bluuebunny/crossref_metadata_2025 huggingface dataset:
Ecuador: Análisis comparativo de las exportaciones de banano orgánico y convencional e incidencia en la Balanza Comercial, 2018
Authors: León Serrano Lady Andrea , Arcaya Sisalima María Fernanda , Barbotó Velásquez Nicole Alexandra , Bermeo Pineda Yomira Lilibeth
Published: December 2020

Siendo Ecuador uno de los mayores productores de banano a nivel mundial, ha logrado colocar la fruta en diferentes mercados internacionales, los ingresos generados cubren un porcentaje destacado del Producto Interno Bruto, creando fuentes de empleos y una significancia económica del sector primario. Ante esto, la investigación tiene el objetivo de realizar un análisis comparativo de las exportaciones de banano orgánico y convencional, y su incidencia en la balanza comercial de Ecuador, 2018. El método utilizado se basa en la aplicación de modelación econométrica, con datos obtenidos del Banco Central del Ecuador. Con éstos valores proporcionados, se permitió observar el comportamiento de una dinámica comercial moderada, los resultados demuestran comparativamente que los dos semestres del año 2018 tienen movimientos diferentes de crecimiento y decrecimiento, la aplicación de la Regresión junto al coeficiente de determinación demuestra que las exportaciones inciden en la Balanza Comercial incorporando más factores. Las principales conclusiones deducen que la comercialización de la fruta de banano seguirá siendo uno de los principales rubros de ingresos, la Balanza Comercial sigue siendo deficitaria por el mayor número de importaciones de otros productos que superan la entrada de divisas, sin embargo, las exportaciones con el tiempo generan balances que permiten aprovechar las ventajas comparativas y competitivas.
旅游文化传播对旅游经济及景区形象提升的影响研究
Authors: 管 敏
Published: December 2020

随着中国经济的快速发展，国家越来越重视旅游文化传播对经济以及景区形象提升的作用。为了进一步提升旅游文化传播价值，需要依据实际情况明确其对旅游经济的影响性作用，创新文化传播手段，开展多样化的管理活动，形成高效的管理需求价值。因此，论文主要针对旅游文化传播对旅游经济及景区形象提升的影响进行简要分析，并提出合理化建议。
西夏壁画中的人物艺术分析
Authors: 秦 婧雯 , 陆 文军
Published: December 2020

党项族原居中国四川松潘高原，先后臣服于唐、五代与宋，后在1038年立国为夏国。由于北宋收回了夏州的管理权，党项族被迫向河西走廊迁徙，党项社会完成了由氏族公社所有制向封建所有制的转化时期。中国游牧民族具有悠久的绘画艺术传统，其历史最早可以追溯到旧石器时代的岩画创作。随着社会生产力的进步与统治者对权力的向往，墓室壁画在艺术的舞台上大放光彩，接着佛教的传入，统治阶级更加青睐以此为教化手段。榆林窟、黑水城遗址、莫高窟等佛教洞窟以此世代修砌而成，其中西夏壁画是这繁重历史的一抹奇异瑰宝。
Identification of Leverage Points in Principal Component Regression and r-k Class Estimators with AR(1) Error Structure
Authors: Söküt Tuğba
Published: December 2020

The determination of leverage observations have been frequently investigated through ordinary least squares and some biased estimators proposed under the multicollinearity problem in the linear regression models. Recently, the identification of leverage and influential observations have been also popular on the general linear regression models with correlated error structure. This paper proposes a new projection matrix and a new quasiprojection matrix to determination of leverage observations for principal component regression and r-k class estimators, respectively, in general linear regression model with first-order autoregressive error structure. Some useful properties of these matrices are presented. Leverage observations obtained by generalized least squares and ridge regression estimators available in the literature have been compared with proposed principal component regression and r-k class estimators over a simulation study and a numerical example. In the literature, the first leverage is considered separately due to the first-order autoregressive error structure. Therefore, the behaviours of first leverages obtained by principal component regression and r-k class estimators has been also investigated according to the autocorrelation coefficient and biasing parameter through applications. The results showed that the leverage of the first observation obtained by principal component regression and r-k estimators is smaller than that obtained by generalized least squares and ridge regression estimators. In addition, as the autocorrelation coefficient goes to -1, the leverage of the first transformed observation decreases for PCR and r-k class estimators, while its increases while the autocorrelation coefficient goes to 1.
A formação humana entre o currículo e a prática do professor do ensino médio integrado
Authors: Medeiros Lílian Gobbi Dutra , Alberto Márcia de Souza Oliveira Paes Leme , Santiago Léia Adriana da Silva
Published: December 2020

Os Institutos Federais oferecem educação profissional e tecnológica e têm o ensino técnico de nível médio como um de seus objetivos, devendo ser ofertado prioritariamente na modalidade integral – ensino médio integrado. Sob a ótica da formação humana integral, omnilateral e politécnica, em que embasamos esse estudo, o ensino médio integrado deve ocupar um papel de transposição para uma formação ampla dos sujeitos, no sentido da escola unitária de Gramsci. Nesse sentido, este estudo busca perceber como se dá a formação humana integral no currículo dos cursos técnicos integrados ao ensino médio de um campus do Instituto Federal do Triângulo Mineiro e na prática docente, com foco nas áreas de Literatura e História. A pesquisa é de abordagem qualitativa, do tipo exploratório. Utilizamos pesquisa bibliográfica e documental, com a análise de dois Projetos Pedagógicos de Cursos, além da aplicação de questionário aberto a professores de Literatura e História. Os dados coletados por meio do questionário foram analisados pela análise de conteúdo de Bardin. Os documentos indicam um progresso, mostrando uma crescente preocupação com a formação humana integral, omnilateral e politécnica dos sujeitos, para o exercício da cidadania e das diversas funções do mundo do trabalho. Os depoimentos dos professores apontam para uma prática preocupada com a utilização de temas, abordagens e processos metodológicos que contribuam com a formação humana integral, apesar de nos parecer um resultado de práticas mais isoladas.
PENGEMBANGAN MEDIA PEMBELAJARAN INTERAKTIF FLIP BOOK MENGGUNAKAN KVISOFT FLIP BOOK MAKER BERBASIS SENI BUDAYA LOKAL
Authors: Putri Reni Ariska , Uchtiawati Sri , Fauziyah Nur
Published: December 2020

