bluuebunny/crossref_metadata_2025_split huggingface dataset:
Characterization of rutile (110) surface structure by REM
Authors: Wang L. , Liu J. , Cowley J. M. 
Published: June 2020

Single crystal TiO2 (rutile) (110) surface has been characterized by several experimental techniques. In this paper, we report the investigations of “optically polished” as well as high temperature oxygen annealed rutile (110) surfaces by using reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) techniques.The crystal was purchased, “optically polished” as-received, from Commercial Crystal Laboratories, Inc.. The details in specimen cutting and surface cleaning procedures have been reported previously. The samples were annealed in pure oxygen at 1425°C for 36 h. The experimental observations were carried out in a Philips 400T microscope operated at 120 kV. The REM images were obtained by selecting the specular reflection spots satisfying surface resonance conditions.Figure 1 is a REM image of as-received rutile (110) surface. The corresponding RHEED pattern is shown in the inset. The azimuthal angle of the incident beam was at 3.9° away from [001] zone axis and the image was formed by choosing (440) specular reflection spot under surface resonance condition.
Use of pattern recognition tools for classifying particles into homogeneous groups
Authors: Hopke Philip K. 
Published: June 2020

Computer-controlled scanning electron microscopy (CCSEM) permits the characterization of size, shape, and composition of individual particles and thus provides a rich source of data to identify the origin of ambient airborne particles. The problem is how to make best use of this information. The general procedure has been to assign each particle to a class of similar particles based on its x-ray fluorescence spectrum. The initial efforts developed the class characteristics and classification rules in an empirical fashion. Recent studies have suggested that greater specificity and precision in the subsequent class balance analysis can be obtained if particle classes are more homogeneous.Data screening and transformation are the initial steps in the analysis procedure. Noise reduction is the first step in analyzing the CCSEM data. Determination of elemental chemistry for individual particles is accomplished by collection of characteristic X-rays. The X-ray fluorescence peaks are obtained as a result of a photon counting process having a Poissonian distribution.
Vibrational spectroscopic techniques for surface and microanalysis of materials
Authors: Koenig Jack L. 
Published: June 2020

There is an increasing awareness of the deleterious effects of inhomogeneities on the properties of solids. With this concern comes the need for microanalytical techniques which can yield information not only about the number, size and shape of the inhomogeneities but also their composition and structure. Determination of the structure and composition of the micro-inhomogeneities require the use of spatially-resolved spectroscopic techniques.Space-resolved spectroscopic techniques are here defined as microanalytical methods which can generate a spectrum spatially resolved in 1, 2 or 3 dimensions from a sample. In one dimension, one obtains a spectral profile, in two-dimensions, a spectral map and in three-dimensions, a spectral image. These spectral methods are ultimately “chemical microscopic” techniques because they couple directly the spectroscopic information (chemical entities) with space information. The maps or images display the spatial distribution of the local chemical environments arising from concentration and structural gradients in the sample. In many cases, very good spectra can be obtained from volumes of a few cubic microns, typically 10−11 grams of matter.
Electron-probe microanalysis of silicon implanted with oxygen and nitrogen
Authors: Dijkstra J.M. , Bastin G.F , Heijligers H.J.M. 
Published: June 2020

High dose ion implantation is a promising technique to form a silicon-on-insulator material. Possible ions for implantation are oxygen and nitrogen, to form insulating layers of buried silicon-oxide and silicon-nitride, or a combination of oxygen and nitrogen, to form silicon oxynitride.One of the problems in analyzing the results of an ion implantation is that it is hard to establish the depth-distribution of the implanted ions in a straight-forward way. Several techniques are available; each of them with their own advantages and disadvantages. A promising approach might be in-depth profiling with the electron probe microanalyzer.The first step in this analysis method is to accurately measure the k-ratios of all the elements involved at a range of accelerating voltages, starting at as low a voltage as possible.The second step is to analyze these measurements with a sophisticated multi-layer analysis (MLA) program. In our laboratory we use an MLA program based on our "PROZA"-bulk correction program, of which we previously explained how it can be expanded to a thin film analysis program.
Electrical microcharacterization of Si-TaSi2 eutectic composites
Authors: Hefter J. , Rossoni P. G. 
Published: June 2020

