bluuebunny/crossref_metadata_2025 huggingface dataset:
Amorphous Structure and Stability of Mn Implanted GeC Ferromagnetic Semiconductor
Authors: Sun C , Floresca HC , Wang J , Jamil M , Guchhait S , Ferrer DA , Banerjee SK , Lian G , Colombo L , Kim MJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Lysosomal Cholesterol and Disease: Pharma Target or Decoy?
Authors: Jerome WG , Ullery JC
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Optimized Sample Preparation for the Imaging of Silicon Defects using Plan View Transmission Electron Microscopy
Authors: Wang N , Myers A , Sidorov M , Koo H , Yuan C , Tracy B , Li S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Energy-Loss Spectrometry (EELS) and Energy-Filtered TEM (EFTEM) Analyses of Organic-Inorganic Nanoparticles
Authors: Koh AL , Watanabe M , Sinclair R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Tomographic Reconstruction in Atom Probe Microscopy: Past, Present. . . Future?
Authors: Gault B , Moody M , Marquis EA , Geuser F de , Geiser BP , Larson DJ , Kelly TF , Ringer SP , Smith GDW
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Investigation of Self-assembled Monolayer by Atom Probe Microscopy
Authors: Gault B , Yang W , Ratinac KR , Zheng R , Braet F , Ringer SP
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Kidney Changes After Daily Slow-bolus IV Injection of Polyoxyl 35 Castor Oil/Ethanol in 5% Dextrose for 2 Weeks to Wistar Rats
Authors: Killary K , Diaz D , Argentieri G , Dugyala R , Bowenkamp K
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative STEM-EDS Mapping and Analysis
Authors: Parish C , Brewer L
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Analysis of Complex HSLA Steel Microstructures by Various Techniques
Authors: Merwin M , Becker C , Giansante D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Contamination Removal Rates Improved by New Impedance Matching Network, for the Evactron® De-Contaminator
Authors: Morgan CG , Vane R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
High Resolution Surface Morphology Measurements using EBSD Cross-Correlation Techniques and AFM,
Authors: Vaudin MD , Stan G , Gerbig YB , Cook RF
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of PbTe-based Thermoelectric Materials by Scanning/ Transmission Electron Microscopy (S/TEM)
Authors: He J , Girard S , Sootsman JR , Kanatzidis MG , Dravid VP
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantification of Manganese Valence States Using Mn L2,3 Electron Energy-Loss Near-Edge Spectra
Authors: Zhang S , Livi K , Gaillot A-C , Veblen D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Orientation Imaging of Nanocrystalline Platinum Films in the TEM
Authors: Darbal A , Barmak K , Nuhfer NT , Dingley DJ , Meaden G , Michael JR , Sun T , Yao B , Coffey KR
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
3D Imaging of Si and Er Nanoclusters in Er Doped SiO1.5 Films by STEM Tomography
Authors: Li P , Wang X , Malac M , Egerton R , Meldrum A , Lenz F , Liang X , Wang J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
TiO2 Nanoparticle and ZnO Nanowire Composite for Solar Cell Application
Authors: Li H , Tung M , Jiao J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Crystal Structure Analysis Using Annular Dark-Field Imaging with High Precision
Authors: Kimoto K , Ishizuka K , Saito M , Nagai T , Yu X , Xie R-J , Hirosaki N , Matsui Y
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Application of Low Accelerating Voltage Aberration Corrected Dedicated STEM With Cold FEG.