Pengembangan media pembelajaran interaktif flip book menggunakan kvisoft flip book maker berbasis seni budaya lokal adalah salah satu cara dalam memanfaatkan tekonologi pendidikan berupa software kvisoft flip book maker yang dipadukan dengan seni budaya lokal dan dihasilkan suatu produk pengembangan berupa media pembelajaran matematika flip book. Tujuan dalam penelitian ini untuk mengetahui proses pengembangan media pembelajaran flip book dan efektifitas media pembelajaran flip book dalam proses pembelajaran di kelas. Subjek dalam penelitian ini adalah 30 orang peserta didik yang terdiri dari 16 laki-laki dan 14 perempuan kelas VII sekolah menengah pertama di Indonesia. Model pengembangan dalam penelitian ini menggunakan model 4D yang terdiri dari tahapan define, design, develop, dan disseminate. Proses pengembangan dalam penelitian ini dimulai dari tahap define dengan melakukan analisis awal akhir, analisis peserta didik, analisis tugas, analisis konsep, dan spesifikasi tujuan pembelajaran; tahapan selanjutnya adalah tahap design dengan melakukan penyusunan tes acuan patokan, pemilihan media, pemilihat format, dan rancangan awal media; tahapan selanjutnya adalah tahap develop dengan melakukan validasi ahli dan uji pengembangan; dan tahapan terakhir adalah tahap disseminate dengan melakukan pengemasan media dan penyebaran media pada lingkup sekolah yang sama dengan kelas yang berbeda. Pengembangan media pembelajaran flip book ini dapat menjadi alternatif pilihan dalam penggunaan media pembelajaran matematika, khususnya pada materi aritmatika sosial.
La traducción del teatro áureo en Italia, desde el siglo XIX hasta nuestros días
Constantes y variables en la formación de un canon
Authors: Antonucci Fausta
Published: December 2020

This essay aims to provide an overview of the Italian translations of Spanish Golden Age theatre from the 19th century to the present, identifying above all the differences in the approach to Spanish texts compared to previous centuries and the distinctive features of each historical-cultural period within this long span of time. Romantic translations (a period marked by the great collections of theatrical texts by Monti and La Cecilia) were characterised by their marked preference for religious and honour-based dramas and for the works of Calderón; while the 20th century saw a general reworking of the corpus of translated texts, with a stable presence of Calderón and the recovery of the dramas on peasant honour by Lope de Vega. The emergence and affirmation of the poetic translation is highlighted, from the early experiments of the 1920s to the general acceptance of our days, and the role hispanists and writers played in this choice. An analysis of the corpus of translation collections in the 20th and 21st centuries, as well as of the many individual translations, also shows how the canon of the Spanish Golden Age theatre has changed both on the academic and editorial side.
Los vaivenes del canon Traducción y puesta en escena de la comedia áurea en Rusia
Authors: Ryjik Veronika
Published: December 2020

This chapter surveys the history of Russian translations of Golden Age Spanish theatre from the early 18th century until now, with a special focus on the relationship between translation trends and performance history. Our main goal is not only to document all known Russian translations of Spanish classical plays completed in the past 300 years, but also to elucidate the processes by which translation took part in the development and transformation of a specifically Russiancomediacanon.
Le trappole della testimonianza
La rappresentazione dei rifugiati in Consigli per essere un bravo immigrato di Elvira Mujčić, La frontiera di Alessandro Leogrande e le antologie di Refugee Tales
Authors: De Capitani Lucio , Sbrojavacca Elena
Published: December 2020

In the wake of the so-called refugee crisis, the ethical imperative to write about the predicament of refugees has become hard to ignore. However, many representational pitfalls are involved in this process. Can refugees relate their story in a way that does not trap them into the role of victims? Can authors that choose to tell these stories avoid appropriating these experiences? This article tackles these issues in a comparative fashion, taking its case studies and theoretical insights from both the Italian and British cultural context, focusing on Elvira Mujčić’s Consigli per essere un bravo immigrato, Alessandro Leogrande’s La frontiera, and the short stories collections Refugee Tales.
Franco Marucci. History of English Literature. From the Late Inter-War Years to 2010 (Volume 8, Books 1 and 2)
Authors: Tomaiuolo Saverio
Published: December 2020

Review of Marucci, F. (2019). History of English Literature. From the Late Inter-War Years to 2010 (Volume 8, Book 1). Transl. from the Italian by A. Gillan. Bern: Peter Lang, pp. 674. | Marucci, F. (2019). History of English Literature. From the Late Inter-War Years to 2010 (Volume 8, Book 2). Transl. from the Italian by C. Durkan and D. Gailor. Bern: Peter Lang, pp. 746.
Honorific Inscription from Delos for the Athlete Menodoros
Authors: Bianchi Irene
Published: December 2020

