bluuebunny/crossref_metadata_2025 huggingface dataset:
Preparation of 2-D Sections of Li-ion Battery Electrode Architectures with a Focused Ion Beam and Modeling
Authors: Gorzkowski E , Rowenhorst D , Stephenson D , Wheeler D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Effect of Ion Currents on the Morphology of Focused Ion Beam Milled Patterns on a Single Crystalline Diamond
Authors: Lee W , Golnabi R , Calabro A , Queenan C , Becker D , Kim D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Metrics for Characterization of Atom Probe Instrument Performance
Authors: Anderson I , Steel E , Henry K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Toward Atomic-Scale Tomography: The ATOM Project
Authors: Kelly T , Miller M , Rajan K , Ringer S , Borisevich A , Dellby N , Krivanek O
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Phase Composition at the Atomic-Size Scale through Multivariate Statistical Analysis of Atom Probe Tomography Data
Authors: Keenan M , Smentkowski V , Ulfig R , Oltman E , Larson D , Kelly T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Toward Automated Optimization of Reconstruction of Atom Probe Data
Authors: Larson D , Geiser B , Prosa T , Kelly T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Analytic Hitmap Equation of the Ideal Spherical Evaporator
Authors: Geiser B , Oltman E , Larson D , Prosa T , Kelly T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data
Authors: Larson D , Geiser B , Prosa T , Ulfig R , Kelly T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Kinetic-Energy Discrimination for Atom Probe Tomography: Concepts and Potential Detectors
Authors: Kelly T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Characterization of the Chemistry and Structure of Material Transfer on AFM Tips Resulting from Contact and Sliding Experiments
Authors: Tourek C , Sundararajan S
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Prospects for Atom Probe Tomography of Commercial Semiconductor Devices
Authors: Larson D , Lawrence D , Olson D , Prosa T , Reinhard D , Ulfig R , Clifton P , Bunton J , Lenz D , Olson J , Renaud L , Martin I , Kelly T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
TEM and Atom Probe Investigation of Calcium Carbonate Precipitation in Seawater
Authors: McMurray S , Gorman B , Diercks D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy
Authors: Kuchibhatla S , Shutthanandan V , Arey B , Kovarik L , Wang C , Prosa T , Ulfig R , Thevuthasan S , Gorman B
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Mapping of Electron-Beam-Excited Plasmon Modes in Lithographically-Defined Gold Nanostructures
Authors: Koh A , Fernandez-Dominguez A , Maier S , Yang J , McComb D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Contrast Generation and Three-Dimensional Characterization of Organic Photovoltaic Device Structures via Low-Loss Energy-Filtered TEM
Authors: Herzing A , DeLongchamp D , Hammond M , Richter L , Rodovsky D , Anderson I
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Multivariate Statistical Analysis Strategies of EELS Spectral Images
Authors: Van Benthem M , Kotula P , Lu P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Development of a New Acquisition Scheme for Energy-Filtering Transmission Electron Microscopy Spectrum-Imaging toward Quantification
Authors: Watanabe M , Allen F
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Aberration Corrected STEM-EELS: Applications to Magnetic Materials
Authors: Varela M , Gazquez J , Bruno F , Garcia-Barriocanal J , Torija M , Sharma M , Oxley M , Prange M , Pantelides S , Leighton C , Leon C , Santamaria J , Pennycook S
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Energy Loss Near-Edge Fine Structure of Oxygen K of Spinel NixMn3-xO4
Authors: Li J , Ko S , Trolier-McKinstry S , Dickey E
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Phase Detection Using Low-Loss EELS with Aberration Corrected STEM
Authors: Schamp C , Casillas G , Jose-Yacaman M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Low Electron Energy Loss Spectroscopy of Fluorescent Probes
Authors: Felts R , Seybold V
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Study of Al2O3 Nanofibers Dispersed in Al Matrix by EELS and Calculations Ab Initio
Authors: Gallegos-Orozco V , Santos-Beltran A , Martínez-Sánchez R , Paraguay-Delgado F , Espinosa-Magaña F
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
HAADF and EELS Analysis of Ti Deposited on Si Substrate Prepared by FIB
