bluuebunny/crossref_metadata_2025 huggingface dataset:
Backside Protection Structure for Security Sensitive ICs
Authors: Amini Elham , Muydinov Ruslan , Szyszka Bernd , Boit Christian
Published: December 2020

Modern integrated circuits (ICs) are in permanent risk of hardware attacks on sensitive data. But, proper and affordable protection of the IC backside against Focused Ion Beam (FIB) and optical fault injection attacks is missing. In this work, we investigate a patent [1] that uses p-n junctions as light emitters (forward bias) and detectors. We improved the backside detection mechanism presented in the patent by developing a test structure and adding an optically active layer on the backside as protective element to detect an attacked backside with electrical signals in the IC. The angle dependent reflection provided by the layer acts as the protective function. We demonstrate how the light emission and detection concept is quantitatively working and how the active layer produces a backside layer integrity related signal in the IC which can act as attack indicator. We also show that, due to the weak light emission intensity of silicon and the high excitation current, influences such as multi-angle reflection and stray current are reducing the angle-dependent effect on the signal and have to be taken into account in practical use.
Power MOSFET Failure Analysis and Package Effects in 3-Phase, Half-Bridge Applications and Design Improvements
Authors: Dipsey Mark , Kearney Ian
Published: December 2020

The degraded performance of a power MOSFET affects customer system reliability and consumer perceptions of quality. Building a reliable product and associated application specific lifetime models to predict the suitability of a power device for a given solution can enable competitive advantages, increased quality, enhanced performance and result in market share gains. This paper describes the methodology employed to configure an application specific reliability test, the failure rates and modes observed, the package modelling, and design improvements implemented. The validation of such relative to its original form and competitor products is discussed where we demonstrate a doubling in performance and an approximate 50% increase in current handling capability. This type of analysis and application specific approach to innovation enables one to focus design improvements in areas most relevant to customer concerns while at the same time adding credibility to specified product limits.
Using Electrical Fault Isolation and Characterization to Improve the Effectiveness of Physical Fault Isolation Techniques for Analog Circuits
Authors: Douglass Jim , Pourmand Sohrab
Published: December 2020

This paper shows that by combining electrical fault isolation and characterization by microprobing with physical fault isolation techniques both what is wrong with the circuit and where the defect is located can be determined with less microprobing and more safety from electrical recovery. In the first example, the unit was powered up using the optical beam induced resistance change (OBIRCH) supply, and OBIRCH was performed to determine if there were OBIRCH site differences between the good part and the return. The second example uses a combination of electrical fault isolation and characterization with microprobing and the physical fault isolation tool of lock in thermography (LIT). With these two examples, it has been shown that the use of electrical fault isolation and microprobing can be used to enhance the physical fault isolation tools of OBIRCH and LIT.
Design for Failure Analysis in a 24 GHz Low-Noise Amplifier for Short Range Radar Applications Created in Silicon CMOS Technology
Authors: Scholz Philipp , Vehring Soenke , Kerst Uwe , Berger Dirk , Boit Christian , Boeck Georg , Gerfers Friedel
Published: December 2020

As the Internet of Things, smart factories and autonomous driving increase the demand for low-price radar sensors, the authors address this need by developing a 24 GHz short range radar in standard bulk silicon CMOS technology for mass market production. CMOS technology enables cost reduction and efficient system integration compared to former GaAs and current SiGe solutions. Design for failure analysis (DFFA) is implemented in the low-noise amplifier (LNA) of the radar to identify and compensate process deviations. It consists of scalable capacitor structures and is executed using focused ion beam circuit edit. By doing so, the design specifications of high gain and low noise of the LNA are reliably met at high yield for the desired operating frequency. The presented DFFA method enables a shift in peak gain by 2.5 GHz. It thereby improves gain and noise figure at 24 GHz by 2 dB and -0.2 dB respectively. The resulting optimized LNA achieves a gain of 20 dB and a noise figure of 3.7 dB matching and surpassing other state-of-the-art works in a single prototyping run.
High-Resolution Ultrasonic Inspection Images of Semiconductor Packages by Advanced High-Frequency Transducers
Authors: Kikukawa Koutaro , Sumikawa Kenta , Takahashi Takuya , Ohno Shigeru
Published: December 2020

This paper describes a method for obtaining high-resolution ultrasonic inspection images of semiconductor packages. We evaluated the effect of the incident ultrasonic frequency on the resolution and defect detection. When the incident frequency of the ultrasonic transducers is changed from 300 MHz to 400 MHz, the capability to detect package defect improves from 2.5 µm to 1.0 µm. The observed images of semiconductor packages proves that a 400 MHz transducer can be applied to inspect sophisticated LSIs.
An Advanced Diagnosis Flow for SRAMs
Authors: Ho Tien-Phu , Faehn Eric , Virazel Arnaud , Bosio Alberto , Girard Patrick
Published: December 2020

