bluuebunny/crossref_metadata_2025 huggingface dataset:
Upaya Promotif dan Preventif Kesehatan Jiwa melalui Deteksi Dini Berbasis Web
Authors: Novianti Evin , Tobing Duma Lumban , Wibisono Bayu
Published: December 2020

Kader merupakan tenaga potensial di masyarakat yang memiliki peranan penting dalam meningkatkan kesehatan jiwa masyarkat. Perberdayaan kader kesehatan jiwa dapat dilakukan dengan memberikan pelatihan deteksi dini berbasis web agar kader memiliki pemahaman tentang masalah kesehatan jiwa, mendeteksi dini ganggguan jiwa dan melakukan rujukan puskesmas. Penelitian ini bertujuan untuk menganalisis efektifitas pelatihan deteksi dini berbasis web dalam upaya promotif dan preventif kesehatan jiwa. Desain Quasi experiment pre and post test without control group” dengan intervensi pelatihan deteksi dini berbasis web digunakan dalam penelitian ini. Sampel penelitian ini terdiri dari 18 orang kader kesehatan yang diambil dengan menggunakan teknik purposive sampling. Analisa data dilakukan dengan membandingkan data sebelum dan sesudah mendapatkan pelatihan deteksi dini berbasis web terhadap kemampuan kognitif dan psikomotor dengan menggunakan uji statistik paired t-test. Hasil penelitian menunjukkan adanya perubahan kemampuan kognitif dan psikomotor yang signifikan  p value 0,000 (p < 0,05). Salah satu upaya promotif dan preventif kesehatan jiwa dapat dilakukan melaui deteksi dini berbasis web. Kata kunci: deteksi dini, kader, kesehatan jiwa PROMOTIVE AND PREVENTIVE EFFORTS FOR MENTAL HEALTH THROUGH WEB-BASED DETECTION EARLY ABSTRACTCadres are potential workers in the community who have an important role in improving the mental health of the community. Empowerment of mental health cadres can be done by providing web-based early detection training so that cadres have an understanding of mental health problems, early detection of mental disorders and make a referral of health centers. This study aims to analyze the effectiveness of web-based early detection training in mental health promotion and prevention efforts. Quasi-experiment design pre and post-test without control group "with a web-based early detection training intervention used in this study. The sample of this study consisted of 18 health cadres taken using a purposive sampling technique. Data analysis was performed by comparing data before and after getting web-based early detection training on cognitive and psychomotor abilities using a paired t-test statistical test.The results showed a significant change in cognitive and psychomotor abilities, p-value 0,000 (p <0.05. One of the promotive and preventive efforts of mental health can be done through web-based early detection. Keywords: early detection, cadres, mental health
THE EXPERIMENTAL RESEARCHES OF REINFORCED CONCRETE I-BEAM ELEMENTS WITH NORMAL CRACKS WHEN TURNING
Authors: Orlova Olga
Published: December 2020

The data of experimental researches of the rigidity of reinforced concrete I-beam elements with normal cracks at the action on them of the twisting moment have resulted in this paper. It is shown that the dependence "torque-twist angle" is almost linear. Significant nonlinear deformations appear in the last stages of loading before failure. Therefore at normative torques, it is recommended to consider the work of reinforced concrete elements of the I-beam cross-section with normal cracks linear. It is shown that the presence of longitudinal reinforcement affects the strength and rigidity of beams with normal cracks. Quite a large part of the external torque is perceived by the pin forces in the longitudinal reinforcement. The difference between the external torque and the moment of the pin forces in the armature is perceived by the upper shelf of the I-beam element. In the absence of longitudinal reinforcement, the upper shelf can collapse at loads much smaller than the destructive load of beams with longitudinal reinforcement.
Common mental health conditions among navy divers: A brief report
Authors:   Institute for Maritime Medicine, Simon’s Town, South Africa, Van Wijk Charles H , Martin Jarred H ,   Department of Psychology, University of Pretoria, South Africa, Firfirey Nazneen ,   Institute for Maritime Medicine, Simon’s Town, South Africa
Published: December 2020

(Van Wijk CH, Martin JH, Firfirey N. Common mental health conditions among navy divers: A brief report. Diving and Hyperbaric Medicine. 2020 December 20;50(4):417–420. doi: 10.28920/dhm50.4.417-420. PMID: 33325025.) Introduction: A recent article reported on common mental health conditions among recreational scuba divers, and observed that the prevalence mirrored national population figures. This raised the question of the extent to which this might also be the case among professional divers. No data on commercial divers could be located; this paper presents the situation among navy divers. Methods: Mental health survey data from 132 South African Navy divers were reviewed to describe the 12-month prevalence of common mood, anxiety, and alcohol misuse disorders. Results: Prevalence of common mood and anxiety conditions appeared to reflect local general population estimates, and the occurrence of alcohol misuse was higher than local population figures, although the usefulness of the population data could be challenged. Conclusions: It appeared that common mental health conditions in both sport and navy divers may generally conform to their respective local general population estimates. If this were to be the case in the broader professional diving environment as well, the inclusion of some form of formal mental health screening during commercial diving medical examinations may be beneficial.
Spatial and temporal patterns of precipitation in Montenegro
Authors: Ćulafić Golub , Popov Tatjana , Gnjato Slobodan , Bajić Davorin , Trbić Goran , Mitrović Luka
Published: December 2020

