. 1). Analysis of the translation state revealed that the Σ=3, (111) grain boundary has an excess volume: normal to the boundary plane, the spacing between the two crystals exceeds what one would expect from a coincidence site lattice model by (0.06 ±0.01 )nm.
Interfaces In Glass-Containing Ceramics
Authors: Barry Carter C , Ravishankar N , Korte Carsten , Mallamaci MP 
Published: July 2020

Abstract
The interaction of a liquid with a solid substrate has been the subject of intense research since the early 1800s. The subject is relevant and very important even today from a basic science as well as technological standpoint. Liquid-phase-sintered oxide ceramics often contain a siliceous glassy layer in the grain boundaries which affect the properties of the ceramic. The wetting of the grain boundaries by the liquid has a strong dependence on the crystallography. While some boundaries are preferably wet, other special boundaries appear to be completely ‘dry’. The presence of the liquid film also affects the faceting behavior of the boundary plane. While several studies have been carried out on these intergranular glass films, many of the basic issues still remain unclear. The development of modern microscopy techniques facilitate the characterization of structure and chemistry at a high spatial resolution. This paper deals with the microstructural examination of two of the important issues involved with these intergranular films, i.e., faceting of grain boundaries in the presence of a glassy phase and the behavior of interfaces between two glassy phases of different compositions.
Mapping The Valence States of Transition Metals Across Interfaces By Energy-Filtered Tem
Authors: Wang ZL , Bentle J , Evans ND 
Published: July 2020

Abstract
Some properties of transition metal oxides are related to the presence of elements with mixed valences. In electron energy-loss spectroscopy (EELS), the L or M ionization edges of transition-metal, rare-earth and actinide elements usually display sharp threshold peaks known as white-lines. EELS experiments have shown that a change in cation valence state introduces a significant change in the White-line intensity ratio [1]. With the use of valence state information provided by the white lines, an experimental approach is demonstrated here to map the valence state distributions of Mn and Co using an energy-filtered transmission electron microscope (TEM). A spatial resolution of ˜ 2 nm has been achieved. This technique should be particularly useful in studying valence states of cations in magnetic oxides.
To map the distribution of ionization states, an energy window of ˜ 10 eV in width is required to isolate the L3 from L2 white lines (Figure 1).
Characterization Of Bonding At The Ni-Sio2 Interface Using Electron Energy-Loss Spectrometry
Authors: Taylor S T , Gronsky R 
Published: July 2020

Abstract
Changes in electronic structure and bonding at metal-oxide interfaces can have a pronounced influence on the macroscopic properties of the interface. This is particularly true for supported-metal catalysts, which feature nanometer-sized transition metal particles dispersed on an inert support such as A12O3 or SiO2. Variations in the d-band filling of the transition metal due to chemical bonding with the support could potentially alter the chemical activity of metal atoms near the interface, thereby affecting catalyst performance. This work investigates possible interface contributions to the performance of a model Ni- SiO2 catalyst system by directly assessing the nature of bonding at the metal-oxide interface. Electron energy-loss spectrometry (EELS) in the TEM is used to examine and quantify changes in the d-band occupancy of interfacial Ni atoms relative to the bulk, and to further relate these changes to interface chemistry.
The Ni d-band occupancy is evaluated using the integrated area under the Ni L2,3 edge in the energyloss spectrum, according to routines establishe-i previously.
Tem Investigation Of Precipitate Shapes And New Interface Phenomena In Al-Pb Alloys
Authors: Dahmen U , Johnson E 
Published: July 2020

