bluuebunny/crossref_metadata_2025 huggingface dataset:
Tocqueville’s Misreading of America, America’s Misreading of Tocqueville
Authors: Pessen Edward
Published: October 2021

I am delighted to have been invited to participate in this celebration of Alexis de Tocqueville. For, as a conscientious worker, I have interpreted the invitation as a summons to reread Democracy in America. What a pleasure to lose oneself in a book of such wisdom, originality of interpretation, intellectual boldness, sweep, erudition, wisdom, and felicity of style, particularly after having recently endured, as book reviewer, books so crabbed in theme and manner of telling as to induce physical as well as mental pain! As the few of you likely to be familiar with my publications will know, my admiration for Tocqueville has been tempered by what some Tocquevilie-ans might call a perhaps excessive sensitivity to the flaws in his discussion of American society during the Jacksonian era.
Women’s Work and the Family Economy : Textiles and Palm Leaf Hatmaking in New England, 1830–1850
Authors: Dublin Thomas
Published: October 2021

In May 1832 the recently married Roxanna Bowker Stowell wrote from her new home in St. Johns-bury, Vermont to Dexter Whittemore, a country storekeeper in her native town of Fitzwilliam. New Hampshire. She asked him to send split palm leaf which she hoped to braid into hats and sell back to him for cash to meet family expenses. « [M]once is so very scarce and we must have some, » she wrote. Thirteen years later, fifteen-year old Mary Paul wrote her father from Woodstock, Vermont, where she was living with an aunt and uncle: « I want you to consent to let me go to Lowell if you can. I think it would be much I cannot get if I stay about here.
Social Transitions and the deconstruction of the Family : Reflexions on Research into the Domestic Circumstances of the Victims of Economic Change
Authors: Harris Christopher C.
Published: October 2021

This paper arises out of, and reports some of the preliminary results of a study (funded by the British Social Science Research Council – Grant GOO 230023 – to which grateful acknowledgment of financial support is here made)which seeks to relate the domestic organization and « local social networks • of a sample of steelworkers made redundant from a British Steel Corporation plant in Port Talbot, South Wales, in the summer of 1980. The sample has been interviewed three times: April-June 1981; April-June 1982 ; October-December 1982. Forty married couples under 50 years of age, drawn from the sample, have been studied in depth
Incidences de l’activité féminine sur la participation du père à la vie familiale
Authors: Gokalp Catherine , Léridon Henri
Published: October 2021

Les relations entre la vie familiale et la vie professionnelle sont nombreuses et, pour certaines d’entre elles, évidentes. Le premier effet de l’activité professionnelle c’est, pour la grande majorité des actif et des actives, déplacemnet entre domicile et lieu de travail.
Débat sur la conjoncture politique
Authors: Crozier Michel , Lavau Georges
Published: October 2021

Français Mitterrand a déclaré en juin 1983 : « Il n’y a pas de politique de rechange. Aucune politique ne dispensera les Français de l'effort nicessaire ». Scion vous, y a-t-il un changemeni de cap par rapport au projet socialiste? Comment rigueur et socialisme peuvent-il se conjuguer?
Colloquium on U.S. and French Industrial Policy
Authors: Wotman Russell
Published: October 2021

According to a common misperception, the U.S. represents anadvanced service economy, France a classic industrial economy. In reality, both arc service economies : both nations for example run merchandise deficits and service surpluses. More alike than is generally thought, both France and the U.S. experienced basic structural economic changes which devastated their traditional « smoke-stack » industries.
Colloque « Mise en question de l’Etat-Providence et émergence de la cité »
Authors: Body-Gendrot Sophie
Published: October 2021

Le colloque sur la mise en question de l’Etat-Providence et émergence de la Cité s’est déroulé à l’université de Paris-X Nanterredu 10 au 12 octobrc 1983, sous 1’égide du comité spécialisé dans les recherches communautaires de l’Association internationale de sociologie.
Reforming the American Welfare Family : 1969-1981
Authors: Glazer Nathan
Published: October 2021

Between 1969 and 1981 the United States was engaged in a major effort to solve in what was considered a rational and systematic way the problem of the poor and dependent family. In 1969, under the Nixon administration, a Family Assistance Plan (FAP) to replace welfare-need-based, non-contributory maintenance income for the poor-was proposed. It had a checkered career over the next few years, with the character of the proposed program being varied with each year of Congressional action in response to political criticism and emergent findings from major social experiments.
Balassa and the Government on France’s Most Pressing Economic Problems : A Brief Commentary
Authors: Anyadike-Danes Michael K.
Published: October 2021

Aredistribution of France's national income to increase the share of corporate profits lies at the heart of Balassa's programme for the achievement of faster growth in output and employment. However his belief that a profits « squeeze » is responsible for the depressed state of corporate investment has rather insecure statistical foundations. Of more immediate relevance to the medium term future of the economy is likely to be the government's apparent conviction that solutions to it's own budgetary problems, and to those posed by the balance of payments, are a pre-condition for renewed growth in France.
Alternative Models of Peasant Families : A Critique of the New Home Economics
Authors: Wiegandt Ellen , Luterbacher Urs
Published: October 2021