The paper analyses, spatial and temporal patterns of precipitation over Montenegro. Data on mean monthly precipitation during the period 1961–2015 from 17 meteorological stations were used for the analysis. Four regions with different spatial precipitation regimes were identified by using the principal component analysis and the agglomerative hierarchical clustering method. A downward tendency in annual precipitation prevails over Montenegro. The most prominent reduction was present in the summer season. In contrast, precipitation increased during autumn. However, the majority of estimated trend values was low and statistically insignificant.
O-C Analysis of Algol-type Eclipsing Binary UU And
Authors: Öztürk Oğuz
Published: December 2020

Using all available minimum times of Algol-type eclipsing binary UU And, Observed(O) - Calculated (C) based orbital period analysis of UU And is presented in this study. O-C diagram of UU And is represented by cyclic variation superimposed on an upward parabolic variation. The upward parabolic variation was modelled by assuming non-conservative mass transfer from the less massive to the more massive component to explain the secular period increase of the system. The rate of fractional mass transfer (β) was calculated to be 0.947. Cyclic O-C variation at period of 14 years was detected in the diagram. Light travel time effect (LTTE) caused by additional body in the system was assumed in order to explain the cyclic O-C variation. Using the mass function obtained from O-C analysis, the possible mass of the third component was found to be in the order of solar mass. Such a massive additional body show itself distinctly in the light curve of UU And. On the contrary, no light contribution from an additional body has been detected in the literature so far. Therefore, we conclude that precise high resolution spectroscopic observations are required in order to clarify the existence of a third body and/or magnetic cycle, which may also give rise to cyclic O-C variation in the binary star system.
Ekmeklik Buğdayda Saman Malçının Fotosentezle İlişkili Bazı Tarımsal Özelliklere ve Verime Etkisi
Authors: Yılmaz Muhammed Alim , Akkaya Aydın
Published: December 2020

İklim ve toprak özellikleri, malç tipi, miktarı, uygulama şekli ve zamanı gibi faktörlere bağlı olarak malç mater-yallerinin etkinliği önemli derecede değişebilmektedir. Bu çalışmada malç olarak buğday samanı kullanılmış ve 4 farklı miktarda (0, 300, 600 ve 900 kg/da), 3 farklı zamanda (ekimden hemen sonra, sapa kalkma başlangıcında, gebecik döneminde) uygulama yapılmıştır. Deneme, faktöriyel düzenleme yapılarak, tesadüf blokları deneme planına göre, 4 tekerrürlü olarak, 2017-2018 ürün yılında Kahramanmaraş koşullarında yürütülmüştür. Denemede, Adana 99 ekmeklik buğday çeşidi kullanılmış ve saman malçı uygulamasının bayrak yaprak alanı, klorofil içeriği, bitki örtüsü sıcaklığı, net fotosentez hızı, transpirasyon hızı, stoma iletkenliği, biyomas, hasat indeksi ve tane verimi üzerindeki etkileri incelenmiştir. Uygulamaların bayrak yaprak alanı, bitki örtüsü sıcaklığı, net fotosentez hızı, transpirasyon hızı ve stoma iletkenliği üzerindeki etkileri önemsiz olmuştur. Hasat indeksi ve çiçeklenme dönemindeki klorofil içeriği yönünden malç uygulama zamanının, erken sarı olumdaki klorofil içeriği yönünden malç miktarının etkisi önemli olmuştur. Tane verimi ve biyomas yönünden malç uygulama zamanının etkisi önemsiz, uygulama miktarının etkisi önemli ancak kararsız bir durum göstermiştir. Daha kararlı sonuçlara ve güvenilir önerilere ulaşabilmek için benzer nitelikte çalışmaların uzun dönemli olarak devam ettirilmesine ihtiyaç olduğu sonucuna varılmıştır.
Enquadramentos na medicina regenerativa: os relatos recentes na imprensa brasileira
Authors: Acero Liliana
Published: December 2020

A mídia funciona como uma ponte entre a medicina e o público, e impacta como a informação é organizada e apresentada às pessoas. Realizou-se uma análise de conteúdo, quantitativo e qualitativo, dos enquadramentos principais nas matérias sobre medicina regenerativa publicadas pela Folha de S.Paulo e O Globo, entre janeiro de 2012 e maio do 2019. A análise mostrou algumas limitações nas informações publicadas: um número bastante escasso de relatos, com poucas matérias sobre controvérsias sociais e regulatórias e matérias de tons otimistas demais sobre os benefícios das terapias celulares. Conclui-se que falta uma contribuição mais sistemática da imprensa à legitimação social e institucional desta área de ponta no país, desenvolvida com recursos públicos e que oferece uma oportunidade imperdível no aumento da consciência em saúde coletiva, assim como, na participação competitiva do Brasil no cenário global.
Orienting the Occident Italian Travel and Migrant Writing in Mexico (1890-1932)
Authors: Savarino Roggero Franco , Zuccala Brian
Published: December 2020

This article addresses a comparatively neglected corpus of Italian travel and migrant writing in Mexico, ranging from Luigi Bruni’sAttraverso il Messico(1890) to Emilio Cecchi’sMessico(1932). It does so from the methodological angle of nation-making and through the seemingly counter-intuitive prism of Italian Orientalism(s). This article focuses on two key moments of both Italian and Mexican history: Post-Unification/PorfiriatoandVentennio/Post-Revolution. The discussion revolves around the problematization of the construction of an Otherized subalternity as a way for the emerging elites to discursively develop and circulate their worldview.
Le vite dell’Altro
Aleksandar Hemon tra Autofiction, Autobiografia e Allofiction
Authors: Davanzo Enrico
Published: December 2020