In the early years of the 20th century, a base was found at Delos, celebrating the pancratiast and wrestler Menodoros son of Gnaios, together with a marble slab providing thirty-six inscribed wreaths. A reconstruction of the base is provided, combined with an analysis of the text of the inscriptions (I.Délos 1957 and 2498), based on recent studies. The Delian monument, which can be dated to the years 120-110 BC, stands out for the variety of agons it records: in some cases, it is one of the oldest attestations. A brief survey of these particular agons is provided.
Neither Literature nor Object: Children’s Writings in the Digital Public Realm
Authors: Simpson Kathryn , Burke Lois
Published: December 2020

The interpretation of children’s writings has often presented a particular challenge to Galleries, Libraries, Archives and Museums (GLAM), as the represented child has historically been deprived of agency, and children’s writings are neither ‘literature’ nor traditional display objects. In this article we will explore the methodologies of representation that are associated with the merging of children’s history and digital humanities. We will lay out an approach for digitally representing children’s writings held in museums. We will demonstrate the possibilities that have been put forward by librarians, archivists and curators internationally, and explore the tools and approaches that have emerged from the field of digital humanities for re-presenting the agency of the child creator and the child visitor within memory institutions. Moreover, in this article we will propose that the digital environment facilitates a critical site of experimentation in displaying children’s collections that allow creator, object, context, critique, and visitor to be equally valued.
PENGARUH KEPUASAN PEMAKAI DAN KOMPLEKSITAS SISTEM AKUNTANSI TERHADAP PENGEMBANGAN SISTEM INFORMASI (STUDI DI ORGANISASI PERANGKAT DAERAH PEMERINTAHAN PROVINSI NTB)
Authors: Ulfa Baiq Adriani
Published: December 2020

Tujuan penelitian ini adalah untuk mengetahui pengaruh kepuasan pengguna dan kompleksitas sistem akuntansi pada pengembangan sistem informasi pada satuan kerja perangkat daerah (OPD) Barat Provinsi Nusa Tenggara. Penelitian ini tergolong penelitian kuantitatif. Penelitian ini menggunakan data primer yang diperoleh dari penyebaran kuesioner kepada responden. Populasi dalam penelitian ini adalah pegawai pelaksana sistem akuntansi/ administrasi keuangan di OPD. Dengan menggunakan purposive sampling Teknik penelitian diperoleh 94 responden sebagai sampel penelitian yang terdiri dari bendahara pengeluaran dan bendahara barang pada 48 OPD. Hasil dari Penelitian berdasarkan Partial Least Square (PLS) menunjukkan bahwa kepuasan pengguna mempengaruhi perkembangan sistem informasi, yang akan meningkat produktivitas, efisiensi, dan ketepatan dalam menggunakan sistem. Selain itu, Variabel kompleksitas sistem akuntansi juga mempengaruhi perkembangan sistem informasi, yang akan meningkatkan kinerja dan produksi karyawan informasi yang akurat.
Analisis Penerapan Fungsi Manajemen Bagian Rekam Medis Di Puskesmas Dompu Kota 2019
Authors: Mulyati Mulyati
Published: December 2020

Penelitian ini merupakan penelitian deskriptif kualitatif, dengan studi kasus pada istansi Puskesmas Dompu Kota dengan judul “Analisis Penerapan Fungsi Manajemen Bagian Rekam Medis Di Puskesmas Dompu Kota 2019”. Dengan tujuan Untuk mengetahui penerapan fungsi manajemen di rekam medis Puskesmas Dompu Kota, apakah berefek dengan baik dalam menunjang Standar rekam medis serta yang paling penting pada pasien yang datang berkunjung. Alat analisis yang digunakan dalam menilai penerapan fungsi Manajemen di Rekam Medis Puskesmas Dompu Kota adalah  metode data deskriptif, karena penelitian ini  untuk mengetahui bagaimanakah analisis penerapan fungsi manajemen rekam medis Puskesmas Dompu Kota.apakah berefek dengan baik dalam menunjang Standar mutu rekam medis serta yang berefek paling penting pada pasien yang datang berkunjung. Tolak ukur yang digunakan untuk mengetahui apakah fungsi manamen sudah di terapkan dengan baik di Rekam medis Puskesmas Dompu Kota. Maka fungsi manajemen sudah diterapkan tapi tidak dampak efektif pada rekam medis dan staf pegawainya.

Dari hasil analisis yang telah dilakukan dengan menggunakan metode deskriptif dapat disimpulkan bahwa Rekam Medis PuskesmasDompu Kota Dapat disimpulkan bahwa penerapan fungsi manajemen dalam Rekam Medis Puskesmas Dompu Kota belum maksimal tetapi sudah cukup berhasil meskipun keberhasilannya belum merata karena terdapat beberapa faktor yang menghambat. Dalam rekam medis harus dikondisikan dengan anggaran belanja Puskesmas serta konsep strategis sebagai pengantisipasian dari faktor penghambat yang dapat menguras waktu dan tenaga rekam medis seperti staf pegawai rekam medis dan kesehatan lainnya.penerapan fungsi manajemen yang sesuai dengan prosedur serta proses dari tahapan manajemen harus melalui nilai-nilai kedisiplinan dalam administrasi sehingga mutu pelayanan yang di titik beratkan pada rekam medis sebagai pelayanan awal saat pasien berkunjung di Puskesmas Dompu Kota sesuai dengan visi dan misi puskesmas.
ANDROID-BASED EVENT INFORMATION APPLICATION IN THE CITY OF MAKASSAR USING LOCATION BASED SERVICE TECHNOLOGY
Authors: Muh Dziaulhaq Andi Ghalib
Published: December 2020