In presenting some ideas about the organization of families, this paper includes an explicit criticism of « economistic » theories of the family and social institutions. Broadly conceived, « economism », or the explanation of societal forms and phenomena through economic and productive processes, has become one of the dominant paradigms in modem social science. Two powerful currents of thought have largely contributed to the development of this perspective – Marxism on the one hand and, more recently, the Chicago school of economics which applies so-called neoclassical analysis to all kinds of institutions ranging from slavery (Fogel and Engerman 1974), to feudalism (North and Thomas 1971), to the family (Becker 1981), and to legal organizations (Posner 1981).
National Moods and Organizational Structures
Authors: Caplow Theodore
Published: October 2021

Few foreign visitors have known the United States as well as Michel Crozier. For that matter, few Americans do. When he speaks about “the trouble with America” it behooves us to listen and to mark his words. The Washington Post announced his forthcoming book with a two-column headline, “America, An Adult Nation Can’t Afford Your Illusions,” and that seems to be a fair synopsis. “This is now the time” writes Crozier, “for America to learn again, to forget its dreams of innocence and superiority, to become humble enough to accept that there are lessons to learn from the rest of the world and from the facts” (Crozier, 1984, 5). America, it appears, is a retarded adolescent.
The Cultural Sources of Innovation A Commentary on Michel Crozier
Authors: Clark Terry Nichols
Published: October 2021

If Tocqueville were to return in 1984, he might be tempted to stay in Cambridge and travel by television. The raw material is obviously rich. But he should go beyond the talkshows to interpret the native rites. That there are problems in America is clear, but separating the superficial from the more fundamental is a first step toward reasonable solutions.
Scènes de la vie politique Française (Suite)
Authors: Schonfeld William
Published: October 2021

Le hasard des rencontres favorisa mes efforts en vue d’obtenir l’autorisation de mener mes recherches. Au moment des elections présidentielles américaines de novembre 1976, je fus invité à participer à l’analyse des résultats sur France-Inter. Parmi les autres participants se trouvaient Yves Guéna, alors Secrétaire Général de l’UDR, ainsi qu’un responsable socialiste de premier plan.
The American Jews, the 1984 Elections, and Beyond
Authors: Lipset Seymour M. , Raab Earl
Published: October 2021

As usual, the rumors about the Jews were wrong. There had been much speculation that American Jews were finally going to succumb to the political destiny of all affluent groups and vote Republican. They did not.
The Outlook for the U.S. Economy in 1985
Authors: Tracy Ronald
Published: October 2021

President Reagan has just been reelected to another four year term as President. Although by any measure he won a landslide victory over former Vice President Mondale, his election did not sweep in the large number of other Republican candidates* that would have given him the clear mandate he was hoping for.
St. Pierre and the Project of Perpetual Peace
Authors: Caplow Theodore
Published: October 2021

One thinks of him as a voluble, untidy little priest, his pockets stuffed with papers and his mind with projects. But the portrait in the mairic of his home town, St. Pierre-Eglise in Normandy, shows a face full of serenity and power. He bears a distinct resemblance to William Penn, another well-connected social inventor, who published his own plan for perpetual peace twenty years before St. Pierre.
Le Mouvement des indicateurs sociaux aux Etats-Unis
Authors: Fattaccini Pierre
Published: October 2021

Les premiers travaux sur Ies I.S. (Indicateurs Sociaux) initiés aux Etats-Unis au début des années soixante se sont développés dans un contexte historique particulier : une croissance économique heurtée et des projets technologiques et spatiaux ambitieux dont on évaluait malles retombées sociales, une administration gagnée aux idées keynésiennes sur le plan économique et favorable à un réformisme actif dans le cadre de la « Great society.
Prospects for Social Reporting in the United States: A Receding Horizon
Authors: Rockwell Richard C.
Published: October 2021

This essay sets forth the thesis that social reporting in the United States has suffered from an excess of modesty among social scientists. This modesty might be traceable to an incomplete model of scientific advance. one that has an aversion to engagement with the real world. The prospects for social reporting in the United States would be brighter if reasonable allowances were to be made for the probable scientific yield of the social reporting enterprise itself. This yield could support and improve not only social reporting but also many unrelated aspects of the social sciences.
L’audiovisuel dans les années socialistes
Authors: Cayrol Roland
Published: October 2021

On connaît le péché mignon du doux pays de France : le pouvoir y a toujours un peu trop aimé les moyens d’information, au point de vouloir les garder sous son aile protectrice.
Commentaires sur 1’article de David L. Schalk
Authors: Domenach Jean-Marie
Published: October 2021

