bluuebunny/crossref_metadata_2025 huggingface dataset:
Computational Structure Refinement by Hybrid Reverse Monte Carlo Simulation Incorporating Fluctuation Electron Microscopy
Authors: Hwang J. , Melgarejo Z.H. , Kalay Y.E. , Kramer M.J. , Stone D.S. , Voyles P.M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Automated Structure Detection in HRTEM Images: An Example with Graphene
Authors: Kling J. , Vestergaard J.S. , Dahl A.L. , Hansen T.W. , Larsen R. , Wagner J.B.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Mastering The Art Of Scientific Programming Or Application Development As A Tool For Scientific Innovation
Authors: Donovan J.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Random Spectrometer Motion for Removal of Time Dependent Artifacts in Spectroscopy
Authors: Gopon P. , Sobol P. , Fournelle J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
De-MA: A Web Database For Electron Microprobe Analyses To Assist Electron Microprobe Lab Manager and Users
Authors: Allaz J.M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Programming for Microscopy and Microanalysis
Authors: Shade P. , Uchic M. , Shiveley A. , Groeber M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
R for X-Ray Microanalysis
Authors: Davis J.M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Microanalysis Software: Properties and Requirements
Authors: Rossek U. , Terborg R. , Falke M. , Kaeppel A. , Rohde M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Analysis of 3D-EBSD Datasets Obtained by FIB Tomography
Authors: Konijnenberg P. , Khorashadizadeh A. , Zaefferer S. , Raabe D.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Effect of the Absorption on the Shape of the Emitted φ(ρz) Depth Distribution for Accurate Quantitative Microanalysis: Evaluation of Analytical Models and Monte Carlo Programs
Authors: Demers H. , Falke M. , Terborg R. , Gauvin R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Nanoscale Phase Patterning in a Sr-Doped Lanthanum Cobaltite Thin Film
Authors: Leonard D.N. , Cullen D.A. , Klein K.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Fast 3D Tomography of C4 Solder Bump by Using Xe Plasma Focused Ion Beam
Authors: Hrncir T. , Hladik L. , Jiruse J. , Lopour F.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
EBSD Imaging of Femtosecond Laser Ablated Surfaces Using the TriBeam System
Authors: Echlin M.P. , Titus M. , Kraemer S. , Pollock T.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
New Approach For Rapid Prototyping Using The Combination of Pulsed Laser Ablation and FIB Milling
Authors: Salzer R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Focused Ion Beam Slice-and-View Tomography and Correlative Electron Microscopy of Multiphase Meteorite Particles
Authors: Bassim N.D. , Stroud R.M. , Scott K. , Nittler L.R. , Herd C.D.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Reproducibility in Focused Ion Beam sample preparation - a Key Requirement for Cryo-Electron Tomography of Eukaryotic Cells
Authors: Schaffer M. , Villa E. , Engel B. , Fukuda Y. , Laugks T. , Rigort A. , Schüler M. , Schwarz A. , Bäuerlein F. , Mahami J. , Baumeister W. , Plitzko J.M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
The Use of Focused Ion Beam (FIB) Technology for Cell Wall Structure Elucidation
Authors: Blumentritt M. , Collins S.D. , Shaler S.M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Applications of Focus Ion Beam Technique in the Characterization of Nanocrystal Nonvolatile Memory Devices
Authors: Zheng J.-G.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Multi-Pore Sensing of Virus Capsids in In-Plane Nanofluidic Devices
Authors: Harms Z. , Haywood D.G. , Selzer L. , Kneller A. , Zlotnick A. , Jacobson S.C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Conductivity and Electroosmotic Transport in Nanofluidic Channels
Authors: Haywood D.G. , Harms Z.D. , Jacobson S.C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Sputter-Induced Topography on Magnesium During Ion Beam Milling Surface Preparation