This article examines the recurring mixture of fiction and autobiographical themes in the work of Bosnian-American writer Aleksandar Hemon, whose writings can be placed close to the literary genre known as Autofiction. These traits occur also in his latest production, exemplified by The Book of My Lives (2013) and My Parents / This Does Not Belong To You (2019). In these two books the attention paid by the author to his relatives’ experiences may led to a comparison with the autofiction subgenre defined by A.K. Mortimer as ‘Allofiction’. Studying these features, my intent is to analyze how Hemon’s stylistic choices have been affected by his condition of other both in the USA and postwar Bosnia.
Miljenko Jergović. Herkul
Authors: Davanzo Enrico
Published: December 2020

Review of Jergović, M. (2019). Herkul. Zaprešić: Fraktura, 176 pp. Beograd: Booka, 149 pp.
Giuliano D’Amico. Tilbake til fremtiden
Authors: Ciaravolo Massimo
Published: December 2020

Review of D’Amico, G. (2020). Tilbake til fremtiden. Håkan Sandell og den nordiske retrogardismen. Oslo: Scandinavian Academic Press, 331 pp.
Republication in Iasos of an Athenian Proxeny Decree
Authors: Rossini Alessandro
Published: December 2020

The agora of Iasos in Caria yielded a 3rd/2nd century BC decree which fulfilled a certain Kydias’ proposal to display the copy of the Athenian-proxeny conferral to three earlier Iaseans. The Iasean part retains a valuable passage about the rare Archive of the Prostates, while the copy allowed a progress in the exegesis of the original decree; it also allowed to form hypotheses on the context of the honours to the three Iaseans and on the reasons that led Iasos and Kydias to commemorate them. It is instrumental, in this sense, to understand the other survived Athenian provision, about the arrangement of a group of philo-Athenian Iaseans.
ÜÇ KONİLİ ROTARİ MATKAPLARIN SEÇİMİNDE DİKKAT EDİLECEK ÖNEMLİ PARAMETRELER
Authors: Acaroğlu Ömür , Ünlü Selma , Hasipek Burcu
Published: December 2020

Açık ocak madenciliği delme patlatma işlerinde yaygın olarak kullanılan matkap türlerinden biri de üç konili matkaplardır. Her ne kadar bu matkapların seçiminde genellikle IADC kodları kullanılsa da matkapların delme hızı ve dayanımına birçok parametre etki etmektedir. Günümüzde niteliksiz ürünlerin yaygınlaşmasından dolayı kullanıcılar matkap ömrünü artırmak için yüksek IADC kodlarında seçim yapma eğilimindedir. Bu ise delme hızını düşürmekte ve delme maliyetini artırmaktadır. Matkap seçiminde; öncelikle matkabın üretim aşamasında doğru malzeme kullanılmış ve uygun metalurjik süreçlerden geçmiş olmasına ayrıca matkap tasarımının formasyon şartlarına uygun olup olmadığına dikkat edilmesi gerekmektedir. Kullanım aşamasında ise verimliliği artırmak için baskı kuvveti ve dönme hızı gibi çalışma parametrelerine ait değerler formasyon özelliklerine göre belirlenmelidir. Matkap seçiminde sadece matkap maliyeti değil, bütün olarak delme işlemi maliyeti dikkate alınmalıdır.
Analisis Harga Saham Pada PT Garuda Indonesia Tbk
Authors: Arvita Yudha Putra , Muniarty Puji
Published: December 2020

Tujuan utama dari penelitian ini adalah untuk mengetahui dan menganalisis besarnya harga saham pada PT Garuda Indonesia Tbk. Jenis penelitian ini adalah deskriptif. Populasi yang digunakan yaitu laporan keuangan tahunan PT Garuda Indonesia Tbk berupa data harga saham dan laba per saham yang diperoleh melalui website resmi Bursa Efek Indonesia (BEI) selama delapan tahun yaitu 2011-2018. Teknik sampling yang digunakan yaitu purposive sampling dengan sampel selama Lima tahun yaitu tahun 2014-2018. Metode analisis data dengan menggunakan alat Price Earning Ratio (PER) serta menggunakan analisis statistik uji t-test one sampel. Hasil analisis yang dilakukan memperoleh nilai thitung lebih kecil dari ttabel (0.365<2.132). Sehingga hipotesis Ho yaitu: Price Earning Ratio (PER) Pada PT Garuda Indonesia Tbk kurang dari 10 dari yang diharapkan diterima (Harga Saham Dikatakan Murah) artinya bahwa harga saham PT Garuda Indonesia Tbk dikatakan murah selama lima tahun terakhir yaitu dari tahun 2014-2018.
Interreligious and Intercultural Dialogue in Education
Authors: Vilà Ruth , Freixa Montse , Aneas Assumpta
Published: December 2020

The article sketches the overall layout of the thematic issue of the ‘Journal of Religion and Transformation in Contemporary Societies (JRAT)’ on Interreligious Dialogue (IRD) in context. It argues that an analysis of interreligious dialogue activities in their socio-cultural contexts helps to counterbalance the long-standing individualistic bias of IRD-research. First, it presents a systematic description of the present state of the art that distinguishes two strands of IRD-research. Second, it argues for a European comparison, based upon most recent findings from the ‘SMRE – Swiss Metadatabase of Religious Affiliation in Europe’. The article is based on the research “Intercultural and interreligious dialogue to promote the culture of peace in unaccompanied foreign youth and minors (MENA) in Barcelona and Melilla” (RTI2018-095259-B-I00 / MCIU / AEI / FEDER, EU) and closes with references to the structure of the present volume of JRaT to facilitate such a comparison.
Attention Mechanism, Transformers, BERT, and GPT: Tutorial and Survey
Authors: Ghojogh Benyamin , Ghodsi Ali
Published: December 2020

