bluuebunny/crossref_metadata_2025 huggingface dataset:
Tunable phase contrast of vitrified macromolecular complexes by an obstruction minimized electrostatic phase plate
Authors: Frindt N. , Oster M. , Schroeder R.R. , Hettler S. , Gamm B. , Dries M. , Gerthsen D. , Schultheiss K.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
New Phase Microscopy for Advanced Soft Materials Imaging Using Tunable Boersch Electrostatic Phase Plate
Authors: Chen F.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A ‘tulip aperture’ providing in-focus phase-contrast
Authors: Buijsse B. , Van Laarhoven F. , Schmid A.K. , Cambie R. , Cabrini S. , Jin J. , Glaeser R.M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Novel Long-Lived Electrostatic Work Function Phase Plates for TEM
Authors: Perry-Houts J.M. , Barton B. , Schmid A.K. , Andresen N. , Kisielowski C.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Low-voltage off-axis electron holography in the TEAM I microscope: pure phase contrast of beam sensitive objects
Authors: Linck M. , Ercius P. , Ciston J. , Boese M. , Dahmen U.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Properties and Behavior of Amorphous Carbon Films Related to Phase Plate Applications
Authors: Danev R. , Glaeser R. , Buijsse B.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Practical hole-free phase plate imaging: principles, advantages and pitfalls
Authors: Malac M. , Bergen M. , Egerton R. , Kawasaki M. , Beleggia M. , Furukawa H. , Shimizu M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Automatic Phase-Plate Centering for Cryo-TEM
Authors: Marko M. , Leith A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Silicon/Chromium based thin films -a way to Zernike phase plates with long-term stability?
Authors: Irsen S.H. , Lenz J. , Patai S. , Kurth P.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Aberration Corrected Zernike Phase Contrast TEM
Authors: Iijima H. , Motoki S. , Hosokawa F. , Ohkura Y.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A quadrupole optics with large aspect ratio for an anamorphotic electrostatic phase plate without beam blocking
Authors: Müller H. , Haider M. , Gerheim V. , Zach J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A Nanocrystalline Hilbert-Phase Plate for Phase-Contrast Transmission Electron Microscopy of Amorphous Objects
Authors: Manuel D. , Gamm B. , Simon H. , Müller E. , Send W. , Gerthsen D. , Rosenauer A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Study for Automated Imaging with Phase Plate Electron Microscopy and Suggestions for the Future Instrumentation
Authors: Qian H. , Furukawa H. , Shimizu M. , Kawasaki M. , Shiojiri M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Modular Nano-Positioning System for Phase Plates
Authors: Irsen S.H. , Kurth P.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Coherent electron interference of satellite reflections
Authors: Herring R.A. , Saitoh K. , Tanaka N. , Tanji T.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Semi-Quantitative TEM Characterization of ReS2 Nanoparticles
Authors: Kliewer C. , Ho T. , McConnachie J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy
Authors: Yamasaki J. , Tanaka N. , Inamoto S. , Nomura Y. , Okazaki-Maeda K.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Adding new dimension to electron tomography: measuring atomic structures and properties in 3D.