Authors: Medina-Flores A , Béjar-Gómez L , Rubio-Avalos J , Bernal J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
New U-Th-Pb Isotope Reference Material for SIMS
Authors: Kennedy A
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Microanalysis Standards and Instrumental Calibration: Practical Improvements in Analytical Confidence
Authors: Carpenter P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
The Status of the Smithsonian Microbeam Standards
Authors: Rose T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Discussion of Standard Specimens for Performance Evaluation in Atom Probe Tomography
Authors: Gorman B , Kelly T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Natural Analogs of Synthetic Reference Materials: Assessing the Limits of Homogeneity Testing at the Picogram Scale
Authors: Michalak P , Renno A , Merchel S , Munnik F , Wiedenbeck M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Assessing Microanalytical Performance Using Secondary Standards: Results of an Electron Probe Interlaboratory Comparison Using Four Natural Volcanic Glasses
Authors: Kuehn S , Froese G , Shane P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Bringing Standardized Processes to Atom-Probe Tomography - Part 1: Establishing Standardized Terminology
Authors: Marquis E , Anderson I , Danoix F , Forbes R , Gault B , Kelly T , Miller M , Moody M , Vurpillot F
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Remote Nanoimaging on Mars - Results of the Atomic Force Microscope Onboard NASA's Phoenix Mission
Authors: Gautsch S , Parrat D , de Rooij N , Staufer U , Marookian J-M , Hecht M , Vijendran S , Sykulska H , Pike W
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Practical Remote Electron Microscopy - A Vendor's Perspective
Authors: Isabell T , Erdman N , Robertson V , Ishikawa I , Somehara K , Nakamichi T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Remote Viewing of SEM - A Versatile Tool for Failure Analysts and the Materials Community
Authors: Shah C
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Energy Selective Secondary Electron Detection in SEM for the Characterization of Polymers
Authors: Rodenburg C , Pearson A , Boden S
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Elemental Mapping with SDD-EDS: Solving the Hard Problems
Authors: Newbury D , Ritchie N
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
High Speed, High Resolution and Large Area X-ray Imaging Using Silicon Drift Detectors
Authors: Terborg R , Berlin J , Salge T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Technique for Complex Averaging of Electron Holograms
Authors: McLeod R , Bergen M , Malac M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
High-resolution SEM Imaging with Aberration Correction for Highly Precise Measurement of Semiconductors
Authors: Konno M , Suzuki Y , Inada H , Nakamura K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Recent Developments in Quantitative Electron Tomography
Authors: Midgley P , Saghi Z , Hindson J , Leary R , Holland D , Sederman A , Gladden L , Schmidt V , Greenham N
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Gold Nanoparticles: 3D-STEM-HAADF Analyses and Plasmonic Studies by EELS
Authors: Arenal R , Roiban L , Ersen O , Burgin J , Treger-Delapierre M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
STEM Axial Resolution Calculated by Monte Carlo Simulations in Micrometers-Thick Substrates
Authors: Demers H , Drouin D , de Jonge N
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Optimized Tomographic Acquisition and Reconstruction for Highly Faceted Nanostructures with Isotropic Resolution
Authors: Ercius P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
3D EDX Microanalysis by FIB-SEM: Enhancement of Elemental Quantification
Authors: Burdet P , Hébert C , Cantoni M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Hybrid Imaging-Novel Approaches and Recent Advances in Correlative Microscopy
Authors: Plitzko J , Rigort A , Baeuerlein F , Laugks T , Villa E , Baumeister W
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Whole-Cell Analysis of the Effect of Cholesterol on LDL-Gold Nanoparticles Uptake in Macrophages by STEM Tomography and 3D STEM
Authors: Baudoin J , Dukes M , Jerome W , De Jonge N
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Recovering Missing Information in Dislocation-Particle Interactions by Diffraction Contrast Dual-Axes Electron Tomography
Authors: Liu G , Robertson I
