bluuebunny/crossref_metadata_2025 huggingface dataset:
Determination of the 3-D Magnetic Vector Potential using Lorentz Transmission Electron Microscopy
Authors: Phatak C , Humphrey E , DeGraef M , Petford-Long A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Practical Limitations in Intravital Multiphoton Microscopy of the Kidney
Authors: Muriello PA , Clendenon S , Dunn K
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Advances in the Automated Segmentation of 3-D Microstructures
Authors: Gulsoy E , DeGraef M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM
Authors: Chang L-Y , Lazar S , Baranova EA , Bock C , Botton GA
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microstructural Characterization of Sputter Deposited BaTiO3/Ni/BaTiO3/Ni/BaTiO3 Multi-layer Thin Films on SiO2/Si Wafers
Authors: Zhang M , Reck JN , Miller FS , O'Keefe MJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Using DTSA-II to Simulate and Interpret an X-ray Spectrum Image from a K411 Microparticle
Authors: Ritchie N
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A New Detector for Backscattered Helium Ions in the 30 keV Energy Range
Authors: Sijbrandij S , Notte J , Thompson B , Huynh C , Sanford C , Scipioni L
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Using the Virtual Cell Simulation Environment for Extracting Quantitative Parameters from Live Cell Fluorescence Imaging Data
Authors: Cowan AE , Ye L , Morgan FR , Koppel DE , Slepchenko BM , Loew LM , Schaff J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Sample Preparation of Epitaxial InN Layers for Transmission Electron Microscopy
Authors: Liliental-Weber Z , Hawkridge M , Erwin D , Libbee M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Energy Loss Spectroscopy of LiMn2O4, and LiMn1.5Ni0.5O4
Authors: Mancilla M Loya , Contreras L Alvarez , Flores DM Carrillo , Ochoa-Lara MT , Aguilar-Elguézabal A , Magaña F Espinosa
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Technique for Fitting Complex Probes in Nano-Beam Diffraction
Authors: McLeod R , Malac M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Jet Soot: Chemical and Structural Characterization via XPS and HRTEM
Authors: Bryg V , Wal R Vander
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Calcium Carbonate Test Formation in the Ciliate Coleps
Authors: DiBartolo-Cordovano R , Marks C , Sprick A , Kingsley R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Steel Hull Corrosion of USS Arizona with Applications to Submerged Resources
Authors: Johnson DL , Medlin DJ , Russell M , Conlin DL , Murphy LE , Carr JD
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Nanostructure Characterization of Conical Silicon Carbide Nanowires and Heterostructures Induced by Release Catalysis
Authors: Liu Z , Srot V , Jin-Phillipp NY , Aken PAV , Rühle M , Yang JC
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Microscopy and Raman Spectroscopy Characterization of Nanoparticle Coated Diatom Biosilica
Authors: Gutu T , Gale DK , Wang W , Chang C-H , Rorrer GL , Jiao J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
3-D EBSD Analysis of High Temperature Sintered YSZ; Evidence of Trace Cubic Phase
Authors: Saraf LV , Thevuthasan S , Arey BW , Pederson LR
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of Advanced High-Energy Density Li-S Batteries by FE-AEM, SEM/EDS X-ray Spectral Imaging and Feature Sizing/Chemical Typing Techniques
Authors: Oleshko VP , Scordilis-Kelley C , Xiao A , Affinito J , Talyossef Y , Elazari R , Grinblat Y , Aurbach D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ and Ex-Situ Electron Microscopy and Spectroscopy Investigation of Capacity Fade Mechanisms of Rechargeable Li-S Batteries
Authors: Oleshko VP , Scordilis-Kelley C , Xiao A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
TEM Study of Pt Cluster Incorporated Zeolite A
Authors: Shi Y , Wang F , Qian J , Yang H , Ding L , Li P , Ng S , Chen J , Malac M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
TEM and Atom Probe Tomography Characterization of High TMR MgO-Based Magnetic Tunnel Junctions
Authors: Rice PM , Yang S-H , Parkin SSP , Marquis EA , Prosa TJ , Larson DJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Single-Molecule Electron Transfer Reaction in Nanomaterials
Authors: Hu D , Lei C , Ackerman EJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microstructural Characterization of CdTe and CIGS Thin Film Solar Cells by Analytical Transmission Electron Microscopy