In her seminal book, States and Social Revolutions, Theda Skocpol advances a structural theory of revolution based on a comparative analysis of the French, Russian, and Chinese revolutions. She identifies state-class, state-economy, and state-state relations as the three key structural variables determining a state’s vulnerability to “revolution from below.” The importance of the structural perspective to the study of revolution is convincingly established by Skocpol.
Locate Faulty Components by IR Based Direct Current Injection Method with Analog Signature Analysis
Authors: Zhu Zhifeng , Leone Paul
Published: October 2021

This article describes a method that combines Analog Signature Analysis (ASA) with IR based Direct Current Injection (IRDCI) for printed circuit board assembly failure analysis. The integration of ASA extends the diagnostic capability of IRDCI from shorted power rails to any measurement location that shows signature differences. It also facilitates the detection of electrical breakdown or degradation without having to remove suspected faulty components from the board.
Automated TEM Workflow for Inline Defect Characterization
Authors: Shim Hyun Woo , Lee Taehun , Kwon Jonghan
Published: October 2021

This study shows that a high-volume TEM workflow can be achieved for inline defect characterization by adding a defect marking step using commercially available tools. A simple user-assisted defect marking procedure added to a conventional automated ex-situ lift-out TEM workflow increased throughput by a factor of nearly three and reduced man-hours by an order of magnitude, a significant improvement over conventional TEM workflows.
The Role of Cloud Computing in a Modern Reverse Engineering Workflow at the 5nm Node and Beyond
Authors: Pawlowicz Chris , Trindade Bruno , Green Michael
Published: October 2021

Modern reverse engineering (RE) workflows involve a growing number of challenges as process nodes drop below 5 nm. As more circuitry is packed into smaller areas, larger quantities of raw data must be collected and processed to help reconstruct the underlying schematics of the circuit under test. This paper examines the role of cloud computing in reverse engineering, explaining how it improves throughput by orders of magnitude for 2D image registration and how it facilitates high-quality image segmentation with the help of machine learning.
PCB Netlist Obfuscation with Micro Electro Mechanical Systems and Additive Manufacturing Techniques
Authors: True John , Xi Chengjie , Khan Aslam , Hihath Josh , Asadizanjani Navid
Published: October 2021

Semiconductor manufacturing, including the multistep fabrication of ICs and tedious assembly of PCBs, has been outsourced to untrusted regions due to globalization. This invites many problems particularly for PCBs, which are vulnerable to nondestructive methods of attack such as X-ray data collection and surface trace probing. In the case of ICs, high-z materials have proven to be an effective countermeasure to block or scatter X-rays, but PCBs, because of their larger dimensions, are more difficult to fully secure. In this paper, a framework for passively obfuscating the critical connections between components on PCBs is demonstrated. A proof of concept is presented whereby an EDA tool combining the small features of micro electromechanical systems with X-ray simulation and 3D manufacturing processes is used to iteratively optimize a PCB design to thwart reverse engineering and probing attacks.
In-Situ Electrical Biasing of Electrically Connected TEM Lamellae with Embedded Nanodevices
Authors: Brodovoi Maria , Gruel Kilian , Chapuis Lucas , Masseboeuf Aurélien , Marcelot Cécile , Hÿtch Martin , Lorut Frédéric , Gatel Christophe
Published: October 2021

In this paper, we demonstrate with a case study on a nanocapacitor, the capability of transmission electron microscopy in electron holography mode to be a unique in-situ technique for mapping electric fields and charge distributions on a single device. Such precision is necessary to keep pace with shrinking device dimensions and the ever increasing complexity of device architectures.
Early Fault-Analysis Using In-Line Raman Spectroscopy Metrology
Authors: Fishmana D. , Neemana L. , Meira N. , Orena Y. , Baraka G. , Avidana A. , Ofeka J.
Published: October 2021

Traditionally, reliability defects are addressed by end-of-line electrical measurements and extensive and dedicated testing during packaging. These tests cover almost every known defect condition and ensure product reliability with high confidence, but they occur in the final stage of manufacturing and are quite time intensive. This paper shows that inline reliability metrology based on Raman spectroscopy is an effective approach for early fault detection and can be used to monitor unintended epi growth, strain, lattice defects, stacking faults, dislocations, and post-etch residues. It can also reveal process anomalies and potential material problems. The paper examines the relationship between process parameters and reliability and reviews the enablers of preventive, early-detection inline metrology in the fab.
Quantile Based Statistical Failure Analysis for Wafer Level Test Comparison
Authors: Bae Jeongwon , Kim Minjoo , Lee Jongbum , Oak Myunghoon , Park Choongsun , Park Sunghun , Yim Sungsoo , Hong Heeil , Lee Jooyoung
Published: October 2021