This is a tutorial and survey paper on the attention mechanism, transformers, BERT, and GPT. We first explain attention mechanism, sequence-to-sequence model without and with attention, self-attention, and attention in different areas such as natural language processing and computer vision. Then, we explain transformers which do not use any recurrence. We explain all the parts of encoder and decoder in the transformer, including positional encoding, multihead self-attention and cross-attention, and masked multihead attention. Thereafter, we introduce the Bidirectional Encoder Representations from Transformers (BERT) and Generative Pre-trained Transformer (GPT) as the stacks of encoders and decoders of transformer, respectively. We explain their characteristics and how they work.
The effects of using two variants of one language on cognition: Evidence from bidialectalism and diglossia.
Authors: alrwaita najla , Pliatsikas Christos , Houston-Price Carmel
Published: December 2020

The question of whether and how bilingualism affects domain general cognition has been extensively debated. Less attention has been paid to the cognitive abilities of speakers of different variants of the same language, in linguistic situations such as bidialectalism and diglossia. Similarly to the bilingual situation, in bidialectalism and diglossia speakers need to use only one variant of the language in a given context. However, these situations provide fewer opportunities for mixing or switching between the variants, potentially leading to different domain general cognitive outcomes than those reported in bilingualism. Here we review the available evidence on the effects of bidialectalism and diglossia on cognition, and evaluate it in relation to theories of the effects of bilingualism on cognition. We conclude that investigations of bilingualism, bidialectalism and diglossia must take into account the conversational context and, in particular, the opportunities for language switching that this affords.
Positividad y proporción para muestras por COVID-19 en Colombia
Authors: Díaz Pinzón Jorge Enrique
Published: December 2020

Introduction: since the outbreak of severe acute respiratory syndrome coronavirus 2 (SARS-CoV-2) in Wuhan, China, on December 2019, the coronavirus 2019 (COVID-19) disease has been spreading worldwide. This disease is caused by a novel coronavirus, the severe acute respiratory syndrome coronavirus 2. Objective: to describe the positive rate of SARS-CoV-2 testing. Methodology: this research focused in PCR processing for COVID-19, using the information collected by the National Institute of Health, over the period between March 6 and October 31 2020. Results: we evidenced that the day in which the greatest number of samples were taken was 24-07-2020, with 41.550, followed by 40.034 samples taken on 23-07-2020, and 39.228 on 22-07-2020. The highest number of tests returning a positive result was reported on 21-07-2020 with 12.160, followed by 11.983 on 23-07-2020, and 11.879 on 29-07-2020. Likewise, the highest positive rate of 0.33 was evidenced on 19-07-2020, followed by 0.32 on 09-08-2020 and 0.31 on 30-08-2020. Conclusion: we must continue on the active search to identify infected people through conducting more PCR, and viral and molecular antigen tests, the latter offering a high level of accuracy, at the healthcare facilities (EPSs), which accelerate timely reporting to people.
Teachers as Agents of Cultural Capital Formation
Authors: Arriaza Gilberto , Lever-White Yvonne
Published: December 2020

This case study examines the role teachers can play as protective agents in the formation of cultural capital. The study followed classroom teachers and midlevel central office educators as they introduced static and relational cultural capital to minoritized and low-socioeconomic-background high school students. Findings show that in practice both forms of cultural capital function simultaneously. Also, this student population benefits from systemic, consistent, and intentional cultural capital formation, especially when this is nested in a set of structures of care.
Charge Diffusion and Reciprocity Theorems: A Direct Approach to EBIC of Ridge Laser Diodes
Authors: Magistrali F. , Salmini G. , Martines G. , Vanzi M.
Published: December 2020

This article explores the intrinsic significance of EBIC maps, looking at the specific case of ridge laser structures, but starting from a much more general approach: the Reciprocity Theorem for Charge Collection first exploited by Donolato in 1985. It provides information on non destructive testing for structural analysis and defect detection in double heterostructure ridge lasers answering the questions about the significance of EBIC maps. Taking full advantage of both direct EBIC theory and Reciprocity Theorem, most of the observed features of EBIC images are analyzed. It can be concluded that any EBIC detected defect indicates an active scattering and recombination point for minority carriers in operating conditions: no uneffective defects may be claimed; and non isotropic comas may not be read as broadening of a stronger defect kernel: they are related to real defect extension.
A New Focused Ion Beam Microsampling Technique for TEM Observation of Site-Specific Areas
Authors: Ohnishi T. , Koike H. , Ishitani T. , Tomimatsu S. , Umemura K. , Kamino T.
Published: December 2020