Authors: Sharma U , Susnitzky D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative HAADF Imaging of Crystals Containing Heavy Elements: A Comparison with Theory
Authors: LeBeau J , Findlay S , Wang X , Jacobson A , Allen L , Stemmer S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Detection of Arsenic Dopant Atoms in Silicon Crystal by Aberration Corrected Scanning Transmission Electron Microscope
Authors: Oshima Y , Hashimoto Y , Sawada H , Hashikawa N , Asayama K , Kondo Y , Tanishiro Y , Takayanagi K
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Surface Dynamics of the Initial Oxidation Behavior of CuNi Alloys Studied by in-situ TEM
Authors: Li Z , Sun L , Ziemak S , Yang J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Element Distribution in Novel Hedgehog-Like Magnetic Nanostructures Studied by, Cs-Corrected STEM-EELS and Uncorrected STEM-XEDS Using SDD-Technology
Authors: Falke M , Mogilatenko A , Neumann W , Brombacher C , Rohrmann H , Kratzer M , Albrecht M , Bleloch AL , Terborg R , Kroemer R , Rohde M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
XEDS with SDD-Technology in Scanning Transmission Electron Microscopy
Authors: Falke M , Mogilatenko A , Kirmse H , Neumann W , Brombacher C , Albrecht M , Bleloch AL , Tränkle G , Käppel A , Terborg R , Kroemer R , Rohde M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Fourier Analysis of Ronchigram and Aberration Assessment
Authors: Ishizuka K , Kimoto K , Bando Y
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Structural and Morphological Characterization of Catalytically-Active Co3O4 Powders
Authors: Prikhodko S , Chen L , Kodambaka S , Richards R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Diffuse Scattering Study of Perovskite Thin Films
Authors: Pacaud J , Pailloux F
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative Analysis of Point Defects in an Ideal Quasicrystal by Aberration-Corrected Z-Contrast STEM
Authors: Abe E , Seki T , Pennycook SJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Low-Energy Secondary Electron Filtering with Immersion Lens SEM
Authors: Young R , Bosch E , Uncovsky M , Tuma L
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Pottery Making Begins in the New World: First Results from Barbados
Authors: Pocock M , Smith F , Trofimova O , Kelley M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Automated Crystal Orientation and Phase Mapping of Iron Oxide Nano-Crystals in a Transmission Electron Microscope
Authors: Rouvimov S , Rauch EF , Moeck P , Nicolopoulos S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Simultaneous Red/Green Dual Fluorescence Detection of Both the Nuclear and Nucleolar Compartments of Live Cells
Authors: Coleman J , Li Z , Shen D , Gatica D , Patton W
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Use of Transmission Electron Microscopy – What are the Real Capabilities and When can I use it?
Authors: Ringnalda J , Scholes G
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In situ EELS Study of the Thermochromic Transition in VO2
Authors: Ochoa-Lara MT , Esparza-Ponce HE , Espinosa-Magaña F
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Field Evaporation of Octadecanethiol
Authors: Prosa TJ , Keeney S Kostrna , Kelly TF
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Single Atom Detection by XEDS in the Aberration Corrected AEM: Is it Feasible?,
Authors: Zaluzec NJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Investigation of Cathodoluminescence of Hydrated Fluorescent Stained Platelets Using an SEM
Authors: Erdman N , Nielsen C , Ackerley C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Microscopy and Spectroscopy of Au-coated Carbon Nanotubes for Electron Field Emission Applications
Authors: Green JM , Jiao J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atmospheric Electron Microscope: Limits of Observable Depth
Authors: Suga M , Nishiyama H , Ebihara T , Ogura T , Sato C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of Oxide Nano-clusters in Mechanically Alloyed Nickel Alloys
Authors: Bentley J , Hoelzer DT
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Novel Operation Mode for Eliminating Influence of Inclination Angle and Friction in Atomic Force Microscopy
Authors: Fei W , Yueyu W , Faquan Z , Xuezeng Z
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Calculating the Detector Solid Angle in X-ray Energy Dispersive Spectroscopy
Authors: Zaluzec NJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Elemental Chemical Composition, Size and Morphological Characterization of Individual Atmospheric Particles Within an Air Quality Program
