num_pages: 808
description: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
language: English
title: VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon
titlecomplete: VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
ratings_count: 6
publisher: Morgan Kaufmann