bluuebunny/crossref_metadata_2025_split huggingface dataset:
Adhesion and Nanomechanical Studies by Interfacial Force Microscopy
Authors: Houston J E 
Published: July 2020

Abstract
Scanning probe techniques have shown dramatic growth recently and are presently making significant impact on surface and interfacial problems in material science. The Interfacial Force Microscopy (IFM) differs from other scanning force-probe techniques by its use of a self-balancing, zero compliance force sensor. This allows carefully controlled and mechanically stable force vs. interfacial separation measurements to be obtained which yield unique and valuable information concerning the interfacial adhesive bond and its failure, as well as enabling the study of the mechanical properties of materials, both on the nanometer scale. I will demonstrate the enhanced capabilities of the IFM by presenting two examples involving: 1) the bonding interaction between chemically distinct end groups on self assembling molecules adsorbed on both the sample and probe tip and 2) a study of the effect of morphological defects on the nanomechanical properties of Au(l 11) single-crystal surfaces
Interfacial adhesion is of extraordinary technological importance and has long been of intense scientific interest.
Implementation Of A Digital Microscopy Teaching Environment
Authors: Graef M De , Nuhfer NT , Cleary NJ 
Published: July 2020

Abstract
The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.
While one can debate whether or not it is wise to treat an SEM or a TEM as just another black-box computer program, it is a fact that these machines are here to stay, which means that microscopy educators must adapt their traditional didactic tools and methods. One way to bring electron microscopes into the classroom is through the use of remote control software packages, such as Timbuktu Pro or PC-Anywhere. The remote user essentially opens a window containing the desktop of the microscope control computer and has all functions available. On microscopes with specialized graphics boards, integration of the image and control display for remote operation may not be straightforward, and often requires the purchase of additional graphics boards for the remote machine.
Microscopy, Electron Microscopy, Elemental Analysis, Image Analysis, Digital Photography, And Telepathology Applications In Pharmaceuticals Research
Authors: Argentieri G , Grosenstein P , Killary K 
Published: July 2020

Abstract
Light and electron microscopy are exceedingly versatile disciplines having many applications in pharmaceutical research. Many corporate and university facilities are organized with a centralized microscopy laboratory that serves the needs of many different investigators. This is also true at the Novartis Pharmaceuticals Corporation in East Hanover, New Jersey. A centralized microscopy laboratory is not only more efficient, but also most cost effective. The microscopy lab at Novartis is designed to meet the needs for a wide range of applications serving all of Research and Development. The lab contains seven functional areas for microscopy applications. A large preparation and processing area, necropsy, microtomy, TEM, SEM, wet and dry dark rooms, and an image analysis suite including telepathology, complete the lab.
Microscopy service is widely used in Pathology, Toxicology, Drug Discovery, Technical Research and Development, Production and Quality Assurance, and Compliance. Microscopy services have also been involved in marketing (packaging labels and commercials) for Novartis products.
Museum Applications For Scanning Electron Microscopy: From Mollusks To Meteorites
Authors: Klaus Angela V , Barnett William K 
Published: July 2020

Abstract
In addition to dinosaur bones and gem collections, the American Museum of Natural History (AMNH) is also home to nine academic research departments: Anthropology, Herpetology, Mammalogy, Earth and Planetary Sciences, Ichthyology, Ornithology, Entomology, Invertebrates, and Vertebrate Paleontology. Each of these departments supports curators, research scientists and assistants, graduate students, and post-docs engaged in a broad spectrum of research activities.
The Core Microscopy Facility houses a state-of-the-art Cold Field Emission SEM equipped with an energy dispersive x-ray spectrometer. This instrument is extremely versatile, as it must be in order to meet the challenges of a diverse imaging and microanalytical environment. Our applications run the gamut from high-resolution electron imaging of insect parts to quantitative x-ray microanalysis of 5 billion-year-old meteorites.
Mineral scientists, archeologists, anthropologists, and artifact conservators use X-ray microanalysis extensively at the AMNH. Current projects include the analysis of chondrites (meteorites that condensed at the same time as the solar system), Neolithic pottery remains, and pigment fragments from Native American artwork.
Magnetic Domain Wall-Microstructure Interactions In Low-Carbon Steel
Authors: Radmilovic V , Krishnan KannanM 
Published: July 2020

