Interface-Engineered Atomic Layer Deposition of Li4Ti5O12:Toward High-Capacity 3D Thin-Film Batteries
Authors: Speulmanns Jan , Bönhardt Sascha , Czernohorsky Malte , Weinreich Wenke 
Published: December 2024

Atomic layer deposition (ALD) of lithium (Li)-based thin films has aroused significant interest in recent years. Promising applications are Li-ion thin-film batteries (TFBs), protective particle coatings, interface model systems, and neuromorphic computing [1,2]. Here, we demonstrate high footprint capacities and excellent high-rate performance of Li4Ti5O12 (LTO) fabricated by ALD for three-dimensional (3D) solid-state TFBs to power upcoming energy-autonomous sensor systems.
The simultaneous increase of power and energy density of full-cell 3D TFBs by coating the battery layer stack over microstructured substrates was recently demonstrated [3]. The required conformal, pinhole-free deposition, and stoichiometric control of nanometer-thin films on highly structured surfaces are only accessible via ALD. The vapor-phase technique based on sequential, self-limiting surface reactions is well understood. However, the direct deposition of Li-based anodes remains challenging [1].
In previous studies, we developed a thermal three-step ALD process for Li-containing mixed oxides on 200 mm silicon wafers [4, 5]. Lithium-tert-butoxide (LTB) and lithium hexamethyldisilazide (LiHMDS) were proven as suitable precursors, forming high-quality spinel LTO with low impurities after rapid thermal processing. The excellent electrochemical behavior of ALD LTO with LiHMDS was examined and linked to the film texture [5].
In this work, we optimize the LTO ALD process with LTB towards high-capacity 3D TFBs and evaluate the electrochemical performance for the first time. A process with tetrakis (dimethylamino) titanium (TDMAT) and H2O at 300 °C was developed, leading to a saturated growth per cycle of 1.06 Å cycle-1 for 7 s LTB pulses. An ALD temperature window between 240 and 320 °C was identified. The effect of the substrate on the initial growth and crystallization behavior was investigated. To overcome the crystallization-inhibiting effect of the titanium nitride current collector, we introduced an ultrathin AlOx interlayer.
Planar ALD LTO films with various thicknesses of up to 75 nm were manufactured, increasing the footprint capacity from 1.5 to 4.3 μAh cm-2. We observed a higher surface capacity contribution due to an increased roughness and an inferior C-rate performance with increasing film thickness. 50 nm LTO films demonstrate the optimum energy and power density. A footprint capacity of 1.95 μAh cm-2, corresponding to 67 % of the initial capacity, was achieved at 50 C with an average Coloumb efficiency of 99.9975 %.
Next, we evaluate ALD LTO films as 3D TFB anodes for the first time. The conformality of the ALD process on microstructured substrates was improved by extending the LTB pulse and purge times. The purge time is the key factor enabling a step coverage of 70 % for holes with an aspect ratio of 10:1. The 3D samples with an area-enhancement factor (AEF) of 9 coated with 50 nm LTO obtained a footprint capacity of 20.2 μAh cm-2 at 1 C. The significant capacity enhancement of 6.9 compared to planar samples is according to the conformality. The remarkable high-power capability of 3D LTO is demonstrated with 7.75 μAh cm-2 at extreme currents of 5 mA cm-2. A capacity retention of 97.4 % after 500 cycles at 1 mA cm-2 shows the high-rate cyclability. The superior high-rate performance of ALD LTO compared to other 3D anode materials illustrates the enormous potential for realizing high-energy and high-power on-chip 3D TFBs.
References
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