Authors: Kaboli S. , Demers H. , Brodusch N. , Gauvin R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Automated TEM Sample Preparation from Smaller Device Structure Regions of Semiconductor ICs using Inline Dual-Beam CLM+ and TEMLink 150
Authors: Rai R.S. , Chen E. , Zhang Y. , Nedeau D. , Chen Y. , Zhao W. , Lim S.K. , Mai Z.-H. , Lam J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Wafer-Scale Ion Beam Lithography of Nanopore Devices
Authors: Klingfus J. , Nadzeyka A. , Bauerdick S. , Albrecht T. , Edel J.B.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Three-Dimensional Visualization of Murine Cardiac Tissue Using FIB-SEM Segmentation Techniques
Authors: Wetzel G. , Clarke J.J. , Hudson J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Extreme High Resolution Imaging of Uncoated Cells in a DualBeamTM
Authors: Riesterer J.L. , López C.S. , Barklis E.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Application of a Generalized Approach for APT Simulation: Investigations on Disordered and Complex Sample Structures
Authors: Oberdorfer C. , Eich S.M. , Schmitz G.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Tracing the Solute Distribution and Effects in Materials by Combining Atom Probe Tomography and Atomistic Simulation: Summary of Recent Results
Authors: Ceguerra A.V. , Cui X.-Y. , Ringer S.P.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
A Level Set Evaporation Model for Heterogeneous Atom Probe Tip
Authors: Xu Z. , Li D. , Xu W. , Devaraj A. , Colby R. , Thevuthasan S.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Measuring Chemical Segregation at Grain Boundaries by Atom Probe Tomography
Authors: Bachhav M. , Chen Y. , Marquis E. , Geiser B.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Novel Insights into In-Service Oxidized Inconel 625 Engine Exhausts by a Multi-Technique Approach
Authors: Bagot P.A. , Edmondson P.E. , Hughes G.M. , Crossley A. , De Lille D.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Microencapsulation Method for Atom Probe Analysis of Powders
Authors: Bell D.C. , Magyar A.P. , Graham A. , Baram M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Atom Probe Tomography of III-Nitrides Based Semiconducting Devices
Authors: Shivaraman R. , Wu Y.-R. , Choi S. , Chung R. , Speck J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Atom-Probe Tomographic Study of Interfacial Intermixing and Segregation in InAs/GaSb Superlattices
Authors: Meng Y. , Kim H. , Isheim D. , Seidman D.N. , Zuo J.-M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Combining Atom-Probe Tomography and Focused-Ion Beam Microscopy to Study Individual Presolar Meteoritic Nanodiamond Particles
Authors: Isheim D. , Stadermann F.J. , Lewis J.B. , Floss C. , Daulton T.L. , Davis A.M. , Heck P.R. , Pellin M.J. , Savina M.R. , Seidman D.N. , Stephan T.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Elemental and Isotopic Tomography at Single-Atom-Scale in 4000 and 2400 Ma Zircons
Authors: Reinhard D.A. , Valley J.W. , Ushikubo T. , Strickland A. , Snoeyenbos D. , Lawrence D. , Martin I. , Larson D.J. , Kelly T.F. , Cavoise A.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
A Weibull Perspective on the Fracture of Atom Probe Specimens
Authors: Gault B. , Bouaziz O.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Electric Field Induced Changes in Surface Bonding: Integrating First Principles and Atom Probe Tomography
Authors: Loyola C. , Peralta J. , Broderick S. , Rajan K.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Influence of Co Underlayer Thickness on Mass Resolving Power in Field Evaporated Cu/Co Bilayer
Authors: Tippey K. , Hornbuckle B.C. , Fu B. , Thompson G.B.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Constraining Atom Probe Tomography Reconstructions of Crystalline Oxides
Authors: Cohen M.J. , Gordon L. , Suram S. , Kaluskar K. , Rajan K. , Valley J.W. , Joester D.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Atom Probe Characterization of Corroded Alloy 600