Authors: Konno M , Suzuki Y , Nakamura K , Inada H
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Direct Observation of Conducting Paths in TiO2 Thin Film by Transmission Electron Microscopy
Authors: Kwon DH , Jeon J-M , Jang JH , Kim KM , Hwang CS , Kim M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Near/Sub-50 pm TEM Resolution Images of Atoms Simulated with the Second Derivative of the Exit-Plane Wavefunction
Authors: Kim HS
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Radiation Response of Nanostructured Pyrochlore and Zirconia
Authors: Lian J , Zhang J , Fuentes A , Namavar F , Ewing RC
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Metallographic Sectioning and Grinding Damage Analysis Through the Use of Color Metallography and Electron Backscatter Diffraction (EBSD)
Authors: Lucas GM , Voort GF Vander , Philippe P , Lagacé M , Hovington P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Anisotropic FCC Metal Nanostructures by Kinetically Controlled Synthesis
Authors: Wang J , Xiong Y , Lim B , Xia Y , Kim MJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Investigations on Toxic Compound Traces in Powders and Sintered Ceramics
Authors: Longuet J-L
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A 3D EBSD Investigation of Dynamic Recrystallisation in a Cu-Sn Bronze
Authors: Gholinia A , Brough I , Humphreys J , McDonald D , Bate P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography
Authors: Prosa TJ , Lawrence D , Olson D , Larson DJ , Marquis EA
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of Porous Snow with SEM and Micro CT
Authors: Lomonaco RW , Chen S , Baker I
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Evaluation of Local Radii of Atom-Probe-Tomography Specimens
Authors: Gerstl S , Geiser BP , Kelly TF , Larson DJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Influence of Environment on Wear of Al-Si Alloys
Authors: Baker I , Sun Y , Dohner AT , Kennedy FE , Munroe PR
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Compound Raman Microscopy for High-speed Vibrational Imaging and Spectral Analysis of Lipid Bodies
Authors: Slipchenko M , Le T , Chen H , Cheng J-X
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Optimisation of Cryo-SEM and How to Minimize Artefacts
Authors: Carey M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Fractography of Dentin - Composite Interface Created at Positive Pulpal Pressure
Authors: Dusevich V , Purk J , Eick D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative Analysis Carbon-Carbon Bonds in a Multiwall Carbon Nanotube using Electron Diffraction
Authors: Zhang J , Zuo J-M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Protective Carbon Deposition for Superior FIB Prepared (S)TEM Specimens
Authors: Leer B Van , Giannuzzi LA , Wang Y-C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of Continuous Cast AA2037 Al Alloy
Authors: Kenik E , Zeng Q , Zhai T
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
30 keV Ga+ FIB Induced X-Rays (FIBIX) of Conductive Materials
Authors: Giannuzzi LA , Gorman BP
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Improved Performance of a Commercial SDD for X-ray Microanalysis
Authors: Kenik E
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Low Temperature Specimen Preparation for Electron Tomography
Authors: Morphew M , Hoenger A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Lack of Nitric Oxide Results in Increased Glomerular Capillary Basement Membrane Thickness
Authors: Ellis A , Grant M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Fine Structural Features and Electronic Structure of Core-Shell Structured Fe Nanoparticles Probed using TEM/STEM and EELS
Authors: Wang CM , Baer DR , Engelhard MH , Amonette JE , Antony J , Qiang Y
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Design Optimization for Cryo-Tomography and Single Particle Data Acquisition and Analysis
Authors: Armbruster BL , Brink J , Danev R , Isabell T , Kawasaki M , Motoki S , Nagayama K
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Correlative EFTEM, STEM and Fluorescence Microscopy as a Tool for Chromatin Biology
Authors: Aronova M , Sousa A , Zhang G , Kruhlak M , Lei E , Leapman R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
3-D Scanning Transmission Electron Microscopy of Carbide-Derived Carbons for Electrical Energy Storage
Authors: Widgeon S , Gass M , Bleloch AL , Yeon S-H , Gogotsi Y , Arslan I
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative TIRF Microscopy for Counting Protein Copy Numbers in Isolated Sub-cellular Structures
Authors: Chiu DT , Mutch SA , Fujimoto B , Gadd J , Bajjalieh S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Experimental Determination of Electron Inelastic Mean Free Path of Components in a Magnetic Read Head