A new focused-ion-beam (FIB) micro(μ)-sampling technique has recently been developed to facilitate transmission electron microscope (TEM) specimen preparation, while allowing chips or wafer samples to remain intact. A deep trench is FIB-milled to dig out a small, wedge-shaped portion of the sample (or a microwedge) from the samples area of interest, leaving a small, brige-shaped portion (or a microbridge) to support the microwedge. A metal needle is then manipulated into position for lifting the microwedge, i.e., the μ-sample. FIB-assisted deposition (AD) is used to bond the needle to the μ-sample. FIB-milling of the microbridge then separates the μ-sample from the chip or wafer. The separated μ-sample is mounted onto a TEM grid and secured using FIB-AD. The μ-sample is then FIB-thinned further, to a strip of about 0.1 μm thick. All of the above steps are accomplished under vacuum in the FIB system. This design permits a reliable and user-friendly environment for TEM specimen preparation, while keeping chips or wafer samples intact. It also permits operators to repeat TEM inspection and FIB-milling so that precise areas of interest may be made available for TEM inspection. Both cross-sectional and plan view TEM μ-sampling are feasible.
Reducing Top-of-Die Plastic Delamination by Assuring Pre-Mold Cleanliness of Die Surfaces
Authors: Lowry R.K. , Linn J.H. , Northen A.L. , Zalnoski J.R. , Satterfield H.W.
Published: December 2020

Delamination of mold compound from top-of-die surfaces in plastic encapsulated microcircuits (PEMs) can alter overall package stresses and cause wire bond or other types of mechanical failure. Liquid water may collect in these delaminated regions and cause metal corrosion. Exceedingly small quantities, even fractions of a monolayer, of adsorbed contamination on die may hinder intimate adhesion of the mold compound to the die surface and cause plastic to delaminate. This paper discusses the consequences of top-of-die delamination (TODD), surface contamination derived from wafer tape mounting that can cause it, and cleaning chemistry to remove surface contaminants in order to minimize it.
Combination of SCM/SSRM Analysis and Nanoprobing Technique for Soft Single Bit Failure Analysis
Authors: Liu Larry , Wang Yuguo , Edwards Hal , Sekel David , Corum Dan
Published: December 2020

Traditionally, many semiconductor companies have used SRAM memory to develop their process technologies. The job of the failure analyst is often to physically deprocess the sample and hope to find the defect with only the bit map location to guide them. The success rate has been better in the past when the size of these SRAM cell were bigger. With the technology shrinking every 2 years, the chance of finding physical defects has become less and less. Besides the shrinking SRAM cell geometries, the electrical failure signature for many of the failures is marginal (soft failure), presenting difficult challenges for failure analysis (FA). Physical analysis of these soft SRAM failures at the sub-100nm technologies is often non-visual without detailed isolation and electrical characterization. Therefore, additional techniques are needed to improve the successful FA on newer technologies. In this discussion, we will present the uses of both SCM/SSRM (scanning capacitance microscopy / scanning spreading resistance microscopy) analysis and nanoprobing technique for fail site isolation.
Laser Milling Techniques for Stacked Die Package Applications
Authors: Skoglund Lars , Dias Rajen
Published: December 2020

Ultraviolet (UV) lasers can be used as microsurgery tools to deprocess electronic packages to expose the device and internal package features. A UV laser milling tool was characterized for various applications on multiple die stacked packages to assist in fault isolation and failure analysis. Laser milling procedures evaluated were package delayering to expose traces, trace cutting so that fails can be isolated between the die and package, wire bond exposure and cutting, multiple stacked die exposure through mold compound decapsulation and device milling. Results show excellent selectivity of the laser in removing organic material without etching copper traces at multiple layers in the organic package. Mold compound removal above the die was limited to within ~15 microns of the die surface to prevent any die damage. Mold compound decapsulation outside the die area to expose multiple layers of wire bonds for probing and inspection was developed after overcoming issues related to wire damage. In conclusion, laser milling procedures developed and evaluated show that the technique has a unique advantage in performing local package microsurgery with minimal damage or change in the global stress state of the package.
A Correlation Study between XPS and AES Quantitative Analysis of Nitrogen Concentration in Gate Oxide
Authors: Wu LinFeng , Li Ming , Lee J.H. , Zhou Jecy , Niou Chorng , Kary Chien W.T.
Published: December 2020

Accurate characterization of the nitrogen concentration and distribution in ultra thin nitrided silicon gate oxide plays the same important role as the fabrication technology itself during the development of 90nm and beyond gate oxide manufacturing process. Based on the measurement results of XPS (X-ray photoelectron spectroscopy) as reference, a correlation study was taken between XPS and AES (Auger electron spectroscopy) data in this paper. The study shows that, by optimizing the experiment conditions of AES such as beam energy, beam current and take off angle, and introducing proper corrective factor, AES can be used as a useful and reliable characterization tool during the monitoring measurement of Nitrogen concentration in ultra thin (<2nm) nitrided silicon gate oxide.
Fault Isolation for a Nanometer-Scale Poly Protrusion Causing Single Column Failure in SRAM Device
Authors: Radaelli Daniele , Wang Nathan N. , Nguyen Francis , Daniel Sabbas
Published: December 2020

A common failure mode such as a faulty single full column in an SRAM can be caused by a wide range of defect types at various locations. Fault isolation by thorough electrical analysis and circuit behavior understanding is needed to precisely pinpoint the defect minimizing the destructive physical analysis. This case study shows the process and the techniques used to identify a nanometer scale poly defect.
Electrical Characterization of the Access Transistor of Deep Trench Based DRAM Products via Backside Contacting
Authors: Lehner Werner , Pauthner Siegfried , Radeck Herbert , Weber Udo , Touzel Jérôme
Published: December 2020

