bluuebunny/crossref_metadata_2025_split huggingface dataset:
Comparing Elemental Sensitivities Obtained With an Aperture and a Monolithic Polycapillary Optic Using a Commercial Micro-X-Ray Fluorescence (MXRF) Instrument
Authors: Worley C G , Colletti L P , Havrilla G J 
Published: July 2020

Abstract
Recent MXRF reports have demonstrated marked x-ray flux enhancements over traditional aperturecollimating systems when using a total reflection capillary optic. In the present work, several standard reference materials (SRMs) were examined with a Kevex Omicron MXRF system to compare the elemental sensitivities achieved with an aperture x-ray guide to those obtained with a monolithic polycapillary optic (X-ray Optical Systems). This study is relevant to the MXRF community using commercial aperture-based instruments where trace elemental concentrations in a sample sometimes mandate the need for a higher primary x-ray dose, but the flexibility of incorporating various sized apertures for other samples is still maintained.
By scanning the x-ray beam over a nickel/gold knife edge, the capillary focal spot diameter at the time of this work was determined to be ∼400 μm, while a 300 μm aperture provided a beam size of ∼550 μm due to beam divergence past the aperture.
Development of a Side Entry High Tilt Cryotransfer Stage for Tomographic Applications
Authors: Armbruster BL , Zolkowski R , Swann PR 
Published: July 2020

Abstract
Three-dimensional electron microscopic imaging, or electron tomography, involves the reconstruction of individual objects from projection data collected over a large range of specimen tilts. Practical limitations of tomography are set by the range of specimen tilt available to generate projection data. In terms of tilt range, current data sets typically cover a range of up to +/-700° of tilt.
When used for applications requiring high tilt such as tomography, problems with specimen holder designs which use circular 3mm diameter grids include restricted field of view created by the standard mesh pattern of commercially available specimen grids. The standard square or hexagonally patterned support grids provide minimal area between grid bars to view a sample at high tilt. The width of the specimen clamping device and holder tip blade also limit the useable grid area to the center of the specimen when the holder is at high tilt positions.
Development of High Resolution FE-SEM (8"FE-SEM) For 8-Inches wafer inspection
Authors: Ohara K , Nielsen C , Saito M 
Published: July 2020

Abstract
Semiconductor production using 8-inches wafers seems to be widely carried out in semiconductor factories. Many FE-SEMs are coming to be used for their particle/defect inspection. As semiconductor processing turns precise, the need of a high resolution FE-SEM has been rising all the more.
Now, JEOL announces a high resolution FE-SEM (8"FE-SEM) for 8-inches wafer inspection, which takes over the strong point of the semi-in-lens field emission scanning electron microscope (FE-SEM) JSM-6340F which has been getting expensive evaluation with its high resolution performance. The 8"FE-SEM possesses a resolution of 3.0nm at lkV of its acceleration voltage and 1.2nm at 15kV, as its semi-in-lens type object lens makes it possible to minimize the aberration.
High resolution observation and inclined wafer observation can be selected properly by changing the wafer holder, as such a holder exchange system has been usually used for transmission electron microscopes.
Quantitative Immunocytochemistry of Proteins Using 2- Photon Microscopy and Digital Image Analysis.
Authors: Wan H , Soeller C , Garrod DR , Robinson C , Cannell MB 
Published: July 2020

Abstract
The two photon microscope provides optical sectioning of fluorescent specimens with a resolution comparable to that obtained in confocal microscopy (see refs 2,3). However, the excited volume in 2-photon microscopy is limited to the focal volume (unlike conventional fluorescence microscopy where excitation occurs throughout the specimen). This means that photodamage is limited to the plane of section being examined. Thus, the light emitted from each point in the specimen depends on the amount of fluorochrome present without the problem of prior illumination (of other planes within the specimen) reducing the photon yield so a better signal to noise ratio can be obtained when examination of multiple image planes is needed. Since 2-photon excitation spectra are wide and chromatic aberration is eliminated (because the emitted light does not have to be focused on a pinhole), it is possible to excite several fluorochromes simultaneously and map their positions with high accuracy.
Tomographic Reconstruction of the Hair Cell Ribbon Synapse
Authors: Lenzi David , Runyeon Jonathan W , Crum John , Ellisman Mark H , Roberts William M 
Published: July 2020