Authors: Gault B. , Scenini F. , Moody M.P. , Huang J.H. , Botton G.A. , Mangelinck D. , Descoins M. , Newman R.C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Atom Probe Tomography Study of In-Doped ZnO
Authors: Baram M. , Bachhav M.N. , Hunter A.H. , Marquis E.A. , Bell D.C. , Liang X. , Clarke D.R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Characterization of Dislocations Found in an Array at a Mixed Character Small Angle Boundary of a Cross Rolled and Annealed Aluminium Sample
Authors: Shamsuzzoha M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Quantitative Differentiation of Three Iron Oxides by EDS
Authors: Konopka J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Examination of Polycrystalline Diamond Compact Cutter used in Drilling Tools in the Oil Industry
Authors: Williard J.N. , Colbert D.K.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Understanding Complex Material Systems Using Multiple Characterization Techniques
Authors: Addepalli S. , Thimmegowda S.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Integrated Nonlinear Optical Microscope for Crystal Centering on a Synchrotron X-ray Beamline
Authors: Newman J.A. , Toth S.J. , Dettmar C.M. , Becker M. , Fischetti R.F. , Simpson G.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Ultra-thin Iridium as a Replacement Coating for Carbon in High Resolution Quantitative Analyses of Insulating Specimens
Authors: Armstrong J.T. , Crispin K.L.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Focused Electron Beam and Elemental Mapping of Palm-top EPMA (Scanning) Equipped with CL Spectrometer (Projection)
Authors: Imashuku S. , Fuyuno N. , Imanishi A. , Hanasaki K. , Ohira K. , Kawai J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Quantitation of Overlapping Core Edges in EFTEM Spectrum Imaging of Cells
Authors: Leapman R.D. , Aronova M.A.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Where is the Plutonium?: Detection and Location of Plutonium-Containing Particles In Tank 18 Waste Using Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), Wavelength Dispersive Spectroscopy (WDS), and X-Ray Diffraction (XRD)
Authors: Ajo H. , Hay M. , Missimer D. , O'Rourke P.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Extensive Analysis of Structure-Property Relationships in Thin-Film Solar Cells Using Scanning Electron Microscopy in Combination with Focused Ion Beam
Authors: Abou-Ras D. , Tsyrulin K. , Schäfer N. , Nichterwitz M. , Kropf H. , Harndt S. , Caballero R. , Schulz H. , Bauer F.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
In-Situ Analytical Electron Microscopy Study of the Lithiation of TiO2 Nanowires Used in Li-Ion Batteries
Authors: Gu M. , Li B. , Wang W. , Sprenkle V. , Wang C.-M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Identifying Minerals of Environmental Concern in Soils from Smelter Operations Using Multiple Microanalytical Methods
Authors: Lowers H.A. , Bove D.J. , Morman S.A.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Auger Electron Spectroscopy of Carbon Diffusion Profiles in Low Temperature Carburized Stainless Steels
Authors: Jennings W. , Avishai A. , Cowen B. , Kahn H. , Ernst F. , Heuer A.H.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Morphological Study on Electrochemical Sensor Based Polypyrrole by Scanning Electron Microscopy
Authors: Gonzalez-Mancera G. , Reyes J.L. , Camacho Q.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Confocal and SEM Studies of Protist Parasites on Fresh Produce
Authors: Bauchan G.R. , Macarisin D. , Santin M. , Fayer R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Improved Specimen Preparation and SEM Imaging Reveal the Morphology of a West African Sorghum Resistant to Storage Insects
Authors: Pendleton M.W. , Ellis E.A. , Pendleton B.B. , Diarisso N.Y.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
An Effective Approach to Extract Cross-Sectional Information from Top-Down SEM for 20nm & 14nm Transistor Nodes in Semiconductor Wafer-Foundries