In modern electronic designs, more and more memories are embedded in a single chip. With the latest technologies, defects due to the manufacturing process are more prone to occur in the periphery of the memory. Obtaining a fast and accurate localization of such defects has become much more difficult with traditional diagnosis approaches that do not allow a fast-enough yield learning and improvement. This paper describes a new and automated diagnosis flow for SRAMs to determine the localization of any given defect and thus, to precisely guide the Failure Analysis phase. Based on the electrical and topological fault signatures obtained through traditional methods, each potential fault on the identified active nets is automatically simulated to retrieve the best defect candidates. This paper also presents preliminary results on a representative case study.
Application of Laser Deprocessing Techniques to Improve the Job Efficiency and Throughput on Logic Device
Authors: Yap H.H. , Yu J. , Nedeau D. , Sheridan Lucile C. Teague , Oh C.K.
Published: December 2020

There are several methods commonly used to locate the area of interest (AOI), such as using layout landmarks, applying laser marks, focus ion beam marks, etc. This paper discusses another method which can improve the job efficiency and cost-effectiveness by introducing the combination of laser marking and laser deprocessing technique (LDT) as a quick way to deprocess the AOI. It further explores LDT to improve the job efficiency and throughput in logic devices to achieve cost-saving targets. An experiment was performed on a 14nm technology node prototype chip that integrated logic and SRAM. The proposed LDT has demonstrated itself to be a useful method to increase the job efficiency by performing in batch and easy to locate the AOI upon loading the sample for SEM inspection. It is also a simple and cost-effective way to delayer comparing to other methodologies.
Nanoscale Strain Mapping via Photo-Induced Force Microscopy
Authors: Park Sung , Park Katie , Nowak Derek , Albrecht Tom , Wood Erin Leigh , Walker Angela Hight
Published: December 2020

Carrier mobility enhancement through local strain in silicon is a means of improving transistor performance. Among the scanning probe microscopy based techniques, tip-enhanced Raman spectroscopy (TERS) has shown some promising results in measuring strain. However, TERS is known to depend critically on the quality of the plasmonic tip, which is difficult to control. In this study, a test structure is used to demonstrate the capability of photo-induced force microscopy with infrared excitation (IR PiFM) in direct measurement of strain with approximately 10 nm spatial resolution. For SiGe pitch less than about 800 nm, the region between the SiGe lines should maintain residual strain. For a region with SiGe pitch of 1000 nm, it is verified that the strain between the SiGe lines is fully relaxed. PiFM promises to be a powerful tool for studying nanoscale strain in diverse material.
Case Study Failure Analysis of an Ultra-High Vacuum Enclosure Made of a Silicon Chip and Borosilicate Glass for the Cold Atom Laboratory
Authors: Garteiz Gil , Verdugo Javeck , Aveline David , Williams Eric , Croonquist Arvid , Blank Richard
Published: December 2020

In this paper, a failure analysis case study on a custom-built vacuum enclosure is presented. The enclosure’s unique construction and project requirement to preserve the maximum number of units for potential future use in space necessitated a fluorocarbon liquid bath for fault isolation and meticulous sample preparation to preserve the failure mechanism during failure analysis.
VLSI for Space Applications—Single Event Effect Investigation and Optical Analysis on an Integrated Laser Platform
Authors: Chef Samuel , Chua Chung Tah , Siah Yu Wen , Perdu Philippe , Gan Chee Lip , Tan Soon Huat , Koh Lian Ser
Published: December 2020

Today’s VLSI devices are neither designed nor manufactured for space applications in which single event effects (SEE) issues are common. In addition, very little information about the internal schematic and usually nothing about the layout or netlist is available. Thus, they are practically black boxes for satellite manufacturers. On the other hand, such devices are crucial in driving the performance of spacecraft, especially smaller satellites. The only way to efficiently manage SEE in VLSI devices is to localize sensitive areas of the die, analyze the regions of interest, study potential mitigation techniques, and evaluate their efficiency. For the first time, all these activities can be performed using the same tool with a single test setup that enables a very efficient iterative process that reduce the evaluation time from months to days. In this paper, we will present the integration of a pulsed laser for SEE study into a laser probing, laser stimulation, and emission microscope system. Use of this system will be demonstrated on a commercial 8 bit microcontroller.
Failure Analysis Case Study of a 1.5 Meter Space Flex Harness
Authors: Kim Erick , Mansour Kamjou , Garteiz Gil , Verdugo Javeck , Ross Ryan , D’Agostino Saverio , Blank Richard
Published: December 2020

This paper presents the failure analysis on a 1.5m flex harness for a space flight instrument that exhibited two failure modes: global isolation resistances between all adjacent traces measured tens of milliohm and lower resistance on the order of 1 kiloohm was observed on several pins. It shows a novel method using a temperature controlled air stream while monitoring isolation resistance to identify a general area of interest of a low isolation resistance failure. The paper explains how isolation resistance measurements were taken and details the steps taken in both destructive and non-destructive analyses. In theory, infrared hotspot could have been completed along the length of the flex harness to locate the failure site. However, with a field of view of approximately 5 x 5 cm, this technique would have been time prohibitive.
An Overview of Risk-Based EEE Counterfeit Part Detection Based on SAE AS6171
Authors: Azarian Michael H.
Published: December 2020

