bluuebunny/crossref_metadata_2025_split huggingface dataset:
APFIM Studies of Interfaces: Structure and Composition
Authors: Hans Nordén  
Published: July 2020

Abstract
The distribution of small amounts of alloying elements or impurities to interfaces can have a major influence on the properties of a material and the atom probe field ion microscope technique is well suited for the study of such segregation effects, where structural and compositional changes often take place over regions only a few nanometers wide.
Many features of the atom probe technique make it very useful in studies of interfaces:
i) high spatial resolution, about lnm laterally and 0.2 nm in depth ii) equal sensitivity for all elements, including the lightest iii) no specimen contamination, surface artifacts from the specimen preparation are removed by field evaporation, iv) low temperature operation, negligible diffusion during analysis
A ncessary prerequisite for any systematic analysis is the ability to prepare suitable specimens. The volume accessible for analysis by APFIM is orders of magnitude smaller than a typical grain size, so a specimen preparation technique was developed that could bring features of interest sufficiently close to the apex (see Fig. la).
Compositional Imaging Rediscovered: What‚s New/What‚S Not?
Authors: Isaacson M S 
Published: July 2020

Abstract
The last several decades have seen an explosion in the number of experimental techniques being developed to characterize materials. In particular, there has been exponential growth in the coupling of microscopic methods with conventional spectroscopic characterization tools. This has been due mainly to the renaissance in microscopy over the last quarter century and the advent of significant computational power “on a bench”.
Compositional imaging is just a new term for what was over a half century ago called “Chemical Microscopy”. Although then the term referred to optical microscopy, today the notion of compositional imaging refers to a method by which we can correlate chemical or elemental composition with a microscopic image feature.
Because many of these microcharacterization methods have developed from many different disciplines, the “local” language used often appears to be untranslatable from one technique to the next without considerable pain and difficulty.
Direct Imaging of Trace Elements, Isotopes, and Molecules Using Mass Spectrometry
Authors: Linton Richard W 
Published: July 2020

Abstract
Secondary ion mass spectrometry (SIMS) is based upon the energetic ion bombardment of surfaces resulting in in the emission of sputtered particles, including both atomic and molecular ions. The use of mass spectrometric detection provides a highly versatile and sensitive tool for surface and thin film microanalysis. The scope of the technique includes a diversity of analysis modes including:
1. Elemental Depth Profiling (dynamic SIMS), 2. Laterally Resolved Imaging (ion microprobe or ion microscope analysis), 3. Image Depth Profiling (combination of modes 1 and 2 providing 3-D images), 4. Molecular Monolayer Analysis and Imaging (static SIMS), 5. Sputtered Neutral Mass Spectrometry (post-ionization).
Much of the early work in dynamic SIMS centered on depth profiling and imaging techniques, with an emphasis on applications to electronic materials. SIMS has made extensive contributions to semiconductor materials science since the 1960's, including the development of new devices and processes, and in failure analysis.
Strategies For Combining Elemental Distribution Data Derived From Multiple Images and Samples
Authors: Cantino Marie E , Eichen Joseph G 
Published: July 2020

Abstract
Data from digital electron probe x-ray microanalysis (EPXMA) images can be used to generate high resolution profiles of Ca binding within sarcomeres of vertebrate striated muscle. While ratios of elemental peak to bremstrahlung at each point (Hall method) have been used in many studies to allow comparison of data taken from different samples, this procedure has limitations for our application. A different normalization procedure is described here which provides a means of assessing variation among elemental and bremstrahlung profiles obtained from different images and samples.
Freeze dried cryosections of chemically skinned frog or rabbit skeletal muscle were prepared as previously described. Digital EPXMA images were collected for 24 to 36 hours using a Zeiss EM910 STEM and an Oxford ExL2 microanalysis system. Calcium and bremstrahlung counts were summed within one pixel wide masks placed at successive positions along each half sarcomere, as previously described, using an automated routine in IPLAB on a Power Mac 7100.
Quantitative Composition and Thickness Mapping With High Spatial Resolution By XEDS In a 300kv FEG-AEM
Authors: Watanabe M , Williams D B 
Published: July 2020