There are many wafer level tests, such as Fail Bit Count (FBC), where conventional statistical analysis methods are inadequate because the associated data do not follow a normal distribution. This paper introduces a statistical failure analysis technique that does not rely on location and scale parameters and is thus able to handle such cases. It describes the math on which the method is based and explains how to determine effect size (ES) using the quantile comparison equivalence criteria (QCEC) and a statistical parameter, called the center of dispersion (CoD), that distinguishes between center difference and dispersion difference. It also includes a case study showing how the new method is used to assess the effect of a process change on dynamic random access memory test data and how it compares in terms of accuracy with conventional statistical techniques.
Fast and Effective Sample Preparation Technique for Backside Fault Isolation on GaN Packaged Devices
Authors: Colpaert Tony , Verleye Stefaan
Published: October 2021

This paper describes a procedure for preparing packaged GaN devices for photon emission microscopy from the backside, which has proven to be an effective method for isolating faults. The deprocessing technique was developed for GaN devices formed on thick p++ silicon substrates mounted in quad-flat no-lead (QFN) packages connected by gold wires. It consists of mechanical polishing, which removes backside metal and packaging material, and selective etching, which quickly etches the silicon while leaving the gold wires intact for electrical measurements. The authors describe each step of the process in detail and explain how emission spots are marked with a UV laser and analyzed in a FIB-SEM system to determine the underlying cause of failure.
Failure Case Studies of GaAs-Based Oxide-Confined VCSELs
Authors: Ho Kuang-Tse , Li Cheng-Che
Published: October 2021

Vertical-cavity surface-emitting lasers (VCSELs) have many advantages over edge-emitting devices, but they tend to be more sensitive to increasing current density both in lifetime and reliability. To better understand this relationship, the authors investigated the cause of 35 failures involving GaAs-based oxide-confined VCSELs. This paper presents a summary of the procedures, methods, and equipment used, the defects and damages observed, and the root causes behind each failure. The authors followed a standard failure analysis workflow consisting of PEM and OBIRCH fault isolation, plan view TEM to confirm the location and distribution of defects, and cross-sectional TEM (XTEM) to determine the profile of a defect at a specific site. All failures examined could be attributed to one of four basic failure mechanisms: burnout due to ESD, dislocations, oxide diffusion, and oxide delamination.
Automated Metrology on the Verticality of Cross-Sectioned Channel Hole at V-NAND with Over 200 Layers by Transmission Electron Microscope
Authors: Kim Dong-yeob , Son Jong-ick , Kang Christopher H
Published: October 2021

This paper describes the development and implementation of a TEM-based measurement procedure and shows how it is used to determine the verticality or etching angle of channel holes in V-NAND flash with more than 200 layers of memory cells. Despite the high aspect ratio of the region of interest, the method can resolve offsets down to a few nm. Such precision is critical, as the paper explains, because the radius and thus electrical characteristics of each memory cell is determined by the etching angle.
Advanced Soft Defect Screen Methodology for Nanoscale SRAM Yield Improvement
Authors: Kim Pangyum , Kim Hyungtae , Kim Youngdae
Published: October 2021

This paper explains how embedded assist and timing control techniques are being used to improve soft defect screening in nanoscale static random access memory (SRAM). The electrical stress test method is evaluated on advanced FinFET devices. As test results show, resistive and parametric defects that are difficult if not impossible to detect using conventional techniques become visible with the aid of assist and timing control circuits.
Enabling Automated Sample Delayering, Imaging, and Probing Prep with an Adaptive Endpointing Workflow
Authors: Morgan-Jones Sean , Carleson Pete , Najarian Mark , Mitchson Gavin , Franco Noel , Weeks Sophia , Mandala Suri
Published: October 2021

With manufacturers now capable of creating transistors in the 5-7 nm node range, the ability to isolate, inspect, and probe individual metal and via layers is of the utmost importance for defect inspection and design validation. These isolated layers can be inspected for defects via SEM, provide design validation, or tested with electrical probing for failure analysis. The work herein describes a functional workflow that enables manufacturers to perform this kind of sample preparation in an automated fashion using plasma focused ion beam (FIB) technology. The workflow is scalable and can be used in both lab and fabrication environments.
Automated Cell Layer Counting and Marking at Target Layer of 3D NAND TEM Samples by Focused Ion Beam
Authors: Ryu Jisu , Kim Seojin , Kang Christopher H. , Baek Jaeheum
Published: October 2021

This paper discusses the development of an automated cell layer counting process for preparing 3D NAND flash memory samples for TEM analysis. In an initial proof-of-concept, several line markings were inscribed on the test device in evenly spaced intervals in order to evaluate its helpfulness for a human operator. A more automated procedure was then developed in which cell layers were counted to a desired target layer starting from a reference layer set by the operator. At that point, the operator could begin preparing the TEM sample.
P-N Junction Analysis using Electron Beam Induced Current (EBIC) Technique
Authors: Sarnecki Lori L. , Kuan Regina
Published: October 2021