Authors: Zhao W. , Wei Y. , Oh C.-K. , Kodali S. , Schaeffer T. , Lim S.-K. , Rai R. , Mai Z.-H. , Lam J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Quantifying oxygen vacancies in fuel-cells materials using atomic EELS analysis
Authors: Longo P. , Chisholm M.F. , Varela M. , Lupini A.R. , Twesten R.D.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Analysis of the Light Element Sensitivity and Measurement Time of the Multiple EDX Pole Shoe Detector Rococo2
Authors: Liebel A. , Bornschlegl M. , Eckhardt R. , Jeschke S. , Niculae A. , Soltau H.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Ultrahigh Resolution EDX Spectrum Imaging: Nuclear Materials Applications
Authors: Francis E. , Haigh S. , Burke G. , Gholinia A. , Preuss M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Active Pixel Sensors for Direct Imaging Of Electrons From 10 keV Up To Several MeV With Large Dynamic Range for TEM Applications
Authors: Strueder L. , Lutz G. , Aschauer S. , Majewski P. , Treis J. , Hermenau K. , Ryll H. , Soltau H.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Movie Mode Dynamic Transmission Electron Microscope: Revealing Material Processes at Nanometer and Nanosecond Scales with Multi-frame Acquisition
Authors: LaGrange T. , Reed B.W. , McKeown J.T. , Santala M.K. , Dehope W.J. , Huete G. , Shuttlesworth R.M. , Campbell G.H.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Photoelectron-Pulse Properties from Free-Free Transitions in Ultrafast Transmission Electron Microscopy
Authors: Flannigan D.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
High Brightness Photocathodes for Ultrafast TEM: A New Paradigm
Authors: Rickman B.L. , Berger J.A. , Nicholls A.W. , Schroeder W.A.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Production of Vortex Beam Modes from a Magnetic Spiral Phase Plate
Authors: Blackburn A.M. , Loudon J.C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Reducing Transient Electric Fields Effect in Ultrafast Electron Diffraction Using Multiple Laser Pulse Train
Authors: Hu Y. , Li J. , Zuo J.-M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
High contrast BSE Imaging under Ultra Low Voltage condition by FE-SEM with Energy Filtering
Authors: Hashimoto Y. , Matsuzaki T. , Ito H. , Konno M. , Takeuchi S.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Electron Orbital Angular Momentum Transfer to Nanoparticle Plasmon Modes
Authors: Harvey T.R. , Pierce J.S. , Yahn T.S. , Ercius P.A. , McMorran B.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Evaluation of a Multi-pixel CMOS Photon Detector
Authors: Chuah J.H. , Holburn D.M. , Breton B.C. , Caldwell N.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
On Achromatic Probe-Forming Lenses for FIB Columns and Helium Microscopes
Authors: Martin F.W.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Estimation of Energy Acceptance of SE Detectors in Scanning Electron Microscopy
Authors: Kumagai K. , Sekiguchi T.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Application of Low Voltage Transmission Electron Microscopy
Authors: Bell D.C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Pros and Cons of Low-kV Transmission Electron Microscopy
Authors: Egerton R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Quantitative Low-Voltage STEM imaging in the Presence of Temporal Incoherence
Authors: Oxley M.P. , Pennycook S.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Low-Voltage Atomic-Resolution Off-Axis Holography on Hexagonal Boron Nitride
Authors: Linck M. , Ercius P. , Ophus C. , Alem N. , Zettl A. , Dahmen U.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Imaging Atomic Dynamics in 2D Silica Glass with Low-Voltage Aberration-Corrected TEM
Authors: Huang P.Y. , Alden J.S. , Kurasch S. , Shekhawat A. , Alemi A.A. , Sethna J.P. , Kaiser U. , Muller D.A.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Low Voltage STEM for the Study of Defects in 2D Materials
Authors: Zhou W. , Lee J. , Kapetanakis M.D. , Prange M.P. , Lupini A.R. , Pantelides S.T. , Idrobo J.-C. , Pennycook S.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Contrast Enhancement in Low-kV Zero-loss Filtered Imaging of Frozen-hydrated Biological Specimen