Authors: Xu X , Vinh L , Risner-Jamtgaard J , Yaney D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Sub-micron X-ray Computed Tomography for Non-Destructive 3D Visualization and Analysis
Authors: Gelb J , Feser M , Tkachuk A , Hsu G , Chen S , Chang H , Fong T , Hunter L , Goldberger I , Lau S-H , Yun W
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Cryoplunge™3 and Solarus® 950: a Perfect Duet for High Quality Frozen Hydrated Specimen Preparations for CryoEM,
Authors: Melanson L
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
BF STEM Tomography for Improved 3D Imaging of Thick Biological Sections
Authors: Sousa A , Hohmann-Marriott M , Azari A , Zhang G , Leapman R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Dislocation Analysis of Semiconductor Devices using 3D Rotation Imaging Technique of Dedicated STEM
Authors: Back TS , Lee SJ , Jung JW , Kim JH , Kim HJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atomic-Resolution Imaging of Crystals Using Charge Flipping and Precession Electron Diffraction
Authors: Hu H , Zuo J-M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Determination of Crystal Structure from Electron Backscatter Diffraction Patterns
Authors: Wright SI , Dingley DJ , Nowell MM
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias
Authors: Winkler C , Martin L , Johnson C , Taheri M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Prospects for 3D Imaging of Dopant Atoms in Ceramic Materials
Authors: Findlay SD , Shibata N , Azuma S , Ikuhara Y
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Effects of Lightning Strikes and High Current on Aerospace Materials
Authors: Gammon LM , Baxter N , Meyr CA , Oberson H , Stack ER , Falcone A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Direct Observation of TiO2 (110) Surfaces by HVEM and HAADF STEM
Authors: Shibata N , Goto A , Mizoguchi T , Findlay S , Choi SY , Yamamoto T , Yuichi I
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
3-Dimensional Nanoscale Structural Characterization of Magnetic Tunnel Junction
Authors: Liu Y , Petford-Long A , Schreiber D , Choi Y-S , Djayaprawira D , Seidman D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Towards Routine Structure Solution using Precession Electron Diffraction
Authors: Midgley PA , Eggeman A , White T , Bithell E
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Observation of Magnetic and Electric Field in STEM by using CCD camera
Authors: Yasuhara A , Inami W , Yamazaki K , Saitow A , Okamoto K , Endo H , Kawazu M , Suzuki T , Ohnishi I , Kondo Y
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
TEM Observation of Twin Evolution in Austenitic TWIP steel
Authors: Han J , Kim M , Han HN
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Development of a 200kV Atomic Resolution Analytical Electron Microscope
Authors: Ishikawa I , Okunishi E , Sawada H , Okura Y , Yamazaki K , Ishikawa T , Kawazu M , Hori M , Terao M , Kanno M , Tanba S , Kondo Y
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative Analysis of Cementite in Steel by Atom Probe Tomography
Authors: Takahashi J , Kawakami K , Yamaguchi Y
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Three-dimensional Observation of Carbon Nanostructures with Confocal Scanning Tansmission Electron Microscopy
Authors: Hashimoto A , Shimojo M , Mitsuishi K , Takeguchi M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Influence of Alkaline Germanate Based Liquid Phase Sintering Aid on Microstructure and Phase Composition of K0.5Na0.5NbO3 Ceramics
Authors: Bencan A , Bernard J , Tellier J , Malic B , Kosec M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Accurate Quantitative EDS Mapping at High Count Rates with a Large Area Silicon Drift Detector
Authors: Collins CL , Holland J , Burgess SR , Statham P , Rowlands N
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Investigation of Boron Delta-layers in Silicon Measured by Atom Probe Tomography (APT)
Authors: Klein C , Mutas S , Würfel A , Zschech E
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy
Authors: Aert S Van , Verbeeck J , Bals S , Erni R , Dyck D Van , Tendeloo S Van
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microvascular Anatomy of Extrahepatic Bile Ducts in Adult South African Clawed Toad, Xenopus laevis Daudin: Scanning Electron Microscopy of Vascular Corrosion Casts and Correlative Light Microscopy
Authors: Lametschwandtner A , Lametschwandtner U , Bartel H , Radner C , Minnich B
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Contrast Mechanisms in Ga+ Ion Induced Secondary Electron Images