This paper describes how electron beam induced current (EBIC) analysis is used to determine the doping profile of p-n junctions and identify defective devices. The limitations of both chemical etching and EBIC are discussed as is the use of ion milling as a potential method for enhancing resolution. The findings in this paper add to the understanding of EBIC and provide insights to further improvements in its use in failure analysis.
Practical Methodologies in Restoring Initial Failure Mode and Backside Focused Ion Beam Cross-Section for Defect Visualization
Authors: Tampos Alvina Jean , Villareal Karl
Published: October 2021

An image sensor module failed in the field and was returned showing functional issues and a supply-to-ground short. After the hard lens mounted over the imaging chip was removed, the short disappeared along with the functional issues. This paper explains how the authors were able to restore the failure mode and discover the underlying defect, via backside focused ion beam cross-sectioning, with minimal intrusion into the top-side package and silicon.
Electro-Optical Probing for Capturing Fast-to-Rise Scan Chain Failures
Authors: Villareal Karl , Estores Rommel , Baert Peter
Published: October 2021

This paper explains how the authors determined the cause of a fast-to-rise failure discovered during scan chain testing of an image sensor. The failed device was mounted on a portable card that facilitates transfer between test platforms in an electro-optical probing (EOP) system. Initial fault localization was conducted through backside PEM, but the results were inconclusive. The part was then analyzed on a digital scan chain tester to check for flaws in the daisy chain of shift registers. Through broken scan chain analysis, the potential cause of the problem (a failing flip-flop) was narrowed down to a few chain links and ultimately pinpointed using EOP fault isolation techniques. The failed device was then deprocessed by parallel lapping and analyzed in a SEM, revealing a broken poly gate as the physical cause of failure.
Maximizing ATPG Diagnosis Resolution on Unique Single Failing Devices
Authors: Sabate Andrew , Estores Rommel
Published: October 2021

For unique single failures, which tend to be the case in customer return and reliability failures, selecting another sample or performing root cause deconvolution is not an option, and if diagnostic tests are not conclusive, it becomes necessary to extend the effectiveness of automatic test pattern generator (ATPG) diagnosis in order to determine the failure mechanism. This paper proposes a way to improve resolution using single-shot logic and high-resolution targeted patterns. Two cases are presented to demonstrate the approach and show how it performed on actual failing units.
Genetic Algorithm-Based Digital Test Optimization Method and its Application to Yield Improvement
Authors: Chan Y.H. , Goh S.H.
Published: October 2021

This paper presents a machine learning approach that uses genetic algorithms to optimize test program timing sets based on first silicon. The method accounts for test hardware differences, discrepancies in silicon processes, and IO pin interdependency. The general theory and implementation are covered in detail and the capabilities of the method, in terms of false fail discovery, elimination, and failure debug, are demonstrated using actual product test cases.
Defect Inspection Wafer Notch Orientation and Defect Detection Dependency
Authors: Purwaningsih Lindarti , Konsulke Philipp , Tonhaeuser Markus , Jantoljak Helena
Published: October 2021

This case study shows that wafer notch orientation can have a significant effect on defect capture rates obtained during defect inspection. The discovery was made when a review of historical data showed that the relationship between defect densities and yield varied greatly for different products in regard to a terminal metal layer. A product design analysis on the affected layer revealed that a majority of metal lines were oriented the vertical direction in one product and in the horizontal direction in the other. It was then shown that this difference could be offset by rotating the wafer in the defect scan tool, which resolved the data discrepancy. This work highlights the importance of considering the orientation of metal lines in each layer when creating a new defect scanning recipe.
Large Area Semiconductor Device Delayering for Failure Identification and Analyses
Authors: Nowakowski Pawel , Bonifacio Cecile , Ray Mary , Fischione Paul
Published: October 2021

This paper presents a development in semiconductor device delayering by broad ion beam milling that offers a uniform delayering area on a millimeter scale. A milling area of this size is made possible by the user's ability to position ion beams individually to cover the desired area. This flexibility in ion beam positioning also enables more precise targeting of an area of interest.
A Novel Sample Preparation Method for Frontside Inspection of GaN Devices after Backside Analysis
Authors: Colpaert Tony , Verleye Stefaan
Published: October 2021

This paper presents a method that allows top view SEM inspection on GaN devices previously subjected to PEM analysis from the backside and the associated sample preparation procedures. By filling the backside cavity with glob-top resin and epoxying the device to a piece of silicon, it is possible to remove all covering layers with a sequence of wet etches. A dried Ag liquid strap eliminates SEM charging problems and backside laser marks are made visible from the front side using an IR wavelength. The paper describes each step of the process in detail along with the results of the frontside SEM inspection.
Simultaneous Interface Defect Density and Differential Capacitance Imaging by Time-Resolved Scanning Nonlinear Dielectric Microscopy
Authors: Yamasue Kohei , Cho Yasuo
Published: October 2021