Abstract
Hair cells, the mechanotransducers of the inner ears and lateral lines of vertebrates offer an excellent preparation for the study of presynaptic mechanisms at fast chemical synapses. They offer the compact, almost cylindrical shape of an epithelial cell without entangling dendrites and axons, and make afferent synapses directly from the cell body. The biology of hair cells demands an unusually high performance of the output synapse, requiring continuous, and very quickly modulated transmitter exocytosis. Release follows the small receptor potential generated by the transduction apparatus; more transmitter is released upon depolarization, less after hyperpolarization. In some hair cells, transmission can phase-lock to kilohertz stimulus frequencies, preserving temporal information across the synapse.
We have exploited the synaptic terminal-like features of these cells to explore both the physiology and ultrastructure of the machinery underlying neurotransmitter release.
Correlated 3D Light and Electron Microscopy of Large, Complex Structures: Analysis of Transverse Tubules in Heart Failure
Authors: Martone Maryann E , Thor Andrea , Young Stephen J , Ellisman. Mark H 
Published: July 2020

Abstract
Light microscopic imaging has experienced a renaissance in the past decade or so, as new techniques for high resolution 3D light microscopy have become readily available. Light microscopic (LM) analysis of cellular details is desirable in many cases because of the flexibility of staining protocols, the ease of specimen preparation and the relatively large sample size that can be obtained compared to electron microscopic (EM) analysis. Despite these advantages, many light microscopic investigations require additional analysis at the electron microscopic level to resolve fine structural features.
High voltage electron microscopy allows the use of relatively thick sections compared to conventional EM and provides the basis for excellent new methods to bridge the gap between microanatomical details revealed by LM and EM methods. When combined with electron tomography, investigators can derive accurate 3D data from these thicker specimens. Through the use of correlated light and electron microscopy, 3D reconstructions of large cellular or subcellular structures can be obtained with the confocal microscope,
A Transportable Multiple Oblique Illumination System which Retrofits to Conventional Optical Microscopes to Provide Highdefinition Real Time 3-Dimensional Imaging
Authors: Greenberg Gary L , Boyde Alan 
Published: July 2020

Abstract
Microscope specimens are 3-dimensional objects, but the images from conventional light microscopes are flat - they only show two dimensions. Multiple oblique illumination is a novel lighting technique for transmitted light microscopes that produces multiple (i.e. two or more) high definition 3-dimensional images using conventional microscope objective lenses. We have previously described its use in transmitted light. The same optical theory has now been expanded to include reflection microscopy. In the present paper, we describe a new development which will make this approach more widely available. It is a retrofit illumination system that will produce true 3-dimensional images directly through the eyepieces of conventional microscopes.
By seeing z-axis information in real-time and in the context of a specimen's entire thickness, researchers can gain additional, unambiguous information about the interrelationships between structures, whereas critical information about 3-dimensional structures can be obscured, lost or misinterpreted when using 2-dimensional instruments. The importance of accurate z-axis information has popularized methods such as deconvolution and confocal microscopy.
Structure and Action of Molecular Tracks and Motors
Authors: Milligan RA 
Published: July 2020

Abstract
Molecular motors belonging to the myosin and kinesin superfamilies utilize ATP to move along their respective F-actin and microtubule tracks. The track-motor complexes have not been amenable to crystallization, so x-ray crystallographic investigations have focused on structure determinations of the individual proteins. Although providing detailed descriptions of the structure of each protein, this approach cannot reveal the geometry of interaction of the proteins nor the conformational changes which occur during the mechanochemical cycle. To obtain this information, we use cryoelectron microscopy and image analysis to calculate three dimensional maps of the track-motor complexes at moderate resolution (15-30A) and combine these data with the high resolution x-ray structures to provide near-atomic models of the working assemblies.
We have so far built models of the rigor (nucleotide-free) and ADP actomyosin complexes. In smooth muscle myosin II (a collaboration with H.L. Sweeney, U. Perm.) and brush border myosin I (BBMI), the motor domain of the myosin head is similar in both biochemical states.
Cathodoluminescence Microscopy of Architectural Paint Samples
Authors: Hopen Thomas J , Brown Richard S , Wheeles R Keith , Stocklein Wilfried 
Published: July 2020