Authors: Bals S. , Goris B. , Van Tendeloo G.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
3D EDX microanalysis by FIB-SEM: Elemental quantification enhancement
Authors: Burdet P. , Cantoni M. , Hébert C.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
3D Imaging of Defects in Crystalline Superlattices of CdS Clusters by Electron Tomography
Authors: Kuebel C.K. , Tatyana L. , Corrigan J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Three-Dimensional Reconstruction of the Amphid Sensory Primary Cilia of C. elegans by Serial Section Electron Microscopy
Authors: Berciu C. , Nicastro D. , Doroquez D.B. , Sengupta P.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
STEM tomography of micrometer-thick neuronal tissues
Authors: Sousa A.A. , Cox D.M. , Wankhede V.V. , Leapman R.D. , Chen X. , Zhang J. , Diamond J.S. , Reese T.S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Silicon Platforms for Supramolecular Structural Analysis of the Chemical Synapse
Authors: Stowell M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Improving cryoEM and EFTEM of biological specimens with graphene
Authors: Rhinow D. , Kühlbrandt W. , Büenfeld M. , Weber N. , Beyer A. , Gölzhäuser A. , Turchanin A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A Comparison of Nano – Scale X-Ray Microscopy and Scanning Transmission Electron Microscopy applied to TiO2 Nanoparticles in a Microbial Food Chain
Authors: Priester J.H. , Mielke R.E. , Werlin R. , Orias E. , Holden P.A. , Gelb J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
SEM 3D Reconstruction of Stained Bulk Samples using Landing Energy Variation and Deconvolution
Authors: Boughorbel F. , Zhuge X. , Potocek P. , Lich B.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Enhanced Four Video-Outputs Backscattered Electron Detector (AsB4) Enabling Live 3D Sample Surface Modeling (3DSM) Even Under Very High Gain Conditions
Authors: Aliman M. , Berger W. , Paluszynski J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Measuring the Three-Dimensional Shape of Grain Boundary Precipitates Using KSpaceNavigator
Authors: Gautam A. , Ophus C. , Dahmen U. , Duden T. , Hagège S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Advances in High-Resolution X-Ray Computed Tomography: Comparing the Latest in Cabinet-based Micro-Computed Tomography Technologies and Synchrotron Radiation-Based Tomography Beamlines
Authors: Rudolph R. , Williams A. , Brunke O.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Enhanced Multi-Modal 3D Analysis of Materials Using FIB-SEM Serial Sectioning
Authors: Fleurkens H.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Photoemission Processes for Ultrafast TEM
Authors: Schroeder W.A. , Berger J.A. , Nicholls A.W. , Zaluzec N.J. , Miller D.J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In situ crystallization of amorphous semiconductors observed by DTEM
Authors: Rosei F.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
The Development of a Flexible Laser Platform for Photoemission based, High-Time Resolution Electron Microscopes
Authors: LaGrange T. , Reed B.W. , DeHope W. , Shuttlesworth R. , Huete G. , Campbell G.H.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Latest Developments in Dynamic TEM: Revealing Material Processes at Nanometer and Nanosecond Scales
Authors: Reed B. , LaGrange T. , Santala M. , McKeown J. , DeHope W. , Huete G. , Shuttlesworth R. , Kim J. , Campbell G. , Topuria T. , Raoux S. , Meister S. , Cui Y. , Kilovits A. , Wiezorek J. , Nikolova L. , Kieffer J. , Rosei F. , Stern M. , Siwick B.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In-situ TEM probing of laser-induced crystallization of amorphous Si
Authors: Xiang B.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Ultrafast Imaging of Rapid Alloy Solidification in Al-Cu Thin Films
Authors: McKeown J.T. , LaGrange T. , Reed B.W. , Campbell G.H. , Kulovits A. , Wiezorek J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Fabication of GaN islands at specific locations on Si substrates using FIB induced Ga surface precipitation and plasma nitridation
Authors: Wang H. , Gray J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam-Scanning Electron Microscopy
Authors: Lin J. , Heeschen W. , Reffner J. , Hook J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Multi-Species Focused Ion Beam Processing for III-V Semiconductor Materials
Authors: Gila B.P. , Appleton B.R. , Fridmann J. , Sanabia J.E. , Mazarov P.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
New processes and modules for improvements in beam chemistry
Authors: Mulders J. , Roussel L. , Wall D.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Application of FIB/SEM and Argon Ion Milling to the Study of Foliated Fine Grained Organic Rich Rocks
Authors: Sondergeld C.H. , Curtis M.E. , Rai C.S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Mixed Synapses as a Testbed for Developing Reagents for Building Connectomes and Synaptomes
Authors: Rosa-Molinar E.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Advanced TEM Sample Preparation Technique using FIB Tilt Stage Method
Authors: Kim J. , Seong T. , Kim J. , Back T. , Kim H. , Kim C.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
On-line Scanned Probe Microscopy Transparently Integrated with Dual Beam SEM/FIB Systems
Authors: Ignatov A. , Komissar A. , Geurts R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In situ Cryo-FIB/SEM imaging of frost formation and ice-substrate interface on superhydrophobic surfaces
Authors: Rykaczewski K. , Scott J.J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
New Tools for Preparing Ultra-Thin TEM Samples