This work highlights the unique capabilities of time-resolved scanning nonlinear dielectric microscopy as demonstrated in the study of SiO2/SiC interfaces. Scanning nonlinear dielectric microscopy (SNDM) is a microwave-based scanning probe technique with high sensitivity to variations in tip-sample capacitance. Time-resolved SNDM, a modified version, is used in this study because it allows simultaneous nanoscale imaging of interface defect density (Dit) and differential capacitance (dC/dV), lending itself to correlation analysis and a better understanding of the relationships that influence interface quality. Through cross-correlation analysis, it is shown that Dit images are not strongly correlated with simultaneously obtained dC/dV images, but rather with difference images derived from dC/dV images recorded with different voltage sweep directions. The results indicate that the dC/dV images visualize the nonuniformity of the total interface charge density and the difference images reflect that of Dit at a particular energy range.
Yield Basics for Failure Analysts
Authors: Albert Dave , Myers Tracy
Published: October 2021

This presentation provides an overview of the terminology and concepts associated with semiconductor yield analysis, modeling, and improvement techniques. It compares and contrasts yield models and describes the steps and equipment involved in setting up yield engineering programs targeting specific failures and defects. It also includes case histories showing how different yield analysis models have been used to identify the root cause of random and systematic failures.
Photonic Localization Techniques
Authors: Boit Christian
Published: October 2021

This presentation provides an overview of photonic measurement techniques and their use in isolating faults and locating defects in ICs. It covers transmission, reflectance, and absorption methods, describing key interactions and important parameters and equations. Reflectance methods discussed include electro-optical probing (EOP), electro-optical frequency modulation (EOFM), and laser-voltage imaging (LVI). Absorption methods covered include those based on the absorption of light in semiconductors, as in optical beam induced current (OBIC), light-induced voltage alteration (LIVA), and laser-assisted device alteration (LADA), and those based on absorption in metals, as in thermally induced voltage alteration (TIVA), optical beam induced resistance change (OBIRCH), and thermoelectric voltage generation or Seebeck effect imaging (SEI). The presentation also covers thermoluminescence (lock-in thermography) and electroluminescence (photon emission) measurement methods and assesses hardware security risks posed by current and emerging photonic localization techniques.
Technique Selection for Front End of Line Defect Localization in Bulk Si FA
Authors: Johnson Greg
Published: October 2021

This presentation is a pictorial guide to the selection and application of measurement methods for defect localization. The presentation covers electron beam absorbed current (EBAC), electron beam induced current (EBIC), passive voltage contrast (PVC), optical and electron beam induced resistance change methods (OBIRCH and EBIRCH), lock-in thermography, photon emission microscopy (PEM), and nanoprobing. It describes how the measurements are made, the sensing mechanisms involved, and the output that can be expected.
Flip-Chip and Backside Techniques
Authors: Cole Edward I. , Fishgrab Kira L. , Barton Daniel L. , Bernhard-Höfer Karoline
Published: October 2021

This presentation covers the basic physics needed to effectively apply backside IC analysis techniques to flip-chip packaged die. It describes the principles of light transmission through silicon and the factors that influence optical image formation from the backside of the wafer or die. It also provides information on the tools and techniques used to expose surfaces, regions, and features of interest for analysis. It describes the steps involved in CNC milling, mechanical grinding and polishing, reactive ion etching (RIE), laser microchemical (LMC) etching, and milling and etching by focused ion beam (FIB). It explains where and how each technique is used and quantifies the capabilities of different combinations of methods.
An analysis of the attitudes of internet users towards the islamic ﬁnancial system
Authors: Alasgarova N. M.
Published: October 2021

In this article has been explored the attitude of Internet users toward the Islamic ﬁnancial system using data from Google Trends and WorldData.AI. An attitudes towards Islamic ﬁnance, Islamic economics and Islamic banking have been compared using from Google Trends survey statistics. Also, in the WorldData. AI. source has been analyzed that the news texts on Islamic ﬁnance for the last 12 months and found that the public attitude towards Islamic ﬁnance was positive.
What COVID-19 Taught Us About Pedagogy and Social Justice—Pandemic or Not
Authors:   University of San Francisco, Lawless Brandi , Chen Yea-Wen ,   San Diego State University
Published: October 2021

The COVID-19 pandemic (in conjunction with the Black Lives Matter Movement) exposed pervasive inequities, challenges, and opportunities to explore and implement “best” pedagogical practices to improve how we address social justice issues. Moreover, the COVID-19 pandemic intensified intergenerational gaps for the already vulnerable, under-resourced, and marginalized in our society. In response, we propose four “best practices” to embrace in our classrooms. These are: (a) fostering flexibility to bridge equity gaps; (b) rethinking the pedagogical panopticon; (c) emphasizing listening to and affirming students’ struggles; and (d) employing student-centered accountability. The authors detail some specific inequalities that were brought to the surface during the Spring and Summer of 2020, offer “best practices” in response to such inequities, and stress the need for a student-centered pedagogy that serves to improve teaching and learning not just during a crisis, but also in semesters and years to come.
Unpacking Privilege in Pandemic Pedagogy: Social Media Debates on Power Dynamics of Online Education
Authors:   University of North Carolina at Greensboro, Schwartzman Roy
Published: October 2021