Authors: Ramirez-Leal R , Esparza-Ponce HE , Varela-Sortillón A , Astorga-Reyes A , Roman-B A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Application of Electron Tomography on DRAM Structures
Authors: Wang S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Reconstruction of Atomic Columns in Silicon by Electron Diffractive Imaging
Authors: Morishita S , Yamasaki J , Nakamura K , Kato T , Tanaka N
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
High and Low Beam Energy Imaging: Complementarity in a Monochromated XHR SEM
Authors: Roussel LY , Gestmann I , Darus M , Morrissey F , Stokes DJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atomic Scale Compositions Across DyScO3/SrTiO3 Interfaces
Authors: Luysberg M , Heidelmann M , Houben L , Boese M , Heeg T , Röckerath M , Schubert J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Prospects for Single Standard Quantitative Analysis with SDD
Authors: Statham P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Holography of Hetero-Interfaces in Solid Oxide Fuel Cells
Authors: Tanji T , Mizuno S , Kato T , Hirayama T
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Ultrastructural Study of the Aphanius dispar (Rüppell 1828) (Pisces: Cyprinodontidae) liver
Authors: Ba-Omar T , Al-Amri M , Victor R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Microscopic Studies with Graphene
Authors: Meyer J , Chuvilin A , Kaiser U
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microtomography Versus Optical Microscopy in the Examination of Interior Features in Ice
Authors: Obbard R , Baker I
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Development of Protocols Suitable for Atomic-Scale Imaging of Catalyst Clusters at Catalytic Temperatures
Authors: Germinario L , Allard LF
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative Femtosecond Laser Atom Probe Analysis of Rare Earth Magnets
Authors: Ohkubo T , Chen Y , Nogiwa K , Nishimura A , Hono K
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
EELS Analysis of Radiation Induced Structural Transformations in Fluoride Compounds
Authors: Rao KS , Cosandey F , Amatucci GG
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Misorientation Gradients by EBSD in Hot and Cold Deformed Alloys
Authors: Zhai T , Jiang X , Jianhui X , Qiang Z , Wei W
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microstructure Evolution During Creep and Annealing of Minerals and Rocks
Authors: Mariani E , Prior DJ , Covey-Crump SJ , Mecklenburgh J , Tatham D , Wheeler J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Accessing Subcellular Structural Information with Advanced Targeting and Sectioning Techniques
Authors: Leis A , Rigort A , Baumeister W , Plitzko JM
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microscopy of Oxide Nanoparticles for Energy Applications
Authors: Basu J , Bhowmick S , Winterstein JP , Wang C , Xue Y , Carter CB
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Metal Nanostructures on Ceramic Surfaces for Energy Applications
Authors: Basu J , Bhowmick S , Winterstein JP , Ravishankar N , Carter CB
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Kidney Structure and Function
Authors: Gattone V
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Detection of Dentin Matrix Protein 1 and Osteopontin in Tertiary Dentine During Experimental Extrusion in Rat Incisors Revealed by Immunocytochemistry
Authors: Aguiar MC , Arana-Chavez VE
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A STEM Parallel Diffraction Technique Applied to Nanomaterials
Authors: Ganesh KJ , Kawasaki M , Zhou JP , Ferreira PJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-situ TEM Study of Thin-film Vanadium Oxide Stability
Authors: Gauntt BD , Dickey EC
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Magnetic Iron-Cobalt Silicide Nanowires on Si(110) Surface
Authors: Ohira Y , Tanji T
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microscopy of High Chloride Primary Froth: Non-mixing of emulsified water
Authors: Elliott GRD , Munoz VA , Mikula RJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of Interfacial Misfit Array Formation for GaSb Growth on GaAs by Transmission Electron Microscopy
Authors: Huang S , Balakrishnan G , Huffaker D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Correlating Pathogen Behavior with Host Responses during PathogenInvasion on the SingleCell Level via Innovative Fluorescence Microscopy
Authors: Bobard A , Ray K , Ehsani S , Enninga J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
How Much EDS Resolution Do I Need?
