bluuebunny/crossref_metadata_2025_split huggingface dataset:
Teaching Microscopy by Workshop
Authors: Elaine C. Humphrey  
Published: July 2020

Abstract
The Biosciences Electron Microscopy Facility at UBC has at present two TEMs, one SEM, two confocals. several fluorescent light microscopes and an above average amount of digital imaging equipment used p by graduate students. The facility supports the Faculty of Medicine and the Faculty of Science and is run by a Director (myself) with one assistant. It is busy having an average of 600 individual users per year. The only way this number of users can be accommodated is by making them independent of staff. Training students had been previously on a one-to-one basis. This is very time consuming. Four years ago with no full time assistant, I decided to approach training in a different way. We started a confocal microscopy workshop aided by one PhD student.
We run a 1.5 day practical confocal workshop. It is one day as a group, giving the basic concept of confocal microscopy, and using the instrument from “this is how you switch the machine on” to “this is how you deal with the stack of images.”
Integration of Asset Management into a Multi-Instrument, Multi-Platform Microscopy Teaching Facility
Authors: Murphy Judy A 
Published: July 2020

Abstract
In a two year microscopy teaching program which includes 18 microscopy courses, there are thousands of images which must be collected from a variety of input devices running on various platforms. These must then be associated with different types of data files that need to be tagged to reports as well as being tagged to projects and courses. All of this information must be accessible, first to all those involved with doing the project as well as to anyone associated with needing the results. Tracking progress and security issues had to be part of the solution. It was also necessary that all of this take minimum staff time. Thus, we had to not only set up an image database, but truly an asset management system. Although it certainly would be possible to develop one’s own system, we are limited in staff time for such a project, and certainly didn’t want to re-invent the wheel if such a product was commercially available.
Remote Scanning Probe Microscopy and its Uses in Distancelearning and Educational Outreach
Authors: Ong Eddie W , Ramakrishna BL , Glaunsinger WS , Pizziconi VB , Razdan A 
Published: July 2020

Abstract
Abstract: Tele-microscopy has become a very active area of research and development in the 1990s where there was a desire to give researchers better access to expensive and specialized microscopes, breaking geographical and time barriers. Rapid advances in telecommunication, computers, and microscopy technologies make possible the establishment of the World Wide Web and the realization of the goal of developing a “laboratory without walls”. This provides unprecedented opportunities for researchers and educators alike to gain access to shared instrumental and educational resources.
In this presentation, a description of the Interactive Nano-Visualization for Science and Engineering Education (IN-VSEE) project will be given. The primary goals of IN-VSEE are to (i) convey the excitement of nanoscience and nanotechnology to promote studentmotivated learning and pursuit of science and engineering careers, (ii) teach fundamental interdisciplinary concepts in science and engineering using a visual format to help students learn and integrate information more effectively, (iii) provide students with the capability to routinely explore materials in three dimensions with resolutions at the nanoscale and even down to the atomic scale, and (iv) demonstrate the feasibility of remote operation of research-grade laboratory instrumentation for development into a powerful educational and collaborative tool.
Formal and Informal Microscopy Education at the University of Iowa Central Microscopy Research Facility: Project Centered Training
Authors: Nessler Randy , Potter Ryan , Stahl Jodi , Wilson Katina , Moninger Thomas , Moore Kenneth 
Published: July 2020

Abstract
The University of Iowa Central Microscopy Research Facility (CMRF) has been in existence for 27 years. Starting out as a transmission electron microscopy (TEM) research laboratory, the facility has offered formal college courses. These courses require that students identify a project to investigate during the semester. Theory from the formal lecture is reinforced by work performed in the laboratory session. From its modest beginnings, the CMRF has continually grown. Currently, the facility offers two Confocal microscopes, two Scanning Electron Microscopes, a Scanning Probe Microscope, Energy Dispersive Spectroscopy, a Mossbauer spectrometer, a PTI Ion Imaging/Ratio system, a Freeze Fracture apparatus, and three light microscopes equipped with CCD cameras. Techniques range from routine histology to in-situ hybridization. Technological advances over the history of the facility have not been confined to the lab. in the past, most lectures were given using overheads and 35mm slides.
An XML Language Template Design for Managing a Remote Instrument Educational Outreach Project
Authors: Lazarevich A , Carragher B , Potter CS , Weber D 
Published: July 2020

Abstract
For the past two years we have been operating a remote instrument educational project called Bugscope. Bugscope is an educational outreach project that provides access to an environmental scanning electron microscope (ESEM) for K-12 classrooms. While the operational aspects of the project require a minimal amount of staff time, the information management for the project is difficult for a small microscopy research group to support without a significant allocation of resources away from the group’s principal research goals. in an effort to alleviate this problem we have begun, in the past five months, to develop a software toolkit called ‘Information Technology for Outreach Projects’ (ITOP) - using the Bugscope project as a test bed. The goal of ITOP is to make it practical for academic research groups to provide scientific resources for educational outreach projects by automating many of the administrative and data handling tasks.
Digital Imaging: Emerging Technologies
Authors: Mackenzie John M 
Published: July 2020