Abstract
The layer sequence of multi-layered white and off-white paint chips usually encountered by the forensic scientist in cases involving structural and/or maintenance paint is sometimes difficult to discern when utilizing commonly employed microscopical methods. This layer sequence information becomes vitally important when comparing a questioned paint sample to a paint sample of known origin. Techniques such as reflected light microscopy, fluorescence microscopy, and scanning electron microscopy (SEM) coupled with energy dispersive x-ray spectroscopy (EDS) may not provide the needed discrimination. Also, binder information may not be available for comparison since the thinness of the layers the difficulty in detecting individual layers, and the abundance of the extender pigments may preclude analysis by infrared microspectrophotometry.
Cathodoluminescence microscopy (CLM) may provide the needed layer sequence information and discrimination when analyzing and comparing multi-layered white and off-white paint samples. Cathodoluminescence (CL) is the emission of radiation from the sample in the visible light region and neighboring wavelengths during excitation by electrons generated from a cathode electron gun.
High Resolution FIB as a General Materials Science Tool
Authors: Phaneuf MW , Li J , Malis T 
Published: July 2020

Abstract
Focused Ion Beam or FIB systems have been used in integrated circuit production for some time. The ability to combine rapid, precision focused ion beam sputtering or gas-assisted ion etching with focused ion beam deposition allows for rapid-prototyping of circuit modifications and failure analysis of defects even if they are buried deep within the chip's architecture. Inevitably, creative TEM researchers reasoned that a FIB could be used to produce site specific parallel-sided, electron transparent regions, thus bringing about the rather unique situation wherein the specimen preparation device often was worth as much as the TEM itself.
More recently, FIB manufacturers have concentrated on improving the resolution and imaging characteristics of these instruments, resulting in a more general-purpose characterization tool. The Micrion 2500 FIB system used in this study is capable of 4 nm imaging resolution using either secondary electron or secondary ions, both generated by a 50 kV liquid metal gallium ion source.
Morphological Identification of Indicator Viruses from a Ground Water Aquifer Recharged with Reclaimed Wastewater
Authors: Stewart JR , Sobsey MD , Gambling TM , Carson JL 
Published: July 2020

Abstract
Protection of public health requires routine monitoring of environmental waters for fecal contamination, especially waters serving as drinking supplies. Municipalities typically rely on assays of indicator microorganisms to detect fecal contamination. Ideally, indicators and pathogens share a common origin. However, the indicators should have higher numbers, survive longer, and be easier to detect and quantify in the laboratory than pathogens. Coliform bacteria are the standard microbial indicator currently used in the United States. Enteric viruses are smaller and survive longer than coliform bacteria, therefore they are inadequate indicators of enteric viruses. Enteric bacteriophages, viruses infecting bacteria, may be a more reliable indicator for human viral pathogens. However, there are several taxonomic groups of enteric bacteriophages, all of which may not be good virus indicators. This project examines the ecology of coliphages, bacteriophages infecting Escherichia coli, in a ground water aquifer which serves as a municipal water supply.
Structural Changes of Soot Particulates as Shown by HRTEM and Image Analysis
Authors: Palotás Árpád B , Bell David C , Rainey Lenore C , Vander Sande John B 
Published: July 2020