Abstract
Transmission electron microscopy plays a key role in the investigation of precipitates and inclusions because it provides direct information at high spatial resolution, on their shape, orientation relationship, interface structure and composition.
This work has utilized high resolution and in-situ electron microscopy to study the equilibrium shapes and thermal behavior of Pb precipitates in Al. It was found that PB precipitates within Al grains form in parallel-cube orientation relationship, are cuboctahedral in shape, adopt a sequence of magic sizes, and display an increase in aspect ratio with decreasing size. These observations have been explained in terms of interfacial energy and residual strain energy.
When the same Pb precipitates form on grain boundaries, their shapes are significantly different. This is apparent from figure 1 which shows a 90° &lt;110&gt; tilt grain boundary in Al with a small cuboctahedral Pb precipitate in the upper grain and a large complex-shaped Pb particle on the grain boundary.
Dynamic Interfaces In Carbon Nanostructures
Authors: Ajayan P M , Banhart F 
Published: July 2020

Abstract
Carbon nanotubes and carbon onions are two fascinating forms of crystalline nanosize carbons that have received considerable attention in recent years (1,2). The remarkable physical properties of nanotubes make them valuable material for applications ranging from electronic devices to nanoprobes. The dimensions and topology of these structures make them fascinating objects for study. Multiwalled nanotubes and onions are made of concentric graphite layers, with different geometry. Singlewalled nanotubes on the other hand are made of singular graphene cylinders, often self-assembled into larger rope-like structures. Nanotubes can be produced in gram quantities using electric arc or laser ablation. Carbon onions, however, are structures that assemble from carbonaceous soot under intense electron irradiation in an electron microscope. Hence the onions are metastable structures that become unstable and disintegrate in the absence of irradiation.
The multiwalled carbon nanotubes and carbon onions have been shown to encapsulate foreign materials (metals, oxides, carbides), either during growth or by capillarity filling (in the case of nanotubes) (1), or during irradiation of metal containing soot (onions) (3).
Composition Distribution In Laterally Modulated Inalas Films
Authors: Twesten RD , Follstaedt D M , Mirecki Millunchick J , Lee S R , Norman AG , Arenkiel SP , Reno J L , Jones E D , Mascarenhas A , Zhang Y 
Published: July 2020

Abstract
Quantum confinement effects in opto-electronic materials have typically been limited to onedimensional confinement due to the constraints of epitaxial growth techniques. One method of forming higher degrees of confinement is the spontaneous lateral modulation seen in InAlAs shortperiod superlattices (SPS) grown on InP(00l). Here, a small number of monolayers (0.5 ˜ 2) of InAs and AlAs is alternately deposited by MBE to build a layer that exhibits lateral modulation on the 10 ˜ 25 nm scale. These materials show strong polarization and a large red shift (˜500meV) of the photo-emission spectra.
A key to understanding and predicting the properties of these films is determining their composition distribution. Using an HB-501 STEM, we have investigated the detailed composition distribution within a strongly modulated sample. The sample was grown in slight tension with respect to the InP substrate, a condition in which lateral modulation is known to be strong. Figure 1 shows a highangle annular dark-field (HAADF) image together with an intensity line scan from the image.
The 3d Parameters Of A (Nano)Crystal From Lattice Images At Two Tilts
Authors: Qin Wentao , Siriwardane Haresh , Fraundorf Phil 
Published: July 2020

Abstract
Various techniques have been developed to infer the 3D relationship of reciprocal lattice vectors from electron diffraction patterns taken at different specimen orientations. Such relationship is subsequently applied in crystallographic analyses. Due to the transmitted nature of the electron beam, TEM images present 3D information averaged throughout the thickness of the specimen on each micrograph. Techniques for acquiring 3D information from such images include stereomicroscopy for characterizing irregular dislocation networks, and 3D reconstruction of nonperiodic macromolecular assemblies. Prospects for finding the 3D lattice parameters of nanocrystals from HREM images taken at different specimen orientations have been discussed. Here we apply this stereo lattice imaging to a 7 nm crystal, and discuss its application to compact fee and bec lattices in general. Results on other lattice types will be published separately.
Generally 3 non-coplanar lattice vectors seen along 2 different zone axes are sufficient for inferring a subset of the 3D reciprocal lattice of a single crystal.