Android Based Event Information App in Makassar City using Location Based Sevice technology is an application that provides information about event information, especially in the city of Makassar by utilizing the Android platform. This research is based on the background because there are still many people who do not know the information about events that are ongoing or will be held in the city of Makassar. That is due to the lack of information obtained and the lack of a forum to convey information about the spread of events easily. The purpose of this research is to build an event information application to help the public receive event information quickly and easily, to help people find the route to the event they want with the help of Location-Based Service technology with use of the android platform to convey event information so that it can be accessed whenever and wherever they want. This research produces an Android-based Event Information Application that helping people get event information with 70% testing results and making it easier for people to find routes to the event location according to their wishes by using technology Location-Based Service with a percentage of 60% strongly agrees.
Ausentismo escolar en estudiantes asmáticos de una institución educativa de la ciudad de Cali
Authors: Cruz Mosquera Freiser Eceomo , Arango Arango Ana cristina , Gallon Figueroa Ana Lucia , Yela Benavidez Ana Marìa , Franco Castrillón Lorena , Avila Ovalle Ivon , Banguera Montaño Edwar Antonio , Lozano Gomez Katherine , Jimenez Duran Diana Patricia , Moreno Reyes Sandra Patricia
Published: December 2020

Introducción: El asma como una enfermedad crónica inflamatoria de las vías aéreas que  se caracteriza por sibilancias, dificultad respiratoria, opresión torácica y tos, la cual se da principalmente en la noche o en las primeras horas de la mañana. A pesar de los avances diagnósticos y terapéuticos, la prevalencia de esta patología  a nivel mundial sigue en aumento, afectando principalmente la población infantil y adolescente, en las que genera limitaciones en la actividad física diaria, interferencias en el sueño,  ausencias a las jornadas escolares y bajo rendimiento académico. El objetivo del presente estudio fue  determinar la frecuencia de ausentismo escolar en estudiantes asmáticos de una institución educativa de la ciudad de Cali.  
Metodología: Un total de 385 estudiantes de 5 a 14 años fueron incluidos en el estudio, a los cuales se les suministro el cuestionario ISAAC, los cuales fueron diligenciados por los cuidadores. A partir de los datos  obtenidos se realizó el análisis estadístico en el paquete SPSS versión 20.  
Resultados: La prevalencia de asma encontrada fue del 27%, con relación el ausentismo  en este grupo de estudiantes se evidenció que en total 776 días de clases se habían perdido durante el año, con un promedio de 7.5 días  (DE +/- 7) por estudiante. El  45% faltó  de 1-5 veces y un 6% más de 20 veces.
Conclusiones: A partir de los hallazgos se concluye que el asma una enfermedad que puede traer claras repercusiones a nivel escolar.
Sickle cell trait: a cause of abdominal pain and pulmonary embolism
Authors: Saad Emanuel José , Tarditi Barra Ayelén , Monzoni Gabriela , Villegas Carolina , Tabares Aldo Hugo
Published: December 2020

Introduction: Sickle cell trait (SCT) is a rare and underdiagnosed disorder in the Argentinian population. In this condition, individuals carry the mutation of the HbS gene in one of the two beta-globin genes. In general, SCT does not present with the typical manifestations of sickle cell anemia. However, under certain circumstances, some clinical characteristics of the disease may develop. Methods: We discussed the case of a 39-Year old man who presented with persistent abdominal pain of unknown origin after traveling to a high-altitude place. He underwent laparotomy without a definite diagnosis. After that, the patient developed signs of splenic infarction and pulmonary thromboembolism that were confirmed by computed tomography. Results: A sickling test was positive, and a hemoglobin electrophoresis revealed an abnormal fraction at the HbS level. In this context a diagnosis of SCT was made. Additional, tests revealed a strongly positive lupus anticoagulant. Conclusion: SCT presentation as abdominal pain and thromboembolic disease in adult patients after exposure to high altitudes is a rarely suspected diagnosis.
Favorable outcome of SARS-CoV-2 infection in a patient with pituitary insufficiency
Authors: Fux Otta Carolina , Moreno Laura , Vitaloni Roberto , Iraci Gabriel S
Published: December 2020

Background: Severe Acute Respiratory Syndrome Coronavirus 2 (SARS-CoV-2) outbreak originated in Wuhan (China) rapidly turned into a pandemic. Due to a national compulsive decree of quarantine, office visits for chronic disease control were delay.

Hypopituitarism includes all clinical conditions that result in partial or complete failure of the pituitary gland's ability to secrete hormones. Pituitary insufficiency per se has been associated with an increase in both morbidity and mortality, particularly due to cardiovascular disease, which is an important risk factor for COVID-19 disease severity.

Objective: To report the first case of SARS-CoV-2 infection in a patient with hypopituitarism, discuss the implications of the treatments the patient was taking and grade up the value of telemedicine in the present scenario.

Methods: Report of the clinical record of a patient with hypopituitarism and infection with SARS-CoV-2.

Results: During the span of the infection, the patient remained on the same hormonal therapeutic scheme (thyroid, gonadal and adrenal axis). The dose of hydrocortisone was not changed during the course of the infection as she was asymptomatic. We use telemedicine to control and advise her on the treatment.