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Phase Plate Enhanced Contrast Reveals Structure of Follicular Melanin Granules
Authors: Camacho-Bragado G , Qian H , Dixon F , Bryant H , Malac M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Transmission Electron Microscopy and Three-Dimensional Tomography of Peptide-Coated Single-Walled Carbon Nanotubes
Authors: Bajaj P , Nguyen J , Gilpin C , Dieckmann G , Chiu C , Nielsen S , Musselman I
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Scanning Transmission Electron Microscopy (STEM) Tomography of Layer-by-Layer PAH/PSS-Au Nanocomposite Structures
Authors: Bassim N , Herzing A , Dressick W , Wahl K , Petrovykh D , Fears K , Stroud R , Clark T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Metallography as a Microanalysis Tool during the Failure Investigation of the Starboard Solar Alpha Rotary Joint of the International Space Station
Authors: Long V , Wright M , McDanels S , Marciniak P , Lubas D , Tucker B
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
The Importance of Sample Preparation in the Analysis of Powder Metallurgy (PM) Materials
Authors: Murphy T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
A Novel Preparartion Method for Lean Duplex Steels
Authors: Panzenböck M , Ragger K , Chladil H , Clemens H
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Delineating Prior Austenite Grain Boundaries in Carbon Steels
Authors: Lawrence S
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Obtaining Consistent Vickers Hardness at Loads ≤ 100 Grams Force
Authors: Vander Voort G , Fowler R
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Electron Probe Microanalysis of Uranium Localization in Alpha-Plutonium
Authors: Neuman A , Nothwang T , Hampel F , Freibert F
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Microscopy Characterization of Aqueous PVAC Glue Penetration in Double Coated Paperboard Systems
Authors: Williams D , Ninness B , Ventresca D , Welsch G
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Shape Controllable Synthesis of ZnO Hexagonal Arrays Via Chemical Precipitation
Authors: Medina-Flores A , Béjar-Gómez L , Herrera-Pérez G , Bernal J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope Supported by Open-Access Crystallographic Databases
Authors: Moeck P , Rouvimov S
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Structural and Chemical Characterisation of Metal and Metal Oxide Nanoparticles
Authors: Kirkland A , Haigh S , Young N , Sawada H , Takayangi K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Structural Investigations of “Ferecrystals” by Scanning Nanobeam Transmission Electron Diffraction
Authors: Kirmse H , Grosse C , Häusler I , Moeck P , Rouvimov S , Beekman M , Moore D , Atkins R , Johnson D , Neumann W
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Diffraction from Oxide Superlattices - Stacking Sequence Effects in Plan View
Authors: Spence J , Shah A , Weierstall U , Nelson-Cheeseman B , Bhattacharya A
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering
Authors: Pavia G , Benner G , Niebel H , Rauch E , Véron M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Reconstruction of Atomic Resolution STEM Images Using the Diffraction-Imaging Method with an Aberration-Corrected STEM
Authors: Okunishi E , Sawada H , Kondo Y
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Combining Scanning Transmission Electron Microscopy and Electron Diffraction to Understand the Atomic Structures of Oxide Superlattices
Authors: Shah A , Nelson-Cheeseman B , Bhattacharya A , Zuo J-M , Spence J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
The Influence of Film Thickness on the Microstructure of Nanocrystalline Nickel Films: A Precession Electron Diffraction Microscopy Study
Authors: Rajasekhara S , Ganesh K , Hattar K , Knapp J , Ferreira P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Automated Diffraction Tomography: A New Era for Electron Crystallography
Authors: Stewart A , Mugnaioli E , Gorelik T , Andrusenko I , Kolb U
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
D-STEM Combined with Precession Microscopy for Nanoscale Crystal Orientation and Phase Mapping
Authors: Ganesh K , Rajasekhara S , Bultreys D , Hattar K , Knapp J , Ferreira P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Characterization of Small Cu Grains Using the Conical Dark-Field Technique in the Transmission Electron Microscope
Authors: Hūbner R , Engelmann H-J , Zschech E