Authors: Volbert B.W. , Rummel A. , Schock K. , Kleindiek S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Cryo-FIB of GaSb and InSb and Temperature Control Effects on Milling
Authors: Santeufemio C.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Reliable Solution for ultra-thin HRTEM Lamella Fabrication by means of BSE Thickness Mapping in Combination with the novel “X2” Preparation Method
Authors: Salzer R. , Lechner L.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Cryo FIB preparation of viscous samples for cryo-TEM
Authors: Kupsta M.R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
EnzMet™: An Enzymatic Metallography Reagent for Accurately Delineating Neuronal Boundaries for Segmenting Gap Junction-Coupled Neurons in their Three-dimensional Space
Authors: Torres-Vazquez I.I. , Serrano-Velez J.L. , Rosa-Molinar E. , Orange F. , Guinel M.J. , Koutis I. , Wolf J. , Laimer C. , Joshi V. , Powell R.D.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Advances in Fluorescence Super-Resolution Biplane FPALM and STED Microscopy
Authors: Bewersdorf J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Extending Subdiffractive Fluorescence Microscopy to Thicker Samples
Authors: York A. , Shroff H.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Fast Single Molecule Position Determination using Graphics Processing Units
Authors: Lidke K.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Characterization of Dislocation Contrast in deformed steels with BCC structure by Electron Channeling Contrast Imaging Method
Authors: Sugiyama M. , Shigesato G. , Shinohara Y.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Channeling Contrast in Helium Ion Microscopy
Authors: Bell D.C.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Comparison of Electron Channeling Contrast Imaging (ECCI) and Electron Back Scattered Diffraction (EBSD) using Hitachi SU8000 FE-SEM
Authors: Kaboli S. , Su J. , Gauvin R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)
Authors: Seal J.R. , Bieler T. , Crimp M. , Britton B. , Wilkinson A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Hybridisation & Band gap contrast from LL-BSE electrons
Authors: Jaksch H.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Dislocation Analysis in Metal-Oxide Materials and Devices by Electron Channeling Contrast Imaging
Authors: Kamaladasa R. , Norman M. , Lu Y. , Bain J.A. , Salvador P.A. , Skowronski M. , De Graef M. , Picard Y.N.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Surface Preparation for Characterizing Microstructure on Transuranic Oxides by Electron Backscatter Spectroscopy and Ion Beam Imaging
Authors: Papin P.A. , Chris C. , Forsyth R.T. , Luther E.P. , Necker C.T.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Zone axis STEM defect imaging based on electron Kossel patterns
Authors: Phillips P. , Kwon J. , Brandes M. , Mills M. , De Graef M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Vortex Beams Hosted in On-Axis Crystals
Authors: Xin H.L. , Zheng H.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Failure of The Incoherent Imaging Approximation in “Sub-Angstrom” STEM Images: A Real-Space Consequence of Electron Channeling
Authors: Hovden R. , Xin H.L. , Muller D.A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ALCHEMI in the Twenty-First Century: A Contemporary Overview
Authors: Anderson I.M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Correlative characterization of the local deformation response and gage volume microstructure of pure Ni micro-samples via in-situ SEM testing and 3D EBSD
Authors: Shade P. , Groeber M. , Uchic M. , Wheeler R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Characterization of Potential Artifacts in the Estimation of Local Plastic Strain near Grain Boundaries via EBSD
Authors: Nowell M. , Wright S.I.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In-situ Straining Analysis by TEM Orientation Mapping (EBSD-like TEM) - Direct Imaging of Deformation Processes in Nanocrystalline Metals
Authors: Kuebel C. , Kobler A. , Hahn H.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
3D non-destructive grain orientation mapping of polycrystalline materials using 3D-XRD and TEM
Authors: Huang X. , Poulsen H.F. , Schmidt S. , Liu H.H. , Godfrey A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Quantitative Approaches for in situ SEM and TEM Deformation Studies
Authors: Dehm G. , Kiener D. , Motz C. , Pippan R. , Smolka M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In situ TEM tensile tests of nanoscale Mg samples oriented for basal slip
Authors: Yu Q. , Minor A. , Qi L. , Li J. , Mishra R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Particle imaging and flow visualization of in-situ TEM nanoreactors
Authors: Puspitasari I. , Kooyman P.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Synthesis, Characterization, and Mechanical Behavior of Nanocrystalline Al-O Thin Film Alloys
Authors: He M. , Malone P.J. , Gianola D.S. , Feng G.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In Situ TEM Observations of Defect Interactions in Mo-Alloy Nanofibers
Authors: Chisholm C. , Minor A.M. , Bei H. , George E.P.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Twinned Nanoparticles Combine High Strength with High Malleability
Authors: Casillas G. , Ponce A. , Velázquez-Salazar J. , Jose-Yacaman M. , Palomares-Báez J.P. , Rodríguez-López J.L. , Luo J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
TEM Investigation of Dislocations in an Aged Ni-Mn-Ga Alloy
Authors: Budruk A. , De Graef M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Phase separation in Beta Ti alloys through HRTEM characterization.