As counterfeiting techniques and processes grow in sophistication, the methods needed to detect these parts must keep pace. This has the unfortunate effect of raising the costs associated with managing this risk. In order to ensure that the resources devoted to counterfeit detection are commensurate with the potential effects and likelihood of counterfeit part usage in a particular application, a risk based methodology has been adopted for testing of electrical, electronic, and electromechanical (EEE) parts by the SAE AS6171 set of standards. This paper provides an overview of the risk assessment methodology employed within AS6171 to determine the testing that should be utilized to manage the risk associated with the use of a part. A scenario is constructed as a case study to illustrate how multiple solutions exist to address the risk for a particular situation, and the choice of any specific test plan can be made on the basis of practical considerations, such as cost, time, or the availability of particular test equipment.
Use of Analog Simulation in Failure Analysis: Application to Emission Microscopy and Laser Voltage Probing Techniques
Authors: Auvray Etienne , Saury Luc , Armagnat Paul , Melis Tommaso , Reverdy Antoine
Published: December 2020

This paper describes a novel flow using analog simulations for the failure analysis of digital, analog, and mixed signal devices. Although cell level diagnosis tools are available in the industry, it presents a solution through analog intra-cell simulation particularly advantageous when multiple defects give the same fault result at cell level. Details of case studies such as the one analog intracell simulation on digital device and the analog laser voltage probing are covered. The aim of the simulation solution proposed is to support the failure analyst to interpret emission images on analog devices. The presented analog simulation flow consists of computing the current (or current density) in MOS and bipolar transistors and simulating the internal waveforms in digital or analog cells. It enables failure analysts to interpret light emission and laser voltage probing results obtained on a physical device in a fast and efficient way.
Transmission Electron Microscopy Sample Preparation By Design-Based Recipe Writing in a DBFIB
Authors: Demarest J. , Austin B. , Arjavac J. , Breton M. , Bergendahl M. , Biedrzycki M. , Boye C. , Gaudiello J. , Hager J. , Matham S. , Nguyen K. , Persala M. , Teehan S.
Published: December 2020

Transmission electron microscopy (TEM) sample can be routinely made at a sub 30nm thickness and specific features in semiconductor device design are on the order of 30nm and smaller. As a result, small changes in pattern match registration can significantly influence the success or failure of proper TEM sample placement as an approximately 15nm shift in lamella placement can easily cause the sample to be off the feature of interest. To address this issue, design based recipe writing is being developed on a dual beam focused ion beam platform. The intent is to have the tool read a GDS file and pattern match the design information to physical wafer images in a similar fashion to state-of-the-art critical dimension scanning electron microscopy operation. While the results are very encouraging, more work needs to be done to ensure a TEM sample of approximately 30nm thickness is placed at the desired location.
Time Domain Nanoprobe Analysis of RTS Popcorn Noise in Analog Circuits
Authors: Mulder Randal
Published: December 2020

Random Telegraph Signal (RTS), also described as popcorn noise in semiconductor analog circuits occurs when there is a sudden step in threshold voltage for a MOSFET or sudden step in base current for a bipolar transistor. The causes of popcorn noise can be process-related in semiconductor manufacturing. This paper presents a nanoprobe analysis methodology that was able to detect popcorn noise issues in discrete transistors causing analog circuit failure. The results presented for two different devices obtained similar results proving that the analysis methodology is viable for detecting popcorn noise issues in semiconductor MOSFET transistors. From a failure analysis perspective, the purpose of this paper is to provide the ability and a methodology to detect a signal that differentiates a failing transistor (popcorn noise) from a non-failing transistor (no popcorn noise). In this regard, the ability to obtain these results was not only unexpected but also very successful.
Spectroscopy-Based Mapping with Scanning Microwave Impedance Microscopy
Authors: De Wolf Peter , Huang Zhuangqun , Pittenger Bede
Published: December 2020

Methods are available to measure conductivity, charge, surface potential, carrier density, piezo-electric and other electrical properties with nanometer scale resolution. One of these methods, scanning microwave impedance microscopy (sMIM), has gained interest due to its capability to measure the full impedance (capacitance and resistive part) with high sensitivity and high spatial resolution. This paper introduces a novel data-cube approach that combines sMIM imaging and sMIM point spectroscopy, producing an integrated and complete 3D data set. This approach replaces the subjective approach of guessing locations of interest (for single point spectroscopy) with a big data approach resulting in higher dimensional data that can be sliced along any axis or plane and is conducive to principal component analysis or other machine learning approaches to data reduction. The data-cube approach is also applicable to other AFM-based electrical characterization modes.
SEM/EDS Characterization of Uncommon Metal Whiskers and Determination of Underlying Growth Mechanisms
Authors: Basak D. , Ponce L. H.
Published: December 2020

Two case-studies on uncommon metals whiskers, performed at the Reliability Analysis Laboratory (RAL) of Northrop Grumman Innovation Systems, are presented. The components analyzed are an Oven Controlled Crystal Oscillator (OCXO) and an Electromechanical Relay. Investigative techniques were used to determine the chemical and physical makeup of the metal whiskers and develop an understanding of the underlying effects and mechanisms that caused the conditions conducive to whisker growth.
Non-Destructive Short Fault Localization in Advanced IC Packages Using Electro Optical Terahertz Pulse Reflectometry
Authors: Zee B. , Qiu W. , Alton J. , White T. , Igarashi M. , Sullivan D.
Published: December 2020