As one of the world’s major social media hubs dedicated to online education during the COVID-19 pandemic, the Facebook mega-group Pandemic Pedagogy provides a panoramic perspective of the key concerns educators and students face amid a public health crisis that forces redefinition of what constitutes effective education. After several months of instruction under pandemic conditions, two central themes emerged as the most extensively discussed and the most intensively contested: (1) rigor versus accommodation in calibrating standards for students, and (2) ways to improve engagement during classes conducted through videoconferencing, especially via Zoom. Both themes reveal deeply embedded systems of privilege and marginalization in the structures and methods of online education. The pandemic starkly exposes disparities in access, equity, and inclusivity. Addressing these challenges will require explicit measures to acknowledge these power imbalances by rethinking what counts as effective teaching and learning rather than relying on institutions to revert to business as usual after this pandemic abates.
“No Justice, No Peace”: Yard Signs as Public Pedagogy and Community Engagement at the Intersection of Public Health Crises
Authors:   University of Minnesota, Mussack Brigitte
Published: October 2021

This paper examines yard signs as a site for public pedagogy that engages two concurrent, and comorbid, public health crises: the COVID-19 pandemic and racism. Specifically, I reflect on how yard signs responding to the George Floyd murder in my own Minneapolis neighborhood exist during a kairotic moment; as myself and my students are increasingly confined to our own homes, and as the boundaries between school and home are blurred, the public health crisis of racism and the specific community response of yard signs present opportunities for examining how these signs can act as entry points into difficult conversations among neighbors, classmates, and colleagues. While such signs are certainly examples of epideictic rhetoric, participating in either “praise or blame,” I suggest that communication teachers can frame them as public pedagogy that “strikes a harmony between learning through public engagement and understanding these public encounters in the space of the classroom” (Holmes, 2016). As such, they can act not only as artifacts of community belonging, but as artifacts to promote reflection, conversation, and inquiry.
Invisibility as Modern Racism: Redressing the Experience of Indigenous Learners in Higher Education
Authors:   University of Alaska Fairbanks, May Amy , McDermott Victoria ,   University of Maryland
Published: October 2021

Indigenous Peoples represent the smallest group of ethnic minorities in the United States, and they are significantly underrepresented in the academy. The tumultuous relationship between institutions of higher learning and First Nation Peoples can be explained in part by the use of education to colonize and force the assimilation of Native Peoples. The end result of centuries of dehumanization and marginalization is invisibility, “the modern form of racism used against Native Americans” (the American Indian College Fund, 2019, p. 5). Educators are challenged to identify institutional inequities and redress barriers to promote social justice through informed and genuine practice, indigenization, and curriculum development that reflects intercultural communication competence.
Genital Herpes and pregnancy
Authors: Laamari Kaoutar
Published: October 2021

Female patient aged 30, at 7 months of pregnancy, admitted to gynecology for genital pain associated with pruritus that has been evolving for one week . On clinical examination, she presents a vulvar edema, ulceration with polycyclic contours and some vesicles on the periphery. The diagnosis of herpes genital was confirmed. The patient took an antiviral treatment. Genital herpes is a sexually transmitted disease caused by the herpes simplex virus (HSV). It is the most frequent cause of genital ulceration worldwide.
TUDY OF THE ROLE OF VITAMIN D IN CHILDREN WITH PROGRESSIVE MYOPIA
Authors: Frolova T. , Bezdetko P.
Published: October 2021

There is controversy in ophthalmic research as to whether vitamin D deficiency is an independent factor in the progression of myopia.
SUBJECTIVE ATTITUDE TO REMOTE WORK AMONG SPECIALISTS WITH DIFFERENT INDIVIDUAL-TYPOLOGICAL CHARACTERISTICS IN COVID-19 CIRCUMSTANCES
Authors: Shirokaya M. , Zhukova O.
Published: October 2021

The study is focussed on the specialist’s with different individual-typological characteristics attitude to the changed conditions for accomplishing work tasks, satisfaction and professional success in the conditions of remote work during global pandemic. Objectives of the study: learn about the attitude specifics of the specialists with different individual-typological characteristics (cognitive styles) to remote work, job satisfaction during pandemic and professional success.