Semiconductor-metal eutectic composites, formed by directional solidification from the melt, are composed of arrays of continuous metallic fibers contained within a single-crystal semiconductor matrix. Such composites contain rods having diameters of ≈1 μm with inter-rod spacings on the order of 10 μm. These rods form cylindrical Schottky junctions with the Si and can be used as the basis for a variety of electronic and optoelectronic devices, including photodetectors and bulk field effect transistors. Electron beam induced current (EBIC) measurements permit the determination of the depletion zone surrounding the active regions of a semiconductor material. This method has been used to examine the carrier concentration in a Si-TaSi2 eutectic composite.A portion of an oval transistor mounted on a semiconducting wafer consisting of Si-TaSi2 eutectic material with contacted rod elements was studied. The rods were selectively contacted by a deposited CoSi2 film which provided an ohmic contact to the TaSi2 rods yet formed a rectifying Schottky barrier with the Si matrix.
Environmental application of LAMMS technique for stone deterioration
Authors: Tsugoshi Takahisa , Hiroi Hidemi , Kikuchi Tadashi , Furuya Keiichi 
Published: June 2020

Recently, architecture deterioration, one of serious problems in Europe and America, has become to be observed conspicuously in Japan. It is confirmed that the deterioration is caused due to not only natural weathering but the acid rain. The deterioration mechanism, however, is still unknown. For a environmental sample, a technique of micro- and chemical analysis for insulators is required just like LAMMS. In this study, LAMMS was applied to "Oya-ishi", a kind of green tuff which is a kind of common building stone in the Tokyo and its vicinity, Japan.Samples were collected at six sites in this district as shown in Fig. 1. Sample A and C were taken from fences along the arterial highway. Sample B and D were taken from fences along the back alley. Sample E and F were taken from fences along the alley at residential area. Site A-D were in the center of the Tokyo metropolitan area, and Site E and F were in the northern and western suburbs.
Si(Li) detector for microanalysis cooled by thermoelectric device
Authors: Barkan Shaul 
Published: June 2020

Cooling down solid state detecors, with other different way then liquid Nitrogen, is a goal of many vendors and customers since the invention of these detectors. THe disadvantage of the common way of liquid Nitrogen is first the inavailibility of the LN in many uses (like space military and any other applications that are not done inside a well organize Laboratory). The use of LN also considers as a Labor consumer in addition to the big dewar that has to be added to any detector for storing the LN, the boiling of the LN, may cause microphonics problesm and the refiling of the dewar in many Labs is a complicated process due to inconvenience location of the microscope.In this paper I will show a spectra result of 10mm2 SiLi detector for microanalysis use, cooled by peltier cooler. The peltier cooler has the advantage of non-microphonics and non-labor needed (like adding LN to the dewar).
ELNES of Iron Compounds
Authors: Kurata Hiroki , Nagai Kazuhiro , Isoda Seiji , Kobayashi Takashi 
Published: June 2020

Electron energy loss spectra of transition metal oxides, which show various fine structures in inner shell edges, have been extensively studied. These structures and their positions are related to the oxidation state of metal ions. In this sence an influence of anions coordinated with the metal ions is very interesting. In the present work, we have investigated the energy loss near-edge structures (ELNES) of some iron compounds, i.e. oxides, chlorides, fluorides and potassium cyanides. In these compounds, Fe ions (Fe2+ or Fe3+) are octahedrally surrounded by six ligand anions and this means that the local symmetry around each iron is almost isotropic.EELS spectra were obtained using a JEM-2000FX with a Gatan Model-666 PEELS. The energy resolution was about leV which was mainly due to the energy spread of LaB6 -filament. The threshole energies of each edges were measured using a voltage scan module which was calibrated by setting the Ni L3 peak in NiO to an energy value of 853 eV.
Temperature-Dependent EXELFS of Chemically Ordered and Disordered Fe3Al
Authors: Okamoto James , Ahn Channing , Fultz Brent 
Published: June 2020