Abstract
It has long been known that carbons have order at the microcrystalline level. Soots have been characterized as having a turbostratic structure and chars have been described as crumpled sheets. The value of electron microscopy in studying the morphology of such materials has been well established although only a few attempts have been made toward quantification.
The Methodology is based upon High Resolution Transmission Electron Microscopy (HRTEM) and further image analysis. The HRTEM image of each sample is recorded, digitized and processed with an image analysis software. Computer generated diffractograms are produced through Fourier Transformation and subsequent reverse transformation yields two color ‘extracted structures’ (Figure 1). The extracted structure is then undergoes statistical analysis. The analysis is aimed at identifying quantifiable structural parameters. Currently the following parameters are studied: circularity (C), elongation (E), and length of fringes (La) orientation of the fringes (cti), the inter-layer spacing (d002), and the fractional coverage of the extracted pattern (F).
Corrosion Product Identification by Micro-Raman and Mossbauer Spectroscopy
Authors: Adar F , Lenain B , Cook D C , Oh S J 
Published: July 2020

Abstract
Micro-Raman spectrometry and Mossbauer spectroscopy have been used to identify the corrosion products on a steel coupon exposed in an industrial environment for 16 years. The Raman analysis was performed on a polished metallographic cross-section in order to map the oxides across the thickness of the coating. The spectra were recorded using a LabRam Micro-Raman spectrograph incorporating a 17 mW HeNe laser (attenuated to 1 mW to prevent oxide transformation), focused to 1 μm spot size, and 1800 g/mm grating. The confocal line-scan imaging enabled 100 spectra to be recorded in one scan at 0.5 um intervals across the thickness of the coating. The Mossbauer analysis was performed using in-situ scattering Mossbauer spectroscopy on the attached corrosion coating and transmission Mossbauer spectroscopy at 300K and 77K on the removed coating, to measure the fraction of each oxide present. Micro-Raman spectrometry showed that the corrosion products had formed in distinct layers as shown in Figure 1.
Relocating Features Across Microanalytical Instrumentation
Authors: Powers William H , Schamber Frederick H 
Published: July 2020

Abstract
The ability to investigate a particular feature or region of a specimen using differing kinds of analytic instrumentation can be a very valuable technique. For example, an object viewed under an optical microscope provides color, polarization, and reflectance information which is not available via SEM viewing. Similarly, the SEM with its large depth of field and ability to utilize secondary and backscattered electron contrast mechanisms, and its capability to perform compositional analysis via EDS, provides information which the optical microscope cannot. Thus, the information provided by the two instruments is complementary.
Desireable though it may be to view the same feature of a specimen via differing instruments, this is often difficult to execute in practice. The difference in contrast mechanisms which makes the excercise valuable may also make it difficult to relate the distinguishing features viewed under one instrument with those viewed in the other. Further, the issue of scale creates a large complication in many practical instances.
Microstructure and Microchemistry of Y-Doped a-Al203
Authors: Giilgiin M A , Mulvihill M L , Putlayev V , Riihle M 
Published: July 2020

Abstract
A thorough microstructural study of common ceramics requires analysis at various length scales. Yttrium doped, polycrystalline α-Al203 was studied using a broad selection of microscopy techniques over a scale range covering seven-orders of magnitude (i.e. from mm to Å).
Yttrium doped, (1000 (Y/Al) atomic ppm) polycrystalline alumina samples were prepared by hot pressing at 1450°C at 50 MPa. Some were subsequently crept in tension. Microstructure of these samples was studied by optical microscopy, scanning electron/orientation imaging microscopy (OIM™), conventional and high resolution transmission electron microscopy. Analytical electron microscopy was performed on a VG HB501 FEG-STEM equipped with an EDS and PEELS.
On a large scale, the microstructure often consisted of bimodal sized alumina grains and second phase YAG (Y3A15012) precipitates. YAG precipitates at grain boundaries (GB) and triple points caused clusters (50μm to 1mm) of small equi-axed alumina grains (0.5-2 μm) randomly distributed over 40 area% of the sample.
The Complementary Nature of Electron Microscopy and ION Channeling for the Assessment of Radiation Damage Evolution in Ceramics
Authors: Sickafus K E 
Published: July 2020