We demonstrate how electro optical terahertz pulse reflectometry (EOTPR) can be used in conjunction with a new one-dimensional lump circuit simulation software to quickly and non-destructively isolate faults in advanced IC packages. In the case studies presented, short failures are accurately located in a series of advanced IC package.
Integrated Diffractive Lenses for Ultrathin Silicon
Authors: van Veenhuizen Marc , van der Cruijsen Peter , Serrels Keith A. , Zachariasse Frank
Published: December 2020

High numerical aperture (NA) laser scanning for fault localization requires the use of special lenses aimed at creating a tightly focused laser spot within an integrated circuit. Typically, extrinsic solid immersion lenses are employed that optimize the refraction at the air-silicon surface. In this feasibility study we investigate with both simulations and experiments the use of integrated diffraction lenses for high-NA imaging. We take the limit to ultrathin silicon and discuss the implications for the lens design and performance.
A Novel Approach on Fractography Through Infrared Microscopy
Authors: Norico Allan , Estores Rommel
Published: December 2020

Some of the most challenging task in analyzing fractures is a die that has not been fully cracked apart and a cracked die with electrical overstress damage. Traditional tools such as simple magnifying lens, optical microscope and up to the advance Scanning Electron Microscope are not enough to study the internal fractures or markings that could lead back to the origin of the crack. In order to study these internal fractures, the analyst tends to break the sample into pieces. However, this method creates additional mechanical stress and leads to a secondary crack where the point of origin will be difficult to analyze.

This paper aims to introduce infrared microscopy in fractography (mainly on silicon) using cases and techniques to minimize the occurrence of secondary crack in analyzing internal fractures.
Optimisation of Large Chunk Lift-Out Method and Lamella Preparation for CBED mEasurements Using Xenon Plasma FIB
Authors: Hrabovský Miloš , Morávek Tomáš , Narendraraj Chandran , Gluch Jürgen , Gall Martin , Zschech Ehrenfried , Mühle Uwe
Published: December 2020

As the new generation of microelectronics is pushed into smaller spaces and the yield production is pushing to lower the unoccupied spaces on chips, the local variation of stress has an influence on the component’s performance. This stress comes mainly from different thermal and mechanical properties of the materials used especially in 3D integrations like through silicon via (TSV) technology [1]. Through finite element simulation [2] the internal strain profile was modelled and based on these findings we devised a simulation model for a large area chunk lift out, to preserve the stress inside the material.

Standard preparation method for strain measurement is to use a wafer dicing saw and subsequently focused ion beam (FIB) milling, to create lamellae with a defined geometry, close to the desired TSV. This method requires different equipment and knowledge base to achieve a lamella which is still contaminated by Gallium. Therefor we developed our own method based on an FE model of a large chunk lift out, where only a Xenon Plasma FIB is utilized until the local stress measurement using convergent beam electron diffraction (CBED) is measured in a transmission electron microscope (TEM).
3D-Printed Samples For EXLO/INLO Practice and Training
Authors: Giannuzzi Zachary A. , Giannuzzi Lucille A. , Gehoski Kathleen A. , Mahoney William J.
Published: December 2020

Practice and training samples have been manufactured using 3D-printing methods. These 3D-printed samples mimic the exact geometry of focused ion beam (FIB) prepared specimens and can be used to help master ex situ and in situ lift out micromanipulation methods. An additively manufactured array of samples yields numerous samples needed for repetition and deliberate practice necessary to master the lift out and micromanipulation steps. The 3D-printed samples are cost effective and negates expensive FIB time needed to prepare FIB specimens.
High Throughput and Multiple Length Scale Sample Preparation for Characterization and Failure Analysis of Advanced Semiconductor Devices
Authors: Bonifacio C. S. , Nowakowski P. , Ray M. L. , Fischione P. E. , Downing C.
Published: December 2020

Failure analysis of advanced semiconductor devices demands fast and accurate examination from the bulk to the specific area of the defect. Consequently, nanometer resolution and below is critical for finding defects. This work presents the use of argon ion milling methods for multiple length scale sample preparation, micrometer to sub-ångström, without sample preparation- induced artifacts for correlative SEM and TEM failure analysis. The result is an accurately delayered sample from which electron-transparent TEM specimens of less than 20 nm are obtained.
Second Order Effect Monitoring During Backside Milling for Functional End Point Detection
Authors: George Anthony , Goldthwaite Isaac , Liszewski Katie , Schley Jeremiah , Kent Thomas
Published: December 2020

Backside silicon removal provides an avenue for a number of modern non-destructive and circuit edit techniques. Visible light microscopy, electron beam microscopy, and focused ion beam circuit edit benefit from a removal of back side silicon from the integrated circuit being examined. Backside milling provides a potential path for rapid sample preparation when thinned or ultrathinned samples are required. However, backside milling is an inherently destructive process and can damage the device function, rendering it no longer useful for further nondestructive analysis. Recent methods of backside milling do not guarantee device functionality at a detected end point without a priori knowledge. This work presents a methodology for functional end point detection during backside milling of integrated circuit packaging. This is achieved by monitoring second order effects in response to applied device strain, which guide the milling procedure, avoiding destructive force as the backside material is removed. Experimental data suggest a correlation between device power consumption waveforms and second order effects which inform an in situ functional end point.

