bluuebunny/crossref_metadata_2025 huggingface dataset:
Acute direct traumatic optic neuropathy treated with steroids, minocycline and hyperbaric oxygen: a case report
Authors:   Department of Ophthalmology and Pediatrics, University of Maryland School of Medicine, Alexander Janet L. , Shulman Matthew D. ,   Department of Ophthalmology Residency, University of Maryland Medical Center, Sethuraman Kinjal N. ,   Department of Emergency Medicine, University of Maryland School of Medicine, Baltimore, Maryland
Published: December 2020

We describe the emergency management of a man who experienced acute vision loss diagnosed as direct traumatic optic neuropathy (TON) in his right eye (no light perception) after falling from a height. TON is caused by a high-impact mechanism of injury. Clinical findings include acute vision loss, which is typically immediate, afferent pupillary defect, decreased color vision, and visual field defects. Treatment is controversial because of the lack of strong evidence supporting intervention over observation. In this case report, our treatment strategy comprised immediate hyperbaric oxygen (HBO2) and daily high doses of a steroid. On the second day, minocycline was added to the treatment regimen for its neuroprotective effects. The patient was discharged after receiving six HBO2 treatments and six days of intravenous solumedrol transitioned to oral prednisone. After the third HBO2 treatment, his vision improved to 20/100; after the fourth treatment, it was 20/40 and plateaued. At the time of discharge, it was 20/40. At two-month follow-up, his corrected visual acuity was 20/60+2 in the affected eye. Immediate HBO2 for ischemic and mechanical injury to the optic nerve following trauma is a therapeutic option.
Risk factors for immersion pulmonary edema in recreational scuba divers: a case-control study
Authors:   Hyperbaric Medicine Unit, Brest University Hospital, Brest, France, Henckes Anne , Cochard Guy ,   Hyperbaric Medicine Unit, Brest University Hospital, Brest, France, Gatineau Florence ,   INSERM CIC 1412, Brest University Hospital, Brest, France, Louge Pierre ,   Department of Diving and Hyperbaric Medicine, Sainte Anne’s Military Hospital, Toulon, France, Gempp Emmanuel ,   Department of Diving and Hyperbaric Medicine, Sainte Anne’s Military Hospital, Toulon, France,   French Navy Diving School, Toulon, France, Demaistre Sébastien ,   Department of Diving and Hyperbaric Medicine, Sainte Anne’s Military Hospital, Toulon, France, Nowak Emmanuel ,   INSERM CIC 1412, Brest University Hospital, Brest, France, Ozier Yves ,   Department of Anesthesiology and Intensive Care Medicine, Brest University Hospital, Brest, France
Published: December 2020

Background: Immersion can cause immersion pulmonary edema (IPE) in previously healthy subjects. We performed a case-control study to better identify IPE risk factors. Methods: We prospectively included recreational scuba divers who had presented signs of IPE and control divers who were randomly chosen among diving members of the French Underwater Federation. We sent an anonymous questionnaire to each diver, with questions on individual characteristics, as well as the conditions of the most recent dive (controls) or the dive during which IPE occurred. Univariate logistic regressions were performed for each relevant factor. Then, multivariate logistic regression was performed. Results: Of the 882 questionnaires sent, 480 (54%) were returned from 88 cases (90%) and 392 control divers (50%). Multivariate analysis identified the following independent risk factors associated with IPE: • being aged over 50 years ((OR) 3.30, (95%CI) 1.76-6.19); • female sex (OR 2.20, 95%CI 1.19-4.08); • non-steroidal anti-inflammatory drug (NSAID) intake before diving (OR 24.32, 95%CI 2.86-206.91); • depth of dive over 20 m (OR 2.00, 95%CI 1.07-3.74); • physical exertion prior to or during the dive (OR 5.51, 95%CI 2.69-11.28); • training dive type (OR 5.34, 95%CI 2.62-10.86); and • daily medication intake (OR 2.79, 95%CI 1.50-5.21); this latter factor appeared to be associated with hypertension in the univariate analysis. Conclusions: To reduce the risk of experiencing IPE, divers over 50 years of age or with hypertension, especially women, should avoid extensive physical effort, psychological stress, deep dives and NSAID intake before diving.
Research on Permanent Magnet Synchronous Motor Speed Control System Based on Three-Order Linear Active Disturbance Rejection Controller
Authors:   College of Electrical & Information Engineering, Southwest Minzu University, Chengdu 610041, China, Chen Zhipeng , Wang Huazhang ,   College of Electrical & Information Engineering, Southwest Minzu University, Chengdu 610041, China, Zheng Wei ,   College of Electrical & Information Engineering, Southwest Minzu University, Chengdu 610041, China
Published: December 2020

Linear active disturbance rejection control (three-order LESO+PD control) and fuzzy PID control strategies are used to simulate the same permanent magnet synchronous motor with variable speed (constant load) and variable load (constant speed), by observing and analyzing the oscilloscope waveform data and waveform changes in Matlab/Simulink, we can compare the control performance of the two control algorithms under different conditions. By comparing the waveform changes of the oscilloscope, it is found that LADRC has more advantages in real-time than fuzzy PID, and the fluctuation is smaller after stabilization. However, the linear auto disturbance rejection control algorithm is more likely to cause overshoot, and it is not as easy to master as fuzzy PID in parameter adjustment. The two control algorithms have their own advantages and disadvantages.
Environmental radon, its exhalation rates and activity concentration of 226Ra, 232Th, and 40kK in Northern India
Authors: Kaur Rupinderjeet , Shikha Deep , Singh Supreet , Mehta Vimal
Published: December 2020

