num_pages: 228
description: From the July 2001 conference in Taormina, Italy, these proceedings comprise 37 papers and ten posters. The papers cover the following dependability evaluation; on-line testing for reconfiguration systems; on-line testable and fault tolerable circuits and systems; yield, test, and reliability issues for very deep submicron chips; logic verification for on-line tested systems; built-in self-testing; self-checking, concurrent detection, and radiation effects; automotive applications and on-line monitoring of temperature; self-checking circuits and error control coding implementation; hardware and software techniques for fault tolerance; applications; and, on-line testing of digital, analog, and mixed signal circuits. Annotation c. Book News, Inc., Portland, OR (booknews.com)
language: English
title: Seventh International On-Line Testing Workshop: Proceedings : 9-11 July 2001, Giardini Naxos, Taormina, Italy
titlecomplete: Seventh International On-Line Testing Workshop: Proceedings : 9-11 July 2001, Giardini Naxos, Taormina, Italy
publisher: IEEE