Authors: Bulloss NA
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Latest Developments in Todays TEM Camera Systems
Authors: Wickersham J , Krieger J , Huelk C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative Characterisation of Surface and Interface Chemistry with X-ray Photoelectron Spectroscopy (XPS)
Authors: Nunney TS , Mustonen O , White RG
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ TEM Characterization of Nucleation and Growth of Nanopatterned Oxides
Authors: Yan A , Sun T , Dravid VP
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Development of a Fast CCD Camera for Electron Diffraction Imaging in Conventional TEM
Authors: Mollon B , Pan M , Jia Y , Mooney P , Sha T
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Extracellular Matrix of Cartilage and Meniscus by ESEM and Immunogold Labeling
Authors: Nelea M , Chevrier A , Gigout A , Changoor A , Buschmann M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Comparison of SiLi and SDD Detectors for Pharmaceutical Applications
Authors: Carlton R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Position Averaged Convergent Beam Electron Diffraction
Authors: LeBeau J , Findlay S , Allen L , Stemmer S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Metallurgy of the Monitor
Authors: Nordgren E , Secord E
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
FIB Sample Preparation of Thin Films and Soft Materials
Authors: Minor A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative Li Mapping in Al alloys by Sub-eV Resolution Energy-Filtering Transmission Electron Microscopy (EFTEM) in the Aberration-Corrected, Monochromated TEAM0.5 Instrument
Authors: Rossell M , Watanabe M , Erni R , Radmilovic V , Dahmen U
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Automated Methods for Profiling the Axonal Transport of Secretory BDNF Granules in Live Cultured Neurons from Time-lapse Microscopy Data
Authors: Mukherjee A , Cohen A , Roysam B , Jenkins B , Fang C , Petrie S Kaech , Banker G
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Analysis of Minerals Using Linearly Polarized Infrared Microspectroscopy
Authors: Weinger BA , Leary PE , Reffner JA
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Complementary Analytical TEM Analysis of Perpendicular Recording Media
Authors: Park S , Nuhfer NT , Laughlin DE , Zhu J-G
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Annular Dark Field Imaging of Catalyst Nanoparticles in Single Shot Dynamic Transmission Electron Microscopy
Authors: Masiel D , Reed B , LaGrange T , Browning ND
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Elevation Resolved Elemental Mapping with SEM/EDS
Authors: Konopka J , Betts M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Functionalization of a Single TiO2 Nanotube for Bio Sensor Applications
Authors: Cha D , Lee M , Shin H , Kim MJ , Kim J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Focused Ion Beam as a Direct-write Mask Tool for Patterning Diamond
Authors: McKenzie W , Pethica J , Cross G
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Behavior of Au Species in Au/FeOx Catalysts as a Result of In-Situ Thermal Treatments, Characterized via Aberration-Corrected STEM Imaging
Authors: Allard LF , Borisevich AY , Deng W , Si R , Flytzani-Stephanopoulos M , Overbury S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
One Year On: New and Unique Applications of He Ion Microscopy
Authors: Bell DC , Erdman N , Jepson MA , Rodenburg C , Inkson BJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microscopic Investigation of the Morphology of Various Photocatalytic Active Nanostructures
Authors: Murafa N , Stengl V , Šubrt J , Bakardjieva S , Houšková V
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characterization of Tablets with Defects Related to Material Sticking to Punch Faces During Pharmaceutical Manufacturing
Authors: Vogt A , Neilly J , Dziki W
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Polarization Field Mapping of AlGaN/GaN HEMT Devices using Lorentz-mode Electron Holography