Abstract
Since the first demonstration by Cosslett and Duncumb, X-ray mapping by an electron probe microanalyzer (EPMA) has become a most popular approach in microanalysis because elemental distributions of constituents in a bulk sample can be displayed visually. The major disadvantage of EPMA mapping is poor spatial resolution (∼ 1 μm). The spatial resolution of X-ray microanalysis can be improved to a few nanometers using electron transparent thin-specimens in the analytical electron microscope (AEM). However, X-ray count rates from thin specimens are strictly limited because of the improved spatial resolution (i.e. smaller interaction volume) and the poor collection efficiency of X-ray. To obtain reasonable counts for accurate quantification in the AEM, extraordinarily long mapping times are required. Therefore, quantitative X-ray mapping is rarely attempted in the AEM. However, these limitations can be overcome by use of intermediate-volt age instruments combined with field-emission guns to increase the beam current-density, careful stage design to maximize the X-ray collection efficiency and the peak-to-background ratio, and ultrahigh vacuum system to reduce contamination.
X-Ray Microscopy Analysis of the Morphology of Poly(Ethylene Terephthalate)/Vectra Blends Produced by Mechanical Alloying
Authors: Smith A P , Bai C , Ade H , Spontak R J , Balik C M , Koch C C , Saw C K 
Published: July 2020

Abstract
The intimate blending of two incompatible polymeric materials constitutes one of the most important fields of study in polymer science. A vast arsenal of techniques, ranging from copolymerization to melt-blending, has been assembled to mix intrinsically immiscible polymers and optimize the physical properties of the resultant system. For some systems, however, even established techniques cannot produce useable blends. To overcome this limitation, non-equilibrium mechanical alloying (high-energy ball milling of two or more dissimilar powders) has been employed to produce blends of poly(ethylene terephthalate) (PET) and Vectra (73/27 oxybenzoate/oxynaphthoate). Characterization of these blends by TEM is confounded by the absence of a preferential staining agent, in which case Scanning Transmission X-ray Microscopy (STXM) provides a valuable alternative in examining the morphology and chemistry of these blends.
The x-ray microscope utilizes a diffraction element called a zone plate to focus soft x-rays into a microprobe. A thin section of sample is placed in this microprobe, and the transmitted photon intensity measured.
Compositional Characterization of an O-N-O Layer in a Dram Using FE-TEM and EDS Elemental Mapping
Authors: Kawasaki M , Oikawa T , Ibe K , Park K H , Shiojiri M , Kersker M 
Published: July 2020

Abstract
An O-N-O layer within a DRAM is designed to be an insulator between a single-crystal silicon substrate and a poly-crystalline silicon gate. The nominal structure of the layer is SiO2-Si3N4-SiO2. A small amount of phosphorus is doped in the poly-crystalline silicon gate to improve the electrical characteristics of the device. Transmission Electron Microscopy (TEM) was first used to view the micro structure in the layer. A bright field image gave clear contrast in the O-N-O layer, however, TEM images do not provide direct information about the elemental distribution. In this study X-ray elemental mapping was thus used to show this distribution.
The specimen was cut from a 16M-DRAM device and thinned using the cross-section ion milling method. The O-N-O layer was examined using a JEM-201 OF FE-(S)TEM equipped with a JEOL UTW-EDS detector. Fig. 1 shows a high resolution TEM image of the O-N-O layer.
Industrial and Clinical Applications of Infrared Spectroscopic Imaging Using Focal-Plane Arrays
Authors: Kidder Linda H , Levin Ira W , Neil Lewis E 
Published: July 2020

Abstract
Conventional Fourier transform infrared (FTIR) spectroscopy is a workhorse analytical technique providing quantitative and qualitative information on a vast array of materials, ranging from semiconductors to biological samples. By coupling a Michelson interferometer and infrared (IR) microscope to an IR sensitive focal-plane array detector, we have added an imaging component to the existing analytical capabilities of FTIR spectroscopy. This additional capability makes it possible to image the distribution of subtle structural and compositional changes reflected in the infrared spectrum within heterogeneous materials. As such, it is an extremely powerful analytical tool which is currently employed in a variety of basic research and industrial applications. Similarly the utility of FTIR spectroscopy for the investigation of biological materials can be greatly extended by recording spectroscopic imaging data sets instead of single FTIR spectra. This spectroscopic imaging capability, especially when combined with microscopy, ensures that information concerning spatial variations in the system’s biochemistry, as well as its cellular morphology, is maintained.
Compositional Mapping by Scanning Electron Microscopy With Energy Dispersive X-Ray Spectrometry: Recognizing Facts and Artifacts
Authors: Newbury Dale E , Bright David S 
Published: July 2020