Abstract
Nondestructive evaluation of steels is both an important engineering need and a scientific challenge. Recent advances include a SQUID imaging technique that is capable of detecting small changes in stray fields at reasonable spatial resolution. The technique is motivated by the fact that the stray fields, determined by the underlying domain configurations in the material, would provide insight into the microstructure including defects, provided the interactions between the microstructure and the domain walls can be well understood.Initial work is being carried out on 1018 low-carbon steels, plastically deformed in a controlled fashion, with the goal of correlating SQUID images with magnetic domain images measured by Lorentz microscopy in a TEM.
Experiments were carried out in a CM200 FEG TEM using the OL field in low-mag (LM) mode, based on a procedure described by Verbist et al [1] and Daykin et al [2].
In-Situ Tem Dynamic Magnetizing Experiments Used To Identify The Pinning Centers In Hard Magnets Re13.75fe80.25b6 (Re=Nd, Pr).
Authors: Volkov VV , Zhu Y 
Published: July 2020

Abstract
The new JEOL 3000F high resolution electron microscope at BNL has been optimized for Lorentz imaging. The necessary field-free environment around the sample is obtained by switching off the objective lens in the free-lens control mode, and the associated reduction in magnification is compensated for by a Gatan post-column image filter (GIF) at ∼ 20x magnification. Fresnel imaging is obtained by defocusing with objective mini-lens (OM). The use of low angle diffraction with an aperture located at the back focal plane makes it possible to obtain Foucault images.
In-situTEM dynamic magnetizing experiments combined with Lorentz magnetrc microscopy both in Fresnel and Foucault modes were used to characterize the magnetic structure of some hard and relatively soft magnets, Nd13.75Fe80.25B6 and Pr13.75Fe80.25B6, prepared by different processing routes. The goal of these in-situexperiments was to develop a reliable and effective procedure to search for, identify, and classify the different pinning centers present in real magnets that accord with their “pinning power” versus applied magnetic field.
Magnetic Imaging Of Recording Media
Authors: Robert Sinclair  , Kai Tang  
Published: July 2020

Abstract
Magnetic recording forms the basis of one of the largest international industries. Electron microscopy has of course played a significant role in relating magnetic performance to the underlying microstructure. However, relatively little attention has been paid to the ways in which imaging of the magnetic structure can be correlated with processing conditions and microstructural parameters. The present research has been aimed to address this deficiency.
A method was devised to prepare samples with large electron transparent areas (e.g., 250 microns square) from real computer hard discs. Fresnel TEM images were taken in a Philips CM20 FEG equipped with a special Lorentz pole piece, and with the objective lens off. Upon defocusing, the ferromagnetic domain structure strikingly appears. The characteristics of the recorded tracks depend on the magnetic state of the disc prior to magnetic “writing”, and much information about the local direction of magnetization could be obtained from the nature of the magnetic “ripple” structure.
Lorentz microscopy of magnetic fine particles
Authors: Tanji T , Aoyama N , Yamamoto K , Hirayama T 
Published: July 2020

Abstract
Magnetic granular films, which consist of magnetic fine particles of nanometer size and a nonmagnetic matrix, have been of great interest for new magnetic materials. Their magnetic characteristics strongly depend on the fine structures, besides the combination of magnetic and nonmagnetic constituents, especially their surface topology and the particles size. Although the relationship between these fine topological structures and the macro-magnetic characteristics has been investigated systematically by many researchers, there has remained a desire to observe magnetic microstructures directly. We succeeded in observing the magnetic structure of fine particles in granular films using Lorentz microscopy.
Two kinds of specimens were observed. One was an Fe-Mo granular film. An amorphous film of Fe-Mo was prepared by dc magnetron sputtering on amorphous carbon thin films at a temperature below 180 K. The films were annealed at 770 K within an in-plane magnetic field. The other kind was an Fe-MgO granular film, where iron particles were embedded in a magnesium oxide single crystal.
Micromagnetic Simulations Of Domain Structures In Thin Films And Bulk Hard Magnets
Authors: Cai Zhi-Xiong , Zhu Yimei 
Published: July 2020