Authors: Afonso C.R. , Caram R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
The Structure of Nanoscale Precipitates and Precipitate Interfaces in an Oxide Dispersion Strengthened Steel
Authors: Ciston J. , Wu Y. , Odette G. , Hosemann P.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Nano-scale Fracture Test for Local Interface Adhesion Strength Evaluation in LSI Interconnects
Authors: Shishido N. , Sugiyama H. , Kamiya S. , Omiya M. , Nagasawa T. , Nokuo T. , Suzuki T. , Nakamura T.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In situ SEM Study of Microbeam Bending of Diffusion Aluminide Bond Coats
Authors: Bhowmick S. , Asif S. , Warren O.L. , Jaya B N. , Jayaram V. , Biswas S.K.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Microstructural and Mechanical Properties of a 304 Stainless Steel Fiber
Authors: Antúnez-Flores W. , Torres-Sánchez R. , Herrera-Ramírez J.M. , Garcia-Aguirre K.A. , Garcia-Estrada J.A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
The Tensile Behavior of E-glass fibers
Authors: Parra-Venegas E.J. , Campos-Venegas K. , Martinez-Sanchez R. , Herrera-Ramirez J.M. , Rodriguez-Miranda A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Oxide-metal interfaces strength measurements on passive films formed in heavy liquid
Authors: Rebelo de Figueiredo M. , Hosemann P. , Kikuchi K.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Structural and Mechanical Characterization of Hi-Nicalon Fibers
Authors: Lujan-Regalado I. , Bencomo-Cisneros J.A. , Campos-Venegas K. , Martinez-Sanchez R. , Herrera-Ramirez J.M. , Figueroa-Duarte J.D. , Gonzalez-Cantu J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Widening the Window of Particle Beam Technology: Helium Ion Microscopy
Authors: Postek M. , Vladar A.E. , Ming B. , Purushotham K.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
High angular intensity gas field ion source with single atom tip
Authors: Moritani H. , Matsubara S. , Hashizume T.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Exploiting channeling in Helium Ion Microscopy
Authors: Hlawacek G. , Veligura V. , Mocking T.F. , George A. , van Gastel R. , Zandvliet H.W. , Poelsema B. , Lorbek S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Towards Secondary Ion Mass Spectrometry On The Helium Ion Microscope
Authors: Wirtz T. , Pillatsch L. , Vanhove N. , Dowsett D. , Sijbrandij S. , Notte J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Site specific He ion irradiation damage studies in nanolayered thin films by cross-coupling Helium Ion Microscopy with TEM and APT
Authors: Vaithaiyalingam S. , Devaraj A. , Venkata Rama Shesha R V. , Wang C. , Varga T. , Thevuthasan S. , Henager C.H.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Quantitative Dopant Contrast in Scanning Electron Microscope and Helium Ion Microscope Using Focused Ion Beam Prepared Specimens
Authors: Zhang H. , Chen Y.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Neon Gas Field Ion Source: Trimer and Single Atom Tip Comparison
Authors: Urban R. , Wolkow R. , Pitters J. , Matsubara S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation
Authors: Petrov Y. , Vyvenko O.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
High Resolution Imaging Of The Rat Kidney Epithelium By Helium Ion Microscopy
Authors: Rice W.L. , Van Hoek A. , Brown D. , Huynh C. , Scipioni L.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Advances in Correlated Light and Electron Microscopy Imaging Probes
Authors: Deerinck T.J. , Bushong E. , Tsien R. , Ellisman M. , Shu X.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Preserving Fluorescent Protein Signal after High Pressure Freezing and Freeze Substitution of Arabidopsis Leaf Tissue
Authors: Johnson C.B. , Smith A. , Vitha S. , Holzenburg A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Understanding structure and chemistry between x-ray and light microscopy
Authors: Jacobsen C.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Correlative Microscopy and Chemical Imaging to Characterize the Structure and Biogeochemical Function of Biofilms