Abstract
Compositional mapping with energy dispersive x-ray spectrometry (EDS) in the scanning electron microscope (SEM) is one of the most widely used techniques for elemental imaging of microstructures. SEM/EDS maps are usually qualitative presentations of elemental distributions in x-y space. In older implementations of mapping, the x-ray intensity from a single spectral region of interest (ROI) above a threshold was recorded on film as a white “dot” during analog scanning. With modem digital control and data recording, x-ray intensities from many ROIs can be recorded in parallel and true counts stored in memory. For display purposes a gray level or color value is used to represent the stored x-ray intensity at each pixel. For major constituents (arbitrarily, major &gt;10%), it is generally possible to make valid, robust comparisons between regions within an individual compositional map, but comparisons may be problematic among several maps of different constituents within the same field of view, depending on the sophistication of the mapping software.
The Next Generation of EDS: Microcalorimeter Eds With 3 eV Energy Resolution
Authors: Martinis John M , Irwin K D , Wollman D A , Hilton G C , Dulcie L L , Bergren N F 
Published: July 2020

Abstract
Semiconductor energy dispersive spectrometers (EDS), the most commonly used detectors for x-ray microanalysis, have matured to the point that significant improvement in energy resolution is not expected in the future. We believe a revolutionary advance in x-ray microanalysis will occur in the next few years due to the development of new x-ray spectrometers based on microcalorimeters. Energy resolution comparable with wavelength dispersive spectrometers, 3 eV to 10 eV, has already been achieved; future detectors may reach a fundamental limit as low as 0.5 eV to 1 eV.
In a microcalorimeter, the energy of an x-ray is converted into heat, and a measurement of the temperature rise of the detector gives the deposited photon energy. Our microcalorimeter detector consists of a superconducting transition edge thermometer cooled to an operating temperature of 100 mK by a compact adiabatic demagnetization refrigerator, a read-out SQUID (Superconducting Quantum Interference Device) preamplifier followed by pulse-shaping amplifier and pile-up rejection circuitry, and a multi-channel analyzer with real-time computer interface.
Application of X-Ray Optics to Energy Dispersive Spectroscopy
Authors: McCarthy J J , McMillan D J 
Published: July 2020

Abstract
The application of x-ray optics for focusing x-rays into high intensity spots or for collimation of x-ray beams has been reported by several authors. Example applications for x-ray optics include microfluorescence, microdiffraction, tomography and lithography, and WDS. Kirkland et al. pointed out that the use of an optic, in a collimating configuration could provide enhanced detection sensitivity in wavelength dispersive spectroscopy. In these proceedings last year, Agnello et al. presented data from a new WDS device specifically designed to use a grazing incidence collimating x-ray optic that confirmed and extended the work of Kirkland.
A few studies have appeared reporting the use X-ray optics in applications using EDS. Focusing x-ray optics have been used on both the excitation and detection side of EDS systems. In a series of papers, Carpenter and his collaborators describe an x-ray microprobe which uses capillary optics to provide an intense convergent beam of x-rays from a microfocus x-ray tube to excite the sample for x-ray microfluorescence studies. Wollman et al.
X-Ray Energy Dispersive Spectroscopy in the Environmental Scanning Electron Microscope
Authors: Mansfield John F , Pennington Brett L 
Published: July 2020