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Strain Measurement of Selective Epitaxial Growth (SEG) SiGe Structure by the Nano Beam Diffraction (NBD) Method
Authors: Kim S-W , Yoo J-H , Koo S-M , Ko D-H
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
On the Consistency of Highly Accurate QCBED Data Refined from Different Zone Axes for Ferromagnetic Tetragonal L10 FePd
Authors: Sang X , Kulovits A , Wiezorek J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
The Use of KSpaceNavigator as a Tool for Defect Analysis by Diffraction Contrast Microscopy
Authors: Gautam A , Duden T , Dahmen U
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Crystallographic Processing of Scanning Tunneling Microscopy Images of Cobalt Phthalocyanines on Silver and Graphite
Authors: Moeck P , Bilyeu T , Straton J , Toader M , Hietschold M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Identification and Local Chemical Analysis of Pharmaceutical Impurities
Authors: Nylese T , Anderhalt R , Patel U
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Mouse Models of Brain Cancer: Insight into the Cytopathogenesis of Glioma
Authors: Ghazi S , Stark M , Li P , Moses H , Abel T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Content Uniformity in Tablets Evaluated by Energy Dispersive X-ray Spectroscopy
Authors: Wolfe J , Lersch T , Bunker K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
TEM Analysis of Soy Protein Based Nanoparticles as Nutraceutical Carriers
Authors: Qian H , Zhang J , Chen L , Malac M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Preparing a Biological Electron Microscopy Laboratory for ISO 17025 Accreditation
Authors: Brantner C , Pope R , Hannah R , Burans J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
The Challenges of Obtaining Funding for Major Instrumentation
Authors: Sherman D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Performance and Application of an Aberration Corrected Analytical Electron Microscope with a Cold Field Emission Gun
Authors: Kohno Y , Okunishi E , Ishikawa I , Tomita T , Kaneyama T , Kondo Y
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
STEM-based Technologies for Nano and Biological Sciences
Authors: Zhang X
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
In Situ Material Removal over Many Orders of Magnitude
Authors: Straw M , Phifer D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Reducing Reagent Consumption and Improving Efficiency of Specimen Fixation and Embedding, Grid Staining and Archiving using mPrep™ Capsule Processing
Authors: Goodman S , Kostrna M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Is “There an App for That?” Take a Look at the New Portable Scanning Electron Microscopes
Authors: Guarrera D , Abe A , Miyahara T , Ohta Y
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
High Quality Cross Sections of Low Melting Point Samples Prepared with Cryo Ion Slicer - Broad Ar Ion Beam Milling Apparatus with a Newly Developed Specimen Cooling Unit
Authors: Nakajima Y , Shibata M , Matsushima H , Suzuki T , Erdman N
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below
Authors: Falke M , Kaeppel A , Terborg R
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
New Results with High Quantum Efficiency Silicon Drift Detectors
Authors: Niculae A , Andricek L , Bornschlegl M , Eckhardt R , Herrmann J , Jartischin O , Jeschke S , Lechner P , Mungenast L , Schweinfest B , Soltau H , Strüder L
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Endothelial Cell Culture Model (ECCM) for Evaluation of Aortic Endothelial Cells Exposed to Normal and Disturbed Flow
Authors: Estrada R , Giridharan G , Prabhu S , Sethu P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Microtechnologies for Studying Cell Biology in Physiologically-Relevant Microenvironments
Authors: Simmons C
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Determining the Effect of Molecular Oxygen Tension on Islet Metabolism and Endothelial Cell Morphology Using a Microfluidic Device
Authors: Sankar K , Rocheleau J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Examining Pancreatic Islet Lipotoxicity by Two-photon NAD(P)H imaging in a Microfluidic Device
Authors: Rocheleau J , Sun M , Kilkenny D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Low-Dose Strain Mapping by Dark-Field Inline Electron Holography
Authors: Özdöl V , Koch C , van Aken P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Development of Sample-Scanning Electron Holography