Authors: Majorovits E. , Hofhaus G. , Angert I. , Benner G. , Kaiser U. , Schröder R.R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Low Energy Scanning Transmission Electron Microscope
Authors: Mullerova I. , Mikmekova E. , Konvalina I. , Frank L.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy
Authors: Nicotra G. , Ramasse Q.M. , Deretzis I. , Bongiorno C. , Spinella C. , Giannazzo F.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Challenges and New Approaches for Quantitative X-Ray Analysis in SEM at Low Beam Voltages
Authors: Statham P.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Testing Analytical Precision Using Adaptive Shaping at High Throughput
Authors: Mott R.B. , Healy O.E. , Ritchie N.W.M. , Lindstrom A.P.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Bridging the Gap between EPMA and AEM: The Performance of High Resolution Field-Emission Electron Microprobes in the Analysis of Geological Materials
Authors: Armstrong J.T. , McSwiggen P. , Nielsen C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Combined Quantitative Analysis Using both Micro-XRF and EDS Analysis Inside the Scanning Electron Microscope
Authors: Witherspoon K.C. , Lamb R. , Sjoman P. , Hellested M.D.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Re-sampling of SEM-EDS Element Maps to Characterize the Length-Scale of Elemental Heterogeneity
Authors: Todd C.S. , Heeschen W.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Th-U-Pb Dating of Lunar Granites by X-Ray Microanalysis
Authors: Seddio S.M. , Jolliff B.L. , Korotev R.L. , Carpenter P.K.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Achieving Accurate Estimates of Material Composition from Spectrum Images
Authors: Statham P.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
A Model Unknown Glass Engineered for EPMA WDS Quality Assurance
Authors: Meier D.C. , Davis J.M. , Anderson J.R. , Wight S.A.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
High Throughput, High Quality Analysis in the Electron Microscope
Authors: Hyde A. , Goulden J. , Rowlands N. , Ubhi S.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
An Improved Low Energy X-ray Transmission Window
Authors: Liddiard S. , Coffin M. , Zappe M. , Abbott J. , Hustedt C. , Zufelt K. , Pei L. , Lund J. , Vanfleet R. , Davis R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
High Spatial Resolution, Energy Resolved Imaging with the pnCCD Color X-ray Camera
Authors: Ihle S. , Ryll H. , Soltau H. , Liebel A. , Scharf O. , Bjeoumikhov A. , Schmidt M. , Strüder L.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Advances in Low Voltage Electron Microscopy from Imaging to Analytical Perspective
Authors: Woo P. , Ohno M. , Takeuchi S. , Gauvin R. , Brodusch N. , Demers H.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Application of Low Temperature Broad Ion Milling for Crystallographic Orientation Analysis of Biocalcite
Authors: Clarke J.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
FS-8500 Provides Superior Specimen Preparation
Authors: Bentley D.L. , Seo G.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
New Tools for Correlative Light and Electron Microscopy
Authors: Langhorst M. , Yakushevska A. , Lich B.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Measurements of the X-ray Transmission Characteristics of Moxtek's AP3 X-Ray Windows
Authors: Creighton R.T. , Liddiard S. , Cornaby S.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
THE NANOWORKBENCH: Automated Nanorobotic System Inside of Scanning Electron or Focused Ion Beam Microscopes
Authors: Burkart I. , Klocke V. , Maynicke E.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Mapping of Two Dimensional Electron Gas at Atomically Abrupt Oxide Interfaces using Inline Electron Holography
Authors: Song K. , Koch C.T. , Choi S.-Y. , Lee H.N. , Ryu S. , Eom C.-B. , Oh S.H.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Study of GaAs/Fe Core/Shell Nanowires using Electron Holography