Abstract
The environmental scanning electron microscope (Environmental SEM) has proved to be a powerful tool in both materials science and the life sciences. Full characterization of materials in the environmental SEM often requires chemical analysis by X-ray energy dispersive spectroscopy (XEDS). However, the spatial resolution of the XEDS signal can be severely degraded by the gaseous environment in the sample chamber. At an operating pressure of 5Torr a significant fraction of the primary electron beam is scattered after it passes through the final pressure limiting aperture and before it strikes the sample. Bolon and Griffin have both published data that illustrates this effect very well. Bolon revealed that 45% of the primary electron beam was scattered by more than 25 μm in an Environmental SEM operating at an accelerating voltage of 30kV, with a water vapor pressure of 3Torr and a working distance of 15mm.
The Analysis of Particles With Energy Dispersive X-Ray Spectroscopy (EDS)
Authors: Small J A , Armstrong J A , Bright D S , Thorne B B 
Published: July 2020

Abstract
The addition of the Si-Li detector to the electron probe, the scanning electron microscope, and more recently the transmission electron microscope (resulting in the analytical electron microscope) has made it possible to obtain elemental analysis on individual “particles” with dimensions less than 1 nm using EDS. Although some initial particle studies on micrometer-sized particles were done on the electron probe using wavelength dispersive spectrometers, WDS, the variability and complexity of many particle compositions coupled with the high currents necessary for WDS made elemental analysis of particles by WDS difficult at best. In addition, the use of multiple spectrometers, each with a different view of the particle and therefore different particle geometry as shown in Fig. 1, limited the quantitative capabilities of the technique. With the introduction of the Si-Li detector, there was only one spectrometer with a single geometry resulting in the development of various procedures for obtaining quantitative elemental analysis of the individual particles.
Unprecedented Performance Improvement For Thermoelectrically Cooled Si(Li) Detector for EDS
Authors: Barkan S , Ihrig K F , Abott M B 
Published: July 2020

Abstract
High performance Si(Li) detectors for EDS applications must be cooled in order to eliminate excess leakage current and to reduce noise as a result of thermal excitation. The most common cooling method is the use of liquid nitrogen (LN), which has been commonly used during the last four decades. The LN method is relatively simple, however, it has some disadvantages such as: requiring a large dewar for storing the LN, the necessity of refilling it with LN, as well as some hazardous handling issues.
Several years ago, Kevex introduced a new no-LN x-ray detector, the SuperDry, offering the customer a solution to the previously mentioned cooling problems. The SuperDry uses a thermoelectric device, a Peltier solid-state refrigerator, without any moving parts. The SuperDry covers all the disadvantages of the LN method, however, the temperature achieved has not reached the same low level as the LN products.
A New EDS Equipment (GEM Detector With Superatw Window) and a Correction for Si-Contamination Improve the Quantitative Electron Probe Micro Analysis of Biological Cryosections
Authors: Schultz M , Rudolf F , Wendt-Gallitelli MF 
Published: July 2020

Abstract
Function dependent changes in the intracellular (i.c.) concentrations of calcium and sodium play a crucial role in the regulation of biological processes such as contraction of heart muscle. However, accurate measurements of both elements are difficult since in i.e. compartments they are present in low concentrations, hence the Ca and Na peaks show small count rates and small peak to continuum ratios. The accurate quantification of Ca and Na is rendered even more difficult by the partially overlap of the NaK with CuL peak and CaKα with KKβ peak. In some cases electrophysiologist substitute in the experiments K+ with Cs+ or the pathologist is interested in the storage of mercury. For analysis of such elements (Cs, Hg) with higher atomic number the stopping power of the EDS crystal play an important role for system sensitivity. Quantitative analysis of thin biological cryosections with the continuum method must be corrected for influence of X-rays emit from holder, supporting film and grid.
Problem Elements and Spectrometry Problems in X-Ray Microanalysis: the Black Holes of the Periodic Table
Authors: Armstrong John T 
Published: July 2020