Keywords: functional end point, side-channel analysis, backside thinning, milling, machine learning, second order effects
A Novel Method of Fabrication of Metal Probes for Scanning Probe Microscopy
Authors: Milczarek Michał , Jarząbek Dariusz M.
Published: December 2020

A novel method of fabrication of all-metal probes for scanning probe microscopy was developed. The motivation for this work was to develop probes and a method of fabricating them, which can be applied to measure friction of pairs of many different materials at the nanoscale. The main process of the presented manufacturing technique is nickel electrodeposition. The other steps are similarly simple and cheap. Moreover, the technique can be easily modified to manufacture probes of different materials and with different tip shapes.
Introduction of a Novel Sample Preparation Technique for the Failure Analysis of Silicon Integrated Photonics Modules
Authors: Pichumani Pradip Sairam , Khatkhatay Fauzia
Published: December 2020

Silicon photonics is a disruptive technology that aims for monolithic integration of photonic devices onto the complementary metal-oxide-semiconductor (CMOS) technology platform to enable low-cost high-volume manufacturing. Since the technology is still in the research and development phase, failure analysis plays an important role in determining the root cause of failures seen in test vehicle silicon photonics modules. The fragile nature of the test vehicle modules warrants the development of new sample preparation methods to facilitate subsequent non-destructive and destructive analysis methods. This work provides an example of a single step sample preparation technique that will reduce the turnaround time while simultaneously increasing the scope of analysis techniques.
Історіографія українського скарбознавства
Authors: Kotsur Victor Petrovich
Published: December 2020

У статті розглянуто історіографію вивчення скарбів монет, пов’язаних з історією грошового обігу українських історичних регіонів. Сукупність знань щодо монетних скарбів, а саме: джерелознавча цінність монетних комплексів, їх класифікація, причини тезаврації, топографія знахідок, склад скарбів, скарбові ємності, методологія та джерела дослідження визначається поняттям скарбознавство. Дефініції поняття «скарб» досить повно та якісно наведені у нумізматичних словниках. Враховуючи те, що нумізматична наука суттєво збагатилася новими знаннями, вважаємо за необхідне внести доповнення у визначення поняття скарбу. Вивчення та детальний аналіз скарбів є одним із ефективних інструментів в уточненні окремих питань метрології монет, систем їх лічби, скарби тісно пов’язані з українським народним фольклором. У дореволюційній історіографії провідні вітчизняні дослідники приділяли увагу питанню надходження скарбів до збірки мюнц-кабінету Університету Св. Володимира, а також складання топографії знахідок монетних скарбів в окремих історичних регіонах України – Полісся, Волині, Північного Причорномор’я. У довоєнний період увага вітчизняних нумізматів у фокусі скарбознавства була акцентована головним чином на розширенні уявлень про топографії скарбів, знахідки монет Київської Русі та стародавнього Риму. Основи вітчизняного скарбознавства та основні аспекти методології наукового вивчення скарбів закладені М. Ф. Котляром. У період незалежності України продовжили наукову фіксацію скарбів та вивчення їх ролі як джерела у вивченні історії грошового обігу українських історичних регіонів. Вагомим джерелом у вивченні скарбознавчих аспектів є дані архівів, а також ресурсів мережі Інтернет. Враховуючи той факт, що численна кількість скарбів, що демонструють вже відомі «зрізи» грошового обігу тих чи інших історичних регіонів у різні історичні періоди, вже опублікована і достатньо широко вивчена, подальші дослідження сучасних науковців ми бачимо у вивченні скарбів із таким складом, який відрізняється за структурою від класичних, містить раніше невідомі у складі скарбів монети, уточнює або підкреслює роль монет окремих емітентів у грошовому обігу України та Східної і Центральної Європи на загал.
Identifikasi Miskonsepsi Menggunakan Three-Tier Diagnostic Test Berbasis Google Form pada Pokok Bahasan Potensial Listrik
Authors: Maryam Eka
Published: December 2020

Tujuan dari penelitian ini adalah untuk mengidentifikasi miskonsepsi denganmenggunakan Three-Tier Diagnostic Test berbasis Google Form pada pokok bahasan  potensial listrik.Jenis miskonsepsi yang dimaksud adalah conceptual misunderstandings  atau pemahaman konseptual  yang  salah. Penelitian ini menggunakan jenis penelitian deskriptif dengan pendekatan kuantitatif. Penelitian ini dilaksanakan di Prodi Rekayasa System Komputer Universitas Bina Insan Lubuklinggau. Teknik pengumpulan data menggunakan tes diagnostik berbentuk pilihan ganda bertingkat, alasan pemilihan jawaban dalam bentuk essay atau menjelaskan konsep pada jawaban yang dipilih kemudian di upload dalam bentuk jpg atau pdf dan  terakhir tingkat keyakinan atau Certainty of Response Index (CRI). Analisis data dilakukan dengan mencari persentase miskonsepsi dari masing-masing indikator. Hasil penelitian didapatkan data miskonsepsi dengan persentase rata-rata sebesar 34%  dan berada pada katagori miskonsepsi sedang. Nilai mahasiswa yang paham konsep tetapi kurang yakin sebesar 1% dan nilai rata-rata mahasiswa yang tidak paham konsep sebesar 4%. Secara keseluruhan  rata-rata nilai  mahasiswa yang paham tentang konsep lebih besar dari pada kategori lain yaitu sebesar 61%.
The Preface to the Hebrew Translation of Purity and Danger
Authors: Baumgarten Albert I.
Published: December 2020