Human beings are constantly exposed to radioactivity in the environment. As
they are major sources of harmful radiation, radionuclides found in the
atmosphere might result in a substantial potential risk to living beings. On
the Earth's surface, the radioactive elements uranium and radium are
naturally present, contributing to radon and thoron gases in the indoor as
well as outdoor climate, soil and water. Radon is one of the most important
toxins that, after cigarette smoking, is the second most common cause of
generating lung cancer. Due to these health-related concerns, a lot of work
has been undertaken by numerous research organizations to determine their
levels at different locations throughout the world. This paper is an attempt
to comprehensively report with different techniques all those studies being
carried out in this part of India so that a current assessment of the indoor
radon levels should be available for further work in this field. Six northern
Indian states, viz. Punjab, Haryana, Himachal Pradesh, Rajasthan , Uttar
Pradesh and Uttarakhand are considered for this examination. This study also
provides data on exhalation rates and activity concentration of natural
radionuclides (226Ra, 232Th, and 40K) present in these states.
Social anxiety and rumination in the context of the revised reinforcement sensitivity theory and the mediation model of social anxiety
Authors: Randjelovic Kristina , Cirovic Nikola
Published: December 2020

The aim of this study was to examine the relationship between temperament, ruminative thought style and social anxiety using latent variable modeling. Before examining the integrated model that specifies the relations between the constructs, relevant measurement issues were examined. The study was conducted on a heterogeneous sample from the general population that included 1,029 participants (62.1% female) aged 19 to 79. The findings show that the Behavioural Inhibition System is the most important vulnerability factor for the development of social anxiety, and it has both a direct effect and an indirect one through the ruminative thought style. Also, Freeze has an additional contribution to the increased experience of social anxiety. The Behavioural Approach System has complex effects on social anxiety ? with a direct protective effect, and indirectly ? with a facilitation of the ruminative thought style. Thus, BAS can also act as a risk factor. The findings support the revised Reinforcement Sensitivity Theory and provide a basis for the extension of the Kimbrel?s Mediation Model of Social Anxiety.
EXPERIENCE IN USING MODULAR SOCIAL HOUSING
Authors:   Lviv Polytechnic National University Department of Architectural Design and Engineering, S Lukyanchenko , V Babyak ,   Lviv Polytechnic National University Department of Architectural Design and Engineering, I Hnes ,   Lviv Polytechnic National University Department of Architectural Design and Engineering
Published: December 2020

The modular modular architecture is currently actively used in construction since it has many advantages over traditional construction. This type of design simplifies and speeds up the process of creating not only social housing, but also campuses and hospitals when there is an epidemic and you need to quickly provide patients with wards, or get out of the housing crisis during the economic crisis. In addition to being practical, it is much cheaper and more environmentally friendly. This article provides examples of the use of modules in construction and architecture to argue the relevance and need to use modular architecture and develop it. The use of the technology of modular formation of architectural objects can solve urgent problems in the modern world: overcoming the consequences of natural disasters, hostilities, the formation of social and niche specialized housing. These examples are not innovations that are unattainable or not scalable for technological reasons. The highlighted issue only shows the need to disseminate these solutions in practice.
HUMAN-FRIENDLY NEW WAY OF SEEING ARCHITECTURE
Authors:   Kraków Gryffindor Foundation, A. MariaMaj , A. Kuśmierska ,   Cracow University of Technology
Published: December 2020

This article is written in the wake of the first wave of the COVID-19 pandemic to shake the world and stagnant systems. After COVID, nothing would be the same as it used to be. It is what it used to be, and we were hoping for a different turn of events. However, things will not sort themselves out. So let us take a look at what cannot do itself, but must be done in architecture and design in general.
Analysis of Evaluation and Exploratory Studies on Student’s Resilience of Online Learning during Pandemic of Covid-19
Authors: Dewantoro Adi , Rachmawati Indriyana
Published: December 2020

The Covid-19 pandemic has changed all systems of life, including those in the field of education. Online learning during a pandemic requires lecturers and students to learn new things that were never thought of before. Mastering technology and managing self-defence against various pressures during a pandemic are important for everyone to master. This study aims to measure the level of student resilience to online learning during the Covid-19 pandemic. This survey was conducted by distributing resilience instruments in the form of google form to students throughout the island of Java, with a total of 483 students as respondents. As many as 483 respondents who filled out the student resilience questionnaire against the Covid-19 outbreak showed that 112 respondents responded positively to online learning during the Covid-19 pandemic. Meanwhile, 371 respondents stated a negative response to online learning during the Covid-19 pandemic. Although the use of online learning models will continue with the times, it is hoped that the management of technology, pedagogy, and content in online learning can work together and provide students comfort in learning.
Chlorella vulgaris microalgae in Ruminant Nutrition: a Review of the Chemical Composition and Nutritive Value
Authors: Kholif Ahmed E. , Olafadehan Olurotimi A.
Published: December 2020