A parallel detection system makes possible quantitative studies of extended electron energy-loss fine-stucture (EXELFS). We are studying the short-range chemical order and local thermal vibrations of chemically ordered and disordered Fe3Al foils using transmission EXELFS. The average number of Fe atoms in the first nearest-neighbor (1nn) shell surrounding the Al atoms in chemically ordered and chemically disordered materials are determined by comparing our data with ab initio EXAFS calculations. The mean-squared relative thermal displacements between the Al atoms and their 1nn shell are roughly determined by our temperature-dependent data.Chemically disordered Fe-27at%Al and Fe-25at%Al samples were prepared by piston-anvil quenching. Some samples were annealed at 300 °C for over a day to develop DO3 order. Aluminum K edge spectra were collected with a Gatan 666 parallel detection magnetic prism spectrometer attached to a Philips EM 430 electron microscope. Room temperature spectra were collected from submicron regions of the Fe-27Al samples with 300 keV electrons and a beam current of 10 nA.
In-Situ Electron Energy Loss Spectroscopy of Silicon Carbide Crystals During Electron Irradiation After Hydrogen Ion Implantation
Authors: Hojou Kiichi , Furuno Sigemi , Otsu Hitoshi , Izui Kazuhiko 
Published: June 2020

Observations of damage structure and analysis of compositional changes are important to elucidate the fundamental process of radiation damage in ion-irradiated ceramics. We have developed an in-situ observation system consisting of a 100 keV transmission electron microscope linked with both an ion accelerator and a parallel electron energy loss spectrometer (P-EELS), as shown in Fig.1[1,2]. Using this system, the plasmon loss peaks of SiC crystals were found to shift to the lower energy side during hydrogen ion irradiation at room temperature (RT)[3].The present paper reports the results of in-situ observation and analysis by P-EELS of SiC crystals during hydrogen ion irradiation and the effects of 100keV electron irradiation after hydrogen ion implantation.Specimens used in the present work were SiC sintered crystals supplied from Hitachi Research Lab., Hitachi LTD. Thin films suitable for electron microscopy were made by 2-4 keV Ar+ions etching after mechanical polishing and then irradiated with 10keV H2+ions by use of ion accelerator combined with EM at RT and 800 °C, respectively.
Gaussian ϕ(ρz) curves: Comparison with other models
Authors: Riveros Alberto , Castellano Gustavo 
Published: June 2020

X ray characteristic intensity Ii , emerging from element i in a bulk sample irradiated with an electron beam may be obtained throughwhere the function ϕi(ρz) is the distribution of ionizations for element i with the mass depth ρz, ψ is the take-off angle and μi the mass absorption coefficient to the radiation of element i.A number of models has been proposed for ϕ(ρz), involving several features concerning the interaction of electrons with matter, e.g. ionization cross section, stopping power, mean ionization potential, electron backscattering, mass absorption coefficients (MAC’s). Several expressions have been developed for these parameters, on which the accuracy of the correction procedures depends.A great number of experimental data and Monte Carlo simulations show that the general shape of ϕ(ρz) curves remains substantially the same when changing the incident electron energy or the sample material. These variables appear in the parameters involved in the expressions for ϕ(ρz). A good description of this function will produce an adequate combined atomic number and absorption correction.
Site Occupation of Ternary Element in an Alti Compound by Alchemi
Authors: Yunrong Ren , Ya Xu , Zuqing Sun , Guoliang Chen 
Published: June 2020

Site occupation of alloying additions in AlTi compounds is important for high temperature alloys development. In this paper, we intend to locate the ternary element Nb in an AITi compound using the ALCHEMI technique. With the L10_type structure, the planes of either (110) or (001) are composed of Al and Ti atoms alterately. Therefore, the ternary element dissolved in the AITi compound can be easily located by ALCHEMI technique[1,2].A Specimen of 51.1 at%Al-41.5at%Ti-7.4at%Nb alloy was used. The structure of this specimen is composed of AlTi, Ti3Al, and other intermetallic compounds which were examined by x_ray diffraction and electron diffraction. The electron micrograph of Fig. 1 shows the compounds structure with lamellar features. Lamellae of AlTi phase of about 1 μm in width were chosen for analysis. The composition of this AlTi phase is about 45at%Al, 44at%Ti, and 11 at%Nb by x_ray analysis in non_channelling condition.
Kinematical and Dynamical CBED Pattern Models: Increasing the Accuracy of the Unit-Cell Parameter Measurements Based on CBED Patterns
Authors: Yadhikov I.N. , Maksimov S.K. 
Published: June 2020