Authors: Takeguchi M , Mitsuishi K , Lei D , Shimojo M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Coherent Electron Interference of a Split HOLZ Line from a Strained Silicon Crystal
Authors: Herring R , Saitoh K , Tanaka N , Tanji T
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Phase Masks for Electron Vortex Beams
Authors: Herring R , Schuetze A , Humphrey E
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Electron Beams with Orbital Angular Momentum
Authors: McMorran B , Agrawal A , Anderson I , Herzing A , Lezec H , McClelland J , Unguris J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Prospects for Off-Axis Electron Holography in the TEAM I Microscope
Authors: Linck M , Duden T , Dahmen U
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Single Atom Imaging and EELS; 40 Years Ago
Authors: Isaacson M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Efficient Elastic Imaging of Single Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy
Authors: Hovden R , Muller D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)
Authors: Alem N , Ramasse Q , Sarahan M , Erni R , Yazyev O , Erickson K , Louie S , Zettl A
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials
Authors: Chisholm M , Duscher G , Windl W
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Quantitative Composition Measurements of Atomic Columns Using STEM; Application to L12 Precipitates
Authors: Ophus C , Gautam A , Marquis E , Dahmen U , Radmilovic V
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Atomic Resolution at 50 - 300 kV Obtained using Low Dose Rate HRTEM
Authors: Barton B , Song C , Kisielowski C
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Challenges in Imaging Single Atoms Adsorbed or Embedded on Surfaces
Authors: Liu J , Allard L
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy
Authors: Rouvière J , Okuno H , Jouneau P , Bayle-Guillemaud P , Daudin B
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Nanoparticle Movement: Plasmonic Forces and Physical Constraints
Authors: Batson P , Reyes-Coronado A , Barrera R , Rivacoba A , Echenique P , Aizpurua J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Advances in STEM-CELL. A Free Software for TEM and STEM Analysis and Simulations: Probe Deconvolution in STEM-HAADF
Authors: Grillo V
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Quantitative Annular Dark Field Images of Silicon (001) Crystal
Authors: Oshima Y , Kim S , Tanishiro Y , Takayanagi K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Vortex Beams for Atomic Resolution Dichroism
Authors: Idrobo J , Pennycook S
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Channeling Contrast in Sub-Ångström Resolution High-Angle Annular Dark-Field Images of Planar Interfaces
Authors: Liu J , Allard L
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Usual and Unusual Effects in ADF-STEM Imaging of Dopant Atom in Crystals
Authors: Mittal A , Gunawan A , Mkhoyan K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Atomic Resolution Defect Analysis Using Low Angle ADF-STEM
Authors: Phillips P , Kovarik L , Mills M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Novel Multivariate Statistical Analysis Methods for STEM/EELS
Authors: Sarahan M , de la Peña F , Ramasse Q , Walls M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Some Historical Comments about Interface Research
Authors: Rühle M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures
Authors: Gauquelin N , Couillard M , Zhang H , Wei J , Botton G
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
The Role of γ-Al2O3 Single Crystal Support to Pt Nanoparticles Construction
Authors: Zhang Z , Li L , Wang L-L , Sanchez S , Wang Q , Johnson D , Frenkel A , Nuzzo R , Yang J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Formation of Single-Orientation Epitaxial Islands of TiSi2 on Si (001) using Sr Passivation
Authors: Kim J , Posadas A , Dargis R , Choi M , Demkov A , Smith D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Quantitative Study of an Incommensurate Grain Boundary Using Aberration Corrected Microscopy
Authors: Gautam A , Radetic T , Lançon F , Dahmen U
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Evolution of a Small Angle Boundary from a Perfect Lattice During Annealing of a Cross Rolled Aluminium Sample
Authors: Shamsuzzoha M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Evaluation of Defect Structures from In Situ Dielectric Breakdown of SiO2-Based Gate Dielectric Layers