Purity and Danger, published in 1966, remains Dame Mary Douglas’s most famous book and “The Abominations of Leviticus” its most widely read chapter. In 2005, only two years before her death and in preparation for the Hebrew translation ofPurity and Danger, which appeared in 2010, Douglas wrote a preface for that publication. With the likely interests of the Hebrew reader in mind, the preface expresses Douglas’s final reflections on the history of her engagement with “The Abominations of Leviticus.” It includes a restatement of her conclusions in light of Valerio Valeri’s work, in which she found the preferred approach to the questions she had asked over the years. This article presents Douglas’s preface after setting it in the context of her contributions.
Affective Futures and Relative Eschatology in American Tibetan Buddhism
Authors: Binning Amy
Published: December 2020

Tibetan Buddhist prophecies of decline are largely unattended when it comes to practitioners’ lived experiences. This article considers such narratives through a focus on a community of American Buddhists in California. The relationship between Buddhist narratives of degenerating future and the American landscape is played out through the creation and distribution of sacred objects, which are potent containers for—and portents of—prophetic futures. Ruptures in time and landscape become, through the frame of prophecy, imaginative spaces where the American topography is drawn into Tibetan history and prophetic future. Narratives of decline, this article argues, also find common ground with salient American rhetoric of preparedness and are therefore far from fringe beliefs, but a more widely available way of thinking through quotidian life.
Scalar Theory of Everything (STOE) unites the big, the small, and the four forces (GUT) by extending Newton’s model
Authors: Hodge John
Published: December 2020

Newton established a major physics advance that was confirmed by predicting the late return of Halley’s comet. Newton identified three characteristics of bodies that have been identified as three characteristics of “mass”. Current standard physical models have become very complex with divergent postulates for cosmology and quantum mechanics. Physics theory restarting from Newton’s speculations and then describing the experiments of the 19th and 20th centuries results in a model of the big, the small, and the four forces (GUT) - the Scalar Theory of Everything (STOE).
Avaliação da Qualidade dos Dados do Sistema de Informação do Câncer do Colo do Útero em Vitória – ES, Brasil
Authors: Almeida Márcia Valéria de Souza , Amorim Maria Helena Costa , Thuler Luiz Claudio Santos , Zandonade Eliana
Published: December 2020

Introdução: O Sistema de Informação do Câncer do Colo do Útero (SISCOLO) é um sistema informatizado que permite avaliar e planejar o bom desempenho das ações do controle do câncer do colo do útero. Objetivo: Analisar a acessibilidade, oportunidade e completude como critérios da qualidade das informações do SISCOLO . Método: Estudo descritivo, exploratório, de análise de dados secundários da população feminina que realiza os exames citopatológicos na rede de saúde do municipio de Vitória, ES. Os dados são oriundos do banco SISCOLO , referentes ao período de janeiro a dezembro de 2007, fornecidos pela Coordenação Municipal do Programa Viva Mulher. Para a realização das análises estatísticas, foi utilizado o programa SPSS versão 15.0. Resultados: O SISCOLO e um sistema que apresenta acessibilidade limitada, com oportunidade (tempo decorrido entre a realização da coleta e a liberação do resultado) variando de 15 a 45 dias. A completude dos atributos foi excelente para “fez exame preventivo anteriormente” e “adequabilidade do material”; boa para “ano do último preventivo”; e ruim para escolaridade e todos os atributos relativos aos campos de anamnese e inspeção do colo (Requisição de Exame Citopatológico – Colo do Útero). Conclusão: O SISCOLO apresentou acessibilidade, oportunidade e problemas quanto à completude, principalmente para os dados epidemiológicos.
Gestão de pessoas: Comunicação interpessoal, motivação e liderança
Authors: Medeiros José Marcos de , Medeiros Sanmily Silva de , Silva Sandra Barbosa da , Moura Manoel
Published: December 2020

Este trabalho científico apresenta uma abordagem sobre a nova perspectiva na área da comunicação, motivação, liderança e as necessidades de se adaptar aos novos meios de comunicação. Não temos como objetivo apresentar uma receita pronta para elucidar os problemas de comunicação dentro das organizações ou criar métodos de relacionar-se, mas fomentar a discussão por entender sua relevância nos dias atuais, já que este tema é bastante discutido e muito procurado para se trabalhar em equipe, pois se trata da psicologia humana. Dado a relevância da comunicação interpessoal, se faz necessário esclarecer alguns pressupostos no que diz respeito às formas de comunicar-se, relacionar-se, como também os fatores principais para uma liderança eficaz e que contribuam para diferenciação do gestor de pessoas, visando o alcance da perspectiva empresarial.
Internationale Verantwortung des Staates und menschenrechte: Der Fall des Maria da Penha Gesetzes in Brasilien
Authors: Macêdo Karen Vanderlei
Published: December 2020