Convergent beam electron diffraction (CBED) is widely used as a microanalysis tool. By the relative position of HOLZ-lines (Higher Order Laue Zone) in CBED-patterns one can determine the unit cell parameters with a high accuracy up to 0.1%. For this purpose, maps of HOLZ-lines are simulated with the help of a computer so that the best matching of maps with experimental CBED-pattern should be reached. In maps, HOLZ-lines are approximated, as a rule, by straight lines. The actual HOLZ-lines, however, are different from the straights. If we decrease accelerating voltage, the difference is increased and, thus, the accuracy of the unit cell parameters determination by the method becomes lower.To improve the accuracy of measurements it is necessary to give up the HOLZ-lines substitution by the straights. According to the kinematical theory a HOLZ-line is merely a fragment of ellipse arc described by the parametric equationwith arc corresponding to change of β parameter from -90° to +90°, wherevector, h - the distance between Laue zones, g - the value of the reciprocal lattice vector, g‖ - the value of the reciprocal lattice vector projection on zero Laue zone.
Recent developments with blind deconvolution for 3-D light microscopy
Authors: Holmes T.J. , Bhattacharyya S. , O'Connor N. , Ancin H. , Gregorio J. , Roysam B. , Szarowski D. , Turner J.N. 
Published: June 2020

A novel deblurring method is under development for 3D light microscopic image deblurring, including the widefield fluorescence, confocal fluorescence and transmitted light brightfield modalities.The main practical advantage of the approach is that it does not require the point spread function (PSF) to be measured. It produces a reconstruction of the PSF along with the deblurred image, which is possible because we mathematically constrain the PSF to have physically justified and reasonable properties, such as bandlimitedness, a missing frequency cone (for widefield) and nonnegative values.Recent developments have included robustizing the reconstruction for confocal data, so that it will repeatedly perform well under various adverse conditions and for a wide variety of sample types. Among other refinements, additional PSF mathematical constraints are being integrated.Evaluation testing is underway with known fabricated test objects. An example is shown in Fig. 1. A specially drawn glass micropipette tip was filled with 0.2% eosin, mounted in Refractive Index Liquid (n= 1.460; Cargille Labs, NJ) and scanned with a BioRad MRC 600 confocal microscope having a 40X, 1.0 N.A. oil objective lens.
Correlation of micromagnetic structure and microstructure in thin film longitudinal magnetic recording media
Authors: Tang Kai 
Published: June 2020

Lorentz transmission electron microscopy (LTEM) has long been used as a tool for imaging the magnetic domain structure in materials and has occasionally been applied to thin film longitudinal magnetic recording media. Conventional/high-resolution electron microscopy (TEM) has shown its power in revealing the detailed microstructure of these materials. The combination of these two techniques can result in a more complete understanding of the interdependence of micromagnetic structure and microstructure and provide insight into how to improve the magnetic performance.LTEM requires specimens with large uniformly thin areas so that the deflection angle of the incident electron beam is proportional to the magnetic field within the specimen plane. Conventional specimen preparation methods, which normally generate a wedge, are therefore no longer suitable. Previous work has used specially designed substrates to facilitate preparation of LTEM specimens of Co alloy/Cr magnetic media. In the present study a chemical etching technique was introduced to successfully produce LTEM specimens directly from the C/Co alloy/Cr/NiP/Al(substrate) structures, typical of those currently used in the magnetic disk industry.
A new approach to alchemi: the ordering tie line method
Authors: Hou D.H. , Fraser H.L. 
Published: June 2020

The ALCHEMI (Atom Location by CHanneling Enhanced Microanalysis) technique has been first developed by Spence and Taftø to determine site occupancies of alloying elements in ordered crystals. Based on their work, a number of formulations have been developed to improve'the accuracy by using multivariant analysis, to extend the analysis to a more general case, and to incorporated anti-site defects and derealization effect. However, all these formulations can be replaced by a new formulation based on the Ordering Tie Line (OTL) concept.The OTL concept can be illustrated by using a ternary compound (C°=AxByCz), with a B2 crystal structure, as an example. In the B2 crystal structure (Fig.1), the sublattices of α and β can be treated as two ' phases" with compositions Cα and Cβ (for B2 ordering ⇔ Cα ≠ Cβ). The OTL is then defined as the tie-line connecting Cα and Cβ(Fig. 1). Similar to a regular tie-line, the OTL describes mass conservation in a B2 crystal and its mid point will locate at C°.
In situ observation of orientation changes on metallic surfaces
Authors: Weiland H. , Field D.P. , Adams B.L. 
Published: June 2020