Authors: Cullen DA , Smith DJ , Fejes PL , McCartney MR
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Strategies for Visualization of Extracellular Polymeric Substances, (ExPS) in Biofilms by Electron Microscopy
Authors: Dohnalkova AC , Arey BW , Williams K , Marshall MJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Study of Compositional Gradients Across the γ/γ Interface in Ni-base Superalloys Using 3D Atom Probe Tomography
Authors: Hwang JY , Nag S , Singh ARP , Viswanathan GB , Tiley J , Srinivasan R , Fraser HL , Banerjee R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Investigation of Nanostructure and Photocatalytic Stability of Mesoporous CuCrO2 Delafossite using Analytical Electron Microscopy
Authors: Chi M , Zhang P , McFarland E
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative Evaluation of Metallographic Preparation Quality using EBSD
Authors: Pinard PT , Hovington P , Lagacé M , Lucas GM , Voort GF Vander , Gauvin R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Plastic Section and Cryo-Electron Tomography Using the IMOD Software Package
Authors: Nicastro D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Application of Dual Beam FIB to the Metrology of Nanostructured Photovoltaic Devices
Authors: McMahon G , Rybczynski J , Wang Y , Gao Y , Argenti N , Kempa K , Ren ZF , Naughton MJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Hyperspectral Confocal Fluorescence Microscope: A New Look into the Cell
Authors: Pedroso MC , Sinclair MB , Jones HDT , Haaland DM
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Surface Morphology and Microstructure of Ag ion-implanted Pyrolytic Carbon
Authors: Chen YB , Zhou RS , Li KD , Wei QM , Wang LM
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
High Resolution Microscopy Analysis of a New Precipitate Phase in the High-Temperature Shape Memory Alloy Ni30Pt20Ti50
Authors: Kovarik L , Yang F , Noebe RD , Mills MJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Gun Shot Residue Analysis and Distinguishing the Formation of GSR from Environmental Particles
Authors: Sarvas I , Kobus H , Green L , Kotula PG , Wuhrer R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Monodispersed Spindle-like Particles of Titania
Authors: Murafa N , Stengl V , Houšková V
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Warfare Agents Degradation on Zirconium Doped Titania
Authors: Stengl V , Bakardjieva S , Murafa N , Opluštil F , Österlund L , Mattsson A , Andersson PO
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Correlative Light/Electron Microscopy: a Tool for Investigating Infectious Diseases
Authors: Sartori A , Mallet A , Veiga E , Bonazzi M , Mostowy S , Dortet L , Baumeister W , Cossart P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Characteristics of Secondary Electron Images From In-lens and Conventional Everhart-Thornley Detectors - Evidence for the Energy-based Differentiation of High Resolution SE1 and Delocalized SE2 Signals
Authors: Griffin BJ , Joy DC , Michael JR
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atom-probe Tomography of Surface Oxides in a 20% Cold Worked Stainless Steel Tested Under PWR Primary Water Conditions
Authors: Lozano-Perez S , Saxey DW , Marquis EA , Terachi T , Yamada T
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atomic Resolution STEM and EELS Studies of Interfaces of Model Gold-Titanium Dioxide (Au-TiO2) Catalysts
Authors: Sivaramakrishnan S , Wen J-G , Pierce B , Scarpelli M , Zuo J-M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ Fracture of Silicon Nanoparticles
Authors: Nowak JD , Beaber AR , Ugurlu O , Gerberich WW , Warren OL
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Mapping Polarization Fields in Al0.85In0.15N/AlN/GaN Heterostructures
Authors: Zhou L , Cullen DA , Smith DJ , Mouti A , Gonschorek M , Feltin E , Carlin JF , Grandjean N , McCartney MR
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microanalysis Data Formats: Are We Even Asking the Right Questions?