Das zentrale Ziel dieses Artikels ist es, die internationale Verantwortung des brasilianischen Staates im Falle von Gewalt gegen Frauen zu analysieren, insbesondere für den Fall, der in Brasilien und außerhalb des Landes zum Sinn geworden ist, der die Beteiligung der Gewalt gegen Maria da Penha Maia Fernandes war, die heute von ihrem Ex-Mann praktiziert wird. Hier ist die Referenz der Fall 12.051 (Maria da Penha Maia Fernandes v. Brasilien), der am 20. August 1998 von der Interamerikanischen Menschenrechtskommission der Organisation Amerikanischer Staaten (OAS) eröffnet wurde. Von der Schnittstelle zwischen häuslicher Gewalt gegen Maria da Penha Maia Fernandes und dem Institute of International Responsibility wurde überprüft, wie die Anwendung eines internationalen Instituts durch die Interamerikanische Menschenrechtskommission der Organisation Amerikanischer Staaten (IACHR-OAS) die Schaffung von Rechtsvorschriften beeinflusste, die die Rechte der Frauen im brasilianischen Staat gewährleisten.
Study on Abundance and Distribution Pattern of Collembola on Three Types of Land Utilizations in Banjar Regency, South Kalimantan
Authors: Trianto Manap , Marisa Fajri
Published: December 2020

Collembola is one of soil organism which classified as mesofauna. This reseach is aims to study the abundance and distribution patterns of Collembola on three types of land utilization in Banjar District, South Kalimantan Province. This research was conducted on April 2020 by using a purposive sampling method. Based on results of Collembola identification obtained at the sampling location, there are 12 genera, 6 families, and 2 orders of Collembola. The highest abundance is found in oil palm plantations. While the Collembola distribution pattern on the three types of land clearing is the same, which is clustering. The results of this study are expected to provide information on the study of abundance and distribution patterns of Collembola in South Kalimantan Province related to environmental factors also help in carrying out sustainable ecosystem development.
Evolución de la formación profesional en España: medio siglo de cambios y reformas
Authors: Vallejo Mónica , Molina-Saorín Jesús , Martínez-López María José
Published: December 2020

El objetivo de este artículo es describir el recorrido y evolución de la Formación Profesional en España a través de la normativa promulgada hasta el momento (leyes educativas y reales decretos). Concretamente son analizadas la Ley General de Educación (LGE), la Ley Orgánica de Ordenación General del Sistema Educativo (LOGSE), la Ley Orgánica de Calidad de la Educación (LOCE), Ley Orgánica de Educación (LOE) y la estrenada Ley Orgánica para la Mejora de la Calidad Educativa (LOMCE). En ellas se examina su contenido a través de tres grandes bloques: estructura y currículum establecido para estas enseñanzas, profesorado y condiciones profesionales y; por último, un apartado de consideraciones generales, en las que se realiza una valoración de las mejoras y críticas de la ley con respecto a la pasada. Las conclusiones alcanzadas detallan cómo se han ido construyendo las enseñanzas de Formación Profesional, al tiempo que permite valorar cuál ha sido su impacto real (respecto a su finalidad), así como los interrogantes y debilidades de la normativa educativa promulgada a lo largo de estos últimos 45 años. La lectura de este trabajo pretende facilitar la reflexión sobre las luces y sombras que aún aqueja la Formación Profesional en este país; siendo este un momento importante, tras la reciente implantación de la Formación Profesional Básica.
Effect of pre and post-natal nutrition on the performances of ewes and lambs under semi intensive rearing system
Authors: Ahmed S , Rakib MRH , Yesmin M , Ershaduzamman M
Published: December 2020

The study was conducted to know the effect of different levels of pre and post-natal nutrition on the performances of ewes and their lambs until 1 year of age and the profitable slaughter age of lambs under semi intensive system. Twenty eight (28) native Bengal ewes at 7 weeks of gestation were randomly assigned to four groups (T0, T1, T2, T3) and supplemented with a concentrate mixture at 0.0, 1.0, 1.5, 2.0% of their body weight respectively. Ewes were allowed to graze 8 hours daily. Creep mixture (20 g/lamb/day) was provided to lambs from 2 weeks age with an increment of 10 g/lamb/week. After weaning, 20 growing male lambs were selected and reared 01 year of age with concentrate mixture at 1.5% of their body weight and 8 hours grazing irrespective of treatment groups. Parameters like, ewe’s litter size, daily milk yield, post-partum heat and lamb’s birth weight, weaning weight, live weight at 06, 09 and 12 months were recorded. The data were analyzed in an ANOVA with CRD by using SPSS v. 20. The mean differences were tested by DMRT at a probability level of P<0.05. After weaning, the lamb growths were analyzed considering age as fixed factor. Regression correlations among different parameters with different ages were also performed. Significantly higher daily milk yield (P<0.01), weaning weight (P<0.05) and daily weight gain of lamb until weaning (P<0.05) were observed in T2 group. Besides, lambs weight at 06, 09, and 12 months differ significantly (P<0.01) along with corresponding daily weight gain (P<0.05). Lambs daily weight gain did not differ significantly from weaning to 09 months of age but significantly reduced (P<0.05) from 09 to 12months age. Finally, it may be concluded that a concentrate diet containing 20% CP during late pregnancy to lactation should be supplied to obtain maximum performances of ewes and their lambs. Besides, native Bengal lamb would be slaughtered between 06 to 09 months of age to get maximum return.