Authors: Zhang D. , Pimpinella R.E. , Liu X. , Dobrowolska M. , Furdyna J.K. , Smith D.J. , McCartney M.R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Electron Holography at Low Voltages Exemplified by Graphene
Authors: Börrnert F. , Lubk A. , Röder F. , Wolf D. , Lichte H.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Characterization of Abrupt Heterojunctions in SiGe NW using Off-Axis Electron Holography
Authors: Gan Z. , Perea D. , Picraux T. , Smith D. , McCartney M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Characterization of Multilayer Ferromagnetic Nanowire Arrays Using Off-Axis Electron Holography
Authors: Akhtari Zavareh A. , Kasama T. , Carignan L.-P. , Yelon A. , Ménard D. , Herring R. , Dunin-Borkowski R. , McCartney M. , Kavanagh K.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
A Research Driven Microscopy Core at New York University Langone Medical Center
Authors: Liang F. , Dancel K. , Petzold C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
A Look at Platinum Prints Using Variable Pressure/Environmental High Resolution Scanning Electron Microscopy -VP HR SEM
Authors: Ravines P. , Erdman N. , McElroy R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Similarities and Differences Between Pigments in Pre-Hispanic Murals and Codices: A Study by Analytical Electron Microscopy
Authors: Arenas Alatorre J.A. , Gonzalez Tirado C. , Silvia-Valasquez Y. , Ruvalcaba Sil J.L.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Near-Surface Chemical Alteration of Nineteenth-Century Architectural Cast Stone
Authors: Vicenzi E.P. , Grissom C.A. , Charola A.E. , Aloiz E. , Wachowiak M.J. , Davis J. , Donovan J.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Using EBSD & EDS to Characterize the Surface of 19th Century and Modern Daguerreotypes
Authors: Ravines P. , Chan L.H. , Nowell M. , McElroy R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Morphological and Compositional Features of Portuguese Polychrome Glazed Pottery Investigated by SEM/EDX - Hints about the Manufacturing Processes
Authors: Guilherme A. , Hodoroaba V.-D. , Benemann S. , Coroado J. , Carvalho M.L.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Trace Element Analysis of Sulfur in a Japanese Sword
Authors: Mori N. , Kamiyama R. , Tanaka T. , McSwiggen P. , Onoders H. , Nielsen C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Structure Nanoclusters with a Well Defined Number of Atoms Using Aberration-Corrected STEM
Authors: Jose Yacaman M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Catalyst Optimization From Structural and Chemical Analysis of Individual Au-Pd Nanoparticles Using Aberration Corrected STEM
Authors: He Q. , Sankar M. , Pritchard J. , Morad M. , Freakley S.J. , Edwards J.K. , Taylor S.H. , Carley A.F. , Hutchings G.J. , Kiely C.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
High-Resolution STEM Analysis of Nanoparticle Materials
Authors: Lupini A.R. , Veith G.M. , Li C. , Iberi V. , Camden J. , Pennycook S.J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Synthesis of Bimetallic Au-Au3Cu Core-Shell Nanostructures Passivated with CuS2 Surface and Atomic Resolution Images by Cs-Corrected STEM
Authors: Khanal S. , Casillas G. , Bhattarai N. , Velazquez-Salazar J.J. , Ponce A. , Jose-Yacaman M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Alcohol Synthesis from Synthesis Gas over Promoted Rhodium Catalysts: A Study of Promoter and Supports Effects
Authors: Guo Z. , Liu J. , Tao R. , Meyer R. , Klie R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Pt Nanoparticles as Electrocatalysts for Water Splitting: Atomistic Insights into Functions and Stability
Authors: Schloegl R. , Kudrenko E. , Willinger M. , Yi Y. , Arrigo R. , Schueth F.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Directly Counting Number of Atoms in Au Nanoparticles Supported on Gamma-alumina by Quantitative-STEM
Authors: Li L. , France M.K. , Yang J.C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Atomic Surface Structures of SrTiO3 Nanocuboids