Dynamic Random Access Memory (DRAM) is the one most widespread commodity product of the microelectronic industry. Although the basis structure is quite simple, an indepth electrical characterization of the single cell is mostly correlated with huge efforts in terms of test patterns due to the multiple possibilities for leakage of the cell itself [1]. A direct characterization of the access transistor is not possible because of the missing contact on the drain side (Deep Trench side). A tentative method to overcome this problem has been reported by G. Zimmermann, by using a front side Focused Ion Beam (FIB) contact to access the drain [2]. Unfortunately this method is limited to “coarse” technologies down to 0.15µm due to the resolution of the FIB probe. In addition, the backside contacting via trench allows the measurement of resistance and/or leakage elements at the interface buried strap, Poly 1-Poly 2 within DT (process conditioned). This paper presents an innovative way to contact the access transistor from the backside of the die, using the deep trench of the cell itself as connection to the drain of the investigated device. The backside contact to the polysilicon filled DT is the key aspect of the method and is realised by backside Focused Ion Beam.
High Aspect Ratio via Milling Endpoint Phenomena in Focused Ion Beam Modification of Integrated Circuits
Authors: Ray Valery
Published: December 2020

Precision detection of endpoint after the milling has reached targeted conductor during circuit modification by focused ion beam system is important. While the sensitivity of the endpoint detection can be enhanced by improved secondary electron collection and sample absorbed current monitoring, a detailed understanding of the endpoint signal distribution within a high aspect ratio (HAR) via is of great interest. This article presents an alternative model of HAR via milling endpointing mechanism in which a phenomenon of spatial distribution of the endpoint information within the HAR via is explained based on sputtering of the material from the targeted metal line and redeposition of the spattered material on the via sidewalls. Increased emission of the secondary electrons, resulting from the subsequent bombardment of this conductive re-deposition by the primary ion beam, is detected as the endpoint. A methodology for the future experimental verification of the proposed model is also described.
System Failure Analysis Process and Case Study
Authors: Konkol Nicholas
Published: December 2020

Failure analysis at the system level requires a well-defined process and methodology in order to drive quality improvements onto motherboards or other subsystems of a personal computer. This process needs to be structured around the type of failure mechanisms that an FA group desires to understand. This paper discusses a specific case study involving electrical overstress in a personal computer that impacted the motherboard of the system. The case study resulted in a solution to increase quality on motherboards in the context of electrical overstress prevention.
FA/LIT Instrument Adjustments for Successful Analysis of Packaged Semiconductor Devices
Authors: Sullivan Daniel J. D. , Hsiung Steve K. , Soopikian John
Published: December 2020

Failure analysis laser inspection tool (FA/LIT) is a tool for the analysis of packaged devices. FA/LIT can routinely expose bond wires for inspection; however, concerns develop for the exposure of stitch bonds, the examination of small trace cracks, and any requirements to maintain electrical functionality of devices. Matching the FA/LIT settings based upon operation and sample material is critical in achieving good exposure of areas of interest with minimal damage. The use of practice samples, or areas away from the area of interest, to verify results before operations on actual FA parts is strongly recommended in this article. The installation of a grounded sample holder has been shown to greatly improve electrical integrity of samples during the laser ablation procedure. Use of the grounding sample holder improved electrical test results from 0% pass to 100% pass in advanced CMOS devices.
Failure Analysis of Laser Blown Metal Fuse Failures in Submicron Technology by C-AFM
Authors: Wen Liang-Feng , Chen Chien-Hui , Chang Allen Timothy
Published: December 2020

This paper presents a method of using a conductive atomic force microscope (C-AFM) to characterize a submicron metal fuse that has been blown open inadequately by laser. In order to obtain a proper I-V curve measured using the C-AFM without affecting the incompletely opened fuse, the paper proposes a method of preserving the fuse by coating its surface with spin-on glass. The paper explains how differences in laser cutting machines resulted in the high failure repair rate of customer product despite equivalent energy and spot size settings. Analysis of the fuse bank circuitry on wafers helped to find the critical physical differences between a fully blown and a poorly blown fuse. By overcoming difficulties in preserving the blown fuse failure sites for C-AFM measurement, laser settings could be easily optimized to ensure proper fuse opening.
Correlation Study of Delamination Gap Detection Capability of SAM and Cross Section/SEM Analysis
Authors: Leng Tan Soo , McKeon James C. P. , Jang Hyo Seong
Published: December 2020

Previous work on determining the minimal air gap detectable in scanning acoustic microscope (SAM) focused on the gap thickness detectable in an idealized Newton ring sample using a 75 MHz transducer. However, air gaps thinner than 0.130 microns have been detected by SAM. These findings have prompted a return to the question of what is the minimal air gap detectability of SAM. To answer this question, further, Newton Ring experiments using transducers across the SAM frequency range have been performed. This article discusses the processes involved in these experiments and provides the results of SAM from actual packages. The procedure involved in cross-sectioning and scanning electron microscopy (SEM) imaging for correlating samples is also provided. Based on the SAM-cross-sectioning-SEM analysis, a detection of 0.056 - 0.183 micron air gaps was concluded for the delamination areas detected by SAM using a 35 MHz 12 mm transducer.
Nondestructive Defect Imaging through Image Intensity Analysis
Authors: Demarest J. , Bearup D. , Dalton A. , Hahn L. , Redder B. , Wallingford F.
Published: December 2020