Abstract
This invited paper will address several emerging technologies that have an impact on scientists moving into digital imaging technology and raise a few concerns about this digital technology that may not have reached our group.
The quality of inkjet printers has moved forward at a staggering rate. The latest printers from Epson (the 900 series) have achieved a milestone in image quality that is very significant and yet is difficult to find in the specification sheet. The “dots” which the company claims can be as small as 3 picoliters are sufficiently small that they cannot be seen with the naked eye. with an improved algorithm, the image quality in 1440 × 720 mode is as good as any dye-sublimation printer. The current 980 when printing in 1440 mode prints at twice the speed as the older 900. At only $250, it actually becomes cost effective to replace 900's with 980's solely based on the amount of time that is saved (even at a University).
Investigation of The Self-Assembly of Chiral Molecules At Liquidsolid Interfaces Using Scanning Tunneling Microscopy Chemical Marker Groups: Driving Forces for 2-D Separation of Chiral Species
Authors: Yablon Dalia , Flynn George 
Published: July 2020

Abstract
Self-assembly of molecules on surfaces is fundamentally a process whereby individual molecules, separated in the gas or liquid phase, fonn ordered arrays on a surface. The driving forces for these self-assembly processes are the attractive and repulsive interactions among the molecules themselves and between the molecular assemblies and the surface. Since physisorption causes minimal perturbation of chemical bonds, studies of physisorbed species provide an extremely convenient method for investigating issues of molecular structure, conformation, orientation and dynamics of molecules in their “natural” state. The two dimensional nature of the interface introduces constraints that can be used advantageously to separate and identify novel structures.
Control and manipulation of self assembly and molecular conformation is one of the key issues often cited in efforts to develop nanotechnology initiatives for the next generation of electrical and mechanical devices. The development of molecular electronic devices based solely on organic materials will also require careful control and manipulation of molecular assemblies as well as the conformations and orientations of the molecules and functional groups within these arrays.
Functional Group Contrast in Scanning Tunneling Microscopy Images of Substituted Phenylethers
Authors: Musselman I H , Kangasniemi K H , M. Lubag A J , Franceschetti J K , Lee H S , Iyengar S 
Published: July 2020

Abstract
Numerous scanning tunneling microscopy (STM) studies of adsorbates at gas/solid and liquid/solid interfaces have been reported. Although early STM experiments of these systems were concerned primarily with visualizing molecules at the atomic level, the focus has shifted to extracting chemical information from STM images, including the identity of atoms or of functional groups within an adsorbed molecule. However, STM image interpretation continues to be an immense challenge and one currently debated issue of critical importance is the mechanism(s) by which the image contrast reveals atomic and molecular structure. Recently, a combination of electronic and geometric factors was proposed. The electronic factor addresses the coupling between the energy levels of the adsorbate and the Fermi level of the surface whereas the geometric factor is related to the spatial overlap between the STM tip and the functional group.
A previous study in our laboratory of a homologous series of para-halogenated phenyloctadecyl ethers (X-POEs, where X = H, CI, Br, I), physisorbed onto highly oriented pyrolytic graphite (HOPG), revealed a bias-dependent contrast in STM images resembling calculated (HyperChem) electron density contours of bonding molecular orbitals.
Proximal Probe Microscopes: tools for Nanotechnology
Authors: Li Xiaomei , West Paul 
Published: July 2020

Abstract
Proximal Probe Microscopes are emerging as powerful tools for facilitating nanotechnology and nanoscience innovations. Probe microscopes operate by moving a nanoscopic probe across a surface in a raster motion. A surface topographic image is generated by displaying on a computer screen the three-dimensional motion of the probe, and hence a three-dimensional rendering of the surface. in addition to providing a standard magnified view of a surface associated with traditional microscopes, proximal probe microscopes provide quantitative height information. The primary factor establishing resolution in a probe system is the diameter of the probe. with recent advances in probe microscope techniques it is possible to measure more than three-dimensional surface profiles. Examples include measuring surface physical and chemical properties, manipulating objects on a surface, and altering surface properties.
In an atomic force microscope the probe is placed in the vicinity of a surface, and various types mechanical properties may be measured. For example, mechanical properties such a surface hardness and elasticity are measured by monitoring the mechanical interactions between the probe and a sample’s surface. in one such method, the probe is vibrated above the surface and the phase and amplitude of the probe’s vibration depends on the mechanical properties of the surface; Figure 1 illustrates this technique.
Noninvasive Probing of Redox Reactions in Single Living Cells by Scanning Electrochemical Microscopy (SECM)
Authors: Mirkin M V , Liu B , Rotenberg S A 
Published: July 2020