Abstract
The shape anisotropy of a magnetic thin film competes with the easy-axis anisotropy, which gives rise to different domain structures compared to the bulk magnetic materials. Recent Lorentz microscope and electron holography and differential-phase-contrast experiments show complex domain structures with features not found in bulk materials seen by magneto-optic method.
In this report we use micromagnetic simulation techniques to study the effect of thickness on the domain structure of magnetic thin films with various orientations relative to the easy axis and compare with those in the bulk materials. The results of the simulations can be used to compare with the data obtained using electron holography experiments to give us quantitative understanding of the domain structure in hard magnetic materials.
We model the magnetic films with an array of dipoles of size 16×l6×Lz, where Lz the thickness of the sample.
High Coercivity Mechanism Of The Die-Upset Hard Magnets Re13.75Fe80.25B6 (Re = Nd, Pr): Possible Correlation To Specific DefectMicrostructure
Authors: Volkov VV , Zhu Y 
Published: July 2020

Abstract
The magnetic properties of permanent magnets are sensitive to their microstructure. In particular, for the family of Nd(Pr)-Fe-B magnets a very different coercivity and energy products may be obtained by several processing techniques. It was experimentally found that a small excess of Nd over the exact phase composition of Nd2Fe14B plays an important role in obtaining high-energy products during the die-upset processing of the anisotropic hard magnets. However the specific role of the Nd excess on both magnetic structure and microstructure of these die-upset magnets is unclear and controversial. Answers to these questions may help to correctly address some major issues in materials science, e.g. how microstructure is related to magnetic structure of hard magnets, and how to optimize the performance of hard magnets.
In-situ TEM magnetizing experiments combined with Lorentz magnetic microscopy in Fresnel-Foucault modes were used to characterize the magnetic structure of die-upset, high energy-product hard magnets Nd13.75Fe80.25B6 and Pr13.75Fe80.25B6.
Semiconductor Defects And Thin Films Characterization By High-Resolution Images And By Vibrational Spectroscopy.
Authors: Conti G , Uritsky YS , Brundle C R , Xu J 
Published: July 2020

Abstract
The physical and chemical characterization of defects and particles on wafer surfaces gives important information on their origin. An effective approach for root-cause determination of wafer surface particle problems is to perform both high-resolution images and chemical characterization on individual defects. The traditional root-cause analysis technique used in the semiconductor industry is Scanning Electron Microscopy combined with Energy Dispersive X-Ray Spectroscopy (SEM/EDX). This technique provides high-resolution images and the atomic composition of the defects. However, this is sometime insufficient to fully characterize them and to determine their origin. In this case, the identification of the molecular composition of the defects can help determine their origin.
Optical spectroscopy, such as Infrared and Raman spectroscopy, is a powerful method for determining the molecular composition of many substances. Micro-FT-IR spectroscopy can characterize semiconductor particles only down to 10 μm because of the IR wavelength diffraction limit. Micro-Raman spectroscopy, instead, can provide useful molecular information on many organic as well as inorganic species with 1 μm spatial resolution.
Micro-Raman Spectroscopy In The Characterization Of Biomedical Materials
Authors: Huang Frank K 
Published: July 2020