Authors: Lin Y. , Wen J. , Hu L. , Kennedy R.M. , Stair P.C. , Poeppelmeier K.R. , Marks L.D.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
In Situ Measurement of Nanoscale Structural and Chemical Changes in Catalyst Nanoparticles under Reactive Environment
Authors: Sharma R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Measuring the Effects of Ambient Gas Environment on Catalyst Defaceting and Coarsening through Environmental TEM
Authors: Saber S.M. , Rao R. , Kim S.M. , Harutyunyan A. , Stach E.A.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
In-situ Atomic-scale Investigation of Elemental Diffusion in Pt-Co Nanoparticles
Authors: Chi M. , Wang C. , More K. , Markovic N. , Stamenkovic V.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Local Ordering and Lithium Storage in Nanostructured Li4Ti5O12 Anodes via Scanning Transmission Electron Microscopy
Authors: Wu L. , Wang F. , Zhu Y.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Nanoscale Fe State-of-Charge Mapping in LiFePO4: A Comparison of EFTEM and STXM Spectrum Imaging
Authors: Sugar J.D. , El Gabaly Marquez F. , Chueh W. , Fenton K.R. , Kotula P.G. , Tyliszczak T. , Bartelt N.C. , Sullivan J.P.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Fabrication and Characterization of Nanoporous Organically Modified Silica Films on Electrodes as Platforms for Electrocatalytic Oxidation of Phospholipids
Authors: Mehdi L. , Cox J. , Browning N.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Novel Closed-Cell Gas-Reaction Holder Allows Characterization of Behavior of Bimetallic Nanoparticles at Elevated Temperatures and Gas Pressures
Authors: Allard L.F. , Wittig J.E. , Chi M. , More K.L. , Bigelow W.C. , Damiano J. , Nackashi D.P.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
In Situ Electron Microscopy and Spectroscopy of Battery Materials
Authors: Holtz M.E. , Yu Y. , Gao J. , Abruna H.D. , Muller D.A.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Visualizing and Analyzing Doped and Functionalized Nanoparticles with STEM-EELS Spectro-Microscopy
Authors: Gloter A. , Tence M. , Stephan O. , Chen S.-Y. , Dong C.-L. , van Schooneveld M. , Colliex C.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Effect of Atomic Structure on the Performance of Lithium-rich Layered Oxides: An Aberration-Corrected STEM and D-STEM Investigation
Authors: Jarvis K. , Wang C.-C. , Manthiram A. , Ferreira P.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
An in situ TEM Study of Ferroelastic Domain Mobility
Authors: Gao P. , Jokisaari J. , Nelson C. , Baek S.-H. , Trassin M. , Bark C.W. , Ramesh R. , Eom C.-B. , Pan X.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Direct Observation of the Evolution of Plasmonic Heterostructured Nanowires
Authors: Hudak B.M. , Chang Y.-J. , Li G. , Guiton B.S.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Preferential Growth of δ-Bi2O3 Layers on the {11-20} Facets of ZnO Nanowires
Authors: Xu J. , Liu J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Full-Scale Characterization of UVLED AlxGa1-xN Nanowires Via Advanced Electron Microscopy
Authors: Phillips P. , Carnevale S. , Kumar R. , Myers R. , Klie R.F.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Determination of Local Structure in Meteoritic Nanoscale Porous Carbon to Explain Entrapped Noble Gases
Authors: Stroud R. , Chisholm M. , Amari S. , Matsuda J.-I.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
STEM/EELS and Diffraction Study of Phase Transformation in FeO0.7F1.3/C Nanocomposites After Lithiation/Delithiation
Authors: Sina M. , Pereira N. , Amatucci G.G. , Cosandey F.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Segregation-Induced Degradation in Hydrogen Storage Mg-based Thin Films
Authors: Li Z. , Zheng S. , Bendersky L.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Microstructural Characterization of Manganese Oxides Supercapacitors based on Liquid-phase Exfoliated for Energy Storage Applications