Conclusion: Health care professionals should carefully follow up on the evolution of patients with hypopituitarism to provide them a safer outcome. The use of telemedicine as a methodology for selected patients acquires relevance in the present epidemiological context.
Soil erosion modelling: A global review and statistical analysis
Authors: Borrelli Pasquale , Alewell Christine , Alvarez Pablo , Ayach Anache Jamil Alexandre , Baartman Jantiene , Ballabio Cristiano , Bezak Nejc , Biddoccu Marcella , Cerdà Artemi , Chalise Devraj , Chen Songchao , Chen Walter , De Girolamo Anna Maria , Desta Gessesse Gizaw , Deumlich Detlef , Diodato Nazzareno , Efthimiou Nikolaos , Erpul Gunay , Fiener Peter , Freppaz Michele , Gentile Francesco , Gericke Andreas , Haregeweyn Nigussie , Hu Bifeng , Jeanneau Amelie , Kaffas Konstantinos , Kiani-Harchegani Mahboobeh , Lizaga Villuendas Ivan , Li Changjia , Lombardo Luigi , López-Vicente Manuel , Lucas-Borja Manuel Esteban , Märker Michael , Miao Chiyuan , Mikoš Matjaž , Modugno Sirio , Möller Markus , Naipal Victoria , Nearing Mark , Owusu Stephen , Panday Dinesh , Patault Edouard , Patriche Cristian Valeriu , Poggio Laura , Portes Raquel , Quijano Laura , Reza Rahdari Mohammad , Renima Mohammed , Ricci Giovanni Francesco , Rodrigo-Comino Jesús , Saia Sergio , Nazari Samani Aliakbar , Schillaci Calogero , Syrris Vasileios , Soo Kim Hyuck , Noses Spinola Diogo , Tarso Oliveira Paulo , Teng Hongfen , Thapa Resham , Vantas Konstantinos , Vieira Diana , Yang Jae , Yin Shuiqing , Zema Demetrio , Zhao Guangju , Panagos Panos
Published: December 2020

To gain a better understanding of the global application of soil erosion prediction models, we comprehensively reviewed relevant peer-reviewed research literature on soil-erosion modelling 1994-2017. Our aim was to identify (i) processes and models most frequently addressed in the literature, (ii) regions within which models are primarily applied, (iii) what regions remain unaddressed and why, and (iv) how frequently studies are conducted to validate/evaluate model outcomes relative to measured data. To perform this task, we merged the knowledge of a group of 66 soil-erosion scientists from 67 research institutions and 25 countries. The resulting database ‘Global Applications of Soil Erosion Modelling Tracker (GASEMT)’ includes 3,030 individual modelling records from 126 counties encompassing all continents (except Antarctica). Out of 8,471 articles identified as potentially relevant, we reviewed 1,697 articles and transferred relevant information from each into the database. For each record reported in the GASEMT database, 42 attributes were evaluated. The GASEMT database provides insights into the state-of-the-art of soil- erosion models and model applications worldwide. The database is also intended to support the upcoming country-based United Nations global soil-erosion assessment. This database may help inform soil erosion research priorities in that it builds a foundation for future targeted in-depth analyses. GASEMT is an open-source database that anyone can use to develop research, rectify errors, and expand.
Failure Analysis of a Half-Micron CMOS IC Technology
Authors: Liang A.Y. , Tangyunyong P. , Bennett R.S. , Flores R.S. , Soden J.M. , Cole E.I.
Published: December 2020

We present the results of recent failure analysis of an advanced, 0.5 um, fully planarized, triple metallization CMOS technology. A variety of failure analysis (FA) tools and techniques were used to localize and identify defects generated by wafer processing. These include light (photon) emission microscopy (LE), fluorescent microthermal imaging (FMI), focused ion beam cross sectioning, SEM/voltage contrast imaging, resistive contrast imaging (RCI), and e-beam testing using an IDS-5000 with an HP 82000. The defects identified included inter- and intra-metal shorts, gate oxide shorts due to plasma processing damage, and high contact resistance due to the contact etch and deposition process. Root causes of these defects were determined and corrective action was taken to improve yield and reliability.
TEM Sample Preparation Using A Focused Ion Beam and A Probe Manipulator
Authors: Herlinger L.R. , Chevacharoenkul S. , Erwin D.C.
Published: December 2020

Cross-sectioning is a necessary technique for the failure analysis of integrated circuits. Historically, the majority of samples have been prepared for scanning electron microscope (SEM) analysis. Today's smaller geometry devices, however, increasingly require the improved spatial resolution afforded by the transmission electron microscope (TEM), both in imaging analysis and in elemental analysis. Specific-area cross-section TEM (SAXTEM) analysis allows the failure analyst to identify defects that may go undiscovered in the SEM. A procedure is described for a timely preparation of SAXTEM samples using a focused ion beam (FIB) instrument and a manipulator probe. This procedure extends the state-of-the-art in several key respects: A) no mechanical grinding is necessary, B) samples as large as the FIB chamber can be accommodated, e.g., whole wafers, C) multiple samples can be prepared from one die, D) the procedure is faster and more repeatable than previously reported procedures.
Temperature Dependence of Quiescent Currents as a Defect Prognosticator and Evaluation Tool
Authors: Seo J.S. , Lee S.S. , Daniel S. , Yoon C.K.
Published: December 2020

The dependence of a defective device's voltage-current characteristics on temperature is studied, both from a theoretical perspective and through a series of actual case studies. The shape of the current vs. temperature curve is shown to be a good prognosticator of the defect type, and as such a valuable complement to other non-destructive defect characterization techniques such as photoemission spectrum analysis [1].
A New Robust Backside Flip-Chip Probing Methodology
Authors: Ullmann P.F. , Talbot C.G. , Lee R.A. , Orjuela C. , Nicholson R.
Published: December 2020