Summary
μ-Raman spectroscopy has been used to characterize two types of biomedical materials: a multilayer, silicone elastomer used in implants, and a thin, polyethylene layer used in a medical device. Raman spectroscopy is the collection of light inelastically scattered by a material or compound. The technique is based on the Raman effect, which involves the interaction of light and matter. When light strikes a material, the light is inelastically scattered and is frequency shifted according to the vibrations of the chemical-functional groups and/or macrostructure of the material. The result is a Raman spectrum of the material that can be interpreted to determine the characteristics of the material, including identity, macrostructure, and quantity of a specific material within a matrix.The application of Raman spectroscopy in the characterization of polymers has been well established. The technique has been used to determine the chemical composition and morphology of polymers. Raman spectroscopy could therefore be a powerful tool for characterizing polymeric biomaterials.
The silicone elastomer characterized in this work consisted of three layers: polydimethylsiloxane, polydimethyl/polydiphenyl siloxane, and polydimethylsiloxane.
Semiconductor Thin Film Characterization Via Raman Microprobe Spectroscopy: Analysis At The Process Line
Authors: Gotts Hugh E 
Published: July 2020

Abstract
Raman Microprobe Spectroscopy has been used in research laboratories to model the growth of thin film silicide layers and the re-crystallization of α-silicon, however little progress has been made towards using these techniques as either at line or on line tools.
At line and on line instrumental techniques such as ellipsometry and X-Ray Fluorescence have been used to characterize the physical properties of thin films in the semiconductor industry, which has lead to improvements in device yields. These techniques, however, do not provide the specificity to determine thin film phase changes which result in improved device performance, whereas Raman Microprobe Spectroscopy can monitor these changes.
In order to perform at line or on line measurements, the spectrometer must be moved to the process line floor. The recent improvements in spectrometer design which has produced systems robust enough to endure high technology manufacturing environments will be briefly discussed. Two case studies of semiconductor process monitoring via Raman Microprobe analysis will be presented.
Evaluation Of Diseased State In Human Tissue Sections Using Infrared And Raman Imaging Microspectroscopy
Authors: Neil Lewis E , Haka Abigail S , Colarusso Pina , Levin Ira W , Gillespie John , Kidder Linda H 
Published: July 2020

Abstract
Optical microscopy has been the workhorse pathological technique, qualitatively differentiating tissue sections by characterizing morphological variations. Vibrational spectroscopic techniques provide quantitative as well as qualitative analytical information that reflects a sample’s biochemical composition and molecular structure. The utility of infrared and Raman techniques for biological characterization has been demonstrated for a variety of applications.[1-4]
FTIR imaging microscopy is a newly developed technique that incorporates the imaging capabilities required for histological procedures with the chemical discrimination of IR spectroscopy.[5-7] The ability to maintain spatial integrity while accessing precise spectroscopic data intrinsic to the sample represents a powerful combination. This technique is much more amenable to analysis by a pathologist than conventional spectroscopy because the data can be presented as images. These images provide direct visualization of a sample’s biochemical heterogeneity.
Vibrational spectroscopic imaging techniques provide excellent sample statistics for the accurate classification of individual spectral signatures because tens of thousands of independent spectra from different spatial locations within the sample are simultaneously recorded.
Attenuated Total Internal Reflection Infrared Microspectroscopy For The Study Of Trace Contaminants In Aqueous Solutions.
Authors: Sommer Andre’ J , Hardgrove Mark 
Published: July 2020

Abstract
Over the past several years many developments have taken place in the field of molecular spectroscopy. For Raman spectroscopy many of the improvements have arisen from technological innovations that include diode-based lasers, holographic notch filters and charged coupled detectors. In contrast, a majority of the developments in infrared spectroscopy have been in the area of new sampling accessories. A major emphasis has been placed on attenuated total internal reflection (ATR) accessories. The devices are allowing infrared spectroscopy to be employed in process control environments and quality control laboratories where the method is not only robust but has the advantages of limited sample preparation and/or in situ analysis.
In the realm of microspectroscopy, ATR accessories have the added advantages of providing better spatial resolution, equal to or higher S/N for equivalent sample size compared to transmission measurements and most importantly the ability to collect spectra of small samples without the adverse effect of diffraction. One accessory which was developed several years ago is known as the Split-Pea.
Infrared Imaging: Performance And Applications Of An Ft-Ir Microscope Based Imaging System
Authors: Wright N A , Bhandare P S , Jiang E Y 
Published: July 2020