Authors: Giannuzzi LA , Utlaut M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Evaluation of Strategies to Increase the Spatial Resolution of X-Ray Mapping in the FE-SEM of Low Concentration in Sub-Micron microstructures
Authors: Hovington P , T-Pinard P , Lagacé M , Thibeault D , Gauvin R , Drouin D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Correction of Spherical Aberration and Six-Fold Astigmatism Using Three Dodecapoles,
Authors: Sawada H , Sasaki T , Hosokawa F , Yuasa S , Terao M , Kawazoe M , Omoto K , Kaneyama T , Tomita T , Kondo Y , Kimoto K , Suenaga K
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Spatially Resolved Characterization of Interface Plasmons in Si/SiO2 Core/Shell Nanostructures
Authors: Wang J , Wang X , Jiao Y , Li Q , Chu M-W , Malac M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System
Authors: Stegmann H , Ritz Y , Utess D , Engelmann H-J , Zschech E
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
New Detector Architecture, for Electron Microscopes with SDDs
Authors: Soltau H , Jaratschin O , Liebel A , Niculae A , Simsek A , Eckhard R , Hermenau K , Lechner P , Lutz G , Schaller G , Schopper F , Strüder L
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A UK Facility for Atom Probe Tomography Analysis
Authors: Marquis EA , Saxey DW , Cerezo A , Smith GDW
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Performance of Low-voltage Electron Microscope with New Aberration Correction System and Cold Field Emission Gun
Authors: Sasaki T , Sawada H , Nakamichi T , Hosokawa F , Omoto K , Tomita T , Kaneyama T , Kondo Y , Kimoto K , Suenaga K
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microstructure and Mechanical Behavior in Spinodal Fe35Ni15Mn25Al25 Alloy
Authors: Wu X , Baker I , Miller MK , More KL
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Benefits Associated With a 1 mm Beam Gas Path Length on the Accuracy of X-ray Analysis in the Variable Pressure SEM
Authors: Bean SJ , Kugler VM , Connor D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
LM-STEM Study of Dislocations in Thick Silicon
Authors: Tang D , Rucki A , Cerva H , Schlossmacher P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM
Authors: Hodoroaba V-D , Procop M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Direct Observation of the Effects of Alloying Additions on Transformation Mechanisms in Emerging Steel Alloys with In-Situ TEM
Authors: Hartshorne M , Toby E , Uranga P , Schmidt M , Novotny P , Taheri M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Modeling and Measurements of Electron Beam Scattering into Adjacent Particles
Authors: Wight S , Small J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atomic-Scale Chemical Imaging of Interdiffusion and Defects in (La0.7Sr0.3MnO3)5/(SrTiO3)5 Multilayers by Aberration Corrected Microscopy
Authors: Kourkoutis LF , Song JH , Hwang HY , Muller DA
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Towards an FE-SEM as a complete analytical laboratory
Authors: Stodolka JP , Schweitzer MG , Albrecht TA
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Challenges in Achieving High Resolution at Low Voltages in the SEM
Authors: Michael JR , Joy DC , Griffin BJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microbial Symbionts and Sponge Heterotrophy; Morphological Aspects of Sponge: Symbiont Integration via SEM Analysis
Authors: Poppell E , Marks C , Hill A , Hill M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Information Depth and Kikuchi Band Contrast in Electron Backscatter Diffraction Patterns
Authors: Winkelmann A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Treatment of Spatial Incoherence in the Aberration Corrected STEM
Authors: Oxley MP , Pennycook SJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of an Annular Four-channel Silicon Drift Detector with a Light Element Window
Authors: Terborg R , Rohde M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes
Authors: Harrach HS von , Dona P , Freitag B , Soltau H , Niculae A , Rohde M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Sub-nanometer Resolution in Field-free Imaging using a Titan 80-300 with Lorentz lens and Image Cs-Corrector at 300kV Acceleration Voltage
Authors: Freitag B , Bischoff M , Mueller H , Hartel P , Harrach HS von
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
TEM Investigation of Interfaces During Cu2O Island Growth
Authors: Zhou G
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Advances in High Resolution Helium Ion Microscope (HIM) Imaging
Authors: Sanford C , Notte J , Scipioni L , McVey S , Hill R , Sijbrandij S , Farkas L
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In situ Imaging and Characterizing the Matrix of Extracellular Polymeric Substances (EPS) of Biofilms.
