Evaluation of Thermal Transport Characteristics of Three-Dimensional Self-Ordered Multilayered Silicon-Germanium Nanodots
Authors: Yokogawa Ryo , Maeda Yuiha , Sugawa Sho , Yamashita Yuichiro , Wen Wei-Chen , Yamamoto Yuji , Ogura Atsushi 
Published: August 2024

1. Background and purpose

Silicon-germanium (SiGe) alloys have much lower thermal conductivity than Si and Ge single crystals and are expected to be candidates for next-generation thermoelectric device materials of internet of things society. It is important to achieve both high carrier mobility and low thermal conductivity on the basis of the dimensionless figure of merit [1]. There are several studies on the thermoelectric properties of SiGe with low-dimensional structures such as superlattice and nanodots [2,3] to dramatically decrease thermal conductivity. However, the relationship between the nanoscale thermal properties and the phonon scattering mechanism of self-ordered multilayer SiGe nanodots with high uniformity grown by Stranski-Krastanov [4] mode is unclear. In this study, we demonstrated the thermal transport characteristics of the self-ordered multilayer SiGe nanodots.

2. Experiments

Si/SiGe superlattice and nanodots samples were fabricated by reduced pressure chemical vapor deposition. We set to 20 cycles of Si0.65Ge0.35 / Si superlattice, the staggered Si0.65Ge0.35 nanodots (alternately stacked) and the dot-on-dot Si0.65Ge0.35 nanodots (vertically stacked) by changing growth temperature and precursors for Si spacer growth [4], as shown in Fig. 1. Thermal properties were evaluated by the Time Domain Thermoreflectance (TDTR) method. The strain states and Ge fraction were evaluated by Raman spectroscopy. The focal length and wavenumber resolution of the Raman spectrometer were 2,000 mm and 0.1 cm-1, respectively. The excitation light source was a green laser (wavelength: 532 nm). We obtained the Raman spectra of Si-Si, Si-Ge, and Ge-Ge vibrational modes derived from the SiGe regions.

3. Results and discussion

Figure 2 shows the thermal conductivity for the SiGe region of the superlattice and nanodots (dot-on-dot and staggered structures) obtained by TDTR method. We found that the SiGe nanodots with the dot-on-dot structure have the highest thermal conductivity, while the SiGe nanodots with the staggered structure and SiGe superlattice have almost the same thermal conductivity. We consider that the heat flow easily penetrates from the top (surface) to the bottom (Si substrate interface) in the dot-on-dot structures. On the other hand, it is possible that the staggered SiGe nanodots can play a sufficient role as a phonon scatterer compared to the dot-on-dot structures since the superlattice structure and the staggered SiGe nanodots have almost the same thermal properties. In conclusion, we demonstrated the possibility of controlling phonon scattering by changing the arrangement of the self-ordered multilayer SiGe nanodots.

Acknowledgement

This work was supported by JSPS KAKENHI Grant Number 21K14201, Japan.

References

[1] M. Nomura et al., Jpn. J. Appl. Phys. 57, 080101 (2018).

[2] P. Chen et al., Phys. Rev. Lett. 111, 115901 (2013).

[3] P. Chen et al., J. Appl. Phys. 115, 044312 (2014).

[4] Y. Yamamoto et al., Semicond. Sci. Technol. 33, 114014 (2018).

Figure 1