Patent SG-11201808609Y-A (SG)
Title: System and method for imaging a surface defect on an object
Inventor: CHEN WENYU
IPC: G01B11/30
Filed: 2017-03-30
Abstract: INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property -, Organization MD 1111101110101011111 HO 111110111010 HE 01111011101101111111011 III International Bureau ... ..... ..Yi j (10) International Publication Number (43) ..... ..... International Publication Date WO 2017/171651 Al 5 October 2017 (05.10.2017) WI P0 I P CT (51) International Patent Classification: focomm Research, 1 Fusionopolis Way, #21-01, Connexis, GO1N 21/88 (2006.01) G01B 11/30 (2006.01) South Tower, Singapore 138632 (SG). (21) International Application Number: (74) Agent: SPRUSON & FERGUSON (ASIA) PTE LTD; PCT/SG2017/050175 P.O. Box 1531, Robinson Road Post Office, Singapore (22) International Filing Date: 903031 (SG). 30 March 2017 (30.03.2017) (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, (25) Filing Language: English AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, (26) Publication Language: English BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, (30) Priority Data: HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, 10201602496P 30 March 2016 (30.03.2016) SG KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, (71) Applicant: AGENCY FOR SCIENCE, TECHNOLOGY MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, AND RESEARCH [SG/SG]; 1 Fusionopolis Way, #20-10 NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, Connexis North Tower, Singapore 138632 (SG). RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, (72) Inventors: CHEN, Wenyu; c/o PKM, Institute for In- ZA, ZM, ZW. focomm Research, 1 Fusionopolis Way, #21-01, Connexis, South Tower, Singapore 138632 (SG). XIONG, Wei; c/o (84) Designated States (unless otherwise indicated, for every PKM, Institute for Infocomm Research, 1 Fusionopolis kind of regional protection available): ARIPO (BW, GH, Way, #21-01, Connexis, South Tower, Singapore 138632 GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, (SG). DU, Jia; c/o PKM, Institute for Infocomm Research, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, — _ 1 Fusionopolis Way, #21-01, Connexis, South Tower, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, Singapore 138632 (SG). CHENG, Jierong; c/o PKM, In- DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, stitute for Infocomm Research, 1 Fusionopolis Way, #21- LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, = 01, Connexis, South Tower, Singapore 138632 (SG). SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, WAN, Teck Sun Marcus; c/o PKM, Institute for In- GW, KM, ML, MR, NE, SN, TD, TG). = = [Continued on next page] (54) Title: SYSTEM AND METHOD FOR IMAGING A SURFACE DEFECT ON AN OBJECT = (57) : A system and a method for imaging a _ f\j Capturing, using a sensor assembly surface defect on an object are provided. The system in- = = 402 connected to an actuator, at least one image of the object dudes an actuator, a sensor assembly connected to the actuator, and a processor configured to control the actu- ator and the sensor assembly. The sensor assembly in- cludes at least one sensor configured to capture at least one image of the object. The processor is configured to control the actuator and the sensor assembly to identify - 4 = , Identifying using a processor configured to control = f \) the actuator and the sensor assembly, a region of a region of interest associated with the surface defect = = 404 interest associated with the surface defect using an image of the object using an image of the object and to repeatedly identify at least one subsequent region of interest associated the surface defect using at least a preceding region of interest such that the surface defect is identified ac- = Iwith _ Repeatedly identifying at least one subsequent cording to a predetermined criterion. _ region of interest associated with the surface defect 1\ i using at least a preceding region of interest such 1-1 406 that the surface defect is identified according to a predetermined criterion 1-1 ir) ,tD ( it FIG. 4 1-1 IN 400 1-1 -.... IN 1-1 0 ei O WO 2017/171651 Al MIDEDIMOMOIDERDEEMOMOINEHEMEM011111110110111111 Declarations under Rule 4.17: Published: — of inventorship (Rule 4.17(iv)) — with international search report (Art. 21(3))