Authors: Decho A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Structural Analysis of Nanoparticles in Thermoelectric AgPb18SbTe20 Single Crystal
Authors: Wu L , Zhou J , Zheng J , Jie Q , Li Q , Yang J , Zhu Y
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
X-Ray Scattering and its Benefits for X-Ray Spectrometry at the SEM
Authors: Hodoroaba V-D , Rackwitz V , Reuter D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atomic-resolution STEM and variable-temperature EELS Studies of Thermoelectric Ca3Co4O9
Authors: Yang G , Ramasse QM , Klie RF
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Study of Atomic Force Microscopy Probes Using a Local Electrode Atom Probe Microscope
Authors: Tourek C , Sundararajan S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Negative Stain Transmission Electron Microscopy of Viruses and Virus-like Particles
Authors: Humphrey C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A EELS Sub Nanometer Investigation of the Dielectric Gate Stack for the Realization of InGaAs Based MOSFET Devices
Authors: Longo P , Holland MC , Paterson GW , Craven AJ , Thayne IG
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Double Aberration-Corrected TEM/STEM of Tungstated Zirconia Nanocatalysts for the Synthesis of Acetaminophen/Paracetamol
Authors: Shiju N , Yoshida K , Brown R , Boyes E , Gai P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Microscopy and EDS of Nanoparticles Generated During Friction Stir Welding
Authors: McCarthy JJ , Pfefferkorn FE , Bello D , Haddad G , Bunker KL
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A TEM Nanoanalytic Investigation of Pd/Ge Ohmic Contacts for the Miniaturization and Optimization of InGaAs nMOSFET Devices.
Authors: Longo P , Jansen W , Merckling C , Penaud J , Caymax M , Thayne IG , Craven AJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Nanocrystal Structure Determination by Kinematic Convergent-Beam Electron Diffraction
Authors: McKeown JT , Spence JCH
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Alignment Control of STEM a Ronchigram Based Approach
Authors: Hoeven SW van der , Dekker AJ den , Tejada A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Failure Analysis Problem Solving Using Metallography
Authors: Hogue F
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Resampling of SEM-EDS Element Maps to Assess the Length-Scale of Elemental Heterogeneity
Authors: Todd C , Heeschen W , Pyzik A , Han C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantifying Cellular Activity in Untagged Cells via Time-Lapse OIR Microscopy
Authors: Landry S , Keeler WJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Using Multiple Contrast Mechanisms via Forescatter Electron Channeling Contrast Imaging to Resolve the Burgers Vector of GaN Threading Dislocations
Authors: Picard YN , Twigg ME , Caldwell JD , Jr. CR Eddy , Mastro MA , Holm RT
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microorganisms Associated with Hydrogel Contact Lens Wear
Authors: Simmons R , Ahearn D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Toward Robust High Resolution Chemical Imaging
Authors: Barrios C , Malkovskiy A , Kisliuk A , Sokolov A , Foster M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Convenient Electron Optics Set Up for Zernike Phase Microscopy in TEM
Authors: Kawasaki M , Malac M , Li P , Qian H , Egerton R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Fabrication and Model Simulation of the Triode-Type Carbon Nanotube Emitter Arrays
Authors: Wu J , Wyse M , Jiao J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A Contribution to the Knowledge of Ancient Pre-Hispanic Au-Pt Processes
Authors: Noguez ME , Villegas G , Salas G , Robert T , Ramírez J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Puddled or Forged? A Steel Bar in the Cathedral of México, from the XVIII Century
Authors: Noguez ME , Mojica D , Sanchez R , Robert T
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A New Wavelength Spectrometer for SEM Analysts
Authors: Camus P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Improved Phase Reconstruction for Magnetic Materials in a Low-Aberration Environment
Authors: Phatak C , DeGraef M , Petford-Long A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Real-space Measurements of Bonding Charge Density in Aberration-corrected High Resolution Electron Microscopy
Authors: Ciston J , Haigh SJ , Kim JS , Kirkland AI , Marks LD
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A Users Perspective of Remote TEM
Authors: Brown G , Bons A-J , Balen A van , Anthonis M , Stuyver J , Rocker S de , Levulis M , Estrada E , Wapp S , Butler J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Emerging Viral Hemorrhagic Fevers in Southern Africa and the Philippines
Authors: Goldsmith C , Metcalfe M , Comer J , Rollin P , Paddock C , Shieh W-J , Batten B , Towner J , Sealy T , McMullan L , Nichol S , Zaki S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microstructural Development of Supported Pt/ZrO2/SiO2 Catalysts: The Effect of ZrO2 Nanoligands
Authors: Zhou W , Phivilay SP , Wachs IE , Kiely CJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electronic and Structural Characterization of Cobalt Ferrite (CoFe2O4) Nanofibers.