Abstract
Few quantitative analysis techniques attempt as large an extrapolation between the compositions of standards and samples than is attempted in electron microbeam x-ray emission analysis. In-situ x-ray microanalysis can be performed for essentially all elements in the periodic table in complex matricies that may contain, in extreme cases, thirty or more detectable elements. Analyses are attempted for the same elements, using the same standards, in various matrices whose average atomic numbers might range from 4 to 94. Unlike most analytical techniques, where suites of standards are synthesized having similar bulk compositions as the samples and bracketing the concentrations of the elements of interest, the standards employed in microbeam analysis are most commonly pure elements, simple oxides, or other binary element compounds. This is true even though matrix effects on electron retardation and scattering, x-ray absorption, and secondary x-ray fluorescence can cause major variations in the differences between relative intensity and relative concentration.
Analyzing the Light Elements in an Electron Probe Micro Analyzer
Authors: Bastin GF , Heijligers HJM 
Published: July 2020

Abstract
Wavelength-dispersive analysis of the ultra-light elements boron, carbon, nitrogen, and oxygen requires much more complicated experimental procedures than the analysis of medium-to-high Z (Z &gt;11) elements. For a large part this is the result of a number of fundamental physical problems which cannot be circumvented. The most difficult problems of this nature are those related to the differences in the x-ray emission profiles from one ultra-light element compound to another. These differences are caused by the fact that in exciting ultra-light element x-rays electronic transitions of the bonding electrons are involved. As a consequence one has to deal with large peak shifts and large peak shape alterations in WDS analysis of ultra-light elements. While peak shifts can easily be accounted for by simply retuning the spectrometer when moving from standard to specimen the effects of peak shape alterations are much more difficult to deal with and in general it is imperative to perform the intensity measurements in an integral fashion.
Analyzing Mg and Fe in Olivines, Pyroxenes, and Garnets: Systematic Discrepancies
Authors: Carpenter P , Armstrong J 
Published: July 2020

Abstract
Quantitative analysis of Mg and Fe in olivines, pyroxenes, and garnets is important for geochemical studies. Natural olivines have compositions close to the forsterite (Mg2SiO4) and fayalite (Fe2SiO4) binary system, with relatively minor substitution of other components. Pyroxenes and garnets are problematic in that they exhibit more diverse solid solution, and may contain both Fe2+ and Fe3+, the relative concentrations of which cannot be directly measured with the microprobe. The forsterite-fayalite olivine binary is a convenient system for studying the accuracy of Mg and Fe analysis without other complicating factors.
Bence and Albee utilized the a-factor approach for quantitative analysis of silicates, based on the empirical observation:

where CA,AB is the weight fraction of the oxide A in a binary oxide system AB, and KA,AB is the measured x-ray intensity of A relative to that of the pure oxide A.
Limits of Analytical Accuracy for Two Critical Semiconductors Systems: (Al, Ga)(As, P) and (In, Ga)(As, P)
Authors: Armstrong John T 
Published: July 2020

Abstract
Among the more important semiconductor materials, with commercially important applications in microelectronics, photonics, and nanodevice development are alloys in the system GaP-GaAs-AlAs- InAs (e.g., 1). These components have extensive regions of solid solution. With the wide variety of phases that can be grown in this system, it is possible to “tailor” heterojunctions that have desired band offsets or quantum wells that have a given shape of confinement potential, which is the basis of “bandgap engineering” (e.g., 2-4). In order to characterize the properties of these phases and maintain quality control in the manufacturing of devices utilizing these phases, it is critical to be able to perform accurate determinations of their compositions. This can be especially difficult, since many of the applications utilizing these phases involve micro- or nano-devices or thin multilayer coatings. In terms of the spatial analysis requirements, electron microbeam x-ray microanalysis is ideally suited for characterization of such specimens.
Beam Induced Composition Modifications During Electron Beam Microanalysis
Authors: Howitt D G , Medlin D L 
Published: July 2020

Abstract
The most common cause of composition modification to a specimen during electron probe microanalysis is the field induced migration of light elements. This is an indirect effect which occurs in response to the long range electric fields that form when dielectric specimens suffer charge imbalance. The result is that the ions are redistributed within the sample according to their respective mobilities and the affect is enhanced rather than eliminated when the sample is coated. The ions typically move radially outward in thin samples because of the excess production of secondary electrons from the specimen surfaces, Cazaux(1986)and downwards in conventional SEM samples when the field is due primarily to the deposition of electrons within the bulk of the specimen
Field induced migration is responsible for most of the elemental signal variations observed during the microanalysis of silicate glasses containing sodium or potassium ions.