Authors: Scott JH , Ritchie N
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Synthesis and Characterization of Nano-pyramid Decorated ZnO Nanowires
Authors: Tang D , Allard LF , Liu J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The Efficiency of in-situ Cleaning Methods for Minimizing Electron Beam Induced Contamination
Authors: Parvaneh H , Demers H , Lifshin E
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Study of Quantum Dots Labeled Trypanosoma cruzi - Rhodnius prolixus Interaction by Real Time Confocal Images
Authors: Thomaz AA de , Almeida DB , Fontes A , Stahl C , Santos-Mallet J , Gomes S , Feder D , Cesar CL
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Direct Observation of Nanoscale Phase Separation in La1-xCaxMnO3 Using Scanning Electron Nanodiffraction
Authors: Tao J , Niebieskikwiat D , Varela M , Luo W , Schofield M , Zhu Y , Salamon MB , Pantelides ST , Zuo J-M , Pennycook SJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Synthesis of Cu and CuOx Nanowires via Reduction of CuO Nanowires
Authors: Lowes WC , Liu J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Impurity Measurments in Polycrystallline Material with Atom Probe Tomography
Authors: Ronsheim P , Hatzistergos M , Flaitz P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A Microstructual Study of Architecturally-Controlled Pt-Ru Core/Shell and Alloy Nanoparticles
Authors: Alayoglu S , Lai L-C , Chiou W-A , Eichhorn B
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Aberration Correction in Energy Loss Spectrometers and Monochromators
Authors: Krivanek O , Ursin J , Corbin GJ , Dellby N , Murfitt M , Own C , Szilagyi Z
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A Reassessment of the Role of Membranes in the TMV Replication Complex
Authors: Berg RH , Soto-Aguilar M , Beachy RN
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Nails and Rivets: Pre-Nineteenth Century
Authors: Hineman MA , Schmidt F
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Nanoscale Microstructure in a Titanium Aluminide Alloy
Authors: Gerstl S , Reinhard D , Larson DJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Grain Boundary Chemistry Before and After Ion Implantation in ODS Steels
Authors: Marquis EA , Lozano-Perez S , Castro V de
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Fast Multislice Simulation of Scanning Transmission Electron Microscope Images
Authors: Dwyer C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Design and Validation of a Low Cost Microscope for Diagnostics in the Developing World
Authors: Cline B , Kuhlmann K , Luo R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
The 3-D Pore Structure of Pd Nanoparticles as a Function of Temperature
Authors: Klein M , Ong M , Jacobs B , Robinson D , Fares S , Arslan I
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Scanning Electron Microscopy and Analysis of Moist, Wet and Liquid Specimens
Authors: Echlin P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Scanning Confocal Electron Microscopy in a FEI Double Corrected Titan3 TEM/STEM
Authors: Zaluzec NJ , Weyland M , Etheridge J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Plasma Cleaning Applications for Surface Science and Model Catalyst Samples
Authors: Zemlyanov D , Fingland B , Wei A , Durbin S , Ribeiro F
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Energy Loss Spectroscopy of Graphene Identified by Aberration, Corrected TEM at 300kV
Authors: Abe Y , Tanaka T , Sawada H , Okunishi E , Kondo Y , Tanishiro Y , Takayanagi K
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Irradiation-Induced Amorphous Structures Studied by Electron Diffraction Radial Distribution Function Analysis
Authors: Ishimaru M , Naito M , Hirata A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atom Probe Tomography Studies of GaN-Based Semiconductor Materials
Authors: Bennett SE , Oliver RA , Saxey DW , Cerezo A , Clifton PH , Ulfig R , Kappers MJ , Humphreys CJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ TEM Characterization of the Effect of Interfaces on Charge Transport in Cu(In,Ga)Se2 Thin Film Solar Cells
Authors: Östberg G , Yucelen E , Svensson K , Olsson E
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron Microscopy Characterization of Fe-Ga and Fe-Si-B Fine Particles
Authors: Solomon VC , Smith DJ , Hong J-I , Berkowitz AE
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ Synthesis of PtSn/C Fuel Cell Nanocatalysts in Aberration-Corrected TEM/STEM
Authors: Liu J , Braddock-Wilking J , Allard LF
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Investigation of 6T@SWCNT by Cs-Corrected Transmission Electron Microscopy
Authors: Bártová B , Lazar S , Botton GA , Milko M , Hébert C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
EELS and EDS Compositional Imaging of B4C Nanostructures Synthesized by a Solid-Liquid-Solid Method
Authors: Al-Sharab JF , Gupta V , Bentley J , Chhowalla M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A Novel Time-Resolved Fluorescence Microscope System Extended from the Deep UV-Visible to NIR (240nm - 1700nm)