Abstract
The field of infrared imaging for analytical chemical analysis has developed over the last few years into a technique that has clearly demonstrated its utility in a variety of applications(l-6). This imaging system is based upon the coupling of an infrared array detector to an infrared spectrometer and microscope, where the use of an array detector allows both spatial and spectral information to be generated simultaneously. Because of the high spatial content and data acquisition speed, researchers have been able to apply this technique to samples and experiments where traditional infrared microscopy has not proven successful.
Previously, in order to obtain an infrared image, the researcher was required to undertake a step and collect mapping experiment. In the mapping experiment, an aperture is set to obtain the desired spatial resolution at the sample. If high spatial resolution is required, most of the energy is discarded and long data collection times are needed to obtain a reasonable signal-to-noise
Alternate Technique To Measure ϕ(ρz) Curves Of Insulator Orcompound
Authors: Drouin D , Nockolds C 
Published: July 2020

Abstract
The ϕ(ρz) method is commonly used in quantitative X-ray microanalysis to calculate the proper correction for absorption and atomic number. Several models are used to reproduce generated X-ray intensity as a function of mass thickness. Those models rely on equations which has been adjusted to fit experimental measurement of the ϕ(ρz) curves. The classical tracer method for the experimental measurement of ϕ(ρz) curves proposed by Castaing (1951). The limitations of this method are related to the fabrication steps of the sample. The successive layers must be deposited in thin uniform layers of the same mass thickness and must be the same composition as the substrate.
The method described here, first proposed by J. Cazaux, uses the effect of self-absorption in a bulk sample to determine the generated intensity. The basic idea is to produce a set of equations for several absorption conditions while maintaining a constant geometry for the x-ray generation.
Measurement And Simulation Of X-Ray Emission From Multilayered Structures In Electron Probe Microanalysis.
Authors: Merlet C , Llovet X , Salvat F 
Published: July 2020

Abstract
Studies of x-ray emission from thin films on substrates using an electron probe microanalyzer (EPMA) provide useful information on the characteristics of x-ray generation by electron beams. In this study, EPMA measurements of multilayered samples were performed in order to test and improve analytical and numerical models used for quantitative EPMA. These models provide relatively accurate results for samples consisting of layers with similar average atomic numbers, because of their similar properties regarding electron transport and x-ray generation. On the contrary, these models find difficulties to describe the process when the various layers have very different atomic numbers. In a previous work, we studied the surface ionization of thin copper films of various thicknesses deposited on substrates with very different atomic numbers. In the present communication, the study is extended to the case of multilayered specimens.
The studied specimens consisted of thin copper films deposited on a carbon layer which, in turn, was placed on a variety of single-element substrates, ranging from Be to Bi.
The Disputed Discovery Of Element 43: A Reexamination Of An Elegant Early Use Of Wavelength-Dispersive X-Ray Microanalysis
Authors: Armstrong John T , Van Assche P H M 
Published: July 2020

Abstract
Typical modern histories of the discovery of the chemical elements report that element 43 was discovered in Italy in 1937 by Perrier and Segre. According to these accounts, the discovery was made by chemical separation in a sample of deuteron-bombarded molybdenum, supplied by E. Lawrence, and thus represent the first discovery of an element produced artificially and is the reason for the name “technetium” (Tc) chosen by the investigators. Some accounts might note in passing that the existence of element 43 was predicted in the early part of the 20th century on the basis of the periodic table, and that the element was reported as discovered in natural samples by x-ray emission spectroscopy in 1925 and called “masurium” (Ma). These reports, however, invariably call this discovery erroneous and sometimes refer to the investigators (typically left unnamed) as “deluded”.
The original reported discovery of “masurium” was made in an exhaustive investigation of some thousand mineral separates of Nb-Mo-U-rich phases involving early elegant use of wavelengthdispersive x-ray microanalysis.