The increasing popularity of flip-chips brings new challenges to those who must perform device analysis (1). Its ability to accommodate high pin-count and high bandwidth microprocessors, DSPs and complex logic devices is increasing the demand for this technology. Conventional e-beam and mechanical probing techniques currently allow quick and efficient analysis of conventional semiconductor devices. When the surface of the device is not exposed, however, conventional analysis techniques are insufficient and new techniques must be developed. Conventional packaging technologies allow design debug and failure analysis to be performed in a relatively straightforward manner. Analysis from the topside is clearly the preferred technique when possible (2), using specially prepared engineering prototypes, but backside access for dynamic timing analysis is required when topside techniques are exhausted. The flipchip process, however, makes topside analysis impractical in most situations. There are several different techniques that are currently being used for backside analysis. These are emission microscopy (3), optical beam induced current (OBIC) (4), and a combination of software and built in self-test/scan methods (5). These techniques are valuable in helping engineers to analyze and isolate faults for functional failures. These techniques do not, however, provide precise analog waveforms which may be used to perform timing analysis on the device. A backside pulsed laser electro-optic technique for measuring internal node timing (6) has been developed for waveform acquisition. Although this technique permits acquisition of waveforms from a bi-polar device which has had its substrate thinned, it has limited application to CMOS devices, particularly in long duty cycle applications. Milling the backside of devices in order to facilitate backside waveform acquisition is considered by some researchers as a potential approach, but the authors are not aware of any published data on this subject.
Micro-Raman Spectroscopy Evaluation of the Local Mechanical Stress in Shallow Trench Isolation CMOS Structures: Correlation with Defect Generation and Diode Leakage
Authors: De Wolf I. , Groeseneken G. , Maes H.E. , Bolt M. , Barla K. , Reader A. , McNally P.J.
Published: December 2020

It is shown, using micro-Raman spectroscopy, that Shallow Trench Isolation introduces high stresses in the active area of silicon devices when wet oxidation steps are used. These stresses result in defect formation in the active area, leading to high diode leakage currents. The stress levels are highest near the outer edges of line structures and at square structures. They also increase with decreasing active area dimensions.
Analysis of Leakage Failures in Flash Memory Devices and Root Cause Identification
Authors: de Luna J. N. C. , del Fierro M. O. , Muñoz J. L.
Published: December 2020

An advanced flash bootblock device was exceeding current leakage specifications on certain pins. Physical analysis showed pinholes on the gate oxide of the n-channel transistor at the input buffer circuit of the affected pins. The fallout contributed ~1% to factory yield loss and was suspected to be caused by electrostatic discharge or ESD somewhere in the assembly and test process. Root cause investigation narrowed down the source to a charged core picker inside the automated test equipment handlers. By using an electromagnetic interference (EMI) locator, we were able to observe in real-time the high amplitude electromagnetic pulse created by this ESD event. Installing air ionizers inside the testers solved the problem.
Automatic Determination of Optimal FIB Operations for Improved Circuit Probing and Fast Reconfiguration
Authors: Desplats Romain , Dargnies Timothee , Courrege Jean-Christophe , Perdu Philippe , Noullet Jean-Louis
Published: December 2020

Focused Ion Beam (FIB) tools are widely used for Integrated Circuit (IC) debug and repair. With the increasing density of recent semiconductor devices, FIB operations are increasingly challenged, requiring access through 4 or more metal layers to reach a metal line of interest. In some cases, accessibility from the front side, through these metal layers, is so limited that backside FIB operations appear to be the most appropriate approach. The questions to be resolved before starting frontside or backside FIB operations on a device are: 1. Is it do-able, are the metal lines accessible? 2. What is the optimal positioning (e.g. accessing a metal 2 line is much faster and easier than digging down to a metal 6 line)? (for the backside) 3. What risk, time and cost are involved in FIB operations? In this paper, we will present a new approach, which allows the FIB user or designer to calculate the optimal FIB operation for debug and IC repair. It automatically selects the fastest and easiest milling and deposition FIB operations.
Microscopy at the Nanoscale
Authors: Vanderlinde William E. , Ballarotto Vincent W.
Published: December 2020

Nanoscale devices such as carbon nanotubes, fluorescent nanoparticles, and molecular conductors serve as a benchmark for the tools and techniques that will be required in the future to analyze processing defects and determine the cause of electronic device failures. In this paper, the authors compare and contrast the nanoscale capabilities of several imaging techniques, including STEM-in-SEM, forward scattered electron imaging, photoelectron emission microscopy, and atomic force microscopy. Along with the results of the various characterization techniques, the paper also includes a survey of the more common nanoscale devices, showing that many require more than one imaging method to make a complete and accurate assessment.
Towards High Accuracy Fault Diagnosis of Digital Circuits
Authors: Hora Camelia , Eichenberger Stefan
Published: December 2020

Due to the development of smaller and denser manufacturing processes most of the hardware localization techniques cannot keep up satisfactorily with the technology trend. There is an increased need in precise and accurate software based diagnosis tools to help identify the fault location. This paper describes the software based fault diagnosis method used within Philips, focusing on the features developed to increase its accuracy.
Hardware Results Demonstrating Defect Localization Using Power Supply Signal Measurements
Authors: Acharyya Dhruva , Plusquellic Jim
Published: December 2020

