VECTOR-DRIVEN LOGIC AND STRUCTURE FOR TESTING AND DEDUCTIVE FAULT SIMULATION
Authors: Hahanova A. , Hahanov V. , Chumachenko S. , Litvinova E. , Rakhlis D. 
Published: October 2021

Context. It is known that data structures are decisive for the creation of efficient parallel algorithms and high-performance computing devices. Therefore, the development of mathematically perfect and technologically simple data structures takes about 80 percent of the design time, when about 20 percent of time and material resources are spent on algorithms and their hardware-software coding. This lead to search for such primitives of data structures that will significantly simplify the parallel high-performance algorithms which are working on them. Models and methods for testing and simulation of digital systems are proposed, which containing certain advantages of quantum computing in terms of implementation of vector qubit data structures in technology of classical computational processes.

Objective. The goal of the work is development of an innovative technology for qubit-vector synthesis and deductive analysis of tests for their verification based on vector data structures that greatly simplify algorithms that can be embedded as BIST components in digital systems on chips.

Method. The deductive faults simulation is used to obtain analytical expressions focused on transporting fault lists through a functional or logical element based on the xor-operation, which serves as a measure of similarity-difference between a test, a function and faults which is specified in the same way in one of the formats − a table, graph, equation. A binary vector is proposed as the most technologically advanced primitive of data structures for setting logical functionality for the purpose of parallel synthesis and analysis of digital systems. The parallelism of solving combinatorial problems is a physical property of quantum computing, which in classical computing, for parallel simulation and faults diagnostics, is provided by unitary-coded data structures due to excess memory.

Results. 1) A method of analytical synthesis of deductive logic for functional elements on the gate level and register transfer level has been developed. 2) A deductive processor for faults simulation based on transporting input lists or faults vectors to external outputs of digital circuits was proposed. 3) The qubit-vector form of logic setting and methods of qubit synthesis of deductive equations for faults simulation were described. 4) A qubit-vector method for the tests’ synthesis which is using derivatives calculated by vector coverage of logic has been developed. 5) Models and methods verification is performed on test examples in the software implementation of structures and algorithms.

Conclusions. The scientific novelty lies in the new paradigm of the technology for the synthesis of deductive RTL logic based on metric test equation, which forms the. A vector form for structures description is introduced, which makes it possible to apply wellknown technologies for the synthesis and analysis of logical circuits tests to effectively solve the problems of graph structures testing and state machine models of digital devices. The practical significance is reflected in the examples of analytical synthesis of deductive logic for functional elements on gate level and register transfer level. A deductive processor for faults simulation which is focused on implementation as a BIST tool, which is used in online testing, simulation and fault diagnosis for digital systems on chips is proposed. A qubit-vector form of the digital systems description is proposed, which surpasses the existing methods of computing devices development in terms of the metric: manufacturability, compactness, speed and quality. A software application has been developed that implements the main testing, simulation and diagnostics services which are used in the educational process to study the advantages of qubit-vector data structures and algorithms. The computational complexity of synthesis processes and deductive formulas for logic and their usage in fault simulation are given.