Recently, microalgae, natural marine resources, have gained increasing interests as a feed for animals. Chlorella vulgaris microalgae are single-cell microorganisms that have been used to provide nutrition to humans and animals for centuries. In the present review, we unveil the composition and nutritive value of C. vulgaris microalgae as a feed for ruminants. Research has shown that inclusion of C. vulgaris microalgae in diets improved feed utilization, milk production and quality, growth performance, and meat quality in ruminants, as a result of improved diet nutritive value. Very low doses of C. vulgaris in feed enhance growth and lactational performance of ruminants. Additionally, C. vulgaris showed very promising results as an alternative to corn and soybean meal; however, it is an expensive protein feed. Therefore, the main constraint to use of C. vulgaris as a feedstuff is its high cost of production, making improvement of cultivation technology to reduce the production costs a critical issue in the near future.
Prevalence of Phonological Articulation Disorders in Preschool Children in the City of Skopje
Authors: Grigorova Evgenija , Ristovska Gordana , Jordanova Nada Pop
Published: December 2020

Introduction: Speech communication is a complex process based on the function of the central nervous system, and also on the speech mechanisms conditioned and controlled by auditory perception, verbal memory, intellectual activity and peripheral speech apparatus.

The aim of this study was to determine the prevalence of the most common phonological articulation disorders in preschool children, from 4-6 years old.

Materials and methods: A cross-sectional study was conducted during 2018, on a representative sample of 550 preschool children aged 4 - 6 years, who attend preschool institutions-kindergartens in the city of Skopje. The study used standardized articulation tests: The Global Articulation Test (GAT) and the Triple Test (vocals, plasia, affricative, fricative, nasal, and lateral), and a questionnaire filled out by a social worker at the kindergarten about the socioeconomic status and the child’s health condition.

Results: Using GAT, we found that 260 (47.3%) children didn’t manifest any phonological articulation disorders, but 290 (52.7%) had disorders. The analysis of gender-based data showed a higher percentage of speech disorders in 57% of boys and 46.9% of girls. The highest percentage of speech disorder is sigmatism with 24.5% in boys and 20.4% in girls, rhotacismus was found in 17.8% in boys and 16.5% in girls. Lambdacism with 8.3% was found in boys and 4.2% in girls. A mixed form (sigmatism, rotacism, and lambdacism) was also found in 2.4% of boys and 3.5% of girls.

Conclusions: The calculated prevalence of phonological articulation disorders in preschool children aged 4-6 years is 52.7%, (57.9% in boys and 46.9% in girls), or every second child in kindergarten has some form of speech disorder. These findings indicate that the treatment of speech disorders should begin in the appropriate services as soon as possible, because the early detection and treatment of speech disorders enable child’s normal intellectual development. The treatment should be started in the preschool period, to allow the start of the educational process without any speech problems.
POLÍTICA CRIMINAL DE ENTORPECENTES: UMA ANÁLISE DOS DIREITOS DA PERSONALIDADE DO USUÁRIO DE DROGAS EM FACE DA REPRESSÃO PENAL
Authors: De Castro Alexander , Neto Silvio Toledo
Published: December 2020

O presente trabalho visa estudar a política criminal de drogas do proibicionismo a partir dos direitos da personalidade entendidos como derivações do mandamento constitucional de proteção à dignidade da pessoa humana. Parte-se de uma análise histórica que compreende do nascimento do proibicionismo até os dias atuais, com destaque para seu momento alto na década de 1970, quando então assumiu a forma da “guerra às drogas”. Com base na exposição do contexto histórico, investigamos a repressão penal ao uso, produção e tráfico de determinadas substâncias psicoativas de forma a questionar a constitucionalidade do artigo 28 da Lei no 11.343/2006 com o objetivo de determinar se, com base no imperativo de defesa dos direitos da personalidade, especialmente o direito à vida privada e à intimidade, é possível exigir do estado a abstenção da invasão na esfera individual da pessoa que opta por fazer uso de determinada substância psicoativa. Analisa-se também – como contra-argumento – a possibilidade a dependência crônica das drogas fazer culminar na impossibilidade de se exercer a autonomia constitucionalmente garantida.
Please spare my teeth! Dental procedures and trigeminal neuralgia
Authors: Tripathi Manjul , Sadashiva Nishanth , Gupta Anand , Jani Parth , Pulickal Sachin Jose , Deora Harsh , Kaur Rupinder , Kaur Parwinder , Batish Aman , Mohindra Sandeep , Kumar Narendra
Published: December 2020

Background:

The correct diagnosis of trigeminal neuralgia (TN) is still a far cry and the patients suffer from unnecessary dental procedures before getting the definite treatment. In this study, we evaluated, if the patients have undergone dental procedures for their misdiagnosed TN before receiving definite treatment for the same.

Methods:

A total of 187 patients received GKRS for their TN (excluding secondary TN) in two institutes from 2010 to 2019. We did a retrospective analysis of these patients’ primary complaints on a standard questionnaire.