Authors: Marshall M.J. , Belchik S.M. , Hill E.A. , Kucek L.A. , Thomas M. , Carson J.P. , White T.A. , Miller E.A. , Dohnalkova A.C. , Beyenal H. , Cao B.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Assessing Defect Uniformity in High Temperature Superconducting Wires
Authors: Holesinger T.G.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
On-line correlative imaging by using electron-photon hybrid microscope
Authors: Minoda H. , Takahashi K. , Onuma T. , Iijima H. , Nagayama K. , Arai Y. , Tarakawa S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A hybrid imaging method to enhance image contrast
Authors: Wang S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Optimization of Biological Samples for Scanning Transmission X-ray Microscopy and Infrared Environmental Imaging
Authors: Dohnalkova A. , Marshall M.J. , Hill E. , Szymanski C. , Kilcoyne A.L. , Hirschmugl C.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Diffusion Couple Approach for Exploring Refractory Metals Additions to Structural Steels
Authors: Brewer L.N. , McGinnis A.L. , Menon S.K. , Hattar K. , Puskar J.D. , Goods S.H.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Combined AFM Nanoindentation and Finite Element Analysis of Soft Heterogeneous Biomaterials
Authors: Doss B.L. , Staunton J.R. , Dannemeyer M. , Linhart M. , Ros R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Nanoscale Chemical Composition Mapping with AFM-based Infrared Spectroscopy
Authors: Prater C. , Lo M. , Hu Q. , Kjoller K. , Marcott C. , Dazzi A. , Chase B.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
On averaging force curves over heterogeneous surfaces in atomic force microscopy
Authors: Kalaparthi V. , Sokolov I. , Kreshchuk M. , Dokukin M.E.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Atomic force microscopy and Kelvin probe force microscopy to study the mechanism of amyloid fibril formation and toxicity.
Authors: Drolle E. , Hane F. , Choi Y. , Gaikwad R. , Attwood S. , Leonenko Z.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A multi-technique approach to the characterization of surfaces and thin films
Authors: Nunney T. , Wall M. , Camus P.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Contribution of the surface contamination at room temperature on the quantitative analysis by EPMA of uranium compounds
Authors: Dugne O. , Brackx E. , Rado C. , Gueneau C. , Chatain S. , Merlet C. , Chamelot P. , Gibilaro M. , Cabiè M. , Lahaye M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Advances in Imaging the Chemical State of the Sample Surface with XPS
Authors: Moffitt C. , Surman D. , Roberts A. , Hutton S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Design of Ambient Pressure XPS (AP-XPS) Using Bench-Top X-Ray Source and High-Pressure High-Temperature STM and Applications to Operando Studies of Catalysis
Authors: Tao F.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Scanning Auger Analysis of Nanowires and Thin Film Nanostructures
Authors: Hammond J.S. , Paul D.F.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
New Desorption Mass Spectrometry Approaches for Inorganic Particle Analysis
Authors: Szakal C. , Konicek A.R. , Ugelow M. , Simons D. , Holbrook R.D.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Characterization of embedded metallic nanoparticles in oxides by cross-coupling aberration-corrected STEM and Atom Probe Tomography
Authors: Devaraj A. , Colby R. , Shutthanandan V. , Subramanian V. , Wang C. , Perea D.E. , Thevuthasan S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Frequency Modulated Kelvin Probe Force Microscopy to map surface potential of mixed lipid monolayers with and without cholesterol
Authors: Gaikwad R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Enhanced Surface and In-Depth Characterization of Organic and Inorganic Materials Using XPS and Soft Depth Profiling with Argon Cluster Ion Beams
Authors: Strohmeier B.R. , White R.G. , Nunney T.S. , Mack P. , Wright A.E.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Analysis of polymer surface structures with X-ray photoelectron spectroscopic imaging
Authors: Nunney T. , White R. , Mack P. , Wright A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
How to Obtain Rigidity Modulus of Biological Cells Using AFM