Bang. J. Livs. Res. Vol. 26 (1&2), 2019: P. 43-50
RedesCOAs, un proyecto colectivo de difusión institucional
Authors: Salgado Leyre , López Nuria , González Samuel
Published: December 2020

La red de comunicación de los Colegios de Arquitectos de España, vertebrada en torno a su Consejo Superior, RedesCOAS, es una potente herramienta de difusión institucional y cultural con el que acercar a la sociedad la importancia de la arquitectura y su necesidad como bien de interés general en nuestro día a día. La situación vivida durante el confinamiento por la pandemia de Covid19 es uno de los últimos ejemplos de trabajo conjunto que tiene esta red de trabajo en su historial desde su creación.
Plantlet regeneration via nucellar embryogenesis in Citrus jambhiri
Authors: Singh Manjula , Paliwal S.P. , Singh Shailendra
Published: December 2020

To produce true-to-type and rapid multiplication micropropagation technique was utilized to the nucellar tissue with ovular halves of C. jambhiri. Nucellar tissues were cultured in a modified MS medium supplemented with different concentrations of 2ip viz. 0.25,0.50 mg l-1 alone and in combination of 0.50 mg l-1 NAA. Initiation of cell division and differentiation of proembryogenic tissue became apparent in first 80 days.These proembryos developed into embryos through subculturing in fresh medium. Low concentration of 0.25 2ip was found more suitable for the development of embryo producing large number of fully developed embryo in comparision to the embryo produced in the high concentration of 2ip (0.50 mg l-1) and in combination of 0.25 2ip and 0.50 mg l-1 NAA. Normally developed embryos in 0.25 2ip showed best germination in the fresh medium supplemented with 0.25 mg l-1 IAA, 100 ME mg l-1 and 5mg mg l-1 amino acids within 30 days as compared to other treatments. These germinated embryos were utilized for producing disease free saplings after hardening and nurturing in laboratory conditions. The disease free saplings thus produced can be used to establish new Citrus orchards within short time.
Studies on Diversity of Spider Fauna in Ahmednagar District, Maharashtra State, India
Authors: Gawali A. R. , Pande G. S. , Gawali R.D.
Published: December 2020

The order Aranae of class Arachnida has a special value in the studies of ecology as it serves as a biological indicator. The main objective of the present study was to findout the diversity and characteristics of spiders from Ahmednagar district. The study on diversity of spider was conducted from various collection sites such as Kopargaon, Madhi Bk, Kumbhari (Godavari River area), Faria bag, Pimpalgaon Malvi, Dongargan, Mahatma Phule Krishi Vidyapeeth, Rahuri and Kolhar. The 108-specimen spiders were collected from various sites. The spider specimen collected were photographed, observed, identified and
classified with the help of Zoological Survey of India, Pune. Out of 60 specimens identified, belong to 09 families and 18 genera.
EVALUATION OF RURAL DEVELOPMENT PLANNING (RPJMDES AND RKPDES)
Authors: Subandi Muhammad , Musriadi Musriadi
Published: December 2020

The study aims to determine the effectiveness of the village midterm development planning process / RPJMDes and the village government work plan / RKPDes implemented by Sidomukti Village Government, Muara Kaman District, Kutai Kartanegara District, which was evaluated based on Permendagri No 114/2014 on village development guidelines. The study uses an evaluation method with a qualitative descriptive approach, data collection through documentation and interview studies, data analysis using reduction, data presentation, and concluding. The results of the study found that in the preparation of the RPJMDes and RKPDes, the village government had not yet fully implemented the stages as stipulated in Permendagri No 114/2014, in the preparation of the RPJMDes there were 3 stages not carried out namely aligning the direction of district policy, assessment of village conditions, and village deliberations, while in the preparation of the RKPDes there were no indicative ceilings, this was due to the lack of competence of the Village Government officials in preparing the RPJMDes and RKPDes, weak administrative management, and lack of community participation.
Computation of Single-Cell Metabolite Distributions Using Mixture Models
Authors: Tonn Mona K. , Thomas Philipp , Barahona Mauricio , Oyarzún Diego A.
Published: December 2020

Metabolic heterogeneity is widely recognized as the next challenge in our understanding of non-genetic variation. A growing body of evidence suggests that metabolic heterogeneity may result from the inherent stochasticity of intracellular events. However, metabolism has been traditionally viewed as a purely deterministic process, on the basis that highly abundant metabolites tend to filter out stochastic phenomena. Here we bridge this gap with a general method for prediction of metabolite distributions across single cells. By exploiting the separation of time scales between enzyme expression and enzyme kinetics, our method produces estimates for metabolite distributions without the lengthy stochastic simulations that would be typically required for large metabolic models. The metabolite distributions take the form of Gaussian mixture models that are directly computable from single-cell expression data and standard deterministic models for metabolic pathways. The proposed mixture models provide a systematic method to predict the impact of biochemical parameters on metabolite distributions. Our method lays the groundwork for identifying the molecular processes that shape metabolic heterogeneity and its functional implications in disease.