Authors: Chandler L
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Solving the Micro to Macro Problem: A New Application for Milli X-ray Fluorescence X-ray Spectrum Imaging
Authors: Davis JM , Newbury DE , Ritchie N , Vicenzi EP
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Atom Probe Tomography of Radiation-Induced Precipitation in Ferritic-Martensitic Alloy HCM12A
Authors: Jiao Z , Penisten J , Was G , Martens R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
3-D TEM Reconstructions with EMAN2
Authors: Ludtke S , Tang G , Woolford D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Sensitivity And Quantitativity In Atom Probe Tomography
Authors: Danoix F , Bostel A , Leitner A , Jessner P , Sauvage X , Gouné M , Danoix R
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Extending the Limits of Single Particle Reconstruction
Authors: Ludtke S , Schmid M , Chiu W
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Signal to Noise Ratio Mapping for Cryo-Electron Tomography
Authors: Renken C
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Imaging ZnO Nanobelts and Nanobelt Supported Metal Nanocatalysts by Aberration-corrected Scanning Transmission Electron Microscopy
Authors: Liu J , Allard LF
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A System for Simulation of Tip Evolution Under Field Evaporation
Authors: Geiser BP , Larson DJ , Gerstl S , Reinhard D , Kelly TF , Prosa TJ , Olson D
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Image Processing and Interpretation in Structural Electron Microscopy
Authors: Heymann B
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ Tensile Observation of Deformation Twin in TWIP Steel Using TEM
Authors: Baik S-I , Ahn T-Y , Hong W-P , Jung Y-S , Lee Y-K , Kim Y-W
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Fibronectin Absorbed onto TiN-coated and Uncoated Titanium Alloy Implants Enhances Osseointegration in the Rat Femur.
Authors: Weiss A , Sovak G , Gotman I
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ Observation of Au/TiO2 Catalyst in Oxygen-Gas Environments
Authors: Tanaka T , Sano K , Ando M , Sawada H , Hosokawa F , Okunishi E , Kondo Y , Tanishiro Y , Takayanagi K
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A Noise-Tolerant Method for Measuring MTF from Found-Object Edges in a TEM
Authors: Mooney PE
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Damage Correlation between in situ Ion Irradiation and Neutron Irradiation in Molybdenum
Authors: Kirk MA , Li M , Baldo P
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Nanomilling for Aberration – Corrected TEM and HAADF STEM
Authors: Cerchiara RR , Fischione PE , Liu J , Matesa JM , Robins AC , Fraser HL , Genc A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ Orientation Imaging of Recrystallization and Grain Growth in OFHC Copper
Authors: Nowell MM , Wright SI , Carpenter JO
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Observation of Cluster Formation from MgO-supported Mononuclear Ir-Complexes by Aberration-Corrected STEM
Authors: Ortalan V , Uzun A , Allard LF , Iddir H , Gates BC , Browning ND
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM
Authors: Kabius B , Hartel P , Haider M , Müller H , Uhlemann S , Loebau U , Zach J
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitative TEM Tensile Testing on 1D Nano-structural Materials
Authors: Shan ZW , Oh J , Minor A , Asif SAS , Warren OL
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars
Authors: Mara N , Bhattacharyya D , Dickerson P , Hoagland R , Misra A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantification of Interfacial Roughness of In2O3/ZrO2 Superlattice Films in 3D
Authors: Zhong X , Kabius B , Schreiber D , Eastman J , Fong D , Petford-Long A
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Damage Layers in Si vs. Ion Dose during 30 keV FIB Milling
Authors: Rubanov S
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Practical Determination of Spatial Resolution in Atom Probe Tomography
Authors: Kelly TF , Voelkl E , Geiser BP
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Advanced Detector Development for Electron Microscopy Enables New Insight into the Study of the Virus Life Cycle in Cells and Alzheimers Disease
Authors: Milazzo A-C , Lanman J , Bouwer JC , Jin L , Peltier ST , Johnson JE , Kleinfelder S , Xuong N-H , Ellisman MH
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Assessment of SEM Image Quality using 1D Power Spectral Density Estimation
Authors: Moody SJ , Phillips MR , Toth M
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
HRTEM Study of Lithographically Defined Silicon Nanowires
Authors: Floresca HC , Trivedi K , Kang SJ , Hu W , Kim MJ
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Synthesis and Characterization of Vanadium-Strontium Apatite Type Structures
Authors: Bucio L , Pazos A Tapia
Published: July 2009

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009