Authors: Sokolov I. , Dokukin M. , Guz N. , Woodworht C.D.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
New Applications in Atom Probe Tomography
Authors: Larson D.J. , Reinhard D.A. , Prosa T.J. , Olson D. , Lawrence D. , Clifton P.H. , Ulfig R.M. , Martin I. , Kelly T.F. , Smentkowski V.S. , Gordon L.M. , Joester D. , Inoue K.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Atom Probe Tomography Analysis of Grain Boundaries in CdTe
Authors: Larson D.J. , Reinhard D.A. , Prosa T.J. , Olson D. , Lawrence D. , Clifton P.H. , Ulfig R.M. , Kelly T.F. , Smentkowski V.S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Latest developments on NanoSIMS instrumentation for life science and materials
Authors: Horreard F. , Hillion F.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Characterization of Fine Surface Structure with a New Electron Detection System in FE-SEM
Authors: Erdman N. , Sakuda Y. , Asahina S. , Tsutsumi K. , Shibata M. , Kudo M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Applying an Atomic Force Microscopy in the Study of Sulfide Flotation
Authors: Zhang J. , Zhang W.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany
Authors: Haschke M. , Waldschläger U. , Tagle R. , Rossek U.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Time Reduction Strategies in Large Area µXRF Imaging
Authors: Davis J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Applications of Micro X-Ray Fluorescence in Concrete
Authors: Sudbrink B. , Ley T. , Davis J.M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Recent advances in Scanning Transmission X-ray Microscopy
Authors: Hitchcock A. , Berejnov V. , Kalirai S. , Obst M. , Tyliszczak T.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
New Approaches to Data Processing for Atomic Resolution EELS
Authors: Cueva P. , Hovden R. , Mundy J.A. , Xin H.L. , Muller D.A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
EDX and EELS Chemical Analysis with a Probe Corrected STEM
Authors: Kothleitner G.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy
Authors: Lovejoy T.C. , Corbin G.J. , Dellby N. , Szilagyi Z.S. , Krivanek O.L. , Falke M. , Kaeppel A. , Hahn W. , Rohde M. , Ramasse Q. , Godfrey I. , Kepaptsoglou D.M. , Sarahan M.C. , Shannon M.D. , Bleloch A.L. , Keyse R.J. , Zan R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Challenges of Quantification with Large Solid Angle SDDs in the AEM
Authors: Kotula P.G. , Michael J.R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Analysis of Small Metal Particles
Authors: Bradley S.A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Understanding Best Practices for Atom Probe Tomography Implant Analysis
Authors: Prosa T.J. , Larson D.J. , Olson D. , Lawrence D. , Henry K. , Steel E. , Anderson I.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Detection of individual atoms with energy dispersive x-ray spectroscopy in scanning transmission electron microscopy
Authors: Klenov D.O.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Simulating STEM images in micrometers-thick solid and liquid specimens
Authors: Drouin D. , Demers H. , de Jonge N.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Evaluation of Monte Carlo Codes with Experimental k-Ratio of Binary Specimen for Quantitative Microanalysis
Authors: Pinard P.T. , Richter S. , Demers H. , Gauvin R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Applications of the Scanning Low Energy Electron Microscope
Authors: Mullerova I. , Mikmekova E. , Mikmekova S. , Hovorka M. , Frank L.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A New Method to Validate Ionization Cross-Sections for the computation of Cliff-Lorimer K_(A-B) Factors.
Authors: Gauvin R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Radiation damage in quartz from uranium-bearing sandstones
Authors: MacRae C.M. , Wilson N.C. , Torpy A. , Pownceby M.I.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
How To Do Really Bad SEM/EDS Quantitative Analysis, and Never Even Notice!
Authors: Newbury D.E. , Ritchie N.W.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Trace Analysis Is Worthless If the Peaks Are Misidentified!