Results:

One hundred and seventeen of the 187 patients responded. About 55.5% of patients had a toothache and 65.8% did visit a dentist for the pain. About 41.8% of patients underwent one dental procedure; 18.8% suffered from worsening of the pain while 8.5% received some partial improvement. About 19.6% also underwent root canal treatment while 6.8% had a nerve block. Mean of 1.6 teeth was extracted per person. About 71% of patients were satisfied with their Gamma Knife radiosurgery for TN at a median follow-up of 49 months.

Conclusion:

There is a need for a better understanding of the disease among the dentists and the patients for the timely and correct treatment, without losing their teeth. The onus lies on neurosurgeons/neurologists disseminate knowledge regarding proper diagnosis and treatment modalities.
The Self-Portrait as a Means of Self-Investigation, Self-Projection and Identification among the Primary School Population in Croatia
Authors: Pivac Dunja , Zemunik Maja
Published: December 2020

The self-portrait is a reflection of the personality in a visual, physical sense, as a concrete form, a summary of the external characteristics of the artist, but also in a psychological sense, when the self-portrait becomes a mediator of communication with the self, a medium of self-investigation. In this way, the self-portrait exists as a means of self-reflection, self-awareness and acceptance of the Self. It contains three primary values: subjective, objective and the archetype. Considering that the self-portrait is not exclusively a means of introspection reserved only for artistic practice, but also includes activities of the entire population, ranging from early childhood to old age, the projective and reflexive features of this motif began to be used for diagnostic and therapeutic purposes. These findings, as well the need for a new role for art teachers arising from the cognitive, emotional and moral needs of children and youth involved in the regular education system in the Republic of Croatia, gave rise to the project The Self-Portrait as a Means of Self-Investigation, Self-Projection and Identification, which was realised in the regular primary educational process, in fifth-grade art classes. The expressive and projective dimensions of children’s drawings, which can indicate the possibility of diagnostic and potentially therapeutic activity within the regular primary education system, were taken as a starting point. The project also sought to examine the impact of rational-cognitive principles of teaching on children’s creativity and expression.
Assessing Historical Maps for Characterizing Fluvial Corridor Changes at a Regional Network Scale
Authors: Dunesme Samuel , Piégay Hervé , Mustière Sébastien
Published: December 2020

Fluvial corridor quality assessment requires that historical data be collected at a regional scale. In this article, our goal is to assess potential map resources to explore riverscape changes at a regional network scale and to define key issues in using an automated vectorization protocol to characterize such changes on such a large scale. We consider IGN’s Nouvelle Carte de France a potentially good resource for our objective of two-date (oldest + actual vector database) comparisons on 1:20,000–1:25,000 scale maps, notably when applied at a regional scale. The French IGN corpus is a good example of topographic maps that were produced in the twentieth century in Europe with fairly homogeneous data over a whole national territory. Moreover, the digitization and georeferencing processes applied by IGN are very accurate. The evolution of conventional features is not as significant for the hydrographic theme and should not be a problem for automatic vectorization. The potential temporal coverage is from 1922 to 1993, but the complexity of the sheet divisions, partial revisions, and the heterogeneity of coverage over time prevent multidate analysis.
Clio, Rewired: Propositions for the Future of Digital History Pedagogy in Canada
Authors: Martin Kimberley
Published: December 2020

Courses on digital history methods are being offered at more Canadian universities than ever before, with both techniques and tools being embedded in courses on oral history, environmental history, and public history, to name a few. What is being taught in these classrooms and who is teaching it? Despite a wealth of digital, historical scholarship being undertaken by women, this article shows that the majority of these classes are taught by men and, furthermore, men have also authored the majority of texts and articles typically assigned in this field. Suggestions for rewiring the digital history classroom to be a more inclusive environment are made, including looking to projects in the related fields of oral, queer, and literary history.
Modeling IC Defects Using Circuit Simulation Software
Authors: Cassels J.J.
Published: December 2020

Often in the course of performing root cause failure analysis and fault localization, it can be helpful to have supporting information in the way of a defect model. This is particularly true when physical identification of a defect is unsuccessful. By modeling suspected, theorized, or documented defects in microchip circuitry, the analyst can more clearly show a direct link between defect and circuit failure in support of analysis conclusions.
Case Study: Unique Stress Induced Gate Oxide Defects in a CMOS Analog/Digital Device Revealed by Backside Silicon Removal
Authors: Matthews M.M.
Published: December 2020

Stress induced pinholes, cracks, and 'craters' have been found in the gate oxide of a double level metal, single level poly CMOS device containing both analog and digital circuits. These defects have been found randomly across the die in active gate regions, and were found in a line parallel to the gate width. These defects were hidden beneath the polysilicon, and were virtually undetectable electrically. The only electrical indication was a slight shift in the threshold voltage, still within specification limits. The polysilicon had a compressive layer of tungsten silicide (WSix) as a cap to lower the polysilicon resistivity and increase circuit speed. It was believed that polysilicon grains or WSix spikes were migrating into the gate oxide during the WSix annealing process. The defects were found in unstressed, untested parts, and in parts that passed all tests and stresses. Backside silicon removal showed defects in the gate oxide layer, and subsequent FIB sectioning revealed a WSix spike. Several techniques were employed to verify the gate oxide defects. Electrical and destructive physical analysis techniques will be presented in the paper.
Forensic Microscopy in the Failure Analysis Laboratory
Authors: Vanderlinde William E. , Stoney David A.
Published: December 2020

