Patent SG-11201905685X-A (SG)
Title: In-field multi core self-test controller with stored test pattern for safety critical automotive use cases
Inventor: JAIN ARVIND
IPC: G11C29/36
Filed: 2018-01-26
Abstract: ELMT Cores JTAG Decoder 112 TAP 702 JTAG 704 Self Test Controller Power/RESET Controller 708 100 Config register LQ2 ROM Interconnect 710 ••!! cc O QC 1-1 00 O 1-1 r•i C PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) omit °nolo DID mil moll! ono En oimIE (10) International Publication Number WO 2018/148038 Al WIPO I PCT (12) INTERNATIONAL APPLICATION (19) World Intellectual Property Organization International Bureau (43) International Publication Date 16 August 2018 (16.08.2018) (51) International Patent Classification: G11C 29/36 (2006.01) GO6F 11/22 (2006.01) Gl1C 29/10 (2006.01) (21) International Application Number: PCT/US2018/015578 (22) International Filing Date: 26 January 2018 (26.01.2018) (25) Filing Language: English (26) Publication Language: English (30) Priority Data: 62/458,534 13 February 2017 (13.02.2017) US 15/835,227 07 December 2017 (07.12.2017) US (71) Applicant: QUALCOMM INCORPORATED [US/US]; Atten: International IP Administration, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). (72) Inventors: JAIN, Arvind; c/o Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). BHUSHAN SINGH, Nishi; c/o Qualcomm Incor- porated, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). GULATI, Rahul; c/o Qualcomm In- corporated, 5775 Morehouse Drive, San Diego, Califor- nia 92121-1714 (US). BHUYAN, Pranjal; c/o Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, Cali- fornia 92121-1714 (US). KINGER, Rakesh Kumar; c/ o Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). AVERBUJ, Roberto; c/o Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). (74) Agent: HODGES, Jonas J. et al.; c/o Arent Fox LLP, 1717 K Street NW, Washington, District of Columbia 20006-5344 (US). (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, (54) Title: IN-FIELD MULTI CORE SELF-TEST CONTROLLER WITH STORED TEST PATTERN FOR SAFETY CRITICAL AUTOMOTIVE USE CASES FIG. 7 (57) : A self-test controller (100) includes a memory (104) configured to store a test patterns, configuration registers (102), and a memory data component. The test patterns are encoded in the memory using various techniques in order to save storage space. By using the configuration parameters, the memory data component is configured to decode the test patterns and perform multiple built- in self-test on a multitude of test cores (706). The described techniques allow for built- in self-test to be performed dynamically while utilizing less space in the memory. [Continued on next page] WO 2018/148038 Al MIDEDIMOMOIDEIREEMOMMIUMOIMIOMMOVOIS KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). Published: — with international search report (Art. 21(3))