Authors: Bonifacio C , van Benthem K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Microstructural Characterization of Closely-Lattice-Matched AlIn(Ga)N Alloys for High Electron Mobility Transistors
Authors: Zhou L , Kirste L , Lim T , Aidam R , Ambacher O , Smith D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
2-D Mapping of Ferroelectric Domains by Transmission Electron Microscopy
Authors: Pan X , Nelson C , Zhang Y , Kim S , Winchester B , Chen L , Melville A , Adamo C , Schlom D , Folkman C , Baek S , Eom C
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Microanalysis of Ferromagnetic-Ferroelectric Interfaces Using Analytical Electron Microscopy
Authors: Sankara Rama Krishnan P , Jan-Chi Y , Ying-Hao C , Valanoor N , Munroe P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Atomic and Electronic Interface Structure of a VN Hard Coating on MgO
Authors: Zhang Z , Dehm G , Rashkova B , Lazar P , Redinger J , Podloucky R
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Twinning Evolution of Faceted Face-Centered Cubic Fe Nanoparticles under Electron Irradiation
Authors: Lu N , Wang J , Ling T , Zhu J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Interfacial Chemistry, Defects, and Strain in Multiferroic Heterostructures
Authors: Sloppy J , Idrobo J , Sundaram S , Spurgeon S , Winkler C , Valanoor N , Munroe P , Taheri M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Indium Composition Variation in Nominally Uniform InGaN Layers Discovered by Aberration-Corrected Z-contrast STEM
Authors: Yankovich A , Kvit A , Li X , Zhang F , Avrutin V , Liu H , Izyumskaya N , Özgür Ü , Morkoc H , Voyles P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Measuring Strain in AlN/GaN Superlattices and Nanowires by NanoBeam Electron Diffraction
Authors: Bougerol C , Béché A , Daudin B , Rouvière J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Low Temperature Synthesis of Zn3P2 Nanowire
Authors: Bae I-T , Van Hart D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Direct Observation of Magnetic Interactions at Structural and Compositional Interfaces in Fe-Ti Oxides using Lorentz Microscopy and Electron Holography
Authors: Kasama T , Harrison R , Church N , Feinberg J , Dunin-Borkowski R
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Interface and Defect Structures in Epitaxial Thin Films of LaCuOSe and Related Compounds by HAADF-STEM Observations
Authors: Tohei T , Mizoguchi T , Hiramatsu H , Hosono H , Ikuhara Y
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Domain Pinning and Valence State Switching in Pb(Zr0.2Ti0.8)O3/La0.8Sr0.2MnO3 Heterostructures
Authors: Su D , Vaz C , Segal Y , Walker F , Ahn C , Han M-G , Sawicki M , Broadbridge C
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Differences in Structural and Electronic Properties of Conducting LGO/STO and LAO/STO Interfaces
Authors: Cantoni C , Gazquez J , Oxley M , Lupini A , Varela M , Pennycook S , Perna P , Marre D , Aruta C , Scotti di Uccio U , Miletto Granozio F
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Interplay Between Polarization and Oxygen Stoichiometry at Ferroelectric Domain Boundaries in BiFeO3
Authors: Borisevich A , Seidel J , Ramesh R , Pennycook S
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Study of Ionic Grain Boundary Segregation in Thermally Grown Alumina on Single-Crystal Superalloys
Authors: Unocic K , Pint B
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Grain Boundary Characterization of Nanocrystalline Cu from the Stereological Analysis of Transmission Electron Microscope Orientation Maps
Authors: Darbal A , Ganesh K , Barmak K , Rohrer G , Ferreira P , Sun T , Coffey K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Synthesis, Structure, and Morphology of Magnetic Core-Shell Nanoparticles
Authors: Mattson E , Krystofiak E , Voyles P , Hirschmugl C , Gajdardziska-Josifovska M , Oliver J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Characterization of AgcNP/Al2024 Composites Prepared by Mechanical Processing in a High Energy Ball Mill
Authors: Carreño-Gallardo C , Estrada-Guel I , Neri-Flores M , Romero-Romo M , López-Meléndez C , Martínez-Sánchez R
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Co-Deposition of Gold and Magnetite Nanoparticles onto Pinnularia sp. Diatom Frustules
Authors: Li H , Wong S , Hudson W , Jiao J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