Optical microscopy techniques used by forensic analysts are shown to have application to failure analysis problems. Proper set up of the optical microscope is reviewed, including the correct use of the field diaphragm and the aperture diaphragm. Polarized light microscopy, bright and dark field methods, refractive index liquids, and a particle reference atlas are used to identify contamination found on semiconductor products.
Optimized Probing Flow for High Speed Fault Localization
Authors: Martin D. , Haller G. , Desplats R. , Nouet P. , Azaïs F.
Published: December 2020

The continually increasing complexity of integrated circuits has made fault localization progressively more difficult. Despite significant imp rovements in test and diagnosis tools, probing is still required for acquiring new information and for confirming test results. For this reason, we have developed an optimized diagnosis -to-probing flow which significantly reduces the number of nodes to be probed and which dramatically cuts the cost of fault localization. With this approach, probing can be integrated in test and diagnosis operations to reach nodes which are known to be untestable.
Intermittent Failures in High Pin Count Packaging
Authors: Varma Ramesh , Brooks Richard , Twist Ronald , Arnold James , Messick Cleston
Published: December 2020

In a prequalification effort to evaluate the assembly process for the industrial grade high pin count devices for use in a high reliability application, one device exhibited characteristics that, without corrective actions and/or extensive screening, may lead to intermittent system failures and unacceptable reliability. Five methodologies confirmed this conclusion: (1) low post-decapsulation wire pull results; (2) bond shape analysis showed process variation; (3) Failure Analysis (FA) using state of the art equipment determined the root causes and verified the low wire pull results; (4) temperature cycling parts while monitoring, showed intermittent failures, and (5) parts tested from other vendors using the same techniques passed all limits.
Application of FIB Circuit Edit in Analysis of Memory Failure of SOI Devices
Authors: Song Z. G. , Loh S. K. , Zheng X. H. , Neo S.P. , Oh C. K.
Published: December 2020

This article presents two cases to demonstrate the application of focused ion beam (FIB) circuit edit in analysis of memory failure of silicon on insulator (SOI) devices using XTEM and EDX analyses. The first case was a single bit failure of SRAM units manufactured with 90 nm technology in SOI wafer. The second case was the whole column failure with a single bit pass for a SRAM unit. From the results, it was concluded that FIB circuit edit and electrical characterization is a good methodology for further narrowing down the defective location of memory failure, especially for SOI technology, where contact-level passive voltage contrast is not suitable.
Secondary Electron Potential Contrast for Dopant Profiling of Silicon Carbide Devices
Authors: Buzzo Marco , Ciappa Mauro , Fichtner Wolfgang
Published: December 2020

Secondary electrons potential contrast (SEPC) by scanning electron microscopy has emerged as a powerful tool for two-dimensional quantitative dopant imaging. The main component of the SEPC signal arises from the difference in the built-in potential between differently doped regions; which is very high in wide-band-gap semiconductors and particularly intense in SiC. This paper, after discussing the physical principles leading to the dopant contrast and the proper experimental setup, investigates the impact of relevant factors such as experimental conditions, surface effects, and sample preparation on image quality. The quantitative capabilities of this technique are demonstrated by the analysis of different test structures and prototypes of power devices such as MOSFET and JFET. The application to completely process devices demonstrates that SEPC represents an unequalled characterization technique, which provides accurate imaging and dopant profiling capabilities for silicon carbide devices.
Alternating Plane-View and Cross-Section Scanning Capacitance Microscope Technique to Reveal Various Implant Issue
Authors: Chuang Tsan-Chang , Shen Cha-Ming , Lin Shi-Chen , Huang Chen-May , Chou Jin-Hong , Lee Jon C.
Published: December 2020

Scanning capacitance microscopy (SCM) is a 2-D carrier and/or dopant concentration profiling technique under development that utilizes the excellent spatial resolution of scanning probe microscopy. However, PV-SCM has limited capability to achieve the goal due to inherent "plane" trait. On top of that, deeper concentration profile just like deep N-well is also one of restrictions to use. For representing above contents more clearly, this paper presents a few cases that demonstrate the alternated and optimized application of PV-SCM and X-SCM. The case studies concern Joint Test Action Group failure and stand-by failure. These cases illustrate that the correct selection from either plane-view or cross-sectional SCM analysis according to the surrounding of defect could help to exactly and rapidly diagnose the failure mechanism. Alternating and optimizing PV-SCM and X-SCM techniques to navigate various implant issue could provide corrective actions that suit local circumstance of defects and identify the root cause.
Electrical Characterization of Different Failure Modes in Sub-100 nm Devices Using Nanoprobing Technique
Authors: Hendarto E. , Toh S.L. , Sudijono J. , Tan P.K. , Tan H. , Goh Y.W. , Zhu L. , Deng Q. , Lin H.B. , He R. , Li H.L. , Mai Z.H. , Lam J.
Published: December 2020