Authors: Newbury D.E. , Ritchie N.W.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Accurate X-ray Mapping and Quantitative Analysis at Tilted Geometries
Authors: Burgess S. , Statham P. , Holland J. , Lang C. , Bhattiprolu S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Quantitative EPMA using Bootstrap Methods
Authors: Davis J. , Scott J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A method to avoid strain field induced artifacts in 2d chemical mapping of dilute GaNAs by HAADF STEM
Authors: Grieb T. , Müller K. , Schowalter M. , Rosenauer A. , Fritz R. , Volz K. , Grillo V.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Two-step Deconvolution in Electron Energy-loss Spectroscopy on hBN K-edge
Authors: McLeod R.A. , Malac M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Counting number of atoms in metal nanoparticles: Development of quantitative-STEM techniques for a JEM-2100F S/TEM
Authors: Li L. , Yang J.C. , Zhang Z.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A Standards-Based Method to Determine Elemental Compositions using Energy Dispersive X-Ray Spectrometry for Compound Semiconductors
Authors: Rathi M. , Ahrenkiel P. , Carapella J. , Wanlass M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Evaluation of Analytical Models and Monte Carlo Programs with Experimental phi-rho-z Depth Distribution for Quantitative Microanalysis
Authors: Demers H. , Gauvin R.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Drilling Down Into The Cathodoluminescence And Compositional Variation In Jadeite
Authors: Wight S. , Davis J.M. , Meier D.C. , Vicenzi E.P.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Tracing Pigment Patterns of Iron-based Paint on Ancestral Puebloan Pottery by SEM-EDS Without the Use of Carbon Coating
Authors: Pendleton M.W. , Ellis E.A. , Washburn D.K. , Pendleton B.B.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
SDD-EDS: Element Analysis of Nanostructures in TEM
Authors: Falke M. , Kaeppel A. , Scheller S. , Hahn W. , Terborg R. , Rohde M. , Ramasse Q. , Lovejoy T.C. , Dellby N. , Szilagyi Z.S. , Krivanek O.L.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Characterization of a Microcalorimeter in comparison to Silicon Drift Detectors
Authors: Terborg R. , Cantor R. , Naito H.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
EDS Spectrometry at Low Accelerating Voltages: Pushing the Boundaries of Nano- and Light Element Analysis with Enhanced SDD Technology
Authors: Scheller S. , Berlin J. , Salge T. , Terborg R. , Falke M.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Trace Element Analysis and Sum Peaks in EDS
Authors: Anderhalt R. , Eggert F. , Nylese T. , Chan L.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Data Quality and Acquisition Time in Energy Dispersive Spectroscopy
Authors: Thompson K. , Camus P. , Rohde D.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Local temperature measurement of 1 bar gas in a TEM nanoreactor
Authors: Vendelbo S.B. , Kooyman P.J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
The Growth Of Si Nanowires In UHVTEM And Cs-corrected ETEM
Authors: Chou Y. , Reuter M. , Ross F.M. , Stach E.A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Environmental TEM studies of acetylene decomposition over multi walled carbon nanotubes and multi shelled carbon onions substrates.
Authors: Zakharov D.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Imaging of Pt3Fe Nanwire Growth in Liquids by In situ TEM
Authors: Liao H. , Cui L. , Zheng H. , Whitelam S.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In-situ Electron Energy Loss Spectroscopy of Liquids
Authors: Holtz M.E. , Yu Y. , Abruña H.D. , Muller D.A.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In-situ Observations of Pt Nanoparticle Growth at Atomic Resolution Using Graphene Liquid Cells and Cc Correction
Authors: Ercius P. , Kim K. , Zettl A. , Park J. , Alivisatos P. , Yuk J. , Lee J.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Coupling EELS/EFTEM Imaging with Environmental Fluid Cell Microscopy
Authors: Unocic R.R. , Baggetto L. , Unocic K.A. , Veith G.M. , Dudney N.J. , More K.L.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In Situ Transmission Electron Microscopy of Electrochemical Electrode Reconfiguration Processes
Authors: Regan B.C. , White E.R. , Mecklenburg M. , Hubbard W.A. , Singer S.B.
Published: November 2012

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.