Authors: Flores DM Carrillo , Flores V Corral , Magaña F Espinosa
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Single-Molecule Protein Conformational Dynamics Under Enzymatic Reactions and Cell Signaling
Authors: He Y , Mukherjee S , Lu P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Structural Analysis Of Hair Samples For Identification Of Ancient Textiles
Authors: Humphrey E
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A Preliminary Comparison of the Vasculature of the Spiral Valve in the Yellow Stingray, Urobatis jamaicensis, and the North American Paddlefish, Polyodon spathula
Authors: Maroni K , Spieler R , Sherman R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Failure Analysis and Design of Cu-Be Alloy Clips
Authors: Schmidt F
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of a High Strength Weld Metal for TRIP Steels Using EBSD and HAADF/STEM Imaging
Authors: Narayanan B , Quintana M , Mills MJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
An ESEM Study of the Influence of Humidity in the Integrity of Mascara Films
Authors: Camacho-Bragado GA , Dixon FM , Zaluzec NJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Biomineralization and Magnetism in Magnetotactic Bacteria
Authors: Pósfai M , Dunin-Borkowski RE , Kasama T , Chong RKK , Simpson ET , Buseck PR
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Reliable Quantification of EELS Spectra with a Simple Model–Based Approach
Authors: Duscher G , Hmielewski ME , Oduor JDO
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Channeling Artifacts in Silicon [211] Using Aberration-Corrected STEM
Authors: Hovden R , Xin HL , Muller DA
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Nano Analysis of Silver Nanoparticles in Commercial Socks
Authors: Hemmati A , Scott K , Davis JM
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Micro XRF Element Maps Are A New Method Of Detecting Elements At Lower Concentrations Than The Electron Beam Produced Corollary: A Garnet Schist Example
Authors: Schwandt C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Energy-filtered Diffracted Beam Interferometry/Holography (DBI/H)
Authors: Herring R , Tanji T
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
4-Phenyl Butyric Acid (PBA) Promotes Aggregate Formation in HEK 293 Cells Expressing Wild Type or Mutant Pulmonary Surfactant Protein C (SP-C)
Authors: Na C-L , Stewart GA , Weaver TE
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Study on the Formation of P Orientation in CC Al-Mn-Mg Alloy by EBSD Method
Authors: Zeng Q , Zhai T
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microstructural Characterization of Ba0.6Sr0.4TiO3 – MgO Composite Thin Films
Authors: Ugurlu O , Feldmann DM , Jia QX , Holesinger TG
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Automatic Correction of Spectral Aberrations in EELS
Authors: Menon N , Barfels M , Thomas P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of Chemical Coating on the Functionalized Carbon Nanotubes
Authors: Luo ZP , Littleton RL , Kim H , Adams L , Carson L , Soboyejo N , Oki A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ and Ex-situ TEM Imaging and Spectroscopy Study of Li-Ion Battery
Authors: Wang CM , Xu W , Nie ZM , Choi D , Wang DH , Yang ZG , Zhang JG , Thevuthasan S , Liu J , Baer DR
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microscopy Characterization of Organic Pigments and Polymer Composite Materials for Xerography Applications.,
Authors: Li P , Paraguay F , Qian J , Malac M , Gardner S , Gerroir P , Carlini R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Backside TEM Sample Preparation With The Multi-Loader Flip-Stage
Authors: Buxbaum A , Schampers R , Bolt J-J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Zernike Phase Contrast Electron Microscopy with a Spherically Corrected Foil Lens
Authors: Typke D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Structure of Toxoplasma gondii Cyst by Quick-freeze/Deep-etch Technique
Authors: Lemgruber L , Lupetti P , Souza W de , Vommaro R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
An Improved Large Area Silicon Drift Detector EDS System for Low Energy X-ray Detection and Fast Spectrum Imaging
Authors: Feng L , Saveliev VD , Takahashi M , Tull CR , Barkan S , Damron EV , Kosuge S , Lamb RD , Witherspoon KC , Sjoman PO
