num_pages: 374
description: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
language: English
title: Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
titlecomplete: Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
ratings_count: 4
publisher: Springer