Assessment of the possibility of X-ray fluorescence analysis before conducting the experimental work
Authors: Dudik S. L. ,   “Spectron”, NPO Ltd, 10a Tsiolkovsky St., Kalinin B.D. , Savelyev S.K. , Sergeev Yu.I. ,   “Pretsizion Tekhnologies” Co. Ltd.,   Baltic State Technical University,   “Spectron”, NPO Ltd, 10a Tsiolkovsky St.
Published: July 2024

The article proposes an approach to the development of a method for X-ray fluorescence analysis of an object using crystal-diffraction spectrometers prior to the experimental work. In case when the X-ray fluorescence analysis method is intended as a substitute for an existing method, then for the object being analyzed the statistical characteristics of the material for which the X-ray fluorescence analysis method is being developed, i.e. the average content of the elements to be determined, the dispersion and the range of the elements content, the requirements for the accuracy of determination, and some others, are calculated on the basis of archival data of the analytical laboratory (or an array of selected calibration samples). In case when a new method is developed, technical requirements for the product allowing estimating these characteristics are sufficient. Analytical characteristics, such as basic instrumental error, sensitivity, spectral resolution, contrast, must be measured and calculated over the entire operating range of the measured analytical lines for the spectrometer used. Metrological characteristics of the method for determining the elements, i.e. detection limit, differential sensitivity, instrumental reproducibility of content measurement at the selected exposure time, are evaluated on the basis of these data. At this stage the question concerning the necessity of diluting the samples with a heavy or light diluent for obtaining satisfactory differential sensitivity may be resolved. The regimes for recording the analytical signal for the elements to be analyzed, i.e. analytical lines, analyzer crystals, X-ray tube operating modes, are determined, the probability of overlapping spectral lines is estimated, and the background measurement points are selected. Calculation of theoretical and simulation of experimental intensities for selected calibration and test samples and calculation of theoretical coefficients of influence are carried out. The expected error of the analysis is estimated on the basis of the statistical characteristics of the material and the theoretical coefficients of influence, and the need to take into account the relationship between the interfering elements in the equations is determined for achieving the required accuracy of determining the elements. Selection of regression or theoretical coupling equations, which provide the required accuracy of determining the elements, is carried out on the basis of the simulated experimental intensities of the analytical lines of the elements. Such approach allows a priory estimate the possibility of developing an X-ray fluorescence analysis technique for an object selected, and can significantly reduce time for performing the experimental work. Keywords: X-ray fluorescence analysis, method of analysis, analyzed object, X-ray spectrometer, analysis characteristics, forecast of experimental intensities, estimation of expected error, modes of registration of the analytical signal, coupling equations.