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Sample Preparation for Materials Scientists
Authors: Colijn H
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Simplifying Minimum Dose Electron Tomography
Authors: Harmon RT , Meyer S , Booth CR , Wilbrink J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of Semiconductor Nanowires by HRTEM and In-Situ TEM
Authors: Wang N
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Nanostructural Characterization of Y1-xSmxBa1.5Cu3Oy Coated Conductors with BaZrO3 Particles by Transmission Electron Microscopy
Authors: Kato T , Miura M , Yoshizumi M , Yamada Y , Izumi T , Hirayama T , Shiohara Y
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Transitioning Laser Ablation ICP-MS from Research Applications to Routine Trace Element Microanalysis: A Look at Quantitative Trace Element Analyses and Imaging
Authors: Koenig AE
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Aberration-Corrected STEM Imaging and 2-D Elemental-Resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer
Authors: Xin HL , Muller DA
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Hyperion™ Ion Probe for Next Generation FIB, SIMS and Nano-Ion, Implantation
Authors: Smith N , Tesch P , Martin N , Boswell R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Tomography of Biological Materials using Focused Ion Beam Sectioning and Backscattered Electron Imaging
Authors: Winter DAM de , Schneijdenberg CTWM , Lebbink MN , Hekking LHP , Post JA , Lich B , Verkleij AJ , Drury MM , Humbel BM
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Growth and Microstructural Properties of Nitride-Based Nanostructures
Authors: Kim YH , Ryu H , Shin YH , Kim MD
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Observer Development for Automatic STEM Closed-Loop Control
Authors: Ruiz A Tejada , Dekker AJ den , Hoeven SW van der
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Nanometer Scale Atomic Order in a Bulk Metallic Glass from Fluctuation Microscopy
Authors: Hwang J , Voyles P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The use of Au and Pt x-ray N lines for correct EDX analysis of C in gold and platinum depositions of micro and nano structures
Authors: Mulders JJL , Botman A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Crystallization Kinetics of Amorphous Alumina-Zirconia-Silica Ceramics
Authors: Chraska T , Hostomsky J , Klementova M , Dubsky J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A New and Fast Method for the Creation of 3D Micro and Nano Structures
Authors: Mulders JJL , Faber JS
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic
Authors: Edelmann RE , Vasudevan V , Kohls D , Ullmer J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantum Wells in the Ternary System Zn(1-X)CdXSe by High Rresolution Microscopy
Authors: Calderon H , Hernandez-Calderon I , Yucelen E , Freitag B , Peripolli S , Achete CA
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Energy Loss Spectroscopy Study on the Dielectric Response of Single H2Ti3O7 Nanotube
Authors: Wang J , Li Q , Peng LM , Malac M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Imaging Adaptive Immune Response in Single Cells using TIRF Microscopy
Authors: Aaron J , Carroll-Portillo A , Pfeiffer J , Wilson B , Timlin J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Background Removal Methods Applied to Atom Probe Data
Authors: Oltman E , Ulfig R , Larson DJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A Suspicious Facial Lesion - A Unique Opportunity to Test the North Carolina Laboratory Response Network
Authors: Christopher PS , Saah JR , Miller SE
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Ion Irradiation-Induced Changes in Surface Morphology of InSb
Authors: Perez-Bergquist A , Xiang X , Zhang Y , Wang L
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Study of the Atomic Structures of Si3N4/CeO2-x and Si3N4/SiO2 Interfaces Using STEM and First-Principles Methods
Authors: Walkosz W , Klie RF , Ogut S , Mikijelj B , Becher PF , Borisevich AY , Pennycook SJ , Idrobo JC
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Partitioning Behavior of Al and Si in FINEMET Nanocrystalline Soft Magnetic Alloys, as Studied by Atom-Probe Tomography
Authors: Knipling K , Daniil M , Willard M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009