num_pages: 272
description: Dedicated to the issues surrounding RFIC testing. An important resource for RFIC designers and high-frequency digital IC designers, IC test engineers, and IC manufacturing test engineers.
language: English
title: RF Measurements of Die and Packages (Artech House Microwave Library
titlecomplete: RF Measurements of Die and Packages (Artech House Microwave Library (Hardcover))
publisher: Artech Print on Demand