The power supply transient/quiescent signal (IDDT/IDDQ) methods that we propose for defect localization analyze regional signal variations introduced by defects at a set of power supply ports on the chip under test (CUT). The methods are based on the comparison of the CUT with a golden reference chip, either simulated or determined to be defect-free, with the objective of distinguishing anomalous signal behavior introduced by a defect from that introduced by process variations. However, variations in contact resistance between the probe card and the CUT introduces anomalies in the measured power supply signals that complicates the task of comparing data between chips. This paper presents hardware results that demonstrate the effectiveness of a previously developed calibration technique designed to eliminate these types of signal anomalies introduced by the testing environment. The CUT hardware data presented in this work is calibrated using simulations of the CUT’s power grid and special on-chip sources of stimuli called ‘calibration circuits’. Several novel Look-Up Table based defect localization techniques are proposed that analyze the calibrated power supplies signals. The results of predicting the locations of emulated defects in nine copies of a test chip demonstrate the effectiveness of the techniques.
Extracting Acoustic Signatures of Solder Bump Defects Using Wavelet Power Spectra and Their Classification Using Normalized Cross-Correlation
Authors: Ramanujachar K.
Published: December 2020

In a previous contribution we highlighted the potential use of spectral analysis of acoustic signals reflected from solder bumps as a means to identify anomalies in the bump. With numerous interfaces in contemporary solder bump geometries, time domain interpretation of acoustic signals is not straightforward. Frequency domain analysis is hence another route to utilizing information contained about defects in acoustic signals emanating from suspect bumps. In this contribution we highlight the use of Wavelet transforms and power spectra in analyzing acoustic signals and demonstrate with a few examples how the transform may be used to obtain unique finger prints of anomalies. We also discuss how cross correlation technqiues may be used to classify a fingerprint once a comprehensive library of finger prints is empirically constructed.
Reliability of Polycrystalline MEMS: Prediction of the Debugging-Time
Authors: Millet O. , Bertrand P. , Legrand B. , Buchaillot L. , Collard D.
Published: December 2020

The debugging-time for polycrystalline MEMS structural layers is the aim of this paper. A description of the fatigue phenomenon for elementary structure in the case of microactuators is presented. It is obtained by combining elementary in situ test benches of varying dimensions and cyclic actuation; in the same way, the debugging-time is determined according to the design and the structural material. Test benches have been developed allowing performance of bending fatigue tests of polycrystalline structural layers, describing the fatigue phenomenon and obtaining a constant debugging-time for a same polycrystalline layer, whatever the excitation frequency and the beams length.
Characterization of VCSEL-Array Degradation Induced by Elevated Temperature and Humidity
Authors: Lopez L. D. , McElfresh D. K. , Melanson R. , Vacar D.
Published: December 2020

The need for high bandwidth, high speed interconnects with optimum routing through computer backplanes has led to the use of optical interconnects in multiprocessor computing systems [1]. Most of the current commercially available optical interfaces are based upon 850nm vertical-cavity surface-emitting lasers (VCSELs). Extensive studies conducted by the VCSEL manufacturers show that the reliability of these devices continues to improve [2-4]. In order to understand the risks and implications of using VCSELbased modules in computer systems, we have conducted an experiment designed to provide insight into the emission degradation and failure of VCSEL devices. In this paper we briefly describe the experiment and review the results of the subsequent failure analysis on degraded VCSEL arrays.
FiberQA-AVIT System for Fiber Endface Inspection
Authors: Roche Brian , Duffy John , Mitcheltree Thomas , Wilson Douglas , Lootsma Wayne , Lewandowski Mike , Trotabas Rémy
Published: December 2020

This paper discusses the requirements, challenges, and capabilities of a fully automated visual inspection tool (AVIT) designed to improve the evaluation of fiber optic endfaces. The FiberQA™-AVIT system is based on the FiberQA™-EFI (Endface Inspection) software from PVI Systems, Inc.
A Novel FIB Method to Prepare TEM Samples for 3D Observation
Authors: Mcllwrath Kevin , Wang Nathan
Published: December 2020

This article describes a novel way to prepare TEM samples from existing FIB lift out samples for third dimensional observation. An in situ needle in a FIB column is applied to handle the sample and a special sample holder is used that tilts the sample rapidly to 90º in the FIB column. The application of this technique is also discussed.
Ion Beam Polishing for Embedded Cross-Sections and Its Advantages for FESEM Analysis in Electronic Packaging
Authors: Mack W. , Seidl B. , Fischer R. , Ort T. , Walter J. , Grünewald J. , Berthold L. , Petzold M.
Published: December 2020

Microstructural diagnostics for electronic packaging development and failure analysis under industrial manufacturing conditions require fast but reliable preparation routines which result in samples of high quality without preparation artefacts. The aim of the presented paper is to introduce a time- and cost efficient ion beam-based preparation procedure for high resolution Field Emission- Scanning Electron Microscopy (FESEM) analysis for packaging components. In particular, the considerable advantages of the proposed method compared to standard metallographic approaches will be demonstrated by discussing results of typical failure analysis examples as a function of the preparation procedure.
An Effective Failure Analysis Strategy for the Successful Introduction of New Products Designed in 90 and 65 nm CMOS Technologies
Authors: Lorut F. , Lamy M. , de la Bardonnie M. , Fabre S. , Ross R. , Ly K. , Wyon C.
Published: December 2020

IC manufacturers, among other things, have to define a global failure analysis (FA) strategy that is best adopted to the challenges associated to the introduction of the 90 and 65 nm CMOS technologies. This article reviews the existing FA techniques and then describes an FA strategy that is aiming at fast, efficient, and economic learning in the latest 120-65 nm CMOS technologies. The strategy is based on a well-balanced mix and usage of in-line defectivity data, voltage contrast analyses, SRAM bitmap analysis results, OBIRCH fault isolation, and various advanced physical characterization techniques. A SRAM bitmap strategy has demonstrated to be very effective in driving most relevant process improvements, and also OBIRCH applied to parametric test structures has helped significantly in identifying major yield detractors.
Three Dimensional Imaging of Microelectronic Devices Using a CrossBeam FIB
Authors: Lifshin Eric , Evertsen James , Principe Edward , Friel John
Published: December 2020