The continually shrinking dimensions of today’s semiconductor technology occasionally allow for novel approaches in imaging defects. It has become desirable to image subsurface voids prior to cross sectioning and some efforts have been made to address this need including the construction of specialized instrumentation [1]. The thickness of the metallization levels at the 65 nm technology node and smaller now allow for the use of the electron beam in a scanning electron microscope (SEM) as a material sensor. At high accelerating voltages (between 20-30 kV) in backscatter imaging mode the numerical gray level values at each pixel location can correlate to the amount of material directly under the electron beam at that location. This is particularly evident when dealing with defined geometries and material sets offering high contrast changes between materials such as those found in semiconductor technology like copper (Cu) metal and conventional dielectric materials. As a result, subsurface voids can be mapped to a reasonable representation prior to cross sectioning and precise pinpointing of the defect location in test structures can occur. This paper discusses this methodology on 65 nm technology with Cu metal lines in a low-k dielectric material for a two level metal test structure. To some extent this work represents a natural extension of a paper presented previously by the author [2].
Combining High-Resolution Pulsed TIVA and Nanoprobing Techniques to Identify Drive Strength Issues in Mixed-Signal Circuits
Authors: Ravikumar V.K. , Ho M.Y. , Goruganthu R.R. , Phoa S.L. , Narang V. , Chin J.M.
Published: December 2020

This paper uses an interesting case study to highlight high-resolution pulsed thermal-induced voltage alteration (TIVA) with solid immersion lens (SIL) as a technique to isolate a temperature-sensitive failure in mixed-signal circuitry, followed by circuit analysis and nanoprobing to confirm a drive strength issue caused by a process change.
Simulation Studies of Fluorine-Induced Corrosion and Defects on Microchip Al Bondpads in Wafer Fabrication
Authors: Younan Hua , Rao Nistala Ramesh
Published: December 2020

Fluorine-induced corrosion is one of the well-known failure modes of Al bondpad leading to non-stick on pad (NSOP) issues. Exposure to moisture (H2O) and atmosphere (O2) play an important role in determining the shape and size of the Al-F corrosion defects on the Al bondpad surface. In this paper, we will propose a laboratory simulation methodology that can reproduce F-induced defects observed either at the wafer fab or the assembly house. The methodology, known as SLAT (Shelf Lifetime Acceleration Test), is used to study the relationship between the F-corrosion defects and the relative temperature (T) and humidity (RH %). It is observed that Al-F corrosion defects simulated are similar to the real defects found in wafer fab and assembly house in our previous studies. A relatively higher T and lower RH % results in the formation of the “crystal-like” defects, but if a relatively lower T and higher RH % condition is used, the “oxide-like” defects were formed. In this paper, we will compare the simulation results to the real defects found in the previous cases and discuss the failure mechanism. From the present study, the importance of controlling T and RH % during wafer storage to eliminate F-induced defects will be highlighted.
Pulsed Spot Milling and Deposition to Enable Next Generation Circuit Edit Via Development
Authors: Scott Dane , Lundquist Ted , Malik Tahir
Published: December 2020

Pulsed spot milling (PSM) and deposition (PSD) extends gallium ion beam technology for circuit edit. Similar to continuous spot mill, a single-point ion beam defines the basic milling profile, however, PSM utilizes a high-speed beam blanker to “pulse” the ion beam. This beam modulation replaces beam rastering by introducing a delay time which is fundamentally equivalent to refresh time during a typical scan pattern to enable and manage chemistry adsorption. Vias with a base diameter <50nm have been enabled by PSM in combination with advanced ion column designs, beam control parameters and endpointing techniques.
Root-Cause Investigations of Stitch Bond – Shearing by Means of 3D-X-ray Computer Tomography (XCT), Metallographic Polishing and FIB
Authors: Jacob Peter , Jerjen Iwan , Nicoletti Giovanni
Published: December 2020

Since new packaging technologies came up, sensitive failure modes, which were difficult to prove, increased. In many cases, an interaction of bending properties, thermomechanical stress and the material compounds used, cause intermittent failures related to electrical connections. Since any decapsulation might falsify analysis results, non-destructive characterization approaches are of utmost importance for future failure analysis. By means of a typical case study, the capabilities and limitations of a highly developed X-ray tool in such application has been outlined as well as the complexity of root cause findings.
Advanced Scan Chain Failure Analysis Using Laser Modulation Mapping and Continuous Wave Probing
Authors: Kasapi Steven , Lo William , Liao Joy , Cory Bruce , Marks Howard
Published: December 2020

A variety of EFA techniques have been deployed to improve scan chain failure isolation. In contrast to other laser techniques, modulation mapping (MM) does not require electrically perturbing of the device. Beginning with a review of MM and continuous-wave (CW) probing as well as shift debug using MM, this paper presents three case studies involving scan chains with subtle resistive and leakage failure mechanisms, including transition, bridge, and slow-to-rise/fall failures, using a combination of these techniques. Combining modulation mapping with laser probing has proven to be a very effective and efficient methodology for isolating shift defects, even challenging timing-related shift defects. So far, every device submitted for physical failure analysis using this workflow has led to successful root cause identification. The techniques are sufficiently non-invasive and straightforward that they can be successfully applied at wafer level for volume, yield-oriented EFA.
Thermal Frequency Imaging: A New Application of Laser Voltage Imaging Applied on 40nm Technology
Authors: Celi Guillaume , Dudit Sylvain , Parrassin Thierry , Perdu Philippe , Reverdy Antoine , Lewis Dean , Vallet Michel
Published: December 2020

For Very Deep submicron Technologies, techniques based on the analysis of reflected laser beam properties are widely used. The Laser Voltage Imaging (LVI) technique, introduced in 2009, allows mapping frequencies through the backside of integrated circuit. In this paper, we propose a new technique based on the LVI technique to debug a scan chain related issue. We describe the method to use LVI, usually dedicated to frequency mapping of digital active parts, in a way that enables localization of resistive leakage. Origin of this signal is investigated on a 40nm case study. This signal can be properly understood when two different effects, charge carrier density variations (LVI) and thermo reflectance effect (Thermal Frequency Imaging, TFI), are taken into account.
Highly Automated Transmission Electron Microscopy Tomography for Defect Understanding
Authors: Demarest James J. , Zhai Hong-Ying
Published: December 2020