HRTEM Contrast Analysis for Structure Characterization of Graphene Films Grown by CVD
Authors: Plachinda P , Rouvimov S , Solanki R , Langworthy K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Orientation Dependent Field Evaporation Behavior in Multilayer Thin Films
Authors: Brons J , Herzing A , Anderson I , Thompson G
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
The Effect of Film Morphology and Interface Structure on the Magnetic Properties of Fe-MgO Thin Films
Authors: Spurgeon S , Lofland S , Misra A , Baldwin J , Taheri M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Probing Stoichiometry in LaAlO3/SrTiO3 Interfaces by Aberration-Corrected STEM
Authors: Mundy J , Fitting Kourkoutis L , Warusawithana M , Schlom D , Muller D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
A Thermodynamic Approach to Predict Dopant Atoms Segregation on Nanocrystals
Authors: Stroppa D , Montoro L , Campello A , Beltrán A , Andrés J , Leite E , Ramirez A
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
TEM Simulations of Tilted Atomically Thin Hexagonal Boron Nitride Sheets
Authors: Odlyzko M , Mkhoyan K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
EELS Investigation of the Formulas for Inelastic Mean Free Path
Authors: Zhang H , Egerton R , Malac M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Old Dogs and New Tricks: Adapting Existing Analytical E-Beam Equipment for Automated Large-Area Quantitative Elemental Mapping of Chlorine in Cement, Mortar and Concrete
Authors: Willenberg B , Deist R , Dempere L
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
In-Situ Nanomechanics of Carbon Nanotubes and Graphene
Authors: Huang J , Ding F , Liang Q , Feng J , Li J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Imaging Grains and Grain Boundaries in Single-Layer Graphene: An Atomic Patchwork Quilt
Authors: Huang P , van der Zande A , Ruiz-Vargas C , Whitney W , Levendorf M , Kevek J , Zhu Y , Park J , McEuen P , Muller D
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Atomic Scale Study of Point Defects in Graphene using STEM
Authors: Zhou W , Prange M , Oxley M , Pantelides S , Pennycook S , Nanda J , Narula C , Idrobo J-C
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
In-Situ Characterization of Mechanical and Electrical Response of Individual BCN Nanotubes
Authors: Ghassemi H , Lee C , Yap Y , Shahbazian-Yassar R
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Real Time ETEM Studies of the Nucleation and Growth of Carbon Nanotubes Utilizing Fe/Pt Catalyst on a Spherical Al2O3 Support
Authors: Zakharov D , Zemlyanov D , Mane A , Elam J , Ribeiro F , Stach E
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
One-Step and In-situ Decoration of High-Quality Graphene with Transition Metal Oxide Nanoparticles
Authors: Qian W , Cottingham S , Chen Z , Besser A , Jiao J
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Synthesis of Nano Carbon Onions by a Mechanical-Chemical Route
Authors: Estrada-Guel I , Lardizábal-Gutiérrez D , Leyva C , Martínez-Sánchez R
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Nanocharacterization of Carbon Nanotube Biosensors for Point-of-Care Diagnostics
Authors: Chapman W , Joshi K , Chang Y-L , Radtkey R , McAllister D , Bunker K
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Microscopical Analysis of Consumer Products Containing Carbon Nanotubes: Determining Potential Airborne Release
Authors: Compton S , Cavaliere M
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Probing Structural and Chemical Evolution of Electrode Materials in Lithium Ion Batteries Using In Situ TEM Imaging and Spectroscopy
Authors: Wang C , Xu W , Liu J , Zhang J , Huang J , Kovarik L , Arey B , Thevuthasan S , Baer D , Mao S , Zhong L , Zhang L
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Understanding the In-Situ Reaction of Cerium Oxide Nanoparticles Using Aberration Corrected Exit Wave Restoration and EELS
Authors: Haigh S , Young N , Sawada H , Takayanagi K , Kirkland A
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
In-situ Environmental TEM Study of Phase and Morphological Changes of TiO2 Nanotubes under Different Heat Treatments
Authors: Santra S , Crozier P
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Electron Tomographic Characterization of Nano-Confined Hydrides for Hydrogen Storage
Authors: House S , Majzoub E , Bhakta R , Allendorf M , Robertson I
Published: October 2011

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.