The characterization of crystalline aggregates by the crystallographic orientations of their grains and subgrains has become a subject of increasing interest. The information obtained is not only used for the characterization of materials, but also more importantly for the determination of properties. To mention only a few, applications have been found in the areas of fracture analysis, recrystallization, and plastic deformation.Most commonly, crystallographic orientations are determined from Backscattered Kikuchi Diffraction (BKD) in the SEM and from Kikuchi patterns obtained by microdiffraction in the TEM. Since the development of fully automatic pattern analysis routines for the BKD, the SEM based techniques currently finds the most applications. In conjunction with computer controlled stage or beam displacements, the technique is known as Orientation Imaging Microscopy (OIM). In this manner, thousands of diffraction patterns are analyzed automatically within a short time. This leads to a statistical description of the distribution of crystallographic orientations, which sufficiently represent the bulk material.
The role of epitaxial strain in the properties of high Tc thin films
Authors: Williams E.J. , Cretton A. , Jaccard Y. , Locquet J.-P. , Mächler E. , Martinoli P. , Fischer Ø. 
Published: June 2020

The difference observed between the critical temperatures measured for bulk material or very thick films (> 500 nm for the ‘214’ system) and those measured for thin films (< 65 nm) has long been of curiosity. Thin films never attain the high values of Tc achieved in bulk or thick film material. Various mechanisms have been proposed to explain this phenomenon, for example Kosterlitz-Thouless effects, inadequate or unstable oxygenation, and strain itself. Formally the role of strain has remained insubstantiated.The system on which we have concentrated our efforts is that of La2-xSrxCuO4 (LSCO) deposited using MBE, mainly onto (001) SrTiO3 (STO) substrates. These films have been grown at about 700°C at ~3 × 10-6 torr oxygen pressure and cooled after growth at -10° min-1. The films have subsequently been examined using several microstructural and electronic probes, including x-ray diffraction, AFM, resistivity, Hall effect and kinetic inductance.
Scanning tunneling microscopy studies of reactions at surfaces
Authors: Leibsle F.M. 
Published: June 2020

Scanning tunneling microscopy (STM) can image clean and adsorbate-covered surfaces with atomic/molecular resolution. This enables us to obtain detailed information on how catalytic reactions proceed on surfaces. Information on such topics as initiation sites for chemical reactions, reaction trends, the development of molecular order, and mesoscopic surface restructuring can be obtained. In addition, variable temperature STM experiments can yield insight into the decomposition of molecules at surfaces.Studies using STM under ultra-high vaccuum conditions have shown how the oxidation of CO occurs on oxygen-precovered Rh(110) surfaces. Figure 1 shows an STM image of an oxygen-precovered Rh(110) surface displaying areas of oxygen-induced c(2×6) and c(2×8) reconstructions following exposure to 5 Langmuirs of CO. Images like this show that the reaction between the CO and adsorbed oxygen initiates at step edges and defects sites. The CO reaction fronts then proceed in a onedimensional manner stripping away the oxgyen from two and three atom wide islands.
Iodopropionic acid staining of waterborne epoxy films
Authors: Shaffer O. L. , Walker F.H. , El-Aasser M. S. 
Published: June 2020

The examination of polymer material by transmission electron microscopy (TEM) often relies on staining in order to improve contrast or preferentially stain a polymer phase. Stains such as osmium tetroxide for unsaturated polymers and ruthenium tetroxide for unsaturated as well as certain saturated polymers have been used quite extensively. A new stain, 3-iodopropionic acid, has been found to be very useful to stain preferentially the amine rich domains in waterborne epoxy films.An epoxy dispersion (epoxy equivalent weight, EEW=625) and a polyamine adduct curing agent (AHEW=163) at a 1.5:1 stoichiometry was prepared. The volatile organic content (VOC) was 2.6 lb./gal., and the solvent blend was 90.6% propoxy ethanol and 9.4% Aromatic 150. The particles size of the starting dispersion was obtained by TEM and disk centrifuge and found to be approximately 500 nm. Films (approximately 1.2 mil dry film thickness[DFT]) were cast on a partially fluorinated polyethylene film, 0.5, 2, 4, and 8 hours after hand mixing and cured for two or more weeks at 25° C and 50% relative humidity.