Imaging tomography by transmission electron microscopy (TEM) is a technique which has been growing in popularity in recent years, yet it has not been widely applied to semiconductor defect studies and root cause determination [1- 3]. In part this is due to the complex equipment, computing needs, and microscope time required to generate the various images which ultimately compose the data set. However, the latest generation of TEMs—with their high level of stability and automation—are greatly reducing the resource needs to create high quality and informative movies of defects rotating about a central axis. One significant advance is the reduction in time required to fabricate a sample and perform the data acquisition by TEM. Today’s microscopes allow for sample fabrication to take place in a few hours or less and can acquire more than 100 images in about an hour at different sample tilt conditions with minimal analyst intervention. This paper describes using automated TEM sample preparation with dual beam focused ion beams (previously reported [4]) in conjunction with automated tomography software on a state-of-the-art TEM. By using an advanced tomography holder ±70° of tilt can be obtained. This is a powerful way to view defects as the failure can be viewed through more than 90° of rotation. Consequently a more complete understanding of the failure site can be obtained over a typical single projection TEM image. This can greatly facilitate root cause determination in a timely manner.
Photon Emission Spectra through Silicon of Various Thicknesses
Authors: Glowacki Arkadiusz , Pagano Carlo , Boit Christian , Yokoyama Yoshiyuki , Jankowski Arkadiusz , Perdu Philippe
Published: December 2020

In this work we present spectrally resolved photon emission microscopy (SPEM) measurements originating from short-channel MOSFETs acquired through the backside of the silicon substrate. Two commonly used detectors have been chosen for the detection of electroluminescence (EL) in the visible and near-infrared spectral regime, namely Si-CCD and InGaAs. As the backside photon emission (PE) inspection is strongly influenced by the absorption of light in a substrate material, the SPEM experiments have been carried out through thinned silicon layers as obtained by mechanical grinding and local focused-ion-beam (FIB) assisted Si material removal. Intrinsic Si absorption (generation of electron-hole pairs) and absorption on free carriers have been modeled to be able to calibrate experimental results and obtain devicerelated PE spectra. The results show no evidences of specific transitions and lead to a conclusion that photon emission from MOSFETs is fully electrical field related.
Advanced Backside Defect Isolation Techniques Using Electron Beam Absorbed Current to Locate Metal Defectivity on Bulk and SOI Technology
Authors: Erington K. , Dickson K. , Lange G. , Garcia J. Z. , Ybarra J. , Wetterling N.
Published: December 2020

This paper describes the use of Electron Beam Absorbed Current (EBAC) mapping performed from the backside of the device as a means of locating metallization defects on state of the art bulk silicon and SOI based microprocessor technologies. It builds on previous work which focused only on flip-chip SOI samples. This paper will demonstrate additional EBAC techniques and the ability to analyze devices processed in bulk silicon technology. Also included are the results obtained from an SOI device mounted in a non flipchip package type. Additional details related to sample preparation, equipment used, and improved practices are described.
Split-Gate Flash Memory Cell Odd/Even Fail Pattern Failure Analysis
Authors: Chiu Re-Long , Higgins Jason , Ying Shu-Lan , Chung Jones , Wang Gang , Liu Xu , Lim Ty
Published: December 2020

A NOR-type split gate embedded Flash memory product program marginal fail with odd/even word line failure pattern. Based on cell current comparison, programming cycling tests and voltage drop measurements, the invisible cause of even/odd cells weak program failure mechanism was verified and confirmed visibly by cross sectioning and junction stain treatment. This problem was then solved by tightening photo alignment control and exposure conditions.
Failure Localization by Using a Novel Backside Passive Voltage Contrast Methodology
Authors: Chen Kuo Hsiung , Chang Chih-Chung , Lin Jian Chan
Published: December 2020

Contact resistance from wafer acceptance test (WAT) data is one of the critical parameter to significantly affect fabrication process. While WAT data shows open/short fail, high resistance fail and leakage fail in contact chain structure, the first job in failure analysis (FA) field is to localize failure site. For example, High resistance failure and leakage failure sites can be localized by Infrared Ray Optical Beam Induced Resistance Change (IR-OBIRCH) detection. Most of open failure modes could be isolated by front side passive voltage contrast (PVC) technique. However, there is still a limitation to this technique while contacts are still connected to substrate in metal-1/contact/active chain structure. Active Voltage Contrast (AVC) [1, 2] is a good method to overcome this problem, but the major concern is how to mark the failure location in SEM based probing system. In this paper, we provide a novel backside passive voltage contrast method to improve the failure analysis technique. By thinning down silicon substrate to the active area, a new contact chain from active area is created. Therefore, novel backside PVC is applied to locate the failed site.
Laser Voltage Probing in Failure Analysis of Advanced Integrated Circuits on SOI
Authors: Ravikumar V.K. , Wampler R. , Ho M.Y. , Christensen J. , Phoa S.L.
Published: December 2020

Laser voltage probing is the newest generation of tools that perform timing analysis for electrical fault isolation in advanced failure analysis facilities. This paper uses failure analysis case studies on SOI to showcase the implementation of laser voltage probing in the failure analysis flow and highlight its significance in root-cause identification.