The scanning electron microscope (SEM) based nanoprobing technique has established itself as an indispensable failure analysis (FA) technique as technology nodes continue to shrink according to Moore's Law. Although it has its share of disadvantages, SEM-based nanoprobing is often preferred because of its advantages over other FA techniques such as focused ion beam in fault isolation. This paper presents the effectiveness of the nanoprobing technique in isolating nanoscale defects in three different cases in sub-100 nm devices: soft-fail defect caused by asymmetrical nickel silicide (NiSi) formation, hard-fail defect caused by abnormal NiSi formation leading to contact-poly short, and isolation of resistive contact in a large electrical test structure. Results suggest that the SEM based nanoprobing technique is particularly useful in identifying causes of soft-fails and plays a very important role in investigating the cause of hard-fails and improving device yield.
Comparative Failure Analysis of Photovoltaic Devices
Authors: Colvin Jim
Published: December 2020

Photovoltaic devices (PV) or more commonly “solar cells” are analyzed using LBIC/LBIV (Light Beam Induced Current/Voltage) PL (Photoluminescence) and EL (Electroluminescence) as well as INSB thermal Methods. This paper will show the advantages and pitfalls of the techniques as well as a novel way to perform EL imaging without a dark box and thermal imaging through glass panels.
The Novel Dopant Profile Inspection Methodology by FIB
Authors: Chou Po Fu , Lu Li Ming
Published: December 2020

Dopant profile inspection is one of the focused ion beam (FIB) physical analysis applications. This paper presents a technique for characterizing P-V dopant regions in silicon by using a FIB methodology. This technique builds on published work for backside FIB navigation, in which n-well contrast is observed. The paper demonstrates that the technique can distinguish both n- and p-type dopant regions. The capability for imaging real sample dopant regions on current fabricated devices is also demonstrated. SEM DC and FIB DC are complementary methodologies for the inspection of dopants. The advantage of the SEM DC method is high resolution and the advantage of FIB DC methodology is high contrast, especially evident in a deep N-well region.
Characterization of Green and Ultraviolet LEDs by Laser-Based FA Techniques
Authors: Miller M. A. , Cole E. I. , Tangyunyong P.
Published: December 2020

This work modifies existing nondestructive, laser-based techniques, such as thermally-induced voltage alteration (TIVA) and light-induced voltage alteration (LIVA), to determine precursors to failure in green and UV LEDs. Both TIVA and LIVA have been shown to be effective tools in localizing defects in Si-based integrated circuits and GaAs vertical cavity surface-emitting lasers. In a previous work, TIVA was also used to demonstrate failed InGaN LEDs in the III-V material system. This article expands the use of these techniques to localize potential precursors that lead to premature failures in deep green and deep UV LEDs. The paper shows how the TIVA/LIVA techniques were successfully used to characterize defects in wide bandgap AlGaN- and InGaN-based LEDs. The defects in the green LEDs appear to be electron-hole pair recombination sites and the observed voltage signals are primarily due to a LIVA effect.
Wafer Level Atomic Force Probing
Authors: Kane Terence , Pendyala Sweta , Tenney Michael P.
Published: December 2020

The laboratory practice of employing atomic force probing (AFP) using AFP current imaging and Nanoprobe Capacitance-Voltage Spectroscopy (NCVS) at contact level (CA) for identfication of front end of line (FEOL) defects in MOSFET devices, especially for silicon on insulator applications has been extensively detailed [1,2,3]. The introduction of Nanoprobe Capacitance Voltage Spectroscopy (NCVS) on bulk silicon wafers and silicon on insulator (SOI) wafers to characterize discrete MOSFET and SOI embedded dynamic ramdom access memory devices (eDRAM) without the time consuming delayering methods of conventional scanning capacitance microscopy has also been highlighted [1,2,3,4,5,6]. Typically, this laboratory AFP characterization is employed on die fragments sampled from whole wafers following back end of the line (BEOL) metallization processing and test. The process vintage of this hardware can be as much as three months after the critical FEOL processing has occurred. This paper is intended to describe for the first time the methodology of applying AFP on whole 300mm wafers at the post CA chemical-mechanical polishing (CMP) process level to provide a real time insight into yield issues that would not be detected until subsequent BEOL metallization processing and testing. This new AFP tool incorporates enhanced features enabling both DC measurements as well as AC capacitance voltage measurements of discrete deep trench embedded DRAM (eDRAM) devices for 32nm, 28nm, and 20nm node technologies.
Use of Lock-In Thermography for Non-Destructive 3D Defect Localization on System in Package and Stacked-Die Technology
Authors: Schlangen Rudolf , Motegi Shinobu , Nagatomo Toshi , Schmidt Christian , Altmann Frank , Murakami Hiroaki , Hollingshead Stewart , West John
Published: December 2020

With the growing variety, complexity and market share of 3D packaged devices, package level FA is also facing new challenges and higher demand. This paper presents Lock-In Thermography (LIT) for fully non-destructive 3D defect localization of electrical active defects. After a short introduction of the basic LIT theory, two slightly different approaches of LIT based 3D localization will be discussed based on two case studies. The first approach relies on package internal reference heat sources (e.g. I/O-diodes) on different die levels. The second approach makes use of calibrated 3D simulation software to yield the differentiation between die levels in 8 die µSD technology.
Identification of Extension Implant Defect in Sub-Micron CMOS ICs – Analysis Technique, Model, and Solution
Authors: Tsang Yuk L. , Nallapati Giri , Skarupa Ron , Anthony Brian
Published: December 2020