Authors: Pettersson H. , Canavan M. , Coelho J. , Pennycook T. , Nicolosi V.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
In-situ Nucleation and Growth of Protein-Templated Magnetic Nanoparticles
Authors: Kashyap S. , Prozorov T.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Unraveling the Coarsening Mechanism of Palladium Nanoparticles Using in situ High Resolution Transmission Electron Microscopy
Authors: Lu P. , Chen K. , Zhang X. , Shan Z.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Adsorption of Sb on the {10 -10} Facets of ZnO Nanowires
Authors: Yuchi D. , Liu J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Structural Properties and Surface Plasmon Polariton Propagation of Gold Nanoplates
Authors: Major T.A. , Devadas M.S. , Lo S.S. , Hartland G.V.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Adsorption of Naphthalene and Pyrene Containing Surfactant Peptides onto Single- Walled Carbon Nanotubes: A Microscopy, Spectroscopy, and Theoretical Study
Authors: Samarajeewa D.R. , Ranatunga U. , Wilson B. , Lemieux A. , Dieckmann G. , Nielsen S. , Musselman I.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Effect of Mechanical Milling on the Microstructure and Morphology of Al2024/SiC Nanocomposite
Authors: Carreno-Gallardo C. , Barriga-Calvillo H. , Lozano-Rodriguez E. , Estrada-Guel I. , Neri-Flores M.A. , Lopez-Melendez C. , Martinez-Sanchez R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Based-Carbon Reinforcements for Aluminum Composites
Authors: Perez-Bustamante R. , Acosta-Pena D. , Reyna-Cruz A. , Lopez-Contreras E. , Vazquez-Marquez R. , Perez-Bustamante F. , Miki-Yoshida M. , Herrera-Ramirez J.M. , Martinez-Sanchez R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Chemical Analysis of Airbrushed Nickel Nanoparticles for Large-Area Growth of Vertically Aligned Carbon Nanofibers on Metal Surfaces
Authors: Oni A. , White R. , Sarac M. , Anderson B. , Pearce R. , Railsback J. , Hensley D. , Melechko A. , Tracy J. , LeBeau J.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Low Dose HREM Imaging of Alloyed Metallic and Oxide Nanoparticles Synthesized by Reactive Mechanical Milling
Authors: Huerta A. , Gonzalez-Flores R. , Ruiz-Ruiz M. , Suarez-Quintero L.F. , Song C. , Kisielowski C. , Calderon H.A.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Zinc Doped SnO2 Electronic Structure Study by EELS
Authors: Vasquez F. , Gallegos-Orozco V. , Ornelas-Gutierrez C. , Antunez-Flores W. , Santos-Beltran A. , Paraguay-Delgado F.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Simulation of Decoherence in Fluctuation Electron Microscopy
Authors: Rezikyan A. , Jibben Z. , Rock B. , Zhao G. , Treacy M.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
A Comparative Study of Quick and Simple Methods for Thickness Measurement of Graphene
Authors: Pettersson H. , Nicolosi V.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
In situ TEM Observation of the Nucleation and Growth of Metal Oxide Nanoparticles on Graphene
Authors: Luo L. , Wu J. , Xu J. , Dravid V.P.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Effect of the CNT quality in CNT/Al2024 Composites
Authors: Perez-Bustamante R. , Perez-Bustamante F. , Amezaga-Madrid P. , Estrada-Guel I. , Miki-Yoshida M. , Martinez-Sanchez R.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Singly Anchored Pt and Pd atoms on Co3O4 and Their Catalytic Performance
Authors: Zhang S. , Tao F. , Frenkel A.I. , Takeda S.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Biogenic Organic/Inorganic Nano-Composite: Imaging the Macro to Atomic Structure of Herdmania momus Vateritic Spicules
Authors: Kabalah-Amitai L. , Mayzel B. , Kauffmann Y. , Fitch A.N. , Bloch L. , Gilbert P.U. , Pokroy B.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Morphological and Compositional Analysis of Organic LEDs with Silicon QDs as Active Layer (SiLEDs)
Authors: Kuebel C. , Maier-Flaig F. , Rinck J. , Powell A. , Ozin G. , Lemmer U.
Published: October 2016

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.