Increased insight into the internal structure of microelectronic devices can be achieved through the use of three dimensional (3D) imaging based on image stacks of serial sections obtained with a combined electron and ion beam (CrossBeam) FIB. This study describes how such data can be collected and presented, some of the factors that need to be optimized to get the best images, and the limitations of the method. It can be viewed as a first step in the emerging area of high resolution 3D microscopy, a technique that can lead to more accurate characterization of the shapes of internal structures and their interconnectivity at the nanoscale.
Materials Characterization and Model of PCB Thermal Expansion for Laminates With Various Copper Densities and Thicknesses
Authors: Cunningham William J. , Casali Dick , Armendariz Norman J.
Published: December 2020

The SEMATECH/SEMI roadmap forecasts increased density requirements for printed circuit board manufacturing to accommodate smaller form factor interconnects, increased pin counts, and routing densities on a range of PCB sizes and thicknesses. As a result, the effect of materials. thermal expansion properties may further impact the structural or physical integrity and subsequent electrical properties for high speed and thermal management requirements. This study demonstrated that various sample coupons selected from PCB boards with different amounts of copper showed a corresponding coefficient of thermal expansion (CTE) correlation in the Z-axis (CTEZ) and can be modeled using a constitutive equation. Moreover, samples were further evaluated from the effect of increasing temperature and showed that the CTE indeed affects copper-interconnect physical structures such as copper vias and barrels in terms of elongation or strain.
OBIRCH Driven Failure Analysis for Process Development of 120 nm to 65 nm Technology Nodes
Authors: Ross R. , Ly K. , de la Bardonnie M. , Kwakman L.F.Tz. , Lorut F. , Lamy M. , Wyon C.
Published: December 2020

Given the ever increasing complexity of conducting failure analysis on today's latest generation manufacturing processes, the authors have investigated and implemented OBIRCH techniques into process development failure analysis practices. They describe their applications of OBIRCH to 120, 90, and 65 nm samples and their methods for interpreting the results. The OBIRCH technique has the ability to address faults within most structure types and quickly give information on a number of failing sites. It has proven itself as a necessary tool for failure analysis at advanced technology nodes, where fault characterization is getting difficult due to extremely small critical dimensions. The results obtained using the OBIRCH tool have been excellent on 120nm and initial 90nm results. The authors have not yet analyzed enough 65nm samples to form any type of conclusion regarding the tools ability at this technology node.
Voltage Regulator Output Shifts Due to Systematic Oxide Non-Uniformities: Failure Analysis, Layout and Process Solutions
Authors: Jumpertz R. , Muigg D. , Oberhuber R. , Ploss W. , Chatterjee T. , Trogolo J.
Published: December 2020

High volume productions of analog devices require usually more than one production facility. These facilities could be part of the company or in a foundry organization. A smart technology transfer is a key requirement to success. Nevertheless, small deviations of parametric key indices can lead to substantial differences in analog device performance. This paper describes an instructive case study to isolate the root cause of a parametric shift of a low drop output (LDO) voltage regulator. This shift caused a significant yield loss in one of the production facilities. The LDO shift was traced back to a current mirror mismatch. Physical failure analysis shows small differences in the gate oxide thickness which consequently vise versa led to threshold voltage mismatch. Further process analysis identified an unwanted topography in the silicon surface as the root cause of the non-uniform gate oxide growth.
Observations of Crystal Damage on the Sidewalls of TEM Samples Prepared by FIB Milling
Authors: Gao Qiang , Zhang Mark , Niou Chorng , Li Ming , Kary Chien W.T.
Published: December 2020

In this paper, crystal damage on TEM sample sidewalls induced by FIB milling during sample preparation was studied. A novel method was invented to prepare the sample, which facilitates the direct observation of amorphous layers on the sidewall. The ion beam acceleration voltage is the dominant factor that affects the damaged layer thickness. The measured amorphous thickness is about 23 nanometers at 30Kv and 10 nanometers at 10Kv. The damage layer thickness is constant with different beam currents over the range from 30pA to 1000pA. Amorphous layer thickness also stays constant with the sample tilt angle.
Electrostatic Discharge (ESD) Damage Simulation on RF MMIC Device
Authors: Chhong Tan Ewe
Published: December 2020

This paper presents electrostatic discharge (ESD) damage simulation results on good units of the RF monolithic microwave integrated circuit device. Two ESD test models, human body model and machine model, simulators were used to simulate the ESD damage on the good units of the RF MMIC devices in different pin configurations. The paper presents the failure analysis results on the field returned units, the ESD damage simulation results, and the failure analysis results on radio frequency operating life failure units. Based on the simulation results obtained, it was concluded that the ESD wounded devices would exhibit a short failure (catastrophic failure) and a low Id failure (latent failure) after being used in the application or field. It is recommended that the static electricity should be eliminated in the workplace at customer site by grounding the operators, equipment and devices in order to prevent the ESD damage.
Near-field Scanning Microwave Probe for Rapid Detection of Nonvisual and Parametric Defects in Cu/low-k Interconnect on Production Wafers
Authors: Talanov Vladimir V. , Schwartz Andrew R.
Published: December 2020

We demonstrate the use of a near-field scanned microwave probe (NSMP) for failure analysis (FA) of parametric defects in Cu/low-k interconnect that leave no physical remnant (sometimes referred to as “non-visual defects”). This technique is rapid, quantitative, non-contact, and provides direct electrical measurements.