Abstract
We reported recently the first application of the scanning electrochemical microscope (SECM) to probe the redox activity of individual living cells. The possibilities of measuring the rate and investigating the pathway of transmembrane charge transfer (CT) were demonstrated. Significant differences were detected in the redox responses given by normal human breast epithelial cells (MCF-10A) and metastatic breast cancer cells (MDA-MB-231). Here, we demonstrate that the intracellular redox potentials and concentrations of redox components in the cell can be evaluated noninvasively by the SECM. Such measurements provide mechanistic explanation of the observed differences in cell redox activities.
In SECM, a microscopic electrochemical sensor, usually called the tip, is scanned over the surface of a sample, and topographic images and maps of chemical reactivity across the surface are obtained. The schematic diagram of such measurements is shown in Figure 1. The oxidized (or reduced) form of redox species initially present in solution reacts at the surface of the ultramicroelectrode tip.
Observation of Magnetic Film Using Magnetic Force Microscope (MFM) in Ultra-High Vacuum (UHV)
Authors: Suzuki K , Kitamura S , Mooney C B 
Published: July 2020

Abstract
In recent years, the magnetic force microscope (MFM) has been used not only for the evaluation of magnetic media but also for the measurement of magnetic characteristics of quantum dots as well as in various fields, because the MFM can visualize magnetic field on the sample surface with the high resolution. The MFM observation in ultra-high vacuum (UHV) requires to reduce the adsorption layer on the sample surface for high resolution observation. The slope detection mode using the variation of vibrating cantilever is basically unstable in UHV due to the increase in the Q factor of the cantilever. Accordingly it has been used for the MFM observation in air. On the other hand, the FM detection technique offers a very high sensitivity because of the high Q factor.
This repot describes the MFM technique to take a magnetic image steadily in UHV. We observed the surface of a magnetic material with MFM technique in UHV, and compared the slope detection technique, the phase detection technique using phase variation of cantilever vibration, and the FM detection technique.
New Automated Analytical Integration for TEM Operation
Authors: Dingley DJ , Mainwaring PR , Sandborg J A , Tiner M , Wright S I 
Published: July 2020

Abstract
Current trends seek to make TEM operation more routine and productive. One of these follows the lead made in scanning electron microscopy in which the spatial distribution of crystallographic data over a selected area of a sample surface is determined by automated recognition of Backscatter Kikuchi patterns (EBSD), Adams et al. This method has been extended to the TEM in a novel manner, Wright et al. Dark field images are collected sequentially from the area of interest for all possible incident beam directions over a solid cone of semi-apex angle up to 4 degrees, Figure 1. The images are recorded directly into a computer. Off line automated analysis follows in which all dark field images are searched to determine the beam conditions under which each pixel in the image brightens, i.e. when the corresponding point in the sample came into a diffraction condition. The measurement of three such non-coplanar conditions for a pixel leads to the determination of the corresponding crystallographic orientation. The accuracy of orientation measurement has been improved to 1 degree by the fitting of the determined diffraction vectors to the surface of the Ewald sphere. The analysis allows grain maps to be reconstructed from which grain size distribution can be automatically determined. Figure 2.
Complete Identification using Spectral Imaging, Compass, and Phaseid
Authors: Camus Patrick P , Dow Audrey A , Rohde David B 
Published: July 2020

Abstract
The complete and accurate identification of all of the phases present in a sample is the ultimate goal of any materials investigator. The identification should include compositional as well as crystalline measurements for unique characterization. in an SEM, the composition of individual regions can be routinely determined via EDS or WDS analysis. The main limitation is the need to visually identify the individual regions from the images alone. A method to limit this restriction is to collect x-ray maps of the field-of-view. This technique has the benefit of providing the spatial distribution of the elemental species, but requires knowledge of all of the elements of interest before the start of the analysis and composition quantification cannot be performed with data only from the maps. Another disadvantage is the possibility that materials may have similar compositional analyses but may be different phases only manifested by crystallographic means.
A better method of complete phase identification involves the collection and analysis of spectral images and the subsequent crystallographic phase identification via EBSD. Spectral imaging consists of the collection of complete EDS spectra at each location within a field-of-view. From this 3-D data set, a series of elemental maps may be extracted for visualizing the spatial distribution of any elements of interest. This data set is especially useful because elements, and even characteristic x-ray lines, can be fully analyzed after the data collection with total flexibility.
Benefits of a Cs-Corrector for Material Science
Authors: Kabius B , Haider M , Uhlemann S , Schwan E , Urban K , Rose H 
Published: July 2020