Abstract
In ion irradiation damage studies on ceramics, damage evolution is often assessed using Rutherford backscattering spectroscopy and ion channeling (RBS/C) techniques. In a typical experiment, a single crystal ceramic sample is irradiated with heavy ions and then the crystal is exposed to He ions along a low-index crystallographic orientation. Simultaneously, the backscattered He ion yield is measured as a function of ion energy loss. For He ions scattered from the heavy ion irradiated volume, the He ion yield increases in proportion to the heavy ion dose. The RBS/C yield rises because the He ion beam is dechanneled by, for instance, interstitial point defects and clusters and their associated strain fields. A quantitative measure of dechanneling is denoted by χmin, defined as the ratio of the He ion yield along a low-index crystal orientation, to the yield obtained in a random (non-channeling) orientation. The damage parameter xmin varies from 0 to 1, where 1 represents the maximum damage level that can be measured by RBS/C.
TEM Analysis of Diamond Films Formed on SiO2 Substrate by Biasenhanced Nucleation
Authors: Cheng S C , Irwin M D , Onneby C , Pantano C G 
Published: July 2020

Abstract
Substrates of fused silica or other refractory glasses are of interest for the fabrication of diamondbased electronic sensors (such as thermistors) and field-emitter arrays. For temperature-sensing applications, the diamond thin film layers must be deposited on thermally insulating substrates, in order to optimize the accuracy and dynamic response time of the device. Silica and silicate glasses are good insulators, providing a barrier to the heat flow out of the device and thereby allowing for optimized performance of temperature sensors. Also, fabrication of diamond field emitters on large area glass substrates is important for manufacture of field emission flat panel displays. Recently, it has been demonstrated that significant enhancement of diamond nucleation on Si02 substrates can be achieved by applying electrical bias to the substrate during its exposure to a microwave generated CH4/H2 plasma.
To investigate the nucleation mechanism of diamond on Si02 substrate, induced during the biasing pretreatment, several TEM techniques were used to characterize the films and the film/substrate interface.
Observations of Superlattice Reflections Associated with Charge Ordering in Bi0.2Ca0.8MnO3 with an Energy-Filter
Authors: Murakami Y , Shindo D , Hiraga K , Oikawa T , Kersker M 
Published: July 2020

Abstract
A perovskite manganese oxide of Bi0.2Ca0.8MnO3 exhibits charge ordering of Mn3+ and Mn4+ ions upon cooling. This is an interesting phenomenon from both academic and practical viewpoints, since the charge ordering is accompanied by significant changes in both electric and magnetic properties of the oxide. Since a difference of scattering amplitudes between Mn3+ and Mn4+ is quite small, charge ordering can be observable as superlattice reflections due to the lattice strain caused by this ordering with an electron diffraction method. However, the background in an electron diffraction pattern, which is mainly caused by plasmon scattering, has hindered a precise investigation of the weak diffuse scattering. The purpose of the present work is to assess an efficiency of an omega-type energy-filter in detailed observations of the weak superlattice reflections associated with the charge ordering.
Specimens of Bi0.2Ca0.8MnO3 were prepared by a conventional ion-milling technique. The critical temperature of charge ordering (TCo) was determined to be 160K by resistivity and magnetization measurements.
Electron Energy-Loss Spectroscopy (EELS) of Cerium and Uranium Oxidation States
Authors: Keller Lindsay P , Bradley John P 
Published: July 2020

Abstract
EELS is a powerful analytical tool for exploring the local solid state environment in materials. There is an extensive literature on EELS analysis of the transition elements and light elements, yet few EELS data exist for heavy elements with multiple oxidation states. We report here on EELS studies of oxidation state influences on near-edge structure in cerium and uranium compounds.
All materials analyzed for this study were embedded in low viscosity epoxy and TEM specimens prepared using ultramicrotomy. The thin sections (∼50 nm thick) were analyzed using a JEOL 2010 (200kV) TEM operated with a LaB6 filament and equipped with a GAT AN 666 parallel EELS spectrometer. EELS data were collected in image mode at 105X magnification with a collection semi-angle of ∼ 100 milliradians at a dispersion of 0.1 eV/channel. The full width at half maximum of the raw (unprocessed) zero-loss peak was 0.7 eV. Peak positions were calibrated by applying a known voltage to a drift tube.