A major failure mode known as ROMBIST (logic and memory) that topped the yield loss pareto and plagued a 0.13 m technology chipset production was analyzed. This MCUROM fail exhibited a unique failing pattern where every 4th row failed. A detailed electrical microprobing analysis had led to an exact model that was able to explain the failure mechanism. This model pinpointed a PFET extension implant blockage. Subsequent silicon etch analysis directed by the model prediction brought out the non visual defect (NVD). Inline inspection at the extension implant photo step identified the root cause. A greater than 45% reduction in die cost was realized in lots with photo resist fixes implemented.
Fault Isolation of Dense High Rc Array by Using Conductive Atomic Force Microscopy
Authors: Hu Wei-Shan , Yang Hui-Wen , Huang Yung-Sheng
Published: December 2020

Integrated circuit complexity and density are continuously increasing with the rapid progress of advanced technology nodes. The density of wafer acceptance test (WAT) pattern is also becoming higher as the device continuing to shrink. Failure analysis (FA) techniques have been developed to improve the precision of defect isolation. A technique with more precise fault isolation capability is needed when the test pattern density increased. In this paper we have isolated faults within a dense high Rc array by using conductive atomic force microscopy (C-AFM). The fault sites in the array can be located efficiently with nano-scale precision. Point contact I-V measurements provide a quantitative comparison of the fault sites.
Failure Analysis on Integrated Power Devices
Authors: Chiang Arthur , Le David , Wu Huixian
Published: December 2020

Integrated power devices (IPD, IC+MOSFETs) have gained popularity for their excellent power management performance and compact size. During the development, it was soon found that exposing the multi-die device for debug could be challenging. In the article, we will show how the traditional decapsulation method fails to expose the device properly for follow up analysis. We will then present a new technique using laser ablation + chemical/plasma etch that proves to work for IPD products. We will then present a complete FA example combining this decapsulation technique and many other advanced FA techniques to solve an elusive failure during the development phase of an IPD product.
Deprocessing Methodologies for Detection of IBC and Cell-to-Cell Shorts in Submicron DRAM
Authors: Chitakudige Ramachandra , Dash Sarat Kumar , Khan A.M.
Published: December 2020

Detection of both Insufficient Buried Contact (IBC) and cell-to-cell short defects is quite a challenging task for failure analysis in submicron Dynamic Random Access Memory (DRAM) devices. A combination of a well-controlled wet etch and high selectivity poly silicon etch is a key requirement in the deprocessing of DRAM for detection of these types of failures. High selectivity poly silicon etch methods have been reported using complicated system such as ECR (Electron Cyclotron Resonance) Plasma system. The fact that these systems use hazardous gases like Cl2, HBr, and SF6 motivates the search for safer alternative deprocessing chemistries. The present work describes high selectivity poly silicon etch using simple Reactive Ion Etch (RIE) plasma system using less hazardous gases such as CF4, O2 etc. A combination of controlled wet etch and high selectivity poly silicon etch have been used to detect both IBC and cell-to-cell shorts in submicron DRAMs.
A Practical Method for Trace Exposure and Roughness Measurements and Implementation in High Speed Package Design
Authors: Korchnoy Valentina , Brener Jacov
Published: December 2020

High frequency signal propagation through transmission lines has been an important discipline for RF engineers. With advancements in digital technologies, especially when data rates reached multiple Gb/s, package designers have to consider parameters such as transmission loss and trace impedance in order to maintain signal integrity. For high frequency signals, the surface roughness of the copper trace becomes increasingly significant in determining conduction loss, due to current confinement to the conductor surface by the skin effect. Accurate 3D conductor surface maps are required for correct trace insertion loss simulation. Practical methods for package trace exposure and 3D surface height map acquisition are discussed in this paper. Advantages and disadvantages of these methods, and their implementation to real packages are shown. Using electrical parameters resulting from a 3D trace surface map, the error between electrical simulations and actual measurements of insertion loss in an FCBGA package have been reduced from 6% to nearly zero, enabling tighter margins in 10GB/s high speed serial design.
Sample Preparation Strategies for Fast and Effective Failure Analysis of 3D Devices
Authors: Kwakman Laurens , Straw Marcus , Coustillier Gaëlle , Sentis Marc , Beyersdorfer Jens , Schischka Jan , Naumann Falk , Altmann Frank
Published: December 2020

In this paper different sample preparation strategies for fast and efficient failure analysis of 3D devices are reviewed and further explored. It will be shown that a combined workflow using laser ablation and plasma FIB milling provides best flexibility to cover most of the FA use cases. Laser ablation guarantees fast, coarse material removal and the subsequent plasma FIB milling provides fast removal of any damage or imperfections induced by the laser ablation, precise navigation to the region of interest, a high quality surface finish allowing direct SEM imaging and analytics such as EBSD and, if required the preparation of a thin lamella for TEM analysis.
Glass Interposer Reliability Improvement by Transient Thermal Modelling and Physical Analysis
Authors: Benali A. , El Amrani A. , Bouissa Y. , Bouya M. , Faqir M. , Ghogho M. , Benlahoucine Y. , Sbiaa Z.
Published: December 2020