Abstract
One of the limiting parameters in high-resolution transmission electron microscopy (HRTEM) are the high values for the spherical aberration Cs of the objective lens, which are the reason, that for TEM's with field-emitter the point resolution at Scherzer defocus is about two times lower than the information limit. Another effect of Cs-values of about one mm is the rather large disc of least confusion, which contributes to a high amount of contrast derealization. Furthermore the images are very sensitive towards beam tilt. These disadvantages contribute to a difficult interpretation of HRTEM-images especially at interfaces and defects. In-situ applications as well as diffraction contrast experiments require a gap of at least ten mm between the pole pieces. For the present TEM's this degrades the resolution at an acceleration voltage of 200 kV to approximately 0.27 nm. Cs-correction offers the ability to combine high resolution with a large space for the sample, which can be used for in-situ experiments.
Recently, we have constructed a lens system for Cs-correction based on hexapole lenses for a commercial 200 kV instrument equipped with a field emission gun. This system allows choosing the Cs-value between +2.0 mm and -0.05 mm. The objective lens of the microscope has a Cs value of 1.2 mm resulting in a point resolution of 0.24 nm.
New Ultra-High-Resolution TEM Cameras
Authors: Favia Paola , Hunt John , Joyce David , Mooney Paul , Pan Ming 
Published: July 2020

Abstract
TEM image acquisition is subject to limitations in resolution imposed by the physics of the position-sensitive detection process. in existing on-line digital cameras detection consists of scintillation, image transfer and photon detection by a CCD. Scintillator resolution is governed primarily by the incident beam energy. Material parameters affect the resolution only weakly. Some improvement can be made with a thin transmission scintillator. Still, backscatter of electrons from below can form a noisy background. Optical transfer resolution also has an important effect on overall camera system resolution. Leakage of light within scintillator, between fibers, at interfaces, and the inherent resolution loss due to binning into a finite pixel all contribute to optical resolution loss. This point spread function is narrower than the electron point spread function above 100kV but has an affect at all voltages. Long-range light leakage (psf tail) affects the background noise in diffraction work where there is often a 10e6 ratio between central peak and diffraction spot of interest. Thus, the number of resolved pixels in a TEM image detector is limited by the area of the detector, the effective thickness of the scintillator and the quality of the image transfer.
Gatan has developed several improvements which will address both electron and lightoptical resolution loss.
Alpha-Null Defocus: an Optimum Defocus Condition with Relevance for Focal-Series Reconstruction
Authors: O’Keefe Michael A 
Published: July 2020

Abstract
Two optimum defocus conditions are well known to users of high-resolution transmission electron microscopes. Scherzer defocus is useful in high-resolution electron microscopy (HREM) because it produces an image of the specimen “projected potential” to the resolution of the microscope. Lichte defocus is useful in electron holography because it optimizes sampling in frequency-space by minimizing the slope of the microscope objective lens phase change out to the highest spatial frequency in the hologram, consequently minimizing dispersion. For focal-series reconstruction, the requirement to maximize transfer into the image of high-frequency diffracted beam amplitudes leads to a third optimum defocus condition.
Image reconstruction methods allow the achievement of super-resolution - resolution beyond the native (Scherzer) resolution of the microscope - by correction of the phase changes introduced by the microscope objective lens. One such method is focal-series reconstruction, in which diffracted-beam information obtained at several different focus values is combined. to produce a valid super-resolution result, it is necessary to ensure that every spatial frequency is represented appropriately. Suitable choice of an optimum defocus produces optimum transfer of diffracted-beam amplitudes at any chosen spatial frequency.
1-MV Field-Emission Transmission Electron Microscope
Authors: Tonomura Akira 
Published: July 2020

Abstract
We developed a 1-MV field-emission transmission electron microscope to help in further improving electron holography, Lorentz microscopy, and high-resolution electron microscopy. This microscope is characterized by an electron beam having the highest brightness ever, 2×1010 A/cm2, and by the highest lattice-resolution below 0.5 Å. These two features were attained by minimizing the mechanical vibration of the whole column and by improving the stability of both the electron beam and the high voltage. If the tiny electron source located at the top of the 7-m-high microscope moves by as little as a fraction of the source size, 50 Å in diameter relative to the column, due to mechanical vibration or beam deflection by the AC magnetic fields, the beam brightness will be greatly degraded. If the ripples ΔE of the high-voltage E exceed ΔE/E = 5 × 10−7 /min, then the inherent monochromatic feature of the beam is deteriorated by the increase in energy spread.
Through the preliminary experiments testing the vibration and magnetic shielding of the acceleration tube as well as the high stability of the high voltage, and through the numerical simulations on the vibration modes of the whole column, we were led to the conclusion that the microscope must be separated into three parts that are connected by cables.