The study involved 120 respondents. To obtain the results a professional psychological questionnaire and a methodology of individual typological characteristics (L.N.Sobchik) were used. As a result of the analysis, it was found that respondents with different cognitive styles differ among themselves in the indicator of assessing the duration of working hours after the introduction of a remote work format, a subjective indicator of preference (choice) of a remote work format over face-to-face and professional success in these conditions. Respondents with formal-logical, verbal and accentuated cognitive styles noted an increase in the duration of working hours during switching to a remote work format and they had the lowest indicators of professional work success. Individuals with visual-figurative and intuitive cognitive styles did not notice an increase in the duration of working hours due to the transition to a distance with the highest indicators of professional success in activity. It is concluded that the

"stress of time" was a valid factor influencing the decrease in professional success in the conditions of universal telecommuting in a pandemic. No connection was found between the cognitive styles of the respondents and the subjective assessment of job satisfaction in a distant setting.
TONGUE-TWISTER AS A METHOD OF STUDENTS’ PRONUNCIATION TRAINING AT HANOI UNIVERSITY (INITIAL STAGE OF TRAINING)
Authors: Do Thi Hong Nhung
Published: October 2021

This paper discusses the ways of employing tongue-twisters in training students’ pronunciation at the Hanoi University (the initial stage of training). The study analyzes the accent of students of the Hanoi University as well as the most common difficulties in the pronunciation of students. The article examines the similarity and differences in the pronunciation of the Russian and Vietnamese languages. The author of the research proposes suitable tongue-twisters and games that can be used in Russian language classes to practice pronunciation.
BASIC POLITICAL VALUES
Authors: Kryukov V. , Rubancova T. , Sotnikova E.
Published: October 2021

In the article, from the point of view of the theory of values, the main categories of political philosophy are considered: politics, management, power. The tribal community was governed by rituals and taboos. In civil society, it is necessary to develop an order of relations between strangers, and for this it is necessary to adopt some rules of behavior that become laws and develop into legal codes, sets of legal norms.

 Two circumstances are of fundamental importance in the functioning of social roles: due to the fact that the social role is a secondary and transformed form of personality, it represents, replaces one, several or many personalities. The phenomenon of representation is dialectically accompanied by its reverse side – the personification of a social role. The performer of a particular social role, occupying a position, being nominated for a particular post, being endowed with a certain rank, rank or degree and title, not only freely, but also out of necessity identifies himself and his social position.
ECONOMIC ASPECTS OF PRODUCTION OF USEFUL FOSSILS IN THE ARCTIC ZONE OF THE RUSSIAN FEDERATION
Authors: Veretennikov N. , Leontiev R.
Published: October 2021

The article analyzes the economic aspects of mining in the Arctic zone of the Russian Federation (AZRF) on the example of industrial development of deposits of precious metals (gold, platinum and silver). The role of the mining industry in the development of the economy and social sphere of the Arctic regions is revealed.
THE ARCTIC: THE TRANSPORT AND TELECOMMUNICATION OF INFRASTRUCTURE, THE ECONOMY, NATIONAL SECURITY
Authors: Veretennikov N. , Leontiev R.
Published: October 2021

At the current time, it is impossible to manage the economy of the Russian Arctic zone regions without creating an infrastructure that will allow organizing effective management of the entire complex of industries located in these territories. In order to organize the development of the territory and living conditions on it, it is necessary to create the infrastructure and environment for comfortable living of the employed and residing population. First of all, it concerns the necessity to strengthen integration processes as the population living there experiences discomfort from the impossibility to use modern telecommunication and information services. In this article the author analyzes and proposes the concept of development and use of fiber-optic communication lines, which could provide (after their installation) the most inhabited communities with digital economy services at affordable prices. The population living in the northern regions and working in hydrocarbon production companies is partially provided with modern services through the construction of departmental communication lines for the management of production and transportation complexes. Get the integration of regional management systems based on the development of digital economy from the laying of Russian communication lines, replacing the use of satellite Internet owned by foreign companies. This will help to use information resources more efficiently in the process of management and interaction to solve common tasks of the Russian Arctic zone where the population lives on a permanent basis. In addition, the most important part of the construction of modern communication lines in the Arctic is to ensure the country’s defense capability of its northern borders, protection of the Northern Sea Route - the main route for the delivery of liquefied gas to Europe and Asia.
Pitting resistance evaluation of ternary Ni-Cr-Mo alloys in flue gas environment
Authors:   Al-Farabi Kazakh National University, Kemelzhanova A. , Mukashev K. ,   Al-Farabi Kazakh National University, Muradov A. ,   Al-Farabi Kazakh National University, Lampke T. ,   Technische Universität Chemnitz, Mussabek G. ,   Al-Farabi Kazakh National university
Published: October 2021

After the appearance of pitting corrosion, the corrosion rate reaches very high values, which leads to a deterioration in the quality of the product in a short time. It may happen that the pitting does not continue its penetrating effect: if there are no necessary conditions for its growth, a pitting of greater activity is not formed, which will absorb all the current supplied from the area surrounding the cathode. Results of potenciodynamic investigations of four Ni‐base alloys are presented. The tests were conducted in 1 percent sulphuric acid, containing 0.2 percent chlorides at temperature 353K. Gravimetric test, performed in the same conditions, revealed excellent properties of alloy signed A3. Pitting corrosion of alloy A4 at the test conditions after long exposure at 353K was observed and was confirmed by the applied tests. The multiple anodic polarization (MAP) method is proposed to control alloys’ susceptibility to pitting corrosion.