In this paper we develop a failure analysis approach based on software weaknesses prediction on the glass interposer packaging. The main objective of this work consists of the reliability improvement of through glass via (TGV) by modeling and simulating the transient thermal cycling load on the glass interposer. Our study consists in a single TGV and the whole package models analysis. Then, we will discuss the benefits and issues of each one. Furthermore, a thermal cycling test and physical analysis in critical areas are done in order to identify the defects failure modes.
Back-Side Deprocessing for Bulk Silicon Devices
Authors: Wei M.S. , Blair Lauren
Published: December 2020

An enhanced back-side deprocessing recipe has been established with an additional heat step compared to previous methods. This enhanced recipe reduces overall deprocessing time by 70%. The edges with higher silicon thickness can be polished simultaneously. This recipe has proved repeatable and successful across different technology nodes and die sizes.
TEM Sample Fabrication of Sub 22 nm Three-Dimensional Test Structures
Authors: Demarest James J.
Published: December 2020

With the 14nm technology node becoming a reality at today's state-of-the-art semiconductor manufacturing plants and the 10nm node actively being planned for, device structures have shrunk well beyond the minimum conventional transmission electron microscope (TEM) sample thickness: 50-100nm. This paper addresses the challenges in TEM sample preparation of sub 22nm three-dimensional test structures. As semiconductor device technology continues to shrink and become more complicated with the addition of three-dimensional device integration, unique sample preparation challenges will continue to arise. This opens the door to novel solutions for these problems like the one presented in this paper: an issue that arose where TEM projection effects interfered with proper characterization of a finFET test structure.
Early Inline Detection of Systematic Defects Using ATPG and Commonality Analysis on Product-Like Logic Yield Learning Vehicle
Authors: Beaudoin Felix , Song Zhigang , Lucarini Stephen , Mechler Thomas F. , Wu Stephen , Cohen Todd L. , Lagus Mark , Wendel Dieter , Spruth Bruno , Stanley Kevin , Bogdan David
Published: December 2020

This paper presents the successful use of the novel inline product-like logic vehicle (PATO) during the last technology development phases of IBM's 22nm SOI technology node. It provides information on the sequential PATO inline test flow, commonality analysis procedure, and commonality signature trending. The paper presents examples of systematic defects uniquely captured by the product-like back end of the line layout. Moreover, this complex logic vehicle also uncovered a rich Pareto of more than 20 types of systematic and random defect mechanisms across the front end of the line, the middle end of the line, and the back end of the line. And more importantly, the non-defect found rate was kept below 20%. This achievement was possible by: leveraging high volume inline test ATPG scan fail data through the novel commonality analysis approach; and selecting the highest ATPG confidence defects representing a known commonality signature to physical failure analysis.
SAM Assisted Contour Milling
Authors: Hollerith Christian , Krüger Bernd , Waginger Stefan , Plabst Doris , Fritz Matthias
Published: December 2020

Contour milling by high precision CNC-milling offers the possibility to delayer precisely into warped and tilted package interfaces e.g. to expose the die backside. The needed data about the warpage of the surface of interest is in this case derived from SAM time of flight- measurements. The combination of these two approaches solves emerging challenges for backside preparation process.
MicroPREP—A New Laser Tool for High-Throughput Sample Preparation
Authors: Krause Michael , Ebert Martin , Höche Thomas , Wagner Uwe
Published: December 2020

Over the past fifty year, lasers have found many, often groundbreaking applications in science and technology. The most important features of lasers are that photons are inherently free of contamination, extremely high energy densities can be focused in very small areas and the laser beam can be precisely positioned using deflection mirrors. By reducing pulse lengths from a few nanoseconds down to the picosecond or femtosecond range, material ablation is becoming increasingly “athermal”, i.e. structure damage by local heating is reduced to well below a few microns. In view of these outstanding characteristics of lasers, it is very surprising that sample preparation for microstructure diagnostics did not derive the advantages from laser micromachining. microPREPTM, is a new laser-micromachining tool developed by 3D-Micromac capable of making fast, clean, and efficient laser ablation available for the preparation of samples for transmission electron microscopy (TEM). The workflow follows a three-stage approach. First, a supporting basic structure is cut from the feedstock. Second, the supported structure is laser-thinned down to a few microns and third, the supported and laser-thinned structure is thinned using a focused ion beam or an ion broad beam. The examples presented in this paper support this approach and show it is ready to be applied in different areas of microstructure diagnostics and has very high potential for failure diagnostics.
A Case Study of Failure Analysis on ESD-Induced Degradation of 405 nm LD
Authors: Liu Hongmin , Li Zhe , Weng Zheng , Jiang Hao , Shen Yuanting
Published: December 2020

A field failing Ondax’s 405nm Laser Diode (LD) was under failure analysis. The failure analysis (FA) results showed that the LD was very sensitive to ESD and the degradation was ESD induced. Some mechanism explanation is also given in this paper.